Ultra-narrow laser emission test device and detection method thereof

Abstract

The present invention discloses an ultra-narrow laser emission test device and a detection method thereof, which relate to the technical field of ultra-narrow laser emission test, and include an optical platform, a test plate is fixedly connected to the top of the optical platform, a reflector is also arranged on the top of the optical platform, and also include: a collimator stabilizing mechanism, an angle adjustment mechanism and a jitter cleaning mechanism. Through the setting of the collimator stabilizing mechanism, the position of an ultra-narrow laser emitter can be stabilized before the ultra-narrow laser emission test, so that the laser emission collimator of the ultra-narrow laser emitter can be more accurately emitted to the reflector. Different from the traditional laser emitter positioning which requires multiple manual adjustments, the setting of the collimator stabilizing mechanism can realize automatic positioning and stabilization through a simple sliding operation, thereby simplifying the operation process and improving work efficiency. At the same time, through the design of the above-mentioned device structure, human intervention is reduced, thereby reducing the uncertainty and error caused thereby.

Description

Technical Field

[0001] The present invention relates to the technical field of ultra-narrow laser emission testing, and in particular to an ultra-narrow laser emission testing device and a detection method thereof. Background Art

[0002] In the prior art, a laser transmitter, or laser, is an optical device that can generate lasers. It amplifies and enhances optical signals through specific physical processes (such as stimulated radiation), thereby generating a laser beam with high directionality, monochromaticity and coherence. The laser linewidth is one of the important indicators of laser performance. It reflects the monochromaticity of the emission spectrum of the laser light source. The linewidth of ultra-narrow laser emission is usually very narrow, which can reach the order of below Hertz (Hz). This places extremely high demands on the coherence, stability and spectral purity of the light source. Therefore, before the laser transmitter is put into use, it is usually necessary to test the ultra-narrow laser emission of the laser transmitter to ensure that the ultra-narrow laser can be emitted normally. Through subsequent tests, the linewidth of the laser can be accurately measured to evaluate its monochromaticity and coherence.

[0003] However, in the process of testing the ultra-narrow laser emission of the laser emitter, the accurate positioning and stabilization of the ultra-narrow laser emitter is a key and complex link. The traditional positioning method relies on multiple manual adjustments, and the technician needs to observe and manually adjust the position of the emitter by naked eye to align the laser crosshairs with the target point of the reflector. This process not only requires the technician to have high professional skills and experience, but is also easily affected by factors such as ambient light and visual fatigue, resulting in limited adjustment accuracy. In addition, due to the need for repeated manual adjustment and verification, the traditional method consumes a lot of time and manpower costs, reducing the overall efficiency of the test, especially when the test scene or target point needs to be changed frequently. This problem is particularly prominent, and the subjectivity and uncontrollability of manual operation make the results of each adjustment different, which in turn affects the accuracy and reliability of the test data.

[0004] In view of this, the present invention proposes an ultra-narrow laser emission testing device and a detection method thereof to make up for and improve the deficiencies of the prior art. Summary of the invention

[0005] In order to solve the above technical problems, the present invention provides an ultra-narrow laser emission test device and a detection method thereof to solve the corresponding technical problems raised in the above background technology.

[0006] To achieve the above objectives, the technical solution adopted by the present invention is: an ultra-narrow laser emission test device, comprising an optical platform, a test plate is fixedly connected to the top of the optical platform, a reflector is also arranged on the top of the optical platform, and also comprises: a centering stabilization mechanism, an angle adjustment mechanism and a jitter cleaning mechanism, and the centering stabilization mechanism, the angle adjustment mechanism and the jitter cleaning mechanism are all arranged above the optical platform; the centering stabilization mechanism is used to stabilize the position of the ultra-narrow laser emitter; the angle adjustment mechanism is used to adjust the angle of reflection formed by the laser and the reflector; the jitter cleaning mechanism is used to jitter to remove contaminants on the reflective surface of the reflector.

[0007] Preferably, the alignment stabilization mechanism includes a placement rack fixedly connected to the top of the optical platform, a push plate is provided at the bottom of the placement rack, oblique grooves are symmetrically and evenly opened on the push plate, and through grooves are symmetrically and evenly opened on the placement rack, a sliding column is slidably connected between the oblique groove and the through groove, and a positioning plate is fixedly connected to the sliding column.

[0008] Preferably, a U-shaped positioning rod is fixedly connected to the top of the placement rack, and positioning grooves are symmetrically provided on both sides of the U-shaped positioning rod, and L-shaped slides are symmetrically fixedly connected to the two sides of the push plate, and the L-shaped slide is slidably connected to the placement rack, and a connecting groove is provided on the side of the L-shaped slide facing the U-shaped positioning rod, and a first elastic telescopic column is fixedly connected to the bottom wall of the connecting groove, and a hemispherical positioning block is fixedly connected to one end of the first elastic telescopic column facing the positioning groove, and the hemispherical positioning block is adapted to the positioning groove.

[0009] Preferably, the angle adjustment mechanism includes a fixing plate fixedly connected to the top of one end of the optical platform away from the placement frame, the fixing plate is fixedly connected to a base plate at the lower end of the side facing the placement frame, the base plate is rotatably connected to a rotating shaft, the top of the rotating shaft is fixedly connected to a mounting plate, and the reflector is fixedly connected to a side of the mounting plate away from the fixing plate.

[0010] Preferably, a threaded rod is threadedly connected to the fixing plate, and a top block is rotatably connected to one end of the threaded rod toward the mounting plate, and the top block contacts the mounting plate, connecting plates are symmetrically fixedly connected on both sides of the top block, and sliders are fixedly connected on the opposite sides of the connecting plates, and side plates are symmetrically fixedly connected to the side of the fixing plate toward the mounting plate with the threaded rod as the center, and sliding grooves are provided on opposite sides of the side plates to be slidably connected to the sliding grooves, and first springs are fixedly connected between the two sides of the slider and the sliding grooves.

[0011] Preferably, the fixed plate is also fixedly connected to a second elastic telescopic column, the second elastic telescopic column is fixedly connected to a linkage plate on one end facing the mounting plate, ear plates are symmetrically fixedly connected to the linkage plate, a torsion spring shaft is rotatably connected between the ear plates, a linkage block is fixedly connected to the outer surface of the torsion spring shaft, and the linkage block is slidably connected to one end of the mounting plate away from the top block.

[0012] Preferably, the shaking cleaning mechanism includes a U-shaped support frame symmetrically fixedly connected to both sides of the mounting plate, a reciprocating screw rod being rotatably connected to the U-shaped support frame, a transmission member being transmission-connected between the reciprocating screw rods, a micro motor being fixedly connected to the top of one of the U-shaped support frames, and an output end of the micro motor being fixedly connected to one of the reciprocating screw rods, a movable plate being threadedly connected between the reciprocating screw rods, a mounting groove being provided on the side of the movable plate facing the reflector, a soft brush being slidably connected to the bottom wall of the mounting groove, and the soft brush being in contact with the surface of the reflector.

[0013] Preferably, a bending frame is fixedly connected to one of the U-shaped support frames, a squeezing ball is equidistantly fixedly connected to the side of the bending frame facing the soft brush, a third elastic telescopic column is fixedly connected between the groove wall on the side of the mounting groove away from the bending frame and the soft brush, and a pressure ball is fixedly connected to the side of the soft brush facing the bending frame.

[0014] An ultra-narrow laser emission detection method, the detection method comprises the following steps: Step 1: device preparation and calibration.

[0015] Step 2: Laser emission and signal acquisition.

[0016] Step 3: Data processing and analysis.

[0017] The step one includes: connecting the circuit of the ultra-narrow laser emitter and debugging it to the best working state, calibrating the laser emission of the ultra-narrow laser emitter to ensure measurement accuracy, and connecting the test board with the circuit of the test equipment.

[0018] The step 2 includes: starting the ultra-narrow laser transmitter to emit a laser with an extremely narrow line width, using a reflector to reflect the laser so that the laser is reflected onto the test board, and using a connected test device to collect in real time a spectrum signal and a photoelectric conversion signal reflected from the laser onto the test board.

[0019] The step three includes: pre-processing the collected signal by filtering, amplifying, etc., then performing spectrum analysis on the signal using a signal processor, calculating key parameters such as the line width of the laser, and finally outputting and storing the analysis results for subsequent analysis and application.

[0020] Compared with the prior art, the present invention has the following beneficial effects: (1) by setting up the collimator stabilizing mechanism, the position of the ultra-narrow laser emitter can be stabilized before the ultra-narrow laser emission test, so that the laser emission collimator of the ultra-narrow laser emitter can be more accurately emitted to the reflector. Different from the traditional laser emitter positioning which requires multiple manual adjustments, the collimator stabilizing mechanism can realize automatic positioning and stabilization through a simple sliding operation, which simplifies the operation process and improves work efficiency. At the same time, through the design of the above-mentioned device structure, human intervention is reduced, thereby reducing the uncertainty and error caused thereby.

[0021] Among them, since the inclined groove is designed to be symmetrical, it can interact with multiple sliding columns when moving, thereby ensuring that all sliding columns can slide synchronously, so that the positioning plates on both sides move toward each other at the same speed. This synchronization not only improves the positioning accuracy, but also enhances the stability of the entire structure. Compared with the traditional complex positioning mechanism, this design can achieve high-precision positioning through a simple mechanical structure and sliding operation, reducing the number and complexity of parts, reducing manufacturing costs and maintenance difficulties, and also making the operation easier and faster.

[0022] In addition, since the contact surface between the hemispherical positioning block and the positioning groove adopts a sliding surface design, the friction and wear generated when the structures contact each other can be reduced, making the interaction between the structures smoother, reducing component loss and wear caused by long-term friction, thereby extending the service life of the structure.

[0023] Setting the contact surface between the hemispherical positioning block and the positioning groove as a sliding surface can not only reduce the wear between the structures, but also help to evenly distribute the stress on the contact surface during contact, thereby reducing the situation where stress is concentrated at a certain point or a small area, and effectively enhancing the overall stability of the connection between the L-shaped slide plate and the U-shaped positioning rod structure.

[0024] At the same time, by designing the shape of the hemispherical positioning block into a hemispherical shape, it can be more convenient to insert and disengage from the positioning groove. When the laser emitter needs to be adjusted or removed later, the operator only needs to perform simple operations to disengage the hemispherical positioning block from the positioning groove, thereby unlocking the push plate. This design simplifies the locking and releasing operations, improves work efficiency as well as the maintainability and flexibility of the device. Compared with the traditional mechanical locking mechanism, the connection between the hemispherical positioning block and the positioning groove is smoother, which reduces the wear and noise caused by friction and extends the service life of the device.

[0025] (2) By setting up the angle adjustment mechanism, after the ultra-narrow laser emitter is stably placed, the reflection angle between the laser and the reflector can be adjusted accordingly, so that the staff can quickly and accurately adjust the angle of the reflector according to actual needs, thereby meeting diverse test requirements and improving the flexibility and adaptability of the test. Through the mechanical structure design, the precise adjustment of the reflector angle is achieved, which reduces the error caused by manual adjustment, improves the accuracy and reliability of the test, and also makes the angle adjustment of the reflector more intuitive and convenient.

[0026] Among them, when the angle adjustment mechanism adjusts the angle of the reflector, one end of the mounting plate is pushed by the top block, and the other end is balanced through the interaction between the second elastic telescopic column and the linkage plate, ensuring the smoothness and controllability of the rotation, making the entire adjustment process smoother and impact-free. The setting of the second elastic telescopic column can also provide a certain amount of buffering and support when the mounting plate rotates, preventing damage caused by sudden force.

[0027] Among them, in the process of the top block pushing the mounting plate to rotate with the rotating shaft as the axis, the linkage block located on the other side of the mounting plate will be synchronously squeezed and slide on the mounting plate. At this time, under the squeezing effect of the rotation of the mounting plate, the linkage block will drive the torsion spring shaft to twist synchronously between the two ear plates. Firstly, it can store elastic potential energy for subsequent reset, facilitate the reset of the auxiliary mounting plate, improve the stability and reliability of the structure, and reduce the risk of structural displacement or damage caused by external force. Secondly, this mechanical linkage mechanism realizes the effective transmission and conversion of force, improves the working efficiency of the overall structure, and in the whole process, energy is transferred from the top block to the mounting plate, and then to the ear plate through the linkage block and the torsion spring shaft, realizing efficient transmission and utilization of energy.

[0028] Among them, the cooperation between the torsion spring shaft, the ear plate and the linkage block, through their elastic characteristics, can make the end of the mounting plate move synchronously with the torsion spring shaft. The rotational power applied by the mounting plate can be transmitted by the torsion spring shaft and squeezed on the second elastic telescopic column to help absorb and disperse part of the impact force, and cooperate with the push of the top block to balance the forces at both ends of the mounting plate, so that the whole process can be more smoothly transitioned and buffered at the power transmission level, so as to reduce the impact of the unstable rotation of the mounting plate on the reflector.

[0029] (3) By setting up the shaking cleaning mechanism, the reflective surface of the reflector can be pre-cleaned before the reflector is used to remove contaminants on the reflective surface of the reflector, thereby ensuring that the surface of the reflector is clean and free of dirt, thereby improving the clarity and contrast of the image and preventing the long-term accumulation of contaminants from eroding the surface of the reflector and affecting its optical performance and stability.

[0030] Among them, the design of vertical reciprocating movement of the soft-bristle brush can ensure that the reflective surface of the reflector is fully and evenly cleaned. As the soft-bristle brush moves down and fits the reflective surface, its bristles can penetrate into and remove dust, dirt and other contaminants on the surface and in tiny gaps, thereby improving the cleaning effect. Compared with other cleaning methods (such as high-pressure gas purging, chemical solvent wiping, etc.), it is more gentle and will not cause scratches or damage to the surface of the reflector, so as to maintain the optical performance of the reflector.

[0031] In addition, the soft-bristle brush is designed to perform horizontal reciprocating shaking while moving vertically. This multi-dimensional movement can more effectively remove stubborn stains and tiny particles on the reflective surface of the mirror. The shaking action design can increase the frequency and strength of contact between the bristles and the surface of the mirror, thereby improving the thoroughness and efficiency of cleaning, ensuring that the soft-bristle brush evenly covers the entire surface of the reflector during the cleaning process, avoiding omissions or incomplete local cleaning, so as to maintain the consistency of the optical properties of the reflector surface. By designing the soft-bristle brush to shake horizontally, the risk of scratches caused by movement in a single direction can be further reduced, and the pressure of the bristles on the surface of the mirror can be dispersed, effectively reducing the occurrence of scratches on the reflective surface.

[0032] In addition, the design of the pressure ball and the squeezing ball can enable the soft brush to automatically adjust its lateral position according to the contact situation during movement. When the pressure ball is squeezed, the soft brush will slide away from the bending frame, and when the squeezing effect disappears, the elastic force of the third elastic telescopic column will reset it. This adaptive adjustment mechanism enables the soft brush to fit the reflective surface of the mirror more closely, thereby improving the cleaning effect. Through the design of lateral reciprocating shaking, the soft brush not only performs simple vertical movement during the cleaning process, but also is accompanied by slight lateral vibrations, which helps to loosen and remove stains and particles attached to the reflective mirror surface, thereby improving the thoroughness and efficiency of cleaning.

[0033] Moreover, since both the pressure ball and the extrusion ball are hemispherical structures and have smooth outer surfaces, the friction and wear caused by contact can be reduced, which helps to reduce mechanical vibration and noise and improve the overall stability and service life of the system. At the same time, the elastic force of the third elastic telescopic column also plays a buffering role, further protecting the soft brush and the reflector surface.

[0034] Among them, the bending frame adopts a symmetrical L-shaped structure design and is connected by vertical plates. This compact design not only saves installation space, but also makes the entire cleaning mechanism more compact and integrated, which is convenient for installation in a limited space and for use with a soft brush. The bending frame is designed close to the micro motor, which can play an isolation role. During the operation of the micro motor, it can effectively disperse and absorb the vibration generated by the micro motor and transfer it to the reflector, further protecting the reflector from potential damage. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] Figure 1 It is a schematic diagram of the overall structure of a preferred embodiment of the present invention.

[0036] Figure 2 The present invention shows Figure 1 Enlarged structural diagram at A in the middle.

[0037] Figure 3 It is a schematic diagram of the push plate connection structure shown in the present invention.

[0038] Figure 4 It is a schematic diagram of the split structure of the positioning groove and the hemispherical positioning block shown in the present invention.

[0039] Figure 5 It is a schematic diagram of the structure of the connection of the reflector shown in the present invention.

[0040] Figure 6 It is a schematic diagram of the structure of the connection of the mounting plate shown in the present invention.

[0041] Figure 7 The present invention shows Figure 6 Enlarged structural diagram at B in the middle.

[0042] Figure 8 This is a schematic diagram of the threaded rod connection structure shown in the present invention.

[0043] Fig. 9 The present invention shows Figure 8 Enlarged structural diagram at point C in the middle.

[0044] Fig.10 The diagram is a structural schematic diagram of the connection between the soft brush and the bending frame shown in the present invention.

[0045] Fig.11 The present invention shows Fig.10 Enlarged structural diagram at D in the middle.

[0046] The numbers in the figure are: 1, optical platform; 2, reflector; 3, test board.

[0047] 4. Centering stabilization mechanism; 401. Placement frame; 402. U-shaped positioning rod; 403. Positioning groove; 404. L-shaped slide plate; 405. Connecting groove; 406. First elastic telescopic column; 407. Hemispherical positioning block; 408. Push plate; 409. Oblique groove; 410. Sliding column; 411. Positioning plate; 412. Through groove.

[0048] 5. Angle adjustment mechanism; 501. Fixed plate; 502. Threaded rod; 503. Top block; 504. Connecting plate; 505. Sliding block; 506. First spring; 507. Side plate; 508. Sliding groove; 509. Second elastic telescopic column; 510. Linkage plate; 511. Ear plate; 512. Torsion spring shaft; 513. Linkage block; 514. Mounting plate; 515. Rotating shaft; 516. Bottom plate.

[0049] 6. Shaking cleaning mechanism; 601. U-shaped support frame; 602. micro motor; 603. reciprocating screw rod; 604. transmission member; 605. moving plate; 606. third elastic telescopic column; 607. soft brush; 608. pressure ball; 609. mounting groove; 610. bending frame; 611. squeezing ball. DETAILED DESCRIPTION

[0050] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0051] Embodiment 1 of the present invention: Please refer to Figures 1 to 11 As shown, an ultra-narrow laser emission test device includes an optical platform 1, a test plate 3 is fixedly connected to the top of the optical platform 1, a reflector 2 is also arranged on the top of the optical platform 1, and also includes: a centering stabilization mechanism 4, an angle adjustment mechanism 5 and a jitter cleaning mechanism 6, and the centering stabilization mechanism 4, the angle adjustment mechanism 5 and the jitter cleaning mechanism 6 are all arranged above the optical platform 1.

[0052] The aiming stabilization mechanism 4 is used to stabilize the position of the ultra-narrow laser emitter.

[0053] The angle adjustment mechanism 5 is used to adjust the reflection angle between the laser and the reflector 2 .

[0054] The shaking cleaning mechanism 6 is used to shake and remove contaminants on the reflective surface of the reflector 2 .

[0055] The centering stabilizing mechanism 4 includes a placement frame 401 fixedly connected to the top of the optical platform 1, a push plate 408 is arranged at the bottom of the placement frame 401, oblique grooves 409 are symmetrically and equidistantly opened on the push plate 408, and through grooves 412 are symmetrically and equidistantly opened on the placement frame 401, a sliding column 410 is slidably connected between the oblique groove 409 and the through groove 412, and a positioning plate 411 is fixedly connected to the sliding column 410.

[0056] A U-shaped positioning rod 402 is fixedly connected to the top of the placement rack 401, and positioning grooves 403 are symmetrically provided on both sides of the U-shaped positioning rod 402. L-shaped slide plates 404 are symmetrically fixedly connected to both sides of the push plate 408, and the L-shaped slide plate 404 is slidably connected to the placement rack 401. A connecting groove 405 is provided on the side of the L-shaped slide plate 404 facing the U-shaped positioning rod 402, and a first elastic telescopic column 406 is fixedly connected to the bottom wall of the connecting groove 405. A hemispherical positioning block 407 is fixedly connected to one end of the first elastic telescopic column 406 facing the positioning groove 403, and the hemispherical positioning block 407 is adapted to the positioning groove 403.

[0057] Please refer to Figures 1 to 4 , better: when the ultra-narrow laser emitter is not initially positioned, the positioning plates 411 on both sides are set far away from each other, and the hemispherical positioning block 407 is not stuck in the positioning groove 403. Instead, the upper end of the L-shaped slide plate 404 is close to the U-shaped positioning rod 402 and is in a fit state with the U-shaped positioning rod 402. The hemispherical positioning block 407 can be compressed into the connecting groove 405 by the pressure exerted by the U-shaped positioning rod 402.

[0058] The effects achieved by this embodiment are as follows: compared with the prior art, through the setting of the aiming stabilization mechanism 4, the position of the ultra-narrow laser emitter can be stabilized before the ultra-narrow laser emission test, so that the laser emission aiming point of the ultra-narrow laser emitter can be more accurately emitted to the reflector 2. Different from the traditional laser emitter positioning which requires multiple manual adjustments, the setting of the aiming stabilization mechanism 4 can achieve automatic positioning and stabilization through a simple sliding operation, which simplifies the operation process and improves work efficiency.

[0059] For further examples, please refer to Figures 1 to 11 As shown, the angle adjustment mechanism 5 includes a fixing plate 501 fixedly connected to the top of one end of the optical platform 1 away from the placement frame 401, a bottom plate 516 is fixedly connected to the lower end of the fixing plate 501 facing the placement frame 401, a rotating shaft 515 is rotatably connected to the bottom plate 516, a mounting plate 514 is fixedly connected to the top of the rotating shaft 515, and the reflector 2 is fixedly connected to the side of the mounting plate 514 away from the fixing plate 501.

[0060] A threaded rod 502 is threadedly connected to the fixed plate 501, and the threaded rod 502 is rotatably connected to one end of the mounting plate 514 with a top block 503, and the top block 503 touches the mounting plate 514, and connecting plates 504 are symmetrically fixedly connected on both sides of the top block 503, and a slider 505 is fixedly connected on the opposite side of the connecting plate 504, and a side plate 507 is symmetrically fixedly connected to the side of the fixed plate 501 facing the mounting plate 514 with the threaded rod 502 as the center, and the opposite sides of the side plate 507 are provided with a sliding groove 508 that is slidably connected to the slider 505, and a first spring 506 is fixedly connected between the two sides of the slider 505 and the sliding groove 508.

[0061] A second elastic telescopic column 509 is also fixedly connected to the fixed plate 501, and a linkage plate 510 is fixedly connected to one end of the second elastic telescopic column 509 facing the mounting plate 514, and ear plates 511 are symmetrically fixedly connected to the linkage plate 510, and a torsion spring shaft 512 is rotatably connected between the ear plates 511, and a linkage block 513 is fixedly connected to the outer surface of the torsion spring shaft 512, and the linkage block 513 is slidably connected to one end of the mounting plate 514 away from the top block 503.

[0062] The effects achieved by this embodiment are as follows: compared with the prior art, through the setting of the angle adjustment mechanism 5, after the ultra-narrow laser emitter is stably placed, the angle of reflection formed by the laser and the reflector 2 can be adjusted accordingly, so that the staff can quickly and accurately adjust the angle of the reflector 2 according to actual needs, thereby meeting diverse test requirements and improving the flexibility and adaptability of the test. Through the mechanical structure design, the precise adjustment of the angle of the reflector 2 is achieved, the error caused by manual adjustment is reduced, the accuracy and reliability of the test are improved, and the angle adjustment of the reflector 2 is made more intuitive and convenient.

[0063] For further examples, please refer to Figures 1 to 11 As shown, the shaking cleaning mechanism 6 includes a U-shaped support frame 601 symmetrically fixedly connected to both sides of the mounting plate 514, a reciprocating screw 603 is rotatably connected to the U-shaped support frame 601, and a transmission member 604 is transmission-connected between the reciprocating screws 603. A micro motor 602 is fixedly connected to the top of one of the U-shaped support frames 601, and the output end of the micro motor 602 is fixedly connected to one of the reciprocating screws 603, a movable plate 605 is threadedly connected between the reciprocating screws 603, and the movable plate 605 is provided with a mounting groove 609 on the side facing the reflector 2, and a soft brush 607 is slidably connected to the inner bottom wall of the mounting groove 609, and the soft brush 607 is in contact with the surface of the reflector 2.

[0064] A bending frame 610 is fixedly connected to one of the U-shaped support frames 601, and a squeezing ball 611 is equidistantly fixedly connected to the side of the bending frame 610 facing the soft brush 607, a third elastic telescopic column 606 is fixedly connected between the groove wall on the side of the mounting groove 609 away from the bending frame 610 and the soft brush 607, and a pressure ball 608 is fixedly connected to the side of the soft brush 607 facing the bending frame 610.

[0065] Please refer to Fig.10 , better: the bending frame 610 is a symmetrical structure, the top and bottom of which are both L-shaped structures, and the two L-shaped structures are fixed by a vertical plate, and the vertical plate is located within the opening range of the installation groove 609, and the vertical plate is arranged close to the soft brush 607, for installing the squeezing ball 611 so as to cooperate with the pressure ball 608.

[0066] In addition, initially, the soft brush 607 should be located above the reflector 2, and the soft brush 607 does not fit the reflective surface of the reflector 2. When the soft brush 607 moves subsequently, the soft brush 607 gradually moves downward and then begins to fit the reflective surface of the reflector 2.

[0067] The effects achieved by this embodiment are as follows: compared with the prior art, through the setting of the shaking cleaning mechanism 6, the reflective surface of the reflector 2 can be pre-cleaned before the reflector 2 is used to remove contaminants on the reflective surface of the reflector 2, thereby ensuring that the surface of the reflector 2 is clean and free of dirt, thereby improving the clarity and contrast of the imaging, and avoiding long-term accumulation of contaminants to erode the surface of the reflector 2 and affect its optical performance and stability.

[0068] Embodiment 2 of the present invention: Ultra-narrow laser emission detection method, the detection method comprises the following steps: Step 1: Device preparation and calibration.

[0069] Step 2: Laser emission and signal acquisition.

[0070] Step 3: Data processing and analysis.

[0071] Step one includes: connecting the circuit of the ultra-narrow laser emitter and debugging it to the best working state, calibrating the laser emission of the ultra-narrow laser emitter to ensure measurement accuracy, and connecting the test board 3 to the circuit of the test equipment.

[0072] Step 2 includes: starting the ultra-narrow laser transmitter to emit a laser with an extremely narrow line width, using the reflector 2 to reflect the laser so that the laser is reflected onto the test board 3, and using the connected test equipment to collect the spectrum signal and the photoelectric conversion signal reflected by the laser onto the test board 3 in real time.

[0073] Step three includes: pre-processing the collected signal by filtering and amplifying, then performing spectrum analysis on the signal using a signal processor, calculating key parameters such as the laser line width, and finally outputting and storing the analysis results for subsequent analysis and application.

[0074] The complete use steps and working principle of the above embodiment are as follows: The following is the working process of the center stabilization mechanism 4 stabilizing the position of the ultra-narrow laser emitter: During the ultra-narrow laser emission test, the staff can first place the ultra-narrow laser emitter on the placement rack 401, such as Figures 1 to 5As shown, since a U-shaped positioning rod 402 is fixedly provided on the top of the placement rack 401, the front end of the ultra-narrow laser emitter can be aligned with the center of the U-shaped positioning rod 402. Through the setting of the U-shaped positioning rod 402, the placement position of the ultra-narrow laser emitter can be preliminarily positioned, and L-shaped slide plates 404 are symmetrically and slidably provided on both sides of the placement rack 401, and a push plate 408 is fixedly provided between the L-shaped slide plates 404, and the push plate 408 is located at the lower end of the placement rack 401. Therefore, after the ultra-narrow laser emitter is placed, the staff can push the L-shaped slide plate 404 to make the push plate 408 move synchronously at the lower end of the placement rack 401. In addition, because oblique grooves 409 are symmetrically and equidistantly provided on the push plate 408, and through grooves 412 are symmetrically and equidistantly provided on the placement rack 401, a sliding column 410 is slidably provided between the oblique groove 409 and the through groove 412, and a positioning plate 411 is fixedly provided on the upper end of the sliding column 410. When the push plate 408 moves, the position of the inclined groove 409 opened thereon changes synchronously, and pushes the slide post 410 to slide between the inclined groove 409 and the through groove 412. Since the through groove 412 is different from the inclined groove 409 and is a groove opened horizontally, when the push plate 408 moves, it can push the slide post 410 to move horizontally in the through groove 412, so that the slide post 410 gradually approaches the center line of the placement rack 401. At this time, the positioning plate 411 installed on the slide post 410 will also approach the direction of the ultra-narrow laser emitter, and finally fit on the outer walls of both sides of the ultra-narrow laser emitter, so that the ultra-narrow laser emitter can be located in the center of the placement rack 401. At the same time, by using the relative fit of the positioning plates 411, the ultra-narrow laser emitter can also be stably placed on the placement rack 401, so that the laser emission crosshairs of the ultra-narrow laser emitter can be more accurately emitted to the reflector 2.

[0075] like Figure 4As shown, when the staff pushes the L-shaped slide plate 404 to slide on the side wall of the placement rack 401, the upper end of the L-shaped slide plate 404 synchronously fits and slides on the side wall of the U-shaped positioning rod 402. Since the positioning grooves 403 are symmetrically provided on both sides of the U-shaped positioning rod 402, the L-shaped slide plate 404 is provided with a connecting groove 405 on the side facing the U-shaped positioning rod 402, and the first elastic telescopic column 406 is fixedly connected to the bottom wall of the connecting groove 405, and the other end of the first elastic telescopic column 406 is fixedly connected to a hemispherical positioning block 407 adapted to the positioning groove 403 (it should be noted here that when the ultra-narrow laser transmitter is not initially positioned, the positioning plates 411 on both sides are set away from each other, and the hemispherical positioning block 407 is not clamped in the positioning groove 403, and the upper end of the L-shaped slide plate 404 is close to the U-shaped positioning rod 402. The side is in a state of fitting with the U-shaped positioning rod 402. The setting can make the hemispherical positioning block 407 use the pressure exerted by the U-shaped positioning rod 402 to be compressed into the connecting groove 405), so as the L-shaped slide plate 404 moves, the hemispherical positioning block 407 moves synchronously close to the connecting groove 405, and when the hemispherical positioning block 407 moves to the opposite side of the connecting groove 405, due to the increase in space, the pressure exerted by the U-shaped positioning rod 402 on the hemispherical positioning block 407 disappears, and under the elastic force of the first elastic telescopic column 406, the hemispherical positioning block 407 can be pushed in the opening direction of the positioning groove 403, and finally the hemispherical positioning block 407 can be clamped in the inside of the positioning groove 403, and the position of the L-shaped slide plate 404 after sliding is limited, and the shape design of the hemispherical positioning block 407 can facilitate the staff to release the clamping relationship later, so as to take the ultra-narrow laser emitter.

[0076] Please refer to the above working process Figures 1 to 11 .

[0077] The following is the working process of the angle adjustment mechanism 5 adjusting the angle of reflection formed by the laser and the reflector 2: After the staff places the ultra-narrow laser transmitter on the placement rack 401 and places it stably, Figures 5 to 9As shown, the staff can drive the threaded rod 502 to rotate on the top block 503 toward one end of the reflector 2 by rotating the threaded rod 502. Since the reflector 2 is fixedly mounted on the mounting plate 514 and the top block 503 is in contact with the mounting plate 514, when the threaded rod 502 rotates, the top block 503 can be driven to move synchronously in the direction of the mounting plate 514, and through the contact between the top block 503 and the mounting plate 514, the mounting plate 514 can be pushed synchronously under the pushing action of the top block 503. Since the side plate 507 is symmetrically fixedly provided with the threaded rod 502 as the center on one side of the fixed plate 501 facing the mounting plate 514, the connecting plates 504 are symmetrically fixedly provided on both sides of the top block 503, and the sliding block 505 is fixedly connected to the connecting plate 504. The opposite sides of the side plates 507 are provided with sliding grooves 508 slidably connected to the sliding block 505, and the sliding block 505 and The first spring 506 is symmetrically fixedly connected between the slide grooves 508. Therefore, when the threaded rod 502 is threadedly rotated on the fixed plate 501 and rotated on the top block 503, the slider 505 will slide synchronously inside the slide groove 508 to cooperate with the movement of the top block 503, so that the top block 503 moves toward the direction of the mounting plate 514 in a linear motion, thereby limiting the movement of the top block 503 and preventing the top block 503 from rotating synchronously with the threaded rod 502. When the threaded rod 502 pushes the top block 503 to move, as the slider 505 slides, the first spring 506 on the side of the slider 505 close to the mounting plate 514 is compressed, while the first spring 506 on the side of the slider 505 away from the mounting plate 514 is stretched. The design of the first spring 506 can facilitate the subsequent resetting of the top block 503. Figure 6 and Figure 7As shown, when the top block 503 pushes the mounting plate 514, since the bottom of the mounting plate 514 is fixedly connected with a rotating shaft 515, the lower end of the fixed plate 501 is fixedly provided with a bottom plate 516, and the rotating shaft 515 is rotatably connected to the bottom plate 516, as one end of the mounting plate 514 is pushed, the mounting plate 514 is caused to rotate on the bottom plate 516 with the rotating shaft 515 as the axis. At the same time, since the end of the fixed plate 501 away from the threaded rod 502 is fixedly connected with the second elastic telescopic column 509 arranged toward the mounting plate 514, and the end of the second elastic telescopic column 509 facing the mounting plate 514 is fixedly connected with the linkage plate 510, the linkage plate 510 is symmetrically provided with two ear plates 511, and a torsion spring shaft 512 is rotatably provided between the two ear plates 511, and the outer surface of the torsion spring shaft 512 is fixedly connected with a linkage block 513 which is slidably connected to the end of the mounting plate 514 away from the top block 503. When one end is pushed out and the rotating shaft 515 rotates on the bottom plate 516, the other end of the mounting plate 514 rotates synchronously in the direction of the fixed plate 501. At this time, the second elastic telescopic column 509 is pushed to shrink by the movement of the mounting plate 514 to cooperate with the rotation movement of the mounting plate 514. Since the threaded rod 502 has a self-locking function, the pushing distance of the top block 503 can be effectively limited. Therefore, the rotation angle of the mounting plate 514 through the rotating shaft 515 can also be limited. The reflector 2 is fixedly installed on the side surface of the mounting plate 514 away from the fixed plate 501. Therefore, with the rotation of the mounting plate 514, the angle of the reflector 2 is synchronously adjusted, thereby realizing the adjustment of the reflection angle between the laser and the reflector 2, so that the staff can quickly and accurately adjust the angle of the reflector 2 according to actual needs, thereby meeting diverse test requirements and improving the flexibility and adaptability of the test.

[0078] Please refer to the above working process Figures 1 to 11 .

[0079] The following is the working process of the shaking cleaning mechanism 6 shaking to remove contaminants from the reflective surface of the reflector 2: Before the reflector 2 is used, the reflective surface of the reflector 2 can be pre-cleaned by the shaking cleaning mechanism 6 set on the mounting plate 514, such as Figure 5As shown, when in use, the micro motor 602 can be started to drive the reciprocating screw 603 fixedly connected to its output end to rotate synchronously with the U-shaped support frame 601. Since the U-shaped support frames 601 are symmetrically arranged on both sides of the mounting plate 514, and each U-shaped support frame 601 is rotatably connected to a reciprocating screw 603, and the two reciprocating screws 603 are connected to each other through a transmission member 604 (it should be noted that the transmission member 604 is composed of two transmission wheels and a transmission belt connected between the two transmission wheels, and the two transmission wheels are respectively fixed to each other. The micro motor 602 is connected to the outer surface of the lower end of the two reciprocating screw rods 603. When the micro motor 602 drives one of the reciprocating screw rods 603 to rotate, the transmission wheel installed on the reciprocating screw rod 603 rotates synchronously. Through the transmission connection of the transmission belt, the other transmission wheel and the reciprocating screw rod 603 fixedly connected to the axis can be driven to rotate synchronously). Therefore, when one of the reciprocating screw rods 603 rotates, the transmission setting of the transmission member 604 can drive the other reciprocating screw rod 603 to rotate synchronously. Since a movable plate 605 is threadedly connected between the two reciprocating screw rods 603, as shown in FIG. Figure 5 , Fig.10 as well as Fig.11As shown, a mounting groove 609 is provided on the side of the movable plate 605 facing the reflector 2, and a soft brush 607 is slidably provided on the bottom wall of the mounting groove 609, a bending frame 610 is fixedly connected to one of the U-shaped support frames 601, and a plurality of squeezing balls 611 are fixedly provided at equal intervals on the side of the bending frame 610 facing the soft brush 607, and a pressure ball 608 adapted to the squeezing ball 611 is fixedly provided on the side of the soft brush 607 facing the bending frame 610, and a third elastic telescopic column 606 is fixedly connected between the side of the soft brush 607 away from the pressure ball 608 and the groove wall of the mounting groove 609 (it should be noted that the bending frame 610 is a symmetrical structure, and its top and bottom are both L-shaped structures, and the two L-shaped structures are fixedly formed by a vertical plate, and the vertical plate It is located within the opening range of the installation groove 609, and the vertical plate is arranged close to the soft brush 607, for installing the squeezing ball 611 so as to cooperate with the pressure ball 608. In addition, initially, the soft brush 607 should be located above the reflector 2, and the soft brush 607 does not fit the reflective surface of the reflector 2. When the soft brush 607 moves subsequently, the soft brush 607 gradually moves down and begins to fit the reflective surface of the reflector 2). Therefore, when the two reciprocating screws 603 rotate synchronously, the movable plate 605 threadedly arranged between their outer surfaces will follow the movement and move on the outer surface of the reciprocating screw 603, so as to change the vertical position of the soft brush 607. When the soft brush 607 moves, it will gradually form a fit with the reflective surface of the reflector 2. In this state, the soft-bristle brush 607 is used to move vertically to clean the reflective surface of the reflector 2 accordingly, ensuring that the surface of the reflector 2 is clean and free of dirt, thereby improving the clarity and contrast of the imaging and preventing the contaminants accumulated for a long time from eroding the surface of the reflector 2 and affecting its optical performance and stability. Through the design of the pressurized ball 608 and the plurality of squeeze balls 611, in the process of the moving plate 605 moving in coordination with the soft-bristle brush 607, the pressurized ball 608 will gradually approach the squeeze ball 611. Since the pressurized ball 608 and the squeeze ball 611 are both configured as hemispherical structures, their outer surfaces are both slippery surfaces, and the position of the squeeze ball 611 is fixed, while the position of the pressurized ball 608 is movable, when the pressurized ball 608 moves to the squeeze ball 611, the pressurized ball 608 will Under the squeezing of the squeezing ball 611, the soft brush 607 slides on the movable plate 605 in the direction away from the bending frame 610. At this time, the third elastic telescopic column 606 will be compressed, and as the movable plate 605 continues to move, the compressed ball 608 will gradually lose contact with the squeezing ball 611. As the squeezing force disappears, the elastic force of the third elastic telescopic column 606 will push the soft brush 607 to slide on the movable plate 605 in the direction close to the bending frame 610, and the position of the soft brush 607 is restored, thereby realizing the lateral position change of the soft brush 607 and correspondingly cleaning the reflecting surface of the reflector 2. The design can change the lateral position of the soft brush 607 while changing the position of the soft brush 607 vertically.The soft brush 607 is made to vibrate horizontally when moving vertically, which can further improve the cleaning effect of the reflective surface of the reflector 2.

[0080] Please refer to the above working process Figures 1 to 11 .

[0081] The circuits and controls involved in the present invention are all prior art and will not be described in detail here.

[0082] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. An ultra-narrow laser emission test device, comprising an optical platform (1), a test plate (3) being fixedly connected to the top of the optical platform (1), and a reflector (2) being further arranged on the top of the optical platform (1), characterized in that: It also includes: a collimator stabilizing mechanism (4) for stabilizing the position of the ultra-narrow laser emitter; an angle adjusting mechanism (5) for adjusting the angle of reflection formed by the laser and the reflector (2); and a shaking cleaning mechanism (6) for shaking to remove contaminants on the reflective surface of the reflector (2); The collimator stabilizing mechanism (4) comprises a placement frame (401) fixedly connected to the top of the optical platform (1), a push plate (408) is arranged at the bottom of the placement frame (401), oblique grooves (409) are symmetrically and equidistantly provided on the push plate (408), through grooves (412) are symmetrically and equidistantly provided on the placement frame (401), a sliding column (410) is slidably connected between the oblique groove (409) and the through groove (412), and a positioning plate (411) is fixedly connected to the sliding column (410); A U-shaped positioning rod (402) is fixedly connected to the top of the placement rack (401), and positioning grooves (403) are symmetrically provided on both sides of the U-shaped positioning rod (402). L-shaped slide plates (404) are symmetrically fixedly connected to the two sides of the push plate (408), and the L-shaped slide plate (404) is slidably connected to the placement rack (401). A connecting groove (405) is provided on the side of the L-shaped slide plate (404) facing the U-shaped positioning rod (402), and a first elastic telescopic column (406) is fixedly connected to the bottom wall of the connecting groove (405), and a hemispherical positioning block (407) is fixedly connected to one end of the first elastic telescopic column (406) facing the positioning groove (403), and the hemispherical positioning block (407) is adapted to the positioning groove (403).

2. The ultra-narrow laser emission test device according to claim 1, characterized in that: The angle adjustment mechanism (5) comprises a fixing plate (501) fixedly connected to the top of one end of the optical platform (1) away from the placement frame (401); a bottom plate (516) is fixedly connected to the lower end of the fixing plate (501) on the side facing the placement frame (401); a rotating shaft (515) is rotatably connected to the bottom plate (516); a mounting plate (514) is fixedly connected to the top of the rotating shaft (515); and the reflector (2) is fixedly connected to the side of the mounting plate (514) away from the fixing plate (501).

3. The ultra-narrow laser emission test device according to claim 2, characterized in that: The fixing plate (501) is threadedly connected with a threaded rod (502); one end of the threaded rod (502) facing the mounting plate (514) is rotatably connected with a top block (503), and the top block (503) contacts the mounting plate (514); two sides of the top block (503) are symmetrically fixedly connected with connecting plates (504); opposite sides of the connecting plates (504) are fixedly connected with sliders (505); one side of the fixing plate (501) facing the mounting plate (514) is symmetrically fixedly connected with side plates (507) with the threaded rod (502) as the center; the opposite sides of the side plates (507) are provided with sliding grooves (505) slidably connected with the sliders (505). 8), first springs (506) are fixedly connected between both sides of the slider (505) and the slide groove (508), a second elastic telescopic column (509) is also fixedly connected to the fixed plate (501), one end of the second elastic telescopic column (509) facing the mounting plate (514) is fixedly connected to a linkage plate (510), ear plates (511) are symmetrically fixedly connected to the linkage plate (510), a torsion spring shaft (512) is rotatably connected between the ear plates (511), a linkage block (513) is fixedly connected to the outer surface of the torsion spring shaft (512), and the linkage block (513) is slidably connected to one end of the mounting plate (514) away from the top block (503).

4. The ultra-narrow laser emission test device according to claim 1, characterized in that: The shaking cleaning mechanism (6) comprises a U-shaped support frame (601) symmetrically fixedly connected to both sides of the mounting plate (514), the U-shaped support frame (601) being rotatably connected to a reciprocating screw (603), a transmission member (604) being transmission-connected between the reciprocating screws (603), a micro motor (602) being fixedly connected to the top of one of the U-shaped support frames (601), and an output end of the micro motor (602) being fixedly connected to one of the reciprocating screws (603), a movable plate (605) being threadedly connected between the reciprocating screws (603), a mounting groove (609) being provided on a side of the movable plate (605) facing the reflector (2), a soft brush (607) being slidably connected to the inner bottom wall of the mounting groove (609), and the soft brush (607) being in contact with the surface of the reflector (2).

5. The ultra-narrow laser emission test device according to claim 4, characterized in that: A bending frame (610) is fixedly connected to one of the U-shaped support frames (601); a squeezing ball (611) is fixedly connected equidistantly to a side of the bending frame (610) facing the soft brush (607); a third elastic telescopic column (606) is fixedly connected between a groove wall on a side of the mounting groove (609) away from the bending frame (610) and the soft brush (607); and a pressure ball (608) is fixedly connected to a side of the soft brush (607) facing the bending frame (610).

6. An ultra-narrow laser emission detection method, applied to an ultra-narrow laser emission test device according to any one of claims 1 to 5, characterized in that: The detection method comprises the following steps: step 1: device preparation and calibration; step 2: laser emission and signal acquisition; step 3: data processing and analysis.

7. The ultra-narrow laser emission detection method according to claim 6, characterized in that: The first step includes: connecting the circuit of the ultra-narrow laser emitter and debugging its working state, calibrating the laser emission of the ultra-narrow laser emitter, and connecting the test board (3) with the circuit of the test equipment; the second step includes: starting the ultra-narrow laser emitter, emitting ultra-narrow laser light, reflecting the laser light by using a reflector (2) so that the laser light is reflected onto the test board (3), and using the connected test equipment to collect in real time the spectrum signal and the photoelectric conversion signal of the laser light reflected onto the test board (3).

8. The ultra-narrow laser emission detection method according to claim 7, characterized in that: The step three includes: filtering and amplifying the collected signal for preprocessing, then using a signal processor to perform spectrum analysis on the signal, calculating the key parameters of the laser line width, and finally outputting and storing the analysis results for subsequent analysis and application.

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