A linear regulator fast test system and a test method

Abstract

The present application relates to linear voltage regulator test technical field, more particularly, to a kind of for linear voltage regulator fast test system and test method.The present application includes power module, measurement module, excitation signal module, analog load module, temperature control module, host computer module, controller module.Controller module is according to the target value set by host computer module to excitation signal module, analog load module, temperature control module is controlled accordingly, and measurement module is controlled to complete the measurement of the measured linear voltage regulator.The test system of the present application is compared with traditional mode, it is more convenient and simple to operate, and linear voltage regulator can be measured at high temperature.The test system of the present application is compared with existing ATE system, component is simplified, and purchase processing cost is low, is suitable for small and medium-sized manufacturers to promote use.The present application solves the problem of high cost in the existing ATE test system for linear voltage regulator parameter measurement.

Description

Technical Field

[0001] This invention relates to the field of linear regulator testing technology, and more specifically, to a quick testing system for linear regulators and a method for testing linear regulators using the testing system. Background Technology

[0002] A linear regulator is a component, and also a type of power supply, whose function is to maintain a stable voltage. After being designed and manufactured by integrated circuit design companies, linear regulators need to be tested to identify and select defective units. Currently, performance testing of linear regulators requires various complex instruments and intricate wiring.

[0003] Performance testing of linear regulators often requires instruments such as oscilloscopes, electronic loads, multimeters, and digitally controlled voltage sources. Testers connect the linear regulator under test to these instruments, manually operate them to generate test signals, and finally obtain the test data. This testing process is often not automated and is cumbersome. Therefore, a patent proposes a power supply testing system (patent number CN 114994563 A) that uses an ATE (Automatic Test Equipment) system to test the performance of the power module. The above method can test various types of power modules, including linear regulators. However, for applications requiring only linear regulator performance measurements, the instruments used are too numerous and expensive. Furthermore, linear regulators are often used in harsh, high-temperature environments, making high-temperature parameter measurements crucial. Currently, extreme parameter measurements of linear regulators at high temperatures often require testing in a high-temperature constant-temperature chamber, which is inconvenient. Summary of the Invention

[0004] Therefore, it is necessary to address the high cost of using existing ATE testing systems to measure the parameters of linear regulators, and to provide a fast testing system and method for linear regulators.

[0005] This invention is achieved using the following technical solution:

[0006] In a first aspect, the present invention discloses a rapid testing system for linear regulators, used to measure the parameters of the linear regulator under test.

[0007] A rapid testing system for linear regulators includes: a measurement module, an excitation signal module, an analog load module, a temperature control module, a host computer module, a controller module, and a power supply module.

[0008] The measurement module measures the actual input and output voltages of the linear regulator under test. The excitation signal module provides the target input voltage to the linear regulator under test. The analog load module provides the target output current to the linear regulator under test. The temperature control module provides the target ambient temperature to the linear regulator under test. The host computer module acts as the user interface, allowing users to set target values ​​for the excitation signal module, analog load module, and temperature control module, and display the measurement results. The controller module controls the excitation signal module, analog load module, and temperature control module according to the target values ​​set by the host computer module, and controls the measurement module to complete the measurement of the linear regulator under test. The power supply module provides power to the measurement module, excitation signal module, analog load module, temperature control module, and controller module.

[0009] This type of quick test system for linear regulators implements the method or process according to embodiments of this disclosure.

[0010] Secondly, the present invention discloses a quick testing method for linear regulators, which uses the quick testing system for linear regulators as disclosed in the first aspect.

[0011] The quick testing method for linear regulators includes the following steps:

[0012] Step 1: Install the linear regulator under test into the quick test system for linear regulators;

[0013] Step 2: Set the target ambient temperature through the host computer module, and the controller module controls the temperature control module to keep the environment where the linear regulator under test is located at the target ambient temperature.

[0014] Step 3: Perform parameter measurements on the linear regulator under test; parameter measurements include, but are not limited to, output voltage measurement, load regulation measurement, line regulation measurement, and transient response measurement.

[0015] This method for quick testing of linear regulators implements the method or process according to embodiments of this disclosure.

[0016] Compared with the prior art, the present invention has the following beneficial effects:

[0017] Compared to traditional methods, the testing system of this invention is more convenient and simpler to operate, and can measure the parameters of linear regulators at high temperatures. Compared to existing ATE systems, the testing system of this invention has fewer components, lower procurement and processing costs, and is suitable for promotion and use by small and medium-sized manufacturers. Attached Figure Description

[0018] Figure 1 This is a structural block diagram of a fast testing system for linear regulators provided in Embodiment 1 of the present invention;

[0019] Figure 2 for Figure 1 Block diagram of the power supply module;

[0020] Figure 3 for Figure 1 Wiring diagram of the excitation signal module;

[0021] Figure 4 for Figure 1 Wiring diagram for the medium temperature control module;

[0022] Figure 5 for Figure 1 Wiring diagram of the analog load module;

[0023] Figure 6 This is a flowchart of a quick testing method for linear regulators provided in Embodiment 2 of the present invention. Detailed Implementation

[0024] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0025] It should be noted that when a component is said to be "installed on" another component, it can be directly on the other component or it may be in a component that is centered on it. When a component is said to be "set on" another component, it can be directly set on the other component or it may also be in a component that is centered on it. When a component is said to be "fixed to" another component, it can be directly fixed to the other component or it may also be in a component that is centered on it.

[0026] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used herein in the specification of this invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The term "or / and" as used herein includes any and all combinations of one or more of the associated listed items.

[0027] Example 1

[0028] In summary, the quick testing system for linear regulators provided in this embodiment 1 is used to measure the parameters of the linear regulator under test.

[0029] Please see Figure 1 , Figure 1This is a structural diagram of a fast testing system for linear regulators. It is designed around the linear regulator under test and includes: a power supply module, a measurement module, an excitation signal module, an analog load module, a temperature control module, a host computer module, and a controller module.

[0030] The following section will introduce each module in detail:

[0031] 1. The power supply module is used to supply power to the measurement module, excitation signal module, analog load module, temperature control module, and controller module.

[0032] See Figure 2 The power supply module includes linear regulator one and linear regulator two.

[0033] The power module's input voltage is an externally supplied 20V supply voltage. Generally, this 20V supply voltage is obtained by converting 220V AC mains power. For example, a linear regulator can be connected to 220V AC mains power via a PD charger (which has a built-in CH224K voltage trigger chip), thus converting the 220V AC mains power into 20V. Alternatively, the 20V supply voltage can also be provided by power banks or other energy storage devices. For instance, the linear regulator can be connected to the 20V output port of the power bank via a power cord, allowing the power bank to directly supply 20V.

[0034] Thus, linear regulator one receives an external 20V supply voltage and generates a 9V supply voltage. Linear regulator two receives a 9V supply voltage and generates a 3.3V supply voltage.

[0035] In this embodiment 1, linear regulator one is selected as L78M09; linear regulator two is selected as ME3116. Of course, other models with the same function can also be used for linear regulator one and linear regulator two.

[0036] The three voltages of different amplitudes are used to power different modules: 20V power supply is used to power the excitation signal module; 9V power supply is used to power the analog load module and temperature control module; and 3.3V power supply is used to power the measurement module and controller module.

[0037] 2. The measurement module is used to measure the actual input voltage and actual output voltage of the linear regulator under test.

[0038] The measurement module connects to the input and output terminals of the linear regulator under test to measure the actual input and output voltages of the regulator. Generally, commercially available modules can be used, such as those based on ADC chips like the ADS1115.

[0039] 3. The excitation signal module is used to provide the target input voltage to the linear regulator under test.

[0040] See Figure 3 The excitation signal module includes: an excitation signal control chip, an inductor L, power switches MP1, MP2, MN1, and MN2, a capacitor C, resistors R1, R2, and R3, and a DAC voltage conversion submodule.

[0041] The excitation signal control chip is connected to the controller module, thereby receiving the signals transmitted by the controller module and performing corresponding control.

[0042] MP1's source is connected to a 20V power supply, its drain is connected to the first terminal of L, and its gate is connected to the excitation signal control chip. MP2's source is connected to the second terminal of L, its drain is connected to the input terminal of the linear regulator under test, and its gate is connected to the excitation signal control chip. MN1's source is grounded, its drain is connected to the first terminal of L, and its gate is connected to the excitation signal control chip. MN2's source is grounded, its drain is connected to the second terminal of L, and its gate is connected to the excitation signal control chip.

[0043] The positive terminal of capacitor C is connected to the drain of MP2, and the negative terminal is grounded. The first terminal of resistor R1 is connected to the drain of MP2, and the second terminal is connected to the excitation signal control chip. The first terminal of resistor R2 is connected to the second terminal of resistor R1, and the second terminal is grounded. The first terminal of resistor R3 is connected to the second terminal of resistor R1. The input terminal of the DAC voltage conversion submodule 1 is connected to the controller module, and the output terminal is connected to the second terminal of resistor R3.

[0044] In this embodiment 1, the excitation signal control chip is selected as LM5176. The DAC voltage conversion submodule one is selected as MCP4725. Of course, other models with the same function can also be used for the excitation signal control chip and the DAC voltage conversion submodule one.

[0045] 4. The temperature control module is used to provide the target ambient temperature to the linear regulator under test.

[0046] See Figure 4 The temperature control module includes: operational amplifier OP1, power switch MP3, resistor R4, resistor R5, DAC voltage conversion submodule II, thermistor R6, resistor R7, and cooling fan.

[0047] The MP3 player is used to heat the environment surrounding the linear regulator under test. The source of the MP3 player is connected to a 9V power supply, and its gate is connected to the output of OP1. The first terminal of R4 is connected to the drain of the MP3 player. The first terminal of R5 is connected to the second terminal of R4 and the positive input of OP1, with the second terminal grounded. The input of the second DAC voltage conversion submodule is connected to the controller module, and its output is connected to the positive input of OP1. The first terminal of the thermistor R6 is connected to the 9V power supply, and the second terminal is connected to the controller module. The first terminal of R7 is connected to the second terminal of R6, with the second terminal grounded. A cooling fan is connected to the controller module to dissipate heat from the environment surrounding the linear regulator under test.

[0048] In this embodiment 1, R4, R5, and R7 are 10kΩ fixed resistors. R6 is an MF52 thermistor. The second DAC voltage conversion submodule uses the MCP4725 chip. Of course, R4, R5, and R7 can also have other resistance values, fluctuating around 5kΩ within 10kΩ. R6 can also be a different type of thermistor. The second DAC voltage conversion submodule can also use other models with the same function.

[0049] 5. The simulated load module is used to provide the target output current to the linear regulator under test.

[0050] See Figure 5 The analog load module includes: operational amplifier OP2, power switch MN3, operational amplifier OP3, resistors R8, R9, R10, R11, DAC voltage conversion submodule, and current detection submodule.

[0051] The gate terminal of MN3 is connected to the output terminal of OP2, and the drain terminal is connected to the output terminal of the linear regulator under test. The output terminal of OP3 is connected to the negative input terminal of OP2, and the positive input terminal is connected to the source terminal of MN3. The first terminal of R8 is connected to the output terminal of OP3, and the second terminal is connected to the negative input terminal of OP3. The first terminal of R9 is connected to the negative input terminal of OP3, and the second terminal is grounded. The first terminal of R10 is connected to the source terminal of MN3, and the second terminal is grounded. The first terminal of R11 is connected to the source terminal of MN3, and the second terminal is grounded. The input terminal of the DAC voltage conversion submodule three is connected to the controller module, and the output terminal is connected to the positive input terminal of OP2. The current detection submodule is connected to the controller module and is used to detect the current passing through R10 and R11.

[0052] In fact, R10 and R11 are connected in parallel, and can be regarded as a sampling resistor R connected in parallel. 并 The current detection submodule measures R. 并 The voltage is then used to calculate the current passing through R10 and R11.

[0053] In this embodiment 1, OP2 uses an LM324; the DAC voltage conversion submodule three uses an MCP4725. Of course, OP2 and the DAC voltage conversion submodule three can also use other models with the same function. R10 and R11 are 6mR / 2W resistors, thus obtaining a 3mR resistor in parallel. 并 Of course, R10 and R11 can also be other resistance values, fluctuating around 2mR around 6mR.

[0054] 6. The host computer module serves as the user operation terminal, used to set the target values ​​corresponding to the excitation signal module, analog load module, and temperature control module, and to display the measurement results of the measurement module.

[0055] In this embodiment 1, the host computer module is located on the host computer and is programmed using software such as LabVIEW to achieve graphical display. The host computer module communicates with the controller module and the measurement module via communication cables: on the one hand, the user sets the target input voltage, target output current, and target ambient temperature on the host computer module, and controls the excitation signal module, analog load module, and temperature control module accordingly through the controller module; on the other hand, the host computer module receives the measurement data from the measurement module and displays the measurement results in real time.

[0056] 7. The controller module controls the excitation signal module, analog load module, and temperature control module according to the target values ​​set by the host computer module, and controls the measurement module to complete the measurement of the linear regulator under test.

[0057] The controller module can be a commercially available module. In this embodiment 1, the controller module adopts a control module based on an STM32F412RET6 MCU, which has built-in ADC, DAC, EEPROM memory and other functional modules, and is equipped with multiple serial communication interfaces (such as UART, SPI, I2C, RS232, USB, etc.), which can communicate and control various external devices, providing flexible interfaces and rich functions.

[0058] Based on the above structure, when measuring the parameters of the linear regulator under test, it is necessary to provide the linear regulator under test with the target input voltage, target ambient temperature, and target output current.

[0059] (1) The principle of providing the target input voltage is as follows:

[0060] The host computer module sets the target input voltage and generates an excitation signal. The controller module receives the excitation signal from the host computer module and measures the actual input voltage through the measurement module.

[0061] The controller module sends the excitation signal to the excitation signal module; the DAC voltage conversion submodule converts the excitation signal into voltage and superimposes it onto the connection of R1 and R2 through R3 to form a superimposed voltage signal; the superimposed voltage signal is transmitted to the excitation signal control chip.

[0062] The excitation signal control chip converts the superimposed voltage signal into a duty cycle D, and controls MP1, MP2, MN1, and MN2 according to D to make the actual input voltage equal to the target input voltage.

[0063] Specifically, for a single control cycle T, MP1 and MN2 are first turned on, then MN1 and MP2 are turned off, and this process is continued for T*D; then MP1 and MN2 are turned off, and MN1 and MP2 are turned on, and this process is continued for T*(1-D). In this way, the input 20V supply voltage is converted into 20*D / (1-D), which is the target input voltage. Generally, T is taken as 10ms.

[0064] (2) The principle of providing the target ambient temperature is as follows:

[0065] The host computer module sets the target ambient temperature and transmits it to the controller module. The controller module receives the target ambient temperature from the host computer module and measures the actual ambient temperature.

[0066] The controller module calculates the actual ambient temperature by obtaining the resistance value of R6. This is because R6 is a thermistor, and its resistance has a linear relationship with temperature. Therefore, by measuring the voltage and current of R6, its resistance value can be calculated, and thus the actual ambient temperature can be derived. It should be noted that the voltage and current of R6 can be directly measured and obtained through the controller module's built-in ADC.

[0067] If the actual ambient temperature equals the target ambient temperature, maintain the current control method.

[0068] If the actual ambient temperature is lower than the target ambient temperature, the controller module will cause a large current to flow through OP1 through the DAC voltage conversion submodule 2, and OP1 will start to heat up until the actual ambient temperature rises to the target ambient temperature.

[0069] If the actual ambient temperature is higher than the target ambient temperature, the controller module controls the cooling fan to turn on, so that the actual ambient temperature drops to the target ambient temperature.

[0070] (3) The principle of providing the target output current is as follows:

[0071] The host computer module sets the target output current and transmits it to the controller module; after receiving the target output current, the controller module detects the actual load current through the current detection submodule.

[0072] The controller module transmits the target output current to the analog load module; the DAC voltage conversion submodule 3 converts the target output current into a voltage value; at the same time, the actual load current generates a voltage drop through R10 and R11, and the voltage drop value is obtained.

[0073] If the voltage drop equals the voltage conversion value, maintain the current control mode.

[0074] If the voltage drop is less than the voltage conversion value, OP2 controls MN3 to turn on, increasing the current flowing through R10 and R11 until the voltage drop rises to the voltage conversion value;

[0075] If the voltage drop is greater than the voltage conversion value, OP2 controls MN3 to shut down, reducing the current flowing through R10 and R11 until the voltage drop is reduced to the voltage conversion value.

[0076] According to the above rules, MN3 is turned on or off to control the actual load current and achieve the target output current.

[0077] Based on the above control principle, the target input voltage, target ambient temperature, and target output current can be provided to the linear regulator under test. Then, the actual output voltage of the linear regulator under test can be measured by the measurement component to complete the parameter measurement.

[0078] Example 2

[0079] This embodiment 2 provides a quick testing method for linear voltage regulators, which uses the quick testing system for linear voltage regulators provided in embodiment 1.

[0080] The quick testing method for linear regulators includes the following steps:

[0081] Step 1: Install the linear regulator under test into the quick test system for linear regulators.

[0082] Step 2: Set the target ambient temperature through the host computer module, and the controller module controls the temperature control module to ensure that the environment in which the linear regulator under test is located is at the target ambient temperature.

[0083] Of course, between step two and step one, a 20V power supply must first be connected to the power module to ensure that step two proceeds smoothly.

[0084] Step 3: Perform parameter measurements on the linear regulator under test; parameter measurements include, but are not limited to, output voltage measurement, load regulation measurement, line regulation measurement, and transient response measurement.

[0085] The method for measuring the output voltage includes: setting a constant target input voltage through the host computer module, controlling the excitation signal module to generate a constant target input voltage through the controller module, controlling the analog load module to generate a constant target output current through the controller module, and controlling the measurement module to measure the actual output voltage of the linear regulator under test through the controller module.

[0086] The method for measuring load regulation includes: setting a constant target input voltage through the host computer module, controlling the excitation signal module to generate a constant target input voltage through the controller module, controlling the analog load module to generate a target output current that gradually increases or decreases through the controller module, and controlling the measurement module to measure the actual output voltage of the linear regulator under test.

[0087] The method for measuring the linear regulation rate includes: setting a gradually increasing target input voltage through the host computer module, controlling the excitation signal module to generate a gradually increasing or decreasing target input voltage through the controller module, controlling the analog load module to generate a constant target output current through the controller module, and controlling the measurement module to measure the actual output voltage of the linear regulator under test.

[0088] The method for transient response measurement includes: setting a constant target input voltage through the host computer module, controlling the excitation signal module to generate a constant target input voltage through the controller module, controlling the analog load module to generate a target output current with a step, and controlling the measurement module to measure the actual output voltage of the linear regulator under test.

[0089] Furthermore, based on the measured parameter values, it is possible to determine whether the tested linear regulator is qualified according to the performance threshold range.

[0090] It should be noted that different parameter measurements have different performance threshold ranges. For example, if the actual output voltage obtained from the output voltage measurement falls within the corresponding performance threshold range, it indicates that the linear regulator under test is qualified; if the actual output voltage obtained from the output voltage measurement exceeds the corresponding performance threshold range, it indicates that the linear regulator under test is unqualified.

[0091] In addition, the host computer module displays the test results in real time and saves the qualified and unqualified products into data files (including test conditions and test results).

[0092] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0093] The embodiments described above are merely illustrative of several implementations of the present invention, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of the present invention, and these all fall within the protection scope of the present invention. Therefore, the protection scope of this invention patent should be determined by the appended claims.

Claims

1. A rapid testing system for linear voltage regulators, used to measure parameters of the linear voltage regulator under test, characterized in that, The fast testing system for linear regulators includes: The measurement module is used to measure the actual input voltage and actual output voltage of the linear regulator under test. The excitation signal module is used to provide the target input voltage to the linear regulator under test. The analog load module is used to provide the target output current to the linear regulator under test; The temperature control module is used to provide the target ambient temperature to the linear regulator under test. The host computer module, which serves as the user operation terminal, is used to set the target values ​​corresponding to the excitation signal module, the analog load module, and the temperature control module, and to display the measurement results of the measurement module. The controller module controls the excitation signal module, analog load module, and temperature control module according to the target values ​​set by the host computer module, and controls the measurement module to complete the measurement of the linear regulator under test; and The power supply module is used to supply power to the measurement module, excitation signal module, analog load module, temperature control module, and controller module. The excitation signal module includes: The excitation signal control chip is connected to the controller module; Inductance L; The power switching transistor MP1 has its source connected to a 20V power supply voltage, its drain connected to the first terminal of L, and its gate connected to the excitation signal control chip. The power switching transistor MP2 has its source terminal connected to the second terminal of L, its drain terminal connected to the input terminal of the linear regulator under test, and its gate terminal connected to the excitation signal control chip. The power switch MN1 has its source terminal grounded, its drain terminal connected to the first terminal of L, and its gate terminal connected to the excitation signal control chip. The power switch MN2 has its source terminal grounded, its drain terminal connected to the second terminal of L, and its gate terminal connected to the excitation signal control chip. Capacitor C has its positive terminal connected to the drain terminal of MP2 and its negative terminal grounded. Resistor R1 has its first end connected to the drain of MP2 and its second end connected to the excitation signal control chip. Resistor R2 has its first terminal connected to the second terminal of R1, and its second terminal is grounded. Resistor R3, with its first terminal connected to the second terminal of R1; and The first DAC voltage conversion submodule has its input connected to the controller module and its output connected to the second terminal of R3.

2. The fast testing system for linear regulators according to claim 1, characterized in that, The power module includes linear regulator one and linear regulator two; Linear regulator one receives an externally input 20V power supply voltage and generates a 9V power supply voltage; linear regulator two receives a 9V power supply voltage and generates a 3.3V power supply voltage. The 20V power supply is used to power the excitation signal module; the 9V power supply is used to power the analog load module and the temperature control module; and the 3.3V power supply is used to power the measurement module and the controller module.

3. The fast testing system for linear regulators according to claim 2, characterized in that, The linear regulator is connected to the 220V AC mains power via a PD charger, and the 220V AC mains power is converted to a 20V supply voltage by the PD charger.

4. The fast testing system for linear regulators according to claim 1, characterized in that, The host computer module sets the target input voltage and generates an excitation signal; the controller module receives the excitation signal from the host computer module and measures the actual input voltage through the measurement module. The controller module sends the excitation signal to the excitation signal module; the DAC voltage conversion submodule converts the excitation signal into a voltage and superimposes it onto the connection of R1 and R2 through R3 to form a superimposed voltage signal; the superimposed voltage signal is transmitted to the excitation signal control chip; the excitation signal control chip converts the superimposed voltage signal into a duty cycle D, and controls MP1, MP2, MN1, and MN2 according to D to make the actual input voltage equal to the target input voltage.

5. The fast testing system for linear regulators according to claim 1, characterized in that, The temperature control module includes: Operational amplifier OP1; The power switching transistor MP3 is used to heat the environment in which the linear regulator under test is located; the source terminal of MP3 is connected to a 9V power supply voltage, and the gate is connected to the output terminal of OP1. Resistor R4, its first end is connected to the drain of MP3; Resistor R5 has its first end connected to the second end of R4 and the positive input terminal of OP1, and its second end grounded. The second DAC voltage conversion submodule has its input connected to the controller module and its output connected to the negative input of OP1. The temperature-sensitive resistor R6 has its first terminal connected to a 9V power supply and its second terminal connected to the controller module. Resistor R7 has its first terminal connected to the second terminal of R6, and its second terminal is grounded. as well as The cooling fan, connected to the controller module, is used to dissipate heat from the environment where the linear regulator under test is located.

6. The fast testing system for linear regulators according to claim 5, characterized in that, The host computer module sets the target ambient temperature and transmits it to the controller module; the controller module receives the target ambient temperature from the host computer module and measures the actual ambient temperature; the controller module calculates the actual ambient temperature by obtaining the resistance value of R6. If the actual ambient temperature equals the target ambient temperature, maintain the current control method. If the actual ambient temperature is lower than the target ambient temperature, the controller module will cause a large current to flow through OP1 through the DAC voltage conversion submodule 2, and the MP3 will start to heat up until the actual ambient temperature rises to the target ambient temperature. If the actual ambient temperature is higher than the target ambient temperature, the controller module controls the cooling fan to turn on, so that the actual ambient temperature drops to the target ambient temperature.

7. The fast testing system for linear regulators according to claim 1, characterized in that, The simulated load module includes: Operational amplifier OP2; The gate of the power switch MN3 is connected to the output of OP2, and its drain is connected to the output of the linear regulator under test. Operational amplifier OP3 has its output connected to the negative input of OP2 and its positive input connected to the source of MN3. Resistor R8 has its first end connected to the output terminal of OP3 and its second end connected to the negative input terminal of OP3. Resistor R9 has its first end connected to the negative input terminal of OP3, and its second end grounded. Resistor R10 has its first terminal connected to the source terminal of MN3 and its second terminal grounded. Resistor R11 has its first terminal connected to the source terminal of MN3 and its second terminal grounded. The third DAC voltage conversion submodule has its input connected to the controller module and its output connected to the positive input of OP2. as well as The current detection submodule, which is connected to the controller module, is used to detect the current passing through R10 and R11.

8. The fast testing system for linear regulators according to claim 7, characterized in that, The host computer module sets the target output current and transmits it to the controller module; after receiving the target output current, the controller module detects the actual load current through the current detection submodule. The controller module transmits the target output current to the analog load module; the DAC voltage conversion submodule converts the target output current into a voltage value; at the same time, the actual load current generates a voltage drop through R10 and R11, and the voltage drop value is obtained. If the voltage drop equals the voltage conversion value, maintain the current control mode. If the voltage drop is less than the voltage conversion value, OP2 controls MN3 to turn on, increasing the current flowing through R10 and R11 until the voltage drop rises to the voltage conversion value; If the voltage drop is greater than the voltage conversion value, OP2 controls MN3 to shut down, reducing the current flowing through R10 and R11 until the voltage drop is reduced to the voltage conversion value.

9. A quick testing method for linear voltage regulators, characterized in that, The fast test system for linear regulators as described in any one of claims 1-8 was used; The quick testing method for linear regulators includes the following steps: Step 1: Install the linear regulator under test into the quick test system for linear regulators; Step 2: Set the target ambient temperature through the host computer module, and the controller module controls the temperature control module to keep the environment where the linear regulator under test is located at the target ambient temperature. Step 3: Perform parameter measurements on the linear regulator under test; the parameter measurements include, but are not limited to, output voltage measurement, load regulation measurement, line regulation measurement, and transient response measurement.

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