An apparatus and method for measuring infrared product smear

Abstract

The application provides a device and method for measuring infrared product afterglow, comprising: a target plate, wherein at least one target hole is arranged on the target plate; a driving mechanism, which is used for driving the target plate to rotate; and a temperature control mechanism, which is arranged on the back side of the target plate, is used for generating infrared radiation, and the generated infrared radiation can pass through the target hole. The device drives the target plate to rotate through the driving mechanism, controls the temperature of the target point of the target plate through the temperature control mechanism, makes the target have a stable infrared wave band, and adjusts the temperature of the target point, so that clear and stable imaging effect is ensured, and the test accuracy of the infrared product afterglow is improved.

Description

Technical Field

[0001] This invention belongs to the field of image processing technology, specifically relating to a device and method for measuring the trailing shadow of infrared products. Background Technology

[0002] Motion trailing refers to the phenomenon where, when an image is displayed as an object moving relative to a stationary background, the moving object leaves a shadow on the background or the background leaves a shadow on the moving object. Motion trailing includes bright motion trailing and dark motion trailing, which in turn include dot motion trailing and line motion trailing. In addition, it can also be classified by direction as vertical motion trailing and horizontal motion trailing.

[0003] Currently, motion blur measurement mainly uses simple animations to simulate its formation, and the severity is determined by visual observation and comparison. This method cannot accurately and effectively determine the degree of motion blur, and therefore cannot accurately judge the image quality of infrared product lenses. Summary of the Invention

[0004] The purpose of this invention is to provide a device for measuring infrared product trailing, which can at least solve some of the defects existing in the prior art.

[0005] To achieve the above objectives, the present invention adopts the following technical solution:

[0006] An apparatus for measuring infrared product ghosting, comprising:

[0007] A target plate, wherein the target plate is provided with at least one target hole;

[0008] A drive mechanism is used to drive the target plate to rotate;

[0009] A temperature control mechanism is located on the back side of the target plate to generate infrared radiation, and the infrared radiation it generates can pass through the target hole.

[0010] Furthermore, the temperature control mechanism includes a temperature control plate connected to the movable end of the drive mechanism, the target plate is mounted on the temperature control plate, and a temperature control module capable of generating infrared radiation is provided on the temperature control plate corresponding to the target hole position of the target plate.

[0011] Furthermore, a heat insulation plate is provided between the temperature control plate and the target plate, and the heat insulation plate is provided with a through hole corresponding to the target hole position of the target plate for the infrared rays generated by the temperature control module to pass through.

[0012] Furthermore, a heat insulation pad is provided between the temperature control plate and the heat insulation plate.

[0013] Furthermore, the temperature control mechanism also includes a water-collecting component for collecting dew on the surface of the low-temperature temperature control module.

[0014] Furthermore, the water receiving assembly includes a fixed base, an annular groove, and a cover plate. The annular groove is installed on the fixed base, the temperature control plate is placed inside the annular groove, and the cover plate covers the annular groove.

[0015] Furthermore, the temperature control plate is made of a water-circulating aluminum plate, and a water-cooling circulation component is connected to the water-circulating aluminum plate.

[0016] Furthermore, the drive mechanism includes a servo motor and a hollow electrically controlled rotary table. The hollow electrically controlled rotary table is connected to the movable end of the servo motor. A perforated disc is mounted on the hollow electrically controlled rotary table, and the perforated disc is connected to the temperature control plate through multiple guide rods.

[0017] Furthermore, the target plate has a small circular hole at its center for target alignment. The target hole on the target plate consists of a four-bar target group and a trailing measurement hole respectively located on both sides of the small circular hole. The four-bar target group includes two four-bar targets respectively along the meridional direction and along the sagittal direction.

[0018] In addition, the present invention also provides a method for measuring infrared product trailing using the above-mentioned device, comprising the following steps:

[0019] The temperature control mechanism generates infrared rays according to the set temperature, and the generated infrared rays pass through the target hole of the target plate. At the same time, the drive mechanism drives the target plate to rotate, and the infrared product under test takes a picture of the target plate. The picture forms a pattern on the target plate corresponding to the shape of the target hole. The amount of deformation of the pattern in the picture is used to calculate the ghosting produced by the infrared product.

[0020] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0021] (1) The device for measuring infrared product trailing provided by the present invention drives the target plate to rotate through the drive mechanism, and controls the target point temperature of the target plate through the temperature control mechanism, so that the target has a stable infrared band and the target point temperature is adjustable, ensuring a clear and stable imaging effect, thereby improving the testing accuracy of infrared product trailing.

[0022] (2) The device for measuring the trailing image of infrared products provided by the present invention ensures the stability of the target point temperature of the target plate by setting a water-cooling circulation component, thereby ensuring a clear and stable imaging effect and avoiding the impact of target plate temperature fluctuations on the testing accuracy of infrared products.

[0023] The present invention will now be described in further detail with reference to the accompanying drawings. Attached Figure Description

[0024] Figure 1 This is a schematic diagram of the device structure for measuring infrared product trailing images according to the present invention;

[0025] Figure 2 This is a first-view exploded view of the device for measuring infrared product trailing images according to the present invention;

[0026] Figure 3 This is a second-view exploded view of the device for measuring infrared product trailing images according to the present invention;

[0027] Figure 4 This is a schematic diagram of the target plate in this invention;

[0028] Figure 5 This is a cross-sectional view of the water-cooled circulation component in this invention;

[0029] Figure 6 This is a temperature control circuit diagram for the heating block in this invention;

[0030] Figure 7 This is a schematic diagram of the front structure of the device for measuring infrared product trailing images of the present invention, placed inside an electrical control cabinet.

[0031] Figure 8 This is a schematic diagram of the back structure of the device for measuring infrared product trailing images of the present invention, which is placed inside the electrical control cabinet.

[0032] Explanation of reference numerals in the attached drawings: 1. Target plate; 2. Temperature control mechanism; 3. Drive mechanism; 4. Heat insulation plate; 5. Heat insulation pad; 6. Heating block; 7. Semiconductor cooler; 8. Cover plate; 9. Temperature control plate; 10. Annular groove; 11. Guide rod; 12. Perforated disc; 13. Hollow electrically controlled rotary table; 14. Servo motor; 15. Mounting support; 16. Pneumatic / hydraulic-electric integrated slip ring; 17. Fixed seat; 18. Rolling bearing; 19. Square groove; 20. Annular baffle; 21. Four-bar target; 22. Small round hole; 23. Large round hole; 24. Water inlet pipe; 25. Conduit; 26. Water circulation channel; 27. Water outlet pipe; 28. Slip ring mounting cover; 29. ​​Dual-channel temperature control module; 30. Electrical control cabinet; 31. Frosted acrylic sheet; 32. Operation panel; 33. Electrical cabinet box. Detailed Implementation

[0033] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0034] In the description of this invention, it should be understood that the terms "center", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.

[0035] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation", "connection", and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, an abutting connection, or an integral connection. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0036] The terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature; in the description of this invention, unless otherwise stated, "a plurality of" means two or more.

[0037] like Figure 1 , Figure 2 and Figure 3 As shown, this embodiment provides a device for measuring the trailing shadow of an infrared product, including a target plate 1, a driving mechanism 3, and a temperature control mechanism 2. The driving mechanism 3 drives the target plate 1 to rotate. The target plate 1 has at least one target hole. The temperature control mechanism 2 is located on the back side of the target plate 1 and generates infrared radiation, which passes through the target hole. When measuring the trailing shadow of the infrared product under test, the temperature control mechanism 2 heats up to generate infrared radiation according to a set temperature, and the generated infrared radiation passes through the target hole of the target plate 1. At the same time, the driving mechanism 3 drives the target plate 1 to rotate, and the infrared product under test takes a picture of the target plate 1. The picture forms a pattern on the target plate 1 corresponding to the shape of the target hole. The trailing shadow generated by the infrared product can be calculated by using the deformation of the pattern in the picture. The device for measuring infrared product trailing provided in this embodiment drives the target plate 1 to rotate through the drive mechanism 3, and controls the target point temperature of the target plate 1 through the temperature control mechanism 2, so that the target has a stable infrared band, ensuring a clear and stable imaging effect, thereby improving the testing accuracy of infrared product trailing.

[0038] As one specific implementation method, such as Figure 4As shown, the target plate 1 can be made of, but is not limited to, AL6061 material, with a recognizable pattern processed in the center. A small circular hole 22 is located in the center of the target plate 1 to facilitate alignment of the lens of the infrared product under test with the target center. Target holes are located on the left and right sides of the center of the target plate 1, with different shapes to serve as recognizable patterns, corresponding to the temperature target holes of the two target points respectively. Specifically, the target hole on the left side of the center of the target plate 1 is designed as a four-bar target group for observing the clarity of the pattern. The four-bar target group includes two four-bar targets 21, each with a length:width = 14mm:2mm. One four-bar target 21 is along the meridional direction, and the other is along the sagittal direction. The target hole on the right side of the center of the target plate 1 is designed as a trailing image measurement hole. This trailing image measurement hole can be, but is not limited to, a large circular hole 23, for testing the trailing image of the infrared product. Ideally, the four-bar targets 21, the small circular hole 22, and the trailing image measurement hole on the target plate 1 are arranged in a straight line to improve measurement accuracy.

[0039] As one specific implementation method, such as Figure 2 and Figure 3 As shown, the temperature control mechanism 2 includes a temperature control plate 9, which is connected to the movable end of the drive mechanism 3. The target plate 1 is mounted on the temperature control plate 9, and a temperature control module is provided on the temperature control plate 9 corresponding to the target hole position of the target plate 1. Optionally, in this embodiment, the temperature control module uses a heating block 6 and a semiconductor cooler 7, with the heating block 6 located between the semiconductor cooler 7 and the target hole. Specifically, a square groove 19 is machined on the temperature control plate 9 for mounting the semiconductor cooler 7. The semiconductor cooler 7 heats or cools the heating block 6. The heating block 6 is mounted on the semiconductor cooler 7, and the temperature of the heating block 6 radiates to the corresponding target hole on the target plate 1, thereby obtaining an infrared target with the target shape (i.e., the shape of the target hole).

[0040] Specifically, in this embodiment, the target plate 1 is provided with two target holes, and correspondingly, two heating blocks 6 and two semiconductor coolers 7 are provided, such as... Figure 6As shown, target hole 1 corresponds to heating block 1 and semiconductor cooler 1. The semiconductor cooler 1 wire is connected to one of the temperature control channels of the dual-channel temperature control module 29. Target hole 2 corresponds to heating block 2 and semiconductor cooler 2. The semiconductor cooler 2 wire is connected to the other temperature control channel of the dual-channel temperature control module 29. Then, the dual-channel temperature control module 29 is connected to the host computer serial port. Thus, the target point temperature of the two target holes can be adjusted within a set temperature range according to actual testing requirements. In this embodiment, the set temperature range is adjustable from 0℃ to 70℃. The two target point temperatures can be set to be the same or different according to actual testing requirements. Preferably, since the shapes of the two target holes on the left and right sides of the target plate 1 in this embodiment are square and circular, respectively, the surfaces of the two heating blocks 6 are designed as square and circular surfaces, respectively, corresponding to the shapes of the two target holes on the target plate 1.

[0041] To prevent the temperature of the heating block 6 from directly radiating onto the target plate 1, a heat insulation plate 4 is provided between the temperature control plate 9 and the target plate 1 for heat insulation. Specifically, the heat insulation plate 4 can be, but is not limited to, a mica plate. The heat insulation plate 4 has through holes corresponding to the target hole positions of the target plate 1, allowing the temperature radiation from the heating block 6 to pass through. The temperature radiation from the heating block 6 is transmitted to the corresponding target hole on the target plate 1 through the through holes on the heat insulation plate 4. The rest of the heat insulation plate 4 isolates the temperature radiation from the heating block 6 from reaching the target plate 1. As a result, only the target hole positions on the target plate 1 generate infrared rays of a stable wavelength. When the infrared product lens under test takes a picture of the target plate, a pattern corresponding to the target hole shape is formed in the picture.

[0042] Furthermore, since the surface of the heating block 6 protrudes from the surface of the temperature control plate 9 when it is installed on the semiconductor cooler 7, the heat insulation plate 4 and the temperature control plate 9 cannot be installed flatly and closely. Therefore, in this embodiment, a heat insulation pad 5 is installed between the temperature control plate 9 and the heat insulation plate 4 to support and control the distance between the heating block 6 and the heat insulation plate 4, ensuring the installation stability of the heat insulation plate 4 and the target plate 1. Specifically, in this embodiment, the heat insulation pad 5 adopts an I-shaped structure, with two heating blocks 6 respectively arranged on both sides of the I-shaped heat insulation pad 5. The thickness of the heat insulation pad 5 is equal to or slightly greater than the thickness of the heating block 6 protruding from the surface of the temperature control plate 9. During installation, the heat insulation pad 5 is fixed tightly against the surface of the temperature control plate 9, and the heat insulation plate 4 is fixed tightly against the heat insulation pad 5. This structural form of the heat insulation pad 5 can both support the heat insulation plate 4 and not affect the temperature radiation of the heating block 6.

[0043] Furthermore, since thermal grease is applied during the installation of the semiconductor cooler 7 for heat conduction, and in order to prevent the thermal grease from overflowing during the target rotation, it is preferable to provide annular baffles 20 around the semiconductor cooler 7.

[0044] Because condensation easily forms on the surface of the heating block 6 at low temperatures, the dew will overflow outside the target plate 1 during rotation. Therefore, the temperature control mechanism 2 further includes a water-collecting component for catching the dew on the surface of the low-temperature heating block 6. In one specific embodiment, the water-collecting component includes a fixed base 17, an annular groove 10, and a cover plate 8. The annular groove 10 is mounted on the fixed base 17, the temperature control plate 9 is placed inside the annular groove 10, and the cover plate 8 covers the annular groove 10. This structural design of the water-collecting component utilizes the annular groove 10 to collect the overflowing dew, thereby preventing it from overflowing. Furthermore, two rolling bearings 18 can be provided inside the annular groove 10, respectively installed on the left and right sides below the temperature control plate 9, to support the rotating target.

[0045] As an optimized implementation, the temperature control plate 9 is made of a water-circulating aluminum plate, and a water-cooling circulation component is connected to the water-circulating aluminum plate. The water-cooling circulation component enables the water-circulating aluminum plate to exchange heat with the heating block 6, thereby ensuring that the temperature set for the heating block 6 remains stable and preventing fluctuations in the surface temperature of the heating block 6 over a long period of time during operation, which would affect the test accuracy.

[0046] One specific implementation method, such as Figure 5 As shown, the water-cooled circulation assembly includes a chiller and an integrated gas / liquid-electric slip ring 16. The stator end of the integrated gas / liquid-electric slip ring 16 is fixed to the mounting bracket 15 via a slip ring mounting cover 28. The mover end of the integrated gas / liquid-electric slip ring 16 is connected to the water circulation aluminum plate via a connecting shaft and rotates at a uniform speed with the water circulation aluminum plate. The water circulation aluminum plate has two threaded holes, and the interior of the water circulation aluminum plate has a water circulation channel 26 connecting the two threaded holes. The stator end water inlet of the integrated gas / liquid-electric slip ring 16 is connected to the outlet of the chiller via an inlet pipe 24. The stator end water outlet of the integrated gas / liquid-electric slip ring 16 is connected to the inlet of the chiller via an outlet pipe 27. The mover end water inlet and mover end water outlet of the integrated gas / liquid-electric slip ring 16 are respectively connected to the two threaded holes of the water circulation aluminum plate via conduits 25. During operation, the liquid in the chiller flows from the chiller outlet through the inlet pipe 24 into the gas / liquid-electric integrated slip ring 16. The liquid circulates from the stator end inlet of the gas / liquid-electric integrated slip ring 16 to the mover end outlet, then flows through the conduit 25 into the toothed hole of the water circulation aluminum plate, flows through the water circulation channel 26 inside the water circulation aluminum plate to another toothed hole, and then circulates from the mover end inlet of the gas / liquid-electric integrated slip ring 16 to the stator end outlet, flows out through the outlet pipe 27, and returns to the chiller, thus realizing liquid circulation. Through this structural design, there is always circulating liquid in the water circulation aluminum plate to exchange heat with the heating block 6, ensuring that the surface temperature of the heating block 6 is always uniform, thereby ensuring the testing accuracy of the infrared product being tested.

[0047] In one specific embodiment, the drive mechanism 3 includes a servo motor 14 and a hollow electrically controlled rotary table 13. The servo motor 14 provides power, and the hollow electrically controlled rotary table 13 is connected to the movable end of the servo motor 14. The servo motor 14 drives the hollow electrically controlled rotary table 13 to rotate at a constant speed. A perforated disc 12 is installed on the hollow electrically controlled rotary table 13. The perforated disc 12 is connected to the temperature control plate 9 through multiple guide rods 11, thereby driving the temperature control plate 9 to rotate at a constant speed. The target plate 1 is fixed on the temperature control plate 9, and thus the target plate 1 rotates at a constant speed together with the hollow electrically controlled rotary table 13. The rotation speed of the target plate 1 can be adjusted and set according to actual needs.

[0048] Preferred, such as Figure 2 As shown, the perforated disk has several holes evenly spaced along its circumference to reduce its weight and ensure its rotational stability. Similarly, symmetrically arranged holes can also be formed on the surface of the temperature control plate to reduce its weight and ensure its rotational stability; for example, in this embodiment, two rectangular holes are symmetrically formed on the top and bottom of the temperature control plate surface, and two circular holes are symmetrically formed between the two square grooves 19.

[0049] like Figure 7 and Figure 8 As shown, the aforementioned device for measuring the ghosting of infrared products also includes an electrical control cabinet 30, in which the target plate 1, drive mechanism 3, and temperature control mechanism 2 are all housed. Specifically, the main frame of the electrical control cabinet 30 is constructed from 40×40mm aluminum profiles and 1.5mm sheet metal, and consists of upper and lower layers. The target plate 1, drive mechanism 3, and temperature control mechanism 2 are installed at the front end of the upper layer, and a frosted acrylic plate 31 is installed on the front surface of the upper layer to partially cover the target plate 1, providing a uniform test surface for the lens assembly of the infrared product under test to combine with the algorithm to determine the image quality. An operation panel 32 is provided on the side of the upper layer, which houses a touch screen, push-button switches, etc. An electrical cabinet box 33 is installed at the rear end of the upper layer to house electrical components. A chiller is placed in the lower layer of the electrical control cabinet 30.

[0050] In this embodiment, the infrared product under test takes pictures and records videos of the target plate 1. The target plate has a distinguishable pattern (i.e., the shape of the target hole). The rotation angle of the target plate 1 in a single frame is obtained by the change of the angle and position of the pattern. Combined with the known preset angular velocity of the target plate 1, the exposure time of the infrared product under test can be calculated. The infrared product under test records videos of the target plate 1. The frame rate of the infrared product under test can be calculated by using the rotation angle between corresponding points of two adjacent frames in the video and the preset angular velocity. The length of the trailing image produced by the infrared product under test is calculated by the amount of deformation of the pattern in the photos taken by the infrared product under test of the target plate 1. By combining the exposure time, frame rate and trailing image length of the infrared product under test, the image quality of the lens imaging of the infrared product under test can be determined.

[0051] The above examples are merely illustrative of the present invention and do not constitute a limitation on the scope of protection of the present invention. All designs that are the same as or similar to the present invention are within the scope of protection of the present invention.

Claims

1. A device for measuring infrared product ghosting, characterized in that, include: The target plate has a small circular hole for target alignment and two target holes with recognizable patterns. The two target holes are used to observe the clarity of the pattern and measure the ghosting, respectively. A drive mechanism is used to drive the target plate to rotate; A temperature control mechanism is located on the back side of the target plate and is used to generate infrared radiation, which can pass through the target holes. The temperature control mechanism includes a temperature control plate connected to the movable end of the drive mechanism. The target plate is mounted on the temperature control plate. The temperature control plate is provided with temperature control modules for independently controlling the target point temperature of the two target holes corresponding to the two target holes of the target plate. The temperature control plate is made of a water-circulating aluminum plate, and a water-cooling circulation component is connected to the water-circulating aluminum plate.

2. The apparatus for measuring infrared product trailing as described in claim 1, characterized in that: A heat insulation plate is provided between the temperature control plate and the target plate, and a through hole is provided on the heat insulation plate at the position corresponding to the target hole of the target plate to allow infrared radiation generated by the temperature control module to pass through.

3. The apparatus for measuring infrared product ghosting as described in claim 2, characterized in that: A heat insulation pad is provided between the temperature control plate and the heat insulation plate.

4. The apparatus for measuring infrared product trailing as described in claim 1, characterized in that: The temperature control mechanism also includes a water-collecting component for collecting dew from the surface of the low-temperature temperature control module.

5. The apparatus for measuring infrared product trailing as described in claim 4, characterized in that: The water receiving assembly includes a fixed base, an annular groove, and a cover plate. The annular groove is installed on the fixed base, the temperature control plate is placed inside the annular groove, and the cover plate covers the annular groove.

6. The apparatus for measuring infrared product trailing as described in claim 1, characterized in that: The drive mechanism includes a servo motor and a hollow electrically controlled rotary table. The hollow electrically controlled rotary table is connected to the movable end of the servo motor. A perforated disc is mounted on the hollow electrically controlled rotary table, and the perforated disc is connected to the temperature control plate through multiple guide rods.

7. The apparatus for measuring infrared product trailing as described in claim 1, characterized in that: The target holes on the target plate used for observing pattern clarity are a four-bar target group, which includes two four-bar targets along the meridional direction and the sagittal direction, respectively.

8. A method for measuring infrared product ghosting using the apparatus according to any one of claims 1-7, characterized in that, The process includes the following: The temperature control mechanism generates infrared radiation by heating up at the set temperature. The infrared radiation passes through the target hole of the target plate. At the same time, the drive mechanism drives the target plate to rotate. The infrared product being tested takes a picture of the target plate. The picture forms a pattern on the target plate corresponding to the shape of the target hole. The amount of deformation of the pattern in the picture is used to calculate the ghosting produced by the infrared product.

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