ECG automated testing methods, apparatus, electronic equipment, and readable storage media

Abstract

This application relates to an automated ECG testing method, apparatus, electronic device, and readable storage medium. The method includes the following steps: if a test command is triggered, obtaining the sampling position of the device under test (DUT) corresponding to the test command; determining the estimated test time for each test module based on the sampling position; selecting the test module with the shortest estimated test time as the first target test module; and moving the DUT to the first target test module for testing. By determining the testing needs of the DUT through the triggering of a test command and selecting the test module with the shortest estimated test time as the test module for the DUT, the testing time for a single DUT is minimized, improving testing efficiency. Simultaneously, it achieves automated testing of the DUT, avoiding the problems of low production efficiency and poor test quality caused by manual methods.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of device testing, and in particular to an ECG automatic testing method and device, an electronic device, and a readable storage medium. BACKGROUND

[0002] Currently, the functional testing of a watch ECG is often performed by manually taking and placing the target device; when a watch is mass-produced, the manual method can result in missed sides, repeated testing, and the like, affecting production efficiency and testing quality. SUMMARY

[0003] The present application provides an ECG automatic testing method and device, an electronic device, and a readable storage medium, aiming to solve the technical problem of low production efficiency and poor testing quality in the prior art.

[0004] To solve the above technical problem or at least partially solve the above technical problem, the present application provides an ECG automatic testing method, which comprises the steps of:

[0005] If a test instruction is triggered, the sampling position of the device to be tested corresponding to the test instruction is obtained;

[0006] The expected test time of each test module is determined according to the sampling position;

[0007] The test module with the least expected test time is taken as a first target test module;

[0008] The device to be tested is moved to the first target test module for testing.

[0009] Optionally, the step of determining the expected test time of each test module according to the sampling position comprises:

[0010] The shortest placement path time between the module position of each test module and the sampling position is determined;

[0011] The expected test time of each test module is determined according to the shortest placement path time.

[0012] Optionally, the step of determining the expected test time of each test module according to the shortest placement path time comprises:

[0013] For each test module, the remaining test time of the test module and the shortest output path time between the module position of the test module and the output position are obtained;

[0014] It is judged whether the remaining test time is greater than the shortest placement path time;

[0015] if the remaining test time is greater than the shortest placement path time, then the sum of the remaining test time and the shortest output path time is taken as the expected test time corresponding to the test module;

[0016] if the remaining test time is less than or equal to the shortest placement path time, then the sum of the shortest placement path time and the shortest output path time is taken as the expected test time corresponding to the test module.

[0017] Optionally, the step of moving the device under test to the first target test module for test operation comprises:

[0018] moving the device under test to a waiting area corresponding to the first target test module, and monitoring the test state of the first target test module;

[0019] when the test state of the first target test module is test end, taking out the tested device in the first target test module, and placing the device under test in the first target test module for test operation.

[0020] Optionally, after the step of moving the device under test to the first target test module for test operation comprises:

[0021] obtaining the test result of the device under test;

[0022] if the test result of the device under test is a defective product, determining whether the number of times of test operation of the device under test in the first target test module is greater than a preset number threshold;

[0023] if the number of times of test operation of the device under test in the first target test module is greater than the preset number threshold, determining a second target test module;

[0024] moving the device under test to the second target test module for test operation, and taking the test result corresponding to the second target test module as the test result of the device under test.

[0025] Optionally, after the step of moving the device under test to the first target test module for test operation comprises:

[0026] obtaining the test result of the device under test, and determining whether the test result is a qualified product;

[0027] if the test result is a qualified product, moving the device under test to a qualified product output position as a tested device.

[0028] To achieve the above objectives, the present invention also provides an automatic ECG testing device, which includes a control module, a transmission module, a robotic arm, and multiple testing modules; the detection end of the control module is connected to the transmission module, the robotic arm, and the testing modules respectively, and the output end of the control module is connected to the control end of the robotic arm, wherein:

[0029] The transmission module is used to trigger a test command containing the sampling position when the device under test moves to the sampling position of the transmission module, and send the test command to the control module;

[0030] The control module is used to determine the expected test time of each test module according to the sampling position in the test instruction after receiving the test instruction, and to take the test module with the shortest expected test time as the first target test module, and send the action signal corresponding to the first target test module to the robotic arm.

[0031] The robotic arm is used to move the device under test to the first target test module for testing after receiving the action signal.

[0032] Optionally, the robotic arm is a six-axis robotic arm.

[0033] Optionally, the test module includes a test unit and a position sensor, wherein the test unit and the position sensor are respectively connected to the control module;

[0034] The testing unit is used to perform testing operations on the device under test and send the test results and the test status corresponding to the testing module to the control module.

[0035] The position sensor is used to detect the position offset of the test module and send the position offset to the control module;

[0036] The control module is used to calibrate the position of the test module using the position offset.

[0037] Optionally, the transmission module includes an input conveyor belt, a first lifting unit, a sampling position, an output position, a second lifting unit, and an output conveyor belt; wherein:

[0038] The input conveyor belt is used to move the device under test to the first lifting unit;

[0039] The first lifting unit is used to move the device under test to the sampling position;

[0040] The second lifting unit is used to move the tested device to the output conveyor belt.

[0041] To achieve the above objectives, the present invention also provides an electronic device, the electronic device including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program, when executed by the processor, implements the steps of the ECG automatic testing method as described above.

[0042] To achieve the above objectives, the present invention also provides a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps of the ECG automatic testing method as described above.

[0043] This invention proposes an automated ECG testing method, apparatus, electronic device, and readable storage medium. Upon triggering a test command, the method acquires the sampling position of the device under test (DUT) corresponding to the test command; determines the estimated test time for each test module based on the sampling position; designates the test module with the shortest estimated test time as the first target test module; and moves the DUT to the first target test module for testing. By determining the testing needs of the DUT through the triggering of test commands and selecting the test module with the shortest estimated test time, the testing time for a single DUT is minimized, improving testing efficiency. Simultaneously, it achieves automated testing of the DUT, avoiding the low production efficiency and poor test quality problems caused by manual methods. Attached Figure Description

[0044] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0045] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, for those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0046] Figure 1 This is a flowchart illustrating the first embodiment of the ECG automatic testing method of the present invention;

[0047] Figure 2 This is a schematic diagram of the module structure of the ECG automatic testing device of the present invention;

[0048] Figure 3 This is a schematic diagram of the specific structure of the ECG automatic testing device of the present invention;

[0049] Figure 4 This is a schematic diagram of the module structure of the electronic device of the present invention.

[0050] Explanation of icon numbers:

[0051] Reference Name Reference Name 100 Control module 300 Mechanical arm 200 Transmission module 310 Clamping jaw 210 Input conveyor belt 400 Test module 211 Barrier block 411 Push-pull slot 212 Infrared photoelectric sensor 412 Push-pull fixing support 221 Lifting device 413 Driving linear rod 222 Side pushing device 414 Servo motor 230 Second lifting unit 420 Position sensor 240 Output conveyor belt 500 Device under test Detailed Implementation

[0052] It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention. To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present application, and not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of this application.

[0053] This invention provides an automated ECG testing method, referring to... Figure 1 , Figure 1 This is a flowchart illustrating the first embodiment of the ECG automatic testing method of the present invention. The method includes the following steps:

[0054] Step S10: If a test command is triggered, the sampling position of the device under test 500 corresponding to the test command is obtained;

[0055] Test commands are used to instruct the execution of test operations; test commands can be triggered manually by the tester or automatically by detecting the position of the device under test 500, such as when the target device reaches the sampling position.

[0056] The sampling position is the waiting position of the device under test 500 during the test operation. It can be understood that the sampling position can be a pre-set fixed position, such as all devices under test 500 waiting for test operations in the same position. Since the sampling position is fixed, as long as the test command is triggered, the preset sampling position can be used as the current sampling position. Multiple sampling positions can also be set, and the corresponding sampling position can be determined according to the trigger indication of the test command. For example, if the device under test 500 arrives at the sampling position, the sensor set at the sampling position detects the device under test 500, thereby triggering the test command. Based on the correspondence between the test command, the corresponding sensor, and the sampling position, the current sampling position can be determined.

[0057] Step S20: Determine the estimated test time for each test module 400 based on the sampling location;

[0058] The estimated test time indicates the estimated time required for the device under test (DUT) 500 to complete the test process. A complete test process for DUT 500 includes moving from the sampling position to the test module 400, performing test operations on DUT 500 through the test module 400, and then moving DUT 500 from the test module 400 to the output position. It is understood that, generally, the time for the test module 400 to perform test operations on DUT 500 is fixed. However, due to the different relative positions of the test module 400 to the sampling position and the output position, the time required for DUT 500 to move between the sampling position, the test module 400, and the output position varies for different test modules 400. Therefore, the estimated test time varies for different test modules 400 and needs to be determined based on the sampling position.

[0059] Step S30: The test module 400 with the shortest expected test time is selected as the first target test module 400;

[0060] It is understandable that when the expected test time is the shortest, the corresponding test module 400 is the test module 400 with the highest current testing efficiency for the device under test 500. Therefore, by using the test module 400 with the shortest expected test time as the first target test module 400 for testing the device under test 500, the testing efficiency of the device under test 500 can be improved.

[0061] Step S40: Move the device under test 500 to the first target test module 400 for testing.

[0062] After the first target test module 400 is determined, the device under test 500 can be moved to the first target test module 400 for testing. It is understandable that, depending on the specific project requiring testing, the test module 400 can be configured with corresponding structures and programs to meet the testing needs.

[0063] The present invention also provides an automatic ECG testing device applied to the above-mentioned automatic ECG testing method, see [link to relevant documentation]. Figure 2 The ECG automatic testing device includes a control module 100, a transmission module 200, a robotic arm 300, and multiple testing modules 400. The detection end of the control module 100 is connected to the transmission module 200, the robotic arm 300, and the testing modules 400, respectively. The output end of the control module 100 is connected to the control end of the robotic arm 300.

[0064] The transmission module 200 is used to trigger a test command containing the sampling position when the device under test 500 moves to the sampling position of the transmission module 200, and send the test command to the control module 100.

[0065] The control module 100 is used to determine the expected test time corresponding to each test module 400 according to the sampling position in the test instruction after receiving the test instruction, and to take the test module 400 with the shortest expected test time as the first target test module 400, and send the action signal corresponding to the first target test module 400 to the robotic arm 300.

[0066] The robotic arm 300 is used to move the device under test 500 to the first target test module 400 for testing after receiving the action signal.

[0067] The specific control of the ECG automatic testing device can be implemented with reference to the aforementioned ECG automatic testing method, and will not be repeated here. It is understood that the components of the above-mentioned ECG automatic testing device can be specifically configured according to actual needs, such as setting the robotic arm 300 as a six-axis robotic arm 300.

[0068] Further details will follow. Figure 3 The transmission module 200 includes an input conveyor belt 210, a first lifting unit, a sampling position, an output position, a second lifting unit 230, and an output conveyor belt 240; wherein:

[0069] The input conveyor belt 210 is used to move the device under test 500 to the first lifting unit;

[0070] The first lifting unit is used to move the device under test 500 to the sampling position;

[0071] The second lifting unit 230 is used to move the tested device to the output conveyor belt 240.

[0072] The input conveyor belt 210, the first lifting unit, and the sampling position form a continuous input transmission path, while the output position, the second lifting unit 230, and the output conveyor belt 240 form a continuous output transmission path.

[0073] Furthermore, a baffle block 211 can be set on the input conveyor belt 210, an anti-reverse detection sensor can be set at the output end of the input conveyor belt 210, and the output end of the input conveyor belt 210 is connected to the first lifting unit.

[0074] The baffle block 211 is used to block the device under test 500 when it moves on the input conveyor belt 210, so that one device under test 500 enters the detection position of the anti-reverse detection sensor, and avoids the device under test 500 at the detection position of the anti-reverse detection sensor being squeezed in the output direction by the conveyor belt. At the same time, it prevents the first lifting unit from pushing other devices under test 500 out of the input conveyor belt 210 when lifting the device under test 500.

[0075] The lifting unit includes a lifting device 221 and a side-pushing device 222. The lifting device 221 is used to generate displacement of the device under test 500, and the side-pushing device 222 is used to fix the displacement path of the device under test 500.

[0076] The anti-reverse detection sensor is used to detect the placement orientation of the device under test 500. When the placement orientation of the device under test 500 is detected to be positive, the first lifting unit is controlled to lift the device under test 500 to the sampling position. When the placement orientation of the device under test 500 is detected to be reversed, the robotic arm 300 is used to adjust the placement orientation of the device under test 500 to positive before the first lifting unit is controlled to lift the device under test 500 to the sampling position again. It should be noted that the robotic arm 300 can be additionally configured to adjust the placement orientation of the device under test 500. Since anti-reverse situations are relatively rare, the aforementioned robotic arm 300 can also be used to adjust the placement orientation of the device under test 500 to reduce costs.

[0077] After the test operation of the device under test 500 is completed, it becomes a tested device. The robotic arm 300 moves the tested device to the output position, and the second lifting unit 230 lifts the tested device to the output conveyor belt 240 for output.

[0078] It should be noted that the sampling position can also be set as a qualified position and a defective position based on the test results. Correspondingly, the qualified position corresponds to the second qualified lifting unit and the qualified output conveyor belt 240, and the defective position corresponds to the second defective lifting unit and the defective output conveyor belt 240.

[0079] This embodiment determines the testing requirements of the device under test (DUT) 500 by triggering test commands, and selects the test module 400 with the shortest test time as the test module 400 for the DUT 500. This minimizes the test time for a single DUT 500, improves testing efficiency, and enables automated testing of the DUT 500, avoiding the problems of low production efficiency and poor test quality caused by manual methods.

[0080] Furthermore, in the first embodiment of the ECG automatic testing method of the present invention based on the first embodiment of the present invention, step S20 includes the following steps:

[0081] Step S21: Determine the time required for the shortest placement path between the module position of each test module 400 and the sampling position;

[0082] Step S22: Determine the estimated test time for each of the test modules 400 based on the shortest placement path time.

[0083] The shortest placement path time indicates the time required between the moment the robotic arm 300 moves and the moment the device under test 500 is moved to the test module 400 via the shortest path. Generally, the shortest path between the sampling position and the test module 400 is a straight path. It is understood that in this embodiment, the movement of the device under test 500 is achieved by the robotic arm 300. When the test command is triggered, the position of the robotic arm 300 is uncertain. Therefore, the shortest placement path includes two segments: the path from the robotic arm 300's position to the sampling position, and the path from the sampling position to the test module 400. After determining the path, the corresponding shortest placement path time can be determined based on the moving speed of the robotic arm 300.

[0084] A coordinate system can be established in advance, and fixed positions can be determined in the coordinate system in the form of coordinates, such as sampling position, output position, and module position of test module 400. When determining the time consumption between the action position and the sampling position, the current position of the action position in the coordinate system can be obtained, and then the distance between the current position and the sampling position can be calculated.

[0085] Due to the varying location settings of the test module 400, the distance between the sampling position and different test modules 400 differs. Therefore, the time taken from the sampling position to the test module 400 affects the difference in the expected test time for different test modules 400. It is understandable that, since the module position and sampling position of the test module 400 are fixed, the time taken between different module positions and the sampling position can be pre-determined and stored based on the actual settings of the test module 400 and the sampling position. When calculating the expected test time, the stored time for the corresponding test module 400 can be directly retrieved for calculation.

[0086] Furthermore, the test module 400 includes a test unit and a position sensor 420, the test unit and the position sensor 420 being connected to the control module 100 respectively;

[0087] The test unit is used to perform test operations on the device under test 500 and send the test results and the test status corresponding to the test module 400 to the control module 100.

[0088] The position sensor 420 is used to detect the position offset of the test module 400 and send the position offset to the control module 100;

[0089] The control module 100 is used to calibrate the module position of the test module 400 by means of the position offset.

[0090] The specific structure of the test unit can be set according to actual test needs. In this embodiment, the test unit includes a sliding fixing bracket 412, a servo motor 414, a drive linear rod 413, a sliding slot 411, a through-beam photoelectric sensor 212, and a test drawer. The sliding fixing bracket 412 is fixed to the front panel of the test drawer with screws. The sliding fixing bracket 412 is connected to the servo motor 414 and the drive linear rod 413 with sheet metal structural screws. The through-beam photoelectric sensor 212 is set on the side of the sliding slot 411. The sliding slot 411 is the placement position of the device under test 500. When the device under test 500 is placed in the sliding slot 411, the light propagation path of the through-beam photoelectric sensor 212 is blocked by the device under test 500. At this time, the placement state of the device under test 500 is detected, and the test operation can be started.

[0091] The servo motor 414 is controlled to move the sliding slot 411 in and out. In practical applications, after the servo motor 414 or the sheet metal screws have been running for a long time, the position of the sliding slot 411 will shift. If the shift is too large, the test unit may collide with the device under test 500 when the robotic arm 300 places the device under test 500, or the device under test 500 may not be accurately placed in the sliding slot 411. To avoid this problem, a position sensor 420 is provided in this embodiment. When setting the test unit, the coordinates of the sliding slot 411 in the coordinate system are determined and associated with the position sensor 420. During the application phase, the coordinates of the sliding slot 411 are corrected and updated using the detection data of the position sensor 420, so that the module position of the test module 400 always matches the actual position. Furthermore, the sliding slot 411 moves in the sliding direction, and its position shift also occurs in the sliding direction. Therefore, when calibrating the module position, the calibration in the sliding direction can be focused on.

[0092] Further, step S22 includes the following steps:

[0093] Step S221: For each of the test modules 400, obtain the remaining test time of the test module 400 and the shortest output path time between the module position and the output position of the test module 400.

[0094] Step S222: Determine whether the remaining test time is greater than the shortest placement path time;

[0095] Step S223: If the remaining test time is greater than the shortest placement path time, then the sum of the remaining test time and the shortest output path time is taken as the expected test time corresponding to the test module 400.

[0096] Step S224: If the remaining test time is less than or equal to the shortest placement path time, then the sum of the shortest placement path time and the shortest output path time is taken as the expected test time corresponding to the test module 400.

[0097] The remaining test time is the remaining time of the test operation currently being performed by test module 400. It can be understood that test module 400 needs to complete the test operation on the currently placed device under test 500 before it can perform the test operation on the next device under test 500.

[0098] If the remaining test time is greater than the shortest placement path time, when the robotic arm 300 moves the device under test 500 to the test module 400, the corresponding test module 400 is still performing the test operation of the previous device under test 500. That is, the shortest placement path time can be included in the remaining test time. Therefore, the sum of the remaining test time and the shortest output path time can reflect the expected test time of the test module 400.

[0099] It should be noted that, under normal circumstances, the time for each test module 400 to perform test operations on the device under test 500 is consistent. Therefore, when calculating the estimated test time, the time for performing test operations can be uniformly excluded; thus, the obtained estimated test time can reflect the differences between different test modules 400.

[0100] When the remaining test time is less than or equal to the shortest placement path time, the robotic arm 300 moves the device under test 500 to the test module 400. At this point, the test module 400 is idle and can directly perform test operations on the device under test 500. Therefore, the sum of the shortest prevention path time and the shortest output path time reflects the expected test time corresponding to the test module 400. Specifically:

[0101]

[0102] Among them, T t To estimate the test duration, T n For the remaining test time, T i For the shortest placement path time, T o The time taken for the shortest output path.

[0103] Further, step S40 includes the following steps:

[0104] Step S41: Move the device under test 500 to the waiting area corresponding to the first target test module 400, and monitor the test status of the first target test module 400;

[0105] Step S42: When the test status of the first target test module 400 is "test completed", the tested device in the first target test module 400 is taken out, and the device under test 500 is placed in the first target test module 400 for testing.

[0106] After identifying the first target test module 400, the robotic arm 300 can be controlled to move the device under test 500 from the sampling position to the test module 400. If the remaining test time of the first target test module 400 is greater than the shortest placement path time, it is necessary to wait for the test operation of the test module 400 to complete. The waiting area can be set to the area near the test module 400, such as directly above the test module 400, based on actual needs.

[0107] After the first target test module 400 completes the test, the tested device in the first target test module 400 is taken out and placed into the device under test 500 to start the test operation.

[0108] This embodiment can accurately determine the expected test time.

[0109] Furthermore, in the third embodiment of the ECG automatic testing method of the present invention based on the first embodiment of the present invention, the step S40 is followed by the following step:

[0110] Step S50: Obtain the test results of the device under test 500;

[0111] Step S60: If the test result of the device under test 500 is a defective product, then determine whether the number of times the device under test 500 performs test operations in the first target test module 400 is greater than a preset number threshold.

[0112] Step S70: If the number of times the device under test 500 performs test operations in the first target test module 400 is greater than a preset number threshold, then the second target test module 400 is determined.

[0113] Step S80: Move the device under test 500 to the second target test module 400 for testing, and take the test result corresponding to the second target test module 400 as the test result of the device under test 500.

[0114] Based on the test operation of the device under test 500, a test result including defective or qualified products can be obtained. It can be understood that when the test result is a defective product, there may be a situation of failure or interference of the test module 400. Therefore, in order to avoid the influence of the failure or interference of the test module 400 on the test result of the device under test 500, when the test result is a defective product, the test operation is performed on the device under test 500 again through the first target test module 400; if the number of times that the test result of the device under test 500 in the first target test module 400 is a defective product reaches the preset number threshold, it is considered that there is a problem with at least one of the device under test 500 and the first target test module 400. At this time, in order to determine whether the device under test 500 is a defective product or the first target test module 400 fails, the device under test 500 is transferred to another test module 400 for test operation, that is, the second target test module 400; the specific value of the preset number threshold can be set according to actual application needs.

[0115] It should be noted that when determining the second target test module 400, it can also be determined based on the determination method of the foregoing first target test module 400; specifically, for example, the first target test module 400 is analogized to the foregoing sampling position, and the corresponding test time consumption between the module position of the first target test module 400 and other test modules 400 except the first target test module 400 is determined. The specific calculation will not be elaborated here.

[0116] If the test result obtained by the second target test module 400 for the device under test 500 is a defective product, it is determined that the device under test 500 is indeed a defective product;

[0117] If the test result obtained by the second target test for the device under test 500 is a qualified product, it is considered that the device under test 500 is a qualified product, and at the same time, it is determined that the first target test module 400 fails, and it is marked for failure, waiting for the staff to determine; it can be understood that when there is a failure mark on the test module 400, this test module 400 is no longer used as an alternative module for the first target test module 400 or the second target test module 400 until the failure is cleared.

[0118] Further, after the step S40, the following steps are included:

[0119] Step S90, obtaining the test result of the device under test 500 and judging whether the test result is a qualified product;

[0120] Step S100, if the test result is a qualified product, moving the device under test 500 as a tested device to the qualified product output position.

[0121] Different test results correspond to different follow-up operations. For example, if the test result is qualified, the product will enter the subsequent outbound process and be packaged and shipped out; if the test result is defective, the product will enter the subsequent re-inspection, destruction and other processes. Therefore, it is necessary to classify and output the test equipment 500 (tested equipment) based on the test results to facilitate the execution of subsequent processes.

[0122] It should be noted that, for the sake of simplicity, the foregoing method embodiments are all described as a series of actions. However, those skilled in the art should understand that this application is not limited to the described order of actions, as some steps may be performed in other orders or simultaneously according to this application. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are preferred embodiments, and the actions and modules involved are not necessarily essential to this application.

[0123] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods according to the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions to cause a terminal device (which may be a mobile phone, computer, server, or network device, etc.) to execute the methods described in the various embodiments of this application.

[0124] Reference Figure 4 In terms of hardware structure, the electronic device may include components such as a communication module 10, a memory 20, and a processor 30. In the electronic device, the processor 30 is connected to both the memory 20 and the communication module 10. The memory 20 stores a computer program, which is executed by the processor 30. When the computer program is executed, it implements the steps of the above-described method embodiments.

[0125] The communication module 10 can connect to external communication devices via a network. The communication module 10 can receive requests from the external communication devices and can also send requests, instructions, and information to the external communication devices. The external communication devices can be other electronic devices, servers, or IoT devices, such as televisions, etc.

[0126] The memory 20 can be used to store software programs and various data. The memory 20 may primarily include a program storage area and a data storage area. The program storage area may store the operating system, at least one application program required for a function (such as obtaining the sampling location of the device under test 500 corresponding to the test command), etc.; the data storage area may include a database, and may store data or information created based on system usage. Furthermore, the memory 20 may include high-speed random access memory, and may also include non-volatile memory, such as at least one disk storage device, flash memory device, or other volatile solid-state storage device.

[0127] The processor 30 is the control center of the electronic device. It connects various parts of the electronic device via various interfaces and lines. By running or executing software programs and / or modules stored in the memory 20, and by calling data stored in the memory 20, it performs various functions and processes data, thereby providing overall monitoring of the electronic device. The processor 30 may include one or more processing units; optionally, the processor 30 may integrate an application processor and a modem processor. The application processor mainly handles the operating system, user interface, and applications, while the modem processor mainly handles wireless communication. It is understood that the modem processor may not be integrated into the processor 30.

[0128] although Figure 4 Not shown, but the above-described electronic device may further include a circuit control module for connecting to a power supply to ensure the normal operation of other components. Those skilled in the art will understand that... Figure 4 The electronic device structure shown does not constitute a limitation on the electronic device and may include more or fewer components than shown, or combine certain components, or have different component arrangements.

[0129] The present invention also proposes a computer-readable storage medium having a computer program stored thereon. The computer-readable storage medium may be... Figure 4 The memory 20 in the electronic device may also be at least one of ROM (Read-Only Memory) / RAM (Random Access Memory), magnetic disk, optical disk, etc. The computer-readable storage medium includes a number of instructions to cause a terminal device with a processor (which may be a television, automobile, mobile phone, computer, server, terminal, or network device, etc.) to execute the methods described in the various embodiments of the present invention.

[0130] In this invention, the terms "first," "second," "third," "fourth," and "fifth" are used for descriptive purposes only and should not be construed as indicating or implying relative importance. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0131] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0132] Although embodiments of the present invention have been shown and described above, the scope of protection of the present invention is not limited thereto. It is understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art can make changes, modifications, and substitutions to the above embodiments within the scope of the present invention, and such changes, modifications, and substitutions should all be covered within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. An ECG automatic test method, characterized by, The method comprises: if a test instruction is triggered, obtaining a sampling position of a device under test corresponding to the test instruction; determining a predicted test time of each test module according to the sampling position; taking the test module with the least predicted test time as a first target test module; moving the device under test to the first target test module for a test operation; the step of determining the predicted test time of each test module according to the sampling position comprises: determining a shortest placement path time between a module position of each test module and the sampling position; determining the predicted test time of each test module according to the shortest placement path time; the step of determining the predicted test time of each test module according to the shortest placement path time comprises: for each test module, obtaining a remaining test time of the test module and a shortest output path time between a module position of the test module and an output position; judging whether the remaining test time is greater than the shortest placement path time; if the remaining test time is greater than the shortest placement path time, taking the sum of the remaining test time and the shortest output path time as the predicted test time of the test module; if the remaining test time is less than or equal to the shortest placement path time, taking the sum of the shortest placement path time and the shortest output path time as the predicted test time of the test module.

2. The ECG automatic testing method of claim 1, wherein, the step of moving the device under test to the first target test module for a test operation comprises: moving the device under test to a waiting area corresponding to the first target test module and monitoring a test state of the first target test module; when the test state of the first target test module is test end, taking out a tested device in the first target test module and placing the device under test in the first target test module for a test operation.

3. The ECG automatic testing method of claim 1, wherein, after the step of moving the device under test to the first target test module for a test operation, comprising: obtaining a test result of the device under test; if the test result of the device under test is a defective product, judging whether a number of times of test operation of the device under test in the first target test module is greater than a preset number threshold; if the number of times of test operation of the device under test in the first target test module is greater than the preset number threshold, determining a second target test module; moving the device under test to the second target test module for a test operation and taking a test result corresponding to the second target test module as the test result of the device under test.

4. The ECG automatic testing method of claim 1, wherein, after the step of moving the device under test to the first target test module for a test operation, comprising: obtaining a test result of the device under test and judging whether the test result is a qualified product; if the test result is a qualified product, moving the device under test to a qualified product output position as a tested device.

5. An ECG automatic testing apparatus characterized by comprising: The device comprises a control module, a transmission module, a mechanical arm and a plurality of test modules; the detection end of the control module is connected with the transmission module, the mechanical arm and the test modules respectively, and the output end of the control module is connected with the control end of the mechanical arm, wherein: The transmission module is used for triggering a test instruction containing a sampling position when a device to be tested moves to the sampling position of the transmission module, and sending the test instruction to the control module; The control module is used for determining the expected test time of each test module according to the sampling position in the test instruction after receiving the test instruction, taking the test module with the least expected test time as a first target test module, and sending a motion signal corresponding to the first target test module to the mechanical arm; The mechanical arm is used for moving the device to be tested to the first target test module for test operation after receiving the motion signal; The step of determining the expected test time of each test module according to the sampling position comprises: determining the shortest placement path time between the module position of each test module and the sampling position; determining the expected test time of each test module according to the shortest placement path time; The step of determining the expected test time of each test module according to the shortest placement path time comprises: for each test module, obtaining the remaining test time of the test module and the shortest output path time between the module position of the test module and the output position; judging whether the remaining test time is greater than the shortest placement path time; if the remaining test time is greater than the shortest placement path time, taking the sum of the remaining test time and the shortest output path time as the expected test time of the test module; if the remaining test time is less than or equal to the shortest placement path time, taking the sum of the shortest placement path time and the shortest output path time as the expected test time of the test module.

6. The ECG automatic testing apparatus of claim 5, wherein The mechanical arm is a six-axis mechanical arm.

7. The ECG automatic testing device of claim 5, wherein, The test module comprises a test unit and a position sensor, and the test unit and the position sensor are connected with the control module respectively; The test unit is used for performing test operation on the device to be tested and sending test results and a test state corresponding to the test module to the control module; The position sensor is used for detecting the position offset of the test module and sending the position offset to the control module; The control module is used for calibrating the module position of the test module through the position offset.

8. The ECG automatic testing apparatus of claim 5, wherein The transmission module comprises an input conveyor belt, a first lifting unit, a sampling position, an output position, a second lifting unit and an output conveyor belt, wherein: The input conveyor belt is used for moving the device to be tested to the first lifting unit; The first lifting unit is used for moving the device to be tested to the sampling position; The second lifting unit is used for moving the tested device to the output conveyor belt.

9. An electronic device, comprising: The electronic device comprises a memory, a processor and a computer program stored on the memory and executable on the processor, the computer program implementing the steps of the ECG automatic test method according to any one of claims 1 to 4 when executed by the processor.

10. A computer-readable storage medium, characterized in that, The computer readable storage medium stores a computer program, the computer program implementing the steps of the ECG automatic test method according to any one of claims 1 to 4 when executed by the processor.

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