A thermal resistance test system and method for a thermal device
By using a dual-layer closed-loop system for automatic calibration and precise testing, the problem of inconsistent temperature monitoring of thermistor products leaving the factory has been solved, enabling accurate thermal resistance testing, improving product yield, and reducing costs.
Patent Information
- Application Number
- CN202310834384.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-07-07
- Publication Date
- 2026-06-09
- Estimated Expiration
- 2043-07-07
AI Technical Summary
Existing technologies cannot guarantee consistent temperature monitoring accuracy for thermistor products leaving the factory, leading to increased defect rates and higher maintenance costs. Furthermore, manual calibration methods cannot obtain accurate data.
A dual-layer closed-loop system is adopted, which combines the drive motors of the upper and lower chambers with TEC cooling plates to achieve precise pressure application and temperature control. Combined with automatic calibration and accurate testing, the data of the drive motors and cooling plates are recorded for subsequent calibration.
It enables precise thermal resistance testing of thermistors, improves product yield, reduces labor and maintenance costs, and ensures the accuracy and consistency of test results.
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Figure CN116879348B_ABST
Abstract
Citation Information
Patent Citations
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