Drive power supply device and automated test equipment

By introducing a voltage adjustment module into the driving power supply device, the gate voltage of the measured power device is realized, which solves the problem that the gate driving voltage cannot be adjusted in the prior art, meets the testing needs of devices of different specifications, and ensures the safety of the test system and data accuracy.

CN119070598BActive Publication Date: 2025-05-27HANGZHOU FIRSTACK TECH
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Patent Information

Application Number
CN202411570958.4
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-11-06
Publication Date
2025-05-27
Estimated Expiration
2044-11-06

AI Technical Summary

Technical Problem

In the prior art, the driving power supply circuit in ATE cannot adjust the gate driving voltage, which cannot meet the testing needs of semiconductor manufacturers for devices with different power specifications.

Method used

A driving power supply device is provided, including a power supply module, a voltage regulation module and a gate driving module. The DC power supply is converted into a target high voltage signal through the power supply module, and the current gate voltage of the device under test is collected and displayed through the voltage regulation module, receiving the target gate voltage value input by the user, generating the adjusted gate voltage signal, and transmitting it to the gate of the device under test.

Benefits of technology

The gate voltage of the measured power device is adjusted online, meeting the automated testing needs of different semiconductor manufacturers for power devices of different specifications, and ensuring the safety of the test system and the accuracy of data.

✦ Generated by Eureka AI based on patent content.

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Patent Text Reader

Abstract

The present application provides a drive power supply device and an automated test device, relating to the field of power electronics technology. The device includes: a power supply module, a voltage regulation module, and a gate drive module. The input end of the power supply module is used to connect to a DC power supply signal, and the output end of the power supply module is connected to the voltage regulation module; the power supply module is used to convert the DC power supply signal into a target high-voltage signal and transmit the target high-voltage signal to the first end of the voltage regulation module; the second end of the voltage regulation module is connected to the input end of the gate drive module. The voltage regulation module is used to obtain and display the current gate voltage signal of the power device under test via the gate drive module, receive the target gate voltage value input by the user, generate an adjusted gate voltage signal according to the target gate voltage value, and transmit the adjusted gate voltage signal to the gate of the power device under test via the gate drive module to control the on / off of the power device under test, thereby realizing the on-line adjustment of the gate voltage of the power device under test.
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Description

Technical Field

[0001] This application relates to the field of power electronics technology, and more particularly, to a drive power supply device and an automatic test equipment. Background Art

[0002] During the process of designing power devices, semiconductor manufacturers need to conduct a large number of test verifications on aspects such as the functions, performance, and reliability of the devices. Among them, most semiconductor manufacturers choose automatic test equipment (ATE) to conduct tests such as double pulse and short circuit on the devices to verify the performance of the devices.

[0003] In related technologies, the gate drive voltage output by the drive power supply circuit in ATE is a fixed value, and there is a problem that the gate drive voltage cannot be adjusted, resulting in the inability to meet the needs of semiconductor manufacturers for testing devices with different power specifications. Summary of the Invention

[0004] The purpose of this application is to provide a drive power supply device and an automatic test equipment to solve the technical problems existing in the prior art in view of the deficiencies in the above-mentioned prior art.

[0005] To achieve the above purpose, the technical solutions adopted in the embodiments of this application are as follows:

[0006] In a first aspect, an embodiment of this application provides a drive power supply device, which includes: a power supply module, a voltage adjustment module, and a gate drive module;

[0007] The input end of the power supply module is used to connect to a DC power supply signal, and the output end of the power supply module is connected to the voltage adjustment module;

[0008] The power supply module is used to convert the DC power supply signal into a target high-voltage signal and transmit the target high-voltage signal to the first end of the voltage adjustment module;

[0009] The second end of the voltage adjustment module is connected to the input end of the gate drive module. The voltage adjustment module is used to obtain and display the current gate voltage signal of the power device under test via the gate drive module, receive the target gate voltage value input by the user, generate an adjusted gate voltage signal according to the target gate voltage value, and transmit the adjusted gate voltage signal to the gate of the power device under test via the gate drive module to control the on / off of the power device under test, and make the adjusted gate voltage between the voltage of the target high-voltage signal and zero voltage.

[0010] Optionally, the power supply module includes: an inverter circuit, an isolation circuit, and a rectifier circuit; the inverter circuit and the rectifier circuit are electromagnetically connected via the isolation circuit;

[0011] The inverter circuit is configured to access the DC power supply signal, invert the DC power supply signal into an AC voltage signal, and transmit the AC voltage signal to the rectifier circuit via the isolation circuit;

[0012] The rectifier circuit is configured to rectify the AC voltage signal to generate the target high-voltage signal, and transmit the target high-voltage signal to the first end of the voltage regulation module.

[0013] Optionally, the inverter circuit includes: a first capacitor, a first switching tube, and a second switching tube;

[0014] One end of the first capacitor is configured to access the DC power supply signal, and the other end of the first capacitor is connected to the first end of the first switching tube, the first end of the second switching tube, and the ground terminal respectively;

[0015] The second end of the first switching tube and the second end of the second switching tube are both connected to the primary side of the isolation circuit;

[0016] The third end of the first switching tube and the third end of the second switching tube are both configured to access a first control signal, and under the action of the first control signal, drive the first switching tube and the second switching tube to conduct alternately.

[0017] Optionally, the rectifier circuit includes: a first rectifier bridge unit, a second rectifier bridge unit, a second capacitor, and a third capacitor;

[0018] The input terminal of the first rectifier bridge unit and the input terminal of the second rectifier bridge unit are both connected to the secondary side of the isolation circuit;

[0019] The first output terminal of the first rectifier bridge unit is connected to one end of the second capacitor and the first end of the voltage regulation module respectively, and the second output terminal of the first rectifier bridge unit is connected to the other end of the second capacitor and the zero-potential reference point of the power device under test respectively;

[0020] The first output terminal of the second rectifier bridge unit is connected to one end of the third capacitor and the zero-potential reference point respectively, and the second output terminal of the second rectifier bridge unit is connected to the other end of the third capacitor and the first end of the voltage regulation module respectively.

[0021] Optionally, the voltage regulation module includes: a positive voltage regulation unit and a negative voltage regulation unit.

[0022] Optionally, the positive voltage regulation unit includes: a first processing unit, a first magnetic coupling isolator, a first digital-to-analog converter, a first analog-to-digital converter, a first amplifier, and a first power amplifier tube;

[0023] The first processing unit is connected to the first magnetic coupling isolator. The input end of the first magnetic coupling isolator is connected to the output end of the first analog-to-digital converter. The output end of the first magnetic coupling isolator is connected to the first digital-to-analog converter. The output end of the first digital-to-analog converter is connected to the non-inverting input end of the first amplifier. The output end of the first amplifier is connected to the base of the first power amplifier tube. The collector of the first power amplifier tube is connected to the first output end of the first rectifier bridge unit in the power supply module and one end of the second capacitor. The emitter of the first power amplifier tube is respectively connected to the input end of the first analog-to-digital converter and the first input end of the gate drive module;

[0024] The first analog-to-digital converter is configured to perform analog-to-digital conversion on the current gate positive voltage of the power device under test obtained via the gate drive module, generate a digital quantity of the current gate positive voltage, and transmit the digital quantity of the current gate positive voltage to the first processing unit via the first magnetic coupling isolator;

[0025] The first processing unit is configured to display the digital quantity of the current gate positive voltage, receive the target gate positive voltage value input by the user, generate a target gate positive voltage signal according to the target gate positive voltage value, and transmit the target gate positive voltage signal to the first digital-to-analog converter via the first magnetic coupling isolator;

[0026] The first digital-to-analog converter is configured to perform digital-to-analog conversion processing on the target gate positive voltage signal, generate an analog quantity of the target gate positive voltage, and transmit the analog quantity of the target gate positive voltage to the first amplifier;

[0027] The first amplifier is configured to perform amplification processing on the analog quantity of the target gate positive voltage, generate an amplified quantity of the target gate positive voltage, and transmit the amplified quantity of the target gate positive voltage to the first power amplifier tube;

[0028] The first power amplifier tube is configured to perform power amplification on the amplified quantity of the target gate positive voltage, generate an adjusted gate positive voltage signal, and transmit the adjusted gate positive voltage signal to the gate of the power device under test via the gate drive module to control the conduction of the power device under test.

[0029] Optionally, the negative voltage regulation unit includes: a second processing unit, a second magnetic coupling isolator, a second digital-to-analog converter, a second analog-to-digital converter, a second amplifier, and a second power amplifier tube;

[0030] The second processing unit is connected to the second magnetic coupling isolator. The input end of the second magnetic coupling isolator is connected to the output end of the second analog-to-digital converter. The output end of the second magnetic coupling isolator is connected to the second digital-to-analog converter. The output end of the second digital-to-analog converter is connected to the non-inverting input end of the second amplifier. The output end of the second amplifier is connected to the base of the second power amplifying transistor. The collector of the second power amplifying transistor is connected to the second output end of the second rectifier bridge unit in the power supply module and the other end of the third capacitor. The emitter of the second power amplifying transistor is respectively connected to the input end of the second analog-to-digital converter and the second input end of the gate driving module;

[0031] The second analog-to-digital converter is configured to perform analog-to-digital conversion on the current gate negative voltage of the power device under test obtained via the gate driving module, generate a digital quantity of the current gate negative voltage, and transmit the digital quantity of the current gate negative voltage to the second processing unit via the second magnetic coupling isolator;

[0032] The second processing unit is configured to display the digital quantity of the current gate negative voltage, receive a target gate negative voltage value input by a user, generate a target gate negative voltage signal according to the target gate negative voltage value, and transmit the target gate negative voltage signal to the second digital-to-analog converter via the second magnetic coupling isolator;

[0033] The second digital-to-analog converter is configured to perform digital-to-analog conversion processing on the target gate negative voltage signal, generate an analog quantity of the target gate negative voltage, and transmit the analog quantity of the target gate negative voltage to the second amplifier;

[0034] The second amplifier is configured to perform amplification processing on the analog quantity of the target gate negative voltage, generate an amplified quantity of the target gate negative voltage, and transmit the amplified quantity of the target gate negative voltage to the second power amplifying transistor;

[0035] The second power amplifying transistor is configured to perform power amplification on the amplified quantity of the target gate negative voltage, generate an adjusted gate negative voltage signal, and transmit the adjusted gate negative voltage signal to the gate of the power device under test via the gate driving module to control the turn-off of the power device under test.

[0036] Optionally, the positive voltage regulating unit further includes: a positive voltage regulating resistor and a fourth capacitor;

[0037] One end of the positive voltage regulating resistor is connected to the output end of the first amplifier, and the other end of the positive voltage regulating resistor is connected to the base of the first power amplifying transistor;

[0038] One end of the fourth capacitor is respectively connected to the emitter of the first power amplifier tube, the input end of the first analog-to-digital converter, and the first input end of the gate driving module, and the other end of the fourth capacitor is respectively connected to the zero-potential reference point of the power device under test.

[0039] Optionally, the gate driving module includes: a first triode, a second triode, a turn-on resistor, and a turn-off resistor;

[0040] The first end of the first triode is respectively connected to the input end of the first analog-to-digital converter, the emitter of the first power amplifier tube, and one end of the fourth capacitor, and the second end of the first triode is connected to one end of the turn-on resistor; the other end of the turn-on resistor is respectively connected to the gate of the power device under test and the other end of the turn-off resistor;

[0041] The first end of the second triode is respectively connected to the input end of the second analog-to-digital converter, the emitter of the second power amplifier tube, and one end of the fifth capacitor in the positive voltage regulation unit, and the second end of the second triode is connected to one end of the turn-off resistor;

[0042] The third ends of the first triode and the second triode are both used to access a second control signal, and under the action of the second control signal, drive the on-off of the first triode and the second triode.

[0043] In a second aspect, an embodiment of the present application further provides an automated test device, and the device includes: the driving power supply device provided in the first aspect above.

[0044] The beneficial effects of the present application are:

[0045] An embodiment of the present application provides a driving power supply device and an automated test device. The driving power supply device includes: a power supply module, a voltage regulation module, and a gate driving module. The power supply module converts the input DC power supply into a target high-voltage signal and transmits the target high-voltage signal to the voltage regulation module; and the voltage regulation module collects and displays the current gate voltage of the power device under test via the gate driving module, realizing online monitoring and display of the current gate voltage. At the same time, it receives the target gate voltage value input by the user, and after processing the target gate voltage value by the voltage regulation module, transmits the generated regulated gate voltage signal to the power device under test to control the on-off of the power device under test. Among them, the regulated gate voltage signal is between the target high-voltage signal and zero voltage, realizing online adjustment of the gate voltage of the power device under test, meeting the needs of different semiconductor manufacturers for automated testing of different specifications of power devices, and ensuring the safety of the test system and the accuracy of data. Description of the Drawings

[0046] To more clearly illustrate the technical solutions of the embodiments of the present application, the following briefly introduces the drawings required for the embodiments. It should be understood that the following drawings only show some embodiments of the present application, and therefore should not be regarded as limiting the scope. For those of ordinary skill in the art, without creative efforts, other relevant drawings can also be obtained based on these drawings.

[0047] Figure 1 It is a schematic structural diagram of a driving power supply circuit provided in the prior art;

[0048] Figure 2 It is a schematic structure of a driving power supply device provided in an embodiment of the present application Figure 1 ;

[0049] Figure 3 It is a schematic structure of a power supply module in the driving power supply device provided in an embodiment of the present application Figure 1 ;

[0050] Figure 4 It is a schematic structure of a power supply module in the driving power supply device provided in an embodiment of the present application Figure 2 ;

[0051] Figure 5 It is a schematic structure of a voltage regulation module in the driving power supply device provided in an embodiment of the present application Figure 1 ;

[0052] Figure 6 It is a schematic structure of a voltage regulation module in the driving power supply device provided in an embodiment of the present application Figure 2 ;

[0053] Figure 7 It is a schematic structure of a driving power supply device provided in an embodiment of the present application Figure 2 ;

[0054] Figure 8 It is a schematic structural diagram of an automated test device provided in an embodiment of the present application.

[0055] Icons: 100 - driving power supply device; 1 - power supply module; 2 - voltage regulation module; 3 - gate drive module; 11 - inverter circuit; 12 - isolation circuit; 13 - rectifier circuit; 21 - positive voltage regulation unit; 22 - negative voltage regulation unit; 200 - automated test device. Specific Embodiments

[0056] The following explains the technical solutions of the specific embodiments in conjunction with the drawings.

[0057] It should be noted that: Although this specification has described the present invention in detail with reference to the above embodiments, those of ordinary skill in the art should understand that those skilled in the relevant technical field can still modify, combine, or make equivalent substitutions to the present invention. All technical solutions and their improvements that do not depart from the spirit and scope of the present invention should be covered within the scope of the claims of the present invention.

[0058] First, the prior art related to this application will be introduced.

[0059] Reference Figure 1 As shown, it is a schematic structural diagram of a driving power supply circuit provided in an ATE device in the prior art. As Figure 1 shown, the driving power supply circuit provides a gate driving voltage V DD (or V SS ) as a fixed output. When it is necessary to adjust the gate driving voltage, it is necessary to change the input voltage or replace the type of zener diode. That is, the driving power supply circuit provided in the above Figure 1 has the problem that the gate driving voltage cannot be adjusted online through software, resulting in the inability to meet the needs of semiconductor manufacturers for testing devices with different power specifications.

[0060] In view of the above problems, this application proposes a driving power supply device. The driving power supply device includes: a power supply module, a voltage adjustment module, and a gate driving module. The power supply module converts the connected DC power supply into a target high-voltage signal and transmits the target high-voltage signal to the voltage adjustment module; the voltage adjustment module collects and displays the current gate voltage of the power device under test, realizing the monitoring and display of the current gate voltage. At the same time, it receives the target gate voltage value input by the user. After processing the target gate voltage value by the voltage adjustment module, the generated adjusted gate voltage signal is transmitted to the power device under test to control the on / off of the power device under test. Among them, the adjusted gate voltage signal is between the target high-voltage signal and zero voltage, realizing the online adjustment of the gate voltage of the power device under test, meeting the needs of different semiconductor manufacturers for automatic testing of power devices with different specifications, and ensuring the safety of the test system and the accuracy of data.

[0061] The structure of the driving power supply device provided in this application will be introduced in detail through the following embodiments.

[0062] Optionally, as shown in Figure 2 , the driving power supply device 100 includes: a power supply module 1, a voltage adjustment module 2, and a gate driving module 3.

[0063] The input end of the power supply module 1 is used to connect a DC power supply signal, and the output end of the power supply module 1 is connected to the voltage adjustment module 2;

[0064] A power supply module 1 is used to convert a DC power signal V CC into a target high-voltage signal V p (or V N ), and transmit the target high-voltage signal V p (or V N ) to the first end of the voltage regulation module 2;

[0065] The second end of the voltage regulation module 2 is connected to the input end of the gate drive module 3. The voltage regulation module 2 is used to obtain and display the current gate voltage signal of the power device under test (such as MOS-FET tube, IGBT tube) via the gate drive module 3, receive the target gate voltage value input by the user, and generate an adjusted gate voltage signal V DD (or V SS ), and transmit the adjusted gate voltage signal V DD (or V SS ) to the gate of the power device under test via the gate drive module 3 to control the on / off of the power device under test, and make the adjusted gate voltage V DD (or V SS ) between the voltage of the target high-voltage signal and zero voltage.

[0066] Optionally, in this embodiment, first, the power supply module 1 converts the accessed DC power signal V CC into a target high-voltage signal and transmits the target high-voltage signal to the voltage regulation module 2; at the same time, the voltage regulation module 2 collects and displays the current gate voltage of the power device under test via the gate drive module 3, realizing the online monitoring and display of the current gate voltage, so that the user can timely understand the actual output voltage (i.e., the current gate voltage) of the power device under test during the automated test. When it is found that the actual output voltage does not match the expected voltage, the target gate voltage value is input through the voltage regulation module 2. The voltage regulation module 2 adjusts and processes the received target gate voltage value, generates an adjusted gate voltage signal, and transmits the adjusted gate voltage signal to the power device under test via the gate drive module to control the on / off of the power device under test. Among them, the adjusted gate voltage signal is between the target high-voltage signal and zero voltage, realizing the online adjustment of the gate voltage of the power device under test, meeting the needs of different semiconductor manufacturers for automated testing of different specifications of power devices, and solving the problem in the prior art that the provided drive power circuit cannot adjust the gate drive voltage online through software.

[0067] In summary, the present application provides a driving power supply device, which includes a power supply module, a voltage regulation module, and a gate drive module. The power supply module converts the input DC power supply into a target high-voltage signal and transmits the target high-voltage signal to the voltage regulation module. The voltage regulation module collects and displays the current gate voltage of the power device under test via the gate drive module, realizing the online monitoring and display of the current gate voltage. At the same time, it receives the target gate voltage value input by the user. After processing the target gate voltage value by the voltage regulation module, the generated regulated gate voltage signal is transmitted to the power device under test to control the on / off of the power device under test. Among them, the regulated gate voltage signal is between the target high-voltage signal and zero voltage, realizing the online adjustability of the gate voltage of the power device under test, meeting the needs of different semiconductor manufacturers for automatic testing of power devices of different specifications, and ensuring the safety of the test system and the accuracy of data.

[0068] The specific structures of the above-mentioned Figure 2 modules will be introduced through the following embodiments.

[0069] Optionally, as shown in Figure 3 Figure, the power supply module 1 includes an inverter circuit 11, an isolation circuit 12, and a rectifier circuit 13; the inverter circuit 11 and the rectifier circuit 13 are electromagnetically connected via the isolation circuit 12.

[0070] The inverter circuit 11 is used to access the DC power supply signal V CC and invert the DC power supply signal V CC into an AC voltage signal, and transmit the AC voltage signal to the rectifier circuit 13 via the isolation circuit 12.

[0071] The rectifier circuit 13 is used to rectify the AC voltage signal to generate a target high-voltage signal V p (or V N ), and transmit the target high-voltage signal V p (or V N ) to the first end of the voltage regulation module 2.

[0072] In this embodiment, the inverter circuit 11, the isolation circuit 12, and the rectifier circuit 13 in the power supply module 1 can perform inversion, isolation, and rectification on the input DC power supply signal V CC to generate a target high-voltage signal V p (or V N ) to provide the required electrical energy for the power device under test.

[0073] The specific structures of the above-mentioned Figure 3 circuits in the power supply module will be introduced through the following embodiments.

[0074] Optionally, referring to Figure 4 As shown, the inverter circuit 11 includes: a first capacitor C1, a first switching transistor Q1, and a second switching transistor Q2; exemplarily, for example, both the first switching transistor Q1 and the second switching transistor Q2 are MOSFET transistors.

[0075] One end of the first capacitor C1 is used to connect to a DC power supply signal V CC , and the other end of the first capacitor C1 is respectively connected to the first end of the first switching transistor Q1, the first end of the second switching transistor Q2, and the ground terminal.

[0076] The second end of the first switching transistor Q1 and the second end of the second switching transistor Q2 are both connected to the primary side of the isolation circuit 12.

[0077] The third end of the first switching transistor Q1 and the third end of the second switching transistor Q2 are both used to connect to a first control signal, and under the action of the first control signal, drive the first switching transistor Q1 and the second switching transistor Q2 to conduct alternately.

[0078] Exemplarily, for example, the isolation circuit 12 includes: a low-parasitic coupling capacitor push-pull transformer, and the primary side of the low-parasitic coupling capacitor push-pull transformer includes two windings with the same number of turns, and the secondary side includes two sets of output windings.

[0079] In this embodiment, the first switching transistor Q1 and the second switching transistor Q2 are the main switching transistors in the power module. A first control signal can be input to the first switching transistor Q1 and the second switching transistor Q2 through an external control device. Under the action of the first control signal, drive the first switching transistor Q1 and the second switching transistor Q2 to conduct complementarily and alternately, so as to generate an alternating magnetic flux on the isolation circuit 12 (such as transformer T1), and transmit the generated AC signal to the rectifier circuit through the secondary side of the isolation circuit 12. Among them, the DC power supply signal V connected to the first capacitor C1 CC can also provide an instantaneous current signal.

[0080] Optionally, continue to refer to Figure 4 As shown, the rectifier circuit includes: a first rectifier bridge unit U5, a second rectifier bridge unit U6, a second capacitor C2, and a third capacitor C3. Among them, the second capacitor C2 and the third capacitor C3 are filter capacitors.

[0081] Among them, both the first rectifier bridge unit U5 and the second rectifier bridge unit U6 can be rectifiers including multiple diodes, and the rectification of the signal is achieved through the forward conduction and reverse cut-off of a series of diodes.

[0082] The input terminals of the first rectifier bridge unit U5 and the input terminals of the second rectifier bridge unit U6 are both connected to the secondary side of the isolation circuit (i.e., transformer T1);

[0083] The first output terminal of the first rectifier bridge unit U5 is respectively connected to one end of the second capacitor C2 and the first terminal of the voltage regulation module 2, and the second output terminal of the first rectifier bridge unit U5 is respectively connected to the other end of the second capacitor C2 and the zero potential reference point V of the power device under test EE connection;

[0084] The first output terminal of the second rectifier bridge unit U6 is respectively connected to one end of the third capacitor C3 and the zero potential reference point V EE connection, and the second output terminal of the second rectifier bridge unit U6 is respectively connected to the other end of the third capacitor C3 and the first terminal of the voltage regulation module 2.

[0085] In this embodiment, the first rectifier bridge unit U5, the second rectifier bridge unit U6, the second capacitor C2 and the third capacitor C3 can rectify and filter the AC voltage signal generated after inversion to generate a target DC high voltage signal (i.e., the target high voltage signal), and transmit the target high voltage signal to the voltage regulation module.

[0086] The structure of the voltage regulation module will be specifically processed through the following embodiments.

[0087] Optionally, as shown in Figure 5 the above-mentioned voltage regulation module 2 includes: a positive voltage regulation unit 21 and a negative voltage regulation unit 22. Among them, the target positive high voltage signal V output by the power supply module 1 can be regulated by the positive voltage regulation unit 21 p to generate a regulated gate positive voltage signal V DD and transmit the regulated gate positive voltage signal V DD to the gate of the power device under test to drive the conduction of the power device under test; and, the target negative high voltage signal V output by the power supply module 1 can also be regulated by the negative voltage regulation unit 22 N to generate a regulated gate negative voltage signal V SS and transmit the regulated gate negative voltage signal V SS to the gate of the power device under test to drive the turn-off of the power device under test, realizing fine adjustment of the gate voltage of the power device under test, thereby meeting the test requirements for power devices of different specifications.

[0088] The structure of the positive voltage regulation unit will be specifically processed through the following embodiments.

[0089] First, the positive voltage regulation unit

[0090] Optionally, as shown in Figure 6As shown, the positive voltage regulation unit 21 includes: a first processing unit, a first magnetic coupling isolator U1, a first digital-to-analog converter U7 (i.e., DAC1), a first analog-to-digital converter U8 (i.e., ADC1), a first amplifier U3, and a first power amplification transistor Q3.

[0091] Exemplarily, for example, the first processing unit can be a processor device such as an FPGA or a CPLD. The first magnetic coupling isolator U1 provides data isolation on and off, and is responsible for bidirectional communication transmission of primary and secondary side data. For example, the control data sent by the first processing unit is transmitted to the secondary side at high speed through the first magnetic coupling isolator U1, and the voltage output data collected from the secondary side can also be transmitted to the primary side at high speed.

[0092] The first processing unit is connected to the first magnetic coupling isolator U1. The input end of the first magnetic coupling isolator U1 is connected to the output end of the first analog-to-digital converter U8. The output end of the first magnetic coupling isolator U2 is connected to the first digital-to-analog converter U7. The output end of the first digital-to-analog converter U7 is connected to the non-inverting input end of the first amplifier U3. The output end of the first amplifier U3 is connected to the base of the first power amplification transistor Q3. The collector of the first power amplification transistor Q3 is connected to the first output end of the first rectifier bridge unit U5 and one end of the second capacitor C2. The emitter of the first power amplification transistor Q3 is respectively connected to the input end of the first analog-to-digital converter U8 and the first input end of the gate drive module;

[0093] The first analog-to-digital converter U8 is used to perform analog-to-digital conversion on the current gate positive voltage of the power device under test obtained through the gate drive module, generate the current gate positive voltage digital quantity, and transmit the current gate positive voltage digital quantity to the first processing unit through the first magnetic coupling isolator U1;

[0094] The first processing unit is used to display the current gate positive voltage digital quantity, receive the target gate positive voltage value input by the user, generate a target gate positive voltage signal according to the target gate positive voltage value, and transmit the target gate positive voltage signal to the first digital-to-analog converter U7 through the first magnetic coupling isolator U1;

[0095] The first digital-to-analog converter U7 is used to perform digital-to-analog conversion processing on the target gate positive voltage signal, generate a target gate positive voltage analog quantity, and transmit the target gate positive voltage analog quantity to the first amplifier U3.

[0096] The first amplifier U3 is used to amplify the target gate positive voltage analog quantity, generate a target gate positive voltage amplified quantity, and transmit the target gate positive voltage amplified quantity to the first power amplification transistor Q3; among them, the first amplifier U3 is a proportional amplification module. For example, the target gate positive voltage analog quantity input to the first amplifier U3 is , then after being amplified by the first amplifier U3, the generated target gate positive voltage amplified quantity is 。

[0097] The first power amplification transistor Q3 is used to amplify the amount of the positive voltage of the target gate, generate an adjusted positive gate voltage signal, and transmit the adjusted positive gate voltage signal to the gate of the power device under test via the gate drive module to control the conduction of the power device under test.

[0098] In this embodiment, the current positive gate voltage of the power device under test can be collected by the first analog-to-digital converter U8, and the current positive gate voltage is transmitted to the first processing unit via the first magnetic coupling isolator U1. Then, the first processing unit monitors and displays the current positive gate voltage of the power device under test online, so that the user can timely understand the actual output positive voltage (i.e., the current positive gate voltage) of the power device under test during the automated test process. When it is found that the actual output positive voltage does not match the expected voltage, the value of the target positive gate voltage is input through the first processing unit, and the value of the target positive gate voltage is input to the first digital-to-analog converter U7, the first amplifier U3, and the first power amplification transistor Q3 via the first magnetic coupling isolator U1, generating an adjusted positive gate voltage signal V DD ,wherein, the adjusted positive gate voltage signal V DD is between 0 and the target positive high voltage signal V P , that is, through the devices in the positive voltage adjustment unit 21, the continuous adjustment of the gate voltage of the power device under test is realized.

[0099] The structure of the negative voltage adjustment unit will be specifically processed through the following embodiments.

[0100] Second, the negative voltage adjustment unit

[0101] Optionally, continuing to refer to Figure 6 as shown, the negative voltage adjustment unit includes: a second processing unit, a second magnetic coupling isolator U2, a second digital-to-analog converter U10 (i.e., DAC2), a second analog-to-digital converter U9 (i.e., ADC2), a second amplifier U4, and a second power amplification transistor Q4.

[0102] Exemplarily, for example, the second processing unit can also be a processor device such as an FPGA or a CPLD. The second magnetic coupling isolator U2 provides data isolation on and off and is responsible for the bidirectional communication transmission of the data on the primary and secondary sides. For example, the control data sent by the second processing unit is transmitted to the secondary side at high speed through the second magnetic coupling isolator U2, and the voltage output data collected on the secondary side can also be transmitted to the primary side at high speed.

[0103] The second processing unit is connected to the second magnetic coupling isolator U2. The input end of the second magnetic coupling isolator U2 is connected to the output end of the second analog-to-digital converter U9. The output end of the second magnetic coupling isolator U2 is connected to the second digital-to-analog converter U10. The output end of the second digital-to-analog converter U10 is connected to the non-inverting input end of the second amplifier U4. The output end of the second amplifier U4 is connected to the base of the second power amplifier transistor Q4. The collector of the second power amplifier transistor Q4 is connected to the second output end of the second rectifier bridge unit U6 and the other end of the third capacitor C3. The emitter of the second power amplifier transistor Q4 is respectively connected to the input end of the second analog-to-digital converter U9 and the second input end of the gate drive module;

[0104] The second analog-to-digital converter U9 is used to perform analog-to-digital conversion on the current gate negative voltage of the power device under test obtained via the gate drive module, generate the current gate negative voltage digital quantity, and transmit the current gate negative voltage digital quantity to the second processing unit via the second magnetic coupling isolator U2;

[0105] The second processing unit is used to display the current gate negative voltage digital quantity, receive the target gate negative voltage value input by the user, generate a target gate negative voltage signal according to the target gate negative voltage value, and transmit the target gate negative voltage signal to the second digital-to-analog converter U10 via the second magnetic coupling isolator U2;

[0106] The second digital-to-analog converter U10 is used to perform digital-to-analog conversion processing on the target gate negative voltage signal, generate the target gate negative voltage analog quantity, and transmit the target gate negative voltage analog quantity to the second amplifier U4;

[0107] The second amplifier U4 is used to amplify the target gate negative voltage analog quantity, generate the amplified target gate negative voltage quantity, and transmit the amplified target gate negative voltage quantity to the second power amplifier transistor Q4; wherein, the second amplifier U4 is a proportional amplification module. For example, the target gate negative voltage analog quantity input to the second amplifier U4 is After being amplified by the second amplifier U4, the generated amplified target gate negative voltage quantity is .

[0108] The second power amplifier transistor Q4 is used to power-amplify the amplified target gate negative voltage quantity, generate the adjusted gate negative voltage signal V SS , and transmit the adjusted gate negative voltage signal V SS to the gate of the power device under test to control the turn-off of the power device under test.

[0109] In this embodiment, the current gate negative voltage of the power device under test can be collected by the second analog-to-digital converter U9, and the current gate negative voltage is transmitted to the second processing unit via the second magnetic coupling isolator U2. Then, the second processing unit monitors and displays the current gate negative voltage of the power device under test online, so that the user can timely understand the actual output negative voltage (i.e., the current gate negative voltage) of the power device under test during the automated test process. When it is found that the actual output negative voltage does not match the expected voltage, the target gate negative voltage value is input through the second processing unit, and the target gate negative voltage value is input to the second digital-to-analog converter U10, the second amplifier U4, and the second power amplifier transistor Q4 via the second magnetic coupling isolator U2, generating an adjusted gate negative voltage signal V SS , where the adjusted gate negative voltage signal V SS is between 0 and the target negative high voltage signal -V N , that is, through the devices in the negative voltage adjustment unit 22, the continuous adjustment of the gate voltage of the power device under test is realized.

[0110] Optionally, continuing to refer to Figure 6 as shown, the positive voltage adjustment unit further includes: a positive voltage adjustment resistor RP4, a fourth capacitor C4;

[0111] One end of the positive voltage adjustment resistor RP4 is connected to the output end of the first amplifier U3, and the other end of the positive voltage adjustment resistor RP4 is connected to the base of the first power amplifier transistor Q3;

[0112] One end of the fourth capacitor C4 is respectively connected to the emitter of the first power amplifier transistor Q3, the input end of the first analog-to-digital converter U8, and the first input end of the gate drive module. The other end of the fourth capacitor C4 is respectively connected to the zero potential reference point V EE of the power device under test.

[0113] Optionally, continuing to refer to Figure 6 as shown, the negative voltage adjustment unit further includes: a negative voltage adjustment resistor RN4, a fifth capacitor C5;

[0114] One end of the negative voltage adjustment resistor RN4 is connected to the output end of the second amplifier U4, and the other end of the negative voltage adjustment resistor RN4 is connected to the base of the second power amplifier transistor Q4;

[0115] One end of the fifth capacitor C5 is respectively connected to the emitter of the second power amplifier transistor Q4, the input end of the second analog-to-digital converter U9, and the first input end of the gate drive module. The other end of the fifth capacitor C5 is respectively connected to the zero potential reference point V EE of the power device under test.

[0116] The structure of the gate drive module will be specifically processed through the following embodiments.

[0117] Optionally, refer to Figure 7 As shown, the gate drive module 3 includes: a first triode Q5, a second triode Q6, a turn-on resistor R Gon , and a turn-off resistor R Goff ;

[0118] The first end of the first triode Q5 is respectively connected to the input end of the first analog-to-digital converter U8, the emitter of the first power amplifier Q3, and one end of the fourth capacitor C4. The second end of the first triode Q5 is connected to one end of the turn-on resistor R Gon ; The other end of the turn-on resistor R Gon is respectively connected to the gate of the power device under test and the other end of the turn-off resistor R Goff ;

[0119] The first end of the second triode Q6 is respectively connected to the input end of the second analog-to-digital converter U9, the emitter of the second power amplifier Q4, and one end of the fifth capacitor C5. The second end of the second triode Q6 is connected to one end of the turn-off resistor R Goff ;

[0120] The third ends of the first triode Q5 and the second triode Q6 are both used to access the second control signal, and under the action of the second control signal, drive the on and off of the first triode Q5 and the second triode Q6.

[0121] In this embodiment, the first triode Q5, the second triode Q6, the turn-on resistor R Gon and the turn-off resistor R Gof constitute a gate push-pull circuit for driving the power device under test. The adjusted gate positive voltage signal V DD (also called the gate turn-on voltage) can be set by the positive voltage adjustment unit, and the adjusted gate negative voltage signal V SS (also called the gate turn-off voltage) can be set by the negative voltage adjustment unit.

[0122] Optionally, the positive and negative voltage adjustment circuits of this solution have symmetry, and the working principle is described in detail with the positive voltage adjustment unit.

[0123] Specifically, refer to Figure 7 As shown, during the actual test process, the first processing unit receives the target gate voltage value input by the user, converts the target gate voltage value into a target gate voltage signal, and transmits the target gate voltage signal to the first digital-to-analog converter U7 via the first magnetic coupling isolator U1. The digital-to-analog conversion value output by the first digital-to-analog converter U7 serves as the in-phase input of the first amplifier U3. After being amplified in-phase by the first amplifier U3, the adjusted gate positive voltage signal V DDis the turn-on voltage for driving the power device under test; and, the base of the first power amplifier transistor Q3 is connected to the output of the first amplifier U3 through the positive voltage regulating resistor RP4, and the collector of the first power amplifier transistor Q3 is connected to the target positive high voltage signal V output by the power supply module P , the emitter of the first power amplifier transistor Q3 is connected to the regulated gate positive voltage signal V DD to provide a positive drive voltage for the power device under test, where the regulated gate positive voltage signal V DD can be continuously adjusted from 0 to V through the first digital-to-analog converter U7 P , the first triode Q5 provides an output current amplification function for the regulated gate positive voltage signal V DD , and the actual output voltage amplitude (i.e., the current gate positive voltage signal) of the power device under test is collected through the first analog-to-digital converter U8, and is transmitted to the first processor via the first magnetic coupling isolator U1, and the current gate positive voltage signal is monitored and displayed online by the first processor.

[0124] Optionally, as shown in Figure 8 , the present application further provides an automated test device, which includes: the drive power supply device 100 provided in the above embodiment. For example, the drive power supply device 100 can be integrated into the automated test device 200. Therefore, during the automated test of the power device under test by the automated test device, the received target gate voltage value can be adjusted by the voltage adjustment module in the drive power supply device 100 to generate a regulated gate voltage signal, and the regulated gate voltage signal is transmitted to the power device under test via the gate drive module to control the on / off of the power device under test, where the regulated gate voltage signal is between the target high voltage signal and zero voltage, realizing the online adjustment of the gate voltage of the power device under test, meeting the needs of different semiconductor manufacturers for automated testing of power devices of different specifications, and solving the problem that the provided drive power supply circuit in the prior art cannot adjust the gate drive voltage online through software.

[0125] In several embodiments provided by the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of the units is only a logical function division, and there can be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point, the displayed or discussed mutual coupling or direct coupling or communication connection can be through some interfaces, and the indirect coupling or communication connection of the devices or units can be in electrical, mechanical or other forms.

[0126] The unit described as a separation component may or may not be physically separated. The component shown as a unit may or may not be a physical unit, that is, it may be located in one place or may be distributed over multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0127] In addition, each functional unit in various embodiments of the present application may be integrated in a processing unit, may exist separately as individual physical units, or two or more units may be integrated in one unit. The above integrated units can be implemented in the form of hardware or in the form of a combination of hardware and software functional units.

[0128] The above integrated unit implemented in the form of a software functional unit can be stored in a computer-readable storage medium. The above software functional unit stored in a storage medium includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) or a processor (English: processor) to execute some steps of the methods described in various embodiments of the present application. The foregoing storage medium includes: various media such as USB flash drives, mobile hard disks, read-only memories (English: Read-Only Memory, abbreviated as: ROM), random access memories (English: Random Access Memory, abbreviated as: RAM), magnetic disks, or optical discs that can store program codes.

Claims

1. A driving power supply device, characterized in that: The driving power supply device comprises: a power supply module, a voltage regulating module and a gate driving module; The input end of the power module is used to receive a DC power signal, and the output end of the power module is connected to the voltage regulation module; The power supply module is used to convert the DC power supply signal into a target high voltage signal and transmit the target high voltage signal to the first end of the voltage regulation module; The second end of the voltage regulating module is connected to the input end of the gate driving module, and the voltage regulating module is used to obtain and display the current gate voltage signal of the power device under test via the gate driving module, and receive the target gate voltage value input by the user, generate an adjusted gate voltage signal according to the target gate voltage value, and transmit the adjusted gate voltage signal to the gate of the power device under test via the gate driving module to control the on and off of the power device under test, and make the adjusted gate voltage between the voltage of the target high voltage signal and zero voltage; Wherein, the voltage regulating module includes: a positive voltage regulating unit and a negative voltage regulating unit; Wherein, the positive voltage regulating unit comprises: a first processing unit, a first magnetic coupling isolator, a first digital-to-analog converter, a first analog-to-digital converter, a first amplifier and a first power amplifier tube; The first processing unit is connected to the first magnetic coupling isolator, the input end of the first magnetic coupling isolator is connected to the output end of the first analog-to-digital converter, the output end of the first magnetic coupling isolator is connected to the first digital-to-analog converter, the output end of the first digital-to-analog converter is connected to the in-phase input end of the first amplifier, the output end of the first amplifier is connected to the base of the first power amplifier tube, the collector of the first power amplifier tube is connected to the first output end of the first rectifier bridge unit in the power module and one end of the second capacitor, and the emitter of the first power amplifier tube is respectively connected to the input end of the first analog-to-digital converter and the first input end of the gate driving module; The first analog-to-digital converter is used to perform analog-to-digital conversion on the current gate positive voltage of the power device under test obtained via the gate driving module to generate a digital value of the current gate positive voltage, and transmit the digital value of the current gate positive voltage to the first processing unit via the first magnetic coupling isolator; The first processing unit is used to display the current gate positive voltage digital value, receive a target gate positive voltage value input by a user, generate a target gate positive voltage signal according to the target gate positive voltage value, and transmit the target gate positive voltage signal to the first digital-to-analog converter via the first magnetic coupling isolator; The first digital-to-analog converter is used to perform digital-to-analog conversion processing on the target gate positive voltage signal to generate a target gate positive voltage analog quantity, and transmit the target gate positive voltage analog quantity to the first amplifier; The first amplifier is used to amplify the analog value of the target gate positive voltage to generate an amplified value of the target gate positive voltage, and transmit the amplified value of the target gate positive voltage to the first power amplifier tube; The first power amplifier tube is used to power amplify the target gate positive voltage amplification amount to generate an adjusted gate positive voltage signal, and transmit the adjusted gate positive voltage signal to the gate of the power device under test via the gate driving module to control the conduction of the power device under test; Wherein, the negative voltage regulating unit comprises: a second processing unit, a second magnetic coupling isolator, a second digital-to-analog converter, a second analog-to-digital converter, a second amplifier and a second power amplifier tube; The second processing unit is connected to the second magnetic coupling isolator, the input end of the second magnetic coupling isolator is connected to the output end of the second analog-to-digital converter, the output end of the second magnetic coupling isolator is connected to the second digital-to-analog converter, the output end of the second digital-to-analog converter is connected to the in-phase input end of the second amplifier, the output end of the second amplifier is connected to the base of the second power amplifier tube, the collector of the second power amplifier tube is connected to the second output end of the second rectifier bridge unit in the power module and the other end of the third capacitor, and the emitter of the second power amplifier tube is respectively connected to the input end of the second analog-to-digital converter and the second input end of the gate driving module; The second analog-to-digital converter is used to perform analog-to-digital conversion on the current negative gate voltage of the power device under test obtained via the gate driving module, generate a digital value of the current negative gate voltage, and transmit the digital value of the current negative gate voltage to the second processing unit via the second magnetic coupling isolator; The second processing unit is used to display the current gate negative voltage digital value, receive a target gate negative voltage value input by a user, generate a target gate negative voltage signal according to the target gate negative voltage value, and transmit the target gate negative voltage signal to the second digital-to-analog converter via the second magnetic coupling isolator; The second digital-to-analog converter is used to perform digital-to-analog conversion processing on the target gate negative voltage signal to generate a target gate negative voltage analog quantity, and transmit the target gate negative voltage analog quantity to the second amplifier; The second amplifier is used to amplify the target gate negative voltage analog value to generate an amplified target gate negative voltage value, and transmit the amplified target gate negative voltage value to the second power amplifier tube; The second power amplifier tube is used to power amplify the target gate negative voltage to generate an adjusted gate negative voltage signal, and transmit the adjusted gate negative voltage signal to the gate of the power device under test via the gate drive module to control the shutdown of the power device under test.

2. The device according to claim 1, characterized in that The power module comprises: an inverter circuit, an isolation circuit and a rectifier circuit; the inverter circuit and the rectifier circuit are electromagnetically connected via the isolation circuit; The inverter circuit is used to receive the DC power signal, invert the DC power signal into an AC voltage signal, and transmit the AC voltage signal to the rectifier circuit via the isolation circuit; The rectifier circuit is used to rectify the AC voltage signal to generate the target high voltage signal, and transmit the target high voltage signal to the first end of the voltage regulation module.

3. The device according to claim 2, characterized in that The inverter circuit includes: a first capacitor, a first switch tube and a second switch tube; One end of the first capacitor is used to access the DC power signal, and the other end of the first capacitor is connected to the first end of the first switch tube, the first end of the second switch tube, and the ground end respectively; The second end of the first switch tube and the second end of the second switch tube are both connected to the primary side of the isolation circuit; The third end of the first switch tube and the third end of the second switch tube are both used to receive a first control signal, and under the action of the first control signal, the first switch tube and the second switch tube are driven to be alternately turned on.

4. The device according to claim 2, characterized in that The rectifier circuit comprises: a first rectifier bridge unit, a second rectifier bridge unit, a second capacitor and a third capacitor; The input end of the first rectifier bridge unit and the input end of the second rectifier bridge unit are both connected to the secondary side of the isolation circuit; The first output end of the first rectifier bridge unit is respectively connected to one end of the second capacitor and the first end of the voltage regulating module, and the second output end of the first rectifier bridge unit is respectively connected to the other end of the second capacitor and the zero potential reference point of the power device under test; The first output end of the second rectifier bridge unit is respectively connected to one end of the third capacitor and the zero potential reference point, and the second output end of the second rectifier bridge unit is respectively connected to the other end of the third capacitor and the first end of the voltage regulation module.

5. The device according to claim 1, characterized in that The positive voltage regulating unit further includes: a positive voltage regulating resistor and a fourth capacitor; One end of the positive voltage regulating resistor is connected to the output end of the first amplifier, and the other end of the positive voltage regulating resistor is connected to the base of the first power amplifier tube; One end of the fourth capacitor is respectively connected to the emitter of the first power amplifier tube, the input end of the first analog-to-digital converter, and the first input end of the gate drive module, and the other end of the fourth capacitor is respectively connected to the zero potential reference point of the power device under test.

6. The device according to claim 5, characterized in that The gate driving module includes: a first transistor, a second transistor, an on resistor and an off resistor; The first end of the first triode is respectively connected to the input end of the first analog-to-digital converter, the emitter of the first power amplifier tube, and one end of the fourth capacitor, and the second end of the first triode is connected to one end of the turn-on resistor; the other end of the turn-on resistor is respectively connected to the gate of the power device under test and the other end of the turn-off resistor; The first end of the second triode is respectively connected to the input end of the second analog-to-digital converter, the emitter of the second power amplifier tube, and one end of the fifth capacitor in the positive voltage regulating unit, and the second end of the second triode is connected to one end of the turn-off resistor; The third end of the first triode and the third end of the second triode are both used to receive a second control signal, and under the action of the second control signal, the first triode and the second triode are driven to be turned on and off.

7. An automated testing device, characterized in that: The device comprises: a driving power supply device as described in any one of claims 1 to 6 above.

Citation Information

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