Quantum field strength measurement method and system with electric field bias control

Abstract

The application belongs to the technical field of radio frequency electromagnetic field measurement, and particularly discloses a quantum field intensity measurement method and system of offset electric field regulation, which comprises the following steps: selecting a Rydberg atomic energy level close to resonance according to the microwave frequency of a measured signal; determining a coupling light wavelength according to the Rydberg atomic energy level, preparing a Rydberg atom, simultaneously obtaining a difference value between the microwave frequency of the measured signal and a resonance transition frequency, and obtaining an energy level offset value according to the difference value; obtaining a polarizability of the Rydberg atomic energy level, obtaining an offset electric field value to be applied according to the energy level offset value and the polarizability; and starting the offset electric field according to the offset electric field value, so that the relevant energy level of the Rydberg atom produces a movement in the offset electric field; when the energy difference between the offset Rydberg energy level and the adjacent energy level resonates with the microwave frequency of the measured signal, the offset sub-energy level forms an energy level splitting, and a frequency splitting is generated, and the electric field of the measured signal is measured according to the interval between the frequency splittings.

Description

Technical Field

[0001] This invention belongs to the field of radio frequency electromagnetic field measurement technology, and particularly relates to a method and system for measuring quantum field strength by offset electric field modulation. Background Technology

[0002] Due to the discrete nature of Rydberg atoms' energy levels, electric field measurements based on the electromagnetic induction transparent spectral splitting method using Rydberg atoms typically have a measurement bandwidth of no more than 50 MHz. Within this bandwidth, the sensitivity of electric field amplitude measurements varies significantly, making broadband continuous microwave electric field measurements impossible. Each time the microwave frequency is switched for electric field measurement, it is necessary to prepare the energy level of another Rydberg atom. Therefore, precise adjustment of the laser wavelength for preparing the Rydberg atom is required. However, current wavelength tuning schemes, whether mechanically cavity-tuned semiconductor lasers or temperature-tuned fiber lasers, involve cumbersome and time-consuming procedures, hindering rapid wavelength adjustment. This, in turn, affects the efficiency of electric field measurement, particularly for applications such as frequency modulation in communications, limiting the application and development of Rydberg electric field measurements. Summary of the Invention

[0003] This invention provides a method and system for measuring quantum field strength by offset electric field modulation, which solves the problem of not being able to achieve broadband continuous microwave electric field measurement.

[0004] In a first aspect, a method for measuring quantum field strength modulated by a deflection electric field is provided, the method comprising:

[0005] Based on the microwave frequency of the signal being measured, select a Rydberg atomic energy level close to resonance;

[0006] Based on the Rydberg atomic energy levels, the wavelength of the coupled light is determined and Rydberg atoms are prepared. At the same time, the difference between the microwave frequency and the resonant transition frequency of the measured signal is obtained, and the energy level offset is obtained based on the difference.

[0007] Obtain the polarizability of the Rydberg atomic energy level, and based on the energy level offset and polarizability, obtain the offset electric field value to be applied;

[0008] According to the offset electric field value, the offset electric field is turned on, causing the relevant energy levels of the Rydberg atom to move in the offset electric field. When the energy difference between the offset Rydberg energy level and the adjacent energy level resonates with the microwave frequency of the measured signal, the offset sub-energy level forms an energy level split and generates frequency split. The electric field of the measured signal is measured according to the interval between the frequency splits.

[0009] Secondly, a quantum field strength measurement system with offset electric field modulation is provided, the system comprising:

[0010] The selection module is used to select the Rydberg atomic energy level close to resonance based on the microwave frequency of the signal being measured.

[0011] The energy level offset acquisition module is used to determine the coupling light wavelength and prepare Rydberg atoms based on the Rydberg atom energy level, and at the same time acquire the difference between the microwave frequency and the resonant transition frequency of the measured signal, and acquire the energy level offset based on the difference.

[0012] The offset electric field value acquisition module is used to acquire the polarizability of the Rydberg atomic energy level, and to acquire the offset electric field value to be applied based on the energy level offset and polarizability.

[0013] The module for acquiring the electric field value of the measured signal is used to activate the offset electric field according to the offset electric field value, so that the relevant energy levels of the Rydberg atom move in the offset electric field. When the energy difference between the offset Rydberg energy level and the adjacent energy level resonates with the microwave frequency of the measured signal, the offset sub-energy level forms an energy level split and generates frequency splitting. The electric field of the measured signal is measured according to the interval between the frequency splits.

[0014] This invention provides a quantum field strength measurement method and system controlled by a deflection electric field. By selecting Rydberg energy levels and calculating energy level frequency shifts using polarizability parameters, a deflection electric field is introduced to shift the Rydberg atomic energy levels, thereby enabling the resonant microwave frequency of Rydberg atomic energy level transitions to be extended both upwards and downwards. Then, by utilizing AT split spectroscopy, the goal of measuring continuous microwave frequencies can be achieved.

[0015] Other features and advantages of the invention will be set forth in the description which follows, and will be apparent in part from the description, or may be learned by practicing the invention. The objects and other advantages of the invention may be realized and obtained by means of the structures particularly pointed out in the written description, claims, and drawings. Attached Figure Description

[0016] The accompanying drawings, which are included to provide a further understanding of the invention and form part of this invention, illustrate exemplary embodiments of the invention and are used to explain the invention, but do not constitute an undue limitation of the invention. In the drawings:

[0017] Figure 1 A schematic diagram illustrating the implementation process of a quantum field strength measurement method with offset electric field modulation according to an embodiment of the present invention;

[0018] Figure 2 A schematic diagram of the microwave electric field for generating AT splitting measurement of EIT spectrum according to an embodiment of the present invention;

[0019] Figure 3 This is a schematic diagram illustrating the principle of reducing energy level spacing induced by the offset electric field according to an embodiment of the present invention.

[0020] Figure 4 A diagram showing the energy level change after energy level shift occurs in response to microwaves, according to an embodiment of the present invention.

[0021] Figure 5 This is a schematic diagram illustrating the principle of increasing energy level spacing induced by the offset electric field according to an embodiment of the present invention.

[0022] Figure 6 A schematic diagram of microwave field measurement for generating a deflection electric field using built-in electrodes according to an embodiment of the present invention;

[0023] The attached diagram is labeled as follows: 1. External electrode wire, 2. Internal upper electrode, 3. Reference probe laser, 4. Rydberg atomic detector laser, 5. Atomic gas cell, 6. Coupled laser, 7. Internal lower electrode, 8. Horn antenna. Detailed Implementation

[0024] To make the objectives, technical solutions, and advantages of this specification clearer, the technical solutions of this specification will be clearly and completely described below in conjunction with specific embodiments and corresponding drawings. Obviously, the described embodiments are only a part of the embodiments of this specification, and not all of them. Based on the embodiments in this specification, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this specification.

[0025] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, apparatus, product, or device that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or devices.

[0026] The technical solutions provided in the various embodiments of this specification are described in detail below with reference to the accompanying drawings.

[0027] To achieve the goal of measuring the continuous microwave frequencies of the signal under test, this invention provides a quantum field strength measurement method and system with offset electric field modulation.

[0028] Figure 1 This is a schematic diagram illustrating the implementation process of a quantum field strength measurement method based on offset electric field modulation according to an embodiment of the present invention. (See attached diagram.) Figure 1 The method includes:

[0029] S100: Select a Rydberg atomic energy level close to resonance based on the microwave frequency of the signal being measured;

[0030] S102: Based on the Rydberg atomic energy level, determine the coupling light wavelength and prepare Rydberg atoms, while obtaining the difference between the microwave frequency and the resonant transition frequency of the measured signal, and obtain the energy level offset based on the difference.

[0031] S104: Obtain the polarizability of the Rydberg atomic energy level, and obtain the offset electric field value to be applied based on the energy level offset and polarizability.

[0032] S106: According to the offset electric field value, the offset electric field is turned on, so that the relevant energy level of the Rydberg atom moves in the offset electric field. When the energy difference between the offset Rydberg energy level and the adjacent energy level resonates with the microwave frequency of the measured signal, the offset sub-energy level forms an energy level split and generates frequency split. The electric field of the measured signal is measured according to the interval between the frequency splits.

[0033] In one specific embodiment, selecting a Rydberg atomic energy level close to resonance based on the microwave frequency of the measured signal specifically includes:

[0034] If the microwave frequency range of the signal being measured is within the first preset range, then select nD. 5 / 2 Energy levels and (n+1)P 3 / 2 The energy level is a near-resonant Rydberg atomic energy level;

[0035] If the microwave frequency range of the signal being measured is within the second preset range, then select nD. 5 / 2 Energy levels and (n+2)P 3 / 2 The energy level is a near-resonant Rydberg atomic energy level;

[0036] Wherein, the microwave frequency value of the measured signal corresponding to the first preset range is less than the microwave frequency value of the measured signal corresponding to the second preset range.

[0037] In specific implementation, the first preset range can be 3GHz-4.22GHz; the second preset range can be 40.13GHz-41GHz; the frequency value of the second preset range is larger because the atomic energy level transition is from n to (n+2), with an interval of (n+1), so the energy difference of 40GHz is much larger than that of 4GHz.

[0038] In one specific embodiment, the step of determining the coupling light wavelength and preparing Rydberg atoms based on the Rydberg atomic energy levels, simultaneously acquiring the difference between the microwave frequency and the resonant transition frequency of the measured signal, and obtaining the energy level shift based on the difference, specifically includes:

[0039] Based on the microwave frequency range of the measured signal, the corresponding D-state and P-state energy levels are selected as near-resonance Rydberg atomic energy levels. According to these Rydberg atomic energy levels, the coupling laser wavelength is adjusted to a preset value. Simultaneously, the difference Δ between the microwave frequency of the measured signal and the resonant transition frequency is obtained. The energy level offset N is then calculated based on this difference Δ using the following formula. shift :

[0040] N shift =hΔ;

[0041] In the formula, h is Planck's constant; the formula for calculating the difference Δ is Δ=Δ1+Δ2, where Δ1 is the energy level shift change under the electric field when the Rydberg atomic energy level is in the corresponding D state energy level, and Δ2 is the energy level shift change under the electric field when the Rydberg atomic energy level is in the corresponding P state energy level.

[0042] In one specific embodiment, obtaining the polarizability of the Rydberg atomic energy level, and obtaining the required offset electric field value based on the energy level offset and polarizability, specifically includes:

[0043] The polarizabilities α1 and α2 of the Rydberg atomic energy levels, corresponding to the D and P states respectively, are obtained. Based on the energy level shift N... shift Given the polarizabilities α1 and α2, the required offset electric field value E is obtained according to the following formula. shift :

[0044]

[0045] In one specific embodiment, the step of activating the offset electric field based on the offset electric field value causes the relevant energy levels of the Rydberg atom to shift within the offset electric field. When the energy difference between the offset Rydberg energy level and its neighboring energy level resonates with the microwave frequency of the measured signal, the offset sub-energy level forms an energy level split and generates a frequency split. The electric field of the measured signal is then measured based on the interval between the frequency splits. Specifically, this includes:

[0046] According to the offset electric field value E shift When a deflection electric field is applied, the corresponding energy levels of the Rydberg atom shift within this field. In the Rydberg state, the atom exhibits electromagnetic induction transparency, forming an EIT spectrum. When a microwave electric field is received, and the microwave frequency resonates with the energy interval between the sub-levels of the corresponding D and P states, the EIT spectrum changes from a single peak to a double peak. The interval between the two double peaks is Δf. Based on the splitting frequency interval Δf, the electric field E of the measured signal is obtained according to the following formula. M :

[0047]

[0048] In the formula, h is Planck's constant; It represents the electric dipole moment.

[0049] It should be noted that Rydberg states are prepared by using two-photon resonance to excite ground-state atoms, such as... Figure 2 As shown, an 852nm laser is used as the probe light, and a 509nm laser is used as the coupling light. The probe light frequency resonates at the atomic 6S1 / 2-6P3 / 2, and the coupling light wavelength is tuned to near the 6P3 / 2-nD5 / 2 energy level. In the Rydberg state, the atom exhibits electromagnetically induced transparency (EIT) (the EIT spectrum is a single-peak spectrum to the left of the energy level in the figure). When a microwave electric field is received, and the microwave frequency resonates at the interval between the nD5 / 2 and (n+1)P3 / 2 energy levels, the spectrum changes from a single peak to a double peak, as shown... Figure 2 The double-peak signal shown is illustrated.

[0050] This invention provides a quantum field strength measurement method controlled by a deflection electric field. By introducing a deflection electric field to the Rydberg atomic energy level, the atomic energy level is moved, thereby changing the resonant microwave frequency of the Rydberg atomic energy level transition. This achieves the goal of measuring continuous microwave frequencies. The method controls the increase or decrease of the measured microwave frequency by increasing or decreasing the intensity of the deflection electric field, thus enabling continuous microwave frequency measurement.

[0051] To better understand the present invention, the implementation process of the present invention will be described below in conjunction with specific embodiments.

[0052] Example

[0053] This invention provides a method for measuring quantum field strength by adjusting the offset electric field. First, based on the frequency of the microwave being measured, the Rydberg level range is approximately selected. (See [link to relevant documentation]). Figure 3 If the microwave frequency to be measured is 3GHz to 4.22GHz, then the 55D can be selected. 5 / 2 Energy level and 56P 3 / 2 The energy level was then adjusted, and the coupling laser wavelength was adjusted to 509.3102 nm to prepare atoms in 55D. 5 / 2 The Ridburg level. Simultaneously calculate 55D. 5 / 2 Energy level and 56P 3 / 2 The polarizability of energy level atoms and the energy level shift under the influence of an electric field. Define 55D. 5 / 2 Energy level and 56P 3 / 2 The energy level shifts under the electric field are Δ1 and Δ2, respectively. Under the influence of the electric field, the EIT spectrum undergoes AT splitting. Based on the frequency interval Δf of the splitting, the electric field amplitude of the measured microwave can be calculated. in It represents the electric dipole moment.

[0054] It should be noted that the energy level splitting here corresponds to 55D. 5 / 2 The sub-levels. See also Figure 4 Under a deflected electric field, the total polarizability, contributing to both scalar and tensor polarizability, can be expressed as:

[0055]

[0056] Among them, scalar polarizability α S and tensor polarizability α T The signs are opposite, and for 55D 5 / 2 ,|α S |<|α T |

[0057] Therefore, under the deflected electric field, energy level 55D 5 / 2 Three sub-levels can appear, corresponding to mj = 0.5, mj = 1.5, and mj = 2.5, respectively. The shifts in mj = 0.5, mj = 1.5, and mj = 2.5 are in opposite directions. The shift in the mj = 0.5 level is the largest. Generally, the spectrum at mj = 0.5 can be selected to measure the microwave field strength amplitude and calculate 55D. 5 / 2 mj = 0.5 and (n+1)P 3 / 2 Microwave transition dipole moment between mj = 0.5 Then, by measuring the spectral splitting frequency interval Δf, the magnitude of the microwave electric field can be calculated.

[0058] Similarly, when the coupling laser frequency is locked to the moving 55D 5 / 2 After the mj=0.5 energy level position, by applying to Figure 5 If the microwave electric field differs from the measured microwave frequency by less than 1 MHz, the superheterodyne method can also be used to measure the amplitude of the superheterodyne spectrum signal and thus measure the microwave electric field.

[0059] Similarly, referring to the method described above for measuring the electric field corresponding to a small frequency of the signal being measured, see [link to relevant documentation]. Figure 5 This represents the Reedberg level nD. 5 / 2 and (n+2)P 3 / 2 The upper limit extension scheme for the measured microwave frequency of 40.13 GHz is specifically manifested as: Rydberg level (n+2)P 3 / 2 In nD 5 / 2 Above the energy level, under the influence of the deflecting electric field, the frequency interval between the two energy levels gradually increases.

[0060] The above only introduces P 3 / 2 Energy levels and nD 5 / 2 The relative energy level shifts, and also for F 7 / 2 Energy levels and nD 5 / 2 The situation is similar for energy levels; we can find them in nD. 5 / 2 F above and below the energy level7 / 2 For energy levels, only the specific energy level needs to be calculated again for F. 7 / 2 The polarizability of an energy level can be used to accurately obtain the change in the relative frequency interval of the energy level, thereby expanding the microwave measurement bandwidth at different microwave frequencies and even realizing continuous frequency microwave measurement.

[0061] There is a one-to-one correspondence between the shifted electric field and the change in energy level. When the electric field is relatively weak, the frequency shift of each energy level is positively correlated with the square of the amplitude of the electric field.

[0062] according to Figure 6 The scheme shown involves adding parallel electrode plates inside the atomic gas chamber and applying a voltage through a wire, thus creating a deflected electric field between the upper and lower internal electrode plates. The coupled laser beam, controlling the probe light, passes through the atomic gas chamber between the two electrode plates. Since the chamber is uniformly filled with cesium gas, Rydberg atoms can be prepared at the points where the laser beams pass through by adjusting the wavelengths of the two laser beams. By controlling the wavelength of the coupled laser, different Rydberg energy levels can be prepared, allowing selection of measurable microwave frequencies. Simultaneously applying the deflected electric field shifts the prepared Rydberg atom energy levels, thereby broadening the bandwidth of the measured microwave. Figure 6 In addition to the overlapping and reverse-propagating Rydberg atomic detector laser and coupling laser, a reference detector laser passes through the atomic gas cell. Together with the Rydberg atomic detector laser, they enter a balanced photodetector after the atomic gas cell for signal acquisition, thus obtaining the atomic spectrum measured by microwaves. A horn antenna is used to generate the microwave electric field to be measured; injecting microwaves of a certain power and frequency will generate a microwave electric field of the corresponding frequency at the location of the atomic gas cell.

[0063] Based on the same inventive concept, the present invention also provides a quantum field strength measurement system controlled by a deflection electric field, the system comprising:

[0064] The selection module is used to select the Rydberg atomic energy level close to resonance based on the microwave frequency of the signal being measured.

[0065] The energy level offset acquisition module is used to determine the coupling light wavelength and prepare Rydberg atoms based on the Rydberg atom energy level, and at the same time acquire the difference between the microwave frequency and the resonant transition frequency of the measured signal, and acquire the energy level offset based on the difference.

[0066] The offset electric field value acquisition module is used to acquire the polarizability of the Rydberg atomic energy level, and to acquire the offset electric field value to be applied based on the energy level offset and polarizability.

[0067] The module for acquiring the electric field value of the measured signal is used to activate the offset electric field according to the offset electric field value, so that the relevant energy levels of the Rydberg atom move in the offset electric field. When the energy difference between the offset Rydberg energy level and the adjacent energy level resonates with the microwave frequency of the measured signal, the offset sub-energy level forms an energy level split and generates frequency splitting. The electric field of the measured signal is measured according to the interval between the frequency splits.

[0068] In one specific implementation, the selection module is specifically used for:

[0069] If the microwave frequency range of the signal being measured is within the first preset range, then select nD. 5 / 2 Energy levels and (n+1)P 3 / 2 The energy level is a near-resonant Rydberg atomic energy level;

[0070] If the microwave frequency range of the signal being measured is within the second preset range, then select nD. 5 / 2 Energy levels and (n+2)P 3 / 2 The energy level is a near-resonant Rydberg atomic energy level;

[0071] Wherein, the microwave frequency value of the measured signal corresponding to the first preset range is less than the microwave frequency value of the measured signal corresponding to the second preset range.

[0072] In one specific embodiment, the energy level shift acquisition module is specifically used for:

[0073] Based on the microwave frequency range of the measured signal, the corresponding D-state and P-state energy levels are selected as near-resonance Rydberg atomic energy levels. According to these Rydberg atomic energy levels, the coupling laser wavelength is adjusted to a preset value. Simultaneously, the difference Δ between the microwave frequency of the measured signal and the resonant transition frequency is obtained. The energy level offset N is then calculated based on this difference Δ using the following formula. shift :

[0074] N shift =hΔ;

[0075] In the formula, h is Planck's constant; the formula for calculating the difference Δ is Δ=Δ1+Δ2, where Δ1 is the energy level shift change under the electric field when the Rydberg atomic energy level is in the corresponding D state energy level, and Δ2 is the energy level shift change under the electric field when the Rydberg atomic energy level is in the corresponding P state energy level.

[0076] In one specific embodiment, the offset electric field value acquisition module is specifically used for:

[0077] The polarizabilities α1 and α2 of the Rydberg atomic energy levels, corresponding to the D and P states respectively, are obtained. Based on the energy level shift N... shift Given the polarizabilities α1 and α2, the required offset electric field value E is obtained according to the following formula.shift :

[0078]

[0079] In one specific embodiment, the measured signal electric field value acquisition module is specifically used for:

[0080] According to the offset electric field value E shift When a deflection electric field is applied, the corresponding energy levels of the Rydberg atom shift within this field. In the Rydberg state, the atom exhibits electromagnetic induction transparency, forming an EIT spectrum. When a microwave electric field is received, and the microwave frequency resonates with the energy interval between the sub-levels of the corresponding D and P states, the EIT spectrum changes from a single peak to a double peak. The interval between the two double peaks is Δf. Based on the splitting frequency interval Δf, the electric field E of the measured signal is obtained according to the following formula. M :

[0081]

[0082] In the formula, h is Planck's constant; It represents the electric dipole moment.

[0083] This invention provides a quantum field strength measurement system controlled by offset electric field. It utilizes the energy level shift effect of Rydberg atoms under the action of electrostatic or low-frequency electric fields to achieve wide-bandwidth frequency measurement of microwave electric fields, thereby increasing the frequency response range of the interaction between Rydberg atoms and microwaves. Based on this scheme, the energy level shift of Rydberg atoms can be quantitatively and accurately controlled. The energy levels of Rydberg atoms actively match the frequency of the microwave being measured, so that the difference between the microwave frequency and the frequency of the shifted atomic energy level satisfies the resonance condition. Then, the electric field strength of microwaves of other frequencies is measured again by EIT-AT splitting generated by dipole resonance transition.

[0084] Although preferred embodiments of the invention have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments as well as all changes and modifications falling within the scope of the invention.

[0085] Obviously, those skilled in the art can make various modifications and variations to this invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims of this invention and their equivalents, this invention also intends to include these modifications and variations.

Claims

1. A method for measuring quantum field strength controlled by a deflected electric field, characterized in that, The method includes: Based on the microwave frequency of the signal being measured, select a Rydberg atomic energy level close to resonance; Based on the Rydberg atomic energy levels, the wavelength of the coupled light is determined and Rydberg atoms are prepared. At the same time, the difference between the microwave frequency and the resonant transition frequency of the measured signal is obtained, and the energy level offset is obtained based on the difference. Obtain the polarizability of the Rydberg atomic energy level, and based on the energy level offset and polarizability, obtain the offset electric field value to be applied; According to the offset electric field value, the offset electric field is turned on, causing the relevant energy levels of the Rydberg atom to move in the offset electric field. When the energy difference between the offset Rydberg energy level and the adjacent energy level resonates with the microwave frequency of the measured signal, the offset sub-energy level forms an energy level split and generates frequency split. The electric field of the measured signal is measured according to the interval between the frequency splits.

2. The method according to claim 1, characterized in that, The step of selecting a Rydberg atomic energy level close to resonance based on the microwave frequency of the measured signal specifically includes: If the microwave frequency range of the signal being measured is within the first preset range, then select nD. 5 / 2 Energy levels and (n+1)P 3 / 2 The energy level is a near-resonant Rydberg atomic energy level; If the microwave frequency range of the signal being measured is within the second preset range, then select nD. 5 / 2 Energy levels and (n+2)P 3 / 2 The energy level is a near-resonant Rydberg atomic energy level; Wherein, the microwave frequency value of the measured signal corresponding to the first preset range is less than the microwave frequency value of the measured signal corresponding to the second preset range.

3. The method according to claim 2, characterized in that, The process involves determining the coupling light wavelength and preparing Rydberg atoms based on the Rydberg atomic energy levels, simultaneously obtaining the difference between the microwave frequency and the resonant transition frequency of the measured signal, and acquiring the energy level shift based on the difference. Specifically, this includes: Based on the microwave frequency range of the measured signal, the corresponding D-state and P-state energy levels are selected as near-resonance Rydberg atomic energy levels. According to these Rydberg atomic energy levels, the coupling laser wavelength is adjusted to a preset value. Simultaneously, the difference Δ between the microwave frequency of the measured signal and the resonant transition frequency is obtained. The energy level offset N is then calculated based on this difference Δ using the following formula. shift : N shift =hΔ; In the formula, h is Planck's constant; the formula for calculating the difference Δ is Δ=Δ1+Δ2, where Δ1 is the energy level shift change under the electric field when the Rydberg atomic energy level is in the corresponding D state energy level, and Δ2 is the energy level shift change under the electric field when the Rydberg atomic energy level is in the corresponding P state energy level.

4. The method according to claim 3, characterized in that, The process of obtaining the polarizability of the Rydberg atomic energy level, and obtaining the required offset electric field value based on the energy level offset and polarizability, specifically includes: The polarizabilities α1 and α2 of the Rydberg atomic energy levels, corresponding to the D and P states respectively, are obtained. Based on the energy level shift N... shift Given the polarizabilities α1 and α2, the required offset electric field value E is obtained according to the following formula. shift :

5. The method according to claim 4, characterized in that, The process involves activating the offset electric field based on the offset electric field value, causing the relevant energy levels of the Rydberg atom to shift within the offset electric field. When the energy difference between the offset Rydberg energy level and its neighboring energy levels resonates with the microwave frequency of the measured signal, the offset sub-energy level undergoes energy level splitting, resulting in frequency splitting. The electric field of the measured signal is then measured based on the interval between these frequency splits. Specifically, this includes: According to the offset electric field value E shift When a deflection electric field is applied, the corresponding energy levels of the Rydberg atom shift within this field. In the Rydberg state, the atom exhibits electromagnetic induction transparency, forming an EIT spectrum. When a microwave electric field is received, and the microwave frequency resonates with the energy interval between the sub-levels of the corresponding D and P states, the EIT spectrum changes from a single peak to a double peak. The interval between the two double peaks is Δf. Based on the splitting frequency interval Δf, the electric field E of the measured signal is obtained according to the following formula. M : In the formula, h is Planck's constant; It represents the electric dipole moment.

6. A quantum field strength measurement system controlled by a deflected electric field, characterized in that, The quantum field strength measurement method using the offset electric field modulation method according to any one of claims 1 to 5, the system comprising: The selection module is used to select the Rydberg atomic energy level close to resonance based on the microwave frequency of the signal being measured. The energy level offset acquisition module is used to determine the coupling light wavelength and prepare Rydberg atoms based on the Rydberg atom energy level, and at the same time acquire the difference between the microwave frequency and the resonant transition frequency of the measured signal, and acquire the energy level offset based on the difference. The offset electric field value acquisition module is used to acquire the polarizability of the Rydberg atomic energy level, and to acquire the offset electric field value to be applied based on the energy level offset and polarizability. The module for acquiring the electric field value of the measured signal is used to activate the offset electric field according to the offset electric field value, so that the relevant energy levels of the Rydberg atom move in the offset electric field. When the energy difference between the offset Rydberg energy level and the adjacent energy level resonates with the microwave frequency of the measured signal, the offset sub-energy level forms an energy level split and generates frequency splitting. The electric field of the measured signal is measured according to the interval between the frequency splits.

7. The system according to claim 6, characterized in that, The selection module is specifically used for: If the microwave frequency range of the signal being measured is within the first preset range, then select nD. 5 / 2 Energy levels and (n+1)P 3 / 2 The energy level is a near-resonant Rydberg atomic energy level; If the microwave frequency range of the signal being measured is within the second preset range, then select nD. 5 / 2 Energy levels and (n+2)P 3 / 2 The energy level is a near-resonant Rydberg atomic energy level; Wherein, the microwave frequency value of the measured signal corresponding to the first preset range is less than the microwave frequency value of the measured signal corresponding to the second preset range.

8. The system according to claim 7, characterized in that, The energy level offset acquisition module is specifically used for: Based on the microwave frequency range of the measured signal, the corresponding D-state and P-state energy levels are selected as near-resonance Rydberg atomic energy levels. According to these Rydberg atomic energy levels, the coupling laser wavelength is adjusted to a preset value. Simultaneously, the difference Δ between the microwave frequency of the measured signal and the resonant transition frequency is obtained. The energy level offset N is then calculated based on this difference Δ using the following formula. shift : N shift =hΔ; In the formula, h is Planck's constant; the formula for calculating the difference Δ is Δ=Δ1+Δ2, where Δ1 is the energy level shift change under the electric field when the Rydberg atomic energy level is in the corresponding D state energy level, and Δ2 is the energy level shift change under the electric field when the Rydberg atomic energy level is in the corresponding P state energy level.

9. The system according to claim 8, characterized in that, The offset electric field value acquisition module is specifically used for: The polarizabilities α1 and α2 of the Rydberg atomic energy levels, corresponding to the D and P states respectively, are obtained. Based on the energy level shift N... shift Given the polarizabilities α1 and α2, the required offset electric field value E is obtained according to the following formula. shift :

10. The system according to claim 9, characterized in that, The module for acquiring the electric field value of the measured signal is specifically used for: According to the offset electric field value E shift When a deflection electric field is applied, the corresponding energy levels of the Rydberg atom shift within this field. In the Rydberg state, the atom exhibits electromagnetic induction transparency, forming an EIT spectrum. When a microwave electric field is received, and the microwave frequency resonates with the energy interval between the sub-levels of the corresponding D and P states, the EIT spectrum changes from a single peak to a double peak. The interval between the two double peaks is Δf. Based on the splitting frequency interval Δf, the electric field E of the measured signal is obtained according to the following formula. M : In the formula, h is Planck's constant; It represents the electric dipole moment.

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