Method for optimizing fluid and related parameters in a fluid circuit system and related device

Abstract

The application discloses an optimization method for controlling fluid and related parameters in a liquid path system and related equipment, and the method comprises the following steps: making the fluid enter into a second flow channel through a first flow channel at a specified flow rate, so that the size change of the deformation degree of a target chip in any direction does not exceed the preset ratio of the size before deformation when the fluid enters into the target chip, and the determination of the specified flow rate is related to the deformation degree of the target chip at a preset level and the flow cross-sectional size of the first flow channel. According to the relationship among the fluid flow rate, the deformation degree of the chip and the flow cross-sectional size of the channel, the specified flow rate of the fluid is obtained, the liquid path system is made to pass the fluid into the chip at the specified flow rate, the deformation of the chip is at a preset level, the deformation or excessive deformation of the chip is avoided as far as possible, the chip surface is ensured to be as flat as possible, the internal liquid of the chip is ensured to be smooth and uniform, the influence of the chip deformation on the sequencing process is reduced, and the accuracy and effectiveness of the sequencing result are improved.

Description

Technical Field

[0001] This application relates to the technical field of fluid circuit systems, and in particular to an optimization method and related equipment for controlling fluids and related parameters in a fluid circuit system. Background Technology

[0002] As the pump fluid is injected into the chip, the chip may deform. If the chip deformation is too large during sequencing, it can cause the following problems:

[0003] Severe chip deformation can cause the upper and lower glass surfaces of the chip to adhere together, leading to highly uneven flow fields within the chip, creating fluid dead zones, and resulting in inconsistent chemical reaction efficiencies across the chip surface. Since sequencing requires multiple biochemical cycles, excessive chip deformation during each liquid extraction can severely weaken the bond strength between the upper and lower glass surfaces, causing chip bonding failure, crosstalk, or breakage. Chip surface flatness is crucial for optical image acquisition; excessive chip deformation can cause surface flatness issues. Therefore, reducing chip deformation is an urgent problem to be solved. Summary of the Invention

[0004] The main objective of this application is to provide a method and related equipment for optimizing the fluid and related parameters in a liquid circuit system, which can solve the technical problem of chip deformation caused by excessive pressure difference between the inside and outside of the chip in the prior art.

[0005] To achieve the above objectives, a first aspect of this application provides a method for controlling fluid in a liquid circuit system. The liquid circuit system is connected to a target chip. The liquid circuit system includes a first flow channel, and the target chip has a second flow channel. The first flow channel and the second flow channel are connected and have different flow cross-sections. The method includes:

[0006] The fluid is introduced into the second channel through the first channel at a specified flow rate, so that the deformation of the target chip is at a preset level when the fluid enters the target chip. The preset level of deformation of the target chip includes ensuring that the dimensional change of the target chip in any direction of the flow cross section of the second channel does not exceed a preset ratio of the dimensional change before deformation. The specified flow rate is determined in relation to the deformation of the target chip at the preset level and the size of the flow cross section of the first channel.

[0007] To achieve the above objectives, a second aspect of this application provides a method for optimizing relevant parameters of a liquid circuit system, wherein the target chip to be used in the liquid circuit system is known, and the method includes:

[0008] Obtain the negative pressure threshold or internal and external pressure difference threshold that the target chip can withstand, wherein the degree of deformation of the target chip is within a preset level within the negative pressure threshold or internal and external pressure difference threshold.

[0009] Determine the parameters that affect the negative pressure inside the target chip or the pressure difference between the inside and outside, the actual constraints of the parameters, and the relationship between the parameters and the voltage drop;

[0010] Based on the negative pressure threshold or the internal and external pressure difference threshold, the actual constraints and relationships of the parameters, the selectable values ​​of the target parameters are calculated.

[0011] The target parameters of the hydraulic system to be designed are adjusted based on the selectable values.

[0012] To achieve the above objectives, a third aspect of this application provides an apparatus for controlling fluid in a liquid circuit system. The liquid circuit system is connected to a target chip. The liquid circuit system includes a first flow channel, and the target chip has a second flow channel. The first flow channel and the second flow channel are connected and have different flow cross-sections. The apparatus includes:

[0013] A fluid control module is used to allow fluid to enter a second channel through a first channel at a specified flow rate, so that the deformation of the target chip is at a preset level when the fluid enters the target chip. The preset level of deformation of the target chip includes ensuring that the dimensional change of the target chip in any direction of the flow cross section of the second channel does not exceed a preset ratio of the dimensional change before deformation. The specified flow rate is determined in relation to the deformation of the target chip at the preset level and the size of the flow cross section of the first channel.

[0014] To achieve the above objectives, a fourth aspect of this application provides an apparatus for optimizing parameters of a liquid circuit system, wherein the target chip to be used in the liquid circuit system is known, and the apparatus includes:

[0015] The negative pressure threshold or internal and external pressure difference threshold acquisition module is used to acquire the negative pressure threshold or internal and external pressure difference threshold that the target chip can withstand, wherein the degree of deformation of the target chip is within a preset level within the negative pressure threshold or internal and external pressure difference threshold.

[0016] The relevant data acquisition module is used to determine the parameters that affect the negative pressure inside the target chip or the pressure difference between the inside and outside, the actual constraints of the parameters, and the relationship between the parameters and the pressure drop.

[0017] The solution module is used to solve for the selectable values ​​of the target parameters based on the negative pressure threshold or the internal and external pressure difference threshold, the actual constraints of the parameters, and the relationship between them.

[0018] The parameter adjustment module is used to adjust the target parameters of the hydraulic system to be designed according to the selectable values.

[0019] To achieve the above objectives, a fifth aspect of this application provides a computer-readable storage medium storing a computer program, which, when executed by a processor, causes the processor to perform the following steps:

[0020] The fluid is introduced into the second channel through the first channel at a specified flow rate, so that the deformation of the target chip is at a preset level when the fluid enters the target chip. The deformation of the target chip is at the preset level, which includes ensuring that the dimensional change of the target chip in any direction of the flow cross section of the second channel does not exceed a preset ratio of the dimensional change before deformation. The specified flow rate is determined in relation to the deformation of the target chip at the preset level and the size of the flow cross section of the first channel.

[0021] The liquid circuit system is connected to the target chip. The liquid circuit system includes a first flow channel, and the target chip has a second flow channel. The first flow channel and the second flow channel are connected and have different flow cross-sections.

[0022] or,

[0023] This causes the processor to perform the following steps:

[0024] Obtain the negative pressure threshold or internal and external pressure difference threshold that the target chip can withstand, wherein the degree of deformation of the target chip is within a preset level within the negative pressure threshold or internal and external pressure difference threshold.

[0025] Determine the parameters that affect the negative pressure inside the target chip or the pressure difference between the inside and outside, the actual constraints of the parameters, and the relationship between the parameters and the voltage drop;

[0026] Based on the negative pressure threshold or the internal and external pressure difference threshold, the actual constraints and relationships of the parameters, the selectable values ​​of the target parameters are calculated.

[0027] The target parameters of the hydraulic system to be designed are adjusted based on the selectable values.

[0028] To achieve the above objectives, a sixth aspect of this application provides a computer device, including a memory and a processor. The memory stores a computer program, and when the computer program is executed by the processor, the processor performs the following steps:

[0029] The fluid is introduced into the second channel through the first channel at a specified flow rate, so that the deformation of the target chip is at a preset level when the fluid enters the target chip. The deformation of the target chip is at the preset level, which includes ensuring that the dimensional change of the target chip in any direction of the flow cross section of the second channel does not exceed a preset ratio of the dimensional change before deformation. The specified flow rate is determined in relation to the deformation of the target chip at the preset level and the size of the flow cross section of the first channel.

[0030] The liquid circuit system is connected to the target chip. The liquid circuit system includes a first flow channel, and the target chip has a second flow channel. The first flow channel and the second flow channel are connected and have different flow cross-sections.

[0031] or,

[0032] This causes the processor to perform the following steps:

[0033] Obtain the negative pressure threshold or internal and external pressure difference threshold that the target chip can withstand, wherein the degree of deformation of the target chip is within a preset level within the negative pressure threshold or internal and external pressure difference threshold.

[0034] Determine the parameters that affect the negative pressure inside the target chip or the pressure difference between the inside and outside, the actual constraints of the parameters, and the relationship between the parameters and the voltage drop;

[0035] Based on the negative pressure threshold or the internal and external pressure difference threshold, the actual constraints and relationships of the parameters, the selectable values ​​of the target parameters are calculated.

[0036] The target parameters of the hydraulic system to be designed are adjusted based on the selectable values.

[0037] The embodiments of this application have the following beneficial effects:

[0038] This application obtains a specified fluid flow rate based on the relationship between fluid flow rate, chip deformation degree, and channel flow cross-section. This allows the fluid system to supply fluid to the chip at the specified flow rate, keeping the chip deformation at a preset level. This minimizes chip deformation or excessive deformation, ensures a smooth chip surface, and makes the internal liquid flow smoothly and uniformly. This reduces the impact of chip deformation on sequencing and other biochemical experiments, improving the accuracy and validity of biochemical results.

[0039] This application obtains the chip height variation under different negative pressures or internal / external pressure differences through testing, explores the relationship between chip height and negative pressure or internal / external pressure difference, and then calculates the negative pressure threshold or internal / external pressure difference threshold that the chip can withstand. Based on the obtained negative pressure threshold or internal / external pressure difference threshold, the negative pressure or internal / external pressure difference provided by similar chips can be clearly limited and constrained in actual sequencing processes, so as to avoid chip deformation or excessive deformation as much as possible, ensure that the chip surface is as flat as possible, so that the liquid inside the chip flows smoothly and uniformly, reduce the impact of chip deformation on the sequencing process, and improve the accuracy and effectiveness of sequencing results. Attached Figure Description

[0040] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0041] in:

[0042] Figure 1This is a schematic diagram of the chip structure in an embodiment of this application;

[0043] Figure 2 This is a flowchart of a method for controlling fluid in a liquid circuit system according to an embodiment of this application;

[0044] Figure 3 This is a schematic diagram of the fitting results in the embodiments of this application;

[0045] Figure 4 This is a flowchart of the optimization method for relevant parameters of the hydraulic system in the embodiments of this application;

[0046] Figure 5 This is a structural block diagram of a device for controlling fluid in a liquid circuit system according to an embodiment of this application;

[0047] Figure 6 This is a structural block diagram of the device for optimizing relevant parameters of the liquid circuit system in the embodiments of this application;

[0048] Figure 7 This is a structural block diagram of the computer device in the embodiments of this application. Detailed Implementation

[0049] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0050] like Figure 2 As shown, in one embodiment, a method for controlling fluid in a fluid circuit system is provided. This embodiment is illustrated using an application to a terminal as an example. The method for controlling fluid in the fluid circuit system specifically includes the following steps:

[0051] S110: Fluid is introduced into the second channel through the first channel at a specified flow rate, so that the deformation of the target chip is at a preset level when the fluid enters the target chip. The preset level of deformation of the target chip includes ensuring that the dimensional change of the target chip in any direction of the flow cross section of the second channel does not exceed a preset ratio of the dimensional change before deformation. The specified flow rate is determined in relation to the deformation of the target chip at the preset level and the size of the flow cross section of the first channel. The fluid system is connected to the target chip and includes the first channel. The target chip is provided with a second channel. The first channel and the second channel are connected. The first channel and the second channel have different sizes of flow cross sections.

[0052] Specifically, the liquid path system is connected to the inlet of the target chip, and the outlet of the target chip is connected to a power unit. The power unit provides negative pressure for the flow of fluid in the liquid path system and the target chip. The liquid path system includes a first flow channel, and the target chip includes at least one second flow channel, with the first and second flow channels having different cross-sectional areas. Figure 1 As shown, the target chip can be a three-layer structure. For example, target chip 200 may include a first layer 205, a second layer 206, and an adhesive layer 207. The adhesive layer 207 is disposed between the first layer 205 and the second layer 206, and the first layer 205 and the second layer 206 are bonded together by the adhesive layer 207. The material of the first layer 205 and the second layer 206 can be glass. Multiple second flow channels 201 and 202 on the target chip 200 can be disposed at intervals on the adhesive layer 207.

[0053] During operation, the power unit provides negative pressure, allowing fluid to flow from the first channel to the second channel through the fluid circuit system. As the fluid flows from the first channel to the second channel, the negative pressure within the first channel decreases in the direction of fluid flow due to factors such as the length of the first channel and the fluid velocity, resulting in a pressure drop. When the fluid reaches the second channel, if the negative pressure at the inlet is too low, the pressure difference between the negative pressure within the second channel and the atmospheric pressure of the external environment will be too large, causing deformation of the target chip. This "pressure drop" can be simply understood as the pressure difference before and after the fluid flows.

[0054] Therefore, to prevent excessive deformation of the target chip, given a fixed fluid system, this embodiment pre-specifies the fluid flow rate, ensuring that the deformation of the target chip is within a preset level when fluid is introduced. The preset level means that the deformation does not exceed the maximum permissible deformation.

[0055] The target chip is three-dimensional, and the degree of deformation of the target chip is kept within a preset level. Specifically, the dimensional changes of the target chip in all directions do not exceed a preset ratio of the corresponding size before deformation. The preset ratio is a value less than 1, such as one-eighth or one-tenth, etc., and is not limited to this.

[0056] This embodiment obtains a specified fluid flow rate based on the relationship between fluid flow rate, target chip deformation degree, and channel flow cross-section. The fluid system then introduces fluid into the target chip at the specified flow rate, keeping the target chip deformation at a preset level. This minimizes the risk of deformation or excessive deformation of the target chip, ensures a smooth surface, and allows for smooth and uniform liquid flow inside the target chip. This reduces the impact of target chip deformation on sequencing and other biochemical experiments, thereby improving the accuracy and effectiveness of biochemical results.

[0057] In one embodiment, the specified flow rate is determined by the following method:

[0058] Obtain the negative pressure threshold or internal and external pressure difference threshold that the target chip can withstand, wherein the deformation degree of the target chip is within a preset level within the negative pressure threshold or internal and external pressure difference threshold.

[0059] Obtain the parameters that affect the negative pressure inside the target chip or the pressure difference between the inside and outside, the actual constraints of the parameters in the liquid circuit system, and the relationship between the parameters and the pressure drop. The parameters include the viscosity coefficient and flow rate of the fluid to be used, the length of the first flow channel, and the size of the flow cross section.

[0060] Based on the negative pressure threshold or the internal and external pressure difference threshold, the actual constraints and relationships of the parameters, the selectable values ​​of the target parameters are calculated, where the target parameters include the fluid velocity.

[0061] The specified flow rate of the fluid to be introduced into the target chip is determined based on the selectable values ​​of the target parameters.

[0062] Specifically, since the pressure inside the target chip is lower than the atmospheric pressure of the external environment, the pressure inside the target chip is called negative pressure. Changes in the negative pressure inside the target chip will cause changes in the pressure difference between the inside and outside of the chip. Thus, the negative pressure threshold or the pressure difference threshold between the inside and outside of the target chip can be obtained when the degree of deformation is within a preset level.

[0063] The parameters affecting the negative pressure or pressure difference between the inside and outside of the target chip include fluid-related parameters and parameters of the fluid circuit system. In a known fluid circuit system, the relevant parameters are known, meaning the constraints on some parameters are known. Based on the relationship between parameters and pressure drop, and the known constraints, the range of values ​​for the changeable fluid-related parameters can be calculated.

[0064] Relevant parameters of a fluid include its flow rate and viscosity coefficient. If the viscosity coefficient is known, the range of possible flow rates can be accurately calculated. If the viscosity coefficient is unknown, the ranges of possible flow rates and viscosity coefficients can be calculated. Therefore, the target parameters include the flow rate, or the target parameters include both the flow rate and viscosity coefficient.

[0065] Once the range of values ​​for the flow rate of the fluid to be used is determined, a value can be selected from that range as the specified flow rate when the fluid is introduced.

[0066] This embodiment calculates the fluid parameters of the fluid to be used in a known liquid system based on the negative pressure threshold or internal / external pressure difference threshold corresponding to the target chip's deformation level, the parameters affecting the negative pressure or internal / external pressure difference within the target chip, the actual constraints of these parameters, and the relationship between pressure drop and parameters. This allows for the determination of the specified flow rate of the fluid to be used. This embodiment fully considers the actual constraints of various parameters affecting the negative pressure or internal / external pressure difference within the target chip, accurately calculating the range of fluid flow rates. This avoids blindly introducing fluid, which could cause significant deformation of the target chip. It ensures the target chip surface remains as flat as possible, resulting in smooth and uniform liquid flow inside the target chip. This reduces the impact of target chip deformation on sequencing and other biochemical experiments, improving the accuracy and effectiveness of biochemical results.

[0067] In one embodiment, obtaining the negative pressure threshold or internal / external pressure difference threshold that the target chip can withstand includes:

[0068] Obtain the deformation parameter values ​​of the test chip in the target direction under different negative pressures or internal and external pressure differences;

[0069] The deformation parameter values ​​and the corresponding negative pressure values ​​or the difference between internal and external pressure are used as the data to be fitted to obtain the fitting results.

[0070] Based on the fitting results and the deformation parameter threshold of the test chip in the target direction under the preset deformation level, the negative pressure threshold or internal and external pressure difference threshold that the test chip can withstand in the target direction is determined, and the negative pressure threshold or internal and external pressure difference threshold of the test chip is used as the negative pressure threshold or internal and external pressure difference threshold that the target chip can withstand.

[0071] Specifically, the test chip and the target chip are of the same type or from the same batch. The "internal and external pressure difference" refers to the difference between the negative pressure inside the test chip and the atmospheric pressure of the external environment.

[0072] Chip deformation is mainly caused by the pressure difference between the inside and outside of the chip during negative pressure liquid extraction. Therefore, it is necessary to explore the physical relationship between negative pressure / internal and external pressure difference and chip deformation under a specific chip structure, and finally give the negative pressure threshold or internal and external pressure difference threshold that the chip can withstand.

[0073] This embodiment acquires the deformation parameter values ​​of the same test chip when different negative pressures are applied to it successively. The deformation parameter values ​​are either the deformation amount or the actual height of the chip.

[0074] The test chip may deform to different degrees under different negative pressures. The deformation will cause the actual height of the test chip to change, that is, the deformation amount.

[0075] Since negative pressure is typically a gas pressure lower than normal pressure (i.e., one standard atmosphere), the internal pressure of the test chip is lower than the external pressure under negative pressure, creating a pressure difference. Therefore, under negative pressure, the test chip may indent inwards, resulting in a decrease in its actual height.

[0076] The varying negative pressure applied to the test chip each time results in different pressure differences between its internal and external surfaces. The actual height of the test chip is measured under different negative pressures or pressure differences, or the change in height is statistically analyzed. This generates multiple sets of data to be fitted. Each set includes either the actual height of the test chip and its corresponding negative pressure or pressure difference, or the deformation of the test chip and its corresponding negative pressure or pressure difference.

[0077] Data fitting, also known as curve fitting, is used to substitute existing data into a numerical expression using mathematical methods, thus obtaining a continuous function (i.e., a curve). Through data fitting, an effective empirical functional relationship between the dependent and independent variables can be established based on experimental data, providing clues for further in-depth research.

[0078] In this embodiment, the negative pressure value or the internal and external pressure difference is used as the independent variable, and the deformation parameter value is used as the dependent variable, so as to obtain the relationship between the negative pressure value or the internal and external pressure difference of the test chip and the change of the deformation parameter value caused by the chip deformation.

[0079] In one embodiment, the deformation parameter value is one of the deformation amount or the actual height of the chip.

[0080] In one embodiment, the deformation parameter threshold is one of the deformation amount threshold under deformation and the chip actual height threshold under deformation.

[0081] The deformation threshold specifically refers to the deformation of the chip under the maximum permissible deformation, that is, the difference between the actual height of the chip under the maximum permissible deformation and the original height of the chip under normal, undeformed conditions. For example, fluid performance indicators require that the chip height deformation under the maximum permissible deformation be less than or equal to 10µm during negative pressure pumping. The actual chip height threshold specifically refers to the actual height of the chip under the maximum permissible deformation.

[0082] The smaller the negative pressure value inside the chip, the greater the pressure difference between the inside and outside of the chip, the more obvious the deformation, and the smaller the actual height of the chip, meaning the greater the chip height deformation. Based on this principle, the negative pressure threshold or the internal and external pressure difference threshold that the test chip can withstand can be obtained by using the deformation parameter threshold and fitting results under the maximum allowable deformation of the test chip.

[0083] Based on the obtained negative pressure threshold or internal and external pressure difference threshold, the negative pressure or internal and external pressure difference provided by similar chips can be clearly defined and constrained during the actual sequencing process. This can minimize chip deformation or excessive deformation, ensure a flat chip surface, and allow for smooth and uniform flow of liquid inside the chip. This reduces the impact of chip deformation on the sequencing process and improves the accuracy and effectiveness of sequencing results.

[0084] In one embodiment, the fitting result is a linear fitting function characterizing the linear relationship between the actual height of the chip and the negative pressure or the difference between internal and external pressure, or; the fitting result is a linear fitting function characterizing the linear relationship between the deformation and the negative pressure or the difference between internal and external pressure.

[0085] Based on the fitting results and the deformation parameter threshold in the target direction of the test chip under a preset deformation level, determine the negative pressure threshold or internal / external pressure difference threshold that the test chip can withstand in the target direction, including:

[0086] Determine the slope of the linear fitting function;

[0087] The deformation threshold is determined based on the deformation parameter threshold in the target direction under a preset level of deformation of the test chip.

[0088] The negative pressure threshold or the internal and external pressure difference threshold that the test chip can withstand in the target direction is obtained by the ratio of the deformation threshold to the absolute value of the slope.

[0089] Specifically, the deformation of the test chip is the height difference or change in height before and after the test. Under normal circumstances, as the pressure difference between the inside and outside of the chip increases, the actual height of the chip decreases, and the chip deformation increases.

[0090] refer to Figure 3 , Figure 3 This diagram illustrates the fitting result between the actual deformation of the test chip and the internal and external pressure difference of the test chip. The unit for chip deformation is μm, and the unit for internal and external pressure difference is kPa. Within the internal and external pressure difference range of -5 kPa to -50 kPa, the actual deformation of the test chip increases as the internal and external pressure difference decreases, i.e., the deformation increases from 0 to 30 μm. The fitting result is almost equivalent to a linear function.

[0091] Similarly, if the fitting result is a linear fitting function that characterizes the linear relationship between the actual height of the chip and the pressure difference between the inside and outside, then the actual height of the chip will become smaller and smaller as the pressure difference between the inside and outside decreases.

[0092] Although the linear functions of the two fitting results are different, the internal and external pressure difference threshold can be calculated by the ratio of the absolute value of the height deformation (deformation threshold) of the test chip under the maximum allowable deformation to the slope of the linear function.

[0093] If the deformation parameter threshold is the actual height threshold of the test chip under the maximum allowable deformation, then the deformation threshold is obtained based on the difference between the original height value of the test chip under normal no negative pressure and the actual height threshold under the maximum allowable deformation.

[0094] Among them, the negative pressure threshold that the liquid circuit system can provide to the chip during the sequencing process can be obtained based on the internal and external pressure difference threshold.

[0095] For example, Figure 3 For a certain chip, the linear fitting function is y = -0.572x - 0.1242. The slope of this fitted line is -0.572 μm / kPa, meaning that when the pressure difference between the inside and outside of the chip's inlet increases by 1 kPa, the chip's deformation increases by 0.572 μm. If the maximum allowable deformation of this chip is 10 μm, then the threshold pressure difference that similar chips can withstand is 10 / 0.572 = 17.5 kPa. Based on this threshold, the negative pressure threshold can be calculated. For example, when the external atmospheric pressure is one standard atmosphere (101.325 kPa), the negative pressure threshold is 101.325 kPa - 17.5 kPa = 83.825 kPa.

[0096] In one embodiment, the deformation parameter value is the actual height of the chip;

[0097] Obtain the deformation parameter values ​​of the test chip in the target direction under different negative pressures or internal and external pressure differences, including:

[0098] The negative pressure or the pressure difference between the inside and outside of the test chip is obtained through a pressure sensor in each round of testing.

[0099] The actual height of the test chip in the target direction under the corresponding negative pressure or internal and external pressure difference is obtained by using a height measuring instrument in each round of testing.

[0100] Specifically, during the testing process, the test chip is placed on the tooling platform, the test chip is fixed using the matching tooling fixture, and different negative pressures are provided to the test chip.

[0101] Pressure sensors are used to obtain the negative pressure or the pressure difference between the inside and outside of the chip being tested.

[0102] To determine the deformation of the test chip under negative pressure each time, negative pressure can be omitted in the first round of testing, and the original chip height under natural conditions can be measured using a height measuring instrument. Both the height measuring instrument and the pressure sensor can be electrically connected or communicate with computer equipment and controlled by the computer, transmitting or sending the measured values ​​to the computer equipment in a timely manner for data fitting and calculation.

[0103] The height measuring instrument is built based on the principle of a laser rangefinder. This laser rangefinder can return the height information of the chip's glass surface in real time, thereby determining the chip's minute displacement (i.e., deformation) in the height direction. Adding a pressure sensor to this fixture platform allows for observation of the chip's deformation pattern along the height direction using different applied negative pressures. For example, in the height direction... Figure 1 The direction indicated by the arrow.

[0104] In one embodiment, the negative pressure for each round of testing is provided by a power unit that is connected to the test chip.

[0105] Specifically, the power component can be, but is not limited to, an injection pump or similar device.

[0106] The syringe pump is connected to the chip's outlet via tubing to provide negative pressure. Specifically, the syringe pump provides negative pressure to the test chip by extracting or removing air from it. This embodiment directly utilizes the syringe pump in the sequencing fluid system to provide negative pressure for deformation testing of the test chip, which is convenient and efficient.

[0107] Of course, besides using a syringe pump to provide negative pressure, a syringe can also be used to provide negative pressure to the chip. This involves pulling the syringe outwards to draw air out of the chip, creating a negative pressure. By changing the syringe's stroke, different levels of negative pressure can be applied to the chip.

[0108] In one embodiment, the liquid inlet of the test chip is closed during each round of testing;

[0109] The power unit is connected to the liquid outlet of the test chip, and the power unit provides negative pressure to the test chip through the liquid outlet of the test chip.

[0110] Specifically, glue can be used to completely block the liquid inlet of the test chip to prevent air leakage, thereby providing a precise negative pressure to the test chip and preventing air leakage from causing test failure or large errors, thus ensuring the accuracy of the test.

[0111] This application obtains the chip height variation under different negative pressures or internal / external pressure differences through testing, explores the relationship between chip height and negative pressure or internal / external pressure difference, and then calculates the negative pressure threshold or internal / external pressure difference threshold that the chip can withstand. The obtained negative pressure threshold or internal / external pressure difference threshold can be clearly limited and constrained for the negative pressure or internal / external pressure difference provided by similar chips in actual sequencing processes, so as to avoid chip deformation or excessive deformation as much as possible, ensure that the chip surface is flat, avoid the upper and lower surfaces of the chip glass from sticking together, ensure smooth and uniform liquid flow inside the chip, ensure consistent chemical reaction efficiency throughout the chip surface, and also ensure accurate optical image acquisition. It also reduces the possibility of chip bonding failure, crosstalk or breakage, reduces the impact of chip deformation on the sequencing process, and improves the accuracy and effectiveness of sequencing results.

[0112] In one embodiment, if the first flow channel upstream of the target chip in the liquid circuit system is a circular pipe, then the relationship between the parameters of any segment of the first flow channel and the pressure drop is as shown in equation (1):

[0113]

[0114] Where ΔP is the pressure drop generated by the fluid flowing through the first channel, μ is the viscosity coefficient of the fluid used in the first channel, L is the length of the first channel, V is the flow velocity of the fluid in the first channel, and S is the cross-sectional area of ​​the first channel. Before the power component operates, the pressure in the first channel is the same as the atmospheric pressure of the external environment. When the power component operates, the fluid flows along the first channel under negative pressure and generates a pressure drop. Therefore, when the fluid reaches the inlet of the target chip, the pressure drop at the inlet of the target chip can be calculated by equation (1). This pressure drop is equal to the pressure difference between the inside and outside of the inlet of the target chip. The total pressure drop at the inlet of the same target chip is the sum of the pressure drops generated by the fluid flowing through multiple sections of the first channel.

[0115] Specifically, for a circular pipeline, the factors affecting the negative pressure at the target chip inlet include the length L of the upstream pipeline, the inner diameter d of the pipeline, the viscosity coefficient μ of the reagent, and the pump flow rate Q. The upstream pipeline is the first flow channel. Another expression of equation (1) is as follows:

[0116]

[0117] d is the inner diameter of the first flow channel, and Q is the pumping flow rate of the power unit.

[0118] Among them, the inner diameter d of the tubing is most sensitive to the overall pressure drop. However, increasing the inner diameter of the tubing will inevitably lead to an increase in reagent consumption and increase the cost of sequencing. Therefore, according to equation (1), the constraints or values ​​of each parameter can be reasonably constrained so as to calculate the optimal value or reasonable range of unknown parameters based on the known parameters.

[0119] In addition, when the fluid flows through multiple upstream pipelines, and the total pressure drop at the inlet of the test chip and the threshold of the internal and external pressure difference at the inlet of the test chip satisfy equation (2), the parameter constraints of each upstream pipeline can be constrained independently.

[0120] For example, if the chip's upstream pipelines include four, then the following must be satisfied:

[0121] ΔP1+ΔP2+ΔP3+ΔP4≤Pm Formula (2)

[0122] Where ΔP1, ΔP2, ΔP3, and ΔP4 are the pressure drops generated by the fluid flowing through the four upstream pipelines, and Pm is the threshold of the internal and external pressure difference of the chip.

[0123] refer to Figure 4 This application also provides a method for optimizing relevant parameters of a liquid circuit system, wherein the target chip to be used in the liquid circuit system is known, and the method includes:

[0124] S210: Obtain the negative pressure threshold or internal and external pressure difference threshold that the target chip can withstand, wherein the deformation degree of the target chip is within a preset level within the negative pressure threshold or internal and external pressure difference threshold.

[0125] S220: Determine the parameters that affect the negative pressure inside the target chip or the pressure difference between the inside and outside, the actual constraints of the parameters, and the relationship between the parameters and the voltage drop;

[0126] S230: Based on the negative pressure threshold or the internal and external pressure difference threshold, the actual constraints and relationships of the parameters, the selectable values ​​of the target parameters are calculated.

[0127] S240: Adjust the target parameters of the hydraulic system to be designed according to the selectable values.

[0128] Specifically, based on the Hagen-Poiseuille law (the assumption of fully developed flow within the tube), factors affecting the negative pressure at the chip inlet include the number and capacity of the upstream pipelines, the viscosity coefficient of the reagents used in the chip, and the pumping flow rate. The pipelines, i.e., the first flow channel, are circular. If the pipeline is circular, its capacity is determined by its length and diameter.

[0129] The chip can be sequenced in different liquid circuit systems. The pressure difference or negative pressure caused by different liquid circuit systems to the chip may be different. Therefore, based on the actual pressure difference threshold or negative pressure threshold that the target chip can withstand and the key data of the liquid circuit system to be used by the target chip, the possible solutions or reasonable range of values ​​for the pipeline parameters of the liquid circuit system can be calculated.

[0130] Based on the available piping parameters, technicians can rationally configure the fluid circuit system to be used by the target chip in order to meet the performance indicators of the target chip's deformation.

[0131] Of course, if the piping of the liquid circuit system to be used by the chip has been determined, the flow rate of the syringe pump and the viscosity coefficient of the reagent to be used can be optimized to calculate the reasonable range of values ​​for the flow rate of the syringe pump and the viscosity coefficient of the reagent.

[0132] In one embodiment, obtaining the negative voltage threshold that the target chip can withstand includes:

[0133] Obtain the deformation parameter values ​​of the test chip under different negative pressures and in the target direction;

[0134] The deformation parameter values ​​and the corresponding negative pressure values ​​are used as the data to be fitted to obtain the fitting results.

[0135] Based on the fitting results and the deformation parameter threshold of the test chip in the target direction under the preset deformation level, the negative pressure threshold that the test chip can withstand in the target direction is determined, and the negative pressure threshold of the test chip is used as the negative pressure threshold that the target chip can withstand.

[0136] In one embodiment, the deformation parameter value is one of the deformation amount or the actual height of the chip.

[0137] In one embodiment, obtaining the threshold of the internal and external pressure difference that the target chip can withstand includes:

[0138] Obtain the deformation parameter values ​​of the test chip in the target direction under different internal and external pressure differences;

[0139] The deformation parameter values ​​and the corresponding internal and external pressure differences are used as the data to be fitted to obtain the fitting results.

[0140] Based on the fitting results and the deformation parameter threshold of the test chip in the target direction under the preset deformation level, the internal and external pressure difference threshold that the test chip can withstand in the target direction is determined, and the internal and external pressure difference threshold of the test chip is used as the internal and external pressure difference threshold that the target chip can withstand.

[0141] In one embodiment, the fitting result is a linear fitting function characterizing the linear relationship between the actual height of the chip and the negative pressure value or the difference between internal and external pressure; or, the fitting result is a linear fitting function characterizing the linear relationship between the deformation and the negative pressure value or the difference between internal and external pressure.

[0142] Based on the fitting results and the deformation parameter threshold in the target direction of the test chip under a preset deformation level, determine the negative pressure threshold or internal / external pressure difference threshold that the test chip can withstand in the target direction, including:

[0143] Determine the slope of the linear fitting function;

[0144] The deformation threshold is determined based on the deformation parameter threshold in the target direction under a preset level of deformation of the test chip.

[0145] The negative pressure threshold or internal / external pressure difference threshold that the chip can withstand in the target direction is obtained by the ratio of the deformation threshold to the absolute value of the slope.

[0146] In one embodiment, the deformation parameter threshold is one of the deformation amount threshold under deformation and the chip actual height threshold under deformation.

[0147] In one embodiment, the deformation parameter value is the actual height of the chip;

[0148] Obtain the deformation parameter values ​​of the test chip in the target direction under different negative pressures or internal and external pressure differences, including:

[0149] The negative pressure or the pressure difference between the inside and outside of the test chip is obtained through a pressure sensor in each round of testing.

[0150] The actual height of the test chip in the target direction under the corresponding negative pressure or internal and external pressure difference is obtained by using a height measuring instrument in each round of testing.

[0151] In one embodiment, the negative pressure for each round of testing is provided by a power unit that is connected to the test chip.

[0152] In one embodiment, the liquid inlet of the test chip is closed during each round of testing;

[0153] The power unit is connected to the liquid outlet of the test chip, and the power unit provides negative pressure to the test chip through the liquid outlet of the test chip.

[0154] In one embodiment, if the first flow channel upstream of the target chip in the liquid circuit system is a circular pipe, then the relationship between the parameters of any segment of the first flow channel and the pressure drop is as shown in equation (1):

[0155]

[0156] Wherein, ΔP circle is the pressure drop generated by the fluid flowing through the first flow channel, μ is the viscosity coefficient of the fluid used in the first flow channel, L is the length of the first flow channel, V is the flow velocity of the fluid in the first flow channel, and S is the size of the flow cross section of the first flow channel. Since the air pressure in the first flow channel is the same as the atmospheric pressure of the external environment before the power component works, when the power component works, the fluid flows along the first flow channel under the action of negative pressure and generates a pressure drop. Therefore, when the fluid reaches the liquid inlet of the target chip, the pressure drop at the liquid inlet of the target chip can be calculated by equation (1). This pressure drop is equal to the pressure difference between the inside and outside of the liquid inlet of the target chip.

[0157] The total pressure drop at the inlet of the same target chip is the sum of the pressure drops generated by the fluid in multiple first flow channels.

[0158] Specifically, for a circular pipeline, the factors affecting the negative pressure at the chip inlet include the length L of the upstream pipeline, the inner diameter d of the pipeline, the viscosity coefficient μ of the reagent, and the pump flow rate Q. The upstream pipeline is the first flow channel. Another expression of equation (1) is as follows:

[0159]

[0160] d is the inner diameter of the first flow channel, and Q is the pumping flow rate of the power unit.

[0161] Among them, the inner diameter d of the tubing is most sensitive to the overall pressure drop. However, increasing the inner diameter of the tubing will inevitably lead to an increase in reagent consumption and increase the cost of sequencing. Therefore, according to equation (1), the constraints or values ​​of each parameter can be reasonably constrained so as to calculate the optimal value or reasonable range of unknown parameters based on the known parameters.

[0162] In addition, when the fluid flows through multiple upstream pipelines, and the total pressure drop at the inlet of the test chip and the threshold of the internal and external pressure difference at the inlet of the test chip satisfy equation (2), the parameter constraints of each upstream pipeline can be constrained independently.

[0163] For example, if the chip's upstream pipelines include four, then the following must be satisfied:

[0164] ΔP1+ΔP2+ΔP3+ΔP4≤Pm Formula (2)

[0165] Where ΔP1, ΔP2, ΔP3, and ΔP4 are the pressure drops generated by the fluid flowing through the four upstream pipelines, and Pm is the threshold of the internal and external pressure difference of the chip.

[0166] In one specific embodiment, the liquid circuit system includes multiple reagent storage devices, a first rotary valve, and a second rotary valve. Each reagent storage device is connected to the first rotary valve via a corresponding first conduit. The first rotary valve is a multi-port valve, including multiple ports and a common port. The first rotary valve is used to select one of the multiple reagent storage devices to enter through any one of the ports and then flow out from the common port. The first rotary valve and the second rotary valve are connected via a second conduit. The second rotary valve is a three-port valve, including three ports: a first port, a second port, and a third port. The first port of the second rotary valve is connected to the common port, and the first port can be selectively connected to either the second port or the third port. The second port of the second rotary valve is connected to the chip's liquid inlet via a third conduit. The third port of the second rotary valve is connected to a waste liquid collection device via a conduit. When the second rotary valve selects to connect the first port and the second port, the reagent in the reagent storage device enters the second flow channel of the chip through the first conduit, the second conduit, and the third conduit via the liquid circuit system. When the second rotary valve connects the first and third ports, the reagent in the reagent storage device enters the waste liquid collection device through the liquid circuit system via the first and second pipelines. This process can perform operations such as cleaning on the liquid circuit system. The chip's outlet is connected to the syringe pump via a fourth pipeline. At this time, the chip has three upstream pipelines: the first, second, and third pipelines.

[0167] Considering the above factors and the selection of reference pipeline parameters, for the upstream pipeline of the liquid system, the first pipeline has an inner diameter of 1.0 mm and lengths of 740 mm and 1500 mm, respectively; the second and third pipelines have an inner diameter of 0.76 mm and lengths of 360 mm and 190 mm, respectively; the fourth pipeline between the chip outlet and the injection pump has an inner diameter of 0.76 mm and a length of 830 mm. When a flow rate of 750 μL / min is used during sequencing, according to equation (1), the pressure drop at the chip inlet is approximately 11.5 kPa, which is much lower than 17.5 kPa, thus meeting the performance index of chip deformation.

[0168] Of course, the above is just an example. In the actual sequencing process, the diameter and length of the tubing, the flow rate of the liquid being drawn, and the viscosity coefficient of the reagent can all be selected within the constraints. This application does not impose any limitations on these aspects.

[0169] refer to Figure 5 This application also provides a device for controlling fluid in a liquid circuit system. The liquid circuit system is connected to a target chip. The liquid circuit system includes a first flow channel, and the target chip has a second flow channel. The first flow channel and the second flow channel are connected and have different flow cross-sections. The device includes:

[0170] The fluid control module 110 is used to allow fluid to enter the second channel through the first channel at a specified flow rate, so that the deformation degree of the target chip is at a preset level when the fluid enters the target chip. The preset level of deformation of the target chip includes ensuring that the dimensional change of the target chip in any direction of the flow cross section of the second channel does not exceed a preset ratio of the dimensional change before deformation. The determination of the specified flow rate is related to the deformation degree of the target chip at the preset level and the size of the flow cross section of the first channel.

[0171] In one embodiment, the device further includes:

[0172] The negative pressure threshold or internal and external pressure difference threshold acquisition module is used to acquire the negative pressure threshold or internal and external pressure difference threshold that the target chip can withstand, wherein the degree of deformation of the target chip is within a preset level within the negative pressure threshold or internal and external pressure difference threshold.

[0173] The relevant data acquisition module is used to acquire parameters that affect the negative pressure inside the target chip or the pressure difference between the inside and outside, the actual constraints of the parameters in the liquid circuit system, and the relationship between the parameters and the pressure drop. Among them, the parameters include the viscosity coefficient and flow rate of the fluid to be used, the length of the first flow channel, and the size of the flow cross section.

[0174] The parameter calculation module is used to calculate the selectable values ​​of the target parameters based on the negative pressure threshold or the internal and external pressure difference threshold, the actual constraints of the parameters, and the relationship between the parameters. The target parameters include the fluid velocity.

[0175] The flow rate determination module is used to determine the specified flow rate of the fluid to be introduced into the target chip based on selectable values ​​of the target parameters.

[0176] In one embodiment, the negative pressure threshold or internal / external pressure difference threshold acquisition module includes:

[0177] The deformation parameter value acquisition module is used to acquire the deformation parameter values ​​of the test chip in the target direction under different negative pressures or internal and external pressure differences.

[0178] The data fitting module is used to fit the deformation parameter values ​​and the corresponding negative pressure values ​​or the difference between internal and external pressure as the data to be fitted, and obtain the fitting results.

[0179] The negative pressure threshold or internal and external pressure difference threshold determination module is used to determine the negative pressure threshold or internal and external pressure difference threshold that the test chip can withstand in the target direction based on the fitting results and the deformation parameter threshold of the test chip under the preset deformation level. The negative pressure threshold or internal and external pressure difference threshold of the test chip is used as the negative pressure threshold or internal and external pressure difference threshold that the target chip can withstand.

[0180] In one embodiment, the deformation parameter value is one of the deformation amount or the actual height of the chip.

[0181] In one embodiment, the fitting result is a linear fitting function characterizing the linear relationship between the actual height of the chip and the negative pressure or the difference between internal and external pressure; or, the fitting result is a linear fitting function characterizing the linear relationship between the deformation and the negative pressure or the difference between internal and external pressure.

[0182] The module for determining the negative pressure threshold or the difference between internal and external pressure includes:

[0183] The slope determination module is used to determine the slope of the linear fitting function;

[0184] The deformation threshold determination module is used to determine the deformation threshold based on the deformation parameter threshold in the target direction under a preset level of deformation of the test chip;

[0185] The ratio calculation module is used to obtain the negative pressure threshold or internal and external pressure difference threshold that the test chip can withstand in the target direction based on the ratio of the absolute value of the deformation threshold to the slope.

[0186] In one embodiment, the deformation parameter threshold is one of the deformation amount threshold under deformation and the chip actual height threshold under deformation.

[0187] In one embodiment, the deformation parameter value is the actual height of the chip;

[0188] The deformation parameter value acquisition module includes:

[0189] The negative pressure or internal / external pressure difference measurement module is used to obtain the negative pressure or internal / external pressure difference within the test chip in each round of testing through a pressure sensor.

[0190] The height measurement module is used to obtain the actual height value of the test chip in the target direction under the corresponding negative pressure or internal and external pressure difference in each round of testing through a height measuring instrument.

[0191] In one embodiment, the negative pressure for each round of testing is provided by a power unit that is connected to the test chip.

[0192] In one embodiment, the liquid inlet of the test chip is closed during each round of testing;

[0193] The power unit is connected to the liquid outlet of the test chip, and the power unit provides negative pressure to the test chip through the liquid outlet of the test chip.

[0194] In one embodiment, if the first flow channel is a circular pipe, the relationship between the parameters of any segment of the first flow channel and the pressure drop is shown in equation (1):

[0195]

[0196] Where ΔP circle is the pressure drop generated by the fluid flowing through the first flow channel, μ is the viscosity coefficient of the fluid used in the first flow channel, L is the length of the first flow channel, V is the flow velocity of the fluid in the first flow channel, and S is the size of the flow cross section of the first flow channel.

[0197] The total pressure drop at the inlet of the same target chip is the sum of the pressure drops generated by the fluid in multiple first flow channels.

[0198] refer to Figure 6 This application also provides an optimization device for parameters related to a liquid circuit system, wherein the target chip to be used in the liquid circuit system is known, and the device includes:

[0199] The negative pressure threshold or internal and external pressure difference threshold acquisition module 210 is used to acquire the negative pressure threshold or internal and external pressure difference threshold that the target chip can withstand, wherein the degree of deformation of the target chip is within a preset level within the negative pressure threshold or internal and external pressure difference threshold.

[0200] The relevant data acquisition module 220 is used to determine the parameters that affect the negative pressure inside the target chip or the pressure difference between the inside and outside, the actual constraints of the parameters, and the relationship between the parameters and the pressure drop.

[0201] The calculation module 230 is used to calculate the selectable values ​​of the target parameters based on the negative pressure threshold or the internal and external pressure difference threshold, the actual constraints and relationships of the parameters;

[0202] The parameter adjustment module 240 is used to adjust the target parameters of the hydraulic circuit system to be designed according to selectable values.

[0203] Figure 7 An internal structural diagram of a computer device in one embodiment is shown. This computer device can specifically be a terminal or a server. Figure 7 As shown, the computer device includes a processor, memory, and network interface connected via a system bus. The memory includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores an operating system and may also store a computer program. When executed by the processor, this computer program causes the processor to perform the steps in the above-described method embodiments. The internal memory may also store a computer program, which, when executed by the processor, causes the processor to perform the steps in the above-described method embodiments. Those skilled in the art will understand that... Figure 7 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0204] In one embodiment, a computer device is provided, including a memory and a processor, the memory storing a computer program that, when executed by the processor, causes the processor to perform the following steps:

[0205] The fluid is introduced into the second channel through the first channel at a specified flow rate, so that the deformation of the target chip is at a preset level when the fluid enters the target chip. The deformation of the target chip is at the preset level, which includes ensuring that the dimensional change of the target chip in any direction of the flow cross section of the second channel does not exceed a preset ratio of the dimensional change before deformation. The specified flow rate is determined in relation to the deformation of the target chip at the preset level and the size of the flow cross section of the first channel.

[0206] The liquid circuit system is connected to the target chip. The liquid circuit system includes a first flow channel, and the target chip has a second flow channel. The first flow channel and the second flow channel are connected and have different flow cross-sections.

[0207] or,

[0208] This causes the processor to perform the following steps:

[0209] Obtain the negative pressure threshold or internal and external pressure difference threshold that the target chip can withstand, wherein the degree of deformation of the target chip is within a preset level within the negative pressure threshold or internal and external pressure difference threshold.

[0210] Determine the parameters that affect the negative pressure inside the target chip or the pressure difference between the inside and outside, the actual constraints of the parameters, and the relationship between the parameters and the voltage drop;

[0211] Based on the negative pressure threshold or the internal and external pressure difference threshold, the actual constraints and relationships of the parameters, the selectable values ​​of the target parameters are calculated.

[0212] The target parameters of the hydraulic system to be designed are adjusted based on the selectable values.

[0213] In one embodiment, a computer-readable storage medium is provided storing a computer program that, when executed by a processor, causes the processor to perform the following steps:

[0214] The fluid is introduced into the second channel through the first channel at a specified flow rate, so that the deformation of the target chip is at a preset level when the fluid enters the target chip. The deformation of the target chip is at the preset level, which includes ensuring that the dimensional change of the target chip in any direction of the flow cross section of the second channel does not exceed a preset ratio of the dimensional change before deformation. The specified flow rate is determined in relation to the deformation of the target chip at the preset level and the size of the flow cross section of the first channel.

[0215] The liquid circuit system is connected to the target chip. The liquid circuit system includes a first flow channel, and the target chip has a second flow channel. The first flow channel and the second flow channel are connected and have different flow cross-sections.

[0216] or,

[0217] This causes the processor to perform the following steps:

[0218] Obtain the negative pressure threshold or internal and external pressure difference threshold that the target chip can withstand, wherein the degree of deformation of the target chip is within a preset level within the negative pressure threshold or internal and external pressure difference threshold.

[0219] Determine the parameters that affect the negative pressure inside the target chip or the pressure difference between the inside and outside, the actual constraints of the parameters, and the relationship between the parameters and the voltage drop;

[0220] Based on the negative pressure threshold or the internal and external pressure difference threshold, the actual constraints and relationships of the parameters, the selectable values ​​of the target parameters are calculated.

[0221] The target parameters of the hydraulic system to be designed are adjusted based on the selectable values.

[0222] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, storage, databases, or other media used in the embodiments provided in this application can include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), RAMbus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and RAMbus dynamic RAM (RDRAM), etc.

[0223] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0224] The above embodiments merely illustrate several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A method for controlling fluid in a liquid circuit system, the liquid circuit system being connected to a target chip, the liquid circuit system including a first flow channel, the target chip having a second flow channel, the first flow channel and the second flow channel being connected, the first flow channel and the second flow channel having different flow cross-sections, characterized in that, The method includes: Fluid is introduced into the second channel through the first channel at a specified flow rate, so that when the fluid enters the target chip, the deformation of the target chip is at a preset level. The preset level of deformation of the target chip includes ensuring that the dimensional change of the target chip in any direction of the flow cross section of the second channel does not exceed a preset ratio of the dimensional change before deformation. The specified flow rate is determined in relation to the deformation of the target chip at the preset level and the size of the flow cross section of the first channel.

2. The method according to claim 1, characterized in that, The specified flow rate is determined by the following method: Obtain the negative pressure threshold or internal and external pressure difference threshold that the target chip can withstand, wherein the degree of deformation of the target chip is within a preset level within the negative pressure threshold or internal and external pressure difference threshold. The parameters affecting the negative pressure inside the target chip or the pressure difference between the inside and outside are obtained, as well as the actual constraints of the parameters in the liquid circuit system and the relationship between the parameters and the pressure drop. The parameters include the viscosity coefficient and flow rate of the fluid to be used, the length of the first flow channel and the size of the flow cross section. Based on the negative pressure threshold or the internal and external pressure difference threshold, the actual constraints of the parameters, and the relationship, the selectable values ​​of the target parameters are calculated, wherein the target parameters include the fluid velocity. The specified flow rate of the fluid to be introduced into the target chip is determined based on the selectable values ​​of the target parameters.

3. The method according to claim 2, characterized in that, The step of obtaining the negative pressure threshold or internal / external pressure difference threshold that the target chip can withstand includes: Obtain the deformation parameter values ​​of the test chip in the target direction under different negative pressures or internal and external pressure differences; The deformation parameter values ​​and the corresponding negative pressure values ​​or the difference between internal and external pressure are used as the data to be fitted to obtain the fitting results. Based on the fitting results and the deformation parameter threshold of the test chip in the target direction under the preset deformation level, the negative pressure threshold or internal and external pressure difference threshold that the test chip can withstand in the target direction is determined, and the negative pressure threshold or internal and external pressure difference threshold of the test chip is used as the negative pressure threshold or internal and external pressure difference threshold that the target chip can withstand. Optionally, the deformation parameter value is one of the deformation amount and the actual height of the chip; Optionally, the fitting result is a linear fitting function characterizing the linear relationship between the actual height of the chip and the negative pressure or the difference between internal and external pressure; or, the fitting result is a linear fitting function characterizing the linear relationship between the deformation and the negative pressure or the difference between internal and external pressure. The step of determining the negative pressure threshold or internal / external pressure difference threshold that the test chip can withstand in the target direction based on the fitting results and the deformation parameter threshold of the test chip under a preset deformation level in the target direction includes: Determine the slope of the linear fitting function; The deformation threshold is determined based on the deformation parameter threshold in the target direction under a preset level of deformation of the test chip. The negative pressure threshold or the internal and external pressure difference threshold that the test chip can withstand in the target direction is obtained by the ratio of the absolute value of the deformation threshold to the absolute value of the slope. Optionally, the deformation parameter threshold is one of the deformation amount threshold under deformation and the chip actual height threshold under deformation; Optionally, the deformation parameter value is the actual height of the chip; The process of obtaining the deformation parameter values ​​of the test chip in the target direction under different negative pressures or internal and external pressure differences includes: The negative pressure or the pressure difference between the inside and outside of the test chip is obtained through a pressure sensor in each round of testing. The actual height of the test chip in the target direction under the corresponding negative pressure or internal and external pressure difference is obtained by using a height measuring instrument in each round of testing; Optionally, the negative pressure for each round of testing is provided by a power unit connected to the test chip; Optionally, the liquid inlet of the test chip is closed during each round of testing; The power unit is connected to the liquid outlet of the test chip, and the power unit provides negative pressure to the test chip through the liquid outlet of the test chip; Optionally, if the first flow channel is a circular pipe, the relationship between the parameters of any segment of the first flow channel and the pressure drop is shown in equation (1): Equation (1) in, The pressure drop generated when the fluid flows through the first flow channel. Let L be the viscosity coefficient of the fluid used in the first flow channel, L be the length of the first flow channel, V be the flow velocity of the fluid in the first flow channel, and S be the cross-sectional area of ​​the first flow channel.

4. The method according to any one of claims 1 to 3, characterized in that, The preset ratio is one-eighth or one-tenth.

5. A device for controlling fluid in a liquid circuit system, the liquid circuit system being connected to a target chip, the liquid circuit system including a first flow channel, the target chip having a second flow channel, the first flow channel and the second flow channel being connected, the first flow channel and the second flow channel having different flow cross-sections, characterized in that, The device includes: A fluid control module is used to allow fluid to enter the second channel through the first channel at a specified flow rate, so that when the fluid enters the target chip, the deformation degree of the target chip is at a preset level. The setting of the target chip deformation degree at the preset level includes ensuring that the dimensional change of the target chip in any direction of the flow cross section of the second channel does not exceed a preset ratio of the pre-deformation size. The determination of the specified flow rate is related to the deformation degree of the target chip at the preset level and the size of the flow cross section of the first channel.

6. The apparatus according to claim 5, characterized in that, The device includes: A negative pressure threshold or internal and external pressure difference threshold acquisition module is used to acquire the negative pressure threshold or internal and external pressure difference threshold that the target chip can withstand, wherein the degree of deformation of the target chip is within a preset level within the negative pressure threshold or internal and external pressure difference threshold. The relevant data acquisition module is used to determine the parameters that affect the negative pressure inside the target chip or the pressure difference between the inside and outside, the actual constraints of the parameters, and the relationship between the parameters and the pressure drop. The calculation module is used to calculate the selectable values ​​of the target parameter in the parameters based on the negative pressure threshold or the internal and external pressure difference threshold, the actual constraints of the parameters, and the relationship. The parameter adjustment module is used to adjust the target parameters of the hydraulic system to be designed according to the selectable values.

7. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by a processor, it causes the processor to perform the steps of the method as described in any one of claims 1-4.

8. A computer device, comprising a memory and a processor, characterized in that, The memory stores a computer program that, when executed by the processor, causes the processor to perform the steps of the method as described in any one of claims 1-4.

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