Cyclotron physical parameter testing device arranged outside the cyclotron

Abstract

The present invention proposes a cyclotron physical parameter testing device arranged outside the cyclotron, comprising a multifunctional test bracket arranged outside the cyclotron, a C-shaped magnet arranged on the multifunctional test bracket for simulating the magnetic field environment of the cyclotron, a movable ion source system arranged on the multifunctional test bracket for simulating the internal ion source of the cyclotron, a movable beam measurement system arranged on the multifunctional test bracket for testing the ion source beam, and a movable high-voltage feed-in system arranged on the multifunctional test bracket for leading the beam from the beam extraction gap of the ion source anode chamber; the invention can be used for offline debugging and measurement of the current intensity of the ion beam under different electrical parameters. The debugging time of the whole accelerator is reduced; the mechanical processing size of the ion source can be determined according to the current intensity test parameters of the ion source on the extraction beam debugging device, so as to better optimize the mechanical structure of the ion source anode chamber.

Description

Technical Field

[0001] The invention belongs to the technical field of cyclotron accelerators, and in particular relates to a cyclotron accelerator physical parameter testing device arranged outside the cyclotron accelerator. Background Art

[0002] The ion source is an important part of the cyclotron, providing the ion beam for the cyclotron. The ion source of a medical small cyclotron is usually H - Ion sources are divided into two types: internal ion sources and external ion sources. Internal ion sources have the advantages of simple structure and low cost.

[0003] The design difficulties of the internal ion source are:

[0004] First, its performance is limited by the machining dimensions of the anode chamber, and the tolerance variation of the machining dimensions will have a significant impact on the performance of the ion source extracted beam. For example, if the internal machining dimensions of the ion source anode chamber differ by a few tenths of a millimeter, the ions produced may not be the currently desired ions (such as negative hydrogen ions) but another type of ions (such as alpha ions).

[0005] Second, the internal ion source is limited by its installation position (installed in the center of the accelerator). When the ion source produces three types of positive ions (H + 、H2 + 、H3 + ), the central area of ​​the cyclotron accelerator in the prior art can only allow one type of ion to pass through the central area, while blocking the other two types of ions. When the user also needs the other two types of ions, the same method is used to allow the currently required ions to pass through the central area, while blocking the other two types of ions. Since three types of ions cannot be analyzed at the same time, only one beam can be debugged at a time, and each beam debugging is limited by the assembly progress of the accelerator and the influence of multiple systems such as the entire vacuum system of the accelerator. All accelerator systems must be qualified before beam tuning tests can be performed. For commercial small cyclotron accelerators, this method seriously affects the debugging progress of the entire accelerator. Summary of the invention

[0006] In view of the deficiencies in the prior art, the present invention proposes a cyclotron physical parameter testing device arranged outside the cyclotron. The first purpose is to solve the problem that the performance of the anode cavity of the ion source is limited by the machining dimensions of the anode cavity, and the tolerance variation of the machining dimensions will have a great influence on the performance of the ion source; the second purpose is to solve the problem that the anode cavity of the ion source is limited by its installation position in the central area, and the debugging of multiple types of ions in the ion source cannot be performed synchronously, which seriously affects the debugging progress of the entire accelerator.

[0007] The present invention proposes the following technical solutions to solve the technical problems:

[0008] A cyclotron physical parameter testing device arranged outside a cyclotron comprises a multifunctional testing support (1) arranged outside the cyclotron, a C-shaped magnet (2) arranged on the multifunctional testing support (1) for simulating the magnetic field environment of the cyclotron, a movable ion source system (3) arranged on the multifunctional testing support (1) for simulating the internal ion source of the cyclotron, a movable beam measuring system (4) arranged on the multifunctional testing support for testing the ion source beam, and a movable high-voltage feeding system (5) arranged on the multifunctional testing support (1) for leading the beam from a beam leading gap (3-2) of an ion source anode chamber (3-1); The movable ion source system (3), the movable beam measurement system (4), and the movable high-voltage feed system (5) are arranged in a multifunctional vacuum box (6) through vacuum joints. In a working state, the testing device moves the movable ion source system (3), the movable beam measurement system (4), and the movable high-voltage feed system (5) to the central plane of the C-shaped magnet (2), and performs a test on the accelerator-related physical parameters in the central plane of the C-shaped magnet (2). The test on the related physical parameters includes a test on the internal processing dimensions of the ion source anode cavity, a test on the current strength of different types of beams drawn out of the ion source anode cavity, and a test on the internal and external training of the ion source anode cavity.

[0009] Its features are:

[0010] The movable beam measurement system (4) comprises a Faraday cage (4-1) with an electric field, the Faraday cage (4-1) with an electric field being arranged near a beam extraction gap (3-2) of an ion source anode chamber (3-1) and being used to receive a beam extracted from the beam extraction gap (3-2) of the ion source anode chamber (3-1); the Faraday cage (4-1) with an electric field and a high-voltage electrode plate (5-1) of a movable high-voltage feed-in system (5) are of equal potential, so as to keep the beam moving at a uniform speed after being extracted from the anode chamber and being acted upon only by a magnetic field force;

[0011] The movable beam measurement system (4) further comprises a beam probe (4-2) with a beam receiving total target and an integral target arranged in the Faraday cage (4-1), the beam probe (4-2) being used to receive the beam drawn out from the ion source, and adjusting and recording power supply parameters by changing beam parameter; the beam probe comprises a beam receiving total target (4-2-1) and an integral target (4-2-2), the beam receiving total target (4-2-1) being used to receive all beams drawn out from the ion source anode cavity (3-1), the integral target (4-2-2) being used to receive different types of beams drawn out from the ion source anode cavity (3-1), the beam probe (4-2) being placed inside the Faraday cage (4-1), and the beam probe (4-2) being moved forward and backward in a small range along a straight line direction under the action of a tail end linear drive device, thereby determining a maximum beam deflection radius;

[0012] The movable high-voltage feeding system (5) is provided with a high-voltage electrode plate (5-1) outside the ion source anode chamber (3-1) and close to the beam extraction gap (3-2) of the anode chamber (3-1). The high-voltage electrode plate (5-1) is fixedly mounted on the Faraday cage (4-1). The high-voltage electrode plate (5-1) carries positive high voltage or negative high voltage and extracts H- or α particles inside the beam extraction gap (3-2) of the ion source anode chamber (3-1) through a high-voltage potential difference. The H- or α particles in the ion source anode chamber (3-1) are pulled out by the high voltage outside and enter the Faraday cage. Under the action of the magnetic field of the C-shaped magnet (2), they are deflected by the Lorentz force and are received by the probe (4-2) of the movable beam measuring system (4) in the Faraday cage (4-1). By analyzing the high voltage polarity of the current high voltage electrode plate (5-1) and the type of ions received by the current probe (4-2), checking whether the internal processing dimensions of the ion source anode chamber (3-1) are qualified;

[0013] The beam extracted by the movable ion source system (3) is affected by the interaction between the high voltage extracted on the high voltage electrode plate (5-1) and the C-shaped magnet (2), and the beam is deflected into the Faraday cage (4-1) and received by the movable beam measurement system (4).

[0014] Furthermore, the plane of the high-voltage electrode plate (5-1) and the plane of the beam outlet (3-2) of the ion source anode chamber (3-1) are parallel to each other and there is a set distance between the two planes; the set distance is based on the standard that the high-voltage electric field is sufficient to pull out the ions in the ion source anode chamber (3-1).

[0015] Furthermore, the high-voltage electrode plate (5-1) is connected to a positive 15 kV high-voltage power supply and a negative 15 kV high-voltage power supply respectively. When a positive voltage is applied to the high-voltage electrode plate (5-1), it is connected to the positive 15 kV high-voltage power supply; when a negative voltage is applied to the high-voltage electrode plate, it is connected to the negative 15 kV high-voltage power supply.

[0016] Furthermore, when a positive voltage is applied to the high-voltage electrode plate (5-1), if the beam receiving target (4-2-1) can receive the beam, the processed dimensions inside the ion source anode cavity (3-1) produce negative hydrogen ions; when a negative voltage is applied to the high-voltage electrode plate (5-1), if the beam receiving target (4-2-1) can receive the beam, the processed dimensions inside the ion source anode cavity (3-1) produce alpha particles.

[0017] Furthermore, the Faraday cage (4-1) with an electric field and the high-voltage electrode plate (5-1) of the mobile high-voltage feed-in system (5) are of equal potential, that is, the high voltage carried by the current Faraday cage (4-1) and the current high-voltage electrode plate (5-1) are the same; the same high voltage carried means that the polarity and magnitude of the high voltage carried by both parties are the same, thereby ensuring that the Faraday cage 4-1 and the high-voltage electrode plate 5-1 are of equal potential.

[0018] Furthermore, the beam receiving total target (4-2-1) is composed of two rectangular probe metal plates which form a set angle with each other, one of the two rectangular target head metal plates is fixedly connected to the beam probe support rod (4-3), and the other extends out of the end of the beam probe support rod (4-3) to receive the beam and is inclined along a direction perpendicular to the trajectories of different beams (3-3) at 90 degrees.

[0019] Furthermore, the length of the rectangular probe metal plate extending beyond the beam probe support rod (4-3) is long enough to receive all beams (3-3) of different trajectory radii drawn out from the ion source anode cavity (3-1).

[0020] Furthermore, the beam probe (4-2) is arranged on a beam probe support rod (4-3); one end of the beam probe support rod (4-3) away from the ion source anode cavity (3-1) is connected to an insulating tube (4-4); one end of the beam probe support rod (4-3) close to the anode cavity is fixedly mounted with a beam receiving total target (4-2-1) and an integral target (4-2-2); the integral target (4-2-2) is a T-shaped baffle and a cylindrical copper block, and the cylindrical copper block is fixedly mounted at 90 degrees perpendicularly to the beam probe support rod (4-3) close to the ion source anode cavity (3-1); a slit of about 2 mm is provided on the T-shaped baffle to allow the beam to pass through, and other positions of the T-shaped baffle can block beams of other deflection radii, and the particle flow intensities of different deflection radii are measured by the forward and backward movement of the beam probe (4-2).

[0021] Furthermore, the process of applying high voltage to the ion source anode chamber (3-1) by the high voltage electrode plate (5-1) to extract ions is the process of exercising the ion source anode chamber (3-1) with high voltage while extracting ions, and the process of continuously extracting ions is the process of continuously exercising the ion source anode chamber (3-1).

[0022] Advantages and effects of the present invention

[0023] 1. The invention can be used to test and measure the current intensity of ion beams under different electrical parameters offline, thus reducing the debugging time of the entire accelerator.

[0024] 2. The flow intensity test parameters of the ion source on the extracted beam debugging device can be used to determine how to adjust the machining dimensions of the ion source, so as to better optimize the mechanical structure of the ion source anode cavity.

[0025] 3. The ion source spare parts can be reserved according to the extracted beam debugging device. After adjusting the electrical parameters on the extracted beam debugging device, if the ion source officially used by the accelerator is damaged, the ion source debugged and measured on the extracted beam debugging device can be directly replaced, saving the time for accelerator inspection and maintenance. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 This is the first perspective of the device of the present invention - a schematic diagram of the beam test device entering the C-shaped magnet;

[0027] Figure 2 This is a second viewing angle of the device of the present invention - a schematic diagram of the beam test device not entering the C-shaped magnet;

[0028] Figure 3 It is a schematic diagram of the overall structure of the ion source of the present invention;

[0029] Figure 4 The figure is a diagram showing the internal structure of the movable beam test device of the present invention;

[0030] Figure 5 This is a schematic diagram of the beam extraction gap of the anode cavity of the ion source of the present invention;

[0031] Figure 6 This is the first viewing angle of the high voltage electrode plate and the ion source anode chamber of the present invention;

[0032] Figure 7 This is the second viewing angle of the high voltage electrode plate and the ion source anode chamber of the present invention;

[0033] Figure 8 A schematic diagram of a beam probe of a movable ion source beam test device of the present invention;

[0034] Fig. 9 Schematic diagram of a Faraday cage with an electric field according to the present invention;

[0035] Fig.10 Schematic diagram of the internal structure of the anode chamber of the ion source of the present invention.

[0036] In the figure: 1: multifunctional test bracket; 2: C-type magnet; 3: movable ion source system; 3-1: ion source anode chamber; 3-1-1: inner wall of ion source anode chamber; 3-2: beam extraction gap; 3-3: beam; 4: movable beam measurement system; 4-1: Faraday cage; 4-2: beam probe; 4-2-1: beam receiving total target; 4-2-2: integrating target; 4-3: beam probe support rod; 5: movable high-voltage feeding system; 5-1: high-voltage electrode plate; 6: multifunctional vacuum box; 6-1: observation window. DETAILED DESCRIPTION

[0037] Design principle of the present invention

[0038] 1. Innovations of the present invention: One of the innovations is the use of a potential difference method to test the internal processing dimensions of the ion source anode cavity 3-1, specifically by applying high voltages of different polarities to the high-voltage electrode plate 5-1 to determine the type of ions being drawn out, and judging whether the internal processing dimensions of the anode cavity are qualified based on the type of ions being drawn out. Since the internal structure of the anode cavity is very complex and difficult to process, there is no instrument on the market that can measure the internal processing dimensions of the anode cavity structure. During the processing, even an error of a few tenths of a millimeter will cause the currently produced particles to change into another type of ion instead of the currently desired ion. Therefore, measuring the internal processing dimensions of the anode cavity has become a major problem in this field, and the potential difference method of the present invention solves this problem; the second innovation is that a new layout method of the accelerator central area structure is changed on the outside of the cyclotron. The new layout method of the central area structure does not block a part of the ions but retains all the drawn particles (the original central area structure, assuming that the anode cavity draws out H + 、H2 + 、H3 + Three kinds of positive ions, only one kind of positive ion is retained and the other two kinds of positive ions are blocked), and the current intensity of each kind of ion is tested. The significance of testing the current intensity of each kind of ion is that the current intensity of the ion can be increased by increasing the internal processing size of the anode cavity as needed. The increase of the ion current intensity by increasing the internal processing size of the anode cavity means that within a certain range, if the conversion range from H- to α ions is 0.5 mm, then the beam current intensity is increased by increasing the internal size of the anode cavity by 0.1 mm each time within a range not exceeding 0.5 mm.

[0039] In short: the significance of the first innovation is that the potential difference method is used to control the large-scale processing size inside the anode cavity. The large range is the range from one ion to another. Controlling the large-scale processing size inside the anode cavity can ensure that the type of particles currently produced is correct and will not change to another type of ion because the internal size of the anode cavity exceeds this large range. The significance of the second innovation is that the intensity of the beam is adjusted by the method that all ions in the anode cavity are drawn out and all currents are tested. The premise of adjusting the beam intensity is to be able to measure the current intensity of all ions (all ions generally refer to 3 types of positive ions, and only 1 type of H- ions). After measuring all the current intensities, the current intensity is increased by increasing the internal processing size of the anode cavity within the adjustable range (not exceeding the large range) as needed.

[0040] 2. The design principle of combining "potential difference" and "equipotential": The "potential difference" method ensures that the internal processing dimensions of the anode cavity meet the requirements and the type of ions are correct. The "equipotential" method ensures that the various ions are clearly separated according to their respective trajectories under the action of the magnetic field after being drawn out. Only when the beam trajectories are clearly separated can the integrating target 4-3 accurately obtain the current intensity of each ion. If high voltage is not applied to the Faraday cage, the ions will decelerate after passing through the high-voltage electrode plate. At this time, although they are also affected by the magnetic field force, they are disturbed by the deceleration effect of the electric field, so that the ions cannot run separately along their respective trajectories well. In this case, the beam received by the integrating target 4-3 will be mixed with other beams and cannot be distinguished. If the intensity of each beam cannot be distinguished, the current intensity cannot be increased.

[0041] Based on the above principles, the present invention designs a cyclotron physical parameter testing device arranged outside the cyclotron, such as Figure 1-10As shown, it includes a multifunctional test stand 1 arranged outside the cyclotron, a C-shaped magnet 2 arranged on the multifunctional test stand 1 for simulating the magnetic field environment of the cyclotron, a movable ion source system 3 arranged on the multifunctional test stand 1 for simulating the internal ion source of the cyclotron, a movable beam measurement system 4 arranged on the multifunctional test stand for testing the ion source beam, and a movable high-voltage feeding system 5 arranged on the multifunctional test stand 1 for leading the beam from the beam extraction gap 3-2 of the ion source anode cavity (3-1); the movable ion source system 3, the movable The movable beam measurement system 4 and the movable high-voltage feed-in system 5 are respectively arranged in a multifunctional vacuum box 6 through a vacuum joint. In the working state, the test device moves the movable ion source system 3, the movable beam measurement system 4, and the movable high-voltage feed-in system 5 to the central plane of the C-shaped magnet 2, and performs a test on the accelerator-related physical parameters in the central plane of the C-shaped magnet 2. The test on the related physical parameters includes the test on the internal processing dimensions of the ion source anode cavity, the test on the current strength of different types of beams drawn out of the ion source anode cavity, and the test on the internal and external training of the ion source anode cavity.

[0042] Its features are:

[0043] like Figure 4 , Figure 5 As shown, the movable beam measurement system 4 includes a Faraday cage 4-1 with an electric field, which is arranged near the beam extraction gap 3-2 of the ion source anode chamber 3-1, and is used to receive the beam extracted from the beam extraction gap 3-2 of the ion source anode chamber 3-1; the Faraday cage 4-1 with an electric field and the high-voltage electrode plate 5-1 of the movable high-voltage feeding system 5 have the same electric potential, so as to keep the beam moving at a uniform speed after being extracted from the anode chamber and being only affected by the magnetic field force;

[0044] like Figure 8 As shown, the movable beam measurement system 4 also includes a beam probe 4-2 with a beam receiving total target and an integrating target arranged in the Faraday cage 4-1, the beam probe 4-2 is used to receive the beam drawn out from the ion source, and adjust the recording power supply parameters by changing the parameters of the beam; the beam probe includes a beam receiving total target 4-2-1 and an integrating target 4-2-2, the beam receiving total target 4-2-1 is used to receive all beams drawn out from the ion source anode cavity 3-1, the integrating target 4-2-2 is used to receive different types of beams drawn out from the ion source anode cavity 3-1, the beam probe 4-2 is placed inside the Faraday cage 4-1, and the beam probe 4-2 moves back and forth in a small range along the straight line direction under the action of the tail end linear drive device, so as to determine the maximum deflection radius of the beam;

[0045] Supplementary Note 1:

[0046] like Figure 4 As shown, the movable beam measurement system 4 includes two parts, one part is arranged inside the Faraday cage 4-1, and the other part is arranged outside the Faraday cage 4-1; the linear drive device is arranged outside the Faraday cage 4-1, including electrodes, a reducer, and a bellows; the insulating tube (4-4), the beam probe support rod 4-3, and the beam probe 4-2 are arranged inside the Faraday cage 4-1;

[0047] like Figure 6 As shown, the movable high-voltage feeding system 5 is provided with a high-voltage electrode plate 5-1 outside the ion source anode cavity 3-1 and close to the beam extraction gap 3-2 of the anode cavity 3-1. The high-voltage electrode plate 5-1 is fixedly mounted on the Faraday cage 4-1. The high-voltage electrode plate 5-1 carries positive high voltage or negative high voltage, and extracts the H- or α particles inside the beam extraction gap 3-2 of the ion source anode cavity 3-1 through the high-voltage potential difference; the H- or α particles in the ion source anode cavity 3-1 are pulled out by the high voltage outside and enter the Faraday cage 4-1, and are deflected by the Lorentz force under the magnetic field of the C-type magnet 2, and are received by the probe 4-2 of the movable beam measurement system 4 in the Faraday cage 4-1. By analyzing the current high-voltage polarity of the high-voltage electrode plate 5-1 and the type of ions currently received by the probe 4-2, it is checked whether the internal processing dimensions of the ion source anode cavity 3-1 are qualified;

[0048] Supplementary Note 2:

[0049] like Fig.10 As shown, the inspection of whether the internal processing size of the anode cavity 3-1 of the ion source is qualified is because the internal structure of the anode cavity 3-1 is very complex, small at both ends and large in the middle, and it is very difficult to process. The internal size determines the type of ions produced. If the internal size differs by a few tenths of a millimeter, the type of particles produced will change, from H- ions to α ions or from α ions to H- ions. At present, there is no such instrument on the market that can reach into the anode cavity's special-shaped cavity to detect its size, so the potential difference method is used. If the high-voltage electrode plate 5-1 is added with positive high voltage and the anode cavity can draw out a beam, then the ions drawn out must be H- ions, and the internal size of the anode cavity must be the size of the H- ions produced, thereby judging whether the internal processing size of the anode cavity 3-1 is qualified.

[0050] The beam extracted by the movable ion source system 3 is affected by the interaction between the high voltage extracted from the high voltage electrode plate 5 - 1 and the C-shaped magnet 2 , and the beam is deflected into the Faraday cage 4 - 1 and received by the movable beam measurement system 4 .

[0051] like Figure 5 , Figure 7As shown, the plane of the high-voltage electrode plate 5-1 and the plane of the beam outlet 3-2 of the ion source anode chamber 3-1 are parallel to each other and there is a set distance between the planes; the set distance is based on the standard that the high-voltage electric field is sufficient to pull out the ions in the ion source anode chamber 3-1.

[0052] The high-voltage electrode plate 5-1 is connected to a positive 15 kV high-voltage power supply and a negative 15 kV high-voltage power supply respectively. When a positive voltage is applied to the high-voltage electrode plate 5-1, it is connected to the positive 15 kV high-voltage power supply. When a negative voltage is applied to the high-voltage electrode plate, it is connected to the negative 15 kV high-voltage power supply.

[0053] When a positive voltage is applied to the high-voltage electrode plate 5-1, if the beam receiving target 4-2-1 can receive the beam, the processed dimensions inside the ion source anode cavity 3-1 produce negative hydrogen ions; when a negative voltage is applied to the high-voltage electrode plate 5-1, if the beam receiving target 4-2-1 can receive the beam, the processed dimensions inside the ion source anode cavity 3-1 produce alpha particles.

[0054] Supplementary Note 3:

[0055] The purpose of connecting the high-voltage electrode plate 5-1 to two high-voltage power supplies is to avoid wrong connection. When one high voltage is connected, the other high voltage will definitely not be connected. If the anode cavity is not inspected and directly put into the accelerator for use, when the processing size of the anode cavity differs by a few tenths of a millimeter, H-ions should be produced, but protons are actually produced, and the accelerator cannot distinguish which one is currently produced, because both H-ions and protons can be accelerated in the accelerator. After using the potential difference method, it is possible to timely determine which type of ions are currently produced, and the accelerator can only be put into use when the internal processing size of the anode cavity is qualified.

[0056] like Figure 7 As shown, the Faraday cage 4-1 with an electric field and the high-voltage electrode plate 5-1 of the mobile high-voltage feeding system 5 are at the same potential, that is, the high voltage carried by the current Faraday cage 4-1 and the current high-voltage electrode plate 5-1 is the same; the same high voltage carried means that the polarity and magnitude of the high voltage carried by both parties are the same, thereby ensuring that the Faraday cage 4-1 and the high-voltage electrode plate 5-1 are at the same potential.

[0057] like Figure 8 As shown, the beam receiving target 4-2-1 is composed of two rectangular probe metal plates which form a set angle with each other. One of the two rectangular target head metal plates is fixedly connected to the beam probe support rod 4-3, and the other extends out of the end of the beam probe support rod 4-3 to receive the beam and is inclined along a direction perpendicular to the trajectories of different beams 3-3 at 90 degrees.

[0058] like Figure 8As shown, the length of the rectangular probe metal plate extending beyond the beam probe support rod 4-3 is long enough to receive all beams 3-3 of different trajectory radii drawn out from the ion source anode cavity 3-1.

[0059] like Figure 4 , Figure 8 As shown, the beam probe 4-2 is arranged on the beam probe support rod 4-3, and the end of the beam probe support rod 4-3 away from the ion source anode cavity 3-1 is connected to the insulating tube 4-4, and the end close to the anode cavity is fixed with a beam receiving total target 4-2-1 and an integrating target 4-2-2; the integrating target 4-2-2 is a T-shaped baffle and a cylindrical copper block, and the cylindrical copper block is fixed at 90 degrees to the beam probe support rod 4-3 close to the end of the ion source anode cavity (3-1); there is a slit of about 2mm on the T-shaped baffle to allow the beam to pass through, and the other positions of the T-shaped baffle can block the beams of the remaining deflection radii, and the particle flow intensity of different deflection radii is measured by the forward and backward movement of the beam probe 4-2.

[0060] The process of the high voltage electrode plate 5-1 applying high voltage to the ion source anode cavity 3-1 to extract ions is the process of exercising the ion source anode cavity 3-1 with high voltage while extracting ions. The process of continuous ion extraction is the process of continuous exercise of the ion source anode cavity 3-1. Embodiment 1

[0061] The present invention designs a cyclotron internal ion source extraction beam debugging device. The device mainly comprises a C-type magnet 2, a multifunctional vacuum box 6, a multifunctional test bracket 1, an ion source system 3, a Faraday cage 4-1, a vacuum system, a high-voltage feed system 5, a movable beam measurement system 4, a high-voltage electrode plate 5-1 system of the high-voltage feed system 5, and other components.

[0062] The beam extracted from the ion source system is affected by the interaction between the high voltage extracted from the high voltage electrode plate 5-1 and the C-type magnet 2. The beam is deflected into the Faraday cage 4-1 and received by the beam measuring system 4.

[0063] The cyclotron internal ion source extraction beam debugging device is a high-voltage experimental device, so guardrails are set up in its working area and personnel access is strictly controlled.

[0064] The ion beam is deflected under the magnetic field of the C-shaped magnet 2 , and the C-shaped magnet 2 is fixedly mounted on the multifunctional test bracket 1 .

[0065] The multifunctional vacuum box 6 is installed on the slide rail of the multifunctional test bracket 1. The multifunctional vacuum box 6 can move back and forth on the multifunctional test bracket 1. The multifunctional vacuum box 6 has two working positions, one is the beam output debugging position inside the C-type magnet, and the other is the maintenance position at one end of the vacuum box bracket. Two observation windows 6-1 are arranged on the multifunctional vacuum box 6 for observing the arcing of the ion source. Two handrails for pushing and pulling are welded on the multifunctional vacuum box 6. Four hanging points are arranged on the multifunctional vacuum box 6. Multiple KF vacuum interfaces are reserved on the multifunctional vacuum box 6 for placing vacuum gauges and feedthrough vacuum threading interfaces. A molecular pump inverted interface is reserved on the upper cover plate of the multifunctional vacuum chamber. The molecular pump is used to pump the interior of the multifunctional vacuum chamber to a high vacuum state.

[0066] The ion source system 3 is installed inside the multifunctional vacuum box 6 via a flange on the side of the multifunctional vacuum box 6 .

[0067] The bottom of the multifunctional vacuum box 6 is paved with a polytetrafluoroethylene material sheet for isolating high pressure.

[0068] The Faraday cage 4-1 is fixedly mounted on a polytetrafluoroethylene plate. The Faraday cage 4-1 is made of aluminum sheet metal. The aluminum alloy parts of the Faraday cage 4-1 are connected to each other, and the fixing holes are directly long holes, which can better adjust the relative positions between the various devices, have better size adaptability, and are more in line with the original design intention of the debugging device. The top surface of the Faraday cage 4-1 is provided with a hinge to form a flip-cover structure, which is convenient for better inspection of the inside of the Faraday box. The top surface of the Faraday cage 4-1 is provided with a thick insulating polytetrafluoroethylene plate, which not only ensures the insulation of the flange box and the multifunctional vacuum box, but also ensures that it plays a supporting role when the multifunctional vacuum box is evacuated, and ensures that the multifunctional vacuum box is not deformed due to the vacuum pressure difference.

[0069] A plurality of long holes are opened at one end of the Faraday cage 4-1, and the long holes are used to install and arrange beam detection targets, and the long holes can also be used to route beam receiving signal lines and feed high voltage lines. The feed high voltage line is connected to the vacuum through the feedthrough vacuum interface to load the high voltage on the Faraday box.

[0070] The high-voltage electrode plate 5-1 is fixedly mounted on the Faraday cage 4-1. The high-voltage electrode plate 5-1 also carries high voltage, and draws out the H- from the ion source beam inside the gap 3-2 through the high-voltage potential difference, so that the ions enter the Faraday cage and are deflected by the Lorentz force under the magnetic field of the C-type magnet 2, thereby passing through the Faraday cage and hitting the beam probe 4-2 inside the Faraday cage.

[0071] The beam probe 4-2 is used to receive the beam from the ion source and adjust the recording power supply parameters by changing the beam parameters. The beam probe 4-2 is placed inside the Faraday box. The beam probe 4-2 can move back and forth in a small range along the straight line direction under the action of the linear drive device at the tail end, so as to determine the maximum deflection radius of the beam.

[0072] The beam probe 4-2 is divided into a total beam receiving target 4-2-1 and an integral target 4-2-2. The total beam receiving target 4-2-1 is also called a total beam intensity target, and the integral target 4-2-2 is also called a beam differential target. The total beam intensity target can measure the total intensity of all beams drawn out by the ion source. The beam differential target is a T-shaped baffle and a cylindrical copper block. There is a slit of about 2mm on the T-shaped baffle to allow the beam to pass through. The other positions of the baffle can block the beams of the remaining deflection radius. Through the forward and backward movement of the target head, the particle flow intensity of different deflection radii can be measured. In order to prevent the problem of drooping caused by the target rod being too long, two insulating support blocks are set.

[0073] A plurality of cable clips are arranged inside the multifunctional vacuum box to prevent the high-voltage wires from moving inside the multifunctional vacuum box. Embodiment 2

[0074] The ion source system 3, the observation window, the Faraday cage 4-1, the high-voltage electrode plate 5-1, the movable beam measurement system 4, etc. are installed in place in sequence, and the multifunctional vacuum box 6 is pushed into the C-type magnet 2. The C-type magnet 2 is electrically excited and waits for the current value to stabilize. The ion source anode cavity 3-1 is arced, and the ion source system 3 draws out the beam, and a high voltage is applied to the piezoelectric electrode plate 5-1 through the vacuum joint. The piezoelectric electrode plate 5-1 draws out the beam through the high-voltage potential difference to the Faraday cage 4-1. Under the action of the magnetic field of the C-type magnet 2, the beam is deflected. The beam probe 4-2 and the beam probe support rod 4-3 are controlled by the motor to move toward the ion source anode cavity 3-1. First, the value displayed on the beam receiving total target 4-2-1 gradually increases, and the beam receiving total target 4-2-1 is gradually driven to move toward the ion source. After reaching a certain position, the value displayed on the beam receiving total target 4-2-1 reaches the maximum and no longer changes. Continue to drive the beam probe 4-2 and the beam probe support rod 4-3 to move, and the integrating target 4-2-2 begins to receive the beam. When the integrating target 4-2-2 moves to different positions, it receives particles with different deflection radii. By recording these positions through motor position feedback, the approximate deflection radius of the beam under different electrical parameters can be known.

[0075] It should be emphasized that the above specific embodiments are merely explanations of the present invention, and they are not limitations of the present invention. After reading this specification, those skilled in the art can make modifications to the above embodiments without any creative contribution as needed, but as long as they are within the scope of the claims of the present invention, they are protected by patent law.

Claims

1. A cyclotron physical parameter testing device arranged outside a cyclotron, comprising a multifunctional testing support (1) arranged outside the cyclotron, a C-shaped magnet (2) arranged on the multifunctional testing support (1) for simulating the magnetic field environment of the cyclotron, a movable ion source system (3) arranged on the multifunctional testing support (1) for simulating the internal ion source of the cyclotron, a movable beam measuring system (4) arranged on the multifunctional testing support for testing the ion source beam, and a movable high-voltage feeding system (5) arranged on the multifunctional testing support (1) for leading the beam from a beam leading gap (3-2) of an ion source anode chamber (3-1); The movable ion source system (3), the movable beam measurement system (4), and the movable high-voltage feed system (5) are arranged in a multifunctional vacuum box (6) through vacuum joints. In a working state, the testing device moves the movable ion source system (3), the movable beam measurement system (4), and the movable high-voltage feed system (5) to the central plane of the C-shaped magnet (2), and performs a test on the accelerator-related physical parameters in the central plane of the C-shaped magnet (2). The test on the relevant physical parameters includes a test on the internal processing dimensions of the ion source anode cavity, a test on the current strength of different types of beams drawn out of the ion source anode cavity, and a test on the internal and external training of the ion source anode cavity. Features: The movable beam measurement system (4) comprises a Faraday cage (4-1) with an electric field, the Faraday cage (4-1) with an electric field being arranged near a beam extraction gap (3-2) of an ion source anode chamber (3-1) and being used to receive a beam extracted from the beam extraction gap (3-2) of the ion source anode chamber (3-1); the Faraday cage (4-1) with an electric field and a high-voltage electrode plate (5-1) of a movable high-voltage feed-in system (5) are of equal potential, so as to keep the beam moving at a uniform speed after being extracted from the anode chamber and being acted upon only by a magnetic field force; The movable beam measurement system (4) further comprises a beam probe (4-2) with a beam receiving total target and an integral target arranged in the Faraday cage (4-1), the beam probe (4-2) being used to receive the beam drawn out from the ion source, and adjusting and recording power supply parameters by changing beam parameter; the beam probe comprises a beam receiving total target (4-2-1) and an integral target (4-2-2), the beam receiving total target (4-2-1) being used to receive all beams drawn out from the ion source anode cavity (3-1), the integral target (4-2-2) being used to receive different types of beams drawn out from the ion source anode cavity (3-1), the beam probe (4-2) being placed inside the Faraday cage (4-1), and the beam probe (4-2) being moved forward and backward in a small range along a straight line direction under the action of a tail end linear drive device, thereby determining a maximum beam deflection radius; The movable high-voltage feeding system (5) is provided with a high-voltage electrode plate (5-1) outside the ion source anode chamber (3-1) and close to the beam extraction gap (3-2) of the anode chamber (3-1). The high-voltage electrode plate (5-1) is fixedly mounted on the Faraday cage (4-1). The high-voltage electrode plate (5-1) carries positive high voltage or negative high voltage and extracts H- or α particles inside the beam extraction gap (3-2) of the ion source anode chamber (3-1) through a high-voltage potential difference. The H- or α particles in the ion source anode chamber (3-1) are pulled out by the high voltage outside and enter the Faraday cage. Under the action of the magnetic field of the C-shaped magnet (2), they are deflected by the Lorentz force and are received by the probe (4-2) of the movable beam measuring system (4) in the Faraday cage (4-1). By analyzing the high voltage polarity of the current high voltage electrode plate (5-1) and the type of ions received by the current probe (4-2), checking whether the internal processing dimensions of the ion source anode chamber (3-1) are qualified; The beam extracted by the movable ion source system (3) is affected by the interaction between the high voltage extracted on the high voltage electrode plate (5-1) and the C-shaped magnet (2), and the beam is deflected into the Faraday cage (4-1) and received by the movable beam measurement system (4).

2. The cyclotron physical parameter testing device arranged outside the cyclotron according to claim 1, characterized in that: The plane of the high-voltage electrode plate (5-1) and the plane of the beam outlet (3-2) of the ion source anode chamber (3-1) are parallel to each other and there is a set distance between the two planes; the set distance is based on the standard that the high-voltage electric field is sufficient to pull out the ions in the ion source anode chamber (3-1).

3. The cyclotron physical parameter testing device arranged outside the cyclotron according to claim 1, characterized in that: The high-voltage electrode plate (5-1) is respectively connected to a positive 15 kV high-voltage power supply and a negative 15 kV high-voltage power supply. When a positive voltage is applied to the high-voltage electrode plate (5-1), it is connected to the positive 15 kV high-voltage power supply; when a negative voltage is applied to the high-voltage electrode plate, it is connected to the negative 15 kV high-voltage power supply.

4. The cyclotron physical parameter testing device arranged outside the cyclotron according to claim 1, characterized in that: When a positive voltage is applied to the high-voltage electrode plate (5-1), if the beam receiving target (4-2-1) can receive the beam, the processed dimensions inside the ion source anode cavity (3-1) produce negative hydrogen ions; when a negative voltage is applied to the high-voltage electrode plate (5-1), if the beam receiving target (4-2-1) can receive the beam, the processed dimensions inside the ion source anode cavity (3-1) produce alpha particles.

5. The cyclotron physical parameter testing device arranged outside the cyclotron according to claim 1, characterized in that: The Faraday cage (4-1) with an electric field and the high-voltage electrode plate (5-1) of the mobile high-voltage feed-in system (5) have the same electric potential, that is, the high voltage carried by the current Faraday cage (4-1) and the current high-voltage electrode plate (5-1) is the same; the high voltage carried is the same means that the polarity and magnitude of the high voltage carried by both parties are the same, thereby ensuring that the Faraday cage (4-1) and the high-voltage electrode plate (5-1) have the same electric potential.

6. The cyclotron physical parameter testing device arranged outside the cyclotron according to claim 1, characterized in that: The beam receiving total target (4-2-1) is composed of two rectangular probe metal flat plates which form a set angle with each other, one of the two rectangular target head metal flat plates being fixedly connected to the beam probe support rod (4-3), and the other extending out of the end of the beam probe support rod (4-3) to receive the beam and being inclined along directions which are 90 degrees perpendicular to the trajectories of different beams (3-3).

7. The cyclotron physical parameter testing device arranged outside the cyclotron according to claim 6, characterized in that: The length of the rectangular probe metal plate extending beyond the beam probe support rod (4-3) is long enough to receive all beams (3-3) of different trajectory radii drawn out from the ion source anode cavity (3-1).

8. The cyclotron physical parameter testing device arranged outside the cyclotron according to claim 1, characterized in that: The beam probe (4-2) is arranged on a beam probe support rod (4-3); one end of the beam probe support rod (4-3) away from the ion source anode cavity (3-1) is connected to an insulating tube (4-4); one end of the beam probe support rod (4-3) close to the anode cavity is fixedly mounted with a beam receiving total target (4-2-1) and an integral target (4-2-2); the integral target (4-2-2) is a T-shaped baffle and a cylindrical copper block; the cylindrical copper block is fixedly mounted perpendicularly to the beam probe support rod (4-3) close to one end of the ion source anode cavity (3-1) at 90 degrees; a slit of about 2 mm is provided on the T-shaped baffle to allow the beam to pass through; other positions of the T-shaped baffle can block beams of other deflection radii; and particle flow intensities of different deflection radii are measured by the forward and backward movement of the beam probe (4-2).

9. The cyclotron physical parameter testing device arranged outside the cyclotron according to claim 1, characterized in that: The process of applying high voltage to the ion source anode cavity (3-1) by the high voltage electrode plate (5-1) to extract ions is the process of exercising the ion source anode cavity (3-1) with high voltage while extracting ions, and the process of continuously extracting ions is the process of continuously exercising the ion source anode cavity (3-1).

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