A reliability detection method, device, apparatus and computer readable storage medium

Abstract

The application discloses a reliability detection method and device, equipment and computer readable storage medium, and relates to the field of computer technology. The method comprises the following steps: obtaining a device search instruction of a to-be-detected item; obtaining device information corresponding to the to-be-detected item according to the device search instruction through the communication connection between the upper computer and each lower computer; wherein the device information is stored in a bill of material library of the lower computer; and calculating the mean time between failures corresponding to the to-be-detected item according to the device information. Through the communication connection between the upper computer and each lower computer, the device information required by the to-be-detected item stored in the bill of material library of each lower computer can be searched and obtained, so that the mean time between failures corresponding to the to-be-detected item can be calculated according to the device information, the reliability detection of the to-be-detected item is completed, the process that the user manually outputs the device information each time for reliability detection is avoided, the workload of the user is reduced, and the accuracy of the reliability detection is ensured.

Description

Technical Field

[0001] This invention relates to the field of computer technology, and in particular to a reliability testing method, apparatus, device, and computer-readable storage medium. Background Technology

[0002] As companies increase their demand for market bidding, the task of reliability departments in producing reliability forecast reports becomes increasingly important. The accuracy and professionalism of these reports will serve as a microcosm of the product design quality of each company during market bidding.

[0003] Current technologies require the use of MTBF (Mean Time Between Failure) prediction software for reliability testing of related projects. However, using MTBF prediction software necessitates manually importing the BOM (Bill of Material) of specific motherboards or other board components into the software for calculation, which is labor-intensive and makes it difficult to guarantee the accuracy of the input information each time. Therefore, how to reduce the user's workload for reliability testing while ensuring the accuracy of reliability testing is an urgent problem to be solved. Summary of the Invention

[0004] The purpose of this invention is to provide a reliability testing method, apparatus, device, and computer-readable storage medium to reduce the user workload of reliability testing and ensure the accuracy of reliability testing.

[0005] To solve the above-mentioned technical problems, the present invention provides a reliability testing method, comprising:

[0006] Obtain the device search command for the item to be tested;

[0007] According to the device search command, the device information corresponding to the item to be tested is obtained through the communication connection between the host computer and each slave computer; wherein, the device information is stored in the bill of materials library of the slave computer;

[0008] Based on the device information, calculate the mean time between failures (MTBF) corresponding to the item to be tested.

[0009] In some embodiments, obtaining device information corresponding to the item to be tested through a communication connection between a host computer and a slave computer according to the device search instruction includes:

[0010] The current lower-level machine retrieves the device information from the target bill of materials library according to the device search command through the communication connection between the upper-level machine and the lower-level machine; wherein, the current lower-level machine is any of the lower-level machines, and the target bill of materials library is a shared bill of materials library of the lower-level machines.

[0011] In some embodiments, obtaining device information corresponding to the item to be tested through a communication connection between a host computer and a slave computer according to the device search instruction includes:

[0012] The current lower-level machine retrieves the device information from the target memory of the host machine through a communication connection with the host machine according to the device search instruction; wherein, the current lower-level machine is any of the lower-level machines, and the target memory stores the respective bill of materials databases transmitted by each lower-level machine.

[0013] In some embodiments, before obtaining the device information corresponding to the item to be detected through the communication connection between the host computer and each slave computer according to the device search instruction, the method further includes:

[0014] The current lower-level machine sends identity confirmation information to the upper-level machine; wherein, the current lower-level machine is any of the lower-level machines.

[0015] After the host computer verifies the identity confirmation information, a communication connection is established with the host computer.

[0016] In some embodiments, the bill of materials library of each of the lower-level machines is stored in an isolated memory.

[0017] In some embodiments, the bill of materials library in the isolated storage includes shared data stored in document or tabular form.

[0018] In some embodiments, the isolation memory in each of the lower-level machines is equipped with its own corresponding lower-level control software, product lifecycle management system and mean time between failures (MTBF) prediction software, wherein the product lifecycle management system includes the bill of materials library;

[0019] Each of the lower-level machines communicates with the upper-level machine's upper-level control software using its own lower-level control software.

[0020] The present invention also provides a reliability testing device, comprising:

[0021] The acquisition module is used to acquire the device search instructions for the item to be tested;

[0022] The search module is used to obtain the device information corresponding to the item to be tested through the communication connection between the host computer and each slave computer according to the device search instruction; wherein the device information is stored in the bill of materials library of the slave computer;

[0023] The detection module is used to calculate the mean time between failures corresponding to the item to be tested based on the device information.

[0024] The present invention also provides a reliability testing device, comprising:

[0025] Memory, used to store computer programs;

[0026] A processor is used to implement the steps of the reliability detection method as described above when executing the computer program.

[0027] In addition, the present invention provides a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps of the reliability detection method described above.

[0028] The present invention provides a reliability testing method, comprising: obtaining a component search instruction for a component to be tested; obtaining component information corresponding to the component to be tested through a communication connection between a host computer and each slave computer according to the component search instruction; wherein the component information is stored in the bill of materials library of the slave computer; and calculating the mean time between failures (MTBF) corresponding to the component to be tested based on the component information.

[0029] As can be seen, this invention, through the communication connection between the host computer and each slave computer, can search and obtain the component information required for the item to be tested stored in the bill of materials library of each slave computer. Based on the component information, the mean time between failures (MTBF) corresponding to the item to be tested is calculated, completing the reliability test of the item. This avoids the process of requiring the user to manually output component information for each reliability test, reducing the user's workload and ensuring the accuracy of the reliability test. Furthermore, this invention also provides a reliability testing device, equipment, and computer-readable storage medium, which also have the above-mentioned beneficial effects. Attached Figure Description

[0030] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the provided drawings without creative effort.

[0031] Figure 1 A flowchart of a reliability testing method provided in an embodiment of the present invention;

[0032] Figure 2 This is a schematic diagram of the system structure of another reliability detection method provided in an embodiment of the present invention;

[0033] Figure 3 This is a structural block diagram of a reliability testing device provided in an embodiment of the present invention;

[0034] Figure 4 This is a simplified structural diagram of a reliability testing device provided in an embodiment of the present invention;

[0035] Figure 5 This is a schematic diagram of the specific structure of a reliability testing device provided in an embodiment of the present invention;

[0036] Figure 6 This is a schematic diagram of the structure of a computer-readable storage medium provided in an embodiment of the present invention. Detailed Implementation

[0037] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0038] Please refer to Figure 1 , Figure 1 A flowchart illustrating a reliability testing method provided in an embodiment of the present invention. The method may include:

[0039] Step 101: Obtain the device search command for the item to be tested.

[0040] In this step, the items to be tested can be those requiring reliability prediction testing, i.e., those requiring calculation of the mean time between failures (MTBF). The device search command in this step can be a command used to search for device information (i.e., the bill of materials information for components).

[0041] It is understood that in this embodiment, through the communication connection between the host computer (such as a computer or server) and each slave computer (such as a computer), the host computer or any slave computer can search for the bill of materials information (i.e., component information) of the components stored in the bill of materials library of each slave computer, thereby realizing the sharing of data in the bill of materials library of each slave computer.

[0042] Correspondingly, the reliability testing method provided in this embodiment can be applied to slave devices that communicate with a host computer. For example, the processor of any slave device (i.e., the current slave device) can obtain the device information corresponding to the item to be tested through the communication connection with the host computer, and then use the device information to calculate the mean time between failures (MTBF) corresponding to the item to be tested, thereby completing the reliability testing of the item to be tested. The reliability testing method provided in this embodiment can also be applied to a host computer. For example, the host computer can obtain the device information corresponding to the item to be tested through the communication connection with each slave device, and then use the device information to calculate the mean time between failures (MTBF) corresponding to the item to be tested, thereby completing the reliability testing of the item to be tested. This embodiment does not impose any limitations in this regard.

[0043] It should be noted that the specific method by which the processor obtains the component search instructions for the item to be tested in this step can be set by the designer according to the practical scenario and user needs. For example, the processor can generate component search instructions based on component search input information; for instance, the processor of the current lower-level machine can use the lower-level control software to generate component search instructions based on the component search input information entered into the search engine. That is, the user can input the component information (such as component name or number) of the item to be tested (i.e., the item to be tested) into the search engine of the lower-level control software in the current lower-level machine, so that the lower-level control software can generate component search instructions. The processor can also determine the component identifier corresponding to the item to be tested based on the item search input information; and generate component search instructions based on the component identifier; for instance, the user can input the item information to be tested (i.e., item search input information) into the search engine of the lower-level control software in the current lower-level machine, so that the lower-level control software can automatically determine the component information (i.e., component identifier) ​​corresponding to the item information, thereby generating the corresponding component search instructions.

[0044] For example, such as Figure 2 As shown, in this embodiment, upper-level control software can be installed on the host computer (host control computer), and lower-level control software, a PLM (Product Life-Cycle Management) system, and MTBF prediction software can be installed on each lower-level computer (lower-level computer). The host computer can use the upper-level control software to control each lower-level computer with its own lower-level control software to run within the control system. That is, the communication connection between the host computer and each lower-level computer can be achieved through the cooperation between the upper-level control software and the lower-level control software; in other words, each lower-level computer uses its own lower-level control software to communicate with the host computer's upper-level control software.

[0045] Step 102: According to the device search command, obtain the device information corresponding to the item to be tested through the communication connection between the host computer and each slave computer; wherein, the device information is stored in the bill of materials library of the slave computer.

[0046] Understandably, in this step, the processor can obtain the device information corresponding to the device search command through the communication connection between the host computer and each slave computer, that is, the device information required for the mean time between failures of the item to be tested.

[0047] In this embodiment, the specific method by which the processor obtains the device information corresponding to the item to be tested based on the device search command through the communication connection between the host computer and each slave computer can be set by the designer according to the practical scenario and user needs. For example, when each slave computer directly shares its own bill of materials (BOM) library, the processor can search for and obtain the device information from the target BOM library according to the device search command through the communication connection between the host computer and the slave computer. The target BOM library can be a BOM library shared by all slave computers. For example, the current slave computer searches for and obtains the device information from the target BOM library according to the device search command through the communication connection between the host computer and the slave computer. The current slave computer can be any slave computer, and the target BOM library can be a BOM library shared by the slave computers. For example, the processor of the current slave computer can not only search for the required device information from the BOM library in its own internal PLM system, but also use its installed slave control software to search for the required device information from the BOM library in the PLM system of other slave computers through communication with the host computer's host control software.

[0048] Correspondingly, when the lower-level machines do not share their respective BOM (Bill of Materials) databases, the processor can retrieve device information from the host computer's target memory. The target memory stores the respective BOM databases transmitted by each lower-level machine via a communication connection. In other words, the lower-level machines do not need to directly share their respective BOM databases; instead, they can transmit their BOM databases to the host computer for storage through a communication connection, thus achieving data sharing within their respective BOM databases. For example, the current lower-level machine, based on a device search command, retrieves device information from the host computer's target memory via a communication connection. Here, the current lower-level machine can be any lower-level machine, and the target memory stores the respective BOM databases transmitted by each lower-level machine. For instance, the processor of the current lower-level machine can not only search for the required device information from its own internal PLM system's BOM database but also, using its installed lower-level control software, search for the required device information from the BOM databases of other lower-level machines stored in the host computer's target memory through communication with the host computer's upper-level control software. Correspondingly, the current lower-level machine can transfer its bill of materials (BOM) database to the target memory of the upper-level machine through a communication connection. Furthermore, after the BOM database is updated, the current lower-level machine can update the BOM database stored in the target memory of the upper-level machine through the communication connection to ensure the accuracy of the BOM database in the target memory.

[0049] Correspondingly, when some host computers do not share their respective bill of materials (BOM) libraries, a combination of the two device information acquisition methods described above can be used. For example, the current slave computer can search for and obtain device information from the target BOM library and the target memory of the host computer according to the device search command. The target BOM library is the BOM library shared by slave computers that share a BOM library, and the target memory stores the BOM libraries transmitted by slave computers that do not share a BOM library. This embodiment does not impose any limitations on this.

[0050] Furthermore, to enhance the information security of the host computer, in this embodiment, the host computer can utilize one or more memory units (i.e., target memory) specifically for storing the data from the bill of materials database uploaded by the slave computer (e.g., ...). Figure 2 The BOM (Bill of Materials) library in the target memory is used by users of each lower-level machine for querying and use. This separates the data in the target memory from other data in the upper-level machine, thereby preventing the theft of other data in the upper-level machine. In other words, the target memory can be used only to store the respective bill of materials library transmitted by each lower-level machine.

[0051] Furthermore, to enhance the information security of the lower-level machines, in this embodiment, the lower-level machines can utilize isolated storage (such as hard disks) to separate their shared bill of materials (BOM) database from ordinary daily data, thereby achieving data theft prevention for the lower-level machines. That is, each lower-level machine's BOM database is stored in its own isolated storage. For example, the isolated storage in each lower-level machine can be equipped with its own corresponding lower-level control software, product lifecycle management system, and mean time between failures (MTBF) estimation software. The product lifecycle management system includes the BOM database; in other words, the isolated storage can be used only for installing the lower-level control software, product lifecycle management system, and MTBF estimation software. For example, the lower-level machine can install an additional storage hard drive (i.e., isolated storage) before installing the software. This allows the PLM system, MTBF prediction software, and lower-level control software to be installed on the additional storage hard drive, thus separating the data that needs to be shared from ordinary daily data. The PLM system can control the sharing of the BOM library within the additional storage hard drive; that is, the user can control whether the BOM library is shared through the PLM system. During the search process, when the lower-level machine shares the BOM, the lower-level control software can control the data sharing on its own additional storage hard drive to protect the data on other hard drives.

[0052] Correspondingly, the specific data content and storage method of the bill of materials library of each lower-level machine in this embodiment can be set by the designer according to the practical scenario and user needs. For example, the bill of materials library in the isolated memory includes shared data (such as the BOM of components) stored in the form of documents or tables. For example, users can use documents or tables to edit the data that needs to be shared in the lower-level machine (i.e., shared data) and store it in the isolated memory.

[0053] Furthermore, to ensure the information security of the host computer and the slave computers, in this embodiment, before establishing a communication connection between the host computer and each slave computer, the host computer can verify the user identity of the slave computer to prevent data theft. For example, the method provided in this embodiment may also include: the current slave computer sending identity confirmation information to the host computer; and establishing a communication connection with the host computer after the host computer verifies the identity confirmation information. For instance, after the current slave computer connects to the host computer via a local area network, the user can enter identity confirmation information on the slave control software of the current slave computer and send it to the host control software of the host computer, so that the host control software of the host computer can establish a communication connection with the slave control software of the current slave computer after verifying the identity confirmation information.

[0054] Step 103: Calculate the mean time between failures (MTBF) for the item to be tested based on the device information.

[0055] Understandably, in this step, the processor can use the device information corresponding to the item to be tested obtained through the search to calculate the mean time between failures (MTBF) corresponding to the item to be tested, and complete the reliability test of the item to be tested, so as to reduce the user's workload and ensure the accuracy of the reliability test.

[0056] Correspondingly, the specific method by which the processor calculates the mean time between failures (MTBF) for the item under test based on the device information in this step can be set by the designer according to the practical scenario and user requirements. For example, the processor can use MTBF prediction software to calculate the MTBF for the item under test based on the device information; for instance, the current lower-level machine can use the PLM system to control its own MTBF prediction software to calculate the MTBF for the item under test using the device information; or, the upper-level machine can use upper-level control software to control its own or any lower-level machine's MTBF prediction software to calculate the MTBF for the item under test using the device information. This embodiment does not impose any restrictions on this.

[0057] In this embodiment, the present invention, through the communication connection between the host computer and each slave computer, can search and obtain the component information required for the item to be tested stored in the bill of materials library of each slave computer. Based on the component information, the mean time between failures corresponding to the item to be tested is calculated, and the reliability test of the item to be tested is completed. This avoids the process of the user having to manually output component information every time the reliability test is performed, reduces the user's workload, and ensures the accuracy of the reliability test.

[0058] Corresponding to the above method embodiments, this invention also provides a reliability testing device. The reliability testing device described below and the reliability testing method described above can be referred to each other.

[0059] Please refer to Figure 3 , Figure 3 This is a structural block diagram of a reliability testing device provided in an embodiment of the present invention. The device may include:

[0060] Module 10 is used to acquire the device search instructions for the item to be tested;

[0061] The search module 20 is used to obtain the device information corresponding to the item to be tested through the communication connection between the host computer and each slave computer according to the device search command; wherein, the device information is stored in the bill of materials library of the slave computer;

[0062] The detection module 30 is used to calculate the mean time between failures corresponding to the items to be tested based on the device information.

[0063] In some embodiments, when the device is applied to a lower-level machine, the search module 20 can be specifically used to search for and obtain device information from the target bill of materials library through the communication connection between the upper-level machine and the lower-level machine according to the device search instruction; wherein, the target bill of materials library is a bill of materials library shared by the lower-level machines.

[0064] In some embodiments, when the device is applied to a lower-level machine, the search module 20 can be specifically used to search for and obtain device information from the target memory of the upper-level machine through a communication connection with the upper-level machine according to the device search instruction; wherein, the target memory stores the respective bill of materials library transmitted by each lower-level machine.

[0065] In some embodiments, when the device is applied to a lower-level machine, the device may further include:

[0066] The verification and sending module is used for the current lower-level machine to send identity confirmation information to the upper-level machine.

[0067] The communication establishment module is used to establish a communication connection with the host computer after the host computer verifies the identity confirmation information.

[0068] In some embodiments, the bill of materials library of each lower-level machine is stored in an isolated memory.

[0069] In some embodiments, the bill of materials library in the isolated storage includes shared data stored in document or tabular form.

[0070] In some embodiments, the isolation memory in each lower-level machine is equipped with its own corresponding lower-level control software, product lifecycle management system and mean time between failures (MTBF) prediction software. The product lifecycle management system includes a bill of materials library.

[0071] Each lower-level machine communicates with the upper-level machine's control software using its own lower-level control software.

[0072] In this embodiment, the present invention can search and obtain the component information required for the test item stored in the bill of materials library of each lower computer through the communication connection between the upper computer and each lower computer. Then, the detection module 30 calculates the mean time between failures corresponding to the test item based on the component information, and completes the reliability test of the test item. This avoids the process of the user having to manually output component information every time the reliability test is performed, reduces the user's workload, and ensures the accuracy of the reliability test.

[0073] Corresponding to the above method embodiments, this invention also provides a reliability testing device. The reliability testing device described below and the reliability testing method described above can be referred to each other.

[0074] Please refer to Figure 4 , Figure 4 This is a simplified structural diagram of a reliability testing device provided in an embodiment of the present invention. The multi-element heterogeneous computing device may include:

[0075] Memory D1 is used to store computer programs;

[0076] The processor D2 is used to implement the steps of the reliability detection method provided in the above method embodiments when executing a computer program.

[0077] Accordingly, please refer to Figure 5 , Figure 5 This is a schematic diagram of a specific structure of a reliability testing device provided in an embodiment of the present invention. The reliability testing device 310 can vary significantly due to different configurations or performance. It may include one or more central processing units (CPUs) 322 (e.g., one or more processors) and a memory 332, and one or more storage media 330 (e.g., one or more mass storage devices) storing application programs 342 or data 344. The memory 332 and storage media 330 can be temporary or persistent storage. The program stored in the storage media 330 may include one or more units (not shown in the diagram), each unit may include a series of instruction operations on the host. Furthermore, the central processing unit 322 may be configured to communicate with the storage media 330 and execute the series of instruction operations in the storage media 330 on the multi-dimensional heterogeneous computing device 310.

[0078] The reliability testing device 310 may also include one or more power supplies 326, one or more wired or wireless network interfaces 350, one or more input / output interfaces 358, and / or one or more operating systems 341. Examples include Windows Server™, Mac OS X™, Unix™, Linux™, FreeBSD™, etc.

[0079] In this embodiment, the reliability testing device can be a slave device, such as a computer, that is connected to a host computer for communication.

[0080] The steps in the reliability testing method described above can be implemented by the structure of the reliability testing equipment.

[0081] Corresponding to the above method embodiments, this invention also provides a computer-readable storage medium. The computer-readable storage medium described below can be referred to in conjunction with the reliability detection method described above.

[0082] Please refer to Figure 6 , Figure 6 This is a schematic diagram of a computer-readable storage medium provided in an embodiment of the present invention. The computer-readable storage medium 40 stores a computer program 41, which, when executed by a processor, implements the steps of the reliability detection method provided in the above-described method embodiment.

[0083] The computer-readable storage medium 40 can specifically be a USB flash drive, a portable hard drive, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk, or any other storage medium capable of storing program code.

[0084] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on its differences from other embodiments. Similar or identical parts between embodiments can be referred to interchangeably. For the apparatuses, devices, and computer-readable storage media disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the descriptions are relatively simple; relevant details can be found in the method section.

[0085] The reliability testing method, apparatus, device, and computer-readable storage medium provided by the present invention have been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of the present invention. The descriptions of the embodiments above are only for the purpose of helping to understand the method and core ideas of the present invention. It should be noted that those skilled in the art can make various improvements and modifications to the present invention without departing from the principles of the invention, and these improvements and modifications also fall within the protection scope of the claims of the present invention.

Claims

1. A reliability testing method, characterized in that, include: Obtain the device search command for the item to be tested; According to the device search command, the device information corresponding to the item to be tested is obtained through the communication connection between the host computer and each slave computer, so as to realize the sharing of data in the bill of materials (BOM) library of each slave computer; wherein, the device information refers to the BOM information of the component, which is stored in the BOM library of the slave computer; the BOM library of each slave computer is stored in an isolated memory, and the BOM library in the isolated memory includes shared data stored in document or table format; the isolated memory in each slave computer is equipped with its own corresponding slave control software, product lifecycle management system and mean time between failures (MTBF) prediction software, and the product lifecycle management system includes the BOM library; wherein, each slave computer communicates with the host computer's host control software using its own slave control software; Based on the device information, calculate the average fault interval time corresponding to the item to be tested; Before obtaining the device information corresponding to the item to be tested through the communication connection between the host computer and each slave computer according to the device search instruction, the method further includes: The current lower-level machine sends identity confirmation information to the upper-level machine; wherein, the current lower-level machine is any of the lower-level machines. After the host computer verifies the identity confirmation information, a communication connection is established with the host computer.

2. The reliability testing method according to claim 1, characterized in that, The step of obtaining device information corresponding to the item to be tested through a communication connection between the host computer and the slave computer according to the device search command includes: The current lower-level machine retrieves the device information from the target bill of materials library according to the device search command through the communication connection between the upper-level machine and the lower-level machine; wherein, the current lower-level machine is any of the lower-level machines, and the target bill of materials library is a shared bill of materials library of the lower-level machines.

3. The reliability testing method according to claim 1, characterized in that, The step of obtaining device information corresponding to the item to be tested through a communication connection between the host computer and the slave computer according to the device search command includes: The current lower-level machine retrieves the device information from the target memory of the host machine through a communication connection with the host machine according to the device search instruction; wherein, the current lower-level machine is any of the lower-level machines, and the target memory stores the respective bill of materials databases transmitted by each lower-level machine.

4. A reliability testing device, characterized in that, include: The acquisition module is used to acquire the device search instructions for the item to be tested; The search module is used to obtain the device information corresponding to the item to be tested through the communication connection between the host computer and each slave computer according to the device search command, so as to realize the sharing of data in the bill of materials (BOM) library of each slave computer; wherein, the device information refers to the BOM information of the component, which is stored in the BOM library of the slave computer; the BOM library of each slave computer is stored in an isolated memory, and the BOM library in the isolated memory includes shared data stored in document or table format; the isolated memory in each slave computer is equipped with its own corresponding slave control software, product lifecycle management system and mean time between failures (MTBF) prediction software, and the product lifecycle management system includes the BOM library; wherein, each slave computer communicates with the host computer's host control software using its own slave control software; The detection module is used to calculate the average fault interval time corresponding to the item to be tested based on the device information. Also includes: The verification and sending module is used for the current lower-level machine to send identity confirmation information to the upper-level machine; wherein, the current lower-level machine can be any of the lower-level machines. The communication establishment module is used to establish a communication connection with the host computer after the host computer verifies the identity confirmation information.

5. A reliability testing device, characterized in that, include: Memory, used to store computer programs; A processor, configured to implement the steps of the reliability detection method as described in any one of claims 1 to 3 when executing the computer program.

6. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the steps of the reliability detection method as described in any one of claims 1 to 3.

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