Functional inspection method, device, equipment and medium for multiple NFC models

Abstract

The present application discloses a method, device, equipment and medium for functional inspection of multiple models of NFC, and relates to the field of functional testing technology. The method includes: real-time monitoring of the working state of the test mainboard, wherein the working state includes the chip insertion state and the chip removal state; when detecting that the working state is converted from the chip removal state to the chip insertion state, obtaining the model information of the NFC chip inserted in the test mainboard; initializing the NFC chip according to the model information, and performing functional inspection on the NFC chip after initialization. The technical solution of the present application can achieve the effect of fast testing of NFC chips by hot-plugging NFC chips on the test mainboard, without the need to manually screen NFC chips of the same model for testing on the test mainboard, and without the need to restart the test mainboard every time a new NFC chip is inserted, thereby improving the test efficiency and convenience of functional inspection of multiple models of NFC.

Description

Technical Field

[0001] The present application relates to the field of functional testing technology, and in particular to a functional testing method, device, equipment and medium for multiple NFC models. Background Art

[0002] With the development of wireless communication technology, NFC (Near Field Communication) technology has been widely used in mobile phones, tablets and other devices.

[0003] During the production process of NFC chips, it is essential to test their functions to determine whether their functions are normal and to ensure product quality. The test is performed by the tester inserting the NFC board containing the NFC chip into the test main board in sequence. The test main board is connected to the test terminal, and the test terminal sends a test command to the test main board to complete the functional test of the NFC chip. However, during the test process, different models of NFC chips require different configuration files and firmware files for testing, and the software in the test terminal in conventional technology only integrates one model of configuration files and firmware files. The tester needs to manually screen the model of the NFC chip for confirmation before testing can be performed. In addition, each time the NFC board is inserted into the test equipment, the test equipment needs to be restarted to make the new NFC chip work normally, and the test efficiency is low.

[0004] In summary, how to improve the test efficiency of NFC chip functional testing has become a technical problem that needs to be solved urgently in this field. Summary of the invention

[0005] The main purpose of this application is to provide a function inspection method, device, equipment and medium for multiple models of NFC, aiming to improve the test efficiency of NFC chip function testing.

[0006] To achieve the above object, the present application provides a function verification method for multiple models of NFC, and the function verification method for multiple models of NFC includes:

[0007] Real-time monitoring of the working status of the test mainboard, wherein the working status includes chip insertion status and chip removal status;

[0008] When detecting that the working state is changed from the chip-unplugged state to the chip-inserted state, acquiring the model information of the NFC chip inserted into the test mainboard;

[0009] The NFC chip is initialized according to the model information, and a function test is performed on the initialized NFC chip.

[0010] Optionally, the test mainboard includes a GPIO (General Purpose Input / Output) interface, and the GPIO interface is connected to the peripheral pin of the NFC chip;

[0011] The step of real-time monitoring and testing the working status of the mainboard includes:

[0012] Monitor the level change of the GPIO interface in real time, wherein the level change includes pulling up the voltage and pulling down the voltage;

[0013] When it is detected that the level changes to the pull-up voltage, determining that the working state of the test mainboard is the chip insertion state;

[0014] When it is detected that the level changes to the pull-down voltage, it is determined that the working state of the test mainboard is the chip-pulling state.

[0015] Optionally, the step of obtaining the model information of the NFC chip inserted into the test mainboard includes:

[0016] Sending a query signal to the NFC chip inserted in the test mainboard, so that the NFC chip returns query data corresponding to the query signal;

[0017] The model information of the NFC chip is extracted from the query data.

[0018] Optionally, before the step of initializing the NFC chip according to the model information, the method further includes:

[0019] Download preset compatible software to the test mainboard, wherein the compatible software integrates configuration files and firmware files of NFC chips of different models.

[0020] Optionally, the step of initializing the NFC chip according to the model information includes:

[0021] Calling a target configuration file and a target firmware file matching the model information from the compatible software;

[0022] The target configuration file and the target firmware file are loaded into the NFC chip, so that the NFC chip completes initialization according to the target configuration file and the target firmware file.

[0023] Optionally, the step of performing a function check on the NFC chip after initialization includes:

[0024] After detecting that the initialization is completed, executing a preset test program to perform a function test on the NFC chip to obtain a test result;

[0025] The test results are visually displayed through a preset display interface.

[0026] Optionally, the method further comprises:

[0027] While obtaining the model information of the NFC chip inserted in the test mainboard, restart the NFC service of the test mainboard.

[0028] In addition, to achieve the above-mentioned purpose, the present application also provides a function inspection device for multiple models of NFC, and the function inspection device for multiple models of NFC includes:

[0029] A status monitoring module, used for real-time monitoring of the working status of the test mainboard, wherein the working status includes a chip insertion status and a chip removal status;

[0030] An information acquisition module, configured to acquire model information of the NFC chip inserted into the test mainboard when detecting that the working state is converted from the chip-unplugged state to the chip-inserted state;

[0031] The testing module is used to initialize the NFC chip according to the model information and perform a function test on the NFC chip after the initialization.

[0032] Among them, each functional module of the functional testing device for multiple types of NFC in the present application implements the steps of the functional testing method for multiple types of NFC as described above during operation.

[0033] In addition, to achieve the above-mentioned purpose, the present application also provides a terminal device, which includes: a memory, a processor, and a function verification program for multiple models of NFC stored in the memory and executable on the processor, wherein the function verification program for multiple models of NFC implements the steps of the function verification method for multiple models of NFC as described above when executed by the processor.

[0034] In addition, to achieve the above-mentioned purpose, the present application also proposes a storage medium, which is a computer-readable storage medium, and stores a functional verification program for multiple models of NFC. When the functional verification program for multiple models of NFC is executed by a processor, the steps of the functional verification method for multiple models of NFC as described above are implemented.

[0035] The present application provides a method, apparatus, terminal device and storage medium for functional inspection of multiple models of NFC, wherein the method for functional inspection of multiple models of NFC includes: real-time monitoring of the working status of a test mainboard, wherein the working status includes a chip insertion status and a chip removal status; when detecting that the working status is converted from the chip removal status to the chip insertion status, obtaining the model information of the NFC chip inserted in the test mainboard; initializing the NFC chip according to the model information, and performing a functional inspection on the NFC chip after the initialization.

[0036] In this way, the present application monitors the working status of the test mainboard in real time, and when the working status of the test mainboard is changed from the chip-unplugged state to the chip-inserted state, it determines that a new NFC chip is inserted into the test mainboard, initializes the NFC chip by obtaining the model information of the NFC chip, and performs a functional test on the NFC chip after initialization. Compared with the traditional functional test on multiple models of NFC, the present application can hot-swap the NFC chip on the test mainboard to achieve the effect of quickly testing the NFC chip. There is no need to manually screen the NFC chips of the same model for testing on the test mainboard, nor is there a need to restart the test mainboard every time a new NFC chip is inserted, which improves the test efficiency and convenience of functional testing for multiple models of NFC. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] Figure 1 A schematic diagram of the device structure of the hardware operating environment of the terminal device involved in the embodiment of the present application;

[0038] Figure 2 This is a schematic diagram of an implementation flow of an embodiment of a method for functional inspection of multiple NFC models of the present application;

[0039] Figure 3 This is a schematic diagram of the structure of a test main board and an NFC sub-board involved in an embodiment of a method for functional inspection of multiple NFC models of this application;

[0040] Figure 4 This is a first flow chart of an embodiment of a method for functional inspection of multiple NFC models in this application;

[0041] Figure 5 This is a second flow chart of an embodiment of a method for functional inspection of multiple NFC models in this application;

[0042] Figure 6 This is a schematic diagram of functional modules of an embodiment of a function inspection device for multiple NFC models of the present application.

[0043] The realization of the purpose, functional features and advantages of this application will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0044] It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0045] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0046] It should be noted that all directional indications in the embodiments of the present application (such as up, down, left, right, front, back, etc.) are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0047] In this application, unless otherwise clearly specified and limited, the terms "connection", "fixation", etc. should be understood in a broad sense. For example, "fixation" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0048] In addition, in this application, descriptions such as "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In addition, the technical solutions between the various embodiments can be combined with each other, but they must be based on the ability of ordinary technicians in this field to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by this application.

[0049] An embodiment of the present application provides a terminal device.

[0050] It should be noted that the terminal device in the embodiment of the present application is a test terminal, which can specifically be a terminal device such as a computer or a server.

[0051] like Figure 1 As shown, Figure 1It is a schematic diagram of the device structure of the hardware operating environment of the terminal device involved in the embodiment of the present application. In the hardware operating environment of the terminal device, the terminal device may include: a processor 1001, such as a CPU, a network interface 1004, a user interface 1003, a memory 1005, and a communication bus 1002. Among them, the communication bus 1002 is used to realize the connection and communication between these components. The user interface 1003 may include a display screen (Display), an input unit such as a keyboard (Keyboard), and the optional user interface 1003 may also include a standard wired interface and a wireless interface. The network interface 1004 may optionally include a standard wired interface and a wireless interface (such as a WI-FI interface). The memory 1005 may be a high-speed RAM memory, or a stable memory (non-volatile memory), such as a disk memory. The memory 1005 may also be a storage device independent of the aforementioned processor 1001.

[0052] Those skilled in the art will understand that Figure 1 The terminal device structure shown in the figure does not constitute a limitation on the device, and may include more or fewer components than shown in the figure, or combine certain components, or arrange the components differently.

[0053] like Figure 1 As shown, the memory 1005 as a computer storage medium may include an operating system, a network communication module, a user interface module, and a function inspection program for multiple NFC models.

[0054] exist Figure 1 In the device shown, the network interface 1004 is mainly used to connect to the backend server and communicate data with the backend server; the user interface 1003 is mainly used to connect to the client (user end) and communicate data with the client; and the processor 1001 can be used to call the function inspection program for multiple models of NFC stored in the memory 1005, and perform the following operations:

[0055] Real-time monitoring of the working status of the test mainboard, wherein the working status includes chip insertion status and chip removal status;

[0056] When detecting that the working state is changed from the chip-unplugged state to the chip-inserted state, acquiring the model information of the NFC chip inserted into the test mainboard;

[0057] The NFC chip is initialized according to the model information, and a function test is performed on the initialized NFC chip.

[0058] Optionally, the test mainboard includes a GPIO interface, and the GPIO interface is connected to the peripheral pin of the NFC chip; the processor 1001 can also be used to call the function test program for multiple models of NFC stored in the memory 1005, and perform the following operations:

[0059] Monitor the level change of the GPIO interface in real time, wherein the level change includes pulling up the voltage and pulling down the voltage;

[0060] When it is detected that the level changes to the pull-up voltage, determining that the working state of the test mainboard is the chip insertion state;

[0061] When it is detected that the level changes to the pull-down voltage, it is determined that the working state of the test mainboard is the chip-pulling state.

[0062] Optionally, the processor 1001 may also be used to call a function inspection program for multiple NFC models stored in the memory 1005, and perform the following operations:

[0063] Sending a query signal to the NFC chip inserted in the test mainboard, so that the NFC chip returns query data corresponding to the query signal;

[0064] The model information of the NFC chip is extracted from the query data.

[0065] Optionally, the processor 1001 may also be used to call a function inspection program for multiple NFC models stored in the memory 1005, and perform the following operations:

[0066] Download preset compatible software to the test mainboard, wherein the compatible software integrates configuration files and firmware files of NFC chips of different models.

[0067] Optionally, the processor 1001 may also be used to call a function inspection program for multiple NFC models stored in the memory 1005, and perform the following operations:

[0068] Calling a target configuration file and a target firmware file matching the model information from the compatible software;

[0069] The target configuration file and the target firmware file are loaded into the NFC chip, so that the NFC chip completes initialization according to the target configuration file and the target firmware file.

[0070] Optionally, the processor 1001 may also be used to call a function inspection program for multiple NFC models stored in the memory 1005, and perform the following operations:

[0071] After detecting that the initialization is completed, executing a preset test program to perform a function test on the NFC chip to obtain a test result;

[0072] The test results are visually displayed through a preset display interface.

[0073] Optionally, the processor 1001 may also be used to call a function inspection program for multiple NFC models stored in the memory 1005, and perform the following operations:

[0074] While obtaining the model information of the NFC chip inserted in the test mainboard, restart the NFC service of the test mainboard.

[0075] Based on the above hardware structure, the overall concept of various embodiments of the present application for the function verification method of multiple NFC models is proposed.

[0076] In the embodiment of the present application, with the development of wireless communication technology, NFC technology has been widely used in mobile phones, tablets and other devices.

[0077] During the production process of NFC chips, it is essential to test their functions to determine whether their functions are normal and to ensure product quality. The test is performed by the tester inserting the NFC board containing the NFC chip into the test main board in sequence. The test main board is connected to the test terminal, and the test terminal sends a test command to the test main board to complete the functional test of the NFC chip. However, during the test process, different models of NFC chips require different configuration files and firmware files for testing, and the software in the test terminal in conventional technology only integrates one model of configuration files and firmware files. The tester needs to manually screen the model of the NFC chip for confirmation before testing can be performed. In addition, each time the NFC board is inserted into the test equipment, the test equipment needs to be restarted to make the new NFC chip work normally, and the test efficiency is low.

[0078] In summary, how to improve the test efficiency of NFC chip functional testing has become a technical problem that needs to be solved urgently in this field.

[0079] In response to the above problems, an embodiment of the present application proposes a functional inspection method for multiple models of NFC, which includes: real-time monitoring of the working status of a test mainboard, wherein the working status includes a chip insertion status and a chip removal status; when it is detected that the working status is converted from the chip removal status to the chip insertion status, obtaining the model information of the NFC chip inserted in the test mainboard; initializing the NFC chip according to the model information, and performing a functional inspection on the NFC chip after the initialization.

[0080] In this way, the present application monitors the working status of the test mainboard in real time, and when the working status of the test mainboard is changed from the chip-unplugged state to the chip-inserted state, it determines that a new NFC chip is inserted into the test mainboard, initializes the NFC chip by obtaining the model information of the NFC chip, and performs a functional test on the NFC chip after initialization. Compared with the traditional functional test on multiple models of NFC, the present application can hot-swap the NFC chip on the test mainboard to achieve the effect of quickly testing the NFC chip. There is no need to manually screen the NFC chips of the same model for testing on the test mainboard, nor is there a need to restart the test mainboard every time a new NFC chip is inserted, which improves the test efficiency and convenience of functional testing for multiple models of NFC.

[0081] Based on the above-mentioned overall concept of the function verification method for multiple NFC models of the present application, various embodiments of the function verification method for multiple NFC models of the present application are proposed.

[0082] Please refer to Figure 2 , Figure 2 This is a flowchart of the first embodiment of the function verification method for multiple NFC models of the present application. It should be noted that although the logical order is shown in the flowchart, in some cases, the steps shown or described may be performed in a different order than here.

[0083] In this embodiment, for ease of understanding and explanation, the test terminal is used as the direct execution subject in this embodiment to explain the function inspection method for multiple NFC models of this application.

[0084] like Figure 2 As shown, in this embodiment, the function verification method for multiple NFC models of the present application may include:

[0085] Step S10: real-time monitoring of the working state of the test mainboard, wherein the working state includes a chip insertion state and a chip removal state;

[0086] It should be noted that, in this embodiment, a communication connection is established between the test terminal and the test mainboard. The test mainboard is fixedly placed in a fixture at the test machine. The test mainboard is the mainboard of any NFC device that supports the NFC function, and the test mainboard includes an NFC antenna. Other peripherals are also fixed on the fixture. The test mainboard and the other peripherals are connected by lines. After the test mainboard after the connected lines is inserted with a normal NFC chip, it can provide NFC services by receiving NFC service instructions sent by the test terminal.

[0087] In this embodiment, after startup, the test terminal monitors the working status of the test mainboard in real time, and the working status of the test mainboard includes a chip insertion state in which the NFC chip has been inserted, and a chip removal state in which the NFC chip has not been inserted.

[0088] Step S20: when it is detected that the working state is converted from the chip removal state to the chip insertion state, obtaining the model information of the NFC chip inserted into the test mainboard;

[0089] In this embodiment, when the test terminal detects that the working state of the test mainboard is changed from the chip-pulled-out state to the chip-inserted state, the test terminal immediately obtains the model information of the NFC chip inserted in the test mainboard.

[0090] In addition, when the test terminal detects that the working state of the test mainboard is the chip unplugged state, it determines that no NFC chip is inserted in the test mainboard, and the test terminal and the test mainboard remain on standby; when the test terminal detects that the working state of the test mainboard is the chip inserted state, the test terminal instructs the test host to turn on the NFC service and perform functional tests on multiple NFC models.

[0091] Furthermore, in a feasible embodiment, the function verification method for multiple NFC models of the present application may also include:

[0092] Step a: While obtaining the model information of the NFC chip inserted in the test mainboard, restart the NFC service of the test mainboard.

[0093] In this embodiment, when the test terminal detects that the working state of the test mainboard has changed from the chip-unplugged state to the chip-inserted state, it determines that a new NFC chip to be tested has been inserted into the test mainboard. At this time, the test terminal controls the test mainboard to restart the NFC service. During the restart process, the test terminal detects the model information of the newly inserted NFC chip. After the NFC service is started normally, functional testing of multiple NFC models can be performed.

[0094] Step S30: Initialize the NFC chip according to the model information, and perform a function test on the initialized NFC chip.

[0095] In this embodiment, the test terminal determines the model of the newly inserted NFC chip according to the model information of the chip. The model of the NFC chip can be PN553, PN557, etc. In this embodiment, the model of the NFC chip tested is not limited. After determining the model of the newly inserted NFC chip, the test terminal initializes the NFC chip according to the model and performs a functional test on the NFC chip after initialization.

[0096] Furthermore, in a feasible embodiment, before the above step S30, the function verification method for multiple NFC models of the present application may also include:

[0097] Step S40: downloading preset compatible software to the test mainboard, wherein the compatible software integrates configuration files and firmware files of NFC chips of different models.

[0098] In this embodiment, the test terminal downloads preset compatible software to the test mainboard based on the communication connection between itself and the test mainboard, and the compatible software integrates configuration files and firmware files of NFC chips of different models.

[0099] It should be noted that, in this embodiment, the test mainboard is compatible with different models of NFC chips after loading the compatible software. Specifically, the compatible software contains a database of various NFC chip information, which includes the communication protocol, data format, command set and other information of the NFC chip. The software queries the database as needed to find the communication parameters that match the specific NFC chip and dynamically loads the corresponding driver.

[0100] Compared with the traditional testing scheme that requires downloading corresponding software for different types of NFC chips, in this embodiment, only one set of compatible software is needed to realize functional testing of different types of NFC chips. Testers do not need to screen NFC chip models, which improves testing efficiency and avoids test errors caused by misplacing incompatible chips.

[0101] Based on this, in a feasible embodiment, the step of "initializing the NFC chip according to the model information" in the above step S30 includes:

[0102] Step S301: calling a target configuration file and a target firmware file matching the model information from the compatible software;

[0103] Step S302: Load the target configuration file and the target firmware file into the NFC chip, so that the NFC chip completes initialization according to the target configuration file and the target firmware file.

[0104] In this embodiment, after determining the model of the NFC chip, the test terminal calls the target configuration file and target firmware file that match the NFC chip model information from the compatible software downloaded from the test mainboard, and loads the target configuration file and target firmware file into the NFC chip, so that the NFC chip can complete initialization based on the target configuration file and target firmware file.

[0105] It should be noted that the firmware file refers to a program pre-installed in a hardware device, which is used to control the hardware device and enable it to operate normally. In this embodiment, the firmware file is used to implement various functions and features of NFC, and the firmware file is loaded to ensure that the NFC chip can operate normally as designed; the configuration file is used to set and configure the parameters and properties of the NFC chip. By loading the configuration file, the NFC chip can be initialized, its operating parameters can be adjusted, its communication protocol and data transmission format can be configured, etc., which helps to ensure correct communication and data exchange between the NFC chip and other devices.

[0106] In this embodiment, the embodiment of the present application monitors the working status of the test mainboard in real time, wherein the working status includes a chip insertion status and a chip removal status; when it is detected that the working status is converted from the chip removal status to the chip insertion status, the model information of the NFC chip inserted in the test mainboard is obtained; the NFC chip is initialized according to the model information, and the function of the NFC chip after the initialization is checked.

[0107] In this way, the embodiment of the present application monitors the working status of the test mainboard in real time. When the working status of the test mainboard is changed from the chip-unplugged state to the chip-inserted state, it determines that a new NFC chip is inserted into the test mainboard, initializes the NFC chip by obtaining the model information of the NFC chip, and performs a functional test on the NFC chip after initialization. Compared with the traditional functional test on multiple models of NFC, the present application can hot-swap the NFC chip on the test mainboard to achieve the effect of quickly testing the NFC chip. There is no need to manually screen the NFC chips of the same model for testing on the test mainboard, and there is no need to restart the test mainboard every time a new NFC chip is inserted, thereby improving the test efficiency and convenience of functional testing for multiple models of NFC.

[0108] Furthermore, based on the first embodiment of the function verification method for multiple NFC models of the present application, a second embodiment of the function verification method for multiple NFC models of the present application is proposed.

[0109] In this embodiment, the test mainboard includes a GPIO interface, and the GPIO interface is connected to the peripheral pin of the NFC chip; the above step S10: real-time monitoring of the working status of the test mainboard includes:

[0110] Step S101: monitoring the level change of the GPIO interface in real time, wherein the level change includes pulling up the voltage and pulling down the voltage;

[0111] It should be noted that, in this embodiment, the test mainboard includes a GPIO interface, and the test mainboard is connected to the peripheral pin of the NFC chip through the GPIO interface.

[0112] For example, in a feasible embodiment, as Figure 3 As shown, the test main board is placed in the fixture of the test machine. The test main board includes a GPIO interface. The NFC chip is placed in the NFC small board. The NFC small board is configured with peripheral pins. When the tester tests the NFC chip, the external pins connected to the NFC small board are inserted into the GPIO interface of the test main board. After the NFC small board is plugged into the test main board, the voltage of the GPIO interface is pulled up. The test terminal determines that the NFC chip has been inserted and can start the test program. After completing the test, the tester can hot-swap the next NFC small board to be tested.

[0113] Step S102: when it is detected that the level changes to the pull-up voltage, determining that the working state of the test mainboard is the chip insertion state;

[0114] In this embodiment, the test terminal monitors the level changes of the GPIO interface of the test mainboard in real time. When the level of the GPIO interface is monitored to change from low voltage to high voltage, the test terminal determines that the current working state of the test mainboard is the chip insertion state, that is, the NFC chip has been inserted into the test mainboard. This judgment is based on preset conditions or thresholds to ensure that other unexpected voltage fluctuations will not be misjudged. At this time, the test terminal can start executing the corresponding test program.

[0115] Step S103: when it is detected that the level changes to the pull-down voltage, determining that the working state of the test mainboard is the chip-pulling state.

[0116] In this embodiment, when the test terminal monitors that the level of the GPIO interface changes from high voltage to low voltage, the test terminal determines that the working state of the test mainboard is the chip unplugged state, that is, the NFC chip has been unplugged from the test mainboard. This determination is also based on precise monitoring of the level change and comparison with the preset threshold. At this time, the test terminal can execute resource release or other necessary operations.

[0117] Further, in a feasible embodiment, the above step S20: obtaining the model information of the NFC chip inserted in the test mainboard includes:

[0118] Step S201: sending a query signal to the NFC chip inserted into the test mainboard, so that the NFC chip returns query data corresponding to the query signal;

[0119] In this embodiment, the test terminal sends a query signal to the NFC chip inserted in the test mainboard. The query signal contains necessary information that can trigger a response from the NFC chip, such as instructions for inquiring about the chip model, status, or other relevant information, so that the NFC chip can respond to the query signal and return query data corresponding to the query signal.

[0120] Step S202: extracting the model information of the NFC chip from the query data.

[0121] In this embodiment, the test terminal receives query data returned by the NFC chip. The received query data may contain various information, such as chip model, status, configuration parameters, etc. The test terminal parses and processes these data to extract the required NFC chip model information.

[0122] It should be noted that, in this embodiment, in order to ensure the accuracy of the extracted information, the test terminal may adopt an appropriate parsing algorithm and verification mechanism, which is not specifically limited in this embodiment.

[0123] Further, in a feasible embodiment, the step of "performing a function test on the NFC chip after initialization" in the above step S30 includes:

[0124] Step S303: After detecting that the initialization is completed, executing a preset test program to perform a function test on the NFC chip to obtain a test result;

[0125] Step S304: Visually display the test results through a preset display interface.

[0126] In this embodiment, after monitoring that the NFC chip has been initialized, the test terminal immediately executes a preset test program to perform a functional test on the NFC chip, obtains the test result, and visually displays the test result through a preset display interface.

[0127] Specifically, the test program may include functional test programs and performance test programs, among which the functional test program is used to verify whether the NFC chip can work normally and achieve the expected functions, such as testing of data transmission, communication protocol, security performance, etc. The performance test program mainly tests the performance indicators of the NFC chip such as computing speed, storage capacity, power consumption, etc. The test results displayed through the display interface include key performance indicators such as the response time, data accuracy, and power consumption of the NFC chip.

[0128] For example, the conventional functional inspection process for multiple NFC models is as follows: Figure 4As shown, taking the PN553 model NFC chip as an example, the software corresponding to this model of NFC chip needs to be downloaded to the test mainboard, and the tester needs to screen the NFC board of this model of NFC chip, insert the NFC board into the test host, and then start the test mainboard to perform functional inspections on multiple models of NFC. When replacing the next NFC board after testing the NFC board, the test host needs to restart before the next NFC board can be tested. When there is a problem with the test result, relevant engineers are needed to determine whether the tester mistakenly placed a different model of chip or whether it is a chip problem. The functional inspection process for multiple models of NFC in this embodiment is as follows: Figure 5 As shown, download the compatible software to the test mainboard. The tester can select an NFC board with any type of NFC chip and insert it into the test mainboard, then start the test mainboard, and then detect the model of the inserted NFC chip. After determining the model, start the functional test for multiple NFC models, and replace the next NFC board after testing the NFC board. At this time, restart the NFC service for the monitoring service of the test mainboard's working status, start detecting the model of the NFC chip in the next NFC board, and perform functional tests for multiple NFC models. In this process, the tester does not need to pay attention to the NFC chip model, and can do so without restarting the test mainboard. Just keep hot-plugging the NFC board. After the NFC board is inserted, the next NFC board can be automatically tested.

[0129] Thus, in this embodiment, by real-time monitoring to see whether the NFC board is inserted into the test main board, after detecting that the NFC board is replaced, the NFC service is automatically reset, and the model of the NFC chip is detected after the service is started. By loading the target configuration file and target firmware file that match the chip model, the NFC chip can work normally, and the hot-swappable function of the NFC board is realized, thereby improving the test efficiency and convenience of functional inspection of multiple NFC models.

[0130] In addition, the embodiment of the present application also proposes a function inspection device for multiple models of NFC.

[0131] Please refer to Figure 6 , the present application is directed to a multi-model NFC function inspection device including:

[0132] The status monitoring module 10 is used to monitor the working status of the test mainboard in real time, wherein the working status includes the chip insertion status and the chip removal status;

[0133] The information acquisition module 20 is used to acquire the model information of the NFC chip inserted in the test mainboard when detecting that the working state is changed from the chip unplugging state to the chip inserting state;

[0134] The inspection module 30 is used to initialize the NFC chip according to the model information and perform a function inspection on the NFC chip after the initialization.

[0135] Optionally, the test mainboard includes a GPIO interface, and the GPIO interface is connected to the peripheral pin of the NFC chip; the status monitoring module 10 includes:

[0136] A level monitoring unit, used for monitoring the level change of the GPIO interface in real time, wherein the level change includes pulling up the voltage and pulling down the voltage;

[0137] A first state determination unit, configured to determine that the working state of the test mainboard is the chip insertion state when the level change is detected to be the pull-up voltage;

[0138] The second state determination unit is used to determine that the working state of the test mainboard is the chip removal state when it is detected that the level changes to the pull-down voltage.

[0139] Optionally, the information acquisition module 20 further includes:

[0140] A signal sending unit, used to send a query signal to the NFC chip inserted in the test mainboard, so that the NFC chip returns query data corresponding to the query signal;

[0141] An information extraction unit is used to extract the model information of the NFC chip from the query data.

[0142] Optionally, the function inspection device for multiple NFC models of the present application may also include:

[0143] The software download module is used to download preset compatible software to the test mainboard, wherein the compatible software integrates configuration files and firmware files of NFC chips of different models.

[0144] Optionally, the inspection module 30 includes:

[0145] A file calling unit, used for calling a target configuration file and a target firmware file matching the model information from the compatible software;

[0146] An initialization unit is used to load the target configuration file and the target firmware file into the NFC chip, so that the NFC chip completes initialization according to the target configuration file and the target firmware file.

[0147] Optionally, the inspection module 30 further includes:

[0148] A testing unit, configured to execute a preset testing program to perform a functional test on the NFC chip and obtain a test result after detecting that the initialization is completed;

[0149] The result display unit is used to visually display the test result through a preset display interface.

[0150] Optionally, the function inspection device for multiple NFC models of the present application may also include:

[0151] The service restart module is used to restart the NFC service of the test mainboard while obtaining the model information of the NFC chip inserted in the test mainboard.

[0152] Among them, the functional implementation of each module in the above-mentioned functional inspection device for multi-model NFC corresponds to the steps in the above-mentioned functional inspection method embodiment for multi-model NFC, and its functions and implementation processes are not repeated here one by one.

[0153] In addition, the present application also proposes a storage medium, which is a computer-readable storage medium, and stores a program for functional inspection of multiple models of NFC. When the functional inspection program for multiple models of NFC is executed by a processor, the steps of the functional inspection method for multiple models of NFC of the present application as described above are implemented.

[0154] The specific embodiments of the storage medium of the present application are basically the same as the above-mentioned embodiments of the function inspection method for multiple NFC models, and will not be described in detail here.

[0155] It should be noted that, in this article, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the sentence "comprises a ..." does not exclude the existence of other identical elements in the process, method, article or device including the element.

[0156] The serial numbers of the above-mentioned embodiments of the present application are for description only and do not represent the advantages or disadvantages of the embodiments.

[0157] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present application, or the part that contributes to the prior art, can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk), and includes a number of instructions for a terminal device (which can be a mobile phone, computer, server, air conditioner, or network device, etc.) to execute the methods described in each embodiment of the present application.

[0158] The above are only preferred embodiments of the present application, and are not intended to limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A method for testing the function of multiple NFC models, characterized in that: The method comprises: Real-time monitoring of level changes of a GPIO interface of a test mainboard, wherein the level changes include pulling up a voltage and pulling down a voltage, and the GPIO interface is connected to an external device pin of an NFC chip inserted in the test mainboard; When it is detected that the level changes to the pull-up voltage, determining that the working state of the test mainboard is a chip insertion state; When it is detected that the level changes to the pull-down voltage, determining that the working state of the test mainboard is a chip-pulling state; When detecting that the working state is converted from the chip-unplugged state to the chip-inserted state, obtaining the model information of the NFC chip inserted in the test mainboard, and restarting the NFC service of the test mainboard; Downloading preset compatible software to the test mainboard, wherein the compatible software integrates configuration files and firmware files of NFC chips of different models; Calling a target configuration file and a target firmware file matching the model information from the compatible software; Loading the target configuration file and the target firmware file into the NFC chip, so that the NFC chip completes initialization according to the target configuration file and the target firmware file; After detecting that the initialization is completed, a preset test program is executed to perform a function test on the NFC chip to obtain a test result.

2. The method for testing the function of multiple NFC models as claimed in claim 1, characterized in that: The step of obtaining the model information of the NFC chip inserted in the test mainboard includes: Sending a query signal to the NFC chip inserted in the test mainboard, so that the NFC chip returns query data corresponding to the query signal; The model information of the NFC chip is extracted from the query data.

3. The function inspection method for multiple NFC models as claimed in claim 1, characterized in that: After the step of obtaining the test result, the method further includes: The test results are visually displayed through a preset display interface.

4. A function inspection device for multiple NFC models, characterized in that: The function inspection device for multiple NFC models includes: A status monitoring module, used for real-time monitoring of the level change of the GPIO interface of the test mainboard, wherein the level change includes pulling up the voltage and pulling down the voltage, and the GPIO interface is connected to the peripheral pin of the NFC chip inserted in the test mainboard; When it is detected that the level changes to the pull-up voltage, determining that the working state of the test mainboard is a chip insertion state; When it is detected that the level changes to the pull-down voltage, determining that the working state of the test mainboard is a chip-pulling state; An information acquisition module, configured to acquire the model information of the NFC chip inserted in the test mainboard and restart the NFC service of the test mainboard when detecting that the working state is converted from the chip unplugged state to the chip inserted state; A software download module, used to download preset compatible software to the test mainboard, wherein the compatible software integrates configuration files and firmware files of NFC chips of different models; A file calling module, used for calling a target configuration file and a target firmware file matching the model information from the compatible software; An initialization module, used to load the target configuration file and the target firmware file into the NFC chip, so that the NFC chip completes initialization according to the target configuration file and the target firmware file; The testing module is used to execute a preset test program to perform a function test on the NFC chip after detecting that the initialization is completed, and obtain a test result.

5. A terminal device, characterized in that: The terminal device includes: a memory, a processor, and a function verification program for multi-model NFC stored in the memory and executable on the processor, wherein the function verification program for multi-model NFC, when executed by the processor, implements the steps of the function verification method for multi-model NFC as described in any one of claims 1 to 3.

6. A storage medium, characterized in that: The storage medium is a computer-readable storage medium, on which is stored a function verification program for multiple NFC models. When the function verification program for multiple NFC models is executed by a processor, the steps of the function verification method for multiple NFC models as described in any one of claims 1 to 3 are implemented.

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