Direct current drop point selection method and device, processor and electronic equipment

Abstract

The application discloses a direct current landing point selection method and device, a processor and electronic equipment. The application relates to the field of electrical engineering. The method comprises the following steps: fitting an association function based on voltage interaction influence factors, reactance parameters and parallel line parameters among multiple groups of direct currents, wherein the association function is used to indicate the relevance of the voltage interaction influence factors and distance information, and the multiple groups of direct currents at least comprise a first direct current and a second direct current; obtaining first distance information of multiple alternative landing point positions from the first direct current and second distance information of the multiple alternative landing point positions from the second direct current; determining target voltage drops of the multiple alternative landing point positions based on the first distance information, the second distance information and the association function; and determining a target landing point position with a target voltage drop less than a preset voltage threshold from the multiple alternative landing point positions. Through the application, the problem of low selection efficiency of direct current landing points in the related art is solved.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of electrical engineering, in particular to a direct current drop point selection method and device, a processor and an electronic device. BACKGROUND

[0002] To realize asynchronous grid interconnection and long-distance large-capacity power transmission, direct current transmission will still play an important role in the power grid and be further developed in the foreseeable future. A series of problems that follow cannot be ignored.

[0003] For direct current transmission, an important problem is how to determine the impact of direct current fault on the remaining direct current. In the prior art, the commonly used method is to build a related model and perform simulation, the modeling process is relatively complex, the speed is slow, and it is difficult to analyze the impact degree of different direct current drop points on other direct current faults, so the problem of new direct current drop point needs to be tried repeatedly, thereby causing the problem of low efficiency of direct current drop point selection.

[0004] That is, the prior art has the technical problem of low efficiency of direct current drop point selection. SUMMARY

[0005] The main purpose of the present application is to provide a direct current drop point selection device, device, processor and electronic device to solve the technical problem of low efficiency of direct current drop point selection in the prior art.

[0006] In order to achieve the above purpose, according to one aspect of the present application, a direct current drop point selection device is provided. The device comprises: fitting a correlation function based on the voltage interaction influence factor, the reactance parameter and the parallel line parameter between multiple groups of direct currents, wherein the correlation function is used to indicate the correlation between the voltage interaction influence factor and the distance information, and the multiple groups of direct currents at least include a first direct current, a second direct current; obtaining first distance information of a plurality of alternative drop point positions from the first direct current and second distance information from the second direct current; determining a target voltage drop of the plurality of alternative drop point positions based on the first distance information, the second distance information and the correlation function, wherein the target voltage drop is used to indicate the voltage loss increment caused by the plurality of alternative drop point positions to the third direct current under the condition that the first direct current and the second direct current fail simultaneously, relative to the first direct current or the second direct current fails alone; determining a target drop point position with a target voltage drop less than a preset voltage threshold from the plurality of alternative drop point positions, wherein the target drop point position is used to set a third direct current.

[0007] To achieve the above object, according to another aspect of the present application, a direct current landing point selection device is provided. The device comprises: a fitting unit configured to fit a correlation function based on voltage interaction influence factors, reactance parameters and parallel line parameters among a plurality of direct currents, wherein the correlation function is configured to indicate the correlation between the voltage interaction influence factors and distance information, and the plurality of direct currents comprises at least a first direct current and a second direct current; an obtaining unit configured to obtain first distance information of a plurality of candidate landing point positions from the first direct current and second distance information from the second direct current; a first determining unit configured to determine target voltage drops of the plurality of candidate landing point positions based on the first distance information, the second distance information and the correlation function, wherein the target voltage drops are configured to indicate voltage loss increments of the plurality of candidate landing point positions caused by the first direct current and the second direct current under simultaneous fault conditions relative to voltage losses caused by the first direct current or the second direct current under single fault conditions; and a second determining unit configured to determine a target landing point position from the plurality of candidate landing point positions, wherein the target landing point position is configured to set a third direct current, and the target landing point position is configured to have a target voltage drop less than a preset voltage threshold.

[0008] Optionally, in the direct current landing point selection device provided by the embodiments of the present application, the first determining unit comprises: a first obtaining module configured to obtain a first voltage interaction influence factor by taking the first distance information as an input of the correlation function, and obtain a second voltage interaction influence factor by taking the second distance information as an input of the correlation function, wherein the first voltage interaction influence factor is configured to indicate the degree of influence of the direct current set by the plurality of candidate landing point positions on the first direct current, and the second voltage interaction influence factor is configured to indicate the degree of influence of the direct current set by the plurality of candidate landing point positions on the second direct current; and a first determining module configured to determine the target voltage drops of the plurality of candidate landing point positions by using the first voltage interaction influence factor, the second voltage interaction influence factor, a third voltage interaction influence factor and a fourth voltage interaction influence factor, wherein the third voltage interaction influence factor is configured to indicate the degree of influence of the second direct current on the first direct current, and the fourth voltage interaction influence factor is configured to indicate the degree of influence of the first direct current on the second direct current.

[0009] Optionally, in the DC landing point selection device provided in the embodiments of this application, the first determining module includes: an acquisition submodule, used to acquire a first voltage drop obtained by subtracting the product of a first voltage interaction factor and a third voltage interaction factor and a second voltage interaction factor, and to acquire a second voltage drop obtained by subtracting the product of a second voltage interaction factor and a fourth voltage interaction factor and a first voltage interaction factor, wherein the first voltage drop is used to indicate the voltage loss increment caused by the failure of the first DC based on the failure of the second DC, and the second voltage drop is used to indicate the voltage loss increment caused by the failure of the second DC based on the failure of the first DC; and a determining submodule, used to determine the smaller value between the first voltage drop and the second voltage drop as the target voltage drop.

[0010] Optionally, in the DC landing point selection device provided in this application embodiment, the device further includes: a second acquisition module, used to acquire the first position of the first DC and the second position of the second DC before acquiring the first distance information between the multiple candidate landing point positions and the first DC and the second distance information between the first DC and the second DC; and an establishment module, used to establish a three-dimensional coordinate system with the midpoint between the first position and the second position as the origin and the line connecting the first position and the second position as the x-axis before acquiring the first distance information between the multiple candidate landing point positions and the first DC and the second DC. In this system, the y-axis of the three-dimensional coordinate system is perpendicular to the x-axis and passes through the origin, and the z-axis of the three-dimensional coordinate system is perpendicular to both the x-axis and y-axis and passes through the origin. The x-axis is used to indicate the horizontal coordinate of the landing point, the y-axis is used to indicate the vertical coordinate of the landing point, and the z-axis is used to indicate the target voltage drop corresponding to the landing point. The third acquisition module is used to acquire multiple candidate landing point positions from the plane formed by the x-axis and y-axis before acquiring the first distance information between the multiple candidate landing point positions and the first DC current, and the second distance information between the multiple candidate landing point positions and the second DC current. Each candidate landing point position corresponds to a horizontal coordinate on the x-axis and a vertical coordinate on the y-axis.

[0011] Optionally, in the DC landing point selection device provided in the embodiments of this application, the device further includes: a drawing module, used to smoothly draw in a three-dimensional coordinate system based on the target voltage drop of multiple candidate landing point positions after determining the target voltage drop of multiple candidate landing point positions based on the first distance information, the second distance information, and the correlation function, to obtain the target voltage drop of each landing point position on the plane; and a second determining module, used to determine the target landing point position from each landing point position whose target voltage drop is less than a preset voltage threshold after determining the target voltage drop of multiple candidate landing point positions based on the first distance information, the second distance information, and the correlation function.

[0012] Optionally, in the DC landing point selection device provided in the embodiments of this application, the device further includes: a third determining module, used to determine, after determining the target voltage drop of multiple candidate landing point locations based on the first distance information, the second distance information, and the correlation function, multiple landing point locations from the multiple candidate landing point locations whose target voltage drop is greater than or equal to a preset voltage threshold; and a fourth determining module, used to determine, after determining the target voltage drop of multiple candidate landing point locations based on the first distance information, the second distance information, and the correlation function, a significant influence area based on the multiple landing point locations, wherein the significant influence area is the range of areas that cause a preset degree of voltage loss impact when the first DC and the second DC fail simultaneously, relative to the failure of the first DC or the second DC alone.

[0013] Optionally, in the DC landing point selection device provided in the embodiments of this application, the fitting unit includes: a fourth acquisition module, used to acquire the adjusted reactance parameter, wherein the adjusted reactance parameter is obtained by dividing the reactance parameter by the parallel line parameter; and a fitting module, used to fit the voltage interaction factor and the adjusted reactance parameter under a preset fitting environment to obtain a correlation function, wherein the voltage interaction factor includes at least one of the following: a first voltage interaction factor and a second voltage interaction factor.

[0014] This application utilizes the voltage interaction factors, reactance parameters, and parallel line parameters of multiple DC currents in a known current network to fit a correlation function, thereby obtaining the correlation between the voltage interaction factors and distance information in the current network. Based on the distance information between multiple candidate landing points and known DC currents, it determines the additional voltage loss caused by the additional DC current at the multiple candidate landing points under multiple simultaneous known DC current faults compared to a single known DC current fault. Based on this voltage loss increment, it determines the most suitable landing point for setting the new current from the multiple candidate landing points. This eliminates the need for additional model building and simulation, and allows for analysis of the degree to which different DC landing points are affected by other DC current faults, thus achieving the technical effect of improving the selection efficiency of DC landing points. Attached Figure Description

[0015] The accompanying drawings, which form part of this application, are used to provide a further understanding of this application. The illustrative embodiments and descriptions of this application are used to explain this application and do not constitute an undue limitation of this application. In the drawings:

[0016] Figure 1 This is a flowchart of a method for selecting a DC landing point according to an embodiment of this application;

[0017] Figure 2 This is a schematic diagram of a method for selecting a DC landing point according to an embodiment of this application;

[0018] Figure 3 This is a schematic diagram of a method for selecting a DC landing point according to an embodiment of this application;

[0019] Figure 4 This is a schematic diagram of a method for selecting a DC landing point according to an embodiment of this application;

[0020] Figure 5 This is a schematic diagram of a DC landing point selection device provided according to an embodiment of this application;

[0021] Figure 6 This is a schematic diagram of an electronic device for selecting the DC landing point according to an embodiment of this application. Detailed Implementation

[0022] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.

[0023] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort should fall within the scope of protection of the present application.

[0024] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate for the embodiments of this application described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0025] It should be noted that all information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for display, data used for analysis, etc.) involved in this disclosure are information and data authorized by the user or fully authorized by all parties. For example, this system has an interface with relevant users or organizations. Before obtaining relevant information, it is necessary to send an acquisition request to the aforementioned user or organization through the interface, and obtain the relevant information after receiving consent information from the aforementioned user or organization.

[0026] The present invention will now be described in conjunction with preferred implementation steps. Figure 1 This is a flowchart of a DC landing point selection method provided according to an embodiment of this application, such as... Figure 1 As shown, the method includes the following steps:

[0027] Step S102: Based on the voltage interaction influence factor, reactance parameter and parallel line parameter among multiple DC groups, a correlation function is fitted to obtain the correlation function, wherein the correlation function is used to indicate the correlation between the voltage interaction influence factor and the distance information, and the multiple DC groups include at least a first DC and a second DC.

[0028] Step S104: Obtain first distance information between multiple candidate landing points and the first DC current, and second distance information between them and the second DC current;

[0029] Step S106: Based on the first distance information, the second distance information, and the correlation function, determine the target voltage drop of the plurality of candidate landing points, wherein the target voltage drop is used to indicate the additional voltage loss caused by the DC additional set for the plurality of candidate landing points when the first DC and the second DC fail simultaneously, relative to when the first DC or the second DC fails alone.

[0030] Step S108: Determine the target landing position from multiple candidate landing positions where the target voltage drop is less than a preset voltage threshold, wherein the target landing position is used to set the third DC.

[0031] Optionally, in this embodiment, the multiple DC groups may be, but are not limited to, DCs in a DC network, and may include, but are not limited to, a first DC, a second DC, and may also include more other DCs. This embodiment does not limit this.

[0032] Optionally, in this embodiment, the voltage interaction influence factor between DC lines can be, but is not limited to, the multi-infeed interaction factor index between DC lines, i.e., MIIF, which is used to measure the strength of the interaction between converter stations in a multi-infeed transmission system.

[0033] Optionally, in this embodiment, a correlation function is fitted based on the voltage interaction influence factors, reactance parameters, and parallel line parameters between multiple DCs. This may include, but is not limited to, fitting the correlation function in a preset environment (e.g., MATLAB environment) based on the voltage interaction influence factors (MIIF) (mentioned above), reactance parameters, and parallel line parameters (i.e., the number of parallel lines) between multiple DCs to obtain a correlation function that indicates the correlation between the voltage interaction influence factors and distance information.

[0034] Further examples, as shown in Table 1, are obtained by statistical analysis of the MIIF, reactance, and number of parallel lines for multiple bus pairs (a combination of bus 1 and bus 2). For instance, the first row of data in Table 1 indicates that the MIIF of DC 1 and DC 2 is 0.3493, the reactance is 1206*10-4 p.u, and the number of parallel lines is 2. After fitting, the relationship between MIIF and distance information is obtained, i.e., the correlation function g, g = 1.47 - 0.18 ln(dis), where dis indicates the distance between the known faulty DC and the newly set DC, and the unit of dis is 10-4 p.u.

[0035] Table 1

[0036] Bus 1 Bus 2 MIIF reactance / 10-4p.u. parallel line number 1 2 0.3493 1206 2 2 3 0.2851 1512 2 2 6 0.5826 688 2 3 6 0.3771 851 2 3 8 0.4674 872 2 4 5 0.4371 216 1 4 7 0.8362 81 2 5 7 0.5412 176 1 6 8 0.3081 759 2

[0037] Optionally, in this embodiment, the first distance information may be used, but is not limited to, to indicate the distance between the first DC and the plurality of alternative landing locations, and the second distance information may be used, but is not limited to, to indicate the distance between the second DC and the plurality of alternative landing locations.

[0038] It should be noted that, based on the first distance information, the second distance information, and the correlation function, the target voltage drop of the plurality of candidate landing points is determined. The target voltage drop is used to indicate the additional voltage loss caused by the DC additional DC at the plurality of candidate landing points when the first DC and the second DC fail simultaneously, relative to when the first DC or the second DC fails alone.

[0039] To further illustrate, let's take the first DC current as i, the second DC current as j, and multiple alternative landing points including k1, k2, ... k n Taking this as an example, the initial landing positions of the newly set third DC line k may be k1, k2, ..., k. n .

[0040] For each possible landing location, the target voltage drop corresponding to each possible landing location is determined based on the first distance information from the first DC and the second distance information from the second DC, as well as the aforementioned correlation function.

[0041] Specifically, taking the landing point k1 as an example, the first distance information with the first DC is assumed to be l1, and the second distance information with the second DC is assumed to be l2. Using l1 as the input to the correlation function g, the output result e is obtained, i.e., e = g(l1). Using l2 as the input to the correlation function g, the output result f is obtained, i.e., f = g(l2). Furthermore, given the voltage interaction factors c = MIIFij and d = MIIFji between current i and current j, the target voltage drop at the landing point k1 is determined based on the above e, f, c, and d, specifically ΔU. mink1=min(a1(e-df), a2(f-ce)), where a1 and a2 are preset adjustment coefficients.

[0042] Similarly, the target voltage drop at each landing point is obtained using the above method, and the target landing point where the target voltage drop is less than the preset voltage threshold is determined. The target landing point is then used as the landing point for setting a new third DC. Thus, when the first DC and the second DC are known to fail simultaneously, the additional voltage loss increment caused by the third DC set at the target landing point is relatively low compared to when the first DC or the second DC fails alone.

[0043] It is understandable that after obtaining the target voltage drop at each landing point, if the landing point with the minimum target voltage drop is determined from it, and this landing point is determined as the landing point for setting a new third DC, then in the case where the first DC and the second DC are known to fail simultaneously, the additional voltage loss increment caused by the third DC set at the target landing point is the lowest compared to the case where the first DC or the second DC fails alone.

[0044] The embodiments provided in this application, by fitting the voltage interaction factors, reactance parameters, and parallel line parameters of multiple DC currents in a known current network, obtain a correlation function, thereby obtaining the correlation between the voltage interaction factors and distance information in the current network. Based on the distance information between multiple candidate landing points and known DC currents, the voltage loss increment caused by the additional DC current set at the multiple candidate landing points under multiple simultaneous known DC current faults, relative to the case of a single known DC current fault, is determined. Based on this voltage loss increment, the most suitable landing point for setting the new current is determined from the multiple candidate landing points. No additional model building is required for simulation, and the degree of influence of other DC current faults on different DC landing points can be analyzed, thereby achieving the technical effect of improving the selection efficiency of DC landing points.

[0045] As an optional approach, based on the first distance information, the second distance information, and the correlation function, the target voltage drop at the plurality of candidate landing point locations is determined, including:

[0046] The first distance information is used as the input to the correlation function to obtain a first voltage interaction influence factor, and the second distance information is used as the input to the correlation function to obtain a second voltage interaction influence factor. The first voltage interaction influence factor is used to indicate the degree of voltage influence of the DC power set at the plurality of candidate landing locations on the first DC power, and the second voltage interaction influence factor is used to indicate the degree of voltage influence of the DC power set at the plurality of candidate landing locations on the second DC power.

[0047] The target voltage drop at the plurality of candidate landing points is determined using the first voltage interaction factor, the second voltage interaction factor, the third voltage interaction factor, and the fourth voltage interaction factor, wherein the third voltage interaction factor is used to indicate the degree to which the second DC is affected by the voltage of the first DC, and the fourth voltage interaction factor is used to indicate the degree to which the first DC is affected by the voltage of the second DC.

[0048] For example, let the first DC current be i, the second DC current be j, and the multiple candidate landing points include k1, k2, ... k n Taking this as an example, the initial landing positions of the newly set third DC line k may be k1, k2, ..., k. n .

[0049] Specifically, taking the landing position k1 as an example, the first distance information with the first DC is assumed to be l1, and the second distance information with the second DC is assumed to be l2. Using l1 as the input of the correlation function g, the first voltage interaction influence factor e is obtained, i.e., e = g(l1), and using l2 as the input of the correlation function g, the second voltage interaction influence factor f is obtained, i.e., f = g(l2). The first voltage interaction influence factor e is used to indicate the degree of voltage influence of the DC set at the multiple candidate landing positions on the first DC, and the second voltage interaction influence factor f is used to indicate the degree of voltage influence of the DC set at the multiple candidate landing positions on the second DC.

[0050] Furthermore, given the third voltage interaction factor d = MIIFji and the fourth voltage interaction factor c = MIIFij between currents i and j, the target voltage drop at the landing point k1 is determined based on the aforementioned e, f, c, and d, specifically ΔU. mink1 =min(a1(e-df), a2(f-ce)), where a1 and a2 are preset adjustment coefficients, the third voltage interaction factor d is used to indicate the degree of voltage influence of the second DC on the first DC, and the fourth voltage interaction factor c is used to indicate the degree of voltage influence of the first DC on the second DC.

[0051] As an optional approach, the target voltage drop at the plurality of candidate landing points is determined using the first voltage interaction factor, the second voltage interaction factor, the third interaction factor, and the fourth interaction factor, including:

[0052] The method obtains a first voltage drop by subtracting the product of the third voltage interaction factor and the second voltage interaction factor from the first voltage interaction factor, and a second voltage drop by subtracting the product of the fourth voltage interaction factor and the first voltage interaction factor from the second voltage interaction factor. The first voltage drop indicates the voltage loss increment caused by the failure of the first DC power supply, given that the second DC power supply is already faulty. The second voltage drop indicates the voltage loss increment caused by the failure of the second DC power supply, given that the first DC power supply is already faulty.

[0053] The smaller of the first voltage drop and the second voltage drop is determined as the target voltage drop.

[0054] To further illustrate, the first voltage drop (e-df) is obtained by subtracting the product of the third voltage interaction factor d and the second voltage interaction factor f from the first voltage interaction factor e. The second voltage drop (f-ce) is obtained by subtracting the product of the fourth voltage interaction factor c and the first voltage interaction factor e from the second voltage interaction factor f.

[0055] It should be noted that when both adjustment coefficients a1 and a2 are 1, the smaller value between the first voltage drop (e-df) and the second voltage drop (f-ce) is directly determined as the target voltage drop. However, when neither adjustment coefficient a1 nor a2 is 1, the smaller value between the first voltage drop (e-df)*a1 and the second voltage drop (f-ce)*a2 is determined as the target voltage drop.

[0056] As an optional approach, before acquiring the first distance information between the multiple candidate landing points and the first DC current, and the second distance information between the two DC currents, the method further includes:

[0057] Obtain the first position of the first DC and the second position of the second DC;

[0058] A three-dimensional coordinate system is established with the midpoint between the first position and the second position as the origin and the line connecting the first position and the second position as the x-axis. The y-axis of the three-dimensional coordinate system is perpendicular to the x-axis and passes through the origin. The z-axis of the three-dimensional coordinate system is perpendicular to the x-axis and the y-axis and passes through the origin. The x-axis is used to indicate the horizontal coordinate of the landing point, the y-axis is used to indicate the vertical coordinate of the landing point, and the z-axis is used to indicate the target voltage drop corresponding to the landing point.

[0059] The plurality of candidate landing point positions are obtained from the plane formed by the x-axis and the y-axis, wherein each candidate landing point position corresponds to an abscissa on the x-axis and a ordinate on the y-axis.

[0060] Optionally, in this embodiment, after obtaining the target voltage drop corresponding to each landing point position, the target voltage drop corresponding to that position is determined based on the matching position of each landing point position in the three-dimensional coordinate system, and a surface plot indicating the relationship between different landing point positions and the target voltage drop is drawn in the three-dimensional coordinate system, such as... Figure 2 As shown.

[0061] As an optional approach, after determining the target voltage drop at the plurality of candidate landing locations based on the first distance information, the second distance information, and the correlation function, the method further includes:

[0062] Based on the target voltage drop at the multiple candidate landing points, a smooth plot is performed in the three-dimensional coordinate system to obtain the target voltage drop at each landing point on the plane;

[0063] The target landing point is determined from the various landing point locations where the target voltage drop is less than the preset voltage threshold.

[0064] Optionally, in this embodiment, the target voltage drop at each landing point is smoothly plotted in the three-dimensional coordinate system based on the target voltage drop at the plurality of candidate landing point locations to obtain the target voltage drop at each landing point location on the plane.

[0065] Understandably, based on the partially determined landing points and their corresponding target voltage drops, smooth plotting in a three-dimensional coordinate system can quickly and efficiently determine the target voltage drop corresponding to each location, thereby providing a more efficient understanding of the overall (global) target voltage drop within the region.

[0066] It should be noted that, but not limited to, the target voltage drop at each landing point on the plane can also be determined directly based on the correlation function, and then plotted in a three-dimensional coordinate system to more accurately determine the target voltage drop at each landing point.

[0067] As an optional approach, after determining the target voltage drop at the plurality of candidate landing locations based on the first distance information, the second distance information, and the correlation function, the method further includes:

[0068] From a plurality of candidate landing locations, a plurality of landing locations are determined where the target voltage drop is greater than or equal to the preset voltage threshold.

[0069] Based on the multiple landing point locations, a significant impact area is determined, wherein the significant impact area is the range of areas that cause a predetermined degree of voltage loss when the first DC and the second DC fail simultaneously, relative to the failure of the first DC or the second DC alone.

[0070] Optionally, in this embodiment, multiple locations where the target voltage drop is greater than or equal to a preset voltage threshold are defined as significant influence areas. The significant influence area is the range of regions that cause a preset degree of voltage loss when the first DC and the second DC fail simultaneously, relative to the failure of the first DC or the second DC alone.

[0071] Understandably, during the planning of new DC construction, it is advisable to specifically analyze the types of simultaneous DC failures that may significantly increase the risks of new DC projects, and to avoid constructing / setting up new DC projects in the aforementioned significantly affected areas.

[0072] As an optional approach, the correlation function is obtained by fitting based on multiple sets of voltage interaction factors, reactance parameters, and parallel line parameters between DC lines, including:

[0073] Obtain the adjusted reactance parameters, wherein the adjusted reactance parameters are obtained by dividing the reactance parameters by the parallel line parameters;

[0074] Under a preset fitting environment, the voltage interaction factor and the adjusted reactance parameter are used to fit the correlation function to obtain the correlation function. The voltage interaction factor includes at least one of the following: a first voltage interaction factor and a second voltage interaction factor.

[0075] Optionally, in this embodiment, the preset fitting environment may be, but is not limited to, a MATLAB environment.

[0076] Further examples, as shown in Table 1, are obtained by statistical analysis of the MIIF, reactance, and number of parallel lines for multiple bus pairs (a combination of bus 1 and bus 2). For instance, the first row of data in Table 1 indicates that the MIIF of DC 1 and DC 2 is 0.3493, the reactance is 1206*10-4 p.u, the adjusted reactance parameter is 603*10-4 p.u, and the number of parallel lines is 2. Through fitting, the relationship between MIIF and distance information is obtained, i.e., the correlation function g, g = 1.47 - 0.18 ln(dis), where dis indicates the distance between the known faulty DC and the newly set DC, and the unit of dis is 10-4 p.u.

[0077] As an alternative approach, the aforementioned method for selecting DC landing points can be applied to a scenario where multiple simultaneous DC faults significantly impact the affected area. In this scenario, a crucial issue for DC transmission is determining the impact of a DC fault on the remaining DC lines. While models and simulations can be built for various types of DC lines, the process is slow, complex, and difficult to analyze the degree to which different DC landing points are affected by other DC faults. Furthermore, selecting new DC landing points requires repeated trials, and the rationale for these selections cannot be theoretically explained.

[0078] To address the aforementioned shortcomings, this embodiment proposes a method for efficiently determining the area significantly affected by other combined DC faults. This allows for consideration of adopting a flexible DC scheme or changing to a more suitable landing point for avoidance, and can provide a reference for the selection of new DC sites and the optimization and upgrading of existing DC systems.

[0079] Specifically, for a single DC fault, the closer it is to the existing DC electrical circuit, the more easily it is affected. The following analysis focuses on the impact of multiple simultaneous DC faults on the remaining DC circuits. Let the new DC fault's landing point be k, and the existing DC circuits be i and j.

[0080] make

[0081] c = MIIF ij ,d=MIIF ji ,

[0082] e = MIIF ki f = MIIF kj

[0083] but

[0084] ΔU min =min(k1(e-df), k2(f-ce))

[0085] Wherein, ΔU min This represents the increased voltage drop due to multiple DC faults compared to a single DC fault. Since there are two types of single DC faults, the minimum of the two values ​​is taken. First, assume that the voltage drop is known when only DCs k and j are known. If the new DC is closer to DC i, the potential voltage drop is larger, i.e., the increased voltage drop is greater. Conversely, if DC j is closer to k, the potential increased voltage drop is smaller. Similarly, if i and j are relatively close, the potential increased voltage drop is also smaller, thus having the form e-df, where k1 is a coefficient. Similarly, the other corresponding value has the form f-ce, where k2 is a coefficient.

[0086] As previously known, e and f are related to the electrical distances from k to i and j, respectively. In practice, electrical distances are highly correlated with actual distances (parameters for lines of the same class are generally similar). Therefore, we can assume that e and f are both functions of the distances from k to i and j, respectively:

[0087] e = g(dis i ), f = g(dis j )

[0088] where g is a concave decreasing function, and dis i , dis j are the distances from k to i and j respectively.

[0089] When e = f,

[0090] k1(e - df) = k2(f - ce)

[0091] It can be obtained that k1(1 - d) = k2(1 - c). Without loss of generality, assume k1 = 1.

[0092] Assume that i is at (-x0, 0) and j is at (x0, 0), then at this time k is on x = 0.

[0093] When k moves along the y-axis from the origin, there is still e = f, and dis i increases, so both e and f decrease, and thus ΔU min decreases. (Both c and d are less than 1).

[0094] When k moves to the right along the direction parallel to the x-axis (0 ≤ x ≤ x0), dis i increases, dis j decreases, so e decreases, f increases, and ΔU min decreases.

[0095] When k moves upward along the direction parallel to the y-axis (0 < x ≤ x0, y > 0), dis i > dis j , so e < f. When moving, both e and f decrease. Although the increase rate of dis i is slow, under the action of the g function, the decrease rate of e is even slower, but the value of d is usually very small, so generally it can also be considered that ΔU min is decreasing.

[0096] In summary, under the above assumptions, the maximum value of ΔU min is obtained at the midpoint of i and j, and the ΔU min at the points on the perpendicular bisector of the two points is higher than that of the points with the same ordinate. Generally speaking, the ΔU min at the points between the two points' connection is also higher than that of the points with the same abscissa.

[0097] For real problems, the expression of the g function can be obtained by fitting according to the actual data, and then the ΔU min at each point can be approximately calculated. According to the set criterion of whether ΔU min is significant (for example, it can be considered that ΔU minA threshold of >0.1 (significant) indicates the region where simultaneous DC faults would have a significant impact. During the planning of new DC construction, this allows for targeted analysis of the types of simultaneous DC faults that could significantly increase the risks associated with the new DC projects.

[0098] A detailed flowchart is shown below. Figure 3 As shown, it includes:

[0099] Step S1: Establish a coordinate system based on the DC combination currently under study, and fit the relationship between MIIF and distance.

[0100] Step S2: Calculate ΔU at each point according to the formula. min ;

[0101] Step S3: Determine the areas of multi-DC combined fault effects that require attention based on actual needs.

[0102] As an optional implementation, a specific power grid example is used for illustration. The DC information of this power grid, as shown in Table 2, is obtained through statistical analysis:

[0103] Table 2

[0104] Bus 1 Bus 2 MIIF reactance / 10-4p.u. parallel line number 1 2 0.3493 1206 2 2 3 0.2851 1512 2 2 6 0.5826 688 2 3 6 0.3771 851 2 3 8 0.4674 872 2 4 5 0.4371 216 1 4 7 0.8362 81 2 5 7 0.5412 176 1 6 8 0.3081 759 2

[0105] By fitting the above-mentioned method for selecting the DC landing point, the correlation function g = 1.47 - 0.18ln(dis) is obtained, where dis is in units of 10⁻⁴ p.u.

[0106] Assuming x0 = 500, plot ΔU min The relationship between x and y of the new DC point k is shown in the figure below. Figure 2 As shown in the figure, the plane is z = 0.10, and ΔU can be seen in the figure. min It conforms to the pattern obtained from the aforementioned analysis.

[0107] Plot the intersection of the two planes with different standards (assumed to be 0.10, 0.15, and 0.20 respectively), and compare it with the standard ellipse, such as... Figure 4 As shown, the intersection line is roughly an ellipse. The horizontal and vertical axes in the figure represent electrical distances, in units of 10⁻⁴ p.u. In practice, the reactance is approximately 10 * 10⁻⁴ p.u over a distance of 1 km.

[0108] Understandably, this allows for a clearer understanding of which existing DC lines should be considered for additional risks during the construction of new DC lines when planning engineering projects. For example, if the reference standard is set to 0.20, then within an elliptical region with the midpoint of the two DC lines as the origin, the major axis on the y-axis, the minor axis on the x-axis, and axis lengths of 2 times and 1 times the distance between the two DC lines respectively, the stability of the new DC line after a combined DC failure needs to be simulated and verified.

[0109] The embodiments provided in this application offer high computational efficiency and simple modeling. Furthermore, compared to simulation analysis methods, they provide theoretical basis for assessing the varying degrees of impact from other DC faults on different points, making it easier to find new, reasonable landing points when the original scheme has shortcomings. In other words, using the aforementioned DC landing point selection method, it is possible to efficiently determine the rationality of a DC landing point scheme, quickly confirm the merits of alternative landing points compared to the original landing point, and intuitively reveal the mechanisms by which each landing point is affected by other DC faults.

[0110] It should be noted that the information collected is authorized by the user or fully authorized by all parties. Furthermore, the collection, storage, use, processing, transmission, provision, disclosure, and application of this data all comply with the relevant laws, regulations, and standards of the relevant countries and regions, and necessary confidentiality measures have been taken. This process does not violate public order and good morals, and corresponding access points are provided for users to choose whether to authorize or refuse. Users are provided with access points to choose whether to agree to or refuse the automated decision-making results; if the user chooses to refuse, the process proceeds to the expert decision-making stage.

[0111] It should be noted that the steps shown in the flowchart in the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions, and although a logical order is shown in the flowchart, in some cases the steps shown or described may be executed in a different order than that shown here.

[0112] This application also provides a DC landing point selection device. It should be noted that the DC landing point selection device of this application can be used to execute the DC landing point selection method provided in this application. The DC landing point selection device provided in this application is described below.

[0113] Figure 5 This is a schematic diagram of a DC landing point selection device according to an embodiment of this application. Figure 5 As shown, the device includes:

[0114] Fitting unit 502 is used to fit a correlation function based on the voltage interaction influence factor, reactance parameter and parallel line parameter between multiple DC groups. The correlation function is used to indicate the correlation between the voltage interaction influence factor and the distance information. The multiple DC groups include at least the first DC group and the second DC group.

[0115] The acquisition unit 504 is used to acquire first distance information between multiple candidate landing point locations and the first DC current, and second distance information between them and the second DC current;

[0116] The first determining unit 506 is used to determine the target voltage drop of multiple candidate landing locations based on the first distance information, the second distance information and the correlation function. The target voltage drop is used to indicate the additional voltage loss caused by the DC additional set for the multiple candidate landing locations in the case of simultaneous failure of the first DC and the second DC, relative to the case of failure of the first DC or the second DC alone.

[0117] The second determining unit 508 is used to determine the target landing position from multiple candidate landing positions where the target voltage drop is less than a preset voltage threshold, wherein the target landing position is used to set the third DC.

[0118] Optionally, in the DC landing point selection device provided in this application embodiment, the first determining unit includes: a first acquiring module, used to obtain a first voltage interaction influence factor by taking first distance information as input to an association function, and to obtain a second voltage interaction influence factor by taking second distance information as input to an association function, wherein the first voltage interaction influence factor is used to indicate the degree of voltage influence of the DC at multiple candidate landing point locations on the first DC, and the second voltage interaction influence factor is used to indicate the degree of voltage influence of the DC at multiple candidate landing point locations on the second DC; the first determining module is used to determine the target voltage drop at multiple candidate landing point locations using the first voltage interaction influence factor, the second voltage interaction influence factor, the third voltage interaction influence factor, and the fourth voltage interaction influence factor, wherein the third voltage interaction influence factor is used to indicate the degree of voltage influence of the second DC on the first DC, and the fourth voltage interaction influence factor is used to indicate the degree of voltage influence of the first DC on the second DC.

[0119] Optionally, in the DC landing point selection device provided in the embodiments of this application, the first determining module includes: an acquisition submodule, used to acquire a first voltage drop obtained by subtracting the product of a first voltage interaction factor and a third voltage interaction factor and a second voltage interaction factor, and to acquire a second voltage drop obtained by subtracting the product of a second voltage interaction factor and a fourth voltage interaction factor and a first voltage interaction factor, wherein the first voltage drop is used to indicate the voltage loss increment caused by the failure of the first DC based on the failure of the second DC, and the second voltage drop is used to indicate the voltage loss increment caused by the failure of the second DC based on the failure of the first DC; and a determining submodule, used to determine the smaller value between the first voltage drop and the second voltage drop as the target voltage drop.

[0120] Optionally, in the DC landing point selection device provided in this application embodiment, the device further includes: a second acquisition module, used to acquire the first position of the first DC and the second position of the second DC before acquiring the first distance information between the multiple candidate landing point positions and the first DC and the second distance information between the first DC and the second DC; and an establishment module, used to establish a three-dimensional coordinate system with the midpoint between the first position and the second position as the origin and the line connecting the first position and the second position as the x-axis before acquiring the first distance information between the multiple candidate landing point positions and the first DC and the second DC. In this system, the y-axis of the three-dimensional coordinate system is perpendicular to the x-axis and passes through the origin, and the z-axis of the three-dimensional coordinate system is perpendicular to both the x-axis and y-axis and passes through the origin. The x-axis is used to indicate the horizontal coordinate of the landing point, the y-axis is used to indicate the vertical coordinate of the landing point, and the z-axis is used to indicate the target voltage drop corresponding to the landing point. The third acquisition module is used to acquire multiple candidate landing point positions from the plane formed by the x-axis and y-axis before acquiring the first distance information between the multiple candidate landing point positions and the first DC current, and the second distance information between the multiple candidate landing point positions and the second DC current. Each candidate landing point position corresponds to a horizontal coordinate on the x-axis and a vertical coordinate on the y-axis.

[0121] Optionally, in the DC landing point selection device provided in the embodiments of this application, the device further includes: a drawing module, used to smoothly draw in a three-dimensional coordinate system based on the target voltage drop of multiple candidate landing point positions after determining the target voltage drop of multiple candidate landing point positions based on the first distance information, the second distance information, and the correlation function, to obtain the target voltage drop of each landing point position on the plane; and a second determining module, used to determine the target landing point position from each landing point position whose target voltage drop is less than a preset voltage threshold after determining the target voltage drop of multiple candidate landing point positions based on the first distance information, the second distance information, and the correlation function.

[0122] Optionally, in the DC landing point selection device provided in the embodiments of this application, the device further includes: a third determining module, used to determine, after determining the target voltage drop of multiple candidate landing point locations based on the first distance information, the second distance information, and the correlation function, multiple landing point locations from the multiple candidate landing point locations whose target voltage drop is greater than or equal to a preset voltage threshold; and a fourth determining module, used to determine, after determining the target voltage drop of multiple candidate landing point locations based on the first distance information, the second distance information, and the correlation function, a significant influence area based on the multiple landing point locations, wherein the significant influence area is the range of areas that cause a preset degree of voltage loss impact when the first DC and the second DC fail simultaneously, relative to the failure of the first DC or the second DC alone.

[0123] Optionally, in the DC landing point selection device provided in the embodiments of this application, the fitting unit includes: a fourth acquisition module, used to acquire the adjusted reactance parameter, wherein the adjusted reactance parameter is obtained by dividing the reactance parameter by the parallel line parameter; and a fitting module, used to fit the voltage interaction factor and the adjusted reactance parameter under a preset fitting environment to obtain a correlation function, wherein the voltage interaction factor includes at least one of the following: a first voltage interaction factor and a second voltage interaction factor.

[0124] This application utilizes the voltage interaction factors, reactance parameters, and parallel line parameters of multiple DC currents in a known current network to fit a correlation function, thereby obtaining the correlation between the voltage interaction factors and distance information in the current network. Based on the distance information between multiple candidate landing points and known DC currents, it determines the additional voltage loss caused by the additional DC current at the multiple candidate landing points under multiple simultaneous known DC current faults compared to a single known DC current fault. Based on this voltage loss increment, it determines the most suitable landing point for setting the new current from the multiple candidate landing points. This eliminates the need for additional model building and simulation, and allows for analysis of the degree to which different DC landing points are affected by other DC current faults, thus achieving the technical effect of improving the selection efficiency of DC landing points.

[0125] The DC landing point selection device includes a processor and a memory. The aforementioned fitting unit, acquisition unit, first determination unit, second determination unit, etc., are all stored in the memory as program units. The processor executes the aforementioned program units stored in the memory to realize the corresponding functions.

[0126] The processor contains a core, which retrieves the corresponding program unit from memory. One or more cores can be configured, and adjusting core parameters can optimize the processor's execution efficiency, thereby improving the accuracy and efficiency of DC landing point selection.

[0127] The memory may include non-permanent memory in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM, and the memory includes at least one memory chip.

[0128] This invention provides a computer-readable storage medium storing a program that, when executed by a processor, implements the above-described method for selecting DC landing points.

[0129] This invention provides a processor for running a program, wherein the program executes the aforementioned method for selecting DC landing points during runtime.

[0130] like Figure 6As shown, an embodiment of the present invention provides an electronic device, the device including a processor, a memory, and a program stored in the memory and executable on the processor. When the processor executes the program, it performs the following steps:

[0131] Based on the voltage interaction influence factor, reactance parameter and parallel line parameter among multiple DC groups, a correlation function is fitted to obtain the correlation function, wherein the correlation function is used to indicate the correlation between the voltage interaction influence factor and the distance information, and the multiple DC groups include at least a first DC and a second DC.

[0132] Obtain first distance information between multiple candidate landing points and the first DC current, and second distance information between the candidate landing points and the second DC current;

[0133] Based on the first distance information, the second distance information, and the correlation function, the target voltage drop of the plurality of candidate landing points is determined, wherein the target voltage drop is used to indicate the additional voltage loss caused by the DC additional DC to the plurality of candidate landing points when the first DC and the second DC fail simultaneously, relative to when the first DC or the second DC fails alone.

[0134] The target landing point is determined from multiple alternative landing point locations, wherein the target voltage drop is less than a preset voltage threshold, and the target landing point location is used to set the third DC.

[0135] The devices mentioned in this article can be servers, PCs, tablets, mobile phones, etc.

[0136] This application also provides a computer program product, which, when executed on a data processing device, is suitable for executing a program that initializes the following method steps:

[0137] Based on the voltage interaction influence factor, reactance parameter and parallel line parameter among multiple DC groups, a correlation function is fitted to obtain the correlation function, wherein the correlation function is used to indicate the correlation between the voltage interaction influence factor and the distance information, and the multiple DC groups include at least a first DC and a second DC.

[0138] Obtain first distance information between multiple candidate landing points and the first DC current, and second distance information between the candidate landing points and the second DC current;

[0139] Based on the first distance information, the second distance information, and the correlation function, the target voltage drop of the plurality of candidate landing points is determined, wherein the target voltage drop is used to indicate the additional voltage loss caused by the DC additional DC to the plurality of candidate landing points when the first DC and the second DC fail simultaneously, relative to when the first DC or the second DC fails alone.

[0140] The target landing point is determined from multiple alternative landing point locations, wherein the target voltage drop is less than a preset voltage threshold, and the target landing point location is used to set the third DC.

[0141] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0142] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart... Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0143] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0144] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0145] In a typical configuration, a computing device includes one or more processors (CPU), input / output interfaces, network interfaces, and memory.

[0146] Memory may include non-persistent memory in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM. Memory is an example of computer-readable media.

[0147] Computer-readable media include both permanent and non-permanent, removable and non-removable media that can store information using any method or technology. Information can be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, disk storage or other magnetic storage devices, or any other non-transferable medium that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include transient computer-readable media, such as modulated data signals and carrier waves.

[0148] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0149] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0150] The above are merely embodiments of this application and are not intended to limit the scope of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of the claims of this application.

Claims

1. A method for selecting the landing point of a DC current, characterized in that, include: Based on the voltage interaction influence factor, reactance parameter and parallel line parameter among multiple DC groups, a correlation function is fitted to obtain the correlation function, wherein the correlation function is used to indicate the correlation between the voltage interaction influence factor and the distance information, and the multiple DC groups include at least a first DC and a second DC. Obtain first distance information between multiple candidate landing points and the first DC current, and second distance information between the candidate landing points and the second DC current; Based on the first distance information, the second distance information, and the correlation function, the target voltage drop of the plurality of candidate landing points is determined, wherein the target voltage drop is used to indicate the additional voltage loss caused by the DC additional DC to the plurality of candidate landing points when the first DC and the second DC fail simultaneously, relative to when the first DC or the second DC fails alone. The target landing point is determined from multiple alternative landing point locations, wherein the target voltage drop is less than a preset voltage threshold, and the target landing point location is used to set the third DC.

2. The method according to claim 1, characterized in that, The step of determining the target voltage drop at the plurality of candidate landing points based on the first distance information, the second distance information, and the correlation function includes: The first distance information is used as the input to the correlation function to obtain a first voltage interaction influence factor, and the second distance information is used as the input to the correlation function to obtain a second voltage interaction influence factor. The first voltage interaction influence factor is used to indicate the degree of voltage influence of the DC power set at the plurality of candidate landing locations on the first DC power, and the second voltage interaction influence factor is used to indicate the degree of voltage influence of the DC power set at the plurality of candidate landing locations on the second DC power. The target voltage drop at the plurality of candidate landing points is determined using the first voltage interaction factor, the second voltage interaction factor, the third voltage interaction factor, and the fourth voltage interaction factor, wherein the third voltage interaction factor is used to indicate the degree to which the second DC is affected by the voltage of the first DC, and the fourth voltage interaction factor is used to indicate the degree to which the first DC is affected by the voltage of the second DC.

3. The method according to claim 2, characterized in that, The step of determining the target voltage drop at the plurality of candidate landing locations using the first voltage interaction factor, the second voltage interaction factor, the third interaction factor, and the fourth interaction factor includes: The method obtains a first voltage drop by subtracting the product of the third voltage interaction factor and the second voltage interaction factor from the first voltage interaction factor, and a second voltage drop by subtracting the product of the fourth voltage interaction factor and the first voltage interaction factor from the second voltage interaction factor. The first voltage drop indicates the voltage loss increment caused by the failure of the first DC power supply, given that the second DC power supply is already faulty. The second voltage drop indicates the voltage loss increment caused by the failure of the second DC power supply, given that the first DC power supply is already faulty. The smaller of the first voltage drop and the second voltage drop is determined as the target voltage drop.

4. The method according to claim 1, characterized in that, Before acquiring the first distance information between the multiple candidate landing points and the first DC current, and the second distance information between the candidate landing points and the second DC current, the method further includes: Obtain the first position of the first DC and the second position of the second DC; A three-dimensional coordinate system is established with the midpoint between the first position and the second position as the origin and the line connecting the first position and the second position as the x-axis. The y-axis of the three-dimensional coordinate system is perpendicular to the x-axis and passes through the origin. The z-axis of the three-dimensional coordinate system is perpendicular to the x-axis and the y-axis and passes through the origin. The x-axis is used to indicate the horizontal coordinate of the landing point, the y-axis is used to indicate the vertical coordinate of the landing point, and the z-axis is used to indicate the target voltage drop corresponding to the landing point. The plurality of candidate landing point positions are obtained from the plane formed by the x-axis and the y-axis, wherein each candidate landing point position corresponds to an abscissa on the x-axis and a ordinate on the y-axis.

5. The method according to claim 4, characterized in that, After determining the target voltage drop of the plurality of candidate landing points based on the first distance information, the second distance information, and the correlation function, the method further includes: Based on the target voltage drop at the multiple candidate landing points, a smooth plot is performed in the three-dimensional coordinate system to obtain the target voltage drop at each landing point on the plane. The target landing point is determined from the various landing point locations where the target voltage drop is less than the preset voltage threshold.

6. The method according to any one of claims 1 to 5, characterized in that, After determining the target voltage drop of the plurality of candidate landing points based on the first distance information, the second distance information, and the correlation function, the method further includes: From a plurality of candidate landing locations, a plurality of landing locations are determined where the target voltage drop is greater than or equal to the preset voltage threshold. Based on the multiple landing point locations, a significant impact area is determined, wherein the significant impact area is the range of areas that cause a predetermined degree of voltage loss when the first DC and the second DC fail simultaneously, relative to the failure of the first DC or the second DC alone.

7. The method according to any one of claims 1 to 5, characterized in that, The correlation function is obtained by fitting based on the voltage interaction influence factors, reactance parameters, and parallel line parameters between multiple sets of DC lines, including: Obtain the adjusted reactance parameters, wherein the adjusted reactance parameters are obtained by dividing the reactance parameters by the parallel line parameters; Under a preset fitting environment, the voltage interaction factor and the adjusted reactance parameter are used to fit the correlation function to obtain the correlation function. The voltage interaction factor includes at least one of the following: a first voltage interaction factor and a second voltage interaction factor.

8. A DC landing point selection device, characterized in that, include: The fitting unit is used to fit a correlation function based on the voltage interaction influence factor, reactance parameter and parallel line parameter between multiple DC groups. The correlation function is used to indicate the correlation between the voltage interaction influence factor and the distance information. The multiple DC groups include at least a first DC group and a second DC group. The acquisition unit is used to acquire first distance information between multiple candidate landing point locations and the first DC current, and second distance information between them and the second DC current; The first determining unit is configured to determine the target voltage drop of the plurality of candidate landing locations based on the first distance information, the second distance information and the correlation function, wherein the target voltage drop is used to indicate the additional voltage loss caused by the DC additional set for the plurality of candidate landing locations when the first DC and the second DC fail simultaneously, relative to when the first DC or the second DC fails alone. The second determining unit is used to determine the target landing position from a plurality of candidate landing positions where the target voltage drop is less than a preset voltage threshold, wherein the target landing position is used to set a third DC.

9. A processor, characterized in that, The processor is used to run a program, wherein the program executes the method according to any one of claims 1 to 7 when it runs.

10. An electronic device, characterized in that, The method includes one or more processors and a memory for storing one or more programs, wherein when the one or more programs are executed by the one or more processors, the one or more processors cause the one or more processors to implement the method of any one of claims 1 to 7.

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