Spectral Radiance Meter Field of View Measurement Method and System

Abstract

The present invention provides a method and system for measuring the field of view of a spectral radiance meter. The method includes: using a calibration baffle and a radiation source to determine the calibration distance corresponding to the spectral radiance meter to be measured; using a first target baffle and a second target baffle to determine the field of view region range of the spectral radiance meter to be measured; when it is determined that the field of view region range of the spectral radiance meter to be measured includes the internal region of a first bottomless elliptical cone, using a plurality of first baffles corresponding to the first target baffle to obtain the first target minor axis length corresponding to the spectral radiance meter to be measured; and based on the first target minor axis length, the calibration distance, the radius of the circular light outlet, and the radius of the circular hole, obtaining the apex angle of the first bottomless elliptical cone in the major axis direction and the apex angle in the minor axis direction. The method and system for measuring the field of view of the spectral radiance meter provided by the present invention can accurately measure the true field of view region of the spectral radiance meter, and have high measurement efficiency.

Description

Technical Field

[0001] The present invention relates to the field of optical technology, and in particular to a method and system for measuring the field of view of a spectral radiometer. Background Art

[0002] The field of view of a spectroradiometer is a key parameter of the spectroradiometer. The field of view of a spectroradiometer determines the spatial range that the spectroradiometer can measure. Ideally, the ideal field of view of a spectroradiometer should be a conical area with the spectroradiometer as the vertex. Ideally, the ideal field of view angle of a spectroradiometer is the vertex angle of the above conical area.

[0003] However, in real application scenarios, the spectroradiometer is affected by many factors, resulting in the real field of view of the spectroradiometer being usually an elliptical cone-shaped area with the spectroradiometer as the vertex, and the real field of view of the spectroradiometer in different directions is not the same in real application scenarios. The field of view provided in the factory information of the spectroradiometer in the related art is usually the ideal field of view of the spectroradiometer under ideal conditions, resulting in large errors in measurement and calculation based on the field of view provided in the factory information of the spectroradiometer.

[0004] In addition, since the design schemes and manufacturing processes of spectral radiometers manufactured by different manufacturers are different, even if the field of view angles provided in the factory information are the same, the actual fields of view of spectral radiometers manufactured by different manufacturers may vary greatly, which in turn leads to large differences in measurement results when using spectral radiometers manufactured by different manufacturers for measurement.

[0005] Therefore, how to accurately measure the true field of view of the spectroradiometer is a technical problem that needs to be solved urgently in this field. Summary of the invention

[0006] The present invention provides a method and system for measuring the field of view of a spectral radiometer, which are used to solve the defect that it is difficult to accurately obtain the real field of view of the spectral radiometer in the prior art, and to accurately measure the real field of view of the spectral radiometer.

[0007] The present invention provides a method for measuring the field of view of a spectral radiance meter, including: using a calibration baffle and a radiation source to determine the calibration distance corresponding to the spectral radiance meter to be measured, wherein a circular hole is provided on the calibration baffle, and the diameter of the circular hole is smaller than the diameter of the circular light exit of the radiation source; using a first target baffle and a second target baffle to determine the field of view area range of the spectral radiance meter to be measured, wherein a first elliptical hole is provided on the first target baffle, and a second elliptical hole is provided on the second target baffle, the minor axis and major axis of the first elliptical hole and the second elliptical hole are equal, the major axis of the first elliptical hole is in the horizontal direction, and the major axis of the second elliptical hole is in the vertical direction; when it is determined that the field of view area range of the spectral radiance meter to be measured includes the internal area of a first bottomless elliptical cone, using a plurality of first baffles corresponding to the first target baffle to obtain the first target minor axis length corresponding to the spectral radiance meter to be measured, the starting point of the first bottomless elliptical cone is the center of the light entrance of the spectral radiance meter to be measured, the projection of the first bottomless elliptical cone on a first reference plane is an ellipse with the major axis in the horizontal direction, and the first reference plane is perpendicular to the central axis of the first bottomless elliptical cone; based on the first target minor axis length, the calibration distance, the radius of the circular light exit, and the radius of the circular hole, obtain the apex angle of the first bottomless elliptical cone in the major axis direction and the apex angle in the minor axis direction, an elliptical hole is provided on any one of the first baffles, the major axis of the elliptical hole on any one of the first baffles is in the horizontal direction and the minor axis is in the vertical direction, each of the first baffles is arranged in the order of decreasing minor axis length of the elliptical hole, and the difference between the minor axis lengths of the elliptical holes on any two adjacent first baffles in the arrangement sequence of the first baffles is a preset value.

[0008] The present invention also provides a spectral radiance meter field of view measurement system for implementing the spectral radiance meter field of view measurement method as described above, which is characterized by comprising: a radiation source, a calibration baffle, a first target baffle, a second target baffle, a plurality of first baffles corresponding to the first target baffle, and a plurality of second baffles corresponding to the second target baffle; a circular hole is provided on the calibration baffle, and the diameter of the circular hole is smaller than the diameter of the light exit of the radiation source; a first elliptical hole is provided on the first target baffle, a second elliptical hole is provided on the second target baffle, the major axis and minor axis of the first elliptical hole and the second elliptical hole are equal, the major axis of the first elliptical hole is in the horizontal direction, and the major axis of the second elliptical hole is in the vertical direction; an elliptical hole is provided on any one of the first baffles, the major axis of the elliptical hole on any one of the first baffles is in the horizontal direction and the minor axis is in the vertical direction, and the first baffles are arranged in the order of decreasing minor axis length of the elliptical hole, and the difference in the minor axis length of the elliptical holes on any two adjacent first baffles in the arrangement sequence of the first baffles is a preset value; an elliptical hole is provided on any one of the second baffles, the major axis of the elliptical hole on any one of the second baffles is in the vertical direction and the minor axis is in the horizontal direction, and the second baffles are arranged in the order of decreasing minor axis length of the elliptical hole, and the difference in the minor axis length of the elliptical holes on any two adjacent second baffles in the arrangement sequence of the second baffles is the preset value.

[0009] The spectral radiance meter field of view measurement method and system provided by the present invention determine the calibration distance corresponding to the spectral radiance meter to be measured by using the calibration baffle and the radiation source, determine the field of view area range of the spectral radiance meter to be measured by using the first target baffle and the second target baffle. When it is determined that the field of view area range of the spectral radiance meter to be measured includes the internal area of the first bottomless elliptical cone, a plurality of first baffles corresponding to the first target baffle are used to obtain the first target minor axis length corresponding to the spectral radiance meter to be measured. Then, based on the first target minor axis length, the calibration distance, the target distance between the target position and the circular light exit, the radius of the circular light exit, and the radius of the circular hole, the apex angle in the major axis direction and the apex angle in the minor axis direction of the first bottomless elliptical cone are obtained. Considering the case where the true field of view area of the spectral radiance meter in the actual application scenario is a bottomless elliptical cone, baffles with elliptical holes of different minor axis to major axis ratios are designed. By changing the distance between the spectral radiance meter to be measured and the baffle and switching the baffles with elliptical holes of different minor axis to major axis ratios, the true field of view area of the spectral radiance meter can be accurately measured. The operation of measuring the true field of view area of the spectral radiance meter is simple and the measurement efficiency is high. Description of the Drawings

[0010] To more clearly illustrate the technical solutions in the present invention or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0011] Figure 1 It is a schematic diagram of the ideal field of view of a spectral radiance meter in an ideal state.

[0012] Figure 2 It is a schematic flowchart of the method for measuring the field of view of the spectral radiance meter provided by the present invention.

[0013] Figure 3 It is one of the schematic diagrams of the positions of the calibration baffle, the radiation source and the spectral radiance meter to be measured in the method for measuring the field of view of the spectral radiance meter provided by the present invention.

[0014] Figure 4 It is another schematic diagram of the positions of the calibration baffle, the radiation source and the spectral radiance meter to be measured in the method for measuring the field of view of the spectral radiance meter provided by the present invention.

[0015] Figure 5 It is a front view of the first target baffle in the method for measuring the field of view of the spectral radiance meter provided by the present invention.

[0016] Figure 6 It is a front view of the second target baffle in the method for measuring the field of view of the spectral radiance meter provided by the present invention.

[0017] Figure 7 It is one of the schematic diagrams of the positions of the first target baffle, the radiation source and the spectral radiance meter to be measured in the method for measuring the field of view of the spectral radiance meter provided by the present invention.

[0018] Figure 8 It is another schematic diagram of the positions of the first target baffle, the radiation source and the spectral radiance meter to be measured in the method for measuring the field of view of the spectral radiance meter provided by the present invention.

[0019] Figure 9 It is a schematic diagram of a bottomless elliptical cone in the method for measuring the field of view of the spectral radiance meter provided by the present invention.

[0020] Figure 10 It is a schematic diagram of the structure of the electronic device provided by the present invention. Detailed implementation manners

[0021] To make the objectives, technical solutions and advantages of the present invention clearer, the technical solutions in the present invention will be clearly and completely described below with reference to the accompanying drawings in the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments in the present invention without creative efforts shall fall within the protection scope of the present invention.

[0022] In the description of this application, the terms "first", "second", etc. are used to distinguish similar objects, rather than to describe a specific order or sequence. It should be understood that such data can be interchanged under appropriate circumstances so that the embodiments of this application can be implemented in an order different from those illustrated or described herein, and the objects distinguished by "first", "second", etc. are generally of the same category, and the number of objects is not limited. For example, the first object can be one or multiple. In addition, in the description of this application, "and / or" means at least one of the connected objects, and the character " / " generally means that the associated objects before and after are in an "or" relationship.

[0023] It should be noted that a spectral radiance meter is an optical measurement device that can be used to measure the spectral radiance radiated by an object. Spectral radiance meters are widely used in many fields such as astronomy, materials science, spectral analysis, environmental monitoring, and industrial production.

[0024] Figure 1 is a schematic diagram of the ideal field of view of a spectral radiance meter in an ideal state. As Figure 1 shown, in an ideal state, the ideal field of view of a spectral radiance meter should be a conical region with the spectral radiance meter as the vertex, and the ideal field of view angle θ of the spectral radiance is the apex angle of the above conical region.

[0025] For a reference plane perpendicular to the central axis of the above conical region, if the distance between the above reference plane and the diameter of the spectral radiance meter is L, then the cross-section of the ideal field of view of the spectral radiance meter in the above reference plane is a circle with point O as the center and L×tg(θ) as the radius, where point O is the intersection of the central axis of the ideal field of view of the spectral radiance meter and the above reference plane.

[0026] If a uniform radiation source is set at point O, and a variable aperture is set in front of the light exit of the above uniform radiation source, then when the above variable aperture becomes smaller from large to less than L×tg(θ), the signal collected by the spectral radiance meter will become smaller. Therefore, the ideal field of view angle of the spectral radiance meter can be calculated according to the radius of the variable aperture when the signal collected by the spectral radiance meter becomes smaller.

[0027] However, for the spectral radiance meters commonly used in the related art, the above-mentioned spectral radiance meter generally includes multiple components such as a light input port, a concave mirror, a reflection grating, and an array detector.

[0028] The light input port of the above-mentioned spectral radiance meter is circular. After light enters the light input port of the above-mentioned spectral radiance meter, it is irradiated on the reflection grating through the concave mirror, and after the reflection grating diffracts the light, it is finally irradiated on the array detector.

[0029] Different from the single-point detector, the array detector in the above-mentioned spectral radiance meter may be 256 pixels, 512 pixels, 1024 pixels, or 2048 pixels, etc. If the acquisition wavelength of the above-mentioned spectral radiance meter is 300nm - 1100nm, then the array detector in the above-mentioned spectral radiance meter is 1024 pixels. If the first pixel corresponds to 300nm, then the nth pixel approximately corresponds to [300 + 800(n - 1) / 1023]nm.

[0030] Under normal circumstances, the size of the array detector is at the centimeter level, so the internal size of the above-mentioned spectral radiance meter is also only at the 10 - centimeter level. Obviously, the optical path corresponding to each pixel of the array detector in the above-mentioned spectral radiance meter is difficult to present an ideal circular symmetry.

[0031] At the same time, if the size of the concave mirror or grating inside the above-mentioned spectral radiance meter is not square or circular, the true field of view of the spectral radiance meter is more likely to be distorted.

[0032] In fact, in the real application scenario, the true field of view of the spectral radiance meter is usually an endless elliptical cone with the light input port of the spectral radiance meter as the vertex. In the real application scenario, the true field of view angles of the spectral radiance meter in different directions are not the same.

[0033] The field of view angle provided in the factory information of the spectral radiance meter in the related art is usually the ideal field of view angle of the spectral radiance meter in the ideal state, resulting in a large error in the measurement and calculation based on the field of view angle provided in the factory information of the spectral radiance meter.

[0034] Moreover, since the design schemes, manufacturing processes, etc. of the spectral radiance meters manufactured by different manufacturers are not the same, even if the field of view angles provided in the factory information are the same, the true fields of view of the spectral radiance meters manufactured by different manufacturers may vary greatly, and further, the measurement results obtained when using the spectral radiance meters manufactured by different manufacturers for measurement may vary greatly.

[0035] In related technologies, traditional measurement methods are usually used for optical instruments with a field of view being a bottomless cone. For example, the measurement method of a solar radiometer based on a laser light source can obtain a high-precision field of view angle of the solar radiometer. However, for a spectral radiance meter with a true field of view being a bottomless elliptical cone, it is difficult to accurately obtain the true field of view of the spectral radiance meter in related technologies.

[0036] The following will describe the field of view measurement method and system of the spectral radiance meter of the present invention in conjunction with Figures 2 - 9 Describe the field of view measurement method and system of the spectral radiance meter of the present invention.

[0037] Figure 2 is a schematic flowchart of the field of view measurement method of the spectral radiance meter provided by the present invention. As Figure 2 shown, the method includes the following: Step 201, use a calibration baffle and a radiation source to determine the calibration distance corresponding to the spectral radiance meter to be measured.

[0038] Among them, a circular hole is provided on the calibration baffle, and the diameter of the circular hole is smaller than the diameter of the light outlet of the radiation source.

[0039] Specifically, the spectral radiance meter to be measured is the measurement object of the field of view measurement method of the spectral radiance meter provided by the present invention. Based on the field of view measurement method of the spectral radiance meter provided by the present invention, the field of view area of the spectral radiance meter to be measured can be measured, so as to determine the field of view area of the spectral radiance meter to be measured.

[0040] It should be noted that the spectral radiance meter to be measured in the embodiments of the present invention can be a common spectral radiance meter in related technologies. For example, the spectral radiance meter to be measured can be a portable spectral radiance meter in related technologies. The spectral radiance meter to be measured in the embodiments of the present invention can be determined according to actual needs, and the spectral radiance meter to be measured in the embodiments of the present invention is not specifically limited.

[0041] It should be noted that the radiation source in the embodiments of the present invention is a light source with high uniformity, and the above radiation source can emit light with high uniformity through a circular light outlet.

[0042] Optionally, the radiation source in the embodiments of the present invention can be an integrating sphere light source.

[0043] It should be noted that the surface of the calibration baffle in the embodiments of the present invention has been blackened to prevent the light reflected from the surface of the calibration baffle from entering the light inlet of the spectral radiance meter to be measured. After the surface of the calibration baffle is blackened, the light entering the light inlet of the spectral radiance meter to be measured through the reflection of the surface of the calibration baffle can be ignored.

[0044] In the embodiment of the present invention, by using a calibration baffle and a radiation source, based on the optical characteristics of the spectral radiance meter to be measured, the calibration distance corresponding to the spectral radiance meter to be measured can be determined by changing the relative distances between the spectral radiance meter to be measured and the calibration baffle and the radiation source.

[0045] Figure 3 It is one of the schematic diagrams of the positions of the calibration baffle, the radiation source and the spectral radiance meter to be measured in the method for measuring the field of view of the spectral radiance meter provided by the present invention. As Figure 3 shown, to determine the calibration distance corresponding to the spectral radiance meter to be measured by using the calibration baffle and the radiation source, the following steps are included: The calibration baffle 302 and the spectral radiance meter 301 to be measured are arranged in sequence along the extension direction of the target light output optical path. The target light output optical path is the light output optical path in the light output optical path of the radiation source 303 that coincides with the central axis of the circular light output port 304 of the radiation source 303. The calibration baffle 302, the circular light output port 304 and the light input port 305 of the spectral radiance meter 301 to be measured are parallel to each other. The target light output optical path passes through the center of the circular hole 306 and the center of the light input port 305. The target position of the center of the circular hole 306 on the target light output optical path and the position of the center of the light input port 305 on the target light output optical path are predefined.

[0046] Specifically, in the embodiment of the present invention, the radius of the light output port can be represented by R, and the radius of the circular hole 306 can be represented by r. As Figure 3 shown, the diameter 2R of the light output port is greater than the diameter 2r of the circular hole 306.

[0047] It should be noted that in the embodiment of the present invention, the radius r of the circular hole 306 can be calculated based on the field of view angle recorded in the factory information of the spectral radiance meter 301 to be measured.

[0048] It should be noted that in the embodiment of the present invention, the position of the center of the circular hole 306 on the target light output optical path is determined as the target position. The target position and the position of the center of the light input port 305 on the target light output optical path in the embodiment of the present invention are predefined based on prior knowledge and / or actual situations.

[0049] In the embodiment of the present invention, the distance between the target position and the center of the light output hole is determined as the target distance. In the embodiment of the present invention, the target distance can be represented by d, the distance between the center of the light input port 305 and the center of the circular light output port 304 can be represented by d1, and the distance between the center of the light input port 305 and the target position can be represented by d2.

[0050] In the embodiment of the present invention, the radiance of the circular light output hole is represented by L, and the area of the projection of the field of view area of the spectral radiance meter 301 to be measured on the plane where the circular light output port 304 is located is represented by A1. Then, the light radiation value S received by the spectral radiance meter 301 to be measured can be calculated based on formula (1):

[0051]

[0052] As Figure 3 shown, when the projection of the field of view area of the spectral radiance meter 301 to be measured on the plane where the circular light outlet 304 is located does not exceed the circular light outlet 304, the area A1 of the projection of the field of view area of the spectral radiance meter 301 to be measured on the plane where the circular light outlet 304 is located follows the inverse square law of distance. Therefore, the ratio of A1 to the square of d1 is a constant, and the light radiation value S received by the spectral radiance meter 301 to be measured is only related to the radiance L of the circular light outlet.

[0053] In the embodiment of the present invention, the radiance L of the circular light outlet is a fixed value. Therefore, when the projection of the field of view area of the spectral radiance meter 301 to be measured on the plane where the circular light outlet 304 is located does not exceed the circular light outlet 304, the light radiation value S received by the spectral radiance meter 301 to be measured is also a fixed value.

[0054] Move the spectral radiance meter 301 to be measured along the extension direction of the target light output optical path, away from the radiation source 303, and obtain the real-time light radiation value received by the spectral radiance meter 301 during the movement.

[0055] When the real-time light radiation value starts to decrease from the fixed value at the current moment, stop moving the spectral radiance meter 301 to be measured.

[0056] Move the spectral radiance meter 301 to be measured to the historical position at the previous moment of the current moment, and obtain the distance between the center of the light inlet 305 and the center of the circular light outlet 304 at the previous moment as the calibration distance.

[0057] As the distance d2 between the center of the light inlet 305 and the target position gradually increases, the area A1 of the projection of the field of view area of the spectral radiance meter 301 to be measured on the plane where the circular light outlet 304 is located also gradually increases. However, as long as the projection of the field of view area of the spectral radiance meter 301 to be measured on the plane where the circular light outlet 304 is located does not exceed the circular light outlet 304, the light radiation value S received by the spectral radiance meter 301 to be measured is a fixed value.

[0058] If the projection of the field of view area of the spectral radiance meter 301 to be measured on the plane where the circular light outlet 304 is located exceeds the circular light outlet 304, due to the occlusion of the calibration baffle 302, the light radiation value S received by the spectral radiance meter 301 to be measured will decrease significantly.

[0059] Therefore, during the process of the spectral radiance meter 301 to be measured moving away from the radiation source 303 along the extension direction of the target light output optical path, if the real-time light radiation value received by the spectral radiance meter 301 to be measured at the current moment is less than the real-time light radiation value received by the spectral radiance meter 301 to be measured at the previous moment, and the real-time light radiation values received by the spectral radiance meter 301 to be measured at each historical moment are all fixed values, it can be determined that the projection of the field of view area of the spectral radiance meter 301 to be measured at the current moment on the plane where the circular light output port 304 is located exceeds the circular light output port 304. Furthermore, it can be determined that the projection of the field of view area of the spectral radiance meter 301 to be measured at the previous moment of the current moment on the plane where the circular light output port 304 is located is tangent to the boundary of the circular light output port 304.

[0060] It can be understood that in the case where it is determined that the projection of the field of view area of the spectral radiance meter 301 to be measured at the previous moment of the current moment on the plane where the circular light output port 304 is located is tangent to the boundary of the circular light output port 304, it can be determined that the maximum radius of the projection of the field of view area of the spectral radiance meter 301 to be measured at the previous moment on the plane where the circular hole 306 is located is the diameter 2r of the circular hole 306, and the maximum radius of the projection of the field of view area of the spectral radiance meter 301 to be measured at the previous moment on the plane where the circular light output port 304 is located is the diameter 2R of the light output port.

[0061] That is, if the projection of the field of view area of the spectral radiance meter 301 to be measured at the previous moment on the plane where the circular hole 306 is located is an ellipse, the major axis length of the elliptical projection of the field of view area of the spectral radiance meter 301 to be measured at the previous moment on the plane where the circular hole 306 is located is 2r, and the major axis length of the elliptical projection of the field of view area of the spectral radiance meter 301 to be measured at the previous moment on the plane where the light output port is located is 2R; if the projection of the field of view area of the spectral radiance meter 301 to be measured at the previous moment on the plane where the circular hole 306 is located is a circle, the radius of the circular projection of the field of view area of the spectral radiance meter 301 to be measured at the previous moment on the plane where the circular hole 306 is located is r, and the radius of the circular projection of the field of view area of the spectral radiance meter 301 to be measured at the previous moment on the plane where the circular light output port 304 is located is R.

[0062] After stopping moving the spectral radiance meter 301 to be measured, the spectral radiance meter 301 to be measured can be moved to the historical position at the previous moment of the current moment, and the distance d2 between the center of the light input port 305 and the center of the circular light output port 304 at the previous moment can be obtained as the calibration distance d0.

[0063] Figure 4It is the second schematic diagram of the positions of the calibration baffle, the radiation source, and the spectral radiance meter to be measured in the spectral radiance meter field of view measurement method provided by the present invention. When the real-time light radiation value received by the spectral radiance meter 301 to be measured at the current moment is less than the real-time light radiation value received by the spectral radiance meter 301 to be measured at the previous moment, and the real-time light radiation values received by the spectral radiance meter 301 to be measured at each historical moment are all fixed values, the historical position where the spectral radiance meter 301 to be measured was located at the previous moment of the current moment and the calibration distance d0 are as Figure 4 shown.

[0064] The calibration distance d0 can be described by formula (2):

[0065]

[0066] Step 202: Use the first target baffle and the second target baffle to determine the field of view area range of the spectral radiance meter 301 to be measured.

[0067] Figure 5 It is the front view of the first target baffle in the spectral radiance meter field of view measurement method provided by the present invention. Figure 6 It is the front view of the second target baffle in the spectral radiance meter field of view measurement method provided by the present invention. As Figure 5 and Figure 6 shown, a first elliptical hole 502 is provided on the first target baffle 501, a second elliptical hole 602 is provided on the second target baffle 601. The minor axes of the first elliptical hole 502 and the second elliptical hole 602 are equal. The major axis lengths of the first elliptical hole 502 and the second elliptical hole 602 are both equal to the diameter of the circular hole 306. The major axis of the first elliptical hole 502 is in the horizontal direction, and the major axis of the second elliptical hole 602 is in the vertical direction.

[0068] It should be noted that in the embodiments of the present invention, the major axis lengths of the first elliptical hole 502 and the second elliptical hole 602 are equal to the diameter 2r of the circular hole 306.

[0069] Specifically, in the embodiments of the present invention, the minor axis length of the first elliptical hole 502 and the second elliptical hole 602 can be represented by 2b, and the major axis length of the first elliptical hole 502 and the second elliptical hole 602 can be represented by 2r.

[0070] In the embodiments of the present invention, by using the first target baffle 501 and the second target baffle 601, the field of view area range of the spectral radiance meter 301 to be measured can be determined based on the optical characteristics of the spectral radiance meter 301 to be measured.

[0071] It should be noted that the surfaces of the first target baffle 501 and the second target baffle 601 in the embodiments of the present invention have been blackened to prevent the light reflected from the surfaces of the first target baffle 501 and the second target baffle 601 from entering the light inlet 305 of the spectral radiance meter 301 to be measured. After the surfaces of the first target baffle 501 and the second target baffle 601 are blackened, the light entering the light inlet 305 of the spectral radiance meter 301 to be measured by reflection from the surfaces of the first target baffle 501 and the second target baffle 601 can be ignored.

[0072] As an optional embodiment, the first target baffle 501 and the second target baffle 601 are used to determine the field of view range of the spectral radiance meter 301 to be measured, including: removing the calibration baffle 302 from the target optical path.

[0073] The first target baffle 501 and the second target baffle 601 are respectively arranged at the target positions, and the first light radiation value received by the spectral radiance meter 301 to be measured through the first elliptical hole 502 and the second light radiation value received by the spectral radiance meter to be measured through the second elliptical hole 602 are respectively obtained. When the first target baffle 501 is arranged at the target position, the first target baffle 501 is parallel to the circular light outlet 304 and the light inlet 305, and the target light outlet optical path passes through the center of the first elliptical hole 502. When the second target baffle 601 is arranged at the target position, the second target baffle 601 is parallel to the circular light outlet 304 and the light inlet 305, and the target light outlet optical path passes through the center of the second elliptical hole 602.

[0074] Compare the first light radiation value and the second light radiation value.

[0075] When the first light radiation value is greater than the second light radiation value, it is determined that the field of view range of the spectral radiance meter 301 to be measured includes the internal area of the first bottomless elliptical cone. When the first light radiation value is less than the second light radiation value, it is determined that the field of view range of the spectral radiance meter 301 to be measured includes the internal area of the second bottomless elliptical cone.

[0076] Wherein, the starting point of the first bottomless elliptical cone is the center of the light inlet 305, the projection of the first bottomless elliptical cone on the first reference plane is an ellipse with the major axis in the horizontal direction, and the first reference plane is perpendicular to the central axis of the first bottomless elliptical cone.

[0077] The starting point of the second bottomless elliptical cone is the center of the light inlet 305, the projection of the second bottomless elliptical cone on the second reference plane is an ellipse with the major axis in the vertical direction, and the second reference plane is perpendicular to the central axis of the second bottomless elliptical cone.

[0078] Figure 7It is one of the schematic diagrams of the positions of the first target baffle, the radiation source, and the spectral radiance meter to be measured in the method for measuring the field of view of the spectral radiance meter provided by the present invention. When the first target baffle 501 is set at the target position, the positional relationship among the first target baffle 501, the radiation source 303, and the spectral radiance meter 301 to be measured is as Figure 7 shown.

[0079] Figure 8 It is another schematic diagram of the positions of the first target baffle, the radiation source, and the spectral radiance meter to be measured in the method for measuring the field of view of the spectral radiance meter provided by the present invention. When the second target baffle 601 is set at the target position, the positional relationship among the second target baffle 601, the radiation source 303, and the spectral radiance meter 301 to be measured is as Figure 8 shown.

[0080] Figure 9 It is a schematic diagram of a bottomless elliptical cone in the method for measuring the field of view of the spectral radiance meter provided by the present invention. As Figure 9 shown, the bottomless elliptical cone in the embodiment of the present invention is similar to an elliptical cone, but the above-mentioned bottomless elliptical cone has no bottom surface, and the side surface of the above-mentioned bottomless elliptical cone diverges in a direction away from the vertex along the central axis of the bottomless elliptical cone. Any cross-section of the above-mentioned bottomless elliptical cone is elliptical, and the ratio of the minor axis to the major axis of any two elliptical cross-sections of the above-mentioned bottomless elliptical cone is equal. The side surface of the above-mentioned bottomless elliptical cone passes through the boundary of any elliptical cross-section.

[0081] It should be noted that in the design process of the spectral radiance meter in the related art, the shapes of the lens, concave mirror, and plane mirror in the incident optical system of the spectral radiance meter are usually circular or rectangular, while the grating and array detector in the spectral radiance meter are both rectangular. The circular optical components are centrosymmetric and installed vertically; when installing the rectangular mirror, grating, and array detector, the sides of the rectangle are respectively along the vertical and horizontal directions. Therefore, the shape of the field of view area of the spectral radiance meter in the related art is usually the above-mentioned first bottomless elliptical cone and the above-mentioned second bottomless elliptical cone.

[0082] Based on the content of the above embodiment, when a calibration baffle 302 is set at the target position and the distance between the center of the light incident port 305 of the spectral radiance meter 301 to be measured and the center of the circular hole 306 in the calibration baffle 302 is the calibration distance d0, if the projection of the field of view area of the spectral radiance meter 301 to be measured at the previous moment on the plane of the circular hole 306 is elliptical, then the major axis length of the elliptical projection of the field of view area of the spectral radiance meter 301 to be measured at the previous moment on the plane of the circular hole 306 is 2r, and the major axis length of the elliptical projection of the field of view area of the spectral radiance meter 301 to be measured at the previous moment on the plane of the light exit port is 2R.

[0083] Therefore, when it is determined that the field of view area of the spectral radiance meter 301 to be measured includes the inner area of the first bottomless elliptical cone, it can be determined that the projection of the field of view area of the spectral radiance meter 301 to be measured on the plane where the circular light outlet 304 is located is an ellipse, and the major axis of the above elliptical projection is in the horizontal direction, the minor axis of the above elliptical projection is in the vertical direction, and the length of the major axis of the above elliptical projection is equal to the diameter 2R of the circular light outlet 304.

[0084] When it is determined that the field of view area of the spectral radiance meter 301 to be measured includes the inner area of the second bottomless elliptical cone, it can be determined that the projection of the field of view area of the spectral radiance meter 301 to be measured on the plane where the circular light outlet 304 is located is an ellipse, and the major axis of the above elliptical projection is in the vertical direction, the minor axis of the above elliptical projection is in the horizontal direction, and the length of the major axis of the above elliptical projection is equal to the diameter 2R of the circular light outlet 304.

[0085] As an optional embodiment, after comparing the first light radiation value and the second light radiation value, the method further includes: when the first light radiation value is equal to the second light radiation value, determining the inner area of the bottomless cone as the field of view area range of the spectral radiance meter 301 to be measured, the bottomless cone starts from the center of the light inlet 305, and the projection of the bottomless cone on the third reference plane is a circle, and the third reference plane is perpendicular to the central axis of the bottomless cone.

[0086] It can be understood that when it is determined that the field of view area of the spectral radiance meter 301 to be measured includes the inner area of the bottomless cone, it can be determined that the projection of the field of view area of the spectral radiance meter 301 to be measured on the plane where the circular light outlet 304 is located is a circle, and the radius of the above circular projection is equal to the radius r of the circular hole 306.

[0087] Step 203, when it is determined that the field of view area of the spectral radiance meter 301 to be measured includes the inner area of the first bottomless elliptical cone, use the multiple first baffles corresponding to the first target baffle 501 to obtain the first target minor axis length corresponding to the spectral radiance meter 301 to be measured.

[0088] Wherein, an elliptical hole is provided on any one of the first baffles, the major axis length of the elliptical hole on any one of the first baffles is the same as the major axis length of the first elliptical hole 502, the major axis of the elliptical hole on any one of the first baffles is in the horizontal direction and the minor axis is in the vertical direction, the first baffles are arranged in the order of decreasing minor axis length of the elliptical holes, and the difference between the minor axis lengths of the elliptical holes on any two adjacent first baffles in the arrangement sequence of the first baffles is a preset value.

[0089] Specifically, in the embodiments of the present invention, the first baffle corresponding to the first target baffle 501 can be identified by i, and k i represents the ratio of the short axis to the long axis of the elliptical hole on the i-th first baffle, and b i represents the short axis length of the elliptical hole on the i-th first baffle. Wherein, i is a positive integer greater than zero, and the short axis length b i of the elliptical hole on the i-th first baffle = r × k i .

[0090] The first baffles corresponding to the first target baffle 501 are arranged in descending order of the ratio of the short axis to the long axis to obtain the first baffle sequence corresponding to the first target baffle 501.

[0091] In the embodiments of the present invention, the ratio k i of the short axis to the long axis of the i-th first baffle i-1 and the ratio k i of the short axis to the long axis of the (i - 1)-th first baffle i-1 have a preset difference. Correspondingly, the short axis length b

[0092] of the i-th first baffle and the short axis length b i of the (i - 1)-th first baffle i-1 also have a preset difference

[0093] It should be noted that in the embodiments of the present invention, the ratio k1 of the short axis to the long axis of the first first baffle corresponding to the first target baffle 501 can be determined based on prior knowledge and / or actual conditions. For example, the ratio k1 of the short axis to the long axis of the first first baffle can be 0.95 or 0.90. The specific value of the ratio k1 of the short axis to the long axis of the first first baffle corresponding to the first target baffle 501 in the embodiments of the present invention is not limited.

[0094] In the embodiments of the present invention, by using multiple first baffles corresponding to the first target baffle 501, the short axis length of the elliptical hole on the baffle at the target position can be gradually reduced while the long axis direction, short axis direction, and long axis length remain unchanged, so as to utilize the optical characteristics of the spectral radiance meter 301 to be measured to obtain the first target short axis length corresponding to the spectral radiance meter 301 to be measured.

[0095] It should be noted that the first baffle corresponding to the first target baffle 501 in the embodiments of the present invention has been blackened to prevent the light reflected from the surface of the first baffle from entering the light inlet 305 of the spectral radiance meter 301 to be measured. After the surface of the first baffle is blackened, the light entering the light inlet 305 of the spectral radiance meter 301 to be measured by reflection from the surface of the first baffle can be ignored.

[0096] As an optional embodiment, when it is determined that the field of view area range of the spectral radiance meter 301 to be measured includes the inner area of the first bottomless elliptical cone, the first target short axis length corresponding to the spectral radiance meter 301 to be measured is obtained by using a plurality of first baffles corresponding to the first target baffle 501, including: removing the first target baffle 501 or the second target baffle 601.

[0097] According to the arrangement order of each first baffle, the first baffle is sequentially set at the target position, and the current light radiation value received by the spectral radiance meter 301 to be measured through the elliptical hole on the first baffle currently set at the target position is sequentially obtained until the current light radiation value received by the spectral radiance meter 301 to be measured through the elliptical hole on the first baffle currently set at the target position is less than the historical light radiation value received by the spectral radiance meter 301 to be measured through the elliptical hole on the first baffle set at the target position last time, and the historical light radiation values received by the spectral radiance meter 301 to be measured through the elliptical holes on the first baffles set at the target position in history are the same, the short axis length of the elliptical hole on the first baffle set at the target position last time is determined as the first target short axis length.

[0098] Specifically, after removing the first target baffle 501 or the second target baffle 601, the first first baffle corresponding to the first target baffle 501 can be set at the target position, and the light radiation value S1 received by the spectral radiance meter 301 to be measured through the elliptical hole on the first first baffle is obtained.

[0099] After removing the first first baffle, the second first baffle corresponding to the first target baffle 501 can be set at the target position, and the light radiation value S2 received by the spectral radiance meter 301 to be measured through the elliptical hole on the second first baffle is obtained.

[0100] Similarly, after removing the (i - 1)th first baffle, the ith first baffle corresponding to the first target baffle 501 can be set at the target position, and the light radiation value S received by the spectral radiance meter 301 to be measured through the elliptical hole on the ith first baffle is obtained. i 。

[0101] By sequentially setting the first baffles at the target positions according to the arrangement order of the first baffles, the major axis length of the elliptical hole on the first baffle set at the target position remains unchanged, but the minor axis length gradually decreases.

[0102] It should be noted that when the first target baffle 501 is set at the target position, the major axis length of the elliptical projection of the field of view area of the spectral radiance meter 301 to be measured on the plane where the first baffle is located is 2r. For any first baffle, the major axis length of the elliptical hole on the first baffle is 2r, and the minor axis of the elliptical hole on the first baffle is less than 2r.

[0103] As the major axis length of the elliptical hole on the first baffle set at the target position remains unchanged but the minor axis length gradually decreases, the projected area of the field of view area of the spectral radiance meter 301 to be measured on the plane where the first baffle is located becomes smaller and smaller. When the minor axis length of the elliptical hole on the first baffle set at the target position is greater than or equal to the minor axis length of the elliptical projection of the field of view area of the spectral radiance meter 301 to be measured on the plane where the first baffle is located, the light radiation value received by the spectral radiance meter 301 to be measured through the elliptical hole on the first baffle is a fixed value. If the minor axis length of the elliptical hole on the first baffle set at the target position is less than the minor axis length of the elliptical projection of the field of view area of the spectral radiance meter 301 to be measured on the plane where the first baffle is located, the light radiation value received by the spectral radiance meter 301 to be measured through the elliptical hole on the first baffle starts to decrease from the fixed value.

[0104] Therefore, if the light radiation value S i is less than the light radiation value S i-1 , and the light radiation value S i-1 , the light radiation value S i-2 , …, the light radiation value S2 and the light radiation value S1 are all fixed values, then the minor axis length b i-1 of the elliptical hole on the (i - 1)-th first baffle can be determined as the first target minor axis length y corresponding to the spectral radiance meter 301 to be measured.

[0105] The first target minor axis length y corresponding to the spectral radiance meter 301 to be measured can be described by formula (3):

[0106] y = 2k i-1 r (3)

[0107] Step 204: Based on the first target minor axis length, the calibration distance, the radius of the circular light outlet 304, and the radius of the circular hole 306, obtain the apex angle in the major axis direction and the apex angle in the minor axis direction of the first bottomless elliptical cone.

[0108] Based on the content of the above embodiments, in the case where it is determined that the field of view area range of the spectral radiance meter 301 to be measured includes the internal area of the first bottomless elliptical cone, it can be determined that the projection of the field of view area of the spectral radiance meter 301 to be measured on the plane where the circular light outlet 304 is located is an ellipse, and the major axis of the above elliptical projection is in the horizontal direction, the minor axis of the above elliptical projection is in the vertical direction, and the length of the major axis of the above elliptical projection is equal to the diameter 2R of the circular light outlet 304.

[0109] Therefore, the diameter 2r of the circular hole 306 can be determined as the first target major axis length corresponding to the spectral radiance meter 301 to be measured.

[0110] Based on the radius R of the circular light outlet 304, the radius r of the circular hole 306, the target distance d between the target position and the circular light outlet 304, the first target minor axis length y, and the calibration distance d0, the apex angle FOV1 of the first bottomless elliptical cone in the major axis direction can be calculated by formula (4):

[0111] FOV1 = 2 × arctan(r / d0) = 2 × arctan[(R - r) / d] (4)

[0112] Based on the radius R of the circular light outlet 304, the radius r of the circular hole 306, the target distance d, the first target minor axis length y corresponding to the spectral radiance meter 301 to be measured, and the calibration distance d0, the apex angle FOV2 of the first bottomless elliptical cone in the minor axis direction can be calculated by formula (5) and formula (6)

[0113] FOV2 = 2 × arctan(k i-1 r / d0) = 2 × arctan[k i-1 (R - r) / d] (5)

[0114] k i-1 = y / 2r (6)

[0115] It should be noted that after calculating the apex angle of the first bottomless elliptical cone in the major axis direction, the apex angle of the first bottomless elliptical cone in the major axis direction can be determined as the field of view angle of the spectral radiance meter 301 to be measured in the horizontal direction. After calculating the apex angle of the first bottomless elliptical cone in the minor axis direction, the apex angle of the first bottomless elliptical cone in the minor axis direction can be determined as the field of view angle of the spectral radiance meter 301 to be measured in the vertical direction.

[0116] As an optional embodiment, after determining the field of view range of the spectral radiance meter 301 to be measured by using the first target baffle 501 and the second target baffle 601, the method further includes: when it is determined that the field of view range of the spectral radiance meter 301 to be measured includes the second bottomless elliptical cone, determining the second target minor axis length corresponding to the spectral radiance meter 301 to be measured by using a plurality of second baffles corresponding to the second target baffle 601.

[0117] Wherein, an elliptical hole is provided on any second baffle, the major axis length of the elliptical hole on any second baffle is the same as the major axis length of the second elliptical hole 602, the major axis of the elliptical hole on any second baffle is in the vertical direction and the minor axis is in the horizontal direction, and the second baffles are arranged in the order of decreasing minor axis length of the elliptical holes, and the difference between the minor axis lengths of the elliptical holes on any two adjacent second baffles in the arrangement sequence of the second baffles is a preset value.

[0118] Specifically, in the embodiments of the present invention, the second baffle corresponding to the second target baffle 601 can be identified by j, and k j represents the ratio of the minor axis to the major axis of the elliptical hole on the j-th second baffle, and b j represents the minor axis length of the elliptical hole on the j-th second baffle. Wherein, j is a positive integer greater than zero, and the minor axis length b j of the elliptical hole on the j-th second baffle = r×k j .

[0119] The second baffles corresponding to the second target baffle 601 are arranged in the order of decreasing ratio of the minor axis to the major axis to obtain the second baffle sequence corresponding to the second target baffle 601.

[0120] In the embodiments of the present invention, the difference between the ratio of the minor axis to the major axis k j of the j-th second baffle and the ratio of the minor axis to the major axis k j-1 of the (j - 1)-th second baffle is a preset value. Correspondingly, the difference between the minor axis length b j of the j-th second baffle and the minor axis length b j-1 of the (j - 1)-th second baffle is also a preset value

[0121] It should be noted that the above preset value in the embodiments of the present invention can be determined based on prior knowledge and / or actual conditions. For example, the above preset value can be 0.05, that is, k j -k j-1 = 0.05. The specific value of the above preset value in the embodiments of the present invention is not limited.

[0122] It should be noted that in the embodiments of the present invention, the ratio k1 of the short axis to the long axis of the first second baffle corresponding to the second target baffle 601 can be determined based on prior knowledge and / or actual conditions. For example, the ratio k1 of the short axis to the long axis of the first second baffle can be 0.95 or 0.90. The specific value of the ratio k1 of the short axis to the long axis of the first second baffle corresponding to the second target baffle 601 in the embodiments of the present invention is not limited.

[0123] In the embodiments of the present invention, by using a plurality of second baffles corresponding to the second target baffle 601, the short-axis length of the elliptical hole on the baffle disposed at the target position can be gradually reduced while the long-axis direction, short-axis direction, and long-axis length remain unchanged, so as to utilize the optical characteristics of the spectral radiance meter 301 to be measured to obtain the second target short-axis length corresponding to the spectral radiance meter 301 to be measured.

[0124] Based on the content of the above embodiments, when it is determined that the field-of-view range of the spectral radiance meter 301 to be measured includes the second bottomless elliptical cone, using a plurality of second baffles corresponding to the second target baffle 601 to determine the second target short-axis length corresponding to the spectral radiance meter 301 to be measured includes: removing the first target baffle 501 or the second target baffle 601.

[0125] According to the arrangement order of the second baffles in the arrangement sequence of the second baffles, the second baffles are sequentially disposed at the target position, and the current light radiation value received by the spectral radiance meter 301 to be measured through the elliptical hole on the second baffle currently disposed at the target position is sequentially obtained until the current light radiation value received by the spectral radiance meter 301 to be measured through the elliptical hole on the second baffle currently disposed at the target position is less than the historical light radiation value received by the spectral radiance meter 301 to be measured through the elliptical hole on the second baffle previously disposed at the target position, and when the historical light radiation values received by the spectral radiance meter 301 to be measured through the elliptical holes on the second baffles previously disposed at the target position are all the same, the short-axis length of the elliptical hole on the second baffle previously disposed at the target position is determined as the second target short-axis length.

[0126] Specifically, after removing the first target baffle 501 or the second target baffle 601, the first second baffle corresponding to the second target baffle 601 can be disposed at the target position, and the light radiation value S1 received by the spectral radiance meter 301 to be measured through the elliptical hole on the first second baffle is obtained.

[0127] After removing the first second baffle, the second second baffle corresponding to the second target baffle 601 can be disposed at the target position, and the light radiation value S2 received by the spectral radiance meter 301 to be measured through the elliptical hole on the second second baffle is obtained.

[0128] Similarly, after removing the (j - 1)-th second baffle, the j-th second baffle corresponding to the second target baffle 601 can be set at the target position, and the light radiation value S received by the spectral radiance meter 301 to be measured through the elliptical hole on the j-th second baffle can be obtained. j 。

[0129] By sequentially setting the second baffles at the target position according to the arrangement order of the second baffles, the major axis length of the elliptical hole on the second baffle set at the target position remains unchanged, but the minor axis length gradually decreases.

[0130] It should be noted that when the second target baffle 601 is set at the target position, the major axis length of the elliptical projection of the field of view area of the spectral radiance meter 301 to be measured on the plane where the second baffle is located is 2r. For any second baffle, the major axis length of the elliptical hole on the above second baffle is 2r, and the minor axis of the elliptical hole on the above second baffle is less than 2r.

[0131] As the major axis length of the elliptical hole on the second baffle set at the target position remains unchanged but the minor axis length gradually decreases, the projected area of the field of view area of the spectral radiance meter 301 to be measured on the plane where the second baffle is located becomes smaller and smaller. When the minor axis length of the elliptical hole on the second baffle set at the target position is greater than or equal to the minor axis length of the elliptical projection of the field of view area of the spectral radiance meter 301 to be measured on the plane where the above second baffle is located, the light radiation value received by the spectral radiance meter 301 to be measured through the elliptical hole on the above second baffle is a fixed value. If the minor axis length of the elliptical hole on the second baffle set at the target position is less than the minor axis length of the elliptical projection of the field of view area of the spectral radiance meter 301 to be measured on the plane where the above second baffle is located, the light radiation value received by the spectral radiance meter 301 to be measured through the elliptical hole on the above second baffle starts to decrease from the fixed value.

[0132] Therefore, if the light radiation value S j is less than the light radiation value S j-1 , and the light radiation values S j-1 , the light radiation value S j-2 , …, the light radiation value S2, and the light radiation value S1 are all fixed values, then the minor axis length b j-1 of the elliptical hole on the (j - 1)-th second baffle can be determined as the second target minor axis length corresponding to the spectral radiance meter 301 to be measured.

[0133] It should be noted that the second baffle corresponding to the second target baffle 601 in the embodiments of the present invention has been blackened to prevent the light reflected from the surface of the second baffle from entering the light inlet 305 of the spectral radiance meter 301 to be measured. After the surface of the second baffle is blackened, the light entering the light inlet 305 of the spectral radiance meter 301 through reflection on the surface of the second baffle can be ignored.

[0134] Based on the second target minor axis length, the calibration distance, the radius of the circular light outlet 304, and the radius of the circular hole 306, obtain the apex angle of the second bottomless elliptical cone in the major axis direction and the apex angle in the minor axis direction.

[0135] It should be noted that in the embodiments of the present invention, the radius R of the circular light outlet 304, the radius r of the circular hole 306, the target distance d between the target position and the circular light outlet 304, the second target minor axis length, and the calibration distance d0 can be used in formulas (4) to (6) to calculate the apex angle of the second bottomless elliptical cone in the major axis direction and the apex angle in the minor axis direction.

[0136] It should be noted that after calculating the apex angle of the second bottomless elliptical cone in the major axis direction, the apex angle of the second bottomless elliptical cone in the major axis direction can be determined as the horizontal field of view angle of the spectral radiance meter 301 to be measured. After calculating the apex angle of the second bottomless elliptical cone in the minor axis direction, the apex angle of the second bottomless elliptical cone in the minor axis direction can be determined as the vertical field of view angle of the spectral radiance meter 301 to be measured.

[0137] In the embodiments of the present invention, by using the calibration baffle and the radiation source, the calibration distance corresponding to the spectral radiance meter to be measured is determined. By using the first target baffle and the second target baffle, the field of view area range of the spectral radiance meter to be measured is determined. When it is determined that the field of view area range of the spectral radiance meter to be measured includes the internal area of the first bottomless elliptical cone, multiple first baffles corresponding to the first target baffle are used to obtain the first target minor axis length corresponding to the spectral radiance meter to be measured. Furthermore, based on the first target minor axis length, the calibration distance, the target distance between the target position and the circular light outlet, the radius of the circular light outlet, and the radius of the circular hole, the apex angle of the first bottomless elliptical cone in the major axis direction and the apex angle in the minor axis direction are obtained. It fully considers the situation where the actual field of view area of the spectral radiance meter in the real application scenario is a bottomless elliptical cone, designs a baffle with elliptical holes having different short-to-long axis ratios, and by changing the distance between the spectral radiance meter to be measured and the baffle and switching the baffle with elliptical holes having different short-to-long axis ratios, the actual field of view area of the spectral radiance meter can be accurately measured. The operation of measuring the actual field of view area of the spectral radiance meter is simple and the measurement efficiency is high.

[0138] Based on the content of the above embodiments, a spectral radiance meter field of view measurement system for implementing the spectral radiance meter field of view measurement method described above, includes: a radiation source 303, a calibration baffle 302, a first target baffle 501, a second target baffle 601, a plurality of first baffles corresponding to the first target baffle 501, and a plurality of second baffles corresponding to the second target baffle 601.

[0139] A circular hole 306 is provided on the calibration baffle 302, and the diameter of the circular hole 306 is smaller than the diameter of the light outlet of the radiation source 303.

[0140] A first elliptical hole 502 is provided on the first target baffle 501, and a second elliptical hole 602 is provided on the second target baffle 601. The major axis and minor axis of the first elliptical hole 502 and the second elliptical hole 602 are equal. The major axis of the first elliptical hole 502 is in the horizontal direction, and the major axis of the second elliptical hole 602 is in the vertical direction.

[0141] An elliptical hole is provided on any one of the first baffles. The major axis of the elliptical hole on any one of the first baffles is in the horizontal direction and the minor axis is in the vertical direction. The first baffles are arranged in the order of decreasing minor axis length of the elliptical holes. The difference in the minor axis length of the elliptical holes on any two adjacent first baffles in the arrangement sequence of the first baffles is a preset value.

[0142] An elliptical hole is provided on any one of the second baffles. The major axis of the elliptical hole on any one of the second baffles is in the vertical direction and the minor axis is in the horizontal direction. The second baffles are arranged in the order of decreasing minor axis length of the elliptical holes. The difference in the minor axis length of the elliptical holes on any two adjacent second baffles in the arrangement sequence of the second baffles is a preset value.

[0143] It should be noted that for the structural schematic diagram after the combination of each part in the spectral radiance meter field of view measurement system provided by the present invention, reference can be made to Figure 3 、 Figure 4 、 Figure 7 and Figure 8 as shown. For the first target baffle 501 and the second target baffle 601, reference can be made to Figure 5 and Figure 6 as shown.

[0144] For the specific process of measuring the field of view area of the spectral radiance meter 301 to be measured by using the spectral radiance meter field of view measurement system provided by the present invention, reference can be made to the content of the above embodiments, and details will not be repeated in the embodiments of the present invention.

[0145] As an optional embodiment, the surfaces of the calibration baffle 302, the first target baffle 501, the second target baffle 601, the first baffles, and the second baffles are blackened.

[0146] As an optional embodiment, the spectral radiance meter field of view measurement system further includes: a guide rail, a first fixing device, a second fixing device, a baffle switching device, and a controller. The controller is electrically connected to the second fixing device and the baffle switching device.

[0147] The guide rail is arranged along the extension direction of the target light output optical path. The first fixing device is arranged at the target position, and the second fixing device is movably arranged on the guide rail.

[0148] The first fixing device is used to fix the calibration baffle 302; the second fixing device is used to fix the spectral radiometer to be measured and move on the guide rail in response to the control of the controller.

[0149] The baffle switching device is used to switch the baffle arranged at the target position in response to the control of the controller.

[0150] The controller includes a memory, a processor, and a computer program stored on the memory and executable on the processor. When the processor executes the program, it implements the spectral radiance meter field of view measurement method described in any one of the above.

[0151] In the spectral radiance meter field of view measurement system in the embodiment of the present invention, the calibration distance corresponding to the spectral radiometer to be measured is determined, and the field of view area range of the spectral radiometer to be measured is determined by using the first target baffle and the second target baffle. When it is determined that the field of view area range of the spectral radiometer to be measured includes the internal area of the first bottomless elliptical cone, the first target short axis length corresponding to the spectral radiometer to be measured is obtained by using a plurality of first baffles corresponding to the first target baffle. Furthermore, based on the first target short axis length, the calibration distance, the target distance between the target position and the circular light outlet, the radius of the circular light outlet, and the radius of the circular hole, the apex angle in the major axis direction and the apex angle in the minor axis direction of the first bottomless elliptical cone are obtained. It fully considers the situation that the real field of view area of the spectral radiance meter in the real application scenario is a bottomless elliptical cone, designs baffles with elliptical holes having different short-to-long axis ratios, and can accurately measure the real field of view area of the spectral radiance meter by changing the distance between the spectral radiometer to be measured and the baffle and switching the baffle with elliptical holes having different short-to-long axis ratios. The operation of measuring the real field of view area of the spectral radiance meter is simple and the measurement efficiency is high.

[0152] Figure 10 Illustrates a schematic physical structure diagram of an electronic device, such as Figure 10As shown in the figure, the electronic device may include: a processor 1010, a communications interface 1020, a memory 1030, and a communication bus 1040. Among them, the processor 1010, the communications interface 1020, and the memory 1030 complete communication with each other through the communication bus 1040. The processor 1010 can call the logical instructions in the memory 1030 to execute the method for measuring the field of view of a spectral radiance meter. The method includes: using a calibration baffle and a radiation source to determine the calibration distance corresponding to the spectral radiance meter to be measured. There is a round hole on the calibration baffle, and the diameter of the round hole is smaller than the diameter of the circular light outlet of the radiation source; using a first target baffle and a second target baffle to determine the range of the field of view area of the spectral radiance meter to be measured. There is a first elliptical hole on the first target baffle, and a second elliptical hole on the second target baffle. The minor axes and major axes of the first elliptical hole and the second elliptical hole are equal. The major axis of the first elliptical hole is in the horizontal direction, and the major axis of the second elliptical hole is in the vertical direction; in the case where it is determined that the range of the field of view area of the spectral radiance meter to be measured includes the internal area of a first bottomless elliptical cone, using a plurality of first baffles corresponding to the first target baffle to obtain the first target minor axis length corresponding to the spectral radiance meter to be measured. The starting point of the first bottomless elliptical cone is the center of the light inlet of the spectral radiance meter to be measured. The projection of the first bottomless elliptical cone on the first reference plane is an ellipse with the major axis in the horizontal direction. The first reference plane is perpendicular to the central axis of the first bottomless elliptical cone; based on the first target minor axis length, the calibration distance, the radius of the circular light outlet, and the radius of the round hole, obtain the apex angle of the first bottomless elliptical cone in the major axis direction and the apex angle in the minor axis direction. There is an elliptical hole on any one of the first baffles. The major axis of the elliptical hole on any one of the first baffles is in the horizontal direction and the minor axis is in the vertical direction. Each first baffle is arranged in the order of decreasing minor axis length of the elliptical hole. The difference between the minor axis lengths of the elliptical holes on any two adjacent first baffles in the arrangement sequence of the first baffles is a preset value.

[0153] In addition, when the logical instructions in the above-mentioned memory 1030 are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or a part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods of various embodiments of the present invention. The aforementioned storage medium includes: various media such as USB flash drives, mobile hard disks, read-only memories (ROMs), random access memories (RAMs), magnetic disks, or optical discs that can store program codes.

[0154] On the other hand, the present invention also provides a computer program product. The computer program product includes a computer program that can be stored on a non-transitory computer-readable storage medium. When the computer program is executed by a processor, the computer can execute the spectral radiance meter field of view measurement method provided by the above-mentioned various methods. The method includes: using a calibration baffle and a radiation source to determine the calibration distance corresponding to the spectral radiance meter to be measured. A circular hole is provided on the calibration baffle, and the diameter of the circular hole is smaller than the diameter of the circular light outlet of the radiation source; using a first target baffle and a second target baffle to determine the field of view area range of the spectral radiance meter to be measured. A first elliptical hole is provided on the first target baffle, and a second elliptical hole is provided on the second target baffle. The minor axes and major axes of the first elliptical hole and the second elliptical hole are equal. The major axis of the first elliptical hole is in the horizontal direction, and the major axis of the second elliptical hole is in the vertical direction; when it is determined that the field of view area range of the spectral radiance meter to be measured includes the internal area of a first bottomless elliptical cone, using a plurality of first baffles corresponding to the first target baffle to obtain the first target minor axis length corresponding to the spectral radiance meter to be measured. The starting point of the first bottomless elliptical cone is the center of the light inlet of the spectral radiance meter to be measured. The projection of the first bottomless elliptical cone on a first reference plane is an ellipse with the major axis in the horizontal direction. The first reference plane is perpendicular to the central axis of the first bottomless elliptical cone; based on the first target minor axis length, the calibration distance, the radius of the circular light outlet, and the radius of the circular hole, obtain the apex angle in the major axis direction and the apex angle in the minor axis direction of the first bottomless elliptical cone. An elliptical hole is provided on any one of the first baffles. The major axis of the elliptical hole on any one of the first baffles is in the horizontal direction and the minor axis is in the vertical direction. The first baffles are arranged in the order of decreasing minor axis length of the elliptical holes. The difference in the minor axis lengths of the elliptical holes on any two adjacent first baffles in the arrangement sequence of the first baffles is a preset value.

[0155] In another aspect, the present invention further provides a non-transitory computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, it implements the method for measuring the field of view of a spectral radiance meter provided by the above-mentioned various methods. The method includes: using a calibration baffle and a radiation source to determine the calibration distance corresponding to the spectral radiance meter to be measured. A circular hole is provided on the calibration baffle, and the diameter of the circular hole is smaller than the diameter of the circular light-emitting port of the radiation source; using a first target baffle and a second target baffle to determine the range of the field of view area of the spectral radiance meter to be measured. A first elliptical hole is provided on the first target baffle, and a second elliptical hole is provided on the second target baffle. The minor axis and major axis of the first elliptical hole and the second elliptical hole are equal. The major axis of the first elliptical hole is in the horizontal direction, and the major axis of the second elliptical hole is in the vertical direction; in the case where it is determined that the range of the field of view area of the spectral radiance meter to be measured includes the internal area of a first bottomless elliptical cone, using a plurality of first baffles corresponding to the first target baffle to obtain the first target minor axis length corresponding to the spectral radiance meter to be measured. The starting point of the first bottomless elliptical cone is the center of the light incident port of the spectral radiance meter to be measured. The projection of the first bottomless elliptical cone on the first reference plane is an ellipse with the major axis in the horizontal direction. The first reference plane is perpendicular to the central axis of the first bottomless elliptical cone; based on the first target minor axis length, the calibration distance, the radius of the circular light-emitting port, and the radius of the circular hole, obtain the apex angle of the first bottomless elliptical cone in the major axis direction and the apex angle in the minor axis direction. An elliptical hole is provided on any one of the first baffles. The major axis of the elliptical hole on any one of the first baffles is in the horizontal direction and the minor axis is in the vertical direction. The first baffles are arranged in the order of decreasing minor axis length of the elliptical holes. The difference in the minor axis length of the elliptical holes on any two adjacent first baffles in the arrangement sequence of the first baffles is a preset value.

[0156] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separated. The components shown as units may or may not be physical units, that is, they may be located in one place, or may be distributed to multiple network units. Some or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment. Those of ordinary skill in the art can understand and implement it without creative efforts.

[0157] Through the description of the above embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus a necessary general hardware platform, and of course, it can also be implemented by hardware. Based on such an understanding, the essence of the above technical solution or the part that contributes to the prior art can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., and includes several instructions to enable a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or some parts of the embodiments.

[0158] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit them. Although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments or equivalently replace some of the technical features. These modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for measuring the field of view of a spectral radiance meter, characterized in that Including: Using a calibration baffle and a radiation source to determine the calibration distance corresponding to the spectral radiance meter to be measured. A circular hole is provided on the calibration baffle, and the diameter of the circular hole is smaller than the diameter of the circular light-emitting port of the radiation source; Using a first target baffle and a second target baffle to determine the field of view area range of the spectral radiance meter to be measured. A first elliptical hole is provided on the first target baffle, and a second elliptical hole is provided on the second target baffle. The minor axes and major axes of the first elliptical hole and the second elliptical hole are equal. The major axis of the first elliptical hole is in the horizontal direction, and the major axis of the second elliptical hole is in the vertical direction; When it is determined that the field of view area range of the spectral radiance meter to be measured includes the internal area of a first bottomless elliptical cone, using a plurality of first baffles corresponding to the first target baffle to obtain the first target minor axis length corresponding to the spectral radiance meter to be measured. The starting point of the first bottomless elliptical cone is the center of the light inlet of the spectral radiance meter to be measured. The projection of the first bottomless elliptical cone on a first reference plane is an ellipse with the major axis in the horizontal direction. The first reference plane is perpendicular to the central axis of the first bottomless elliptical cone; Based on the first target minor axis length, the calibration distance, the radius of the circular light-emitting port, and the radius of the circular hole, obtain the apex angle in the major axis direction and the apex angle in the minor axis direction of the first bottomless elliptical cone. An elliptical hole is provided on any one of the first baffles. The major axis length of the elliptical hole on any one of the first baffles is the same as the major axis length of the first elliptical hole. The major axis of the elliptical hole on any one of the first baffles is in the horizontal direction and the minor axis is in the vertical direction. Each of the first baffles is arranged in the order of decreasing minor axis length of the elliptical hole. The difference in the minor axis length of the elliptical holes on any two adjacent first baffles in the arrangement sequence of the first baffles is a preset value.

2. The method for measuring the field of view of a spectral radiance meter according to claim 1, characterized in that After using the first target baffle and the second target baffle to determine the field of view area range of the spectral radiance meter to be measured, the method further includes: When it is determined that the field of view area range of the spectral radiance meter to be measured includes a second bottomless elliptical cone, using a plurality of second baffles corresponding to the second target baffle to determine the second target minor axis length corresponding to the spectral radiance meter to be measured; Based on the second target minor axis length, the calibration distance, the radius of the circular light-emitting port, and the radius of the circular hole, obtain the apex angle in the major axis direction and the apex angle in the minor axis direction of the second bottomless elliptical cone; Among them, an elliptical hole is provided on any one of the second baffles. The major axis length of the elliptical hole on any one of the second baffles is the same as the major axis length of the second elliptical hole. The major axis of the elliptical hole on any one of the second baffles is in the vertical direction and the minor axis is in the horizontal direction. Each of the second baffles is arranged in the order of decreasing minor axis length of the elliptical hole. The difference in the minor axis lengths of the elliptical holes on any two adjacent second baffles in the arrangement sequence of the second baffles is the preset value. The starting point of the second bottomless elliptical cone is the center of the light inlet. The projection of the second bottomless elliptical cone on the second reference plane is an ellipse with the major axis in the vertical direction. The second reference plane is perpendicular to the central axis of the second bottomless elliptical cone.

3. The method for measuring the field of view of a spectral radiance meter according to claim 2, wherein The method for determining the calibration distance corresponding to the spectral radiance meter to be measured by using the calibration baffle and the radiation source includes: The calibration baffle and the spectral radiance meter to be measured are sequentially arranged along the extension direction of the target light output optical path. The target light output optical path is the light output optical path in the light output optical path of the radiation source that coincides with the central axis of the circular light outlet of the radiation source. The calibration baffle, the circular light outlet, and the light inlet of the spectral radiance meter to be measured are parallel to each other. The target light output optical path passes through the center of the circular hole and the center of the light inlet. The target position of the center of the circular hole on the target light output optical path and the position of the center of the light inlet on the target light output optical path are predefined. Along the extension direction of the target light output optical path, move the spectral radiance meter to be measured away from the radiation source, and obtain the real-time light radiation value received by the spectral radiance meter to be measured during the movement. When the real-time light radiation value starts to decrease from a fixed value at the current moment, stop moving the spectral radiance meter to be measured. Move the spectral radiance meter to be measured to the historical position at the previous moment of the current moment, and obtain the distance between the center of the light inlet and the center of the circular light outlet at the previous moment as the calibration distance.

4. The method for measuring the field of view of a spectral radiance meter according to claim 3, wherein The method for determining the field of view range of the spectral radiance meter to be measured by using the first target baffle and the second target baffle includes: Remove the calibration baffle from the target light output optical path. Set the first target baffle and the second target baffle at the target position respectively, and obtain the first light radiation value received by the spectral radiance meter to be measured through the first elliptical hole and the second light radiation value received by the spectral radiance meter to be measured through the second elliptical hole respectively. When the first target baffle is set at the target position, the first target baffle is parallel to the circular light outlet and the light inlet, and the target light output optical path passes through the center of the first elliptical hole. When the second target baffle is set at the target position, the second target baffle is parallel to the circular light outlet and the light inlet, and the target light output optical path passes through the center of the second elliptical hole. Compare the first light radiation value and the second light radiation value. When the first light radiation value is greater than the second light radiation value, it is determined that the field of view area range of the spectral radiance meter to be measured includes the inner area of the first bottomless elliptical cone. When the first light radiation value is less than the second light radiation value, it is determined that the field of view area range of the spectral radiance meter to be measured includes the inner area of the second bottomless elliptical cone.

5. The method for measuring the field of view of a spectral radiance meter according to claim 4, wherein When it is determined that the field of view area range of the spectral radiance meter to be measured includes the inner area of the first bottomless elliptical cone, using the multiple first baffles corresponding to the first target baffle to obtain the first target minor axis length corresponding to the spectral radiance meter to be measured includes: Remove the first target baffle or the second target baffle; According to the arrangement order of each of the first baffles, sequentially set the first baffles at the target position, and sequentially obtain the current light radiation value received by the spectral radiance meter to be measured through the elliptical hole on the first baffle currently set at the target position, until the current light radiation value received by the spectral radiance meter to be measured through the elliptical hole on the first baffle currently set at the target position is less than the historical light radiation value received by the spectral radiance meter to be measured through the elliptical hole on the first baffle set at the target position last time, and when the historical light radiation values received by the spectral radiance meter to be measured through the elliptical holes on the first baffles set at the target position in history are all the same, determine the minor axis length of the elliptical hole on the first baffle set at the target position last time as the first target minor axis length.

6. The method for measuring the field of view of a spectral radiance meter according to claim 4, characterized in that, When it is determined that the field of view area range of the spectral radiance meter to be measured includes the second bottomless elliptical cone, using the multiple second baffles corresponding to the second target baffle to determine the second target minor axis length corresponding to the spectral radiance meter to be measured includes: Remove the first target baffle or the second target baffle; According to the arrangement order of each of the second baffles in the arrangement sequence of the second baffles, sequentially set the second baffles at the target position, and sequentially obtain the current light radiation value received by the spectral radiance meter to be measured through the elliptical hole on the second baffle currently set at the target position, until the current light radiation value received by the spectral radiance meter to be measured through the elliptical hole on the second baffle currently set at the target position is less than the historical light radiation value received by the spectral radiance meter to be measured through the elliptical hole on the second baffle set at the target position last time, and when the historical light radiation values received by the spectral radiance meter to be measured through the elliptical holes on the second baffles set at the target position in history are all the same, determine the minor axis length of the elliptical hole on the second baffle set at the target position last time as the second target minor axis length.

7. The method for measuring the field of view of a spectral radiance meter according to claim 4, characterized in that After comparing the first light radiation value and the second light radiation value, the method further includes: When the first light radiation value is equal to the second light radiation value, the internal region of the bottomless cone is determined as the field of view region range of the spectral radiance meter to be measured. The bottomless cone starts from the center of the light incident port, and the projection of the bottomless cone on the third reference plane is circular. The third reference plane is perpendicular to the central axis of the bottomless cone.

8. A spectral radiance meter field of view measurement system for implementing the spectral radiance meter field of view measurement method according to any one of claims 1 to 7, characterized in that, Including: A radiation source, a calibration baffle, a first target baffle, a second target baffle, a plurality of first baffles corresponding to the first target baffle, and a plurality of second baffles corresponding to the second target baffle; A circular hole is provided on the calibration baffle, and the diameter of the circular hole is smaller than the diameter of the light exit of the radiation source; A first elliptical hole is provided on the first target baffle, and a second elliptical hole is provided on the second target baffle. The major axis and minor axis of the first elliptical hole and the second elliptical hole are equal. The major axis of the first elliptical hole is in the horizontal direction, and the major axis of the second elliptical hole is in the vertical direction; An elliptical hole is provided on any one of the first baffles. The major axis of the elliptical hole on any one of the first baffles is in the horizontal direction and the minor axis is in the vertical direction. Each of the first baffles is arranged in the order of decreasing minor axis length of the elliptical hole. The difference in the minor axis length of the elliptical holes on any two adjacent first baffles in the arrangement sequence of the first baffles is a preset value; An elliptical hole is provided on any one of the second baffles. The major axis of the elliptical hole on any one of the second baffles is in the vertical direction and the minor axis is in the horizontal direction. Each of the second baffles is arranged in the order of decreasing minor axis length of the elliptical hole. The difference in the minor axis length of the elliptical holes on any two adjacent second baffles in the arrangement sequence of the second baffles is the preset value.

9. The spectral radiance meter field of view measurement system according to claim 8, characterized in that The surfaces of the calibration baffle, the first target baffle, the second target baffle, the first baffle, and the second baffle are blackened.

10. The spectral radiance meter field of view measurement system according to claim 8 or 9, characterized in that Further including: A guide rail, a first fixing device, a second fixing device, a baffle switching device, and a controller; the controller is electrically connected to the second fixing device and the baffle switching device; The guide rail is arranged along the extension direction of the target light exit optical path. The first fixing device is arranged at the target position, and the second fixing device is movably arranged on the guide rail; The first fixing device is used to fix the calibration baffle; the second fixing device is used to fix the spectral radiance meter to be measured and move on the guide rail in response to the control of the controller; The baffle switching device is used to switch the baffle arranged at the target position in response to the control of the controller; The controller includes a memory, a processor, and a computer program stored on the memory and executable on the processor. When the processor executes the program, it implements the spectral radiance meter field of view measurement method according to any one of claims 1 to 7.

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