A burst received optical power calibration method and apparatus
By calculating the reference ADC value and performing two-dimensional compensation for temperature and optical power within a preset optical power range, the problem of temperature error influence in the prior art is solved, and high-precision optical power calibration is achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- ACCELINK TECHNOLOGIES CO LTD
- Filing Date
- 2022-06-30
- Publication Date
- 2026-05-19
AI Technical Summary
Existing burst-received optical calibration methods cannot effectively filter out errors introduced by temperature factors, resulting in insufficient accuracy of the ADC value output by the optical receiver device, which cannot meet the requirements for high-precision optical power reporting.
By calculating the relationship between the sampled ADC value and temperature within a preset optical power range, a reference ADC value is obtained. Two-dimensional compensation for temperature and optical power is then performed. The influence of temperature characteristics is offset by temperature compensation coefficients and constants. Combined with optical power calibration coefficients and constants, accurate calculation of optical power is achieved.
It improves the accuracy of optical power reporting, meets the accuracy requirements of optical power ranges, and realizes high-precision optical power calibration under different temperature and optical power conditions.
Smart Images
Figure CN117375727B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of communication technology, and in particular to a method and apparatus for calibrating burst received optical power. Background Technology
[0002] Various OLT modules in the access network need to report bursts of received light. The reporting range of received light is relatively wide, from the overload point to below the sensitivity threshold, and high reporting accuracy is required, within ±2dB. In applications requiring high optical receiving sensitivity, optical receivers using APDs (Optical Photodiodes) are typically employed. The intensity of the received optical signal is based on the photocurrent, which is converted into an optical voltage by the module circuit and then sampled by a microcontroller. Due to the material characteristics and temperature characteristics of the APD device, noise, and the performance of the conversion circuit, the original sampled voltage obtained under the same received optical power conditions will have deviations or fluctuations. Traditional calibration methods use second-order or third-order curve fitting to convert the ADC into a power value (unit: 0.1uW). This method usually cannot meet the reporting accuracy requirements of the module across the entire power range and cannot filter out errors introduced by temperature noise and other factors.
[0003] Therefore, overcoming the shortcomings of the existing technology is an urgent problem to be solved in this technical field. Summary of the Invention
[0004] The technical problem to be solved by this invention is that existing burst receiving optical calibration cannot filter out errors introduced by temperature factors.
[0005] The present invention adopts the following technical solution:
[0006] In a first aspect, the present invention provides a burst received optical power calibration method, comprising:
[0007] Based on the relationship between the sampled ADC value and temperature in each first optical power range, the current temperature, and the current ADC value, the first optical power range corresponding to the current ADC value is determined. Based on the relationship between the sampled ADC deviation and the temperature deviation in the first optical power range, the reference ADC value corresponding to the current ADC value is calculated. Wherein, the sampled ADC deviation is the deviation of the sampled ADC value relative to the reference ADC value, and the temperature deviation is the deviation between the temperature at the time of sampling and the reference temperature.
[0008] Based on the reference ADC value, the corresponding second optical power range is determined, and the corresponding reported optical power is calculated based on the relationship between the optical power in the second optical power range and the reference ADC value.
[0009] Among them, multiple consecutive first optical power ranges are preset, and the relationship between the sampling ADC value and temperature in the corresponding first optical power range, as well as the relationship between the sampling ADC deviation and temperature deviation in the corresponding first optical power range, are measured; multiple consecutive second optical power ranges are preset, and the relationship between the optical power and the reference ADC value in the corresponding second optical power range is measured.
[0010] Preferably, determining the first optical power range corresponding to the current ADC value based on the relationship between the sampled ADC value and temperature in each first optical power range, the current temperature, and the current ADC value specifically includes:
[0011] Based on the relationship between the sampled ADC values of each first optical power range and temperature, the sampled ADC range corresponding to each first optical power range at the current temperature is calculated. The sampled ADC range in which the current ADC value is located is then compared to obtain the corresponding first optical power range.
[0012] Preferably, the step of calculating the reference ADC value corresponding to the current ADC value based on the relationship between the sampling ADC deviation and the temperature deviation in the first optical power range specifically includes:
[0013] Based on the relationship between the sampling ADC deviation and the temperature deviation, a corresponding temperature compensation coefficient and a temperature compensation constant are determined. The ADC deviation compensation value is obtained by multiplying the difference between the current temperature and the reference temperature by the temperature compensation coefficient and adding the temperature compensation constant. Specifically, when the current temperature is higher than the reference temperature, the corresponding temperature compensation coefficient and temperature compensation constant are determined based on the relationship between the sampling ADC deviation and the temperature deviation in the high-temperature range. When the current temperature is lower than the reference temperature, the corresponding temperature compensation coefficient and temperature compensation constant are determined based on the relationship between the sampling ADC deviation and the temperature deviation in the low-temperature range.
[0014] The corresponding reference ADC value is obtained by adding the ADC deviation compensation value to the current ADC value.
[0015] Preferably, the step of calculating the corresponding reported optical power based on the relationship between the optical power in the second optical power range and the reference ADC value specifically includes:
[0016] Based on the relationship between the optical power and the reference ADC value, the corresponding optical power calibration coefficient and optical power calibration constant are determined. The reported optical power is obtained by multiplying the reference ADC value corresponding to the current ADC value by the optical power calibration coefficient and adding the optical power calibration constant.
[0017] Preferably, the relationship between the sampling ADC value and temperature in the corresponding first optical power range, and the relationship between the sampling ADC deviation and temperature deviation in the corresponding first optical power range are measured, specifically including:
[0018] Under the corresponding optical power conditions, the sampled ADC values at different temperatures and the reference ADC values at the reference temperature are collected. Based on the different temperature values and the corresponding sampled ADC values, the relationship between the sampled ADC values and the temperature corresponding to the corresponding optical power is fitted. Based on the difference between the different temperature values and the reference temperature, and the difference between the corresponding sampled ADC values and the reference ADC values, the relationship between the sampled ADC deviation and the temperature deviation corresponding to the corresponding optical power is fitted.
[0019] The critical maximum power value or critical minimum power value of each first optical power range is used as the sampling point. The relationship between the sampling ADC value corresponding to the sampling point and the temperature is used as the relationship between the sampling ADC value and the temperature of the corresponding first optical power range. The relationship between the sampling ADC deviation corresponding to the sampling point and the temperature deviation is used as the relationship between the sampling ADC deviation and the temperature deviation of the corresponding first optical power range.
[0020] Preferably, the first optical power range is one or more of the following: no light to -32dBm, -32dBm to -30dBm, -30dBm to -25dBm, -25dBm to -18dBm, and -18dBm to -8dBm.
[0021] Preferably, the measurement of the relationship between the optical power in the corresponding second optical power range and the reference ADC value specifically includes:
[0022] Multiple acquisition points are selected within the second optical power range or at the critical position of the second power range. At the reference temperature, the reference ADC value corresponding to the acquisition point is acquired. Based on the multiple acquisition points in the second optical power range and the corresponding reference ADC value, the relationship between the optical power of the second optical power range and the reference ADC value is fitted.
[0023] Preferably, the second optical power range is one or more of the following: no light to -32dBm, -32dBm to -30dBm, -30dBm to -28dBm, -28dBm to -25dBm, -25dBm to -22dBm, -22dBm to -18dBm, -18dBm to -15dBm, -15dBm to -13dBm, and -13dBm to -18dBm.
[0024] Preferably, the method determines the digital content of the optical signal received during the corresponding compensation period when the initial calculation of each set of relationships is obtained; in practical applications, the method further includes:
[0025] In each round of compensation adjustment, in addition to determining the corresponding second optical power range based on the reference ADC value and calculating the corresponding reported optical power based on the relationship between the optical power in the second optical power range and the reference ADC value, the digital content of the optical signal received in the corresponding compensation period is also parsed, and the parsed digital content is compared and analyzed with the digital content at the initial calculation to obtain the reported optical power after further weighted compensation.
[0026] The relationships include the relationship between the sampled ADC value and temperature, the relationship between the sampled ADC deviation and temperature deviation, and the relationship between optical power and the reference ADC value.
[0027] In a second aspect, the present invention also provides a burst received optical power calibration device for implementing the burst received optical power calibration method described in the first aspect, the device comprising:
[0028] At least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor for performing the burst received optical power calibration method described in the first aspect.
[0029] Thirdly, the present invention also provides a non-volatile computer storage medium storing computer-executable instructions that are executed by one or more processors to perform the burst received optical power calibration method described in the first aspect.
[0030] This invention compensates for the temperature of the ADC value output by the optical receiver by pre-setting the relationship between the sampling ADC value and temperature, and the relationship between the sampling ADC deviation and temperature deviation. This counteracts the influence of temperature characteristics on the accuracy of the output ADC of the optical receiver. Furthermore, different relationships between the sampling ADC value and temperature, and between the sampling ADC deviation and temperature deviation, are applied to different optical power ranges. This allows for compensation not only for temperature but also for the deviation of the ADC value sampled under different power conditions. Thus, through a single compensation calculation, two-dimensional compensation for temperature and power deviations is achieved. The compensated reference ADC value is then used to calculate the optical power, thereby improving the accuracy of the reported optical power and meeting the optical power reporting requirements of different optical power ranges. Attached Figure Description
[0031] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the embodiments of the present invention will be briefly described below. Obviously, the drawings described below are merely some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without any creative effort.
[0032] Figure 1 This is a flowchart of a burst received optical power calibration method provided in an embodiment of the present invention;
[0033] Figure 2 This is a flowchart of a burst received optical power calibration method provided in an embodiment of the present invention;
[0034] Figure 3 This is a flowchart of a burst received optical power calibration method provided in an embodiment of the present invention;
[0035] Figure 4 This is a table showing the relationship between optical power and a reference ADC value, provided by an embodiment of the present invention.
[0036] Figure 5 This is a flowchart of a burst received optical power calibration method provided in an embodiment of the present invention;
[0037] Figure 6 This is a table showing the relationship between sampling ADC values and temperature in the high-temperature range, provided by an embodiment of the present invention.
[0038] Figure 7 This is a table showing the relationship between the sampled ADC value and temperature in the low-temperature range, provided by an embodiment of the present invention.
[0039] Figure 8 This is a table showing the relationship between sampling ADC deviation and temperature deviation in the high-temperature region, provided by an embodiment of the present invention.
[0040] Figure 9 This is a table showing the relationship between sampling ADC deviation and temperature deviation in the low-temperature range, provided by an embodiment of the present invention.
[0041] Figure 10 This is a flowchart of a burst received optical power calibration method provided in an embodiment of the present invention;
[0042] Figure 11 This is a flowchart of a burst received optical power calibration method provided in an embodiment of the present invention;
[0043] Figure 12 This is a schematic diagram of the architecture of a burst received optical power calibration device provided in an embodiment of the present invention. Detailed Implementation
[0044] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention.
[0045] Furthermore, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.
[0046] Example 1:
[0047] Embodiment 1 of the present invention provides a burst received optical power calibration method, such as... Figure 1 As shown, it includes:
[0048] In step 201, the first optical power range corresponding to the current ADC value is determined based on the relationship between the sampled ADC value and temperature in each first optical power range, the current temperature, and the current ADC value. The reference ADC value corresponding to the current ADC value is calculated based on the relationship between the sampled ADC deviation and temperature deviation in the first optical power range.
[0049] Wherein, the sampling ADC deviation is the deviation of the sampling ADC value relative to the reference ADC value, and the temperature deviation is the deviation between the sampling temperature and the reference temperature.
[0050] In step 202, a corresponding second optical power range is determined based on the reference ADC value, and the corresponding reported optical power is calculated based on the relationship between the optical power in the second optical power range and the reference ADC value.
[0051] Among them, multiple consecutive first optical power ranges are preset, and the relationship between the sampling ADC value and temperature in the corresponding first optical power range, as well as the relationship between the sampling ADC deviation and temperature deviation in the corresponding first optical power range, are measured; multiple consecutive second optical power ranges are preset, and the relationship between the optical power and the reference ADC value in the corresponding second optical power range is measured.
[0052] The sampled ADC value is the value actually collected under the corresponding temperature conditions, the current ADC value is the ADC value collected at the current time and current temperature, and the reference ADC value is the ADC value collected under reference temperature conditions. The reference temperature is determined by those skilled in the art based on the device characteristics of the optical receiver and the possible operating environment of the optical receiver. Typically, the reference temperature is the optimal operating temperature of the optical receiver.
[0053] The relationship between the sampled ADC value and temperature represents the change of the sampled ADC value with temperature at a corresponding optical power. The relationship between the sampled ADC deviation and temperature deviation represents the magnitude of the drift of the sampled ADC value due to temperature at a corresponding optical power. The relationship between optical power and the reference ADC value represents the relationship between the reference ADC value and optical power at a reference temperature. The first optical power range and the second optical power range are obtained by those skilled in the art based on the relationship between the temperature and ADC value, and the ADC value and optical power of the optical receiving device used.
[0054] This embodiment uses preset relationships between sampling ADC values and temperature, and between sampling ADC deviation and temperature deviation, to perform temperature compensation on the ADC values output by the optical receiver. This compensates for the impact of temperature characteristics on the accuracy of the output ADC of the optical receiver. Furthermore, different relationships between sampling ADC values and temperature, and between sampling ADC deviation and temperature deviation, are applied to different optical power ranges. This allows for temperature compensation while also compensating for the deviation of the ADC values sampled under different power conditions. Thus, through a single compensation calculation, two-dimensional compensation for temperature and power deviations is achieved. The compensated reference ADC value is then used to calculate the optical power, improving the accuracy of the reported optical power and meeting the optical power reporting requirements for different optical power ranges.
[0055] The step of determining the first optical power range corresponding to the current ADC value based on the relationship between the sampled ADC value and temperature in each first optical power range, the current temperature, and the current ADC value specifically includes:
[0056] Based on the relationship between the sampled ADC values of each first optical power range and temperature, the sampled ADC range corresponding to each first optical power range at the current temperature is calculated. The sampled ADC range in which the current ADC value is located is then compared to obtain the corresponding first optical power range.
[0057] As a preferred implementation, the comparison to determine the sampling ADC interval of the current ADC value can be achieved through a binary search method. That is, the critical values of multiple first optical power intervals are sorted according to their optical power. Starting with the optical power at the middle position of the sort, the corresponding sampling ADC value is calculated. The current ADC value is compared with the sampling ADC value, thereby selecting the first half or the second half of the sort as the next comparison interval. In each comparison, the middle value within the corresponding comparison interval is selected for comparison. The next comparison interval is determined based on the comparison result until the final comparison interval corresponds to a first optical power interval.
[0058] The step of calculating the reference ADC value corresponding to the current ADC value based on the relationship between the sampling ADC deviation and the temperature deviation in the first optical power range specifically includes:
[0059] Based on the relationship between the sampling ADC deviation and the temperature deviation, a corresponding temperature compensation coefficient and a temperature compensation constant are determined. The ADC deviation compensation value is obtained by multiplying the difference between the current temperature and the reference temperature by the temperature compensation coefficient and adding the temperature compensation constant. Specifically, when the current temperature is higher than the reference temperature, the corresponding temperature compensation coefficient and temperature compensation constant are determined based on the relationship between the sampling ADC deviation and the temperature deviation in the high-temperature range. When the current temperature is lower than the reference temperature, the corresponding temperature compensation coefficient and temperature compensation constant are determined based on the relationship between the sampling ADC deviation and the temperature deviation in the low-temperature range.
[0060] The corresponding reference ADC value is obtained by adding the ADC deviation compensation value to the current ADC value.
[0061] This embodiment determines high and low temperature conditions based on the current temperature, and then uses the relationship between sampling ADC deviation and temperature deviation in the high-temperature range and the relationship between sampling ADC deviation and temperature deviation in the low-temperature range to correspond to different temperature compensation coefficients and temperature compensation constants, making temperature compensation more accurate.
[0062] The step of calculating the corresponding reported optical power based on the relationship between the optical power in the second optical power range and the reference ADC value specifically includes:
[0063] Based on the relationship between the optical power and the reference ADC value, the corresponding optical power calibration coefficient and optical power calibration constant are determined. The reported optical power is obtained by multiplying the reference ADC value corresponding to the current ADC value by the optical power calibration coefficient and adding the optical power calibration constant.
[0064] The measurements obtained the relationship between the sampled ADC value and temperature for each first optical power range, and the relationship between the sampled ADC deviation and temperature deviation for each first optical power range, such as... Figure 2 As shown, it specifically includes:
[0065] In step 301, under the corresponding optical power conditions, the sampled ADC values at different temperatures and the reference ADC value at the reference temperature are collected.
[0066] In step 302, based on different temperature values and the corresponding sampling ADC values, the relationship between the sampling ADC value corresponding to the corresponding optical power and the temperature is fitted.
[0067] In step 303, based on the difference between different temperature values and the reference temperature, and the difference between the corresponding sampled ADC value and the reference ADC value, the relationship between the sampled ADC deviation and the temperature deviation corresponding to the corresponding optical power is fitted.
[0068] In step 304, the critical maximum power value or critical minimum power value of each first optical power range is used as the sampling point, the relationship between the sampling ADC value corresponding to the sampling point and the temperature is used as the relationship between the sampling ADC value and the temperature of the corresponding first optical power range, and the relationship between the sampling ADC deviation corresponding to the sampling point and the temperature deviation is used as the relationship between the sampling ADC deviation and the temperature deviation of the corresponding first optical power range.
[0069] The relationship between the sampled ADC value and temperature is as follows:
[0070] ADC_t=slope_t×temp+offset_t
[0071] `temp` represents the temperature at which the data was acquired, and `ADC_t` represents the sampled ADC value acquired at temperature `temp`. `slope_t` and `offset_t` are the corresponding coefficients and constants, obtained by linear fitting from the acquired `ADC_t` and `temp` values.
[0072] The relationship between the sampling ADC deviation and the temperature deviation is as follows:
[0073] ADC_R-ADC_t=slope_r×(temp-temp_st)+offset_r
[0074] temp is the temperature at which ADC_t is acquired, ADC_t is the sampled ADC value acquired at the temperature temp, ADC_R is the reference ADC value acquired at the current optical power and the reference temperature, temp_st is the reference temperature, slope_r is the temperature compensation coefficient, offset_r is the temperature compensation constant, and slope_r and offset_r are obtained by linear fitting of the acquired ADC_t, ADC_R, temp, and temp_st.
[0075] In conjunction with the above preferred embodiments, there is also a preferred method, namely, fitting the relationship between the sampling ADC value corresponding to the optical power and the temperature as follows: based on the temperature value when it is higher than the reference temperature and the sampling ADC value, the relationship between the sampling ADC value and the temperature in the high temperature range is fitted; based on the temperature value when it is lower than the reference temperature and the sampling ADC value, the relationship between the sampling ADC value and the temperature in the low temperature range is fitted.
[0076] The relationship between the sampling ADC deviation and temperature deviation corresponding to the corresponding optical power is obtained by fitting: based on the temperature value above the reference temperature, the sampling ADC value, the reference temperature and the reference ADC value, the relationship between the sampling ADC deviation and temperature deviation in the high temperature range is obtained by fitting; based on the temperature value below the reference temperature, the sampling ADC value, the reference temperature and the reference ADC value, the relationship between the sampling ADC deviation and temperature deviation in the low temperature range is obtained by fitting.
[0077] The first optical power range is one or more of the following: no light to -32dBm, -32dBm to -30dBm, -30dBm to -25dBm, -25dBm to -18dBm, and -18dBm to -8dBm.
[0078] The measurement obtains the relationship between the optical power in each second optical power range and the reference ADC value, specifically including:
[0079] Multiple acquisition points are selected within the second optical power range or at the critical position of the second power range. At the reference temperature, the reference ADC value corresponding to the acquisition point is acquired. Based on the multiple acquisition points in the second optical power range and the corresponding reference ADC value, the relationship between the optical power of the second optical power range and the reference ADC value is fitted.
[0080] The relationship between the optical power and the reference ADC value is as follows:
[0081] RSSI = slope × ADC_R + offset
[0082] RSSI is the optical power, slope is the optical power calibration coefficient, offset is the optical power calibration constant, and ADC_R is the normalized reference ADC value corresponding to the sampled ADC value.
[0083] The second optical power range is one or more of the following: no light to -32dBm, -32dBm to -30dBm, -30dBm to -28dBm, -28dBm to -25dBm, -25dBm to -22dBm, -22dBm to -18dBm, -18dBm to -15dBm, -15dBm to -13dBm, and -13dBm to -18dBm.
[0084] In practical applications, when determining the initial calculations of each set of relationships, the method also includes: the digital content of the optical signal received during the corresponding compensation period;
[0085] In each round of compensation adjustment, in addition to determining the corresponding second optical power range based on the reference ADC value and calculating the corresponding reported optical power based on the relationship between the optical power in the second optical power range and the reference ADC value, the digital content of the optical signal received in the corresponding compensation period is also parsed, and the parsed digital content is compared and analyzed with the digital content at the initial calculation to obtain the reported optical power after further weighted compensation.
[0086] The relationships include the relationship between the sampled ADC value and temperature, the relationship between the sampled ADC deviation and temperature deviation, and the relationship between optical power and the reference ADC value.
[0087] Specifically: Based on the 1, 0 distribution of the optical signal used when measuring each set of relationships, the 1, 0 distribution of the optical signal received when actually reporting the optical power is compared. Based on the difference between the two distributions, further compensation is made to the calculation of the reported optical power.
[0088] If an all-1 encoded optical signal is used when calculating each set of relationships, and the test time for obtaining the corresponding relationship is assumed to be 10ms, then the reception of the all-1 encoded optical signal for 10ms is completed accordingly.
[0089] When calculating optical power based on ADC values, the 0s and 1s contained in the corresponding optical signal digital content (i.e., encoding) are determined according to the actual transmitted content. Therefore, the comparison analysis involves comparing the 0 and 1 ratios of the latter to generate a compensation value. This further considers that in practical applications, data content is continuously transmitted within the channel, resulting in a 0 and 1 distribution. Different 0 and 1 ratios lead to different analyzed optical power levels. This embodiment of the invention further considers these details and provides compensation. The specific compensation value varies depending on the actual high and low level difference between 1 and 0, which will not be specifically described here.
[0090] In this embodiment, "first" and "second" have no special limiting meaning. They are used only to facilitate the description of different individuals within a class of objects, and should not be interpreted as having a special limiting meaning in terms of order or other aspects.
[0091] Example 2:
[0092] Based on the method described in Embodiment 1, this invention combines specific application scenarios and uses technical descriptions in relevant scenarios to illustrate the implementation process of the features of this invention in those scenarios.
[0093] The following will use burst received optical power calibration in a passive optical network as an example to explain the process of optical power calibration. Before calibration, relevant data needs to be collected to generate the relationship between the sampled ADC value and temperature, the relationship between the sampled ADC deviation and temperature deviation, and the relationship between optical power and the reference ADC value.
[0094] The process of generating the relationship between optical power and the reference ADC value is as follows: Figure 3 As shown, it specifically includes:
[0095] In step 401, under the reference temperature conditions, the optical power of the test light source is set to no light, -32dBm, -30dBm, -28dBm, -25dBm, -22dBm, -18dBm, -15dBm, -13dBm, and -8dBm, respectively. The corresponding ADC values are sampled at each optical power. To avoid noise interference, a median filtering method with multiple sampling is used at each power point to overcome noise effects. The filtered ADC values are recorded in the module MCU.
[0096] In step 402, the relationship between the optical power and the reference ADC value in each optical power range is obtained by fitting the recorded ADC values and corresponding optical power. The corresponding power range, the boundary ADC values of the power range, the corresponding optical power calibration coefficient, and the optical power calibration constant are recorded in the MCU, such as... Figure 4 As shown, in Figure 4 In this context, the boundary ADC value represents the maximum reference ADC value for each power range.
[0097] The process of generating the relationship between the sampled ADC value and temperature, and the relationship between the sampled ADC deviation and temperature deviation, is as follows: Figure 5 As shown, it specifically includes:
[0098] In step 501, the optical power of the test light source is set to -32dBm, -30dBm, -25dBm, -18dBm and -8dBm respectively. At each optical power sampling point, the light is adjusted to multiple temperature values under high temperature and low temperature conditions. The sampling ADC value corresponding to each optical power at multiple temperatures is recorded. Under the reference temperature condition, the reference ADC value corresponding to each optical power is recorded.
[0099] In step 502, for each optical power value, a linear fit is performed based on the recorded sampling ADC value under high temperature conditions and the temperature at the time of sampling to obtain the relationship between the sampling ADC value and temperature in the high temperature range at the corresponding optical power; and a linear fit is performed based on the difference between the temperature at the time of sampling and the reference temperature and the difference between the sampling ADC and the reference ADC at the corresponding optical power under high temperature conditions to obtain the relationship between the sampling ADC deviation and the temperature deviation in the high temperature range.
[0100] In step 503, for each optical power value, a linear fit is performed based on the recorded sampling ADC value under low-temperature conditions and the temperature at the time of sampling to obtain the relationship between the sampling ADC value and the temperature in the low-temperature range at the corresponding optical power; and a linear fit is performed based on the difference between the temperature at the time of sampling and the reference temperature and the difference between the sampling ADC and the reference ADC at the corresponding optical power under low-temperature conditions to obtain the relationship between the sampling ADC deviation and the temperature deviation in the low-temperature range.
[0101] After generating the relationships between the sampled ADC value and temperature, the sampled ADC deviation and temperature deviation, and the optical power and reference ADC value, the coefficients of each power range and each relationship within each power range are stored in the MCU for subsequent optical power calibration, such as... Figure 6 The figure shows the coefficients and constants of the relationship between the sampled ADC value and temperature in the high-temperature range, as shown below. Figure 7 The figure shows the coefficients of the relationship between the sampled ADC value and temperature in the low-temperature range, as shown below. Figure 8 The figure shows the relationship between sampling ADC deviation and temperature deviation, including the temperature compensation coefficient and temperature compensation constant in the high-temperature range. Figure 9 The diagram shows the relationship between sampling ADC deviation and temperature deviation in the low-temperature range, including the temperature compensation coefficient and temperature compensation constant. Each set of relationships can be represented as a linear curve, with each set having a different slope k and constant b. The slope k represents the coefficient required for actual calculation, and the constant b represents the constant required for actual calculation.
[0102] The process of optical power calibration includes two parts: temperature compensation of the sampled ADC value to obtain a reference ADC value, and calculation of the optical power based on the reference ADC value. Temperature compensation of the sampled ADC value is as follows: Figure 10 As shown, it specifically includes:
[0103] In step 601, the current temperature temp and the sampled ADC value ADC_cur are acquired.
[0104] In step 602, it is determined whether temp is greater than the reference temperature temp_st. If so, the relationship between the sampled ADC value of each power range and the temperature in the high-temperature range is selected; otherwise, the relationship between the sampled ADC value of each power range and the temperature in the low-temperature range is selected.
[0105] In step 603, the sampling ADC value corresponding to the boundary point of each power range at the current temperature is calculated, thereby determining the sampling ADC range of each power range at the current temperature.
[0106] In step 604, ADC_cur is compared with the sampled ADC value corresponding to each power interval boundary point to determine the sampled ADC interval in which ADC_cur is located, thereby obtaining the power interval corresponding to ADC_cur.
[0107] In step 605, the relationship between the sampling ADC deviation and the temperature deviation in the power range is obtained, and the reference ADC value ADC_R is calculated based on the temperature compensation coefficient, temperature compensation constant, temp, and ADC_cur in the relationship.
[0108] The optical power is calculated based on the reference ADC value, specifically including: determining the optical power range corresponding to ADC_R based on the reference ADC value at each optical power range boundary point; calculating the corresponding reported optical power value based on the relationship between the optical power in the optical power range and the reference ADC value, and based on the optical power calibration coefficient, optical power calibration constant, and ADC_R.
[0109] The following will be based on... Figure 6 or Figure 7 The five optical power ranges shown are examples. The specific details of steps 603 and 604 above will be explained as follows: Figure 11 As shown, it specifically includes:
[0110] In step 701, the normalized ADC value ADC2 corresponding to temperature compensation segment 2 is calculated, and it is determined whether ADC_cur is less than or equal to ADC2. If ADC_cur is less than or equal to ADC2, then proceed to step 702; otherwise, proceed to step 703.
[0111] In step 702, the normalized ADC value ADC1 corresponding to temperature compensation segment 1 is calculated, and it is determined whether ADC_cur is less than or equal to ADC1. If ADC_cur is less than or equal to ADC1, the power range corresponding to temperature compensation segment 0 is taken as the power range corresponding to ADC_cur. Otherwise, the power range corresponding to temperature compensation segment 1 is taken as the power range corresponding to ADC_cur.
[0112] In step 703, the normalized ADC value ADC3 corresponding to temperature compensation segment 3 is calculated, and it is determined whether ADC_cur is less than or equal to ADC3. If ADC_cur is less than or equal to ADC3, the power range corresponding to temperature compensation segment 3 is taken as the power range corresponding to ADC_cur. Otherwise, the normalized ADC value ADC4 corresponding to temperature compensation segment 4 is calculated, and the power range corresponding to temperature compensation segment 4 is taken as the power range corresponding to ADC_cur.
[0113] In practical applications, this embodiment also includes:
[0114] When measuring each set of relationships, the digital content of the optical signal received within the corresponding compensation period is recorded. During each round of compensation adjustment, the digital content of the optical signal received within the corresponding compensation period is also parsed. The parsed digital content is compared and analyzed with the digital content at the initial calculation time to obtain the reported optical power after further weighted compensation. For example, when measuring each set of relationships, an all-1 encoded optical signal is used, and the optical signal is received within a preset 10ms test time, and the 0 and 1 distribution of the optical signal is recorded.
[0115] When actually calculating and reporting optical power, the optical power is further compensated and calibrated based on the 0,1 distribution ratio of the actual received optical signal and the 0,1 distribution ratio of the recorded test optical signal.
[0116] Example 3:
[0117] like Figure 12 The diagram shown is an architectural schematic of a burst received optical power calibration method according to an embodiment of the present invention. The burst received optical power calibration method of this embodiment includes one or more processors 21 and a memory 22. Figure 12 Take a processor 21 as an example.
[0118] Processor 21 and memory 22 can be connected via a bus or other means. Figure 12 Taking the example of a connection between China and Israel via a bus.
[0119] The memory 22, as a non-volatile computer-readable storage medium, can be used to store non-volatile software programs and non-volatile computer-executable programs, such as the burst received optical power calibration method in Embodiment 1. The processor 21 executes the burst received optical power calibration method by running the non-volatile software program and instructions stored in the memory 22.
[0120] Memory 22 may include high-speed random access memory, and may also include non-volatile memory, such as at least one disk storage device, flash memory device, or other non-volatile solid-state storage device. In some embodiments, memory 22 may optionally include memory remotely located relative to processor 21, which can be connected to processor 21 via a network. Examples of such networks include, but are not limited to, the Internet, intranets, local area networks, mobile communication networks, and combinations thereof.
[0121] The program instructions / modules are stored in the memory 22. When executed by one or more processors 21, they perform the burst received optical power calibration method in Embodiment 1 above, for example, performing the above-described... Figures 1-3 , Figure 5 , Figure 10 , Figure 11 The steps shown.
[0122] It is worth noting that the information interaction and execution process between the modules and units in the above-mentioned device and system are based on the same concept as the processing method embodiment of the present invention. For details, please refer to the description in the method embodiment of the present invention, and will not be repeated here.
[0123] Those skilled in the art will understand that all or part of the steps in the various methods of the embodiments can be implemented by a program instructing related hardware. The program can be stored in a computer-readable storage medium, which may include: read-only memory (ROM), random access memory (RAM), magnetic disk or optical disk, etc.
[0124] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the protection scope of the present invention.
Claims
1. A method for calibrating burst received optical power, characterized in that, include: Based on the relationship between the sampled ADC values and temperature in each first optical power range, the current temperature, and the current ADC value, the first optical power range corresponding to the current ADC value is determined. Based on the relationship between the sampled ADC deviation and temperature deviation in the first optical power range, the reference ADC value corresponding to the current ADC value is calculated. Specifically, this includes: determining the corresponding temperature compensation coefficient and temperature compensation constant based on the relationship between the sampled ADC deviation and temperature deviation; multiplying the difference between the current temperature and the reference temperature by the temperature compensation coefficient and adding the temperature compensation constant to obtain the ADC deviation compensation value; wherein, when the current temperature is higher than the reference temperature, determining the corresponding temperature compensation coefficient and temperature compensation constant based on the relationship between the sampled ADC deviation and temperature deviation in the high-temperature range; and when the current temperature is lower than the reference temperature, determining the corresponding temperature compensation coefficient and temperature compensation constant based on the relationship between the sampled ADC deviation and temperature deviation in the low-temperature range; and adding the ADC deviation compensation value to the current ADC value to obtain the corresponding reference ADC value; wherein, the sampled ADC deviation is the deviation of the sampled ADC value relative to the reference ADC value, and the temperature deviation is the deviation between the sampling temperature and the reference temperature; Based on the reference ADC value, a corresponding second optical power range is determined, and the corresponding reported optical power is calculated based on the relationship between the optical power in the second optical power range and the reference ADC value. Specifically, this includes: determining the corresponding optical power calibration coefficient and optical power calibration constant based on the relationship between the optical power and the reference ADC value; multiplying the reference ADC value corresponding to the current ADC value by the optical power calibration coefficient; and adding the optical power calibration constant to obtain the reported optical power. Among them, multiple consecutive first optical power ranges are preset, and the relationship between the sampling ADC value and temperature in the corresponding first optical power range, as well as the relationship between the sampling ADC deviation and temperature deviation in the corresponding first optical power range, are measured; multiple consecutive second optical power ranges are preset, and the relationship between the optical power and the reference ADC value in the corresponding second optical power range is measured.
2. The burst received optical power calibration method according to claim 1, characterized in that, The step of determining the first optical power range corresponding to the current ADC value based on the relationship between the sampled ADC value and temperature in each first optical power range, the current temperature, and the current ADC value specifically includes: Based on the relationship between the sampled ADC values of each first optical power range and temperature, the sampled ADC range corresponding to each first optical power range at the current temperature is calculated. The sampled ADC range in which the current ADC value is located is then compared to obtain the corresponding first optical power range.
3. The burst received optical power calibration method according to claim 1, characterized in that, The relationship between the sampled ADC value and temperature in the corresponding first optical power range was measured, as well as the relationship between the sampled ADC deviation and temperature deviation in the corresponding first optical power range, specifically including: Under the corresponding optical power conditions, the sampled ADC values at different temperatures and the reference ADC values at the reference temperature are collected. Based on the different temperature values and the corresponding sampled ADC values, the relationship between the sampled ADC values and the temperature corresponding to the corresponding optical power is fitted. Based on the difference between the different temperature values and the reference temperature, and the difference between the corresponding sampled ADC values and the reference ADC values, the relationship between the sampled ADC deviation and the temperature deviation corresponding to the corresponding optical power is fitted. The critical maximum power value or critical minimum power value of each first optical power range is used as the sampling point. The relationship between the sampling ADC value corresponding to the sampling point and the temperature is used as the relationship between the sampling ADC value and the temperature of the corresponding first optical power range. The relationship between the sampling ADC deviation corresponding to the sampling point and the temperature deviation is used as the relationship between the sampling ADC deviation and the temperature deviation of the corresponding first optical power range.
4. The burst received optical power calibration method according to claim 1, characterized in that, The measurement obtains the relationship between the optical power in the corresponding second optical power range and the reference ADC value, specifically including: Multiple acquisition points are selected within the second optical power range or at the critical position of the second power range. At the reference temperature, the reference ADC value corresponding to the acquisition point is acquired. Based on the multiple acquisition points in the second optical power range and the corresponding reference ADC value, the relationship between the optical power of the second optical power range and the reference ADC value is fitted.
5. The burst received optical power calibration method according to any one of claims 1-4, characterized in that, The first optical power range is one or more of the following: no light ~ -32dBm, -32dBm ~ -30dBm, -30dBm ~ -25dBm, -25dBm ~ -18dBm, and -18dBm ~ -8dBm.
6. The burst received optical power calibration method according to any one of claims 1-4, characterized in that, The second optical power range is one or more of the following: no light ~ -32dBm, -32dBm ~ -30dBm, -30dBm ~ -28dBm, -28dBm ~ -25dBm, -25dBm ~ -22dBm, -22dBm ~ -18dBm, -18dBm ~ -15dBm, -15dBm ~ -13dBm, and -13dBm ~ -18dBm.
7. The burst received optical power calibration method according to any one of claims 1-4, characterized in that, When the initial calculations yield each set of relationships, the digital content of the optical signal received during the corresponding compensation period is determined. In practical applications, the method also includes: In each round of compensation adjustment, in addition to determining the corresponding second optical power range based on the reference ADC value and calculating the corresponding reported optical power based on the relationship between the optical power in the second optical power range and the reference ADC value, the digital content of the optical signal received in the corresponding compensation period is also parsed, and the parsed digital content is compared and analyzed with the digital content at the initial calculation to obtain the reported optical power after further weighted compensation. The relationships include the relationship between the sampled ADC value and temperature, the relationship between the sampled ADC deviation and temperature deviation, and the relationship between optical power and the reference ADC value.
8. A burst-received optical power calibration device, characterized in that, The device includes: At least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor for performing the burst received optical power calibration method according to any one of claims 1-7.