High-sensitivity radiation detector and rapid sensitivity calibration method thereof

Abstract

The application provides a high-sensitivity radiation detector and a sensitivity rapid calibration method thereof, measures plateau characteristic curves of each sub-detector, and can accurately obtain a gain reduction state of the sub-detector in a combined detector due to voltage division. By maintaining the voltage of only one sub-detector in the detector and making the detector in different detector states, only the performance of the single sub-detector with or without the inter-sub-detector shielding effect in the same position needs to be compared, multiple equations do not need to be solved simultaneously, the gain reduction caused by the mutual shielding effect of the sub-detector can be accurately obtained by combining the obtained gain reduction state parameter caused by the detector voltage division, the gain reduction caused by the detector voltage division and the gain reduction caused by the mutual shielding effect of the sub-detector are decoupled, and the influence of the voltage division deviation and the shielding effect on the performance of the combined detector can be quantitatively determined.

Description

Technical Field

[0001] This invention relates to the field of radiation detector technology. Background Technology

[0002] Typically, radiation detectors are used outside the reactor to monitor reactor power in real time during reactor startup, power operation, shutdown, and design basis accident conditions. These detectors output real-time power level and power change rate signals for reactor protection, playing a crucial role in safe reactor operation. During initial startup and other similar conditions, the ambient radiation field is extremely weak, requiring significantly improved detector sensitivity for effective monitoring.

[0003] In the field of radiation detection, multiple detectors are often combined into arrays to construct combined detectors for measurement, thereby improving detection range and sensitivity. However, due to various factors such as radiation shielding and blocking effects between individual detectors, as well as voltage deviations caused by applying voltage to multiple detectors using parallel voltage divider branches, the sensitivity of a combined detector is not simply the sum of the individual detectors. To achieve a high level of sensitivity, the combined detector system needs to be calibrated and adjusted to minimize these influencing factors.

[0004] Patent document CN104820233A discloses a scintillator array structure and a neutron detector using the scintillator array structure. The document describes the structure and operating mode of the neutron detector, but does not explain the calibration method.

[0005] Patent document CN202210182456.9 discloses a calibration method and system for a photodetector array, which calibrates the performance of the photodetector array and obtains the response matrix of the sub-detectors. However, the object is a photodetector, and the calibration is performed by sunlight. There is no self-shielding effect or voltage division effect between the detectors.

[0006] As mentioned above, in existing technologies, the combined detector is treated as a whole, and the overall output of the entire detector is examined. The overall effect of multiple performance parameters of the combined detector is analyzed. However, the performance parameters of the individual sub-detectors in the detector array are not analyzed in detail, and the potential of the detector cannot be fully explored. Moreover, if the detector performance is found to be unsatisfactory after calibration, the detector needs to be redesigned, such as modifying the number of detectors, layout, and other parameters. This process is time-consuming, costly, and inefficient. Summary of the Invention

[0007] To address the aforementioned technical problems, this invention provides a high-sensitivity radiation detector and a rapid sensitivity calibration method thereof, which can eliminate the influence of voltage division and shielding effects on detector performance and improve detection performance.

[0008] The first aspect of this invention provides a rapid sensitivity calibration method for a high-sensitivity radiation detector. The detector includes multiple sub-detectors, each sub-detector having a predetermined setting position. The calibration method includes the following steps:

[0009] Step S1: In the radiation field, each sub-detector is set up individually at its predetermined position. The plateau voltage range U(i, min) to U(i, max) of the plateau curve of each sub-detector is measured, as well as the signal value N(i, rec) corresponding to the optimal operating voltage U(i, rec) of each sub-detector. Here, i = 1, 2, 3, ... M, and M is the number of sub-detectors.

[0010] Step S2: Place all sub-detectors in their predetermined positions, apply voltage to the detectors, measure the operating voltage U(i, com) of each sub-detector, and adjust the detector voltage so that the operating voltage U(i, com) of each sub-detector is within its plateau voltage range U(i, min) to U(i, max), and obtain the voltage state S0(i) of each sub-detector. Here, S0(i) = N(i, com) / N(i, rec) × 100%, where N(i, com) is the signal value measured by the i-th sub-detector under the operating voltage U(i, com).

[0011] Step S3: In the radiation field, measure the sum of the output signals N0(com) of all sub-detectors of the detector. N0(com) satisfies the following relationship:

[0012] N0(com)=a1·N(1,com)+a2·N(2,com)+……+a M ·N(M, com)

[0013] =a1·S0(1)·N(1, rec)+a2·S0(2)·N(2, rec)+……+a M ·S0(M)·N(M,rec)

[0014] in,

[0015] a i This indicates the effect of the mutual shielding effect between sub-detectors on the signal output of the sub-detectors;

[0016] Step S4: Sequentially maintain the voltage connection of the i-th sub-detector among the M sub-detectors, and disconnect the voltage of the other M-1 sub-detectors to obtain M different detector states j, j = 1, 2, 3…M. Under each detector state j, execute steps S2 and S3 to measure the voltage state Sj(i) of the i-th sub-detector, j = 1, 2, 3…M, and the output signal N of the i-th sub-detector. j(com), based on the M measurement results, a is calculated. j .

[0017] Preferably, in step S4, in each of the M measurements, the output signal N of the i-th sub-detector is obtained. j (com),

[0018] N j (com) satisfies the following relation:

[0019] N j (com) = a i ·N(i, com)

[0020] =a i ·S j (i)·N(i, rec)

[0021] Get a i =N j (com) / S j (i)·N(i,rec).

[0022] Preferably, in step S1, the plateau curve is normalized, with the voltage V applied to each sub-detector as the abscissa and the ratio N(i,V) / N(i,rec)×100% of the signal value N(i,rec) corresponding to the voltage V to the optimal operating voltage U(i,rec) of the sub-detector as the ordinate, to obtain the plateau curve of the percentage signal output of each sub-detector.

[0023] Preferably, in step S4, when the state of the detector is changed, the position of each sub-detector and the radiation field remain unchanged.

[0024] Preferably, using the obtained S0(i) and a i This improves the performance of the detector.

[0025] A second aspect of the present invention provides a high-sensitivity radiation detector, which is calibrated using the calibration method provided in the first aspect of the present invention.

[0026] According to the detector and calibration method of the present invention, by measuring the plateau characteristic curves of each sub-detector, the loss state of the sub-detectors caused by voltage division in the combined detector can be accurately obtained. By maintaining the voltage connection of one sub-detector while disconnecting the voltage connections of other sub-detectors, the detectors are placed in different detector states, and the shielding effect parameters between sub-detectors can be easily obtained. Combined with the obtained loss state parameters caused by detector voltage division, the loss caused by mutual shielding effect on sub-detectors can be accurately obtained, thereby decoupling the loss caused by detector voltage division and the loss caused by mutual shielding effect of sub-detectors. The influence of voltage division offset and shielding effect on the performance of the combined detector can be quantitatively determined. Attached Figure Description

[0027] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the embodiments of this application will be briefly described below.

[0028] Figure 1 This is a schematic diagram of a detector located within a radiation field according to a specific embodiment of the present invention;

[0029] Figure 2 This is a flowchart illustrating a detector calibration method according to a specific embodiment of the present invention;

[0030] Figure 3 This is a flowchart illustrating the measurement sub-detector plateau characteristic curve of a specific embodiment of the present invention;

[0031] Figure 4 This is a schematic diagram of a sub-detector installed at a predetermined position in a specific embodiment of the present invention;

[0032] Figure 5 This is the plateau characteristic curve of a sub-detector in a specific embodiment of the present invention;

[0033] Figure 6 This is a normalized plateau curve according to a specific embodiment of the present invention;

[0034] Figure 7 The plateau curve of the signal output for the percentage of the working voltage within its plateau voltage range, according to a specific embodiment of the present invention;

[0035] Figure 8 This is a schematic diagram illustrating the maintenance of the voltage of a sub-detector according to a specific embodiment of the present invention. Detailed Implementation

[0036] To better understand the technical solution of this application, the embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0037] Figure 1This is a schematic diagram of a detector 100 located in a radiation field according to a specific embodiment of the present invention.

[0038] like Figure 1 As shown, detector 100 is a detector array (also called a combined detector) consisting of multiple sub-detectors 1. Each sub-detector 1 is mounted on a specially designed support frame 2 (which can also be called a "test fixture" 2 when testing the detector). During detection and testing, the spatial position of each sub-detector 1 is fixed.

[0039] Detector 100 is located in the radiation field 3 and detects radiation. In this embodiment, as an example, neutron source 4 generates radiation field 3, and detector 100 is a neutron detector.

[0040] The number of sub-detectors 1 in detector 100 can be determined based on factors such as measurement requirements. Figure 1 In the middle, detector 100 contains 10 sub-detectors 1.

[0041] Before conducting formal measurements, detector 100 needs to be calibrated to ensure it is in optimal working condition. When measuring extremely weak radiation fields, detector 100 should have sufficiently high detection sensitivity; therefore, it is necessary to calibrate detector 100 to maximize its sensitivity.

[0042] Figure 2 This is a flowchart of a calibration method for a detector 100 according to a specific embodiment of the present invention.

[0043] like Figure 2 As shown, the calibration method of the detector 100 in this embodiment includes the following steps.

[0044] Step S1: Sequentially set each sub-detector 1 individually at its predetermined installation position on the test fixture 2. In the radiation field 3, measure the plateau characteristic curve of each sub-detector 1 individually to determine the plateau voltage range of the plateau curve of each sub-detector 1, as well as the signal value measured by each sub-detector 1 under the optimal operating voltage recommended by the detector manufacturer.

[0045] Step S2: Set all sub-detectors 1 at their predetermined installation positions on the test fixture 2 to form a combined detector 100 (detector array). Apply voltage to the combined detector 100 and measure the actual operating voltage of each sub-detector 1. If the operating voltage of a sub-detector 1 is not within the plateau voltage range of its plateau curve, adjust the voltage of the combined detector 100 so that the operating voltage of each sub-detector 1 is within its plateau voltage range. Determine the voltage deviation state of each sub-detector 1 based on the actual operating voltage of each sub-detector 1 and the signal value at that voltage, the optimal operating voltage and the signal value at that voltage.

[0046] Step S3: In the radiation field 3, the total output signal of the combined detector 100 is measured. The output signal satisfies a certain relationship with the output signals of each sub-detector 1, the voltage deviation state parameter, and the mutual shielding effect parameter of the sub-detectors.

[0047] Step S4: Maintain the voltage of one sub-detector 1 in detector 100, disconnect the voltage connection of other sub-detectors 1, so that detector 100 is in a different detector state. In this detector state, execute steps S2 and S3 to measure the total output signal of the combined detector 100 and the voltage deviation state parameter of each sub-detector 1.

[0048] By sequentially changing the sub-detector 1 that maintains the voltage connection, multiple different detector states are obtained. In each detector state, steps S2 and S3 are executed to obtain multiple measurement results. Based on these multiple measurement results, parameters characterizing the mutual shielding effect of the sub-detectors are calculated.

[0049] The detector calibration method of this embodiment is described in detail below.

[0050] First, let's explain step S1.

[0051] Figure 3 This is a flowchart illustrating the characteristic curve of the measurement sub-detector 1 ping (approximately 1 square meter) according to a specific embodiment of the present invention.

[0052] like Figure 3 As shown, step S1 specifically includes the following steps.

[0053] Step S11: Place a sub-detector 1 on the test fixture 2 at the predetermined setting position 21 of the sub-detector.

[0054] Figure 4 This is a schematic diagram of a sub-detector 1 installed at a predetermined setting position 21 in a specific embodiment of the present invention.

[0055] One sub-detector 1 is installed at a predetermined position 21 on the test fixture 2, and no sub-detectors are installed at the other positions of the test fixture 2. Assume that the number of sub-detectors is M, and the sub-detector 1 is numbered from 1 to M. Figure 4 In the test fixture 2, the sub-detector 1 is the second one from the top (i=2), and the power supply of the sub-detector 1 is connected to make the sub-detector 1 work. Then the shield of the neutron source 4 is removed, so that the sub-detector 1 is in the radiation field 3.

[0056] Step S12: Adjust the voltage V of the sub-detector 1 (i=2) and record the signal value N(i,V) output by the sub-detector 1 (i=2) under different voltages V, and plot the plateau characteristic curve of the signal value changing with the voltage V of the sub-detector 1 (i=2).

[0057] Figure 5 The image shows the plateau characteristic curve of sub-detector 1 in a specific embodiment of the present invention.

[0058] Figure 5 In the diagram, the horizontal axis represents the voltage V applied to sub-detector 1 (i=2), and the vertical axis represents the signal value N(i,V) measured by sub-detector 1 (i=2) under voltage V. Figure 5 In this context, the type of signal value N(i,V) is exemplified by the count rate cps (counts per second).

[0059] Figure 5 In the middle, the signal value under voltage U(i,min) is N(i,min), and the signal value under voltage U(i,max) is N(i,max). The changes are not significant, showing a slowly changing region. This region is called the "plateau region" of the sub-detector 1. U(i,min) is the minimum voltage value of the plateau region, and U(i,max) is the maximum voltage value of the plateau region.

[0060] Figure 5 In this context, U(i,rec) represents the optimal operating voltage for sub-detector 1 (i=2), which is usually the recommended operating voltage value provided by the detector manufacturer, but can also be determined by the detector user through measurement. The signal value at voltage U(i,rec) is N(i,rec).

[0061] Step S13, will Figure 5 The plateau curve in the middle is normalized.

[0062] Figure 6 This is a normalized plateau curve according to a specific embodiment of the present invention.

[0063] about Figure 5The plateau curve is obtained by dividing the signal value N(i,V) at each voltage V by the signal value N(i,rec) at the optimal operating voltage U(i,rec). Figure 6 The normalized plateau curve in the figure. That is, Figure 6 The vertical axis represents the ratio of the signal value N(i, V) at voltage V to the signal value N(i, rec) at the optimal operating voltage U(i, rec), which is N(i, V) / N(i, rec) × 100%. Therefore... Figure 6 The normalized plateau curve is also called the percentage signal output plateau curve. Figure 6 In the diagram, when the operating voltage U(i, com) of sub-detector 1 is at its optimal operating voltage U(i, rec), the value on the ordinate is 100%. When the operating voltage U(i, com) of sub-detector 1 deviates from the optimal operating voltage U(i, rec), the value on the ordinate deviates from 100%. Therefore, Figure 6 The percentage signal output plateau curve characterizes the effect of the change in the operating voltage U(i,com) of sub-detector 1 relative to the optimal operating voltage on the signal value of sub-detector 1.

[0064] Step S14: Replace sub-detector 1 by placing another sub-detector 1 at the predetermined installation position 21 on the test fixture 2. Do not place sub-detectors 1 at other positions on the test fixture 2. Repeat steps S11 to S13 to obtain the plateau curve of the other sub-detector 1.

[0065] This process is repeated so that the sub-detector number i takes values ​​from 1 to M. Steps S11 to S13 are executed M times in total to obtain the plateau voltage range U(i, min) to U(i, max) of the plateau curves of all M sub-detectors 1, the signal value N(i, rec) at the optimal operating voltage U(i, rec) of each sub-detector, and the percentage signal output plateau curve of each sub-detector 1.

[0066] Step 2 is explained in detail below.

[0067] As described above, in step S2, all sub-detectors 1 are set at their predetermined positions 21 on the test fixture 2 to form a combined detector 100 (detector array). A voltage is applied to the combined detector 100, and the actual operating voltage U(i, com) of each sub-detector 1 is measured using a voltage testing device. If the actual operating voltage U(i, com) of a sub-detector 1 is not within its plateau voltage range U(i, min) to U(i, max), the voltage of the combined detector 100 is adjusted so that the operating voltage U(i, com) of each sub-detector 1 is within its plateau voltage range U(i, min) to U(i, max), and the operating voltage U(i, com) of all sub-detectors 1 at this time is recorded, i = 1, 2, 3...M.

[0068] use Figure 6 The normalized percentage signal output plateau curve of sub-detector 1, when the horizontal axis value is the actual operating voltage U(i, com) of sub-detector 1, the vertical axis value of the point on the percentage signal output plateau curve is N(i, com) / N(i, rec)×100%. This value N(i, com) / N(i, rec)×100% reflects the influence of the change in the actual operating voltage U(i, com) of sub-detector 1 relative to the optimal operating voltage on the signal value of sub-detector 1. Here, it is denoted as the voltage state S0(i) of sub-detector 1, that is,

[0069] S0(i)=N(i,com) / N(i,rec)×100%,

[0070] N(i, com) represents the signal value measured by the i-th sub-detector under the operating voltage U(i, com). The voltage state S0(i) indicates the effect of the change in the operating voltage of the sub-detector 1 on its signal output. Its subscript "0" indicates the current state of detector 100, that is, the state in which all sub-detectors 1 are subjected to voltage (detector state 0).

[0071] Using the above method, the voltage state S0(i) of all sub-detectors 1 is obtained, i = 1, 2, 3...M.

[0072] Figure 7 This invention demonstrates how the voltage state S0(i) of the sub-detector 1 is determined using a percentage signal output plateau curve in a specific embodiment.

[0073] like Figure 7 As shown, when the horizontal axis value is the actual operating voltage U(i, com) of the sub-detector 1, the vertical axis value of the point on the percentage signal output plateau curve is N(i, com) / N(i, rec)×100%, thus obtaining the voltage state S0(i) of the sub-detector 1.

[0074] Step 3 is explained in detail below.

[0075] After obtaining the voltage state S0(i) of all sub-detectors 1 in detector state 0, proceed to step S3.

[0076] In step S3, the radiation field 3 of the neutron source 4 is measured using the combined detector 100, and the total output signal NO(com) of the combined detector 100 is recorded. The total output signal NO(com) of the combined detector 100 is related to step S1 and the data obtained from step S1. Figure 5 The output signals N(1,com), ..., N(i,com), ..., N(M,com) of each individual sub-detector 1 under the voltage U(i,com) determined by the plateau curve satisfy the following relationship.

[0077] N0(com)=a1·N(1,com)+a2·N(2,com)+……+a M ·N(M, com)

[0078] =a1·S0(1)·N(1, rec)+a2·S0(2)·N(2, rec)+……+a M ·S0(M)·N(M,rec) (1)

[0079] In equation (1),

[0080] a i This describes the impact of the mutual shielding effect between sub-detectors 1 on the signal output of sub-detector 1. In the combined detector 100, other sub-detectors B exist around one sub-detector A. The surrounding sub-detectors B interact with neutrons, thus altering the neutron radiation field measured by sub-detector A. The mutual shielding effect (or self-shielding effect) of the sub-detectors is an interference factor that degrades the performance of detector 100. To improve detector sensitivity, it is necessary to determine the quantitative value of the sub-detector shielding effect to provide a basis for reducing the shielding effect.

[0081] S0(1)~S0(M) are the voltage state parameters of the first to Mth sub-detectors 1 obtained in step S2 under detector state 0, respectively.

[0082] As shown in equation (1), the total output signal N0(com) of the combined detector 100 is not the sum of the individual output signals N(1,com), ..., N(i,com), ..., N(M,com) of each sub-detector 1, but is affected by the mutual shielding effect between the sub-detectors 1 on the signal output of the sub-detectors 1, using parameter a i This indicates the impact.

[0083] In equation (1), a i S0(i)·N(i, rec) is the signal value N(i, rec) of the i-th sub-detector 1 at the optimal operating voltage U(i, rec) multiplied by the mutual shielding effect parameter a of the sub-detectors 1. i Then multiply by the voltage state parameter S0(i) of sub-detector 1 to obtain the contribution of the output signal of sub-detector 1 to the total output signal of the combined detector 100. The output signals a of all sub-detectors 1 are then multiplied. i S0(i) and N(i, rec) are added together to obtain the sum of the output signals of all sub-detectors l in detector state 0, N0(com), which is the total output signal of the combined detector 100.

[0084] In equation (1), only parameter a iUnknown, all other coefficients are known.

[0085] Step 4 is explained in detail below.

[0086] In step S4, without changing the installation position of each sub-detector 1, the position of the neutron source 4, and the state of the radiation field 3, the voltage of the i-th sub-detector 1 among the M sub-detectors 1 is maintained, i = 1, 2, 3, ... M, and the voltage connection of the other M-1 sub-detectors 1 is disconnected, but these sub-detectors 1 with disconnected voltage are still placed in their predetermined setting position 2l.

[0087] Figure 8 This is a schematic diagram illustrating the maintenance of the voltage of a sub-detector 1 according to a specific embodiment of the present invention.

[0088] Figure 8 In the combined detector 100, the first sub-detector 1 (i=1) from top to bottom maintains the voltage connection, and the voltage connection of the sub-detectors 1 (i=2, 3, ... M) is disconnected, so that the state of detector 100 is different from detector state 0, which is denoted as detector state 1.

[0089] In detector state 1, step S2 is executed again to obtain the voltage state S1(i) of all sub-detectors 1, i = 1, 2, 3...M. Since only the first sub-detector 1 is in the working state and the other sub-detectors 1 are not in the working state, only S1(1) is not 0, and S1(2) to S1(M) are all 0.

[0090] Next, step S3 is executed again to measure the total output signal N1(com) of the combined detector 100 in detector state 1. Since only the first sub-detector 1 has an output signal, N1(com) satisfies the following relationship:

[0091] N1(com) = a1·N(1, com)

[0092] =a1·S1(1)·N(1,rec) (2)

[0093] In equation (2),

[0094] a1 represents the effect of the mutual shielding effect between sub-detectors 1 on the signal output of the first sub-detector 1. Although the voltage connection of the second to Mth sub-detectors 1 is disconnected, since the installation position of the sub-detectors 1 and the state of the radiation field 3 remain unchanged, a i No change.

[0095] S1(1) is the voltage state parameter of the first sub-detector 1 in detector state 1.

[0096] This process is repeated sequentially, maintaining the voltage of the i-th sub-detector 1 out of M sub-detectors (i = 1, 2, 3, ..., M), while disconnecting the voltage connections of the other M-1 sub-detectors 1, resulting in M ​​different detector states j (j = 1, 2, 3, ..., M). In M measurements, because only the voltage of the i-th sub-detector 1 is maintained while the voltage connections of the other sub-detectors 1 are disconnected, only S... j (i) is not 0.

[0097] In each detector state j, steps S2 and S3 are executed to measure the voltage state S of the i-th sub-detector 1. j (i), j = 1, 2, 3…M, and the output signal N of the i-th sub-detector 1 j (com), N j (com) satisfies the following relation:

[0098] N j (com) = a i ·N(i, com)

[0099] =a i ·S j (i)·N(i, rec) (3)

[0100] Get a i =N j (com) / S j (i)·N(i,rec).

[0101] By sequentially changing the voltage of the sub-detector maintaining the voltage connection and disconnecting the voltage of the other M-1 sub-detectors, M different detector states j are obtained. After M measurements are performed, M relational expressions (3) are obtained, and the M a values ​​can be calculated. i The value of , that is, the shielding effect parameter a of each sub-detector 1 is obtained. i The value of , i.e., the influence of the mutual shielding effect on the signal output of sub-detector 1.

[0102] As described above, through steps S2 to S4, the influence of the voltage state of sub-detector 1 on the output signal of each sub-detector 1, S0(i), and the influence of the mutual shielding effect between sub-detectors 1 on the output signal of that sub-detector 1, a, can be obtained. i This enables precise calibration.

[0103] In this invention, the shielding effect parameters of the sub-detectors 1 can be obtained simply by comparing the performance of individual sub-detectors 1 at the same position with or without the shielding effect between sub-detectors 1. This is very simple, especially when there are many sub-detectors 1 in the combined detector 100, the method of this invention has obvious advantages.

[0104] Using the obtained S0(i) and ai This can correct the output signal of detector 100, improve the sensitivity and other detection performance of detector 100, and improve the design of detector 100 in subsequent designs based on the measurement results.

[0105] The present invention also provides a high-sensitivity radiation detector 100, which is calibrated using the above-described calibration method, and can achieve high sensitivity and has good detection performance.

[0106] According to the detector and calibration method of the present invention, the plateau characteristic curves of each sub-detector 1 are measured to accurately obtain the change in signal output of the sub-detectors due to voltage division in the combined detector. By maintaining the voltage connection of one sub-detector 1 in the combined detector and disconnecting the voltage connections of other sub-detectors, the detector 100 is placed in different detector states. By comparing the performance of individual sub-detectors 1 at the same position with and without the shielding effect between sub-detectors 1, the shielding effect parameter α between sub-detectors can be obtained. i This decouples the effects of voltage division on the detector from the effects of mutual shielding of the sub-detectors 1, enabling quantitative determination of the impact of voltage division offset and shielding effect on the performance of the combined detector 100. This significantly improves the detection performance of the combined detector, such as sensitivity, and also allows for the acquisition of the characteristics of each sub-detector 1, providing a more comprehensive understanding of the working performance of each sub-detector 1.

[0107] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A method for rapid sensitivity calibration of a high-sensitivity radiation detector, the detector comprising multiple sub-detectors, each sub-detector having a predetermined setting position, the method characterized by comprising the following steps: Step S1: In the radiation field, each of the sub-detectors is set up individually at the predetermined setting position of each sub-detector. The plateau voltage range U(i,min)~U(i,max) of the plateau curve of each sub-detector is measured, as well as the signal value N(i,rec) corresponding to the optimal operating voltage U(i,rec) of each sub-detector, where i=1,2,3,…M, and M is the number of sub-detectors; Step S2: Place all the sub-detectors in their predetermined settings, apply voltage to the detectors, measure the operating voltage U(i, com) of each sub-detector, and adjust the voltage of the detectors so that the operating voltage U(i, com) of each sub-detector is within its plateau voltage range U(i, min) to U(i, max), and obtain the voltage state S0(i) of each sub-detector. Here, S0(i) = N(i, com) / N(i, rec) × 100%, where N(i, com) is the signal value measured by the i-th sub-detector under the operating voltage U(i, com). Step S3: In the radiation field, measure the sum of the output signals N0(com) of all sub-detectors of the detector. N0(com) satisfies the following relationship: N0(com)=a1·N(1,com)+a2·N(2,com)+……+a M ·N(M, as) =a1·S0(1)·N(1,rec)+a2·S0(2)·N(2,rec)+……+a M ·S0(M)·N(M,rec), in, a i This indicates the effect of the mutual shielding effect between sub-detectors on the signal output of the sub-detectors; Step S4: Sequentially maintain the voltage connection of the i-th sub-detector among the M sub-detectors, and disconnect the voltage of the other M-1 sub-detectors to obtain M different detector states j, j = 1, 2, 3...M. Under each detector state j, execute steps S2 and S3 to measure the voltage state S of the i-th sub-detector. j (i), j = 1, 2, 3…M, and the output signal N of the i-th sub-detector j (com), based on the M measurement results, a is calculated. i ; In step S4, when the state of the detector is changed, the position of each sub-detector and the radiation field remain unchanged.

2. The rapid sensitivity calibration method for a high-sensitivity radiation detector according to claim 1, characterized in that, In step S4, In M measurements, the output signal N of the i-th sub-detector is obtained each time. j (com), N j (com) satisfies the following relation: N j (com)=a i ·N(i,com) =a i ·S j (i)·N(i,rec) Get a i =N j (com) / S j (i)·N(i,rec).

3. The rapid sensitivity calibration method for a high-sensitivity radiation detector according to claim 1, characterized in that, In step S1, the plateau curve is normalized, with the voltage V applied to each sub-detector as the abscissa and the ratio N(i,V) / N(i,rec)×100% of the signal value N(i,rec) corresponding to the voltage V to the optimal operating voltage U(i,rec) of the sub-detector as the ordinate, to obtain the plateau curve of the percentage signal output of each sub-detector.

4. The rapid sensitivity calibration method for a high-sensitivity radiation detector according to claim 1 or 2, characterized in that, Using the obtained S0(i) and a i This improves the performance of the detector.

5. A high-sensitivity radiation detector, calibrated using the calibration method as described in any one of claims 1 to 4.

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