A reliability test method and test system for a display panel

Abstract

The application discloses a kind of reliability test method and test system of display panel, comprising: at least two display panels to be tested are placed on bearing substrate;Obtain the test area of display panel to be tested;According to test area, set first preset test parameter, and according to first preset test parameter, obtain first threshold voltage test value;Set first preset threshold voltage range;According to first threshold voltage test value and first preset threshold voltage range, obtain the performance test result of display panel to be tested;According to test area, set second preset test parameter, and according to second preset test parameter, obtain threshold voltage difference value;Set second preset threshold voltage range;According to threshold voltage difference value and second preset threshold voltage range, obtain the life test result of display panel to be tested;According to performance test result and life test result, judge the reliability of display panel to be tested, guarantee the reliability of device in display panel, guarantee the use effect of display panel.

Description

Technical Field

[0001] This invention relates to the field of display technology, and in particular to a reliability testing method and system for display panels. Background Technology

[0002] With the development of display technology, liquid crystal display panels (LCDs) and organic light-emitting diode (OLED) panels are widely used in display devices such as mobile phones and computers. Since the quality of the display panel directly affects the performance of the display device, pre-shipment testing of the display panel has become particularly important.

[0003] Display panels typically include pixel circuits and light-emitting devices. The pixel circuits usually drive the light-emitting devices to emit light, enabling image display. The pixel circuits include switching elements; however, the instability of these switching elements affects the display panel's performance. Current pre-shipment testing methods for display panels cannot accurately test the performance of the switching elements, resulting in the display panel's reliability and safety failing to meet expectations, thus severely impacting its usability. Summary of the Invention

[0004] This invention provides a reliability testing method and system for display panels to improve the reliability of components in display panels and ensure the performance of display panels.

[0005] According to one aspect of the present invention, a reliability testing method for a display panel is provided, comprising:

[0006] Place at least two display panels to be tested on the substrate;

[0007] Obtain the test area of ​​the display panel under test;

[0008] A first preset test parameter is set according to the area to be tested, and a first threshold voltage test value is obtained according to the first preset test parameter;

[0009] Set the first preset threshold voltage range;

[0010] Based on the first threshold voltage test value and the first preset threshold voltage range, the performance test results of the display panel under test are obtained;

[0011] The threshold voltage difference is obtained based on the second preset test parameters of the area to be tested.

[0012] Set a second preset threshold voltage range;

[0013] Based on the threshold voltage difference and the second preset threshold voltage range, the life test result of the display panel under test is obtained;

[0014] The reliability of the display panel under test is determined based on the performance test results and the lifespan test results.

[0015] Optionally, setting first preset test parameters based on the area to be tested, and obtaining a first threshold voltage test value based on the first preset test parameters, includes:

[0016] Set the first preset source-drain voltage parameter value and the preset gate-source voltage parameter range of the switching element in the region to be tested;

[0017] The conduction current value of the switching element is obtained based on the first preset source-drain voltage parameter value and the preset gate-source voltage parameter range;

[0018] The first threshold voltage test value is obtained based on the conduction current value.

[0019] Optionally, based on the first threshold voltage test value and the first preset threshold voltage range, the performance test results of the display panel under test are obtained, including:

[0020] Determine whether the first threshold voltage test value is within the first preset threshold voltage range;

[0021] If so, obtain the performance test results of the display panel under test;

[0022] If not, repeat the steps of obtaining the first preset source-drain voltage parameter value and the preset gate-source voltage parameter range of the switching element in the region under test.

[0023] Optionally, before repeatedly performing the step of obtaining the first preset source-drain voltage parameter value and the preset gate-source voltage parameter range of the switching element in the region under test, the method further includes:

[0024] The number of times performance test results are obtained;

[0025] Determine whether the number of times is less than a preset number;

[0026] If so, the steps of obtaining the first preset source-drain voltage parameter value and the preset gate-source voltage parameter range of the switching element in the region to be tested are repeated;

[0027] If not, the operation will end and a test error signal will be output.

[0028] Optionally, a second preset test parameter is set according to the area to be tested, and a threshold voltage difference is obtained according to the second preset test parameter, including:

[0029] Set a second preset source-drain voltage parameter value and a second preset gate-source voltage parameter value for the switching element in the region to be tested, wherein the second preset source-drain voltage parameter value is greater than zero;

[0030] Set the first preset pressure time and the first preset temperature value;

[0031] The second threshold voltage test value of the switching element is obtained based on the second preset source-drain voltage parameter value, the second preset gate-source voltage parameter value, the first preset pressure time, and the first preset temperature value.

[0032] Obtain the first initial threshold voltage value;

[0033] The first threshold voltage difference is obtained based on the second threshold voltage test value and the first initial threshold voltage value.

[0034] Optionally, the second preset threshold voltage range includes a first sub-preset threshold voltage range; setting a second preset threshold voltage range; and obtaining the lifespan test result of the display panel under test based on the threshold voltage difference and the second preset threshold voltage range, including:

[0035] Set the first sub-preset threshold voltage range;

[0036] Determine whether the first threshold voltage difference is within the range of the first sub-preset threshold voltage;

[0037] If so, obtain the lifespan test results of the display panel under test;

[0038] If not, determine whether the life test of the current display panel under test has been completed;

[0039] If the life test of the current display panel under test is completed, the step of obtaining the second preset source-drain voltage parameter value and the second preset gate-source voltage parameter value of the switching element in the area under test is repeated, wherein the second preset source-drain voltage parameter value is greater than zero;

[0040] If the life test of the display panel under test is not completed, the steps of obtaining the first preset pressure time and the first preset temperature value are repeated.

[0041] Optionally, a second preset test parameter is set according to the area to be tested, and a threshold voltage difference is obtained according to the second preset test parameter, including:

[0042] Set a third preset source-drain voltage parameter value and a third preset gate-source voltage parameter value for the switching element in the region to be tested, wherein the third preset source-drain voltage parameter value is less than zero;

[0043] Set the second preset pressure time, the second preset temperature value, and the preset brightness value;

[0044] The third threshold voltage test value of the switching element is obtained based on the third preset source-drain voltage parameter value, the third preset gate-source voltage parameter value, the second preset pressure time, the second preset temperature value, and the preset brightness value;

[0045] Obtain the second initial threshold voltage value;

[0046] The second threshold voltage difference is obtained based on the third threshold voltage test value and the second initial threshold voltage value.

[0047] Optionally, the second preset threshold voltage range includes a second sub-preset threshold voltage range; setting the second preset threshold voltage range; and obtaining the lifespan test results of the display panel under test based on the threshold voltage difference and the second preset threshold voltage range, including:

[0048] Set the second sub-preset threshold voltage range;

[0049] Determine whether the second threshold voltage difference is within the range of the second sub-preset threshold voltage;

[0050] If so, obtain the lifespan test results of the display panel under test;

[0051] If not, determine whether the life test of the current display panel under test has been completed;

[0052] If the life test of the current display panel under test is completed, the step of obtaining the third preset source-drain voltage parameter value and the third preset gate-source voltage parameter value of the switching element in the area under test is repeated, wherein the third preset source-drain voltage parameter value is less than zero.

[0053] If the life test of the display panel under test is not completed, the steps of obtaining the second preset pressure time, the second preset temperature value and the preset brightness value are repeated.

[0054] Optionally, before obtaining the test area of ​​the display panel under test, the method further includes:

[0055] Set the test cycle for the display panel under test.

[0056] According to another aspect of the present invention, a reliability testing system for a display panel is provided, the display panel reliability testing system being used to perform the reliability testing method for a display panel as described in any of the preceding aspects;

[0057] The reliability testing system for the display panel includes:

[0058] The test panel placement module is used to place at least two test panels on a carrier substrate;

[0059] The test area acquisition module is used to acquire the test area of ​​the display panel under test;

[0060] The first threshold voltage test value acquisition module is used to set a first preset test parameter according to the area to be tested, and to acquire a first threshold voltage test value according to the first preset test parameter.

[0061] The first preset threshold voltage range setting module is used to set the first preset threshold voltage range;

[0062] The performance test result acquisition module is used to acquire the performance test result of the display panel under test based on the first threshold voltage test value and the first preset threshold voltage range.

[0063] The threshold voltage difference acquisition module is used to set a second preset test parameter according to the area to be tested, and to acquire the threshold voltage difference according to the second preset test parameter;

[0064] The second preset threshold voltage range setting module is used to set the second preset threshold voltage range;

[0065] The life test result acquisition module is used to acquire the life test result of the display panel under test based on the threshold voltage difference and the second preset threshold voltage range;

[0066] The reliability judgment module for the display panel under test is used to judge the reliability of the display panel under test based on the performance test results and the life test results.

[0067] The technical solution of this invention provides a reliability testing method for a display panel, comprising: placing at least two display panels under test on a carrier substrate; obtaining a test area of ​​the display panel under test; setting a first preset test parameter for the test area and obtaining a first threshold voltage test value based on the first preset test parameter; setting a first preset threshold voltage range; obtaining a performance test result of the display panel under test based on the first threshold voltage test value and the first preset threshold voltage range; setting a second preset test parameter based on the test area and obtaining a threshold voltage difference based on the second preset test parameter; setting a second preset threshold voltage range; obtaining a lifetime test result of the display panel under test based on the threshold voltage difference and the second preset threshold voltage range; determining the reliability of the display panel under test based on the performance test result and the lifetime test result, monitoring the performance of components in the display panel, verifying the performance of components, thereby ensuring the reliability of components in the display panel and ensuring the performance of the display panel.

[0068] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of the present invention, nor is it intended to limit the scope of the invention. Other features of the invention will become readily apparent from the following description. Attached Figure Description

[0069] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0070] Figure 1 A flowchart illustrating a reliability testing method for a display panel provided in an embodiment of the present invention;

[0071] Figure 2 This is a schematic diagram of the structure of a carrier substrate provided in an embodiment of the present invention;

[0072] Figure 3 This is a schematic diagram of another carrier substrate provided in an embodiment of the present invention;

[0073] Figure 4 A flowchart illustrating a reliability testing method for a display panel provided in an embodiment of the present invention;

[0074] Figure 5 This is a schematic diagram of the structure of a switching element provided in an embodiment of the present invention;

[0075] Figure 6 A current-voltage test curve provided in an embodiment of the present invention;

[0076] Figure 7 A flowchart illustrating a reliability testing method for a display panel provided in an embodiment of the present invention;

[0077] Figure 8 A flowchart illustrating a reliability testing method for a display panel provided in an embodiment of the present invention;

[0078] Figure 9 A flowchart illustrating a reliability testing method for a display panel provided in an embodiment of the present invention;

[0079] Figure 10 A test curve of the difference between a first preset pressure time and a first threshold voltage is provided for an embodiment of the present invention;

[0080] Figure 11 A flowchart illustrating a reliability testing method for a display panel provided in an embodiment of the present invention;

[0081] Figure 12 A flowchart illustrating a reliability testing method for a display panel provided in an embodiment of the present invention;

[0082] Figure 13 A test curve of the difference between a second preset pressure time and a second threshold voltage is provided in an embodiment of the present invention;

[0083] Figure 14 A flowchart illustrating a reliability testing method for a display panel provided in an embodiment of the present invention;

[0084] Figure 15 A flowchart illustrating another reliability testing method for a display panel provided in an embodiment of the present invention;

[0085] Figure 16 A schematic diagram of a reliability testing system for a display panel provided in an embodiment of the present invention;

[0086] Figure 17 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present invention. Detailed Implementation

[0087] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0088] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0089] Figure 1 This is a flowchart illustrating a reliability testing method for a display panel according to an embodiment of the present invention. This embodiment is applicable to the performance monitoring of components in a display panel. The method can be executed by a reliability testing system for the display panel, which can be implemented in hardware and / or software. Figure 1 As shown, the method includes:

[0090] S101, at least two display panels to be tested are placed on a carrier substrate.

[0091] in, Figure 2 This is a schematic diagram of a carrier substrate provided in an embodiment of the present invention. Figure 3 This is a schematic diagram of another carrier substrate provided in an embodiment of the present invention, as shown below. Figure 2 As shown, exemplarily, five display panels 111 to be tested are supported on a single substrate 110; as Figure 3 As shown, for example, four display panels 111 to be tested are carried on a carrier substrate 110, and the test area 112 in the same display panel to be tested can be tested. The above methods can ensure that the display panels to be tested on the same carrier substrate 110 can be tested simultaneously, avoiding multiple transfers of the display panels to be tested 111, which would affect the testing efficiency.

[0092] S102, Obtain the area to be tested on the display panel under test.

[0093] This involves acquiring the test area for each display panel under test on the substrate, such as... Figure 2 As shown, the test areas are selected at the four corners and the center of the substrate, meaning that each display panel under test in the substrate is tested. The selection of the test areas for the display panels can be made according to actual design requirements, and this embodiment of the invention does not impose specific limitations.

[0094] S103, set the first preset test parameters according to the area to be tested, and obtain the first threshold voltage test value according to the first preset test parameters.

[0095] In the test of the test area, the performance of the switching element in the test area is tested. The first preset test parameters required for the performance test of the switching element are set according to the test area. The first preset test parameters may include the gate-source voltage value and the source-drain voltage value. Then, the first threshold voltage test value is obtained according to the first preset test parameters to reflect the switching effect of the switching element.

[0096] S104, Set the first preset threshold voltage range.

[0097] The different switching elements in the display panel are provided with different threshold voltage ranges. For example, the first preset threshold voltage range for the first switching element (Dr TR) is -1.5V to 2.0V, the first preset threshold voltage range for the second switching element (Scan TR) is -1.5V to 2.0V, and the first preset threshold voltage range for the third switching element (Sence TR) is -1.5V to 2.0V.

[0098] S105, based on the first threshold voltage test value and the first preset threshold voltage range, obtain the performance test results of the display panel under test.

[0099] Specifically, based on the first threshold voltage test value of the switching element and the first preset threshold voltage range, the performance test results of the switching element in the display panel under test are obtained, thereby reflecting the performance of the display panel under test.

[0100] S106, set the second preset test parameters according to the area to be tested, and obtain the threshold voltage difference according to the second preset test parameters.

[0101] The second preset test parameters include gate-source voltage, source-drain voltage, pressure time, test temperature, and brightness. Depending on different test requirements, these parameters facilitate the acquisition of the threshold voltage difference of the switching element in the test area, thereby reflecting the life performance of the switching element.

[0102] S107, Set the second preset threshold voltage range.

[0103] S108: Obtain the life test results of the display panel under test based on the threshold voltage difference and the second preset threshold voltage range.

[0104] The lifespan of the switching elements in the display panel under test is tested. Specific tests include: PBTS (Positive Bias Temperature Stress), a type of accelerated test that measures the thermal characteristics of the crystal in the switching element after a certain time under high temperature and positive voltage conditions; and NBTiS (Negative Bias Temperature Illumination Stress), another type of accelerated test that measures the thermal characteristics of the crystal under light, high temperature, and negative voltage conditions after a certain time. The lifespan test results of the display panel under test are obtained according to the different test requirements.

[0105] S109 determines the reliability of the display panel under test based on the performance test results and life test results.

[0106] The performance test results and life test results obtained reflect the reliability of the display panel under test, thereby ensuring the performance of the display panel after it leaves the factory, guaranteeing the use effect, and reducing the risk of damage.

[0107] This invention assesses the reliability of a display panel by testing its test area and obtaining performance and lifespan test results. It also monitors and verifies the performance of components within the display panel, thereby ensuring the reliability of the components and guaranteeing the panel's performance.

[0108] Optional, Figure 4 This is a flowchart illustrating a reliability testing method for a display panel provided in an embodiment of the present invention, as shown below. Figure 4 As shown, the method includes:

[0109] S201, at least two display panels to be tested are placed on a carrier substrate.

[0110] S202, Obtain the area to be tested on the display panel under test.

[0111] S203, set the first preset source-drain voltage parameter value and preset gate-source voltage parameter range of the switching element in the region to be tested.

[0112] S204: Obtain the on-current value of the switching element based on the first preset source-drain voltage parameter value and the preset gate-source voltage parameter range.

[0113] in, Figure 5 This is a schematic diagram of a switching element provided in an embodiment of the present invention. The switching element includes a source 113, a drain 114, a gate 115, and a semiconductor region 116. A gate-source voltage Vgs is applied to the gate 115, and a source-drain voltage Vds is applied to the drain 114. Figure 6 A current-voltage test curve is provided for an embodiment of the present invention, such as... Figure 5 and Figure 6 As shown, the first preset source-drain voltage parameter value can be 0.1V (low voltage) or 10V (high voltage), and the preset gate-source voltage parameter range can be -15V to 20V. During the test, the gate-source voltage is gradually increased in 0.2V steps, thereby obtaining the following values ​​under low and high voltage conditions respectively. Figure 6 The test curve shown can be used to obtain the on-current value when the switching element is turned on.

[0114] S205, obtain the first threshold voltage test value based on the conduction current value.

[0115] During the test, the gate-source voltage value corresponding to the conduction of the switching element is the threshold voltage value Vth. That is, the gate-source voltage value obtained according to the conduction current value when the switching element is turned on is used to obtain the first threshold voltage test value.

[0116] S206, Set the first preset threshold voltage range.

[0117] S207: Obtain the performance test results of the display panel under test based on the first threshold voltage test value and the first preset threshold voltage range.

[0118] S208, set the second preset test parameters according to the area to be tested, and obtain the threshold voltage difference according to the second preset test parameters.

[0119] S209, Set the second preset threshold voltage range.

[0120] S210: Obtain the life test results of the display panel under test based on the threshold voltage difference and the second preset threshold voltage range.

[0121] S211 determines the reliability of the display panel under test based on performance test results and lifespan test results.

[0122] This invention obtains the first preset source-drain voltage parameter value and the preset gate-source voltage parameter range of the switching element in the area under test, and then obtains the conduction current value and the first threshold voltage test value, thereby obtaining the performance test results of the display panel under test. At the same time, it can also obtain the lifetime test results of the display panel under test. Based on the performance test results and lifetime test results, the reliability of the display panel under test is judged, the performance of the components in the display panel is monitored, and the performance of the components is verified, thereby ensuring the reliability of the components in the display panel and ensuring the use effect of the display panel.

[0123] Optional, Figure 7 This is a flowchart illustrating a reliability testing method for a display panel provided in an embodiment of the present invention, as shown below. Figure 7 As shown, the method includes:

[0124] S301, at least two display panels to be tested are placed on a carrier substrate.

[0125] S302, Obtain the area to be tested on the display panel under test.

[0126] S303, set the first preset source-drain voltage parameter value and preset gate-source voltage parameter range of the switching element in the region to be tested.

[0127] S304: Obtain the on-current value of the switching element based on the first preset source-drain voltage parameter value and the preset gate-source voltage parameter range.

[0128] S305 obtains the first threshold voltage test value based on the conduction current value.

[0129] S306, Set the first preset threshold voltage range.

[0130] S307, determine whether the first threshold voltage test value is within the first preset threshold voltage range; if yes, proceed to step S308; if no, proceed to step S303.

[0131] Specifically, it is determined whether the first threshold voltage test value is within the first preset threshold voltage range. If it is, the performance of the switching element is considered to be normal. If not, the performance is tested again at different locations in the area to be tested.

[0132] S308, obtain the performance test results of the display panel under test.

[0133] S309, set the second preset test parameters according to the area to be tested, and obtain the threshold voltage difference according to the second preset test parameters.

[0134] S310, set the second preset threshold voltage range.

[0135] S311, based on the threshold voltage difference and the second preset threshold voltage range, obtain the life test results of the display panel under test.

[0136] S312 determines the reliability of the display panel under test based on performance test results and lifespan test results.

[0137] This invention obtains the performance test results of the display panel by determining whether the first threshold voltage test value is within the first preset threshold voltage range, thereby reflecting the reliability of the display panel under test and ensuring the performance of the display panel.

[0138] Optional, Figure 8 This is a flowchart illustrating a reliability testing method for a display panel provided in an embodiment of the present invention, as shown below. Figure 8 As shown, the method includes:

[0139] S401, at least two display panels to be tested are placed on a carrier substrate.

[0140] S402, Obtain the area to be tested on the display panel under test.

[0141] S403, set the first preset source-drain voltage parameter value and preset gate-source voltage parameter range of the switching element in the region to be tested.

[0142] S404: Obtain the on-current value of the switching element based on the first preset source-drain voltage parameter value and the preset gate-source voltage parameter range.

[0143] S405, obtains the first threshold voltage test value based on the conduction current value.

[0144] S406, Set the first preset threshold voltage range.

[0145] S407, determine whether the first threshold voltage test value is within the first preset threshold voltage range; if yes, proceed to step S408; if no, proceed to step S409.

[0146] S408, obtain the performance test results of the display panel under test.

[0147] S409, the number of times performance test results are retrieved.

[0148] S410, determine whether the number of attempts is less than the preset number of attempts; if yes, proceed to step S403; if no, proceed to step S411.

[0149] S411, end operation and output test error signal.

[0150] Specifically, when the first threshold voltage test value is not within the first preset threshold voltage range, the number of times the performance test structure is obtained is recorded. The preset number of times is usually set to three. When the number of times is less than the preset number of times, the performance test continues and returns to step S403. When the number of times is greater than or equal to the preset number of times, the operation ends and a test abnormality signal is output.

[0151] S412, set the second preset test parameters according to the area to be tested, and obtain the threshold voltage difference according to the second preset test parameters.

[0152] S413, set the second preset threshold voltage range.

[0153] S414: Obtain the life test results of the display panel under test based on the threshold voltage difference and the second preset threshold voltage range.

[0154] S415 determines the reliability of the display panel under test based on performance test results and lifespan test results.

[0155] This invention, through its embodiments, determines whether the first threshold voltage test value is within the first preset threshold voltage range, thereby obtaining the number of times the performance test result is obtained. It also determines whether the number of times is less than the preset number, ensuring the number of performance tests, thus more accurately reflecting the performance test result of the display panel, ensuring the reliability of the display panel under test, and ensuring the performance of the display panel.

[0156] Optional, Figure 9 This is a flowchart illustrating a reliability testing method for a display panel provided in an embodiment of the present invention, as shown below. Figure 9 As shown, the method includes:

[0157] S501, at least two display panels to be tested are placed on a carrier substrate.

[0158] S502, Obtain the area to be tested on the display panel under test.

[0159] S503, set the first preset test parameters according to the area to be tested, and obtain the first threshold voltage test value according to the first preset test parameters.

[0160] S504, set the first preset threshold voltage range.

[0161] S505: Obtain the performance test results of the display panel under test based on the first threshold voltage test value and the first preset threshold voltage range.

[0162] S506, Set the second preset source-drain voltage parameter value and the second preset gate-source voltage parameter value of the switching element in the region to be tested, wherein the second preset source-drain voltage parameter value is greater than zero.

[0163] Among them, the PBTS test is performed on the display panel under test to reflect the crystal thermal performance of the switching element in the display panel under test after a certain pressure time under high temperature and positive voltage conditions. The second preset source-drain voltage parameter value can be selected as 30V, and the second preset gate-source voltage parameter value is 0V.

[0164] S507, set the first preset pressure time and the first preset temperature value.

[0165] The first preset pressure time is typically 10s, 100s, 1000s, 2000s, 3000s, 3600s, 4000s, 50000s, 10000s, 20000s, 30000s, or 40000s, with a total test pressure duration of approximately 11 hours. The first preset temperature value can be 60℃.

[0166] S508, the second threshold voltage test value of the switching element is obtained based on the second preset source-drain voltage parameter value, the second preset gate-source voltage parameter value, the first preset pressure time, and the first preset temperature value.

[0167] In each first preset pressure time, the performance of the switching element as described in the above embodiment is performed to obtain the second threshold voltage test value.

[0168] S509, obtain the first initial threshold voltage value.

[0169] S510, obtain the first threshold voltage difference based on the second threshold voltage test value and the first initial threshold voltage value.

[0170] in, Figure 10 A test curve for the difference between a first preset pressure time and a first threshold voltage is provided in an embodiment of the present invention, such as... Figure 10 As shown, the first initial threshold voltage value of the switching element is obtained in advance, and the difference between the second threshold voltage test value and the first initial threshold voltage value is calculated to obtain the first threshold voltage difference value. That is, the first threshold voltage difference value is obtained for each first preset pressure time, and the test curve of the first preset pressure time and the first threshold voltage difference value is obtained, which reflects the performance of the switching element of the display panel under test under PBTS test.

[0171] S511, set the second preset threshold voltage range.

[0172] S512, based on the first threshold voltage difference and the second preset threshold voltage range, obtain the life test results of the display panel under test.

[0173] Table 1 exemplarily illustrates the first threshold voltage difference ΔV under different first preset pressure times T1 during PBTS testing. th1 The corresponding relationship is that for PBTS testing, the second preset threshold voltage range is a positive value range greater than or equal to zero. The second preset threshold voltage range can be within 0 to 1.5V. By comparing whether the difference of the first threshold voltage under different preset pressure times is within the second preset threshold voltage range, the life test results of the display panel under test can be reflected.

[0174] Table 1. Difference ΔV of the first threshold voltage under different first preset pressure times T1. th1 Correspondence table

[0175]

[0176]

[0177] S513 determines the reliability of the display panel under test based on performance test results and lifespan test results.

[0178] This invention provides a second threshold voltage test value for a switching element by obtaining a second preset source-drain voltage parameter value and a second preset gate-source voltage parameter value for the switching element in the area to be tested. Then, it combines the second preset source-drain voltage parameter value with the first initial threshold voltage value to obtain a first threshold voltage difference, thereby obtaining the life test result of the display panel under test, ensuring the reliability of the display panel under test, and ensuring the performance of the display panel.

[0179] Optional, Figure 11 This is a flowchart illustrating a reliability testing method for a display panel provided in an embodiment of the present invention, as shown below. Figure 11 As shown, the method includes:

[0180] S601, at least two display panels to be tested are placed on a carrier substrate.

[0181] S602, Obtain the area to be tested on the display panel under test.

[0182] S603, set the first preset test parameters according to the area to be tested, and obtain the first threshold voltage test value according to the first preset test parameters.

[0183] S604, set the first preset threshold voltage range.

[0184] S605: Obtain the performance test results of the display panel under test based on the first threshold voltage test value and the first preset threshold voltage range.

[0185] S606, Set the second preset source-drain voltage parameter value and the second preset gate-source voltage parameter value of the switching element in the region to be tested, wherein the second preset source-drain voltage parameter value is greater than zero.

[0186] S607, set the first preset pressure time and the first preset temperature value.

[0187] S608, obtain the second threshold voltage test value of the switching element based on the second preset source-drain voltage parameter value, the second preset gate-source voltage parameter value, the first preset pressure time, and the first preset temperature value.

[0188] S609, obtain the first initial threshold voltage value.

[0189] S610, obtain the first threshold voltage difference based on the second threshold voltage test value and the first initial threshold voltage value.

[0190] S611, set the first sub-preset threshold voltage range.

[0191] For PBTS testing, the first preset threshold voltage range can be between 0 and 1.5V.

[0192] S612, determine whether the first threshold voltage difference is within the range of the first sub-preset threshold voltage; if yes, proceed to step S613; if no, proceed to step S614.

[0193] S613, obtain the life test results of the display panel under test.

[0194] Specifically, it is determined whether the first threshold voltage difference is within the range of the first sub-preset threshold voltage. If the first threshold voltage difference is within the range of the first sub-preset threshold voltage, the life test result is obtained. If the first threshold voltage difference is not within the range of the first sub-preset threshold voltage, it is necessary to determine whether the current life test has been completed, that is, whether the preset pressure time under the current test is the maximum preset pressure time. For example, the maximum preset pressure time is 40000s in Table 1.

[0195] S614, determine whether the life test of the current display panel under test is completed; if yes, proceed to step S606; if no, proceed to step S607.

[0196] The process involves determining whether the current lifespan test, i.e., the PBTS test, is complete. If not, the current lifespan test is incomplete and needs to be continued under different first preset pressure times, repeating step S607. If complete, the current first preset pressure time under the current test is the maximum preset pressure time, i.e., the maximum preset pressure time is 40000s as shown in Table 1, then the test is considered complete. Considering the testing accuracy of the test system, another PBTS test needs to be performed, i.e., repeating step S606.

[0197] S615 determines the reliability of the display panel under test based on performance test results and lifespan test results.

[0198] This invention, by determining whether the PBTS test of the current display panel under test has been completed, executes different operation procedures to ensure the accuracy and completeness of the life test results, thereby ensuring the reliability of the display panel under test and the performance of the display panel.

[0199] Optional, Figure 12 This is a flowchart illustrating a reliability testing method for a display panel provided in an embodiment of the present invention, as shown below. Figure 12 As shown, the method includes:

[0200] S701, at least two display panels to be tested are placed on a carrier substrate.

[0201] S702, Obtain the area to be tested from the display panel under test.

[0202] S703, set the first preset test parameters according to the area to be tested, and obtain the first threshold voltage test value according to the first preset test parameters.

[0203] S704, set the first preset threshold voltage range.

[0204] S705: Obtain the performance test results of the display panel under test based on the first threshold voltage test value and the first preset threshold voltage range.

[0205] S706, set the third preset source-drain voltage parameter value and the third preset gate-source voltage parameter value of the switching element in the region to be tested, wherein the third preset source-drain voltage parameter value is less than zero.

[0206] Among them, the NBTS test is performed on the display panel under test to reflect the crystal thermal performance of the switching element in the display panel under test after a certain pressure time under high temperature, light and negative voltage conditions. The third preset source-drain voltage parameter value can be selected as -30V, and the third preset gate-source voltage parameter value is 0V.

[0207] S707, set the second preset pressure time, the second preset temperature value, and the preset brightness value.

[0208] For example, the second preset pressure time is typically 10s, 100s, 1000s, 2000s, 3000s, 3600s, 4000s, 50000s, 10000s, 20000s, 30000s, or 40000s, with a total test pressure duration of approximately 11 hours. The second preset temperature value can be 60℃, and the preset brightness value is 4500 nits.

[0209] S708, obtains the third threshold voltage test value of the switching element based on the third preset source-drain voltage parameter value, the third preset gate-source voltage parameter value, the second preset pressure time, the second preset temperature value, and the preset brightness value.

[0210] In each second preset pressure time, the performance test of the switching element as described in the above embodiment is performed to obtain the third threshold voltage test value.

[0211] S709, obtain the second initial threshold voltage value.

[0212] S710, obtains the second threshold voltage difference based on the third threshold voltage test value and the second initial threshold voltage value.

[0213] in, Figure 13 This invention provides a test curve for the difference between a second preset pressure time and a second threshold voltage, as shown in the embodiment of the invention. Figure 13 As shown, the second initial threshold voltage value of the switching element is obtained in advance, and the difference between the third threshold voltage test value and the second initial threshold voltage value is calculated to obtain the second threshold voltage difference value. That is, the second threshold voltage difference value is obtained for each second preset pressure time, and the test curve of the second preset pressure time and the second threshold voltage difference value is obtained, which reflects the performance of the switching element of the display panel under test under NBTS test.

[0214] S711, set the second preset threshold voltage range.

[0215] S712, based on the first threshold voltage difference and the second preset threshold voltage range, obtain the life test results of the display panel under test.

[0216] Table 2 exemplarily illustrates the second threshold voltage difference ΔV under different second preset pressure times T2 during NBTS testing. th2 The corresponding relationship is that for NBTS testing, the second preset threshold voltage range is a negative value range less than or equal to zero. The second preset threshold voltage range can be within 0 to -12V. By comparing whether the difference of the second threshold voltage under different preset pressure times is within the second preset threshold voltage range, the life test results of the display panel under test can be reflected.

[0217] Table 2. Difference ΔV of the second threshold voltage under different second preset pressure times T2. th2 Correspondence table

[0218]

[0219] S713 determines the reliability of the display panel under test based on performance test results and lifespan test results.

[0220] This invention provides a method to obtain a third threshold voltage test value for a switching element by acquiring a third preset source-drain voltage parameter value and a third preset gate-source voltage parameter value for the switching element in the area under test. Then, it combines this with a second initial threshold voltage value to obtain a second threshold voltage difference, thereby obtaining the life test result of the display panel under test. This ensures the reliability of the display panel under test and guarantees the performance of the display panel.

[0221] Optional, Figure 14 This is a flowchart illustrating a reliability testing method for a display panel provided in an embodiment of the present invention, as shown below. Figure 14 As shown, the method includes:

[0222] S801, at least two display panels to be tested are placed on a carrier substrate.

[0223] S802, Obtain the area to be tested on the display panel under test.

[0224] S803, set the first preset test parameters according to the area to be tested, and obtain the first threshold voltage test value according to the first preset test parameters.

[0225] S804, set the first preset threshold voltage range.

[0226] S805: Obtain the performance test results of the display panel under test based on the first threshold voltage test value and the first preset threshold voltage range.

[0227] S806, set the third preset source-drain voltage parameter value and the third preset gate-source voltage parameter value of the switching element in the region to be tested, wherein the third preset source-drain voltage parameter value is less than zero.

[0228] S807, set the second preset pressure time, the second preset temperature value, and the preset brightness value.

[0229] S808 obtains the third threshold voltage test value of the switching element based on the third preset source-drain voltage parameter value, the third preset gate-source voltage parameter value, the second preset pressure time, the second preset temperature value, and the preset brightness value.

[0230] S809, obtain the second initial threshold voltage value.

[0231] S810 obtains the second threshold voltage difference based on the third threshold voltage test value and the second initial threshold voltage value.

[0232] S811, set the second sub-preset threshold voltage range.

[0233] For NBTS testing, the second preset threshold voltage range can be within 0 to -12V.

[0234] S812, determine whether the second threshold voltage difference is within the range of the second sub-preset threshold voltage; if yes, then execute step S813; if no, then execute step S814.

[0235] S813, obtain the life test results of the display panel under test.

[0236] Specifically, it is determined whether the second threshold voltage difference is within the range of the second sub-preset threshold voltage. If the second threshold voltage difference is within the range of the second sub-preset threshold voltage, the life test result is obtained. If the second threshold voltage difference is not within the range of the second sub-preset threshold voltage, it is necessary to determine whether the current life test has been completed, that is, whether the preset pressure time under the current test is the maximum preset pressure time. For example, as shown in Table 1, the maximum preset pressure time is 40000s.

[0237] S814, determine whether the life test of the current display panel under test is completed; if yes, proceed to step S806; if no, proceed to step S807.

[0238] The process involves determining whether the current life test, i.e., the NBTS test, is complete. If not, the current life test is incomplete and needs to be continued under different second preset pressure times, repeating step S807. If it is complete, the current second preset pressure time under the current test is the maximum preset pressure time, i.e., the maximum preset pressure time is 40000s as shown in Table 2. Then, the test is considered complete. Considering the test accuracy of the test system, another NBTS test needs to be performed, i.e., repeating step S806.

[0239] S815 determines the reliability of the display panel under test based on performance test results and lifespan test results.

[0240] This invention, by determining whether the NBTS test of the current display panel under test has been completed, executes different operation procedures to ensure the accuracy and completeness of the life test results, thereby ensuring the reliability of the display panel under test and the performance of the display panel.

[0241] Optional, Figure 15 A flowchart illustrating another reliability testing method for a display panel provided in an embodiment of the present invention is shown below. Figure 15 As shown, the method includes:

[0242] S901, at least two display panels to be tested are placed on a carrier substrate.

[0243] S902, set the test cycle for the display panel under test.

[0244] Prior to testing, a testing period needs to be determined, and performance and lifespan tests are conducted within a certain timeframe to ensure the performance of the display panel. The testing period can be selected based on actual testing requirements, and this embodiment of the invention does not impose specific limitations.

[0245] S903, obtain the area to be tested of the display panel under test.

[0246] S904, set the first preset test parameters according to the area to be tested, and obtain the first threshold voltage test value according to the first preset test parameters.

[0247] S905, set the first preset threshold voltage range.

[0248] S906: Obtain the performance test results of the display panel under test based on the first threshold voltage test value and the first preset threshold voltage range.

[0249] S907, set the second preset test parameters according to the area to be tested, and obtain the threshold voltage difference according to the second preset test parameters.

[0250] S908, set the second preset threshold voltage range.

[0251] S909 obtains the life test results of the display panel under test based on the threshold voltage difference and the second preset threshold voltage range.

[0252] S910 determines the reliability of the display panel under test based on performance test results and lifespan test results.

[0253] This invention ensures the reliability and performance of the display panel by obtaining the test cycle of the display panel before obtaining the test area.

[0254] Figure 16 This is a schematic diagram of the structure of a reliability testing system for a display panel provided in an embodiment of the present invention, as shown below. Figure 16 As shown, the reliability testing system for the display panel is used to perform the reliability testing method for the display panel described in any of the above embodiments;

[0255] The reliability testing system 200 for display panels includes:

[0256] The test panel placement module 201 is used to place at least two test panels on a carrier substrate;

[0257] The test area acquisition module 202 is used to acquire the test area of ​​the display panel under test;

[0258] The first threshold voltage test value acquisition module 203 is used to set a first preset test parameter according to the area to be tested, and to acquire the first threshold voltage test value according to the first preset test parameter.

[0259] The first preset threshold voltage range setting module 204 is used to set the first preset threshold voltage range;

[0260] The performance test result acquisition module 205 is used to acquire the performance test result of the display panel under test based on the first threshold voltage test value and the first preset threshold voltage range.

[0261] The threshold voltage difference acquisition module 206 is used to set a second preset test parameter according to the area to be tested, and to acquire the threshold voltage difference according to the second preset test parameter.

[0262] The second preset threshold voltage range setting module 207 is used to set the second preset threshold voltage range;

[0263] The life test result acquisition module 208 is used to acquire the life test result of the display panel under test based on the threshold voltage difference and the second preset threshold voltage range.

[0264] The reliability judgment module 209 of the display panel under test is used to judge the reliability of the display panel under test based on the performance test results and life test results.

[0265] It should be noted that since the reliability testing system for the display panel provided in this embodiment includes any of the reliability testing methods for the display panel as described in the embodiments of the present invention, it has the same or corresponding beneficial effects as the reliability testing methods for the display panel, and will not be elaborated here.

[0266] Figure 17 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present invention, such as... Figure 17 As shown. Electronic devices are intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. Electronic devices can also represent various forms of mobile devices, such as personal digital processors, cellular phones, smartphones, wearable devices (such as helmets, glasses, watches, etc.), and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the invention described and / or claimed herein.

[0267] like Figure 17As shown, the electronic device 10 includes at least one processor 11 and a memory, such as a read-only memory (ROM) 12 or a random access memory (RAM) 13, communicatively connected to the at least one processor 11. The memory stores computer programs executable by the at least one processor. The processor 11 can perform various appropriate actions and processes based on the computer program stored in the ROM 12 or loaded from storage unit 18 into the RAM 13. The RAM 13 may also store various programs and data required for the operation of the electronic device 10. The processor 11, ROM 12, and RAM 13 are interconnected via a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0268] Multiple components in electronic device 10 are connected to I / O interface 15, including: input unit 16, such as keyboard, mouse, etc.; output unit 17, such as various types of displays, speakers, etc.; storage unit 18, such as disk, optical disk, etc.; and communication unit 19, such as network card, modem, wireless transceiver, etc. Communication unit 19 allows electronic device 10 to exchange information / data with other devices through computer networks such as the Internet and / or various telecommunications networks.

[0269] Processor 11 can be a variety of general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. Processor 11 performs the various methods and processes described above, such as reliability testing methods for display panels.

[0270] In some embodiments, the reliability testing method for the display panel may be implemented as a computer program tangibly contained in a computer-readable storage medium, such as storage unit 18. In some embodiments, part or all of the computer program may be loaded and / or installed on the electronic device 10 via ROM 12 and / or communication unit 19. When the computer program is loaded into RAM 13 and executed by processor 11, one or more steps of the reliability testing method for the display panel described above may be performed. Alternatively, in other embodiments, processor 11 may be configured to perform the reliability testing method for the display panel by any other suitable means (e.g., by means of firmware).

[0271] Various embodiments of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), systems-on-a-chip (SoCs), payload-programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0272] Computer programs used to implement the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, such that when executed by the processor, the computer programs cause the functions / operations specified in the flowcharts and / or block diagrams to be performed. The computer programs may be executed entirely on a machine, partially on a machine, or as a standalone software package, partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0273] In the context of this invention, a computer-readable storage medium can be a tangible medium that may contain or store a computer program for use by or in conjunction with an instruction execution system, apparatus, or device. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination thereof. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.

[0274] To provide interaction with a user, the systems and techniques described herein can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the electronic device. Other types of devices can also be used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0275] The systems and technologies described herein can be implemented in computing systems that include backend components (e.g., as data servers), or computing systems that include middleware components (e.g., application servers), or computing systems that include frontend components (e.g., user computers with graphical user interfaces or web browsers through which users can interact with implementations of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication of any form or medium (e.g., communication networks). Examples of communication networks include local area networks (LANs), wide area networks (WANs), blockchain networks, and the Internet.

[0276] A computing system can include clients and servers. Clients and servers are generally located far apart and typically interact through communication networks. The client-server relationship is created by computer programs running on the respective computers and having a client-server relationship with each other. The server can be a cloud server, also known as a cloud computing server or cloud host, which is a hosting product within the cloud computing service system to address the shortcomings of traditional physical hosts and VPS services, such as high management difficulty and weak business scalability.

[0277] It should be understood that the various forms of processes shown above can be used, with steps reordered, added, or deleted. For example, the steps described in this invention can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution of this invention can be achieved, and this is not limited herein.

[0278] The specific embodiments described above do not constitute a limitation on the scope of protection of this invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this invention should be included within the scope of protection of this invention.

Claims

1. A reliability test method of a display panel, characterized by, The method comprises the following steps: placing at least two display panels to be tested on a bearing substrate; obtaining a region to be tested of the display panel to be tested; setting a first preset test parameter according to the region to be tested, and obtaining a plurality of first threshold voltage test values according to the first preset test parameter; wherein the first preset test parameter comprises a first preset source-drain voltage reference value and a preset gate-source voltage parameter range of a switching element in the region to be tested; setting a first preset threshold voltage range; obtaining a performance test result of the display panel to be tested according to the first threshold voltage test value and the first preset threshold voltage range; setting a second preset test parameter according to the region to be tested, and obtaining a plurality of threshold voltage difference values according to the second preset test parameter; wherein the second preset test parameter comprises a second preset source-drain voltage reference value, a second preset gate-source voltage parameter value, a first preset pressure time, a first preset temperature value and a first initial threshold voltage value of the switching element in the region to be tested; setting a second preset threshold voltage range; obtaining a life test result of the display panel to be tested according to the threshold voltage difference value and the second preset threshold voltage range; judging the reliability of the display panel to be tested according to the performance test result and the life test result.

2. The reliability test method of a display panel according to claim 1, wherein The method comprises the following steps: setting a first preset source-drain voltage parameter value and a preset gate-source voltage parameter range of a switching element in the region to be tested; obtaining a conduction current value of the switching element according to the first preset source-drain voltage parameter value and the preset gate-source voltage parameter range; obtaining a first threshold voltage test value according to the conduction current value.

3. The reliability test method of a display panel according to claim 2, wherein The method comprises the following steps: judging whether the first threshold voltage test value is within the first preset threshold voltage range; if yes, obtaining the performance test result of the display panel to be tested; if no, repeating the step of obtaining the first preset source-drain voltage parameter value and the preset gate-source voltage parameter range of the switching element in the region to be tested.

4. The reliability test method of a display panel according to claim 3, wherein Before repeating the step of obtaining the first preset source-drain voltage parameter value and the preset gate-source voltage parameter range of the switching element in the region to be tested, the method further comprises the following steps: obtaining a number of times of obtaining the performance test result; judging whether the number of times is less than a preset number of times; if yes, repeating the step of obtaining the first preset source-drain voltage parameter value and the preset gate-source voltage parameter range of the switching element in the region to be tested; if no, ending the operation and outputting a test abnormal signal.

5. The reliability test method of a display panel according to claim 1, wherein The method comprises the following steps: setting a second preset source-drain voltage parameter value and a second preset gate-source voltage parameter value of a switching element in the region to be tested, wherein the second preset source-drain voltage parameter value is greater than zero; setting a first preset pressure time and a first preset temperature value; According to the second preset source-drain voltage parameter value, the second preset gate-source voltage parameter value, the first preset pressure time and the first preset temperature value, a second threshold voltage test value of the switch element is obtained; A first initial threshold voltage value is obtained; According to the second threshold voltage test value and the first initial threshold voltage value, a first threshold voltage difference value is obtained.

6. The reliability test method of a display panel according to claim 5, wherein The second preset threshold voltage range includes a first sub-preset threshold voltage range; A second preset threshold voltage range is set; According to the threshold voltage difference value and the second preset threshold voltage range, a life test result of the display panel under test is obtained, including: The first sub-preset threshold voltage range is set; It is judged whether the first threshold voltage difference value is within the first sub-preset threshold voltage range; If yes, the life test result of the display panel under test is obtained; If no, it is judged whether the life test of the display panel under test is completed at present; If the life test of the display panel under test is completed at present, the step of obtaining the second preset source-drain voltage parameter value and the second preset gate-source voltage parameter value of the switch element in the test area is repeatedly executed, wherein the second preset source-drain voltage parameter value is greater than zero; If the life test of the display panel under test is not completed at present, the step of obtaining the first preset pressure time and the first preset temperature value is repeatedly executed.

7. The reliability test method of a display panel according to claim 1, wherein According to the test area, a second preset test parameter is set, and a plurality of threshold voltage difference values are measured according to the second preset test parameter, including: The third preset source-drain voltage parameter value and the third preset gate-source voltage parameter value of the switch element in the test area are set, wherein the third preset source-drain voltage parameter value is less than zero; A second preset pressure time, a second preset temperature value and a preset brightness value are set; According to the third preset source-drain voltage parameter value, the third preset gate-source voltage parameter value, the second preset pressure time, the second preset temperature value and the preset brightness value, a third threshold voltage test value of the switch element is obtained; A second initial threshold voltage value is obtained; According to the third threshold voltage test value and the second initial threshold voltage value, a second threshold voltage difference value is obtained.

8. The reliability test method of a display panel according to claim 7, wherein The second preset threshold voltage range includes a second sub-preset threshold voltage range; A second preset threshold voltage range is set; According to the threshold voltage difference value and the second preset threshold voltage range, a life test result of the display panel under test is obtained, including: The second sub-preset threshold voltage range is set; It is judged whether the second threshold voltage difference value is within the second sub-preset threshold voltage range; If yes, the life test result of the display panel under test is obtained; If no, it is judged whether the life test of the display panel under test is completed at present; If the life test of the display panel under test is completed at present, the step of obtaining the third preset source-drain voltage parameter value and the third preset gate-source voltage parameter value of the switch element in the test area is repeatedly executed, wherein the third preset source-drain voltage parameter value is less than zero; If the life test of the display panel under test is not completed, the steps of obtaining the second preset pressure time, the second preset temperature value and the preset brightness value are repeated.

9. The reliability test method of a display panel according to claim 1, wherein Before obtaining the test area of ​​the display panel under test, the method further includes: Set the test cycle for the display panel under test.

10. A reliability test system of a display panel, characterized by, The reliability testing system for the display panel is used to perform the reliability testing method for the display panel according to any one of claims 1-9; The reliability testing system for the display panel includes: The test panel placement module is used to place at least two test panels on a carrier substrate; The test area acquisition module is used to acquire the test area of ​​the display panel under test; The first threshold voltage test value acquisition module is used to set a first preset test parameter according to the area to be tested, and to test and obtain a plurality of first threshold voltage test values ​​according to the first preset test parameter; wherein, the first preset test parameter includes the first preset source-drain voltage reference value and the preset gate-source voltage parameter range of the switching element in the area to be tested; The first preset threshold voltage range setting module is used to set the first preset threshold voltage range; The performance test result acquisition module is used to acquire the performance test result of the display panel under test based on the first threshold voltage test value and the first preset threshold voltage range. A threshold voltage difference acquisition module is used to set a second preset test parameter according to the area to be tested, and to test and obtain multiple threshold voltage differences according to the second preset test parameter; wherein, the second preset test parameter includes a second preset source-drain voltage reference value, a second preset gate-source voltage parameter value, a first preset pressure-time, a first preset temperature value, and a first initial threshold voltage value for the switching element in the area to be tested; a second preset threshold voltage range setting module is used to set a second preset threshold voltage range; The life test result acquisition module is used to acquire the life test result of the display panel under test based on the threshold voltage difference and the second preset threshold voltage range; The reliability judgment module for the display panel under test is used to judge the reliability of the display panel under test based on the performance test results and the life test results.

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