A method and apparatus for testing CT detector positions

Abstract

The application belongs to the technical field of CT detector, and particularly relates to a method and device for testing the position of a CT detector. The method for testing the position of a CT detector comprises obtaining X-rays according to an X-ray device starting instruction; obtaining acquisition data formed by the X-rays passing through a slit and being incident on a detector according to an acquisition card starting instruction; obtaining light response data of the detector according to the acquisition data; obtaining a response curve of a slit projection according to the light response data; obtaining an offset of the detector according to the response curve of the slit projection; and adjusting the position of the detector according to the offset. Through the above method, the positional relationship between each detector and a reference detection position can be calculated according to test data, and the actual offset of each detector can be calculated, so as to guide the adjustment of the position of the detector and improve the patient image quality of the CT equipment.

Description

Technical Field

[0001] This application belongs to the field of CT detector technology, and in particular relates to a method and apparatus for testing the position of a CT detector. Background Technology

[0002] CT technology has consistently evolved towards more rows and wider fields of view. Currently, in addition to the mainstream 32-slice and 64-slice CT scanners, 128-slice and 256-slice CT systems have also emerged. Here, the number of rows refers to the number of rows of CT detectors. Increasing the number of detector rows generally involves increasing the number of physical pixels in the Z-axis by stitching multiple detectors together. Next, multiple detectors are closely arranged and mounted on a CT rail, positioned on an arc surface facing the focal point of the X-ray tube. Since CT image reconstruction relies on specific optical path geometry, the assembly and positioning accuracy of the detectors has a significant impact on the image quality of CT. Summary of the Invention

[0003] Therefore, it is necessary to provide a method and apparatus for testing the position of CT detectors to address the aforementioned technical problems and solve the problem of poor installation accuracy when splicing multiple detectors.

[0004] The first aspect of the present invention provides a method for testing the position of a CT detector, the method comprising:

[0005] X-rays are obtained according to the start command of the X-ray device;

[0006] According to the start command of the acquisition card, the X-rays pass through the slit and hit the detector, forming the acquisition data;

[0007] Based on the collected data, the photoresponse data of the detector is obtained;

[0008] Based on the optical response data, the response curve of the slit projection is obtained;

[0009] The offset of the detector is obtained based on the response curve of the slit projection;

[0010] The position of the detector is adjusted according to the offset.

[0011] In some feasible embodiments, the step of obtaining X-rays according to the X-ray device activation command includes:

[0012] Acquire control signals, including an X-ray device start command;

[0013] The X-ray device receives X-rays in response to an X-ray device activation command;

[0014] The step of obtaining the acquired data formed by the X-rays passing through the slit and hitting the detector according to the acquisition card start command includes:

[0015] The control signal is acquired, and the control signal further includes a data acquisition card start command;

[0016] The acquisition card, in response to the acquisition card activation command, acquires data that passes through the slit and is projected onto the detector, thereby obtaining the acquired data.

[0017] In some feasible embodiments, the step of obtaining the detector's photoresponse data based on the acquired data further includes:

[0018] The photoresponse data is obtained based on the collected data; wherein,

[0019] The light response data represents the light response data A(x, y, t) of an n×m detector;

[0020] Each set of optical response data corresponds to a time t, for a total of T time points;

[0021] x represents the x-th channel in the X direction of the detector, n represents the total number of channels in the X direction of the detector, y represents the y-th row in the Y direction of the detector, and m represents the total number of channels in the Y direction of the detector.

[0022] In some feasible embodiments, the step of obtaining the response curve of the slit projection based on the light response data includes:

[0023] Based on the aforementioned photoresponse data, the mean photoresponse is calculated along the time T direction to obtain vector B, where the formula for calculating vector B(x, y) is:

[0024]

[0025] Using spline interpolation, multiple spline interpolation operations are performed on the data A(x) in each Y direction of the detector to obtain the interpolation array A in each Y direction for each detector. ’ (x');

[0026] With x' as the x-coordinate, A ’ Using (x') as the ordinate, plot the curve to obtain A. ’ (x') data curve;

[0027] According to A ’ (x') data curve, to obtain A ’ (x') is the half-width at half-maximum (WHM) of the data curve, where the x-coordinate value corresponding to the center of the WHM is denoted as x. FWHM ;

[0028] Based on the corresponding x of the detector's Y-axis data FWHM The detector array x is obtained. FWHM (y);

[0029] Using y as the x-axis, and employing the least squares method, the array x is... FWHM (y) is fitted with a straight line to obtain the response curve of the slit projection.

[0030] In some implementable methods, the step of obtaining the detector offset based on the response curve of the slit projection includes:

[0031] Based on preset judgment criteria, the skewness of the response curve of the slit projection is compared to obtain the skewness of each detector in the Y direction;

[0032] The array x of the detector FWHM (y) is compared with the preset detector standard deviation value to obtain the X-axis offset of each detector;

[0033] The offset of the detector is obtained based on the skewness of the detector in the Y direction and the offset of the detector in the X direction.

[0034] A second aspect of the present invention provides an apparatus for testing the position of a CT detector, applied to the aforementioned method for testing the position of a CT detector, the apparatus comprising:

[0035] The detection unit includes a slit structure and a positioning bracket, wherein the positioning bracket is equipped with a detector and the slit structure.

[0036] X-ray device, used to emit X-rays;

[0037] The electrical component includes a data acquisition card and a control circuit board. The data acquisition card is connected to the detector and is used to acquire the detector's photoresponse data. The control circuit board is connected to both the data acquisition card and the X-ray device.

[0038] The slit structure is located between the detector and the X-ray device, so that the X-rays emitted from the X-ray device pass through the slit structure and are directed toward the detector.

[0039] The control circuit board responds to operation commands by sending an X-ray device start command to the X-ray device and a data acquisition card start command to the data acquisition card.

[0040] In some possible implementations, the slit structure includes a support portion and a slit plate having a slit, at least one end of the slit plate being connected to the support portion, and the end of the support portion away from the slit plate being connected to the positioning bracket.

[0041] In some feasible embodiments, the slit structure is made of a high-density alloy.

[0042] In some possible implementations, the positioning bracket is located in the direction of X-ray propagation and has a preset installation accuracy, so that the slit structure is located on the center line of the detector in the Y direction.

[0043] Some feasible methods also include a power supply electrically connected to the X-ray device, the acquisition card, and the control circuit board, respectively, to provide power to the X-ray device, the acquisition card, and the control circuit board.

[0044] Beneficial effects:

[0045] This invention provides a method and apparatus for testing the position of a CT detector. First, X-rays are obtained according to an X-ray device activation command; and according to a data acquisition card activation command, the X-rays pass through a slit and strike the detector, forming acquisition data. Next, the detector's light response data is obtained based on the acquisition data. Then, the response curve of the slit projection is obtained based on the light response data. Finally, the detector's offset is obtained based on the slit projection response curve. The position of each detector is adjusted based on the offset. Using this method, the alignment relationship between each detector and a reference detection position can be calculated based on the test data, thereby deducing the actual offset of each detector, which guides the adjustment of the detector's position and helps improve the patient image quality of the CT equipment. Attached Figure Description

[0046] To more clearly illustrate the technical solutions in the embodiments of this application or the conventional technology, the drawings used in the description of the embodiments or the conventional technology will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0047] Figure 1 This is a flowchart illustrating a method for testing the position of a CT detector according to the present invention.

[0048] Figure 2 This is a schematic diagram showing the relationship between the detector's x-axis and y-axis, as well as the slit and detector position, in a method for testing the position of a CT detector according to the present invention.

[0049] Figure 3 This is a schematic diagram of the response curve of a method for testing the position of a CT detector according to the present invention;

[0050] Figure 4This is a schematic diagram of a device for testing the position of a CT detector according to the present invention.

[0051] Figure label:

[0052] 1. Slit structure; 2. Positioning bracket; 3. X-ray device; 4. Electrical components; 5. Detector module. Detailed Implementation

[0053] To facilitate understanding of this application, a more complete description will be provided below with reference to the accompanying drawings, which illustrate embodiments of the present application. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the disclosure of this application will be thorough and complete.

[0054] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the specification of this application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The term "and / or" as used herein includes any and all couplings of one or more of the associated listed items.

[0055] It is understood that the terms “first,” “second,” etc., used in this application may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another.

[0056] The following explanations of some terms used in this application are provided to aid in understanding the application:

[0057] CT, or Computed Tomography, is a scanning technology that uses precisely collimated X-ray beams, gamma rays, ultrasound waves, etc., along with highly sensitive detectors, to perform a series of cross-sectional scans around a specific part of the human body. It features fast scanning time and clear images and can be used to examine a variety of diseases.

[0058] A data acquisition card is a computer expansion card used to acquire analog or digital signals from connected devices, automatically collect them, and send them to a host computer for analysis and processing.

[0059] Spline interpolation is a commonly used interpolation technique used to estimate the values ​​between a set of discrete data points by fitting a smooth curve or surface. This interpolation curve typically consists of multiple low-order polynomials, with a polynomial defined for each interval between adjacent data points; these polynomials are called splines.

[0060] Least squares is a commonly used mathematical optimization method for solving problems such as linear regression and curve fitting. It determines the optimal estimates of model parameters by minimizing the sum of squared residuals between observed data and model predictions.

[0061] Full width at half maximum (FWHM) refers to the width of a spectral band at half its peak height. The FWHM peak determination method is a type of peak determination method commonly used in spectroscopy, chromatography, and other fields.

[0062] The formula for fitting a straight line is to find a straight line that approximates a set of data points as closely as possible.

[0063] Currently, the assembly precision of detectors and the processing precision of mounting brackets are difficult to achieve the positioning precision required for CT images. Higher installation precision requirements will bring more manufacturing costs and time costs. Existing technologies use multiple tooling conversions to ensure detector positioning precision. However, due to the multi-level conversion of positioning references, the tolerance chain superposition effect is significant, and the final assembled detector positional precision is difficult to meet the image requirements.

[0064] like Figure 1 As shown, the first aspect of the present invention provides a method for testing the position of a CT detector, the method comprising the following steps:

[0065] S100, X-rays are obtained according to the X-ray device start command.

[0066] Specifically, the X-ray device is a type of CT scanner that is a conventional device that emits X-rays. After receiving an X-ray device start command, the X-ray device starts emitting X-rays.

[0067] S200: According to the start command of the acquisition card, the X-rays pass through the slit and hit the detector, forming the acquisition data.

[0068] Specifically, after receiving the start command, the acquisition card can acquire the data collected by the detectors that are electrically connected to it.

[0069] It should be noted that the start commands that form the acquisition card start command and the X-ray device start command constitute the control signal.

[0070] For example: Acquire a control signal, the control signal including an X-ray device start command;

[0071] The X-ray device receives X-rays in response to an X-ray device activation command;

[0072] The control signal is acquired, and the control signal further includes a data acquisition card start command;

[0073] The acquisition card, in response to the acquisition card activation command, acquires data that passes through the slit and is projected onto the detector, thereby obtaining the acquired data.

[0074] Understandably, the control signal includes the X-ray device start command and the acquisition card start command. After the control signal is generated, the X-ray device start command is sent to the X-ray device, and the acquisition card start command is sent to the acquisition card, so that the X-ray device and the acquisition card can start working.

[0075] S300, based on the collected data, obtain the photoresponse data of the detector.

[0076] Specifically, after acquiring the collected data, which includes optical response data, the optical response data is then processed. Here, the optical response data represents data A(x, y, t) as the optical response data of an n×m detector; each set of optical response data corresponds to each time point t, for a total of T time points; x represents the x-th channel in the X-direction of the detector, n is the total number of channels in the X-direction of the detector, y represents the y-th row in the Y-direction of the detector, and m is the total number of channels in the Y-direction of the detector. In other words, the detector may include n×m detectors, and each detector has corresponding optical response data at each time point t.

[0077] S400, based on the light response data, obtain the response curve of the slit projection.

[0078] like Figure 2 As shown, specifically, obtaining the response curve of the slit projection based on the light response data includes the following steps:

[0079] Based on the aforementioned photoresponse data, the mean photoresponse is calculated along the time T direction to obtain vector B, where the formula for calculating vector B(x, y) is:

[0080]

[0081] Using spline interpolation, multiple spline interpolation operations are performed on the data A(x) in each Y direction of the detector to obtain the interpolation array A for each Y direction of each detector. ’ (x');

[0082] With x' as the x-coordinate, A ’ Using (x') as the ordinate, plot the curve to obtain A. ’ (x') data curve;

[0083] According to A ’ (x') data curve, to obtain A ’ (x') is the half-width at half-maximum (WHM) of the data curve, where the x-coordinate value corresponding to the center of the WHM is denoted as x. FWHM ;

[0084] Based on the corresponding x of all Y-axis data from the detector FWHM The detector array x is obtained. FWHM (y);

[0085] Using y as the x-coordinate, and applying the least squares method, calculate the array x. FWHM (y) is fitted with a straight line to obtain the response curve of the slit projection.

[0086] It should be noted that after obtaining the light response data A(x, y, t) in the aforementioned steps, the mean light response vector B is obtained using the formula for vector B. This mean vector is then used in subsequent steps to calibrate the detector, determine the detector's response to X-rays at different positions, and facilitate the adjustment of the detector's position in subsequent steps. This ensures that the detector's response to X-rays is consistent, avoids or reduces image artifacts or distortions, improves image quality, and ensures the uniformity and contrast of the entire image.

[0087] In addition, multiple spline interpolation is performed on the data A(x) in each Y direction of the detector. For example, the interpolation is performed using the cubic spline interpolation method to generate a smooth interpolation curve. By fitting a cubic polynomial between adjacent data points and ensuring the continuity of the first and second derivatives at each data point, discontinuities or abrupt changes are avoided during the interpolation process, which helps to reduce the impact of noise.

[0088] like Figure 3 As shown, next, using y as the abscissa, the least squares method is used to find the best-fit line. That is, the least squares method is used to obtain a straight line by minimizing the sum of the squares of the vertical distances from the data points to the fitted line. In this way, the obtained straight line can better describe the distribution trend of the slit projection response curve in a statistical sense.

[0089] It should be noted that the half-width at half-maximum (HWHM) is used in detector photoresponse data processing, employing multiple spline interpolation to interpolate the data. Multiple spline interpolation approximates the data by fitting a polynomial between adjacent data points, providing a more accurate description of the peak shape. Next, peak fitting is performed on the interpolated data, using a fitting function (such as a Gaussian function or a Lorentz function) to obtain peak parameters, such as peak position and peak width. Then, based on the fitting results, the HWHM is calculated. This can be achieved by drawing a HWHM line parallel to the horizontal axis at half the height of the fitted curve's peak, intersecting the two peak waist lines; the distance between the two intersection points is the HWHM. The peak position is then determined using the HWHM peak-fixing method, taking the midpoint between the two intersection points; the horizontal coordinate of this midpoint is the desired peak position. Finally, a linear fit is performed on the peak position value to obtain the response curve of the slit projection.

[0090] S500, the offset of the detector is obtained based on the response curve of the slit projection.

[0091] Specifically, obtaining the offset of the detector includes the following steps:

[0092] Based on preset judgment criteria, the skewness of the response curve of the slit projection is compared to obtain the skewness of the detector in the Y direction.

[0093] The detector array x FWHM (y) is compared with the preset detector standard deviation value to obtain the X-axis offset of each detector;

[0094] The offset of the detector is obtained based on the skewness of the detector in the Y direction and the offset of the detector in the X direction.

[0095] For example, the method for determining whether the response curve of the slit projection is skewed is as follows: First, determine the slope k value of the straight line fitting formula (e.g., the least squares method, the purpose of which is to minimize the sum of the squares of the vertical distances from the data points to the fitted line). The k value should be within a preset range. If it exceeds the preset range, it indicates that the detector has a skew in the Y direction. In this case, the detector module needs to be adjusted for Y-direction skew. After adjustment, retest until the k value is within the preset range. Next, compare the X-direction offset of each detector value.

[0096] If the response curve is not flat, it indicates that the detector is skewed in the Y direction. Therefore, it is necessary to adjust the detector in the Y direction based on the offset. Additionally, the x-axis of each detector should be compared. FWHM， The detector's X-direction deviation is calculated by comparing it with a preset detector standard deviation value, resulting in the X-direction offset. The detector's position is then adjusted based on this offset. This method is used to adjust the detector's position in both the X and Y directions.

[0097] S600, adjust the position of the detector according to the offset.

[0098] Specifically, the X and Y offsets of the detectors are obtained in the aforementioned steps. The position of each detector is adjusted according to the offsets to obtain a detector in an ideal position, thereby improving the consistency of the detectors and improving the patient image quality of the CT equipment.

[0099] like Figure 4 As shown, a second aspect of the present invention provides an apparatus for testing the position of a CT detector, applied to the aforementioned method for testing the position of a CT detector, the apparatus comprising: a detection unit, an X-ray device 3, and an electrical unit 4.

[0100] The detection unit includes a slit structure 1 and a positioning bracket 2. The positioning bracket 2 is equipped with a detector module 5 and the slit structure 1. The detector module 5 is composed of multiple detectors.

[0101] X-ray device 3 is used to emit X-rays.

[0102] The electrical unit 4 includes a data acquisition card and a control circuit board. The data acquisition card is connected to the detector module 5 and is used to acquire the light response data of the detector in the detector module 5. The control circuit board is connected to the data acquisition card and the X-ray device 3 respectively.

[0103] The slit structure 1 is located between the detector module 5 and the X-ray device 3, so that the X-rays emitted from the X-ray device 3 pass through the slit structure 1 and are directed to the detector module 5; the control circuit board responds to the operation command, sending an X-ray device start command to the X-ray device 3 and a data acquisition card start command to the data acquisition card.

[0104] It should be noted that the control circuit board responds to the operator's commands by sending an X-ray device start command to the X-ray device 3 and an acquisition card start command to the acquisition card. Upon receiving the start commands, both the X-ray device 3 and the acquisition card begin operation. The X-ray device 3 emits X-rays, which pass through a slit and strike the detector module 5. The detectors in the detector module 5 receive the X-rays, which are then collected by the acquisition card. The acquisition card generates acquisition data based on the response time of the detectors in the detector module 5 to the X-rays. This acquisition data includes light response data. In other words, this method obtains the light response data of each detector in the detector module 5 to X-rays. The light response data can then be processed and analyzed to determine the positional deviation of the detectors in the detector module 5, allowing for positional adjustments to the detectors in the detector module 5.

[0105] Furthermore, the slit structure 1 includes a support portion and a slit plate. The slit plate has a slit, and at least one end of the slit plate is connected to the support portion. The end of the support portion away from the slit plate is connected to the positioning bracket 2. The slit structure is made of a high-density alloy. For example, the slit structure 1 is made of tungsten, molybdenum, or other high-density materials or high-density alloys, and has a preset strength, so that X-rays can only pass through the slit of the slit structure 1 and reach the detector module 5.

[0106] Furthermore, the positioning bracket 2 is located in the propagation direction of the X-rays and has a preset installation accuracy, so that each slit of the slit structure 1 is located on the center line of the corresponding detector in the Y direction of the detector module 5. The positioning bracket 2 has a preset strength to support the slit structure 1 and the detector module 5; the positioning bracket 2 has a positioning structure that positions the relative position of the detector of the detector module 5 and the slit, so that the slit is aligned with the center line of the detector in the Y direction of the detector of the detector module 5.

[0107] In one embodiment, an apparatus for testing the position of a CT detector further includes a power supply (not shown in the figure), which is electrically connected to the X-ray device 3, the acquisition card, and the control circuit board, respectively, so as to supply power to the X-ray device 3, the acquisition card, and the control circuit board.

[0108] In summary, the present invention provides a method and apparatus for testing the position of a CT detector. By analyzing the detector data collected by the detector module 5, the alignment relationship between the reference detection position and the detector of the detector module 5 is calculated, and then the actual offset of each detector is calculated. Based on this, the position of the detector can be adjusted to improve the image quality.

[0109] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, storage, databases, or other media used in the embodiments provided in this application can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), Rambus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.

[0110] The various embodiments in this disclosure are described in a progressive manner. The same or similar parts between the various embodiments can be referred to each other. Each embodiment focuses on describing the differences from other embodiments.

[0111] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method of testing CT detector positions, characterized by, The method comprises: According to the X-ray device start instruction, the X-ray is obtained; According to the acquisition card start instruction, the X-ray passing through the slit and shooting on the detector forms the acquisition data; According to the acquisition data, the light response data of the detector is obtained; According to the light response data, the response curve of the slit projection is obtained; According to the response curve of the slit projection, the offset of the detector is obtained; According to the offset, the position of the detector is adjusted, wherein The step of obtaining the light response data of the detector according to the acquisition data further comprises: According to the acquisition data, the light response data is obtained; wherein The light response data represents the data A(x, y, t) as the light response data of the n*m detector; Each set of light response data corresponds to each time t, a total of T times; X is the xth channel in the X direction of the detector, n is the total number of channels in the X direction of the detector, y represents the yth row in the Y direction of the detector, and m is the total number of channels in the Y direction of the detector; The step of obtaining the response curve of the slit projection according to the light response data comprises: According to the light response data, the light response mean value is calculated in the time T direction to obtain the vector B, wherein the vector B(x, y) calculation formula is: A spline interpolation method is used to perform a plurality of spline interpolation operations on the data A(x) of each Y direction of the detector to obtain each Y direction interpolation array A ’ (x ’ ) of each detector. With x ’ Let A be the x-axis. ’ (x ’ Using y as the ordinate, plot the curve to obtain A. ’ (x ’ Data curves; According to A ’ (x ’ ) data curve, the half-height width of the A ’ (x ’ ) data curve is obtained, wherein the center of the half-height width corresponds to the x FWHM coordinate value According to the corresponding x FWHM of the detector Y data FWHM (y); With y as the abscissa, the array x FWHM (y) is linearly fitted by the least square method to obtain the response curve of the slit projection.

2. The method of testing CT detector positions of claim 1, wherein, The step of obtaining the X-ray according to the X-ray device start instruction comprises: Obtain a control signal, the control signal includes an X-ray device start instruction; The X-ray device obtains the X-ray in response to the X-ray device start instruction; The step of obtaining the acquisition data formed by the X-ray passing through the slit and shooting on the detector according to the acquisition card start instruction comprises: Obtain the control signal, the control signal further includes an acquisition card start instruction; The acquisition card acquires the data passing through the slit and shooting on the detector to obtain the acquisition data in response to the acquisition card start instruction.

3. The method of testing CT detector positions of claim 1, wherein, The step of obtaining the offset of the detector according to the response curve of the slit projection comprises: According to the preset judgment standard, the deflection of the response curve of the slit projection is compared to obtain the Y direction deflection of each detector; The array x of the probe is obtained FWHM (y) is compared with the preset probe standard deviation value, and an X direction offset of each probe is obtained. According to the deflection of the detector in the Y direction and the X direction offset of the detector, the offset of the detector is obtained.

4. An apparatus for testing CT detector positions, characterized by The device is applied to the method for testing the position of the CT detector in any one of claims 1-3, and comprises: A detection part comprises a slit structure and a positioning support, the positioning support is provided with a detector and a slit structure; An X-ray device is used to emit X-rays; An electrical part comprises an acquisition card and a control circuit board, the acquisition card is connected with the detector and is used to acquire the light response data of the detector; the control circuit board is connected with the acquisition card and the X-ray device respectively; wherein The slit structure is located between the detector and the X-ray device, so that the X-rays emitted by the X-ray device pass through the slit structure and shoot towards the detector; The control circuit board sends an X-ray device starting instruction to the X-ray device and a collection card starting instruction to the collection card in response to an operation instruction.

5. The apparatus for testing CT detector positions of claim 4, wherein, The linear slit structure comprises a support part and a slit plate, the slit plate is provided with a linear slit, at least one end of the slit plate is connected with the support part, and the end of the support part away from the slit plate is connected with the positioning support.

6. The apparatus for testing CT detector positions of claim 5, wherein, The linear slit structure is made of high-density alloy.

7. The apparatus for testing CT detector positions of claim 5, wherein, The positioning support is located in the propagation direction of the X-ray and has a preset installation precision, so that the linear slit structure is located on the center line of the detector in the Y direction.

8. The apparatus for testing CT detector positions of claim 5, wherein, A power supply is further included and electrically connected with the X-ray device, the collection card and the control circuit board, so as to supply power for the X-ray device, the collection card and the control circuit board.

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