A high-precision processing control method and device for ultra-thin optical devices

Abstract

The present invention provides a high-precision processing control method for an ultra-thin optical device, the method comprising: acquiring an image of an optical device to be detected based on a visual sensor, generating a first array image based on the image of the optical device to be detected, the first array image being an image composed of evenly distributed dot arrays located within the contour of the optical device to be detected in the image of the optical device to be detected; generating multiple detection light beams based on the first array image, each detection light beam corresponding to a point located in the first array image, the directions of the multiple detection light beams being parallel and incident on the optical device to be detected along a first angle, and projecting a first detection image after the multiple detection light beams are emitted; controlling the rotation of the optical device to be detected so that the multiple detection light beams are incident on the optical device to be detected along a second angle, and projecting a second detection image after the multiple detection light beams are emitted; comparing the first detection image with the second detection image, and determining whether the optical device to be detected is qualified according to the comparison result.

Description

Technical Field

[0001] The present invention relates to the field of control technology, and in particular to a high-precision processing control method and device for an ultra-thin optical device. Background Art

[0002] In today's era of rapid technological development, optical devices, as basic components, are widely used in many fields such as communications, lighting, display, biomedicine, etc. With the continuous advancement of technology, optical devices are also developing in the direction of thinner, lighter, and higher performance. Therefore, ultra-thin optical devices came into being and became the representative of the new generation of optical technology.

[0003] With the wide application of ultra-thin optical devices in various fields, how to accurately and efficiently detect them has become a key technology. In the existing technology, the detection process of ultra-thin optical devices includes surface morphology detection, including the use of scanning electron microscopes (SEM), atomic force microscopes (AFM), etc. to detect the flatness and smoothness of the surface of ultra-thin optical devices, and then optical detection using transmittance measurement methods. These cannot be performed simultaneously, and the detection speed is slow. Summary of the invention

[0004] The embodiments of the present invention provide a high-precision processing control method and device for an ultra-thin optical device to improve the above-mentioned problem.

[0005] In order to achieve the above object, the present invention adopts the following technical scheme:

[0006] In a first aspect, the present invention provides a high-precision processing control method for an ultra-thin optical device, the method comprising:

[0007] Acquire an image of the optical device to be detected based on a visual sensor, and generate a first array image based on the image of the optical device to be detected, wherein the first array image is an image composed of uniformly distributed dot arrays located within the contour of the optical device to be detected in the image of the optical device to be detected;

[0008] Generate multiple detection beams based on the first array image, each detection beam corresponds to a point in the first array image, the directions of the multiple detection beams are parallel and incident on the optical device to be detected along a first angle, and the multiple detection beams are projected to form a first detection image after being emitted;

[0009] Controlling the optical device to be detected to rotate so that the multiple detection light beams are incident on the optical device to be detected along a second angle, and the multiple detection light beams are projected to form a second detection image after being emitted;

[0010] The first detection image is compared with the second detection image, and whether the optical device to be detected is qualified is determined according to the comparison result.

[0011] Optionally, comparing the first detection image with the second detection image, and determining whether the optical device to be detected is qualified according to the comparison result, includes:

[0012] Based on the first detection image, the first detection image is sequentially determined , , ..... The first point, among which, , , ..... All are natural numbers;

[0013] Based on the second detection image, the first , , ..... The second point, where , , ..... are all natural numbers, and each first point corresponds to each second point one by one;

[0014] Based on the first point and the second point, multiple offset constants are determined, which are , , ..... , based on multiple offset constants to determine the average offset constant ;

[0015] The average offset constant Compare with multiple offset constants to get multiple difference constants , , ..... ,determine whether the optical device to be inspected is qualified based on multiple difference constants.

[0016] Optionally, a plurality of offset constants are determined based on the first point and the second point, which are , , ..... , based on multiple offset constants to determine the average offset constant ,include:

[0017] Based on the first point and the second point, multiple offset constants are determined, which are , , ..... ,satisfy:

[0018] ;

[0019] in,( , ) is the coordinate of the first point of n, ( , ) is the The coordinates of the second point, is the offset constant of the nth pair of the first point and the second point.

[0020] Optionally, a plurality of offset constants are determined based on the first point and the second point, which are , , ..... , based on multiple offset constants to determine the average offset constant , also includes:

[0021] Determining an average offset constant based on multiple offset constants ,satisfy: .

[0022] Optionally, set the average offset constant Compare with multiple offset constants to get multiple difference constants , , ..... , determine whether the optical device to be inspected is qualified based on multiple difference constants, including:

[0023] Based on the first detection image and the second detection image, the light spot attenuation corresponding to each point is obtained, which are respectively , , ..... ;

[0024] Determine the pass rate of the optical device to be inspected based on the difference constant and multiple spot attenuation , if the qualification If it is greater than a preset value, the optical device to be tested is determined to be an unqualified device, wherein the qualified degree satisfy:

[0025] = ;

[0026] in, , , All are natural numbers.

[0027] Optionally, a plurality of detection beams are generated based on the first array image, each detection beam corresponds to a point in the first array image, the directions of the plurality of detection beams are parallel and incident on the optical device to be detected along a first angle, and the plurality of detection beams are projected to form a first detection image after being emitted, including:

[0028] The directions of the multiple detection light beams are parallel and incident on the optical device to be detected along a first angle, wherein the first angle is greater than 90°.

[0029] Optionally, controlling the optical device to be detected to rotate so that the multiple detection light beams are incident on the optical device to be detected along a second angle, and the multiple detection light beams are projected to form a second detection image after being emitted, includes:

[0030] So that the multiple detection light beams are incident on the optical device to be detected along a second angle, wherein the second angle is greater than 90° and less than 180°.

[0031] In a second aspect, the present invention provides a high-precision processing control device for an ultra-thin optical device, the device being configured as follows:

[0032] Acquire an image of the optical device to be detected based on a visual sensor, and generate a first array image based on the image of the optical device to be detected, wherein the first array image is an image composed of uniformly distributed dot arrays located within the contour of the optical device to be detected in the image of the optical device to be detected;

[0033] Generate multiple detection beams based on the first array image, each detection beam corresponds to a point in the first array image, the directions of the multiple detection beams are parallel and incident on the optical device to be detected along a first angle, and the multiple detection beams are projected to form a first detection image after being emitted;

[0034] Controlling the optical device to be detected to rotate so that the multiple detection light beams are incident on the optical device to be detected along a second angle, and the multiple detection light beams are projected to form a second detection image after being emitted;

[0035] The first detection image is compared with the second detection image, and whether the optical device to be detected is qualified is determined according to the comparison result.

[0036] Optionally, the device is configured to:

[0037] Based on the first detection image, the first detection image is sequentially determined , , ..... The first point, among which, , , ..... All are natural numbers;

[0038] Based on the second detection image, the first , , ..... The second point, where , , ..... are all natural numbers, and each first point corresponds to each second point one by one;

[0039] Based on the first point and the second point, multiple offset constants are determined, which are , , ..... , based on multiple offset constants to determine the average offset constant ;

[0040] The average offset constant Compare with multiple offset constants to get multiple difference constants , , ..... ,determine whether the optical device to be inspected is qualified based on multiple difference constants.

[0041] Optionally, the device is configured to:

[0042] Based on the first point and the second point, multiple offset constants are determined, which are , , ..... ,satisfy:

[0043] ;

[0044] in,( , ) is the coordinate of the first point of n, ( , ) is the The coordinates of the second point, is the offset constant of the nth pair of the first point and the second point.

[0045] Optionally, the device is configured to:

[0046] Determining an average offset constant based on multiple offset constants ,satisfy: .

[0047] Optionally, the device is configured to:

[0048] Based on the first detection image and the second detection image, the light spot attenuation corresponding to each point is obtained, which are respectively , , ..... ;

[0049] Determine the pass rate of the optical device to be inspected based on the difference constant and multiple spot attenuation , if the qualification If it is greater than a preset value, the optical device to be tested is determined to be an unqualified device, wherein the qualified degree satisfy:

[0050] = ;

[0051] in, , , All are natural numbers.

[0052] Optionally, the device is configured to:

[0053] The directions of the multiple detection light beams are parallel and incident on the optical device to be detected along a first angle, wherein the first angle is greater than 90°.

[0054] Optionally, the apparatus is configured to: enable the multiple detection light beams to be incident on the optical device to be detected along a second angle, wherein the second angle is greater than 90° and less than 180°.

[0055] In a third aspect, the present invention provides an electronic device, comprising a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other via the communication bus;

[0056] Memory, used to store computer programs;

[0057] The processor is used to implement the method steps proposed in the first aspect when executing the program stored in the memory.

[0058] In summary, the above method and device have the following technical effects:

[0059] The present invention proposes a high-precision processing control method for an ultra-thin optical device. First, an image of the optical device to be detected is acquired based on a visual sensor, and a first array image is generated based on the image of the optical device to be detected. Then, multiple detection light beams are generated based on the first array image, each detection light beam corresponds to a point position in the first array image, and the directions of the multiple detection light beams are parallel and incident on the optical device to be detected along a first angle. After the multiple detection light beams are emitted, a first detection image is projected. Then, the optical device to be detected is controlled to rotate so that the multiple detection light beams are incident on the optical device to be detected along a second angle, and the multiple detection light beams are emitted and a second detection image is projected.

[0060] Finally, the first detection image is compared with the second detection image, and whether the optical device to be detected is qualified is determined according to the comparison result. The high-precision processing control method of ultra-thin optical devices proposed by the present invention is to project images of the optical device to be detected by incident and emitted at different angles. When the optical device to be detected has uneven distribution of light refraction, the overall difference between the first detection image and the second detection image can be used to judge whether it meets the qualified standard, and the detection method is faster and more accurate. BRIEF DESCRIPTION OF THE DRAWINGS

[0061] Figure 1 The present invention is a flowchart of a high-precision processing control method for ultra-thin optical devices. DETAILED DESCRIPTION

[0062] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0063] The present invention proposes a high-precision processing control method for ultra-thin optical devices. Figure 1 , including the following steps:

[0064] S101: Acquire an image of an optical device to be detected based on a visual sensor, and generate a first array image based on the image of the optical device to be detected, wherein the first array image is an image composed of uniformly distributed dot arrays located within the contour of the optical device to be detected in the image of the optical device to be detected.

[0065] It can be understood that the first array image is composed of uniformly distributed dot arrays located within the device contour in the image of the optical device to be detected. The main purpose of this step is to array the image of the optical device to be detected so as to detect the information of the optical device to be detected in an array, thereby providing more abundant data support for subsequent analysis. In this embodiment, the outer contour shape of the first array is the same as that of the optical device to be detected. Therefore, the image contour formed by the first array is also the same as that of the optical device to be detected. In this way, it can be ensured that the image passed by each point in the array is incident on the image to be detected and emitted from the image to be detected, thereby avoiding interference in the image processing process of the final image formed by not passing through the optical device to be detected.

[0066] S102: Generate multiple detection light beams based on the first array image, each detection light beam corresponds to a point in the first array image, the directions of the multiple detection light beams are parallel and incident on the optical device to be detected along a first angle, and the multiple detection light beams are emitted and project a first detection image.

[0067] It is understandable that after passing through the optical device to be inspected, multiple detection light beams are projected onto the relevant detection plane to diffuse the light beams. It is understandable that when the light beams pass through the optical device to be inspected, if the optical device to be inspected has defects, such as unevenness, the projection image formed by the light beams will inevitably change to a certain extent.

[0068] Specifically, in the present embodiment, a beam of detection light is projected corresponding to each point in the first array, and multiple light beams remain parallel. Thus, each light beam is refracted at the incident surface of the optical device when passing through the optical device to be detected, and is emitted from the exit surface. Thus, when the optical device to be detected is in an ideal state, that is, the medium is evenly distributed and the surface is completely flat, the emitted light beams also remain completely parallel. After the multiple light beams are emitted, the light projected on the detection plane also forms a first detection image. In other words, when there is uneven distribution of the medium, impurities, or an uneven surface in the optical device, the light path also changes, and therefore the projected image will inevitably change. Therefore, in the present embodiment, the change in the light path will inevitably lead to a change in the projected image, and the present invention uses this change to quantify its degree of qualification.

[0069] S103: Control the optical device to be detected to rotate so that the multiple detection light beams are incident on the optical device to be detected along a second angle, and the multiple detection light beams are projected to form a second detection image after being emitted.

[0070] Optionally, the directions of the multiple detection light beams are parallel and incident on the optical device to be detected along a first angle, wherein the first angle is greater than 90°, and of course, in order to have a clear difference with the previous comparison image, the second angle is greater than 90° and less than 180°. In this way, the reflection of light on the surface of the medium is also reduced.

[0071] In this embodiment, when the light beam passes through the optical device to be detected, if there is a defect in a partial area on the optical device to be detected, that is, an uneven point or a medium uneven point, the light beam approaching or passing through the point position will inevitably be offset or the light intensity will change. In order to ensure that the light beam can pass through the defective position, in this embodiment, through the rotation of the optical device, the light path of the light beam in the optical device also changes with the rotation. Through different rotation methods, detection of different positions can be achieved. At the same time, when there are uneven surfaces on the optical device to be detected, the light beam passing through the point position will inevitably be deflected to a greater extent during the rotation process. Of course, in other embodiments, for the optical device to be detected with grating characteristics, the rotation plane is also parallel to the grating plane, avoiding the influence of the grating structure on the detection result.

[0072] S104: Compare the first detection image with the second detection image, and determine whether the optical device to be detected is qualified according to the comparison result.

[0073] It is understandable that when there are factors such as bumps on the surface of the optical device to be detected by different angles of incidence, the light rays incident at different angles will form more obvious differences in the light spots after being emitted. The difference in the distance between each pair of light spots, or the difference in light intensity, can be used to measure the degree of qualification of the entire device to be detected. In this embodiment, by comparing the first detection image formed before the rotation and the second detection image formed after the rotation, it can be determined whether it is qualified based on the comparison results. It is understandable that the greater the difference between the second image and the first image, the greater the difference between it and the ideal device to be detected, that is, the less likely it is to be qualified.

[0074] Regarding how to quantify the difference value, optionally, as an implementation manner, step S104 may include the following steps:

[0075] S1041: sequentially determine the first detection image based on the first detection image. , , ..... The first point, among which, , , ..... All are natural numbers.

[0076] It can be understood that for the process of quantifying the offset of multiple points on the image, determining the corresponding relationship between the points before and after the offset is a basic condition. Therefore, in this embodiment, for the first point in the first detection image, , , ..... The sequence can be divided in sequence or in accordance with a certain route, which is not limited here. S1042: based on the second detection image, determine the first , , ..... The second point, where , , ..... are all natural numbers, and each first point corresponds to each second point one by one.

[0077] For the correspondence between the first point and the second point, the second detection image is also divided in the same order as the first point. , , ..... It indicates that the corresponding relationship between each first point and each second point is guaranteed not to change.

[0078] S1043: Determine multiple offset constants based on the first point and the second point, respectively. , , ..... , based on multiple offset constants to determine the average offset constant .

[0079] After the first point and the second point are quantified, their features can be used to measure the offset relationship. In this embodiment, the features of the first point and the second point can be their coordinate relationship in the image, and in other embodiments, they can also be other relationships, which are not limited here.

[0080] It is understandable that, due to the different incident angles of the two groups of light beams, there must be an overall deflection. That is, due to the different optical paths, the coordinates of the final formed light spots are different. Therefore, in this embodiment, it is first necessary to obtain the light spot offset caused by the overall deflection. Specifically, multiple offset constants are determined based on the first point position and the second point position, which are respectively , , ..... ,satisfy:

[0081] ;

[0082] in,( , ) is the coordinate of the first point of n, ( , ) is the The coordinates of the second point, is the offset constant of the nth pair of the first point and the second point. Then, the average offset constant can be determined based on multiple offset constants ,satisfy: The average offset constant is the effect of the overall offset caused by rotation, which should be avoided during digital processing. The above calculation formula shows that the average offset constant , and combined with the offset of each pair of light spots, the degree of offset of each light spot position is measured.

[0083] S1044: Average offset constant Compare with multiple offset constants to get multiple difference constants , , ..... ,determine whether the optical device to be inspected is qualified based on multiple difference constants.

[0084] It can be understood that the difference between the average offset constant and the offset constant can be used to measure the overall offset degree. The difference between the average offset constant and the offset constant, that is, multiple difference constants , , ..... It can be expressed more specifically. For example, for an ideal optical device to be inspected, multiple difference constants should be the same. For a defective part, the offset constant of its position is larger than the average offset constant, that is, the difference between the average offset constant and the average offset constant, that is, the difference constant is larger. By determining the position with the largest difference constant, the position of the defective part can be determined.

[0085] The light beam will inevitably attenuate to a certain extent when passing through the optical device to be inspected, and when the deflection angle is larger, the light intensity at the ideal point will become less. Therefore, in some embodiments, in order to more accurately measure the distribution of defects on the entire optical device, the light spot attenuation corresponding to each point can be obtained based on the first detection image and the second detection image, which are respectively , , ..... Then, based on the difference constant and multiple spot attenuation, the qualification of the optical device to be inspected is determined. , if the qualification If it is greater than a preset value, the optical device to be tested is determined to be an unqualified device, wherein the qualified degree satisfy:

[0086] = ;

[0087] in, , , All are natural numbers.

[0088] It can be understood that the above calculation formula can be used to evaluate the overall qualification of the optical device to be inspected. When it is greater than the preset value, which is also the qualified value, it proves that the amount of partial light spot deviation is large or the degree of attenuation is large, and therefore it is an unqualified device.

[0089] The present invention proposes a high-precision processing control method for an ultra-thin optical device. First, an image of the optical device to be detected is acquired based on a visual sensor, and a first array image is generated based on the image of the optical device to be detected. Then, multiple detection light beams are generated based on the first array image, each detection light beam corresponds to a point position in the first array image, and the directions of the multiple detection light beams are parallel and incident on the optical device to be detected along a first angle. After the multiple detection light beams are emitted, a first detection image is projected. Then, the optical device to be detected is controlled to rotate so that the multiple detection light beams are incident on the optical device to be detected along a second angle, and the multiple detection light beams are emitted and a second detection image is projected.

[0090] Finally, the first detection image is compared with the second detection image, and whether the optical device to be detected is qualified is determined according to the comparison result. The high-precision processing control method of ultra-thin optical devices proposed by the present invention is to project images of the optical device to be detected by incident and emitted at different angles. When the optical device to be detected has uneven distribution of light refraction, the overall difference between the first detection image and the second detection image can be used to judge whether it meets the qualified standard, and the detection method is faster and more accurate.

[0091] Based on the same inventive concept, the present invention proposes a high-precision processing control device for ultra-thin optical devices, which is configured as follows:

[0092] Acquire an image of the optical device to be detected based on a visual sensor, and generate a first array image based on the image of the optical device to be detected, wherein the first array image is an image composed of uniformly distributed dot arrays located within the contour of the optical device to be detected in the image of the optical device to be detected;

[0093] Generate multiple detection beams based on the first array image, each detection beam corresponds to a point in the first array image, the directions of the multiple detection beams are parallel and incident on the optical device to be detected along a first angle, and the multiple detection beams are projected to form a first detection image after being emitted;

[0094] Controlling the optical device to be detected to rotate so that the multiple detection light beams are incident on the optical device to be detected along a second angle, and the multiple detection light beams are projected to form a second detection image after being emitted;

[0095] The first detection image is compared with the second detection image, and whether the optical device to be detected is qualified is determined according to the comparison result.

[0096] Optionally, the device is configured to:

[0097] Based on the first detection image, the first detection image is sequentially determined , , ..... The first point, among which, , , ..... All are natural numbers;

[0098] Based on the second detection image, the first , , ..... The second point, where , , ..... are all natural numbers, and each first point corresponds to each second point one by one;

[0099] Based on the first point and the second point, multiple offset constants are determined, which are , , ..... , based on multiple offset constants to determine the average offset constant ;

[0100] The average offset constant Compare with multiple offset constants to get multiple difference constants , , ..... ,determine whether the optical device to be inspected is qualified based on multiple difference constants.

[0101] Optionally, the device is configured to:

[0102] Based on the first point and the second point, multiple offset constants are determined, which are , , ..... ,satisfy:

[0103] ;

[0104] in,( , ) is the coordinate of the first point of n, ( , ) is the The coordinates of the second point, is the offset constant of the nth pair of the first point and the second point.

[0105] Optionally, the device is configured to:

[0106] Determining an average offset constant based on multiple offset constants ,satisfy: .

[0107] Optionally, the device is configured to:

[0108] Based on the first detection image and the second detection image, the light spot attenuation corresponding to each point is obtained, which are respectively , , ..... ;

[0109] Determine the pass rate of the optical device to be inspected based on the difference constant and multiple spot attenuation , if the qualification If it is greater than a preset value, the optical device to be tested is determined to be an unqualified device, wherein the qualified degree satisfy:

[0110] = ;

[0111] in, , , All are natural numbers.

[0112] Optionally, the device is configured to:

[0113] The directions of the multiple detection light beams are parallel and incident on the optical device to be detected along a first angle, wherein the first angle is greater than 90°.

[0114] Optionally, the apparatus is configured to: enable the multiple detection light beams to be incident on the optical device to be detected along a second angle, wherein the second angle is greater than 90° and less than 180°.

[0115] The present invention proposes a high-precision processing control device for ultra-thin optical devices. First, an image of an optical device to be detected is acquired based on a visual sensor, and a first array image is generated based on the image of the optical device to be detected. Then, multiple detection light beams are generated based on the first array image, each detection light beam corresponds to a point position in the first array image, and the directions of the multiple detection light beams are parallel and incident on the optical device to be detected along a first angle. After the multiple detection light beams are emitted, a first detection image is projected. Then, the optical device to be detected is controlled to rotate so that the multiple detection light beams are incident on the optical device to be detected along a second angle. After the multiple detection light beams are emitted, a second detection image is projected.

[0116] Finally, the first detection image is compared with the second detection image, and whether the optical device to be detected is qualified is determined according to the comparison result. The high-precision processing control device for ultra-thin optical devices proposed by the present invention projects images of the optical device to be detected by incident and emitted at different angles. When the optical device to be detected has uneven distribution of light refraction, the overall difference between the first detection image and the second detection image can be used to judge whether it meets the qualified standard, and the detection method is faster and more accurate.

[0117] Based on the same inventive concept, an embodiment of the present invention further provides an electronic device, the electronic device comprising:

[0118] At least one processor; and a memory in communication with the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the high-precision processing control method of the ultra-thin optical device according to the embodiment of the present invention.

[0119] In addition, to achieve the above-mentioned purpose, an embodiment of the present invention further proposes a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the high-precision processing control method of the ultra-thin optical device of the embodiment of the present invention.

[0120] The following is a detailed introduction to the various components of electronic equipment:

[0121] The processor is the control center of the electronic device, which can be a processor or a general term for multiple processing elements. For example, the processor is one or more central processing units (CPUs), or an application specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of the present invention, such as one or more microprocessors (digital signal processors, DSPs), or one or more field programmable gate arrays (FPGAs).

[0122] Optionally, the processor can perform various functions of the electronic device by running or executing a software program stored in the memory, and calling data stored in the memory.

[0123] The memory is used to store the software program for executing the solution of the present invention, and the execution is controlled by the processor. The specific implementation method can refer to the above method embodiment and will not be repeated here.

[0124] Optionally, the memory may be a read-only memory (ROM) or other types of static storage devices that can store static information and instructions, a random access memory (RAM) or other types of dynamic storage devices that can store information and instructions, or an electrically erasable programmable read-only memory (EEPROM), a compact disc read-only memory (CD-ROM) or other optical disc storage, optical disc storage (including compressed optical disc, laser disc, optical disc, digital versatile disc, Blu-ray disc, etc.), a magnetic disk storage medium or other magnetic storage device, or any other medium that can be used to carry or store the desired program code in the form of instructions or data structures and can be accessed by a computer, but is not limited thereto. The memory may be integrated with the processor, or may exist independently and be coupled to the processor through an interface circuit of the electronic device, which is not specifically limited in the embodiments of the present invention.

[0125] A transceiver is used to communicate with a network device or a terminal device.

[0126] Optionally, the transceiver may include a receiver and a transmitter, wherein the receiver is used to implement a receiving function, and the transmitter is used to implement a sending function.

[0127] Optionally, the transceiver may be integrated with the processor, or may exist independently and be coupled to the processor via an interface circuit of the router, which is not specifically limited in the embodiment of the present invention.

[0128] In addition, the technical effects of the electronic device can refer to the technical effects of the data transmission method in the above method embodiment, which will not be repeated here.

[0129] It should be understood that the processor in the embodiment of the present invention may be a central processing unit (CPU), and the processor may also be other general-purpose processors, digital signal processors (DSP), application specific integrated circuits (ASIC), field programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.

[0130] It should also be understood that the memory in the embodiments of the present invention may be a volatile memory or a non-volatile memory, or may include both volatile and non-volatile memories. Among them, the non-volatile memory may be a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), or a flash memory. The volatile memory may be a random access memory (RAM), which is used as an external cache. By way of example and not limitation, many forms of random access memory (RAM) are available, such as static RAM (SRAM), dynamic random access memory (DRAM), synchronous DRAM (SDRAM), double data rate synchronous dynamic random access memory (DDR SDRAM), enhanced synchronous dynamic random access memory (ESDRAM), synchronous link DRAM (SLDRAM), and direct rambus RAM (DR RAM).

[0131] The above embodiments can be implemented in whole or in part by software, hardware (such as circuits), firmware or any other combination. When implemented by software, the above embodiments can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions or computer programs. When the computer instructions or computer programs are loaded or executed on a computer, the process or function described in the embodiment of the present invention is generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer instructions can be transmitted from one website, computer, server or data center to another website, computer, server or data center by wired (such as infrared, wireless, microwave, etc.). The computer-readable storage medium can be any available medium that can be accessed by a computer or a data storage device such as a server or data center that contains one or more available media sets. The available medium can be a magnetic medium (for example, a floppy disk, a hard disk, a tape), an optical medium (for example, a DVD), or a semiconductor medium. The semiconductor medium can be a solid-state hard disk.

[0132] It should be understood that the term "and / or" in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. A and B can be singular or plural. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship, but it may also indicate an "and / or" relationship. Please refer to the context for specific understanding.

[0133] In the present invention, "at least one" means one or more, and "plurality" means two or more. "At least one of the following" or similar expressions refers to any combination of these items, including any combination of single items or plural items. For example, at least one of a, b, or c can mean: a, b, c, ab, ac, bc, or abc, where a, b, and c can be single or multiple.

[0134] It should be understood that in various embodiments of the present invention, the size of the serial numbers of the above-mentioned processes does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present invention.

[0135] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.

Claims

1. A high-precision processing control method for ultra-thin optical devices, characterized in that: The method comprises: Acquire an image of the optical device to be detected based on a visual sensor, and generate a first array image based on the image of the optical device to be detected, wherein the first array image is an image composed of uniformly distributed dot arrays located within the contour of the optical device to be detected in the image of the optical device to be detected; Generate multiple detection light beams based on the first array image, each of the detection light beams corresponds to a point in the first array image, the directions of the multiple detection light beams are parallel and incident on the optical device to be detected along a first angle, and the multiple detection light beams are projected to form a first detection image after being emitted; Controlling the optical device to be detected to rotate so that the multiple detection light beams are incident on the optical device to be detected along a second angle, and the multiple detection light beams are projected to form a second detection image after being emitted; Comparing the first detection image with the second detection image, and determining whether the optical device to be detected is qualified according to the comparison result, including: determining the first detection image in sequence based on the first detection image , , ..... The first point, among which, , , ..... All are natural numbers; Based on the second detection image, the first , , ..... The second point, where , , ..... are all natural numbers, and each of the first points corresponds to each of the second points one by one; Based on the first point and the second point, a plurality of offset constants are determined, which are , , ..... , determining an average offset constant based on a plurality of said offset constants , where the average offset constant satisfy: Based on the first point and the second point, a plurality of offset constants are determined, which are , , ..... ,satisfy: ； in,( , ) is the coordinate of the nth first point, ( , ) is the The coordinates of the second point, is the offset constant of the nth pair of the first point and the second point; Determine an average offset constant based on a plurality of the offset constants ,satisfy: ; The average offset constant Compare with multiple offset constants to obtain multiple difference constants , , ..... , determining whether the optical device to be inspected is qualified based on a plurality of the difference constants, wherein the difference constant is the difference between an average offset constant and an offset constant.

2. The high-precision processing control method of an ultra-thin optical device according to claim 1, characterized in that: Based on the first array image, a plurality of detection light beams are generated, each of the detection light beams corresponds to a point in the first array image, the directions of the plurality of detection light beams are parallel and incident on the optical device to be detected along a first angle, and the plurality of detection light beams are projected to form a first detection image after being emitted, including: The directions of the multiple detection light beams are parallel and incident on the optical device to be detected along a first angle, wherein the first angle is greater than 90°.

3. The high-precision processing control method of an ultra-thin optical device according to claim 2, characterized in that: Controlling the optical device to be detected to rotate so that the multiple detection light beams are incident on the optical device to be detected along a second angle, and the multiple detection light beams are projected to form a second detection image after being emitted, including: So that the multiple detection light beams are incident on the optical device to be detected along a second angle, wherein the second angle is greater than 90° and less than 180°.

4. A high-precision processing control device for an ultra-thin optical device, the device being configured as follows: Acquire an image of the optical device to be detected based on a visual sensor, and generate a first array image based on the image of the optical device to be detected, wherein the first array image is an image composed of uniformly distributed dot arrays located within the contour of the optical device to be detected in the image of the optical device to be detected; Generate multiple detection light beams based on the first array image, each of the detection light beams corresponds to a point in the first array image, the directions of the multiple detection light beams are parallel and incident on the optical device to be detected along a first angle, and the multiple detection light beams are projected to form a first detection image after being emitted; Controlling the optical device to be detected to rotate so that the multiple detection light beams are incident on the optical device to be detected along a second angle, and the multiple detection light beams are projected to form a second detection image after being emitted; The first detection image is compared with the second detection image, and whether the optical device to be detected is qualified is determined according to the comparison result, including: determining the first detection image in sequence based on the first detection image; , , ..... The first point, among which, , , ..... All are natural numbers; Based on the second detection image, the first , , ..... The second point, where , , ..... are all natural numbers, and each of the first points corresponds to each of the second points one by one; Based on the first point and the second point, a plurality of offset constants are determined, which are , , ..... , determining an average offset constant based on a plurality of said offset constants , where the average offset constant satisfy: Based on the first point and the second point, a plurality of offset constants are determined, which are , , ..... ,satisfy: ； in,( , ) is the coordinate of the nth first point, ( , ) is the The coordinates of the second point, is the offset constant of the nth pair of the first point and the second point; Determine an average offset constant based on a plurality of the offset constants ,satisfy: ; The average offset constant Compare with multiple offset constants to obtain multiple difference constants , , ..... , determining whether the optical device to be inspected is qualified based on a plurality of the difference constants, wherein the difference constant is the difference between an average offset constant and an offset constant.

5. An electronic device, characterized in that: It includes a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other via the communication bus; The memory is used to store computer programs; The processor is used to implement the method steps proposed in any one of claims 1 to 3 when executing the program stored in the memory.

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