Test socket opening and closing mechanism and chip testing device

Abstract

The present invention belongs to the field of chip testing technology, and discloses a test socket opening and closing mechanism and a chip testing device, wherein the test socket opening and closing mechanism comprises a carrier, a conveying member and an operating mechanism, wherein a test area for installing a test socket is arranged on the carrier, and the test socket comprises an upper cover and a bottom plate; the conveying member is movably arranged on the carrier, and the conveying member has a receiving groove for accommodating a chip; the operating mechanism can move relative to the carrier, and the operating mechanism comprises a first adsorption head and an opening and closing head, wherein the first adsorption head is configured to transfer the chip between the receiving groove and the chip groove of the bottom plate, and the opening and closing head is configured to drive the upper cover to open or close relative to the bottom plate; the chip testing device comprises a test module and the above-mentioned test socket opening and closing mechanism. The test socket opening and closing mechanism and the chip testing device provided by the present invention can realize the automatic opening and closing of the test socket and the automatic loading and unloading of chips, thereby improving the testing efficiency and reducing the labor intensity of manual labor.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing, and in particular to a test socket opening and closing mechanism and a chip testing device. Background Art

[0002] System-on-chip is a core component in modern electronic devices. It integrates multiple independent chips into a single chip to improve performance, reduce power consumption and size. Testing these complex system chips requires specialized equipment, among which the test socket is a key tool in chip electrical performance testing. The main function of the test socket is to provide a physical interface to connect the chip to be tested with the test equipment for performance and reliability testing.

[0003] The test socket generally includes an upper cover and a bottom plate that are connected to each other. The bottom plate is provided with a chip slot for accommodating the chip. The upper cover can be opened or closed relative to the bottom plate. During the chip testing process, the operator needs to first put the chip into the chip slot, and then manually close the upper cover. After the test is completed, the operator opens the upper cover and takes out the chip. In this way, when testing chips, especially when testing in large quantities, it is necessary to manually open and close the test socket frequently, and frequently load and unload the chips, which will result in low chip testing efficiency and high manual labor intensity. Summary of the invention

[0004] The object of the present invention is to provide a test socket opening and closing mechanism and a chip testing device, which can realize automatic opening and closing of the test socket and automatic loading and unloading of chips, thereby improving test efficiency and reducing manual labor intensity.

[0005] To achieve this object, the present invention adopts the following technical solutions:

[0006] In the first aspect, the present invention provides a test socket opening and closing mechanism, including a carrier platform, a conveying member and an operating mechanism, wherein a test area is arranged on the carrier platform, the test area is used to install a test socket, and the test socket comprises an upper cover and a bottom plate; the conveying member is movably arranged on the carrier platform, and the conveying member has a receiving groove for accommodating a chip; the operating mechanism can move relative to the carrier platform, and the operating mechanism comprises a first adsorption head and an opening and closing head, the first adsorption head is configured to transfer the chip between the receiving groove and the chip groove of the bottom plate, and the opening and closing head is configured to drive the upper cover to open or close relative to the bottom plate.

[0007] Preferably, the upper cover is fixedly connected with a connecting arm, and a universal rotating head is provided at one end of the connecting arm away from the upper cover. The universal rotating head is configured to partially extend into the opening and closing head and can rotate and cooperate with the opening and closing head.

[0008] Preferably, the opening and closing head includes a first clamping portion and a second clamping portion, one end of the first clamping portion and the second clamping portion are connected to each other, and the other end is set to be open, the opening and closing head is elastic, and the universal rotating head extends between the first clamping portion and the second clamping portion through the opening, and when the universal rotating head extends between the first clamping portion and the second clamping portion, the first clamping portion and the second clamping portion can provide clamping force to the universal rotating head.

[0009] Preferably, a snap is provided on the bottom plate, and the snap includes a snap-fitting portion and a pressing portion arranged opposite to each other, and when the test socket is in a closed state, the snap-fitting portion and the upper cover are snap-fitted with each other; when the test socket needs to be switched from a closed state to an open state, the opening and closing head is configured to press against the top surface of the pressing portion to separate the snap-fitting portion from the upper cover.

[0010] Preferably, a first adjustment mechanism is provided on the supporting platform, and the first adjustment mechanism includes a first adjustment member, a second adjustment member and a third adjustment member, the first adjustment member extends along a first direction, the second adjustment member is connected to the first adjustment member, and can drive the first adjustment member to move along a second direction, the first direction and the second direction are set at an angle, and both extend in a horizontal direction, the third adjustment member is movably connected to the first adjustment member along the first direction, the operating mechanism is connected to the third adjustment member, and the third adjustment member can drive the operating mechanism to rise and fall vertically relative to the supporting platform.

[0011] Preferably, the supporting platform is provided with an elongated hole extending along the second direction, and the second adjusting member is slidably inserted into the elongated hole.

[0012] Preferably, a long groove is provided on the supporting platform, a guide rail extending along the length direction of the long groove is fixedly arranged in the long groove, and the conveying member is partially located in the long groove and slidably cooperates with the guide rail.

[0013] Preferably, the number of the test areas is two, and both of the two test areas can be equipped with a plurality of the test sockets, and the conveying member can be movably disposed between the two test areas.

[0014] Preferably, the support platform further comprises a plurality of storage areas for storing chips, and a rotating member is fixedly provided between two adjacent storage areas, and the rotating member can carry the chips and drive the chips to rotate.

[0015] In a second aspect, the present invention provides a chip testing device, comprising a test module and the test socket opening and closing mechanism described in the first aspect; the test module is mounted on the carrier and electrically connected to the test socket, and the test module is used to test the chip.

[0016] Beneficial effects of the present invention:

[0017] The test socket opening and closing mechanism and chip testing device provided by the present invention, by providing a conveying member, an operating mechanism integrating a first adsorption head and an opening and closing head, can realize automatic loading and unloading of chips through the conveying member and the first adsorption head, and can drive the test socket to realize automatic opening and closing through the opening and closing head. There is no need for the operator to repeatedly perform the above operations manually, which greatly reduces the labor intensity of manual labor and is beneficial to improving the testing efficiency of the chip. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a three-dimensional structural schematic diagram of a test socket opening and closing mechanism provided by an embodiment of the present invention;

[0019] Figure 2 yes Figure 1 A partial enlarged view of the middle A;

[0020] Figure 3 is a three-dimensional structural schematic diagram of a test socket opening and closing mechanism from another perspective provided by an embodiment of the present invention;

[0021] Figure 4 It is a schematic diagram of the main structure of the operating mechanism provided by an embodiment of the present invention;

[0022] Figure 5 is a schematic diagram of the three-dimensional structure of a conveying member provided in an embodiment of the present invention;

[0023] Figure 6 is a schematic diagram of a test socket provided by an embodiment of the present invention in an open state;

[0024] Figure 7 is a schematic diagram of the opening and closing head provided in an embodiment of the present invention driving the test socket to be in a closed state;

[0025] Figure 8 is a schematic diagram of the top view of the test socket opening and closing mechanism provided by an embodiment of the present invention;

[0026] Fig. 9 is a schematic structural diagram of an opening and closing head provided in an embodiment of the present invention;

[0027] Fig.10 yes Figure 6 A partial enlarged view of point B in the middle.

[0028] In the figure:

[0029] 1. Carrying platform; 11. Testing area; 12. Long hole; 13. Long slot; 14. Material storage area;

[0030] 2. conveying member; 21. receiving tank;

[0031] 3. Operating mechanism; 31. First adsorption head; 32. Opening and closing head; 321. First clamping part; 322. Second clamping part;

[0032] 4. test socket; 41. upper cover; 42. bottom plate; 43. connecting arm; 44. universal rotating head; 45. buckle; 451. clamping part; 452. pressing part;

[0033] 5. First adjustment mechanism; 51. First adjustment member; 52. Second adjustment member; 53. Third adjustment member;

[0034] 6. Guide rails;

[0035] 7. Rotating parts;

[0036] 8. Second regulating mechanism;

[0037] 9. The second adsorption head. DETAILED DESCRIPTION

[0038] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the present invention, rather than to limit the present invention. It should also be noted that, for ease of description, only parts related to the present invention, rather than all structures, are shown in the accompanying drawings.

[0039] In the description of the present invention, unless otherwise clearly specified and limited, the terms "connected", "connected", and "fixed" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0040] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may include that the first and second features are in direct contact, or may include that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, a first feature being "above", "above" and "above" a second feature includes that the first feature is directly above and obliquely above the second feature, or simply indicates that the first feature is higher in level than the second feature. A first feature being "below", "below" and "below" a second feature includes that the first feature is directly below and obliquely below the second feature, or simply indicates that the first feature is lower in level than the second feature.

[0041] In the description of this embodiment, the terms "upper", "lower", "right", etc., directions or positional relationships are based on the directions or positional relationships shown in the drawings, and are only for the convenience of description and simplification of operation, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are only used to distinguish in the description and have no special meaning.

[0042] The chip testing device provided in the embodiment of the present application includes a test socket opening and closing mechanism and a test module (not shown in the figure). Figure 1 to Figure 7 As shown, the test socket opening and closing mechanism includes a carrier 1, a conveyor 2 and an operating mechanism 3. A test area 11 is provided on the carrier 1. The test area 11 is used to install a test socket 4. The test socket 4 includes an upper cover 41 and a bottom plate 42. The test module is installed on the carrier 1 and is electrically connected to the test socket 4. The test module is used to test the chip. Among them, the working principle and specific settings of the test module for testing the performance of the chip are mature existing technologies in the field and will not be described in detail here.

[0043] The conveyor 2 is movably disposed on the carrier 1 . The conveyor 2 has a receiving groove 21 for accommodating chips. That is, the conveyor 2 is responsible for transferring and transporting the chips on the carrier 1 .

[0044] Specifically, a plurality of receiving slots 21 may be provided on a conveying member 2 to realize the simultaneous transfer and transportation of a plurality of chips. Figure 5 As shown, eight receiving grooves 21 may be provided on the conveying member 2 , and the eight receiving grooves 21 are arranged in two symmetrical rows, with each row including four receiving grooves 21 .

[0045] The operating mechanism 3 can move relative to the carrier 1, and includes a first adsorption head 31 and an opening and closing head 32. The first adsorption head 31 is configured to transfer the chip between the accommodating groove 21 and the chip groove of the bottom plate 42, that is, the first adsorption head 31 can adsorb and transfer the chip, so that the chip is transferred from the accommodating groove 21 to the chip groove of the bottom plate 42, or from the chip groove of the bottom plate 42 to the accommodating groove 21. The opening and closing head 32 is configured to drive the upper cover 41 to open or close relative to the bottom plate 42, so that the test socket 4 switches between the open state and the closed state.

[0046] In the specific implementation, the conveying member 2 first transports the chip to be tested to the vicinity of the test socket 4, then moves the operating mechanism 3, and absorbs the chip to be tested through the first adsorption head 31 in the operating mechanism 3, and transfers the chip to be tested from the accommodating groove 21 to the inside of the test socket 4, and then moves the opening and closing head 32, so that the opening and closing head 32 drives the upper cover 41 of the test socket 4 to buckle with the bottom plate 42, that is, the test socket 4 is in a closed state (by Figure 6 to Figure 7 , that is, the opening and closing head 32 drives the test socket 4 to switch from the open state to the closed state), and then the performance test of the chip begins. After the chip test is completed, the opening and closing head 32 is moved to drive the upper cover 41 to separate from the bottom plate 42. At this time, the test socket 4 is in the open state, and the first suction head 31 is moved again, so that the first suction head 31 moves the tested chip out of the test socket 4 to the receiving groove 21, so as to enter the next work process.

[0047] The first adsorption head 31 can be configured as a suction nozzle or a magnetic suction nozzle with a vacuum adsorption function, which is not specifically limited here. The number of the first adsorption heads 31 can be configured as follows: Figure 2 Of course, it can also be set to 1, 2, 3 or more than 4, depending on the actual situation.

[0048] In addition, if Figure 4 As shown, in the present embodiment, the first adsorption head 31 and the opening and closing head 32 are arranged opposite to each other. In other embodiments, the first adsorption head 31 and the opening and closing head 32 may also be arranged on the same side, which is not specifically limited here.

[0049] The test socket opening and closing mechanism and chip testing device provided in the embodiment of the present application, by providing a conveying member 2, an operating mechanism 3 integrated with a first adsorption head 31 and an opening and closing head 32, can realize automatic loading and unloading of chips through the conveying member 2 and the first adsorption head 31, and can drive the test socket 4 to realize automatic opening and closing through the opening and closing head 32. There is no need for the operator to repeatedly perform the above operations manually, which greatly reduces the labor intensity of manual labor and is beneficial to improving the testing efficiency of the chip.

[0050] Alternatively, if Figure 8As shown, there are two test areas 11, and both test areas 11 can be equipped with a plurality of test sockets 4, and the conveying member 2 can be movably arranged between the two test areas 11. Specifically, the two test areas 11 can be symmetrically arranged on the carrier 1.

[0051] Through such an arrangement, multiple test sockets 4 can simultaneously test multiple chips, which is beneficial to further improve the test efficiency; and the conveyor 2 is movably arranged between the two test areas 11, so that the conveyor 2 can more conveniently transfer chips to each test area 11 on both sides at any position in the moving path.

[0052] Exemplarily, when installing the test sockets 4 in the test area 11 , a positioning camera may be used to position the multiple test sockets 4 to ensure the positioning accuracy of the multiple test sockets 4 and to achieve reasonable use of the space in the test area 11 .

[0053] like Figure 8 As shown, in some embodiments, a long slot 13 is provided on the carrier 1, and a guide rail 6 extending along the length direction of the long slot 13 is fixedly arranged in the long slot 13, and a portion of the conveying member 2 is located in the long slot 13 and slidably cooperates with the guide rail 6. The conveying member 2 moves along the length direction of the long slot 13.

[0054] By opening a long groove 13 on the supporting platform 1, the conveying member 2 can be partially located inside the long groove 13. In this way, not only the conveying member 2 does not occupy additional space and is conducive to improving space utilization, but also a certain limiting and guiding effect can be provided for the conveying member 2, thereby improving the stability of the conveying member 2 during movement.

[0055] Specifically, a pulley is fixedly provided at each end of the long groove 13 along its length direction, and a belt is sleeved on the two pulleys. The belt can abut against the conveying member 2, and the rotation of the belt can drive the conveying member 2 to slide along the guide rail 6. A driving motor can be provided on the carrier 1, and the driving motor directly drives one of the pulleys to rotate, thereby driving the rotation of the belt and the follower of the other pulley.

[0056] Of course, the method of driving the conveying member 2 to slide is not limited to the above-mentioned method of using belt transmission. In other embodiments, the pulley assembly can be omitted, and the driving motor can be directly connected to the conveying member 2 so that the driving motor drives the conveying member 2 to slide along the guide rail 6.

[0057] like Figure 6 and Figure 7 As shown, in some embodiments, the upper cover 41 is fixedly connected to a connecting arm 43, and a universal rotating head 44 is provided at one end of the connecting arm 43 away from the upper cover 41. The universal rotating head 44 is configured to partially extend into the opening and closing head 32 and can rotate and cooperate with the opening and closing head 32.

[0058] Through such a configuration, the introduction of the connecting arm 43 makes the position and angle between the opening and closing head 32 and the upper cover 41 more flexible and adjustable, thereby making the upper cover 41 smoother in the process of being engaged with the bottom plate 42 or separated from the bottom plate 42. The universal rotating head 44 further increases the flexibility of the connection between the opening and closing head 32 and the connecting arm 43, and can reduce the friction and wear between the opening and closing head 32 and the connecting arm 43, which helps to maintain the stability and reliability of the connection and extend the service life.

[0059] Specifically, the universal rotating head 44 can be set as a sphere, and the opening and closing head 32 is provided with an arc groove matching the sphere. The universal rotating head 44 is configured to extend into the arc groove, so that the contact surface between the universal rotating head 44 and the opening and closing head 32 is more closely matched.

[0060] Furthermore, if Fig. 9 As shown, the opening and closing head 32 includes a first clamping portion 321 and a second clamping portion 322, one end of the first clamping portion 321 and the second clamping portion 322 are connected to each other, and the other end is set to be open, the opening and closing head 32 is elastic, and the universal rotating head 44 extends between the first clamping portion 321 and the second clamping portion 322 through the open. That is: one end of the first clamping portion 321 and one end of the second clamping portion 322 are connected to each other, and the other ends of the first clamping portion 321 and the second clamping portion 322 are both set to be open, and an accommodation space for the universal rotating head 44 to extend into is formed between the two openings. When the universal rotating head 44 extends between the first clamping portion 321 and the second clamping portion 322, the first clamping portion 321 and the second clamping portion 322 can provide a clamping force to the universal rotating head 44.

[0061] In a specific implementation, when the opening and closing head 32 is in a natural state, the first clamping portion 321 and the second clamping portion 322 are substantially parallel to each other (eg, Fig. 9 As shown in the figure, when the opening and closing head 32 moves downward and the universal rotating head 44 begins to extend, the angle between the first clamping portion 321 and the second clamping portion 322 increases first, that is: during the process of the universal rotating head 44 extending between the first clamping portion 321 and the second clamping portion 322, the universal rotating head 44 will overcome the clamping force between the first clamping portion 321 and the second clamping portion 322; after the universal rotating head 44 extends into the opening and closing head 32, that is, after the outer surface of the universal rotating head 44 abuts against the surface of the arc-shaped groove on the opening and closing head 32, the angle between the first clamping portion 321 and the second clamping portion 322 will be restored, so that the universal rotating head 44 is subjected to a stable clamping force between the first clamping portion 321 and the second clamping portion 322.

[0062] Through such a configuration, the opening and closing head 32 can provide a clamping force to the universal rotating head 44 under the action of its own elastic force, effectively avoiding the risk of the universal rotating head 44 falling off from between the first clamping part 321 and the second clamping part 322 during the movement of the upper cover 41, which is beneficial to improving the reliability and stability of the overall structure.

[0063] Specifically, a spring may be installed inside the opening and closing head 32 so that the opening and closing head 32 has elastic force.

[0064] like Figure 6 , Figure 7 and Fig.10 As shown, in some embodiments, a buckle 45 is provided on the bottom plate 42, and the buckle 45 includes a clamping portion 451 and a pressing portion 452 arranged opposite to each other. When the test socket 4 is in a closed state, the clamping portion 451 and the upper cover 41 are clamped with each other; when the test socket 4 needs to be switched from a closed state to an open state, the opening and closing head 32 is configured to press against the top surface of the pressing portion 452 to separate the clamping portion 451 from the upper cover 41. That is, after the chip is tested in the test socket 4, the opening and closing head 32 is moved so that the opening and closing head 32 applies downward pressure to the top surface of the pressing portion 452 to release the clamping portion 451 from the upper cover 41, and finally the test socket 4 is in an open state so as to take out the tested chip.

[0065] Preferably, a spring can be provided at the connection between the upper cover 41 and the bottom plate 42 of the test socket 4, so that when the opening and closing head 32 applies downward pressure to the top surface of the pressing portion 452, the clamping relationship between the clamping portion 451 and the upper cover 41 is first released, and then under the action of the spring between the upper cover 41 and the bottom plate 42, the upper cover 41 will automatically pop open in the direction away from the bottom plate 42, and the user no longer needs to operate the opening and closing head 32 to drive the upper cover 41 away from the bottom plate 42.

[0066] By providing the buckle 45, the method of operating the test socket 4 to open and close is simple and quick, and it is convenient for users to operate; the buckle 45 can provide a stable closed state for the test socket 4, and in the closed state, the opening and closing head 32 needs to apply a certain force to the pressing part 452 to open the upper cover 41, which helps to prevent misoperation.

[0067] Exemplarily, the engaging portion 451 may be configured as a hook, or as a claw, which is not specifically limited herein.

[0068] Specifically, the clamping portion 451 and the pressing portion 452 on the buckle 45 can be integrally formed to facilitate processing and manufacturing during the production process.

[0069] like Figure 1 to Figure 4As shown, in some embodiments, a first adjustment mechanism 5 is provided on the supporting platform 1, and the first adjustment mechanism 5 includes a first adjustment member 51, a second adjustment member 52 and a third adjustment member 53. The first adjustment member 51 extends along the first direction X, and the second adjustment member 52 is connected to the first adjustment member 51, and can drive the first adjustment member 51 to move along the second direction Y. The first direction X and the second direction Y are set at an angle, and both extend in the horizontal direction. The third adjustment member 53 is movably connected to the first adjustment member 51 along the first direction X, and the operating mechanism 3 is connected to the third adjustment member 53. The third adjustment member 53 can drive the operating mechanism 3 to rise and fall vertically relative to the supporting platform 1.

[0070] In specific implementation, when the operating mechanism 3 needs to move along the first direction X, the third adjusting member 53 is started, so that the third adjusting member 53 drives the operating mechanism 3 to move along the extension direction of the first adjusting member 51 (i.e., the first direction X); when the operating mechanism 3 needs to move along the second direction Y, the second adjusting member 52 is started, so that the second adjusting member 52 drives the first adjusting member 51 to move along the second direction Y. At this time, the third adjusting member 53 on the first adjusting member 51 moves along the second direction Y at the same time, and the operating mechanism 3 also moves along the second direction Y accordingly; when the operating mechanism 3 moves to a suitable position and needs to be vertically raised or lowered relative to the supporting platform 1, the third adjusting member 53 is started to control the operating mechanism 3 to adjust the height position.

[0071] By providing the first adjustment mechanism 5, the first adjustment member 51, the second adjustment member 52 and the third adjustment member 53 can respectively drive the operating mechanism 3 to move in the first direction X and the second direction Y, and drive the operating mechanism 3 to vertically rise and fall in the height direction of the supporting platform 1. In this way, the movement of the operating mechanism 3 in three directions can be precisely controlled, which is conducive to improving the movement accuracy of the operating mechanism 3, and further improving the operation accuracy of the operating mechanism 3.

[0072] For example, Figure 1 and Figure 3 As shown, the first direction X may be the width direction of the carrying platform 1 , and the second direction Y may be the length direction of the carrying platform 1 . At this time, the first direction X and the second direction Y are perpendicular to each other.

[0073] Furthermore, a long hole 12 extending along the second direction Y is formed on the supporting platform 1 , and the second adjusting member 52 is slidably disposed in the long hole 12 .

[0074] Specifically, one end of the second adjusting member 52 is connected to the first adjusting member 51 , and the other end of the second adjusting member 52 away from the first adjusting member 51 can be slidably connected to the supporting platform 1 along the second direction Y.

[0075] Through such a configuration, the second adjusting member 52 is slidably inserted into the elongated hole 12, which not only makes the structural layout more compact, but also when the second adjusting member 52 moves in the elongated hole 12, the elongated hole 12 also serves as a limiting guide for the movement of the second adjusting member 52, thereby preventing the second adjusting member 52 from tilting or shifting during the movement.

[0076] Optionally, the number of the second adjusting members 52 can be two, and the two second adjusting members 52 are respectively arranged at opposite ends of the first adjusting member 51. In this way, the two second adjusting members 52 can provide relatively balanced support at opposite ends of the first adjusting member 51, and also provide more balanced support for the first adjusting mechanism 5 as a whole, which is conducive to a more stable movement of the first adjusting mechanism 5.

[0077] It should be noted that: in this embodiment, the sliding connection between the second adjusting member 52 and the supporting platform 1, the sliding connection between the third adjusting member 53 and the first adjusting member 51, and the sliding of the operating mechanism 3 on the third adjusting member 53 can adopt the motor drive plus pulley assembly method as described above, which will not be repeated here.

[0078] In addition, the motor connected to the opening and closing head 32 may be additionally provided with a function of providing downward pressure, so that the universal rotating head 44 will not fall off downward when it is located inside the opening and closing head 32 .

[0079] like Figure 1 , Figure 3 and Figure 8 As shown, in some embodiments, the carrier 1 further includes a plurality of storage areas 14 for storing chips, and a rotating member 7 is fixedly provided between two adjacent storage areas 14, and the rotating member 7 can carry the chips and drive the chips to rotate.

[0080] For the convenience of description, Figure 8 Taking the orientation in as an example, along the length direction of the support platform 1, that is, Figure 8 In the second direction Y, the left side is the front side of the carrier 1, and the right side is the rear side of the carrier 1. Exemplarily, the test area 11 is located at the front side of the carrier 1, and the plurality of storage areas 14 are arranged at the rear side of the carrier 1. The storage area 14 can be Figure 8 The number of the plurality of elements is 5, but it is not limited thereto, and the specific number can be determined according to the actual situation.

[0081] By setting up multiple storage areas 14, it is possible to conveniently store a variety of different types of chips; the chips are placed on the rotating member 7, and the rotation of the rotating member 7 can adjust the angle of the chip, so that the placement angle of the chip can be directly adapted to the test socket 4, avoiding repeated loading operations due to inappropriate chip placement angles, which is conducive to improving the overall detection efficiency. That is: when the chip angle in the storage area 14 is adapted to the test position in the test socket 4, the chip can be directly transferred from the storage area 14 to the inside of the test socket 4, and when the chip angle in the storage area 14 deviates from the test position in the test socket 4, the chip in the storage area 14 is first transferred to the rotating member 7, and after the rotating member 7 adjusts the placement angle of the chip to the right position, the chip is transferred from the rotating member 7 to the test socket 4.

[0082] Alternatively, if Figure 1 and Figure 3 As shown, a second adjustment mechanism 8 can be provided at multiple storage areas 14, and a second adsorption head 9 is connected to the second adjustment mechanism 8, wherein the setting of the second adjustment mechanism 8 can refer to the first adjustment mechanism 5, and can drive the second adsorption head 9 to move along the first direction X, the second direction Y and the height direction of the supporting platform 1, which will not be repeated here.

[0083] The second adsorption head 9 is configured to transfer the chip from the storage area 14 to the conveyor 2, or to transfer the chip from the storage area 14 to the rotating member 7. After the chip is rotated by the rotating member 7, it is adsorbed and transferred to the conveyor 2 by the second adsorption head 9. The second adsorption head 9 can also be set as a suction nozzle or a magnetic suction nozzle with a vacuum adsorption function, which is not specifically limited here, and the number of the second adsorption heads 9 can be set to multiple to improve the transfer efficiency of the chip.

[0084] Obviously, the above embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention. For those skilled in the art, various obvious changes, readjustments and substitutions can be made without departing from the protection scope of the present invention. It is not necessary and impossible to list all the embodiments here. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the claims of the present invention.

Claims

1. Test socket opening and closing mechanism, characterized in that: include: A carrier platform (1), wherein a test area (11) is provided on the carrier platform (1), wherein the test area (11) is used to install a test socket (4), and wherein the test socket (4) comprises an upper cover (41) and a bottom plate (42); A conveying member (2) is movably arranged on the carrying platform (1), and the conveying member (2) has a receiving groove (21) for receiving a chip; An operating mechanism (3) is movable relative to the carrier platform (1), the operating mechanism (3) comprising a first adsorption head (31) and an opening and closing head (32), the first adsorption head (31) being configured to transfer the chip between the accommodating groove (21) and the chip groove of the bottom plate (42), the opening and closing head (32) being configured to drive the upper cover (41) to open or close relative to the bottom plate (42); The upper cover (41) is fixedly connected to a connecting arm (43), and a universal rotating head (44) is provided at one end of the connecting arm (43) away from the upper cover (41), and the universal rotating head (44) is configured to partially extend into the opening and closing head (32) and can be rotatably matched with the opening and closing head (32); The opening and closing head (32) comprises a first clamping portion (321) and a second clamping portion (322); one end of the first clamping portion (321) and the second clamping portion (322) are connected to each other, and the other end is set to be open; the opening and closing head (32) is elastic; the universal rotating head (44) extends between the first clamping portion (321) and the second clamping portion (322) through the open portion; when the universal rotating head (44) extends between the first clamping portion (321) and the second clamping portion (322), the first clamping portion (321) and the second clamping portion (322) can provide a clamping force to the universal rotating head (44).

2. The test socket opening and closing mechanism according to claim 1, characterized in that: A buckle (45) is provided on the bottom plate (42), and the buckle (45) comprises a clamping portion (451) and a pressing portion (452) arranged opposite to each other. When the test socket (4) is in a closed state, the clamping portion (451) and the upper cover (41) are mutually clamped; when the test socket (4) needs to be switched from a closed state to an open state, the opening and closing head (32) is configured to press against the top surface of the pressing portion (452) so that the clamping portion (451) is separated from the upper cover (41).

3. The test socket opening and closing mechanism according to claim 1 or 2, characterized in that: The support platform (1) is provided with a first adjustment mechanism (5), the first adjustment mechanism (5) comprising a first adjustment member (51), a second adjustment member (52) and a third adjustment member (53), the first adjustment member (51) extending along a first direction (X), the second adjustment member (52) being connected to the first adjustment member (51) and being capable of driving the first adjustment member (51) to move along a second direction (Y), the first direction (X) and the second direction (Y) being arranged at an angle and both extending in a horizontal direction, the third adjustment member (53) being movably connected to the first adjustment member (51) along the first direction (X), the operating mechanism (3) being connected to the third adjustment member (53), and the third adjustment member (53) being capable of driving the operating mechanism (3) to vertically rise and fall relative to the support platform (1).

4. The test socket opening and closing mechanism according to claim 3, characterized in that: The supporting platform (1) is provided with an elongated hole (12) extending along the second direction (Y), and the second adjusting member (52) is slidably arranged in the elongated hole (12).

5. The test socket opening and closing mechanism according to claim 1 or 2, characterized in that: The support platform (1) is provided with a long groove (13), a guide rail (6) extending along the length direction of the long groove (13) is fixedly arranged in the long groove (13), and the conveying member (2) is partially located in the long groove (13) and is slidably matched with the guide rail (6).

6. The test socket opening and closing mechanism according to claim 1 or 2, characterized in that: There are two test areas (11), each of the two test areas (11) can be equipped with a plurality of test sockets (4), and the conveying member (2) can be movably arranged between the two test areas (11).

7. The test socket opening and closing mechanism according to claim 1 or 2, characterized in that: The carrier platform (1) further comprises a plurality of material storage areas (14), wherein the plurality of material storage areas (14) are used to store chips, and a rotating member (7) is fixedly arranged between two adjacent material storage areas (14), wherein the rotating member (7) is capable of carrying the chips and driving the chips to rotate.

8. A chip testing device, characterized in that: It comprises a test module and a test socket opening and closing mechanism as claimed in any one of claims 1 to 7; The test module is mounted on the carrier platform (1) and is electrically connected to the test socket (4); the test module is used to test the chip.

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