A communication circuit testing apparatus and method

Abstract

The application discloses a kind of communication circuit testing device and method.The testing device includes: area controller, EMC load box, communication conversion module and host computer.Area controller is provided with the communication circuit module to be measured;EMC load box is provided with shielding layer, sensor unit and test port, sensor unit is used to receive the instruction issued by the communication circuit module to be measured, and the data in sensor unit is fed back to the communication circuit module to be measured, and test port is used to connect test equipment;Host computer is communicated with area controller by communication conversion module, and host computer is used to test the shift register configuration associated with the communication circuit module to be measured after the work of area controller;Wherein, area controller and EMC load box are arranged in EMC laboratory.The electromagnetic interference is shielded by the EMC load box in the embodiment of the application, the influence of electromagnetic interference on sensor unit is reduced, the accuracy of EMC test is improved, and the test cost is reduced.

Description

Technical Field

[0001] This invention relates to the field of communication testing technology, and in particular to a communication circuit testing device and method. Background Technology

[0002] As the integration of automotive control systems increases, the types and number of signals are also growing. Traditional analog interface circuit modules and PWM interface circuit modules for processing sensor signals are gradually being replaced by communication circuit modules that meet functional safety standards, offer higher compatibility, and occupy fewer controller connector pins, such as the PSI5 communication circuit module. In existing technologies, PSI5 signal boards are often used as the signal source for testing PSI5 communication circuit modules.

[0003] However, the PSI5 signal board is expensive and cannot be adapted to the EMC testing environment, resulting in poor EMC testing accuracy for the PSI5 communication circuit module. Summary of the Invention

[0004] This invention provides a communication circuit testing device and method to improve the accuracy of EMC testing and reduce testing costs.

[0005] According to one aspect of the present invention, a communication circuit testing apparatus is provided, the apparatus comprising:

[0006] A zone controller, wherein the zone controller is equipped with a communication circuit module under test;

[0007] An EMC load cell is connected to the area controller. The EMC load cell is equipped with a shielding layer to shield interference signals. The EMC load cell is equipped with a sensor unit to receive commands from the communication circuit module under test and to feed back the data in the sensor unit to the communication circuit module under test. The EMC load cell is equipped with a test port for connecting to test equipment.

[0008] The host computer is connected to the EMC load cell via a communication conversion module. The host computer communicates with the area controller through the communication conversion module. The host computer is used to configure the shift register associated with the test of the communication circuit module under test after the area controller is working.

[0009] The area controller and the EMC load cell are located in the EMC laboratory.

[0010] Optionally, the EMC load cell includes: an analog unit and a signal transmission unit;

[0011] The simulation unit is used to provide a simulation environment for the sensor unit;

[0012] The signal transmission unit is used to receive control signals sent by the area controller, and the signal transmission unit is connected to the area controller.

[0013] Optionally, the communication conversion module includes: a communication conversion unit and an optical fiber bridging unit;

[0014] The communication conversion unit is used to convert USB signals into CAN signals, or to convert CAN signals into USB signals; the first end of the communication conversion unit is connected to the host computer, and the second end of the communication conversion unit is connected to the fiber optic bridging unit.

[0015] The fiber optic bridging unit is used to transfer signals from outside the EMC laboratory to inside the EMC laboratory, or to transfer signals from inside the EMC laboratory to outside the EMC laboratory; the second end of the fiber optic bridging unit is connected to the communication circuit module under test.

[0016] Optionally, the fiber optic bridging unit includes: a first optical bridge, a second optical bridge, and an optical fiber;

[0017] Both the first optical bridge and the second optical bridge are used for signal conversion, converting the CAN signal into an optical signal, or converting the optical signal into a CAN signal;

[0018] The first optical bridge is located outside the EMC laboratory. The first end of the first optical bridge serves as the first end of the fiber optic bridging unit. The second end of the first optical bridge is connected to the first end of the second optical bridge via the optical fiber. The second end of the second optical bridge serves as the second end of the fiber optic bridging unit.

[0019] Optionally, the testing apparatus may also include: an artificial power network;

[0020] The artificial power network is used to provide power to the EMC load cell, and the artificial power network is connected to the EMC load cell;

[0021] The EMC load cell is connected to the communication circuit module under test via a twisted pair cable.

[0022] Optionally, an antenna is provided in the EMC laboratory, and the antenna is used to generate the interference signal;

[0023] The communication circuit module under test is a PSI5 communication circuit module. The drive control pin of the transceiver chip in the PSI5 communication circuit module is used to control the power supply of the drive pin. The drive pin of the transceiver chip is used to control the power supply of the first signal output pin and the second signal output pin of the transceiver chip. The first and second signal output pins of the transceiver chip are used to power the sensor unit and to communicate with the sensor unit. The first signal output pin of the transceiver chip is connected to the sensor unit through a first RC matching unit, and the second signal output pin of the transceiver chip is connected to the sensor unit through a second RC matching unit. The first high-level terminal of the transceiver chip is connected through a second RC matching unit. A sixth capacitor is connected to the first low-level terminal of the transceiver chip. The second high-level terminal of the transceiver chip is connected to the second low-level terminal of the transceiver chip through a seventh capacitor. The sixth capacitor is used to provide a trigger voltage for the sensor unit. The seventh capacitor is used to provide a trigger voltage for the sensor unit. The first output pin of the transceiver chip is used to interrupt signal transmission and data reading. The second output pin of the transceiver chip is used to interrupt signal transmission and data reading. The enable pin, clock pin, data input pin, and data output pin of the transceiver chip are used to transmit control signals of the internal registers of the transceiver chip and serial data. The reset pin of the transceiver chip is used to reset the transceiver chip.

[0024] According to another aspect of the present invention, a communication circuit testing method is provided, which is applied to the communication circuit testing apparatus described in any of the above embodiments, the communication circuit testing method comprising:

[0025] The host computer generates configuration instructions based on the interaction content;

[0026] The area controller configures the communication circuit module under test according to the configuration instructions;

[0027] The communication circuit module under test acquires the sensing signal;

[0028] The area controller generates control signals based on the sensor signals;

[0029] The host computer performs functional tests on the communication circuit module under test according to the control signals.

[0030] The host computer acquires the serial data of the communication circuit module under test;

[0031] The host computer tests the power supply voltage, superimposed voltage of the signal output port, and trigger voltage of the communication circuit module under test based on the serial data.

[0032] Optionally, the step of configuring the communication circuit module under test according to the configuration instructions by the area controller includes:

[0033] Configure the general-purpose registers;

[0034] Configure the channel control register;

[0035] Configure channel-related registers;

[0036] Configure the diagnostic register.

[0037] Optionally, the steps for setting the general-purpose registers include:

[0038] The synchronization pulse length, the method for generating the mode pulse, and the external clock of the transceiver chip of the communication circuit module under test are set.

[0039] Configure the verification method for the sensor unit;

[0040] Set the output voltage of the drive pin of the transceiver chip of the communication circuit module under test;

[0041] The steps to set the channel control register include:

[0042] The output voltage of the drive pin of the transceiver chip of the communication circuit module under test is set to enable or disable.

[0043] Configure whether to enable the signal output pins of the transceiver chip of the communication circuit module under test;

[0044] The steps to set the channel-related registers include:

[0045] The synchronous pulse voltage, static current limit, number of connected sensor units, and communication rate of the signal output pin of the transceiver chip of the communication circuit module under test are set.

[0046] Configure whether the output pin of the transceiver chip of the communication circuit module under test is an interrupt output;

[0047] The steps to set up the diagnostic register include:

[0048] The test communication circuit module is configured to have output undervoltage fault, short circuit to ground fault, leakage current to ground fault, power supply short circuit fault, and short circuit fault between adjacent channels.

[0049] Setting up an open-circuit fault for the sensor unit

[0050] This invention protects the sensor unit by setting a shielding layer in the EMC load box and providing a test port within it to simulate sensor unit failures. The tested communication circuit module is configured via a host computer and a communication conversion module, and its functionality and interface voltage are tested after configuration. This invention also shields the sensor unit from electromagnetic interference using the EMC load box, reducing its impact, improving EMC testing accuracy, and lowering testing costs.

[0051] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of the present invention, nor is it intended to limit the scope of the invention. Other features of the invention will become readily apparent from the following description. Attached Figure Description

[0052] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0053] Figure 1 This is a schematic diagram of the structure of a communication circuit testing device provided in an embodiment of the present invention;

[0054] Figure 2 This is a schematic diagram of a host computer human-machine interface provided in an embodiment of the present invention;

[0055] Figure 3 This is a circuit schematic diagram of a communication circuit module under test provided in an embodiment of the present invention;

[0056] Figure 4 This is a flowchart of a communication circuit testing method provided in an embodiment of the present invention;

[0057] Figure 5 This is a flowchart of the configuration of the communication circuit module under test provided in an embodiment of the present invention. Detailed Implementation

[0058] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0059] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0060] This invention provides a communication circuit testing device for testing the communication module of an automotive controller. Figure 1 This is a schematic diagram of the structure of a communication circuit testing device provided in an embodiment of the present invention. (Refer to...) Figure 1 The testing device includes: a zone controller 110, an EMC load cell 120, and a host computer 130.

[0061] The area controller 110 is equipped with a communication circuit module under test (DUT) 111; an EMC load cell 120 is connected to the area controller 110; the EMC load cell 120 is equipped with a shielding layer to shield interference signals; the EMC load cell 120 is equipped with a sensor unit, which receives commands from the DUT 111 and feeds back data from the sensor unit to the DUT 111; the EMC load cell 120 is equipped with a test port 121 for connecting to a test device; this test device is used to simulate sensor unit failures and test the connection between the DUT 111 and the sensor unit. In addition, the test port 121 is also used to output signals for manual testing of the DUT 111.

[0062] A communication conversion module 140 connects the host computer 130 and the EMC load box 120. The host computer 130 communicates with the area controller 110 through the communication conversion module 140, which is used to convert the signal format. After the area controller 110 is working, the host computer 130 is used to test the shift register configuration associated with the communication circuit module 111 under test. The area controller 110 and the EMC load box 120 are located in the EMC laboratory (Electro Magnetic Compatibility Lab).

[0063] As can be understood, EMC testing refers to the testing of a device or system's ability to operate within its electromagnetic environment without causing unacceptable electromagnetic interference to any equipment in that environment. Because various types of electromagnetic interference exist in EMC laboratories, a shielding layer is installed in the EMC load box 120 to reduce the impact of electromagnetic interference on the sensor unit and to provide a good working environment for the sensor unit.

[0064] Figure 2 This is a schematic diagram of a host computer human-machine interface provided in an embodiment of the present invention. (Refer to...) Figure 2 For example, before testing the communication circuit module 111 under test, the area controller 110 is first activated or triggered. The area controller 110 can be triggered, for example, by a key signal, causing it to enter normal operating mode. Next, the host computer 130 sets the communication signals and file storage path of the communication conversion module 140.

[0065] After the communication conversion module 140 is configured, the host computer 130 configures the registers in the communication circuit module 111 under test in the area controller 110, thereby enabling the communication circuit module 111 under test to work normally. This allows the host computer 130 to communicate with the sensor unit through the communication circuit module 111 under test, and also enables the area controller 110 to communicate with the sensor unit through the communication circuit module 111 under test. It should be noted that the sensor unit is used to sense its environment, and the environmental variables sensed by the sensor unit depend on the sensor unit itself. For example, the sensor unit can be a height sensor or an acceleration sensor. Correspondingly, the height sensor is used to sense the height of the sensor itself, and the acceleration sensor is used to sense the acceleration of the sensor at the current moment. This embodiment does not impose any limitations on this.

[0066] It is understood that the communication circuit testing device provided in this embodiment of the invention can test various types of communication circuit modules. The communication circuit module to be tested only needs to be able to communicate with the area controller. This embodiment does not limit the type of the communication circuit module 111 under test. For ease of understanding, this embodiment uses the PSI5 communication module as an example of the communication circuit module 111 under test.

[0067] Table 1 provides an example of the register format of the communication circuit module under test.

[0068] Table 1

[0069]

[0070] During the configuration process of the host computer 130 on the registers of the communication circuit module 111 under test in the area controller 110, the host computer 130 first converts the configuration command into CAN communication format through the communication conversion module 140 and sends it to the area controller 110. The area controller 110 then configures the communication circuit module 111 under test according to the configuration command. Table 2 provides an example of the message data table of the host computer 130 when the area controller 110 configures the communication circuit module 111 under test. Specific message data can be found in Table 2.

[0071] Table 2

[0072]

[0073] In addition, the communication circuit module under test 111 sends serial data to the host computer 130. The host computer 130 analyzes the power supply voltage, superimposed voltage of the signal output port and trigger voltage of the communication circuit module under test 110 based on the serial data, compares the analyzed data with normal data, and writes the comparison results into the work report.

[0074] After the host computer 130 configures the communication circuit module 111 under test, the function of the communication circuit module 111 under test is tested.

[0075] When the testing equipment does not issue a test command to the sensor unit, the sensor unit sends sensing data to the area controller 110 through the communication under test module 111. The area controller 110 generates a control command based on the sensing data and sends the control command to the host computer 130 through the communication under test module 111. When the host computer 130 receives the control command, it indicates that the communication under test module is working normally; when the host computer 130 does not receive the control command, it indicates that the communication under test module is malfunctioning.

[0076] When the testing equipment does not issue a test command to the sensor unit, the sensor unit sends the sensor fault data to the host computer 130 through the communication module under test 111. When the host computer receives the fault data, it indicates that the communication circuit module under test is working normally; when the host computer does not receive the fault data, it indicates that the communication circuit module under test is malfunctioning.

[0077] The host computer 130 generates a test report based on the above test results and outputs the test report. Table 3 provides an example of a partial test report; please refer to Table 3 for specific test content.

[0078] Table 3

[0079]

[0080]

[0081] This invention protects the sensor unit by setting a shielding layer in the EMC load box 120, and sets a test port 121 in the EMC load box 120 to simulate sensor unit failure conditions. The communication circuit module 111 under test is configured via a host computer 130 and a communication conversion module 140, and its function and interface voltage are tested after configuration. This invention uses the EMC load box to shield against electromagnetic interference, reducing the impact of electromagnetic interference on the sensor unit, improving the accuracy of EMC testing, and reducing testing costs.

[0082] Based on the above embodiments, optionally, the EMC load cell includes: an analog unit and a signal transmission unit.

[0083] The simulation unit provides a simulation environment for the sensor unit. The signal transmission unit receives control signals sent by the area controller 110 and is connected to the area controller 110.

[0084] Specifically, the simulation unit is used to simulate the external environment and provide various sensor data for EMC testing. The signal transmission unit is used to bridge the communication conversion module 140 and the communication circuit under test module 111, thereby realizing the connection between the host computer 130 and the area controller 110. Since there are various electromagnetic interferences in the EMC laboratory, a signal transmission unit is set in the EMC load box 120 so that the control signals and serial data sent by the area controller 110 are transmitted to the host computer 130 through the data transmission unit, thereby reducing the impact of electromagnetic interference on the control signals and serial data.

[0085] Based on the above embodiments, optionally, refer to... Figure 1 The communication conversion module 140 includes a communication conversion unit 141 and an optical fiber bridging unit 142.

[0086] The communication conversion unit 141 is used to convert USB signals into CAN signals, or to convert CAN signals into USB signals; the first end of the communication conversion unit 141 is connected to the host computer, and the second end of the communication conversion unit 141 is connected to the fiber optic bridging unit 142.

[0087] It is understood that the host computer 130 communicates externally via USB, while the area controller 110 communicates externally via CAN. When the host computer 130 communicates with the area controller 110, a communication method conversion is required. Therefore, a communication conversion unit 141 is provided in the communication conversion module 140 to enable communication between the host computer 130 and the area controller 110.

[0088] The fiber optic bridging unit is used to transfer signals from outside the EMC laboratory to inside the EMC laboratory, or to transfer signals from inside the EMC laboratory to outside the EMC laboratory; the second end of the fiber optic bridging unit is connected to the communication circuit module under test.

[0089] It is understandable that, due to the different environments inside and outside the EMC laboratory, fiber optic cables are used for switching control signals and serial data when transmitting them between the two environments. Since the signals transmitted through the fiber optic cable are optical signals, optical signal transmission is unaffected by changes in the electromagnetic environment. Therefore, the CAN signal is converted into an optical signal for transmission between the EMC laboratory and outside, and then converted back into a CAN signal after the environmental conversion is completed. This reduces the impact of environmental conversion on the test results.

[0090] Based on the above embodiments, optionally, refer to... Figure 1 The fiber optic bridging unit includes: a first optical bridge 1421, a second optical bridge 1422, and optical fibers.

[0091] Both the first optical bridge 1421 and the second optical bridge 1422 are used for signal conversion, converting CAN signals into optical signals, or vice versa. The first optical bridge 1421 is located outside the EMC laboratory. The first end of the first optical bridge 1421 serves as the first end of the fiber optic bridging unit. The second end of the first optical bridge 1421 is connected to the first end of the second optical bridge 1422 via optical fiber. The second end of the second optical bridge 1422 serves as the second end of the fiber optic bridging unit.

[0092] Based on the above embodiments, optionally, refer to... Figure 1 The testing apparatus also includes an artificial power network 150.

[0093] The artificial power network 150 is used to provide power to the EMC load box 120, and the artificial power network 150 is connected to the EMC load box 120; the EMC load box 120 and the communication circuit module under test 111 are connected by twisted pair cable.

[0094] Specifically, twisted-pair cable is the most commonly used transmission medium in structured cabling projects. It consists of two copper wires with insulating protective layers. By twisting the two insulated copper wires together at a certain density, the electromagnetic waves radiated by each wire during transmission are canceled out by the electromagnetic waves emitted by the other wire, effectively reducing the degree of signal interference.

[0095] It should be noted that the communication circuit module 111 under test is a PSI5 communication circuit module. The characteristics of PSI5 communication signals are that the voltage power supply line and the signal line are transmitted on the same line, and the data on the signal line is transmitted digitally using Manchester encoding. The communication rate is available in two types: 125kbps and 189kbps.

[0096] Based on the above embodiments, optionally, refer to... Figure 1 Antenna 160 is installed in the EMC laboratory. Antenna 160 is used to generate interference signals.

[0097] Figure 3 This is a circuit schematic diagram of a communication circuit module under test provided in an embodiment of the present invention. Exemplarily, refer to... Figure 3 The communication circuit module under test is a PSI5 communication circuit module. The drive control pin VGS of the transceiver chip 200 of the PSI5 communication circuit module is used to control the power supply of the drive pin VAS. The drive pin VAS of the transceiver chip 200 is used to control the power supply of the first signal output pin PSI1 and the second signal output pin PSI2 of the transceiver chip 200. The first signal output pin PSI1 and the second signal output pin PSI2 of the transceiver chip 200 are used to power the sensor unit and to communicate with the sensor unit. The first signal output pin PSI1 of the transceiver chip 200 is connected to the sensor unit through the first RC matching unit 210, and the second signal output pin PSI2 of the transceiver chip 200 is connected to the sensor unit through the second RC matching unit 220. The first high-level pin BH1 of the transceiver chip 200 is connected to the sensor unit through the sixth... Capacitor C6 is connected to the first low-level pin BL1 of transceiver chip 200. The second high-level pin BH2 of transceiver chip 200 is connected to the second low-level pin BL2 of transceiver chip 200 through the seventh capacitor C7. The sixth capacitor C6 is used to provide the trigger voltage for the sensor unit. The seventh capacitor C7 is used to provide the trigger voltage for the sensor unit. The first output pin DOUT1 of transceiver chip 200 is used to interrupt signal transmission and data reading. The second output pin DOUT2 of transceiver chip 200 is used to interrupt signal transmission and data reading. The enable pin CS, the clock pin SCLK, the data input pin MOSI, and the data output pin MISO of transceiver chip 200 are used to transmit control signals and serial data of the internal register of transceiver chip 200. The reset pin RESETN of transceiver chip 200 is used to reset transceiver chip 200.

[0098] Specifically, the VGS drive control pin of the transceiver chip 200 in the PMOSI5 communication circuit module controls the conduction of the external MOS transistor Q1 to power the drive pin VAS. The first signal output pin PMOSI1 and the second signal output pin PMOSI2 are powered by the chip's drive pin VAS. The first capacitor C1 and the second capacitor C2 are two power supply filter capacitors for the drive pin VAS. The first signal output pin PMOSI1 and the second signal output pin PMOSI2 power the sensor unit and enable communication with it. The sixth capacitor C6 and the seventh capacitor C7 are two bootstrap capacitors, which provide pulse voltage to trigger the external sensor. The second resistor R2, the ninth capacitor C9, and the eighth capacitor C8 are matching resistors and capacitors for the first signal output pin PMOSI1. The third resistor R3, the tenth capacitor C10, and the eleventh capacitor C11 are matching resistors and capacitors for the second signal output pin PMOSI2. The first output pin DOUT1 and the second output pin DOUT2... 2 is used as an interrupt pin. When the internal register is full, it interrupts the MCU signal and reads the data. The fourth resistor R4 is the redundant resistor for the first output pin DDOUT1, and the fifth resistor R5 is the redundant resistor for the second output pin. The enable pin CS, clock pin SCLK, data input pin MOSI, and data output pin MISO of the transceiver chip 200 are respectively connected to the four corresponding pins on the area controller 110 to transmit the control signals and serial data of the internal register of the transceiver chip 200. The enable pin CS is pulled up to +5V through the seventh resistor R7, and the data output pin MISO is pulled up to +5V through the eighth resistor R8.

[0099] This invention also provides a communication circuit testing method, which can be applied to the communication circuit testing device provided in any of the above embodiments. Figure 4 This is a flowchart of a communication circuit testing method provided in an embodiment of the present invention. (Refer to...) Figure 4 The communication circuit testing method includes:

[0100] S110, the host computer generates configuration instructions based on the interaction content.

[0101] Specifically, a human-machine interface is set up in the host computer. Users can input configuration information through the human-machine interface, and the host computer generates corresponding configuration commands based on the configuration information and sends the configuration commands to the area controller. It should be noted that the host computer can be a computer. This embodiment does not limit the specific form of the host computer, as long as the host computer can meet the usage requirements.

[0102] S120, the area controller configures the communication circuit module under test according to the configuration instructions.

[0103] Specifically, the area controller receives the configuration instructions sent by the host computer, parses the configuration instructions, and configures the registers of the communication circuit module under test according to the parsed instructions.

[0104] S130, The communication circuit module under test acquires the sensing signal.

[0105] Specifically, the sensor unit sends the sensing data to the communication circuit under test.

[0106] S140, The area controller generates control signals based on the sensor signals.

[0107] Specifically, the communication format used between the communication circuit module under test and the sensor unit is PSI5 communication. Therefore, after receiving the sensor data, the communication circuit module under test also performs format conversion on the sensor data, converting the sensor data format into a format that the area controller can recognize. The area controller generates a control signal based on the converted sensor data and sends the control signal to the host computer.

[0108] S150: The host computer performs functional tests on the communication circuit module under test based on control signals.

[0109] Specifically, when the host computer receives the control command, it indicates that the communication circuit module under test is working normally; when the host computer does not receive the control command, it indicates that the communication circuit module under test is malfunctioning.

[0110] S160, The host computer acquires the serial data of the communication circuit module under test.

[0111] For example, the area controller sends a debugging command to the communication circuit module under test. The communication circuit module under test generates serial data according to the debugging command and sends the serial data to the area controller. The area controller then sends the serial data to the host computer.

[0112] S170: The host computer tests the power supply voltage, superimposed voltage of the signal output port, and trigger voltage of the communication circuit module under test based on serial data.

[0113] For example, the host computer parses the serial data sent by the area controller and obtains the power supply voltage, the superimposed voltage of the signal output port, and the trigger voltage of the communication circuit module under test. The measured voltages are then compared with the corresponding reference values ​​to obtain the test results.

[0114] Figure 5 This is a flowchart illustrating the configuration of the communication circuit module under test provided in an embodiment of the present invention. Optionally, based on the above embodiments, refer to... Figure 5 The steps of configuring the communication circuit module under test by the area controller according to the configuration instructions include:

[0115] S121, Set general-purpose registers.

[0116] For example, the synchronization pulse length, the method for generating the mode pulse, and the external clock of the transceiver chip of the communication circuit module under test are set, the verification method of the sensor unit is set, and the output voltage of the drive pin of the transceiver chip of the communication circuit module under test is set.

[0117] S122, Set the channel control register.

[0118] For example, the output voltage of the drive pin of the transceiver chip of the communication circuit module under test is enabled or disabled, and the signal output pin of the transceiver chip of the communication circuit module under test is enabled or disabled.

[0119] S123, Set the channel-related registers.

[0120] For example, the synchronization pulse voltage, quiescent current limit, number of connected sensor units, and communication rate of the signal output pins of the transceiver chip of the communication circuit module under test are set, as is whether the output pins of the transceiver chip of the communication circuit module under test are interrupt outputs. It should be noted that different communication circuit modules under test contain different numbers of channels. When the communication circuit module under test contains multiple channels, the channel-related registers for each channel need to be set.

[0121] S124. Set the diagnostic register.

[0122] Specifically, the test communication circuit module is configured to have output undervoltage fault, short circuit to ground fault, leakage current to ground fault, power supply short circuit fault, and short circuit fault between adjacent channels, and the sensor unit is configured to have open circuit fault.

[0123] It should be noted that the specific settings can be determined based on the communication circuit module under test during actual testing, and this embodiment does not impose any restrictions on this.

[0124] It should be understood that the various forms of processes shown above can be used, with steps reordered, added, or deleted. For example, the steps described in this invention can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution of this invention can be achieved, and this is not limited herein.

[0125] The specific embodiments described above do not constitute a limitation on the scope of protection of this invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this invention should be included within the scope of protection of this invention.

Claims

1. A method for testing communication circuits, applied to a communication circuit testing device, characterized in that, The communication circuit testing device includes: A zone controller, wherein the zone controller is equipped with a communication circuit module under test; An EMC load cell is connected to the area controller. The EMC load cell is equipped with a shielding layer to shield interference signals. The EMC load cell is equipped with a sensor unit to receive commands from the communication circuit module under test and to feed back the data in the sensor unit to the communication circuit module under test. The EMC load cell is equipped with a test port for connecting to test equipment. A host computer is connected to the area controller via a communication conversion module. The host computer communicates with the area controller through the communication conversion module. The host computer is used to configure the shift register associated with the test communication circuit module after the area controller is working. The area controller and the EMC load cell are located in the EMC laboratory. The communication circuit testing method includes: The host computer generates configuration instructions based on the interaction content; The area controller configures the communication circuit module under test according to the configuration instructions; The communication circuit module under test acquires the sensing signal; The area controller generates control signals based on the sensor signals; The host computer performs functional tests on the communication circuit module under test according to the control signals. The host computer acquires the serial data of the communication circuit module under test; The host computer tests the power supply voltage, superimposed voltage of the signal output port, and trigger voltage of the communication circuit module under test based on the serial data.

2. The communication circuit testing method according to claim 1, characterized in that, The EMC load cell includes: an analog unit and a signal transmission unit; The simulation unit is used to provide a simulation environment for the sensor unit; The signal transmission unit is used to receive control signals sent by the area controller, and the signal transmission unit is connected to the area controller.

3. The communication circuit testing method according to claim 1, characterized in that, The communication conversion module includes: a communication conversion unit and an optical fiber bridging unit; The communication conversion unit is used to convert USB signals into CAN signals, or to convert CAN signals into USB signals; the first end of the communication conversion unit is connected to the host computer, and the second end of the communication conversion unit is connected to the fiber optic bridging unit. The fiber optic bridging unit is used to transfer signals from outside the EMC laboratory to inside the EMC laboratory, or to transfer signals from inside the EMC laboratory to outside the EMC laboratory; the second end of the fiber optic bridging unit is connected to the communication circuit module under test.

4. The communication circuit testing method according to claim 3, characterized in that, The fiber optic bridging unit includes: a first optical bridge, a second optical bridge, and optical fibers; Both the first optical bridge and the second optical bridge are used for signal conversion, converting the CAN signal into an optical signal, or converting the optical signal into a CAN signal; The first optical bridge is located outside the EMC laboratory. The first end of the first optical bridge serves as the first end of the fiber optic bridging unit. The second end of the first optical bridge is connected to the first end of the second optical bridge via the optical fiber. The second end of the second optical bridge serves as the second end of the fiber optic bridging unit.

5. The communication circuit testing method according to claim 1, characterized in that, The communication circuit testing device also includes: an artificial power network; The artificial power network is used to provide power to the EMC load cell, and the artificial power network is connected to the EMC load cell; The EMC load cell is connected to the communication circuit module under test via a twisted pair cable.

6. The communication circuit testing method according to claim 1, characterized in that, An antenna is installed in the EMC laboratory, and the antenna is used to generate the interference signal. The communication circuit module under test is a PSI5 communication circuit module. The drive control pin of the transceiver chip in the PSI5 communication circuit module is used to control the power supply of the drive pin. The drive pin of the transceiver chip is used to control the power supply of the first signal output pin and the second signal output pin of the transceiver chip. The first and second signal output pins of the transceiver chip are used to power the sensor unit and to communicate with the sensor unit. The first signal output pin of the transceiver chip is connected to the sensor unit through a first RC matching unit, and the second signal output pin of the transceiver chip is connected to the sensor unit through a second RC matching unit. The first high-level terminal of the transceiver chip is connected to the sixth... A capacitor is connected to the first low-level terminal of the transceiver chip. The second high-level terminal of the transceiver chip is connected to the second low-level terminal of the transceiver chip through a seventh capacitor. The sixth capacitor is used to provide a trigger voltage for the sensor unit. The seventh capacitor is used to provide a trigger voltage for the sensor unit. The first output pin of the transceiver chip is used to interrupt signal transmission and data reading. The second output pin of the transceiver chip is used to interrupt signal transmission and data reading. The enable pin, clock pin, data input pin, and data output pin of the transceiver chip are used to transmit control signals of the internal registers of the transceiver chip and serial data. The reset pin of the transceiver chip is used to reset the transceiver chip.

7. The communication circuit testing method according to claim 1, characterized in that, The steps for the area controller to configure the communication circuit module under test according to the configuration instructions include: Configure the general-purpose registers; Configure the channel control register; Configure channel-related registers; Configure the diagnostic register.

8. The communication circuit testing method according to claim 7, characterized in that, The steps to set up the general-purpose registers include: The synchronization pulse length, the method for generating the mode pulse, and the external clock of the transceiver chip of the communication circuit module under test are set. Configure the verification method for the sensor unit; Set the output voltage of the drive pin of the transceiver chip of the communication circuit module under test; The steps to set the channel control register include: The output voltage of the drive pin of the transceiver chip of the communication circuit module under test is set to enable or disable. Configure whether to enable the signal output pins of the transceiver chip of the communication circuit module under test; The steps to set the channel-related registers include: The synchronous pulse voltage, static current limit, number of connected sensor units, and communication rate of the signal output pin of the transceiver chip of the communication circuit module under test are set. Configure whether the output pin of the transceiver chip of the communication circuit module under test is an interrupt output; The steps to set up the diagnostic register include: The test communication circuit module is configured to have output undervoltage fault, short circuit to ground fault, leakage current to ground fault, power supply short circuit fault, and short circuit fault between adjacent channels. The open-circuit fault of the sensor unit is configured.

Images