Automated Test System Customized for Radio Frequency and Intermediate Frequency Integrated Microsystems

Abstract

The present invention provides a customized automatic test system for radio frequency and intermediate frequency integrated microsystems. According to the customized test items, communications of relevant instruments and auxiliary devices are established. Through the central control machine, corresponding control operations are performed on one or more of the power supply, microsystem test board, signal source module, switch matrix module, and spectrum module required for the test items of the test target, and the output signals or spectrum data of each target test item received are analyzed and processed to obtain a test report. The customized automatic test system of the present invention includes index tests for radio frequency and intermediate frequency channels, has strong test coverage and high test efficiency; and the system also has high portability on the basis of customization, with general underlying driver code, which can be easily ported to the test platforms of other projects.

Description

Technical Field

[0001] The present invention relates to the technical field of testing, and particularly to an automatic testing system customized for radio frequency and intermediate frequency integrated microsystems. Background Art

[0002] Currently, the commonly used radio frequency and microwave testing systems require a large number of testing devices, mix vector testing with scalar testing, and share broadband and narrowband testing schemes, forming an extremely complex and non-portable testing platform. For most radio frequency and intermediate frequency testing projects, the form of manual channel switching, instrument operation, data reading, data saving and processing, and report writing is still used. The entire testing process will consume a large amount of time, which is unacceptable for batch testing of mass-produced products. Summary of the Invention

[0003] In view of the above-mentioned disadvantages of the prior art, the purpose of the present invention is to provide an automatic testing system customized for radio frequency and intermediate frequency integrated microsystems to solve the above-mentioned prior art problems.

[0004] To achieve the above purpose and other related purposes, the present invention provides an automatic testing system customized for radio frequency and intermediate frequency integrated microsystems, including: a central control machine, a power supply, a microsystem test board, a signal source module, a switch matrix module, and a spectrum module; wherein, the central control machine is respectively communicatively connected to the power supply, the microsystem test board, the signal source module, and the spectrum module; the microsystem test board is respectively communicatively connected to the power supply, the signal source module, and the switch matrix module; the switch matrix module includes: a radio frequency receiving switch matrix, an intermediate frequency receiving switch matrix, and an output switch matrix controlled by the microsystem test board to configure high and low levels; the signal source module is used to output one or more of a clock signal, a radio frequency local oscillator signal, a radio frequency receiving signal, and an intermediate frequency receiving signal to the microsystem test board; wherein, under the control of the radio frequency receiving switch matrix, the radio frequency receiving signal is input into the corresponding channel of the microsystem test board; under the control of the intermediate frequency receiving switch matrix, the intermediate frequency receiving signal is input into the corresponding channel of the microsystem test board; the microsystem test board is used to perform corresponding data processing based on the received signal related to the target test item from the signal source module to output an output signal corresponding to the target test item; the spectrum module is used to receive the output signal of the target test item output from the corresponding channel of the microsystem test board under the control of the output switch matrix, and generate corresponding spectrum data and send it to the central control machine; the central control machine is used to perform corresponding control operations on one or more of the power supply, the microsystem test board, the signal source module, the switch matrix module, and the spectrum module required for testing the target test item, and analyze and process the received output signal or spectrum data of each target test item to obtain a test report.

[0005] In an embodiment of the present invention, the signal source module includes: a clock signal source for outputting a clock signal to the micro-system test board; a radio frequency local oscillator signal source for outputting a radio frequency local oscillator signal to the micro-system test board; a radio frequency receiving signal source connected to a radio frequency receiving switch matrix for inputting a first radio frequency receiving signal or a second radio frequency receiving signal from a corresponding channel of the micro-system test board under the control of the radio frequency receiving switch matrix; and an intermediate frequency signal source connected to the intermediate frequency receiving switch matrix for inputting an intermediate frequency receiving signal from a corresponding channel of the micro-system test board under the control of the radio frequency receiving switch matrix.

[0006] In an embodiment of the present invention, the microsystem test board is formed with an AD receiving link, a DA transmitting link, a radio frequency receiving link, and a radio frequency transmitting link; the microsystem test board includes: a clock input port, an ADC input port, a radio frequency receiving input port, a radio frequency transmitting input port, a clock chip, an FPGA, a radio frequency transceiver link composed of switches and switch filters, a sampling chip, a TR power management chip, a DAC output port, a radio frequency receiving output port, a radio frequency transmitting output port, a LAN network port, and a USB port; wherein, when the target test item is an AD receiving link test item, a clock signal from the clock signal source is received through the clock input port, and after the FPGA receives the intermediate frequency receiving link control instruction sent by the central control machine transmitted through the USB port, the sampling chip is configured; after the sampling chip is configured, the intermediate frequency receiving signal sent by the intermediate frequency signal source received through the ADC input port from the corresponding channel is mixed to zero intermediate frequency for sampling, and the sampled AD data obtained by sampling is output as the output signal of the AD receiving link test item to the central control machine through the LAN network port; when the target test item is a DA transmitting link test item, a clock signal from the clock signal source is received through the clock input port, and after the FPGA receives the intermediate frequency transmitting link control instruction sent by the central control machine transmitted through the USB port, the obtained DA transmitting link data is output as the output signal of the DA transmitting link test item through the DAC output port, so that the spectrum module receives the corresponding output signal under the control of the output switch matrix and generates the corresponding spectrum data and sends it to the central control machine; when the target test item is a radio frequency receiving link test item, a clock signal from the clock signal source is received through the clock input port, and after the FPGA receives the radio frequency receiving link control instruction sent by the central control machine transmitted through the USB port, the radio frequency receiving link control instruction corresponding serial codeword is input into the TR power management chip, and after the switches and switch filters in the radio frequency transceiver link are controlled by the high and low levels generated by the radio frequency transceiver link, the radio frequency receiving link data obtained based on the intermediate frequency receiving signal sent by the radio frequency local oscillator signal source received through the radio frequency receiving input port and the first radio frequency receiving signal sent by the radio frequency receiving signal source received from the corresponding channel is output as the output signal of the radio frequency receiving link test item through the radio frequency receiving output port, so that the spectrum module receives the output signal of the corresponding channel under the control of the output switch matrix and generates the corresponding spectrum data and sends it to the central control machine;When the target test item is a radio frequency (RF) transmission link test item, a clock signal from the clock signal source is received through the clock input port. After the Field-Programmable Gate Array (FPGA) receives the RF transmission link control instruction sent by the central control unit through the USB port, the serial code word corresponding to the RF reception link control instruction is input into the TR power management chip. Then, the high and low levels generated by the RF transceiver link control the switches and switch filters in the RF transceiver link. After that, the RF transmission link data obtained based on the intermediate frequency (IF) reception signal sent by the RF local oscillator signal source received through the RF reception input port and the second RF reception signal of the RF reception signal source received from the corresponding channel is output as the output signal of the RF transmission link test item through the RF transmission output port, so that the spectrum module can receive the output signal output from the corresponding channel under the control of the output switch matrix and generate the corresponding spectrum data and send it to the central control unit.

[0007] In an embodiment of the present invention, the central control unit includes: a pre-test processing module, configured to sequentially set the test information required for the target test item on the main interface and the human-machine interaction window, and check whether the relevant devices are communicating normally; a power-on normal detection module, connected to the pre-test processing module, configured to control a power-on normal detection operation to determine whether the power-on is normal after the pre-test processing is completed; a link calibration module, connected to the power-on normal detection module, configured to determine whether the links of the set target detection items are calibrated under normal power-on conditions, and calibrate the links in case of non-calibration; a test control module, connected to the link calibration module, configured to perform corresponding test control operations on one or more of the micro-system test board, the signal source module, the switch matrix module, and the spectrum module for the current target test item after the links of all target detection items are calibrated, record the output signal or spectrum data of the current target test item received, and continue to perform the test control operation for the next target test item after the data recording is completed until the output signals or spectrum data of all target test items are obtained; a test report output module, connected to the test control module, configured to analyze and process the output signals or spectrum data of all target test items and output the corresponding test report.

[0008] In an embodiment of the present invention, for the current target test item, performing corresponding test control operations on one or more of a microsystem test board, a signal source module, a switch matrix module, and a spectrum module includes: if the current target test item is an AD receive link test item, sending an intermediate frequency receive link control instruction to the microsystem test board to configure the sampling chip of the microsystem test board, then controlling the intermediate frequency signal source to output an intermediate frequency receive signal, and controlling the microsystem test board to configure high and low levels to control the intermediate frequency receive switch matrix to switch channels to obtain an output signal of the AD receive link test item; if the current target test item is a DA transmit link test item, sending an intermediate frequency receive link control instruction to the microsystem test board to configure the sampling chip of the microsystem test board, then sending an intermediate frequency transmit link control instruction to the microsystem test board, and controlling the microsystem test board to configure high and low levels to control the output switch matrix to switch channels to obtain an output signal of the DA transmit link test item, and controlling the spectrum module to generate corresponding spectrum data to receive the spectrum data; if the current target test item is a radio frequency receive link test item, sending a radio frequency receive link control instruction to the microsystem test board to send a serial code word corresponding to the radio frequency receive link control instruction to the TR power management chip to control the generated high and low levels to construct a radio frequency transceiver link, controlling the radio frequency local oscillator signal source and the radio frequency receive signal source to output a radio frequency local oscillator signal and a first radio frequency receive signal, and controlling the microsystem test board to configure high and low levels to control the radio frequency receive switch matrix and the output switch matrix to switch channels to obtain an output signal of the radio frequency receive link test item, and controlling the spectrum module to generate corresponding spectrum data to receive the spectrum data; if the current target test item is a radio frequency transmit link test item, sending a radio frequency transmit link control instruction to the microsystem test board to send a serial code word corresponding to the radio frequency receive link control instruction to the TR power management chip to control the generated high and low levels to construct a radio frequency transceiver link, controlling the radio frequency local oscillator signal source and the radio frequency receive signal source to output a radio frequency local oscillator signal and a second radio frequency receive signal, and controlling the microsystem test board to configure high and low levels to control the radio frequency receive switch matrix and the output switch matrix, and controlling the spectrum module to generate corresponding spectrum data to receive the spectrum data.

[0009] In an embodiment of the present invention, setting the test information required for the target test item in the main interface and the human-machine interaction window in sequence, and checking whether the relevant devices communicate normally includes: selecting all target test items included in this test in the main interface, and setting the test item information and the report output address; setting the instrument information required for the target test item, the serial port number and the baud rate connected to the microsystem test board in the human-machine interaction form interface; detecting whether the communication of each instrument is normal, and completing the pre-test processing under normal conditions.

[0010] In an embodiment of the present invention, controlling the power-on normal detection operation includes: sending a control instruction to the power supply and setting the voltage and current values of each port of the micro-system test board, so that the power supply outputs current in sequence according to the power-on sequence; reading back the working current of the power supply and comparing it with the stored correct static current value. If they are the same, the power-on is normal.

[0011] In an embodiment of the present invention, the system further includes: a power meter for calibrating an uncalibrated link to compensate for the deviation data after calibration.

[0012] In an embodiment of the present invention, the spectrum module includes: a first spectrum analyzer and a second spectrum analyzer; the output switch matrix includes: a first output switch matrix and a second output switch matrix; wherein, the first spectrum analyzer is connected to the first output switch matrix and is used to receive the output signal of the radio frequency receiving link test item output from the corresponding channel under the control of the first output switch matrix, and generate corresponding spectrum data and send it to the central control machine; the second spectrum analyzer is connected to the second output switch matrix and is used to receive the output signal of the radio frequency transmitting link test item output from the corresponding channel under the control of the second output switch matrix, and generate corresponding spectrum data and send it to the central control machine.

[0013] In an embodiment of the present invention, the central control machine communicates with the power supply, the signal source module and the spectrum module through the GPIB protocol respectively.

[0014] As described above, the present invention is an automatic test system customized for radio frequency and intermediate frequency integrated micro-systems, and has the following beneficial effects: according to the customized test items, the present invention establishes the communication of relevant instruments and auxiliary equipment, and executes corresponding control operations on one or more of the power supply, the micro-system test board, the signal source module, the switch matrix module and the spectrum module required for the test target test items through the central control machine, and analyzes and processes the output signals or spectrum data of each target test item received to obtain a test report. The customized automatic test system of the present invention includes the index tests of radio frequency and intermediate frequency channels, has strong test coverage and high test efficiency; and the system also has high portability on the basis of customization, and the underlying driver code is general and can be easily transplanted to the test platforms of other projects. Description of the Drawings

[0015] Figure 1 It shows a schematic structural diagram of an automatic test system customized for radio frequency and intermediate frequency integrated micro-systems in an embodiment of the present invention.

[0016] Figure 2 It shows a schematic structural diagram of an automatic test system customized for radio frequency and intermediate frequency integrated micro-systems in an embodiment of the present invention.

[0017] Figure 3 It shows a schematic structural diagram of the microsystem test board in an embodiment of the present invention.

[0018] Figure 4 It shows a schematic diagram of the multi-level software architecture in an embodiment of the present invention.

[0019] Figure 5 It shows a schematic diagram of the test process of the automatic test system customized for the radio frequency and intermediate frequency integrated microsystem in an embodiment of the present invention. Specific embodiments

[0020] The following uses specific specific examples to illustrate the implementation manners of the present invention. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation manners. Various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of the present invention. It should be noted that, without conflict, the following embodiments and the features in the embodiments can be combined with each other.

[0021] It should be noted that in the following description, reference is made to the accompanying drawings, which describe several embodiments of the present invention. It should be understood that other embodiments can also be used, and mechanical composition, structure, electrical, and operational changes can be made without departing from the spirit and scope of the present invention. The following detailed description should not be considered restrictive, and the scope of the embodiments of the present invention is only defined by the claims of the published patent. The terms used here are only for describing specific embodiments and are not intended to limit the present invention. Spatially related terms, such as "upper", "lower", "left", "right", "below", "beneath", "lower part", "above", "upper part", etc., can be used in the text to facilitate the description of the relationship between one element or feature shown in the figure and another element or feature.

[0022] Throughout the specification, when it is said that a part is "connected" to another part, this includes not only the case of "direct connection", but also the case of "indirect connection" with other elements placed in between. In addition, when it is said that a certain part "includes" a certain constituent element, unless there is a particularly contrary record, it does not mean excluding other constituent elements, but means that other constituent elements can also be included.

[0023] The first, second, third, etc. terms mentioned herein are used to illustrate various parts, components, regions, layers, and / or segments, but are not limited thereto. These terms are only used to distinguish a part, component, region, layer, or segment from other parts, components, regions, layers, or segments. Therefore, the first part, component, region, layer, or segment described below may refer to the second part, component, region, layer, or segment without exceeding the scope of the present invention.

[0024] Furthermore, as used herein, the singular forms "a", "an", and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It should be further understood that the terms "comprising", "including" indicate the presence of the stated features, operations, elements, components, items, kinds, and / or groups, but do not preclude the presence, occurrence, or addition of one or more other features, operations, elements, components, items, kinds, and / or groups. The terms "or" and "and / or" used herein are to be construed as inclusive, meaning any one or any combination. Thus, "A, B, or C" or "A, B, and / or C" means "any of the following: A; B; C; A and B; A and C; B and C; A, B, and C". An exception to this definition only occurs when the combination of elements, functions, or operations is inherently mutually exclusive in some way.

[0025] Most of the RF and IF test items still use the form of manual channel switching, operating instruments, reading data, saving and processing data, and writing reports. The entire test process will consume a large amount of time, which is unacceptable for the batch testing of mass-produced products. Therefore, in order to accelerate the test efficiency and adapt to various test scenarios, it is necessary to implement a complete process of establishing communication between relevant instruments and auxiliary equipment according to customized test items, controlling instruments, equipment, and FPGA according to the test flow chart to obtain effective test data, and processing and outputting reports.

[0026] Therefore, an automatic test system customized for RF and IF integrated microsystems according to the present invention establishes communication between relevant instruments and auxiliary equipment according to customized test items, and performs corresponding control operations on one or more of the power supply, microsystem test board, signal source module, switch matrix module, and spectrum module required for the target test items of the test object through the central control machine, and analyzes and processes the output signals or spectrum data of each target test item received to obtain a test report. The customized automatic test system of the present invention includes the index test of RF and IF channels, has strong test coverage and high test efficiency; and the system also has high portability on the basis of customization, with common underlying driver code and can be easily transplanted to the test platforms of other projects.

[0027] The following is a detailed description of the embodiments of the present invention with reference to the accompanying drawings, so that those skilled in the technical field of the present invention can easily implement it. The present invention can be embodied in many different forms and is not limited to the embodiments described herein.

[0028] As Figure 1 Shown is a schematic structural diagram of an automatic test system customized for a radio frequency and intermediate frequency integrated microsystem in an embodiment of the present invention.

[0029] The system includes: a central control machine 1, a power supply 2, a microsystem test board 3, a signal source module 4, a switch matrix module, and a spectrum module 5; wherein, the central control machine 1 is respectively communicatively connected to the power supply 2, the microsystem test board 3, the signal source module 4, and the spectrum module 5; preferably, the central control machine 1 communicates with the power supply 2, the signal source module 4, and the spectrum module 5 through the GPIB protocol; the communication between the industrial control machine 1 and the microsystem test board 3 is realized through the UART protocol and the TCP protocol; the UART protocol is mainly used to transmit control instructions and read back control instruction feedback; the TCP communication is used to read back the sampled AD data.

[0030] The microsystem test board 3 is respectively communicatively connected to the power supply 2, the signal source module 4, and the switch matrix module; the switch matrix module includes: a radio frequency receiving switch matrix, an intermediate frequency receiving switch matrix, and an output switch matrix; the control of each switch matrix is realized by configuring high and low levels of the microsystem test board 3 through instructions issued by the industrial control machine 1;

[0031] The signal source module 4 is used to output one or more of a clock signal, a radio frequency local oscillator signal, a radio frequency receiving signal, and an intermediate frequency receiving signal to the microsystem test board 3; wherein, the radio frequency receiving signal is input to the corresponding channel of the microsystem test board 3 under the control of the radio frequency receiving switch matrix; the intermediate frequency receiving signal is input to the corresponding channel of the microsystem test board 3 under the control of the intermediate frequency receiving switch matrix;

[0032] The microsystem test board 3 is used to perform corresponding data processing based on the signals related to the target test item received from the signal source module 4, so as to output an output signal corresponding to the target test item;

[0033] The spectrum module 5 is used to receive the output signal of the target test item output from the corresponding channel of the microsystem test board 3 under the control of the output switch matrix, and generate corresponding spectrum data and send it to the central control machine 1;

[0034] The central control unit 1 is configured to perform corresponding control operations on one or more of the power supply 2, the micro-system test board 3, the signal source module 4, the switch matrix module, and the spectrum module 5 required for the test items of the test target, and analyze and process the output signals or spectrum data of each target test item received to obtain a test report.

[0035] The automatic test system customized for radio frequency and intermediate frequency integrated microsystems of the present application includes a software part and a hardware part; in order to better describe the hardware part of the system, it is now combined with Figure 2 and Figure 3 and the following specific embodiments are described.

[0036] In one embodiment, as Figure 2 , the signal source module 4 includes:

[0037] A clock signal source, configured to output a clock signal to the micro-system test board to provide a clock signal required for testing to the micro-system test board;

[0038] A radio frequency local oscillator signal source, configured to output a radio frequency local oscillator signal to the micro-system test board;

[0039] A radio frequency receiving signal source, connected to the radio frequency receiving switch matrix, configured to input a first radio frequency receiving signal or a second radio frequency receiving signal from a corresponding channel of the micro-system test board under the control of the radio frequency receiving switch matrix;

[0040] An intermediate frequency signal source, connected to the intermediate frequency receiving switch matrix, configured to input an intermediate frequency receiving signal from a corresponding channel of the micro-system test board under the control of the radio frequency receiving switch matrix.

[0041] It should be noted that the radio frequency local oscillator signal source and the radio frequency receiving signal source are used to provide signals to the micro-system test board when corresponding radio frequency-related items are tested; the intermediate frequency signal source is used to provide signals to the micro-system test board when corresponding intermediate frequency-related items are tested.

[0042] In one embodiment, the micro-system test board is formed with an AD receiving link, a DA transmitting link, a radio frequency receiving link, and a radio frequency transmitting link, and the test items can be customized as AD receiving link test items, DA transmitting link test items, radio frequency receiving link test items, and radio frequency transmitting link test items.

[0043] Such as Figure 3, the microsystem test board includes: a clock input port CLK_IN_COM, an ADC input port ADC_IN_COM, a radio frequency receiving input port RF_RX_IN_COM, a radio frequency transmitting input port RF_TX_IN_COM, a clock chip, an FPGA, a radio frequency transceiver link composed of switches and switch filters, a sampling chip, a TR power management chip, a DAC output port DAC_OUT_COM, a radio frequency receiving output port RF_RX_OUT_COM, a radio frequency transmitting output port RF_TX_OUT_COM, a LAN network port LAN_COM, and a USB port USB_COM;

[0044] Among them, the FPGA includes: a hard core and a soft core; the radio frequency transceiver link includes: connected switches, switch filters, and a TR power management chip;

[0045] During testing, the transmission process of the basic signal flow of the microsystem test board is as follows:

[0046] When the target test item is an AD receiving link test item, the clock signal SYSCLK from the clock signal source is received through the CLK_IN_COM port. After the hard core in the FPGA receives the intermediate frequency receiving link control instruction sent by the central control machine through the USB_COM port, the VALID signal is transmitted to the soft core through the AXI bus, and the sampling chip register configuration data stored in the soft core is returned to the hard core, and the sampling chip is configured through SPI; after the sampling chip is configured, the intermediate frequency receiving signal sent by the intermediate frequency signal source received through the ADC_IN_COM port from the corresponding channel is mixed to zero intermediate frequency for sampling, and the sampled AD data SERDES_AD_DATA is triggered by the sampling flag signal from the central control machine, stored in the FPGA, and then used as the output signal of the AD receiving link test item and output to the central control machine through the LAN_COM network port;

[0047] It should be noted that the REFCLK reference clock of the FPGA and the synchronous clock of the sampling chip are both obtained by dividing the external signal received by the clock chip through CLK_IN_COM.

[0048] When the target test item is the DA transmission link test item, a clock signal from the clock signal source is received through the CLK_IN_COM port. After the hardcore in the FPGA receives the intermediate frequency transmission link control instruction sent by the central control unit through the USB_COM port, the processed modulation signal, that is, the DA transmission link data, is output as the output signal of the DA transmission link test item through the DAC_OUT_COM port, so that the spectrum module receives the corresponding output signal under the control of the output switch matrix and generates the corresponding spectrum data and sends it to the central control unit;

[0049] It should be noted that there are three ways to obtain the DA transmission link data:

[0050] 1. Output with the intermediate frequency received signal as the data source; the front-end process of the control instruction intermediate frequency received signal is the same as that of the above AD reception link. After the AD data reception is completed, SERDES_DA_DATA is directly output to the FPGA through the internal link and then output as a signal through the ADC_OUT_COM port.

[0051] 2. Generate the output signal by itself through the BIST mode; in the BIST mode, there is no data at the front end of the signal, and SERDES_DA_DATA is directly generated by the chip and output through the FPGA.

[0052] 3. Generate a low-frequency clock output by the DDS module of the FPGA; in the DDS mode, the front end of the DA signal is generated by the DDS module of the FPGA, and the back-end link is the same as the above.

[0053] When the target test item is the radio frequency reception link test item, a clock signal from the clock signal source is received through the CLK_IN_COM port. After the FPGA receives the radio frequency reception link control instruction sent by the central control unit through the USB_COM port, it is processed by the hardcore in the FPGA, and the serial codeword corresponding to the radio frequency reception link control instruction is sent to the TR power management chip. After the high and low levels generated by the radio frequency transceiver link control the switches and switch filters in the radio frequency transceiver link, different links (including transceiver, frequency band, mixing, direct-through control) are constructed. Except for the direct-through control, the radio frequency reception link data obtained after mixing the intermediate frequency reception signal sent by the radio frequency local oscillator signal source received through the RF_RX_IN_COM port and the first radio frequency reception signal sent by the radio frequency reception signal source received from the corresponding channel is output as the output signal of the radio frequency reception link test item through the RF_RX_OUT_COM port, so that the spectrum module receives the output signal of the corresponding channel under the control of the output switch matrix and generates the corresponding spectrum data and sends it to the central control unit;

[0054] It should be noted that when the link is a through connection, no mixing is required, and the received signal is directly output.

[0055] When the target test item is a radio frequency transmission link test item, a clock signal from the clock signal source is received through the CLK_IN_COM port. After the FPGA receives the radio frequency transmission link control instruction sent by the central control unit through the USB_COM port, it is processed by the hard core in the FPGA. The serial code word corresponding to the radio frequency reception link control instruction is input into the TR power management chip, and the high and low levels generated by the radio frequency transceiver link control the switches and switch filters in the radio frequency transceiver link, thereby constructing different links (including transceiver, frequency band, mixing, through connection control). Except for the through connection control, the radio frequency transmission link data obtained by mixing the intermediate frequency reception signal sent by the radio frequency local oscillator signal source received through the radio frequency reception input port and the second radio frequency reception signal of the radio frequency reception signal source received from the corresponding channel is used as the output signal of the radio frequency transmission link test item and is output through the RF_TX_IN_COM port, so that the spectrum module receives the output signal output from the corresponding channel under the control of the output switch matrix and generates the corresponding spectrum data and sends it to the central control unit.

[0056] In one embodiment, as Figure 2 shown, the spectrum module 5 includes: a first spectrum analyzer and a second spectrum analyzer; the output switch matrix includes: a first output switch matrix and a second output switch matrix;

[0057] Among them, the first spectrum analyzer is connected to the first output switch matrix and is used to receive the output signal of the radio frequency reception link test item output from the corresponding channel under the control of the first output switch matrix and generate the corresponding spectrum data and send it to the central control unit; the second spectrum analyzer is connected to the second output switch matrix and is used to receive the output signal of the radio frequency transmission link test item output from the corresponding channel under the control of the second output switch matrix and generate the corresponding spectrum data and send it to the central control unit.

[0058] The software part of the present invention is mainly implemented through the central control unit. In order to better describe the software part of the system, the following specific embodiments are now combined for description.

[0059] As Figure 4 , the central control unit adopts a multi-level software architecture, specifically including three hierarchical structures;

[0060] The first level is the main form, which includes test item selection, signal flow diagram, power form entry, signal source form entry, spectrum analyzer form entry, switch matrix host computer entry, and test board host computer entry;

[0061] The second level is the human-machine interaction form, including the power control form, signal source control form, spectrum analyzer control form, switch matrix host computer form, and test board host computer form. The forms of all instruments include the instrument brand, model, instrument communication method selection, and basic instrument control items. The host computer form includes the serial port number, baud rate selection, information reading control, etc. In addition, it also includes a test calibration form for calibrating the selected RF test link.

[0062] The third level is the underlying driver program, including instrument driver programs, communication driver programs, MATLAB function functions, and calibration algorithms. The communication driver programs include TCP / IP communication, GPIB communication, SPI communication, and UART communication. The MATLAB function functions mainly process the received data, perform FFT calculations, and output in the form of a spectrum image. The calibration algorithm is used to calibrate the RF link, measure the test error value, and complete the compensation.

[0063] In one embodiment, in combination with the above multi-level software architecture, the central control machine includes:

[0064] A pre-test processing module, used to sequentially set the test information required for the test target test items on the main interface and the human-machine interaction window, and check whether the relevant devices are communicating normally;

[0065] A power-on normal detection module, connected to the pre-test processing module, used to control the power-on normal detection operation after the pre-test processing is completed to determine whether the power-on is normal;

[0066] A link calibration module, connected to the power-on normal detection module, used to determine whether the links of the set target detection items are calibrated under normal power-on conditions; and calibrate the links in the case of non-calibration; preferably, the system further includes: a power meter, used to calibrate the uncalibrated link to compensate for the deviation data after calibration.

[0067] A test control module, connected to the link calibration module, used to perform corresponding test control operations on one or more of the microsystem test board, signal source module, switch matrix module, and spectrum module for the current target test item after the links of all target detection items are calibrated, and record the output signal or spectrum data of the current target test item received. After the data recording is completed, continue to perform the test control operation for the next target test item until the output signals or spectrum data of all target test items are obtained;

[0068] A test report output module, connected to the test control module, used to analyze and process the output signals or spectrum data of all target test items and output the corresponding test report.

[0069] In one embodiment, test information required for the test items of the test target is sequentially set on the main interface and the human-computer interaction window, and it is checked whether the relevant devices are communicating normally, including:

[0070] On the main interface, select all target test items included in this test, and set the test item information and the report output address;

[0071] On the human-computer interaction form interface, set the instrument information required for the test items of the test target, as well as the serial port number and baud rate connected to the microsystem test board;

[0072] On the human-computer interaction window interface, enter the windows of each instrument to detect whether the communication of each instrument is normal, and complete the pre-test processing under normal circumstances.

[0073] In one embodiment, controlling the power-on normal detection operation includes:

[0074] Send a control command to the power supply, and set the voltage and current values of each port of the microsystem test board for the power supply to output current in sequence according to the power-on sequence;

[0075] Read back the working current of the power supply and compare it with the stored correct static current value. If they are the same, the power-on is normal; otherwise, it is abnormal.

[0076] In a specific embodiment, for the current target test item, performing corresponding test control operations on one or more of the microsystem test board, signal source module, switch matrix module, and spectrum module includes:

[0077] If the current target test item is an AD reception link test item, control the clock signal source to output a clock signal, send an intermediate frequency reception link control command to the microsystem test board to configure the sampling chip of the microsystem test board, then control the intermediate frequency signal source to output an intermediate frequency reception signal, and control the microsystem test board to configure high and low levels to control the intermediate frequency reception switch matrix to switch channels to obtain the output signal of the AD reception link test item output by the microsystem test board;

[0078] If the current target test item is a DA transmission link test item, send an intermediate frequency reception link control command to the microsystem test board to configure the sampling chip of the microsystem test board, control the clock signal source to output a clock signal, send an intermediate frequency transmission link control command to the microsystem test board, and control the microsystem test board to configure high and low levels to control the output switch matrix to switch channels to obtain the output signal of the DA transmission link test item, and control the spectrum module to generate corresponding spectrum data to receive the spectrum data;

[0079] If the current target test item is a radio frequency receiving link test item, control the clock signal source to output a clock signal, and send a radio frequency receiving link control instruction to the micro-system test board, so as to input the high and low levels generated by controlling the serial code word corresponding to the radio frequency receiving link control instruction into the TR power management chip to construct a radio frequency transceiver link, control the radio frequency local oscillator signal source and the radio frequency receiving signal source to output a radio frequency local oscillator signal and a first radio frequency receiving signal, and control the micro-system test board to configure high and low levels to control the radio frequency receiving switch matrix and output the output signal of the radio frequency receiving link test item of the switch matrix switching channel, and control the spectrum module to generate corresponding spectrum data to receive the spectrum data;

[0080] If the current target test item is a radio frequency transmitting link test item, control the clock signal source to output a clock signal, and send a radio frequency transmitting link control instruction to the micro-system test board, so as to input the high and low levels generated by controlling the serial code word corresponding to the radio frequency receiving link control instruction into the TR power management chip to construct a radio frequency transceiver link, control the radio frequency local oscillator signal source and the radio frequency receiving signal source to output a radio frequency local oscillator signal and a second radio frequency receiving signal, and control the micro-system test board to configure high and low levels to control the radio frequency receiving switch matrix and output the output signal of the radio frequency transmitting link test item obtained by switching the channel of the output switch matrix, and control the spectrum module to generate corresponding spectrum data to receive the spectrum data.

[0081] To better describe the test process of the automatic test system, the following will be combined with Figure 5 and the following specific embodiments for description.

[0082] The overall test process is as follows:

[0083] Step 1: First, build a hardware test environment, and check whether all the used instruments are within the metrology cycle; whether the DUT is in good condition; check whether the cables are intact, etc.

[0084] Step 2: Select the test items included in this test on the main interface of the test software, and set the test item information and the report output address.

[0085] Step 3: Set the model number, network analyzer address, etc. of the instrument on the human-computer interaction form interface.

[0086] Step 4: Set the serial port number and baud rate connected to the test board.

[0087] Step 5: Start the test program, and check whether the instrument communication, serial port communication, and network port communication are normal.

[0088] Step 6: Start the test after the preconditions are completed.

[0089] Step 7: The industrial control computer sends control instructions to the power supply, sets the voltage and current values of each port, and outputs the current in sequence according to the power-on sequence.

[0090] Step 8: Read back the operating current of the power supply.

[0091] Step 9: Compare with the correct static current value stored in the industrial control computer to check if there is an abnormal power-on phenomenon. If it is correct, continue; if it is incorrect, return to Step 1 to manually check which part of the connection or the DUT has problems.

[0092] Step 10: Select different test links according to different test items.

[0093] Step 11: Check if the test link is calibrated. If it is not calibrated, jump to Step 12; if it has passed the link calibration, jump to Step 13.

[0094] Step 12: Set the power meter to calibrate the test link and compensate for the deviation data after calibration.

[0095] Step 13: According to different test items, configure the sampling chip or send serial codes to the TR power management chip to control the high and low levels to construct a radio frequency transceiver link.

[0096] Step 14: Control the signal source to output signals with a certain power and frequency, and control the FREQ and SPAN of the spectrum analyzer.

[0097] Step 15: Control the switch matrix to switch to the DUT channel.

[0098] Step 16: The test of the current link test item ends.

[0099] Step 17: The test ends and the test data is recorded.

[0100] Step 18: Judge whether the test is over. If there are untested test items, return to 10) to continue the test; if all test items are completed, continue.

[0101] Step 19: Analyze and process the data obtained from the test, output the test report, and complete the test.

[0102] As can be seen from the above, the present invention has the following advantages:

[0103] 1) A customized automatic test system for radio frequency and intermediate frequency microsystems, including the index test of radio frequency and intermediate frequency channels, with strong test coverage and high test efficiency.

[0104] 2) Adopting a multi-level software architecture, all functions are implemented modularly. When it is necessary to update a certain part of them, only select this module to modify it, which is convenient for system iteration and update.

[0105] 3) Based on customization, this system also has high portability. The underlying driver code is common and can be easily ported to the test platforms of other projects. For similar micro-system architectures, this system can be tested. According to different test items, customize the signal flow diagram and add relevant test instruments.

[0106] In summary, the customized automatic test system for radio frequency and intermediate frequency integrated micro-systems according to the present invention establishes the communication of relevant instruments and auxiliary equipment according to the customized test items, and performs corresponding control operations on one or more of the power supply, micro-system test board, signal source module, switch matrix module, and spectrum module required for the test target test items through the central control machine, and analyzes and processes the output signals or spectrum data of each target test item received to obtain a test report. The customized automatic test system of the present invention includes the index tests of radio frequency and intermediate frequency channels, has strong test coverage and high test efficiency; and the system also has high portability on the basis of customization, the underlying driver code is common, and it can be easily ported to the test platforms of other projects. Therefore, the present invention effectively overcomes various disadvantages in the prior art and has high industrial utilization value.

[0107] The above embodiments are only used to exemplarily illustrate the principles and effects of the present invention, rather than to limit the present invention. Any person familiar with this technology can modify or change the above embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or changes completed by those with ordinary knowledge in the technical field without departing from the spirit and technical ideas disclosed by the present invention should still be covered by the claims of the present invention.

Claims

1. An automatic test system customized for radio frequency and intermediate frequency integrated microsystems, characterized in that Including: A central control unit, a power supply, a microsystem test board, a signal source module, a switch matrix module, and a spectrum module; Among them, the central control unit is communicatively connected to the power supply, the microsystem test board, the signal source module, and the spectrum module respectively; the microsystem test board is communicatively connected to the power supply, the signal source module, and the switch matrix module respectively; the switch matrix module includes: a radio frequency receiving switch matrix, an intermediate frequency receiving switch matrix, and an output switch matrix controlled by the microsystem test board to configure high and low levels; The signal source module is used to output one or more of a clock signal, a radio frequency local oscillator signal, a radio frequency receiving signal, and an intermediate frequency receiving signal to the microsystem test board; among them, the radio frequency receiving signal is input to the corresponding channel of the microsystem test board under the control of the radio frequency receiving switch matrix; the intermediate frequency receiving signal is input to the corresponding channel of the microsystem test board under the control of the intermediate frequency receiving switch matrix; The microsystem test board is used to perform corresponding data processing based on the signal related to the target test item received from the signal source module to output the output signal corresponding to the target test item; The spectrum module is used to receive the output signal of the target test item output from the corresponding channel of the microsystem test board under the control of the output switch matrix and generate the corresponding spectrum data and send it to the central control unit; The central control unit is used to perform corresponding control operations on one or more of the power supply, the microsystem test board, the signal source module, the switch matrix module, and the spectrum module required for testing the target test item, and analyze and process the output signals or spectrum data of each received target test item to obtain a test report; Among them, the signal source module includes: a clock signal source for outputting a clock signal to the microsystem test board; a radio frequency local oscillator signal source for outputting a radio frequency local oscillator signal to the microsystem test board; a radio frequency receiving signal source connected to the radio frequency receiving switch matrix for inputting the first radio frequency receiving signal or the second radio frequency receiving signal from the corresponding channel of the microsystem test board under the control of the radio frequency receiving switch matrix; an intermediate frequency signal source connected to the intermediate frequency receiving switch matrix for inputting the intermediate frequency receiving signal from the corresponding channel of the microsystem test board under the control of the radio frequency receiving switch matrix; The micro-system test board is formed with an AD receiving link, a DA transmitting link, a radio frequency (RF) receiving link, and a radio frequency transmitting link. The micro-system test board includes: a clock input port, an ADC input port, an RF receiving input port, an RF transmitting input port, a clock chip, an FPGA, an RF transceiver link composed of switches and switch filters, a sampling chip, a TR power management chip, a DAC output port, an RF receiving output port, an RF transmitting output port, a LAN network port, and a USB port. Among them, when the target test item is an AD receiving link test item, a clock signal from the clock signal source is received through the clock input port. After the FPGA receives the intermediate frequency receiving link control instruction sent by the central control machine through the USB port, it configures the sampling chip. After the sampling chip is configured, the intermediate frequency receiving signal sent by the intermediate frequency signal source received through the ADC input port from the corresponding channel is mixed to zero intermediate frequency for sampling, and the sampled AD data obtained by sampling is output as the output signal of the AD receiving link test item to the central control machine through the LAN network port. When the target test item is a DA transmitting link test item, a clock signal from the clock signal source is received through the clock input port. After the FPGA receives the intermediate frequency transmitting link control instruction sent by the central control machine through the USB port, the obtained DA transmitting link data is output as the output signal of the DA transmitting link test item through the DAC output port, so that the spectrum module receives the corresponding output signal under the control of the output switch matrix and generates the corresponding spectrum data and sends it to the central control machine. When the target test item is an RF receiving link test item, a clock signal from the clock signal source is received through the clock input port. After the FPGA receives the RF receiving link control instruction sent by the central control machine through the USB port, the serial code word corresponding to the RF receiving link control instruction is input into the TR power management chip, and the high and low levels generated by the RF transceiver link control the switches and switch filters in the RF transceiver link. Then, the RF receiving link data obtained based on the intermediate frequency receiving signal sent by the RF local oscillator signal source received through the RF receiving input port and the first RF receiving signal sent by the RF receiving signal source received from the corresponding channel is output as the output signal of the RF receiving link test item through the RF receiving output port, so that the spectrum module receives the output signal of the corresponding channel under the control of the output switch matrix and generates the corresponding spectrum data and sends it to the central control machine;When the target test item is a radio frequency transmission link test item, a clock signal from the clock signal source is received through the clock input port. After the FPGA receives the radio frequency transmission link control instruction sent by the central control unit transmitted through the USB port, the serial code word corresponding to the radio frequency reception link control instruction is input into the TR power management chip. Then, the high and low levels generated by the radio frequency transceiver link control the switches and switch filters in the radio frequency transceiver link. After that, the radio frequency transmission link data obtained based on the intermediate frequency reception signal sent by the radio frequency local oscillator signal source received through the radio frequency reception input port and the second radio frequency reception signal of the radio frequency reception signal source received from the corresponding channel is output as the output signal of the radio frequency transmission link test item through the radio frequency transmission output port, so that the spectrum module can receive the output signal output by the corresponding channel under the control of the output switch matrix and generate the corresponding spectrum data and send it to the central control unit.

2. The customized automatic test system for radio frequency and intermediate frequency integrated microsystems according to claim 1, wherein The central control unit includes: A pre-test processing module for sequentially setting the test information required for testing the target test item on the main interface and the human-machine interaction window and checking whether the relevant devices are communicating normally; A power-on normal detection module connected to the pre-test processing module for controlling a power-on normal detection operation to judge whether the power-on is normal after the pre-test processing is completed; A link calibration module connected to the power-on normal detection module for judging whether the links of the set target detection items are calibrated under normal power-on conditions; and calibrating the links in the case of non-calibration; The test control module, connected to the link calibration module, is used to perform corresponding test control operations on one or more of the microsystem test board, signal source module, switch matrix module, and spectrum module for the current target test item after calibrating the links of all target detection items, and record the output signal or spectrum data of the current target test item received. After the data recording is completed, continue to perform the test control operation for the next target test item until the output signals or spectrum data of all target test items are obtained; The test report output module, connected to the test control module, is used to analyze and process the output signals or spectrum data of all target test items and output the corresponding test reports.

3. The automated test system customized for radio frequency and intermediate frequency integrated microsystems according to claim 2, wherein Performing corresponding test control operations on one or more of the microsystem test board, signal source module, switch matrix module, and spectrum module for the current target test item includes: If the current target test item is an AD receive link test item, send an intermediate frequency receive link control instruction to the microsystem test board to configure the sampling chip of the microsystem test board, then control the intermediate frequency signal source to output an intermediate frequency receive signal, and control the microsystem test board to configure high and low levels to control the intermediate frequency receive switch matrix to switch channels to obtain the output signal of the AD receive link test item; If the current target test item is a DA transmit link test item, send an intermediate frequency receive link control instruction to the microsystem test board to configure the sampling chip of the microsystem test board, then send an intermediate frequency transmit link control instruction to the microsystem test board, and control the microsystem test board to configure high and low levels to control the output switch matrix to switch channels to obtain the output signal of the DA transmit link test item, and control the spectrum module to generate the corresponding spectrum data to receive the spectrum data; If the current target test item is a radio frequency receive link test item, send a radio frequency receive link control instruction to the microsystem test board to send a serial code word corresponding to the radio frequency receive link control instruction to the TR power management chip to control the generated high and low levels to construct a radio frequency transceiver link, control the radio frequency local oscillator signal source and the radio frequency receive signal source to output a radio frequency local oscillator signal and a first radio frequency receive signal, and control the microsystem test board to configure high and low levels to control the radio frequency receive switch matrix and the output switch matrix to switch channels to obtain the output signal of the radio frequency receive link test item, and control the spectrum module to generate the corresponding spectrum data to receive the spectrum data; If the current target test item is a radio frequency transmit link test item, send a radio frequency transmit link control instruction to the microsystem test board to send a serial code word corresponding to the radio frequency receive link control instruction to the TR power management chip to control the generated high and low levels to construct a radio frequency transceiver link, control the radio frequency local oscillator signal source and the radio frequency receive signal source to output a radio frequency local oscillator signal and a second radio frequency receive signal, and control the microsystem test board to configure high and low levels to control the radio frequency receive switch matrix and the output switch matrix to switch channels, and control the spectrum module to generate the corresponding spectrum data to receive the spectrum data.

4. The automated test system customized for radio frequency and intermediate frequency integrated microsystems according to claim 2, wherein Set the test information required for the test target test items on the main interface and the human-machine interaction window in sequence, and check whether the relevant devices are communicating normally, including: Select all the target test items included in this test on the main interface, and set the test item information and the report output address; Set the instrument information required for the test target test items, the serial port number and the baud rate connected to the microsystem test board on the human-machine interaction form interface; Detect whether the communication of each instrument is normal, and complete the pre-test processing under normal conditions.

5. The automated test system customized for radio frequency and intermediate frequency integrated microsystems according to claim 2, wherein Control the power-on normal detection operation, including: Send a control command to the power supply, and set the voltage and current values of each port of the microsystem test board for the power supply to output current in sequence according to the power-on sequence; Read back the working current of the power supply and compare it with the stored correct static current value. If they are the same, the power-on is normal.

6. The customized automatic test system for radio frequency and intermediate frequency integrated microsystems according to claim 2, wherein The system further includes: a power meter for calibrating an uncalibrated link to compensate for the deviation data after calibration.

7. The automated test system customized for radio frequency and intermediate frequency integrated microsystems according to claim 1, wherein The spectrum module includes: a first spectrum analyzer and a second spectrum analyzer; the output switch matrix includes: a first output switch matrix and a second output switch matrix; Wherein, the first spectrum analyzer is connected to the first output switch matrix, and is used to receive the output signal of the radio frequency receiving link test item output from the corresponding channel under the control of the first output switch matrix, and generate the corresponding spectrum data and send it to the central control machine; The second spectrum analyzer is connected to the second output switch matrix, and is used to receive the output signal of the radio frequency transmitting link test item output from the corresponding channel under the control of the second output switch matrix, and generate the corresponding spectrum data and send it to the central control machine.

8. The automated test system customized for radio frequency and intermediate frequency integrated microsystems according to claim 1, wherein The central control machine communicates with the power supply, the signal source module and the spectrum module through the GPIB protocol respectively.

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