Miniature infrared spectrometer and electronic device

Abstract

The embodiment of the application provides a kind of miniature infrared spectrometer and electronic equipment, for environmental monitoring, biological medical treatment, food safety etc..The spectrometer additionally increases narrow-band light source, for emitting second light beam, by micro stepping motor control plane grating, the first background spectrum and second background spectrum are generated in linear array detector by the second light beam spectrophotometry;In addition, the first light beam is emitted to the surface of the object to be measured by wide spectrum light source and occurs diffuse reflection, by micro stepping motor control plane grating, the first mixed spectrum and second mixed spectrum are generated in linear array detector by the mixed light beam spectrophotometry of first light beam and second light beam.Finally, the spectrum of the object to be measured is determined by the spectrum of narrow-band light source, first mixed spectrum and second mixed spectrum, and first background spectrum and second background spectrum by linear array detector.The technical scheme of the application can further compress the volume of spectrometer, reduce cost, and also can realize wide spectral range detection.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of spectral measurement, and more particularly, to a miniature infrared spectrometer and an electronic device. BACKGROUND

[0002] Spectrum can reflect the molecular structure information of a substance, and plays an important role in the fields of biology, chemistry, pharmaceutical materials, food industry, geological exploration and the like. With the improvement of living standards, more and more people pay more attention to the quality of life, such as food safety, health monitoring and the like, so that the demand for spectral detection in daily life is rapidly increasing.

[0003] Spectral instruments can qualitatively and quantitatively analyze the structure and composition of a substance without damage by using optical principles, and are one of the most widely used analysis tools in scientific research and industry. Although traditional spectral instruments can provide ultra-fine spectral resolution and a wide spectral range, they have many limitations such as large size, high power consumption, high cost, poor environmental adaptability, inconvenience for secondary development and the like, and are difficult to meet the application requirements of people in daily life in different scenes, lightness, portability, low power consumption, low cost, rapid detection, real-time online and the like.

[0004] Therefore, how to balance the size of the spectral instrument and the detection accuracy of the wide spectral range is a problem to be solved. SUMMARY

[0005] The embodiments of the present application provide a miniature infrared spectrometer and an electronic device, which can realize wide spectral range detection while compressing the volume of the spectrometer and reducing the cost.

[0006] In a first aspect, a miniature infrared spectrometer is provided, comprising a wide-spectrum light source, at least one narrow-band light source, a scanning grating and a line array detector, the scanning grating comprising a plane grating and a miniature stepping motor, and the at least one narrow-band light source comprising a first narrow-band light source, wherein:

[0007] The wide-spectrum light source is configured to emit a first light beam to the surface of a to-be-measured object, and input the first light beam to the plane grating through diffuse reflection of the surface of the to-be-measured object;

[0008] The first narrow-band light source is configured to emit a second light beam to the plane grating, and the light-emitting surface of the first narrow-band light source faces the inside of the miniature infrared spectrometer;

[0009] The scanning grating is configured to control the plane grating to split the mixed light beams of the first light beam and the second light beam at a first angle and a second angle respectively by the miniature stepping motor, and obtain a first diffracted light beam and a second diffracted light beam;

[0010] The line array detector is configured to detect the first diffraction light beam and the second diffraction light beam respectively to obtain a first mixed spectrum and a second mixed spectrum, and the first mixed spectrum and the second mixed spectrum include a first spectral overlap region corresponding to a spectrum of the first narrow-band light source.

[0011] The scanning grating is further configured to control the planar grating by the micro stepping motor to split the second light beam at the first angle and the second angle respectively to obtain a third diffraction light beam and a fourth diffraction light beam.

[0012] The line array detector is further configured to detect the third diffraction light beam and the fourth diffraction light beam respectively to obtain a first background spectrum and a second background spectrum, and the first background spectrum and the second background spectrum include the first spectral overlap region.

[0013] The line array detector is further configured to detect the spectrum of the first narrow-band light source.

[0014] The line array detector is further configured to determine the spectrum of the object to be measured according to the spectrum of the first narrow-band light source, the first mixed spectrum and the second mixed spectrum, and the first background spectrum and the second background spectrum.

[0015] For example, the wide-spectrum light source includes an active illumination light source such as a halogen tungsten lamp active light source, and the narrow-band light source includes a light-emitting diode (LED) light source such as a narrow-band LED calibration light source.

[0016] It should be understood that the mixed spectrum includes a background spectrum and a response generated after the surface of the object to be measured is irradiated by the first narrow-band light source and then diffused into the field of view of the instrument. The background spectrum includes a response generated after any light other than the wide-spectrum light source enters the field of view of the instrument, or a response generated after the surface of the object to be measured is reflected into the field of view of the instrument, and a response generated after the first narrow-band light source enters the field of view of the instrument.

[0017] It should be noted that the spectrum of the first narrow-band light source can be detected by the line array detector alone, or can be obtained together when the line array detector detects the mixed spectrum or the background spectrum. The first spectral overlap region corresponds to the spectrum of the first narrow-band light source, and it can be understood that the first spectral overlap region includes the spectrum of the first narrow-band light source, which is used to splice the adjacent first mixed spectrum and the second mixed spectrum, and is used to splice the adjacent second background spectrum and the third background spectrum.

[0018] In the technical scheme of the present application, by additionally adding the first narrow-band light source in the micro infrared spectrometer, the acquisition of the multi-segment mixed spectrum and the multi-segment background spectrum is completed in sequence, and then the line array detector is used to splice the multi-segment spectrum, so as to obtain the spectrum of the object to be measured, which can not only compress the volume of the spectrometer, but also ensure the effective detection of the wide-spectrum range.

[0019] With reference to the first aspect, in some implementations of the first aspect, a wavelength range of the first spectral overlap region is greater than or equal to a wavelength range of the spectrum of the first narrowband light source.

[0020] For example, if the wavelength range of the first spectral overlap region is 1000 nm to 1600 nm, the wavelength range of the spectrum of the corresponding first narrowband light source is greater than or equal to 1000 nm and less than or equal to 1600 nm, for example, 1200 nm to 1400 nm.

[0021] With reference to the first aspect, in some implementations of the first aspect, the linear array detector is further configured to:

[0022] splicing the first mixed spectrum and the second mixed spectrum according to the spectrum of the first narrowband light source to obtain a full-section mixed spectrum;

[0023] splicing the first background spectrum and the second background spectrum according to the spectrum of the first narrowband light source to obtain a full-section background spectrum;

[0024] determining the spectrum of the object to be measured according to the full-section mixed spectrum and the full-section background spectrum.

[0025] In this implementation, the linear array detector can splice the multiple-section mixed spectrum (e.g., the first mixed spectrum and the second mixed spectrum) and the multiple-section background spectrum (e.g., the first background spectrum and the second background spectrum) according to the spectrum of the narrowband light source (e.g., the first narrowband light source), and then determine the full-section spectrum of the object to be measured, which can not only compress the volume of the spectrometer, but also ensure effective detection of a wide spectral range.

[0026] With reference to the first aspect, in some implementations of the first aspect, the linear array detector is further configured to:

[0027] determining a first partial spectrum of the object to be measured according to the first mixed spectrum and the first background spectrum, and determining a second partial spectrum of the object to be measured according to the second mixed spectrum and the second background spectrum;

[0028] splicing the first partial spectrum of the object to be measured and the second partial spectrum of the object to be measured according to the spectrum of the first narrowband light source to determine the spectrum of the object to be measured.

[0029] In this implementation, the linear array detector can splice the multiple-section partial spectrum of the object to be measured (e.g., the first partial spectrum of the object to be measured and the second partial spectrum of the object to be measured) according to the spectrum of the narrowband light source (e.g., the first narrowband light source), and then determine the full-section spectrum of the object to be measured, which ensures effective detection of a wide spectral range.

[0030] With reference to the first aspect, in some implementations of the first aspect, the linear array detector is further configured to:

[0031] The first system spectrum is calibrated according to the pre-stored spectrum of the first narrow-band light source, and the first system spectrum includes a full-range background spectrum.

[0032] Exemplarily, in a case where the cover of the instrument lens is closed, the wide-spectrum light source (for example, a tungsten-halogen lamp active light source) is turned off, and the first narrow-band light source (for example, the narrow-band LED calibration light source 105) is turned on, and the first system spectrum is collected.

[0033] It should be understood that the first system spectrum includes a response generated on the linear array detector array by the first narrow-band light source incident on the field of view of the instrument, that is, a spectral position of the narrow-band LED calibration light source.

[0034] In this implementation, since the spectrum of the narrow-band LED calibration light source is fixed at the factory, by comparing the collected first system spectrum and the pre-stored spectrum of the narrow-band LED calibration light source at the factory, it can be determined whether the instrument itself is deviated or whether the optical path needs to be further adjusted, thereby ensuring the accuracy, spectral quality and stability of the acquired wide-spectrum spectrum.

[0035] In combination with the first aspect, in some implementations of the first aspect, the linear array detector is further configured to:

[0036] The second system spectrum is calibrated according to a relative wavelength relationship between the pre-stored spectrum of the wide-spectrum light source and the spectrum of the first narrow-band light source, and the second system spectrum includes a full-range mixed spectrum.

[0037] Exemplarily, in a case where the cover of the instrument lens is closed, the first narrow-band light source is kept in a turned-on state, and the wide-spectrum light source is turned on, and the second system spectrum is collected.

[0038] It should be understood that the second system spectrum includes both a reflection spectrum of the surface of the object to be measured and the spectrum of the first narrow-band light source, and thus the relative wavelength relationship between the spectrum of the first narrow-band light source and the spectrum of the wide-spectrum light source can be determined.

[0039] In this implementation, since the relative position between the spectrum of the narrow-band LED calibration light source and the spectrum of the tungsten-halogen lamp active light source is fixed at the factory, by comparing the second system spectrum and the pre-stored relative position between the spectrum of the narrow-band LED calibration light source and the spectrum of the tungsten-halogen lamp active light source at the factory, it can be determined whether the wide-spectrum light source is aged.

[0040] In this application, the spectrum of the narrow-band LED calibration light source is introduced, which is beneficial to the registration of the spectral position and the wavelength calibration. This is because the calibration light source has much more diffuse reflection light intensity than the object to be measured, and thus the spectrum of the first narrow-band light source in the first system spectrum and the second system spectrum collected above is relatively obvious.

[0041] With reference to the first aspect, in some implementations of the first aspect, the at least one narrow-band light source further includes a second narrow-band light source, the second narrow-band light source being different from the first narrow-band light source in a center wavelength; and wherein:

[0042] The scanning grating is further configured to split the mixed light beam of the first light beam and the second light beam at the third angle by the micro-step motor controlled planar grating to obtain a fifth diffraction light beam;

[0043] The linear array detector is further configured to detect the fifth diffraction light beam to obtain a third mixed spectrum, the second mixed spectrum and the third mixed spectrum including a second spectral overlap region corresponding to a spectrum of the second narrow-band light source;

[0044] The scanning grating is further configured to split the second light beam at the third angle by the micro-step motor controlled planar grating to obtain a sixth diffraction light beam;

[0045] The linear array detector is further configured to detect the sixth diffraction light beam to obtain a third background spectrum, the second background spectrum and the third background spectrum including a second spectral overlap region;

[0046] The linear array detector is further configured to detect a spectrum of the second narrow-band light source;

[0047] The linear array detector is further configured to determine a full spectrum of the object to be measured according to the spectrum of the first narrow-band light source, the spectrum of the second narrow-band light source, the first mixed spectrum, the second mixed spectrum and the third mixed spectrum, and the first background spectrum, the second background spectrum and the third background spectrum.

[0048] It should be noted that the spectrum of the second narrow-band light source can be detected by the linear array detector alone, or can be obtained by the linear array detector when detecting the mixed spectrum or the background spectrum. The second spectral overlap region corresponding to the spectrum of the second narrow-band light source can be understood as containing the spectrum of the second narrow-band light source, and the spectral line of the second narrow-band light source is used to splice the adjacent second mixed spectrum and the third mixed spectrum, and is used to splice the adjacent second background spectrum and the third background spectrum.

[0049] In this implementation, by additionally adding a second narrow-band light source in the miniature infrared spectrometer, the collection of the third mixed spectrum and the third background spectrum is completed in sequence, and the linear array detector can realize the splicing of the multi-segment mixed spectrum and the multi-segment background spectrum, and then the spectrum of the object to be measured is obtained, which can ensure effective detection of a wider spectral range.

[0050] It should be noted that the splicing between the second mixed spectrum and the third mixed spectrum, and the splicing between the second background spectrum and the third background spectrum can refer to the splicing between the first mixed spectrum and the second mixed spectrum, and the splicing between the first background spectrum and the second background spectrum described above. For the sake of brevity, no further elaboration is made here.

[0051] In the present application, the splicing of the spectrum mainly relies on the narrowband light sources (e.g., the first narrowband light source and the second narrowband light source) in the overlapping region of adjacent spectral bands, and no longer relies on the absolute position of the spectral imaging on the detector linear array, which can compensate for the positioning error or repetition error existing when the scanning grating rotates.

[0052] It should be understood that the spectrum of the first narrowband light source, the spectrum of the second narrowband light source, the first mixed spectrum, the second mixed spectrum and the third mixed spectrum, the first background spectrum, the second background spectrum and the third background spectrum are only examples given for the convenience of understanding the scheme and should not constitute any limitation on the technical scheme of the present application. That is, the number of narrowband light sources, mixed spectra and background spectra is not specifically limited in the present application.

[0053] In combination with the first aspect, in some implementations of the first aspect, the wavelength range of the second spectral overlapping region is greater than or equal to the wavelength range of the spectrum of the second narrowband light source.

[0054] For example, if the wavelength range of the second spectral overlapping region is 1600nm-2000nm, then the wavelength range of the spectrum of the corresponding second narrowband light source is greater than or equal to 1600nm and less than or equal to 2000nm, for example, 1800nm-2000nm.

[0055] In combination with the first aspect, in some implementations of the first aspect, the at least one narrowband light source is uniformly arranged at the edge of the field of view of the miniature infrared spectrometer.

[0056] In this implementation, the position of the narrowband light source should be installed in the field of view of the spectral instrument as much as possible, so that the instrument can detect the measured object while receiving the spectrum from the narrowband light source. At the same time, it should be avoided to block the diffuse reflection light on the surface of the measured object as much as possible to reduce the energy loss of the measured object. Moreover, the narrowband light source should be avoided to irradiate the measured object, that is, the spectrum of the narrowband light source is the superimposed spectrum after being reflected by the measured object.

[0057] In other words, the narrowband light source is not placed in the optical path formed between the measured object 104 and the light shielding cylinder 106, the converging lens 107, the slit diaphragm 108 and the plane mirror 109.

[0058] In one example, in order to improve the energy utilization rate, the at least one narrowband light source can be uniformly arranged at the inner edge region of the window piece inside the spectral instrument.

[0059] In combination with the first aspect, in some implementations of the first aspect, the miniature stepping motor includes an open-loop motor.

[0060] In this implementation, the miniature stepping motor in the scanning grating is driven by an open-loop motor, which further miniaturizes the volume of the spectrometer and reduces the cost.

[0061] With reference to the first aspect, in some implementations of the first aspect, the at least one narrow-band light source includes a single-color light-emitting diode (LED) light source.

[0062] In this implementation, the micro stepping motor in the scanning grating is driven by an open-loop motor, so that the volume of the spectrometer is reduced and the cost is reduced. At the same time, since the wavelength range of the monochromatic light of the single-color LED is narrow, the positioning accuracy of the spectrometer can also achieve the splicing effect brought by the high-precision closed-loop motor, thereby obtaining a high-precision spectrum. In other words, compared with the closed-loop motor which is limited by size and cost, the volume and cost are reduced, and the acquisition of high-precision spectrum can be ensured.

[0063] The second aspect provides an electronic device, including the miniature infrared spectrometer in any one of the implementations of the first aspect.

[0064] The third aspect provides an electronic device, including a processor and a miniature infrared spectrometer, the miniature infrared spectrometer including a wide-spectrum light source, at least one narrow-band light source, a scanning grating, and a linear array detector, the scanning grating including a plane grating and a micro stepping motor, the at least one narrow-band light source including a first narrow-band light source; wherein:

[0065] The wide-spectrum light source is configured to emit a first light beam to a surface of a to-be-measured object, and to cause the first light beam to be incident on the plane grating through diffuse reflection of the surface of the to-be-measured object.

[0066] The first narrow-band light source is configured to emit a second light beam to the plane grating.

[0067] The scanning grating is configured to control the plane grating to split the mixed light beams of the first light beam and the second light beam at a first angle and a second angle respectively by the micro stepping motor, to obtain a first diffracted light beam and a second diffracted light beam.

[0068] The linear array detector is configured to detect the first diffracted light beam and the second diffracted light beam respectively, to obtain a first mixed spectrum and a second mixed spectrum, the first mixed spectrum and the second mixed spectrum including a first spectral overlap region corresponding to a spectrum of the first narrow-band light source.

[0069] The scanning grating is further configured to control the plane grating to split the second light beam at the first angle and the second angle respectively by the micro stepping motor, to obtain a third diffracted light beam and a fourth diffracted light beam.

[0070] The linear array detector is further configured to detect the third diffracted light beam and the fourth diffracted light beam respectively, to obtain a first background spectrum and a second background spectrum, the first background spectrum and the second background spectrum including the first spectral overlap region.

[0071] The line array detector is also configured to detect the spectrum of the first narrowband light source.

[0072] The processor is configured to receive the spectrum of the first narrowband light source, the first mixed spectrum and the second mixed spectrum, and the first background spectrum and the second background spectrum from the miniature infrared spectrometer.

[0073] The processor is further configured to determine the spectrum of the object to be measured according to the spectrum of the first narrowband light source, the first mixed spectrum and the second mixed spectrum, and the first background spectrum and the second background spectrum.

[0074] With reference to the third aspect, in some implementations of the third aspect, a wavelength range of the first spectral overlap region is greater than or equal to a wavelength range of the spectrum of the first narrowband light source.

[0075] With reference to the third aspect, in some implementations of the third aspect, the processor is further configured to:

[0076] splicing the first mixed spectrum and the second mixed spectrum according to the spectrum of the first narrowband light source to obtain a full-segment mixed spectrum;

[0077] splicing the first background spectrum and the second background spectrum according to the spectrum of the first narrowband light source to obtain a full-segment background spectrum;

[0078] determining the spectrum of the object to be measured according to the full-segment mixed spectrum and the full-segment background spectrum.

[0079] With reference to the third aspect, in some implementations of the third aspect, the processor is further configured to:

[0080] determining a first partial spectrum of the object to be measured according to the first mixed spectrum and the first background spectrum, and determining a second partial spectrum of the object to be measured according to the second mixed spectrum and the second background spectrum;

[0081] splicing the first partial spectrum of the object to be measured and the second partial spectrum of the object to be measured according to the spectrum of the first narrowband light source to determine the spectrum of the object to be measured.

[0082] With reference to the third aspect, in some implementations of the third aspect, the processor is further configured to:

[0083] calibrating the first system spectrum according to the pre-stored spectrum of the first narrowband light source, the first system spectrum comprising the full-segment background spectrum.

[0084] With reference to the third aspect, in some implementations of the third aspect, the processor is further configured to:

[0085] calibrating the second system spectrum according to a relative wavelength relationship between the pre-stored spectrum of the wide-spectrum light source and the spectrum of the first narrowband light source, the second system spectrum comprising the full-segment mixed spectrum.

[0086] In some implementations of the third aspect, the at least one narrowband light source further includes a second narrowband light source, the second narrowband light source being different from the first narrowband light source in a central wavelength; and wherein:

[0087] The scanning grating is further configured to split the mixed light beam of the first light beam and the second light beam at the third angle by the micro stepping motor controlled planar grating to obtain a fifth diffraction light beam.

[0088] The linear array detector is further configured to detect the fifth diffraction light beam to obtain a third mixed spectrum, the second mixed spectrum and the third mixed spectrum including a second spectral overlap region corresponding to a spectrum of the second narrowband light source.

[0089] The scanning grating is further configured to split the second light beam at the third angle by the micro stepping motor controlled planar grating to obtain a sixth diffraction light beam.

[0090] The linear array detector is further configured to detect the sixth diffraction light beam to obtain a third background spectrum, the second background spectrum and the third background spectrum including the second spectral overlap region.

[0091] The linear array detector is further configured to detect a spectrum of the second narrowband light source.

[0092] The processor is further configured to receive the spectrum of the second narrowband light source, the third mixed spectrum and the third background spectrum from the micro infrared spectrometer.

[0093] The processor is further configured to determine a spectrum of the object to be measured according to the spectrum of the first narrowband light source, the spectrum of the second narrowband light source, the first mixed spectrum, the second mixed spectrum and the third mixed spectrum, the first background spectrum, the second background spectrum and the third background spectrum.

[0094] In some implementations of the third aspect, a wavelength range of the second spectral overlap region is greater than or equal to a wavelength range of the spectrum of the second narrowband light source. BRIEF DESCRIPTION OF DRAWINGS

[0095] Figure 1 is a structural schematic diagram of a micro infrared spectrometer provided by an embodiment of the present application.

[0096] Figure 2 is a flowchart of a multi-segment spectrum time-sharing acquisition and splicing method provided by an embodiment of the present application.

[0097] Figure 3 is a flowchart of another multi-segment spectrum time-sharing acquisition and splicing method provided by an embodiment of the present application.

[0098] Figure 4 is a schematic diagram of imaging positions and splicing positions of multi-segment spectra provided by an embodiment of the present application.

[0099] Figure 5 is a result schematic diagram of multi-section spectrum splicing provided by an embodiment of the present application.

[0100] Figure 6 is another result schematic diagram of multi-section spectrum splicing provided by an embodiment of the present application.

[0101] Figure 7 is still another result schematic diagram of multi-section spectrum splicing provided by an embodiment of the present application.

[0102] Figure 8 is a flow schematic diagram of a spectrum self-calibration method provided by an embodiment of the present application.

[0103] Figure 9 is a schematic structural diagram of an electronic device provided by an embodiment of the present application. DETAILED DESCRIPTION

[0104] The technical solutions in the present application will be described below with reference to the drawings.

[0105] Spectrum analysis instruments are important components of modern optical instruments, and through the use of spectroscopy principles, the structure and composition of matter are qualitatively and quantitatively analyzed. Among them, infrared spectrum instruments are one of the most important optical instruments, mainly applying optical technology and spectrum detection technology principles to observe, analyze and process the structure and composition of matter, with the advantages of high analysis precision, large measurement range, fast measurement speed and small sample consumption, and are widely used in metallurgy, geology, petroleum chemical industry, medicine and health, environmental protection and other departments. It is also an indispensable instrument for aerospace, space exploration, resource and hydrological survey, and has extremely important application value and broad market prospect.

[0106] In the spectrum detection process, in order to obtain higher precision spectrum results, the improved non-crossing non-symmetrical Czerny-Turner (referred to as CT) structure near-infrared miniature spectrometer, or the non-scanning CT structure spectrometer, etc. uses a higher cost closed-loop motor to achieve it. In comparison, the scanning grating designed based on micro-opt-electro-mechanical system (MOEMS) technology needs higher process precision and longer movement optical path (more than 100 μm, very difficult in process), and the size of the spectrometer is difficult to further compress, the service life and accuracy of the instrument are limited, and the cost is relatively high.

[0107] Therefore, the application provides a miniature infrared spectrometer based on a scanning grating and a spectral self-calibration method, which can further compress the volume of the spectrometer, reduce the cost, realize wide spectral range detection, and ensure spectral quality and stability. The spectral instrument disclosed in the application can meet the needs of people for spectral accuracy, small size, rapid detection, real-time online, etc. of the miniature spectrometer, and can be applied to many fields such as environmental monitoring, field exploration, biological medicine, agricultural production, food safety, health monitoring, intelligent household appliances, military modernization, etc. The spectral instrument is suitable for the growing spectral detection needs in daily life such as gem identification, fruit sugar detection, food composition, food freshness detection, drug differentiation, non-invasive blood glucose detection, indoor natural gas leakage detection, household harmful volatile substance detection, etc.

[0108] In order to facilitate understanding of the technical solutions of the application, some concepts and technologies related to the application are briefly described.

[0109] 1, coupling

[0110] Coupling can be understood as direct coupling and / or indirect coupling, and "coupling connection" can be understood as direct coupling connection and / or indirect coupling connection. Direct coupling can also be referred to as "electrical connection", which is understood as physical contact and electrical conduction of components, and can also be understood as a form of connection between different components in a circuit structure through a physical circuit such as a copper foil or a wire on a printed circuit board (PCB) that can transmit electrical signals. "Indirect coupling" can be understood as electrical conduction between two conductors through a space without contact. Indirect coupling can also be referred to as capacitive coupling, for example, through the coupling between the gap between two conductive parts to form an equivalent capacitor to realize signal transmission.

[0111] 2, spectral splicing

[0112] Splicing can mean that different individuals are connected to form a whole, and the present application mainly refers to the connection of different spectral bands. Splicing of spectrum A and spectrum B can be understood as connecting spectrum A and spectrum B at the beginning and end by using a normalization algorithm, or splicing by removing the spectrum in the overlapping band range. For example, the wavelength range of spectrum A is 390nm-500nm, and the wavelength range of spectrum B is 500nm-780nm, and the wavelength range after spectral splicing is 390nm-780nm. For another example, the wavelength range of spectrum A is 390nm-600nm, and the wavelength range of spectrum B is 550nm-780nm, and the wavelength range after spectral splicing is still 390nm-780nm.

[0113] 3, infrared light

[0114] Infrared light generally refers to infrared (IR), which is a kind of electromagnetic wave with a frequency between microwave and visible light, the frequency is 0.3THz~400THz, and the corresponding wavelength of the radiation in vacuum is 760nm~1000um. It is invisible light with lower frequency than red light.

[0115] 4、Scanning grating

[0116] Grating, also known as diffraction grating, is an optical element that disperses (decomposes into spectrum) light by using multi-slit diffraction principle, which is composed of a large number of parallel slits with equal width and equal spacing. For a given grating, different wavelengths of light in the same order grating spectrum do not coincide, but are arranged in order according to the wavelength, forming a series of discrete spectra. Therefore, the mixed composite light of various different wavelengths incident together is separated from each other after diffraction by the grating, that is, the principle of light dispersion of diffraction grating. The scanning grating in the present application is coupled by a planar blazed grating and a micro stepping motor, and the time-sharing acquisition of multi-section spectrum can be realized by multi-angle light dispersion of the scanning grating.

[0117] 5、Diaphragm

[0118] Diaphragm is the edge, frame or specially arranged hole barrier of optical element in optical assembly. Diaphragm is used to limit the size of imaging light beam or the unit of imaging space.

[0119] 6、Focus

[0120] Focus refers to the converging point of parallel light after refraction by a lens or reflection by a curved mirror. Focus includes image-side focus and object-side focus. Object-side focus is the position of the object at infinity, and image-side focus is the position of the image at infinity.

[0121] 7、Stray light

[0122] Stray light refers to harmful light that is not involved in imaging and is projected onto the image plane by the optical system.

[0123] 8、Field of view

[0124] Field of view represents the maximum range that can be observed by the camera, and the larger the field of view, the larger the observation range. It is usually expressed in angle, such as view angle or field of view angle. Field of view angle is the angle range that the photosensitive element receives the image. The angle is formed by the two edges of the maximum range of the lens of the optical instrument as the vertex and the object image of the measured target that can pass through the lens.

[0125] In order to facilitate understanding of the technical solutions of the present application, the following points are explained.

[0126] In this application, "at least one" means one or more and "multiple" means two or more. In the description of the application, the character " / " generally indicates a "or" relationship between the objects before and after it.

[0127] In this application, "first", "second", and various numbered (e.g., #1, #2) are only used for the convenience of description and do not limit the scope of the embodiments of the application. The size of the serial number of each process below does not mean the order of execution, and the execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the application.

[0128] In this application, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device comprising a series of steps or units does not have to be limited to those steps or units clearly listed, but can include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0129] In this application, "exemplary" or "for example" is used to mean example, illustration or description, and the embodiments or design schemes described as "exemplary" or "for example" should not be interpreted as more preferred or more advantageous than other embodiments or design schemes. The use of "exemplary" or "for example" is intended to present the relevant concept in a specific manner for understanding.

[0130] In this application, the term "central" indicates the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, which is only for the convenience of describing the application and simplifying the description, and does not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the application.

[0131] In this application, the first feature "on" or "under" the second feature can be direct contact between the first and second features, or indirect contact between the first and second features through an intermediate medium. Moreover, the first feature "above", "over" and "on" the second feature can be directly above or obliquely above the first feature, or simply indicate that the first feature is higher in horizontal height than the second feature. The first feature "below", "under" and "under" the second feature can be directly below or obliquely below the first feature, or simply indicate that the first feature is lower in horizontal height than the second feature. It should be understood that the orientation or positional relationship indicated by the terms "center", "upper", "lower", etc. is based on the orientation or positional relationship shown in the drawings, which is only for the convenience of describing the application and simplifying the description, and does not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the application.

[0132] In this application, unless otherwise clearly indicated and limited, the terms "mount", "fixed", "disposed", and the like should be interpreted broadly, and when an element is referred to as being "fixed to" or "disposed to" another element, it can be directly on another element or there can be intervening elements. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or there can be intervening elements.

[0133] The technical solutions provided by the present application will be described in detail below with reference to the drawings.

[0134] Figure 1 is a structural schematic diagram of a micro infrared spectrometer 100 provided by an embodiment of the present application. As shown in the figure, the micro infrared spectrometer 100 includes a halogen tungsten lamp active light source 101, a scanning grating, a small line array detector 114, and a narrow-band LED calibration light source 105. Figure 1

[0135] Among them, the scanning grating includes a plane grating 111 and a micro stepping motor 112. Illustratively, the plane grating 111 is placed above the micro stepping motor 112, and the scanning grating can be designed by coupling the plane grating 111 and the micro stepping motor 112.

[0136] In an example, the halogen tungsten lamp active light source 101 (i.e., a wide-spectrum light source) is used to emit a light signal #1 (i.e., a first light beam) to the surface of a to-be-measured object 104, and the first light beam is incident to the plane grating 111 through the diffuse reflection of the surface of the to-be-measured object;

[0137] The narrow-band LED calibration light source 105 (i.e., a first narrow-band light source) is used to emit a light signal #2 (i.e., a second light beam) to the plane grating 111;

[0138] The scanning grating is used to control the plane grating 111 through the micro stepping motor 112 to split the mixed light of the light signal #1 and the light signal #2 at a first angle and a second angle respectively, to obtain a first diffracted light beam and a second diffracted light beam;

[0139] The line array detector 114 is used to detect the first diffracted light beam and the second diffracted light beam respectively, to obtain a first mixed spectrum and a second mixed spectrum, and the first mixed spectrum and the second mixed spectrum include a first light spectrum overlap region corresponding to the spectrum of the first narrow-band light source;

[0140] The scanning grating is also used to control the plane grating 111 through the micro stepping motor 112 to split the light signal #2 at the first angle and the second angle respectively, to obtain a third diffracted light beam and a fourth diffracted light beam;

[0141] ​The linear array detector 114 is further configured to detect the third diffraction beam and the fourth diffraction beam respectively to obtain a first background spectrum and a second background spectrum, the first background spectrum and the second background spectrum comprising the first spectral overlap region.

[0142] The linear array detector is further configured to determine the spectrum of the object to be measured according to the spectrum of the first narrowband light source, the first mixed spectrum and the second mixed spectrum, and the first background spectrum and the second background spectrum.

[0143] Exemplarily, the tungsten-halogen lamp active light source 101 can be near-infrared light or infrared light, and the corresponding wavelength can be 900 nm-2500 nm. The number of the narrowband LED calibration light sources 105 can be one or more (for example, N-1), wherein the center wavelengths of any two narrowband LED calibration light sources 105 are different from each other, and the wavelength range of the narrowband LED calibration light source 105 is less than or equal to the wavelength range of the spectral overlap region of the adjacent two spectra. For example, the wavelength ranges of the adjacent two spectra are 900 nm-1500 nm and 1200 nm-1800 nm respectively, the wavelength range of the spectral overlap region is 1200 nm-1500 nm, and the wavelength range of the corresponding narrowband LED calibration light source 105 belongs to 1200 nm-1500 nm, which can be 1200 nm-1400 nm, 1300 nm-1500 nm, or 1200 nm-1500 nm, which is not limited in the present application.

[0144] It should be understood that the working principle of the micro stepping motor 112 is that the motor driver controls the winding of the stepping motor through the internal logic circuit according to the external control pulse and direction signal, and realizes the forward or reverse rotation of the motor by energizing in a certain time sequence.

[0145] Exemplarily, the micro stepping motor can be an open-loop motor.

[0146] The small linear array detector 114 can be placed at the focal plane of the converging mirror 113, and is configured to measure the light intensity of each wavelength image point. For example, the small linear array detector 114 can be a charge coupled device (CCD) array or other types of light detector array. Exemplarily, the small linear array detector 114 can be composed of M rows and 1 column of detector pixels (photo-diodes, PDs). In this implementation, the use of the small linear array detector 114 can reduce the number of rotations of the micro stepping motor 112 and reduce the errors caused by the mechanical structure.

[0147] The small array detector 114 can be connected with a sense circuit for reading the spectral signal on the small array detector 114. It should be understood that the sense circuit is mainly composed of MOS tubes and capacitors compatible with the MOS process.

[0148] The position of the narrow-band LED calibration light source 105 should meet the following requirements:

[0149] (1) In order to ensure that the instrument can detect the object 104 and receive the narrow-band spectrum from the narrow-band LED calibration light source 105 at the same time, the narrow-band LED calibration light source 105 should be installed as much as possible in the field of view of the spectral instrument;

[0150] (2) In order to reduce the energy loss of the object 104, the position of the narrow-band LED calibration light source 105 should avoid blocking the diffuse reflection of the object 104 as much as possible;

[0151] (3) The installation position of the narrow-band LED calibration light source 105 should avoid the irradiation of the narrow-band LED calibration light source 105 to the object 104, that is, avoid the superposition of the narrow-band spectrum reflected by the object 104.

[0152] According to the above requirements for the placement position, the narrow-band LED calibration light source 105 can be placed at the edge of the field of view of the spectral instrument. In other words, the narrow-band LED calibration light source 105 should not be placed on the optical path formed between the object 104 and the light-tight tube 106, the converging lens 107, the slit diaphragm 108, and the plane mirror 109.

[0153] For example, in order to improve the energy utilization rate of the light beam, the narrow-band LED calibration light source 105 can be arranged at the inner edge region of the window sheet 103. Alternatively, when the miniature infrared spectrometer 100 includes a plurality of narrow-band LED calibration light sources 105, the plurality of narrow-band LED calibration light sources 105 can be uniformly placed at the inner edge of the window sheet 103. It should be understood that the center wavelengths of any two narrow-band LED calibration light sources 105 are different.

[0154] In this application, the narrow-band LED calibration light source 105 can be used to splice multiple spectral segments to realize wide spectral range detection.

[0155] In one example, the array detector 114 is further configured to splice the first mixed spectrum and the second mixed spectrum according to the spectrum of the first narrow-band light source to obtain a full-segment mixed spectrum; splice the first background spectrum and the second background spectrum according to the spectrum of the first narrow-band light source to obtain a full-segment background spectrum; and determine the spectrum of the object according to the full-segment mixed spectrum and the full-segment background spectrum.

[0156] In another example, the linear array detector 114 is further configured to determine a first partial spectrum of the object to be measured based on the first mixed spectrum and the first background spectrum, and determine a second partial spectrum of the object to be measured based on the second mixed spectrum and the second background spectrum; and splice the first partial spectrum of the object to be measured and the second partial spectrum of the object to be measured based on the spectrum of the first narrowband light source to determine the spectrum of the object to be measured.

[0157] In the present application, the narrowband LED calibration light source 105 can also be used to calibrate the spliced multi-segment spectrum to ensure the accuracy of the obtained spectral segments.

[0158] In one example, the linear array detector 114 is configured to calibrate the first system spectrum based on the pre-stored spectrum of the narrowband LED calibration light source 105, the first system spectrum including the full-segment background spectrum.

[0159] It should be understood that, in the case that the cover of the instrument lens is closed, the first system spectrum includes the response generated by the incident narrowband LED calibration light source 105 on the field of view of the instrument, that is, the spectral position of the narrowband LED calibration light source.

[0160] In another example, the linear array detector 114 is further configured to calibrate the second system spectrum based on the relative wavelength relationship between the pre-stored spectrum of the halogen tungsten lamp active light source 101 and the spectrum of the narrowband LED calibration light source 105, the second system spectrum including the full-segment mixed spectrum.

[0161] It should be understood that, in the case that the cover of the instrument lens is closed, the second system spectrum includes both the reflection spectrum of the object surface 104 to be measured and the spectrum of the narrowband LED calibration light source 105, and thus the relative wavelength relationship between the spectrum of the halogen tungsten lamp active light source 101 and the spectrum of the narrowband LED calibration light source 105 can be determined.

[0162] Optionally, the at least one narrowband light source further includes a second narrowband light source, the second narrowband light source having a different center wavelength from the first narrowband light source; and wherein:

[0163] The scanning grating is further configured to control the planar grating by the micro stepping motor to split the mixed light beam of the first light beam and the second light beam at a third angle to obtain a fifth diffracted light beam;

[0164] The linear array detector is further configured to detect the fifth diffracted light beam to obtain a third mixed spectrum, the second mixed spectrum and the third mixed spectrum including a second spectral overlap region corresponding to the spectrum of the second narrowband light source.

[0165] The scanning grating is further configured to control the planar grating by the micro stepping motor to split the second light beam at a third angle to obtain a sixth diffracted light beam.

[0166] The line array detector is further configured to detect the sixth diffraction light beam to obtain a third background spectrum, and the second background spectrum and the third background spectrum comprise a second spectrum overlap region.

[0167] The line array detector is further configured to determine a spectrum of the object to be measured according to the spectrum of the first narrowband light source, the spectrum of the second narrowband light source, the first mixed spectrum, the second mixed spectrum and the third mixed spectrum, and the first background spectrum, the second background spectrum and the third background spectrum.

[0168] In addition, the miniature infrared spectrometer 100 further comprises an ellipsoidal reflector bowl 102, a window sheet 103, a light shielding cylinder 106, a converging lens 107, a slit diaphragm 108, a plane mirror 109, a collimating mirror 110, and a converging mirror 113. Among them:

[0169] The ellipsoidal reflector bowl 102 adopts a parabolic curved surface design, is used for converging the light signal #1 emitted by the halogen tungsten lamp active light source 101, and reduces light loss. The window sheet 103 is located above the light shielding cylinder 106, is a transparent optical plane that protects electronic elements, sensors, or semiconductor elements in the optical path. The light shielding cylinder 106 is used to shield part of stray light outside the field of view of the instrument. The converging lens 107 is located between the light shielding cylinder 106 and the slit diaphragm 108, and the focal point of the converging lens 107 is located at the center of the slit diaphragm 108. The slit diaphragm 108 is used to shield part of stray light outside the field of view of the instrument. That is, the transmission light path of the light beam in the light shielding cylinder 106, the converging lens 107 and the slit diaphragm 108 is a straight line. The plane mirror 109 is used to reflect the light signal transmitted through the slit diaphragm 108. The collimating mirror 110 is used to change the received reflected light beam into parallel light, and the collimating mirror 110 can be an independent lens or a mirror. The converging mirror 113 is used to focus the emitted light beam after diffraction, and finally enters the small line array detector 114.

[0170] It should be noted that, Figure 1 The miniature infrared spectrometer 100 shown is only an example for easy understanding, and the relative distance between the components shown in the figure, the shape and size of the components are not necessarily the same as or scaled to the actual object.

[0171] The working principle of the miniature infrared spectrometer 100 will be described in detail below. Figure 1 The working principle of the miniature infrared spectrometer 100 will be described in detail below.

[0172] In the technical scheme of the present application, the miniature infrared spectrometer 100 is based on a cross-asymmetric CT light path structure, and multi-angle light splitting is performed through a scanning grating to realize multi-section spectrum time-sharing convergence on the small line array detector 114. At the same time, a narrowband LED calibration light source 105 is used to assist spectrum splicing and calibration, and a halogen tungsten lamp active light source 101 is used in cooperation with an ellipsoidal reflector bowl 102 for active illumination, so as to finally complete wide-spectrum spectrum detection.

[0173] It should be understood that the CT optical path structure includes a slit, two concave mirrors (collimating mirror and focusing mirror), a plane diffraction grating and a CCD. The CCD is a kind of photoelectric sensor device, which is composed of light-sensitive pixels (micro photoelectric sensing sheet) arranged in a line. Specifically, the incident light is incident by the slit, collimated by the collimating mirror, diffracted on the plane grating, separated by the grating, and finally focused by the focusing mirror to the CCD to collect and analyze the corresponding signals.

[0174] In one possible implementation, the halogen tungsten lamp active light source 101 and the narrowband LED calibration light source 105 are turned on at the same time. Specifically, the halogen tungsten lamp active light source 101 emits light signal #1, which is collected by the ellipsoidal reflector bowl 102 and then exits through the window sheet 103, and then irradiates the surface of the object to be measured 104. The light that is diffusely reflected by the surface of the object to be measured 104 is the first light beam. The narrowband LED calibration light source 105 emits light signal #2, which, together with the first light beam, enters the light-shielding cylinder 106 and is collected by the converging lens 107 and then collected in the center of the slit diaphragm 108. The first light beam that passes through the slit diaphragm 108 enters the plane mirror 109, and the reflected first light beam first enters the collimating mirror 110 for collimation, and then enters the plane grating 111 for diffraction, and then enters the converging mirror 113 for convergence, and finally enters the small linear array detector 114 for imaging.

[0175] In another possible implementation, the halogen tungsten lamp active light source 101 is turned off, and the narrowband LED calibration light source 105 is turned on. Specifically, the narrowband LED calibration light source 105 emits light signal #2, which first enters the light-shielding cylinder 106 and is collected by the converging lens 107 and then collected in the center of the slit diaphragm 108. The first light beam that passes through the slit diaphragm 108 enters the plane mirror 109, and the reflected first light beam first enters the collimating mirror 110 for collimation, and then enters the plane grating 111 for diffraction, and then enters the converging mirror 113 for convergence, and finally enters the small linear array detector 114 for imaging.

[0176] Based on the above two implementations, the path of the light signal #1 emitted by the halogen tungsten lamp active light source 101 is a-b-e-f-g-h, and the path of the light signal #2 emitted by the narrowband LED calibration light source 105 is c-d-e-f-g-h. Optionally, when the halogen tungsten lamp active light source 101 and the narrowband LED calibration light source 105 are turned on at the same time, the paths b and d can completely coincide.

[0177] The above completes the grating spectroscopy at a certain angle and the corresponding spectrum acquisition, and then the micro stepping motor 112 is controlled to drive the plane grating 111 to rotate to the next spectroscopy angle, and the above steps are repeated to complete the grating spectroscopy at the angle and the spectrum acquisition. In this way, the full spectrum spectral detection is achieved.

[0178] For example, assuming that the full rotation angle of the micro stepping motor 112 is 0-A degrees, the corresponding spectroscopy angle of the plane grating 111 has two, i.e., the scanning positions of the plane grating have two, the wavelength range covered by the spectrometer is 900-1500 nm, and the wavelength range of the linear array detector 114 (for example, a photodiode PD) is 300 nm. Then, in the first grating spectroscopy, the rotation angle of the stepping motor can be A / 2 degrees, the plane grating is controlled to rotate to the grating position 1 for spectroscopy, and the corresponding collected spectral wavelength range is 900-1200 nm; in the second grating spectroscopy, the stepping motor is sequentially rotated to A degrees, and the plane grating is controlled to rotate to the grating position 2 for spectroscopy, and the corresponding collected spectral wavelength range is 1200-1500 nm, i.e., the full spectrum spectral detection is achieved.

[0179] Alternatively, assuming that the full rotation angle of the micro stepping motor 112 is 0-A degrees, the corresponding spectroscopy angle of the plane grating 111 has three, i.e., the scanning positions of the plane grating have three, the wavelength range covered by the spectrometer is 900-2100 nm, and the wavelength range of the pixel of the linear array detector 114 is 600 nm. Then, in the first grating spectroscopy, the rotation angle of the stepping motor can be A / 3 degrees, the plane grating is controlled to rotate to the grating position 1 for spectroscopy, and the corresponding collected spectral wavelength range is 900-1500 nm; in the second grating spectroscopy, the stepping motor is sequentially rotated to 2A / 3 degrees, and the plane grating is controlled to rotate to the grating position 2 for spectroscopy, and the corresponding collected spectral wavelength range is 1200-1800 nm, in the third grating spectroscopy, the stepping motor is sequentially rotated to A degrees, and the plane grating is controlled to rotate to the grating position 3 for spectroscopy, and the corresponding collected spectral wavelength range is 1500-2100 nm, i.e., the full spectrum spectral detection is achieved.

[0180] It should be noted that the wavelength range (or range) of the above spectrometer can be pre-set, the larger the range, the more the diffraction angles of the plane grating, and the larger the spectral range that can be supported for measurement. Similarly, the wavelength range corresponding to the spectrum measured each time, and the center wavelength λ of the narrow-band LED calibration light source 105 can also be pre-set. It should be understood that the above rotation full angle of the stepper motor, the grating diffraction angle, the scanning position of the plane grating, the full spectral range, and the wavelength range (for example, 300nm) of the image element in the linear array detector array are only exemplary descriptions, and should not constitute any limitation on the technical solutions of the present application.

[0181] It should be noted that whether the spectrum needs to be collected and spliced in segments mainly depends on the scanning wavelength range corresponding to each scanning grating position and the spectral range to be measured. For example, the spectral range to be measured is 900nm-1200nm, the scanning wavelength range corresponding to the scanning grating position 1 is 900nm-1500nm, and the spectral measurement can be completed by one grating scanning; for another example, the spectral range to be measured is 900nm-1800nm, the scanning wavelength range corresponding to the scanning grating position 1 is 900nm-1500nm, the scanning wavelength range corresponding to the scanning grating position 2 is 1200nm-1800nm, and the spectral measurement can be completed by two grating scanning, and the spectra of the two scanning need to be spliced to obtain the full spectral range.

[0182] Based on the above Figure 1 The working principle of the miniature infrared spectrometer 100 is shown, and the splicing method of the collected multi-segment spectrum is described in detail. Figure 2 and Figure 3 , the splicing method of the collected multi-segment spectrum is described in detail.

[0183] Figure 2 is a flowchart of a multi-segment spectrum time-sharing acquisition and splicing method 200 provided by the present application. As Figure 2 shown, it specifically includes the following steps.

[0184] S210, collecting the background spectrum #1 and the mixed spectrum #1 corresponding to the grating position 1.

[0185] For example, the plane grating 111 is rotated to the grating position 1 by the miniature stepper motor 112, the tungsten-halogen lamp active light source 101 is turned off, and the narrow-band LED calibration light source 105 is turned on, and the miniature infrared spectrometer 100 is used to align the object to be measured 104 for spectral acquisition, to obtain the background spectrum #1.

[0186] It should be understood that the background spectrum #1 collected by the miniature infrared spectrometer 100 includes the response generated by any light entering the field of view of the instrument except the halogen tungsten lamp active light source 101, or the response generated by the light reflected into the field of view of the instrument by the object to be measured 104, and the response generated by the narrow-band LED calibration light source 105 entering the field of view of the instrument.

[0187] Further, the grating position 1 is kept unchanged, the halogen tungsten lamp active light source 101 is turned on, and the miniature infrared spectrometer 100 is used to collect the spectrum of the object to be measured 104, to obtain the mixed spectrum #1.

[0188] It should be understood that the mixed spectrum #1 collected by the miniature infrared spectrometer 100 includes the background spectrum #1 in step S210, and the response generated by the diffuse reflection into the field of view of the instrument after the object to be measured 104 is irradiated by the halogen tungsten lamp active light source 101.

[0189] S220, the background spectrum #2, …, the background spectrum #N corresponding to the grating position 2, …, the grating position N are collected in turn, and the mixed spectrum #2, …, the mixed spectrum #N are collected in turn.

[0190] For example, the plane grating 111 is rotated from the grating position 1 to the grating position 2 by the miniature stepping motor 112, the halogen tungsten lamp active light source 101 is turned off, the narrow-band LED calibration light source 105 is turned on, and the miniature infrared spectrometer 100 is used to collect the spectrum of the object to be measured 104, to obtain the background spectrum #2.

[0191] Further, the grating position 2 is kept unchanged, the halogen tungsten lamp active light source 101 is turned on, and the miniature infrared spectrometer 100 is used to collect the spectrum of the object to be measured 104, to obtain the mixed spectrum #2.

[0192] Similarly, the background spectrum #3, …, the background spectrum #N corresponding to the grating position 3, …, the grating position N are collected in turn, and the mixed spectrum #3, …, the mixed spectrum #N are collected in turn.

[0193] The specific implementation of collecting the background spectrum #3, …, the background spectrum #N and the corresponding mixed spectrum #3, …, the mixed spectrum #N can refer to the above-mentioned step S210, and details are not described here for the sake of brevity.

[0194] It should be noted that the specific meaning of the background spectrum #2, …, the background spectrum #N can refer to the meaning of the above-mentioned background spectrum #1, and similarly, the specific meaning of the mixed spectrum #2, …, the mixed spectrum #N can refer to the meaning of the above-mentioned mixed spectrum #1, and details are not described here for the sake of brevity.

[0195] It should be understood that the N segments of the spectrum (including the background spectrum or the mixed spectrum) contain N-1 splicing regions, and the narrow-band LED calibration light source 105 provides the calibration spectrum of the N-1 splicing regions, that is, the splicing of the N segments of the spectrum can be achieved by N-1 narrow-band LED calibration light sources 105 of different wavelengths.

[0196] In S230, according to the preset N-1 splicing positions, the N segments of the background spectrum and the N segments of the mixed spectrum are spliced respectively to obtain the full-segment background spectrum and the full-segment mixed spectrum.

[0197] For example, N=3, the preset first splicing position is 1400nm-1600nm, the second splicing position is 2000nm-2200nm, the wavelength range of the first segment of the mixed spectrum is 900nm-1600nm, the wavelength range of the second segment of the mixed spectrum is 1400nm-2200nm, the wavelength range of the third segment of the mixed spectrum is 2000nm-2500nm, the wavelength range of the first segment of the background spectrum is 1000nm-1600nm, the wavelength range of the second segment of the background spectrum is 1400nm-2200nm, the wavelength range of the third segment of the background spectrum is 2000nm-2400nm, the wavelength range of the full-segment mixed spectrum is 900nm-2500nm after splicing, and the wavelength range of the full-segment background spectrum is 1000nm-2400nm.

[0198] The N-1 splicing positions correspond to the spectra of the N-1 narrow-band LED calibration light sources 105 respectively, and the N-1 splicing positions corresponding to the splicing of the N segments of the background spectrum and the N segments of the mixed spectrum are the same.

[0199] It should be noted that the specific spectral splicing operation can refer to the existing spectral splicing technology, for example, the spectral splicing can be achieved by normalization processing, and the like, and for the sake of brevity, the details are not described herein.

[0200] It should be understood that the above preset splicing positions and quantities, as well as the wavelength ranges and quantities of the background spectrum and the mixed spectrum are only illustrative and should not constitute any limitation on the technical solutions of the present application.

[0201] In S240, the full-segment spectrum of the object to be measured is determined according to the full-segment background spectrum and the full-segment mixed spectrum.

[0202] For example, the wavelengths of the spectrum of the narrow-band LED calibration light source 105 in the full-segment background spectrum and the full-segment mixed spectrum obtained by splicing in the above step S230 are aligned and normalized, and then the full-segment background spectrum and the full-segment mixed spectrum are subtracted, and the obtained spectrum curve is the full-segment spectrum of the object to be measured, that is, the reflection spectrum of the object to be measured itself.

[0203] Further, the full spectrum of the to-be-detected object is compared with the pre-stored spectrum (or the cloud-stored spectrum) in the database, and the structure or component information of the to-be-detected object 104 can be identified.

[0204] Figure 3 is another flow diagram of a multi-segment spectrum time-sharing acquisition and splicing method 300 provided by the embodiment of the present application. As shown in the figure, the method specifically includes the following steps. Figure 3

[0205] S310, collecting a background spectrum #1 and a mixed spectrum #1 corresponding to a grating position 1.

[0206] S320, sequentially collecting background spectra #2, …, #N and mixed spectra #2, …, #N corresponding to grating positions 2, …, N.

[0207] The specific implementation of the above steps S310 and S320 can be respectively referred to the steps S210 and S220 of the above method 200, and for the sake of brevity, no more details are given here.

[0208] S330, determining partial spectra of N segments of the to-be-detected object according to the N segments of the background spectra and the N segments of the mixed spectra.

[0209] For example, N=3, the wavelengths of the spectrum of the narrow-band LED calibration light source 105 in the first segment of the background spectrum and the first segment of the mixed spectrum are aligned, normalized, and difference-processed, and the partial spectrum of the first segment of the to-be-detected object can be obtained, for example, 900nm-1600nm; similarly, the wavelength range of the partial spectrum of the second segment of the to-be-detected object is 1200nm-2000nm, and the wavelength range of the partial spectrum of the third segment of the to-be-detected object is 1800nm-2500nm.

[0210] S340, splicing the full spectrum of the to-be-detected object according to the partial spectra of the N segments of the to-be-detected object and the preset N-1 splicing positions.

[0211] For example, N=3, the wavelength range of the first splicing position is 1200nm-1600nm, and the wavelength range of the second splicing position is 1800nm-2000nm, and the wavelength range of the full spectrum of the to-be-detected object obtained by splicing is 900nm-2500nm.

[0212] The N-1 splicing positions correspond to the spectra of N-1 narrow-band LED calibration light sources 105 respectively, and the N-1 splicing positions corresponding to the splicing of the N segments of the background spectra and the N segments of the mixed spectra are the same.

[0213] ​It should be noted that the specific spectral splicing operation can refer to the existing spectral splicing technology, for example, the splicing of the spectrum is realized by normalization processing, and the like, and for the sake of brevity, the details are not described herein.

[0214] It should be understood that the above preset splicing positions and quantity, and the wavelength range and quantity of the background spectrum and the mixed spectrum are only illustrative examples, and should not constitute any limitation on the technical solutions of the present application.

[0215] Further, the full spectrum of the object to be measured is compared with the pre-stored spectrum in the database, and the structure or component information of the object to be measured 104 can be identified.

[0216] In summary, the spectrometer disclosed in the present application controls the rotation of the plane grating 111 by the micro stepping motor 112, realizes the time-sharing acquisition of N segment spectra, and splices the N segment spectra by using the narrowband LED calibration light source 105 to cover the full spectrum segment, and realizes the detection of a wide spectral range.

[0217] Figure 4 is a schematic diagram of the imaging position and splicing position of a multi-segment spectrum provided by an embodiment of the present application. As shown in Figure 4 , taking N=3 as an example, the imaging positions of the 3 segment spectra on the linear array detector corresponding to the 3 positions of the scanning grating are illustrated, and the splicing positions of the 3 segment spectra are illustrated.

[0218] For example, based on the above-mentioned method 200 or 300, 3 segment spectra are acquired, and the corresponding wavelength ranges are 900nm-1600nm, 1200nm-2200nm and 1800nm-2500nm, respectively. The 3 segment spectra have 2 overlapping spectral regions, each of which contains the spectrum of a narrowband LED calibration light source 105 of a specific wavelength, so as to facilitate the splicing of the 3 segment spectra, and therefore at least 2 narrowband LED calibration light sources of specific wavelengths are required. For example, the wavelength ranges corresponding to the 2 overlapping spectral regions are 1200nm-1600nm and 1800nm-2200nm, the center wavelength of the narrowband LED calibration light source 105#1 is λ1, and the corresponding wavelength range can be greater than or equal to 1200nm and less than or equal to 1600nm, for example, 1300nm-1500nm; the center wavelength of the narrowband LED calibration light source 105#2 is λ2, and the corresponding wavelength range can be greater than or equal to 1800nm and less than or equal to 2200nm, for example, 1900nm-2100nm.

[0219] To ensure the accuracy of the splicing, more narrow-band LED calibration light sources 105 of specific wavelengths can also be used to assist the spectral splicing. For example, two additional narrow-band LED calibration light sources 105 are added at the middle positions of the three spliced spectra, and after the splicing of the three spectra is completed, the two additional narrow-band LED calibration light sources 105 are turned on. When a splicing error occurs, the two additional narrow-band LED calibration light sources 105 can be used to further correct the spectrum according to their central wavelengths, thereby ensuring the accuracy of the spectral splicing.

[0220] According to the above description, the multi-segment spectral splicing described in the present application mainly relies on the spectrum of the narrow-band LED calibration light source 105 in the splicing area of adjacent spectral segments, and no longer relies on the absolute position on the spectral imaging and the small linear array detector, thereby making up for the positioning error or the repeat error caused by the rotation of the scanning grating.

[0221] Based on the above Figure 1 the working principle of the miniature infrared spectrometer 100 is shown, Figure 2 and Figure 3 the multi-segment spectral time-sharing acquisition and splicing method, and Figure 4 the imaging position and the splicing position of the multi-segment spectrum are shown, which provide the following Figures 5 to 7 the result diagram of the multi-segment spectral splicing is shown.

[0222] Figure 5 is a result diagram of multi-segment spectral splicing provided by an embodiment of the present application. As Figure 5 shown, it includes two spectra, a first spectrum and a second spectrum, and the splicing effect is good. Among them, for the splicing area (overlapping area) of the two spectra, the end points of the first spectrum include n-2, n-1 and n, and correspondingly, the end points of the second spectrum are 0, 1 and 2 respectively. In this implementation, the miniature stepping motor in the scanning grating is driven by a closed-loop motor, and the accuracy of the spectral splicing mainly depends on the closed-loop accuracy of the closed-loop motor, so that a high-precision closed-loop motor can improve the accuracy of the spectral splicing. However, due to the limitation of the size and cost of the closed-loop motor, the miniaturization and low cost of the spectrometer 100 will be affected.

[0223] Figure 6 is another result diagram of multi-segment spectral splicing provided by an embodiment of the present application. As Figure 6As shown, the spectrum consists of two segments. An error occurs in the splicing of the first and second segments, resulting in broadening and distortion in the spliced ​​spectrum. Specifically, in the overlapping region (splitting area) of the two spectra, the endpoints of the first segment are n-2, n-1, and n, while the endpoints of the second segment are 0, 1, and 2. In this implementation, the micro-stepping motor in the scanning grating is driven by an open-loop motor. Although the spectrometer 100 can be further miniaturized, the inability to determine whether the rotation angle of the open-loop motor is accurate leads to an indeterminate position of the scanning grating, resulting in severe errors in the spectral splicing and even the appearance of erroneous characteristic peaks.

[0224] Figure 7 This is a schematic diagram of another multi-segment spectral splicing method provided in an embodiment of this application. For example... Figure 7 As shown, the image includes two spectral segments, with good stitching between the first and second segments. Specifically, in the overlapping region (segment overlap), the endpoints of the first segment are n-2, n-1, and n, while the endpoints of the second segment are 0, 1, and 2. In this implementation, the micro-stepping motor in the scanning grating is driven by an open-loop motor and a monochromatic LED self-calibration method, essentially adding a closed-loop feedback structure to the open-loop motor. Figure 5 Compared to the closed-loop motor shown, the spectrometer 100 is smaller and less expensive. Furthermore, because the monochromatic light from a monochromatic LED has a narrow wavelength range, the positioning accuracy of the spectrometer 100 can still reach [the required level]. Figure 5 The high-precision closed-loop motor shown in the image produces a stitching effect, thereby obtaining a high-precision spectrum.

[0225] In summary, in comparison Figures 5 to 7 As shown in the results of splicing multiple spectra, using an open-loop motor and a monochromatic LED as the micro stepper motor in the scanning grating of the miniature infrared spectrometer 100 is an ideal solution.

[0226] It should be noted that the miniature infrared spectrometer 100 disclosed in this application also has a spectral self-calibration function. For example, after obtaining the background spectrum and mixed spectrum using the above-mentioned method 200 or 300, spectral self-calibration can be performed to ensure spectral accuracy. The following is in conjunction with... Figure 8 The method for spectral self-calibration is explained in detail.

[0227] Figure 8 This is a schematic flowchart of a spectral self-calibration method 800 provided in an embodiment of this application. Figure 8 As shown, the process includes the following steps.

[0228] S810 acquires the first system spectrum and compares and calibrates it with the spectrum of the pre-stored narrowband LED calibration light source.

[0229] For example, when the halogen tungsten lamp active light source 101 is turned off and the narrowband LED calibration light source 105 is turned on, the first system spectrum can be obtained by the above-mentioned method 200 or 300, that is, the response of the narrowband LED calibration light source 105 incident on the instrument field of view on the linear array detector array 114, that is, the spectral position of the narrowband LED calibration light source.

[0230] It should be understood that the spectrum of the narrowband LED calibration light source 105 is fixed at the factory, and the response wavelength of the narrowband LED calibration light source 105 at the factory is calibrated and pre-stored in the spectral instrument (for example, the linear array detector array 114), and the calibration result is the response wavelength position of the narrowband LED calibration light source 105 on the linear array detector 114 (that is, the spectrum of the narrowband LED calibration light source 105).

[0231] Further, by comparing the first system spectrum with the pre-stored spectrum of the narrowband LED calibration light source 105 at the factory, it can be determined whether the instrument itself has been shifted (for example, Figure 1 the narrowband LED calibration light source 105, the light-tight barrel 106, the converging lens 107, the slit diaphragm 108, the plane mirror 109, etc.), and whether the optical path needs to be further adjusted (for example, Figure 1 the optical path c-d-e-f-g). If the response wavelength of the narrowband LED calibration light source 105 on the linear array detector 114 is shifted by +10 nm compared with the pre-stored response wavelength of the narrowband LED calibration light source 105 at the factory calibration, for example, a -10 nm translation operation can be performed on the spectrum responded by the current linear array detector 114 to make the response wavelength position of the first system spectrum consistent with the pre-stored response wavelength position at the factory, or a -10 nm translation operation can be performed on the current linear array detector 114 to calibrate the spectrum shift caused by the instrument or the optical path and the like.

[0232] Optionally, before performing the above-mentioned step S810, it is determined whether the cover of the instrument lens is in a closed state. If the cover of the instrument lens is in a closed state, the S810 and the subsequent processes are started to be executed; otherwise, the S810 and the subsequent processes are not executed.

[0233] For example, the cover of the instrument can be periodically checked, for example, by comparing the background noise with the pre-stored threshold size, if the background noise exceeds the threshold size, it is determined that the cover of the instrument is in a closed state, otherwise it is considered that the cover of the instrument is in an open state.

[0234] Optionally, if the user manually selects to start the calibration process, the step of determining whether the cover of the instrument lens is in the closed state is performed, and if the cover of the instrument lens is closed, the step S810 and the subsequent process are started.

[0235] S820, a second system spectrum is obtained, the relative wavelength relationship between the spectrum of the narrow-band LED calibration light source and the spectrum of the tungsten-halogen lamp active light source is determined, and is compared with the pre-stored relative wavelength relationship between the spectrum of the narrow-band LED calibration light source 105 and the spectrum of the tungsten-halogen lamp active light source 101.

[0236] For example, the narrow-band LED calibration light source 105 is kept in the open state, and the tungsten-halogen lamp active light source 101 is turned on, and the spectrum collection is performed by the above-mentioned method 200 or 300, and the second system spectrum can be obtained. Since the second system spectrum contains the reflection spectrum of the object 104 to be measured and the spectrum of the narrow-band LED calibration light source 105, the relative wavelength relationship between the spectrum of the narrow-band LED calibration light source and the spectrum of the tungsten-halogen lamp active light source can be determined.

[0237] It should be understood that the relative position (or the relative wavelength relationship) of the spectrum of the narrow-band LED calibration light source 105 and the spectrum of the tungsten-halogen lamp active light source 101 is fixed at the time of factory shipment, and the relative position of the spectrum of the narrow-band LED calibration light source 105 and the spectrum of the tungsten-halogen lamp active light source 101 is calibrated at the time of factory shipment, and the calibration result is pre-stored in the spectral instrument (for example, the linear array detector array 114).

[0238] Further, by comparing the relative wavelength relationship between the spectrum of the narrow-band LED calibration light source and the spectrum of the tungsten-halogen lamp active light source in the second system spectrum with the pre-stored relative wavelength relationship between the spectrum of the narrow-band LED calibration light source 105 and the spectrum of the tungsten-halogen lamp active light source 101 at the time of factory shipment, whether the tungsten-halogen lamp active light source 101 is aged can be determined. If the comparison result shows that the relative wavelength relationship between the spectrum of the narrow-band LED calibration light source and the spectrum of the tungsten-halogen lamp active light source in the second system spectrum has shifted, further calibration is needed, and the calibration method is similar to the calibration method in the above-mentioned step S810, and details are not described here for the sake of brevity.

[0239] It should be understood that since the narrow-band LED calibration light source 105 is much stronger than the diffuse reflection light of the object 104 to be measured, the spectrum of the narrow-band LED calibration light source in the first system spectrum obtained by the instrument detection in the above-mentioned step S810 and the second system spectrum obtained by the instrument detection in the step S820 is more obvious, which is beneficial to the registration of the spectral position and the wavelength calibration.

[0240] It should be noted that based on the above steps S810 and S820, the calibration of the instrument itself and the halogen tungsten lamp active light source can be realized, and then through the calibrated micro infrared spectrometer 100 for spectrum acquisition, the spectrum quality and stability can be ensured. Alternatively, before each spectrum (for example, collecting background spectrum and mixed spectrum) acquisition, the above steps S810 and S820 can be performed, or not, for example, once every 10 times of spectrum acquisition, etc., which is not limited in the present application.

[0241] Alternatively, after the above steps S810 and S820, more accurate spectrum of the object to be measured can be obtained by performing steps S830 and S840.

[0242] S830, acquiring background spectrum and mixed spectrum.

[0243] Wherein, the specific acquisition method of the background spectrum and the mixed spectrum can refer to steps S210-S230 in the above method 200, and will not be repeated here for brevity.

[0244] It should be noted that before performing the above step S830, it is necessary to ensure that the cover of the instrument lens is in the open state. Exemplarily, the cover of the instrument can be periodically checked, for example, by comparing the background noise with the pre-stored threshold size, if the background noise is lower than the threshold size, it is considered that the cover of the instrument has been opened, otherwise it is considered that the cover of the instrument is in the closed state.

[0245] S840, determining the spectrum of the object to be measured according to the background spectrum and the mixed spectrum.

[0246] Exemplarily, first align and normalize the response wavelength of the spectrum of the narrow-band LED calibration light source 105 in the background spectrum and the mixed spectrum, and then subtract the difference between the background spectrum and the mixed spectrum. At this time, the obtained spectrum curve is the spectrum of the object to be measured 104, that is, the reflection spectrum of the object to be measured 104 itself.

[0247] Further, comparing the spectrum of the object to be measured with the pre-stored spectrum in the database can identify the structure or component information of the object to be measured 104, etc. For example, by identifying the content of nitrite, the freshness of the substance is prompted; or by identifying the content of protein, whether the material of the clothes is real leather is prompted; or by detecting the content of skin moisture, the use of cosmetics is suggested, etc.

[0248] The miniature infrared spectrometer disclosed in the application is based on a cross-asymmetric Czerny-Turner structure, adopts a mature and efficient plane grating coupled with a miniature stepping motor as a scanning grating, realizes multi-angle spectrometry through the scanning grating, ensures that multi-section spectrums are converged on a small linear array detector at different times, simultaneously adopts a narrow-band LED calibration light source to assist spectral splicing and calibration, and finally completes the acquisition of spectral data with a wide spectral range, high precision, high resolution and high signal-to-noise ratio.

[0249] The technical solution of the application can compress the size of the instrument without complex motor control and mechanical structure, adopts a plane grating instead of a MEMS grating to ensure the spectrometry efficiency and stability, reduces the cost and control complexity, equips with a narrow-band LED calibration light source, proposes a spectral splicing and self-calibration scheme to make up for the limited positioning accuracy and repeatability of the scanning grating, reduces the development cost and control difficulty of the scanning grating, and ensures that the detected spectrum is reliable.

[0250] It should be understood that commercial portable or handheld spectral analysis devices have gradually compressed the spectrometer to centimeter level, and will continue to compress the volume to millimeter level or even micrometer level, and the above-mentioned miniature infrared spectrometer 100 can be integrated into a chip or an electronic device such as a smart phone or a notebook computer. Figure 1

[0251] Figure 9 is a schematic structural diagram of an electronic device 900 provided by an embodiment of the application. The electronic device 900 can be a terminal consumer product or a 3C electronic product (computer, communication, consumer electronic product), such as a mobile phone, a portable computer, a tablet computer, an electronic reader, a notebook computer, a digital camera, a wearable device, a headset, a watch, a digital camera, or a stylus, etc. The electronic device 900 can also be a vehicle, or a control device, a car machine, a vehicle-mounted device, etc. applied to a vehicle. Figure 9 The embodiment shown takes the mobile phone as an example for illustration.

[0252] The electronic device 900 can include a housing 91, a display screen 92, and a circuit board assembly 93. The display screen 92 and the circuit board assembly 93 are mounted to the housing 91. Specifically, the housing 91 can include a frame and a back cover. The frame can be located between the display screen 92 and the back cover. The frame can surround the outer periphery of the display screen 92 and the outer periphery of the back cover, and the display screen 92 is spaced apart from the back cover. The cavity formed between the display screen 92, the frame, and the back cover can be used to accommodate the circuit board assembly 93, and the housing 91 can be used to fix the circuit board assembly 93. The circuit board assembly 93 can include a circuit board, and a miniature infrared spectrometer 94 (as shown in Figure 1 ​​

[0253] Circuit boards can be printed circuit boards, flexible circuit boards, integrated circuits (or chips), etc. Depending on the number of electronic components they carry, circuit boards can be single-sided or double-sided. A single-sided board refers to a circuit board with electronic components on one side. A double-sided board refers to a circuit board with electronic components on both sides. Depending on the type of electronic components they carry, circuit boards can be motherboards, module boards, frame boards, RF boards, or application processor (AP) boards, etc. A motherboard is the main circuit board within an electronic device. An RF board can be used to carry RF chips, RF power amplifiers, wireless fidelity (WIFI) chips, etc. An AP board can be used to carry system-on-chip (SOC) components, double data rate memory, etc.

[0254] Optionally, the electronic device also includes a processor that can stitch together and calibrate the spectrum of the object under test, ensuring both wide-band spectral detection and improved spectral accuracy.

[0255] The processor is used to receive the spectrum of a first narrowband light source, a first mixed spectrum and a second mixed spectrum, as well as a first background spectrum and a second background spectrum from a miniature infrared spectrometer 94; and is also used to determine the spectrum of the object to be measured based on the spectrum of the first narrowband light source, the first mixed spectrum and the second mixed spectrum, as well as the first background spectrum and the second background spectrum.

[0256] The implementation of the miniature infrared spectrometer 94 in detecting and acquiring the spectrum of the first narrowband light source, the first mixed spectrum and the second mixed spectrum, as well as the first background spectrum and the second background spectrum, can be found in the above methods 200 or 300. For the sake of brevity, it will not be described in detail here.

[0257] In one example, the processor is configured to stitch together a first mixed spectrum and a second mixed spectrum based on the spectrum of a first narrowband light source to obtain a mixed spectrum of the entire segment; stitch together a first background spectrum and a second background spectrum based on the spectrum of the first narrowband light source to obtain a background spectrum of the entire segment; and determine the spectrum of the object to be measured based on the mixed spectrum of the entire segment and the background spectrum of the entire segment.

[0258] In another example, the processor is further configured to determine a first part of the spectrum of the object under test based on a first mixed spectrum and a first background spectrum; determine a second part of the spectrum of the object under test based on a second mixed spectrum and a second background spectrum; and stitch together the first part of the spectrum of the object under test and the second part of the spectrum of the object under test based on the spectrum of a first narrowband light source to determine the spectrum of the object under test.

[0259] Specifically, taking the detection of the sugar content of fruits as an example, the detection window of the miniature infrared spectrometer 94 of the electronic device 900 is aligned with the fruit to collect the spectral curve of the fruit, and the sugar content of the fruit can be quickly calculated through the model algorithm built in the miniature infrared spectrometer 94, so as to achieve the purpose of rapid detection of the sugar content; or the miniature infrared spectrometer 94 sends the collected spectrum to the processor of the electronic device 900, and the sugar content of the fruit is quickly calculated through the processor, so as to achieve the purpose of rapid detection of the sugar content. In addition, the miniature infrared spectrometer 94 disclosed in the present application can also detect the alcohol content of white wine, the protein content of milk and milk powder, and even distinguish whether vegetables are organically planted or not.

[0260] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working process of the system, device and unit described above can refer to the corresponding process in the foregoing method embodiments, which will not be repeated here.

[0261] In several embodiments provided in the present application, it should be understood that the disclosed system, device and method can be implemented in other ways. For example, the device embodiments described above are only schematic, for example, the division of the units is only a logical function division, and actual implementation can have another division manner, for example, a plurality of units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the coupling or direct coupling or communication connection between the units shown or discussed can be indirect coupling or communication connection through some interface, device or unit, and can be electrical or other forms.

[0262] Those skilled in the art can realize that the units and algorithm steps of each example described in combination with the embodiments disclosed in the present application can be realized by electronic hardware or a combination of computer software and electronic hardware. Whether the functions are executed in hardware or software mode depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present application.

[0263] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto, and any skilled person in the art can easily think of changes or replacements within the technical range disclosed in the present application, which should be covered in the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A miniature infrared spectrometer, characterized by, include: The system comprises a broadband light source, at least one narrowband light source, a scanning grating, and a linear array detector. The scanning grating includes a planar grating and a micro stepper motor. The at least one narrowband light source includes a first narrowband light source. The broadband light source is used to emit a first beam onto the surface of the object to be tested, and the first beam is incident onto the planar grating through diffuse reflection from the surface of the object to be tested; The first narrowband light source is used to emit a second light beam to the planar grating; The scanning grating is used to control the planar grating via the micro stepper motor to split the mixed beam of the first beam and the second beam at a first angle and a second angle, respectively, to obtain a first diffracted beam and a second diffracted beam. The linear array detector is used to detect the first diffracted beam and the second diffracted beam respectively to obtain a first mixed spectrum and a second mixed spectrum. The first mixed spectrum and the second mixed spectrum include a first spectral overlap region, which corresponds to the spectrum of the first narrowband light source. The scanning grating is also used to control the planar grating to split the second beam at the first angle and the second angle respectively through the micro stepper motor, so as to obtain the third diffracted beam and the fourth diffracted beam. The linear array detector is also used to detect the third diffraction beam and the fourth diffraction beam respectively to obtain a first background spectrum and a second background spectrum, wherein the first background spectrum and the second background spectrum include the first spectral overlap region; The linear array detector is also used to detect the spectrum of the first narrowband light source; The linear array detector is further configured to determine the spectrum of the object under test based on the spectrum of the first narrowband light source, the first mixed spectrum and the second mixed spectrum, and the first background spectrum and the second background spectrum.

2. The miniature infrared spectrometer of claim 1, wherein, The band range of the first spectral overlap region is greater than or equal to the band range of the spectrum of the first narrowband light source.

3. The miniature infrared spectrometer of claim 1 or 2, wherein, The linear array detector is also used for: Based on the spectrum of the first narrowband light source, the first mixed spectrum and the second mixed spectrum are spliced ​​together to obtain the mixed spectrum of the entire segment; Based on the spectrum of the first narrowband light source, the first background spectrum and the second background spectrum are spliced ​​together to obtain the background spectrum of the entire segment; The spectrum of the object under test is determined based on the mixed spectrum of the entire segment and the background spectrum of the entire segment.

4. The miniature infrared spectrometer of claim 1 or 2, wherein, The linear array detector is also used for: A first part of the spectrum of the object under test is determined based on the first mixed spectrum and the first background spectrum, and a second part of the spectrum of the object under test is determined based on the second mixed spectrum and the second background spectrum. Based on the spectrum of the first narrowband light source, the first part of the spectrum of the object under test and the second part of the spectrum of the object under test are spliced ​​together to determine the spectrum of the object under test.

5. The miniature infrared spectrometer of claim 3, wherein, The linear array detector is also used for: The first system spectrum is calibrated based on the pre-stored spectrum of the first narrowband light source, the first system spectrum including the background spectrum of the entire band.

6. The miniature infrared spectrometer according to claim 3, characterized in that, The linear array detector is also used for: The second system spectrum is calibrated based on the relative wavelength relationship between the spectrum of the broadband light source and the spectrum of the first narrowband light source, which is stored in advance. The second system spectrum includes the mixed spectrum of the entire band.

7. The miniature infrared spectrometer according to claim 1 or 2, characterized in that, The at least one narrowband light source further includes a second narrowband light source, the second narrowband light source having a different center wavelength from the first narrowband light source; wherein: The scanning grating is also used to control the planar grating via the micro stepper motor to split the mixed beam of the first beam and the second beam at a third angle to obtain a fifth diffracted beam; The linear array detector is also used to detect the fifth diffracted beam to obtain a third mixed spectrum. The second mixed spectrum and the third mixed spectrum include a second spectral overlap region, which corresponds to the spectrum of the second narrowband light source. The scanning grating is also used to control the planar grating to split the second beam at the third angle through the micro stepper motor to obtain the sixth diffracted beam; The linear array detector is also used to detect the sixth diffraction beam to obtain a third background spectrum, wherein the second background spectrum and the third background spectrum include the second spectral overlap region; The linear array detector is also used to detect the spectrum of the second narrowband light source; The linear array detector is further configured to determine the spectrum of the object under test based on the spectrum of the first narrowband light source, the spectrum of the second narrowband light source, the first mixed spectrum, the second mixed spectrum and the third mixed spectrum, the first background spectrum, the second background spectrum and the third background spectrum.

8. The miniature infrared spectrometer according to claim 7, characterized in that, The band range of the second spectral overlap region is greater than or equal to the band range of the spectrum of the second narrowband light source.

9. The miniature infrared spectrometer according to claim 1 or 2, characterized in that, The center wavelengths of any two narrowband light sources in the at least one narrowband light source are different.

10. The miniature infrared spectrometer according to claim 1 or 2, characterized in that, The at least one narrowband light source is uniformly disposed at the edge of the field of view of the miniature infrared spectrometer.

11. The miniature infrared spectrometer according to claim 1 or 2, characterized in that, The at least one narrowband light source is uniformly disposed in the inner edge region of the window of the miniature infrared spectrometer.

12. The miniature infrared spectrometer according to claim 1 or 2, characterized in that, The micro stepper motor is an open-loop motor.

13. The miniature infrared spectrometer according to claim 12, characterized in that, The at least one narrowband light source includes a monochromatic light-emitting diode (LED) light source.

14. An electronic device, characterized in that, include: The miniature infrared spectrometer as described in any one of claims 1 to 13.

15. An electronic device, characterized in that, include: A processor and a miniature infrared spectrometer, the miniature infrared spectrometer comprising a broadband light source, at least one narrowband light source, a scanning grating, and a linear array detector, the scanning grating comprising a planar grating and a miniature stepper motor, and the at least one narrowband light source comprising a first narrowband light source; wherein: The broadband light source is used to emit a first beam onto the surface of the object to be tested, and the first beam is incident onto the planar grating through diffuse reflection from the surface of the object to be tested; The first narrowband light source is used to emit a second light beam to the planar grating; The scanning grating is used to control the planar grating via the micro stepper motor to split the mixed beam of the first beam and the second beam at a first angle and a second angle, respectively, to obtain a first diffracted beam and a second diffracted beam. The linear array detector is used to detect the first diffracted beam and the second diffracted beam respectively to obtain a first mixed spectrum and a second mixed spectrum. The first mixed spectrum and the second mixed spectrum include a first spectral overlap region, which corresponds to the spectrum of the first narrowband light source. The scanning grating is also used to control the planar grating to split the second beam at the first angle and the second angle respectively through the micro stepper motor, so as to obtain the third diffracted beam and the fourth diffracted beam. The linear array detector is also used to detect the third diffraction beam and the fourth diffraction beam respectively to obtain a first background spectrum and a second background spectrum, wherein the first background spectrum and the second background spectrum include the first spectral overlap region; The linear array detector is also used to detect the spectrum of the first narrowband light source; The processor is configured to receive from the miniature infrared spectrometer the spectrum of the first narrowband light source, the first mixed spectrum and the second mixed spectrum, as well as the first background spectrum and the second background spectrum; The processor is further configured to determine the spectrum of the object under test based on the spectrum of the first narrowband light source, the first mixed spectrum and the second mixed spectrum, and the first background spectrum and the second background spectrum.

16. The electronic device according to claim 15, characterized in that, The processor is also used for: Based on the spectrum of the first narrowband light source, the first mixed spectrum and the second mixed spectrum are spliced ​​together to obtain the mixed spectrum of the entire segment; Based on the spectrum of the first narrowband light source, the first background spectrum and the second background spectrum are spliced ​​together to obtain the background spectrum of the entire segment; The spectrum of the object under test is determined based on the mixed spectrum of the entire segment and the background spectrum of the entire segment.

17. The electronic device according to claim 15 or 16, characterized in that, The processor is also used for: A first part of the spectrum of the object under test is determined based on the first mixed spectrum and the first background spectrum, and a second part of the spectrum of the object under test is determined based on the second mixed spectrum and the second background spectrum. Based on the spectrum of the first narrowband light source, the first part of the spectrum of the object under test and the second part of the spectrum of the object under test are spliced ​​together to determine the spectrum of the object under test.

18. The electronic device according to claim 16, characterized in that, The processor is also used for: The first system spectrum is calibrated based on the pre-stored spectrum of the first narrowband light source, the first system spectrum including the background spectrum of the entire band.

19. The electronic device according to claim 16 or 18, characterized in that, The processor is further configured to: calibrate a second system spectrum based on a pre-stored relative wavelength relationship between the spectrum of the broadband light source and the spectrum of the first narrowband light source, wherein the second system spectrum includes the mixed spectrum of the entire band.

20. The electronic device according to claim 15 or 16, characterized in that, The at least one narrowband light source further includes a second narrowband light source, the second narrowband light source having a different center wavelength from the first narrowband light source; wherein: The scanning grating is also used to control the planar grating via the micro stepper motor to split the mixed beam of the first beam and the second beam at a third angle to obtain a fifth diffracted beam; The linear array detector is also used to detect the fifth diffracted beam to obtain a third mixed spectrum. The second mixed spectrum and the third mixed spectrum include a second spectral overlap region, which corresponds to the spectrum of the second narrowband light source. The scanning grating is also used to control the planar grating to split the second beam at the third angle through the micro stepper motor to obtain the sixth diffracted beam; The linear array detector is also used to detect the sixth diffraction beam to obtain a third background spectrum, wherein the second background spectrum and the third background spectrum include the second spectral overlap region; The linear array detector is also used to detect the spectrum of the second narrowband light source; The processor is also configured to receive the spectrum of the second narrowband light source, the third mixed spectrum, and the third background spectrum from the miniature infrared spectrometer; The processor is further configured to determine the spectrum of the object under test based on the spectrum of the first narrowband light source, the spectrum of the second narrowband light source, the first mixed spectrum, the second mixed spectrum and the third mixed spectrum, the first background spectrum, the second background spectrum and the third background spectrum.

Images