Curve alignment method and apparatus

Abstract

A curve alignment method and device. The method obtains data from at least one machine analyzing test samples and generates a plurality of test curves; in response to an alignment operation from a first point around a first curve to a second point around a second curve in the test curves, records a corresponding relationship of a first feature corresponding to the first point and a second feature corresponding to the second point, and collects corresponding relationships of a plurality of alignment operations as feature data; obtains data from the machine analyzing a current sample and generates a plurality of current curves; according to the corresponding relationship in the recorded feature data, searches for a third point on a third curve of the current curves matching the first feature and a fourth point on a fourth curve of the current curves matching the second feature; and adjusts at least one of the third curve and the fourth curve so that the third point aligns with the fourth point.

Description

Technical Field

[0001] This invention relates to a data processing method and apparatus, and more particularly to a curve alignment method and curve alignment apparatus. Background Technology

[0002] With the advancement of microscopy, various types of microscopic observation devices have emerged, such as atomic force microscopes (AFM), electron microscopes including transmission electron microscopes (TEM), scanning electron microscopes (SEM), secondary ion mass spectrometers (SIMS), extended resistivity analyzers (SRP), X-ray energy dispersive X-ray spectrometers (EDS), X-ray photoelectron spectrometers (XPS), Euroelectron spectroscopy (FE-AES), and thin film thickness profile measuring instruments (α-step). The high-resolution three-dimensional imaging technology of electron microscopes is applied in clinical medicine and biomolecular research for analytical detection, effectively increasing the resolution of observed images and the accuracy of observation results.

[0003] When analyzing samples using microscopic observation equipment, it is necessary to integrate the analytical results from different instruments. This includes adjusting, expanding, and merging the detection data from multiple instruments to obtain a complete analytical report for the sample. However, because each instrument has different specifications, characteristics, operating methods, and operating environments, the curves of their detection data may differ due to offsets or distortions. Therefore, integrating this data requires operators to manually adjust the curves based on experience, identify correlations, and align them to obtain accurate analytical results. This process is time-consuming and labor-intensive. Summary of the Invention

[0004] This invention provides a curve alignment method and a curve alignment device, which can automatically adjust and align data curves from multiple machines by learning from past experience in curve alignment.

[0005] The curve alignment method of this invention is applicable to electronic devices having a data capture device and a processor. The method includes the following steps: acquiring data obtained from analyzing a test sample using at least one instrument using the data capture device and generating multiple test curves; in response to an alignment operation from a first point around a first curve in the test curves to a second point around a second curve, recording the correspondence between a first feature corresponding to the first point and a second feature corresponding to the second point, and aggregating the correspondences of multiple alignment operations as feature data; acquiring data obtained from analyzing a current sample using the data capture device and generating multiple current curves; based on the correspondences in the recorded feature data, searching for a third point on the third curve matching the first feature and a fourth point on the fourth curve matching the second feature for the third and fourth curves in the current curves; and adjusting at least one of the third and fourth curves such that the third point aligns with the fourth point.

[0006] The curve alignment device of this invention includes a data acquisition device, a storage device, and a processor. The data acquisition device is used to connect to at least one machine tool. The processor is coupled to the data acquisition device and the storage device, and is configured to use the data acquisition device to acquire data obtained from the machine tool's analysis of a test sample and generate multiple test curves in response to an alignment operation from a first point around a first curve to a second point around a second curve. It records the correspondence between a first feature corresponding to the first point and a second feature corresponding to the second point, and aggregates the correspondences of multiple alignment operations as feature data. It also uses the data acquisition device to acquire data obtained from the machine tool's analysis of a current sample and generate multiple current curves. Based on the correspondences in the recorded feature data, it searches for a third point on the third curve that matches the first feature and a fourth point on the fourth curve that matches the second feature, and adjusts at least one of the third and fourth curves so that the third point aligns with the fourth point.

[0007] Based on the above, the curve alignment method and curve alignment device of the present invention acquire the alignment operations performed by the operator on the output data curves of a single machine or different machines and record them as feature data, which are used to perform feature comparison and adjustment on the curves of subsequent output data of the machine, thereby realizing automatic alignment of data curves of a single machine or multiple machines.

[0008] The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments, but this is not intended to limit the present invention. Attached Figure Description

[0009] Figure 1 This is a block diagram illustrating a curve alignment device according to an embodiment of the present invention.

[0010] Figure 2This is a flowchart illustrating a curve alignment method according to an embodiment of the present invention.

[0011] Figure 3 This is a graph illustrated according to an embodiment of the present invention.

[0012] Figures 4A to 4C This is an example of a curve alignment method illustrated according to an embodiment of the present invention.

[0013] Figure 5A and Figure 5B This is an example of a curve alignment method illustrated according to an embodiment of the present invention.

[0014] Figure 6 This is a flowchart illustrating a curve alignment method according to an embodiment of the present invention.

[0015] Figure 7 This is an example of a curve alignment method illustrated according to an embodiment of the present invention.

[0016] In the attached figures, the following labels are used:

[0017] 10: Curve alignment device

[0018] 12: Data capture equipment

[0019] 14: Storage device

[0020] 16: Processor

[0021] 20: Machine

[0022] 30: Curve graph

[0023] 42, 44: Features

[0024] Sections 62, 64, 66, 68, and 70

[0025] 32, 34, A1, A2, B1, B2, C, D: Test curves

[0026] c, d, e, f: points

[0027] c1~c4, d1~d7, e1~e4, f1~f7: Feature points

[0028] C1, C2, D1, D2, E, F: Current curves

[0029] S202~S210, S602~S614: Steps Detailed Implementation

[0030] The structural and working principles of the present invention will be described in detail below with reference to the accompanying drawings:

[0031] This invention proposes a curve alignment method and device. Addressing the differences in offset and deformation between curves obtained from analyzing a test sample using a single instrument or from different instruments analyzing the same test sample, the method learns from the alignment operations performed by operators on these curves and records them as feature data. Subsequently, when obtaining the curve of the current sample, the method compares the curves based on this feature data to identify the correlation between them and align them, thereby correctly and quickly integrating the analysis results from different instruments.

[0032] Figure 1 This is a block diagram illustrating a curve alignment device according to an embodiment of the present invention. Please refer to... Figure 1 The curve alignment device 10 in this embodiment is, for example, a personal computer, server, workstation, or other device with computing capabilities, including a data capture device 12, a storage device 14, and a processor 16, the functions of which are described below:

[0033] The data acquisition device 12 is, for example, a wired connection device such as a universal serial bus (USB), RS232, universal asynchronous receiver / transmitter (UART), integrated circuitry (I2C), serial peripheral interface (SPI), displayport, thunderbolt, or local area network (LAN) interface; or a wireless connection device supporting communication protocols such as wireless fidelity (Wi-Fi), RFID, Bluetooth, infrared, near-field communication (NFC), or device-to-device (D2D). The data acquisition device 12 can be connected to at least one instrument 20 used to analyze samples to acquire data obtained from the sample analysis by the instrument 20. The instrument 20 is, for example, a small-area component analysis device of various types, such as a secondary ion mass spectrometer (SIMS), a spread resistance analyzer (SRP), an X-ray energy dispersive spectrometer (EDS), an X-ray photoelectron spectrometer (XPS), or an electro-electron spectrometer (FE-AES), and is not limited herein.

[0034] Storage device 14 may be, for example, any type of fixed or removable random access memory (RAM), read-only memory (ROM), flash memory, hard disk, or other similar device or combination thereof, for storing programs executable by processor 16. In some embodiments, storage device 14 may record data acquired by data capture device 12, as well as feature data obtained by curve alignment and feature identification of that data. The recorded data may be stored in a database, for example, in the form of a text file, spreadsheet, or tree structure, for retrieval during searching; this embodiment does not limit the storage method.

[0035] Processor 16 is coupled to data capture device 12 and storage device 14 to control the operation of curve alignment device 10. In some embodiments, processor 16 is, for example, a central processing unit (CPU), or other programmable general-purpose or special-purpose microprocessor, digital signal processor (DSP), programmable controller, application-specific integrated circuit (ASIC), field-programmable gate array (FPGA), programmable logic controller (PLC), or other similar device or combination thereof, and can load and execute the program stored in storage device 14 to perform the curve alignment method of the embodiments of the present invention.

[0036] In some embodiments, the curve alignment device 10 further includes a display for displaying curves of data acquired by the data capture device 12, and an operating device for operating the curves displayed on the display, wherein the display is, for example, a liquid crystal display (LCD), and the operating device is, for example, a mouse, keyboard, touchpad, touch screen, etc., and is not limited thereto.

[0037] Figure 2 This is a flowchart illustrating a curve alignment method according to an embodiment of the present invention. Please also refer to... Figure 1 and Figure 2 The method in this embodiment is applicable to Figure 1 The curve alignment device 10 is described below with respect to the various components of the curve alignment device 10. The detailed steps of the curve alignment method of the present invention are described below with respect to the various components of the curve alignment device 10.

[0038] In step S202, the processor 16 of the curve alignment device 10 uses the data capture device 12 to acquire test data obtained from the analysis of a test sample by at least one machine 20 and uses it to generate multiple test curves. For example, the processor 16 uses the data capture device 12 to acquire the raw data of the analyzed test sample from the machine 20 and plots it into test curves. This includes curve information such as the name, number of points, and notes of the generated test curves, and calculates the average, minimum, maximum, and other meaningful statistical information of the test curves.

[0039] In some embodiments, the processor 16 may further display the plotted test curve on a display and list the aforementioned curve information, statistical information, and axis information. For example, in Figure 3 The curve 30 shown displays test curves 32 and 34 and their related axis information (time, intensity). Test curves 32 and 34 represent the change in signal intensity over time obtained from analyzing a test sample using different instruments.

[0040] In some embodiments, the processor 16 can receive adjustment operations performed by an operator on the test curve via an operating device. The operator can use a mouse (holding down the left or right mouse button) to drag the test curve to perform operations such as translation and scaling, or use the mouse to click on the test curve to perform operations such as cutting and merging; there are no limitations on this. In some embodiments, the operator can use the mouse to point from a first point around a first curve to a second point around a second curve to perform an alignment operation on the test curve. This alignment operation can be, for example, scaling the first or second curve based on the curve's starting point or a custom baseline (i.e., points on the test curve fixed on that baseline) so that the first and second points are aligned with each other.

[0041] In step S204, in response to the alignment operation from a first point around the first curve in the test curve to a second point around the second curve, the processor 16 records the correspondence between the first feature corresponding to the first point and the second feature corresponding to the second point in the storage device 14, and aggregates the correspondences of multiple alignment operations as feature data. The feature data may include, for example, the positions of the first and second points, the names of the corresponding curves, the feature points of the corresponding features, the corresponding point distances, etc., and is not limited here.

[0042] In detail, in some embodiments, the first feature includes, for example, a plurality of feature points on a first curve surrounding a first point, and the second feature includes, for example, a plurality of feature points on a second curve surrounding a second point. These feature points are, for example, feature points sampled at equal time intervals or intervals according to the shape of the curve, and their number can be determined according to the degree of curve deformation or the desired level of detail. This embodiment does not limit the method of obtaining them. In some embodiments, the first feature records the relative relationship between the first point and the first curve (i.e., global feature), and the second feature records the relative relationship between the second point and the second curve, but is not limited thereto.

[0043] In step S206, the processor 16 uses the data capture device 12 to acquire the current data obtained by the instrument 20 from analyzing a current sample and uses it to generate multiple current curves.

[0044] In step S208, the processor 16 searches for a third point on the third curve that matches the first feature and a fourth point on the fourth curve that matches the second feature, based on the corresponding relationships in the recorded feature data. For example, the processor 16 uses feature data to compare the similarity of features in the third and fourth curves based on information such as the machine type, curve name, position, feature points, and resolution corresponding to the third and fourth curves, thereby selecting suitable alignment operations for automatic alignment.

[0045] In detail, the processor 16 uses a sliding window to perform feature comparison on the third curve and the fourth curve respectively, to search for a third point matching the first feature from the third curve and a fourth point matching the second feature from the fourth curve. The feature comparison includes slope comparison, correlation comparison, or position comparison, but this embodiment is not limited to these.

[0046] In some embodiments, the feature data used for the feature comparison described above can be weighted according to the cumulative number of alignment operations received during the testing phase or confirmation operations received during the implementation phase. The adjusted weights are also stored in a database for use as the basis for subsequent feature comparisons. That is, if the cumulative number of alignment operations corresponding to a certain first feature and a certain second feature is large, the alignment operation is more likely to be invoked when the feature data is matched with the feature in the current curve during a subsequent search. In this way, the weight of the correspondence pointed to by the alignment operation for feature comparison can be adjusted so that the comparison result reflects the actual operation of the operator and optimizes the user experience. In addition, after finding a third point matching the first feature and a fourth point matching the second feature, in response to the operator's confirmation operation for the third and fourth points, the weight of the correspondence confirmed by the confirmation operation for feature comparison can be adjusted so that the comparison result reflects the actual operation of the operator; conversely, if the operator deletes a correspondence for a third and fourth point, the weight of this correspondence for feature comparison can be reduced to decrease the likelihood of this correspondence being invoked.

[0047] In step S210, the processor 16 adjusts at least one of the third curve and the fourth curve so that the third point aligns with the fourth point. For example, the processor 16 may scale the third curve and / or the fourth curve proportionally to align the third point with the fourth point. In some embodiments, the processor 16 may additionally define a baseline for adjusting the third curve and the fourth curve, and adjust the third curve or the fourth curve based on this baseline (i.e., points of the third or fourth curve fixed on this baseline) to align the third point with the fourth point. In some embodiments, the processor 16 may also define a baseline at the location of the aligned third and fourth points, and continue to adjust the third curve or the fourth curve based on this baseline.

[0048] For example, Figures 4A to 4C This is an example of a curve alignment method illustrated according to an embodiment of the present invention. Please refer to... Figure 4A In this embodiment, the curve alignment device displays test curves C and D generated by analyzing data from a test sample using different instruments on a display screen, and receives alignment operations from the operator, pointing from point c around test curve C to point d around test curve D. Next, please refer to... Figure 4B The curve alignment device uses multiple feature points c1 to c4 on test curve C corresponding to point c as the first feature, and multiple feature points d1 to d7 on test curve D corresponding to point d as the second feature, and records the correspondence between the first and second features as feature data. Please refer to... Figure 4CWhen the curve alignment device receives data from analyzing a current sample using the same or similar equipment and uses it to generate current curves E and F, it analyzes multiple features on current curves E and F using previously recorded feature data. This allows it to find the third feature (including feature points e1 to e4) on current curve E that matches the first feature (including feature points c1 to c4) and its corresponding point e. Similarly, it finds the fourth feature (including feature points f1 to f7) on current curve F that matches the second feature (including feature points d1 to d7) and its corresponding point f. Based on this, the curve alignment device can adjust current curves E and / or F so that point e aligns with point f, thus completing the alignment operation between current curves E and F.

[0049] It should be noted that the correspondence between the first and second features mentioned above may include multiple alignment operations performed by the operator on the test curve. For example, Figure 5A and Figure 5B This is an example of a curve alignment method illustrated according to an embodiment of the present invention. Please refer to... Figure 5A For test curves A1 and B1, the operator can perform two alignment operations, pointing from the edge of the peak in test curve B1 to the edge of the corresponding peak in test curve A1, and record the correspondence between the features corresponding to these two alignment operations as feature data. For the current curves C1 and D1, the previously recorded feature data can be used to find the peak in the current curve C1 that corresponds to the peak in the current curve D1, thus completing the alignment operation between the current curves C1 and D1. Please refer to... Figure 5B For test curves A2 and B2, the operator can perform two alignment operations from the edge of the trough in test curve B2 to the edge of the corresponding peak in test curve A2, and record the correspondence between the features corresponding to these two alignment operations as feature data. For the current curves C2 and D2, the operator can use the previously recorded feature data to find the peak in the current curve C2 that corresponds to the trough in the current curve D2, thereby completing the alignment operation between the current curves C2 and D2.

[0050] Through the above method, the curve alignment device of this invention can learn from the operator's experience in adjusting the machine data curve and apply it to the feature comparison and automatic alignment of subsequent data curves, thereby quickly and accurately integrating the analysis results of different machines and assisting the operator in observing the correlation between machine data curves.

[0051] It should be noted that, in some embodiments, the curve alignment device of the present invention can also divide the analysis curve into multiple segments according to the shape and distribution of features in the analysis curve and perform the above-mentioned feature comparison and automatic alignment respectively, thereby obtaining better analysis results.

[0052] In detail, Figure 6This is a flowchart illustrating a curve alignment method according to an embodiment of the present invention. Please also refer to... Figure 1 and Figure 6 The method in this embodiment is applicable to Figure 1 The curve alignment device 10 is described below with respect to the various components of the curve alignment device 10. The detailed steps of the curve alignment method of the present invention are described below with respect to the various components of the curve alignment device 10.

[0053] In step S602, the processor 16 of the curve alignment device 10 uses the data capture device 12 to acquire test data obtained by analyzing a test sample from at least one machine 20 and uses it to generate multiple test curves. This step is the same as or similar to step S202 in the aforementioned embodiment, so its details will not be repeated here.

[0054] Unlike the previous embodiments, in this embodiment, in step S604, the processor 16 analyzes multiple features of each test curve and divides these test curves into multiple segments according to the shape and distribution of these features. The features may be, for example, peaks, depressions, or other special shapes in the curve, and are not limited here. The processor 16 may, for example, set multiple consecutive peaks, multiple depressions, or other features in the curve as the same segment and record the alignment operations for different segments for subsequent feature comparison of similar segments.

[0055] In step S606, in response to the alignment operation from a first point around the first curve in the test curve to a second point around the second curve, the processor 16 records the correspondence between the first feature corresponding to the first point and the second feature corresponding to the second point of each alignment operation within each segment as feature data. Specifically, for each segment of the test curve, the processor 16 can record the correspondence of its features based on the operator's alignment operation of the curve within that segment, and use this as feature data for subsequent feature comparison.

[0056] In step S608, the processor 16 uses the data acquisition device 12 to acquire the current data obtained by the machine 20 from analyzing a current sample and uses it to generate multiple current curves. Then, in step S610, multiple features of each current curve are analyzed, and the current curves are divided into multiple segments according to the shape and distribution of these features. The processor 16 may use the same or similar method as in step S504 to distinguish the current curves, or it may use the method previously used to distinguish data curves for the same machine to which the current curve belongs; there is no limitation here.

[0057] In step S612, the processor 16 searches for a third point on the third curve that matches the first feature and a fourth point on the fourth curve that matches the second feature, based on the corresponding relationships in the recorded feature data of each segment, within the selected segments. For example, the processor 16 calculates the feature value of each current curve within each segment, and selects the current curve for alignment within the selected segment based on the magnitude of the calculated feature value.

[0058] In detail, in some cases, the features within certain segments of a curve are not obvious enough to be used for feature comparison. Therefore, a better approach is to observe the correspondence of curve features and use available features (such as peaks, concave areas, or other special shapes) in different segments as the basis for feature comparison. This feature can be used to align the curves in that segment, and this embodiment does not limit its scope.

[0059] In step S614, the processor 16 adjusts at least one of the third and fourth curves within the selected segment so that the third point aligns with the fourth point.

[0060] It should be noted that, in some embodiments, after the processor 16 completes the alignment of curves within each selected segment, it may, for example, re-segment and feature comparison of the current curve, and compare the corresponding features obtained by using different segmentation methods, thereby finding all corresponding features between the current curves and avoiding the omission of corresponding features caused by segmentation errors.

[0061] For example, Figure 7 This is an example of a curve alignment method illustrated according to an embodiment of the present invention. Please refer to... Figure 7In this embodiment, a curve alignment device displays on a display the test curves (including lines A, B, C, D, E, and F) generated by a single instrument or different instruments analyzing the same current sample. The curve alignment device distinguishes segments 62 based on the densely varied A and B lines, segments 64 based on the corresponding undulations of lines C and E, segments 66 based on the three peaks of line C and the three dips of line D, segments 68 based on lines E and F with similar undulation frequencies and amplitudes, and segments 70 based on lines E and F with similar shapes. For the multiple segments 62-70 of the current curve, the curve alignment device achieves alignment by aligning line B with line A in segment 62; by aligning the continuous and alternating peaks and troughs of lines C and E in segment 64; by aligning the three peaks of line C with the three troughs of line D in segment 66; by aligning lines E and F in segment 68; and by aligning lines E and F in segment 70. By utilizing the curves with distinct characteristics in each segment 62-70 for alignment, better alignment results can be obtained.

[0062] In summary, the curve alignment method and device of this invention monitor and record the alignment operations performed by operators on the curves of output data from a single machine or different machines as feature data. This data is then used to compare the features of subsequent output data from the machines, thereby selecting suitable alignment operations to apply to the alignment of the current curve. Thus, this invention can transform the complex adjustment / alignment process into experience-based feedback for the adjustment of the current curve, achieving automatic curve alignment and accurately and quickly integrating the analysis results from different machines.

[0063] Of course, the present invention may have other various embodiments. Without departing from the spirit and essence of the present invention, those skilled in the art can make various corresponding changes and modifications according to the present invention, but these corresponding changes and modifications should all fall within the protection scope of the appended claims.

Claims

1. A curve alignment method, applicable to electronic devices with data capture equipment and processors, characterized in that, The method includes the following steps: The data capture device is used to acquire test data obtained from analyzing a test sample by at least one machine and to generate multiple test curves. In response to the alignment operation from a first point around the first curve in the test curve to a second point around the second curve, the correspondence between the first feature corresponding to the first point and the second feature corresponding to the second point is recorded, and the correspondence of multiple alignment operations is collected as feature data. The data capture device is used to acquire current data obtained from the analysis of a current sample by the instrument and to generate multiple current curves. Based on the corresponding relationships in the recorded feature data, for the third and fourth curves in the current curves, search for a third point on the third curve that matches the first feature and a fourth point on the fourth curve that matches the second feature; and Adjust at least one of the third curve and the fourth curve so that the third point aligns with the fourth point.

2. The method according to claim 1, characterized in that, Including: Analyze multiple features of each test curve, and divide the test curve into multiple segments according to the shape and distribution of the features; and The correspondence between the first feature corresponding to the first point and the second feature corresponding to the second point of each alignment operation within each segment is recorded as the feature data.

3. The method according to claim 2, characterized in that, Including: Analyze multiple features of each current curve, and divide the current curve into multiple segments according to the shape and distribution of the features; and Based on the corresponding relationships in the feature data of each of the recorded segments, for the third curve and the fourth curve located within a selected segment, search for the third point on the third curve that matches the first feature and the fourth point on the fourth curve that matches the second feature; and Adjust at least one of the third curve and the fourth curve within the selected segment so that the third point aligns with the fourth point.

4. The method according to claim 3, characterized in that, Including: For each segment of the current curve, calculate a feature value for the feature in each current curve; and Based on the magnitude of the feature value, the current curve used for alignment within the selected segment is selected.

5. The method according to claim 1, characterized in that, The steps of searching for the third point on the third curve that matches the first feature and the fourth point on the fourth curve that matches the second feature include: The third curve and the fourth curve are compared using a sliding window to find the third point and the fourth point. The feature comparison includes slope comparison, correlation comparison or position comparison.

6. The method according to claim 5, characterized in that, After the step of searching for a third point on the third curve that matches the first feature and a fourth point on the fourth curve that matches the second feature, the method further includes: In response to the confirmation operation for the searched third and fourth points, adjust at least one of the third and fourth curves such that the third point aligns with the fourth point; and The number of records of the correspondence between the first feature and the second feature is accumulated, and the weight of the correspondence used for feature comparison is adjusted based on the accumulated number of records.

7. The method according to claim 1, characterized in that, The step of recording the correspondence between the first feature corresponding to the first point and the second feature corresponding to the second point, and aggregating the correspondence of multiple alignment operations as feature data includes: The number of records for each of the corresponding relationships is accumulated, and the weight of the corresponding relationship used for feature comparison is adjusted based on the accumulated number of records.

8. The method according to claim 1, characterized in that, The step of adjusting at least one of the third curve and the fourth curve so that the third point is aligned with the fourth point includes: The third curve or the fourth curve is scaled proportionally so that the third point aligns with the fourth point.

9. The method according to claim 1, characterized in that, The step of adjusting at least one of the third curve and the fourth curve so that the third point is aligned with the fourth point includes: Define a baseline for adjusting the third curve and the fourth curve, and adjust the third curve or the fourth curve based on the baseline so that the third point is aligned with the fourth point.

10. The method according to claim 1, characterized in that, After adjusting at least one of the third curve and the fourth curve so that the third point aligns with the fourth point, the method further includes: A baseline is defined based on the positions of the aligned third and fourth points, and at least one of the third and fourth curves is adjusted based on the baseline.

11. A curve alignment device, characterized in that, include: Data capture equipment, connected to at least one unit; Storage device; A processor, coupled to the data capture device and the storage device, is configured to: The data capture device is used to acquire test data obtained from the analysis of a test sample by the machine and to generate multiple test curves. In response to an alignment operation from a first point around a first curve in the test curve to a second point around a second curve, the correspondence between a first feature corresponding to the first point and a second feature corresponding to the second point is recorded in the storage device, and the correspondence of multiple alignment operations is collected as feature data. The data capture device is used to acquire current data obtained from the analysis of a current sample by the instrument and to generate multiple current curves. Based on the corresponding relationships recorded in the feature data of the storage device, for the third curve and the fourth curve in the current curve, a third point on the third curve that matches the first feature and a fourth point on the fourth curve that matches the second feature are searched; and Adjust at least one of the third curve and the fourth curve so that the third point aligns with the fourth point.

12. The curve alignment device according to claim 11, characterized in that, The processor includes analyzing multiple features of each test curve, dividing the test curve into multiple segments according to the shape and distribution of the features, and recording the correspondence between the first feature corresponding to the first point of each alignment operation within each segment and the second feature corresponding to the second point as the feature data.

13. The curve alignment device according to claim 12, characterized in that, The processor includes, based on the correspondences in the feature data of each of the recorded segments, searching for a third point on the third curve that matches the first feature and a fourth point on the fourth curve that matches the second feature, for a selected segment of the segments, and adjusting at least one of the third curve and the fourth curve in the selected segment such that the third point aligns with the fourth point.

14. The curve alignment device according to claim 13, characterized in that, The processor includes, for each segment, calculating a feature value of the feature in each current curve, and selecting, based on the magnitude of the feature value, the current curve to be aligned within the selected segment.

15. The curve alignment device of claim 11, wherein, The processor includes using a sliding window to perform feature comparison on the third curve and the fourth curve respectively to search for the third point and the fourth point, wherein the feature comparison includes slope comparison, correlation comparison or position comparison.

16. The curve alignment device of claim 15, wherein, The processor includes, in response to a confirmation operation for the searched third and fourth points, adjusting at least one of the third and fourth curves such that the third point aligns with the fourth point, accumulating the number of records of the correspondence between the first feature and the second feature, and adjusting the weight of the correspondence for feature comparison based on the accumulated number of records.

17. The curve alignment device according to claim 11, characterized in that, The processor includes accumulating the number of records for each of the corresponding relationships and adjusting the weight of the corresponding relationship for the feature comparison based on the accumulated number of records.

18. The curve alignment device according to claim 11, characterized in that, The processor includes scaling the third curve or the fourth curve proportionally such that the third point aligns with the fourth point.

19. The curve alignment device according to claim 11, characterized in that, The processor includes defining a baseline for adjusting the third curve and the fourth curve, adjusting the third curve or the fourth curve based on the baseline, such that the third point aligns with the fourth point.

20. The curve alignment device according to claim 11, characterized in that, The processor includes defining a baseline at the location of the aligned third and fourth points, and using the baseline as a reference to continue adjusting at least one of the third and fourth curves.

Images