A light element detection method and system

Abstract

The present invention relates to a light element detection method and system, so that when detecting light elements, there is no need to seal and evacuate or inflate the relevant area, and the influence of environmental factors on the detection results in the current environment is obtained by detecting external standard samples, and then the detection of the sample to be tested is corrected to improve the accuracy of light element detection. On this basis, the pretreatment process of the sample is simplified, and various types of samples can be detected. For powder samples, accurate detection can be performed without tableting. At the same time, the life of the detector is guaranteed and the use and maintenance cost of the equipment is reduced.

Description

Technical Field

[0001] The present invention belongs to the technical field of optical detection, and in particular relates to a light element detection method and system. Background Art

[0002] X-ray fluorescence (XRF) analysis technology refers to the technology of irradiating the sample to be tested with an X-ray light source such as an X-ray tube, exciting the elements in the sample to be tested and generating characteristic fluorescent X-rays of the elements, detecting and analyzing these characteristic fluorescent X-rays, and then obtaining the content and concentration information of the elements in the sample to be tested. However, for light elements in the periodic table, such as sodium, magnesium, aluminum, silicon, phosphorus, etc., the critical excitation energy of their characteristic fluorescent X-rays is below 2.5keV, which makes the detection accuracy of XRF technology for light elements low.

[0003] The detection accuracy of light elements using XRF technology is low. The main reason is the absorption effect of air. The characteristic fluorescence X-ray energy of light elements is very small and is significantly absorbed by air. Changes in air pressure, temperature, humidity, etc. will cause differences in the absorption of characteristic fluorescence X-rays of light elements, resulting in large errors in light element detection results.

[0004] In order to solve the above problems, there are two commonly used methods in the XRF field. The first method is to seal the space surrounded by the light source outlet, detector, and sample area, and evacuate the sealed space during the measurement process to eliminate the absorption effect of air. The second method is to continuously fill the space surrounded by the light source outlet, detector, and sample area with hydrogen or helium to maintain the hydrogen or helium composition of this space. Since hydrogen or helium has a smaller absorption effect on the characteristic fluorescent X-rays of light elements, the influence of the absorption effect can be reduced.

[0005] However, both of the above methods have disadvantages. The disadvantage of the first method is that the detector window for light element detection applications is generally a polymer material with a thickness of microns. This type of material is generally fragile, so the repeated changes in air pressure in the sealed space during the use of the equipment will reduce the service life of the detector window, and even cause the window to rupture directly. In addition, powder samples must be pressed by a special tablet press before they can be placed in a vacuum environment. Liquid samples cannot be measured in a vacuum environment, and in a sealed space, the influence of sample uniformity and particle size effects cannot be avoided. The disadvantage of the second method is that the gas cost is high, and hydrogen may cause safety hazards. Hydrogen is an explosive gas. For safety reasons, most users cannot accept this method. Although helium is a safe gas, its cost is relatively high. Summary of the invention

[0006] The present invention provides a light element detection method and system, aiming to solve the problem that the air absorption effect affects the detection result when light elements are detected in the prior art.

[0007] In order to solve the above problems, on the one hand, an embodiment of the present invention provides a light element detection method, comprising the following steps:

[0008] Detecting an external standard sample to obtain the content of one or more elements to be measured in the external standard sample under current environmental conditions; the external standard sample includes a sample in which the content of at least one element to be measured is known, or a sample in which the content of at least one adjacent element to be measured in the periodic table is known;

[0009] Initiate detection of the sample to be tested, and obtain the content of one or more elements to be tested in the sample to be tested under current environmental conditions;

[0010] According to the standard value of the content of the element to be measured and the content of one or more elements to be measured in the external standard sample under the current environmental conditions, the content of one or more elements to be measured in the sample to be measured under the current environmental conditions is corrected.

[0011] Optionally, the "testing an external standard sample to obtain the content of one or more elements to be measured in the external standard sample under current environmental conditions; the external standard sample includes a sample whose content of at least one element to be measured is known, or includes a sample whose content of at least one adjacent element to be measured in the periodic table is known" includes the following steps:

[0012] Moving the external standard sample to the detection zone;

[0013] Projecting X-rays toward the detection area to detect the external standard sample for a time period of t1;

[0014] A signal excited from the external standard sample is received, and the content of one or more elements to be measured in the external standard sample is calculated.

[0015] Optionally, the “starting detection of the sample to be tested to obtain the content of one or more elements to be tested in the sample to be tested under current environmental conditions” includes the following steps:

[0016] Moving the sample to be tested to the detection area;

[0017] Projecting X-rays to the detection area to detect the sample for a time t3;

[0018] The signal excited from the external standard sample is received, and the content of one or more elements to be measured in the sample to be measured is calculated.

[0019] Optionally, the “correcting the content of one or more elements to be measured in the sample to be measured under the current environmental conditions according to the standard value of the content of the element to be measured and the content of one or more elements to be measured in the external standard sample under the current environmental conditions” comprises the following steps:

[0020] Calculate the change rate of the detection value of one or more elements to be measured in the external standard sample according to the standard value of the content of the element to be measured and the content of one or more elements to be measured in the external standard sample under current environmental conditions;

[0021] The expression of the detection value change rate is as follows:

[0022] ;

[0023] in, is the standard value of the content of the element to be measured, is the content of the element to be measured in the external standard sample under the current environmental conditions;

[0024] According to the detection value change rate, the content of one or more elements to be measured in the sample to be measured under the current environmental conditions is corrected, and the correction expression is as follows:

[0025] ;

[0026] in, is the content of the element to be tested in the sample to be tested under the current environment, is the result after correction.

[0027] Optionally, also include:

[0028] For one or more elements to be measured, a linear relationship between the net intensity and the content of the elements to be measured is established.

[0029] Optionally, the detection method for the external standard sample or the sample to be tested is:

[0030] Obtaining the net intensity of characteristic fluorescent X-rays of one or more elements to be measured;

[0031] The content of one or more elements to be measured is calculated according to the linear relationship between the net intensity and the content of the elements to be measured.

[0032] Optionally, the light element detection method is implemented by the following detection system, the detection system includes a sample placement platform, a light source device, a detection device and a control module, and the control module controls the connection between the sample placement platform, the light source device and the detection device;

[0033] The light element detection method specifically comprises the following steps:

[0034] The control module controls the start of detection of the external standard sample, the light source device emits X-rays to the sample placement platform, and the detection device obtains the content of one or more elements to be measured in the external standard sample under current environmental conditions;

[0035] The control module controls the sample placement platform to switch between the external standard sample and the sample to be tested; the control module controls the start of the detection of the sample to be tested, the light source device emits X-rays to the sample placement platform, and the detection device obtains the content of one or more elements to be tested in the sample to be tested under the current environmental conditions;

[0036] The control module corrects the content of one or more elements to be measured in the sample to be measured under the current environmental conditions obtained by the detection device according to the standard value of the content of the element to be measured and the content of one or more elements to be measured in the external standard sample under the current environmental conditions obtained by the detection device.

[0037] Optionally, the detection method of the external standard sample and the sample to be tested is that a driving device drives the sample placement position to move linearly, and scanning detection is achieved through relative movement between the sample placement position and the detection device.

[0038] Optionally, it also includes: a driving device driving the sample placement position to rotate, and a driving device driving the sample placement position to move linearly, so as to cooperate with the rotation of the sample placement position to realize spiral scanning detection.

[0039] In order to solve the above problems, on the other hand, an embodiment of the present invention provides a detection system, including a control module, the control module including a processor and a memory, the memory is used to store instructions, when the instructions are executed by the processor, the control module executes the above light element detection method.

[0040] The light element detection method and system provided in the embodiment of the present invention can detect light elements without sealing, vacuuming or inflating the relevant area. The influence of environmental factors in the current environment on the detection results can be obtained by detecting external standard samples, and then the detection of the sample to be tested can be corrected to improve the accuracy of light element detection. On this basis, the pretreatment process of the sample is simplified, and various types of samples can be detected. Powder samples can be accurately detected without tableting. At the same time, the life of the detector is guaranteed and the use and maintenance cost of the equipment is reduced. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] Figure 1 The structure of the XRF detection system provided by one embodiment of the present invention is shown in FIG. Figure 1 ;

[0042] Figure 2The structure of the XRF detection system provided by one embodiment of the present invention is shown in FIG. Figure 2 ;

[0043] Figure 3 It is a structural schematic diagram of a sample placement platform provided by an embodiment of the present invention;

[0044] Figure 4 is a schematic structural diagram of a first supporting member of a sample placement platform provided by an embodiment of the present invention;

[0045] Figure 5 is a schematic structural diagram of a second supporting member of a sample placement platform provided by an embodiment of the present invention;

[0046] Figure 6 It is a schematic structural diagram of a turntable of a sample placement platform provided by an embodiment of the present invention;

[0047] Figure 7 It is a structural schematic diagram of a first driving module of a sample placement platform provided by an embodiment of the present invention;

[0048] Figure 8 It is a schematic diagram of the back structure of a sample placement platform provided by an embodiment of the present invention;

[0049] Fig. 9 It is a structural schematic diagram of a third driving module of a sample placement platform provided in one embodiment of the present invention;

[0050] Fig.10 It is a structural schematic diagram of a sample placement module of a sample placement platform provided by an embodiment of the present invention;

[0051] Fig.11 It is a schematic diagram of a flow chart of a detection method provided by an embodiment of the present invention;

[0052] Fig.12 is a schematic diagram of a scanning detection path according to an embodiment of the present invention.

[0053] The reference numerals in the specification are as follows:

[0054] 100. Sample placement platform;

[0055] 10. Sample placement platform;

[0056] 20. light source device; 201. X-ray tube; 202. crystal;

[0057] 30. Detection device;

[0058] 110. Inspection area

[0059] 1. first support member; 11. ring hole; 12. first support plate; 13. second support plate; 14. third support plate; 15. fourth support plate; 16. handle; 1a. second light-transmitting area;

[0060] 2. second support member; 21. first groove; 22. mounting groove; 23. travel switch; 2a. detection window;

[0061] 3. Turntable; 31. Mounting hole; 3a. Third light transmission area;

[0062] 4. First driving module; 41. First driving member; 42. Friction wheel; 43. First guide assembly;

[0063] 5. Second driving module; 51. Second driving member; 52. First transmission mechanism; 53. First transmission wheel; 54. Second transmission wheel; 55. First flexible member; 56. First tensioning wheel; 57. First mounting block; 571. First long strip hole;

[0064] 6. Third drive module; 61. Third drive member; 62. Second transmission mechanism; 63. Third transmission wheel; 64. Fourth transmission wheel; 65. Second flexible member; 66. Second tensioning wheel; 67. Second mounting block; 68. Third mounting block;

[0065] 7. Sample placement position; 71. Sample cup; 72. Cup holder; 721. Second connection hole; 73. Base; 731. First connection hole; 722. First section hole; 723. Second section hole; 7a. First light transmission area;

[0066] 8. Photoelectric switch;

[0067] 9. Test piece. DETAILED DESCRIPTION

[0068] In order to make the technical problems, technical solutions and beneficial effects solved by the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0069] The light element detection method provided in this application mainly includes the following steps:

[0070] The external standard sample is tested to obtain the content of one or more elements to be measured in the external standard sample under the current environmental conditions; the external standard sample includes a sample whose content of at least one element to be measured is known, or a sample whose content of at least one adjacent element to be measured in the periodic table is known; the adjacent element refers to an element whose number of interval elements between the element to be measured and the element to be measured is less than or equal to 5 in the order of the periodic table.

[0071] Start the detection of the sample to be tested and obtain the content of one or more elements to be tested in the sample to be tested under the current environmental conditions.

[0072] According to the standard value of the content of the element to be measured and the content of one or more elements to be measured in the external standard sample under the current environmental conditions, the content of one or more elements to be measured in the sample to be measured under the current environmental conditions is corrected.

[0073] The light element detection method provided in the present application is applied to a detection system, in particular to an XRF detection system. The basic requirement for the detection system is to be able to realize detection switching of multiple samples.

[0074] Exemplarily, the XRF detection system includes a sample placement platform, a light source device, a detection device and a control module. The sample placement platform includes a driving device, and the control module controls the connection between the sample placement platform, the light source device and the detection device;

[0075] The sample placement platform is provided with at least two sample placement positions for placing external standard samples and samples to be tested, and the driving device drives the sample placement platform to realize the switching between the external standard samples and the samples to be tested;

[0076] The light source device and the detection device are arranged below the sample placement platform. The light source device includes an X-ray tube and a crystal for projecting monochromatic X-rays. The detection device includes a detector for receiving the signal excited by the sample on the sample placement position. The control module executes computer program instructions to control the implementation of the XRF-based light element detection method. Specifically:

[0077] The control module controls the start of the detection of the external standard sample, the light source device emits X-rays to the sample placement platform, and the detection device obtains the content of one or more elements to be measured in the external standard sample under the current environmental conditions;

[0078] The control module controls the sample placement platform to switch between the external standard sample and the sample to be tested;

[0079] The control module controls the start of the detection of the sample to be tested, the light source device emits X-rays to the sample placement platform, and the detection device obtains the content of one or more elements to be tested in the sample to be tested under the current environmental conditions;

[0080] The control module corrects the content of one or more elements to be measured in the sample to be measured under the current environmental conditions obtained by the detection device according to the standard value of the content of the elements to be measured and the content of one or more elements to be measured in the external standard sample under the current environmental conditions obtained by the detection device.

[0081] The driving device is also used to drive the sample placement position to move linearly, and the scanning detection is realized through the relative movement between the sample placement position and the detection device.

[0082] The driving device is also used to drive the sample placement position to rotate. The driving device drives the sample placement position to move linearly, and cooperates with the rotation of the sample placement position to achieve spiral scanning detection.

[0083] As an implementation method, the light element detection method is specifically as follows:

[0084] Perform a scanning test on the external standard sample for a duration of t1 to obtain an X-ray energy spectrum of the external standard sample, and calculate the content of one or more elements to be measured in the external standard sample under current environmental conditions based on the X-ray energy spectrum of the external standard sample;

[0085] According to the standard value of the content of the element to be measured (obtained from the standard sample, the standard sample refers to a sample with a known content of the element to be measured prepared by, for example, industry standards, and the external standard sample described in this application can also directly use the standard sample), calculate the detection value change rate of one or more elements to be measured in the external standard sample;

[0086] Start scanning and testing the sample to be tested within time t2, the testing time of the sample to be tested is t3, obtain the X-ray energy spectrum of the sample to be tested, and calculate the content of one or more elements to be tested in the sample to be tested under the current environmental conditions using a preset method according to the X-ray energy spectrum of the sample to be tested;

[0087] According to the detection value change rate, the content of one or more elements to be measured in the sample to be measured under the current environmental conditions is corrected.

[0088] Before testing the t1 duration of the external standard sample, it also includes:

[0089] Select external standard samples according to the samples to be tested. The external standard samples include samples with a known content of at least one element to be tested, or samples with a known content of at least one adjacent element to be tested in the periodic table. Put the screened external standard samples together with the samples to be tested into different sample placement positions in the XRF detection system for subsequent testing.

[0090] According to the known standard value of the content of the element to be measured in the external standard sample, the specific method of calculating the change rate of the detection value of one or more elements to be measured in the external standard sample is:

[0091] ;

[0092] in, is the standard value of the known content of the element to be measured in the external standard sample, It is the content of the element to be measured in the external standard sample under the current environmental conditions.

[0093] According to the detection value change rate, the specific method of correcting the content of one or more elements in the sample under the current environmental conditions is as follows:

[0094] ;

[0095] in, is the content of the element to be tested in the sample to be tested under the current environment, This is the result after correction for the element to be measured.

[0096] As an implementation method, the standard value of the content of the element to be measured can be used. , and the content of one or more elements to be measured in the external standard sample under the current environmental conditions obtained by the detection device , the content of one or more elements in the sample under the current environmental conditions obtained by the detection device The specific method is:

[0097] .

[0098] The preset method in the above steps specifically includes:

[0099] According to one or more elements to be measured, obtaining energy spectra of at least three standard samples with different contents of the elements to be measured;

[0100] Obtain the net intensity of characteristic fluorescent X-rays of the element to be tested;

[0101] Establish a linear relationship between net intensity and the content of the element to be measured.

[0102] That is, for one or more elements to be measured, a linear relationship between the net intensity of the elements to be measured (ie, the net intensity of the characteristic fluorescent X-rays of the elements to be measured) and the content is established.

[0103] According to the X-ray energy spectrum of the sample to be tested, the content of one or more elements to be tested in the sample to be tested under the current environmental conditions is calculated by a preset method, including the following steps:

[0104] Obtaining the net intensity of characteristic fluorescent X-rays of one or more elements to be tested in the sample to be tested;

[0105] According to the linear relationship between the net intensity and the content of the element to be tested, the content of one or more elements to be tested in the sample to be tested is calculated.

[0106] In the above process, the detection time t1 is equal to the detection time t3, or is substantially equal after normalization in a subsequent step.

[0107] As an implementation method, combined with a specific hardware structure, such as Figures 1 to 12As shown, the XRF detection system 100 includes a sample placement platform 10, a light source device 20 and a detection device 30; wherein the sample placement platform 10 includes a controller, a first support member 1, a second support member 2, a turntable 3, a first drive module 4, a second drive module 5, a third drive module 6 and a plurality of sample placement positions 7. The controller controls the connection of the first drive module 4, the second drive module 5 and the third drive module 6 to control the speed and direction of movement of each drive module. The first support member 1 is movably connected to the second support member 2, and the second support member 2 can move linearly relative to the first support member 1. The turntable 3 is mounted on the second support member 2 and can rotate relative to the second support member 2 around its own axis. Each sample placement position 7 can be rotatably mounted on the turntable 3, and the sample placement position 7 is used to place the sample. The first drive module 4 is used to drive the second support member 2 to move linearly relative to the first support member 1. The second drive module 5 is used to drive the turntable 3 to rotate relative to the second support member 2. The third drive module 6 is used to drive each sample placement position 7 to rotate relative to the turntable 3. The controller is not shown in the figure. When the connection relationship is determined, technicians in this field can adjust the setting position of the controller. The functions related to the controller can also be integrated into the control module of the XRF detection system.

[0108] The multiple sample placement positions 7 include external standard sample placement positions and test sample placement positions. The external standard sample placement positions are used to place external standard samples, and the test sample placement positions are used to place test samples. The second support member 2 can move relative to the first support member 1, so that each sample placement position 7 can be moved to the detection area 110 in sequence. The light source device 20 is used to project monochromatic focused X-rays to the detection area 110 to irradiate the sample on the sample placement position 7 of the detection area 110; the detection device 30 is used to receive the signal excited by the sample on the sample placement position 7 of the detection area 110. Figure 1 and Figure 2 The area indicated by A is the monochromatic focused X-ray emitted by the X-ray tube 201 and after passing through the crystal 202 .

[0109] When one sample placement position 7 moves to the detection area 110, the sample placement position 7 corresponds to the detection area 110, wherein when one sample placement position 7 corresponds to the detection area 110, other sample placement positions 7 do not correspond to the detection area 110. Specifically, the second support member 2 is provided with a detection window 2a, and each sample placement position 7 is provided with a first light-transmitting area 7a, and the first light-transmitting area 7a of each sample placement position 7 can be switched to correspond to the detection window 2a in sequence.

[0110] The controller can control the first drive module driver 4 to drive the second support member 2 to move linearly, and cooperate with the third drive module 6 to drive the sample placement position 7 to rotate, so that the light spot starts from the center position of the detection window 2a and performs a circular scan of the detection window 2a radially outward, thereby increasing the irradiation area of ​​the light spot on the sample surface and improving the detection accuracy of the sample.

[0111] Each sample placement position 7 can rotate around its own axis relative to the turntable 3. The third driving module 6 drives the sample placement position 7 to rotate relative to the turntable 3, which actually drives the sample placement position 7 to rotate around its own axis relative to the turntable 3.

[0112] The sample placement positions 7 are sequentially arranged around the axis of the turntable 3, and when the second driving module 5 drives the turntable 3 to rotate relative to the second support member 2, the first light-transmitting areas 7a of the sample placement positions 7 can be sequentially switched to correspond to the detection window 2a. When the first light-transmitting area 7a of one sample placement position 7 corresponds to the detection window 2a, the first light-transmitting areas 7a of other sample placement positions 7 do not correspond to the detection window 2a.

[0113] In one embodiment, if Fig.12 As shown, the scanning mode of the detection window 2a is to perform an annular scanning of the detection window 2a radially outward from the center of the detection window 2a with the light spot. As another embodiment, the detection window 2a can be scanned with intervals in conjunction with the flashing of the light spot.

[0114] When working, when the first driving module 4 of the sample placement platform 10 drives the second support member 2 to move linearly relative to the first support member 1, it can simultaneously drive the turntable 3 and the sample placement position 7 installed on the turntable 3 to move linearly relative to the first support member 1; when the turntable 3 rotates around its own axis (the axis is defined as the first axis) relative to the second support member 2, it can simultaneously drive each sample placement position 7 to rotate around the first axis; when the sample placement position 7 rotates around its own axis (the axis is defined as the second axis), it can simultaneously drive the sample placed thereon to rotate around the second axis.

[0115] When the sample placement platform 10 is applied to the XRF detection system 100, the first support member 1 is usually fixed on the corresponding support device. After the light emitted by the light source device irradiates the sample placed on the sample placement position 7, for some powdered samples or liquid samples, the sample placement position 7 can be driven to move linearly by the first driving module 4 to adjust the detection position of the sample irradiated by the light spot, and the rotation of the sample placement position 7 can be coordinated to realize the scanning of the sample detection surface by the light spot, which can also be understood as realizing the scanning of the detection window 2a. When the sample is driven to move by the first driving module 4 and the third driving module 6, the irradiation area of ​​the light source device on the sample surface can be increased to improve the detection accuracy of the sample.

[0116] The first support member 1 is a frame structure, which includes a first support plate 12, a second support plate 13, a third support plate 14 and a fourth support plate 15 connected end to end in sequence. It is defined that the first support plate 12 and the third support plate 14 are arranged at intervals along the first direction, and the second support plate 13 and the fourth support plate 15 are arranged at intervals along the second direction. When in use, the second direction can be perpendicular to the first direction, and the second direction is also perpendicular to the vertical direction.

[0117] The second support member 2 is a plate-like structure, and the turntable 3 is a disk. The second support member 2 is provided with a mounting groove 22, and the turntable 3 is mounted in the mounting groove 22, and the mounting groove 22 is arranged on the upper surface of the second support member 2. The turntable 3 is mounted in the mounting groove 22, which may mean that: a part of the turntable 3 is located in the mounting groove 22; or, the turntable 3 is completely located in the mounting groove 22; or, at least a part of the connecting member for connecting the turntable 3 and the second support member 2 is located in the mounting groove 22, wherein the connecting member includes bearings and other parts.

[0118] The turntable 3 is provided with a mounting hole 31 , and the sample placement position 7 is installed in the mounting hole 31 . There are multiple mounting holes 31 , and one sample placement position 7 can be installed in each mounting hole 31 .

[0119] The first driving module 4 includes a first driving member 41 and a friction wheel 42; one of the first support member 1 and the second support member 2 can be connected to the first driving member 41, the power output end of the first driving member 41 is connected to the friction wheel 42, and the other of the first support member 1 and the second support member 2 is in friction contact with the friction wheel 42, so that the first support member 1 and the second support member 2 can move relative to each other through friction.

[0120] The first driving member 41 is mounted on the second supporting member 2, and the power output end of the first driving member 41 is connected to the friction wheel 42, which is used to drive the friction wheel 42 to rotate around its own axis. In addition, the friction wheel 42 is in friction contact with the first supporting member 1; when the friction wheel 42 rotates around its own axis, friction force is generated between the friction wheel 42 and the first supporting member 1, and this friction force drives the second supporting member 2 to move relative to the first supporting member 1. In other embodiments, the first driving member 41 can also be mounted on the first supporting member 1, and in this case, the friction wheel 42 is in friction contact with the second supporting member 2.

[0121] The first driving member 41 may be a motor, such as a stepping motor, a servo motor, etc. At this time, the power output end of the first driving member 41 is the main shaft of the motor.

[0122] In one embodiment, the first support member 1 further has a friction block 17, and the friction wheel 42 rubs against the friction block 17 to drive the second support member 2 to move linearly. The friction block 17 can be installed on the fourth support plate 15 and rub against the side of the friction wheel 42.

[0123] The first driving module 4 further includes a first guide assembly 43, through which the first support member 1 and the second support member 2 are connected, and the first guide assembly 43 guides the linear motion of the second support member 2 relative to the first support member 1. In the scenario where the first support member 1 is an annular structure, the fixed portion of the first guide assembly 43 is mounted on the inner side wall of the first support member 1, and the movable portion of the first guide assembly 43 is mounted on the second support member 2. The movable portion can linearly move relative to the fixed portion along the first direction.

[0124] The second driving module 5 includes a second driving member 51 and a first transmission mechanism 52. The second driving member 51 is mounted on the second supporting member 2. The first transmission mechanism 52 is respectively connected to the second driving member 51 and the rotating disk 3. The first transmission mechanism 52 includes a first transmission wheel 53 and a first flexible member 55. The power output end of the second driving member 51 is connected to the first transmission wheel 53, and the first transmission wheel 53 is connected to the rotating disk 3 through the first flexible member 55. When the second driving member 51 drives the first transmission wheel 53 to rotate, the rotating disk 3 can be driven to rotate through the first flexible member 55.

[0125] The first transmission mechanism 52 further includes a second transmission wheel 54, which is connected to the rotating disk 3, and a first flexible member 55 connects the first transmission wheel 53 and the second transmission wheel 54. In addition, the axis of the first transmission wheel 53 may be parallel to the first axis, and the second transmission wheel 54 is coaxially arranged with the rotating disk 3. During operation, the first driving member 41 drives the first transmission wheel 53 to rotate, and then drives the second transmission wheel 54 to rotate through the first flexible member 55, thereby transmitting the driving force to the rotating disk 3, so that the rotating disk 3 rotates around its own axis.

[0126] The first flexible member 55 is a belt. In this case, the first transmission mechanism 52 is a belt transmission mechanism. The first transmission wheel 53 and the second transmission wheel 54 can both be synchronous wheels.

[0127] The first transmission mechanism 52 further includes a first tensioning wheel 56, which is mounted on the second support member 2 and is used to tension the first flexible member 55. The first tensioning wheel 56 can be mounted on the outside of the first flexible member 55, or the first tensioning wheel 56 can also be arranged on the inside of the first flexible member 55.

[0128] The third driving module 6 comprises a third driving member 61 and a second transmission mechanism 62 . The third driving member 61 is mounted on the turntable 3 . The second transmission mechanism 62 is respectively connected to the third driving member 61 and each sample placement position 7 .

[0129] The second transmission mechanism 62 includes a third transmission wheel 63 and a second flexible member 65. The power output end of the third driving member 61 is connected to the third transmission wheel 63, and the third transmission wheel 63 is transmission-connected to each sample placement position 7 through the second flexible member 65. After the torque output by the third driving member 61 is transmitted to the third transmission wheel 63, it is transmitted to each sample placement position 7 through the second flexible member 65, thereby causing each sample placement position 7 to rotate around its own axis.

[0130] The second transmission mechanism 62 also includes a fourth transmission wheel 64, and the number of the fourth transmission wheels 64 is multiple, and one fourth transmission wheel 64 is connected to one sample placement position 7; the first flexible member 55 connects the third transmission wheel 63 and each fourth transmission wheel 64. During operation, the third driving member 61 drives the third transmission wheel 63 to rotate, and then drives each fourth transmission wheel 64 to rotate through the second flexible member 65, and then transmits the driving force to each sample placement position 7, so that each sample placement position 7 is distributed and rotates around its own axis. In addition, the axes of the third transmission wheel 63 and each fourth transmission wheel 64 can be parallel to the first axis, and one fourth transmission wheel 64 is coaxially arranged with the sample placement position 7 connected thereto.

[0131] The second flexible member 65 is a belt, and the second transmission mechanism 62 is a belt transmission mechanism. The third transmission wheel 63 and each fourth transmission wheel 64 can be synchronous wheels. The third driving member 61 can be a motor, such as a stepping motor, a servo motor, etc.

[0132] The second transmission mechanism 62 further includes a second tensioning wheel 66 . The second tensioning wheel 66 is mounted on the rotating disk 3 and is used for tensioning the second flexible member 65 .

[0133] The sample placement positions 7 are evenly arranged around the axis of the turntable 3 , and the center of mass of the second driving module 5 is located on the axis of the turntable 3 , so that the turntable 3 can rotate more smoothly.

[0134] The first support member 1 is provided with a second light-transmitting area 1a, and the turntable 3 is provided with a third light-transmitting area 3a; the first light-transmitting area 7a, the second light-transmitting area 1a, the third light-transmitting area 3a and the detection window 2a are opposite to each other, wherein the four are opposite to each other to form a light channel, and the X-rays emitted by the light source device can be irradiated onto the sample from the light channel.

[0135] Among them, the second light-transmitting area 1a can be a first light-transmitting hole that penetrates the first support member 1 along the vertical direction. Among them, in the scenario where the first support member 1 is a ring structure, the first light-transmitting hole is a part of the ring hole 11 of the first support member 1.

[0136] The detection window 2a may be a second light-transmitting hole that passes through the second support member 2 in the vertical direction. The third light-transmitting area 3a may be a third light-transmitting hole that passes through the turntable 3 in the vertical direction. There are multiple third light-transmitting areas 3a, and one first light-transmitting area 7a corresponds to at least one third light-transmitting area 3a. In the scenario where the turntable 3 is provided with a mounting hole 31, the mounting hole 31 is the third light-transmitting hole, and the mounting hole 31 passes through the turntable 3 along the first axis.

[0137] There is only one detection window 2a. When a sample on a sample placement position 7 needs to be detected, the turntable 3 is driven to rotate so that the first light-transmitting area 7a on the sample placement position 7 and the third light-transmitting area 3a corresponding to the first light-transmitting area 7a are rotated to face the detection window 2a.

[0138] The sample placement position 7 includes a sample cup 71 and a base 73; the base 73 is rotatably connected to the turntable 3, the sample cup 71 is detachably mounted on the base, and the first light-transmitting area is arranged below the sample cup 71, and the first light-transmitting area is used to allow light to irradiate the sample in the sample cup 71. The base 73 can be mounted in the mounting hole 31, and the base 73 can be in contact with the upper surface of the turntable 3 (i.e., the surface of the turntable 3 away from the second support member 2).

[0139] The base 73 rotates relative to the turntable 3, that is, the sample placement position 7 rotates relative to the turntable 3. The axis of rotation of the base 73 relative to the turntable 3 is the axis of the sample placement position 7. When the base 73 rotates relative to the turntable 3, the sample cup 71 can be driven to rotate relative to the turntable 3. In addition, the base 73 can be rotatably connected to the turntable 3 through a bearing. The base 73 and the fourth transmission wheel 64 can be integrally arranged, that is, the circumferential surface of the base 73 is provided with a groove for connecting the flexible member.

[0140] A first light-transmitting area 7a is provided below the sample cup 71 so that the X-rays can irradiate the sample in the sample cup 71. The first light-transmitting area 7a can be an area of ​​the sample cup 71 opposite to the second hole 723.

[0141] In other embodiments, the cup holder 72 and the base 73 may also be integrally formed.

[0142] The sample placement platform 10 is also provided with a position sensor, which is used to detect the rotation position of the turntable 3. The position sensor includes a photoelectric switch 8 and a detection sheet 9, which is used to feedback the position state of the turntable 3. A plurality of detection sheets 9 are provided on the turntable, and the detection sheets 9 can be detected by the photoelectric switch 8 to determine the position of the turntable 3.

[0143] In one embodiment, each detection sheet 9 corresponds to a sample placement position 7 .

[0144] In one embodiment, the sample placement platform 10 is further provided with a travel switch 23 . The travel switch 23 is provided on the second support member 2 . The travel switch 23 is used to indicate a reset position of the second support member 2 in linear motion relative to the first support member 1 .

[0145] According to the above architecture, the detection process is as follows Fig.11 As shown, the specific steps include:

[0146] Step S1: moving the external standard sample placement position to the detection area 110 of the first support member 1 ; wherein an external standard sample is placed on the external standard sample placement position, and at this time the external standard sample is located in the detection area 110 .

[0147] Step S2: Control the light source device 20 to project X-rays to the detection area 110 to irradiate the external standard sample on the external standard sample placement mold located in the detection area 110; specifically, the control module controls the light source device 20 to work, so that the light source device 20 projects monochromatic focused X-rays to the external standard sample located in the detection area 110, and receives the signal excited from the external standard sample through the detection device 30 to detect the element content in the external standard sample. The above detection is performed by scanning detection, and the detection time is t1.

[0148] Step S3: controlling the detection device 30 to receive the light signal excited by the external standard sample located in the detection area 110, and to obtain the detection value of the element content in the external standard sample.

[0149] Step S4: Obtain the change rate of the element content according to the detected value of the element content of the external standard sample and the actual value (standard value) of the element content of the external standard sample.

[0150] The specific method for calculating the change rate of the detection value of one or more elements to be measured in the external standard sample is:

[0151] ;

[0152] in, is the standard value of the known content of the element to be measured in the external standard sample, It is the content of the element to be measured in the external standard sample under the current environmental conditions.

[0153] Step S5: Move the sample placement position to be tested to the detection area 110 of the first support member 1; specifically, start the detection of the sample to be tested within time t2, and combined with the above structure, complete the switching of different sample placement positions 7 within time t2.

[0154] Step S6: controlling the light source device 20 to project X-rays toward the detection area 110 to irradiate the sample to be detected on the sample placement mold in the detection area 110;

[0155] Step S7: Control the detection device 30 to receive the light signal excited by the sample to be tested located in the detection area 110, and obtain the detection value of the element content in the sample to be tested; specifically, the detection time of the sample to be tested is t3, and the X-ray energy spectrum of the sample to be tested is obtained. According to the X-ray energy spectrum of the sample to be tested, a preset method is used to calculate the content of one or more elements to be tested in the sample to be tested under the current environmental conditions.

[0156] Step S8: Obtain the actual value of the element content of the sample to be tested according to the detection value of the element content of the sample to be tested and the change rate of the element content. Specifically, according to the change rate of the detection value, the specific method of correcting the content of one or more elements to be tested in the sample to be tested under the current environmental conditions is:

[0157] ;

[0158] in, is the content of the element to be tested in the sample to be tested under the current environment, This is the result after correction for the element to be measured.

[0159] The above preset methods include:

[0160] According to one or more elements to be measured, obtaining energy spectra of at least three standard samples with different contents of the elements to be measured;

[0161] Obtain the net intensity of characteristic fluorescent X-rays of the element to be tested;

[0162] Establish a linear relationship between net intensity and the content of the element to be measured.

[0163] According to the X-ray energy spectrum of the sample to be tested, the content of one or more elements to be tested in the sample to be tested under the current environmental conditions is calculated by a preset method, including the following steps:

[0164] Obtaining the net intensity of characteristic fluorescent X-rays of one or more elements to be tested in the sample to be tested;

[0165] According to the linear relationship between the net intensity and the content of the element to be tested, the content of one or more elements to be tested in the sample to be tested is calculated.

[0166] The above steps are executed under the control of the control module. Specifically, in step S1 and step S5, the control module controls the driving module 4 to work so as to drive the second support member 2 to rotate, thereby moving the external standard sample placement position or the test sample placement position to the detection area 110; in step S2 and step S6, the control module light source device 20 works to project light to the detection area 110; in step S3 and step S7, the control module controls the detection device 30 to work so as to receive X-rays excited from the sample, and the detection device 30 can obtain according to the light; in step S4 and step S8, the calculation of the element content change rate and the calculation of the actual value of the element content of the sample to be tested can be performed by the control module.

[0167] In addition, the actual value (standard value) of the element content of the external standard sample may be pre-measured and stored in a storage area of ​​the control module.

[0168] It should be understood that steps S1, S2, S3 and S4 belong to the step of determining the rate of change of element content, steps S5, S6 and S7 belong to the step of detecting the element content of the sample to be tested, and step S8 belongs to the step of calculating the actual value of the element content of the sample to be tested, wherein the sequence of the step of determining the rate of change of element content and the step of detecting the element content of the sample to be tested can be adjusted according to actual needs, that is, during operation, the step of determining the rate of change of element content can be executed first, and then the step of detecting the element content of the sample to be tested can be executed; or, the step of detecting the element content of the sample to be tested can be executed first, and then the step of determining the rate of change of element content can be executed.

[0169] In the above embodiment, the target material of the X-ray tube 201 is chromium, and the strongest part of the X-rays emitted by the X-ray tube 201 is the characteristic fluorescent X-ray of its target material, with an energy of 5.4 keV. After diffraction by the crystal 2, monochromatic focused X-rays with an energy of 5.4 keV are obtained. This energy is close to the critical excitation energy of light elements, and can efficiently excite the light elements in the sample.

[0170] In the above embodiment, t1 is 60 seconds and t3 is 60 seconds. t1 and t3 may also be different, and the detection time may be adjusted according to actual conditions after subsequent normalization processing.

[0171] In the above embodiment, the range of t2 is 0 to 5 seconds, and the shorter t2 is, the better, which is related to the hardware facilities of the detection system.

[0172] In the above embodiment, the scanning detection method is:

[0173] Controlling the first driving module to drive the second supporting member to move linearly in one direction to an extreme position;

[0174] Controlling the first driving module to reverse, and then driving the second supporting member to move a first distance at a first speed, so that the X-ray spot emitted by the light source device is irradiated to the center position of the detection window;

[0175] Controlling the third driving module to drive the sample placement module to rotate at a constant speed;

[0176] The first driving module is controlled to reverse, and then the second supporting member is driven to move a second distance at a second speed, so that the X-ray spot scans the detection window.

[0177] In one embodiment, the sample to be tested is placed in the sample placement module 7, and the specific detection method is:

[0178] (1) The controller controls the first drive module 4. The first drive member 41 drives the second support member 2 to move in the direction of the travel switch 23 at a speed v1 (first speed). When the travel switch 23 hits the first support plate 12 and is triggered, the controller receives a signal that the second support member 2 has reached the limit position in that direction.

[0179] (2) The controller controls the first driving member 41 to reverse direction, thereby controlling the second supporting member 2 to move a distance D1 (a first distance) in the opposite direction of the travel switch 23 at a speed v1, so that the X-ray spot emitted by the light source device is irradiated to the center position of the detection window 2a.

[0180] (3) The controller controls the third driving module 6, and the third driving member 61 drives the sample placement module 7 to rotate at a constant speed v3.

[0181] (4) The controller controls the first driving member 41 to reverse again, and then drives the second supporting member 2 to move a distance D2 (a second distance) at a speed v2 (a second speed), so that the X-ray spot scans the detection window 2 a.

[0182] The second speed v2 is smaller than the first speed v1, and the second distance D2 is smaller than the first distance D1.

[0183] Before each measurement process begins, first perform steps (1) and (2) to move the second support member 2 so that the light spot of the X-ray light source is irradiated at the center of the detection window 2a. Then perform steps (3) and (4) to complete the scanning of the sample surface by the light spot of the X-ray light source. The scanning simulation effect of the light spot of the monochromatic X-ray light source on the sample surface is shown in FIG. Fig. 9 As shown. Under the premise that the position of the sample placement platform 10 relative to the X-ray light source remains fixed, the second support member 2 moves linearly relative to the first support member 1, and each sample placement module 7 rotates relative to the turntable 3, so as to realize the scanning of the monochromatic X-ray light source on the sample surface, and the scanning covers the entire circular area of ​​the sample surface.

[0184] The light element detection method proposed in this application has two basic hardware requirements. Level 1 is to have multiple sample positions and be able to switch samples. The core steps of the light element detection method can be achieved based on level 1. Level 2 is that the hardware structure can achieve scanning detection of samples. Based on level 2, the light element detection method can be further improved. Therefore, the structure of the detection system in the above embodiment is variable, and the focus is on achieving the requirements of the above levels 1 and 2.

[0185] The division of modules in the embodiments of the present application is schematic and is only a logical function division. There may be other division methods in actual implementation. In addition, each functional module in each embodiment of the present application may be integrated into a processor, or may exist physically separately, or two or more modules may be integrated into one module. The above-mentioned integrated modules may be implemented in the form of hardware or in the form of software functional modules.

[0186] The light element detection method provided in the present application can be implemented in whole or in part by software, hardware, firmware or any combination thereof. When implemented using software, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the process or function described in accordance with the embodiment of the present invention is generated in whole or in part. The computer may be a general-purpose computer, a special-purpose computer, a computer network, a network device, a terminal device or other programmable device. The computer instructions may be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium, for example, the computer instructions may be transmitted from a website site, a computer, a server or a data center by wired (e.g., coaxial cable, optical fiber, digital subscriber line (digital subscriber line)) or wireless (e.g., infrared, wireless, microwave, etc.) mode to another website site, computer, server or data center. The computer-readable storage medium may be any available medium that a computer can access or a data storage device such as a server or a data center that includes one or more available media integrated. The available medium may be a magnetic medium (eg, a floppy disk, a hard disk, a magnetic tape), an optical medium (eg, a digital video disc), or a semiconductor medium, etc.

[0187] In the embodiments of the present application, under the premise of no logical contradiction, the embodiments may reference each other, for example, the methods and / or terms between method embodiments may reference each other, for example, the functions and / or terms between device embodiments may reference each other, for example, the functions and / or terms between device embodiments and method embodiments may reference each other.

[0188] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0189] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A light element detection method, characterized in that: The following steps are involved: Detecting an external standard sample to obtain the content of one or more elements to be measured in the external standard sample under current environmental conditions; the external standard sample includes a sample in which the content of at least one element to be measured is known, or a sample in which the content of at least one adjacent element to be measured in the periodic table is known; Initiate detection of the sample to be tested within time t2 to obtain the content of one or more elements to be tested in the sample to be tested under current environmental conditions; According to the standard value of the content of the element to be measured and the content of one or more elements to be measured in the external standard sample under the current environmental conditions, the content of one or more elements to be measured in the sample to be measured under the current environmental conditions is corrected; The light element detection method is implemented by the following detection system, which includes a sample placement platform, a light source device, a detection device and a control module, wherein the control module controls the connection between the sample placement platform, the light source device and the detection device; at least two sample placement positions are provided on the sample placement platform, and the sample placement positions are used to place external standard samples and samples to be tested; The light element detection method specifically comprises the following steps: The control module controls the start of detection of the external standard sample, the light source device emits X-rays to the sample placement platform, and the detection device obtains the content of one or more elements to be measured in the external standard sample under current environmental conditions; The control module controls the sample placement platform to switch between the external standard sample and the sample to be tested, wherein the switching of different sample placement positions is completed within t2 time, and the range of t2 is 0 to 5 seconds; the control module controls the start of the detection of the sample to be tested, the light source device emits X-rays to the sample placement platform, and the detection device obtains the content of one or more elements to be tested in the sample to be tested under the current environmental conditions; The control module corrects the content of one or more elements to be measured in the sample to be measured under the current environmental conditions obtained by the detection device according to the standard value of the content of the element to be measured and the content of one or more elements to be measured in the external standard sample under the current environmental conditions obtained by the detection device; The "testing the external standard sample to obtain the content of one or more elements to be measured in the external standard sample under the current environmental conditions; the external standard sample includes a sample whose content of at least one element to be measured is known, or includes a sample whose content of at least one adjacent element to be measured in the periodic table is known" includes the following steps: Moving the external standard sample to the detection zone; Projecting X-rays toward the detection area to detect the external standard sample for a time period of t1; Receiving a signal excited from the external standard sample, and calculating the content of one or more elements to be measured in the external standard sample; The "starting the detection of the sample to be tested to obtain the content of one or more elements to be tested in the sample to be tested under the current environmental conditions" includes the following steps: Moving the sample to be tested to the detection area; Projecting X-rays to the detection area to detect the sample for a time t3; Receiving a signal excited from the external standard sample, and calculating the content of one or more elements to be measured in the sample to be measured; t1=t3; the "correcting the content of one or more elements to be measured in the sample under the current environmental conditions according to the standard value of the content of the element to be measured and the content of one or more elements to be measured in the external standard sample under the current environmental conditions" comprises the following steps: Calculate the change rate of the detection value of one or more elements to be measured in the external standard sample according to the standard value of the content of the element to be measured and the content of one or more elements to be measured in the external standard sample under current environmental conditions; The expression of the detection value change rate is as follows: Among them, C ref is the standard value of the content of the element to be measured, C' ref is the content of the element to be measured in the external standard sample under the current environmental conditions; According to the detection value change rate, the content of one or more elements to be measured in the sample to be measured under the current environmental conditions is corrected, and the correction expression is as follows: Among them, C' i is the content of the element to be tested in the sample under the current environment, C i is the result after correction.

2. The light element detection method according to claim 1, characterized in that: Also includes: For one or more elements to be measured, a linear relationship between the net intensity and the content of the elements to be measured is established.

3. The light element detection method according to claim 2, characterized in that: The detection method for the external standard sample or the sample to be tested is: Obtaining the net intensity of characteristic fluorescent X-rays of one or more elements to be measured; The content of one or more elements to be measured is calculated according to the linear relationship between the net intensity and the content of the elements to be measured.

4. The light element detection method according to claim 1, characterized in that: The detection method of the external standard sample and the sample to be tested is that the driving device drives the sample placement position to move linearly, and the scanning detection is realized by the relative movement between the sample placement position and the detection device.

5. The light element detection method according to claim 4, characterized in that: Also includes: The driving device drives the sample placement position to rotate, and the driving device drives the sample placement position to move linearly, and cooperates with the rotation of the sample placement position to realize spiral scanning detection.

6. A detection system, characterized in that: It comprises a control module, which comprises a processor and a memory, wherein the memory is used to store instructions, and when the instructions are executed by the processor, the control module executes the light element detection method as claimed in any one of claims 1 to 5.

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