A bridge arm switching device, a test system and a test method for a power device

Abstract

The present invention discloses a bridge arm switching device, a test system and a test method for a power device. The bridge arm switching device includes a fixed frame, a contact group plate, a test assembly and a drive module installed on the fixed frame; the contact group plate is arranged on the fixed frame, and the side of the contact group plate away from the fixed frame includes a power supply area, a test area, a module input area, a load area and an insulation area; the test assembly includes a plate body, a test piece installed on the plate body, a plurality of load conductive groups and two power conductive groups, and the test piece is used to be respectively connected with the plurality of test areas to switch the bridge arm to access the test system; the drive module is used to drive the plate body to move; when the plate body moves to the first preset position, the plurality of load conductive groups are all connected to the module input area and the load area, and the two power conductive groups are conductively connected to the power area. In this way, the drive module drives the plate body to move so that the test piece can be connected to different test areas, thereby switching the bridge arm to access the external test system.

Description

Technical Field

[0001] The embodiments of the present invention relate to the field of power device testing, and in particular to a bridge arm switching device and a testing system. Background Art

[0002] Generally speaking, in order to ensure that electrical devices can operate stably for a long time, a series of stability tests are usually performed on power devices (such as MOS, IGBT), such as thermal resistance tests or voltage drop tests. When performing these tests, it is usually necessary to test multiple bridge arms separately, that is, it is necessary to switch to different bridge arms to perform the experiments during the test.

[0003] At present, the bridge arm switching method is to control multiple cylinders controlled by PLC to extend and retract in a preset extension and retraction sequence. The output ends of the multiple cylinders are all provided with spring pins for conducting electricity. Different spring pins are conductively connected with the contact group plate to achieve the connection of different bridge arms. This switching method requires multiple cylinders to be equipped, and it is difficult to ensure whether the spring pins and the contact group plate are welded due to excessive heat under high current conditions when switching the bridge arm, which brings inconvenience. Summary of the invention

[0004] In order to solve the above technical problems, an embodiment of the present invention provides an easy-to-use bridge arm switching device and a testing system.

[0005] The embodiment of the present invention solves the technical problem by adopting the following technical solution:

[0006] A bridge arm switching device comprises a fixing frame, a contact group plate, a test assembly and a driving module, wherein the fixing frame comprises a platform and a bracket mounted on the platform; the contact group plate is arranged on the platform, and the side of the contact group plate facing away from the platform comprises a conductive power supply area, multiple groups of conductive test areas, a module input area, a load area and an insulating area; the test assembly comprises a board body, a test piece, multiple groups of load conductive groups located on one side of the board body and two groups of power conductive connection groups located on the other side of the board body, the multiple groups of load conductive groups, the two groups of power conductive connection groups and the test piece are all installed on the board body, the multiple groups of load conductive groups are all spaced apart from the two groups of power conductive connection groups in a first direction, the first direction is a direction parallel to the plane of the platform, the test piece is used to respectively conduct with the multiple groups of test areas to switch the bridge arm to access the test device; the driving module is installed on the bracket, the driving module is connected to the board body, and is used to drive the board body to move;

[0007] When the driving module drives the plate to move to a first preset position, multiple groups of the load conductive groups are connected to the module input area and the load area, and two groups of the power conductive groups are conductively connected to the power area. When the driving module drives the plate to move to a second preset position along the first direction, multiple groups of the load conductive groups are disconnected from the load area, the test piece is connected to the test area, and two groups of the power conductive groups are connected to the power area and the module input area.

[0008] Optionally, the power supply area includes an experimental power supply area, a first test power supply area, a second test power supply area and a module power supply area, the module power supply area is arranged between the first test power supply area and the second test power supply area, along the first direction, the experimental power supply area is located at an end of the contact group plate away from the test area; the test area is located on a side of the first test power supply area away from the module power supply area, the load area and the test area are arranged opposite to each other in the second direction, and the second direction is perpendicular to the first direction;

[0009] When the plate moves to the first preset position, multiple groups of the load conductive groups are connected to the load area and the module input area, and two groups of the power conductive groups are connected to the module power area and the experimental power area; when the plate moves to the second preset position, multiple groups of the load conductive groups are separated from the load area and the module input area, one group of the power conductive groups is respectively connected to the first test power area and the module power area, and the other group of the power conductive groups is respectively connected to the second test power area and the module input area.

[0010] Optionally, the number of the test areas is at least four test unit areas, and the driving module drives the plate to move along the first direction so that the test piece is connected to at least four of the test unit areas respectively.

[0011] Optionally, the first test power supply area includes a first test positive pole area and a first test negative pole area that are adjacent to each other, and the second test power supply area includes a second test positive pole area and a second test negative pole area that are adjacent to each other. The first test positive pole area is provided with a plurality of first protrusions that are spaced apart, the first test negative pole area is provided with a plurality of second protrusions that are spaced apart, the second test positive pole area is provided with a plurality of third protrusions that are spaced apart, and the second test negative pole area is provided with a plurality of fourth protrusions that are spaced apart. Along the first direction, the first protrusions are adjacent to the second protrusions in an alternating manner, and the third protrusions are adjacent to the fourth protrusions in an alternating manner.

[0012] Optionally, the length of the test unit area in the first direction is d1, the maximum distance between the first protrusion and the second protrusion in the first direction is d2, and the maximum distance between the third protrusion and the fourth protrusion in the first direction is d3, satisfying: d1=d2 and / or d1=d3, so that when the test piece moves from one end of the test unit area to the other end, the power conduction group can switch the electrode area of ​​the connected power area.

[0013] Optionally, the two groups of power conductive groups are respectively a first power conductive group and a second power conductive group, the first power conductive group includes a first conductive row, a first conductive pin group arranged at one end of the first conductive row, and a second conductive pin group arranged at the other end of the first conductive row, and the second power conductive group includes a second conductive row, a third conductive pin group arranged at one end of the second conductive row, and a fourth conductive pin group arranged at the other end of the second conductive row;

[0014] When the test piece is located at one end of the test unit area, the first conductive needle group is connected to the first protrusion of the first test positive electrode area, the second conductive needle group is connected to the module power supply area, the third conductive needle group is connected to the module input area, and the fourth conductive needle group is connected to the fourth protrusion of the second test negative electrode area;

[0015] When the test piece is located at the other end of the test unit area, the first conductive needle group is connected to the second protrusion of the first test negative electrode area, the second conductive needle group is connected to the module power supply area, the third conductive needle group is connected to the module input area, and the fourth conductive needle group is connected to the third protrusion of the second test positive electrode area.

[0016] Optionally, the length of the test unit area in the first direction is d1, the module input area includes a U-phase input area, a V-phase input area and a W-phase input area arranged along the first direction, and the length of the U-phase input area, the V-phase input area and the W-phase input area in the first direction is d4, satisfying d4≥d1.

[0017] Optionally, the load area includes a U-phase load area, a V-phase load area and a W-phase load area, and the number of the load conductive groups is three. When the driving module drives the plate to move to the first preset position, one group of the load conductive groups connects the U-phase input area and the U-phase load area, one group of the load conductive groups connects the V-phase input area and the V-phase load area, and one group of the load conductive groups connects the W-phase input area and the W-phase load area.

[0018] Optionally, the driving module includes a transverse driving module and a longitudinal driving module, the transverse driving module is installed on the bracket, the longitudinal driving module is installed on the transverse driving module, the plate body is connected to the longitudinal driving module, the transverse driving module is used to drive the longitudinal driving module to move along the first direction, and the longitudinal driving module is used to drive the plate body to move along the second direction, and the second direction is perpendicular to the first direction and the platform.

[0019] The embodiment of the present invention also adopts the following technical solutions to solve the technical problems:

[0020] A test system comprises the above-mentioned bridge arm switching device, a device to be tested, a test apparatus and a load, wherein the load is connected to the load area, the test apparatus is connected to the test piece, and the device to be tested is connected to the power supply area and the module input area.

[0021] The embodiment of the present invention also adopts the following technical solutions to solve the technical problems:

[0022] A testing method for a power device is applied to the above-mentioned testing system, and the steps of the testing method include: receiving a first driving instruction and determining whether the plate is at a safe position height; if so, controlling the plate to move to the first preset position and executing a first descending instruction, so that multiple groups of the load conductive groups and two groups of the power conductive groups are all descended in a preset descending manner and realize the connection of the module input area and the load area, and the power conductive group and the power area are conductively connected; determining whether the power-on time of the load conductive group connected to the module input area and the load area meets the first preset time length; if so, sending a second driving instruction; receiving the second driving instruction and determining whether the plate is at a safe position height; if so, controlling the plate to move to the second preset position and executing a second descending instruction, so that the The test piece descends to the first position of the test area in a preset descending manner, and the power conductor group is connected to the power area; it is determined whether the power-on time between the test piece and the test area meets the second preset time length; if so, an ascending instruction is sent to drive the board to rise to a safe height; an experimental switching instruction is received and the test piece is driven to move to the second position of the test area, and the power conductor group moves synchronously; a third descending instruction is received and the test piece is driven to descend to the second position of the test area in the preset descending manner, and two groups of the power conductor groups are connected to the power area; it is determined again whether the power-on time between the test piece and the test area meets the third preset time length; if so, an ascending instruction is sent to drive the board to rise to a safe height; a bridge arm switching instruction is received and the test piece is driven to move to the first position of another test area.

[0023] The beneficial effects of the embodiments of the present invention are as follows: the bridge arm switching device provided by the embodiments of the present application includes a fixing frame, a contact group plate, a test assembly and a driving module, the fixing frame includes a platform and a bracket installed on the platform; the contact group plate is arranged on the platform, and the side of the contact group plate away from the platform includes a conductive power supply area, multiple groups of conductive test areas, a module input area, a load area and an insulating area; the test assembly includes a board body, a test piece, multiple groups of load conductive groups located on one side of the board body and two groups of power conductive connection groups located on the other side of the board body, the multiple groups of load conductive groups, the two groups of power conductive connection groups and the test piece are all installed on the board body, and the multiple groups of load conductive groups are connected to the two groups of power conductive connection groups. The connection groups are arranged at intervals in the first direction, which is a direction parallel to the plane of the platform. The test piece is used to conduct with multiple groups of test areas respectively to switch the bridge arm to access the test device; the driving module is installed on the bracket, and the driving module is connected to the plate body, and is used to drive the plate body to move; when the driving module drives the plate body to move to the first preset position, the multiple groups of load conductive groups are connected to the module input area and the load area, and the two groups of power conductive connection groups are conductively connected to the power area. When the driving module drives the plate body to move along the first direction to the second preset position, the multiple groups of load conductive groups are disconnected from the load area, and the test piece is connected to the test area, and the two groups of power conductive connection groups are connected to the power area and the module input area. Through the above-mentioned device, the driving module drives the plate body to move so that the test piece can be connected to different test areas, thereby switching the bridge arm to access the external test device. Compared with the method of setting multiple cylinders to drive the conductive spring needle to switch the bridge arm respectively, it is not necessary to equip multiple cylinders, which has certain convenience, and the test piece moves with the plate body to connect to different test areas, reducing the risk of welding between the test piece and the contact group plate under high current conditions. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] One or more embodiments are exemplarily described by pictures in the corresponding drawings, and these exemplified descriptions do not constitute limitations on the embodiments. Elements with the same reference numerals in the drawings represent similar elements, and unless otherwise stated, the figures in the drawings do not constitute proportional limitations.

[0025] Figure 1 is a structural block diagram of a test system in one embodiment of the present application;

[0026] Figure 2 yes Figure 1 Structural diagram of the middle bridge arm switching device;

[0027] Figure 3 yes Figure 2 A schematic diagram of the structure of the middle contact group plate;

[0028] Figure 4 yes Figure 2 Schematic diagram of the structure of the test component;

[0029] Figure 5yes Figure 4 Schematic diagram from another perspective;

[0030] Figure 6 It is a schematic diagram of the connection between multiple load conductive groups and power conductive groups and the contact group plate when the plate body is located at the first preset position;

[0031] Figure 7 It is a schematic diagram of the connection between two power supply conductors and contact point plates when the test piece is in the first position of the first test unit area;

[0032] Figure 8 It is a schematic diagram of the connection between two power supply conductors and contact point plates when the test piece is in the second position of the first test unit area;

[0033] Fig. 9 It is a schematic diagram of the connection between the two power supply conductors and the contact plate when the test piece is in the first position of the second test unit area;

[0034] Fig.10 is a schematic diagram of the connection between the two power supply conductors and the contact point assembly board when the test piece is in the second position of the second test unit area;

[0035] Fig.11 It is the circuit equivalent diagram of the bridge arm switching device testing the device under test;

[0036] Fig.12 It is a flowchart of the test method of power devices;

[0037] In the figure: 1. test system; 2. device under test; 3. test device; 4. load; 5. bridge arm switching device; 51. fixing frame; 52. drive module; 53. contact group board; 54. test assembly; 511. bracket; 512. platform; 521. horizontal drive module; 522. longitudinal drive module; 5221. longitudinal linear module; 5222. servo motor; 5301. board body; 5302. conductive block; 5303. terminal block; 53011. avoidance; 531. power supply area; 532. test area; 533 , module input area; 534, load area; 535, insulation area; 541, board; 542, test piece; 543, load conductive group; 544, power conductive group; 5311, experimental power area; 5312, first test power area; 5313, second test power area; 5314, module power area; 53121, first test positive area; 53122, first test negative area; 53131, second test positive area; 53132, second test negative area; 53141, module positive area; 53142, module negative area ; 53121a, first protrusion; 53122a, second protrusion; 53131a, third protrusion; 53132a, fourth protrusion; 5321, test unit area; 5441, first power connection group; 5442, second power connection group; 54411, first conductive row; 54412, first conductive needle group; 54413, second conductive needle group; 54421, second conductive row; 54422, third conductive needle group; 54423, fourth conductive needle group; 5331, U phase input area; 5332, V phase Input area; 5333, W phase input area; 5341, U phase load area; 5342, V phase load area; 5343, W phase load area; 10, test power supply; 20, load power supply; 30, control switch module; 40, rectifier circuit module; 50, reactive switch; 11, first test power supply; 12, second test power supply; 31, first switch group; 32, second switch group; 33, third switch group; 41, first bridge arm; 42, second bridge arm; 43, third bridge arm; 401, first electrode bus; 402, second electrode bus. DETAILED DESCRIPTION

[0038] In order to facilitate the understanding of the present invention, the present invention is described in more detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that when an element is described as "fixed to" another element, it can be directly on another element or there can be one or more centered elements therebetween. When an element is described as "connected" to another element, it can be directly connected to another element or there can be one or more centered elements therebetween. The orientation or positional relationship indicated by the terms "upper", "lower", "inner", "outer", "vertical", "horizontal", etc. used in this specification is based on the orientation or positional relationship shown in the accompanying drawings, only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation of the present invention. In addition, the terms "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying relative importance.

[0039] Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used in this specification includes any and all combinations of one or more of the related listed items.

[0040] In addition, the technical features involved in different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0041] like Figure 1 As shown, a test system 1 provided by one embodiment of the present application includes a device under test 2, a test device 3, a load 4 and a bridge arm switching device 5, wherein the device under test 2, the test device 3 and the load 4 are all connected to the bridge arm switching device 5. Among them, the device under test 2 is used to control the operation of the load 4, and the test device 3 can be used to test the parameters of the bridge arm of the connected device under test 2, and the device under test 2 can be a MOS tube or an IGBT. On the one hand, the bridge arm switching device 5 is used to switch the bridge arm of the device under test 2 to connect to the test device 3, so as to perform thermal resistance experiments and voltage drop experiments on the device under test 2; on the other hand, the bridge arm switching device 5 can also be used to realize the connection between the load 4 and the device under test 2, so as to perform reactive power experiments.

[0042] like Figure 2 As shown, the above-mentioned bridge arm switching device 5 includes a fixed frame 51, a driving module 52, a contact group plate 53 and a test component 54. The fixed frame 51 includes a platform 512 and a bracket 511 installed on the platform 512. The driving module 52 is installed on the bracket 511, the contact group plate 53 is installed on the platform 512, and the test component 54 is installed on the driving module 52. The driving module 52 is used to drive the test component 54 to move.

[0043] The driving module 52 includes a transverse driving module 521 and a longitudinal driving module 522. The transverse driving module 521 is mounted on the bracket 511. The longitudinal driving module 522 is mounted on the transverse driving module 521 and connected to the test assembly 54. The transverse driving module 521 is used to drive the longitudinal driving module 522 to move along the first direction X. The first direction X is a direction parallel to the plane of the platform 512. The longitudinal driving module 522 is used to drive the test assembly 54 to approach or move away from the contact assembly plate 53. In this embodiment, the transverse driving module 521 includes a linear module and a motor (not shown) for driving the linear module. The longitudinal driving module 522 includes a longitudinal linear module 5221 and a servo motor 5222 for driving the longitudinal linear module 5221. The output end of the servo motor 5222 is connected to the longitudinal linear module 5221. The moving plate of the longitudinal linear module 5221 is connected to the test assembly 54.

[0044] like Figure 3 As shown, the contact assembly plate 53 includes a plate body 5301, a plurality of conductive blocks 5302 embedded in the plate body 5301, and a connection terminal 5303, wherein the connection terminal 5303 is connected to the conductive block 5302. Among them, a plurality of embedding grooves (not shown) are provided on a side of the plate body 5301 away from the platform 512, and the plurality of embedding grooves are used for embedding the conductive blocks 5302, and a plurality of avoidance openings 53011 are provided on the periphery of the plate body 5301, and the plurality of avoidance openings 53011 are used for installing the connection terminals 5303. In this embodiment, based on the object to which the conductive block 5302 is connected, the side of the contact assembly plate 53 facing away from the platform 512 includes a conductive power supply area 531, multiple groups of conductive test areas 532, a module input area 533, a load area 534 and an insulating area 535. The insulating area 535 is used to insulate the power supply area 531, multiple groups of conductive test areas 532, the module input area 533 and the load area 534, respectively.

[0045] like Figure 4-5 As shown, the test assembly 54 includes a board 541, a test piece 542, a plurality of load conductive groups 543 located on one side of the board 541, and two power conductive groups 544 located on the other side of the board 541. The plurality of load conductive groups 543, the two power conductive groups 544 and the test piece 542 are all installed on the board 541. The plurality of load conductive groups 543 are spaced apart from the two power conductive groups 544 in the first direction X. The test piece 542 is used to be respectively connected to the plurality of test areas 532 to switch the bridge arm to access the test device 3.

[0046] When the driving module 52 drives the plate body 541 to move to the first preset position, the multiple load conductive groups 543 are connected to the module input area 533 and the load area 534, and the two power conductive groups 544 are conductively connected to the power area 531. When the driving module 52 drives the plate body 541 to move to the second preset position along the first direction X, the multiple load conductive groups 543 are disconnected from the load area 534, the test piece 542 is connected to the test area 532, and the two power conductive groups 544 are connected to the power area 531 and the module input area 533. Through the above device, the driving module 52 drives the plate 541 to move so that the test piece 542 can be connected to different test areas 532, thereby switching the bridge arm of the device under test 2 to connect to the external test device 3. Compared with the method of setting multiple cylinders to drive the conductive spring needles to switch the bridge arms, it is not necessary to equip multiple cylinders, which has certain convenience, and the test piece 542 moves with the plate 541 to connect to different test areas 532, reducing the risk of welding between the test piece 542 and the contact group plate 53 under high current conditions. Welding refers to the phenomenon that metal melts at high temperature and partially condenses after cooling.

[0047] In some embodiments, Figure 3 As shown, the power supply area 531 includes an experimental power supply area 5311, a first test power supply area 5312, a second test power supply area 5313 and a module power supply area 5314. The module power supply area 5314 is arranged between the first test power supply area 5312 and the second test power supply area 5313. Along the first direction X, the test area 532 is located on the side of the first test power supply area 5312 away from the module power supply area 5314. The experimental power supply area 5311 is located on the end of the contact group plate 53 away from the test area 532. The load area 534 and the test area 532 are arranged opposite to each other in the second direction Y, and the second direction Y is perpendicular to the first direction X.

[0048] When the plate 541 moves to the first preset position, Figure 6 As shown, multiple load conductive groups 543 are connected to the load area 534 and the module input area 533, and the two power conductive groups 544 are connected to the module power area 5314 and the experimental power area 5311; when the plate 541 moves to the second preset position, as shown Figure 7 As shown, multiple groups of load conductive groups 543 are separated from the load area 534 and the module input area 533, one group of power conductive groups 544 are respectively connected to the first test power area 5312 and the module power area 5314, and another group of power conductive groups 544 are respectively connected to the second test power area 5313 and the module input area 533.

[0049] Please refer again to Figure 3The first test power supply area 5312 includes a first test positive area 53121 and a first test negative area 53122 that are adjacent to each other. The second test power supply area 5313 includes a second test positive area 53131 and a second test negative area 53132 that are adjacent to each other. Along the second direction Y, the first test negative area 53122 and the second test negative area 53132 are close to the module power supply area 5314, and the second test negative area 53132 and the second test positive area 53131 are both far away from the module power supply area 5314. The module power supply area 5314 includes a module positive area 53141 and a module negative area 53142 that are adjacent to each other. The module negative area 53142 is arranged close to the first test negative area 53122, and the module positive area 53141 is arranged close to the second test negative area 53132. The module input area 533 is arranged between the module positive area 53141 and the module negative area 53142. In this embodiment, the first test power area 5312 and the second test power area 5313 are both externally connected to the same power supply. The test area 532 is disposed close to the first test positive electrode area 53121 , and the load area 534 is disposed close to the second test positive electrode area 53131 .

[0050] In some embodiments, the first test positive region 53121 is provided with a plurality of first protrusions 53121a disposed at intervals, the first test negative region 53122 is provided with a plurality of second protrusions 53122a disposed at intervals, the second test positive region 53131 is provided with a plurality of third protrusions 53131a disposed at intervals, and the second test negative region 53132 is provided with a plurality of fourth protrusions 53132a disposed at intervals, and along the first direction X, the first protrusions 53121a and the second protrusions 53122a are staggered and adjacent, and the third protrusions 53131a and the fourth protrusions 53132a are staggered and adjacent. Staggered adjacency means that a protrusion of another polarity is accommodated between protrusions of the same polarity adjacent in the first direction. By way of example, taking the first protrusion 53121a and the second protrusion 53122a as an example, two adjacent first protrusions 53121a are provided with a second protrusion 53122a, and a first protrusion 53121a is provided between two adjacent second protrusions 53122a. By way of example, taking the third protrusion 53131a and the fourth protrusion 53132a as an example, two adjacent third protrusions 53131a are provided with a fourth protrusion 53132a, and a third protrusion 53131a is provided between two adjacent fourth protrusions 53132a.

[0051] In some embodiments, Figure 3 and Figure 6As shown, the first protrusion 53121a, the second protrusion 53122a, the third protrusion 53131a and the fourth protrusion 53132a are all rectangular in shape, the number of the test area 532 is at least four test unit areas 5321, and the driving module 52 drives the plate 541 to move along the first direction X, so that the test piece 542 is respectively connected to at least four test unit areas 5321, thereby testing different bridge arms of the device under test 2. In this embodiment, the device under test 2 has six MOS tubes connected in parallel, and there are six test unit areas 5321, and one test unit area 5321 tests one MOS tube.

[0052] In some embodiments, Figure 7 As shown, the length of the test unit area 5321 in the first direction X is d1, the maximum distance between the first protrusion 53121a and the second protrusion 53122a in the first direction X is d2, and the maximum distance between the third protrusion 53131a and the fourth protrusion 53132a in the first direction X is d3, satisfying d1=d2 and / or d1=d3, so that when the test piece 542 moves from one end of the test unit area 5321 to the other end, the power conductor group 544 can switch the electrode area of ​​the connected power area 531.

[0053] Please combine Figure 4 and Figure 5 The two power conductive groups 544 are respectively a first power conductive group 5441 and a second power conductive group 5442. The first power conductive group 5441 includes a first conductive row 54411, a first conductive pin group 54412 disposed at one end of the first conductive row 54411, and a second conductive pin group 54413 disposed at the other end of the first conductive row 54411. The second power conductive group 5442 includes a second conductive row 54421, a third conductive pin group 54422 disposed at one end of the second conductive row 54421, and a fourth conductive pin group 54423 disposed at the other end of the second conductive row 54421.

[0054] For example, the first test unit area 5321 is used as an example. When the test piece 542 is located at one end of the test unit area 5321, Figure 7 As shown, the first conductive needle group 54412 is connected to the first protrusion 53121a of the first test positive electrode area 53121, the second conductive needle group 54413 is connected to the module power supply area 5314, the third conductive needle group 54422 is connected to the module input area 533, and the fourth conductive needle group 54423 is connected to the fourth protrusion 53132a of the second test negative electrode area 53132; when the test piece 542 is located at the other end of the test unit area 5321, as shown Figure 8As shown, the first conductive needle group 54412 is connected to the second protrusion 53122a of the first test negative electrode area 53122, the second conductive needle group 54413 is connected to the module power supply area 5314, the third conductive needle group 54422 is connected to the module input area 533, and the fourth conductive needle group 54423 is connected to the third protrusion 53131a of the second test positive electrode area 53131.

[0055] Thus, when the test piece 542 moves from one end of the test unit area 5321 to the second end, the power supply connection group 544 can switch the electrode area of ​​the connected power supply area 531, so as to complete the thermal resistance test and the voltage drop test in the same test unit area 5321. Compared with the manual switching wiring method, the present application can use the two pairs of electrode areas of the same power supply on the contact group plate 53 to connect with the test piece 542 to achieve the switching of the polarity of the connected electrode, which is conducive to improving the efficiency of the test. It should be noted here that the electrode area of ​​the power supply area 531 refers to the experimental power supply area 5311, the first test power supply area 5312, the second test power supply area 5313 and the module power supply area 5314.

[0056] For example, Fig. 9 and Fig.10 As shown, Fig. 9 It shows a schematic diagram of the connection between the first power connection set 5441 and the second power connection set 5442 and the power area 531 when the power connection set 544 moves to the first position of the second test unit area 5321; Fig.10 It shows a schematic diagram of the connection between the first power connection set 5441 and the second power connection set 5442 and the power area 531 when the power connection set 544 moves to the second position of the second test unit area 5321 .

[0057] In some embodiments, please refer again to Figure 7 , the length of the test unit area 5321 in the first direction is d1, the module input area 533 includes a U-phase input area 5331, a V-phase input area 5332 and a W-phase input area 5333 arranged along the first direction X, and the lengths of the U-phase input area 5331, the V-phase input area 5332 and the W-phase input area 5333 in the first direction X are d4, satisfying d4≥d1. In this way, it is beneficial to realize that as the test piece 542 moves from one end of the test unit area 5321 to the other end, the thermal resistance test and the voltage drop test can be performed on the U-phase input area 5331, the V-phase input area 5332 and the W-phase input area 5333 respectively.

[0058] In some embodiments, the load area 534 includes a U-phase load area 5341, a V-phase load area 5342 and a W-phase load area 5343, and the number of load conductive groups 543 is three. When the driving module 52 drives the plate 541 to move to the first preset position, one group of load conductive groups 543 connects the U-phase input area 5331 and the U-phase load area 5341, one group of load conductive groups 543 connects the V-phase input area 5332 and the V-phase load area 5342, and one group of load conductive groups 543 connects the W-phase input area 5333 and the W-phase load area 5343.

[0059] It should be understood that the first preset position refers to the coordinate position between the module input area 533 and the load area 534 on the contact assembly plate 53 on the platform 512, and its coordinate position can be predetermined based on the position coordinate of the selected reference point. Similarly, the second preset position refers to the coordinate position of the test area 532 relative to the platform 512.

[0060] The bridge arm switching device 5 provided in the embodiment of the present application includes a fixing frame 51, a contact group plate 53, a test assembly 54 and a driving module 52. The fixing frame 51 includes a platform 512 and a bracket 511 installed on the platform 512; the contact group plate 53 is arranged on the platform 512, and the side of the contact group plate 53 away from the platform 512 includes a conductive power supply area 531, multiple groups of conductive test areas 532, a module input area 533, a load area 534 and an insulating area 535; the test assembly 54 includes a board 541, a test piece 542, multiple groups of load conductive groups 543 located on one side of the board 541, and two groups of power conductive connection groups 544 located on the other side of the board 541. The multiple groups of load conductive groups 543, the two groups of power conductive connection groups 544 and the test piece 542 are all installed on the board 541, and the multiple groups of load conductive groups 543 are all connected to the two groups of power conductive connection groups 54 4 are arranged at intervals in a first direction X, which is a direction parallel to the plane of the platform 512. The test piece 542 is used to be respectively connected with the multiple test areas 532 to switch the bridge arm to access the test device 3; the driving module 52 is installed on the bracket 511, and the driving module 52 is connected to the plate body 541, and is used to drive the plate body 541 to move; when the driving module 52 drives the plate body 541 to move to the first preset position, the multiple load conductive groups 543 are all connected to the module input area 533 and the load area 534, and the two power conductive groups 544 are conductively connected to the power area 531; when the driving module 52 drives the plate body 541 to move along the first direction X to the second preset position, the multiple load conductive groups 543 are disconnected from the load area 534, the test piece 542 is connected to the test area 532, and the two power conductive groups 544 are connected to the power area 531 and the module input area 533. Through the above-mentioned equipment, the driving module 52 drives the plate body 541 to move so that the test piece 542 can be connected to different test areas 532, thereby switching the bridge arm to access the external test device 3. Compared with the method of setting multiple cylinders to drive the conductive spring needles to switch the bridge arms respectively, there is no need to equip multiple cylinders, which has certain convenience, and the test piece 542 moves with the plate body 541 to connect to different test areas 532, reducing the risk of welding between the test piece 542 and the contact group plate 53 under high current conditions.

[0061] In order to facilitate understanding of the bridge arm switching device 5 of the present application, please refer to Fig.11 Understanding, such as Fig.11 The bridge arm switching circuit shown includes a test power supply 10, a load power supply 20, a control switch module 30, a rectifier circuit module 40, a reactive switch 50 and a load 4. The test power supply 10 is connected to the control switch module 30 and the rectifier circuit module 40, and the load power supply 20 is connected to the rectifier circuit module 40 and the load 4.

[0062] In this embodiment, the test power supply 10 includes a first test power supply 11 for connecting to the first test power supply area 5312 and a second test power supply 12 for connecting to the second test power supply area 5313. The first test power supply 11 and the second test power supply 12 are formed by two positive and negative connecting lines derived from the same power supply and connected to the contact group plate 53.

[0063] The control switch module 30 includes a first switch group 31, a second switch group 32, and a third switch group 33 connected to each other. The first switch group 31 includes a switch S1, a switch S2, a switch S3, a switch S4, a switch S13, a switch S14, a switch S15, and a switch S16. The second switch group 32 includes a switch S5, a switch S6, a switch S7, a switch S8, a switch S17, a switch S18, a switch S19, and a switch S20. The third switch group 33 includes a switch S9, a switch S10, a switch S11, a switch S12, a switch S21, a switch S22, a switch S23, and a switch S24.

[0064] One end of the switch S1 is connected to the positive electrode of the first test power supply 11, and the other end of the switch S1 is connected to the first electrode bus 401 of the rectifier circuit module 40; one end of the switch S2 is connected to the negative electrode of the first test power supply 11, and the other end of the switch S2 is connected to the first electrode bus 401 of the rectifier circuit module 40; one end of the switch S3 is connected to the positive electrode of the first test power supply 11, and the other end of the switch S3 is connected to one end of the switch S13, and the other end of the switch S13 is connected to the negative electrode of the second test power supply 12; one end of the switch S4 is connected to the negative electrode of the first test power supply 11, and the other end of the switch S4 is connected to one end of the switch S14, the switch S13 and the U-phase input end of the rectifier circuit module 40, and the other end of the switch S14 is connected to the positive electrode of the second test power supply 12. One end of the switch S15 is connected to the second electrode bus 402 of the rectifier circuit module 40, and the other end of the switch S15 is connected to the negative electrode of the second test power supply 12. One end of the switch S16 is connected to the second electrode bus 402 of the rectifier circuit module 40, and one end of the switch S16 is connected to the positive electrode of the second test power supply 12.

[0065] One end of the switch S5 is connected to the positive electrode of the first test power supply 11, and the other end of the switch S5 is connected to the first electrode bus 401 of the rectifier circuit module 40. One end of the switch S6 is connected to the negative electrode of the first test power supply 11, and the other end of the switch S6 is connected to the first electrode bus 401 of the rectifier circuit module 40. One end of the switch S7 is connected to the positive electrode of the first test power supply 11, and the other end of the switch S7 is connected to the switch S17, the switch S18, and the V-phase input end of the rectifier circuit module 40. One end of the switch S8 is connected to the negative electrode of the first test power supply 11, and the other end of the switch S8 is connected to one end of the switch S18. The other end of the switch S17 is connected to the negative electrode of the second test power supply 12, and the other end of the switch S18 is connected to the positive electrode of the second test power supply 12. One end of the switch S19 is connected to the second electrode bus 402 of the rectifier circuit module 40, and the other end of the switch S19 is connected to the negative electrode of the second test power supply 12. One end of the switch S20 is connected to the second electrode bus 402 of the rectifier circuit module 40, and the other end of the switch S20 is connected to the positive electrode of the second test power supply 12.

[0066] One end of the switch S9 is connected to the positive electrode of the first test power supply 11, and the other end of the switch S9 is connected to the first electrode bus 401 of the rectifier circuit module 40. One end of the switch S10 is connected to the negative electrode of the first test power supply 11, and the other end of the switch S10 is connected to the first electrode bus 401 of the rectifier circuit module 40. One end of the switch S11 is connected to the positive electrode of the first test power supply 11, and the other end of the switch S11 is connected to the switch S21, the switch S22, and the W-phase input end of the rectifier circuit module 40. One end of the switch S12 is connected to the negative electrode of the first test power supply 11, and the other end of the switch S12 is connected to one end of the switch S22. The other end of the switch S21 is connected to the negative electrode of the second test power supply 12, and the other end of the switch S22 is connected to the positive electrode of the second test power supply 12. One end of the switch S23 is connected to the second electrode bus 402 of the rectifier circuit module 40, and the other end of the switch S23 is connected to the negative electrode of the second test power supply 12. One end of the switch S24 is connected to the second electrode bus 402 of the rectifier circuit module 40, and the other end of the switch S24 is connected to the positive electrode of the second test power supply 12.

[0067] The rectifier circuit module 40 includes a first bridge arm 41, a second bridge arm 42 and a third bridge arm 43 which are arranged in parallel. The reactive switch 50 includes a switch S25, a switch S26, a switch S27, a switch S28 and a switch S29. The first bridge arm 41 includes a first rectifier device Q1 and a second rectifier device Q2 which are connected in series, the second bridge arm 42 includes a third rectifier device Q3 and a fourth rectifier device Q4 which are connected in series, the third bridge arm 43 includes a fifth rectifier device Q5 and a sixth rectifier device Q6 which are connected in series, the output end of the first rectifier device Q1 is connected to the U phase input end, the output end of the third rectifier device Q3 is connected to the V phase input end, and the output end of the fifth rectifier device Q5 is connected to the W phase input end. The input end of the first rectifier device Q1, the input end of the third rectifier device Q3 and the input end of the fifth rectifier device Q5 are all connected to the input end of the load power supply 20 through the switch S29, and the output end of the second rectifier device Q2, the output end of the fourth rectifier device Q4 and the output end of the sixth rectifier device Q6 are all connected to the output end of the load power supply 20 through the switch 28.

[0068] When conducting a reactive power experiment on the device under test 2, that is, an experiment simulating the preset working time of the device under test 2, switches S25, S26, S27, S28 and S29 are all closed, switches S1 to S24 are all disconnected, the load power supply 20 is connected to the power connection end of the device under test 2, the U-phase end of the device under test 2 is connected to the U-phase of the load 4, the V-phase end of the device under test 2 is connected to the V-phase of the load 4, and the W-phase end of the device under test 2 is connected to the W-phase of the load 4, that is, the driving module 52 drives the test component 54 to move to the first preset position, multiple groups of load conductive groups 543 are connected to the load area 534 and the module input area 533, and the two groups of power conductive groups 544 are connected to the module power area 5314 and the experimental power area 5311.

[0069] When conducting voltage drop experiments and thermal resistance experiments, switches S25, S26, S27, S28 and S29 need to be disconnected to test the bridge arm of the device under test 2, which is equivalent to moving the plate 541 to the second preset position, and the multiple load conductive groups 543 are separated from the load area 534 and the module input area 533.

[0070] When the first rectifier Q1 is tested, the switches S1 and S13 are closed. At this time, the voltage drop test can be performed on the first rectifier Q1. The current starts from the positive electrode of the first test power supply 11 and flows through the switch S1 to the input end of the first rectifier Q1. The current flowing out of the first rectifier Q1 is output along the U-phase output end and flows through the switch S13 to return to the negative electrode of the second test power supply 12. It is equivalent to that one group of power supply conductors 544 are respectively connected to the positive electrode of the first test power supply area 5312 and the U-phase input area 5331 of the module power supply area 5314, and the other group of power supply conductors 544 are respectively connected to the second test power supply area 5313 and the module input area 533. The test piece 542 is connected to the first position of the first test unit area 5321. The test piece 542 is now in the first position of the first test unit area 5321. The test piece 542 is equivalent to being connected in parallel at both ends of the first rectifier Q1;

[0071] When switch S1 and switch S13 are disconnected, switch S2 and switch S14 are closed. At this time, a thermal resistance test can be performed on the first rectifier device Q1. The current starts from the positive pole of the second test power supply 12 and flows through switch S14 and is input from the U phase of the rectifier circuit module 40. After flowing through the first rectifier device Q1 and switch S2, it returns to the negative pole of the first test power supply 11, which is equivalent to the test piece 542 being in the second position of the first test unit area 5321.

[0072] Switch S3 and switch S15 form a group, switch S4 and switch S16 form a group, switch S5 and switch S17 form a group, switch S6 and switch S18 form a group, switch S7 and switch S19 form a group, switch S8 and switch S20 form a group, switch S9 and switch S21 form a group, switch S10 and switch S22 form a group, switch S11 and switch S23 form a group, and switch S12 and switch S24 form a group. Each group of switches is closed in sequence, so that the second rectifier device Q2, the third rectifier device Q3, the fourth rectifier device Q4, the fifth rectifier device Q5, and the sixth rectifier device Q6 are connected to the circuit to perform a voltage drop experiment and a thermal resistance experiment. Equivalently, the test piece 542 is connected to the second test unit area 5321 to the sixth test unit area 5321 in sequence.

[0073] like Fig.12 As shown, a power device testing method provided in another embodiment of the present application is applied to the above-mentioned testing system 1, and the steps of the testing method include:

[0074] Step S21: receiving a first driving instruction and determining whether the plate is at a safe position height;

[0075] The safe position height means that the distance between the test piece, multiple load conductive groups, and two power conductive groups and the platform plane is greater than the distance between the contact group plate and the platform plane, so as to avoid collision between the test component and the contact group plate during movement. Among them, the test piece, multiple load conductive groups, and two power conductive groups can all select the same reference point as the plate.

[0076] Step S22: If yes, control the plate to move to the first preset position and execute the first descending instruction, so that the multiple load conductive groups and the two power conductive groups are all descended in a preset descending manner and realize the connection between the module input area and the load area, and the power conductive group and the power area are conductively connected;

[0077] The first descent instruction here refers to the control board body descending in a preset descent method, which includes position mode descent and torque mode descent. The position mode descent refers to the spring pins of multiple groups of load conductive groups and the spring pins of two groups of power conductive groups descending until they just contact the conductive area of ​​the contact group plate, and then switching to the torque mode descent, so that the spring pins gradually press against the conductive area to ensure a reliable connection.

[0078] Step S23: determining whether the power-on time of the load conductive group connected to the module input area and the load area meets a first preset time length;

[0079] The first preset duration refers to the test duration required when the device under test is subjected to an experiment, and the specific test duration is set according to the test conditions.

[0080] Step S24: If yes, send a second driving instruction;

[0081] Step S25: receiving the second driving instruction and determining whether the plate is at a safe position height;

[0082] Step S26: If yes, control the plate to move to the second preset position and execute the second descending instruction, so that the test piece descends to the first position of the test area in a preset descending manner, and the power supply connection group is connected to the power supply area;

[0083] Step S27: determining whether the power-on time between the test piece and the test area meets a second preset time length;

[0084] The second preset time duration refers to the test time duration required for the experiment to be performed at the first position of the test area when the device under test moves to the second preset position. The specific test time duration is set according to the test conditions.

[0085] Step S28: If the conditions are met, a rising instruction is sent to drive the board to rise to a safe height;

[0086] Step S29: receiving an experiment switching instruction and driving the test piece to move to a second position of the test area, and the power supply connection group moves synchronously;

[0087] Step S30: receiving a third descending instruction and driving the test piece to descend to a second position of the test area in the preset descending manner, and the two sets of the power supply connection groups are connected to the power supply area;

[0088] Step S31: determining again whether the power-on time between the test piece and the test area meets a third preset time length;

[0089] The third preset time duration refers to the test time duration required for the experiment to be performed at the second position of the test area when the device under test moves to the second preset position. The specific test time duration is set according to the test conditions.

[0090] Step S32: If the conditions are met, a rising instruction is sent to drive the board to rise to a safe height;

[0091] Step S33: receiving a bridge arm switching instruction and driving the test piece to move to a first position of another test area.

[0092] The above description is only an implementation mode of the present invention, and does not limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made by using the contents of the present invention specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A bridge arm switching device, characterized in that: include: A fixed frame, including a platform and a bracket mounted on the platform; A contact assembly plate, arranged on the platform, wherein a side of the contact assembly plate facing away from the platform includes a conductive power supply area, a plurality of conductive test areas, a module input area, a load area, and an insulation area; A test assembly, comprising a plate body, a test piece, a plurality of load conductive groups located on one side of the plate body, and two power conductive groups located on the other side of the plate body, wherein the plurality of load conductive groups, the two power conductive groups, and the test piece are all mounted on the plate body, the plurality of load conductive groups are spaced apart from the two power conductive groups in a first direction, the first direction being a direction parallel to the plane of the platform, and the test piece is used to be respectively connected with the plurality of test areas to switch the bridge arm to access the test device; A driving module, mounted on the bracket, connected to the plate body, and used for driving the plate body to move; When the driving module drives the plate to move to a first preset position, multiple groups of the load conductive groups are connected to the module input area and the load area, and two groups of the power conductive groups are conductively connected to the power area. When the driving module drives the plate to move to a second preset position along the first direction, multiple groups of the load conductive groups are disconnected from the load area, the test piece is connected to the test area, and two groups of the power conductive groups are connected to the power area and the module input area.

2. The bridge arm switching device according to claim 1, characterized in that: The power supply area includes an experimental power supply area, a first test power supply area, a second test power supply area and a module power supply area. The module power supply area is arranged between the first test power supply area and the second test power supply area. Along the first direction, the experimental power supply area is located at one end of the contact group plate away from the test area; the test area is located at a side of the first test power supply area away from the module power supply area. The load area and the test area are arranged opposite to each other in the second direction, and the second direction is perpendicular to the first direction. When the plate moves to the first preset position, multiple groups of the load conductive groups are connected to the load area and the module input area, and two groups of the power conductive groups are connected to the module power area and the experimental power area; when the plate moves to the second preset position, multiple groups of the load conductive groups are separated from the load area and the module input area, one group of the power conductive groups is respectively connected to the first test power area and the module power area, and the other group of the power conductive groups is respectively connected to the second test power area and the module input area.

3. The bridge arm switching device according to claim 2, characterized in that: The number of the test areas is at least four test unit areas, and the driving module drives the plate to move along the first direction so that the test piece is connected to at least four test unit areas respectively.

4. The bridge arm switching device according to claim 3, characterized in that: The first test power supply area includes a first test positive pole area and a first test negative pole area that are adjacent to each other, and the second test power supply area includes a second test positive pole area and a second test negative pole area that are adjacent to each other. The first test positive pole area is provided with a plurality of first protrusions that are spaced apart, the first test negative pole area is provided with a plurality of second protrusions that are spaced apart, the second test positive pole area is provided with a plurality of third protrusions that are spaced apart, and the second test negative pole area is provided with a plurality of fourth protrusions that are spaced apart. Along the first direction, the first protrusions are adjacent to the second protrusions in an alternating manner, and the third protrusions are adjacent to the fourth protrusions in an alternating manner.

5. The bridge arm switching device according to claim 4, characterized in that: The length of the test unit area in the first direction is d1, the maximum distance between the first protrusion and the second protrusion in the first direction is d2, and the maximum distance between the third protrusion and the fourth protrusion in the first direction is d3, satisfying: d1=d2 and / or d1=d3, so that when the test piece moves from one end of the test unit area to the other end, the power supply conductive group can switch the electrode area of ​​the connected power supply area.

6. The bridge arm switching device according to claim 4, characterized in that: The two power conductive groups are respectively a first power conductive group and a second power conductive group, the first power conductive group includes a first conductive bar, a first conductive pin group disposed at one end of the first conductive bar, and a second conductive pin group disposed at the other end of the first conductive bar, the second power conductive group includes a second conductive bar, a third conductive pin group disposed at one end of the second conductive bar, and a fourth conductive pin group disposed at the other end of the second conductive bar; When the test piece is located at one end of the test unit area, the first conductive needle group is connected to the first protrusion of the first test positive electrode area, the second conductive needle group is connected to the module power supply area, the third conductive needle group is connected to the module input area, and the fourth conductive needle group is connected to the fourth protrusion of the second test negative electrode area; When the test piece is located at the other end of the test unit area, the first conductive needle group is connected to the second protrusion of the first test negative electrode area, the second conductive needle group is connected to the module power supply area, the third conductive needle group is connected to the module input area, and the fourth conductive needle group is connected to the third protrusion of the second test positive electrode area.

7. The bridge arm switching device according to claim 3, characterized in that: The length of the test unit area in the first direction is d1, The module input area includes a U-phase input area, a V-phase input area and a W-phase input area arranged along the first direction, and the length of the U-phase input area, the V-phase input area and the W-phase input area in the first direction is d4, satisfying d4≥d1.

8. The bridge arm switching device according to claim 7, characterized in that: The load area includes a U-phase load area, a V-phase load area and a W-phase load area, and the number of the load conductive groups is three. When the driving module drives the plate to move to the first preset position, one group of the load conductive groups connects the U-phase input area and the U-phase load area, one group of the load conductive groups connects the V-phase input area and the V-phase load area, and one group of the load conductive groups connects the W-phase input area and the W-phase load area.

9. The bridge arm switching device according to any one of claims 1 to 8, characterized in that: The driving module includes a transverse driving module and a longitudinal driving module, the transverse driving module is installed on the bracket, the longitudinal driving module is installed on the transverse driving module, the plate body is connected to the longitudinal driving module, the transverse driving module is used to drive the longitudinal driving module to move along the first direction, and the longitudinal driving module is used to drive the plate body to move along the second direction, and the second direction is perpendicular to the first direction and the platform.

10. A testing system, characterized in that: It comprises a bridge arm switching device, a device to be tested, a test apparatus and a load as described in any one of claims 1 to 9, wherein the load is connected to the load area, the test apparatus is connected to the test piece, and the device to be tested is connected to the power supply area and the module input area.

11. A method for testing a power device, applied to the testing system as claimed in claim 10, characterized in that: The steps of the test method include: Receiving a first driving instruction and determining whether the plate is at a safe position height; If yes, the plate is controlled to move to the first preset position and execute the first descending instruction, so that the multiple load conductive groups and the two power conductive groups are all descended in a preset descending manner and the module input area and the load area are connected, and the power conductive group and the power area are conductively connected; Determining whether the load conductive group is connected to the module input area and the power-on time of the load area meets a first preset time length; If yes, send a second drive instruction; receiving the second driving instruction and determining whether the plate is at a safe position height; If yes, the plate is controlled to move to the second preset position and a second descending instruction is executed, so that the test piece descends to the first position of the test area in a preset descending manner, and the power supply connection group is connected to the power supply area; Determining whether the power-on time between the test piece and the test area meets a second preset time length; If the conditions are met, a rising command is sent to drive the board to rise to a safe height; Receiving an experiment switching instruction and driving the test piece to move to a second position of the test area, the power supply connection group moves synchronously; receiving a third descending instruction and driving the test piece to descend to a second position of the test area in the preset descending manner, and the two sets of the power supply conductors are connected to the power supply area; Determining again whether the power-on time between the test piece and the test area satisfies a third preset time length; If the conditions are met, a rising command is sent to drive the board to rise to a safe height; A bridge arm switching instruction is received and the test piece is driven to move to a first position of another test area.

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