A power filter testing device and method, electronic device and storage medium

Abstract

The present application relates to the technical field of electronic testing and measurement, in particular to a power filter testing device and method, electronic equipment and storage medium. The present application relates to a power filter testing method, which is applied to a power filter testing device. The testing target current is obtained from the current measurement module through the first input end, the first potential of the first test end is obtained through the second input end, and the second potential of the second test end is obtained through the third input end. Then, the testing target voltage between the first test end and the second test end is determined according to the first potential and the second potential by the testing module, and whether the testing target voltage meets the first preset condition is judged. When the testing target voltage meets the first preset condition, the index test result is obtained. In this way, the automatic testing of the power filter is realized, and the testing efficiency is improved.

Description

Technical Field

[0001] This invention relates to the field of electronic testing and measurement technology, and in particular to a power filter testing device and method, electronic equipment, and storage medium. Background Technology

[0002] In the mass production of power filters, functional testing is required before shipment to ensure product quality. Furthermore, in the final stage of large-scale production, testing efficiency needs to be improved.

[0003] In the production process of power filters, testing is required before the products are shipped. Conventional testing methods include using multimeters, adjustable power supplies, cement resistors, or manual testing. These methods are inefficient and cannot meet the demands of large-scale mass production. Therefore, improving the testing efficiency of power filters for large-scale mass production has become a major challenge that the industry urgently needs to address. Summary of the Invention

[0004] This invention aims to at least solve one of the technical problems existing in the prior art. To this end, this invention proposes a power filter testing device and method, electronic device, and storage medium, which, for the large-scale mass production of power filters, enables automated testing of power filters and improves the testing efficiency of power filters.

[0005] According to a first aspect of the present invention, a power filter testing device includes a power module, a testing module, a current measurement module, a first testing terminal, and a second testing terminal; wherein the first testing terminal and the second testing terminal are used to connect to the power filter to be tested, and when the power filter is connected, the first potential of the first testing terminal is higher than the second potential of the second testing terminal;

[0006] The power module is used to supply power to the test module and the current measurement module;

[0007] The current measurement module is located between the second test terminal and the first input terminal of the test module, and the current measurement module is used to detect the test target current output by the second test terminal;

[0008] The test module includes a first input terminal, a second input terminal, a third input terminal, and a test output terminal. The first input terminal is used to obtain the target test current from the current measurement module; the second input terminal is used to obtain the first potential of the first test terminal; the third input terminal is used to obtain the second potential of the second test terminal; and the test output terminal is connected to the first test terminal. Specifically, the test module is used to perform filter index detection based on the first potential, the second potential, and the target test current to obtain index detection results.

[0009] Based on the first potential and the second potential, determine the target voltage between the first test terminal and the second test terminal, and determine whether the target voltage meets the first preset condition;

[0010] When the target voltage meets the first preset condition, the test result of the index is obtained.

[0011] According to some embodiments of the present invention, the test module includes a control unit and a transition circuit unit;

[0012] The control unit is used to acquire the target test current through the first input terminal, acquire the first potential through the second input terminal, acquire the second potential through the third input terminal, and perform filter index detection based on the first potential, the second potential and the target test current to generate a test adjustment signal;

[0013] The transition circuit unit is connected to the control unit and is used to obtain the test adjustment signal from the control unit and perform filter index detection based on the test adjustment signal to obtain the index detection result.

[0014] According to some embodiments of the present invention, the test module further includes a voltage drop unit and an analog-to-digital converter connected in series.

[0015] The first input pin of the voltage drop unit serves as the second input terminal of the test module to acquire the first potential; the second input pin of the voltage drop unit serves as the third input terminal of the test module to acquire the second potential; the voltage drop unit is used to perform voltage drop processing after acquiring the first potential and the second potential to obtain the first potential after voltage drop and the second potential after voltage drop.

[0016] The analog-to-digital conversion unit is connected to the control unit; the analog-to-digital conversion unit is used to perform analog-to-digital conversion on the first potential after voltage drop and the second potential after voltage drop, to form a first potential value corresponding to the first potential and a second potential value corresponding to the second potential, and to transmit the first potential value and the second potential value to the control unit.

[0017] According to some embodiments of the present invention, the test module further includes a filtering and shaping unit, and the transition circuit unit is connected to the filtering and shaping unit;

[0018] The filtering and shaping unit is used to shape the potential control signal to obtain the shaped potential control signal; wherein, the potential control signal is generated by the transition circuit unit based on the test adjustment signal and is used for filter index detection.

[0019] According to some embodiments of the present invention, the current measurement module is further connected to a load unit;

[0020] The load unit is located between the current measurement module and the second measurement terminal, and is used to provide a resistive load for the power filter under test.

[0021] A power filter testing method according to a second aspect of the present invention, applied to a power filter testing apparatus, the method comprising:

[0022] The test target current is obtained from the current measurement module through the first input terminal, the first potential of the first test terminal is obtained through the second input terminal, and the second potential of the second test terminal is obtained through the third input terminal.

[0023] The test module performs filter performance testing based on the first potential, the second potential, and the target current to obtain the performance test results. Specifically:

[0024] Based on the first potential and the second potential, determine the target voltage between the first test terminal and the second test terminal, and determine whether the target voltage meets the first preset condition;

[0025] When the target voltage meets the first preset condition, the test result of the index is obtained.

[0026] According to some embodiments of the present invention, obtaining the index test result when the test target voltage meets the first preset condition further includes:

[0027] When the target voltage meets the first preset condition, the first potential is adjusted in multiple rounds based on the preset value range, and the target voltage between the first test terminal and the second test terminal is determined in each round of adjustment. Based on the target voltage corresponding to the multiple rounds of adjustment, the voltage drop change range is obtained, and it is determined whether the voltage drop change range meets the second preset condition.

[0028] When the pressure drop variation range meets the second preset condition, the index test result is obtained.

[0029] According to some embodiments of the present invention, obtaining the index test result when the pressure drop variation range meets the second preset condition further includes:

[0030] When the voltage drop change range meets the second preset condition, the first potential is adjusted in multiple rounds until the first potential meets the preset value, and then it is determined whether the test target current meets the third preset condition.

[0031] When the target current for testing meets the third preset condition, the test result of the index is obtained.

[0032] Thirdly, embodiments of the present invention provide an electronic device, including: a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the power filter testing method as described in any one of the embodiments of the second aspect of the present invention.

[0033] Fourthly, embodiments of the present invention provide a computer-readable storage medium storing a program that is executed by a processor to implement the power filter testing method as described in any one of the embodiments of the second aspect of the present invention.

[0034] The power filter testing apparatus and method, electronic device, and storage medium according to embodiments of the present invention have at least the following beneficial effects:

[0035] A power filter testing device includes a power module, a testing module, a current measurement module, a first testing terminal, and a second testing terminal. The first and second testing terminals are used to connect to the power filter under test. When the power filter is connected, the first potential of the first testing terminal is higher than the second potential of the second testing terminal. According to a second aspect of the present invention, a power filter testing method is applied to a power filter testing device. It requires obtaining a target current from the current measurement module through a first input terminal, obtaining the first potential of the first testing terminal through a second input terminal, and obtaining the second potential of the second testing terminal through a third input terminal. Then, the testing module performs filter performance testing based on the first potential, the second potential, and the target current to obtain the performance test results. Specifically, the target voltage between the first and second testing terminals is first determined based on the first and second potentials, and it is judged whether the target voltage meets a first preset condition. When the target voltage meets the first preset condition, the performance test results are obtained. This achieves automated power filter testing and improves testing efficiency.

[0036] Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0037] The above and / or additional aspects and advantages of the present invention will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, in which:

[0038] Figure 1A , Figure 1B This is a schematic diagram of an optional structure of the power filter testing device provided in an embodiment of the present invention;

[0039] Figure 2 This is a schematic diagram of an optional structure of the power filter testing device provided in an embodiment of the present invention;

[0040] Figure 3 This is a schematic diagram of an optional structure of the power filter testing device provided in an embodiment of the present invention;

[0041] Figure 4 This is a schematic diagram of an optional structure of the power filter testing device provided in an embodiment of the present invention;

[0042] Figure 5 This is a schematic diagram of an optional structure of the power filter testing device provided in an embodiment of the present invention;

[0043] Figure 6 This is a schematic diagram of the power filter testing method provided in an embodiment of the present invention;

[0044] Figure 7 This is another flowchart illustrating the power filter testing method provided in an embodiment of the present invention;

[0045] Figure 8 This is another flowchart illustrating the power filter testing method provided in an embodiment of the present invention;

[0046] Figure 9 This is a schematic diagram of the hardware structure of the electronic device provided in the embodiments of this application. Detailed Implementation

[0047] Embodiments of the present invention are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and should not be construed as limiting the present invention.

[0048] In the description of this invention, "several" means one or more, "more than" means two or more, "greater than," "less than," and "exceeding" are understood to exclude the stated number, while "above," "below," and "within" are understood to include the stated number. The use of "first" and "second" in the description is merely for distinguishing technical features and should not be construed as indicating or implying relative importance, or implicitly indicating the number of indicated technical features, or implicitly indicating the order of the indicated technical features.

[0049] In the description of this invention, it should be understood that the orientation descriptions, such as up, down, left, right, front, back, etc., are based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limiting this invention.

[0050] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "illustrative embodiment," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0051] In the description of this invention, it should be noted that, unless otherwise explicitly defined, terms such as "setting," "installing," and "connecting" should be interpreted broadly. Those skilled in the art can reasonably determine the specific meaning of these terms in this invention in conjunction with the specific content of the technical solution. Furthermore, the identification of specific steps in the following text does not imply a limitation on the order of steps or execution logic. The execution order and logic between each step should be understood and inferred from the content described in the embodiments.

[0052] In the mass production of power filters, functional testing is required before shipment to ensure product quality. Furthermore, in the final stage of large-scale production, testing efficiency needs to be improved.

[0053] In the above process, the main technical specifications of the power filter are: a) power supply voltage drop; b) voltage input range; and c) filter load capacity. For product manufacturing, these specifications need to be tested. However, conventional testing methods, including using multimeters, adjustable power supplies, cement resistors, or manual testing, are inefficient and cannot meet the needs of large-scale mass production. Therefore, improving the testing efficiency of power filters for large-scale mass production has become a major challenge that the industry urgently needs to address.

[0054] This invention aims to solve at least one of the technical problems existing in the prior art. To this end, this invention proposes a power filter testing device and method, electronic equipment, and storage medium, capable of testing three main technical indicators of power filters: power supply voltage drop, voltage input range, and filter load-carrying capacity, thereby achieving automated testing of power filters and improving testing efficiency.

[0055] Reference Figure 1A A power filter testing device 100 according to a first aspect embodiment of the present invention includes a power module 110, a testing module 120, a current measurement module 130, a first test terminal 140 and a second test terminal 150, and a power filter 160 to be tested.

[0056] Reference Figure 1B In some embodiments, the test module 120 of the power filter test apparatus 100 includes a first input terminal 121, a second input terminal 122, a third input terminal 123, and a test output terminal 124.

[0057] The power supply module 110 is used to supply power to the test module 120 and the current measurement module 130. In some embodiments, the test module 120 and the current measurement module 130 need to operate normally when powered on, so the power supply module 110 is required to supply them.

[0058] The first test terminal 140 and the second test terminal 150 are used to connect to the power filter 160 to be tested. When the power filter 160 is connected, the first potential of the first test terminal 140 is higher than the second potential of the second test terminal 150.

[0059] The current measurement module 130 is used to detect the target test current output from the second test terminal 150. In some more specific embodiments, the current measurement module 130 may include a current sensor. The current measurement module is used to measure the target test current of the power filter 160 under test, thereby determining the load-carrying capacity of the power filter under test.

[0060] The test module 120 acquires the target current from the current measurement module 130 through the first input terminal 121, acquires the first potential of the first test terminal 140 through the second input terminal 122, and acquires the second potential of the second test terminal 150 through the third input terminal 123. The test module 120 is used to perform filter performance testing based on the first potential, the second potential, and the target current to obtain performance testing results. In some more specific embodiments, the test module 120 performs filter performance testing based on the first potential, the second potential, and the target current to obtain performance testing results. Specifically, this can be achieved by: determining the target voltage between the first and second test terminals based on the first and second potentials, and determining whether the target voltage meets a first preset condition; when the target voltage meets the first preset condition, obtaining the performance testing result.

[0061] Reference Figure 2 According to some embodiments of the present invention, the test module 120 includes a control unit 125 and a transition circuit unit 126;

[0062] The control unit 125 is used to acquire the target current through the first input terminal 121, the first potential through the second input terminal 122, and the second potential through the third input terminal 123. Based on the first potential, the second potential, and the target current, it performs filter parameter detection to generate a test adjustment signal. In some specific embodiments, the control unit 125 may be a microcontroller unit (MCU), and the test adjustment signal may be pulse-width modulation (PWM). The transition circuit unit 126 is used to acquire the test adjustment signal from the control unit 125 and adjust the first potential through the test output terminal 124. In some specific embodiments, the transition circuit unit 126 may be a MOSFET control circuit.

[0063] Reference Figure 3 According to some embodiments of the present invention, the test module 120 further includes a voltage drop unit 127 and an analog-to-digital converter unit 128 connected in series.

[0064] The first input pin 1271 of the voltage drop unit 127 serves as the second input terminal 122 of the test module to acquire the first potential; the second input pin 1272 of the voltage drop unit 127 serves as the third input terminal 123 of the test module to acquire the second potential; the voltage drop unit 127 performs voltage drop processing after acquiring the first and second potentials to obtain the voltage-dropped first potential and voltage-dropped second potential. The analog-to-digital converter unit 128 performs analog-to-digital conversion on the voltage-dropped first potential and voltage-dropped second potential to form the first potential value corresponding to the first potential and the second potential value corresponding to the second potential, and transmits the first potential value and the second potential value to the control unit 125. The control unit 125 and the analog-to-digital converter unit 128 belong to a low-voltage system and can only measure low-voltage analog signals. However, the input and output voltages of the power filter 160 under test are both high-voltage signals. Therefore, a step-down circuit is needed to convert the high-voltage signal to the low-voltage signal. In some specific embodiments, the voltage drop unit 127 can be implemented as an inverse proportional operation circuit through an operational amplifier to achieve voltage signal step-down processing. Since the voltage signal is an analog signal, the control unit 125 cannot directly recognize it. Therefore, an analog-to-digital converter 128 is needed to convert the analog signal into a digital signal that the control unit 125 can recognize, and then transmit it to the control unit through a communication interface. In some specific embodiments, the analog-to-digital converter 128 can be a control analog-to-digital converter chip.

[0065] Reference Figure 4 According to some embodiments of the present invention, the test module 120 further includes a filter shaping unit 129, and the transition circuit unit 126 is connected to the filter shaping unit 129;

[0066] The filter shaping unit 129 is used to shape the potential control signal to obtain a shaped potential control signal. The potential control signal is generated by the transition circuit unit 126 based on the test adjustment signal and is used for filter performance testing. In some specific embodiments, the filter shaping unit includes a filter shaping circuit, which uses an inductor and capacitor to form a "π-type filter" circuit, reducing circuit ripple and improving test accuracy.

[0067] Reference Figure 5 According to some embodiments of the present invention, the current measurement module 130 is also connected to a load unit 131;

[0068] Load unit 131 provides a resistive load to the power filter 160 under test, simulating a real-world application scenario, thereby making the test results more accurate and improving the test accuracy. In some specific embodiments, the load unit may be a power resistor.

[0069] Reference Figure 6According to a second aspect of the present invention, step S600 of a power filter testing method is applied to a power filter testing apparatus 100. The power filter testing method may include, but is not limited to:

[0070] Step S601: Obtain the target current from the current measurement module through the first input terminal, obtain the first potential of the first test terminal through the second input terminal, and obtain the second potential of the second test terminal through the third input terminal;

[0071] Step S602: The test module performs filter performance testing based on the first potential, the second potential, and the target current to obtain the performance test results. Specifically:

[0072] Determine the target voltage between the first test terminal and the second test terminal based on the first potential and the second potential, and determine whether the target voltage meets the first preset condition.

[0073] When the target voltage meets the first preset condition, the index test result is obtained.

[0074] In step S601 of some embodiments, the target test current is obtained from the current measurement module through the first input terminal, the first potential of the first test terminal is obtained through the second input terminal, and the second potential of the second test terminal is obtained through the third input terminal. It should be noted that the first input terminal is used to obtain the target test current from the current measurement module, the second input terminal is used to obtain the first potential of the first test terminal, and the third input terminal is used to obtain the second potential of the second test terminal. Specifically, the first and second test terminals are used to connect to the power filter under test. When the power filter is connected, the first potential of the first test terminal is higher than the second potential of the second test terminal.

[0075] In step S602 of some embodiments, the first preset condition may be the maximum allowable voltage drop of the power filter. The test target voltage refers to the voltage of the power filter to be tested, which can be determined based on the difference between the first potential and the second potential. The control unit determines whether the test target voltage meets the first preset condition; that is, it determines whether the voltage of the power filter to be tested is less than the maximum voltage drop of the power filter. When the test target voltage meets the first preset condition, the next round of testing continues; when the test target voltage does not meet the first preset condition, the control unit records and reports the unqualified data, and the test is completed. At this point, the test of the power voltage drop, one of the technical indicators of the power filter, is completed. It should be noted that the control unit can connect to external devices by adding a host computer communication interface to automatically upload test data to external devices and automatically archive and record it.

[0076] The power filter testing method applied to the power filter testing device described above obtains the target current from the current measurement module through the first input terminal, the first potential of the first test terminal through the second input terminal, and the second potential of the second test terminal through the third input terminal. Then, the testing module determines the target voltage between the first and second test terminals based on the first and second potentials, and judges whether the target voltage meets the first preset condition. When the target voltage meets the first preset condition, the index test result is obtained, realizing the voltage drop test of the power filter, achieving the purpose of automated testing of the power filter, and improving the testing efficiency of the power filter.

[0077] Reference Figure 7 According to some embodiments of the present invention, step S602, when the target voltage meets the first preset condition, obtains the index test result, which may include, but is not limited to:

[0078] Step S701: When the target voltage meets the first preset condition, the first potential is adjusted in multiple rounds based on the preset value range, and the target voltage between the first test terminal and the second test terminal is determined in each round of adjustment. Based on the target voltage in the multiple rounds of adjustment, the voltage drop change range is obtained, and it is determined whether the voltage drop change range meets the second preset condition.

[0079] Step S702: When the pressure drop variation range meets the second preset condition, the index test result is obtained.

[0080] In step S701 of some embodiments, the preset value range refers to the minimum and maximum values ​​of the first potential, and the second preset condition refers to the range consisting of the minimum and maximum values ​​of the target voltage. Specifically, when the target voltage meets the first preset condition, the control unit determines whether the first potential is within the preset value range. When the first potential is within the preset value range, the control unit obtains the potential control signal by increasing the PWM duty cycle control transition circuit unit, and then adjusts the first potential by performing shaping processing through the filtering and shaping unit. At this time, the second potential will also change accordingly. Then, the target voltage between the first test terminal and the second test terminal is determined. This adjustment is performed in multiple rounds until the first potential reaches the maximum value of the preset value range. Thus, the voltage drop change range of the target voltage is obtained. Then, the control unit determines whether the voltage drop change range meets the second preset condition.

[0081] In step S702 of some embodiments, if the voltage drop variation range meets the second preset condition, the test continues to the next round; if the voltage drop variation range does not meet the second preset condition, the control unit records and reports the unqualified data, and the test is completed. At this time, the test of the voltage input range, one of the technical indicators of the power filter, is completed. It should be noted that the control unit can connect to external devices by adding a host computer communication interface to realize automatic uploading of test data to external devices and automatic archiving.

[0082] The power filter testing method described above, applied to a power filter testing device, involves adjusting the first potential multiple times based on a preset value range when the target voltage meets the first preset condition. In each adjustment round, the target voltage between the first and second test terminals is determined. Based on the target voltages from these multiple adjustments, the voltage drop variation range is obtained, and it is determined whether this range meets the second preset condition. When the voltage drop variation range meets the second preset condition, the test result is obtained. This method achieves the voltage input range testing of the power filter, realizing automated testing and improving the testing efficiency.

[0083] Reference Figure 8 According to some embodiments of the present invention, step S702, when the pressure drop variation range meets the second preset condition, obtains the index test result, and may include, but is not limited to:

[0084] Step S801: When the voltage drop change range meets the second preset condition, the first potential is adjusted multiple times until the first potential meets the preset value, and then it is determined whether the test target current meets the third preset condition.

[0085] Step S802: When the target current meets the third preset condition, the index test result is obtained.

[0086] In step S801 of some embodiments, the preset value refers to the maximum value of the first potential, and the third preset condition refers to Imax*(1-η)≤Io≤Imax*(1+η) when Vi=Vimax, where Vi is the first potential, Vimax is the specified maximum value of the first potential, Imax refers to the maximum load current of the power filter, η refers to the specified standard deviation, * indicates multiplication operation, and Io refers to the test target current, that is, the load current of the power filter.

[0087] Specifically, when the voltage drop change range meets the second preset condition, the control unit obtains the potential control signal by increasing the PWM duty cycle control transition circuit unit, and then adjusts the first potential by the filtering and shaping unit until the first potential meets the preset value. The control unit obtains the test target current from the current measurement module and then determines whether the test target current meets the third preset condition.

[0088] In step S702 of some embodiments, when the target test current does not meet the second preset condition, the control unit records and reports the unqualified data; when the target test current meets the third preset condition, the product is qualified and the test is completed. At this time, the test of the load-carrying capacity, one of the technical indicators of the power filter, is completed. It should be noted that the control unit can connect to external devices by adding a host computer communication interface to realize automatic uploading of test data to external devices and automatic archiving.

[0089] The power filter testing method described above, applied to a power filter testing device, involves adjusting the first potential multiple times until it meets a preset value when the voltage drop variation range meets the second preset condition. Then, it determines whether the target current meets the third preset condition. When the target current meets the third preset condition, the test result is obtained. This method achieves the load-carrying capacity testing of the power filter, realizing automated testing and improving the testing efficiency.

[0090] The power filter testing method described above, applied to the power filter testing device, tested three main technical indicators of the power filter: power supply voltage drop, voltage input range, and filter load capacity. The test results were recorded and reported, thereby realizing automated testing of power filters and improving testing efficiency.

[0091] Figure 9 An electronic device 900 according to an embodiment of the present invention is shown. The electronic device 900 includes: a processor 901, a memory 902, and a computer program stored in the memory 902 and executable on the processor 901. When the computer program is executed, it is used to perform the power filter test method described above.

[0092] The processor 901 and memory 902 can be connected via a bus or other means.

[0093] The memory 902, as a non-transitory computer-readable storage medium, can be used to store non-transitory software programs and non-transitory computer-executable programs, such as the power filter testing method described in this embodiment of the invention. The processor 901 implements the aforementioned power filter testing method by running the non-transitory software program and instructions stored in the memory 902.

[0094] The memory 902 may include a program storage area and a data storage area. The program storage area may store the operating system and application programs required for at least one function. The data storage area may store the power filter test method described above. Furthermore, the memory 902 may include high-speed random access memory 902, and may also include non-transitory memory 902, such as at least one storage device, flash memory, or other non-transitory solid-state storage device. In some embodiments, the memory 902 may optionally include remotely located memories 902 relative to the processor 901, which can be connected to the electronic device 900 via a network. Examples of such networks include, but are not limited to, the Internet, intranets, local area networks, mobile communication networks, and combinations thereof.

[0095] The non-transient software program and instructions required to implement the power filter test method described above are stored in memory 902. When executed by one or more processors 901, the power filter test method described above is performed. For example, Figure 6 Method steps S601 to S602, Figure 7 Method steps S701 to S702, Figure 8 The method steps S801 to S802.

[0096] This invention also provides a computer-readable storage medium storing computer-executable instructions for performing the power filter test method described above.

[0097] In one embodiment, the computer-readable storage medium stores computer-executable instructions that are executed by one or more control processors, for example, Figure 6 Method steps S601 to S602, Figure 7 Method steps S701 to S702, Figure 8 The method steps S801 to S802.

[0098] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs.

[0099] Those skilled in the art will understand that all or some of the steps and systems in the methods disclosed above can be implemented as software, firmware, hardware, and suitable combinations thereof. Some or all of the physical components can be implemented as software executed by a processor, such as a central processing unit, digital signal processor, or microprocessor, or as hardware, or as an integrated circuit, such as an application-specific integrated circuit. Such software can be distributed on a computer-readable medium, which can include computer storage media (or non-transitory media) and communication media (or transient media). As is known to those skilled in the art, the term computer storage media includes volatile and non-volatile, removable and non-removable media implemented in any method or technology for storing information (such as computer-readable instructions, data structures, program modules, or other data). Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technologies, CD-ROM, digital versatile disc (DVD) or other optical disc storage, magnetic cartridges, magnetic tape, storage device storage or other magnetic storage devices, or any other medium that can be used to store desired information and is accessible to a computer. Furthermore, as is known to those skilled in the art, communication media typically include computer-readable instructions, data structures, program modules, or other data in modulated data signals such as carrier waves or other transmission mechanisms, and may include any information delivery medium. It should also be understood that the various embodiments provided in this invention can be arbitrarily combined to achieve different technical effects.

[0100] The above provides a detailed description of the preferred embodiments of the present invention. However, the present invention is not limited to the above embodiments. Those skilled in the art can make various equivalent modifications or substitutions without departing from the spirit of the present invention. All such equivalent modifications or substitutions are included within the scope defined by the claims of the present invention.

Claims

1. A power filter test apparatus, characterized by, The power supply module, the test module, the current measurement module, the first test terminal and the second test terminal are included, wherein the first test terminal and the second test terminal are used for accessing the power filter to be tested, when the power filter is accessed, the first potential of the first test terminal is higher than the second potential of the second test terminal; The power supply module is used for supplying power to the test module and the current measurement module; The current measurement module is arranged between the second test terminal and the first input terminal of the test module, and is used for detecting the test target current output by the second test terminal; The test module includes the first input terminal, the second input terminal, the third input terminal and the test output terminal, the first input terminal is used for obtaining the test target current from the current measurement module, the second input terminal is used for obtaining the first potential of the first test terminal, the third input terminal is used for obtaining the second potential of the second test terminal, and the test output terminal is connected to the first test terminal; wherein the test module is used for performing filter index detection according to the first potential, the second potential and the test target current to obtain an index detection result, specifically: determining the test target voltage between the first test terminal and the second test terminal according to the first potential and the second potential, and judging whether the test target voltage meets a first preset condition; when the test target voltage meets the first preset condition, the index test result is obtained.

2. The power filter test device of claim 1, wherein, The test module includes a control unit and a transition circuit unit; The control unit is used for obtaining the test target current through the first input terminal, obtaining the first potential through the second input terminal, obtaining the second potential through the third input terminal, and performing filter index detection according to the first potential, the second potential and the test target current to generate a test adjustment signal; The transition circuit unit is connected to the control unit, and is used for obtaining the test adjustment signal from the control unit and performing filter index detection based on the test adjustment signal to obtain the index detection result.

3. The power filter test device of claim 2, wherein, The test module further includes a voltage drop unit and an analog-to-digital conversion unit connected in series; The first input pin of the voltage drop unit is used as the second input terminal of the test module to obtain the first potential, and the second input pin of the voltage drop unit is used as the third input terminal of the test module to obtain the second potential; The voltage drop unit is used for voltage drop processing after obtaining the first potential and the second potential to obtain the first potential after voltage drop and the second potential after voltage drop; The analog-to-digital conversion unit is connected to the control unit; The analog-to-digital conversion unit is used for analog-to-digital conversion of the first potential after voltage drop and the second potential after voltage drop to form a first potential value corresponding to the first potential and a second potential value corresponding to the second potential, and transmit the first potential value and the second potential value to the control unit.

4. The power filter test device of claim 2, wherein, The test module further includes a filter and shaping unit, and the transition circuit unit is connected to the filter and shaping unit; The filter shaping unit is configured to perform shaping processing on the potential control signal to obtain a shaped potential control signal; wherein the potential control signal is generated by the transition circuit unit based on the test adjustment signal, and is used for filter index detection.

5. The power filter test device of claim 1, wherein, The current measurement module is further connected with a load unit; The load unit is arranged between the current measurement module and the second measurement end, and is configured to provide a resistive load for the to-be-tested power filter.

6. A power filter testing method, characterized by, The method is applied to the power filter test device of any one of claims 1 to 5, and the method comprises: obtaining a test target current from the current measurement module through a first input end, obtaining a first potential of the first test end through a second input end, and obtaining a second potential of the second test end through a third input end; performing filter index detection on the first potential, the second potential, and the test target current by the test module to obtain an index test result, and specifically: determining a test target voltage between the first test end and the second test end according to the first potential and the second potential, and determining whether the test target voltage meets a first preset condition; when the test target voltage meets the first preset condition, obtaining the index test result.

7. The method of claim 6, wherein, when the test target voltage meets the first preset condition, obtaining the index test result, further comprises: when the test target voltage meets the first preset condition, performing multiple rounds of adjustment on the first potential based on a preset value interval, and determining the corresponding test target voltage between the first test end and the second test end in each round of adjustment, obtaining a voltage drop change interval according to the corresponding test target voltage in multiple rounds of adjustment, and determining whether the voltage drop change interval meets a second preset condition; when the voltage drop change interval meets the second preset condition, obtaining the index test result.

8. The method of claim 7, wherein, when the voltage drop change interval meets the second preset condition, obtaining the index test result, further comprises: when the voltage drop change interval meets the second preset condition, performing multiple rounds of adjustment on the first potential until the first potential meets the preset value, and then determining whether the test target current meets a third preset condition; when the test target current meets the third preset condition, obtaining the index test result.

9. An electronic device, comprising: comprises: a memory and a processor, the memory stores a computer program, and the processor implements the power filter test device and method of any one of claims 1 to 8 when executing the computer program.

10. A computer-readable storage medium, characterized in that, The storage medium stores a program, and the program is executed by the processor to implement the power filter test device and method of any one of claims 1 to 8.

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