Defect detection data evaluation method based on ultrasonic scanning microscope

Abstract

The present invention application discloses a defect detection data evaluation method based on an ultrasonic scanning microscope, and relates to the technical field of ultrasonic detection of ceramic material defects. The defect detection data evaluation method based on an ultrasonic scanning microscope includes the following steps: S1, preliminary experiment; S2, performance test; S3, judging the performance evaluation value; S4, obtaining the defect coefficient. The present invention application determines the optimal number of ultrasonic scanning microscopes through preliminary experiments, then performs performance testing on the ultrasonic scanning microscope, and then adjusts the scanning parameters of the ultrasonic scanning microscope until the performance evaluation value meets the preset working standard, and finally collects the defect data of the material to be detected through the ultrasonic scanning microscope, and obtains the defect coefficient based on this, so as to achieve a more accurate effect of performing defect detection of ceramic materials through an ultrasonic scanning microscope, and solves the problem of low data accuracy when performing defect detection of ceramic materials through an ultrasonic scanning microscope in the prior art.

Description

Technical Field

[0001] The present invention relates to the technical field of ultrasonic detection of ceramic material defects, and in particular to a defect detection data evaluation method based on an ultrasonic scanning microscope. Background Art

[0002] Ultrasonic scanning microscope is a tool that uses ultrasonic imaging technology to detect defects, realizing non-destructive detection and evaluation. During the production and use of ceramic materials, various defects such as cracks and voids may occur due to improper formulation and imperfect process. These defects will seriously affect the performance and service life of ceramic materials. Based on the transmission, reflection and refraction properties of ultrasound, when ultrasound passes through ceramic materials and encounters the interface of materials with different internal structures, echoes of different intensities will be formed. These echoes are captured by the receiver and converted into electrical signals. After processing, images of the interior of the ceramic material are generated, thereby realizing qualitative and quantitative analysis of defects.

[0003] In the prior art, by adjusting the parameters of an ultrasonic scanning microscope, the reflected or refracted waves generated when ultrasonic waves propagate inside a material are collected, thereby obtaining an image of the interior of the material, and based on this, defects are detected and evaluated, thereby achieving improved detection accuracy.

[0004] For example, the invention patent with announcement number: CN112305077B discloses a nondestructive testing method for the interface bonding quality between a bearing surface coating and a substrate, which includes the following steps: performing an A-scan using an ultrasonic scanning microscope, determining the bonding position between the surface coating and the substrate by reflected echo, performing a C-scan at the bonding position between the surface coating and the substrate, determining the qualified position and the suspicious position on the C-scan view, and determining the defective position by combining the bottom echo analysis of the A-scan and B-scan.

[0005] For example, the invention patent with announcement number: CN106226398B discloses a nondestructive testing method for the bonding surface quality of a PDC composite sheet, comprising the following steps: 1) immersing the PDC composite sheet horizontally in water with the diamond layer facing upward; 2) performing an A-scan on the PDC composite sheet, adjusting the position of the transducer so that the PDC composite sheet is located at the focus of the transducer; determining the bonding surface area of ​​the PDC composite sheet based on the reflected waveform of the A-scan; 3) performing a C-scan on the bonding surface area of ​​the PDC composite sheet, and judging the bonding surface quality of the PDC composite sheet based on the obtained ultrasonic scanning image.

[0006] However, in the process of implementing the technical solution of the invention in the embodiments of the present application, the present application found that the above technology has at least the following technical problems:

[0007] In the prior art, appropriate parameters need to be set during the detection process according to the characteristics of the ceramic material and the detection requirements. The ultrasonic waves of the ultrasonic scanning microscope are affected by environmental factors and may not be able to accurately detect defects or may lead to misjudgment. There is a problem of low data accuracy when performing ceramic material defect detection using an ultrasonic scanning microscope. Summary of the invention

[0008] The embodiment of the present application solves the problem of low data accuracy when performing defect detection of ceramic materials through ultrasonic scanning microscopes in the prior art by providing a defect detection data evaluation method based on ultrasonic scanning microscopes, thereby achieving more accurate defect detection of ceramic materials through ultrasonic scanning microscopes.

[0009] The present application provides a defect detection data evaluation method based on an ultrasonic scanning microscope, comprising the following steps: S1, conducting a preliminary experiment on an ultrasonic scanning microscope to obtain a scanning area, evaluating the number of ultrasonic scanning microscopes according to the scanning area and the total area of ​​a material to be detected, obtaining an optimal number of ultrasonic scanning microscopes, and using a sensor to record environmental data in real time, wherein the scanning area includes a repeated area and a non-repeated area, and the environmental data includes temperature and humidity; S2, performing a performance test on the ultrasonic scanning microscope to obtain a performance evaluation value, wherein the performance test includes temperature detection and humidity detection, and the performance test is used to evaluate the degree of influence of environmental factors on the performance of the ultrasonic scanning microscope; S3, judging whether the performance evaluation value meets a preset working standard, if so, executing S4, otherwise adjusting the scanning parameters of the ultrasonic scanning microscope and returning to S2 until the performance evaluation value meets the preset working standard, wherein the scanning parameters include ultrasonic frequency, gain, scanning speed and scanning resolution; S4, collecting defect data of the material to be detected by a deployed ultrasonic scanning microscope, and obtaining a defect coefficient of the material to be detected according to the defect data, wherein the defect data represents physical property data of defects of the material to be detected, wherein the defect data includes defect depth and defect area, and the defect coefficient is used to quantify the degree of defects of the material to be detected.

[0010] Furthermore, the specific process of the preliminary experiment is as follows: A1, the total area of ​​the material to be tested and the scanning resolution of the ultrasonic scanning microscope are obtained from the preset database, and the material image data of the material surface is obtained by scanning the material to be tested through the ultrasonic scanning microscope; A2, all the material image data are aligned in the preset coordinate system through the image registration algorithm, and the intersection of the material image data is obtained and recorded as the repeated area, and the difference between the material image data and the repeated area is recorded as the non-repeated area in the image, and the repeated area and the non-repeated area are obtained by numbering the pixel points of each repeated area and non-repeated area respectively; A3, the coverage of the ultrasonic scanning microscope is obtained according to the scanning area and the total area of ​​the material to be tested. A4, judging whether the coverage index is not less than 0, if not less than 0, executing A5, otherwise increasing the number of ultrasonic scanning microscopes until the coverage index is not less than 0; A5, judging whether the coverage index is greater than a preset coverage index, if greater than the preset coverage index, reducing the number of ultrasonic scanning microscopes until the coverage index is not greater than the preset coverage index, otherwise determining that the current number of ultrasonic scanning microscopes is the optimal number, the preset coverage index represents the reference conformity between the total coverage area of ​​the material image data and the total area of ​​the material to be detected; the coverage index is calculated by the following formula:

[0011]

[0012] Where q represents the number of the pre-experiment, q = 1, 2, ..., Q, Q represents the total number of pre-experiments, qn represents the number of non-repeated regions in the qth pre-experiment, qn = q.1, q.2, ..., qN, qN represents the total number of non-repeated regions in the qth pre-experiment, qm represents the number of repeated regions in the qth pre-experiment, qm = q.1, q.2, ..., qM, qM represents the total number of repeated regions in the qth pre-experiment, BC q.n represents the non-repeating area of ​​the qnth non-repeating region scanned by the ultrasonic scanning microscope in the qth pre-experiment, CF q.m represents the repeated area of ​​the qmth repeated area scanned by the ultrasonic scanning microscope in the qth preliminary experiment, A represents the total area of ​​the material to be tested, and FG q represents the coverage index of the ultrasonic scanning microscope in the qth preliminary experiment, N is a positive integer, and M is a positive integer.

[0013] Furthermore, the specific process of performance testing is as follows: temperature testing is performed on the ultrasonic scanning microscope to obtain first detection data, and the obtained first detection data are arranged in order to obtain a temperature sequence, wherein the first detection data represents the performance data of the ultrasonic scanning microscope under temperature detection, and the first detection data includes a first image noise, a first image resolution, a first scanning time, a first scanning speed, and a first ultrasonic frequency; humidity testing is performed on the ultrasonic scanning microscope to obtain second detection data, and the obtained second detection data are arranged in order to obtain a humidity sequence, wherein the second detection data represents the performance data of the ultrasonic scanning microscope under humidity detection, and the second detection data includes a second image noise, a second image resolution, a second scanning time, a second scanning speed, and a second ultrasonic frequency.

[0014] Furthermore, a specific method for acquiring the first detection data is as follows: B1, collecting a first internal image of the material to be detected through an ultrasonic scanning microscope at a preset time point in a preset time period, and the ultrasonic scanning microscope is in a first simulation environment; B2, extracting first image data in the first internal image through image analysis software, integrating the first image data with the corresponding timestamp to obtain a first image sequence, and the first image data includes a first image noise and a first image resolution; B3, recording the first scanning time in real time through a timer, and obtaining a first scanning speed in combination with the area of ​​the first internal image, and the first scanning time represents the time spent by the ultrasonic scanning microscope for scanning in temperature detection; B4, obtaining a first ultrasonic frequency of the ultrasonic scanning microscope through a spectrum analyzer.

[0015] Furthermore, a specific method for acquiring the second detection data is as follows: C1, collecting a second internal image of the material to be detected by ultrasonic scanning microscopy at a preset time point in a preset time period, and the ultrasonic scanning microscope is in a second simulation environment; C2, extracting second image data in the second internal image by image analysis software, integrating the second image data with the corresponding timestamp to obtain a second image sequence, and the second image data includes second image noise and second image resolution; C3, recording the second scanning time in real time by a timer, and obtaining a second scanning speed in combination with the area of ​​the second internal image, and the second scanning time represents the time spent by the ultrasonic scanning microscope for scanning in humidity detection; C4, obtaining a second ultrasonic frequency of the ultrasonic scanning microscope by a spectrum analyzer.

[0016] Furthermore, the performance of the ultrasonic scanning microscope is tested to obtain a performance evaluation value, which also includes obtaining an image quality coefficient, ultrasonic penetration and scanning quality coefficient of the ultrasonic scanning microscope; the specific method of obtaining the image quality coefficient is as follows: obtaining a reference noise and a reference resolution from a preset database, and combining the image noise and the image resolution to obtain the image quality coefficient of the ultrasonic scanning microscope, the image noise includes a first image noise and a second image noise, the image resolution includes a first image resolution and a second image resolution, and the image quality coefficient includes a temperature image quality coefficient and a humidity image quality coefficient; the image quality coefficient is calculated by the following formula:

[0017]

[0018] Where i is the category of the performance test, i=1,2, i=1 represents temperature test, i=2 represents humidity test, t is the number of the performance test, t=1,2,...,T, T represents the total number of performance tests, IQ i represents the image quality factor of the ultrasonic scanning microscope for the i-th performance test, FB i.t represents the image resolution of the ultrasonic scanning microscope for the tth performance test in the i-th performance test, ZY i.t represents the image noise of the ultrasonic scanning microscope for the t-th performance test in the i-th performance test, FB0 represents the reference resolution, and ZY0 represents the reference noise.

[0019] Furthermore, the specific method for obtaining ultrasonic penetrating power is as follows: obtain the preset ultrasonic frequency of the material to be detected from a preset database, and obtain the ultrasonic penetrating power of the ultrasonic scanning microscope in combination with the ultrasonic frequency. The ultrasonic penetrating power is used to describe the ability of ultrasonic waves to penetrate the material to be detected. The ultrasonic frequency includes a first ultrasonic frequency and a second ultrasonic frequency. The ultrasonic penetrating power includes temperature ultrasonic penetrating power and humidity ultrasonic penetrating power.

[0020] Furthermore, the scanning quality coefficient is specifically obtained in the following manner: the preset scanning data is obtained from the preset database, and the ultrasonic scanning microscope is evaluated in combination with the scanning time and the scanning speed to obtain the scanning quality coefficient, the preset scanning data includes the preset scanning time and the preset scanning speed, the scanning quality coefficient is used to evaluate the quality of the ultrasonic scanning microscope scanning, the scanning time includes the first scanning time and the second scanning time, the scanning speed includes the first scanning speed and the second scanning speed, the scanning quality coefficient includes the temperature scanning quality coefficient and the humidity scanning quality coefficient; the scanning quality coefficient is calculated by the following formula:

[0021]

[0022] Where, SPi represents the scanning quality factor of the ultrasonic scanning microscope in the i-th performance test, ST i.t represents the scanning time of the ultrasonic scanning microscope for the tth performance test in the i-th performance test, SD i.t represents the scanning speed of the ultrasonic scanning microscope for the t-th performance test in the i-th type performance test, ST0 represents the preset scanning time of the ultrasonic scanning microscope, and SD0 represents the preset scanning speed of the ultrasonic scanning microscope.

[0023] Furthermore, the specific method for obtaining the performance evaluation value is as follows: obtaining the performance weight from a preset database, and evaluating the ultrasonic scanning microscope according to the image quality coefficient, ultrasonic penetration and scanning quality coefficient of the ultrasonic scanning microscope to obtain the performance evaluation value, wherein the performance weight includes image weight, penetration weight and scanning weight; the performance evaluation value is calculated by the following formula:

[0024]

[0025] Where XN represents the performance evaluation value of ultrasonic scanning microscope, IQ i The image quality factor of the ultrasonic scanning microscope for the i-th performance test, PT i represents the ultrasonic penetration of the ultrasonic scanning microscope for the i-th performance test, SP i represents the scanning quality coefficient of the ultrasonic scanning microscope for the i-th type performance detection, α1 represents the image weight, α2 represents the penetration weight, and α3 represents the scanning weight.

[0026] Furthermore, the specific method of obtaining the defect coefficient is as follows: E1, using an ultrasonic scanning microscope to scan the material to be tested to obtain an internal image of the material to be tested; E2, using image analysis software to measure the defects in the internal image of the material to be tested to obtain defect data, and the defect data represents the physical property data of the defects of the material to be tested; E3, multiplying the defect depth and defect area of ​​the material to be tested in the defect data to obtain the defect coefficient of the material to be tested, and the defect coefficient is used to quantify the degree of defects in the material to be tested.

[0027] One or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages:

[0028] 1. The optimal number of ultrasonic scanning microscopes is determined through preliminary experiments, and then the performance of the ultrasonic scanning microscope is tested. Then, the scanning parameters of the ultrasonic scanning microscope are adjusted until the performance evaluation value meets the preset working standard. Finally, the defect data of the material to be tested is collected through the ultrasonic scanning microscope, and the defect coefficient of the material to be tested is obtained based on this, thereby ensuring the accuracy of the defect data, and then achieving more accurate defect detection of ceramic materials through ultrasonic scanning microscopes, effectively solving the problem of low data accuracy when performing defect detection of ceramic materials through ultrasonic scanning microscopes in the prior art.

[0029] 2. The material to be tested is scanned by an ultrasonic scanning microscope to obtain material image data on the surface of the material to be tested, and then the repeated areas and non-repeated areas are identified by the image registration algorithm. Finally, the coverage index of the ultrasonic scanning microscope is obtained through the pixel points of each repeated area and non-repeated area, thereby optimizing the utilization of ultrasonic scanning microscope resources and further improving the efficiency and accuracy of ultrasonic scanning microscope scanning.

[0030] 3. The first internal image of the material to be tested is collected by an ultrasonic scanning microscope, and then the first image data in the first internal image is extracted by image analysis software, which is integrated with the corresponding timestamp to obtain a first image sequence. The first scanning time is recorded in real time by a timer, and the first scanning speed is obtained in combination with the area of ​​the first internal image. Finally, the first ultrasonic frequency of the ultrasonic scanning microscope is obtained by a spectrum analyzer, so as to evaluate the performance of the ultrasonic scanning microscope in temperature detection, thereby achieving an improvement in the detection accuracy of the ultrasonic scanning microscope. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] Figure 1 A simplified flow chart of a defect detection data evaluation method based on an ultrasonic scanning microscope provided in an embodiment of the present application;

[0032] Figure 2 A simplified schematic diagram of the preliminary experiment provided in the embodiments of the present application;

[0033] Figure 3 A schematic diagram of the changes in performance evaluation values ​​provided in an embodiment of the present application. DETAILED DESCRIPTION

[0034] The embodiment of the present application solves the problem of low data accuracy in the prior art when performing defect detection on ceramic materials through ultrasonic scanning microscopes by providing a defect detection data evaluation method based on ultrasonic scanning microscopes. The optimal number of ultrasonic scanning microscopes is determined through preliminary experiments, and then the performance of the ultrasonic scanning microscopes is tested. Subsequently, the scanning parameters of the ultrasonic scanning microscopes are adjusted until the performance evaluation value meets the preset working standards. Finally, the defect data of the material to be detected is collected through the ultrasonic scanning microscope, and the defect coefficient of the material to be detected is obtained based on the defect data, thereby achieving more accurate defect detection of ceramic materials through ultrasonic scanning microscopes.

[0035] The technical solution in the embodiment of the present application is to solve the problem of low data accuracy when performing ceramic material defect detection by ultrasonic scanning microscope. The overall idea is as follows:

[0036] By performing performance testing on the ultrasonic scanning microscope, then adjusting the scanning parameters of the ultrasonic scanning microscope until the performance evaluation value meets the preset working standard, and finally obtaining the defect coefficient by collecting the defect data of the material to be tested, a more accurate defect detection effect of ceramic materials through ultrasonic scanning microscope is achieved.

[0037] In order to better understand the above technical solution, the above technical solution will be described in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0038] like Figure 1 FIG. 1 is a flow chart of a defect detection data evaluation method based on an ultrasonic scanning microscope provided in an embodiment of the present application, and the method comprises the following steps:

[0039] S1, conduct a preliminary experiment on the ultrasonic scanning microscope to obtain the scanning area, evaluate the number of ultrasonic scanning microscopes according to the scanning area and the total area of ​​the material to be detected, obtain the optimal number of ultrasonic scanning microscopes, and use sensors to record environmental data in real time. The scanning area includes repeated area and non-repeated area, and the environmental data includes temperature and humidity;

[0040] S2, performing a performance test on the ultrasonic scanning microscope to obtain a performance evaluation value, wherein the performance test includes a temperature test and a humidity test, and the performance test is used to evaluate the degree of influence of environmental factors on the performance of the ultrasonic scanning microscope;

[0041] S3, judging whether the performance evaluation value meets the preset working standard, if so, executing S4, otherwise adjusting the scanning parameters of the ultrasonic scanning microscope and returning to S2 until the performance evaluation value meets the preset working standard, the scanning parameters represent the technical parameters set when performing the scanning operation, and the scanning parameters include ultrasonic frequency, gain, scanning speed and scanning resolution;

[0042] S4, collecting defect data of the material to be detected through the deployed ultrasonic scanning microscope, and obtaining a defect coefficient of the material to be detected based on the defect data, the defect data represents the physical characteristic data of the defect of the material to be detected, the defect data includes defect depth and defect area, and the defect coefficient is used to quantify the defect degree of the material to be detected.

[0043] In this embodiment, a scanning acoustic microscope (SAM) refers to an instrument that uses ultrasonic technology to perform high-resolution imaging. When ultrasonic waves propagate in a material, they will reflect, refract, and other phenomena when they encounter different interfaces (such as defects, boundaries, etc.). By receiving and analyzing these signals, an image of the internal structure of the material can be formed, thereby detecting defects in the material. The scanning area represents the area that the ultrasonic scanning microscope can cover during a single scan. The performance evaluation value represents a quantitative indicator used to evaluate the performance of the ultrasonic scanning microscope under current working conditions. The steps of adjusting the scanning parameters of the ultrasonic scanning microscope include ultrasonic frequency adjustment, gain adjustment, scanning speed adjustment, and scanning resolution adjustment. The scanning parameters of the ultrasonic scanning microscope are adjusted step by step by using a trial and error method or an empirical method, and then scanned again until the performance evaluation value of the ultrasonic scanning microscope meets the preset working standards. ; The purpose of ultrasonic frequency adjustment is to improve imaging resolution and contrast; high-frequency ultrasonic waves have higher resolution but shallower penetration depth; low-frequency ultrasonic waves have greater penetration depth but lower resolution; the purpose of gain adjustment is to enhance signal strength and improve image quality. If the gain is over-amplified, noise and artifacts will be introduced; gain indicates the signal amplification factor; the purpose of scanning speed adjustment is to balance detection time and image quality; scanning speed indicates the area scanned per second; faster scanning speeds can shorten detection time but may sacrifice some image quality; the purpose of scanning resolution adjustment is to control detection accuracy and detail display; higher resolution can capture more details but may increase data processing time and storage requirements; scanning resolution indicates the minimum defect size that can be detected; more accurate defect detection of ceramic materials through ultrasonic scanning microscopes is achieved.

[0044] Further, such as Figure 2As shown, it is a flowchart of the preliminary experiment provided in the embodiment of the present application. The specific process of the preliminary experiment is as follows: A1, the total area of ​​the material to be detected and the scanning resolution of the ultrasonic scanning microscope are obtained from the preset database, and the material image data of the material surface is obtained by scanning the material to be detected by the ultrasonic scanning microscope; A2, all the material image data are aligned in the preset coordinate system through the image registration algorithm, and the intersection of the material image data is obtained and recorded as the repeated area, and the difference set of the material image data and the repeated area is recorded as the non-repeated area in the image, and the repeated area and the non-repeated area are obtained by the numbered pixel points of each repeated area and non-repeated area, respectively. The intersection of the material image data represents the area that appears at least once in all the material image data; A3, according to The scanning area and the total area of ​​the material to be detected obtain the coverage index of the ultrasonic scanning microscope, and the coverage index is used to measure the degree of conformity between the total coverage area of ​​the material image data and the total area of ​​the material to be detected; A4, determine whether the coverage index is not less than 0, if not less than 0, execute A5, otherwise increase the number of ultrasonic scanning microscopes until the coverage index is not less than 0; A5, determine whether the coverage index is greater than the preset coverage index, if greater than the preset coverage index, reduce the number of ultrasonic scanning microscopes until the coverage index is not greater than the preset coverage index, otherwise determine that the current number of ultrasonic scanning microscopes is the optimal number, and the preset coverage index represents the reference conformity between the total coverage area of ​​the material image data and the total area of ​​the material to be detected; the coverage index is calculated by the following formula:

[0045]

[0046] Where q represents the number of the pre-experiment, q = 1, 2, ..., Q, Q represents the total number of pre-experiments, qn represents the number of non-repeated regions in the qth pre-experiment, qn = q.1, q.2, ..., qN, qN represents the total number of non-repeated regions in the qth pre-experiment, qm represents the number of repeated regions in the qth pre-experiment, qm = q.1, q.2, ..., qM, qM represents the total number of repeated regions in the qth pre-experiment, BC q.n represents the non-repeating area of ​​the qnth non-repeating region scanned by the ultrasonic scanning microscope in the qth pre-experiment, CF q.m represents the repeated area of ​​the qmth repeated area scanned by the ultrasonic scanning microscope in the qth preliminary experiment, A represents the total area of ​​the material to be tested, and FG q represents the coverage index of the ultrasonic scanning microscope in the qth preliminary experiment, N is a positive integer, and M is a positive integer. For example, N can be a positive integer greater than or equal to 3, and M can be a positive integer greater than or equal to 3.

[0047] In this embodiment, the total area of ​​the material to be detected represents the total area of ​​the material surface that needs to be detected, which is determined by the preset information in the database before the ultrasonic scanning microscope scans; the scanning resolution of the ultrasonic scanning microscope represents the minimum unit area that the ultrasonic scanning microscope can distinguish; the higher the resolution, the finer the image data obtained by scanning; an image registration algorithm is used to align all material image data into a preset coordinate system; this process may involve image translation, rotation, scaling and other transformations to ensure that the same physical positions in the image are visually aligned; the coverage index represents the degree of conformity between the total coverage area of ​​the material image data and the total area of ​​the material to be detected, and is an effective indicator for measuring whether the ultrasonic scanning microscope completely covers the material to be detected; the preset coverage index represents the degree of conformity between the total coverage area of ​​the material image data and the total area of ​​the material to be detected, and is an effective indicator for measuring whether the ultrasonic scanning microscope completely covers the material to be detected; the preset coverage index represents the degree of conformity between the total coverage area of ​​the material image data and the total area of ​​the material to be detected during the deployment of the ultrasonic scanning microscope, in order to ensure The minimum coverage index value is set to ensure sufficient coverage area; by judging whether the coverage index is not less than 0, if it is not less than 0, then judging whether the coverage index reaches the preset coverage index, otherwise it means that there are areas that are not scanned by the ultrasonic scanning microscope, and the number of ultrasonic scanning microscopes needs to be increased to ensure that every part of the material surface is scanned, until the coverage index is not less than 0; by judging whether the coverage index reaches the preset coverage index, if it is greater than the preset coverage index, it means that there are redundant ultrasonic scanning microscopes, and the number of ultrasonic scanning microscopes needs to be reduced, and the use of equipment is optimized to ensure that neither important areas are missed nor unnecessary scanning is performed, until the coverage index is not greater than the preset coverage index, otherwise the current number of ultrasonic scanning microscopes is determined to be the optimal number; it is achieved that the material to be tested can be accurately and fully scanned and analyzed.

[0048] Image registration algorithm refers to a technology that aligns two or more image data sets into the same coordinate system, which is usually used to improve the comparability and analyzability of image data. The main steps of image registration include feature point detection, feature point matching, transformation model calculation, and image resampling and alignment. Feature point detection refers to the use of feature detection algorithms (such as Scale-Invariant Feature Transform, Speeded-Up Robust Features, Oriented FAST and Rotated BRIEF, etc.) to extract key points in each image. These feature points should have good repeatability and robustness to transformations such as rotation and scaling. Feature point matching refers to matching feature points in different images. By calculating the distance between feature point descriptors, similar feature point pairs can be found. To improve matching accuracy, a random sampling consensus algorithm (RANdom Sampling Consensus Algorithm) can be used. Consensus) is used to eliminate false matches; transformation model calculation means calculating the transformation matrix between images based on the matched feature point pairs; common transformation models include affine transformation, perspective transformation, etc., and the specific choice depends on the characteristics of the image and the registration requirements; by applying the calculated transformation matrix, the images are transformed into the same preset coordinate system one by one to align them in space; image resampling and alignment means applying the transformation matrix to resample and interpolate the images so that the images are accurately aligned in the preset coordinate system; this process can correct geometric deformations such as rotation, scaling, and translation between images; after aligning the images, check whether each pixel has corresponding data in the image; pixels that exist and are consistent in the image will be defined as repeated areas; non-repeated areas It refers to the unique part in each image; in mathematics, the intersection refers to the set composed of the common elements of two or more sets, and in image analysis, the intersection represents the area that appears at least once in all image data; the difference refers to the set composed of the elements that exist in one set but not in another set, and in image analysis, the difference represents the unique area in an image, that is, the part that does not appear in other images; the non-repeating area refers to the area that is obtained by calculating the difference in image analysis, which is unique to a single image and does not appear repeatedly in other images; for the convenience of management and analysis, each repeated area and non-repeating area can be numbered, and then the repeated area and non-repeating area can be obtained by counting the number of pixels in these areas.

[0049] The algorithm of this embodiment combines the “non-repeating area BC of the qnth non-repeating area scanned by the ultrasonic scanning microscope in the qth pre-experiment” q.n ” and “The repetition area CF of the qmth repetition area scanned by the ultrasonic scanning microscope in the qth pre-experiment q.m ”, comprehensive analysis yields the “coverage index FG of the ultrasonic scanning microscope in the qth pre-experiment”q ", and the various parameters are related to each other, not independent, it is a whole, and it is not possible to obtain the "coverage index FG of the ultrasonic scanning microscope in the qth pre-experiment" by simply combining and adding them. q ”, for example, in this formula, “the non-repeating area BC of the qnth non-repeating area scanned by the ultrasonic scanning microscope in the qth preliminary experiment q.n The increase of " may lead to the coverage index FG of the ultrasonic scanning microscope in the qth preliminary experiment q "Increase does not necessarily mean that the coverage index FG of the ultrasonic scanning microscope in the qth pre-experiment q " is large, and at this time, we also need to consider "the repetition area CF of the qmth repetition area scanned by the ultrasonic scanning microscope in the qth pre-experiment q.m "It can also determine the degree of conformity between the total coverage area of ​​the material image data at the next moment and the total area of ​​the material to be tested. It takes into account the correlation and mutual influence between the variables in a quantitative way. When the non-repeating area BC of the qn-th non-repeating area scanned by the ultrasonic scanning microscope in the q-th pre-experiment q.n When the size increases, the repetition area CF of the qmth repetition area scanned by the ultrasonic scanning microscope in the qth pre-experiment q.m The coverage index FG of the ultrasonic scanning microscope in the qth pre-experiment may decrease accordingly. q It may be increased that the algorithm obtained by comprehensive analysis can accurately quantify the degree of conformity between the total coverage area of ​​the analysis material image data and the total area of ​​the material to be tested, indicating the effect of accurately evaluating the coverage index of the ultrasonic scanning microscope, and thus accurately analyzing by establishing a mathematical form.

[0050] Furthermore, the specific process of performance testing is as follows: temperature testing is performed on the ultrasonic scanning microscope to obtain first detection data, and the obtained first detection data are arranged in order to obtain a temperature sequence, the first detection data represents the performance data of the ultrasonic scanning microscope under temperature detection, the first detection data includes a first image noise, a first image resolution, a first scanning time, a first scanning speed and a first ultrasonic frequency, and the temperature sequence represents a collection of the first detection data; humidity testing is performed on the ultrasonic scanning microscope to obtain second detection data, and the obtained second detection data are arranged in order to obtain a humidity sequence, the second detection data represents the performance data of the ultrasonic scanning microscope under humidity detection, the second detection data includes a second image noise, a second image resolution, a second scanning time, a second scanning speed and a second ultrasonic frequency, and the humidity sequence represents a collection of the second detection data.

[0051] In this embodiment, the first detection data represents the data obtained when the performance test of the ultrasonic scanning microscope is carried out under different temperature conditions, reflecting the working performance of the microscope under different temperature conditions; the temperature condition generally refers to the temperature control of 20°C to 80°C; the second detection data represents the data obtained when the performance test of the ultrasonic scanning microscope is carried out under different humidity conditions, reflecting the working performance of the microscope under different humidity conditions; the temperature sequence represents the sequence formed by arranging the first detection data in chronological order; the humidity sequence represents the sequence formed by arranging the second detection data in chronological order; image noise represents the random, unexpected signal generated during the imaging process, which will affect the quality of the image and reduce the clarity and readability of the image; the image resolution represents a parameter used to describe the clarity of the image details, the higher the resolution, the clearer the image and the more details that can be displayed; the scanning time represents the time required to complete a scan; the scanning speed represents the data acquisition speed during the scanning process; the ultrasonic frequency represents the vibration frequency of the ultrasonic wave used in the ultrasonic scanning microscope, which will affect the depth and resolution of the imaging; and an effective evaluation of the working performance of the ultrasonic scanning microscope under different environmental conditions is achieved.

[0052] Furthermore, the specific method for obtaining the first detection data is as follows:

[0053] B1, collecting a first internal image of the material to be tested by ultrasonic scanning microscopy at a preset time point in a preset time period, the ultrasonic scanning microscope being in a first simulation environment, the first simulation environment representing a temperature test simulating the performance of the ultrasonic scanning microscope within different temperature ranges at a set humidity;

[0054] B2, extracting first image data from the first internal image by using image analysis software, and integrating the first image data with a corresponding timestamp to obtain a first image sequence, wherein the first image data includes first image noise and first image resolution;

[0055] B3, recording the first scanning time in real time by a timer, and obtaining a first scanning speed in combination with the area of ​​the first internal image, wherein the first scanning time represents the time taken by the ultrasonic scanning microscope to scan in temperature detection;

[0056] B4, obtain the first ultrasonic frequency of the ultrasonic scanning microscope through a spectrum analyzer.

[0057] In this embodiment, the preset time period refers to a pre-set time period for performing the detection task within a specific time range; the preset time period is obtained from a preset database and can generally be set to 1 hour; the preset time point refers to a pre-set time point for performing the detection task at a specific time point; the preset time point is obtained from a preset database and can generally be set to once every 10 minutes; the first simulation environment refers to a simulated environmental condition for testing the performance of an ultrasonic scanning microscope at a specific humidity and in a different temperature range, for example, the humidity is set to 50% RH and the temperature range is generally 20°C to 80°C; the first internal image refers to an image of the interior of the material to be detected obtained by an ultrasonic scanning microscope during temperature detection, and the image reflects the internal structure or characteristics of the material; the image analysis software refers to a software tool for processing and analyzing image data, which can extract specific information from the image, such as image noise and image resolution. General image analysis software includes ImageJ, NI Vision Builder for Automated Inspection, Zeiss ZEN, and Olympus Stream; in this embodiment, ImageJ can be selected to extract image resolution and image noise; the first image sequence represents a sequence obtained by integrating the first image data with its corresponding timestamp, which is used to represent the change of image data over time; the first scanning time represents the time spent by the ultrasonic scanning microscope in the temperature detection process, reflecting the speed and efficiency of the scanning; the first scanning speed represents the scanning speed calculated by combining the scanning time and the scanning area, which represents the size of the area scanned per unit time; the spectrum analyzer represents an instrument for measuring and analyzing the signal spectrum, which can measure the frequency, power and other parameters of the signal; here, it is used to measure the ultrasonic frequency of the ultrasonic scanning microscope; a comprehensive evaluation of the performance of the ultrasonic scanning microscope under temperature changes is achieved.

[0058] Furthermore, the specific method for obtaining the second detection data is as follows:

[0059] C1, collecting a second internal image of the material to be tested by ultrasonic scanning microscopy at a preset time point in a preset time period, the ultrasonic scanning microscopy being in a second simulated environment, the second simulated environment representing humidity detection simulating the performance of the ultrasonic scanning microscopy within different humidity ranges at a set temperature;

[0060] C2, extracting second image data from the second internal image by image analysis software, integrating the second image data with the corresponding timestamp to obtain a second image sequence, wherein the second image data includes second image noise and second image resolution;

[0061] C3, recording the second scanning time in real time by a timer, and obtaining the second scanning speed in combination with the area of ​​the second internal image, wherein the second scanning time represents the time taken by the ultrasonic scanning microscope to scan in humidity detection;

[0062] C4, obtains the second ultrasonic frequency of the ultrasonic scanning microscope through a spectrum analyzer.

[0063] In this embodiment, the second simulation environment refers to the environment simulated at a set temperature and in different humidity ranges, which is used to test the performance of the equipment under these environmental conditions. Generally, the set temperature is 25°C and the humidity is between 20%RH and 95%RH; the second internal image refers to the image of the inside of the material to be tested obtained by the ultrasonic scanning microscope during humidity detection; image noise refers to interference or impurities in the image that do not belong to the original signal, which usually affects the clarity of the image; image resolution refers to the clarity or detail of the image, usually measured in pixels; the timestamp is used to record the specific time point of data acquisition; the second scanning time refers to the time required for the ultrasonic scanning microscope to complete a scan during the humidity detection process; the second ultrasonic frequency refers to the sound wave frequency used by the ultrasonic scanning microscope during the humidity detection process; the measurement of frequency helps to evaluate the propagation characteristics of ultrasonic waves under different humidity conditions; and a comprehensive evaluation of the performance of the ultrasonic scanning microscope under humidity changes is achieved.

[0064] Furthermore, the performance of the ultrasonic scanning microscope is tested to obtain a performance evaluation value, which also includes obtaining the image quality coefficient, ultrasonic penetration and scanning quality coefficient of the ultrasonic scanning microscope; the specific method of obtaining the image quality coefficient is as follows: obtain the reference noise and reference resolution from a preset database, and obtain the image quality coefficient of the ultrasonic scanning microscope in combination with the image noise and the image resolution, the reference noise is used to evaluate the standard of the actual image noise, the reference resolution is used to evaluate the standard of the actual image resolution, the image quality coefficient is used to evaluate the quality of the image scanned by the ultrasonic scanning microscope, the image noise includes the first image noise and the second image noise, the image resolution includes the first image resolution and the second image resolution, and the image quality coefficient includes the temperature image quality coefficient and the humidity image quality coefficient; the image quality coefficient is calculated by the following formula:

[0065]

[0066] Where i is the category of performance test, i=1,2, i=1 represents temperature test, i=2 represents humidity test, t is the number of performance test, t=1,2,...,T, T represents the total number of performance tests, that is, the number of temperature test and humidity test is T, IQ irepresents the image quality coefficient of the ultrasonic scanning microscope for the i-th type of performance detection, the temperature image quality coefficient is IQ1, the humidity image quality coefficient is IQ2, and FB i.t represents the image resolution of the ultrasonic scanning microscope for the tth performance test in the i-th performance test, ZY i.t represents the image noise of the ultrasonic scanning microscope for the t-th performance test in the i-th performance test, FB0 represents the reference resolution, and ZY0 represents the reference noise.

[0067] In this embodiment, the reference noise is used to evaluate the standard of image noise obtained during the actual scanning process; the reference noise is obtained from a preset database, and the noise intensity can generally be set within the range of 1-10μV; the reference resolution is used to evaluate the standard of image resolution obtained during the actual scanning process; the reference resolution is obtained from a preset database, and generally 1-10μm can be selected, so that small defects can be captured while maintaining a reasonable scanning time; the image quality coefficient represents an indicator used to quantify the quality of images generated by the ultrasonic scanning microscope; the first image noise represents the noise level in images obtained under different temperature conditions; the second image noise represents the noise level in images obtained under different humidity conditions; the first image resolution represents the clarity of images obtained under different temperature conditions; the second image resolution: refers to the clarity of images obtained under different humidity conditions respectively; the temperature image quality coefficient reflects the image quality generated by the ultrasonic scanning microscope under different temperature conditions; the humidity image quality coefficient reflects the image quality generated by the ultrasonic scanning microscope under different humidity conditions; and the image quality performance of the ultrasonic scanning microscope under different environmental conditions is evaluated.

[0068] The algorithm of this embodiment combines the image resolution FB of the ultrasonic scanning microscope for the t-th performance test in the i-th performance test i.t ” and “Image noise ZY of ultrasonic scanning microscope for the tth performance test in the i-th performance test i.t ”, comprehensive analysis yields the “image quality coefficient IQ of the ultrasonic scanning microscope for the i-th performance test i ", and the various parameters are related to each other, not independent, it is a whole, and it is not possible to obtain the "image quality coefficient IQ of ultrasonic scanning microscope for type i performance detection by simple combination and addition. i ”, for example, in this formula, “the image resolution FB of the ultrasonic scanning microscope for the t-th performance test in the i-th performance test i.t The increase of " may lead to the image quality coefficient IQ of the ultrasonic scanning microscope for the i-th performance test i "Increase does not necessarily mean that the image quality coefficient IQ of the ultrasonic scanning microscope for the i-th performance test i" is large, and at this time, it is also necessary to consider "the image noise ZY of the ultrasonic scanning microscope for the t-th performance test in the i-th performance test i.t "It can also determine the quality of the image obtained by the ultrasonic scanning microscope at the next moment. It takes into account the correlation and mutual influence between the variables in a quantitative way. Generally speaking, high-resolution images require more pixels to form, so they are more susceptible to noise. Noise will reduce the clarity of the image and make the details in the image blurred, thus affecting the imaging quality. High-resolution images usually have higher clarity and can show more details, thereby improving the imaging quality. The algorithm obtained by comprehensive analysis can accurately and quantitatively analyze the quality of the image obtained by the ultrasonic scanning microscope, which shows the effect of accurately evaluating the imaging quality of the ultrasonic scanning microscope. Therefore, accurate analysis is carried out by establishing mathematical forms.

[0069] Furthermore, the specific method of obtaining the ultrasonic penetration is as follows: obtaining the preset ultrasonic frequency of the material to be detected from the preset database, and combining the ultrasonic frequency to obtain the ultrasonic penetration of the ultrasonic scanning microscope, the ultrasonic penetration is used to describe the ability of the ultrasonic wave to penetrate the material to be detected, the ultrasonic frequency includes the first ultrasonic frequency and the second ultrasonic frequency, and the ultrasonic penetration includes the temperature ultrasonic penetration and the humidity ultrasonic penetration; the ultrasonic penetration is calculated by the following formula:

[0070]

[0071] Where, PT i represents the ultrasonic penetration of the ultrasonic scanning microscope in the i-th performance test, CP i.t represents the ultrasonic frequency of the ultrasonic scanning microscope for the t-th performance test in the i-th type performance test, and CP0 represents the preset ultrasonic frequency of the ultrasonic scanning microscope.

[0072] In this embodiment, ultrasound is a sound wave with a frequency higher than the sound frequency audible to the human ear (i.e., greater than 20kHz); different ultrasonic frequencies may have different propagation characteristics in materials (such as ultrasonic penetration, reflection, scattering, etc.); the preset ultrasonic frequency is obtained from a preset database and is set according to the thickness of the material and the depth of the expected defect. Typically, an ultrasonic frequency of 20-100MHz is used for ceramic defect detection; ultrasonic penetration refers to the ability of ultrasound to penetrate a certain material, which is usually related to the physical properties of the material such as density, thickness, and acoustic impedance; strong ultrasonic penetration means that ultrasound can penetrate deeper into the material, thereby obtaining more internal information; temperature ultrasonic penetration refers to the change in the ability of ultrasound to penetrate materials under different temperature conditions; humidity ultrasonic penetration refers to the change in the ability of ultrasound to penetrate materials under different humidity conditions; for example, the physical properties of ceramic materials may change under high temperature or high humidity environments, thereby affecting ultrasonic penetration; the ultrasonic penetration ability of ultrasonic scanning microscopes under different environmental conditions is evaluated.

[0073] The algorithm of this embodiment combines the ultrasonic frequency CP of the ultrasonic scanning microscope for the t-th performance test in the i-th performance test i.t ”, and the analysis results show that “the ultrasonic penetration power PT of the ultrasonic scanning microscope in the i-th performance test i ", and the various parameters are related to each other, not independent, it is a whole, and it is not possible to obtain the "ultrasonic penetration power PT of ultrasonic scanning microscope in the i-th performance test" by simple combination and addition. i ”, for example, in this formula, “the ultrasonic frequency CP of the ultrasonic scanning microscope for the t-th performance test in the i-th performance test i.t " may lead to the increase of "the ultrasonic penetration of the ultrasonic scanning microscope in the i-th performance test PT i "Increase, itself takes into account the correlation and mutual influence between various variables in a quantitative way. Generally speaking, the higher the frequency of ultrasound, the weaker its ultrasonic penetration is usually, but the directionality of low-frequency ultrasound is poor. The algorithm itself is obtained through comprehensive analysis, which can accurately and quantitatively analyze the ability of ultrasound to penetrate the material to be tested, indicating the effect of accurately evaluating the ultrasonic penetration, so accurate analysis is carried out by establishing a mathematical form.

[0074] Furthermore, the scanning quality coefficient is specifically obtained in the following manner: the preset scanning data is obtained from the preset database, and the ultrasonic scanning microscope is evaluated in combination with the scanning time and the scanning speed to obtain the scanning quality coefficient, the preset scanning data includes the preset scanning time and the preset scanning speed, the preset scanning time is used to evaluate the standard of the scanning time of the actual ultrasonic scanning microscope, the preset scanning speed is used to evaluate the standard of the scanning speed of the actual ultrasonic scanning microscope, the scanning quality coefficient is used to evaluate the quality of the ultrasonic scanning microscope scanning, the scanning time includes the first scanning time and the second scanning time, the scanning speed includes the first scanning speed and the second scanning speed, and the scanning quality coefficient includes the temperature scanning quality coefficient and the humidity scanning quality coefficient; the scanning quality coefficient is calculated by the following formula:

[0075]

[0076] Where, SP i represents the scanning quality factor of the ultrasonic scanning microscope in the i-th performance test, ST i.t represents the scanning time of the ultrasonic scanning microscope for the tth performance test in the i-th performance test, SD i.t represents the scanning speed of the ultrasonic scanning microscope for the t-th performance test in the i-th type performance test, ST0 represents the preset scanning time of the ultrasonic scanning microscope, and SD0 represents the preset scanning speed of the ultrasonic scanning microscope.

[0077] In this embodiment, the preset scanning data is used as a reference standard for actual scanning; the preset scanning speed indicates the scanning speed of the device under standard conditions, usually expressed in terms of the scanning area per unit time; the preset scanning speed is obtained from a preset database, adjusted according to the thickness of the ceramic material and the expected defect size, and can be set between 1-5 square millimeters; the preset scanning time indicates the time required for the device to complete a scan under standard conditions; the preset scanning time is obtained from a preset database, and is generally set within the range of 1-10 milliseconds; the scanning quality coefficient is used to quantify the scanning quality index of the device under different conditions; the first scanning time indicates the time required to complete the scan under different temperature conditions; the second scanning time indicates the time required to complete the scan under different humidity conditions; the first scanning speed and the second scanning speed indicate the scanning speed of the device under different environmental conditions; the temperature scanning quality coefficient is used to reflect the coefficient of the scanning quality of the ultrasonic scanning microscope under different temperature conditions; the humidity scanning quality coefficient is used to reflect the coefficient of the scanning quality of the ultrasonic scanning microscope under different humidity conditions; the scanning quality of the ultrasonic scanning microscope under different temperature and humidity conditions is evaluated.

[0078] The performance test category i is 1, the total number of performance tests T is 3, the preset scanning time ST0 is 5s, and the preset scanning speed SD0 is 3mm 2For example, the statistical table of changes in the scanning quality coefficient is shown in Table 1:

[0079] Table 1 Statistics of changes in scanning quality coefficients

[0080]

[0081] From the table, it can be seen that when the scanning time is less than the preset scanning time, the scanning time increases, and the scanning quality coefficient may increase accordingly (also affected by the scanning speed); when the scanning speed is less than the preset scanning speed, the scanning speed increases, and the scanning quality coefficient may increase (also affected by the scanning time); when the scanning speed is greater than the preset scanning speed, the scanning speed increases, and the scanning quality coefficient may decrease (also affected by the scanning time); in other words, it is necessary to obtain the changing relationship of the scanning quality coefficient based on the relationship between the average scanning speed and the average scanning time of the performance test.

[0082] The algorithm of this embodiment combines the scanning time ST of the ultrasonic scanning microscope for the t-th performance test in the i-th performance test i.t ” and “the scanning speed SD of the ultrasonic scanning microscope for the t-th performance test in the i-th performance test i.t ”, comprehensive analysis yields the “scanning quality factor SP of ultrasonic scanning microscope in the i-th performance test” i ", and the various parameters are related to each other, not independent, it is a whole, and it is not possible to obtain the "scanning quality coefficient SP of ultrasonic scanning microscope in the i-th performance test by simple combination and addition. i ”, for example, in this formula, “the scanning time ST of the ultrasonic scanning microscope for the t-th performance test in the i-th performance test” i.t " may lead to the increase of "the scanning quality factor SP of the ultrasonic scanning microscope in the i-th performance test i "Increase does not necessarily mean that the scanning quality factor SP of the ultrasonic scanning microscope in the i-th performance test i " is large, and at this time, it is also necessary to consider "the scanning speed SD of the ultrasonic scanning microscope for the t-th performance test in the i-th performance test i.t "It can also determine the quality of the image obtained by the ultrasonic scanning microscope at the next moment. It takes into account the correlation and mutual influence between the variables in a quantitative way. Increasing the scanning speed may reduce the scanning time, but it may reduce the image resolution, thus affecting the image quality. Increasing the scanning time usually means reducing the scanning speed, which may improve the image resolution, but will cause the scanning time to be too long, affecting the efficiency. The algorithm obtained by comprehensive analysis can accurately and quantitatively analyze the quality of the image scanned by the ultrasonic scanning microscope, which shows the effect of accurately evaluating the imaging quality of the ultrasonic scanning microscope. Therefore, accurate analysis is carried out by establishing mathematical forms.

[0083] Furthermore, the specific method for obtaining the performance evaluation value is as follows: obtaining the performance weight from the preset database, and evaluating the ultrasonic scanning microscope according to the image quality coefficient, ultrasonic penetration and scanning quality coefficient of the ultrasonic scanning microscope to obtain the performance evaluation value, the performance weight includes image weight, penetration weight and scanning weight; the performance evaluation value is calculated by the following formula:

[0084]

[0085] Where XN represents the performance evaluation value of ultrasonic scanning microscope, IQ i The image quality factor of the ultrasonic scanning microscope for the i-th performance test, PT i represents the ultrasonic penetration of the ultrasonic scanning microscope for the i-th performance test, SP i represents the scanning quality coefficient of the ultrasonic scanning microscope for the i-th type performance detection, α1 represents the image weight, α2 represents the penetration weight, and α3 represents the scanning weight.

[0086] In this embodiment, the performance weight represents the relative importance value assigned to different performance indicators; the performance weight includes image weight, penetration weight and scanning weight, which respectively represent the proportion of image quality, ultrasonic penetration and scanning process quality in the overall performance evaluation; the performance evaluation value is used to quantify the overall performance of the ultrasonic scanning microscope; and a comprehensive evaluation of the performance of the ultrasonic scanning microscope in terms of image quality, ultrasonic penetration and scanning quality is achieved.

[0087] The category i of performance detection is 1, the image weight is 0.3, the penetration weight is 0.4, and the scanning weight is 0.3. Taking 0.5 as an example, Figure 2 As shown, it is a schematic diagram of the change of the performance evaluation value provided in the embodiment of the present application. From the figure, it can be seen that when the image quality coefficient increases, the performance evaluation value increases accordingly, and when the ultrasonic penetration increases, the performance evaluation value increases accordingly.

[0088] The algorithm of this embodiment combines the image quality coefficient IQ of the ultrasonic scanning microscope for the i-th type performance detection i "," Ultrasonic penetration of ultrasonic scanning microscope for type i performance testing PT i ” and “Scanning quality factor SP of ultrasonic scanning microscope for performance test of type i i ", the comprehensive analysis results in the "performance evaluation value XN of the ultrasonic scanning microscope", and the various parameters are related to each other, not independent, and are a whole. The "performance evaluation value XN of the ultrasonic scanning microscope" cannot be obtained by simple combination and addition. For example, in this formula, the "image quality coefficient IQ of the ultrasonic scanning microscope for the i-th performance test"i " may lead to an increase in the "performance evaluation value XN of the ultrasonic scanning microscope", which does not necessarily mean that the "performance evaluation value XN of the ultrasonic scanning microscope" is large. At this time, it is also necessary to consider the "ultrasonic penetration power PT of the ultrasonic scanning microscope for the i-th performance test i ” and “Scanning quality factor SP of ultrasonic scanning microscope for performance test of type i i " can also determine the quality of the image obtained by the ultrasonic scanning microscope at the next moment. It takes into account the "image quality coefficient IQ of the ultrasonic scanning microscope for the i-th performance test" in a quantitative way. i "," Ultrasonic penetration of ultrasonic scanning microscope for type i performance testing PT i ” and “Scanning quality factor SP of ultrasonic scanning microscope for performance test of type i i "The correlation and mutual influence between them, the image quality coefficient increases, the performance evaluation value may also increase; the ultrasonic penetration increases, the performance evaluation value may also increase; the scanning quality coefficient increases, the performance evaluation value may also increase; the algorithm itself is obtained by comprehensive analysis, which can accurately and quantitatively analyze the quality of the image scanned by the ultrasonic scanning microscope, indicating the effect of accurately evaluating the performance evaluation value of the ultrasonic scanning microscope, so accurate analysis is carried out by establishing mathematical forms.

[0089] Specifically, the image weight is obtained from a preset database. In a specific embodiment, a mapping set of the image quality coefficient of the ultrasonic scanning microscope and its corresponding weight is constructed according to the relationship between the image resolution and image noise of the ultrasonic scanning microscope in historical data and the performance evaluation value, and the real-time image resolution and image noise of the ultrasonic scanning microscope are input into the mapping set to obtain the corresponding image weight.

[0090] Specifically, the penetration weight is obtained from a preset database. In a specific embodiment, a mapping set of the ultrasonic penetration of the ultrasonic scanning microscope and its corresponding weight is constructed according to the relationship between the ultrasonic frequency of the ultrasonic scanning microscope and the performance evaluation value in the historical data, and the real-time ultrasonic frequency and image noise of the ultrasonic scanning microscope are input into the mapping set to obtain the corresponding penetration weight.

[0091] Specifically, the scanning weight is obtained from a preset database. In a specific embodiment, a mapping set of the scanning quality coefficient of the ultrasonic scanning microscope and its corresponding weight is constructed according to the relationship between the scanning time and scanning speed of the ultrasonic scanning microscope and the performance evaluation value in the historical data, and the real-time scanning time and scanning speed of the ultrasonic scanning microscope are input into the mapping set to obtain the corresponding scanning weight.

[0092] Furthermore, the specific method of obtaining the defect coefficient is as follows: E1, using an ultrasonic scanning microscope to scan the material to be tested to obtain an internal image of the material to be tested; E2, using image analysis software to measure the defects in the internal image of the material to be tested to obtain defect data, and the defect data represents the physical property data of the defects of the material to be tested; E3, multiplying the defect depth and defect area of ​​the material to be tested in the defect data to obtain the defect coefficient of the material to be tested, and the defect coefficient is used to quantify the degree of defects in the material to be tested.

[0093] In this embodiment, an ultrasonic scanning microscope can be used to observe the internal structure and possible defects, such as cracks, pores, inclusions, etc., of the material without destroying the material itself; image analysis software includes ImageJ, NI VisionBuilder for Automated Inspection, Zeiss ZEN, and Olympus Stream; the acquired image is processed using the image analysis software to automatically or manually identify and mark defects; the software analyzes the shape, size, position, etc. of the defects and extracts physical property data; the defect depth refers to the depth of the defects inside the material; the defect area represents the planar projection area of ​​the defects in the image inside the material; a larger defect area means that the defects may have a greater impact on the material performance; the defect coefficient can be used for material quality control to help determine whether the material meets the standards; in this embodiment, ImageJ can be selected to measure the defects in the image; and quantitative evaluation of defects inside the material is achieved.

[0094] To summarize, the embodiment of the present application determines the optimal number of ultrasonic scanning microscopes through preliminary experiments, then performs performance testing on the ultrasonic scanning microscopes, then adjusts the scanning parameters of the ultrasonic scanning microscopes until the performance evaluation values ​​meet the preset working standards, and finally collects the defect data of the material to be inspected through the ultrasonic scanning microscope. Based on this, the defect coefficient of the material to be inspected is obtained, thereby ensuring the accuracy of the defect data, and further achieving more accurate defect detection of ceramic materials through ultrasonic scanning microscopes, effectively solving the problem of low data accuracy when performing defect detection of ceramic materials through ultrasonic scanning microscopes in the prior art.

[0095] Those skilled in the art will appreciate that the embodiments of the present invention application can be provided as methods, systems, or computer program products. Therefore, the present invention application can adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment in combination with software and hardware. Moreover, the present invention application can adopt the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) that contain computer-usable program code.

[0096] The present invention application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present invention application. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of the processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0097] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0098] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0099] Although the preferred embodiments of the present invention have been described, those skilled in the art may make other changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications that fall within the scope of the present invention.

[0100] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.

Claims

1. A defect detection data evaluation method based on ultrasonic scanning microscope, characterized in that: The following steps are involved: S1, conducting a preliminary experiment on the ultrasonic scanning microscope to obtain a scanning area, evaluating the number of ultrasonic scanning microscopes according to the scanning area and the total area of ​​the material to be detected, obtaining an optimal number of ultrasonic scanning microscopes, and using a sensor to record environmental data in real time, wherein the scanning area includes a repeated area and a non-repeated area, and the environmental data includes temperature and humidity; S2, performing a performance test on the ultrasonic scanning microscope to obtain a performance evaluation value, wherein the performance test includes a temperature test and a humidity test, and the performance test is used to evaluate the degree of influence of environmental factors on the performance of the ultrasonic scanning microscope; S3, determining whether the performance evaluation value meets the preset working standard, if so, executing S4, otherwise adjusting the scanning parameters of the ultrasonic scanning microscope and returning to S2 until the performance evaluation value meets the preset working standard, the scanning parameters including ultrasonic frequency, gain, scanning speed and scanning resolution; S4, collecting defect data of the material to be detected by the deployed ultrasonic scanning microscope, and obtaining a defect coefficient of the material to be detected according to the defect data, wherein the defect data represents physical property data of the defect of the material to be detected, and the defect data includes defect depth and defect area, and the defect coefficient is used to quantify the degree of defect of the material to be detected; The specific process of the pre-experiment is as follows: A1, obtaining the total area of ​​the material to be tested and the scanning resolution of the ultrasonic scanning microscope from a preset database, and scanning the material to be tested by the ultrasonic scanning microscope to obtain material image data of the material surface; A2, all material image data are aligned in a preset coordinate system through an image registration algorithm, and the intersection of the material image data is obtained and recorded as the repeated area, and the difference between the material image data and the repeated area is recorded as the non-repeated area in the image, and the repeated area and the non-repeated area are obtained by numbering the pixel points of each repeated area and non-repeated area respectively; A3, obtaining a coverage index of the ultrasonic scanning microscope according to the scanning area and the total area of ​​the material to be detected, wherein the coverage index is used to measure the degree of conformity between the total coverage area of ​​the material image data and the total area of ​​the material to be detected; A4, judging whether the coverage index is not less than 0, if it is not less than 0, executing A5, otherwise increasing the number of ultrasonic scanning microscopes until the coverage index is not less than 0; A5, determining whether the coverage index is greater than a preset coverage index, if so, reducing the number of ultrasonic scanning microscopes until the coverage index is no greater than the preset coverage index, otherwise determining that the current number of ultrasonic scanning microscopes is the optimal number, wherein the preset coverage index represents a reference conformity between the total coverage area of ​​the material image data and the total area of ​​the material to be detected; The coverage index is calculated by the following formula: Where q represents the number of the pre-experiment, q = 1, 2, ..., Q, Q represents the total number of pre-experiments, qn represents the number of non-repeated regions in the qth pre-experiment, qn = q.1, q.2, ..., qN, qN represents the total number of non-repeated regions in the qth pre-experiment, qm represents the number of repeated regions in the qth pre-experiment, qm = q.1, q.2, ..., qM, qM represents the total number of repeated regions in the qth pre-experiment, BC q.n represents the non-repeating area of ​​the qnth non-repeating region scanned by the ultrasonic scanning microscope in the qth pre-experiment, CF q.m represents the repeated area of ​​the qmth repeated area scanned by the ultrasonic scanning microscope in the qth preliminary experiment, A represents the total area of ​​the material to be tested, and FG q represents the coverage index of the ultrasonic scanning microscope in the qth preliminary experiment, N is a positive integer, and M is a positive integer.

2. The defect detection data evaluation method based on ultrasonic scanning microscope according to claim 1, characterized in that: The specific process of the performance test is as follows: Performing temperature detection on the ultrasonic scanning microscope to obtain first detection data, and orderly arranging the obtained first detection data to obtain a temperature sequence, wherein the first detection data represents performance data of the ultrasonic scanning microscope under temperature detection, and the first detection data includes first image noise, first image resolution, first scanning time, first scanning speed, and first ultrasonic frequency; Perform humidity detection on the ultrasonic scanning microscope to obtain second detection data, and arrange the obtained second detection data in order to obtain a humidity sequence, wherein the second detection data represents performance data of the ultrasonic scanning microscope under humidity detection, and the second detection data includes second image noise, second image resolution, second scanning time, second scanning speed and second ultrasonic frequency.

3. The defect detection data evaluation method based on ultrasonic scanning microscope according to claim 2, characterized in that: The specific method for obtaining the first detection data is as follows: B1, collecting a first internal image of the material to be inspected by using an ultrasonic scanning microscope within a preset time point of a preset time period, wherein the ultrasonic scanning microscope is in a first simulation environment; B2, extracting first image data from the first internal image by using image analysis software, and integrating the first image data with a corresponding timestamp to obtain a first image sequence, wherein the first image data includes first image noise and first image resolution; B3, recording the first scanning time in real time by a timer, and obtaining a first scanning speed in combination with the area of ​​the first internal image, wherein the first scanning time represents the time taken by the ultrasonic scanning microscope to scan in temperature detection; B4, obtain the first ultrasonic frequency of the ultrasonic scanning microscope through a spectrum analyzer.

4. The defect detection data evaluation method based on ultrasonic scanning microscope according to claim 3, characterized in that: The specific method for obtaining the second detection data is as follows: C1, collecting a second internal image of the material to be inspected by using an ultrasonic scanning microscope within a preset time point of a preset time period, wherein the ultrasonic scanning microscope is in a second simulation environment; C2, extracting second image data from the second internal image by image analysis software, and integrating the second image data with a corresponding timestamp to obtain a second image sequence, wherein the second image data includes second image noise and second image resolution; C3, recording the second scanning time in real time by a timer, and obtaining a second scanning speed in combination with the area of ​​the second internal image, wherein the second scanning time represents the time taken by the ultrasonic scanning microscope to scan in humidity detection; C4, obtains the second ultrasonic frequency of the ultrasonic scanning microscope through a spectrum analyzer.

5. The defect detection data evaluation method based on ultrasonic scanning microscope according to claim 4, characterized in that: The performance test of the ultrasonic scanning microscope to obtain the performance evaluation value also includes obtaining the image quality coefficient, ultrasonic penetration and scanning quality coefficient of the ultrasonic scanning microscope; The specific method of obtaining the image quality coefficient is as follows: Acquire reference noise and reference resolution from a preset database, and obtain an image quality coefficient of the ultrasonic scanning microscope by combining image noise and image resolution, wherein the image noise includes a first image noise and a second image noise, the image resolution includes a first image resolution and a second image resolution, and the image quality coefficient includes a temperature image quality coefficient and a humidity image quality coefficient; The image quality coefficient is calculated by the following formula: Where i is the category of the performance test, i=1,2, i=1 represents temperature test, i=2 represents humidity test, t is the number of the performance test, t=1,2,...,T, T represents the total number of performance tests, IQ i represents the image quality factor of the ultrasonic scanning microscope for the i-th performance test, FB i.t represents the image resolution of the ultrasonic scanning microscope for the tth performance test in the i-th performance test, ZY i.t represents the image noise of the ultrasonic scanning microscope for the t-th performance test in the i-th performance test, FB0 represents the reference resolution, and ZY0 represents the reference noise.

6. The defect detection data evaluation method based on ultrasonic scanning microscope according to claim 5, characterized in that: The specific method for obtaining the ultrasonic penetration force is as follows: The preset ultrasonic frequency of the material to be detected is obtained from the preset database, and the ultrasonic penetration of the ultrasonic scanning microscope is obtained in combination with the ultrasonic frequency. The ultrasonic penetration is used to describe the ability of the ultrasonic wave to penetrate the material to be detected. The ultrasonic frequency includes a first ultrasonic frequency and a second ultrasonic frequency. The ultrasonic penetration includes temperature ultrasonic penetration and humidity ultrasonic penetration.

7. The defect detection data evaluation method based on ultrasonic scanning microscope according to claim 6, characterized in that: The specific method of obtaining the scanning quality coefficient is as follows: The preset scanning data is obtained from the preset database, and the ultrasonic scanning microscope is evaluated in combination with the scanning time and the scanning speed to obtain a scanning quality coefficient, wherein the preset scanning data includes the preset scanning time and the preset scanning speed, and the scanning quality coefficient is used to evaluate the quality of the ultrasonic scanning microscope scanning, the scanning time includes a first scanning time and a second scanning time, the scanning speed includes a first scanning speed and a second scanning speed, and the scanning quality coefficient includes a temperature scanning quality coefficient and a humidity scanning quality coefficient; The scan quality factor is calculated by the following formula: Where, SP i represents the scanning quality factor of the ultrasonic scanning microscope in the i-th performance test, ST i.t represents the scanning time of the ultrasonic scanning microscope for the tth performance test in the i-th performance test, SD i.t represents the scanning speed of the ultrasonic scanning microscope for the t-th performance test in the i-th type performance test, ST0 represents the preset scanning time of the ultrasonic scanning microscope, and SD0 represents the preset scanning speed of the ultrasonic scanning microscope.

8. The defect detection data evaluation method based on ultrasonic scanning microscope according to claim 7, characterized in that: The specific method of obtaining the performance evaluation value is as follows: Acquire performance weights from a preset database, and evaluate the ultrasonic scanning microscope according to an image quality coefficient, ultrasonic penetration, and scanning quality coefficient of the ultrasonic scanning microscope to obtain a performance evaluation value, wherein the performance weights include image weights, penetration weights, and scanning weights; The performance evaluation value is calculated by the following formula: Where XN represents the performance evaluation value of ultrasonic scanning microscope, IQ i The image quality factor of the ultrasonic scanning microscope for the i-th performance test, PT i represents the ultrasonic penetration of the ultrasonic scanning microscope for the i-th performance test, SP i represents the scanning quality coefficient of the ultrasonic scanning microscope for the i-th type performance detection, α1 represents the image weight, α2 represents the penetration weight, and α3 represents the scanning weight.

9. The defect detection data evaluation method based on ultrasonic scanning microscope according to claim 8, characterized in that: The specific method of obtaining the defect coefficient is as follows: E1, using an ultrasonic scanning microscope to scan the material to be tested to obtain an internal image of the material to be tested; E2, measuring defects in the internal image of the material to be inspected by image analysis software to obtain defect data, wherein the defect data represents physical property data of the defects of the material to be inspected; E3, multiplying the defect depth and defect area of ​​the material to be detected in the defect data to obtain a defect coefficient of the material to be detected, wherein the defect coefficient is used to quantify the defect degree of the material to be detected.

Images