A terahertz field generation method based on two-color field phase locking

Abstract

The present application relates to the technical field of terahertz pulse generation of optoelectronics, and discloses a terahertz field generation method based on two-color field phase locking, comprising: through optical system building, using a beam expander to amplify the fringe spot in the optical path. The frequency map and phase map of the amplified spot are obtained, and the periodic frequency point is extracted. The phase change information of the periodic frequency point is analyzed, compared with the expected phase change threshold, and it is judged whether the position of the piezoelectric ceramic needs to be adjusted. If the phase change information is within the threshold range, it is determined that no adjustment is needed; otherwise, the position of the piezoelectric ceramic is adjusted and moved. Through accurate control of the phase of the optical field, the stability of the pulse is improved, the overall structure is simplified, and the cost of the terahertz magnetic field generation is reduced.

Description

Technical Field

[0001] This invention relates to the field of terahertz pulse generation technology in optoelectronics, and in particular to a terahertz field generation method based on dual-color field phase locking. Background Technology

[0002] In the current field of terahertz wave generation, two-color field ionization of air has been proven to generate high-intensity, ultra-wideband terahertz pulses. However, in experiments, the phase jitter of the two color fields due to the influence of airflow and vibration of mechanical devices leads to unstable generation of terahertz pulses. Therefore, achieving phase-locking technology for two-color fields is key to solving this problem.

[0003] Currently, terahertz wave generation methods mainly include photoconductive antennas, nonlinear crystal optical rectification, quantum cascade lasers, laser plasma, and free-electron lasers. However, each method has a series of limitations. For example, photoconductive antennas are limited by semiconductor materials, resulting in low output terahertz wave intensity; nonlinear crystal optical rectification is limited by crystal thickness and damage threshold; free-electron lasers are not widely used due to cost and size constraints; and quantum cascade lasers require solutions to problems related to beam focusing and operating temperature. In contrast, laser plasma, using gas as the generation medium, has advantages. Due to the short recombination time of plasma, the theoretical intensity of the generated terahertz radiation is extremely high, making it a key research focus in the terahertz field.

[0004] With the advent of ultrashort pulse lasers, researchers can now study strong-field physics phenomena in the atomic and molecular realms, including laser plasma. By focusing a femtosecond laser into a gaseous medium, the medium tunnels and ionizes under the influence of the laser field, forming air plasma, which generates terahertz radiation. Although monochromatic femtosecond lasers were first used to ionize gaseous media to generate terahertz radiation in 1993, the radiation intensity was relatively low. It wasn't until 2000, with the introduction of symmetry-breaking bicolor fields composed of frequency-harmonic fields to ionize gaseous media, that the terahertz radiation yield significantly increased, shifting the focus of research from monochromatic fields to bicolor fields.

[0005] However, in experiments using a two-color field to induce terahertz waves from air plasma, fluctuations in the laboratory environment and vibrations of optical components lead to instability in the phase difference of the two-color field optical path, thus affecting the yield of terahertz waves. Therefore, achieving phase stability of the two-color field in experiments has become a key research focus for improving the intensity of terahertz waves.

[0006] Current phase-locking techniques are divided into two types: active locking and passive locking. Active locking uses methods such as modulation and phase detection to control the phase through feedback, including heterodyne methods, stochastic parallel gradient descent (SPGD), frequency-domain multi-jitter methods, and time-domain single-jitter methods. Passive locking utilizes nonlinear interactions and optical coupling to control the phase of each optical path, including mutual injection locking, phase conjugate phase-locking, polarization phase-locking, self-imaging cavity coherent synthesis, and interferometer structure self-organized coherent synthesis. However, the overall performance of passive locking decreases as the number of locked paths increases, thus limiting the expansion of the number of control paths and output power. Therefore, solving the phase-locking problem of two-color fields remains a challenging research direction in the field of terahertz wave generation. Summary of the Invention

[0007] The purpose of this invention is to provide a terahertz field generation method based on dual-color field phase locking, which is suitable for improving pulse stability by precisely controlling the phase of the optical field, while simplifying the overall structure and reducing the cost of generating terahertz magnetic fields.

[0008] On one hand, this invention provides a terahertz field generation method based on two-color field phase locking, comprising:

[0009] An optical path was constructed, and a beam expander array was used to magnify the striped light spots in the optical path;

[0010] Obtain the frequency and phase diagrams of the magnified striped light spot, and extract the periodic frequency points of the striped light spot based on the frequency and phase diagrams.

[0011] The phase change information of the periodic frequency points of the striped light spot is obtained, and based on the relationship between the phase change information of the periodic frequency points of the striped light spot and the expected phase change threshold of the periodic frequency points of the striped light spot, it is determined whether the position of the piezoelectric ceramic should be adjusted or moved.

[0012] If the phase change information of the periodic frequency point of the striped light spot is within the expected phase change threshold of the periodic frequency point of the striped light spot, then it is determined that the position of the piezoelectric ceramic will not be adjusted or moved.

[0013] If the phase change information of the periodic frequency point of the striped light spot is outside the expected phase change of the periodic frequency point of the striped light spot, then it is determined that the position of the piezoelectric ceramic should be adjusted and moved.

[0014] Furthermore, before acquiring the magnified frequency map and phase map of the striped spot, and extracting the periodic frequency points of the striped spot based on the frequency map and phase map, the process includes:

[0015] Obtain the stripe signal of the magnified striped spot;

[0016] The frequency diagram and phase diagram of the stripe signal are obtained by performing a fast Fourier transform algorithm on the stripe signal.

[0017] The periodic frequency points of the stripe spot are extracted based on the frequency diagram and phase diagram of the stripe signal.

[0018] Further, when obtaining phase change information of the periodic frequency points of the striped light spot, and determining whether to adjust or move the position of the piezoelectric ceramic based on the relationship between the phase change information of the periodic frequency points of the striped light spot and the expected phase change threshold of the periodic frequency points of the striped light spot, the process includes:

[0019] Obtain the real-time phase F of the periodic frequency point of the striped light spot and the expected phase A of the periodic frequency point of the striped light spot;

[0020] Based on the relationship between the real-time phase F of the periodic frequency point of the striped light spot and the expected phase A of the periodic frequency point of the striped light spot, it is determined whether the position of the piezoelectric ceramic should be adjusted or moved:

[0021] When F = A, it is determined that the real-time phase F of the periodic frequency point of the striped light spot is the same as the expected phase A of the periodic frequency point of the striped light spot, and therefore the position of the piezoelectric ceramic is not adjusted or moved.

[0022] When F≠A, it is determined that the real-time phase F of the periodic frequency point of the striped light spot is different from the expected phase A of the periodic frequency point of the striped light spot. A feedback control algorithm is performed to calculate the position of the piezoelectric ceramic based on the real-time phase F of the periodic frequency point of the striped light spot and the expected phase A of the periodic frequency point of the striped light spot. The position of the piezoelectric ceramic is adjusted and moved based on the displacement feedback signal calculated by the feedback control algorithm.

[0023] Furthermore, when generating a feedback signal based on a feedback control algorithm according to the relationship between the real-time phase F of the periodic frequency point of the striped light spot and the expected phase A of the periodic frequency point of the striped light spot, and adjusting the position of the piezoelectric ceramic according to the feedback information, the process includes:

[0024] Obtain the expected phase difference ΔF between the real-time phase F of the periodic frequency point of the striped spot and the expected phase A of the periodic frequency point of the striped spot, where ΔF = FA;

[0025] The feedback control calculation is performed based on the expected phase difference ΔF, and the displacement feedback signal T after the feedback control calculation is obtained. T is set to FeedbackAlgorithmΔF.

[0026] The position of the piezoelectric ceramic is adjusted and moved according to the displacement feedback signal T.

[0027] Furthermore, feedback control calculations are performed based on the desired phase difference ΔF, and the displacement feedback signal T after the feedback control calculation is obtained. When T = FeedbackAlgorithmΔF, the calculation includes:

[0028] Obtain the proportional parameter L when the position of the piezoelectric ceramic is adjusted and moved, and determine whether the proportional parameter L when the position of the piezoelectric ceramic is adjusted and moved meets the preset required proportional parameter based on the relationship between the proportional parameter L and the preset proportional parameter L0.

[0029] When L = L0, it is determined that the proportional parameter when the position of the piezoelectric ceramic is adjusted and moved meets the preset required proportional parameter.

[0030] When L > L0 and L < L0, it is determined that the proportional parameter when the piezoelectric ceramic position is adjusted is slower or faster than the preset required proportional parameter. It is also determined that the proportional parameter when the piezoelectric ceramic position is adjusted does not meet the preset required proportional parameter. Based on the relationship between the proportional parameter L when the piezoelectric ceramic position is adjusted and the preset proportional parameter L0, the proportional parameter L when the piezoelectric ceramic position is adjusted is adjusted.

[0031] Furthermore, when determining that the proportional parameter during the adjustment and movement of the piezoelectric ceramic position does not conform to the preset required proportional parameter, and adjusting the proportional parameter L during the adjustment and movement of the piezoelectric ceramic position according to the relationship between the proportional parameter L during the adjustment and movement of the piezoelectric ceramic position and the preset proportional parameter L0, the adjustment includes:

[0032] The proportional parameter difference ΔL between the proportional parameter L when the position of the piezoelectric ceramic is adjusted and the preset proportional parameter L0 is obtained, where ΔL = L - L0. The proportional parameter difference ΔL is compared with the preset proportional parameter difference, and the corresponding adjustment coefficient is selected based on the comparison result to adjust the proportional parameter L when the position of the piezoelectric ceramic is adjusted.

[0033] Among them, the first preset proportional parameter difference △L1 and the second preset proportional parameter difference △L2 are preset, the first preset adjustment coefficient M1, the second preset adjustment coefficient M2 and the third preset adjustment coefficient M3 are preset, and △L1<0<△L2, M1<M2<M3<0.5;

[0034] When △L≤△L1, the third preset adjustment coefficient M3 is selected to adjust the proportional parameter L when adjusting the position of the piezoelectric ceramic.

[0035] When △L1<△L≤0, the proportional parameter L is not adjusted when the position of the piezoelectric ceramic is moved.

[0036] When 0 < ΔL ≤ ΔL2, the second preset adjustment coefficient M2 is selected to adjust the proportional parameter L when the position of the piezoelectric ceramic is adjusted and moved.

[0037] When △L>△L2, the first preset adjustment coefficient M1 is selected to adjust the proportional parameter L when adjusting the position of the piezoelectric ceramic.

[0038] When the i-th preset adjustment coefficient Mi is selected to adjust the proportional parameter L when the position of the piezoelectric ceramic is adjusted, i = 1, 2, 3, and the adjusted proportional parameter L1 is determined to be L1. L1 = L * Mi, and the displacement feedback signal T = (L1) ΔF is determined.

[0039] Furthermore, when the i-th preset adjustment coefficient Mi is selected to adjust the proportional parameter L when the position of the piezoelectric ceramic is adjusted, and the adjusted proportional parameter L1 is determined to be L1, the displacement feedback signal T = (L1)ΔF is determined, including:

[0040] The integral parameter K is obtained when the position of the piezoelectric ceramic is adjusted and moved. Based on the relationship between the integral parameter K and the preset integral parameter K0, it is determined whether the integral parameter K meets the preset requirement integral parameter.

[0041] When K = K0, it is determined that the integral parameters when the position of the piezoelectric ceramic is adjusted and moved meet the preset required integral parameters.

[0042] When K > K0 and K < K0, it is determined that the integral parameter when the piezoelectric ceramic position is adjusted is greater than or less than the preset integral parameter. It is also determined that the integral parameter when the piezoelectric ceramic position is adjusted does not meet the preset required integral parameter. Based on the relationship between the integral parameter K when the piezoelectric ceramic position is adjusted and the preset integral parameter K0, the integral parameter when the piezoelectric ceramic position is adjusted is adjusted.

[0043] Furthermore, when determining that the integral parameter during the adjustment and movement of the piezoelectric ceramic position does not meet the preset required integral parameter, and adjusting the integral parameter during the adjustment and movement of the piezoelectric ceramic position according to the relationship between the integral parameter K during the adjustment and movement of the piezoelectric ceramic position and the preset integral parameter K0, the adjustment includes:

[0044] The integral parameter difference ΔK between the integral parameter K when the position of the piezoelectric ceramic is adjusted and moved and the preset integral parameter K0 is obtained, where ΔK = K - K0. The integral parameter difference ΔK is compared with the preset integral parameter difference, and the corresponding adjustment coefficient is selected based on the comparison result to adjust the integral parameter K when the position of the piezoelectric ceramic is adjusted and moved.

[0045] Among them, the first preset integral parameter difference △K1 and the second preset integral parameter difference △K2 are preset, the first preset adjustment coefficient N1, the second preset adjustment coefficient N2 and the third preset adjustment coefficient N3 are preset, and △K1<0<△K2, N1<N2<N3<0.3;

[0046] When △K≤△K1, the third preset adjustment coefficient N3 is selected to adjust the integral parameter K when the position of the piezoelectric ceramic is adjusted and moved.

[0047] When △K1<△K≤0, the integral parameter K is not adjusted when the position of the piezoelectric ceramic is moved.

[0048] When 0 < ΔK ≤ ΔK2, the second preset adjustment coefficient N2 is selected to adjust the integral parameter K when the position of the piezoelectric ceramic is adjusted and moved.

[0049] When △K>△K2, the first preset adjustment coefficient N1 is selected to adjust the integral parameter K when the position of the piezoelectric ceramic is adjusted and moved;

[0050] When the i-th preset adjustment coefficient Ni is selected to adjust the integral parameter K when the position of the piezoelectric ceramic is adjusted, i = 1, 2, 3, and the integral parameter K1 is determined to be the adjusted position of the piezoelectric ceramic. K1 = K * Ni is set, and the displacement feedback signal T = (L1, K1) ΔF is determined.

[0051] Furthermore, when the i-th preset adjustment coefficient Ni is selected to adjust the integral parameter K when the position of the piezoelectric ceramic is adjusted and moved, and the adjusted integral parameter K1 is determined when the position of the piezoelectric ceramic is adjusted and moved, the displacement feedback signal T = (L1, K1)ΔF is determined, including:

[0052] Obtain the differential parameter J when the piezoelectric ceramic position is adjusted and moved, and determine whether the differential parameter J when the piezoelectric ceramic position is adjusted and moved meets the preset required differential parameter based on the relationship between the differential parameter J and the preset differential parameter J0.

[0053] When J = J0, it is determined that the differential parameters of the piezoelectric ceramic during position adjustment and movement meet the preset required differential parameters.

[0054] When J > J0 and J < J0, it is determined that the differential parameter when the piezoelectric ceramic position is adjusted is greater than or less than the preset differential parameter. It is also determined that the differential parameter when the piezoelectric ceramic position is adjusted does not meet the preset required differential parameter. Based on the relationship between the differential parameter J when the piezoelectric ceramic position is adjusted and the preset differential parameter J0, the differential parameter when the piezoelectric ceramic position is adjusted is adjusted.

[0055] Furthermore, if it is determined that the differential parameter during the adjustment and movement of the piezoelectric ceramic position does not conform to the preset required differential parameter, and the differential parameter during the adjustment and movement of the piezoelectric ceramic position is adjusted according to the relationship between the differential parameter J during the adjustment and movement of the piezoelectric ceramic position and the preset differential parameter J0, the adjustment of the differential parameter during the adjustment and movement of the piezoelectric ceramic position includes:

[0056] The differential parameter difference ΔJ between the differential parameter J when the position of the piezoelectric ceramic is adjusted and moved and the preset differential parameter J0 is obtained, where ΔJ = J - J0. The differential parameter difference ΔJ is compared with the preset differential parameter difference, and the corresponding modification coefficient is selected according to the comparison result to correct the differential parameter when the position of the piezoelectric ceramic is adjusted and moved.

[0057] Among them, the first preset differential parameter difference △J1 and the second preset differential parameter difference △J2 ​​are preset, the first preset correction coefficient B1, the second preset correction coefficient B2 and the third preset correction coefficient B3 are preset, and △J1<0<△J2, B1<B2<B3<0.3;

[0058] When △J≤△J1, the third preset correction coefficient B3 is selected to correct the differential parameter when the position of the piezoelectric ceramic is adjusted and moved.

[0059] When △J1<△J≤0, the differential parameters of the piezoelectric ceramic are not corrected when the position is adjusted and moved.

[0060] When 0 < ΔJ ≤ ΔJ2, the second preset correction coefficient B2 is selected to correct the differential parameter when the position of the piezoelectric ceramic is adjusted and moved.

[0061] When △J>△J2, the first preset correction coefficient B1 is selected to correct the differential parameter when the position of the piezoelectric ceramic is adjusted and moved.

[0062] When the i-th preset correction coefficient Bi is selected to correct the differential parameter when the position of the piezoelectric ceramic is adjusted and moved, i = 1, 2, 3, and the differential parameter when the position of the piezoelectric ceramic is adjusted and moved is determined to be J1, J1 = J * Bi, and the displacement feedback signal T = (L1, K1, J1) △F is determined.

[0063] Compared with existing technologies, the terahertz field generation method based on dual-color field phase locking proposed in this invention has the following advantages: First, by constructing an optical path and using a beam expander to amplify the fringe spot in the optical path, subtle changes in the optical path can be effectively amplified and captured, improving the sensitivity to optical signals. Second, by acquiring the frequency and phase diagrams of the amplified fringe spot, detailed data on the spatial frequency and phase information of the optical signal can be obtained, providing a foundation for subsequent analysis and control. Third, by extracting the periodic frequency points of the fringe spot, the periodic changes of the optical signal can be monitored, further enhancing the ability to analyze optical characteristics. By acquiring the phase change information of the periodic frequency points and comparing it with the expected phase change threshold, the system can determine in real time whether the optical signal is in the desired state, thereby achieving automatic adjustment of phase locking. Finally, after determining the relationship between the phase change information and the expected threshold, by adjusting and moving the position of the piezoelectric ceramic, errors in the optical system can be quickly responded to and corrected, maintaining stable operation of the optical path, while also effectively and quickly completing phase locking. This simplifies the overall structure and reduces the cost of terahertz magnetic field generation. Attached Figure Description

[0064] Figure 1 This is a schematic flowchart of a terahertz field generation method based on dual-color field phase locking according to an embodiment of the present invention. Detailed Implementation

[0065] Exemplary embodiments of the present disclosure will now be described in more detail with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided to enable a more thorough understanding of the present disclosure and to fully convey the scope of the disclosure to those skilled in the art. It should be noted that, unless otherwise specified, embodiments and features in the embodiments of the present invention can be combined with each other. The present invention will now be described in detail with reference to the accompanying drawings and embodiments.

[0066] like Figure 1 As shown, an embodiment of the present invention provides a terahertz field generation method based on two-color field phase locking, comprising:

[0067] Step S100: Build the optical path and use a beam expander group to magnify the striped light spots in the optical path.

[0068] Step S200: Obtain the frequency map and phase map of the magnified striped spot, and extract the periodic frequency points of the striped spot based on the frequency map and phase map of the striped spot.

[0069] Step S300: Obtain the phase change information of the periodic frequency points of the striped light spot, and determine whether to adjust or move the position of the piezoelectric ceramic based on the relationship between the phase change information of the periodic frequency points of the striped light spot and the expected phase change threshold of the periodic frequency points of the striped light spot. Specifically: if the phase change information of the periodic frequency points of the striped light spot is within the expected phase change threshold of the periodic frequency points of the striped light spot, then it is determined that the position of the piezoelectric ceramic should not be adjusted or moved. If the phase change information of the periodic frequency points of the striped light spot is outside the expected phase change of the periodic frequency points of the striped light spot, then it is determined that the position of the piezoelectric ceramic should be adjusted or moved.

[0070] Understandably, firstly, by constructing an optical path and using a beam expander to magnify the fringe spot, the sensitivity to detect subtle optical features is improved, laying the foundation for subsequent analysis. Secondly, obtaining the frequency and phase diagrams of the magnified fringe spot allows for a detailed understanding of the frequency and phase information of the optical signal, providing a rich data foundation for subsequent processing. By extracting the periodic frequency points and phase change information of the fringe spot, the state of the optical system can be monitored in real time. Based on this information, it can be determined whether the position of the piezoelectric ceramic needs to be adjusted or moved, thereby achieving precise active control of the optical field phase. Most importantly, by judging the relationship between the phase change information and the expected threshold, precise adjustment of the piezoelectric ceramic position can be achieved. This helps maintain the optical field phase in the desired state, improving the stability and performance of optical field phase locking.

[0071] Specifically, in some embodiments of the present invention, before acquiring the frequency map and phase map of the magnified striped spot, and extracting the periodic frequency points of the striped spot based on the frequency map and phase map, the method includes: acquiring the stripe signal of the magnified striped spot; performing a Fast Fourier Transform algorithm on the stripe signal to acquire the frequency map and phase map of the stripe signal; and extracting the periodic frequency points of the striped spot based on the frequency map and phase map of the stripe signal.

[0072] Understandably, by acquiring the fringe signal of the fringe spot, raw data about the optical signal can be obtained. This step provides the necessary input for subsequent analysis, enabling the system to conduct in-depth research on optical characteristics. Secondly, the fringe signal is processed using a Fast Fourier Transform algorithm to obtain a frequency diagram and a phase diagram. This step helps convert the signal from the time domain to the frequency domain, providing a detailed understanding of the frequency and phase characteristics of the optical signal. Finally, the periodic frequency points of the fringe spot are extracted from the frequency and phase diagrams. This process can determine the variation of specific frequencies in the optical system, providing crucial information for subsequent control and adjustment.

[0073] Specifically, in some embodiments of the present invention, when obtaining phase change information of the periodic frequency points of the striped light spot, and determining whether to adjust the position of the piezoelectric ceramic based on the relationship between the phase change information of the periodic frequency points of the striped light spot and the expected phase change threshold of the periodic frequency points of the striped light spot, the process includes: obtaining the real-time phase F and the expected phase A of the periodic frequency points of the striped light spot. Based on the relationship between the real-time phase F and the expected phase A of the periodic frequency points of the striped light spot, the process determines whether to adjust the position of the piezoelectric ceramic: when F = A, it is determined that the real-time phase F and the expected phase A of the periodic frequency points of the striped light spot are the same, and therefore no adjustment is made to the position of the piezoelectric ceramic. When F ≠ A, it is determined that the real-time phase F and the expected phase A of the periodic frequency points of the striped light spot are different, and a feedback control algorithm is performed based on the relationship between the real-time phase F and the expected phase A of the periodic frequency points of the striped light spot, and the position of the piezoelectric ceramic is adjusted based on the displacement feedback signal calculated by the feedback control algorithm.

[0074] Specifically, in some embodiments of the present invention, when a feedback signal is generated based on a feedback control algorithm according to the relationship between the real-time phase F of the periodic frequency point of the striped light spot and the expected phase A of the periodic frequency point of the striped light spot, and the position of the piezoelectric ceramic is adjusted and moved according to the feedback information, the process includes: obtaining the expected phase difference ΔF between the real-time phase F of the periodic frequency point of the striped light spot and the expected phase A of the periodic frequency point of the striped light spot, where ΔF = FA; performing feedback control calculation based on the expected phase difference ΔF, and obtaining the displacement feedback signal T after the feedback control calculation, setting T = FeedbackAlgorithmΔF; and adjusting and moving the position of the piezoelectric ceramic according to the displacement feedback signal T.

[0075] Understandably, by acquiring the real-time phase and desired phase of the periodic frequency points of the fringe spot, real-time information about the optical characteristics can be obtained. This information is the foundation for real-time monitoring of the system's operating status, helping the system to perceive dynamic changes in the optical signal in real time. Secondly, by judging the relationship between the real-time phase and the desired phase, it is possible to determine whether to adjust or move the piezoelectric ceramic position. This gives the system intelligent adaptive capabilities, enabling flexible adjustments based on actual conditions, further maintaining the optical field phase in the desired state, and improving the stability and performance of optical field phase locking. Finally, through the calculation of the feedback control algorithm, a displacement feedback signal can be quickly generated for adjusting the piezoelectric ceramic position. This feedback mechanism enables the piezoelectric ceramic to respond quickly to real-time changes, achieving active control of the system state, thereby maintaining the stable operation of the optical system in the desired state.

[0076] Specifically, in some embodiments of the present invention, when performing feedback control calculations based on the desired phase difference ΔF and obtaining the displacement feedback signal T after the feedback control calculation, and setting T = FeedbackAlgorithmΔF, the process includes: obtaining the proportional parameter L when the piezoelectric ceramic position is adjusted and moved, and determining whether the proportional parameter L meets the preset required proportional parameter based on the relationship between the proportional parameter L and the preset proportional parameter L0: when L = L0, it is determined that the proportional parameter meets the preset required proportional parameter. When L > L0 or L < L0, it is determined that the proportional parameter is slower or faster than the preset required proportional parameter, and the proportional parameter does not meet the preset required proportional parameter. The proportional parameter L is then adjusted based on the relationship between the proportional parameter L and the preset proportional parameter L0.

[0077] Specifically, in some embodiments of the present invention, when it is determined that the proportional parameter when adjusting the position of the piezoelectric ceramic does not meet the preset required proportional parameter, and when adjusting the proportional parameter L when adjusting the position of the piezoelectric ceramic according to the relationship between the proportional parameter L when adjusting the position of the piezoelectric ceramic and the preset proportional parameter L0, the following steps are taken: obtaining the proportional parameter difference ΔL between the proportional parameter L when adjusting the position of the piezoelectric ceramic and the preset proportional parameter L0, where ΔL = L - L0; comparing the proportional parameter difference ΔL with the preset proportional parameter difference; and selecting the corresponding adjustment coefficient according to the comparison result to adjust the proportional parameter L when adjusting the position of the piezoelectric ceramic: wherein, a first preset proportional parameter difference ΔL1 and a second preset proportional parameter difference ΔL2 are preset, and a first preset adjustment coefficient M1, a second preset adjustment coefficient M2, and a third preset adjustment coefficient M3 are preset, and ΔL1 < 0 < ΔL2, M1 < M2 < M3 < 0.5.

[0078] When △L≤△L1, the third preset adjustment coefficient M3 is selected to adjust the proportional parameter L when adjusting the position of the piezoelectric ceramic.

[0079] When △L1<△L≤0, the proportional parameter L is not adjusted when the position of the piezoelectric ceramic is moved.

[0080] When 0 < ΔL ≤ ΔL2, the second preset adjustment coefficient M2 is selected to adjust the proportional parameter L when adjusting the position of the piezoelectric ceramic.

[0081] When △L>△L2, the first preset adjustment coefficient M1 is selected to adjust the proportional parameter L when adjusting the position of the piezoelectric ceramic.

[0082] When the i-th preset adjustment coefficient Mi is selected to adjust the proportional parameter L when the position of the piezoelectric ceramic is adjusted, i = 1, 2, 3, and the adjusted proportional parameter L1 is determined to be L1, L1 = L * Mi, and the displacement feedback signal T = (L1) ΔF is determined.

[0083] Understandably, by comparing the difference between the actual proportional parameters and the preset proportional parameters, it's possible to determine whether the proportional parameters meet the preset requirements when adjusting the position of the piezoelectric ceramic. Real-time monitoring and adjustment of the optical system's operating status ensures the piezoelectric ceramic position is adjusted according to the expected proportional parameters, improving the stability of the light field. Secondly, by setting multiple preset proportional parameter difference ranges and corresponding adjustment coefficients, multi-stage adjustment of the proportional parameters is achieved. Different adjustment coefficients are used at different stages, allowing for more flexible adaptation to adjustment needs under different operating conditions, enhancing the robustness and adaptability during piezoelectric ceramic movement. Finally, by calculating the displacement feedback signal using the adjusted proportional parameters, precise control of the piezoelectric ceramic's position adjustment is achieved. This feedback control mechanism enables the system to adjust parameters promptly according to actual conditions, ensuring the light field remains in a stable operating state, thereby improving the performance and response speed of the optical system.

[0084] Specifically, in some embodiments of the present invention, when the proportional parameter L for adjusting the position of the piezoelectric ceramic is adjusted by selecting the i-th preset adjustment coefficient Mi, and the adjusted proportional parameter for adjusting the position of the piezoelectric ceramic is determined to be L1, and the displacement feedback signal T = (L1)ΔF is determined, the process includes: obtaining the integral parameter K for adjusting the position of the piezoelectric ceramic, and determining whether the integral parameter for adjusting the position of the piezoelectric ceramic meets the preset required integral parameter based on the relationship between the integral parameter K and the preset integral parameter K0: when K = K0, it is determined that the integral parameter for adjusting the position of the piezoelectric ceramic meets the preset required integral parameter. When K > K0 or K < K0, it is determined that the integral parameter for adjusting the position of the piezoelectric ceramic is greater than or less than the preset integral parameter, and the integral parameter for adjusting the position of the piezoelectric ceramic does not meet the preset required integral parameter. The integral parameter for adjusting the position of the piezoelectric ceramic is then adjusted based on the relationship between the integral parameter K and the preset integral parameter K0.

[0085] Specifically, in some embodiments of the present invention, when it is determined that the integral parameter when the position of the piezoelectric ceramic is adjusted does not meet the preset required integral parameter, and the integral parameter when the position of the piezoelectric ceramic is adjusted is adjusted according to the relationship between the integral parameter K when the position of the piezoelectric ceramic is adjusted and the preset integral parameter K0, the adjustment includes: obtaining the integral parameter difference ΔK between the integral parameter K when the position of the piezoelectric ceramic is adjusted and the preset integral parameter K0, ΔK = K - K0, comparing the integral parameter difference ΔK with the preset integral parameter difference, and selecting the corresponding adjustment coefficient according to the comparison result, and adjusting the integral parameter K when the position of the piezoelectric ceramic is adjusted: wherein, a first preset integral parameter difference ΔK1 and a second preset integral parameter difference ΔK2 are preset, a first preset adjustment coefficient N1, a second preset adjustment coefficient N2 and a third preset adjustment coefficient N3 are preset, and ΔK1 < 0 < ΔK2, N1 < N2 < N3 < 0.3.

[0086] When △K≤△K1, the third preset adjustment coefficient N3 is selected to adjust the integral parameter K when the position of the piezoelectric ceramic is adjusted.

[0087] When △K1<△K≤0, the integral parameter K is not adjusted when the position of the piezoelectric ceramic is moved.

[0088] When 0 < ΔK ≤ ΔK2, the second preset adjustment coefficient N2 is selected to adjust the integral parameter K when the position of the piezoelectric ceramic is adjusted.

[0089] When △K>△K2, the first preset adjustment coefficient N1 is selected to adjust the integral parameter K when the position of the piezoelectric ceramic is adjusted.

[0090] When the i-th preset adjustment coefficient Ni is selected to adjust the integral parameter K when the position of the piezoelectric ceramic is adjusted, i = 1, 2, 3, and the integral parameter K1 is determined when the position of the piezoelectric ceramic is adjusted, K1 = K * Ni, and the displacement feedback signal T = (L1, K1) ΔF is determined.

[0091] Understandably, by comparing the difference between the actual integral parameters and the preset integral parameters, it's possible to determine whether the integral parameters meet the preset requirements when adjusting the position of the piezoelectric ceramic. This helps the system monitor and adjust the working state of the optical system in real time. Secondly, by setting multiple preset integral parameter difference ranges and corresponding adjustment coefficients, multi-stage adjustment of the integral parameters is achieved. Using different adjustment coefficients at different stages allows for more flexible adaptation to adjustment needs under different working conditions, enhancing the system's robustness and adaptability. Finally, by calculating the displacement feedback signal using the adjusted integral parameters, precise control of the piezoelectric ceramic's position adjustment is achieved. This feedback control mechanism enables the system to adjust parameters promptly according to actual conditions.

[0092] Specifically, in some embodiments of the present invention, when the integral parameter K is adjusted when the position of the piezoelectric ceramic is adjusted by selecting the i-th preset adjustment coefficient Ni, and the integral parameter K1 is determined after adjustment, and the displacement feedback signal T = (L1, K1)ΔF is determined, the method includes: obtaining the differential parameter J when the position of the piezoelectric ceramic is adjusted, and judging whether the differential parameter J meets the preset required differential parameter based on the relationship between the differential parameter J and the preset differential parameter J0: when J = J0, it is judged that the differential parameter meets the preset required differential parameter. When J > J0 and J < J0, it is determined that the differential parameter when the piezoelectric ceramic position is adjusted is greater than or less than the preset differential parameter. If the differential parameter when the piezoelectric ceramic position is adjusted does not meet the preset required differential parameter, the differential parameter when the piezoelectric ceramic position is adjusted is adjusted according to the relationship between the differential parameter J when the piezoelectric ceramic position is adjusted and the preset differential parameter J0.

[0093] Specifically, in some embodiments of the present invention, when it is determined that the differential parameter when the position of the piezoelectric ceramic is adjusted does not meet the preset required differential parameter, and the differential parameter when the position of the piezoelectric ceramic is adjusted is adjusted according to the relationship between the differential parameter J when the position of the piezoelectric ceramic is adjusted and the preset differential parameter J0, the adjustment includes: obtaining the differential parameter difference ΔJ between the differential parameter J when the position of the piezoelectric ceramic is adjusted and the preset differential parameter J0, ΔJ = J - J0, comparing the differential parameter difference ΔJ with the preset differential parameter difference, and selecting the corresponding modification coefficient according to the comparison result to correct the differential parameter when the position of the piezoelectric ceramic is adjusted: wherein, a first preset differential parameter difference ΔJ1 and a second preset differential parameter difference ΔJ2 are preset, a first preset correction coefficient B1, a second preset correction coefficient B2 and a third preset correction coefficient B3 are preset, and ΔJ1 < 0 < ΔJ2, B1 < B2 < B3 < 0.3.

[0094] When △J≤△J1, the third preset correction coefficient B3 is selected to correct the differential parameters when the position of the piezoelectric ceramic is adjusted and moved.

[0095] When △J1<△J≤0, the differential parameters are not corrected when the position of the piezoelectric ceramic is adjusted.

[0096] When 0 < ΔJ ≤ ΔJ2, the second preset correction coefficient B2 is selected to correct the differential parameters when adjusting and moving the position of the piezoelectric ceramic.

[0097] When △J>△J2, the first preset correction coefficient B1 is selected to correct the differential parameters when the position of the piezoelectric ceramic is adjusted and moved.

[0098] When the i-th preset correction coefficient Bi is selected to correct the differential parameter when adjusting the position of the piezoelectric ceramic, i = 1, 2, 3, and the differential parameter when adjusting the position of the piezoelectric ceramic is determined to be J1, J1 = J * Bi, and the displacement feedback signal T = (L1, K1, J1) △F is determined.

[0099] Understandably, by comparing the difference between the actual differential parameters and the preset differential parameters, it is possible to determine whether the differential parameters meet the preset requirements when adjusting the position of the piezoelectric ceramic. This allows for real-time monitoring and adjustment of the optical system's operating status, ensuring the system adjusts according to the expected differential parameters. Secondly, by setting multiple preset differential parameter difference ranges and corresponding correction coefficients, multi-stage correction of the differential parameters is achieved. Different correction coefficients are used at different stages, making the system more flexible in adapting to the differential parameter adjustment needs under different operating conditions, enhancing the system's robustness and adaptability. Finally, by calculating the displacement feedback signal using the corrected differential parameters, precise control of the piezoelectric ceramic's position adjustment is achieved.

[0100] In summary, this invention provides a terahertz field generation method based on dual-color field phase locking. By constructing an optical path and using a beam expander to amplify the fringe spot within it, it effectively amplifies and captures subtle changes in the optical path, improving sensitivity to optical signals. Secondly, acquiring the frequency and phase diagrams of the amplified fringe spot provides detailed data on the spatial frequency and phase information of the optical signal, laying the foundation for subsequent analysis and control. Subsequently, by extracting the periodic frequency points of the fringe spot, the system monitors the periodic changes in the optical signal, further enhancing the analytical capabilities of optical characteristics. By acquiring the phase change information of the periodic frequency points and comparing it with a expected phase change threshold, the system can determine in real time whether the optical signal is in the desired state, thereby achieving automatic adjustment of phase locking. Finally, after determining the relationship between the phase change information and the expected threshold, adjusting the position of the piezoelectric ceramic allows for rapid response and correction of errors in the optical system, maintaining stable optical path operation, and effectively and quickly completing phase locking. This simplifies the overall structure and reduces the cost of terahertz magnetic field generation.

[0101] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0102] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart... Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0103] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0104] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0105] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit it. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art should understand that modifications or equivalent substitutions can still be made to the specific implementation of the present invention. Any modifications or equivalent substitutions that do not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. A method for generating terahertz fields based on two-color field phase locking, characterized in that, include: An optical path was constructed, and a beam expander array was used to magnify the striped light spots in the optical path; Obtain the frequency and phase diagrams of the magnified striped light spot, and extract the periodic frequency points of the striped light spot based on the frequency and phase diagrams. The phase change information of the periodic frequency points of the striped light spot is obtained, and based on the relationship between the phase change information of the periodic frequency points of the striped light spot and the expected phase change threshold of the periodic frequency points of the striped light spot, it is determined whether the position of the piezoelectric ceramic should be adjusted or moved. If the phase change information of the periodic frequency point of the striped light spot is within the expected phase change threshold of the periodic frequency point of the striped light spot, then it is determined that the position of the piezoelectric ceramic will not be adjusted or moved. If the phase change information of the periodic frequency point of the striped light spot is outside the expected phase change of the periodic frequency point of the striped light spot, then it is determined that the position of the piezoelectric ceramic should be adjusted and moved. Acquire the phase change information of the periodic frequency points of the striped light spot, and determine whether to adjust or move the position of the piezoelectric ceramic based on the relationship between the phase change information of the periodic frequency points of the striped light spot and the expected phase change threshold of the periodic frequency points of the striped light spot, including: Obtain the real-time phase F of the periodic frequency point of the striped light spot and the expected phase A of the periodic frequency point of the striped light spot; Based on the relationship between the real-time phase F of the periodic frequency point of the striped light spot and the expected phase A of the periodic frequency point of the striped light spot, it is determined whether the position of the piezoelectric ceramic should be adjusted or moved: When F = A, it is determined that the real-time phase F of the periodic frequency point of the striped light spot is the same as the expected phase A of the periodic frequency point of the striped light spot, and therefore the position of the piezoelectric ceramic is not adjusted or moved. When F≠A, it is determined that the real-time phase F of the periodic frequency point of the striped light spot is different from the expected phase A of the periodic frequency point of the striped light spot. Based on the relationship between the real-time phase F of the periodic frequency point of the striped light spot and the expected phase A of the periodic frequency point of the striped light spot, a displacement feedback signal is generated based on the feedback control algorithm, and the position of the piezoelectric ceramic is adjusted and moved according to the displacement feedback signal.

2. The terahertz field generation method based on dual-color field phase locking as described in claim 1, characterized in that, Before acquiring the magnified frequency map and phase map of the striped light spot, and extracting the periodic frequency points of the striped light spot based on the frequency map and phase map, the process includes: Obtain the stripe signal of the magnified striped spot; The frequency diagram and phase diagram of the stripe signal are obtained by performing a fast Fourier transform algorithm on the stripe signal. The periodic frequency points of the stripe spot are extracted based on the frequency diagram and phase diagram of the stripe signal.

3. The terahertz field generation method based on two-color field phase locking as described in claim 1, characterized in that, Based on the relationship between the real-time phase F of the periodic frequency point of the striped light spot and the expected phase A of the periodic frequency point of the striped light spot, a displacement feedback signal is generated according to a feedback control algorithm, and the position of the piezoelectric ceramic is adjusted and moved according to the displacement feedback signal, including: Obtain the expected phase difference ΔF between the real-time phase F of the periodic frequency point of the striped spot and the expected phase A of the periodic frequency point of the striped spot, where ΔF = FA; The feedback control calculation is performed based on the expected phase difference ΔF, and the displacement feedback signal after the feedback control calculation is obtained. The position of the piezoelectric ceramic is adjusted and moved according to the displacement feedback signal T.

4. The terahertz field generation method based on two-color field phase locking as described in claim 3, characterized in that, The feedback control calculation is performed based on the desired phase difference ΔF, and the displacement feedback signal after the feedback control calculation is obtained, including: Obtain the proportional parameter L when the position of the piezoelectric ceramic is adjusted and moved, and determine whether the proportional parameter L when the position of the piezoelectric ceramic is adjusted and moved meets the preset required proportional parameter based on the relationship between the proportional parameter L and the preset proportional parameter L0. When L = L0, it is determined that the proportional parameter when the position of the piezoelectric ceramic is adjusted and moved meets the preset required proportional parameter. When L > L0 and L < L0, it is determined that the proportional parameter when the piezoelectric ceramic position is adjusted is slower or faster than the preset required proportional parameter. It is also determined that the proportional parameter when the piezoelectric ceramic position is adjusted does not meet the preset required proportional parameter. Based on the relationship between the proportional parameter L when the piezoelectric ceramic position is adjusted and the preset proportional parameter L0, the proportional parameter L when the piezoelectric ceramic position is adjusted is adjusted.

5. The terahertz field generation method based on two-color field phase locking as described in claim 4, characterized in that, If the proportional parameter used to adjust the position of the piezoelectric ceramic does not meet the preset required proportional parameter, and based on the relationship between the proportional parameter L used to adjust the position of the piezoelectric ceramic and the preset proportional parameter L0, the proportional parameter L used to adjust the position of the piezoelectric ceramic is adjusted, including: The proportional parameter difference ΔL between the proportional parameter L when the position of the piezoelectric ceramic is adjusted and the preset proportional parameter L0 is obtained, where ΔL = L - L0. The proportional parameter difference ΔL is compared with the preset proportional parameter difference, and the corresponding adjustment coefficient is selected based on the comparison result to adjust the proportional parameter L when the position of the piezoelectric ceramic is adjusted. Among them, the first preset proportional parameter difference △L1 and the second preset proportional parameter difference △L2 are preset, the first preset adjustment coefficient M1, the second preset adjustment coefficient M2 and the third preset adjustment coefficient M3 are preset, and △L1<0<△L2, M1<M2<M3<0.5; When △L≤△L1, the third preset adjustment coefficient M3 is selected to adjust the proportional parameter L when adjusting the position of the piezoelectric ceramic. When △L1<△L≤0, the proportional parameter L is not adjusted when the position of the piezoelectric ceramic is moved. When 0 < ΔL ≤ ΔL2, the second preset adjustment coefficient M2 is selected to adjust the proportional parameter L when the position of the piezoelectric ceramic is adjusted and moved. When △L>△L2, the first preset adjustment coefficient M1 is selected to adjust the proportional parameter L when adjusting the position of the piezoelectric ceramic. When the i-th preset adjustment coefficient Mi is selected to adjust the proportional parameter L when the position of the piezoelectric ceramic is adjusted, i=1,2,3, and the adjusted proportional parameter L1 is determined to be the proportional parameter L1 when the position of the piezoelectric ceramic is adjusted, L1=L*Mi is set, and the displacement feedback signal is determined.

6. The terahertz field generation method based on two-color field phase locking as described in claim 5, characterized in that, When the i-th preset adjustment coefficient Mi is selected to adjust the proportional parameter L when the position of the piezoelectric ceramic is moved, and the adjusted proportional parameter L1 is determined when the position of the piezoelectric ceramic is moved, the displacement feedback signal is determined, including: The integral parameter K is obtained when the position of the piezoelectric ceramic is adjusted and moved. Based on the relationship between the integral parameter K and the preset integral parameter K0, it is determined whether the integral parameter K meets the preset requirement integral parameter. When K=K0, it is determined that the integral parameters when the position of the piezoelectric ceramic is adjusted and moved meet the preset required integral parameters. When K > K0 and K < K0, it is determined that the integral parameter when the piezoelectric ceramic position is adjusted is greater than or less than the preset integral parameter. It is also determined that the integral parameter when the piezoelectric ceramic position is adjusted does not meet the preset required integral parameter. Based on the relationship between the integral parameter K when the piezoelectric ceramic position is adjusted and the preset integral parameter K0, the integral parameter when the piezoelectric ceramic position is adjusted is adjusted.

7. The terahertz field generation method based on two-color field phase locking as described in claim 6, characterized in that, If the integral parameter during the adjustment and movement of the piezoelectric ceramic position does not meet the preset required integral parameter, and based on the relationship between the integral parameter K during the adjustment and movement of the piezoelectric ceramic position and the preset integral parameter K0, the integral parameter during the adjustment and movement of the piezoelectric ceramic position is adjusted, including: The integral parameter difference ΔK between the integral parameter K when the position of the piezoelectric ceramic is adjusted and moved and the preset integral parameter K0 is obtained, where ΔK = K - K0. The integral parameter difference ΔK is compared with the preset integral parameter difference, and the corresponding adjustment coefficient is selected based on the comparison result to adjust the integral parameter K when the position of the piezoelectric ceramic is adjusted and moved. Among them, the first preset integral parameter difference △K1 and the second preset integral parameter difference △K2 are preset, the first preset adjustment coefficient N1, the second preset adjustment coefficient N2 and the third preset adjustment coefficient N3 are preset, and △K1<0<△K2, N1<N2<N3<0.3; When △K≤△K1, the third preset adjustment coefficient N3 is selected to adjust the integral parameter K when the position of the piezoelectric ceramic is adjusted and moved. When △K1<△K≤0, the integral parameter K is not adjusted when the position of the piezoelectric ceramic is moved. When 0 < ΔK ≤ ΔK2, the second preset adjustment coefficient N2 is selected to adjust the integral parameter K when the position of the piezoelectric ceramic is adjusted and moved. When △K>△K2, the first preset adjustment coefficient N1 is selected to adjust the integral parameter K when the position of the piezoelectric ceramic is adjusted and moved; When the i-th preset adjustment coefficient Ni is selected to adjust the integral parameter K when the position of the piezoelectric ceramic is adjusted, i=1,2,3, and the integral parameter K1 is determined when the position of the piezoelectric ceramic is adjusted after adjustment, K1=K*Ni, and the displacement feedback signal is determined.

8. The terahertz field generation method based on two-color field phase locking as described in claim 7, characterized in that, When the i-th preset adjustment coefficient Ni is selected to adjust the integral parameter K when the position of the piezoelectric ceramic is adjusted, i=1,2,3, and the integral parameter K1 is determined to be the adjusted position of the piezoelectric ceramic, K1=K*Ni, the displacement feedback signal is determined, including: Obtain the differential parameter J when the piezoelectric ceramic position is adjusted and moved, and determine whether the differential parameter J when the piezoelectric ceramic position is adjusted and moved meets the preset required differential parameter based on the relationship between the differential parameter J and the preset differential parameter J0. When J=J0, it is determined that the differential parameters of the piezoelectric ceramic during position adjustment and movement meet the preset required differential parameters. When J > J0 and J < J0, it is determined that the differential parameter when the piezoelectric ceramic position is adjusted is greater than or less than the preset differential parameter. It is also determined that the differential parameter when the piezoelectric ceramic position is adjusted does not meet the preset required differential parameter. Based on the relationship between the differential parameter J when the piezoelectric ceramic position is adjusted and the preset differential parameter J0, the differential parameter when the piezoelectric ceramic position is adjusted is adjusted.

9. The terahertz field generation method based on two-color field phase locking as described in claim 8, characterized in that, If the differential parameter during the adjustment and movement of the piezoelectric ceramic does not meet the preset required differential parameter, and based on the relationship between the differential parameter J during the adjustment and movement of the piezoelectric ceramic and the preset differential parameter J0, the differential parameter during the adjustment and movement of the piezoelectric ceramic is adjusted, including: The differential parameter difference ΔJ between the differential parameter J when the position of the piezoelectric ceramic is adjusted and moved and the preset differential parameter J0 is obtained, where ΔJ = J - J0. The differential parameter difference ΔJ is compared with the preset differential parameter difference, and the corresponding modification coefficient is selected based on the comparison result to correct the differential parameter when the position of the piezoelectric ceramic is adjusted and moved. Among them, the first preset differential parameter difference △J1 and the second preset differential parameter difference △J2 ​​are preset, the first preset correction coefficient B1, the second preset correction coefficient B2 and the third preset correction coefficient B3 are preset, and △J1<0<△J2, B1<B2<B3<0.3; When △J≤△J1, the third preset correction coefficient B3 is selected to correct the differential parameter when the position of the piezoelectric ceramic is adjusted and moved. When △J1<△J≤0, the differential parameters of the piezoelectric ceramic are not corrected when the position is adjusted and moved. When 0 < ΔJ ≤ ΔJ2, the second preset correction coefficient B2 is selected to correct the differential parameter when the position of the piezoelectric ceramic is adjusted and moved. When △J>△J2, the first preset correction coefficient B1 is selected to correct the differential parameter when the position of the piezoelectric ceramic is adjusted and moved. When the i-th preset correction coefficient Bi is selected to correct the differential parameter when the position of the piezoelectric ceramic is adjusted and moved, i=1,2,3, and the differential parameter when the position of the piezoelectric ceramic is adjusted and moved after correction is determined to be J1, J1=J*Bi, and the displacement feedback signal is determined.

Images