Accelerated Aging Test Method, Device and Equipment for Varistor of Lightning Arrester

Abstract

The present application relates to a method, device and equipment for accelerating the aging test of varistors of a lightning arrester. The method includes obtaining the steady-state voltage harmonic spectrum, the reference voltage of the lightning arrester, the reference voltage of the varistor and the power frequency of an AC filter; obtaining the main frequency voltage, the main frequency harmonic number and the total harmonic voltage amplitude from the steady-state voltage harmonic spectrum; calculating the charge rate according to the reference voltage of the lightning arrester and the total harmonic voltage amplitude; calculating the main frequency harmonic voltage charge rate, the waveform frequency and the test voltage according to the main frequency voltage, the main frequency harmonic number, the reference voltage of the lightning arrester, the power frequency, the charge rate and the reference voltage of the varistor; obtaining the aging test parameters and the accelerated aging test voltage waveform and performing an aging test on each varistor in the lightning arrester according to them to obtain a power loss-time relationship curve graph. The method realizes the aging characteristic test of the lightning arrester under the superposition of multiple harmonic voltages, obtains the lightning arrester passing the stability test, and improves the performance of the AC filter.

Description

Technical Field

[0001] The present application relates to the technical field of arrester aging tests, and particularly relates to a method, device and equipment for accelerating the aging test of resistor chips of an arrester. Background Art

[0002] Currently, only AC power frequency or DC voltage waveforms can be used in the long-term operating voltage test of arresters for AC filters. Therefore, long-term stability test data of each resistor chip in the arrester under AC / DC can be easily obtained. The resistor chip products produced by existing arresters all have long-term operating stability under an AC power frequency of 0.95 charge rate (charge rate = maximum operating voltage applied / resistor chip reference voltage). However, for the arrester of the AC filter that needs to operate for a long time, its operating voltage contains multiple harmonic components, and the power supply for the stability test of the arrester cannot generate a voltage waveform with harmonic components, resulting in poor test results.

[0003] Currently, due to the limitation of the test power supply for the stability test of the arrester, the power consumption of the resistor chip under power frequency is used to replace the power consumption under harmonics. However, since the polarization loss of the resistor chip increases significantly under the action of high-frequency voltage, there is a certain uncertainty in the method of using power frequency loss to replace harmonic power consumption, which is likely to increase engineering risks. Summary of the Invention

[0004] The embodiments of the present application provide a method, device and equipment for accelerating the aging test of resistor chips of an arrester, which are used to solve the technical problem that the existing long-term stability test method for arresters can only use AC power frequency or DC voltage waveforms and is not applicable to the stability test of arresters in AC filters.

[0005] To achieve the above purpose, the embodiments of the present application provide the following technical solutions:

[0006] On the one hand, a method for accelerating the aging test of resistor chips of an arrester is provided, which is applied to the arrester of an AC filter. The method for accelerating the aging test of resistor chips includes the following steps:

[0007] Obtain the steady-state voltage harmonic spectrum, arrester reference voltage, resistor chip reference voltage and power frequency of the arrester in the AC filter; obtain the main frequency voltage, main frequency harmonic number and total harmonic voltage amplitude from the steady-state voltage harmonic spectrum;

[0008] Calculate the charge rate of the arrester according to the arrester reference voltage and the total harmonic voltage amplitude; calculate the main frequency harmonic voltage charge rate, waveform frequency and test voltage according to the main frequency voltage, the main frequency harmonic number, the arrester reference voltage, the power frequency, the charge rate and the resistor chip reference voltage;

[0009] Obtain the aging test parameters, and determine the accelerated aging test voltage waveform according to the main frequency harmonic voltage charging rate, the waveform frequency, and the charging rate; the aging test parameters include the test temperature and the operating duration;

[0010] Conduct an aging test on each resistor disc in the arrester according to the aging test parameters, the test voltage, and the accelerated aging test voltage waveform, and obtain the power loss-time relationship curve graph of the corresponding resistor disc.

[0011] Preferably, the accelerated aging test method for the resistor discs of the arrester includes:

[0012] Obtain the set of power losses at each time of the resistor discs from the power loss-time relationship curve graph, and screen out the minimum power loss, the maximum power loss, and the starting value of the power loss from the set of power losses at each time;

[0013] If the maximum power loss does not exceed 1.3 times the minimum power loss and each power loss at each time in the set of power losses at each time is not greater than 1.1 times the starting value of the power loss, then the corresponding resistor disc passes the aging test.

[0014] Preferably, the accelerated aging test method for the resistor discs of the arrester includes: if all the resistor discs in the arrester pass the aging test, then the arrester passes the aging test.

[0015] Preferably, calculating according to the main frequency voltage, the main frequency harmonic number, the reference voltage of the arrester, the power frequency, the charging rate, and the reference voltage of the resistor disc to obtain the main frequency harmonic voltage charging rate, the waveform frequency, and the test voltage includes:

[0016] Calculate the main frequency harmonic voltage charging rate according to the main frequency voltage and the reference voltage of the arrester using the charging rate formula;

[0017] Calculate the waveform frequency according to the main frequency harmonic number and the power frequency using the waveform frequency formula;

[0018] Calculate the test voltage according to the charging rate and the reference voltage of the resistor disc using the test voltage formula;

[0019] Among them, the charging rate formula is: H ez =(U z *A) / U bc , the waveform frequency formula is: f b =B*f 0 , the test voltage formula is: U s =U dc *H e , in the formula, H ezis the charging rate of the fundamental harmonic voltage, U z is the fundamental voltage, A is the conversion peak factor, U bc is the reference voltage of the arrester, f b is the waveform frequency, B is the fundamental harmonic order, f 0 is the power frequency, U s is the test voltage, U dc is the reference voltage of the varistor, H e is the charging rate of the arrester.

[0020] Preferably, the operation duration content for obtaining the aging test parameters includes:

[0021] Obtain the temperature difference between the test temperature and the operating temperature of the aging test equipment and the operating years of the aging test equipment;

[0022] Calculate the test acceleration coefficient according to the temperature difference, and calculate the operation duration according to the operating years and the test acceleration coefficient.

[0023] On the other hand, a varistor accelerated aging test device for an arrester is provided, which is applied to the arrester of an AC filter. The varistor accelerated aging test device includes a data acquisition module, a calculation module, a waveform determination module and an aging test output module;

[0024] The data acquisition module is used to obtain the steady-state voltage harmonic spectrum, the reference voltage of the arrester, the reference voltage of the varistor and the power frequency of the arrester in the AC filter; obtain the fundamental voltage, the fundamental harmonic order and the total harmonic voltage amplitude from the steady-state voltage harmonic spectrum;

[0025] The calculation module is used to calculate the charging rate of the arrester according to the reference voltage of the arrester and the total harmonic voltage amplitude; calculate the charging rate of the fundamental harmonic voltage, the waveform frequency and the test voltage according to the fundamental voltage, the fundamental harmonic order, the reference voltage of the arrester, the power frequency, the charging rate and the reference voltage of the varistor;

[0026] The waveform determination module is used to obtain the aging test parameters and determine the accelerated aging test voltage waveform according to the charging rate of the fundamental harmonic voltage, the waveform frequency and the charging rate; the aging test parameters include the test temperature and the operation duration;

[0027] The aging test output module is used to perform an aging test on each varistor in the arrester according to the aging test parameters, the test voltage and the accelerated aging test voltage waveform, and obtain the power loss-time relationship curve of the corresponding varistor.

[0028] Preferably, the accelerating aging test device for the varistor resistors includes a passing judgment module. The passing judgment module is configured to obtain a set of power losses at each time of the varistor resistors from the power loss - time relationship curve graph, and screen out the minimum power loss, the maximum power loss, and the power loss start value from the set of power losses at each time. If the maximum power loss does not exceed 1.3 times the minimum power loss and each power loss at each time in the set of power losses at each time is not greater than 1.1 times the power loss start value, then the corresponding varistor resistor passes the aging test.

[0029] Preferably, the passing judgment module is further configured to determine that the arrester passes the aging test if all the varistor resistors in the arrester pass the aging test.

[0030] Preferably, the calculation module includes a first calculation sub - module, a second calculation sub - module, and a third calculation sub - module;

[0031] The first calculation sub - module is configured to calculate the charging rate of the fundamental frequency harmonic voltage according to the fundamental frequency voltage and the reference voltage of the arrester by using the charging rate formula.

[0032] The second calculation sub - module is configured to calculate the waveform frequency according to the fundamental frequency harmonic order and the power frequency by using the waveform frequency formula.

[0033] The third calculation sub - module is configured to calculate the test voltage according to the charging rate and the reference voltage of the varistor resistor by using the test voltage formula.

[0034] Wherein, the charging rate formula is: H ez =(U z *A) / U bc , the waveform frequency formula is: f b =B*f 0 , the test voltage formula is: U s =U dc *H e , in the formula, H ez is the charging rate of the fundamental frequency harmonic voltage, U z is the fundamental frequency voltage, A is the conversion peak coefficient, U bc is the reference voltage of the arrester, f b is the waveform frequency, B is the fundamental frequency harmonic order, f 0 is the power frequency, U s is the test voltage, U dc is the reference voltage of the varistor resistor, H e is the charging rate of the arrester.

[0035] On the other hand, a terminal device is provided, including a processor and a memory;

[0036] The memory is used to store program codes and transmit the program codes to the processor;

[0037] The processor is used to execute the method for accelerating the aging test of the varistor of the lightning arrester according to the instructions in the program codes.

[0038] The method, device and equipment for accelerating the aging test of the varistor of the lightning arrester. The method includes obtaining the steady-state voltage harmonic spectrum, reference voltage of the lightning arrester, reference voltage of the varistor and power frequency of the lightning arrester in the AC filter; obtaining the main frequency voltage, main frequency harmonic order and total harmonic voltage amplitude from the steady-state voltage harmonic spectrum; calculating according to the reference voltage of the lightning arrester and the total harmonic voltage amplitude to obtain the charge rate of the lightning arrester; calculating according to the main frequency voltage, main frequency harmonic order, reference voltage of the lightning arrester, power frequency, charge rate and reference voltage of the varistor to obtain the charge rate of the main frequency harmonic voltage, waveform frequency and test voltage; obtaining aging test parameters, and determining the accelerated aging test voltage waveform according to the charge rate of the main frequency harmonic voltage, waveform frequency and charge rate; the aging test parameters include test temperature and operation duration; performing an aging test on each varistor in the lightning arrester according to the aging test parameters, test voltage and accelerated aging test voltage waveform to obtain the power loss-time relationship curve graph of the corresponding varistor. It can be seen from the above technical solutions that the embodiments of the present application have the following advantages: The method for accelerating the aging test of the varistor of the lightning arrester realizes the aging characteristic test of the lightning arrester in the AC filter under the superposition of multiple harmonic voltages, obtains the lightning arrester passing the stability test, improves the performance of the AC filter, and solves the technical problem that the existing method for long-term stability test of the lightning arrester can only adopt AC power frequency or DC voltage waveform and is not applicable to the stability test of the lightning arrester in the AC filter. Description of the Drawings

[0039] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0040] Figure 1 It is a step flow chart of the method for accelerating the aging test of the varistor of the lightning arrester described in the embodiments of the present application;

[0041] Figure 2 It is a framework diagram of the aging test of the lightning arrester in the method for accelerating the aging test of the varistor of the lightning arrester described in the embodiments of the present application;

[0042] Figure 3The power loss-time relationship curve of the resistor chip accelerated aging test method for the lightning arrester described in the embodiments of the present application;

[0043] Figure 4 The schematic diagram of the framework of the resistor chip accelerated aging test device for the lightning arrester described in the embodiments of the present application;

[0044] Figure 5 The schematic diagram of the terminal device described in the embodiments of the present application. Detailed implementation manners

[0045] To make the objectives, features, and advantages of the present application more obvious and understandable, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the embodiments described below are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the scope of protection of the present application.

[0046] In the description of the embodiments of the present application, the terms "first" and "second" are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the embodiments of the present application, "a plurality of" means two or more, unless otherwise specifically defined.

[0047] In the embodiments of the present application, unless otherwise clearly defined and limited, the terms "installed", "connected", "connected", "fixed", etc. should be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or integrated; it may be a mechanical connection or an electrical connection; it may be directly connected or indirectly connected through an intermediate medium, and it may be the internal communication of two components or the interaction relationship between two components. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present application can be understood according to specific situations.

[0048] In the embodiments of the present application, for a conventional DC project based on a thyristor converter valve (LCC), a large number of AC filter banks usually need to be installed on the AC side, such as Figure 1 In the AC filter configuration scheme of a certain DC project shown, 4 large groups and 15 small groups of AC filters are configured on the AC 500 kV bus. The AC filters are divided into three types: A, B, and C. The type structure of each AC filter is as Figure 1As shown in the figure. Among them, C is a capacitor, L is a reactor, R is a resistor, and Fac is a lightning arrester. It can be seen that the lightning arrester of the AC filter plays a role in protecting low-voltage components. A reasonable configuration scheme for the lightning arrester of the AC filter not only needs to ensure the stability of the lightning arrester during long-term continuous operation, but also needs to ensure that the lightning arrester has sufficient protection ability (residual voltage and current-carrying energy level meeting the protection requirements) when withstanding transient overvoltages. Among them, during the long-term continuous operation of the lightning arrester, it needs to withstand the harmonic voltage on the AC filter components. This harmonic voltage contains the superposition of multiple harmonic components, and the harmonic frequency distribution is usually concentrated in the 2nd to 50th times, such as Figure 2 shown Figure 2 is a typical voltage waveform diagram of the steady-state operation of the lightning arrester of the AC filter.

[0049] To verify the thermal stability of the lightning arrester under long-term operating voltage, a long-term stability test needs to be carried out in the type test of the lightning arrester. During the test, the varistor of the lightning arrester needs to be heated to 115 °C, the long-term operating voltage is applied between the ends of the varistor, and it lasts for 1000 hours. Measure the power consumption of the varistor during the test to obtain the power consumption-time curve, and use the method of GB / T11032-2020 8.4.3.4 to determine whether the lightning arrester passes the test.

[0050] In the current design of the lightning arrester of the AC filter, a charging rate of 0.8 is generally selected for design, but it is impossible to verify the thermal stability of the lightning arrester under the multiple harmonic voltages of 0.8 charging rate through tests. The power loss of the metal oxide varistor includes conduction loss, polarization loss, and loss caused by structural inhomogeneity. According to the principles of electrical engineering, the active power loss P of the metal oxide varistor material under the action of voltage is:[[]]

[0051]

[0052] In the formula, the first half is the polarization power loss, and the second half is the conduction power loss. Among them, the capacitance C, resistance value R, dielectric loss tangent value tanσ, voltage frequency f, and effective voltage value U of the varistor. It can be seen that the polarization loss part is related to the power supply frequency. Under the action of high-frequency voltage with the same voltage amplitude, the power consumption of the varistor will be higher than that under power frequency voltage.

[0053] The embodiment of the present application provides a method, device and equipment for accelerating the aging test of the varistor of a lightning arrester, which is applied to the lightning arrester of an AC filter, and solves the technical problem that the existing method for long-term stability test of a lightning arrester can only use AC power frequency or DC voltage waveforms, which is not applicable to the stability test of the lightning arrester in an AC filter.

[0054] Embodiment 1:

[0055] Figure 1It is a flowchart of the steps of the accelerated aging test method for the varistor of the lightning arrester described in the embodiments of the present application. Figure 2 It is a framework diagram of the aging test of the lightning arrester in the accelerated aging test method for the varistor of the lightning arrester described in the embodiments of the present application. In Figure 2 it, MOA represents the test varistor, RS represents the current-limiting resistor, and the dashed box is the temperature control box for the aging test.

[0056] As Figure 1 and Figure 2 shown, the embodiments of the present application provide an accelerated aging test method for the varistor of a lightning arrester, which is applied to the lightning arrester of an AC filter. The accelerated aging test method for the varistor includes the following steps:

[0057] S1. Obtain the steady-state voltage harmonic spectrum, the reference voltage of the lightning arrester, the reference voltage of the varistor, and the power frequency of the lightning arrester in the AC filter; obtain the main frequency voltage, the main frequency harmonic order, and the total harmonic voltage amplitude from the steady-state voltage harmonic spectrum.

[0058] It should be noted that in step S1, the steady-state voltage harmonic spectrum, the reference voltage of the lightning arrester, the reference voltage of the varistor, and the power frequency of the lightning arrester in the AC filter. The steady-state voltage harmonic spectrum can obtain each harmonic and the harmonic order, voltage amplitude, and single-harmonic effective value corresponding to each harmonic, so that the total harmonic voltage amplitude and total harmonic effective value of all harmonics can be obtained. In this embodiment, due to the tuning point setting of the AC filter, it will inevitably lead to a significantly higher harmonic percentage of the main frequency harmonic order than that of the other orders. The harmonic order with the highest voltage amplitude percentage is selected as the main frequency voltage.

[0059] S2. Calculate according to the reference voltage of the lightning arrester and the total harmonic voltage amplitude to obtain the charge rate of the lightning arrester; calculate according to the main frequency voltage, the main frequency harmonic order, the reference voltage of the lightning arrester, the power frequency, the charge rate, and the reference voltage of the varistor to obtain the charge rate of the main frequency harmonic voltage, the waveform frequency, and the test voltage.

[0060] It should be noted that in step S2, first calculate the charge rate of the lightning arrester and the charge rate of the main frequency harmonic voltage, the waveform frequency, and the test voltage according to the data in step S1. The charge rate of the lightning arrester is the total harmonic voltage amplitude of each harmonic divided by the reference voltage of the lightning arrester. For example, if the reference voltage of the lightning arrester is 106.8 kV and the total harmonic voltage amplitude is 83.3 kV, the charge rate H e is 0.78.

[0061] In the embodiments of the present application, the single-harmonic percentage of each harmonic is obtained by dividing the single-harmonic effective value by the total harmonic effective value and multiplying by 100%, as shown in Table 1. Among them, the main frequency voltage in Table 1 is the 13th harmonic.

[0062] Table 1 shows the harmonic parameters of the steady-state voltage harmonic spectrum

[0063]

[0064] S3. Obtain the aging test parameters, and determine the accelerated aging test voltage waveform according to the main frequency harmonic voltage charging rate, waveform frequency, and charging rate; the aging test parameters include test temperature and operating duration.

[0065] It should be noted that in step S3, the aging test parameters and the accelerated aging test voltage waveform required for the aging test of the resistor chips in the arrester are obtained. Among them, the test temperature can be selected as 115°C.

[0066] S4. Perform an aging test on each resistor chip in the arrester according to the aging test parameters, test voltage, and accelerated aging test voltage waveform, and obtain the power loss-time relationship curve of the corresponding resistor chip.

[0067] It should be noted that in step S4, the resistor chips of the arrester are subjected to an aging test. As Figure 2 shown, the test voltage obtained in step S2 is applied to the resistor chip test group, and each test group consists of 3 resistor chips of the same model. The test group samples are placed in the temperature control box for the aging test. While applying the test voltage to the resistor chips, the test circuit for controlling the test temperature at 115°C is as Figure 2 shown.

[0068] A method for accelerating the aging test of the resistor chips of an arrester provided by this application includes obtaining the steady-state voltage harmonic spectrum, arrester reference voltage, resistor chip reference voltage, and power frequency of the arrester in the AC filter; obtaining the main frequency voltage, main frequency harmonic order, and total harmonic voltage amplitude from the steady-state voltage harmonic spectrum; calculating according to the arrester reference voltage and the total harmonic voltage amplitude to obtain the charging rate of the arrester; calculating according to the main frequency voltage, main frequency harmonic order, arrester reference voltage, power frequency, charging rate, and resistor chip reference voltage to obtain the main frequency harmonic voltage charging rate, waveform frequency, and test voltage; obtaining the aging test parameters, and determining the accelerated aging test voltage waveform according to the main frequency harmonic voltage charging rate, waveform frequency, and charging rate; the aging test parameters include test temperature and operating duration; performing an aging test on each resistor chip in the arrester according to the aging test parameters, test voltage, and accelerated aging test voltage waveform, and obtaining the power loss-time relationship curve of the corresponding resistor chip. The method for accelerating the aging test of the resistor chips of the arrester realizes the aging characteristic test of the arrester in the AC filter under the superposition of multiple harmonic voltages, obtains the arrester passing the stability test, improves the performance of the AC filter, and solves the technical problem that the existing long-term stability test method for the arrester can only use AC power frequency or DC voltage waveforms and is not applicable to the stability test of the arrester in the AC filter.

[0069] It should be noted that the accelerated aging test method for the varistor of this arrester only needs to output the accelerated aging test voltage waveform based on a single fundamental frequency voltage generator and a power frequency voltage generator. Compared with the previous aging test results using only power frequency voltage and the comparison with harmonic voltage, the reliability of the arrester is improved. For example, if the power frequency aging test passes the test at a charge rate of 0.95, it is considered that the harmonic voltage can also withstand a charge rate of 0.95, ignoring the polarization loss under high-frequency harmonics, resulting in a decrease in the reliability of the actual application of the arrester.

[0070] Figure 3 It is the power loss-time relationship curve graph of the accelerated aging test method for the varistor of the arrester described in the embodiment of the present application.

[0071] In an embodiment of the present application, the accelerated aging test method for the varistor of this arrester includes:

[0072] Obtain the set of power losses at each time of the varistor from the power loss-time relationship curve graph, and screen out the minimum power loss, the maximum power loss, and the starting value of the power loss from the set of power losses at each time;

[0073] If the maximum power loss does not exceed 1.3 times the minimum power loss and each power loss at each time in the set of power losses at each time is not greater than 1.1 times the starting value of the power loss, the corresponding varistor passes the aging test.

[0074] It should be noted that after the accelerated aging test for each varistor of this arrester starts, the power loss of the varistor is measured 3h ± 15min later as the starting value of the power loss Pstart, and the power loss at each hour and the power loss at the end of the test are subsequently recorded as the ending value of the power loss Pend. As Figure 3 shown, the power loss at the lowest point of the curve in the power loss-time relationship curve graph is used as the minimum power loss Pmin. The maximum power loss refers to the power loss with the largest value between the minimum power loss Pmin and the ending value of the power loss Pend as the maximum power loss Pmax.

[0075] In an embodiment of the present application, the accelerated aging test method for the varistor of this arrester includes: if all the varistors in the arrester pass the aging test, the arrester passes the aging test.

[0076] It should be noted that only when all the varistors in the arrester pass the aging test can it be stated that the arrester passes the aging test.

[0077] In an embodiment of the present application, calculating based on the main frequency voltage, the number of main frequency harmonics, the reference voltage of the lightning arrester, the power frequency, the charge rate, and the reference voltage of the varistor to obtain the charge rate of the main frequency harmonic voltage, the waveform frequency, and the test voltage includes:

[0078] Calculating according to the main frequency voltage and the reference voltage of the lightning arrester using the charge rate formula to obtain the charge rate of the main frequency harmonic voltage;

[0079] Calculating according to the number of main frequency harmonics and the power frequency using the waveform frequency formula to obtain the waveform frequency;

[0080] Calculating according to the charge rate and the reference voltage of the varistor using the test voltage formula to obtain the test voltage;

[0081] Among them, the charge rate formula is: H ez =(U z *A) / U bc , the waveform frequency formula is: f b =B*f 0 , the test voltage formula is: U s =U dc *H e , in the formula, H ez is the charge rate of the main frequency harmonic voltage, U z is the main frequency voltage, A is the conversion peak factor, U bc is the reference voltage of the lightning arrester, f b is the waveform frequency, B is the number of main frequency harmonics, f 0 is the power frequency, U s is the test voltage, U dc is the reference voltage of the varistor, H e is the charge rate of the lightning arrester.

[0082] It should be noted that since the main frequency voltage is significantly higher than other harmonics in the percentage content of each harmonic (determined by the tuning point of the filter), it can be approximately considered that the aging loss under the superposition of multiple harmonics is approximately equal to the loss of the main frequency voltage at the same charge rate. By adjusting the charge rate of the main frequency harmonic voltage to the charge rate of the lightning arrester, the accelerated aging test voltage waveform can be obtained. For example: If U z is 41.57, A is 1.414, U bc is 108, f 0 is 50Hz, B is 13, U dc is 4.9kV, then it is calculated that H ez =0.54, and in the test voltage, the charge rate of the 13th harmonic voltage is adjusted from 0.54 to 0.78. The test voltage waveform of the varistor for the accelerated aging test has a waveform frequency f b of 13*50 = 650Hz, and the test voltage U sA sinusoidal voltage waveform of 4.9 kV * 0.78 = 3.822 kV (the reference voltage of a single resistor chip is 4.9 kV).

[0083] In the embodiment of the present application, the content of the operation duration for obtaining the aging test parameters includes:

[0084] Obtaining the temperature difference between the test temperature and the operating temperature of the aging test equipment, and the operating years of the aging test equipment;

[0085] Calculating the test acceleration coefficient according to the temperature difference, and calculating the operation duration according to the operating years and the test acceleration coefficient.

[0086] In the embodiment of the present application, the test acceleration coefficient is calculated according to the temperature difference using the coefficient calculation formula. The coefficient calculation formula is: AF T = 2.5 (ΔT / 10) where AF T is the test acceleration coefficient, and ΔT is the temperature difference. In this embodiment, if the operating years are 40 years and the test acceleration coefficient is 386, and it operates for 40 years at the upper limit of the ambient temperature of the aging equipment, which is 50 °C, then the test acceleration coefficient is 386, and the operation duration of the test is 40 * 8760 / 386 = 907 hours.

[0087] Embodiment 2:

[0088] Figure 4 It is a schematic diagram of the framework of the resistor chip accelerated aging test device for the lightning arrester described in the embodiment of the present application.

[0089] As Figure 4 shown, the embodiment of the present application provides a resistor chip accelerated aging test device for a lightning arrester, which is applied to the lightning arrester of an AC filter. The resistor chip accelerated aging test device includes a data acquisition module 10, a calculation module 20, a waveform determination module 30, and an aging test output module 40;

[0090] The data acquisition module 10 is used to acquire the steady-state voltage harmonic spectrum, the reference voltage of the lightning arrester, the reference voltage of the resistor chip, and the power frequency of the lightning arrester in the AC filter; and obtain the main frequency voltage, the main frequency harmonic order, and the total harmonic voltage amplitude from the steady-state voltage harmonic spectrum;

[0091] The calculation module 20 is used to calculate the charge rate of the lightning arrester according to the reference voltage of the lightning arrester and the total harmonic voltage amplitude; and calculate the main frequency harmonic voltage charge rate, the waveform frequency, and the test voltage according to the main frequency voltage, the main frequency harmonic order, the reference voltage of the lightning arrester, the power frequency, the charge rate, and the reference voltage of the resistor chip;

[0092] The waveform determination module 30 is configured to obtain aging test parameters and determine the accelerated aging test voltage waveform according to the fundamental frequency harmonic voltage charge rate, waveform frequency, and charge rate; the aging test parameters include test temperature and operation duration;

[0093] The aging test output module 40 is configured to perform an aging test on each resistor chip in the arrester according to the aging test parameters, test voltage, and accelerated aging test voltage waveform, and obtain a power loss-time relationship curve graph of the corresponding resistor chip.

[0094] In the embodiment of the present application, the resistor chip accelerated aging test device of the arrester includes a judgment module. The judgment module is configured to obtain a set of time power losses composed of the power losses at each time in the resistor chip from the power loss-time relationship curve graph, and screen out the minimum power loss, maximum power loss, and power loss start value from the set of time power losses; if the maximum power loss does not exceed 1.3 times the minimum power loss and each power loss at each time in the set of time power losses is not greater than 1.1 times the power loss start value, the corresponding resistor chip passes the aging test.

[0095] In the embodiment of the present application, the judgment module is further configured to determine that the arrester passes the aging test if all the resistor chips in the arrester pass the aging test.

[0096] In the embodiment of the present application, the calculation module includes a first calculation sub-module, a second calculation sub-module, and a third calculation sub-module;

[0097] The first calculation sub-module is configured to calculate according to the fundamental frequency voltage and the arrester reference voltage using the charge rate formula to obtain the fundamental frequency harmonic voltage charge rate;

[0098] The second calculation sub-module is configured to calculate according to the fundamental frequency harmonic order and the power frequency using the waveform frequency formula to obtain the waveform frequency;

[0099] The third calculation sub-module is configured to calculate according to the charge rate and the resistor chip reference voltage using the test voltage formula to obtain the test voltage;

[0100] Among them, the charge rate formula is: H ez =(U z *A) / U bc , the waveform frequency formula is: f b =B*f 0 , the test voltage formula is: U s =U dc *H e , in the formula, H ez is the fundamental frequency harmonic voltage charge rate, U z is the fundamental frequency voltage, A is the conversion peak coefficient, U bc is the arrester reference voltage, f bis the waveform frequency, B is the main frequency harmonic number, and f 0 is the power frequency, and U s is the test voltage, and U dc is the reference voltage of the resistor chip, and H e is the charge rate of the lightning arrester.

[0101] It should be noted that the content of the modules in the device of the second embodiment corresponds to the steps of the method in the first embodiment. The content of the method for accelerating the aging test of the resistor chip of this lightning arrester has been described in the first embodiment, and the module content of the device for accelerating the aging test of the resistor chip of this lightning arrester will not be described in detail in this embodiment.

[0102] Embodiment 3:

[0103] Figure 5 is a schematic diagram of the terminal device described in the embodiments of the present application.

[0104] As Figure 5 shown, the embodiments of the present application provide a terminal device, including a processor and a memory;

[0105] The memory is used to store program codes and transmit the program codes to the processor;

[0106] The processor is used to execute the above method for accelerating the aging test of the resistor chip of the lightning arrester according to the instructions in the program code.

[0107] It should be noted that the processor is used to execute the steps in the above embodiment of the method for accelerating the aging test of the resistor chip of a lightning arrester according to the instructions in the program code. Alternatively, when the processor executes the computer program, it realizes the functions of each module / unit in the above system / device embodiments.

[0108] Exemplarily, the computer program can be divided into one or more modules / units. One or more modules / units are stored in the memory and executed by the processor to complete the present application. One or more modules / units can be a series of computer program instruction segments capable of performing specific functions, and the instruction segments are used to describe the execution process of the computer program in the terminal device.

[0109] The terminal device can be a computing device such as a desktop computer, a notebook, a palm computer, and a cloud server. The terminal device may include, but is not limited to, a processor and a memory. Those skilled in the art can understand that it does not constitute a limitation to the terminal device, and it may include more or fewer components than shown in the figure, or combine some components, or different components. For example, the terminal device may also include input / output devices, network access devices, buses, etc.

[0110] The so-called processor may be a central processing unit (CPU), or may also be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.

[0111] The memory may be an internal storage unit of the terminal device, such as the hard disk or memory of the terminal device. The memory may also be an external storage device of the terminal device, such as a plug-in hard disk equipped on the terminal device, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. Further, the memory may also include both the internal storage unit of the terminal device and the external storage device. The memory is used to store computer programs and other programs and data required by the terminal device. The memory may also be used to temporarily store data that has been output or is to be output.

[0112] Those skilled in the art can clearly understand that for the convenience and brevity of description, the specific working processes of the systems, devices, and units described above may refer to the corresponding processes in the foregoing method embodiments and will not be elaborated herein.

[0113] In several embodiments provided in the present application, it should be understood that the disclosed systems, devices, and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of the units is only a logical function division, and there may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed couplings or direct couplings or communication connections to each other can be through some interfaces, and the indirect couplings or communication connections of the devices or units can be in electrical, mechanical, or other forms.

[0114] The units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place or distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0115] In addition, the functional units in each embodiment of the present application may be integrated in one processing unit, or each unit may exist physically alone, or two or more units may be integrated in one unit. The above-mentioned integrated units can be implemented in the form of hardware or in the form of software functional units.

[0116] When the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on such understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in various embodiments of this application. The foregoing storage medium includes: various media that can store program codes, such as USB flash drives, mobile hard disks, read-only memories (ROMs), random access memories (RAMs), magnetic disks, or optical discs.

[0117] As described above, the above embodiments are only used to illustrate the technical solution of this application and are not intended to limit it; although this application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of various embodiments of this application.

Claims

1. A method for accelerating aging test of resistors of lightning arresters, applied to lightning arresters of AC filters, characterized in that: The accelerated aging test method for resistors comprises the following steps: Obtaining a steady-state voltage harmonic spectrum of a lightning arrester in an AC filter, a lightning arrester reference voltage, a resistor reference voltage, and a power frequency; obtaining a main frequency voltage, a main frequency harmonic order, and a total harmonic voltage amplitude from the steady-state voltage harmonic spectrum; The charge factor of the arrester is calculated based on the arrester reference voltage and the total harmonic voltage amplitude; the charge factor of the main frequency harmonic voltage, the waveform frequency and the test voltage are calculated based on the main frequency voltage, the main frequency harmonic order, the arrester reference voltage, the power frequency, the charge factor and the resistor reference voltage; Obtaining aging test parameters, and determining an accelerated aging test voltage waveform according to the main frequency harmonic voltage charge rate, the waveform frequency, and the charge rate; the aging test parameters include a test temperature and a running duration; Perform an aging test on each resistor in the arrester according to the aging test parameters, the test voltage and the accelerated aging test voltage waveform to obtain a power loss-time relationship curve of the corresponding resistor; The main frequency harmonic voltage charge factor, waveform frequency and test voltage are calculated according to the main frequency voltage, the main frequency harmonic order, the arrester reference voltage, the power frequency, the charge factor and the resistor reference voltage, and include: The charge factor of the main frequency harmonic voltage is calculated by using the charge factor formula according to the main frequency voltage and the arrester reference voltage; The waveform frequency is calculated using the waveform frequency formula according to the main frequency harmonic order and the power frequency; The test voltage is calculated using a test voltage formula according to the charge rate and the resistor reference voltage to obtain the test voltage; Wherein, the charge rate formula is: H ez =(U z *A) / U bc , the waveform frequency formula is: f b =B*f0, the test voltage formula is: U s =U dc *H e , where H ez is the main frequency harmonic voltage charge rate, U z is the main frequency voltage, A is the conversion peak coefficient, U bc is the arrester reference voltage, f b is the waveform frequency, B is the harmonic number of the main frequency, f0 is the power frequency, U s is the test voltage, U dc is the resistor reference voltage, H e is the charge rate of the arrester; In the waveform of the test voltage based on the waveform frequency, the charge factor of the main frequency harmonic voltage is adjusted to the charge factor to obtain an accelerated aging test voltage waveform.

2. The accelerated aging test method for resistors of lightning arresters according to claim 1, characterized in that: include: Obtaining a time power loss set consisting of each time power loss in the resistor from the power loss-time relationship curve, and screening out a minimum power loss, a maximum power loss and a power loss start value from the time power loss set; If the maximum power loss does not exceed 1.3 times the minimum power loss and each of the time power losses in the time power loss set is not greater than 1.1 times the power loss starting value, the corresponding resistor passes the aging test.

3. The accelerated aging test method for resistors of lightning arresters according to claim 2, characterized in that: include: If all resistors in the arrester pass the aging test, the arrester passes the aging test.

4. The accelerated aging test method for resistors of lightning arresters according to claim 1, characterized in that: The running duration of the aging test parameters includes: Obtaining the temperature difference between the test temperature and the operating temperature of the aging test equipment and the operating years of the aging test equipment; The test acceleration factor is calculated based on the temperature difference, and the operation duration is calculated based on the operation years and the test acceleration factor.

5. An accelerated aging test device for resistors of lightning arresters, applied to lightning arresters of AC filters, characterized in that: The resistor accelerated aging test device includes a data acquisition module, a calculation module, a waveform determination module and an aging test output module; The data acquisition module is used to obtain the steady-state voltage harmonic spectrum of the arrester in the AC filter, the arrester reference voltage, the resistor reference voltage and the power frequency; and obtain the main frequency voltage, the main frequency harmonic order and the total harmonic voltage amplitude from the steady-state voltage harmonic spectrum; The calculation module is used to calculate the charge factor of the arrester according to the arrester reference voltage and the total harmonic voltage amplitude; The main frequency harmonic voltage charge factor, waveform frequency and test voltage are calculated according to the main frequency voltage, the main frequency harmonic order, the arrester reference voltage, the power frequency, the charge factor and the resistor reference voltage; The waveform determination module is used to obtain aging test parameters and determine the accelerated aging test voltage waveform according to the main frequency harmonic voltage charge rate, the waveform frequency and the charge rate; the aging test parameters include test temperature and operation duration; The aging test output module is used to perform an aging test on each resistor in the arrester according to the aging test parameters, the test voltage and the accelerated aging test voltage waveform to obtain a power loss-time relationship curve of the corresponding resistor; The calculation module includes a first calculation submodule, a second calculation submodule and a third calculation submodule; The first calculation submodule is used to calculate the charge factor of the main frequency harmonic voltage according to the main frequency voltage and the arrester reference voltage using a charge factor formula; The second calculation submodule is used to calculate the waveform frequency according to the main frequency harmonic order and the power frequency using the waveform frequency formula; The third calculation submodule is used to calculate the test voltage using the test voltage formula according to the charge rate and the resistor reference voltage to obtain the test voltage; Wherein, the charge rate formula is: H ez =(U z *A) / U bc , the waveform frequency formula is: f b =B*f0, the test voltage formula is: U s =U dc *H e , where H ez is the main frequency harmonic voltage charge rate, U z is the main frequency voltage, A is the conversion peak coefficient, U bc is the arrester reference voltage, f b is the waveform frequency, B is the harmonic number of the main frequency, f0 is the power frequency, U s is the test voltage, U dc is the resistor reference voltage, H e is the charge rate of the arrester; In the waveform of the test voltage based on the waveform frequency, the charge factor of the main frequency harmonic voltage is adjusted to the charge factor to obtain an accelerated aging test voltage waveform.

6. The accelerated aging test device for resistors of lightning arresters according to claim 5, characterized in that: It includes a passing judgment module, which is used to obtain a time power loss set consisting of each time power loss in the resistor from the power loss-time relationship curve diagram, and screen out the minimum power loss, maximum power loss and power loss starting value from the time power loss set; according to the maximum power loss not exceeding 1.3 times of the minimum power loss and each time power loss in the time power loss set is not greater than 1.1 times of the power loss starting value, the corresponding resistor passes the aging test.

7. The accelerated aging test device for resistors of lightning arresters according to claim 6, characterized in that: The passing judgment module is also used for judging that the arrester passes the aging test if all resistors in the arrester pass the aging test.

8. A terminal device, characterized in that: including a processor and a memory; The memory is used to store program codes and transmit the program codes to the processor; The processor is used to execute the accelerated aging test method for resistors of a lightning arrester according to any one of claims 1 to 4 according to the instructions in the program code.

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