Test bench electrical connection structure for reducing coupling effect of weak force test environment

Abstract

The application discloses a test-bed electrical connection structure for reducing coupling effect of weak force test environment, which comprises a frame, a frame fixed base plate component fixed on the frame, a rotary fixed base plate component arranged below the frame fixed base plate component, and a rotating shaft connecting the frame fixed base plate component and the rotary fixed base plate component. A pendulum body is fixed on the rotary fixed base plate component, and a measured propeller is arranged at the bottom end of the pendulum body. The application weakens the influence of the conducting wire, the microwave conducting wire and the air pipe on the rigidity and temperature coefficient of the test bed.

Description

Technical Field

[0001] This invention belongs to the field of weak force testing, measurement and calibration technology, and specifically relates to an electrical connection structure for a test bench that reduces the coupling effect of weak force testing environment, which is suitable for various weak force measurement processes and measuring devices with rotating shaft structures. Background Technology

[0002] Microthrusters with resolutions in the micronewton range and higher have important applications in high-precision space experimental satellites. Space missions place increasingly higher demands on the precision of satellite attitude and orbit control, and the actuators for this control are high-precision space microthrusters. They are a crucial component of space missions, and their performance determines the quality and even the success or failure of the mission. In high-precision deep space exploration, small satellite formation flying, space gravitational wave detection programs, space equivalence principle verification, and microgravity vibration isolation projects, microthrusters are also needed to provide real-time compensation for non-gravitational disturbances experienced by satellites or local payloads, enabling drag-free control.

[0003] Ground-based performance evaluation testing and precise calibration are essential for the development of micro-thrusters and a prerequisite for their space applications. Common physical structures used in ground testing include simple pendulums, inverted pendulums, torsion pendulums, and balances. The measurement principle of these test stands with rotating shafts is that the aforementioned sensitive structures deform or displace around a precision shaft under the influence of weak forces / torques. By measuring the displacement, the magnitude of the force / torque can be determined. Depending on the force measurement range, the measurement accuracy can reach micro-Newton or even sub-micro-Newton levels within a small range.

[0004] The micro-thruster under test, fixed on the pendulum, needs to be connected to the controller via a working gas tube and multiple microwave, high-voltage, power, and signal wires to ensure its normal operation during testing. However, due to limitations in the assembly design near the shaft, assembly errors, material creep, and various external interference factors, the actual system differs significantly from the theoretical design. This leads to decreased time and temperature stability during testing and makes it susceptible to environmental fluctuations, thus limiting the accuracy of the measurements. Summary of the Invention

[0005] The purpose of this invention is to address the aforementioned deficiencies of existing rotary weak force test benches for thrust testing and calibration of micro-thrusters, and to provide an electrical connection structure for the test bench that reduces the coupling effect of the weak force testing environment.

[0006] The above-mentioned objectives of the present invention are achieved by the following technical means:

[0007] An electrical connection structure for a test bench that reduces coupling effects in weak force testing environments includes a frame, a frame fixing base plate component fixed on the frame, a rotating fixing base plate component disposed below the frame fixing base plate component, the frame fixing base plate component being connected to the rotating fixing base plate component via a pivot, a pendulum body fixed on the rotating fixing base plate component, and a test pusher fixed to the bottom end of the pendulum body.

[0008] The bottom ends of the upper conductor and the upper microwave conductor are both fixed to the frame fixing substrate component. The top ends of the lower conductor and the lower microwave conductor are both fixed to the rotating fixing substrate component. The bottom end of the upper conductor is connected to the top end of the corresponding lower conductor through a corresponding conductor extension and wire passing unit. The bottom end of the upper microwave conductor is connected to the top end of the corresponding lower microwave conductor through a corresponding microwave conductor extension and wire passing unit.

[0009] The bottom end of both the lower section of the conductor and the bottom end of the lower section of the microwave conductor are connected to the thruster under test.

[0010] A first working gas pipe section is also fixed on the frame fixing base plate component, and a second working gas pipe section is also fixed on the rotating fixing base plate component. The bottom end of the first working gas pipe section and the top end of the second working gas pipe section are connected by a flexible gas pipe. The top end of the first working gas pipe section is connected to the gas source through an upper gas pipe, and the bottom end of the second working gas pipe section is connected to the thruster under test through a lower gas pipe.

[0011] As mentioned above, the positions of the upper and lower conductors correspond one-to-one, and the positions of the upper and lower microwave conductors also correspond one-to-one.

[0012] As described above, the upper section conductor, the corresponding conductor extension and crossing unit, and the corresponding lower section conductor are integrated conductors; the upper section microwave conductor, the corresponding microwave conductor extension and crossing unit, and the corresponding lower section microwave conductor are integrated conductors.

[0013] As described above, the wire extension cable passing unit and the microwave wire extension cable passing unit are configured as U-shaped or V-shaped.

[0014] As described above, the lower section of the wire is fixed to the rotating fixed substrate component and extends to the pendulum body; the lower section of the microwave wire is fixed to the rotating fixed substrate component and extends to the pendulum body; and the lower section of the air tube is fixed to the rotating fixed substrate component and extends to the pendulum body.

[0015] As described above, the bottom end of the lower section of the conductor passes through the slots opened on the side wall of the pendulum body and enters the axial cavity inside the pendulum body, and then exits from the axial cavity to connect with the thruster under test; the bottom end of the lower section of the microwave conductor passes through the slots opened on the side wall of the pendulum body and enters the axial cavity inside the pendulum body, and then exits from the axial cavity to connect with the thruster under test; the bottom end of the lower section of the air tube passes through the slots opened on the side wall of the pendulum body and enters the axial cavity inside the pendulum body, and then exits from the axial cavity to connect with the thruster under test.

[0016] As described above, a first fixing base plate is provided on the frame fixing base plate component, and a second fixing base plate is provided on the rotating fixing base plate component.

[0017] The upper end of the rotating shaft component is pressed against the first fixed base plate by a corresponding first rotating shaft fixing cover plate, and the lower end of the rotating shaft component is pressed against the second fixed base plate by a corresponding second rotating shaft fixing cover plate.

[0018] The lower end of the upper conductor is pressed onto the first fixed base plate by a corresponding first conductor fixing cover plate, and the upper end of the upper conductor is pressed onto the second fixed base plate by a corresponding second conductor fixing cover plate.

[0019] The lower end of the upper microwave conductor is pressed onto the first fixed base plate by a corresponding first microwave conductor fixing cover plate, and the upper end of the lower microwave conductor is pressed onto the second fixed base plate by a corresponding second microwave conductor fixing cover plate.

[0020] The first working gas pipe is pressed onto the first fixed base plate by a corresponding first gas pipe fixing cover plate, and the second working gas pipe is pressed onto the second fixed base plate by a corresponding second gas pipe fixing cover plate.

[0021] As described above, the first fixed base plate is assembled from one or more sub-fixing plates. When the first fixed base plate is composed of multiple sub-fixing plates, the surfaces of each sub-fixing plate are on the same plane. The second fixed base plate is assembled from one or more fixed plates. When the second fixed base plate is composed of multiple sub-fixing plates, the surfaces of each sub-fixing plate are on the same plane.

[0022] As mentioned above, the pivot component is a fork spring, leaf spring, or wire.

[0023] Compared with the prior art, the present invention has the following advantages:

[0024] Compared to previous installation methods, this invention can further reduce the impact of signal and power cables, microwave cables, and air pipes on the rigidity and temperature coefficient of the test bench. It also facilitates the suppression of temperature effects on the rotating components, allowing for the use of multiple rotating components in parallel and individual testing of each component's temperature effect. The optimal assembly of rotating components further suppresses the temperature effect on the pendulum.

[0025] This invention enables existing thruster test benches to offset some of the effects of environmental coupling during testing. It improves the components of the test bench that are susceptible to environmental coupling effects from multiple aspects, making it more conducive to the test bench to truly and reliably test and record the measured weak forces, without requiring significant modifications to existing weak force test benches.

[0026] This invention has been verified in actual testing, achieving the connection of dozens of power supply wires, signal wires, microwave wires, high-voltage wires, and air pipes from the test platform frame to the pendulum body. These connection structures introduce minimal additional stiffness, offer good stability, and are low-cost and easy to operate. Furthermore, the aforementioned structures enable flexible combinations of rotating shafts with different stiffnesses and linear combinations of rotating shafts with different temperature polarities, thereby achieving measurements across multiple orders of magnitude with low temperature coupling coefficients. Attached Figure Description

[0027] Figure 1 This is a field diagram of a waterfall-style wiring method commonly used in existing technologies.

[0028] Figure 2 This is a schematic diagram of the connection structure of the present invention;

[0029] Figure 3 This is a schematic diagram of the overall structure of the present invention;

[0030] Figure 4 This is a schematic diagram illustrating how the pendulum moves along a line.

[0031] Figure labels and corresponding component names:

[0032] 1-Frame fixing substrate component; 101-First fixing base plate; 102-Second fixing base plate; 103-First rotating shaft fixing cover plate; 104-Second rotating shaft fixing cover plate; 105-First wire fixing cover plate; 106-Second wire fixing cover plate; 107-First microwave wire fixing cover plate; 108-Second microwave wire fixing cover plate; 109-First air tube fixing cover plate; 110-Second air tube fixing cover plate; 2-Rotating fixing substrate component; 301-Wire extension and guide unit; 302-Upper section wire; 303-Lower section wire; 401-Soft air tube; 4021-First working fluid air tube; 4022-Second working fluid air tube; 501-Microwave wire extension and guide unit; 502-Upper section microwave wire; 503-Lower section microwave wire; 6-Rotating shaft component; 7-Frame; 8-Swing body; 9-Tested thruster. Detailed Implementation

[0033] To facilitate understanding and implementation of the present invention by those skilled in the art, the present invention will be further described in detail below with reference to examples. The implementation examples described herein are only for illustration and explanation and are not intended to limit the present invention.

[0034] Example 1:

[0035] An electrical connection structure for a test bench that reduces coupling effects in a weak force testing environment includes a frame 7, which is mounted on the ground or other horizontal platform. A frame fixing base plate component 1 is fixed on the frame 7, and a rotating fixing base plate component 2 is disposed below the frame fixing base plate component 1. The frame fixing base plate component 1 is connected to the rotating fixing base plate component 2 via a pivot. In this embodiment, there are two pivots, located at both ends of the frame fixing base plate component 1. A pendulum 8 is fixed on the rotating fixing base plate component 2, and the bottom end of the pendulum 8 is used to fix the pusher 9 under test.

[0036] The bottom end of the upper section wire and the bottom end of the upper section microwave wire are both fixed on the frame fixing substrate component 1, and the top end of the lower section wire and the top end of the lower section microwave wire are both fixed on the rotating fixing substrate component 2.

[0037] As a preferred embodiment, the upper and lower conductors correspond one-to-one, with the top of the lower conductor located below the bottom of the corresponding upper conductor. Similarly, the upper and lower microwave conductors correspond one-to-one, with the top of the lower microwave conductor located below the bottom of the corresponding upper microwave conductor.

[0038] The bottom end of the upper section conductor is connected to the top end of the corresponding lower section conductor through the corresponding conductor extension and passing unit 301, and the bottom end of the upper microwave conductor is connected to the top end of the corresponding lower microwave conductor through the corresponding microwave conductor extension and passing unit 501.

[0039] As a preferred embodiment, the upper section conductor, the corresponding conductor extension and crossing unit 301, and the corresponding lower section conductor are integrated into a single conductor; the upper section microwave conductor, the corresponding microwave conductor extension and crossing unit 501, and the corresponding lower section microwave conductor are integrated into a single conductor.

[0040] The wire extension guide unit 301 and the microwave wire extension guide unit 501 are U-shaped or V-shaped, etc., and are used to increase the length of the connecting wire.

[0041] The bottom end of both the lower section of the conductor and the bottom end of the lower section of the microwave conductor are connected to the thruster 9 under test.

[0042] As a preferred embodiment, a first working gas pipe section 4021 is also fixed on the frame fixing base plate component 1, and a second working gas pipe section 4022 is also fixed on the rotating fixing base plate component 2. The bottom end of the first working gas pipe section 4021 and the top end of the second working gas pipe section 4022 are connected by a flexible gas pipe 401. The top end of the first working gas pipe section 4021 is connected to the gas source through an upper gas pipe, and the bottom end of the second working gas pipe section 4022 is connected to the tested thruster 9 through a lower gas pipe.

[0043] Compared to previous installation methods, the above installation method can further reduce the influence of wires (including power supply wires, signal wires, microwave wires, and high-voltage wires), microwave wires (upper microwave wire, lower microwave wire, and microwave wire extension cable unit) and air pipes on the stiffness and temperature coefficient of the pendulum. Simultaneously, to study the temperature effect of the rotating shafts, a method of parallel connection of multiple rotating shafts and individual testing of the temperature effect of each rotating shaft was adopted, and the optimal rotating shafts were assembled to suppress the temperature effect of the pendulum.

[0044] The wire extension and guide unit 301 and the microwave wire extension and guide unit 501 are bent into a U-shape to provide sufficient space for the displacement and deformation of the wires (including power supply wires, signal wires, microwave wires, and high-voltage wires) and the microwave wires (upper microwave wire, lower microwave wire, and microwave wire extension and guide unit). When the pendulum is in the measurement state, it will swing back and forth. This motion will exert a force on the wires and microwave wires, resulting in displacement and deformation. At the same time, ambient temperature fluctuations and temperature fluctuations of the energized wires and microwave wires themselves will also cause a certain degree of deformation of the wires and microwave wires. The displacement and deformation caused by these two situations can be partially dissipated through the reserved space, thereby reducing the impact of the above displacement and deformation on the pendulum's motion and thus reducing the impact of the wires on the overall stiffness of the test platform.

[0045] In this invention, the conductive wires and microwave conductive wires adopt a distributed, U-shaped wiring design, comprising at least 10 wires per group and at least 2 groups of wires. The conductive wires are separated from each other between the frame fixing substrate component 1 and the rotating fixing substrate component 2, and do not contact each other; the wiring between the frame and the pendulum body uses a U-shaped deformable arrangement (conductive wire extension wiring unit 301 and microwave conductive wire extension wiring unit 501). This reduces the deformation of the pendulum body when subjected to external influences, thereby reducing the impact of the conductive wire stiffness on the overall test stage.

[0046] In this invention, the connection of the air pipes is handled by fixing the first working gas pipe 4021 and the second working gas pipe 4022 on the frame fixing base plate component 1 and the rotating fixing base plate component 2, and using a flexible air pipe 401 to connect the first working gas pipe 4021 and the second working gas pipe 4022 in between. Through the transition of the flexible air pipe 401, the air supply requirements of the tested thruster 9 are met while reducing the impact of the air pipes on the overall rigidity of the test platform, thus improving stability. The first working gas pipe 4021 and the second working gas pipe 4022 are copper or aluminum pipes, and the flexible air pipe 401 is a PVC pipe.

[0047] In this invention, the rotating shaft is installed between the frame fixing base plate component 1 and the rotation fixing base plate component 2 via a detachable first rotating shaft fixing cover plate 103 and a second rotating shaft fixing cover plate 104. This allows for the convenient addition or removal of rotating shaft components with different stiffnesses, enabling quick replacement of rotating shaft components and alteration of the overall test bench stiffness and measurement range.

[0048] In this invention, the rotating shaft is installed between the frame fixing base plate component 1 and the rotating fixing base plate component 2 via a detachable first rotating shaft fixing cover plate 103 and a second rotating shaft fixing cover plate 104. This allows for convenient testing of the temperature effect of each rotating shaft by using parallel testing of multiple rotating shafts or individual testing. Furthermore, by combining rotating shafts with temperature effects of different polarities, the overall test bench achieves a comprehensive low temperature coupling coefficient.

[0049] Suppose there are N types of rotating components, with two components of each type. The two rotating components of each type are symmetrically arranged on the frame fixing base plate component 1 and symmetrically arranged on the rotation fixing base plate component 2. The temperature coefficient of the i-th (i = 2, 3, 4, 5, ..., N) type of rotating component can be defined as T. i Therefore, through the above performance tests, a combination can be obtained that yields the following results:

[0050]

[0051] At this point, it can be assumed that the k-type rotating shaft component makes the temperature effect of the test bench approach zero. Different rotating shaft components have different stiffnesses; by changing the combination of rotating shaft components, the stiffness coefficient of the test bench can be adjusted, and the measurement range of the test bench will also change, thus achieving a measurement range conversion from the millinewton level to the submicronewton level. Based on this design, the test bench can achieve measurements across multiple orders of magnitude with low temperature coupling coefficients.

[0052] Preferably, the lower section of the wire is fixed on the rotating fixed substrate component 2 and the swing body 8, the lower section of the microwave wire is fixed on the rotating fixed substrate component 2 and the swing body 8, and the lower section of the air tube is fixed on the rotating fixed substrate component 2 and the swing body 8.

[0053] As a preferred embodiment, the bottom end of the lower section of the conductor passes through the slots opened on the side wall of the pendulum body 8 and enters the axial cavity inside the pendulum body 8, and then exits from the axial cavity to connect with the thruster 9 under test; the bottom end of the lower section of the microwave conductor passes through the slots opened on the side wall of the pendulum body 8 and enters the axial cavity inside the pendulum body 8, and then exits from the axial cavity to connect with the thruster 9 under test; the bottom end of the lower section of the air tube passes through the slots opened on the side wall of the pendulum body 8 and enters the axial cavity inside the pendulum body 8, and then exits from the axial cavity to connect with the thruster 9 under test.

[0054] like Figure 4 The lower section of the conductor, the lower section of the microwave conductor, and the lower section of the air tube are fixed by the second conductor fixing cover plate 106, the second microwave conductor fixing cover plate 108, and the second air tube fixing cover plate 110, respectively, and then converge at the pendulum body 8. The wires inside the pendulum body 8 will be fixed in the axial wire cavity inside the pendulum body 8, so as to avoid the introduction of measurement error caused by the movement of the pendulum body 8 during the test due to the floating of the unfixed wires inside.

[0055] In this embodiment, a first fixing base plate 101 is provided on the frame fixing base plate component 1 by fixing screws, and a second fixing base plate 102 is provided on the rotating fixing base plate component 2 by fixing screws.

[0056] The upper end of the pivot component is pressed onto the first fixed base plate 101 by a corresponding first pivot fixing cover plate 103. The first pivot fixing cover plate 103 and the first fixed base plate 101 are fixed together by fixing screws. The lower end of the pivot component is pressed onto the second fixed base plate 102 by a corresponding second pivot fixing cover plate 104. The second pivot fixing cover plate 104 and the second fixed base plate 102 are fixed together by fixing screws. The pivot component is a hinged component such as a fork spring, leaf spring, or wire hinge.

[0057] The lower end of the upper conductor is pressed onto the first fixed base plate 101 by the corresponding first conductor fixing cover plate 105. The first conductor fixing cover plate 105 and the first fixed base plate 101 are fixed together by fixing screws. The upper end of the upper conductor is pressed onto the second fixed base plate 102 by the corresponding second conductor fixing cover plate 106. The second conductor fixing cover plate 106 and the second fixed base plate 102 are fixed together by fixing screws.

[0058] The lower end of the upper microwave conductor is pressed onto the first fixed base plate 101 by the corresponding first microwave conductor fixing cover plate 107. The first microwave conductor fixing cover plate 107 and the first fixed base plate 101 are fixed together by fixing screws. The upper end of the lower microwave conductor is pressed onto the second fixed base plate 102 by the corresponding second microwave conductor fixing cover plate 108. The second microwave conductor fixing cover plate 108 and the second fixed base plate 102 are fixed together by fixing screws.

[0059] The first working fluid tube 4021 is pressed onto the first fixed base plate 101 by a corresponding first tube fixing cover plate 109. The first tube fixing cover plate 109 and the first fixed base plate 101 are fixed together by fixing screws. The second working fluid tube 4022 is pressed onto the second fixed base plate 102 by a corresponding second tube fixing cover plate 110. The second tube fixing cover plate 110 and the second fixed base plate 102 are fixed together by fixing screws.

[0060] The first working gas pipe 4021 and the second working gas pipe 4022 are connected by a flexible gas pipe 401. When the pendulum 8 swings, the flexible gas pipe 401 will reduce the influence of motion and temperature through its own deformation. Similar to the aforementioned wire, this design will reduce the influence of the gas pipe on the rigidity of the test platform.

[0061] The wire extension and guide unit 301 and the microwave wire extension and guide unit can reduce their impact on the overall rigidity of the test bench by increasing the wire length and single wire arrangement. At the same time, increasing the wire length can greatly reduce the impact of the temperature effect of the connecting wire on the test bench.

[0062] The present invention is applicable to all micro-thrust test stands that use physical or virtual rotating shafts, such as balance type and vertical rotating shaft torsion type test stands. Therefore, the mounting surface of the assembly structure is not limited to the vertical or horizontal direction.

[0063] It should be noted that the specific embodiments described in this invention are merely illustrative of the spirit of the invention. Those skilled in the art to which this invention pertains can make various modifications or additions to the described specific embodiments or use similar methods to substitute them, without departing from the spirit of the invention or exceeding the scope defined by the appended claims.

Claims

1. An electrical connection structure for a test bench to reduce coupling effects in a weak force testing environment, comprising a frame (7), characterized in that, A frame fixing base plate component (1) is fixed on the frame (7), and a rotating fixing base plate component (2) is set below the frame fixing base plate component (1). The frame fixing base plate component (1) is connected to the rotating fixing base plate component (2) through a rotating shaft. A pendulum (8) is fixed on the rotating fixing base plate component (2), and the bottom end of the pendulum (8) is fixed to the pusher under test (9). The bottom ends of the upper section wire and the upper section microwave wire are both fixed on the frame fixing substrate component (1), and the top ends of the lower section wire and the lower section microwave wire are both fixed on the rotating fixing substrate component (2). The bottom end of the upper section wire is connected to the top end of the corresponding lower section wire through the corresponding wire extension and passing unit (301), and the bottom end of the upper section microwave wire is connected to the top end of the corresponding lower section microwave wire through the corresponding microwave wire extension and passing unit (501). The bottom end of the lower section of the conductor and the bottom end of the lower section of the microwave conductor are both connected to the thruster under test (9). A first working gas pipe section (4021) is also fixed on the frame fixing base plate component (1), and a second working gas pipe section (4022) is also fixed on the rotating fixing base plate component (2). The bottom end of the first working gas pipe section (4021) and the top end of the second working gas pipe section (4022) are connected by a flexible gas pipe (401). The top end of the first working gas pipe section (4021) is connected to the gas source through the upper section gas pipe, and the bottom end of the second working gas pipe section (4022) is connected to the tested thruster (9) through the lower section gas pipe. The wire extension and guide unit (301) and the microwave wire extension and guide unit (501) are configured as U-shaped or V-shaped. The lower section of the wire is fixed to the rotating fixed substrate component (2) and extends to the pendulum body (8), the lower section of the microwave wire is fixed to the rotating fixed substrate component (2) and extends to the pendulum body (8), and the lower section of the air tube is fixed to the rotating fixed substrate component (2) and extends to the pendulum body (8). The bottom end of the lower section of the conductor passes through the slots opened on the side wall of the pendulum (8) and enters the axial cavity inside the pendulum (8), and then exits from the axial cavity to connect with the thruster (9) under test; the bottom end of the lower section of the microwave conductor passes through the slots opened on the side wall of the pendulum (8) and enters the axial cavity inside the pendulum (8), and then exits from the axial cavity to connect with the thruster (9) under test; the bottom end of the lower section of the air tube passes through the slots opened on the side wall of the pendulum (8) and enters the axial cavity inside the pendulum (8), and then exits from the axial cavity to connect with the thruster (9) under test.

2. The electrical connection structure of the test bench for reducing coupling effects in weak force testing environments according to claim 1, characterized in that, The positions of the upper and lower conductors are in one-to-one correspondence, as are the positions of the upper and lower microwave conductors.

3. The electrical connection structure of the test bench for reducing coupling effects in weak force testing environments according to claim 2, characterized in that, The upper section conductor, the corresponding conductor extension and passing unit (301), and the corresponding lower section conductor are integrated conductors; the upper section microwave conductor, the corresponding microwave conductor extension and passing unit (501), and the corresponding lower section microwave conductor are integrated conductors.

4. The electrical connection structure of the test bench for reducing coupling effects in weak force testing environments according to claim 1, characterized in that, The frame fixing base plate component (1) is provided with a first fixing base plate (101), and the rotating fixing base plate component (2) is provided with a second fixing base plate (102). The upper end of the rotating shaft is pressed onto the first fixed base plate (101) by the corresponding first rotating shaft fixing cover plate (103), and the lower end of the rotating shaft is pressed onto the second fixed base plate (102) by the corresponding second rotating shaft fixing cover plate (104). The lower end of the upper conductor is pressed onto the first fixed base plate (101) by the corresponding first conductor fixing cover plate (105), and the upper end of the upper conductor is pressed onto the second fixed base plate (102) by the corresponding second conductor fixing cover plate (106). The lower end of the upper microwave conductor is pressed onto the first fixed base plate (101) by the corresponding first microwave conductor fixing cover plate (107), and the upper end of the lower microwave conductor is pressed onto the second fixed base plate (102) by the corresponding second microwave conductor fixing cover plate (108). The first working gas pipe section (4021) is pressed onto the first fixed base plate (101) by the corresponding first gas pipe fixing cover plate (109), and the second working gas pipe section (4022) is pressed onto the second fixed base plate (102) by the corresponding second gas pipe fixing cover plate (110).

5. The electrical connection structure of the test bench for reducing coupling effects in weak force testing environments according to claim 4, characterized in that, The first fixed base plate (101) is assembled from one or more sub-fixed plates. When the first fixed base plate (101) is composed of multiple sub-fixed plates, the surfaces of each sub-fixed plate are on the same plane. The second fixed base plate (102) is assembled from one or more sub-fixed plates. When the second fixed base plate (102) is composed of multiple sub-fixed plates, the surfaces of each sub-fixed plate are on the same plane.

6. The electrical connection structure of the test bench for reducing coupling effects in weak force testing environments according to claim 1, characterized in that, The rotating shaft is a fork spring, leaf spring, or wire.

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