A mapping configuration method for an adapter

Abstract

The present invention discloses a mapping configuration structure and configuration method for an adapter, which belongs to the field of testing technology. The method comprises: statistically analyzing the types of signal ports in the connector interface of the product to be tested; statistically analyzing the signal constraints of the connectors on the front panel of the adapter, and the maximum support capacity of all connectors on the front panel of the adapter for the number of all signal ports; judging whether the signal constraints meet the test requirements required by the product to be tested; statistically analyzing the number of channels of various signals of the functional board in the test station, matching the test resources with the product to be tested, and determining the correspondence between the pins of the functional board and the pins of the connector of the product to be tested; respectively obtaining the mapping relationship between the functional board and the interface connector assembly, the mapping relationship between the interface connector assembly and the rear panel of the adapter, and the mapping relationship between the front panel of the adapter and the product to be tested; and obtaining the mapping relationship inside the adapter. The present invention can efficiently solve the mapping configuration problem of the adapter and improve the configuration efficiency of the adapter.

Description

Technical Field

[0001] The present invention relates to the field of testing, and in particular to a mapping configuration method for an adapter. Background Art

[0002] The adapter is located between the test equipment and the device under test, and its main function is to distribute and condition the test signals. Since the types and characteristics of the signals of the object under test and the test equipment are different, it is difficult for the interface adapter to achieve a certain degree of universality, which poses a challenge to the development cycle and cost of the test equipment.

[0003] Traditional adapter configuration is manually designed, with the primary task being to map the connectors on the front and rear panels of the adapter box. This design relies on the experience of hardware designers, making it difficult and time-consuming for novices. Furthermore, to improve adapter versatility, most research focuses on achieving adapter versatility in hardware through modularization and the addition of matrix switches, while no effective method for designing adapter mapping configuration has been developed. For example, patent CN102313565A achieves interface adapter versatility through modularized adapter circuit boards, while patent CN103968868B introduces a matrix switch to enable routing and switching of different signals. Given this, this proposal proposes a method for adapter mapping configuration. Summary of the Invention

[0004] The present invention aims to solve the universality problem of adapters in the prior art. Based on a universal automated test equipment (ATE) and an adapter without switches in a test station, a mapping configuration method for the adapter is proposed to efficiently solve the mapping configuration problem of the adapter and improve the adapter configuration efficiency.

[0005] In order to achieve the above-mentioned object of the invention, the technical solution of the present invention is as follows:

[0006] A mapping configuration method for an adapter, wherein the adapter is connected to a product to be tested and a test device, respectively. The test device includes a test station and an interface connector assembly. The test station includes a chassis backplane and a functional board. The adapter includes a front panel and a rear panel. The configuration method includes the following steps:

[0007] S1. Statistically analyze the types of signal ports in the connector interface of the product under test;

[0008] S2. Counting the signal constraints of the connectors on the front panel of the adapter and the maximum support capacity of all connectors on the front panel of the adapter for all signal ports;

[0009] S3. Determine whether the signal constraint condition meets the test requirements of the product to be tested;

[0010] S4. If the conditions are met, the number of channels of various signals on the functional boards in the test station is counted, the test resources are matched with the product to be tested, and the corresponding relationship f0 between the pins of the functional boards and the connector pins of the product to be tested is determined;

[0011] S5, respectively obtaining a mapping relationship f1 between the function board and the interface connector assembly, a mapping relationship f2 between the interface connector assembly and the adapter rear panel, and a mapping relationship f3 between the adapter front panel and the product under test;

[0012] S6. Obtain the mapping relationship f4 inside the adapter based on f0, f1, f2, and f3;

[0013] S7, f3, and f4 are the final test cable and adapter mapping configurations.

[0014] Furthermore, a connector is provided on the front panel of the adapter. The connector on the front panel of the adapter is connected to the connector on the product to be tested through a test cable, and the rear panel of the adapter is connected to the interface connector assembly.

[0015] Furthermore, in S1, assuming that the ports in the connector interface of the product to be tested are of type m, the number of ports of all types is expressed as {M1, M2, ···M m}, M i Represents the number of signal ports of type i.

[0016] Assume that the number of connectors on the front panel of the adapter is n, and the connector numbers are {CT1, CT2···CT n}, the maximum number of different types of ports on the jth connector is CT j {D j1 ,D j2 ,···D jm}, where D jk , k∈[1,m] is the number of type k ports on the jth connector; then the maximum support capacity of all connectors on the front panel of the adapter for all signal ports {MX1,MX2,···MX m}, where MX p Represents the maximum support capability of the adapter for the number of type p signal ports.

[0017] Furthermore, if the signal constraints meet the test requirements of the product to be tested, then MX p ≥M p Otherwise, the adaptation cannot be completed and the adapter front panel interface design needs to be modified.

[0018] Furthermore, in S4, if the signal constraint condition meets the test requirements, the number of channels of various signals of the functional boards in the test station {G1, G2, ···G m}, requiring G i ≥M i .

[0019] Furthermore, in S4, matching the test resources with the product to be tested refers to matching the test resources according to the definition, range, accuracy, and transmission rate parameters of the connector pins of the product to be tested; if the parameters of the test resources cannot meet the test requirements of the product to be tested, the functional board in the test station is replaced.

[0020] Furthermore, the mapping relationship f3 from the front panel of the adapter to the product under test is full-shot, and this relationship is used in sequence according to the connector numbers in S2 to meet the test requirements.

[0021] Furthermore, the functional board of the test station does not include a matrix switch.

[0022] In summary, the present invention has the following advantages:

[0023] The present invention proposes an adapter mapping configuration method, which can be applied to mature software to realize software automation design and effectively solve the adapter mapping configuration problem. It can not only improve the adapter configuration efficiency, but also avoid hard link problems caused by human errors. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 Schematic diagram of the test equipment and the unit under test (UUT) hardware and connection structure;

[0025] In the picture:

[0026] 1. Test station, 11. Chassis backplane, 12. Functional board, 2. Interface connector assembly, 21. Connector module; 3. Adapter, 31. Adapter rear panel, 311. Module on the rear panel, 32. Adapter front panel, 321. Connector on the front panel, 4. Product under test, 41. Connector on the product under test, 5. Test cable. DETAILED DESCRIPTION

[0027] In order to more clearly illustrate the present invention, the present invention is further described below in conjunction with preferred embodiments and drawings. Those skilled in the art should understand that the following specific description is illustrative rather than restrictive and should not be used to limit the scope of protection of the present invention.

[0028] The method of the present invention is implemented on the basis of a general automated test equipment (ATE) and an adapter 3 without switches in the test station, such as Figure 1The figure shows the hardware and connection structure of the test equipment and the unit under test (UUT). The test equipment mainly includes a test station 1, an interface connector assembly 2 (ICA), an adapter 3, and a test cable 5. The test station 1 includes a chassis backplane 11 and a functional board 12, and the adapter 3 includes an adapter front panel 32 and an adapter rear panel 31.

[0029] Adapter 3 can be configured to support 12 channels, enabling channel routing. Connector 321 on the adapter's front panel mates with connector 41 on the device under test via test cable 5. The adapter's rear panel 31 mates with the interface connector assembly 2. Specifically, the mold strip 311 on the adapter's rear panel mates with the connection mold strip 21 on the interface connector assembly 2.

[0030] The functional boards 12 of the test station 1 include analog AD, DA, discrete DIO, pulse PWM, RS422 / 232 / 485, CAN, LAN, power supply, etc., but do not include a matrix switch.

[0031] In terms of product selection, test station 1 has 8 / 14 / 18 slots depending on the number of required boards. The size of the ICA frame is determined by the number of boards required for conditioning. The size of the ICA module is determined by the number of pins on the functional board 12 of test station 1. The pins on the adapter rear panel 31 are determined by the number of ICA modules, and the pins on the adapter front panel 32 are determined by the test requirements of the product under test.

[0032] Based on the above structure, the present invention proposes a mapping configuration method for an adapter, comprising the following steps:

[0033] Step 1: Statistical analysis: If the signal ports in the connector interface of the UUT are of type m, then the number of signal ports of all types is {M1, M2, ···M m}, M i Represents the number of signal ports of type i.

[0034] Step 2: Count the signal constraints of the connector 321 on the front panel of the adapter. Let n be the number of connectors on the front panel of the adapter, and the connector numbers are {CT1, CT2···CT n}, the maximum number of different types of ports on the jth connector is CT j {D j1 ,D j2 ,···D jm}, where D jk ,k∈[1,m] is the number of type k ports on the j-th connector.

[0035] Calculate the maximum support capacity of all connectors on the front panel of the adapter for all signal ports {MX1,MX2,···MX m}, where MX p Represents the maximum support capability of the adapter for the number of type p signal ports.

[0036] Step 3: Determine whether the constraints meet the test requirements of the UUT, that is, ... p ≥M p Otherwise, the adaptation cannot be completed and the adapter front panel interface design needs to be modified.

[0037] Step 4: If the constraints meet the test requirements, match the test resources based on the UUT connector pinout, range, accuracy, transmission rate, and other parameters. The principle is that the test resource capabilities must meet the UUT test requirements. The correspondence between the functional board pins and the UUT connector pins is determined (f0: functional board → UUT). If the test resource parameters do not meet the UUT test requirements, replace the functional board in the test station.

[0038] Step 5: The functional board to the interface connector assembly ICA is mapped one to one in space and logic, f1:1 matrix.

[0039] Step 6: The ICA to the adapter back panel is spatially and logically mapped one to one, f2:1 matrix

[0040] Step 7: Get the mapping relationship between the front panel of the adapter and the UUT of the product under test, that is, the mapping relationship of the cable, f3: adapter rear panel → UUT of the product under test. This relationship is used in sequence according to the statistics in step 2 according to the connector number to meet the test needs.

[0041] Step 8: Obtain the mapping relationship f4 inside the adapter based on f0 and f3.

[0042] At this point, f3 and f4 are the final mapping configurations for the designed cable and adapter. The former is sent to the cable manufacturer, and the latter is sent to the adapter's processing unit via the host computer for automatic switching, or technicians can connect the cables based on the mapping relationship.

[0043] The above description is only a preferred embodiment of the present invention and does not limit the present invention in any form. Any simple modification or equivalent change made to the above embodiment based on the technical essence of the present invention shall fall within the scope of protection of the present invention.

Claims

1. A mapping configuration method for an adapter, wherein the adapter is connected to a product to be tested and a test device, respectively. The test device includes a test station and an interface connector assembly. The test station includes a chassis backplane and a functional board. The adapter includes a front panel and a rear panel. The method is characterized in that: The configuration method includes the following steps: S1. Statistically analyze the types of signal ports in the connector interface of the product under test; S2. Counting the signal constraints of the connectors on the front panel of the adapter and the maximum support capacity of all connectors on the front panel of the adapter for all signal ports; S3. Determine whether the signal constraint condition meets the test requirements of the product to be tested; S4. If the conditions are met, the number of channels of various signals on the functional boards in the test station is counted, the test resources are matched with the product to be tested, and the corresponding relationship f0 between the pins of the functional boards and the connector pins of the product to be tested is determined; S5, respectively obtaining a mapping relationship f1 between the function board and the interface connector assembly, a mapping relationship f2 between the interface connector assembly and the adapter rear panel, and a mapping relationship f3 between the adapter front panel and the product under test; S6. Obtain the mapping relationship f4 inside the adapter based on f0, f1, f2, and f3; S7, f3, and f4 are the final test cable and adapter mapping configurations.

2. The adapter mapping configuration method according to claim 1, characterized in that: A connector is provided on the front panel of the adapter. The connector on the front panel of the adapter is connected to the connector on the product to be tested through a test cable, and the rear panel of the adapter is connected to the interface connector assembly.

3. The adapter mapping configuration method according to claim 2, characterized in that: In S1, if the ports in the connector interface of the product to be tested are of type m, then the number of ports of all types is expressed as {M1, M2, ···M m }, M i Represents the number of signal ports of type i; Assume that the number of connectors on the front panel of the adapter is n, and the connector numbers are {CT1, CT2···CT n }, the maximum number of different types of ports on the jth connector is CT j {D j1 ,D j2 ,···D jm }, where D jk , k∈[1,m] is the number of type k ports on the jth connector; then the maximum support capacity of all connectors on the front panel of the adapter for all signal ports {MX1,MX2,···MX m }, where MX p Represents the maximum support capability of the adapter for the number of type p signal ports.

4. The adapter mapping configuration method according to claim 3, characterized in that: If the signal constraints meet the test requirements of the product to be tested, then MX p ≥M p Otherwise, the adaptation cannot be completed and the adapter front panel interface design needs to be modified.

5. The adapter mapping configuration method according to claim 4, characterized in that: In S4, if the signal constraint condition meets the test requirements, the number of channels of various signals of the functional boards in the test station {G1, G2, ···G m }, requiring G i ≥M i .

6. The adapter mapping configuration method according to claim 1, characterized in that: In S4, matching the test resources with the product under test means matching the test resources according to the definition, range, accuracy, and transmission rate parameters of the connector pins of the product under test; if the parameters of the test resources cannot meet the test requirements of the product under test, the functional board in the test station is replaced.

7. The adapter mapping configuration method according to claim 1 or 3, characterized in that: The mapping relationship f3 from the front panel of the adapter to the product under test is full-shot. This relationship is used in sequence according to the connector numbers in S2 to meet the test requirements.

8. The adapter mapping configuration method according to claim 1, characterized in that: The test station's functional boards do not include matrix switches.

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