A switch cabinet insulation micro-component defect evaluation method and device and test system

Abstract

The application discloses a switch cabinet insulation micro-component defect evaluation method and device and a test system. The method comprises the following steps: collecting comprehensive ground voltage measurement values of multiple groups of target insulation micro-components under the joint action of a preset power frequency voltage and a preset operating overvoltage, wherein the preset power frequency voltage comprises a first preset amplitude, and the preset operating overvoltage comprises a second preset amplitude; based on the comprehensive ground voltage measurement values, an initial theoretical calculation model is optimized by using a heuristic search algorithm to obtain a theoretical calculation optimization model; a defect degree evaluation factor of the target insulation micro-component is calculated according to a comprehensive ground voltage theoretical value and the first preset amplitude, wherein the comprehensive ground voltage theoretical value is obtained according to the theoretical calculation optimization model; and the defect degree of the target insulation micro-component is evaluated according to the defect degree evaluation factor to obtain a defect degree evaluation result. The application can solve the technical problem that insulation micro-component defects are prone to partial discharge and easily lead to insulation deterioration, but there is a lack of a relevant defect evaluation scheme.

Description

Technical Field

[0001] This application relates to the field of workpiece defect detection technology, and in particular to a method, device and test system for evaluating defects in micro-components of switchgear insulation. Background Technology

[0002] Air-insulated switchgear is one of the most widely used electrical devices in power distribution systems. This equipment primarily utilizes environmentally friendly gas insulation technology, supplemented by solid insulation technology. The insulating components of air-insulated switchgear are among its weakest points. Micro-defects in the insulating components, such as micro-solid protrusions, caused during manufacturing, assembly, transportation, installation, and long-term operation, can lead to abnormal electric fields inside the switchgear, making it prone to partial discharge. Furthermore, considering the frequent operation of the switchgear to meet the actual operational needs of the power grid, which can cause operational overvoltages, the insulation of the switchgear components will further deteriorate under long-term operating conditions. Currently, performance evaluation of the insulation defect level of switchgear mainly focuses on partial discharge detection and diagnosis, with very little research on the degree of micro-solid protrusion defects in the insulating components. Statistics show that insulation failure is the main cause of air-insulated switchgear failures, and micro-defects in the insulating components seriously affect the safe and stable operation of air-insulated switchgear. Summary of the Invention

[0003] This application provides a method, device, and test system for evaluating defects in micro-components of switchgear insulation, which addresses the technical problem that defects in micro-components are prone to partial discharge and insulation degradation, but currently lack relevant defect evaluation solutions.

[0004] In view of this, the first aspect of this application provides a method for evaluating defects in micro-components of switchgear insulation, comprising:

[0005] Collect comprehensive ground voltage measurements of multiple target insulated micro-components under the combined action of a preset power frequency voltage and a preset operating overvoltage. The preset power frequency voltage includes a first preset amplitude, and the preset operating overvoltage includes a second preset amplitude.

[0006] Based on the comprehensive ground voltage measurement values, a heuristic search algorithm is used to optimize the initial theoretical calculation model, resulting in an optimized theoretical calculation model.

[0007] The defect severity assessment factor of the target insulating micro-component is calculated based on the comprehensive theoretical value of the ground voltage and the first preset amplitude. The comprehensive theoretical value of the ground voltage is obtained based on the theoretical calculation optimization model.

[0008] The defect severity of the target insulating micro-component is evaluated based on the defect severity evaluation factor to obtain a defect severity evaluation result, which includes general defects, moderate defects, and severe defects.

[0009] Preferably, the method involves collecting the combined ground voltage measurement values ​​of multiple target insulating micro-components under the combined action of a preset power frequency voltage and a preset operational overvoltage. The preset power frequency voltage includes a first preset amplitude, and the preset operational overvoltage includes a second preset amplitude, comprising:

[0010] S1: A preset power frequency voltage with a first preset amplitude is generated by a power frequency transformer and applied to the target insulating micro-component;

[0011] S2: Simultaneously, a preset operating overvoltage with a second preset amplitude is generated by operating the overvoltage generator and applied to the target insulating micro-component;

[0012] S3: Use a ground voltage monitor to collect the combined ground voltage measurement value under the combined action of the preset power frequency voltage and the preset operational overvoltage;

[0013] S4: Replace the target insulating micro-component with a preset simulation object, return to step S1, and obtain multiple sets of the comprehensive ground voltage measurement values.

[0014] Preferably, the step of optimizing the initial theoretical calculation model based on the comprehensive ground voltage measurement value using a heuristic search algorithm to obtain an optimized theoretical calculation model includes:

[0015] Multiple sets of initial integrated ground voltage theoretical values ​​were determined based on the initial theoretical calculation model;

[0016] A target function based on a heuristic search algorithm is constructed based on multiple sets of comprehensive ground voltage measurements and the initial comprehensive ground voltage theoretical value.

[0017] The objective function is optimized through iterative calculation to obtain the optimal error coefficient;

[0018] The initial theoretical calculation model is optimized based on the optimal error coefficient to obtain the optimized theoretical calculation model.

[0019] Preferably, the step of optimizing the initial theoretical calculation model based on the comprehensive ground voltage measurement value using a heuristic search algorithm to obtain an optimized theoretical calculation model further includes:

[0020] An initial theoretical calculation model is constructed based on the first preset amplitude and the initial error coefficient.

[0021] The second aspect of this application provides a device for evaluating defects in micro-components of switchgear insulation, comprising:

[0022] The voltage acquisition unit is used to acquire the comprehensive ground voltage measurement value of multiple target insulating micro-components under the combined action of a preset power frequency voltage and a preset operating overvoltage. The preset power frequency voltage includes a first preset amplitude, and the preset operating overvoltage includes a second preset amplitude.

[0023] The model optimization unit is used to optimize the initial theoretical calculation model based on the comprehensive ground voltage measurement value using a heuristic search algorithm to obtain the optimized theoretical calculation model.

[0024] An evaluation calculation unit is used to calculate the defect degree evaluation factor of the target insulating micro-component based on the comprehensive theoretical value of the ground voltage and the first preset amplitude, wherein the comprehensive theoretical value of the ground voltage is obtained according to the theoretical calculation optimization model;

[0025] The evaluation and analysis unit is used to evaluate the defect degree of the target insulating micro-component according to the defect degree evaluation factor, and obtain the defect degree evaluation result, which includes general defects, moderate defects and severe defects.

[0026] Preferably, the voltage acquisition unit is specifically used for:

[0027] S1: A preset power frequency voltage with a first preset amplitude is generated by a power frequency transformer and applied to the target insulating micro-component;

[0028] S2: Simultaneously, a preset operating overvoltage with a second preset amplitude is generated by operating the overvoltage generator and applied to the target insulating micro-component;

[0029] S3: Use a ground voltage monitor to collect the combined ground voltage measurement value under the combined action of the preset power frequency voltage and the preset operational overvoltage;

[0030] S4: Replace the target insulating micro-component with a preset simulation object, return to step S1, and obtain multiple sets of the comprehensive ground voltage measurement values.

[0031] Preferably, the model optimization unit is specifically used for:

[0032] Multiple sets of initial integrated ground voltage theoretical values ​​were determined based on the initial theoretical calculation model;

[0033] A target function based on a heuristic search algorithm is constructed based on multiple sets of comprehensive ground voltage measurements and the initial comprehensive ground voltage theoretical value.

[0034] The objective function is optimized through iterative calculation to obtain the optimal error coefficient;

[0035] The initial theoretical calculation model is optimized based on the optimal error coefficient to obtain the optimized theoretical calculation model.

[0036] The third aspect of this application provides a test system for defects in micro-components of switchgear insulation, comprising: a host computer, a power frequency power supply module, an operating overvoltage module, a voltage monitoring module, and a switchgear;

[0037] The host computer is electrically connected to the power frequency power supply module, the operation overvoltage module, and the voltage monitoring module, respectively.

[0038] The target insulating micro-component in the switchgear is electrically connected to the power frequency power supply module, the operating overvoltage module, and the voltage monitoring module via cables and busbars, respectively.

[0039] The target insulating micro-component is grounded via a grounding grid;

[0040] The power frequency power supply module, the overvoltage control module, and the voltage monitoring module are all grounded through a grounding device.

[0041] Preferably, the power frequency power supply module includes a power frequency amplitude control device, a power frequency source, an AC-DC module, a DC-AC module, a power frequency transformer, and a power frequency power switch, which are connected in sequence.

[0042] The overvoltage control module includes an overvoltage generator controller, an overvoltage generator, and an overvoltage switch, which are connected in sequence.

[0043] Preferably, the voltage monitoring module includes: a comprehensive ground voltage monitor and a voltage divider;

[0044] The integrated ground voltage monitoring instrument is electrically connected to the voltage divider.

[0045] As can be seen from the above technical solutions, the embodiments of this application have the following advantages:

[0046] This application provides a method for evaluating defects in micro-components of switchgear insulation, comprising: collecting comprehensive ground voltage measurements of multiple target micro-components under the combined action of a preset power frequency voltage and a preset operating overvoltage, wherein the preset power frequency voltage includes a first preset amplitude and the preset operating overvoltage includes a second preset amplitude; optimizing an initial theoretical calculation model based on the comprehensive ground voltage measurements using a heuristic search algorithm to obtain an optimized theoretical calculation model; calculating a defect severity evaluation factor for the target micro-components based on the theoretical value of the comprehensive ground voltage and the first preset amplitude, wherein the theoretical value of the comprehensive ground voltage is obtained from the optimized theoretical calculation model; and evaluating the defect severity of the target micro-components based on the defect severity evaluation factor to obtain a defect severity evaluation result, wherein the defect severity evaluation result includes general defects, relatively serious defects, and severe defects.

[0047] This application provides a method for evaluating defects in micro-components of switchgear insulation. It simulates the potential operating environment of the micro-component by applying both power frequency voltage and operational overvoltage to the target insulation component. Based on this, it provides a specific calculation method for defect evaluation factors, thereby obtaining the defect evaluation result. This process is unaffected by subjective factors, and the calculation and operation procedures are simple and easy to execute, making it applicable to practical engineering projects. Therefore, this application addresses the technical problem that defects in insulation micro-components are prone to partial discharge and insulation degradation, but currently lack relevant defect evaluation solutions. Attached Figure Description

[0048] Figure 1 A flowchart illustrating a method for evaluating defects in micro-components of switchgear insulation, provided in an embodiment of this application;

[0049] Figure 2 A schematic diagram of a defect assessment device for micro-components of switchgear insulation provided in this application embodiment;

[0050] Figure 3 A schematic diagram of a defect testing system for micro-components of switchgear insulation provided in this application embodiment;

[0051] Figure reference numerals: 1. Host computer; 2. Power frequency amplitude control device; 3. Power frequency power supply module; 4. Power frequency source; 5. AC-DC module; 6. DC-AC module; 7. Power frequency transformer; 81. Power frequency power switch; 82. Overvoltage switch; 91. High voltage armored cable I; 92. High voltage armored cable II; 93. High voltage armored cable III; 10. Switch cabinet; 11. Target insulation micro-component sample; 12. Grounding grid; 131. Grounding device I; 132. Grounding device II; 133. Grounding device III; 134. Grounding device IV; 14. Operational overvoltage generator controller; 15. Operational overvoltage generator; 16. Integrated ground voltage monitor; 17. Micro-solid protrusion defect in insulation component; 18. Voltage divider; 19. Busbar. Detailed Implementation

[0052] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present application.

[0053] For easier understanding, please refer to Figure 1 An embodiment of a method for evaluating defects in micro-components of switchgear insulation provided in this application includes:

[0054] Step 101: Collect the comprehensive ground voltage measurement values ​​of multiple target insulating micro-components under the combined action of preset power frequency voltage and preset operating overvoltage. The preset power frequency voltage includes a first preset amplitude, and the preset operating overvoltage includes a second preset amplitude.

[0055] Further, step 101 includes:

[0056] S1: A preset power frequency voltage with a first preset amplitude is generated by a power frequency transformer and applied to the target insulating micro-component;

[0057] S2: Simultaneously, a preset operating overvoltage with a second preset amplitude is generated by operating the overvoltage generator and applied to the target insulating micro-component;

[0058] S3: Use a ground voltage monitor to collect the combined ground voltage measurement value under the combined action of preset power frequency voltage and preset operational overvoltage;

[0059] S4: Replace the target insulating micro-component with a preset simulation object, return to step S1, and obtain multiple sets of comprehensive ground voltage measurement values.

[0060] It should be noted that the preset power frequency voltage and preset switching overvoltage are generated by specific equipment and applied simultaneously to the target insulating micro-component. Then, a specific ground voltage monitor can be used to collect the comprehensive ground voltage measurement value U of the target insulating micro-component after the application. Y Moreover, the first preset amplitude U X1 Second preset amplitude U X2 All settings can be adjusted according to actual needs, and no restrictions are imposed here.

[0061] The target insulating micro-component in this embodiment may include, but is not limited to, insulating micro-bulges. If the target insulating micro-component is an insulating micro-bulge, then the pre-set simulation in this embodiment can be a brass needle electrode as an insulating micro-bulge sample to achieve multiple pressure applications and comprehensive ground voltage acquisition, thereby obtaining multiple sets of comprehensive ground voltage measurement values.

[0062] It should be noted that if brass needle electrodes are used as samples, the length and spacing of the needle electrodes need to be set reasonably. Specifically, the design can be based on the length range of the micro-solid protrusion defect, and there is no specific limitation.

[0063] Step 102: Based on the comprehensive ground voltage measurement values, the initial theoretical calculation model is optimized using a heuristic search algorithm to obtain the optimized theoretical calculation model.

[0064] Further, step 102 includes:

[0065] Multiple sets of initial integrated ground voltage theoretical values ​​were determined based on the initial theoretical calculation model;

[0066] A target function based on a heuristic search algorithm is constructed based on multiple sets of integrated ground voltage measurements and initial integrated ground voltage theoretical values.

[0067] The objective function is optimized through iterative optimization to obtain the optimal error coefficient.

[0068] The initial theoretical calculation model is optimized based on the optimal error coefficient to obtain the optimized theoretical calculation model.

[0069] Furthermore, step 102, preceding the following, also includes:

[0070] An initial theoretical calculation model is constructed based on the first preset amplitude and the initial error coefficient.

[0071] Understandably, the initial theoretical calculation model is used to calculate the theoretical value of the integrated ground voltage. Specifically, the initial theoretical calculation model, based on the first preset amplitude and the initial error coefficient, is expressed as follows:

[0072]

[0073] Among them, U T U is the initial theoretical value of the integrated ground voltage, n is the initial error coefficient, and U is the initial theoretical value of the integrated ground voltage. X1 Let y be the first preset amplitude, and y be the integral variable.

[0074] If m sets of integrated ground voltage measurements can be obtained through the method described above, then the corresponding number of initial integrated ground voltage theoretical values, i.e., m sets, can be calculated here based on the initial theoretical calculation model.

[0075] This embodiment optimizes and adjusts the initial theoretical calculation model based on a heuristic search algorithm to obtain the optimal error coefficient n0. First, an objective function based on the heuristic search algorithm is constructed based on multiple sets of integrated ground voltage measurements and the initial integrated ground voltage theoretical value:

[0076]

[0077] Where f(n) is the objective function, U Tj U Yj These are the initial theoretical value of the integrated ground voltage and the measured value of the integrated ground voltage for the j-th group, respectively, where p is the integration factor.

[0078] Then, a new perturbation solution n' is generated, and the objective function is calculated:

[0079] Δf=f(n)-f(n')

[0080] If Δf≥0, then accept the new solution; otherwise, obtain the new solution according to the probability acceptance criterion.

[0081] Next, it is determined whether the number of iterations has been reached. If not, a new perturbation solution is generated and Δf is calculated. If so, it is determined whether the termination condition is met. If it is met, the operation ends and the optimal solution, i.e. the optimal error coefficient n0, is obtained. Otherwise, the number of iterations is reset and a new perturbation solution is generated and calculated until the optimal error coefficient is obtained.

[0082] Substituting the obtained optimal error coefficients into the initial theoretical calculation model yields the optimized theoretical calculation model:

[0083]

[0084] Among them, U Ti This is the calculated theoretical value of the combined voltage to ground.

[0085] Step 103: Calculate the defect degree assessment factor of the target insulating micro-component based on the comprehensive theoretical value of the ground voltage and the first preset amplitude. The comprehensive theoretical value of the ground voltage is obtained based on the theoretical calculation optimization model.

[0086] The calculation process for the defect severity assessment factor is expressed as follows:

[0087]

[0088] Among them, the comprehensive ground voltage theoretical value U Ti That is, it is obtained through the above-mentioned theoretical calculation optimization model.

[0089] Step 104: Evaluate the defect level of the target insulating micro-component based on the defect level assessment factor to obtain the defect level assessment result, which includes general defects, moderate defects, and severe defects.

[0090] This embodiment compares the defect severity assessment factor C with a preset defect assessment reference range to determine the specific defect severity assessment result. Specifically:

[0091] When C∈[-0.38,0.38], it indicates that the insulation micro-components of the switchgear exhibit general-level defects and no maintenance work is required;

[0092] When C∈[-1.22,-0.42]∪[0.42,1.22], it indicates that the insulation micro-components of the switchgear have relatively serious defects, that is, the degree of defect has reached a certain level, and timely maintenance needs to be arranged.

[0093] When C∈[-∞, -1.22]∪[1.22, ∞], it indicates that the insulation micro-components of the switchgear have very serious defects, that is, the degree of defect is very high, and the relevant components need to be replaced immediately.

[0094] This application provides a method for evaluating defects in micro-components of switchgear insulation. It simulates the potential operating environment of the micro-component by applying both power frequency voltage and operational overvoltage to the target insulation component. Based on this, it provides a specific calculation method for defect evaluation factors, thereby obtaining the defect evaluation result. This process is unaffected by subjective factors, and the calculation and operation processes are simple and easy to execute, making it applicable to practical engineering projects. Therefore, this application addresses the technical problem that defects in insulation micro-components are prone to partial discharge and insulation degradation, but currently lack relevant defect evaluation solutions.

[0095] For easier understanding, please refer to Figure 2 This application provides an embodiment of a defect assessment device for micro-components in switchgear insulation, comprising:

[0096] The voltage acquisition unit 201 is used to acquire the comprehensive ground voltage measurement value of multiple sets of target insulating micro-components under the combined action of preset power frequency voltage and preset operating overvoltage. The preset power frequency voltage includes a first preset amplitude, and the preset operating overvoltage includes a second preset amplitude.

[0097] The model optimization unit 202 is used to optimize the initial theoretical calculation model based on the comprehensive ground voltage measurement value and a heuristic search algorithm to obtain the theoretical calculation optimized model.

[0098] The evaluation calculation unit 203 is used to calculate the defect degree evaluation factor of the target insulating micro-component based on the comprehensive theoretical value of the ground voltage and the first preset amplitude. The comprehensive theoretical value of the ground voltage is obtained based on the theoretical calculation optimization model.

[0099] The evaluation and analysis unit 204 is used to evaluate the defect level of the target insulating micro-component based on the defect level evaluation factor, and obtain the defect level evaluation result, which includes general defects, moderate defects and severe defects.

[0100] Furthermore, the voltage acquisition unit 201 is specifically used for:

[0101] S1: A preset power frequency voltage with a first preset amplitude is generated by a power frequency transformer and applied to the target insulating micro-component;

[0102] S2: Simultaneously, a preset operating overvoltage with a second preset amplitude is generated by operating the overvoltage generator and applied to the target insulating micro-component;

[0103] S3: Use a ground voltage monitor to collect the combined ground voltage measurement value under the combined action of preset power frequency voltage and preset operational overvoltage;

[0104] S4: Replace the target insulating micro-component with a preset simulation object, return to step S1, and obtain multiple sets of comprehensive ground voltage measurement values.

[0105] Furthermore, the model optimization unit 202 is specifically used for:

[0106] Multiple sets of initial integrated ground voltage theoretical values ​​were determined based on the initial theoretical calculation model;

[0107] A target function based on a heuristic search algorithm is constructed based on multiple sets of integrated ground voltage measurements and initial integrated ground voltage theoretical values.

[0108] The objective function is optimized through iterative optimization to obtain the optimal error coefficient.

[0109] The initial theoretical calculation model is optimized based on the optimal error coefficient to obtain the optimized theoretical calculation model.

[0110] For easier understanding, please refer to Figure 3 This application provides a test system for defects in the insulation micro-components of a switchgear, comprising: a host computer 1, a power frequency power supply module 3, an operating overvoltage module, a voltage monitoring module, and a switchgear 10;

[0111] The host computer 1 is electrically connected to the power frequency power supply module 3, the overvoltage control module, and the voltage monitoring module, respectively.

[0112] The target insulation micro-components in switchgear 10 are electrically connected to power frequency power module 3, overvoltage module and voltage monitoring module via cables and busbar 19, respectively.

[0113] The target insulated micro-component is grounded through grounding grid 12;

[0114] The power frequency power supply module 3, the overvoltage control module, and the voltage monitoring module are all grounded through a grounding device.

[0115] Furthermore, the power frequency power module 3 includes a power frequency amplitude control device 2, a power frequency source 4, an AC-DC module 5, a DC-AC module 6, a power frequency transformer 7, and a power frequency power switch 81, which are connected in sequence.

[0116] The overvoltage control module includes an overvoltage generator controller 14, an overvoltage generator 15, and an overvoltage switch 82, which are connected in sequence.

[0117] Furthermore, the voltage monitoring module includes: an integrated ground voltage monitor 16 and a voltage divider 18;

[0118] The integrated ground voltage monitor 16 is electrically connected to the voltage divider 18.

[0119] It should be noted that the output terminal of the power frequency transformer 7 is connected to the input terminal of the target insulated micro-component sample 11 through the power frequency power switch 81, the high voltage armored cable 91, and the bus 19. The input terminal of the power frequency transformer 7 is connected to the host computer 1 through the DC-AC module 6, the AC-DC module 5, the power frequency source 4, and the voltage amplitude control device 2.

[0120] The output terminal of the overvoltage generator 15 is connected to the input terminal of the target insulated micro-component sample 11 via the overvoltage switch 8282, the high-voltage armored cable 92, and the busbar 19. The input terminal of the overvoltage generator 15 is connected to the host computer 1 via the overvoltage generator controller 14.

[0121] Assuming that the target insulating micro-component sample 11 in this embodiment is an insulating micro-protrusion, and the insulating micro-protrusion defect 17 is on the skirt of the insulating component sample, and the insulating component is in the switch cabinet 10. The input terminal of the integrated ground voltage monitor 16 is connected to the target insulating micro-component through a voltage divider 18, a high-voltage armored cable 93, and a busbar 19. The integrated ground voltage monitor 16 is electrically connected to the host computer 1 and is used to send the monitored integrated ground voltage measurement value to the host computer 1.

[0122] The grounding terminals of the power frequency transformer 7, the target insulation micro-component sample 11, the operating overvoltage generator 15, the integrated ground voltage monitor 16, and the voltage divider 18 are respectively connected to grounding device one 131, grounding grid 12, grounding device two 132, grounding device three 133, and grounding device four 134, and are grounded.

[0123] Furthermore, in this embodiment, when the target insulating micro-component is an insulating micro-bulge, a brass needle electrode is used to simulate the micro-bulge defect. When replacing the simulated sample, the power frequency switch 81 and the overvoltage switch 82 need to be disconnected. Moreover, the length of the needle electrode simulation needs to be replaced at equal intervals within the length range of the insulating micro-bulge defect 17 before the test is conducted, and m sets of comprehensive ground voltage measurements are collected. In addition, the length range of the insulating micro-bulge defect 17 is L0~5L0; the interval is |L0-5L0| / (m-1).

[0124] Specifically, the power frequency power switch 81 and the overvoltage switch 82 are closed simultaneously, and the host computer 1 adjusts the amplitude of the power frequency voltage to U. X1 The host computer 1 sends a voltage amplitude setting signal to the power frequency amplitude control device 2. The power frequency amplitude control device 2, through the power frequency source 4, AC-DC module 5, and DC-AC module 6, controls the power frequency transformer 7 to generate an amplitude of U. X1 The preset power frequency voltage is then used; subsequently, the host computer 1 sends an overvoltage generation signal to the overvoltage generator controller 14, which in turn controls the overvoltage generator 15 to generate an overvoltage signal with an amplitude of U. X2The preset operating overvoltage; then, the integrated ground voltage monitor 16 monitors the target insulating micro-component sample 11 at U through the voltage divider 18. X1 with U X2 Combined ground voltage measurement value U under the combined effect Y Finally, based on the comprehensive ground voltage measurement value U... Y The theoretical value calculation model is optimized to obtain the comprehensive theoretical value of the ground voltage; and the defect degree assessment factor is calculated based on the comprehensive theoretical value of the ground voltage to obtain the defect degree assessment result of the insulation micro-component.

[0125] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0126] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0127] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0128] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for executing all or part of the steps of the methods described in the various embodiments of this application through a computer device (which may be a personal computer, server, or network device, etc.). The aforementioned storage medium includes: USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, optical disks, and other media capable of storing program code.

[0129] The above-described embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application.

Claims

1. A method for evaluating defects in micro-components of switchgear insulation, characterized in that, include: Collect comprehensive ground voltage measurements of multiple target insulated micro-components under the combined action of a preset power frequency voltage and a preset operating overvoltage. The preset power frequency voltage includes a first preset amplitude, and the preset operating overvoltage includes a second preset amplitude. Based on the comprehensive ground voltage measurements, a heuristic search algorithm was used to optimize the initial theoretical calculation model, resulting in an optimized theoretical calculation model, which is expressed as follows: ； in, To obtain the theoretical value of the comprehensive ground voltage, The first preset amplitude, The optimal error coefficients are given, and y is the integral variable. The defect severity assessment factor of the target insulating micro-component is calculated based on the theoretical value of the comprehensive ground voltage and the first preset amplitude. The theoretical value of the comprehensive ground voltage is obtained according to the theoretical calculation optimization model. The defect severity assessment factor is expressed as follows: ； The defect severity of the target insulating micro-component is evaluated based on the defect severity evaluation factor to obtain the defect severity evaluation result, which includes general defects, moderate defects, and severe defects.

2. The method for evaluating defects in micro-components of switchgear insulation according to claim 1, characterized in that, The method involves collecting comprehensive ground voltage measurements of multiple target insulated micro-components under the combined action of a preset power frequency voltage and a preset operational overvoltage. The preset power frequency voltage includes a first preset amplitude, and the preset operational overvoltage includes a second preset amplitude. S1: A preset power frequency voltage with a first preset amplitude is generated by a power frequency transformer and applied to the target insulating micro-component; S2: Simultaneously, a preset operating overvoltage with a second preset amplitude is generated by operating the overvoltage generator and applied to the target insulating micro-component; S3: Use a ground voltage monitor to collect the combined ground voltage measurement value under the combined action of the preset power frequency voltage and the preset operational overvoltage; S4: Replace the target insulating micro-component with a preset simulation object, return to step S1, and obtain multiple sets of the comprehensive ground voltage measurement values.

3. The method for evaluating defects in micro-components of switchgear insulation according to claim 1, characterized in that, Based on the comprehensive ground voltage measurement values, a heuristic search algorithm is used to optimize the initial theoretical calculation model, resulting in an optimized theoretical calculation model, including: Multiple sets of initial integrated ground voltage theoretical values ​​were determined based on the initial theoretical calculation model; Based on the multiple sets of comprehensive ground voltage measurements and the initial comprehensive ground voltage theoretical value, an objective function based on a heuristic search algorithm is constructed, and the objective function is expressed as: ； in, Let be the objective function. , These are the initial theoretical value of the integrated ground voltage and the measured value of the integrated ground voltage in the j-th group, respectively. The integral factor is m, and the total number of parameter groups is m. The objective function is optimized through iterative calculation to obtain the optimal error coefficient; The initial theoretical calculation model is optimized based on the optimal error coefficient to obtain the optimized theoretical calculation model.

4. The method for evaluating defects in micro-components of switchgear insulation according to claim 1, characterized in that, Based on the comprehensive ground voltage measurement values, a heuristic search algorithm is used to optimize the initial theoretical calculation model to obtain an optimized theoretical calculation model. Prior to this, the following steps are also included: An initial theoretical calculation model is constructed based on the first preset amplitude and the initial error coefficient.

5. A device for evaluating defects in micro-components of switchgear insulation, characterized in that, include: The voltage acquisition unit is used to acquire the comprehensive ground voltage measurement value of multiple target insulating micro-components under the combined action of a preset power frequency voltage and a preset operating overvoltage. The preset power frequency voltage includes a first preset amplitude, and the preset operating overvoltage includes a second preset amplitude. The model optimization unit is used to optimize the initial theoretical calculation model based on the comprehensive ground voltage measurement values ​​using a heuristic search algorithm, thereby obtaining an optimized theoretical calculation model, which is expressed as follows: ； in, To obtain the theoretical value of the comprehensive ground voltage, The first preset amplitude, The optimal error coefficients are given, and y is the integral variable. The evaluation calculation unit is used to calculate the defect severity evaluation factor of the target insulating micro-component based on the theoretical value of the comprehensive voltage to ground and the first preset amplitude. The theoretical value of the comprehensive voltage to ground is obtained according to the theoretical calculation optimization model, and the defect severity evaluation factor is expressed as follows: ； The evaluation and analysis unit is used to evaluate the defect degree of the target insulating micro-component according to the defect degree evaluation factor, and obtain the defect degree evaluation result, which includes general defects, moderate defects and severe defects.

6. The switchgear insulation micro-component defect assessment device according to claim 5, characterized in that, The voltage acquisition unit is specifically used for: S1: A preset power frequency voltage with a first preset amplitude is generated by a power frequency transformer and applied to the target insulating micro-component; S2: Simultaneously, a preset operating overvoltage with a second preset amplitude is generated by operating the overvoltage generator and applied to the target insulating micro-component; S3: Use a ground voltage monitor to collect the combined ground voltage measurement value under the combined action of the preset power frequency voltage and the preset operational overvoltage; S4: Replace the target insulating micro-component with a preset simulation object, return to step S1, and obtain multiple sets of the comprehensive ground voltage measurement values.

7. The switchgear insulation micro-component defect assessment device according to claim 5, characterized in that, The model optimization unit is specifically used for: Multiple sets of initial integrated ground voltage theoretical values ​​were determined based on the initial theoretical calculation model; Based on the multiple sets of comprehensive ground voltage measurements and the initial comprehensive ground voltage theoretical value, an objective function based on a heuristic search algorithm is constructed, and the objective function is expressed as: ； in, Let be the objective function. , These are the initial theoretical value of the integrated ground voltage and the measured value of the integrated ground voltage in the j-th group, respectively. The integral factor is m, and the total number of parameter groups is m. The objective function is optimized through iterative calculation to obtain the optimal error coefficient; The initial theoretical calculation model is optimized based on the optimal error coefficient to obtain the optimized theoretical calculation model.

8. A test system for defects in micro-components of switchgear insulation, used to implement the defect assessment method for micro-components of switchgear insulation according to any one of claims 1-4, characterized in that, include: Host computer, power frequency power supply module, overvoltage control module, voltage monitoring module, and switch cabinet; The host computer is electrically connected to the power frequency power supply module, the operation overvoltage module, and the voltage monitoring module, respectively. The target insulating micro-component in the switchgear is electrically connected to the power frequency power supply module, the operating overvoltage module, and the voltage monitoring module via cables and busbars, respectively. The target insulating micro-component is grounded via a grounding grid; The power frequency power supply module, the overvoltage control module, and the voltage monitoring module are all grounded through a grounding device.

9. The switchgear insulation micro-component defect testing system according to claim 8, characterized in that, The power frequency power module includes a power frequency amplitude control device, a power frequency source, an AC-DC module, a DC-AC module, a power frequency transformer, and a power frequency power switch, which are connected in sequence. The overvoltage control module includes an overvoltage generator controller, an overvoltage generator, and an overvoltage switch, which are connected in sequence.

10. The switchgear insulation micro-component defect testing system according to claim 8, characterized in that, The voltage monitoring module includes: a comprehensive ground voltage monitor and a voltage divider; The integrated ground voltage monitoring instrument is electrically connected to the voltage divider.

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