An automatic test and calibration tooling and method for formation and capacitance testing equipment

Abstract

The present invention provides an automatic test and calibration tooling and method for a formation and grading equipment in the technical field of formation and grading. The tooling includes a single-chip microcomputer, a DAC output module, a power transfer module, a power supply module, a voltage and current sampling module, a signal switch module, a copper bar and a communication module; the copper bar, the signal switch module, the single-chip microcomputer, the DAC output module, the power transfer module, the power supply module and the voltage and current sampling module are connected in sequence; one end of the voltage and current sampling module is connected to the single-chip microcomputer, and the other end is connected to the signal switch module; the single-chip microcomputer is respectively connected to the communication module and the power transfer module. The advantages of the present invention are: greatly improving the efficiency and reliability of the test and calibration of the formation and grading equipment.

Description

Technical Field

[0001] The present invention relates to the technical field of formation and grading, and particularly to an automatic test and calibration tooling and method for formation and grading equipment. Background Art

[0002] The formation and grading equipment of lithium batteries is composed of various precision devices. The reliability of each device is crucial for the performance of the whole machine. Among them, the line sequence connection and the accuracy standard of voltage and current are the keys affecting whether the lithium battery can be normally activated. If there is a loose connection in the circuit of the formation and grading equipment, it will block the flow of electrons in the circuit, resulting in too large impedance at the connection, generating a large amount of heat, burning the connection terminals, melting the insulation layer of the circuit, and even causing a fire; whether the line sequence of the sampling circuit is correct is also directly related to whether the formation and grading equipment can work properly and whether it can produce qualified battery cores, so as to avoid a large amount of economic losses; at the same time, the accuracy level of the formation and grading equipment also determines the quality level of the produced battery cores. The higher the accuracy, the better the equipment effect. Therefore, there is a need to test and calibrate the line sequence and accuracy of the formation and grading equipment.

[0003] For the test and calibration of the line sequence and accuracy of the formation and grading equipment, traditionally, staff carry instruments into the cabinet of the formation and grading equipment, and through additional wiring, rely on eyesight and feel to check the correctness of the connection of the connecting screws. When calibrating the accuracy, it is necessary to constantly change the wiring of the instrument and then read and calibrate through the naked eye. There are the following disadvantages: staff are prone to fatigue after long-term work, the error rate is greatly increased, and it is easy to make mistakes in repetitive work. Not only the labor cost is high, but also the efficiency is low, making the reliability of the formation and grading equipment unable to be guaranteed, and restricting the production capacity and quality of the formation and grading equipment.

[0004] Therefore, how to provide an automatic test and calibration tooling and method for formation and grading equipment to improve the efficiency and reliability of the test and calibration of the formation and grading equipment has become an urgent technical problem to be solved. Summary of the Invention

[0005] The technical problem to be solved by the present invention is to provide an automatic test and calibration tooling and method for formation and grading equipment to improve the efficiency and reliability of the test and calibration of the formation and grading equipment.

[0006] In a first aspect, the present invention provides an automatic test and calibration tooling for formation and grading equipment, including a single-chip microcomputer, a DAC output module, a power transfer module, a power supply module, a voltage and current sampling module, a signal switch module, a busbar, and a communication module;

[0007] The busbar, the signal switch module, the single-chip microcomputer, the DAC output module, the power transfer module, the power supply module, and the voltage and current sampling module are connected in sequence;

[0008] One end of the voltage and current sampling module is connected to the single-chip microcomputer, and the other end is connected to the signal switch module; the single-chip microcomputer is respectively connected to the communication module and the power transfer module.

[0009] Further, the model of the single-chip microcomputer is STM32F429ZGT6LQFP-144.

[0010] Further, the DAC output module includes an operational amplifier U6A, an operational amplifier U6B, a resistor R108, a resistor R109, a resistor R110, a resistor R111, a resistor R112, a capacitor C27, a capacitor C28, and a diode D19;

[0011] One end of the resistor R108 is connected to the single-chip microcomputer, and the other end is connected to pin 3 of the operational amplifier U6A; pin 1 of the operational amplifier U6A is connected to the resistor R110 and the resistor R112, pin 2 is connected to the resistor R111 and the resistor R112, and pin 8 is connected to the capacitor C27;

[0012] Pin 5 of the operational amplifier U6B is connected to the resistor R110, and pins 6 and 7 are connected to the resistor R109; after the capacitor C28 is connected in parallel with the diode D19, the input end of the diode D19 is grounded, and the output end is connected to the power transfer module.

[0013] Further, the model of the power supply module is RSP-1500-5.

[0014] Further, the model of the voltage and current sampling module is 34461A.

[0015] Further, the signal switch module includes a MOS transistor Q1, a MOS transistor Q2, a MOS transistor Q3, a MOS transistor Q4, a MOS transistor Q5, a MOS transistor Q6, a MOS transistor Q7, a MOS transistor Q8, a MOS transistor Q9, a MOS transistor Q10, a MOS transistor Q11, a MOS transistor Q12, a terminal block J3, and a terminal block J4;

[0016] The G poles of the MOS transistors Q1, Q2, Q3, Q4, Q5, Q6, Q7, Q8, Q9, Q10, Q11, and Q12 are all connected to the single-chip microcomputer;

[0017] The pins 1, 2, 3, 4, 5, and 6 of the terminal block J3 are connected to the D poles of the MOS transistors Q1, Q2, Q3, Q4, Q5, Q6 and a copper bar; the pins 1, 2, 3, 4, 5, and 6 of the terminal block J4 are connected to the D poles of the MOS transistors Q7, Q8, Q9, Q10, Q11, Q12 and a copper bar;

[0018] The S poles of the MOS transistors Q1, Q2, Q3, Q4, Q5, Q6, Q7, Q8, Q9, Q10, Q11, and Q12 are connected to each other and grounded.

[0019] Further, the MOS transistors Q1, Q2, Q3, Q4, Q5, Q6, Q7, Q8, Q9, Q10, Q11, and Q12 are all NMOS transistors.

[0020] In a second aspect, the present invention provides an automatic test and calibration method for a formation and grading equipment, including the following steps:

[0021] Step S10: Place the test and calibration tooling in the storage location of the formation and grading equipment, and connect the copper bar to the test channel to be tested and calibrated on the formation and grading equipment;

[0022] Step S20: The single-chip microcomputer controls the test and calibration tooling to test the wire sequence of the formation and grading equipment;

[0023] Step S30: The single-chip microcomputer controls the test and calibration tooling to calibrate the accuracy of the formation and grading equipment;

[0024] Step S40: The single-chip microcomputer generates a test and calibration report on the wire sequence and accuracy, encrypts the test and calibration report using the national cryptographic algorithm, and uploads it to the server through the communication module.

[0025] Further, the step S20 specifically includes:

[0026] Step S21: Disconnect the pin bed of the formation and grading equipment, apply a fixed value voltage to each battery cell one by one, apply a voltage to the battery cell tab based on the first tab voltage load value, and collect the first battery cell voltage value, the first battery cell current value, and the first tab voltage value;

[0027] Step S22: Determine whether the first tab voltage value is 0. If so, generate an alarm for the disconnection of the battery cell sampling line; if not, proceed to step S23;

[0028] Step S23: Subtract the first tab voltage value from the first tab voltage loading value to obtain the first tab voltage error value, and based on a preset first threshold, second threshold, and third threshold, verify the first cell voltage value, the first cell current value, and the first tab voltage error value;

[0029] Step S24: Press the pin bed of the formation and grading equipment. The test calibration tooling outputs a reference voltage to the power transfer module through the DAC output module, performs switch switching through the switch signal module, and acquires the second cell voltage value, the second tab voltage value, and the tooling reference voltage;

[0030] Calculate the first cell voltage error value based on the second cell voltage value and the tooling reference voltage, calculate the second cell voltage error value based on the second tab voltage value and the tooling reference voltage, and based on a preset fourth threshold and fifth threshold, verify the first cell voltage error value and the second cell voltage error value;

[0031] Step S25: Load voltage on the cells one by one based on the cell voltage loading value, load voltage on the cell tabs based on the second tab voltage loading value, and acquire the third cell voltage value, the third cell current value, and the third tab voltage value;

[0032] Calculate the third cell voltage error value based on the cell voltage loading value and the third cell voltage value; calculate the second tab voltage error value based on the second tab voltage loading value and the third tab voltage value; based on a preset sixth threshold and seventh threshold, verify the third cell voltage error value and the second tab voltage error value.

[0033] Further, in the step S30, the precision calibration includes cell voltage calibration, cell charging current calibration, and cell discharging current calibration.

[0034] The advantages of the present invention are:

[0035] By setting a single-chip microcomputer, a DAC output module, a power transfer module, a power supply module, a voltage and current sampling module, a signal switch module, a busbar, and a communication module; the busbar, the signal switch module, the single-chip microcomputer, the DAC output module, the power transfer module, the power supply module, and the voltage and current sampling module are connected in sequence; one end of the voltage and current sampling module is connected to the single-chip microcomputer, and the other end is connected to the signal switch module; the single-chip microcomputer is respectively connected to the communication module and the power transfer module. The single-chip microcomputer converts digital signals into analog signals through the DAC output module, controls the power supply module to output a reference voltage to the voltage and current sampling module through the power transfer module, switches the test channel through the signal switch module, collects voltage values and current values through the voltage and current sampling module for line sequence testing and accuracy calibration, and uploads the test calibration report to the server through the communication module, that is, replaces the traditional manual operation with the automatic test calibration of the test calibration tooling, thereby greatly improving the efficiency and reliability of the charge and discharge equipment test calibration. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] The present invention will be further described below with reference to the accompanying drawings in conjunction with embodiments.

[0037] Figure 1 It is a circuit principle block diagram of an automatic test calibration tooling for a charge and discharge device of the present invention.

[0038] Figure 2 It is a circuit diagram of the DAC output module of the present invention.

[0039] Figure 3 It is a circuit diagram of the signal switch module of the present invention.

[0040] Figure 4 It is a flowchart of an automatic test calibration method for a charge and discharge device of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0041] The overall idea of the technical solution in the embodiments of the present application is as follows: through the loop inside the test calibration tooling and the switch control of the signal switch module, the probes at the library positions of the charge and discharge device obtain the required voltage and current, and then line sequence testing and accuracy calibration are carried out.

[0042] Please refer to Figures 1 to 4 As shown, a preferred embodiment of an automatic test calibration tooling for a charge and discharge device of the present invention includes a single-chip microcomputer, a DAC output module, a power transfer module, a power supply module, a voltage and current sampling module, a signal switch module, a busbar, and a communication module;

[0043] The busbar, the signal switch module, the single-chip microcomputer, the DAC output module, the power transfer module, the power supply module, and the voltage and current sampling module are connected in sequence;

[0044] One end of the voltage and current sampling module is connected to the single-chip microcomputer, and the other end is connected to the signal switch module; the single-chip microcomputer is respectively connected to the communication module and the power transfer module.

[0045] The power transfer module consists of MOS transistors to form a charging circuit and a discharging circuit. The corresponding circuit is controlled by the single-chip microcomputer. A power circuit is formed with the chemical component capacitance equipment to be tested using a power line to ensure the stable appearance of voltage / current and guarantee the calibration environment; the copper bar is used to simulate the positive and negative electrodes of the battery, provide a calibration path, and contact the contacts of the chemical component capacitance equipment to be tested; through the cooperation of the power transfer module and the signal switch module, the test and calibration requirements of multiple channels can be met.

[0046] The model of the single-chip microcomputer is STM32F429ZGT6LQFP-144, which is an ARM 32-bit Cortex-M4 CPU with an FPU, an adaptive real-time accelerator (ART accelerator) that realizes zero-wait state operation performance in the Flash memory, with a main frequency of up to 180 MHz. The MPU can achieve a performance of 225 DMIPS / 1.25 DMIPS / MHz, has a DSP instruction set, and has two 12-bit buffered DAC channels that can be used to convert two digital signals into two analog voltage signals for output.

[0047] The DAC output module includes an operational amplifier U6A, an operational amplifier U6B, a resistor R108, a resistor R109, a resistor R110, a resistor R111, a resistor R112, a capacitor C27, a capacitor C28, and a diode D19; the models of the operational amplifier U6A and the operational amplifier U6B are preferably TLV2316IDR;

[0048] One end of the resistor R108 is connected to the single-chip microcomputer, and the other end is connected to pin 3 of the operational amplifier U6A; pin 1 of the operational amplifier U6A is connected to the resistor R110 and the resistor R112, pin 2 is connected to the resistor R111 and the resistor R112, and pin 8 is connected to the capacitor C27;

[0049] Pin 5 of the operational amplifier U6B is connected to the resistor R110, and pins 6 and 7 are connected to the resistor R109; after the capacitor C28 and the diode D19 are connected in parallel, the input end of the diode D19 is grounded, and the output end is connected to the power transfer module.

[0050] The DAC output module uses the 12-bit buffered DAC channel built in the single-chip microcomputer to convert digital signals into analog signals for output, and performs amplification with a double gain through the rail-to-rail dual operational amplifier TLV2316IDR, and can output a maximum voltage of 5V for testing and calibration.

[0051] The model of the power supply module is RSP-1500-5, which can output a current of 0 to 240 A to meet the calibration of the maximum range of the equipment.

[0052] The model of the voltage and current sampling module is 34461A, with a resolution of six and a half digits and a basic DCV accuracy of 35 ppm. It can ensure that the accuracy of the tooling is much greater than that of the equipment and has a Lan interface to directly communicate with the host computer to obtain data.

[0053] The signal switch module includes a MOS transistor Q1, a MOS transistor Q2, a MOS transistor Q3, a MOS transistor Q4, a MOS transistor Q5, a MOS transistor Q6, a MOS transistor Q7, a MOS transistor Q8, a MOS transistor Q9, a MOS transistor Q10, a MOS transistor Q11, a MOS transistor Q12, a terminal block J3, and a terminal block J4;

[0054] The G poles of the MOS transistors Q1, Q2, Q3, Q4, Q5, Q6, Q7, Q8, Q9, Q10, Q11, and Q12 are all connected to the single-chip microcomputer;

[0055] The pins 1, 2, 3, 4, 5, and 6 of the terminal block J3 are connected to the D poles of the MOS transistors Q1, Q2, Q3, Q4, Q5, and Q6 and the copper bar; the pins 1, 2, 3, 4, 5, and 6 of the terminal block J4 are connected to the D poles of the MOS transistors Q7, Q8, Q9, Q10, Q11, and Q12 and the copper bar;

[0056] The S poles of the MOS transistors Q1, Q2, Q3, Q4, Q5, Q6, Q7, Q8, Q9, Q10, Q11, and Q12 are connected to each other and grounded.

[0057] The MOS transistors Q1, Q2, Q3, Q4, Q5, Q6, Q7, Q8, Q9, Q10, Q11, and Q12 are all NMOS transistors.

[0058] The signal switch module turns on the MOS transistor based on a high level and can pass a current of 200 A.

[0059] The communication module is an Ethernet module, preferably with the model LAN8720, which supports communication with the Ethernet MAC through the RMII interface and supports 10 Mbps and 100 Mbps.

[0060] A preferred embodiment of the automatic test and calibration method for a formation and grading equipment of the present invention includes the following steps:

[0061] Step S10: Place the test and calibration tooling in the storage location of the formation and grading equipment, and connect the copper busbar to the test channels of the formation and grading equipment to be tested and calibrated.

[0062] Step S20: The single-chip microcomputer controls the test and calibration tooling to test the wire sequence of the formation and grading equipment.

[0063] Step S30: The single-chip microcomputer controls the test and calibration tooling to calibrate the accuracy of the formation and grading equipment.

[0064] Step S40: The single-chip microcomputer generates a test and calibration report on the wire sequence and accuracy. After encrypting the test and calibration report using the national cryptographic algorithm, it is uploaded to the server through the communication module.

[0065] The specific steps of step S20 include:

[0066] Step S21: Disconnect the pin bed of the formation and grading equipment, apply a fixed voltage to each cell one by one, apply a voltage to the cell tab based on the first tab voltage load value, and collect the first cell voltage value, the first cell current value, and the first tab voltage value.

[0067] Step S22: Determine whether the first tab voltage value is 0. If it is, generate an alarm for the disconnection of the cell sampling line; if not, proceed to step S23.

[0068] Step S23: Subtract the first tab voltage value from the first tab voltage load value to obtain the first tab voltage error value. Based on the preset first threshold, second threshold, and third threshold, verify the first cell voltage value, the first cell current value, and the first tab voltage error value.

[0069] Step S24: Press the pin bed of the formation and grading equipment. The test and calibration tooling outputs a reference voltage to the power transfer module through the DAC output module, performs switch switching through the switch signal module, and collects the second cell voltage value, the second tab voltage value, and the tooling reference voltage.

[0070] Calculate the first cell voltage error value based on the second cell voltage value and the tooling reference voltage, calculate the second cell voltage error value based on the second tab voltage value and the tooling reference voltage, and verify the first cell voltage error value and the second cell voltage error value based on the preset fourth threshold and fifth threshold.

[0071] Step S25: Apply voltages to the battery cells one by one based on the battery cell voltage loading values, apply voltages to the battery cell tabs based on the second tab voltage loading values, and collect the third battery cell voltage values, third battery cell current values, and third tab voltage values;

[0072] Calculate the third battery cell voltage error value based on the battery cell voltage loading value and the third battery cell voltage value; calculate the second tab voltage error value based on the second tab voltage loading value and the third tab voltage value; perform verification on the third battery cell voltage error value and the second tab voltage error value based on a preset sixth threshold and seventh threshold.

[0073] In the said step S30, the precision calibration includes battery cell voltage calibration, battery cell charging current calibration, and battery cell discharging current calibration.

[0074] The specific method for battery cell voltage calibration is as follows: Turn on the corresponding MOS transistor in the signal switch module, the DAC output module outputs the test point voltage to the busbar, the voltage current sampling module collects the test point voltage to obtain the battery cell channel voltage and voltage acquisition value, calculate the correction factor based on the battery cell channel voltage and voltage acquisition value, write the correction factor into the voltage current sampling module to compensate the acquisition result, and finally conduct a review on the calibrated channel. The review points are 0.05%, 1%, 10%, 20%, 50%, and 90% of the maximum range, a total of six review points, to ensure the effectiveness of the precision.

[0075] The specific method for battery cell charging current calibration is as follows: Calibrate each battery cell channel one by one. Close the signal switch module corresponding to the power supply channel, the power transfer module turns on the charging current loop, the battery cell channel loads current, obtain the battery cell channel current and charging current acquisition value, calculate the correction factor through the factor algorithm for the battery cell channel current and charging current acquisition value, write it into the voltage current sampling module to compensate the acquisition result, conduct a review after calibration, and adopt 6-point review in line with the voltage review points to obtain a formation and formation equipment that meets the precision standard.

[0076] The specific method for battery cell discharging current calibration is as follows: In order to simulate the battery cell discharging scenario, use the power supply module inside the test and calibration tooling to calibrate the battery cell. Close the signal switch module corresponding to the battery cell channel, the power transfer module turns on the discharging current loop, the discharging power supply loads current, obtain the battery cell channel discharging current and discharging current acquisition value, calculate the correction factor through the factor algorithm for the battery cell channel discharging current and discharging current acquisition value, write it into the voltage current sampling module to compensate the acquisition result, and use 6-point review to obtain a formation and formation equipment that meets the precision requirements.

[0077] In summary, the advantages of the present invention are as follows:

[0078] By setting a single-chip microcomputer, a DAC output module, a power transfer module, a power supply module, a voltage and current sampling module, a signal switch module, a busbar, and a communication module; the busbar, the signal switch module, the single-chip microcomputer, the DAC output module, the power transfer module, the power supply module, and the voltage and current sampling module are connected in sequence; one end of the voltage and current sampling module is connected to the single-chip microcomputer, and the other end is connected to the signal switch module; the single-chip microcomputer is respectively connected to the communication module and the power transfer module. The single-chip microcomputer converts digital signals into analog signals through the DAC output module, so as to control the power supply module to output a reference voltage to the voltage and current sampling module through the power transfer module, switch the test channel through the signal switch module, collect voltage values and current values through the voltage and current sampling module for line sequence testing and accuracy calibration, and upload the test calibration report to the server through the communication module, that is, the automatic test calibration of the test calibration tooling replaces the traditional manual operation, thereby greatly improving the efficiency and reliability of the charge and discharge equipment test calibration.

[0079] Although the specific implementation manners of the present invention have been described above, those skilled in the art of this technology should understand that the specific embodiments we described are illustrative rather than used to limit the scope of the present invention. Equivalent modifications and variations made by those skilled in the art in accordance with the spirit of the present invention should be covered by the scope protected by the claims of the present invention.

Claims

1. An automatic test and calibration tooling for formation and capacitance measurement equipment, characterized in that: It includes a single-chip microcomputer, a DAC output module, a power transfer module, a power supply module, a voltage and current sampling module, a signal switch module, a bus bar, and a communication module; The bus bar, signal switch module, single-chip microcomputer, DAC output module, power transfer module, power supply module, and voltage and current sampling module are connected in sequence; One end of the voltage and current sampling module is connected to the single-chip microcomputer, and the other end is connected to the signal switch module; the single-chip microcomputer is respectively connected to the communication module and the power transfer module; The DAC output module includes an operational amplifier U6A, an operational amplifier U6B, a resistor R108, a resistor R109, a resistor R110, a resistor R111, a resistor R112, a capacitor C27, a capacitor C28, and a diode D19; One end of the resistor R108 is connected to the single-chip microcomputer, and the other end is connected to pin 3 of the operational amplifier U6A; pin 1 of the operational amplifier U6A is connected to the resistor R110 and the resistor R112, pin 2 is connected to the resistor R111 and the resistor R112, and pin 8 is connected to the capacitor C27; Pin 5 of the operational amplifier U6B is connected to the resistor R110, and pins 6 and 7 are connected to the resistor R109; after the capacitor C28 and the diode D19 are connected in parallel, the input end of the diode D19 is grounded, and the output end is connected to the power transfer module.

2. The automatic test and calibration tooling for formation and capacitance measurement equipment according to claim 1, characterized in that: The model of the single-chip microcomputer is STM32F429ZGT6LQFP-144.

3. The automatic test and calibration tooling for formation and capacitance measurement equipment according to claim 1, characterized in that: The model of the power supply module is RSP-1500-5.

4. The automatic test and calibration tooling for formation and capacitance measurement equipment according to claim 1, characterized in that: The model of the voltage and current sampling module is 34461A.

5. The automatic test and calibration tooling for formation and capacitance measurement equipment according to claim 1, characterized in that: The signal switch module includes a MOS transistor Q1, a MOS transistor Q2, a MOS transistor Q3, a MOS transistor Q4, a MOS transistor Q5, a MOS transistor Q6, a MOS transistor Q7, a MOS transistor Q8, a MOS transistor Q9, a MOS transistor Q10, a MOS transistor Q11, a MOS transistor Q12, a terminal block J3, and a terminal block J4; The G poles of the MOS transistors Q1, Q2, Q3, Q4, Q5, Q6, Q7, Q8, Q9, Q10, Q11, and Q12 are all connected to the single-chip microcomputer; Pins 1, 2, 3, 4, 5, and 6 of the terminal block J3 are connected to the D poles of the MOS transistors Q1, Q2, Q3, Q4, Q5, Q6 and the bus bar; pins 1, 2, 3, 4, 5, and 6 of the terminal block J4 are connected to the D poles of the MOS transistors Q7, Q8, Q9, Q10, Q11, Q12 and the bus bar; The S poles of the MOS transistors Q1, Q2, Q3, Q4, Q5, Q6, Q7, Q8, Q9, Q10, Q11, and Q12 are connected to each other and grounded.

6. The automatic test and calibration tooling for formation and capacitance measurement equipment according to claim 5, characterized in that: The MOS transistors Q1, Q2, Q3, Q4, Q5, Q6, Q7, Q8, Q9, Q10, Q11, and Q12 are all NMOS transistors.

7. An automatic test and calibration method for formation and capacitance measurement equipment, characterized in that: The method needs to use the test and calibration tooling described in any one of claims 1 to 6, and includes the following steps: Step S10: Place the test and calibration tooling in the storage location of the formation and grading equipment, and connect the copper busbar to the test channel to be tested and calibrated of the formation and grading equipment. Step S20: The single-chip microcomputer controls the test and calibration tooling to test the line sequence of the formation and grading equipment. Step S30: The single-chip microcomputer controls the test and calibration tooling to calibrate the accuracy of the formation and grading equipment. Step S40: The single-chip microcomputer generates a test and calibration report on the line sequence and accuracy, encrypts the test and calibration report using the national cryptographic algorithm, and uploads it to the server through the communication module.

8. The automatic test and calibration method for formation and capacitance measurement equipment according to claim 7, characterized in that: The specific content of step S20 includes: Step S21: Disconnect the pin bed of the formation and grading equipment, apply a fixed value voltage to each cell one by one, apply a voltage to the cell tab based on the first tab voltage load value, and collect the first cell voltage value, the first cell current value, and the first tab voltage value. Step S22: Determine whether the first tab voltage value is 0. If it is, generate an alarm for the disconnection of the cell sampling line; if not, proceed to step S23. Step S23: Subtract the first tab voltage value from the first tab voltage load value to obtain the first tab voltage error value, and verify the first cell voltage value, the first cell current value, and the first tab voltage error value based on the preset first threshold, second threshold, and third threshold. Step S24: Press the pin bed of the formation and grading equipment. The test and calibration tooling outputs a reference voltage to the power transfer module through the DAC output module, performs switch switching through the switch signal module, and collects the second cell voltage value, the second tab voltage value, and the tooling reference voltage. Calculate the first cell voltage error value based on the second cell voltage value and the tooling reference voltage, calculate the second cell voltage error value based on the second tab voltage value and the tooling reference voltage, and verify the first cell voltage error value and the second cell voltage error value based on the preset fourth threshold and fifth threshold. Step S25: Apply a voltage to each cell one by one based on the cell voltage load value, apply a voltage to the cell tab based on the second tab voltage load value, and collect the third cell voltage value, the third cell current value, and the third tab voltage value. Calculate the third cell voltage error value based on the cell voltage load value and the third cell voltage value; calculate the second tab voltage error value based on the second tab voltage load value and the third tab voltage value; verify the third cell voltage error value and the second tab voltage error value based on the preset sixth threshold and seventh threshold.

9. The automatic test and calibration method for formation and capacitance measurement equipment according to claim 7, characterized in that:In step S30, the accuracy calibration includes cell voltage calibration, cell charging current calibration, and cell discharging current calibration.

Images