A sensor performance tester

Abstract

The application discloses a kind of sensor performance test machines, it is related to the technical field of sensor test, installation platform, test component, clamping assembly, oscilloscope and wire clamp;Test component, test component includes test piece and driving part, test piece is movably arranged on installation platform, and is opened with multiple test holes, and driving part is used to drive test piece to move;Clamping assembly includes sensor clamp, sensor clamp is slidably connected on installation platform, sensor clamp is used to hold groove photoelectric sensor, sensor clamp can be moved to make test piece part be located in test groove;Oscilloscope is used to display and record the test data of groove photoelectric sensor;Wire clamp has four, and respectively with groove photoelectric sensor and oscilloscope electric connection.The application has the effect of improving the accuracy of collected data, thereby improving the accuracy of detection result;And collected data can be processed in time, thereby improving the detection efficiency.

Description

Technical Field

[0001] This application relates to the technical field of sensor testing, and in particular to a sensor performance testing machine. Background Technology

[0002] Sensors are the primary component for achieving automatic control. Among them, the slotted photoelectric sensor is a type of through-beam photoelectric switch. It has a test slot, and infrared emitting and receiving devices are respectively set on the opposite side walls of the test slot. When an object passes through the test slot, the object blocks the infrared light, causing a change in the intensity of the light received by the infrared receiving device. This change in light intensity is converted into a change in electrical signal to control the connected equipment.

[0003] Currently, the testing of slotted photoelectric sensors mainly involves operators using a multimeter to measure and record the voltage data at the output terminal of the slotted photoelectric sensor. The voltage data is then processed to determine whether the sensor's voltage, response time, and response frequency are up to standard.

[0004] However, the sensor data collected by this detection method has low stability and accuracy, resulting in low accuracy of the detection results. Furthermore, the collected voltage data needs to be processed before it can be determined whether the sensor is qualified, leading to low detection efficiency. Summary of the Invention

[0005] In order to improve the accuracy of the collected data, thereby improving the accuracy of the detection results, and to enable timely processing of the collected data, thereby improving detection efficiency, this application provides a sensor performance testing machine.

[0006] This application provides a sensor performance testing machine, which adopts the following technical solution:

[0007] A sensor performance testing machine, comprising:

[0008] Installation platform;

[0009] The test component includes a test piece and a driving component. The test piece is movably mounted on a mounting platform and has multiple test holes. The driving component is used to drive the test piece to move.

[0010] A clamping assembly includes a sensor clamp slidably connected to a mounting platform. The sensor clamp is used to clamp a slotted photoelectric sensor. The sensor clamp is movable such that a portion of the test piece is located in the test slot of the slotted photoelectric sensor, and when the test piece moves, a plurality of the test holes can sequentially pass through the test slot.

[0011] An oscilloscope for displaying and recording test data of a slotted photoelectric sensor;

[0012] The wire clamps consist of four wire clamps, each with one end electrically connected to one of the four wires of the slotted photoelectric sensor and the other end electrically connected to an oscilloscope.

[0013] By adopting the above technical solution, during testing, the operator fixes the sensor on the sensor fixture, then moves the sensor fixture to the test piece, so that the test hole of the test piece is located in the test slot. The four wires of the slotted photoelectric sensor are electrically connected to the wire fixture, and the driving device is started. The driving device drives the test piece to rotate, so that multiple test holes pass through the test slot in sequence, thereby testing the slotted photoelectric sensor. At the same time, the oscilloscope records and displays the test data, thereby improving the accuracy of the test data and the detection efficiency.

[0014] Optionally, the clamping assembly includes a guide rail, which is disposed on the mounting platform. A slide is slidably connected to the guide rail, and the slide moves in a direction perpendicular to the rotation axis of the test piece. The slide is connected to the sensor clamp.

[0015] By adopting the above technical solution, the operator fixes the slotted photoelectric sensor to the sensor fixture, and then moves the slide table in a direction perpendicular to the rotation axis of the test piece towards the test piece, so that the slide table drives the sensor fixture to the position where the test piece is inserted into the test slot, thereby making it easier for the operator to fix the slotted photoelectric sensor to the sensor fixture.

[0016] Optionally, the sensor clamp includes a first gripper and a second gripper, which can move toward or away from each other, and the direction of movement is perpendicular to the length of the guide rail. A fixing groove is formed between the first gripper and the second gripper.

[0017] By adopting the above technical solution, the operator moves the first gripper and the second gripper away from each other, so that the slotted photoelectric sensor is inserted into the fixed slot, and then moves the first gripper and the second gripper toward each other, thereby locking the slotted photoelectric sensor.

[0018] Optionally, the wire clamp includes a third jaw, a fourth jaw, and a first locking member. The third jaw and the fourth jaw can move toward each other or away from each other, and the first locking member is used to lock the positions of the third jaw and the fourth jaw.

[0019] By adopting the above technical solution, the first locking member is released, the fourth clamp moves away from the third clamp, the wire of the slotted photoelectric sensor is placed between the third clamp and the fourth clamp, then the fourth clamp moves towards the third clamp and clamps the wire together with the third clamp, and then the first locking member locks the third clamp and the fourth clamp, so that the wire is electrically connected to the oscilloscope through the wire clamp.

[0020] Optionally, the wire clamp further includes a connecting rod, which is made of insulating material, and the plurality of fourth jaws are connected by the connecting rod.

[0021] By adopting the above technical solution, the four fourth jaws are connected by a connecting rod. When clamping the wire, moving one fourth jaw causes all four fourth jaws to move simultaneously, which makes it easier for the operator to clamp the wire. The connecting rod is made of insulating material so that the four fourth jaws are not electrically connected to each other.

[0022] Optionally, the test piece has a circular cross-section, and the driving component is used to drive the test piece to rotate around its own axis, and the test holes are spaced apart circumferentially around the axis of the test piece.

[0023] By adopting the above technical solution, the circular cross-section of the test piece makes the space occupied by the test piece smaller when it rotates, and the test piece can make multiple test holes pass through the test slot of the slotted photoelectric sensor in sequence when it rotates.

[0024] Optionally, the mounting platform is provided with multiple fixing rings, which are spaced apart along the circumference of the test piece and coaxial with the test piece. Multiple sensor clamps are provided, and the sensor clamps are mounted on the fixing rings.

[0025] By adopting the above technical solution, the slotted photoelectric sensor is fixed to the sensor fixture. During testing, the test piece rotates, so that multiple test holes pass through multiple slotted photoelectric sensors on multiple fixing rings in sequence. This allows the testing machine to test multiple slotted photoelectric sensors simultaneously, improving testing efficiency.

[0026] Optionally, an arc-shaped groove is provided on the side of the fixing ring near the test piece. The arc-shaped groove is coaxial with the fixing ring. A connecting block is slidably disposed in the arc-shaped groove. The sensor clamp is disposed on the connecting block. A second locking member is provided on the connecting block. The second locking member is used to lock the position of the connecting block.

[0027] By adopting the above technical solution, the slotted photoelectric sensor is fixed to the sensor fixture, and then the connecting block is inserted into the arc-shaped slot from the space between adjacent fixing rings. Then, the second locking member is operated to lock the position of the connecting block, which makes it easy for the operator to install the sensor fixture in the arc-shaped slot.

[0028] Optionally, two pulleys are rotatably mounted on the mounting platform, and a mounting strip is sleeved on the outer side of the two pulleys. The mounting strip is annular. There are multiple test pieces, and the multiple test pieces are spaced apart on the outer wall of the mounting strip along the length direction. There are multiple sensor clamps, and the multiple sensor clamps are arranged along the length direction of the mounting strip. The driving component is used to drive the pulleys to rotate.

[0029] By adopting the above technical solution, the operator fixes the slotted photoelectric sensor to the sensor fixture. During testing, the driving component is activated, which drives the pulley to rotate. The pulley drives the mounting strip to rotate, so that multiple test pieces on the mounting strip pass through multiple test slots in sequence, thereby testing multiple slotted photoelectric sensors simultaneously and improving testing efficiency.

[0030] Optionally, the clamping assembly includes a clamping seat with an installation groove, the installation strip being located within the installation groove, and multiple sensor clamps being spaced apart on the inner wall of the installation groove. The clamping seat is slidably connected to the mounting platform, and its movement direction is the length direction of the installation strip.

[0031] By adopting the above technical solution, the operator moves the clamping seat until the mounting strip is disengaged from the mounting slot, fixes the slotted photoelectric sensor to the sensor fixture, moves the clamping seat so that the mounting strip is inserted into the mounting slot, and allows the test piece to pass through multiple test slots. Then, the driving component is activated to detect multiple slotted photoelectric sensors at the same time, thereby improving the detection efficiency.

[0032] In summary, this application includes at least one of the following beneficial effects:

[0033] 1. During testing, the operator fixes the sensor on the sensor fixture, then moves the sensor fixture to the test piece, and electrically connects the four wires of the slotted photoelectric sensor to the wire fixture. The driver is then activated, which drives the test piece to rotate and test the slotted photoelectric sensor. At the same time, the oscilloscope records and displays the test data, thereby improving the accuracy of the test data and the detection efficiency.

[0034] 2. The operator fixes the slotted photoelectric sensor to the sensor fixture, and then moves the slide table along the length of the guide rail towards the test piece and abuts against the limiting piece, so that the slide table drives the sensor fixture to the position where the test piece is inserted into the test slot, thereby making it easier for the operator to fix the slotted photoelectric sensor to the sensor fixture.

[0035] 3. Fix the slotted photoelectric sensor to the sensor fixture. During testing, the test piece rotates, causing multiple test holes to pass through multiple slotted photoelectric sensors on multiple fixing rings in sequence. This allows the testing machine to test multiple slotted photoelectric sensors simultaneously, improving testing efficiency.

[0036] 4. Fix the slotted photoelectric sensor to the sensor fixture, then insert the connecting block into the arc-shaped slot from the space between adjacent fixing rings, and then operate the second locking member to lock the position of the connecting block, so that the operator can install the sensor fixture in the arc-shaped slot. Attached Figure Description

[0037] Figure 1This is a schematic diagram of the overall structure of Embodiment 1 of this application;

[0038] Figure 2 yes Figure 1 A magnified schematic diagram of the partial structure at point A in the middle;

[0039] Figure 3 This is a schematic diagram of the overall structure of Embodiment 2 of this application;

[0040] Figure 4 This is a partial structural schematic diagram of the fixing ring according to Embodiment 2 of this application;

[0041] Figure 5 This is a schematic diagram of the overall structure of Embodiment 3 of this application;

[0042] Figure 6 This is a partial structural schematic diagram of the clamping seat according to Embodiment 3 of this application.

[0043] Explanation of reference numerals in the attached drawings: 1. Mounting platform; 2. Test assembly; 21. Test piece; 22. Test hole; 23. Drive component; 24. Pulley; 25. Mounting strip; 3. Clamping assembly; 31. Sensor clamp; 311. First gripper; 312. Second gripper; 313. Fixing groove; 32. Guide rail; 33. Slide table; 34. Clamping seat; 341. Mounting groove; 35. Fixing ring; 36. Arc-shaped groove; 37. Connecting block; 38. Second locking element; 4. Oscilloscope; 5. Wire clamp; 51. Third gripper; 52. Fourth gripper; 53. Connecting rod; 54. First locking element; 6. Slotted photoelectric sensor; 61. Test groove. Detailed Implementation

[0044] The following is in conjunction with the appendix Figure 1-6 This application will be described in further detail.

[0045] Reference Figure 1 and Figure 2 The slotted photoelectric sensor 6 has a test slot 61 at one end, and infrared emitters and receivers are respectively arranged on the opposite sidewalls of the test slot 61. Four wires are arranged at the other end of the slotted photoelectric sensor 6. When an object passes through the test slot 61, the light intensity information received by the infrared receiver changes, causing the slotted photoelectric sensor 6 to transmit the changing electrical signal to an external device through the wires, thereby realizing the function of controlling the external device.

[0046] Example 1:

[0047] This application discloses a sensor performance testing machine, which is described in an embodiment. Figure 1 and Figure 2The sensor performance testing machine includes a mounting platform 1, on which a clamping assembly 3 is provided. The clamping assembly 3 includes a guide rail 32, which is detachably connected to the mounting platform 1 by bolts. A slide table 33 is slidably provided on the guide rail 32, and the slide table 33 moves in the direction of the length of the guide rail 32. A sensor clamp 31 is slidably provided on the slide table 33, and the sensor clamp 31 moves in the direction perpendicular to the length of the guide rail 32. The sensor clamp 31 includes a first jaw 311 and a second jaw 312 that can move towards or away from each other. The first jaw 311 and the second jaw 312 can be rotatably connected to a bolt and threadedly connected to it, respectively. When the bolt rotates, it drives the first jaw 311 and the second jaw 312 to move towards or away from each other. A fixing groove 313 is formed between the first jaw 311 and the second jaw 312.

[0048] Reference Figure 1 and Figure 2 The mounting platform 1 is equipped with a test component 2, which includes a test piece 21 and a drive component 23. The test piece 21 is circular and has multiple test holes 22 spaced apart along its circumferential edge. The drive component 23 is a speed-adjustable motor. The test piece 21 is rotatably connected to the output end of the drive component 23, and the test holes 22 can pass through the fixing groove 313. The drive component 23 is used to drive the test piece 21 to rotate.

[0049] When fixing the slotted photoelectric sensor 6, the operator places the slotted photoelectric sensor 6 between the fixing slots 313, and then rotates the bolts to make the first clamp 311 and the second clamp 312 move towards each other, so that the inner wall of the fixing slot 313 clamps the slotted photoelectric sensor 6, thereby fixing the slotted photoelectric sensor 6 to the sensor fixture 31. Then, the slide 33 is moved, and the slide 33 drives the slotted photoelectric sensor 6 on the sensor fixture 31 to move closer to the test piece 21, so that the slotted photoelectric sensor 6 moves to a position where the test hole 22 can pass through the test slot 61. During the test, the operator adjusts the motor speed to the required test speed, and the motor drives the test piece 21 to rotate, so that the test hole 22 passes through the test slot 61 in sequence, thereby testing the slotted photoelectric sensor 6.

[0050] Reference Figure 1 and Figure 2The sensor performance testing machine also includes a wire clamp 5 and an oscilloscope 4. The wire clamp 5 is electrically connected to the slotted photoelectric sensor 6 and the oscilloscope 4 respectively. The wire clamp 5 abuts against the surface of the mounting platform 1. The wire clamp 5 includes a first locking member 54, a connecting rod 53, four third jaws 51 and fourth jaws 52 corresponding to the third jaws 51. The connecting rod 53 is made of insulating material, and the third jaws 51 and fourth jaws 52 are made of conductive metal material. The four fourth jaws 52 are fixedly connected by the connecting rod 53. The third jaws 51 and fourth jaws 52 can move towards or away from each other. The first locking member 54 is a bolt. The third jaws 51 and fourth jaws 52 are rotatably connected to the bolt and threadedly connected to it respectively. When the bolt rotates, it drives the third jaws 51 and fourth jaws 52 to move towards or away from each other.

[0051] After the operator fixes the slotted photoelectric sensor 6 to the sensor clamp 31, the four wires are placed between the four third clamps 51 and the corresponding fourth clamps 52 respectively. Then, the bolt is rotated so that the third clamps 51 and the corresponding fourth clamps 52 move towards each other and clamp the wires, so that the slotted photoelectric sensor 6 is electrically connected to the oscilloscope 4. During the test, the electrical signal of the slotted photoelectric sensor 6 is transmitted to the oscilloscope 4 through the wires and the wire clamps 5 in sequence. The oscilloscope 4 collects, processes and records the electrical signal, thereby improving the test accuracy and test efficiency.

[0052] The implementation principle of a sensor performance testing machine according to an embodiment of this application is as follows: During testing, the driving component 23 is activated, and the driving component 23 drives the test piece 21 to rotate, so that multiple test holes 22 pass through the test slot 61 in sequence. At the same time, the oscilloscope 4 receives, processes and records the changing electrical signals of the slot-shaped photoelectric sensor 6, thereby improving the test accuracy and test efficiency.

[0053] Example 2:

[0054] Reference Figure 3 and Figure 4 The difference between this embodiment and other embodiments is that: the test piece 21 is circular, and multiple test holes 22 are spaced apart circumferentially along the axis of the test piece 21. The clamping assembly 3 includes multiple fixing rings 35, which are spaced apart circumferentially along the test piece 21 and are all fixedly connected to the mounting platform 1. An arc-shaped groove 36 is provided on the fixing ring 35. The arc-shaped groove 36 is a T-shaped groove and is coaxial with the test piece 21. It is connected to one end of the fixing ring 35 and the outer wall of the fixing ring 35 respectively. A connecting block 37 is slidably connected in the arc-shaped groove 36. A sensor clamp 31 is fixedly connected to the end of the connecting block 37 near the test piece 21, and a second locking member 38 is provided at the end away from the test piece 21. The second locking member 38 is a bolt and is threadedly connected to the connecting block 37. One end of the bolt passes through the arc-shaped groove 36. When the bolt rotates, the screw is threadedly connected to the connecting block 37, and the nut abuts against the outer wall of the fixing ring 35, thereby locking the connecting block 37 and the fixing ring 35.

[0055] In this embodiment, there are four fixing rings 35, and a connecting block 37 is slidably disposed within the arc-shaped groove 36 on each fixing ring 35; the oscilloscope 4 is a multi-trace oscilloscope 4, capable of simultaneously receiving and displaying multiple signals; four wire clamps 5 are provided, and the four wire clamps 5 respectively electrically connect the four slotted photoelectric sensors 6 to the multi-trace oscilloscope 4. In other embodiments of this application, multiple connecting blocks 37 can be slidably disposed within the arc-shaped groove 36 on each fixing ring 35; multiple oscilloscopes 4 can be provided.

[0056] The implementation principle of a sensor performance testing machine according to an embodiment of this application is as follows: When fixing the sensor fixture 31, the operator fixes the slotted photoelectric sensor 6 to the sensor fixture 31, and then inserts the corresponding connecting block 37 into the arc-shaped groove 36 from the gap between the fixing rings 35. Then, the bolt passes through the arc-shaped groove 36 and is threadedly connected to the connecting block 37, so that the nut abuts against the outer wall of the fixing ring 35, thereby locking the position of the connecting block 37. During testing, the test piece 21 rotates, so that multiple test holes 22 pass through multiple test grooves 61 simultaneously, thereby simultaneously detecting multiple slotted photoelectric sensors 6, improving detection efficiency. Moreover, the ring structure is compact and occupies less space.

[0057] This embodiment of the application includes multiple wire clamps 5 that correspond one-to-one with the sensor clamp 31. For ease of reading, please refer to... Figure 3 and Figure 4 The drawing does not show multiple wire clamps 5 and wires; only one wire clamp 5 and its corresponding wire are drawn.

[0058] Example 3:

[0059] Reference Figure 5 and Figure 6 The difference between this embodiment and other embodiments is that the clamping component 3 includes a clamping seat 34, which is slidably connected to the mounting platform 1 via a guide rail 32, and the clamping seat 34 moves in the direction of the length of the guide rail 32.

[0060] Reference Figure 5 and Figure 6 The clamping base 34 has an installation groove 341. Multiple sensor clamps 31 are spaced apart on the inner wall of the installation groove 341. Two pulleys 24 are installed in the installation groove 341. Both pulleys 24 are rotatably connected to the driving component 23. The rotation axis of the pulleys 24 is perpendicular to the length direction of the guide rail 32. One pulley 24 is connected to the output end of the driving component 23. An installation strip 25 is sleeved on the two pulleys 24. The installation strip 25 is annular. Multiple test pieces 21 are spaced apart on the outer wall of the installation strip 25 along the length direction of the installation strip 25.

[0061] In other embodiments of this application, the detection element may also have multiple detection holes, thereby further improving detection efficiency.

[0062] The implementation principle of a sensor performance testing machine according to an embodiment of this application is as follows: When fixing the slotted photoelectric sensor 6, the operator fixes the slotted photoelectric sensor 6 to the sensor fixture 31, then moves the clamping seat 34 so that the mounting strip 25 is inserted into the mounting slot 341, and then starts the driving component 23. The driving component 23 drives the mounting strip 25 to rotate through the pulley 24, so that multiple test holes 22 pass through multiple slotted photoelectric sensors 6 in sequence, thereby further improving the testing efficiency.

[0063] This embodiment of the application includes multiple wire clamps 5 that correspond one-to-one with the sensor clamp 31. For ease of reading, please refer to... Figure 5 and Figure 6 The drawing does not show multiple wire clamps 5 and wires; only one wire clamp 5 and its corresponding wire are drawn.

[0064] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. A sensor performance testing machine, characterized in that: include: Mounting station (1); Test component (2), the test component (2) includes a test piece (21) and a drive component (23). The test piece (21) is movably disposed on the mounting platform (1) and has multiple test holes (22). The drive component (23) is used to drive the test piece (21) to move. The clamping assembly (3) includes a sensor clamp (31) which is slidably connected to the mounting platform (1). The sensor clamp (31) is used to clamp the slotted photoelectric sensor (6). The sensor clamp (31) can be moved such that the test piece (21) is partially located in the test slot (61) of the slotted photoelectric sensor (6). When the test piece (21) moves, the plurality of test holes (22) can pass through the test slot (61) in sequence. Oscilloscope (4), the oscilloscope (4) is used to display and record test data of slotted photoelectric sensor (6); Four wire clamps (5) are provided, and each wire clamp is electrically connected at one end to the four wires of the slotted photoelectric sensor (6) and at the other end to the oscilloscope (4). Two pulleys (24) are rotatably mounted on the mounting platform (1). An mounting strip (25) is sleeved on the outer side of the two pulleys (24). The mounting strip (25) is annular. There are multiple test pieces (21), and multiple test pieces (21) are spaced apart on the outer wall of the mounting strip (25) along the length direction. There are multiple sensor clamps (31), and multiple sensor clamps (31) are arranged along the length direction of the mounting strip (25). The driving member (23) is used to drive the pulleys (24) to rotate. The clamping assembly (3) includes a clamping seat (34), on which an installation groove (341) is provided. The installation strip (25) is located in the installation groove (341). Multiple sensor clamps (31) are spaced apart on the inner wall of the installation groove (341). The clamping seat (34) is slidably connected to the mounting platform (1), and its movement direction is the length direction of the installation strip (25).

2. The sensor performance testing machine according to claim 1, characterized in that: The wire clamp (5) includes a third jaw (51), a fourth jaw (52) and a first locking member (54). The third jaw (51) and the fourth jaw (52) can move towards each other or away from each other. The first locking member (54) is used to lock the position of the third jaw (51) and the fourth jaw (52).

3. The sensor performance testing machine according to claim 2, characterized in that: The wire clamp (5) also includes a connecting rod (53), which is made of insulating material, and the multiple fourth jaws (52) are connected by the connecting rod (53).

Images