Self-Testing Method and System for Power Amplifier

Abstract

The present application relates to a self-checking method and system for a power amplifier. By determining the sampling frequency bandwidth of a single-stage power amplifier, the approximate sampling frequency range can be determined. Since the additional phase shift and noise suppression properties of a single-stage power amplifier are different in different bandwidth regions, the sampling frequency bandwidth of the power amplifier is divided into a first bandwidth region, a second bandwidth region, and a third bandwidth region according to the amplification factor. In fact, the product of the amplification factor and the bandwidth of most power amplifiers is a constant value. The bandwidth regions divided based on the amplification factor can bring out the better properties of a single-stage power amplifier. Generally speaking, the additional phase shift of a single-stage power amplifier in the second bandwidth region is clear and the noise suppression effect is good. Therefore, when the frequency of the sampling object is in the second bandwidth region, the sampling object can be directly sampled, which can achieve high-precision sampling of the voltage and current sampler.

Description

Technical Field

[0001] The present application relates to the technical field of power amplifiers, and particularly to a self-checking method and system for a power amplifier. Background Art

[0002] A power amplifier is a common module of electrical equipment, and power amplifiers are widely used in electrical equipment such as underwater communication transmitters, underwater acoustic transmitting transducers, measuring amplifiers, and voltage and current samplers. At present, the power amplifier of the voltage and current sampler has defects of large phase error and high noise. This is because there is an additional phase shift between the operating frequency of the voltage and current sampler and the rated frequency of the capacitor, and there is also a physical connection between the noise and the coupling of the capacitor, which results in the defect that the voltage and current sampler is difficult to meet the high-precision requirements under a high sampling bandwidth. Therefore, it is necessary to propose a self-checking method and system for a power amplifier. Summary of the Invention

[0003] Based on this, in view of the defect that the voltage and current sampler is difficult to meet the high-precision requirements under a high sampling bandwidth, it is necessary to propose a self-checking method and system for a power amplifier.

[0004] The present application provides a self-checking method for a power amplifier, including:

[0005] Receiving the frequency of a sampling object;

[0006] Dividing the sampling frequency bandwidth of the power amplifier into a first bandwidth region, a second bandwidth region, and a third bandwidth region according to the amplification factor; the first bandwidth region, the second bandwidth region, and the third bandwidth region are all continuous bandwidth intervals; the numerical values of the center frequency of the interval of the first bandwidth region, the center frequency of the interval of the second bandwidth region, and the center frequency of the interval of the third bandwidth region increase in sequence;

[0007] Judging whether the frequency of the sampling object is in the second bandwidth region;

[0008] If the frequency of the sampling object is in the second bandwidth region, directly sampling the sampling object;

[0009] If the frequency of the sampling object is not in the second bandwidth region, judging whether the frequency of the sampling object is in the first bandwidth region;

[0010] If the frequency of the sampling object is in the first bandwidth region, selecting the maximum frequency number in the first bandwidth region;

[0011] If the frequency of the sampling object is not in the first bandwidth region, selecting the minimum frequency number in the third bandwidth region.

[0012] The present application provides a self-checking system for a power amplifier, including:

[0013] A single-chip microcomputer is used to execute the self-checking method of the above-mentioned power amplifier;

[0014] A power amplifier is electrically connected to the single-chip microcomputer.

[0015] This application relates to a self-checking method and system for a power amplifier. By determining the sampling frequency bandwidth of a single-stage power amplifier, the approximate sampling frequency range can be determined. Since the additional phase shift and noise suppression properties of a single-stage power amplifier are different in different bandwidth regions, the sampling frequency bandwidth of the power amplifier is divided into a first bandwidth region, a second bandwidth region, and a third bandwidth region according to the amplification factor. In fact, the product of the amplification factor and the bandwidth of most power amplifiers is a constant value. The bandwidth regions divided based on the amplification factor can bring out the better properties of the single-stage power amplifier. Generally speaking, the additional phase shift of the single-stage power amplifier in the second bandwidth region is clear and the noise suppression effect is good. Therefore, when the frequency of the sampling object is in the second bandwidth region, the sampling object can be directly sampled, which can achieve high-precision sampling of the voltage and current sampler. To increase the working bandwidth region of the voltage and current sampler, when the frequency of the sampling object is in the first bandwidth region, the maximum frequency number in the first bandwidth region is selected. The minimum additional phase shift is achieved by using the minimum frequency number in the first bandwidth region. When the frequency of the sampling object is in the third bandwidth region, the minimum frequency number in the third bandwidth region is selected. Noise suppression is achieved based on the minimum frequency number in the third bandwidth region. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a schematic flowchart of a self-checking method for a power amplifier provided by an embodiment of this application.

[0017] Figure 2 It is a graph showing the relationship between the total phase offset and the input frequency of a self-checking method for a power amplifier provided by an embodiment of this application.

[0018] Figure 3 It is a structural diagram of a self-checking system for a power amplifier provided by an embodiment of this application.

[0019] REFERENCE SIGNS:

[0020] 100 - single-chip microcomputer; 200 - power amplifier; 210 - body; 220 - bypass capacitor; 230 - power supply. DETAILED DESCRIPTION

[0021] In order to make the objectives, technical solutions and advantages of this application clearer, the following further elaborates on this application in conjunction with the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not used to limit this application.

[0022] This application provides a self-checking method for a power amplifier.

[0023] As Figure 1 shown, in an embodiment of the present application, a self-checking method for a power amplifier includes:

[0024] S100, receiving the frequency of the sampling object.

[0025] S200, dividing the sampling frequency bandwidth of the power amplifier into a first bandwidth region, a second bandwidth region, and a third bandwidth region according to the amplification factor.

[0026] Specifically, the first bandwidth region, the second bandwidth region, and the third bandwidth region are all continuous bandwidth intervals. The numerical values of the center frequencies of the intervals of the first bandwidth region, the center frequencies of the intervals of the second bandwidth region, and the center frequencies of the intervals of the third bandwidth region increase in sequence.

[0027] S300, determining whether the frequency of the sampling object is in the second bandwidth region.

[0028] S400, if the frequency of the sampling object is in the second bandwidth region, directly sampling the sampling object.

[0029] S500, if the frequency of the sampling object is not in the second bandwidth region, determining whether the frequency of the sampling object is in the first bandwidth region.

[0030] S600, if the frequency of the sampling object is in the first bandwidth region, selecting the maximum frequency number in the first bandwidth region.

[0031] S700, if the frequency of the sampling object is not in the first bandwidth region, selecting the minimum frequency number in the third bandwidth region.

[0032] The present application relates to a self-checking method and system for a power amplifier. By determining the sampling frequency bandwidth of a single-stage power amplifier, the approximate sampling frequency range can be determined. Since the additional phase shift and noise suppression properties of a single-stage power amplifier are different in different bandwidth regions, the sampling frequency bandwidth of the power amplifier is divided into a first bandwidth region, a second bandwidth region, and a third bandwidth region according to the amplification factor. In fact, the product of the amplification factor and the bandwidth of most power amplifiers is a constant value. The bandwidth regions divided based on the amplification factor can give play to the better properties of a single-stage power amplifier. Generally speaking, the additional phase shift of a single-stage power amplifier in the second bandwidth region is clear and the noise suppression effect is good. Therefore, when the frequency of the sampling object is in the second bandwidth region, the sampling object can be directly sampled, which can achieve high-precision sampling of the voltage and current sampler. In order to increase the working bandwidth region of the voltage and current sampler, when the frequency of the sampling object is in the first bandwidth region, the maximum frequency number in the first bandwidth region is selected. The minimum additional phase shift is achieved by using the minimum frequency number in the first bandwidth region. When the frequency of the sampling object is in the third bandwidth region, the minimum frequency number in the third bandwidth region is selected. Noise suppression is achieved based on the minimum frequency number in the third bandwidth region.

[0033] In an embodiment of the present application, S200 includes:

[0034] S211, simplifying the power amplifier by using Thevenin's theorem; after the power amplifier is simplified, it includes a current source and a voltage source.

[0035] S212, generating an amplification factor function in the loaded state based on the schematic diagram of the simplified power amplifier.

[0036] S213, segmenting the bandwidth interval for the amplification factor function in the loaded state.

[0037] Specifically, the bandwidth interval is segmented by using the amplification factor function. The segmentation points can be predetermined amplification factor threshold points, such as 0 to 10 times, 10 times to 30 times, 30 times to 50 times, and so on.

[0038] S214, generating a first bandwidth region, a second bandwidth region, and a third bandwidth region.

[0039] Specifically, the first bandwidth region, the second bandwidth region, and the third bandwidth region are all continuous bandwidth intervals. The numerical values of the center frequency of the interval of the first bandwidth region, the center frequency of the interval of the second bandwidth region, and the center frequency of the interval of the third bandwidth region increase in sequence.

[0040] S215, defining the first bandwidth region as the low-frequency bandwidth region.

[0041] S216, defining the second bandwidth region as the intermediate-frequency bandwidth region.

[0042] S217, define the third bandwidth region as the high-frequency bandwidth region.

[0043] Specifically, the first bandwidth region, the second bandwidth region, and the third bandwidth region are actually continuous frequency value intervals. Since the product of the bandwidth and the amplification factor is a constant value, and the amplification factor is the gain of the power amplifier, the characteristic that the product of the bandwidth and the amplification factor is a constant value can be used to exhibit the relatively stable working characteristics of the power amplifier. And the amplification factor function in the load-bearing state is a continuous inverse proportional function, so the first bandwidth region, the second bandwidth region, and the third bandwidth region are continuous frequency value intervals.

[0044] In an embodiment of the present application, S200 further includes:

[0045] S221, extract the bypass capacitance of the power amplifier and the inter-electrode capacitance of the transistor of the power amplifier in the second bandwidth region.

[0046] Specifically, a triode is composed of two PN junctions, and the included emitter junction and collector junction both have capacitance effects. The capacitance effect of the triode has a direct relationship with the operating frequency of the triode. When the operating frequency of the triode is low, its influence can be ignored, but at high frequencies, the capacitive reactance of the capacitance effect decreases, thereby affecting the amplification factor and phase, resulting in a decrease in the current amplification factor β and an increase in the additional phase shift. At higher operating frequencies, the influence of the additional phase shift is obvious.

[0047] S222, determine whether the bypass capacitance is an electrical component in parallel with the voltage source in the simplified schematic diagram of the power amplifier.

[0048] S223, if the bypass capacitance is not an electrical component in parallel with the voltage source in the simplified schematic diagram of the power amplifier, then feedback the information of matching failure. The matching failure means that the second bandwidth region of this power amplifier cannot perform the signal amplification task.

[0049] Specifically, if the bypass capacitance is not an electrical component in parallel with the voltage source in the simplified schematic diagram of the power amplifier, the capacitive reactance effect of the bypass capacitance will affect the amplification factor of the power amplifier, thereby affecting the determination of the frequency for the efficient operation of the power amplifier. This will lead to uncertainty in the phase shift amount in the second bandwidth region, and further reduce the working frequency matching accuracy of the voltage-current sampler.

[0050] S224, if the bypass capacitance is an electrical component in parallel with the voltage source in the simplified schematic diagram of the power amplifier, then further determine whether the inter-electrode capacitance is an electrical component in series with the current source in the simplified schematic diagram of the power amplifier.

[0051] S225, if the inter-electrode capacitance is an electrical component in series with the current source in the simplified schematic diagram of the power amplifier, then define the second bandwidth region as the working interval.

[0052] Specifically, when operating from low frequency to medium frequency, the current amplification factor β of the triode is a constant. At this time, the influence of the junction capacitance on the circuit is relatively small and can be regarded as an open circuit state. However, as the frequency increases, the shunt effect of the junction capacitance increases, resulting in a decrease in β, which means that the amplification ability of the triode decreases with the increase of frequency.

[0053] Simply put, when the operating frequency of the triode is low, the inter-electrode capacitance is an electrical component in series with the current source in the simplified schematic diagram of the power amplifier.

[0054] S226, if the inter-electrode capacitance is not an electrical component in series with the current source in the simplified schematic diagram of the power amplifier, then the information of feedback matching failure.

[0055] Specifically, currently, the current amplification factor β of most power amplifiers is a constant. The common-emitter cut-off frequency refers to the frequency corresponding to when β drops to 70.7% of the maximum value. This parameter is an important indicator to measure the frequency response of the triode and directly affects the performance of the triode in high-frequency applications.

[0056] Simply put, the maximum threshold of the intermediate frequency is the frequency corresponding to when it is at 70.7% of the current amplification factor β.

[0057] When the intermediate frequency is greater than this threshold, the influence of the inter-electrode capacitance cannot be ignored, which will directly lead to inaccurate measurement of the phase offset of the power amplifier.

[0058] Therefore, when the second bandwidth region is the working range, sampling the sampling object that conforms to the frequency of the second bandwidth region, the sampling accuracy is appropriate.

[0059] In an embodiment of the present application, S200 further includes:

[0060] S231, based on the capacitive reactance formula, determine the first capacitance value of the inter-electrode capacitance of the transistor of the power amplifier in the first bandwidth region.

[0061] Specifically, at the low-frequency operating frequency, the larger the first capacitance value of the inter-electrode capacitance, the more likely it is to affect the measured value of the phase offset of the transistor of the power amplifier, and thus the sampling accuracy of the voltage-current sampler.

[0062] S232, determine whether the first capacitance value is less than the first capacitance threshold.

[0063] Specifically, the selection of the first capacitance threshold is related to the cut-off frequency and characteristic frequency of the transistor selected for the power amplifier. The main purpose is to ensure that the transistor of the power amplifier has good amplification performance within the operating frequency range and ensure that the corresponding value of the first capacitance value of the transistor of the power amplifier avoids the mutation region of the characteristic curve of the triode.

[0064] S233. If the first capacitance value is greater than or equal to the first capacitance threshold, determine that the first bandwidth region is a non-operating interval.

[0065] S234. If the first capacitance value is less than the first capacitance threshold, calculate the phase shift relationship formula of the input frequency with respect to the bypass capacitor.

[0066] S235. Associate the bypass capacitor with the frequency of the first bandwidth region.

[0067] Specifically, in the first bandwidth region, the parameter affecting the sampling accuracy is the additional displacement phase.

[0068]

[0069] Among them, θ is the additional displacement phase, arctan is the inverse trigonometric function, f is the frequency of the object to be sampled, and f L is the frequency associated with the bypass capacitor and the first bandwidth region. Formula 1 is the phase shift relationship formula of the input frequency with respect to the bypass capacitor.

[0070] The formula for associating the bypass capacitor with the frequency of the first bandwidth region is:

[0071]

[0072] Among them, R1 is the internal resistance of the voltage source of the body, R2 is the internal resistance of the current source of the body, and C is the bypass capacitor.

[0073] Actually, in order to make the additional displacement phase as small as possible, the capacitance value of the bypass capacitor can be adjusted. Adjusting the capacitance value of the bypass capacitor can also achieve accurate calculation of the additional displacement phase.

[0074] In an embodiment of the present application, S200 further includes:

[0075] S241. Based on the capacitive reactance formula, determine the second capacitance value of the bypass capacitor of the power amplifier.

[0076] S242. Determine whether the second capacitance value is less than the second capacitance threshold.

[0077] Specifically, in the third bandwidth region, the smaller the bypass capacitor, for the bypass capacitor connected in parallel to the circuit, the greater the impedance affects the circuit effect, and the easier it is to generate noise interference.

[0078] Therefore, if the second capacitance value is less than the second capacitance threshold, the third bandwidth region of the power amplifier is not suitable as a sampling working area.

[0079] S243. If the second capacitance value is less than the second capacitance threshold, determine that the third bandwidth region is a non-operating interval.

[0080] S244. If the second capacitance value is greater than or equal to the second capacitance threshold, calculate the phase shift relationship of the input frequency with respect to the interelectrode capacitance.

[0081] S245. Associate the interelectrode capacitance with the frequency of the third bandwidth region.

[0082] Specifically, when the bypass capacitance can be ignored, the phase shift relationship of the input frequency with respect to the interelectrode capacitance is a piecewise linear function relationship related to the amplification factor.

[0083] Formula for associating the interelectrode capacitance with the frequency of the third bandwidth region:

[0084]

[0085] where f H is the frequency associated with the interelectrode capacitance and the third bandwidth region, and C1 is the interelectrode capacitance.

[0086] In an embodiment of the present application, before S300, it includes:

[0087] S310. Call the amplification factor function in the loaded state, the frequency of the bypass capacitance and the first bandwidth region, and the frequency of the interelectrode capacitance and the third bandwidth region.

[0088] S320. Based on the relationship between the bandwidth and the amplification factor, determine the constant of the bandwidth and the amplification factor.

[0089] S330. Use the constant of the bandwidth and the amplification factor to generate the amplification factor threshold of the first bandwidth region, the second bandwidth region or the third bandwidth region.

[0090] Specifically, the relationship between the bandwidth and the amplification factor:

[0091]

[0092] where A is the amplification factor and C k is the self-inductance capacitance of the power amplifier.

[0093] As Figure 2 can be seen, in the high-frequency environment where the maximum threshold above the intermediate frequency is the frequency corresponding to 70.7% of the current amplification factor β,

[0094] f = f H The total phase shift of the sampling result is -225 degrees.

[0095] f >> f H The total phase shift of the sampling result is -270 degrees.

[0096] These offsets can be accurately calculated, so errors can be effectively avoided.

[0097] In an embodiment of the present application, the self-checking method of the power amplifier further includes S800, and S800 includes:

[0098] S810, receiving multi-stage power amplifier parameters.

[0099] S820, analyzing the frequencies of the bypass capacitors at all levels and the first bandwidth region, and the frequencies of the inter-stage capacitors at all levels and the third bandwidth region.

[0100] S830, generating a correction coefficient for the frequency of the bypass capacitor and the first bandwidth region, and a compensation coefficient for the frequency of the inter-stage capacitor and the third bandwidth region.

[0101] Specifically, the analysis result is:

[0102]

[0103] Among them, f Lk is the frequency of the associated bypass capacitor of the Kth stage and the first bandwidth region.

[0104] f Hk is the frequency of the associated inter-stage capacitor of the Kth stage and the third bandwidth region.

[0105] It can also be known that as the number of stages increases, the bandwidth frequencies of higher stages are successively greater than those of lower stages.

[0106] The compensation coefficient and the correction coefficient can be obtained from Equation 5:

[0107] Compensation coefficient:

[0108]

[0109] Among them, G1 is the compensation coefficient, and n is a positive integer.

[0110] Correction coefficient:

[0111]

[0112] Among them, G2 is the correction coefficient, and n is a positive integer.

[0113] The present application provides a self-checking system for a power amplifier.

[0114] Such as Figure 3As shown, in an embodiment of the present application, a self-checking system for a power amplifier includes a single-chip microcomputer 100 and a power amplifier 200. The single-chip microcomputer 100 is used to execute the self-checking method of the power amplifier. The power amplifier 200 is electrically connected to the single-chip microcomputer 100. The power amplifier 200 includes a body 210, a bypass capacitor 220, and a power supply 230. The bypass capacitor 220 is electrically connected to the body 210. The power supply 230 is electrically connected to the body 210. The bypass capacitor 220 is a variable bypass capacitor. The power supply 230 is a variable-frequency power supply.

[0115] Specifically, the power supply 230 includes a voltage source and a current source.

[0116] The present application relates to a self-checking system for a power amplifier. The single-chip microcomputer 100 can determine a general sampling frequency range by determining the sampling frequency bandwidth of the single-stage power amplifier 200. Since the additional phase shift and noise suppression properties of the single-stage power amplifier are different in different bandwidth regions, the sampling frequency bandwidth of the power amplifier 200 is divided into a first bandwidth region, a second bandwidth region, and a third bandwidth region according to the amplification factor. In fact, the product of the amplification factor and the bandwidth of most power amplifiers 200 is a constant value. The bandwidth regions divided based on the amplification factor can give full play to the better properties of the single-stage power amplifier. Generally speaking, the additional phase shift of the single-stage power amplifier in the second bandwidth region is clear, and the noise suppression effect is good. Therefore, when the frequency of the sampling object is in the second bandwidth region, the sampling object can be directly sampled, which can achieve high-precision sampling of the voltage and current sampler. In order to increase the working bandwidth region of the voltage and current sampler, when the frequency of the sampling object is in the first bandwidth region, the maximum frequency number in the first bandwidth region is selected. The minimum additional phase shift is achieved by using the minimum frequency number in the first bandwidth region. When the frequency of the sampling object is in the third bandwidth region, the minimum frequency number in the third bandwidth region is selected. Noise suppression is achieved based on the minimum frequency number in the third bandwidth region.

[0117] The technical features of the above-described embodiments can be combined arbitrarily, and there is no limitation on the execution order of the method steps. For the sake of brevity of description, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope described in this specification.

[0118] The above-described embodiments only represent several implementation manners of the present application. Their descriptions are relatively specific and detailed, but they should not be construed as limiting the patent scope of the present application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several deformations and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

Claims

1. A self-checking method for a power amplifier, characterized in that, Including: Receiving the frequency of the sampling object; Dividing the sampling frequency bandwidth of the power amplifier into a first bandwidth region, a second bandwidth region, and a third bandwidth region according to the amplification factor; the first bandwidth region, the second bandwidth region, and the third bandwidth region are all continuous bandwidth intervals; the dividing the sampling frequency bandwidth of the power amplifier into a first bandwidth region, a second bandwidth region, and a third bandwidth region includes simplifying the power amplifier using Thevenin's theorem; the simplified power amplifier includes a current source and a voltage source; based on the schematic diagram of the simplified power amplifier, generating an amplification factor function in the loaded state; for the amplification factor function in the loaded state, segmenting and cutting the bandwidth intervals of the sampling frequency bandwidth of the power amplifier; generating a first bandwidth region, a second bandwidth region, and a third bandwidth region; defining the first bandwidth region as a low-frequency bandwidth region; defining the second bandwidth region as a medium-frequency bandwidth region; defining the third bandwidth region as a high-frequency bandwidth region; extracting the bypass capacitor of the power amplifier and the inter-electrode capacitance of the transistor of the power amplifier in the second bandwidth region; determining whether the bypass capacitor is an electrical component in parallel with the voltage source in the schematic diagram of the simplified power amplifier; if the bypass capacitor is not an electrical component in parallel with the voltage source in the schematic diagram of the simplified power amplifier, then feedback information of matching failure; the matching failure means that the second bandwidth region of the power amplifier cannot perform the signal amplification task; if the bypass capacitor is an electrical component in parallel with the voltage source in the schematic diagram of the simplified power amplifier, then further determining whether the inter-electrode capacitance is an electrical component in series with the current source in the schematic diagram of the simplified power amplifier; if the inter-electrode capacitance is an electrical component in series with the current source in the schematic diagram of the simplified power amplifier, then defining the second bandwidth region as the working interval; if the inter-electrode capacitance is not an electrical component in series with the current source in the schematic diagram of the simplified power amplifier, then feedback information of matching failure; based on the capacitive reactance formula, determining the first capacitance value of the inter-electrode capacitance of the transistor of the power amplifier in the first bandwidth region; determining whether the first capacitance value is less than the first capacitance threshold; If the first capacitance value is greater than or equal to the first capacitance threshold, then determining the first bandwidth region as a non-working interval; if the first capacitance value is less than the first capacitance threshold, then calculating a phase shift relationship formula for the bypass capacitor; based on the capacitive reactance formula, determining the second capacitance value of the bypass capacitor of the power amplifier; determining whether the second capacitance value is less than the second capacitance threshold; If the second capacitance value is less than the second capacitance threshold, then determining the third bandwidth region as a non-working interval; If the second capacitance value is greater than or equal to the second capacitance threshold, then calculating a phase shift relationship formula for the inter-electrode capacitance; the numerical values of the center frequencies of the intervals of the first bandwidth region, the second bandwidth region, and the third bandwidth region increase in sequence; Determining whether the frequency of the sampling object is within the second bandwidth region; If the frequency of the sampling object is within the second bandwidth region, then directly sampling the sampling object; If the frequency of the sampling object is not within the second bandwidth region, then determining whether the frequency of the sampling object is within the first bandwidth region; If the frequency of the sampling object is within the first bandwidth region, select the maximum frequency value in the first bandwidth region to sample the sampling object; If the frequency of the sampling object is not within the first bandwidth region, select the minimum frequency value in the third bandwidth region to sample the sampling object.

2. The self-checking method of the power amplifier according to claim 1, characterized in that, Before determining whether the frequency of the sampling object is within the second bandwidth region, it further includes: Call the amplification factor function in the loaded state, the bypass capacitor and the frequency of the first bandwidth region, and the inter-electrode capacitance and the frequency of the third bandwidth region; Based on the relationship between the bandwidth and the amplification factor, determine the constant of the bandwidth and the amplification factor; Use the constant of the bandwidth and the amplification factor to generate the amplification factor threshold of the first bandwidth region, the second bandwidth region or the third bandwidth region.

3. The self-checking method of the power amplifier according to claim 2, characterized in that, The self-checking method of the power amplifier further includes: Receive the parameters of the multi-stage power amplifier; Analyze the bypass capacitance of each stage and the frequency of the first bandwidth region, and the inter-electrode capacitance of each stage and the frequency of the third bandwidth region; Generate the correction coefficient of the bypass capacitance and the frequency of the first bandwidth region, and the compensation coefficient of the inter-electrode capacitance and the frequency of the third bandwidth region.

4. A self-checking system for a power amplifier, characterized in that, It includes: A single-chip microcomputer for executing the self-checking method of the power amplifier according to any one of claims 1 to 3; A power amplifier electrically connected to the single-chip microcomputer.

5. The self-checking system of the power amplifier according to claim 4, characterized in that, The power amplifier includes: A body; A bypass capacitor electrically connected to the body; A power supply electrically connected to the body.

6. The self-checking system of the power amplifier according to claim 5, wherein The bypass capacitor is a variable bypass capacitor; The power supply is a variable-frequency power supply.

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