Method and device for improving signal-to-noise ratio of near-infrared soybean spectrum
By obtaining the mapping relationship between wavelength position and integral time and dynamically updating the integral time, the problem of extremely poor signal-to-noise ratio of the near-infrared soybean spectrum in the range of 1000-1100nm is solved, and the spectral data with high signal-to-noise ratio and consistency are achieved, avoiding high costs and manufacturing difficulty.
Patent Information
- Application Number
- CN202410727400.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-06-06
- Publication Date
- 2025-05-16
- Estimated Expiration
- 2044-06-06
AI Technical Summary
When collecting near-infrared soybean spectrum, the signal-to-noise ratio is extremely poor in the range of 1000-1100 nm, resulting in inaccurate or failure of spectral prediction. Methods to improve the signal-to-noise ratio, such as increasing the light source power, increasing the size of the spectrometer incident slit, etc., have problems of high cost and manufacturing difficulty.
By obtaining the mapping relationship between the wavelength position and the integral time, the integration time corresponding to each wavelength position is determined according to the mapping relationship, and the near-infrared spectral data are updated to improve the signal-to-noise ratio.
Dynamic update of the points time improves the signal-to-noise ratio, solves the problems of high cost and low efficiency in the system research and development process, and ensures the consistency of the soybean spectrum.
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Figure CN118706789B_ABST
Abstract
Description
Technical Field
[0001] The present application relates to a method and a device for improving the signal-to-noise ratio of near-infrared soybean spectrum, and belongs to the technical field of image processing. Background Art
[0002] At present, the fatty acid composition and other parameters in soybean seeds can be detected by collecting near-infrared soybean spectra. Among them, near-infrared soybean spectra are usually collected using near-infrared bands within a certain wavelength range, such as: using 600-1100nm near-infrared bands.
[0003] Under normal integration time, the infrared energy is extremely low when sampling soybeans in the long-wave position range (for example, in the range of 1000-1100nm, or 900-1050nm), and the signal-to-noise ratio is extremely poor. However, the absorption peak of protein is located near the 1030nm position, and a low signal-to-noise ratio will lead to inaccurate or failed spectral prediction.
[0004] Some typical ways to improve the signal-to-noise ratio of near-infrared soybean spectra at 1000-1100nm include:
[0005] 1. Increase the light source power. At this time, although the signal-to-noise ratio can be significantly increased, the high temperature has a great impact on the sample to be tested and the system, which will cause the system detection performance to decline.
[0006] 2. Increase the size of the spectrometer's incident slit. In this case, while the signal-to-noise ratio increases, the optical resolution will deteriorate, leading to problems that affect spectral performance.
[0007] 3. Anti-reflection coating is applied to the internal optical components of the spectrometer. Although it can effectively improve the signal-to-noise ratio, the coating cost is relatively high, and the consistency between different batches of coating manufacturers is difficult to guarantee, which increases the difficulty of system manufacturing.
[0008] 4. Select silicon detectors with higher responsiveness. Silicon detectors with higher responsiveness are more expensive, and most high-performance silicon detectors are difficult to manufacture and have long delivery cycles, which will also increase the difficulty of system manufacturing and generate greater R&D costs.
[0009] 5. Increase the integration time and select an ADC chip with higher bit number and frequency. Although increasing the dynamic range of the spectrum can improve the signal-to-noise ratio of the corresponding band, the ADC chip is also difficult to manufacture. The high cost also increases the overall R&D cost, making system manufacturing more difficult.
[0010] 6. Use a silicon detector flattening filter. By flattening the spectral response of the silicon photodiode, the responsivity at the short-wave position of visible light is reduced, and the spectral responsivity at the 800-1100nm position is increased. However, the flattening filter also increases the development cost, and it is difficult to ensure the consistency between batches, which increases the difficulty of system manufacturing. Summary of the invention
[0011] This application provides a method and device for improving the signal-to-noise ratio of near-infrared soybean spectrum, which can effectively solve the problems of extremely high cost, extremely low efficiency and poor consistency of soybean spectrum in the system development process. This application provides the following technical solutions:
[0012] In a first aspect, a method for improving the signal-to-noise ratio of near-infrared soybean spectrum is provided, the method comprising:
[0013] Acquire a mapping relationship between a wavelength position and an integration time; wherein, for each wavelength position, the mapping relationship indicates that the integration time is negatively correlated with the spectral responsivity corresponding to the wavelength position;
[0014] Obtain near infrared spectral data of soybean;
[0015] For each pixel point of the near-infrared spectrum data, determining the integration time corresponding to each wavelength position based on the mapping relationship;
[0016] The near infrared spectrum data is updated according to the adjusted integration time to obtain updated near infrared spectrum data, so as to analyze the soybean based on the updated near infrared spectrum data.
[0017] Optionally, updating the near infrared spectrum data according to the adjusted integration time to obtain updated near infrared spectrum data includes:
[0018] Get the original integration time of each pixel;
[0019] For each wavelength position, determining an adjusted integration time corresponding to the wavelength position based on the mapping relationship;
[0020] The original integration time at the wavelength position of each pixel point is adjusted to the adjusted integration time to obtain the updated near-infrared spectrum data.
[0021] Optionally, adjusting the original integration time at the wavelength position of each pixel point to the adjusted integration time to obtain the updated near-infrared spectrum data includes:
[0022] For each wavelength position, determining the ratio between the adjusted integration time and the original integration time, and obtaining a ratio array K corresponding to each wavelength position;
[0023] The near infrared spectrum data corresponding to each pixel point is multiplied by the ratio array K to obtain the updated near infrared spectrum data.
[0024] Optionally, for each pixel point of the near-infrared spectrum data, determining the integration time corresponding to each wavelength position based on the mapping relationship includes:
[0025] For each pixel point of the near-infrared spectral data, at least an integration time corresponding to a specified wavelength position is determined based on the mapping relationship, wherein the specified wavelength position refers to a position within a preset wavelength range, and the signal-to-noise ratio of the spectral data within the preset wavelength range does not meet a preset signal-to-noise ratio requirement.
[0026] Optionally, before determining the integration time corresponding to each wavelength position for each pixel point of the near-infrared spectrum data based on the mapping relationship, the method further includes:
[0027] The near infrared spectrum data in the pixel domain is interpolated to obtain the near infrared spectrum data in the wavelength domain, so as to determine the integration time corresponding to each wavelength position in a continuous wavelength range.
[0028] Optionally, acquiring a mapping relationship between a wavelength position and an integration time includes:
[0029] For each wavelength position, the integration time at the current spectral responsivity is adjusted to collect reference near-infrared soybean spectra at different integration times and spectral responsivities corresponding to the same wavelength position;
[0030] Obtain the signal-to-noise ratio of each reference near-infrared soybean spectrum;
[0031] Obtaining the integration time corresponding to the reference near-infrared soybean spectrum whose signal-to-noise ratio meets the preset requirements;
[0032] A mapping relationship between the integration time and the current spectral responsivity is established.
[0033] In a second aspect, a device for improving the signal-to-noise ratio of near-infrared soybean spectrum is provided, the device comprising:
[0034] A relationship acquisition module, used to acquire a mapping relationship between a wavelength position and an integration time; wherein, for each wavelength position, the mapping relationship indicates that the integration time is negatively correlated with the spectral responsivity corresponding to the wavelength position;
[0035] A spectrum acquisition module is used to obtain near-infrared spectrum data of soybeans;
[0036] A time determination module, used for determining, for each pixel point of the near-infrared spectrum data, the integration time corresponding to each wavelength position based on the mapping relationship;
[0037] The spectrum adjustment module is used to update the near infrared spectrum data according to the adjusted integration time to obtain updated near infrared spectrum data, so as to analyze the soybean based on the updated near infrared spectrum data.
[0038] Optionally, the spectrum adjustment module is used to:
[0039] Get the original integration time of each pixel;
[0040] For each wavelength position, determining an adjusted integration time corresponding to the wavelength position based on the mapping relationship;
[0041] The original integration time at the wavelength position of each pixel point is adjusted to the adjusted integration time to obtain the updated near-infrared spectrum data.
[0042] Optionally, adjusting the original integration time at the wavelength position of each pixel point to the adjusted integration time to obtain the updated near-infrared spectrum data includes:
[0043] For each wavelength position, determining the ratio between the adjusted integration time and the original integration time, and obtaining a ratio array K corresponding to each wavelength position;
[0044] The near infrared spectrum data corresponding to each pixel point is multiplied by the ratio array K to obtain the updated near infrared spectrum data.
[0045] Optionally, the time determination module is used to:
[0046] For each pixel point of the near-infrared spectral data, at least an integration time corresponding to a specified wavelength position is determined based on the mapping relationship, wherein the specified wavelength position refers to a position within a preset wavelength range, and the signal-to-noise ratio of the spectral data within the preset wavelength range does not meet a preset signal-to-noise ratio requirement.
[0047] By obtaining a mapping relationship between wavelength position and integration time; wherein, for each wavelength position, the mapping relationship indicates that the integration time is negatively correlated with the spectral responsivity corresponding to the wavelength position; obtaining near-infrared spectrum data of soybeans; for each pixel point of the near-infrared spectrum data, determining the integration time corresponding to each wavelength position based on the mapping relationship; updating the near-infrared spectrum data according to the adjusted integration time to obtain updated near-infrared spectrum data, so as to analyze soybeans based on the updated near-infrared spectrum data; dynamically updating the corresponding integration time according to the spectral responsivity at different wavelength positions, thereby improving the spectral energy corresponding to the wavelength position, and at the same time, there is no need to introduce new devices or use better devices, so as to solve the problems of extremely high cost and extremely low efficiency and poor consistency of soybean spectrum in the system development process, thereby improving the signal-to-noise ratio corresponding to the wavelength position, and obtaining a spectrum with high consistency and signal-to-noise ratio.
[0048] The above description is only an overview of the technical solution of the present application. In order to more clearly understand the technical means of the present application and implement it according to the contents of the specification, the following is a detailed description of the preferred embodiments of the present application in conjunction with the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS
[0049] Figure 1 This is a flow chart of a method for improving the signal-to-noise ratio of near-infrared soybean spectrum provided by an embodiment of the present application;
[0050] Figure 2a-2g is a schematic diagram comparing unupdated near infrared spectrum data and updated near infrared spectrum data provided by an embodiment of the present application;
[0051] Figure 3 It is a block diagram of a device for improving the signal-to-noise ratio of near-infrared soybean spectrum provided by an embodiment of the present application. DETAILED DESCRIPTION
[0052] The specific implementation methods of the present application are further described in detail below in conjunction with the accompanying drawings and examples. The following examples are used to illustrate the present application but are not intended to limit the scope of the present application.
[0053] Generally, the near-infrared soybean spectrum acquisition equipment is provided with a light source, a detector and a spectrum generating device. The near-infrared light emitted by the light source irradiates the sample (such as the soybean to be detected) and is received by the detector and converted into an electrical signal. The spectrum generating device is connected to the detector, and after acquiring the electrical signal, a near-infrared soybean spectrum or a near-infrared soybean absorbance spectrum is generated based on the electrical signal.
[0054] The spectrum generating device may be an electronic device such as a computer that has the capability of processing infrared spectrum.
[0055] Figure 1A flowchart of a method for improving the signal-to-noise ratio of near-infrared soybean spectrum is provided in one embodiment of the present application. This embodiment is described by taking the method used in a spectrum generating device as an example. Figure 1 As shown, the method includes at least the following steps:
[0056] Step 101, obtaining a mapping relationship between a wavelength position and an integration time; wherein, for each wavelength position, the mapping relationship indicates that the integration time is negatively correlated with the spectral responsivity corresponding to the wavelength position.
[0057] The integration time is the time it takes for the charge generated by the light input to accumulate in the detector. In near-infrared spectroscopy, the amount of charge accumulated is proportional to the integration time, which means that if the amount of incident light is low, a longer integration time can be used to obtain sufficient charge.
[0058] Spectral responsivity is a physical quantity that describes the sensitivity of a detector to light radiation of different wavelengths. It reflects the relationship between the detector output signal and the incident light radiation power.
[0059] In one example, obtaining a mapping relationship between a wavelength position and an integration time includes:
[0060] For each wavelength position, the integration time at the current spectral responsivity is adjusted to collect reference near-infrared soybean spectra at different integration times and spectral responsivities corresponding to the same wavelength position;
[0061] Obtain the signal-to-noise ratio of each reference near-infrared soybean spectrum;
[0062] Obtaining the integration time corresponding to the reference near-infrared soybean spectrum whose signal-to-noise ratio meets the preset requirements;
[0063] Establish a mapping relationship between the integration time and the current spectral responsivity.
[0064] Illustratively, the mapping relationship is acquired and then stored in the spectrum generating device, so that each time the near-infrared spectrum data of soybeans is collected, the mapping relationship is read to update the near-infrared spectrum data to improve the signal-to-noise ratio of the near-infrared spectrum data.
[0065] Step 102, obtaining near infrared spectrum data of soybeans.
[0066] The near infrared spectrum data includes but is not limited to: the spectrum data of the near infrared soybean spectrum and / or the spectrum data of the near infrared soybean absorbance spectrum. The near infrared spectrum data is obtained by detection by a detector.
[0067] Optionally, the near-infrared spectrum data detected by the detector is near-infrared spectrum data in the pixel domain. In this case, the wavelength range may not be continuous. Based on this, before determining the integration time corresponding to each wavelength position for each pixel point of the near-infrared spectrum data based on the mapping relationship, that is, before step 103, it also includes: interpolating the near-infrared spectrum data in the pixel domain to obtain the near-infrared spectrum data in the wavelength domain, so as to determine the integration time corresponding to each wavelength position in the continuous wavelength range.
[0068] Optionally, step 102 may be executed before step 101, or may be executed after step 101, or may be executed simultaneously with step 101. This embodiment does not limit the execution order between step 101 and step 102.
[0069] Step 103: for each pixel point of the near-infrared spectrum data, determine the integration time corresponding to each wavelength position based on the mapping relationship.
[0070] In one example, the spectrum generating device may determine the integration time corresponding to each wavelength position within the entire wavelength acquisition range based on the mapping relationship.
[0071] In another example, the integration time may also be determined for a specified wavelength position with a lower signal-to-noise ratio. In this case, for each pixel point of the near-infrared spectral data, the integration time corresponding to each wavelength position is determined based on the mapping relationship, including: for each pixel point of the near-infrared spectral data, at least the integration time corresponding to the specified wavelength position is determined based on the mapping relationship, the specified wavelength position refers to being within a preset wavelength range, and the signal-to-noise ratio of the spectral data within the preset wavelength range does not meet the preset signal-to-noise ratio requirement.
[0072] For example, the preset wavelength range is 900-1100 nm, and the integration time is determined for each designated wavelength position within the preset wavelength range based on the mapping relationship.
[0073] Step 104 , updating the near infrared spectrum data according to the adjusted integration time to obtain updated near infrared spectrum data, so as to analyze the soybean based on the updated near infrared spectrum data.
[0074] The spectrum generating device obtains the original integration time of each pixel point; for each wavelength position, determines the adjusted integration time corresponding to the wavelength position based on the mapping relationship; adjusts the original integration time at the wavelength position of each pixel point to the adjusted integration time, and obtains updated near-infrared spectrum data.
[0075] Schematically, the original integration time at the wavelength position of each pixel point is adjusted to the adjusted integration time to obtain updated near-infrared spectrum data, including:
[0076] For each wavelength position, the ratio between the adjusted integration time and the original integration time is determined to obtain the ratio array K corresponding to each wavelength position; the near-infrared spectrum data corresponding to each pixel point is multiplied by the ratio array K to obtain the updated near-infrared spectrum data.
[0077] refer to Figure 2a-2g A schematic diagram comparing the unupdated near infrared spectral data and the updated near infrared spectral data is shown, wherein: Figure 2a represents conventional reference spectral data, Figure 2b represents the spectrum of a conventional soybean sample (i.e., the spectrum at a low signal-to-noise ratio). Figure 2c represents the spectrum of a conventional soybean sample (i.e., the absorbance spectrum at a low signal-to-noise ratio). Figure 2d The integral time curve corresponding to the mapping relationship is shown. According to the figure, the integral time in the wavelength range of 600-900nm is reduced, and in the wavelength range of 900-1100nm, the integral time is increased. Figure 2e Indicates Figure 2d The high signal-to-noise ratio reference spectrum after the integration time curve is shown. Figure 2f Indicates Figure 2d The high signal-to-noise ratio soybean spectrum after the integration time curve is shown. Figure 2g Indicates Figure 2d The high signal-to-noise ratio soybean absorbance spectrum after the integration time curve shown is processed. Figure 2f and Figure 2g It can be seen that the energy of the wavelength 900-1100nm part (the circled part in the figure) is increased. At this time, a spectrum with high consistency and signal-to-noise ratio can be obtained.
[0078] In summary, the method for improving the signal-to-noise ratio of the near-infrared soybean spectrum provided in this embodiment is by obtaining a mapping relationship between the wavelength position and the integration time; wherein, for each wavelength position, the mapping relationship indicates that the integration time is negatively correlated with the spectral responsivity corresponding to the wavelength position; obtaining near-infrared spectrum data of soybeans; for each pixel point of the near-infrared spectrum data, determining the integration time corresponding to each wavelength position based on the mapping relationship; updating the near-infrared spectrum data according to the adjusted integration time to obtain updated near-infrared spectrum data, so as to analyze the soybeans based on the updated near-infrared spectrum data; the corresponding integration time can be dynamically updated according to the spectral responsivity of different wavelength positions, thereby improving the spectral energy corresponding to the wavelength position, and at the same time, there is no need to introduce new devices or use better devices, so as to solve the problems of extremely high cost and extremely low efficiency and poor consistency of soybean spectrum in the system development process, thereby improving the signal-to-noise ratio corresponding to the wavelength position, and obtaining a spectrum with high consistency and signal-to-noise ratio.
[0079] Figure 3The block diagram of a device for improving the signal-to-noise ratio of near-infrared soybean spectrum provided by an embodiment of the present application includes at least the following modules: a relationship acquisition module 310 , a spectrum acquisition module 320 , a time determination module 330 , and a spectrum adjustment module 340 .
[0080] A relationship acquisition module 310 is used to acquire a mapping relationship between a wavelength position and an integration time; wherein, for each wavelength position, the mapping relationship indicates that the integration time is negatively correlated with the spectral responsivity corresponding to the wavelength position;
[0081] A spectrum acquisition module 320 is used to acquire near infrared spectrum data of soybeans;
[0082] A time determination module 330, configured to determine, for each pixel point of the near-infrared spectrum data, an integration time corresponding to each wavelength position based on the mapping relationship;
[0083] The spectrum adjustment module 340 is used to update the near infrared spectrum data according to the adjusted integration time to obtain updated near infrared spectrum data, so as to analyze the soybean based on the updated near infrared spectrum data.
[0084] Optionally, the spectrum adjustment module is used to:
[0085] Get the original integration time of each pixel;
[0086] For each wavelength position, determining an adjusted integration time corresponding to the wavelength position based on the mapping relationship;
[0087] The original integration time at the wavelength position of each pixel point is adjusted to the adjusted integration time to obtain the updated near-infrared spectrum data.
[0088] Optionally, adjusting the original integration time at the wavelength position of each pixel point to the adjusted integration time to obtain the updated near-infrared spectrum data includes:
[0089] For each wavelength position, determining the ratio between the adjusted integration time and the original integration time, and obtaining a ratio array K corresponding to each wavelength position;
[0090] The near infrared spectrum data corresponding to each pixel point is multiplied by the ratio array K to obtain the updated near infrared spectrum data.
[0091] Optionally, the time determination module is used to:
[0092] For each pixel point of the near-infrared spectral data, at least an integration time corresponding to a specified wavelength position is determined based on the mapping relationship, wherein the specified wavelength position refers to a position within a preset wavelength range, and the signal-to-noise ratio of the spectral data within the preset wavelength range does not meet a preset signal-to-noise ratio requirement.
[0093] For relevant details, refer to the above method embodiment.
[0094] It should be noted that: the device for improving the signal-to-noise ratio of the near-infrared soybean spectrum provided in the above embodiment only uses the division of the above functional modules as an example to illustrate when improving the signal-to-noise ratio of the near-infrared soybean spectrum. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device for improving the signal-to-noise ratio of the near-infrared soybean spectrum is divided into different functional modules to complete all or part of the functions described above. In addition, the device for improving the signal-to-noise ratio of the near-infrared soybean spectrum provided in the above embodiment and the method embodiment for improving the signal-to-noise ratio of the near-infrared soybean spectrum belong to the same concept. The specific implementation process is detailed in the method embodiment and will not be repeated here.
[0095] Optionally, the present application also provides a computer-readable storage medium, in which a program is stored, and the program is loaded and executed by a processor to implement the method for improving the signal-to-noise ratio of near-infrared soybean spectrum of the above method embodiment.
[0096] Optionally, the present application also provides a computer product, which includes a computer-readable storage medium, in which a program is stored, and the program is loaded and executed by a processor to implement the method for improving the near-infrared soybean spectrum signal-to-noise ratio of the above method embodiment.
[0097] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0098] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.
Claims
1. A method for improving the signal-to-noise ratio of near-infrared soybean spectrum, characterized in that: The method comprises: Acquire a mapping relationship between a wavelength position and an integration time; wherein, for each wavelength position, the mapping relationship indicates that the integration time is negatively correlated with the spectral responsivity corresponding to the wavelength position; Obtain near infrared spectral data of soybean; For each pixel point of the near-infrared spectrum data, determining the integration time corresponding to each wavelength position based on the mapping relationship; updating the near infrared spectrum data according to the adjusted integration time to obtain updated near infrared spectrum data, so as to analyze the soybean based on the updated near infrared spectrum data; Wherein, updating the near infrared spectrum data according to the adjusted integration time to obtain updated near infrared spectrum data includes: Get the original integration time of each pixel; For each wavelength position, determining an adjusted integration time corresponding to the wavelength position based on the mapping relationship; Adjusting the original integration time at the wavelength position of each pixel point to the adjusted integration time to obtain the updated near-infrared spectrum data; The step of adjusting the original integration time at the wavelength position of each pixel point to the adjusted integration time to obtain the updated near-infrared spectrum data includes: For each wavelength position, determining the ratio between the adjusted integration time and the original integration time, and obtaining a ratio array K corresponding to each wavelength position; Multiplying the near infrared spectrum data corresponding to each pixel point by the ratio array K to obtain the updated near infrared spectrum data; Wherein, the obtaining of the mapping relationship between the wavelength position and the integration time includes: For each wavelength position, the integration time at the current spectral responsivity is adjusted to collect reference near-infrared soybean spectra at different integration times and spectral responsivities corresponding to the same wavelength position; Obtain the signal-to-noise ratio of each reference near-infrared soybean spectrum; Obtaining the integration time corresponding to the reference near-infrared soybean spectrum whose signal-to-noise ratio meets the preset requirements; A mapping relationship between the integration time and the current spectral responsivity is established.
2. The method according to claim 1, characterized in that: The step of determining, for each pixel point of the near-infrared spectrum data, the integration time corresponding to each wavelength position based on the mapping relationship comprises: For each pixel point of the near-infrared spectral data, at least an integration time corresponding to a specified wavelength position is determined based on the mapping relationship, wherein the specified wavelength position refers to a position within a preset wavelength range, and the signal-to-noise ratio of the spectral data within the preset wavelength range does not meet a preset signal-to-noise ratio requirement.
3. The method according to claim 1, characterized in that Before determining the integration time corresponding to each wavelength position for each pixel point of the near-infrared spectrum data based on the mapping relationship, the method further includes: The near infrared spectrum data in the pixel domain is interpolated to obtain the near infrared spectrum data in the wavelength domain, so as to determine the integration time corresponding to each wavelength position in a continuous wavelength range.
4. A device for improving the signal-to-noise ratio of near-infrared soybean spectrum, characterized in that: The device comprises: A relationship acquisition module, used to acquire a mapping relationship between a wavelength position and an integration time; wherein, for each wavelength position, the mapping relationship indicates that the integration time is negatively correlated with the spectral responsivity corresponding to the wavelength position; A spectrum acquisition module is used to obtain near-infrared spectrum data of soybeans; A time determination module, used for determining, for each pixel point of the near-infrared spectrum data, the integration time corresponding to each wavelength position based on the mapping relationship; A spectrum adjustment module, used for updating the near infrared spectrum data according to the adjusted integration time to obtain updated near infrared spectrum data, so as to analyze the soybean based on the updated near infrared spectrum data; Wherein, the spectrum adjustment module is used to: Get the original integration time of each pixel; For each wavelength position, determining an adjusted integration time corresponding to the wavelength position based on the mapping relationship; Adjusting the original integration time at the wavelength position of each pixel point to the adjusted integration time to obtain the updated near-infrared spectrum data; The step of adjusting the original integration time at the wavelength position of each pixel point to the adjusted integration time to obtain the updated near-infrared spectrum data includes: For each wavelength position, determining the ratio between the adjusted integration time and the original integration time, and obtaining a ratio array K corresponding to each wavelength position; Multiplying the near infrared spectrum data corresponding to each pixel point by the ratio array K to obtain the updated near infrared spectrum data; Wherein, the obtaining of the mapping relationship between the wavelength position and the integration time includes: For each wavelength position, the integration time at the current spectral responsivity is adjusted to collect reference near-infrared soybean spectra at different integration times and spectral responsivities corresponding to the same wavelength position; Obtain the signal-to-noise ratio of each reference near-infrared soybean spectrum; Obtaining the integration time corresponding to the reference near-infrared soybean spectrum whose signal-to-noise ratio meets the preset requirements; A mapping relationship between the integration time and the current spectral responsivity is established.
5. The device according to claim 4, characterized in that The time determination module is used to: For each pixel point of the near-infrared spectral data, at least an integration time corresponding to a specified wavelength position is determined based on the mapping relationship, wherein the specified wavelength position refers to a position within a preset wavelength range, and the signal-to-noise ratio of the spectral data within the preset wavelength range does not meet a preset signal-to-noise ratio requirement.
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