Support structure and method for focus adjustment

Abstract

Embodiments of a support structure for adjusting the position of a plurality of optical elements are described, the support structure comprising a base plate comprising a centering pin, a first translation slot, and a second translation slot; and a translatable plate configured to operatively couple with the plurality of optical elements and move relative to the base plate, wherein the translatable plate comprises a centering slot configured to engage with the centering pin, a first cam configured to engage with the first translation slot and control movement of the translatable plate along a first axis, and a second cam configured to engage with the second translation slot and control movement of the translatable plate along a second axis.

Description

[0001] Cross-reference to related applications This application claims priority to U.S. Patent Application Serial No. 63 / 156,499, filed March 4, 2021, which is hereby incorporated in its entirety by reference for all purposes. Technical Field

[0002] The present invention generally relates to a support structure with a translation component configured to easily achieve substantially optimal focusing and alignment of a light beam to a spectrometer detector. Background Technology

[0003] It is generally understood that a challenge in many spectrometer implementations includes the ability to easily and accurately adjust the focusing and alignment of the beam on the detector. This task is particularly difficult for those performing adjustments in the field, especially when engineers do not have access to specialized resources. For example, in many spectrometer implementations, the detector is mounted in a fixed position on a substrate within the spectrometer using fasteners configured to hold the detector as a permanent component in place to maintain a focused position. In these implementations, if adjustment of the focus is desired, the engineer at least partially disassembles the component by releasing enough fasteners to move the detector's position on the plate. In this example, the detector's position can be adjusted in one or more degrees of freedom (e.g., forward to backward and from left to right) while monitoring the signal from the detector (e.g., for a Raman spectrometer, the neon spectrum can be monitored to achieve optimal full width at half maximum).

[0004] This approach has several drawbacks, including the need to return the spectrometer to the factory for adjustment if the problem is identified on-site where replacement is required. This is because service engineers cannot quickly or effectively refocus a new detector outside of a factory environment.

[0005] Therefore, a configuration is needed to allow for easy and accurate adjustment of focus and alignment without the use of specialized tools or resources. Summary of the Invention

[0006] This document describes systems, methods, and products for addressing these and other needs in relation to exemplary, non-limiting embodiments. Various alternatives, modifications, and equivalents are also possible.

[0007] The present invention describes an embodiment of a support structure for adjusting the position of a plurality of optical elements. The support structure includes a substrate including a centering pin, a first translation slot, and a second translation slot; and a translational plate configured to be operatively coupled to the plurality of optical elements and movable relative to the substrate. The translational plate includes a centering slot configured to engage with the centering pin, a first cam configured to engage with the first translation slot and control the movement of the translational plate along a first axis, and a second cam configured to engage with the second translation slot and control the movement of the translational plate along a second axis.

[0008] In some cases, the optical elements include optical mirrors, and the movement of the translation plate along the first axis can be configured to enable alignment of the spectrometer. The movement of the translation plate along the second axis may also include linear movement of a centering pin in a centering slot, wherein the first axis may be substantially parallel to the centering slot, and / or substantially parallel to the second translation slot, and / or substantially perpendicular to the first translation slot.

[0009] In some implementations, the movement of the translation plate along the second axis is configured to focus the beam along the length of the array detector and may include rotation about the centering pin.

[0010] Furthermore, the first cam and the second cam may each include a cam pin, which in some cases may be offset from the center of the bodies of the first cam and the second cam. Rotation of the first cam about the cam pin can cause a force between the first cam and a first opening in the translatable plate, causing the translatable plate to move relative to the substrate along a first axis. In some applications, approximately 1 / 10 of the full rotation provides the entire stroke range, which can be approximately 2.25 mm.

[0011] An embodiment of a system for adjusting the characteristics of a light beam is described, the system including an aperture through which the light beam enters; a detector configured to generate a signal in response to the light beam; and a support structure including: a substrate including a centering pin, a first translation slot, and a second translation slot; and a translational plate operatively coupled to a plurality of optical elements configured to guide the light beam from the aperture to the detector and to move relative to the substrate, wherein the translational plate includes a centering slot configured to engage with the centering pin, a first cam configured to engage with the first translation slot and control movement of the translational plate along a first axis, and a second cam configured to engage with the second translation slot and control movement of the translational plate along a second axis.

[0012] In some cases, the optical elements include optical mirrors, and the movement of the translation plate along the first axis can be configured to align the spectrometer. The movement of the translation plate along the second axis may also include linear movement of a centering pin in a centering slot, wherein the first axis may be substantially parallel to the centering slot, and / or substantially parallel to the second translation slot, and / or substantially perpendicular to the first translation slot.

[0013] In some implementations, the movement of the translation plate along the second axis is configured to focus the beam along the length of the array detector and may include rotation about the centering pin.

[0014] Furthermore, the first cam and the second cam may each include a cam pin, which in some cases may be offset from the center of the bodies of the first cam and the second cam. Rotation of the first cam about the cam pin can cause a force between the first cam and a first opening in the translatable plate, causing the translatable plate to move relative to the substrate along a first axis. In some applications, approximately 1 / 10 of the full rotation provides the entire stroke range, which can be approximately 2.25 mm.

[0015] A method for adjusting the characteristics of a light beam is described, the method comprising moving a translational plate relative to a substrate, wherein the translational plate is operatively coupled to a plurality of optical elements configured to guide the light beam from an aperture to a detector, and wherein the substrate includes a centering pin, a first translation slot, and a second translation slot; and the translational plate includes a centering slot configured to engage with the centering pin, a first cam configured to engage with the first translation slot and control movement of the translational plate along a first axis, and a second cam configured to engage with the second translation slot and control movement of the translational plate along a second axis.

[0016] In some cases, moving the translation plate along the first axis allows for alignment of the spectrometer. In other cases, moving the translation plate along the second axis allows for focusing the beam along the length of the array detector.

[0017] Furthermore, rotating the first cam about the cam pin can generate a force between the first cam and the first opening in the translatable plate, so that the translatable plate moves relative to the substrate along the first axis.

[0018] The above-described embodiments and specific implementations are not necessarily inclusive or exclusive of each other, and can be combined in any and any other possible manner, whether or not they are presented in combination with the same or different embodiments or specific implementations. The description of one embodiment or specific implementation is not intended to be limiting with respect to other embodiments and / or specific implementations. Furthermore, in alternative implementations, any one or more functions, steps, operations, or techniques described elsewhere in this specification may be combined with any one or more functions, steps, operations, or techniques described in this specification. Therefore, the above-described embodiments and specific implementations are illustrative and not restrictive. Attached Figure Description

[0019] The above and additional features will become clearer from the following detailed description taken in conjunction with the accompanying drawings. In the drawings, similar reference numerals indicate similar structures, elements, or method steps, and the leftmost digit of the reference numerals indicates the figure number in which the reference element first appears (e.g., element 110 first appears in the figure). Figure 1 (In Chinese). However, all these conventions are intended to be typical or illustrative, not restrictive.

[0020] Figure 1 A functional block diagram of one embodiment of a microscope instrument that communicates with a computer; Figure 2 A simplified graphical representation of one embodiment of an optical assembly including a substrate and a translational plate; Figure 3 For including a centering pin, a first translation slot, and a second translation slot Figure 2 A simplified graphical representation of one embodiment of the substrate; Figure 4 For including a slot and two cam elements Figure 2 A simplified graphical representation of one embodiment of a translatable plate; Figure 5 For including cam pins Figure 4 A simplified graphical representation of one embodiment of a cam element; Figure 6 for Figure 2 and Figure 4 A simplified graphical representation of one embodiment of a translatable plate, the translatable plate including a first cam opening and a second cam opening, wherein a cam pin of each cam passes through the first cam opening and the second cam opening and... Figure 3 One of the translation slots engages; and Figure 7 A simplified graphical representation of one embodiment of the first translation slot that engages with the cam pin.

[0021] In several views of the accompanying drawings, similar reference numerals refer to corresponding parts. Detailed Implementation

[0022] As will be described in more detail below, the described embodiments of the invention include a support structure with a translation component configured to easily achieve substantially optimal focusing and alignment of the beam to the spectrometer detector. More specifically, the translation component includes a cam element that enables fine adjustment of the position of the translational plate in two degrees of freedom.

[0023] Figure 1 A simplified illustrative example of a user 101 capable of interacting with computer 110 and microscope 120 is provided. Embodiments of microscope 120 may include a variety of commercially available microscopes. For example, microscope 120 may include a DXR confocal Raman microscope purchased from Thermo Fisher Scientific. Figure 1 The network connection between computer 110 and microscope 120 is also described; however, it should be understood that... Figure 1 This is intended to be illustrative and may include additional or fewer network connections. Furthermore, network connections between components may include "direct" wired or wireless data transmission (e.g., represented by lightning) and "indirect" communication via other devices (e.g., switches, routers, controllers, computers, etc.). Therefore, it should not be assumed that... Figure 1 Examples are considered restrictive.

[0024] Computer 110 may comprise any type of computing platform, such as a workstation, personal computer, tablet computer, "smartphone," one or more servers, computing cluster (local or remote), or any other current or future computer or computer cluster. Computers typically include known components such as one or more processors, operating system, system memory, memory storage devices, input-output controllers, input-output devices, and display devices. It should also be understood that more than one specific implementation of Computer 110 can be used to perform various operations in different implementations, and therefore should not be considered as... Figure 1 The representation of computer 110 in the text is considered to be restrictive.

[0025] In some embodiments, computer 110 may employ a computer program product comprising computer-usable media having control logic (e.g., a computer software program containing program code) stored therein. When executed by a processor, the control logic causes the processor to perform some or all of the functions described herein. In other embodiments, some functions are implemented primarily in hardware using, for example, a hardware state machine. Implementing a hardware state machine to perform the functions described herein will be apparent to those skilled in the art. Furthermore, in the same or other embodiments, computer 110 may employ an Internet client, which may include a dedicated software application enabled to access remote information via a network. The network may comprise one or more of many different types of networks well known to those skilled in the art. For example, the network may include a local area network (LAN) or a wide area network (WAN) that communicates using protocols commonly referred to as the TCP / IP protocol suite. The network may include a network comprising a globally interconnected computer network system commonly referred to as the Internet, or may also include various intranet architectures. Those skilled in the art will also appreciate that some users in a networked environment may prefer to use so-called “firewalls” (sometimes also called packet filters or perimeter protection devices) to control information traffic to and from hardware and / or software systems. For example, a firewall may include hardware or software components or a combination thereof, and is typically designed to enforce security policies set by users, such as network administrators.

[0026] As described herein, embodiments of the invention include a support structure configured with a substrate and a translation plate movable relative to the substrate, wherein the translation plate includes optical components for guiding a light beam to a spectrometer detector.

[0027] Figure 2 A simplified illustrative example of an optical assembly 200 is provided, comprising multiple optical elements in a “triple spectrometer” arrangement as described in U.S. Patent No. 7,345,760, which is hereby incorporated herein by reference in its entirety for all purposes. For example, optical assembly 200 includes an input aperture 203 that introduces a light beam onto an optical path 210 to a primary mirror. The beam is reflected from the primary mirror and travels parallel to a grating 235, which modulates the beam and reflects it along optical path 210 to a secondary mirror 217, the position of which relative to optical path 210 affects the focusing of the beam on an array of elements of detector 240 (e.g., the characteristics of grating 235 can be selected by rotating a desired embodiment into optical path 210). The beam is then reflected from secondary mirror 217 and guided along optical path 210 to a secondary mirror 219, the position of which relative to optical path 210 affects the focusing of the beam on detector 240.

[0028] Figure 2Also shown is a substrate 260 with a centering pin 265 and a translational plate 250 with a slot 253 engaging with the centering pin 265, wherein the centering pin 265 is allowed to move along the axis of the slot 253. The translational plate 250 also includes two embodiments of a cam 205, which can be used to move the translational plate 250 relative to the substrate 260 in a very precise manner.

[0029] Figure 3 A simplified illustrative example of substrate 260 is provided, which more clearly shows centering pin 265 and first translation slot 305 and second translation slot 307. As will be described in further detail below, the first translation slot 305 and second translation slot 307 are used to control the position of the translational plate 250 relative to substrate 260.

[0030] Figure 4 Simplified illustrative examples of two specific implementations of a translational plate 250 with slot 253 and cam 205 are provided. Figure 5 A simplified illustrative example of a cam 205 is provided, having a handle 510 attached to a cam body 515, wherein the handle 510 provides leverage for a user 101 to provide rotational force to the cam 205. Figure 5 A cam pin 520 attached to the base of the cam body 515 is also shown. For example, the base of the cam body 515 may be generally circular (e.g., when viewed from below), with the cam pin 520 located offset from the center of the circle.

[0031] Figure 6 A simplified illustrative example of a translational plate 250 is provided, wherein a centering pin 265 is positioned in a substrate 260 as close as possible to the focal plane of detector 240 and as close as possible to the optical axis 610. A slot 253 in substrate 260 is generally parallel to the optical axis 610, and sliding the translational plate 250 along the direction of the movement axis 625 (e.g., along the slot 253) results in a generally “focusing” movement, which is the primary movement required to align detector 240. This “focusing” movement is allowed using the slot 253 and the centering pin 265, while also allowing a second degree of freedom, namely rotation about the centering pin 265 along a tilt rotation 627. The tilt rotation 627 allows for optimization of the focus quality over the length of the array detector, rather than just at a single point.

[0032] Figure 6Embodiments of a cam pin 520 engaging with a first translation slot 305 and an embodiment of a cam pin 520 engaging with a second cam slot 307 are also shown. For example, an embodiment of cam 205 is inserted through a first cam opening 605 in the translatable plate 250, such that the cam pin 520 engages with the first translation slot 305 in the substrate 260. Similarly, an embodiment of cam 205 is inserted through a second cam opening 607 in the translatable plate 250, such that the cam pin 520 engages with the second translation slot 307 in the substrate 260. Because the cam pin 520 is offset from a central position in the cam body 515, rotation of cam 205 in the first translation slot 305 and / or the second translation slot 307 results in a force between the cam body 515 and the walls of the first cam opening 605 and / or the second cam opening 607, which causes movement of the translatable plate 250 relative to the substrate 260.

[0033] Figure 7 A simplified illustrative example is provided of how a displacement of angle θ703 results in a displacement X705 via the following formula: X = R sin (θ) Here, distance R 707 is the distance from the center of the pin to the central axis of the cam 205. For example, the actual value of distance R 707 provides the function of determining the lever action or mechanical gain of the cam 205. It is likely desirable that distance R 707 be selected such that approximately ±1 / 10 of a full circle of rotation provides the full amount of travel required for adjustment. In the example described here, optical tolerance can produce a variation of approximately 1% in the focal length of detector 240, preferably approximately 225 mm, thus requiring a travel of approximately 2.25 mm, therefore distance R 707 should be approximately 3.8 mm.

[0034] For example, return Figure 6 A cam 205, positioned in a first cam opening 605, can be positioned generally along an optical axis 610 (e.g., the optical axis 610 is generally parallel to slot 253), wherein a cam pin 520 engages with a first translation slot 305, which is generally perpendicular to the optical axis 610. Therefore, rotating the cam at the first cam opening 605 will push the plate back and forth along the optical axis 610, thereby achieving "focus" adjustment. Because the first translation slot 305 is generally perpendicular to the optical axis 610, the translational plate 250 can rotate freely about a centering pin 265 along the length of the first translation slot 305 (e.g., tilt rotation 627).

[0035] Continuing this example, a second embodiment of cam 205, positioned in the second cam opening 607, performs "tilt" adjustment. The second translation slot 307 can be substantially parallel to the optical axis 610, thus not restricting "focus" adjustment. However, rotating cam 205 in the second cam opening 607 will drive the translational plate 250 to an orientation that constrains its "tilt" axis, while still allowing for further "focus" adjustment.

[0036] Having described various implementation schemes and specific embodiments, it will be apparent to those skilled in the art that the foregoing is illustrative and not limiting, and has been presented by way of example only. Many other schemes are possible for assigning functions to the various functional elements of the illustrated schemes. The function of any element may be performed in various ways in alternative implementation schemes.

Claims

1. A support structure for adjusting the position of multiple optical elements, the support structure comprising: A substrate, the substrate including a centering pin, a first translation slot and a second translation slot; and A translational plate configured to be operatively coupled to and movable relative to the substrate, wherein the translational plate includes a centering slot configured to engage with the centering pin, a first cam configured to engage with the first translational slot and control the movement of the translational plate along a first axis, and a second cam configured to engage with the second translational slot and control the movement of the translational plate along a second axis.

2. The support structure according to claim 1, wherein: The optical element includes a reflector.

3. The support structure according to claim 1, wherein: The movement of the translational plate along the first axis is configured to enable alignment of the spectrometer.

4. The support structure according to claim 3, wherein: The movement of the translational plate along the second axis includes the linear movement of the centering pin in the centering slot.

5. The support structure according to claim 3, wherein: The first axis is generally parallel to the centering slot.

6. The support structure according to claim 3, wherein: The first axis is generally parallel to the second translation slot.

7. The support structure according to claim 3, wherein: The first axis is substantially perpendicular to the first translation slot.

8. The support structure according to any one of claims 1 to 7, wherein: The movement of the translational plate along the second axis is configured to focus the beam along the length of the array detector.

9. The support structure according to claim 8, wherein: The movement of the translatable plate along the second axis includes rotation about the centering pin.

10. The support structure according to any one of claims 1 to 7, wherein: The first cam and the second cam each include a cam pin that is offset from the center of the body of the first cam and the second cam.

11. The support structure according to claim 10, wherein: The rotation of the first cam about the cam pin causes a force between the first cam and the first opening in the translatable plate, so that the translatable plate moves relative to the substrate along the first axis.

12. A system for adjusting the properties of a light beam, the system comprising: Aperture through which the light beam enters; A detector configured to generate a signal in response to the light beam; and The support structure includes: A substrate, the substrate including a centering pin, a first translation slot and a second translation slot; and A translational plate operatively coupled to a plurality of optical elements configured to guide the light beam from the aperture to the detector and to move relative to the substrate, wherein the translational plate includes a centering slot configured to engage with the centering pin, a first cam configured to engage with the first translational slot and control movement of the translational plate along a first axis, and a second cam configured to engage with the second translational slot and control movement of the translational plate along a second axis.

13. The system according to claim 12, wherein: The movement of the translational plate along the first axis is configured to align the spectrometer.

14. The system according to any one of claims 12 to 13, wherein: The movement of the translational plate along the second axis includes linear movement of the centering pin in the centering slot to focus the beam along the length of the array detector.

15. The system according to claim 14, wherein: The movement of the translatable plate along the second axis includes rotation about the centering pin.

16. A method for adjusting the characteristics of a light beam, the method comprising: Relative to the substrate, a movable plate The translatable plate is operatively coupled to a plurality of optical elements configured to guide a light beam from the aperture to the detector, and The substrate includes a centering pin, a first translation slot, and a second translation slot; Furthermore, the translatable plate includes a centering slot configured to engage with the centering pin, a first cam configured to engage with the first translation slot and control the movement of the translatable plate along a first axis, and a second cam configured to engage with the second translation slot and control the movement of the translatable plate along a second axis.

17. The method of claim 16, wherein: Moving the translational plate along the first axis enables alignment of the spectrometer.

18. The method of claim 16, wherein: Moving the translational plate along the second axis allows the beam to be focused along the length of the array detector.

19. The method according to any one of claims 16 to 18, wherein: Rotating the first cam around the cam pin causes a force between the first cam and the first opening in the translatable plate, thereby moving the translatable plate relative to the substrate along the first axis.

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