A field strength measurement device based on the electromagnetically induced transparency effect

Abstract

The present application discloses a field strength measurement device based on the electromagnetically induced transparency (EIT) effect. The device consists of a detection laser, a coupling laser, a beam splitting module and an atomic vapor cell. The beam splitting module is used to obtain a first target detection light and a second target detection light that are collinear and opposite in direction, and a first target coupling light and a second target coupling light that are collinear and opposite in direction. The first target detection light and the first target coupling light are collinear and in the same direction. The first target detection light and the first target coupling light generate the EIT effect in the atomic vapor cell, and the second target detection light and the second target coupling light generate the EIT effect in the atomic vapor cell. The Doppler effect between the first spectral diagram of the first target detection light and the second spectral diagram of the second target detection light is canceled out, and the intersection of the first spectral diagram and the second spectral diagram reflects the magnitude of the field strength. It can be seen that the present application can improve the possibility of the development of field strength measurement based on Rydberg atoms in the power system.

Description

Technical Field

[0001] The present application relates to the technical field of field strength measurement, and more specifically, to a field strength measurement device based on the electromagnetically induced transparency effect. Background Art

[0002] With the development of quantum information technology, Rydberg atoms have been applied in multiple fields. In the field of measurement, the measurement of microwave electric fields and power frequency voltages based on Rydberg atoms both require obtaining accurate measurement values by observing the electromagnetically induced transparency (EIT) phenomenon. Most of the current electromagnetically induced transparency phenomena need to be carried out in an ultra-cold environment, and its main purpose is to reduce the interference of the Doppler effect on the EIT phenomenon to obtain more accurate field strength measurement values.

[0003] With the further development of quantum sensing technology, its precise measurement performance enables it to be applied in various fields. Especially in the power system, the field strength measurement based on Rydberg atoms has opened up new ideas for the future development of voltage sensing. However, in order to reduce the Doppler effect, the electromagnetically induced transparency phenomenon needs to be carried out in an ultra-cold environment, which limits the development of the field strength measurement based on Rydberg atoms in the power system. Based on this, how to generate the electromagnetically induced transparency phenomenon in a non-ultra-cold environment and achieve field strength measurement has become the focus of attention of those skilled in the art. Summary of the Invention

[0004] In view of this, the present application provides a field strength measurement device based on the electromagnetically induced transparency effect, which is used to generate the electromagnetically induced transparency phenomenon in a non-ultra-cold environment and achieve field strength measurement.

[0005] In order to achieve the above object, the following solutions are proposed:

[0006] A field strength measurement device based on the electromagnetically induced transparency effect includes a probe laser, a coupling laser, a beam splitting module, and an atomic vapor cell;

[0007] The probe laser is used to emit probe light;

[0008] The coupling laser is used to emit coupling light;

[0009] The beam splitting module is used to split the probe light to obtain a first target probe light and a second target probe light that are collinear and opposite, and split the coupling light to obtain a first target coupling light and a second target coupling light that are collinear and opposite, wherein the first target probe light and the first target coupling light are collinear and in the same direction, and the second target probe light and the second target coupling light are collinear and in the same direction;

[0010] The atomic vapor cell is configured to simultaneously receive the incidence of the first target probe light, the second target probe light, the first target coupling light, and the second target coupling light, so that the first target probe light and the first target coupling light generate an electromagnetically induced transparency (EIT) effect in the atomic vapor cell, and the second target probe light and the second target coupling light generate an EIT effect in the atomic vapor cell. After the EIT effect is generated, the Doppler effect between the first spectral diagram of the first target probe light and the second spectral diagram of the second target probe light is cancelled out, and the intersection of the first spectral diagram and the second spectral diagram reflects the magnitude of the field strength.

[0011] Optionally, the beam splitting module includes a first beam splitter, a second beam splitter, a first mirror, a third beam splitter, a fourth beam splitter, a fifth beam splitter, a sixth beam splitter, and a second mirror:

[0012] The first beam splitter is configured to split the probe light to obtain a first horizontal probe light and a first vertical probe light;

[0013] The second beam splitter is configured to split the first vertical probe light to obtain a first target probe light and a second vertical probe light, so that the first target probe light is incident on the atomic vapor cell in a first direction;

[0014] The first mirror is configured to reflect the first horizontal probe light to the third beam splitter;

[0015] The third beam splitter is configured to split the first horizontal probe light to obtain a second target probe light and a third vertical probe light, and the second target probe light is incident on the atomic vapor cell in a second direction;

[0016] The fourth beam splitter is configured to split the coupling light to obtain a first horizontal coupling light and a first vertical coupling light, so that the first vertical coupling light reaches the fifth beam splitter and the first horizontal coupling light reaches the second mirror;

[0017] The fifth beam splitter is configured to split the first vertical coupling light to obtain a second target coupling light and a second vertical coupling light, and the second target coupling light is incident on the atomic vapor cell in a second direction;

[0018] The second mirror is configured to reflect the first horizontal coupling light to the sixth beam splitter;

[0019] The sixth beam splitter is configured to split the first horizontal coupling light to obtain a first target coupling light and a third vertical coupling light, so that the first target coupling light is incident on the atomic vapor cell in a first direction.

[0020] Optionally, the probe light and the coupling light are elliptically polarized lights;

[0021] The beam splitting module further includes a first quarter-wave plate, a first half-wave plate, a second quarter-wave plate, and a second half-wave plate;

[0022] The first quarter-wave plate is configured to convert the probe light from an elliptically polarized light into a linearly polarized light, and transmit the probe light converted into a linearly polarized light to the first half-wave plate;

[0023] The first half-wave plate is configured to adjust the angle of the probe light converted into a linearly polarized light, and transmit the probe light with the adjusted angle to the first beam splitter;

[0024] The second quarter-wave plate is configured to convert the probe light from an elliptically polarized light into a linearly polarized light, and transmit the probe light converted into a linearly polarized light to the second half-wave plate;

[0025] The second half-wave plate is configured to adjust the angle of the probe light converted into a linearly polarized light, and transmit the probe light with the adjusted angle to the fourth beam splitter.

[0026] Optionally, the first beam splitter and the fourth beam splitter are polarization beam splitters.

[0027] Optionally, a first optical detector and a second optical detector are further included;

[0028] The first optical detector is configured to receive the incidence of the first target probe light passing through the atomic vapor cell, and collect a first spectral line map of the first target probe light passing through the atomic vapor cell;

[0029] The second optical detector is configured to receive the incidence of the second target probe light passing through the atomic vapor cell, and collect a second spectral line map of the second target probe light passing through the atomic vapor cell.

[0030] Optionally, an integration module is further included;

[0031] The integration module is configured to obtain the first spectral line map and the second spectral line map, and integrate the intersection of the first spectral line map and the second spectral line map to form an EIT effect peak map with an approximate natural broadening, and the EIT effect peak map reflects the magnitude of the field strength.

[0032] Optionally, the probe laser is an 852 nm laser;

[0033] The coupling laser is a 510 nm laser.

[0034] Optionally, the probe light emitted by the probe laser is a linearly polarized light of 852 nm;

[0035] The coupled light emitted by the coupled laser is linearly polarized light with a wavelength of 510 nm.

[0036] Optionally, the atomic vapor cell is a cesium atomic vapor cell.

[0037] Optionally, a first optical isolator and a second optical isolator are further included;

[0038] The first optical isolator is used to prevent the probe light and / or the coupled light from entering the interior of the probe laser, causing damage to the probe laser;

[0039] The second optical isolator is used to prevent the probe light and / or the coupled light from entering the interior of the coupled laser, causing damage to the coupled laser.

[0040] It can be seen from the above technical solutions that the field strength measurement device based on the electromagnetically induced transparency effect provided by the present application can be composed of a probe laser, a coupled laser, a beam splitting module, and an atomic vapor cell; among them, the beam splitting module can be used to split the probe light emitted by the probe laser to obtain a first target probe light and a second target probe light that are collinear and opposite in direction, and split the coupled light emitted by the coupled laser to obtain a first target coupled light and a second target coupled light that are collinear and opposite in direction, where the first target probe light and the first target coupled light are collinear and in the same direction, and the second target probe light and the second target coupled light are collinear and in the same direction; in this way, the first target probe light and the first target coupled light form a first double-light-path combination scheme, and the second target probe light and the second target coupled light form a second double-light-path combination scheme; at the same time, the atomic vapor cell can be used to simultaneously receive the incidence of the first target probe light, the second target probe light, the first target coupled light, and the second target coupled light, so that the first target probe light and the first target coupled light generate an electromagnetically induced transparency phenomenon (EIT effect) in the atomic vapor cell, and the second target probe light and the second target coupled light generate an electromagnetically induced transparency phenomenon (EIT effect) in the atomic vapor cell. After the EIT effect is generated, the Doppler effect between the first spectral diagram of the first target probe light and the second spectral diagram of the second target probe light is mutually cancelled, and the intersection of the first spectral diagram and the second spectral diagram reflects the magnitude of the field strength. In this way, two sets of double-light-path combination schemes with opposite directions can be formed in the atomic vapor cell, and the Doppler effects of the two EIT effects of the double-light-path combination scheme are mutually cancelled, realizing the electromagnetically induced transparency phenomenon in a non-ultra-cold environment and avoiding the influence caused by the Doppler effect. It can be seen that the present application can realize the electromagnetically induced transparency phenomenon in a non-ultra-cold environment, further improving the possibility of the development of power frequency measurement based on Rydberg atoms in the power system. The present application can generate the electromagnetically induced transparency phenomenon in a non-ultra-cold environment to complete the measurement of the field strength. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only the embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on the provided drawings.

[0042] Figure 1 Schematic diagram of a field strength measurement device based on the electromagnetically induced transparency effect disclosed in the embodiments of the present application;

[0043] Figure 2 Schematic diagram of another field strength measurement device based on the electromagnetically induced transparency effect disclosed in the embodiments of the present application;

[0044] Figure 3 Schematic diagram of yet another field strength measurement device based on the electromagnetically induced transparency effect disclosed in the embodiments of the present application;

[0045] Figure 4 Peak diagram of the EIT effect with approximate natural broadening disclosed in the embodiments of the present application;

[0046] Among them, Figure 1 、 Figure 2 and Figure 3 The corresponding relationship between the reference numerals and the component names is as follows:

[0047] Probe laser 1, coupling laser 2, beam splitting module 3, atomic vapor cell 4, first optical detector 5, second optical detector 6, integration module 7, first optical isolator 8, second optical isolator 9, first beam splitter 30, second beam splitter 31, first mirror 32, third beam splitter 33, fourth beam splitter 34, fifth beam splitter 35, sixth beam splitter 36, second mirror 37, first quarter-wave plate 38, first half-wave plate 39, second quarter-wave plate 40, second half-wave plate 41, first filter 42, second filter 43, first optical trash can 44, second optical trash can 45, third optical trash can 46, fourth optical trash can 47, fifth optical trash can 48 and sixth optical trash can 49. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0048] The following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments of the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present application.

[0049] Next, the field strength measurement device based on the electromagnetically induced transparency effect of the present application will be introduced in detail. It should be noted that the directions of the structures shown in the attached drawings of the present application are set for the sake of easy understanding of the description, and do not impose any restrictions on the directions of the embodiments of the present disclosure during actual implementation. Moreover, the shapes and sizes of the whole or part of the structures shown in the attached drawings do not limit the actual shapes and sizes.

[0050] Next, in combination with Figure 1 the field strength measurement device based on the electromagnetically induced transparency effect of the present application will be introduced in detail.

[0051] Referring to Figure 1 It can be found that the field strength measurement device based on the electromagnetically induced transparency effect of the present application can be composed of a probe laser 1, a coupling laser 2, a beam splitting module 3, and an atomic vapor cell 4.

[0052] The probe laser 1 can be used to emit probe light.

[0053] The coupling laser 2 can be used to emit coupling light.

[0054] The beam splitting module 3 can be used to split the probe light to obtain a first target probe light and a second target probe light.

[0055] Among them, the first target probe light and the second target probe light are collinear, in opposite directions, and have equal powers.

[0056] The beam splitting module 3 can also be used to split the coupling light to obtain a first target coupling light and a second target coupling light.

[0057] Among them, the first target coupling light and the second target coupling light are collinear and in opposite directions, and the first target probe light and the first target coupling light are collinear and in the same direction, and the second target probe light and the second target coupling light are collinear, in the same direction, and have equal powers.

[0058] The atomic vapor cell 4 can be used to simultaneously receive the incidence of the first target probe light, the second target probe light, the first target coupling light, and the second target coupling light, so that the first target probe light and the first target coupling light generate a first electromagnetically induced transparency phenomenon (EIT effect) in the atomic vapor cell 4, and the second target probe light and the second target coupling light generate a second electromagnetically induced transparency phenomenon (EIT effect) in the atomic vapor cell 4.

[0059] Since the first target probe light that generates the first electromagnetically induced transparency (EIT) effect and the second target probe light that generates the second EIT effect are collinear and opposite in direction, and the first target coupling light that generates the first EIT effect and the second target coupling light that generates the second EIT effect are collinear and opposite in direction. Therefore, the Doppler effect existing in the first spectral diagram of the first target probe light after generating the EIT effect has the same power, the same frequency, and the opposite direction as the Doppler effect between the second spectral diagram of the second target probe light after generating the EIT effect. Thus, the intersection of the first spectral diagram and the second spectral diagram cancels out the Doppler effect with each other, and the magnitude of the field strength can be obtained based on the intersection of the first spectral diagram and the second spectral diagram.

[0060] As can be seen from the above technical solution, the field strength measurement device based on the electromagnetically induced transparency effect provided by this application can be composed of a probe laser 1, a coupling laser 2, a beam splitting module 3, and an atomic vapor cell 4. Among them, the beam splitting module 3 can be used to split the probe light to obtain a first target probe light and a second target probe light that are collinear and opposite in direction, and split the coupling light to obtain a first target coupling light and a second target coupling light that are collinear and opposite in direction. Among them, the first target probe light and the first target coupling light are collinear and in the same direction, and the second target probe light and the second target coupling light are collinear and in the same direction. In this way, the first target probe light and the first target coupling light form a first double optical path combination scheme, and the second target probe light and the second target coupling light form a second double optical path combination scheme. At the same time, the atomic vapor cell 4 can be used to simultaneously receive the incidence of the first target probe light, the second target probe light, the first target coupling light, and the second target coupling light, so that the first target probe light and the first target coupling light generate the electromagnetically induced transparency phenomenon (EIT effect) in the atomic vapor cell 4, and the second target probe light and the second target coupling light generate the electromagnetically induced transparency phenomenon (EIT effect) in the atomic vapor cell 4. The Doppler effect between the first spectral diagram of the first target probe light after generating the EIT effect and the second spectral diagram of the second target probe light after generating the EIT effect cancels each other out, and the intersection of the first spectral diagram and the second spectral diagram reflects the magnitude of the field strength. In this way, two sets of double optical path combination schemes with opposite directions can be formed in the atomic vapor cell 4, and the Doppler effects formed by the two sets of double optical path combination schemes cancel each other out, realizing the electromagnetically induced transparency phenomenon in a non-ultracold environment and avoiding the influence caused by the Doppler effect. It can be seen that this application can achieve the electromagnetically induced transparency phenomenon in a non-ultracold environment, further improving the possibility of the development of the field strength measurement based on Rydberg atoms in the power system. This application can generate the electromagnetically induced transparency phenomenon in a non-ultracold environment to complete the measurement of the field strength.

[0061] Furthermore, in order to better achieve the EIT effect, the atomic vapor cell 4 can be a cesium atomic vapor cell.

[0062] See Figure 1 and Figure 2 In some embodiments of the present application, the beam splitting module 3 may include a first beam splitter 30, a second beam splitter 31, a first mirror 32, a third beam splitter 33, a fourth beam splitter 34, a fifth beam splitter 35, a sixth beam splitter 36, and a second mirror 37.

[0063] Specifically, the first beam splitter 30 is configured to split the probe light to obtain a first horizontal probe light and a first vertical probe light.

[0064] The second beam splitter 31 may be configured to split the first vertical probe light to obtain a first target probe light and a second vertical probe light, so that the first target probe light is incident on the atomic vapor cell 4 in a first direction.

[0065] Wherein, the first direction may be from left to right. The second vertical probe light is useless light and may be incident on the third optical trash can 46.

[0066] The first mirror 32 may be configured to reflect the first horizontal probe light to the third beam splitter 33.

[0067] The third beam splitter 33 may be configured to split the first horizontal probe light to obtain a second target probe light and a third vertical probe light, and the second target probe light is incident on the atomic vapor cell 4 in a second direction.

[0068] The third vertical probe light is useless light and may be incident on the fifth optical trash can 48.

[0069] The fourth beam splitter 34 may be configured to split the coupling light to obtain a first horizontal coupling light and a first vertical coupling light, so that the first vertical coupling light reaches the fifth beam splitter 35 and the first horizontal coupling light reaches the second mirror 37.

[0070] The fifth beam splitter 35 may be configured to split the first vertical coupling light to obtain a second target coupling light and a second vertical coupling light, and the second target coupling light is incident on the atomic vapor cell 4 in a second direction.

[0071] Wherein, the second direction may be from right to left.

[0072] The second vertical coupling light is useless light and may be incident on the fourth optical trash can 47.

[0073] The second mirror 37 may be configured to reflect the first horizontal coupling light to the sixth beam splitter 36.

[0074] The sixth beam splitter 36 may be configured to split the first horizontal coupling light to obtain a first target coupling light and a third vertical coupling light, so that the first target coupling light is incident on the atomic vapor cell 4 in a first direction.

[0075] The third vertically coupled light is useless light and can be incident on the second optical trash can 45.

[0076] As can be seen from the above technical solution, this embodiment provides an optional composition manner of the beam splitting module 3. Through the above manner, the first target coupled light, the first target detection light, the second target coupled light, and the second target detection light can be better incident on the atomic vapor cell 4, so as to better implement the EIT effect and further improve the reliability of measuring the field strength in this application.

[0077] In some implementations of this application, considering that the detection light emitted by the detection laser 1 and the coupled light emitted by the coupling laser 2 can be elliptically polarized light or linearly polarized light, and in this application, it is necessary to split the detection light and the coupled light, and linearly polarized light is easier to split. Therefore, when the detection light emitted by the detection laser 1 and the coupled light emitted by the coupling laser 2 are elliptically polarized light, the beam splitting module 3 can also be used to convert the elliptically polarized light into linearly polarized light for subsequent beam splitting. At this time, the beam splitting module 3 can also include a first quarter-wave plate 38, a first half-wave plate 39, a second quarter-wave plate 40, and a second half-wave plate 41.

[0078] Specifically, the first quarter-wave plate 38 can be used to convert the detection light from elliptically polarized light into linearly polarized light and transmit the detection light converted into linearly polarized light to the first half-wave plate 39;

[0079] The first half-wave plate 39 can be used to adjust the polarization angle of the detection light converted into linearly polarized light and transmit the detection light with the adjusted angle to the first beam splitter 30.

[0080] The second quarter-wave plate 40 can be used to convert the detection light from elliptically polarized light into linearly polarized light and transmit the detection light converted into linearly polarized light to the second half-wave plate 41.

[0081] The second half-wave plate 41 can be used to adjust the polarization angle of the detection light converted into linearly polarized light and transmit the detection light with the adjusted angle to the fourth beam splitter 34.

[0082] The detection laser 1 can be an 852 nm laser, and the detection light can be 852 nm laser; the coupling laser can be a 510 nm laser, and the coupled light can be 510 nm laser.

[0083] As can be seen from the above technical solution, this embodiment provides another optional composition manner of the beam splitting module 3. The composition of the beam splitting module 3 is affected by the detection laser 1 and the coupling laser 2, which further improves the practicability of this application.

[0084] Further, in order to better split the probe light, the first beam splitter 30 can be a polarization beam splitter. Similarly, in order to better split the coupled light, the first beam splitter 34 can also be a polarization beam splitter.

[0085] In some embodiments of the present application, considering that in order to better obtain the first spectral diagram of the first target probe light, the first optical detector 5 can be used to collect the first spectral diagram of the first target probe light. Similarly, in order to better obtain the second spectral diagram of the second target probe light, the second optical detector 6 can be used to collect the second spectral diagram of the second target probe light.

[0086] Specifically, the first target probe light passing through the atomic vapor cell 4 can be incident on the fifth beam splitter 35, and the fifth beam splitter 35 can also split the first target probe light to obtain a fourth horizontal probe light and a fourth vertical probe light.

[0087] The fourth horizontal probe light is incident on the third beam splitter 33, and the third beam splitter 33 can also split the fourth horizontal probe light to obtain a fifth horizontal probe light and a fifth vertical probe light.

[0088] The fifth vertical probe light can be useless light. The fifth horizontal probe light can be incident on the first optical detector 5 after passing through the filtering of the second filter 43.

[0089] The fourth vertical probe light can be incident on the fourth beam splitter 34, and the fourth beam splitter 34 can also split the fifth vertical probe light to obtain a sixth horizontal probe light and a sixth vertical probe light.

[0090] The sixth vertical probe light and the sixth horizontal probe light are useless light, and the sixth vertical probe light can be incident on the sixth light trash can 49.

[0091] The second target probe light passing through the atomic vapor cell 4 can be incident on the second beam splitter 31, and the second beam splitter 31 can also split the second target probe light to obtain a seventh horizontal probe light and a seventh vertical probe light.

[0092] The seventh horizontal probe light is incident on the sixth beam splitter 36, and the sixth beam splitter 36 can also split the seventh horizontal probe light to obtain an eighth horizontal probe light and an eighth vertical probe light.

[0093] The eighth vertical probe light can be useless light. The eighth horizontal probe light can be incident on the second optical detector 6 after passing through the filtering of the first filter 42.

[0094] The seventh vertical probe light can be incident on the first beam splitter 30, and the first beam splitter 30 can also split the seventh vertical probe light to obtain a ninth horizontal probe light and a ninth vertical probe light.

[0095] The ninth vertical detection light and the ninth horizontal detection light are useless lights, and the ninth vertical detection light can be incident on a light trash can 44.

[0096] As can be seen from the above technical solution, this embodiment provides an optional method for collecting the spectral diagrams of the first target detection light and the second target detection light that are collinear and opposite in direction. Through the above method, the photodetector can be used for collection, further realizing the wide range of application scenarios of the present application and improving the accuracy of measuring the field strength of the present application.

[0097] See Figure 3 , in some embodiments of the present application, the field strength measurement device based on the electromagnetically induced transparency effect may further include an integration module 7.

[0098] Figure 3 The arrows in [[ ]] indicate the direction of light, and the straight lines indicate the connection relationship between components.

[0099] The integration module 7 can be connected to the first optical detector 5 and the second optical detector 6 to obtain the first spectral diagram and the second spectral diagram. The integration module 7 can integrate the intersection of the first spectral diagram and the second spectral diagram to form an EIT effect peak diagram with an approximate natural broadening, as Figure 4 shown. The EIT effect peak diagram reflects the magnitude of the field strength.

[0100] As can be seen from the above technical solution, this embodiment provides an optional method for integrating the first spectral diagram and the second spectral diagram. Through the above method, the accuracy of the present application can be further improved.

[0101] See Figure 2 , in some embodiments of the present application, the field strength measurement device based on the electromagnetically induced transparency effect may further include a first optical isolator 8 and a second optical isolator 9.

[0102] The first optical isolator 8 can be used to prevent the detection light and / or the coupling light from rebounding into the detection laser 1, causing damage to the detection laser 1.

[0103] The second optical isolator 9 can be used to prevent the detection light and / or the coupling light from rebounding into the coupling laser 2, causing damage to the coupling laser 2.

[0104] As can be seen from the above technical solution, this embodiment provides an optional method for protecting the inside of the detection laser 1 and the inside of the coupling laser 2. Through the above first optical isolator 8 and second optical isolator 9, the damage rate of the detection laser 1 and the coupling laser 2 can be further reduced, and the reusability and accuracy of the present application can be further improved.

[0105] The centers of the sixth beam splitter 36, the second mirror 37, and the second optical waste bin 45 may be located on the same vertical line, as Figure 2 shown.

[0106] The centers of the first beam splitter 30, the second beam splitter 31, the first optical waste bin 44, and the third optical waste bin 46 may be located on the same vertical line, as Figure 2 shown.

[0107] The centers of the fourth beam splitter 34, the fifth beam splitter 35, the fourth optical waste bin 47, and the sixth optical waste bin 49 may be located on the same vertical line, as Figure 2 shown.

[0108] The centers of the first mirror 32, the third beam splitter 33, and the fifth optical waste bin 48 may be located on the same vertical line, as Figure 2 shown.

[0109] The centers of the detection laser 1, the first optical isolator 8, the first quarter-wave plate 38, the first half-wave plate 39, the first beam splitter 30, and the first mirror 32 may be located on the same horizontal line, and the first mirror 32 may form a certain inclination angle with the horizontal line, as Figure 2 shown.

[0110] The centers of the second optical detector 6, the first filter 42, the sixth beam splitter 36, the second beam splitter 31, the atomic vapor cell 4, the fifth beam splitter 35, the third beam splitter 33, the second filter 43, and the first optical detector 5 may be located on the same horizontal line, as Figure 2 shown.

[0111] The centers of the second mirror 37, the fourth beam splitter 34, the second quarter-wave plate 40, the second half-wave plate 41, the second optical isolator 9, and the coupling laser 2 may be located on the same horizontal line, as Figure 2 shown.

[0112] Finally, it should also be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements not only includes those elements, but also includes other elements not expressly listed, or elements inherent to such process, method, article or device. Without further limitation, an element defined by the phrase "comprising a..." does not exclude the presence of additional identical elements in the process, method, article or device comprising the element.

[0113] The various embodiments in this specification are described in a progressive manner. Each embodiment focuses on the differences from other embodiments. For the same or similar parts among the various embodiments, reference may be made to each other.

[0114] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present application. Various modifications to these embodiments will be obvious to those skilled in the art. The general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. The various embodiments of the present application can be combined with each other. Therefore, the present application will not be limited to these embodiments shown herein, but rather to the broadest scope consistent with the principles and novel features disclosed herein.

Claims

1. A field strength measuring device based on the electromagnetically induced transparency effect, characterized in that It includes a detection laser, a coupling laser, a beam splitting module and an atomic vapor cell; The detection laser is used to emit detection light; The coupling laser is used to emit coupling light; The beam splitting module is used to split the detection light to obtain a first target detection light and a second target detection light that are collinear and opposite in direction, and split the coupling light to obtain a first target coupling light and a second target coupling light that are collinear and opposite in direction. Among them, the first target detection light and the first target coupling light are collinear and in the same direction, and the second target detection light and the second target coupling light are collinear and in the same direction; The atomic vapor cell is used to simultaneously receive the incidence of the first target detection light, the second target detection light, the first target coupling light and the second target coupling light, so that the first target detection light and the first target coupling light generate an electromagnetically induced transparency (EIT) effect in the atomic vapor cell, and the second target detection light and the second target coupling light generate an EIT effect in the atomic vapor cell. After the EIT effect is generated, the Doppler effect between the first spectral diagram of the first target detection light and the second spectral diagram of the second target detection light is cancelled out, and the intersection of the first spectral diagram and the second spectral diagram reflects the magnitude of the field strength.

2. The field strength measuring device based on the electromagnetically induced transparency effect according to claim 1, wherein The beam splitting module includes a first beam splitter, a second beam splitter, a first mirror, a third beam splitter, a fourth beam splitter, a fifth beam splitter, a sixth beam splitter and a second mirror: The first beam splitter is used to split the detection light to obtain a first horizontal detection light and a first vertical detection light; The second beam splitter is used to split the first vertical detection light to obtain a first target detection light and a second vertical detection light, so that the first target detection light is incident on the atomic vapor cell in a first direction; The first mirror is used to reflect the first horizontal detection light to the third beam splitter; The third beam splitter is used to split the first horizontal detection light to obtain a second target detection light and a third vertical detection light, and the second target detection light is incident on the atomic vapor cell in a second direction; The fourth beam splitter is used to split the coupling light to obtain a first horizontal coupling light and a first vertical coupling light, so that the first vertical coupling light reaches the fifth beam splitter and the first horizontal coupling light reaches the second mirror; The fifth beam splitter is used to split the first vertical coupling light to obtain a second target coupling light and a second vertical coupling light, and the second target coupling light is incident on the atomic vapor cell in a second direction; The second mirror is used to reflect the first horizontal coupling light to the sixth beam splitter; The sixth beam splitter is used to split the first horizontal coupling light to obtain a first target coupling light and a third vertical coupling light, so that the first target coupling light is incident on the atomic vapor cell in the first direction.

3. The field strength measuring device based on the electromagnetically induced transparency effect according to claim 2, characterized in that The detection light and the coupling light are elliptically polarized light; The beam splitting module further includes a first quarter-wave plate, a first half-wave plate, a second quarter-wave plate and a second half-wave plate; The first 1 / 4 wave plate is configured to convert the probe light from elliptically polarized light to linearly polarized light, and transmit the probe light converted to linearly polarized light to the first half wave plate; The first half wave plate is configured to adjust the angle of the probe light converted to linearly polarized light, and transmit the probe light with the adjusted angle to the first beam splitter; The second 1 / 4 wave plate is configured to convert the probe light from elliptically polarized light to linearly polarized light, and transmit the probe light converted to linearly polarized light to the second half wave plate; The second half wave plate is configured to adjust the angle of the probe light converted to linearly polarized light, and transmit the probe light with the adjusted angle to the fourth beam splitter.

4. The field strength measuring device based on the electromagnetically induced transparency effect according to claim 3, characterized in that The first beam splitter and the fourth beam splitter are polarization beam splitters.

5. The field strength measuring device based on the electromagnetically induced transparency effect according to claim 1, characterized in that, It further includes a first optical detector and a second optical detector; The first optical detector is configured to receive the incidence of the first target probe light passing through the atomic vapor cell, and collect a first spectral line diagram of the first target probe light passing through the atomic vapor cell; The second optical detector is configured to receive the incidence of the second target probe light passing through the atomic vapor cell, and collect a second spectral line diagram of the second target probe light passing through the atomic vapor cell.

6. The field strength measuring device based on the electromagnetically induced transparency effect according to claim 5, characterized in that It further includes an integration module; The integration module is configured to obtain the first spectral line diagram and the second spectral line diagram, and integrate the intersection of the first spectral line diagram and the second spectral line diagram to form an EIT effect peak diagram with approximate natural broadening, and the EIT effect peak diagram reflects the magnitude of the field strength.

7. The field strength measuring device based on the electromagnetically induced transparency effect according to claim 1, characterized in that The probe laser is an 852 nm laser; The coupling laser is a 510 nm laser.

8. The field strength measuring device based on the electromagnetically induced transparency effect according to claim 7, characterized in that The probe light emitted by the probe laser is linearly polarized light with a wavelength of 852 nm; The coupling light emitted by the coupling laser is linearly polarized light with a wavelength of 510 nm.

9. The field strength measuring device based on the electromagnetically induced transparency effect according to claim 1, characterized in that, The atomic vapor cell is a cesium atomic vapor cell.

10. The field strength measuring device based on the electromagnetically induced transparency effect according to claim 1, characterized in that, It further includes a first optical isolator and a second optical isolator; The first optical isolator is configured to prevent the probe light and / or the coupling light from entering the interior of the probe laser and causing damage to the probe laser; The second optical isolator is configured to prevent the probe light and / or the coupling light from entering the interior of the coupling laser and causing damage to the coupling laser.

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