A successive approximation analog-to-digital converter and apparatus

CN117394860BActive Publication Date: 2026-08-28SHANGHAI INTEGRATED CIRCUIT RESEARCH & DEVELOPMENT CENTER CO LTD
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Patent Information

Application Number
CN202311169220.2
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-09-12
Publication Date
2026-08-28
Estimated Expiration
2043-09-12

AI Technical Summary

Technical Problem

SAR ADC的前端通常需要设置采样保持电路来对输入信号进行采样,相关技术中的采样保持电路通常为NMOS与PMOS构成的传输门电路,在实际应用中当过压输入至传输门电路时,传输门电路中的PMOS会产生亚阈值导通的情况,导致过压输入通过PMOS管为电容矩阵进行反向充电,进而影响SAR ADC输出结果的准确性

Benefits of technology

[0021]本发明的有益效果在于提供了一种逐次逼近式模拟数字转换器及设备,包括采样保持模块、比较模块、逐次逼近逻辑模块以及电容阵列,采样保持模块包括第一晶体管、第二晶体管以及第三晶体管。第一晶体管至第三晶体管组成动态开关结构,能够在进行参考电压与采样电压逐次比较的转换阶段将电容阵列的第一端的电压与输入信号进行隔离,即使在过压输入时采样保持模块中的第二晶体管也不会工作在亚阈值状态,从而保证电容阵列的第一端的电压的稳定性,进而保证逐次逼近式模拟数字转换器的精度。

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Abstract

The application discloses a successive approximation type analog-digital converter and equipment, and relates to the field of integrated circuits, comprising a sample and hold module, a comparison module, a successive approximation logic module and a capacitor array, wherein the sample and hold module comprises a first transistor, a second transistor and a third transistor. The first transistor to the third transistor constitute a dynamic switch structure, which can isolate the voltage at the first end of the capacitor array from the input signal during the conversion stage of the successive comparison of the reference voltage and the sampling voltage, so that the second transistor in the sample and hold module does not work in the sub-threshold state even when overvoltage is input, thereby ensuring the stability of the voltage at the first end of the capacitor array and further ensuring the precision of the successive approximation type analog-digital converter.
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Citation Information

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