Test method and device, storage medium and program product

Abstract

The invention relates to a testing method and device, a storage medium and a program product, and relates to the technical field of automobile testing. The technical problems of relatively low test efficiency and relatively low accuracy in related technologies are at least solved. The method comprises the following steps: obtaining a to-be-tested object of a domain controller, wherein the to-be-tested object comprises at least one of a first-stage power supply system, a second-stage power supply system under the first-stage power supply system, a third-stage power supply system under the second-stage power supply system, a power supply management integrated circuit under the first-stage power supply system and a system base controller under the first-stage power supply system; determining a test scheme of the to-be-tested object based on the to-be-tested object; based on the test scheme of the to-be-tested object, the to-be-tested object is tested, a target test result of the to-be-tested object is obtained, and the target test result is used for indicating whether power-on and power-off of the to-be-tested object are normal or not.

Description

Technical Field

[0001] The present application relates to the field of automobile technology, in particular to the field of automobile testing technology, and specifically to a testing method, device, storage medium and program product. Background Art

[0002] A car includes a large number of domain controllers, and the stable operation of the domain controllers has an important impact on the realization of various functions of the vehicle. Therefore, it is necessary to test the domain controllers of the vehicle.

[0003] Currently, power-on and power-off tests of domain controllers can be completed through manual testing.

[0004] However, the related art based on manual power-on and power-off testing of domain controllers has the problems of low testing efficiency and low accuracy. There is a lack of a reliable solution for power-on and power-off testing of domain controllers. Summary of the invention

[0005] According to the first aspect provided by the present application, the present application provides a test method, device, storage medium and program product to at least solve the technical problems of low test efficiency and low accuracy in the related technology. The technical solution of the present application is as follows: obtain the object to be tested of the domain controller, and the object to be tested includes at least one of the following: a primary power supply system, a secondary power supply system under the primary power supply system, a tertiary power supply system under the secondary power supply system, a power management integrated circuit (power management integrated circuit, PMIC) under the primary power supply system, and a system base controller (system base controller, SBC) under the primary power supply system; based on the object to be tested, determine the test scheme of the object to be tested; based on the test scheme of the object to be tested, test the object to be tested to obtain the target test result of the object to be tested, and the target test result is used to indicate whether the power on and off of the object to be tested is normal.

[0006] In a possible implementation, the first-level power supply system includes a first-level power supply, a system-level chip, and an application corresponding to the system-level chip; the object to be tested is at least one of the following: the first-level power supply, the system-level chip, and the application; the test scheme based on the object to be tested tests the object to be tested, including: obtaining a target time interval corresponding to the object to be tested; the target time interval includes at least one of the following: a first time interval, a second time interval, and a third time interval; the first time interval is the time it takes to start the first-level power supply; the second time interval is used to indicate the time it takes to start the system-level chip after the first-level power supply is started; the third time interval is used to indicate the time it takes to start the application after the system-level chip is started; the object to be tested corresponds to the target time interval; based on the target time interval, the object to be tested is powered on and off to obtain the target test result.

[0007] In a possible implementation, the object to be tested is one of the primary power supply, the system-level chip and the application, the target time interval is a time interval corresponding to the object to be tested among the first time interval, the second time interval and the third time interval, the object to be tested corresponds to the target time interval, and based on the target time interval, power on and off tests are performed on the object to be tested to obtain a target test result of the domain controller, including: sending a first power-on instruction to the domain controller, the first power-on instruction is used to trigger the power-on of the object to be tested; after sending the first power-on instruction for a period of time corresponding to the target time interval, obtaining a first power-on response result of the object to be tested; comparing the expected response result corresponding to the object to be tested with the first power-on response result to obtain a first test result, and the first test result is used to indicate whether the power-on of the object to be tested is normal.

[0008] In a possible implementation, the object to be tested includes the primary power supply, the system-level chip, and multiple ones of the application, and the target time interval includes: multiple time intervals corresponding to the object to be tested in the first time interval, the second time interval, and the third time interval. Based on the target time interval, the object to be tested is powered on and off to obtain the target test result of the domain controller, including: sending a second power-on instruction to the domain controller, the second power-on instruction is used to trigger the power-on of each object in the object to be tested; based on the target time interval, obtaining a second power-on response result, the second power-on response includes the power-on response result of each object in the object to be tested; comparing the expected response result corresponding to the object to be tested with the second power-on response result to obtain a second test result, and the second test result is used to indicate whether the power-on of the object to be tested is normal.

[0009] In a possible implementation, the object to be tested includes a first object and a second object, the first object and the second object are the first-level power supply, the system-level chip, and two adjacent ones in the application, the second object is the next-level object of the first object, the target time interval includes the time interval corresponding to the first object and the time interval corresponding to the second object, and based on the target time interval, the object to be tested is powered on and off to obtain the target test result of the domain controller, including: sending a third power-on instruction to the domain controller, the third power-on instruction is used to trigger the first object and the second object to power on; based on the target time interval, obtaining a third power-on response result of the object to be tested, the third power-on response result is the power-on response result corresponding to the second object; comparing the expected response result corresponding to the object to be tested with the third power-on response result to obtain a third test result, and the third test result is used to indicate whether the power-on of the first object and the second object is normal.

[0010] In a possible implementation, the object to be tested is at least one of the following: the secondary power supply system, the tertiary power supply system; the test scheme based on the object to be tested is used to test the object to be tested, including: sending a fourth power-on instruction to the domain controller, the fourth power-on instruction is used to trigger the power-on of the secondary power supply system and / or the tertiary power supply system; obtaining a fourth power-on response result of the object to be tested, the fourth power-on response result includes the power-on response result of the secondary power supply system and / or the tertiary power supply system; comparing the expected response result corresponding to the object to be tested with the fourth power-on response result to obtain a fourth test result, the fourth test result is used to indicate whether the power-on of the secondary power supply system and / or the tertiary power supply system is normal.

[0011] In a possible implementation, the object to be tested is at least one of the following: a power management integrated circuit under the primary power system, and a system base controller under the primary power system, wherein the power management integrated circuit under the primary power system and the system base controller under the primary power system both include multiple channels, and the test scheme based on the object to be tested tests the object to be tested, including: sending a fifth power-on instruction to the object to be tested, wherein the fifth power-on instruction is used to trigger the power management integrated circuit under the primary power system and / or the system base controller under the primary power system to power on; obtaining a fifth power-on response result corresponding to the object to be tested, wherein the fifth power-on response result includes a power-on response result of each channel of the object to be tested; and comparing the expected response result corresponding to the object to be tested with the fifth power-on response result to obtain a fifth test result, wherein the fifth test result is used to indicate whether the power-on of the power management integrated circuit and / or the system base controller is normal.

[0012] In a possible implementation, the test scheme based on the object to be tested tests the object to be tested, including: obtaining a target number of tests for the object to be tested, the target number of tests being determined based on the designed usage time of the domain controller; testing the object to be tested based on the target number of tests to obtain multiple test results, the test results being used to indicate whether the power on and off of the object to be tested is normal; determining that the target test result is a sixth test result, indicating that the power on and off of the object to be tested is normal, based on the number of test results indicating that the power on and off of the object to be tested is normal being greater than or equal to a quantity threshold among the multiple test results; determining that the target test result is a seventh test result, indicating that the power on and off of the object to be tested is abnormal, based on the number of test results indicating that the power on and off of the object to be tested is normal being less than a quantity threshold among the multiple test results.

[0013] According to a second aspect provided by the present application, a testing device is provided, including: an acquisition module, a determination module and a testing module; the acquisition module is used to acquire an object to be tested of a domain controller, and the object to be tested includes at least one of the following: a primary power supply system, a secondary power supply system under the primary power supply system, a tertiary power supply system under the secondary power supply system, a power management integrated circuit under the primary power supply system, and a system base controller under the primary power supply system; the determination module is used to determine a test scheme for the object to be tested based on the object to be tested; the testing module is used to test the object to be tested based on the test scheme of the object to be tested, and obtain a target test result of the object to be tested, and the target test result is used to indicate whether the power on and off of the object to be tested are normal.

[0014] In a possible implementation, the first-level power supply system includes a first-level power supply, a system-level chip, and an application corresponding to the system-level chip; the object to be tested is at least one of the following: the first-level power supply, the system-level chip, and the application; the acquisition module is specifically used to obtain the target time interval corresponding to the object to be tested; the target time interval includes at least one of the following: a first time interval, a second time interval, and a third time interval; the first time interval is the time it takes to start the first-level power supply; the second time interval is used to indicate the time it takes to start the system-level chip after the first-level power supply is started; the third time interval is used to indicate the time it takes to start the application after the system-level chip is started; the object to be tested corresponds to the target time interval; the test module is specifically used to perform power on and off tests on the object to be tested based on the target time interval to obtain the target test result.

[0015] In a possible implementation, the object to be tested is one of the primary power supply, the system-level chip and the application, and the target time interval is a time interval among the first time interval, the second time interval and the third time interval corresponding to the object to be tested; the testing device also includes a sending module; the sending module is used to send a first power-on instruction to the domain controller, and the first power-on instruction is used to trigger the power-on of the object to be tested; the acquisition module is also used to obtain a first power-on response result of the object to be tested after a duration corresponding to the target time interval of sending the first power-on instruction; the testing module is specifically used to compare the expected response result corresponding to the object to be tested with the first power-on response result to obtain a first test result, and the first test result is used to indicate whether the power-on of the object to be tested is normal.

[0016] In a possible implementation, the object to be tested includes the primary power supply, the system-level chip, and multiple ones of the application, and the target time interval includes: multiple time intervals corresponding to the object to be tested among the first time interval, the second time interval, and the third time interval; the testing device also includes a sending module; the sending module is used to send a second power-on instruction to the domain controller, and the second power-on instruction is used to trigger the power-on of each object in the object to be tested; the acquisition module is also used to acquire a second power-on response result based on the target time interval, and the second power-on response includes the power-on response result of each object in the object to be tested; the testing module is specifically used to compare the expected response result corresponding to the object to be tested with the second power-on response result to obtain a second test result, and the second test result is used to indicate whether the power-on of the object to be tested is normal.

[0017] In a possible implementation, the object to be tested includes a first object and a second object, the first object and the second object are the first-level power supply, the system-level chip and two adjacent ones in the application, the second object is the next-level object of the first object, and the target time interval includes the time interval corresponding to the first object and the time interval corresponding to the second object; the testing device also includes a sending module; the sending module is used to send a third power-on instruction to the domain controller, and the third power-on instruction is used to trigger the power-on of the first object and the second object; the acquisition module is also used to acquire a third power-on response result of the object to be tested based on the target time interval, and the third power-on response result includes the power-on response result corresponding to the first object and the power-on response result corresponding to the second object; the testing module is specifically used to compare the expected response result corresponding to the object to be tested with the third power-on response result to obtain a third test result, and the third test result is used to indicate whether the power-on of the first object and the second object is normal.

[0018] In a possible implementation, the object to be tested is at least one of the following: the secondary power supply system, the tertiary power supply system; the testing device also includes a sending module; the sending module is used to send a fourth power-on instruction to the domain controller, and the fourth power-on instruction is used to trigger the power-on of the secondary power supply system and / or the tertiary power supply system; the acquisition module is also used to obtain a fourth power-on response result of the object to be tested, and the fourth power-on response result includes the power-on response result of the secondary power supply system and / or the tertiary power supply system; the testing module is specifically used to compare the expected response result corresponding to the object to be tested with the fourth power-on response result to obtain a fourth test result, and the fourth test result is used to indicate whether the power-on of the secondary power supply system and / or the tertiary power supply system is normal.

[0019] In a possible implementation, the object to be tested is at least one of the following: a power management integrated circuit under the primary power system, a system base controller under the primary power system, and the power management integrated circuit under the primary power system and the system base controller under the primary power system both include multiple channels; the testing device also includes a sending module; the sending module is used to send a fifth power-on instruction to the object to be tested, and the fifth power-on instruction is used to trigger the power management integrated circuit under the primary power system and / or the system base controller under the primary power system to power on; the acquisition module is also used to obtain a fifth power-on response result corresponding to the object to be tested, and the fifth power-on response result includes the power-on response result of each channel of the object to be tested; the testing module is specifically used to compare the expected response result corresponding to the object to be tested with the fifth power-on response result to obtain a fifth test result, and the fifth test result is used to indicate whether the power-on of the power management integrated circuit and / or the system base controller is normal.

[0020] In a possible implementation, the acquisition module is further used to acquire a target number of tests for the object to be tested, and the target number of tests is determined based on the designed usage time of the domain controller; the testing module is specifically used to test the object to be tested based on the target number of tests to obtain multiple test results, and the test results are used to indicate whether the power on and off of the object to be tested is normal; the determination module is further used to determine that the target test result is a sixth test result based on the number of test results indicating that the power on and off of the object to be tested is normal among the multiple test results being greater than or equal to a quantity threshold, and the sixth test result is used to indicate that the power on and off of the object to be tested is normal; the determination module is further used to determine that the target test result is a seventh test result based on the number of test results indicating that the power on and off of the object to be tested is normal among the multiple test results being less than a quantity threshold, and the seventh test result is used to indicate that the power on and off of the object to be tested is abnormal.

[0021] According to a third aspect provided by the present application, a testing device is provided, comprising: a processor; a memory for storing processor executable instructions; wherein the processor is configured to execute instructions to implement the method of the above-mentioned first aspect and any possible implementation manner thereof.

[0022] According to the fourth aspect provided by the present application, a computer-readable storage medium is provided. When the instructions in the computer-readable storage medium are executed by the processor of the testing device, the testing device is enabled to execute the method in the above-mentioned first aspect and any possible implementation manner thereof.

[0023] According to a fifth aspect provided by the present application, a computer program product is provided, the computer program product comprising computer instructions, and when the computer instructions are executed on a test device, the test device executes the method of the first aspect and any possible implementation manner thereof.

[0024] Therefore, the above technical features of the present application have the following beneficial effects:

[0025] (1) By adopting different test schemes for different objects to be tested, the power-on and power-off test results of the domain controller can be accurately and reliably determined.

[0026] (2) The target time interval can indicate the time taken for each object in the test object to start up. Therefore, based on the target time interval, the power-on and power-off tests are performed on the test object to obtain the target test results accurately and reliably.

[0027] (3) Sending a first power-on instruction to the domain controller; obtaining a first power-on response result of the object to be tested after a time corresponding to the target time interval of sending the first power-on instruction; comparing the expected response result corresponding to the object to be tested with the first power-on response result to obtain a first test result. In this way, the power-on test result of the object to be tested can be accurately and reliably obtained when the object to be tested is one of a primary power supply, a system-level chip, and an application, and the power-on test of the object to be tested is completed.

[0028] (4) Send a second power-on instruction to the domain controller; obtain a second power-on response result based on the target time interval; compare the expected response result corresponding to the object to be tested with the second power-on response result to obtain a second test result. Since the second power-on instruction is used to trigger the power-on of each object in the object to be tested, and the second test result is used to indicate whether the power-on of the object to be tested is normal, it is possible to accurately and reliably obtain the power-on test result of the object to be tested when the object to be tested includes a primary power supply, a system-level chip, and multiple of the applications, and complete the power-on test of the object to be tested.

[0029] (5) Send a third power-on instruction to the domain controller; based on the target time interval, obtain a third power-on response result of the object to be tested; compare the expected response result corresponding to the object to be tested with the third power-on response result to obtain a third test result. Since the third power-on instruction is used to trigger the power-on of the first object and the second object, the third power-on response result is the power-on response result corresponding to the second object; therefore, it is possible to accurately and reliably determine the power-on result of the object to be tested when the object to be tested includes the first object and the second object, the first object and the second object are two adjacent objects in a primary power supply, a system-level chip, and an application, and the second object is a lower-level object of the first object, thereby completing the power-on test of the object to be tested.

[0030] (6) Through the fourth power-on instruction and the fourth power-on response result, it can be accurately and reliably determined whether the power-on of the secondary power supply system and / or the tertiary power supply system is normal.

[0031] (7) Through the fifth power-on instruction and the fifth power-on response result, the test result of the object to be tested can be accurately and reliably determined when the object to be tested is a power management integrated circuit and / or a system base controller.

[0032] (8) The number of test results indicating that the power on and off of the object to be tested is normal among the multiple test results is greater than or equal to the number threshold, indicating that the reliability of the power on and off of the object to be tested is strong and can meet the user's use requirements. At this time, the target test result is determined to be the sixth test result. The number of test results indicating that the power on and off of the object to be tested is normal among the multiple test results is less than the number threshold, indicating that the reliability of the power on and off of the object to be tested is poor and cannot meet the user's use requirements. At this time, the target test result is determined to be the seventh test result. In this way, the number of tests can more accurately and reliably determine whether the domain controller can meet the power on and off requirements corresponding to its designed service life.

[0033] It should be noted that the technical effects brought about by any implementation method in the second to fifth aspects can refer to the technical effects brought about by the corresponding implementation method in the first aspect, and will not be repeated here.

[0034] It should be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] The drawings herein are incorporated into the specification and constitute a part of the specification, illustrate embodiments consistent with the present application, and together with the specification are used to explain the principles of the present application, and do not constitute an improper limitation on the present application.

[0036] Figure 1 is a schematic diagram of the architecture of a test system according to an exemplary embodiment;

[0037] Figure 2 is a schematic diagram showing the structure of a domain controller according to an exemplary embodiment;

[0038] Figure 3 is a schematic diagram of the structure of another domain controller according to an exemplary embodiment;

[0039] Figure 4 is a schematic diagram of the structure of another domain controller according to an exemplary embodiment;

[0040] Figure 5 is a flow chart of a testing method according to an exemplary embodiment;

[0041] Figure 6 is a flow chart of another testing method according to an exemplary embodiment;

[0042] Figure 7 is a flow chart of another testing method according to an exemplary embodiment;

[0043] Figure 8 is a flow chart of another testing method according to an exemplary embodiment;

[0044] Fig. 9 is a flow chart of another testing method according to an exemplary embodiment;

[0045] Fig.10 is a flow chart of another testing method according to an exemplary embodiment;

[0046] Fig.11 is a flow chart of another testing method according to an exemplary embodiment;

[0047] Fig.12 is a flow chart of another testing method according to an exemplary embodiment;

[0048] Fig.13 is a structural schematic diagram of a testing device according to an exemplary embodiment;

[0049] Fig.14 It is a schematic structural diagram of a testing device according to an exemplary embodiment. DETAILED DESCRIPTION

[0050] In order to enable ordinary persons in the art to better understand the technical solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the accompanying drawings.

[0051] It should be noted that the terms "first", "second", etc. in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchangeable where appropriate, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present application. On the contrary, they are merely examples of devices and methods consistent with some aspects of the present application as detailed in the attached claims.

[0052] A large number of domain controllers are included in the car. The stable operation of the domain controller has an important impact on the realization of various functions of the vehicle. Therefore, it is necessary to test the domain controller of the vehicle. Among them, the power-on and power-off test is to verify whether the device to be tested can work normally when encountering various power-off scenarios or power-on failures during actual use. Therefore, the test system should be able to cover the power-on or power-off situations that may occur during actual use, and then verify whether the system will be disordered and unable to start normally.

[0053] Currently, power-on and power-off tests of domain controllers can be completed through manual testing.

[0054] However, the related art based on manual power-on and power-off testing of domain controllers has the problems of low testing efficiency and low accuracy. There is a lack of a reliable solution for power-on and power-off testing of domain controllers.

[0055] In order to solve the above problems, the present application provides a testing method, including: obtaining an object to be tested of a domain controller. Based on the object to be tested, determining a test scheme for the object to be tested. Based on the test scheme for the object to be tested, testing the object to be tested to obtain a target test result for the object to be tested. In this way, by adopting different test schemes for different objects to be tested, the power-on and power-off test results of the domain controller can be accurately and reliably determined.

[0056] like Figure 1 , is a schematic diagram of the architecture of a test system according to an exemplary embodiment, including a test device 101, a primary power system 102, a secondary power system 103, a tertiary power system 104, a power management integrated circuit 105, and a system base controller 106.

[0057] Among them, the testing device 101 is used to send power on and off instructions to the object to be tested (one or more of the primary power supply system 102, the secondary power supply system 103, the tertiary power supply system 104, the power management integrated circuit 105, and the system base controller 106); or to obtain the power on and off response results of the object to be tested.

[0058] The primary power supply system 102 includes a primary power supply of the domain controller and devices (such as a system-level chip) directly powered by the primary power supply.

[0059] The secondary power supply system 103 includes a transformer connected to the primary power supply and devices connected to the transformer; the transformer is used to convert the voltage of the primary power supply into the voltage required by the secondary power supply system 103.

[0060] For example, the voltage of the primary power supply may be 12 volts. The voltage required by the secondary power supply system 103 may be 5 volts.

[0061] The tertiary power system 104 includes a transformer connected to the transformer in the secondary power system 103 , and the transformer is used to convert the voltage of the secondary power system 103 into a voltage required by the tertiary power system 104 .

[0062] Exemplarily, the voltage required by the three-level power system 104 may be 1.8 volts or 1.2 volts.

[0063] The power management integrated circuit 105 is used to manage and control the power supply in the domain controller.

[0064] The system base controller 106 is used to manage and control the system in the domain controller.

[0065] In some embodiments, the domain controllers to which the primary power system 102, the secondary power system 103, the tertiary power system 104, the power management integrated circuit 105, and the system base controller 106 belong may include at least one of the following: a cockpit domain controller, a driving domain controller, a body domain controller, a chassis domain controller, and a power domain controller.

[0066] In some embodiments, the primary power system 102 , the secondary power system 103 , and the tertiary power system 104 are connected via a power conversion chip.

[0067] Exemplarily, the power conversion chip may be a low dropout regulator (LDO) or a buck converter.

[0068] In some embodiments, the primary power system 102 , the secondary power system 103 , the tertiary power system 104 , the power management integrated circuit 105 , and the system base controller 106 may be connected in series or in parallel.

[0069] like Figure 2 , is a schematic diagram of the structure of a domain controller according to an exemplary embodiment, including a primary power system 201 , a secondary power system 202 , a tertiary power system 203 , and a controller 204 .

[0070] Among them, the primary power supply system 201 includes an input pin Vin and a Vout output pin;

[0071] The secondary power system 202 includes an input pin Vin, an output pin Vout, and a control pin EN.

[0072] The three-stage power system 203 includes an input pin Vin, an output pin Vout, and a control pin EN.

[0073] The controller 204 is connected to the control pin EN of the secondary power system 202 and the control pin of the tertiary power system 203, and is used to control the secondary power system 202 and the tertiary power system 203, such as inputting a wake-up instruction or a sleep instruction.

[0074] In a possible implementation, the controller 204 is connected to a control pin EN of the secondary power system 202 and a control pin of the tertiary power system 203 via an IO pin.

[0075] like Figure 3 , is a schematic diagram of the structure of another domain controller according to an exemplary embodiment, including a controller 301 , a primary power supply 302 , a power management integrated circuit 303 , and a system-level chip 304 .

[0076] The controller 301 is connected to the control pin EN of the power management integrated circuit 303 and the wake-up signal pin WAKE of the power management integrated circuit 303 ; and is used to control the power management integrated circuit 303 to wake up, sleep, power on, power off, etc.

[0077] The primary power supply 302 is connected to the input pin Vin of the power management integrated circuit 303 and is used to provide voltage to the power management integrated circuit 303 so that the power management integrated circuit 303 can work normally.

[0078] The power management integrated circuit 303 also includes a first switching regulator output pin SW1, a second switching regulator output pin SW2, a first low-dropout linear regulator output pin LDO1, and a second low-dropout linear regulator output pin LDO2; and is used to manage the input power of the system-level chip 304.

[0079] The system-level chip 304 includes a first power domain pin, a second power domain pin, and a third power domain pin; the first power domain pin is connected to the first switching regulator output pin SW1, the second power domain pin is connected to the second switching regulator output pin SW2, and the third power domain pin is connected to the second low-dropout linear regulator output pin LDO2; the system-level chip 304 is used to implement the corresponding functions of the domain controller.

[0080] like Figure 4 , is a schematic diagram of the structure of another domain controller according to an exemplary embodiment, including a domain controller power-on and power-off device 401 , a control unit 402 , a sending unit 403 , a detection unit 404 , and a receiving unit 405 .

[0081] The domain controller power-on and power-off device 401 is used to supply power to the system-level chip.

[0082] The control unit 402 is used to control whether the domain controller power-on and power-off device 401 supplies power to the system-level chip.

[0083] The sending unit 403 is used to send control instructions to the system-level chip to control the power on and off of the system-level chip.

[0084] The detection unit 404 is used to detect the voltage or current of the circuit.

[0085] The receiving module 405 is used to receive a response corresponding to a control instruction or an instruction sent by other devices.

[0086] For ease of understanding, the testing method provided in this application is specifically introduced below with reference to the accompanying drawings.

[0087] Figure 5 is a flow chart of a testing method according to an exemplary embodiment. Figure 1 As shown, the test method includes S501-S503:

[0088] S501: Obtain the domain controller object to be tested.

[0089] Among them, the object to be tested includes at least one of the following: a primary power supply system, a secondary power supply system under the primary power supply system, a tertiary power supply system under the secondary power supply system, a power management integrated circuit under the primary power supply system, and a system base controller under the primary power supply system.

[0090] In some embodiments, the domain controller includes at least one of the following: a cockpit domain controller, a driving domain controller, a body domain controller, a chassis domain controller, and a power domain controller.

[0091] It should be understood that the types of domain controllers are different, and the functions implemented by the corresponding primary power supply system, the secondary power supply system under the primary power supply system, the tertiary power supply system under the secondary power supply system, the power management integrated circuit under the primary power supply system, and the system base controller under the primary power supply system may be different.

[0092] In a possible implementation manner, the object to be tested of the domain controller may be determined through user input.

[0093] Exemplarily, the user can input object information of the object to be tested, which object information includes at least one of a primary power supply system, a secondary power supply system under the primary power supply system, a tertiary power supply system under the secondary power supply system, a power management integrated circuit under the primary power supply system, and a system base controller under the primary power supply system.

[0094] S502: Determine a test plan for the object to be tested based on the object to be tested.

[0095] In a possible implementation manner, a test scheme for the object to be tested may be determined based on the number and types of objects included in the object to be tested.

[0096] S503: Based on the test plan of the object to be tested, the object to be tested is tested to obtain a target test result of the object to be tested.

[0097] The target test result is used to indicate whether the power on and off of the object to be tested is normal.

[0098] In the embodiment of the application, the object to be tested of the domain controller is obtained. Based on the object to be tested, a test scheme for the object to be tested is determined. Based on the test scheme for the object to be tested, the object to be tested is tested to obtain a target test result of the object to be tested. In this way, by adopting different test schemes for different objects to be tested, the power-on and power-off test results of the domain controller can be accurately and reliably determined.

[0099] In a possible implementation, the primary power system includes a primary power supply, a system-level chip, and an application corresponding to the system-level chip. The object to be tested is at least one of the following: a primary power supply, a system-level chip, and an application. Figure 5 The embodiment shown, as Figure 6 As shown, the above S503 tests the object to be tested based on the test scheme of the object to be tested, including S601-S602:

[0100] S601: Obtain a target time interval corresponding to the object to be tested.

[0101] The target time interval includes at least one of the following: a first time interval, a second time interval, and a third time interval. The first time interval is the time taken to start the primary power supply. The second time interval is used to indicate the time taken to start the system-level chip after the primary power supply is started. The third time interval is used to indicate the time taken to start the application after the system-level chip is started. The object to be tested corresponds to the target time interval.

[0102] It should be understood that, when the object to be tested includes a primary power source, the target time interval includes the first time interval corresponding to the primary power source, that is, the object to be tested corresponds to the target time interval.

[0103] In a possible implementation, based on the objects included in the object to be tested, the time interval corresponding to each object may be added to the target time interval.

[0104] In one possible implementation, the primary power supply is powered by the lithium battery of the vehicle, so the test voltage provided to the primary power supply during the test must also be consistent with the lithium battery voltage.

[0105] In a possible implementation, in a scenario where a lithium battery may be overcharged, the test voltage may be adjusted to be higher than the lithium battery voltage.

[0106] In a possible implementation manner, the first time interval is smaller than the second time interval, and the second time interval is smaller than the third time interval.

[0107] S602: Based on the target time interval, perform power on and power off tests on the test object to obtain a target test result.

[0108] It should be understood that the target time interval can indicate the time taken for each object in the tested object to start up. Therefore, based on the target time interval, the power-on and power-off tests on the tested object can accurately and reliably obtain the target test results.

[0109] Exemplarily, the object to be tested includes a primary power supply, and the target time interval includes a first time interval; at this time, starting from the moment when the domain controller controls the primary power supply to power on, after the first time interval, the testing device obtains the power-on result of the primary power supply, thereby accurately obtaining the power-on result of the primary power supply corresponding to the first time interval; based on the power-on result, it can be accurately determined whether the power-on of the primary power supply is normal.

[0110] Exemplarily, the first-level power supply is powered on normally when the first-level power supply is powered on successfully after a first time interval has passed since the moment of starting the power supply. The first-level power supply is powered on abnormally, including at least one of the following: the first-level power supply fails to power on, and the first-level power supply is powered on successfully after a time interval greater than the first time interval has passed since the moment of starting the power supply.

[0111] In a possible implementation, the target time interval may be set in a timer to implement power-on and power-off testing of the object to be tested based on the target time interval.

[0112] In a possible implementation, the object to be tested is one of a primary power supply, a system-level chip, and an application, and the target time interval is a time interval corresponding to the object to be tested among the first time interval, the second time interval, and the third time interval. Figure 6 The embodiment shown, as Figure 7As shown, the above S602 performs power-on and power-off tests on the test object based on the target time interval to obtain the target test result of the domain controller, including S701-S703:

[0113] S701. Send a first power-on instruction to a domain controller.

[0114] The first power-on instruction is used to trigger the object to be tested to power on.

[0115] In a possible implementation, the test device and the domain controller communicate via wireless signals; the test device sends a first power-on instruction to the domain controller via an air interface.

[0116] In a possible implementation, the test device and the domain controller are connected by wire (eg, connected via a communication cable); the test device sends a first power-on instruction to the domain controller via the communication cable.

[0117] In a possible implementation, the domain controller sends a high-level signal to the object to be tested through a power-on control pin (eg, an EN enable pin) based on the first power-on instruction, thereby triggering power-on of the object to be tested.

[0118] In a possible implementation, the domain controller sends a high-level signal to the object under test through a wake-up control pin to trigger the object under test to power on or to trigger the object under test to enter a wake-up state.

[0119] S702: After sending the first power-on instruction for a duration corresponding to the target time interval, obtain a first power-on response result of the object to be tested.

[0120] It should be understood that the target time interval corresponds to the object to be tested, that is, in the case of one of the primary power supply, system-level chip, and application of the object to be tested, the target time interval can indicate the time taken to power on the object to be tested. Therefore, after sending the time corresponding to the target time interval of the first power-on instruction, the first power-on response result of the object to be tested can be accurately and reliably obtained.

[0121] S703: Compare the expected response result corresponding to the object to be tested with the first power-on response result to obtain a first test result.

[0122] The first test result is used to indicate whether the power-on of the object to be tested is normal.

[0123] In a possible implementation, the first power-on response result may be the power consumption of the object to be tested. At this time, the expected response result is the expected power consumption of the object to be tested.

[0124] Exemplarily, the power consumption condition may be at least one of the following: a voltage value, a power value, and a current value.

[0125] In a possible implementation, when the object to be tested is a system-on-chip, the first power-on response result may be a log of the system-on-chip, which is used to indicate whether the object to be tested is powered on normally. At this time, the expected response result is a log indicating that the object to be tested is powered on normally.

[0126] In the embodiment of the present application, a first power-on instruction is sent to a domain controller; after the duration corresponding to the target time interval of sending the first power-on instruction, a first power-on response result of the object to be tested is obtained; and the expected response result corresponding to the object to be tested is compared with the first power-on response result to obtain a first test result. In this way, the power-on test result of the object to be tested can be accurately and reliably obtained when the object to be tested is one of a primary power supply, a system-level chip, and an application, and the power-on test of the object to be tested is completed.

[0127] In a possible implementation, the object to be tested includes multiple of a primary power supply, a system-level chip, and an application, and the target time interval includes: multiple time intervals corresponding to the object to be tested in a first time interval, a second time interval, and a third time interval. Figure 6 The embodiment shown, as Figure 8 As shown, the above S602 performs power-on and power-off tests on the test object based on the target time interval to obtain the target test result of the domain controller, including S801-S803:

[0128] S801. Send a second power-on instruction to the domain controller.

[0129] The second power-on instruction is used to trigger each object in the objects to be tested to power on.

[0130] In a possible implementation manner, the second power-on instruction may include multiple sub-instructions, and one sub-instruction is used to trigger one of the objects to be tested to power on.

[0131] S802: Obtain a second power-on response result based on the target time interval.

[0132] The second power-on response includes a power-on response result of each object in the objects to be tested.

[0133] In one possible implementation, for each object in the objects to be tested, a power-on response result of the first object (one of the objects to be tested) is obtained after a time interval corresponding to the first object has passed at the start-up moment of the first object, thereby obtaining a power-on response result of each object in the objects to be tested; and the power-on response result of each object is determined as the second power-on response result.

[0134] S803: Compare the expected response result corresponding to the object to be tested with the second power-on response result to obtain a second test result.

[0135] The second test result is used to indicate whether the power-on of the object to be tested is normal.

[0136] In one possible implementation, the expected response result includes an expected power-on result of each object of the object to be tested; when the second power-on response result indicates that the power-on response result of each object in the object to be tested is the same as the expected power-on result corresponding to each object, it is determined that the object to be tested is powered on normally.

[0137] In a possible implementation, when the second power-on response result indicates that the power-on response result of an object among the objects to be tested is different from the expected power-on result corresponding to the object, it is determined that the object to be tested is powered on abnormally.

[0138] Optionally, the testing device may perform ADC sampling on the object to be tested through the domain controller to obtain on / off state information of the object to be tested, thereby obtaining a power-on response result of the object to be tested.

[0139] In the embodiment of the present application, a second power-on instruction is sent to the domain controller; based on the target time interval, a second power-on response result is obtained; the expected response result corresponding to the object to be tested is compared with the second power-on response result to obtain a second test result. Since the second power-on instruction is used to trigger the power-on of each object in the object to be tested, and the second test result is used to indicate whether the power-on of the object to be tested is normal, it is possible to accurately and reliably obtain the power-on test result of the object to be tested when the object to be tested includes a primary power supply, a system-level chip, and multiple of the applications, and complete the power-on test of the object to be tested.

[0140] In a possible implementation, the object to be tested includes a first object and a second object, the first object and the second object are two adjacent objects in a primary power supply, a system-level chip, and an application, and the second object is a lower-level object of the first object. Figure 6 The embodiment shown, as Fig. 9 As shown, in the above S602, based on the target time interval, the power-on and power-off test is performed on the test object to obtain the target test result of the domain controller, including S901-S903:

[0141] S901. Send a third power-on instruction to the domain controller.

[0142] The third power-on instruction is used to trigger the first object and the second object to power on.

[0143] In a possible implementation, the domain controller sends power-on signals to the first object and the second object respectively based on the third power-on instruction, thereby triggering power-on of the first object and the second object.

[0144] Optionally, the power-on signal may be a high level signal.

[0145] S902: Based on the target time interval, obtain a third power-on response result of the object to be tested.

[0146] The third power-on response result is a power-on response result corresponding to the second object.

[0147] Exemplarily, the first object is a primary power supply, and the second object is an application corresponding to the system-level chip; at this time, after a first time interval has passed since the moment when the primary power supply starts to power on, a power-on response result corresponding to the primary power supply is obtained; after a third time interval has passed since the moment when the application corresponding to the system-level chip starts to power on, a power-on response result corresponding to the application corresponding to the system-level chip is obtained; based on the power-on response result corresponding to the primary power supply and the power-on response result of the application corresponding to the system-level chip, a third power-on result is determined.

[0148] S903: Compare the expected response result corresponding to the object to be tested with the third power-on response result to obtain a third test result.

[0149] The third test result is used to indicate whether the first object and the second object are powered on normally.

[0150] It should be understood that the expected response result includes an expected power-on result of the first object and an expected power-on result of the second object.

[0151] In one possible implementation, a power-on response result corresponding to the first object is compared with an expected power-on result of the first object to obtain a test result of the first object; a power-on response result corresponding to the second object is compared with the expected power-on result of the second object to obtain a test result of the second object; and a third test result is determined based on the test result of the first object and the test result of the second object.

[0152] In the embodiment of the present application, a third power-on instruction is sent to the domain controller; based on the target time interval, a third power-on response result of the object to be tested is obtained; the expected response result corresponding to the object to be tested is compared with the third power-on response result to obtain a third test result. Since the third power-on instruction is used to trigger the power-on of the first object and the second object, the third power-on response result includes the power-on response result corresponding to the first object and the power-on response result corresponding to the second object; therefore, it is possible to accurately and reliably determine the power-on result of the object to be tested when the object to be tested includes the first object and the second object, the first object is one of the primary power supply, the system-level chip, and the application, and the second object is another one of the primary power supply, the system-level chip, and the application except the first object, thereby completing the power-on test of the object to be tested.

[0153] In some embodiments, the object to be tested is at least one of the following: a secondary power system, a tertiary power system. Figure 5 The embodiment shown, as Fig.10 As shown, the above S503 tests the object to be tested based on the test scheme of the object to be tested, including S1001-S1003:

[0154] S1001. Send a fourth power-on instruction to the domain controller, where the fourth power-on instruction is used to trigger power-on of the secondary power supply system and / or the tertiary power supply system.

[0155] Optionally, the primary power system, the secondary power system and the tertiary power system are connected in series.

[0156] Exemplarily, the voltage of the primary power system may be 12 volts, the voltage of the second power system may be 5 volts, and the voltage of the tertiary power system may be 1.8 volts or 1.2 volts.

[0157] In a possible implementation, the domain controller may control the power on and off of the object to be tested by enabling the voltage output by the pin based on the fourth power-on instruction.

[0158] S1002: Obtain a fourth power-on response result of the object to be tested, where the fourth power-on response result includes a power-on response result of a secondary power system and / or a tertiary power system.

[0159] In a possible implementation, the testing device may obtain an amplitude (or referred to as a sampled voltage) collected by a sampling circuit of the domain controller to obtain a fourth power-on response result.

[0160] S1003: Compare the expected response result corresponding to the object to be tested with the fourth power-on response result to obtain a fourth test result.

[0161] The fourth test result is used to indicate whether the power-on of the secondary power supply system and / or the tertiary power supply system is normal.

[0162] It should be understood that, through the fourth power-on instruction and the fourth power-on response result, it is possible to accurately and reliably determine whether the power-on of the secondary power supply system and / or the tertiary power supply system is normal.

[0163] In a possible implementation, when the fourth power-on response result includes a sampled voltage, the expected response result includes a voltage threshold; based on whether the sampled voltage is higher than the voltage threshold, it is determined whether the object to be tested is powered on normally. If the sampled voltage is higher than the voltage threshold, it indicates that the object to be tested is powered on normally; if the sampled voltage is lower than the voltage threshold, it indicates that the object to be tested is powered on abnormally.

[0164] In a possible implementation, the third-level power supply system may be powered on and off first, and then the second-level power supply system may be powered on and off.

[0165] It should be understood that performing power on and off tests on the tertiary power supply system first and then on the secondary power supply system can avoid inaccurate test results of the lower power supply system due to the higher power supply system affecting the lower power supply system.

[0166] In some embodiments, the object to be tested is at least one of the following: a power management integrated circuit under a primary power system, a system base controller under a primary power system, and the power management integrated circuit under the primary power system and the system base controller under the primary power system both include multiple channels. Figure 5 The embodiment shown, as Fig.11 As shown, the above S503, based on the test scheme of the object to be tested, tests the object to be tested, including S1101-S1103:

[0167] S1101. Send a fifth power-on instruction to the object to be tested.

[0168] The fifth power-on instruction is used to trigger the power management integrated circuit in the primary power system and / or the system base controller in the primary power system to power on.

[0169] In some embodiments, the power management integrated circuit and / or the system base controller are powered by the system-on-chip in a standalone mode in the primary power system.

[0170] In some embodiments, the power management integrated circuit and / or the system base controller are connected in parallel with the system-level chip for independent mode in the primary power system.

[0171] In a possible implementation, the domain controller may directly control the on and off of the primary power supply based on the fifth power-on instruction, and complete the power on and off of the power management integrated circuit and / or the system base controller.

[0172] In one possible implementation, the domain controller controls the power management integrated circuit and / or the power chip corresponding to the system base controller to output a high voltage through an enable pin based on the fifth power-on instruction, thereby triggering the power management integrated circuit and / or the system base controller to power on.

[0173] S1102: Obtain a fifth power-on response result corresponding to the object to be tested.

[0174] The fifth power-on response result includes a power-on response result of each channel of the object to be tested.

[0175] In a possible implementation manner, the testing device obtains the fifth power-on response result by acquiring the power-on response result of each channel of the object to be tested.

[0176] In a possible implementation, the domain controller also controls the power management integrated circuit and / or the system base controller to enter the wake-up state through the sleep wake-up pin, so as to accurately obtain the power-on response result of the power management integrated circuit and / or the system base controller.

[0177] S1103: Compare the expected response result corresponding to the object to be tested with the fifth power-on response result to obtain a fifth test result.

[0178] The fifth test result is used to indicate whether the power management integrated circuit and / or the system base controller are powered on normally.

[0179] In a possible implementation, the fifth power-on response result includes the sampled voltage of each channel, and the expected response result includes the preset voltage of each channel when powered on; at this time, the fifth test result can be determined based on whether the sampled voltage of each channel is the preset voltage of the channel. Wherein, if the sampled voltage of each channel is the preset voltage of the channel, it means that the power-on of the power management integrated circuit and / or the system base controller is normal; if the sampled voltage of a channel is not the preset voltage of the channel, it means that the power-on of the power management integrated circuit and / or the system base controller is abnormal.

[0180] It should be understood that, through the fifth power-on instruction and the fifth power-on response result, the test result of the object to be tested can be accurately and reliably determined when the object to be tested is a power management integrated circuit and / or a system base controller.

[0181] In some embodiments, the possible implementation method of obtaining the power-on test result based on any of the above methods can be analogous to the implementation method of obtaining the power-off test.

[0182] In some embodiments, in combination Figure 5 The embodiment shown, as Fig.12 As shown, the above S503 tests the object to be tested based on the test scheme of the object to be tested, including S1201-S1204:

[0183] S1201. Obtain the target number of tests for the object to be tested.

[0184] The target number of tests is determined based on the designed usage time of the domain controller.

[0185] For example, assuming that the domain controller is a cockpit domain controller, the cockpit domain controller is designed to be powered on and off 20 times a day for 30 years; then the target number of tests can be determined to be 219,000 times.

[0186] Optionally, when it is necessary to test each part of the domain controller in different combinations, a number of tests corresponding to the importance of each combination can be allocated to each combination; the sum of the number of tests for all combinations corresponds to the design usage time of the domain controller.

[0187] Exemplarily, the importance of each combination is in the form of percentage, and the sum of the importance of all combinations is 1. That is, the importance of each combination is a relative importance.

[0188] Optionally, the importance of each combination may also be an absolute importance, and each importance is represented by data.

[0189] S1202: Test the test object based on the target test number to obtain multiple test results.

[0190] The test result is used to indicate whether the object to be tested is powered on and off normally.

[0191] It should be understood that the test result of the object to be tested in S1202 may be obtained based on any of the above possible implementation methods for obtaining the test result.

[0192] S1203: Determine that the target test result is a sixth test result based on the number of test results indicating that the object to be tested is powered on and off normally being greater than or equal to a number threshold among the multiple test results.

[0193] The sixth test result is used to indicate that the object to be tested is powered on and off normally.

[0194] It should be understood that the number of test results indicating that the power on and off of the object to be tested is normal among the multiple test results is greater than or equal to the quantity threshold, indicating that the power on and off reliability of the object to be tested is strong and can meet the user's usage needs. At this time, the target test result is determined to be the sixth test result.

[0195] S1204: Determine that the target test result is the seventh test result based on the number of test results indicating that the to-be-tested object is powered on and off normally being less than a number threshold among the multiple test results.

[0196] The seventh test result is used to indicate that the object to be tested has abnormal power on and off.

[0197] It should be understood that the number of test results indicating that the power on and off of the object to be tested is normal among the multiple test results is less than the quantity threshold, which means that the reliability of the power on and off of the object to be tested is poor and cannot meet the user's usage requirements. At this time, the target test result is determined to be the seventh test result.

[0198] The above mainly introduces the scheme provided by the embodiment of the present application from the perspective of the method. In order to achieve the above functions, the test device or the test device includes a hardware structure and / or software module corresponding to the execution of each function. It should be easily appreciated by those skilled in the art that, in combination with the units and algorithm steps of each example described in the embodiments disclosed herein, the present application can be implemented in the form of hardware or a combination of hardware and computer software. Whether a function is executed in the form of hardware or computer software driving hardware depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present application.

[0199] The embodiment of the present application can divide the functional modules of the test device or the test device according to the above method. For example, the test device or the test device may include various functional modules corresponding to the various functional divisions, or two or more functions may be integrated into one processing module. The above integrated modules can be implemented in the form of hardware or in the form of software functional modules. It should be noted that the division of modules in the embodiment of the present application is schematic and is only a logical functional division. There may be other division methods in actual implementation.

[0200] Fig.13 FIG. 1 is a schematic diagram showing a structure of a testing device according to an exemplary embodiment. Fig.13 The testing device includes an acquisition module 1301 , a determination module 1302 and a testing module 1303 .

[0201] The acquisition module 1301 is used to acquire the object to be tested of the domain controller, and the object to be tested includes at least one of the following: a primary power supply system, a secondary power supply system under the primary power supply system, a tertiary power supply system under the secondary power supply system, a power management integrated circuit under the primary power supply system, and a system base controller under the primary power supply system.

[0202] The determination module 1302 is used to determine a test plan for the object to be tested based on the object to be tested.

[0203] The testing module 1303 is used to test the object to be tested based on the testing scheme of the object to be tested, and obtain a target test result of the object to be tested, where the target test result is used to indicate whether the power on and off of the object to be tested is normal.

[0204] In a possible implementation, the primary power system includes a primary power supply, a system-on-chip, and an application corresponding to the system-on-chip. The object to be tested is at least one of the following: the primary power supply, the system-on-chip, and the application.

[0205] The acquisition module 1301 is specifically used to acquire the target time interval corresponding to the object to be tested. The target time interval includes at least one of the following: a first time interval, a second time interval, and a third time interval. The first time interval is the time it takes to start the primary power supply. The second time interval is used to indicate the time it takes to start the system-level chip after the primary power supply is started. The third time interval is used to indicate the time it takes to start the application after the system-level chip is started. The object to be tested corresponds to the target time interval.

[0206] The test module 1303 is specifically configured to perform power-on and power-off tests on the object to be tested based on the target time interval to obtain the target test result.

[0207] In a possible implementation, the object to be tested is one of the primary power supply, the system-level chip, and the application, and the target time interval is a time interval corresponding to the object to be tested among the first time interval, the second time interval, and the third time interval. The testing device also includes a sending module 1304.

[0208] The sending module 1304 is used to send a first power-on instruction to the domain controller, where the first power-on instruction is used to trigger the object to be tested to power on.

[0209] The acquisition module 1301 is further configured to acquire a first power-on response result of the object to be tested after sending the first power-on instruction for a duration corresponding to the target time interval.

[0210] The testing module 1303 is specifically used to compare the expected response result corresponding to the object to be tested with the first power-on response result to obtain a first test result, and the first test result is used to indicate whether the power-on of the object to be tested is normal.

[0211] In a possible implementation, the object to be tested includes the primary power supply, the system-level chip, and multiple of the application, and the target time interval includes: multiple time intervals corresponding to the object to be tested in the first time interval, the second time interval, and the third time interval. The test device also includes a sending module 1304.

[0212] The sending module 1304 is used to send a second power-on instruction to the domain controller, where the second power-on instruction is used to trigger each object in the object to be tested to power on.

[0213] The acquisition module 1301 is further configured to acquire a second power-on response result based on the target time interval, where the second power-on response includes a power-on response result of each object in the objects to be tested.

[0214] The testing module 1303 is specifically used to compare the expected response result corresponding to the object to be tested with the second power-on response result to obtain a second test result, and the second test result is used to indicate whether the power-on of the object to be tested is normal.

[0215] In a possible implementation, the object to be tested includes a first object and a second object, the first object and the second object are two adjacent objects in the primary power supply, the system-level chip, and the application, the second object is a next-level object of the first object, and the target time interval includes a time interval corresponding to the first object and a time interval corresponding to the second object. The test device also includes a sending module 1304.

[0216] The sending module 1304 is used to send a third power-on instruction to the domain controller, where the third power-on instruction is used to trigger power-on of the first object and the second object.

[0217] The acquisition module 1301 is further configured to acquire a third power-on response result of the object to be tested based on the target time interval, where the third power-on response result is a power-on response result corresponding to the second object.

[0218] The testing module 1303 is specifically used to compare the expected response result corresponding to the object to be tested with the third power-on response result to obtain a third test result, and the third test result is used to indicate whether the power-on of the first object and the second object is normal.

[0219] In a possible implementation manner, the object to be tested is at least one of the following: the secondary power supply system, the tertiary power supply system. The testing device further includes a sending module 1304 .

[0220] The sending module 1304 is used to send a fourth power-on instruction to the domain controller, where the fourth power-on instruction is used to trigger the secondary power system and / or the tertiary power system to power on.

[0221] The acquisition module 1301 is further configured to acquire a fourth power-on response result of the object to be tested, where the fourth power-on response result includes a power-on response result of the secondary power system and / or the tertiary power system.

[0222] The test module 1303 is specifically used to compare the expected response result corresponding to the object to be tested with the fourth power-on response result to obtain a fourth test result, which is used to indicate whether the power-on of the secondary power supply system and / or the tertiary power supply system is normal.

[0223] In a possible implementation manner, the object to be tested is at least one of the following: a power management integrated circuit under the primary power system, a system base controller under the primary power system, and the power management integrated circuit under the primary power system and the system base controller under the primary power system both include multiple channels. The test device also includes a sending module 1304.

[0224] The sending module 1304 is used to send a fifth power-on instruction to the object to be tested, and the fifth power-on instruction is used to trigger the power management integrated circuit under the primary power system and / or the system base controller under the primary power system to power on.

[0225] The acquisition module 1301 is further configured to acquire a fifth power-on response result corresponding to the object to be tested, where the fifth power-on response result includes a power-on response result of each channel of the object to be tested.

[0226] The test module 1303 is specifically used to compare the expected response result corresponding to the object to be tested with the fifth power-on response result to obtain a fifth test result, which is used to indicate whether the power management integrated circuit and / or the system base controller is powered on normally.

[0227] In a possible implementation, the acquisition module 1301 is further used to acquire a target number of tests for the object to be tested, where the target number of tests is determined based on a designed usage time of the domain controller.

[0228] The testing module 1303 is specifically used to test the object to be tested based on the target test number to obtain multiple test results, and the test results are used to indicate whether the power on and off of the object to be tested is normal.

[0229] The determination module 1302 is further used to determine that the target test result is a sixth test result based on the number of test results in the multiple test results indicating that the power on and off of the object to be tested is normal is greater than or equal to a quantity threshold, and the sixth test result is used to indicate that the power on and off of the object to be tested is normal.

[0230] The determination module 1302 is further used to determine that the target test result is the seventh test result based on the number of test results indicating that the power on and off of the object to be tested is normal among the multiple test results being less than a quantity threshold, and the seventh test result is used to indicate that the power on and off of the object to be tested is abnormal.

[0231] Regarding the device in the above embodiment, the specific manner in which each module performs operations has been described in detail in the embodiment of the method, and will not be elaborated here.

[0232] Fig.14 FIG. 1 is a schematic diagram showing the structure of a testing device according to an exemplary embodiment. Fig.14 As shown, the testing device includes but is not limited to: a processor 1401 and a memory 1402 .

[0233] The memory 1402 is used to store executable instructions of the processor 1401. It can be understood that the processor 1401 is configured to execute instructions to implement the test method in the above embodiment.

[0234] It should be noted that those skilled in the art can understand that Fig.14 The test device structure shown in the figure does not constitute a limitation on the test device, and the test device may include Fig.14 More or fewer components may be shown, or certain components may be combined, or the components may be arranged differently.

[0235] The processor 1401 is the control center of the test device. It uses various interfaces and lines to connect various parts of the entire test device. By running or executing software programs and / or modules stored in the memory 1402, and calling data stored in the memory 1402, it performs various functions of the test device and processes data, thereby monitoring the test device as a whole. The processor 1401 may include one or more processing units. Optionally, the processor 1401 may integrate an application processor and a modem processor, wherein the application processor mainly processes the operating system, user interface, and application programs, etc., and the modem processor mainly processes wireless communications. It is understandable that the above-mentioned modem processor may not be integrated into the processor 1401.

[0236] The memory 1402 may be used to store software programs and various data. The memory 1402 may mainly include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application program required by at least one functional module (such as a determination unit, a processing unit, etc.), etc. In addition, the memory 1402 may include a high-speed random access memory, and may also include a non-volatile memory, such as at least one disk storage device, a flash memory device, or other volatile solid-state storage devices.

[0237] In an exemplary embodiment, a computer-readable storage medium including instructions is also provided, such as a memory 1402 including instructions. The instructions can be executed by a processor 1401 of a test device to implement the method in the above embodiment.

[0238] In actual implementation, Fig.13 The functions of the acquisition module 1301, the determination module 1302, the test module 1303 and the sending module 1304 in the embodiment can be realized by Fig.14 The processor 1401 in the embodiment calls the computer program stored in the memory 1402 to implement. The specific execution process can refer to the description of the method part in the above embodiment, which will not be repeated here.

[0239] Optionally, the computer-readable storage medium may be a non-temporary computer-readable storage medium, for example, the non-temporary computer-readable storage medium may be a read-only memory (ROM), a random access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, etc.

[0240] In an exemplary embodiment, the present application also provides a computer program product including one or more instructions, and the one or more instructions can be executed by the processor 1401 of the test device to complete the method in the above embodiment.

[0241] It should be noted that when the instructions in the above-mentioned computer-readable storage medium or one or more instructions in the computer program product are executed by the processor of the test device, the various processes of the above-mentioned method embodiment are implemented, and the same technical effect as the above-mentioned method can be achieved. To avoid repetition, they will not be repeated here.

[0242] Through the description of the above implementation methods, technical personnel in the relevant field can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional modules is used as an example. In actual applications, the above-mentioned functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above.

[0243] In the several embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic, for example, the division of modules or units is only a logical function division, and there may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another device, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0244] The units described as separate components may or may not be physically separated, and the components shown as units may be one physical unit or multiple physical units, that is, they may be located in one place or distributed in multiple different places. Some or all of the units may be selected according to actual needs to achieve the purpose of the present embodiment.

[0245] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0246] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a readable storage medium. Based on this understanding, the technical solution of the embodiment of the present application is essentially or the part that contributes to the prior art or the full classification part or part of the technical solution can be embodied in the form of a software product, which is stored in a storage medium, including a number of instructions to enable a device (which can be a single-chip microcomputer, chip, etc.) or a processor (processor) to execute the full classification part or part of the steps of each embodiment method of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, ROM, RAM, disk or CD and other media that can store program code.

[0247] The above are only specific implementations of the present application, but the protection scope of the present application is not limited thereto, and any changes or substitutions within the technical scope disclosed in the present application should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A testing method, characterized in that: include: Acquire an object to be tested of the domain controller, the object to be tested comprising at least one of the following: a primary power system, a secondary power system under the primary power system, a tertiary power system under the secondary power system, a power management integrated circuit under the primary power system, and a system base controller under the primary power system; Based on the object to be tested, determining a test plan for the object to be tested; Based on the test scheme of the object to be tested, the object to be tested is tested to obtain a target test result of the object to be tested, wherein the target test result is used to indicate whether the power on and off of the object to be tested is normal.

2. The method according to claim 1, characterized in that The primary power system includes a primary power supply, a system-level chip, and an application corresponding to the system-level chip; the object to be tested is at least one of the following: the primary power supply, the system-level chip, and the application; the test scheme based on the object to be tested, testing the object to be tested, includes: Obtain a target time interval corresponding to the object to be tested; the target time interval includes at least one of the following: a first time interval, a second time interval, and a third time interval; the first time interval is the time taken to start the primary power supply; the second time interval is used to indicate the time taken to start the system-level chip after the primary power supply is started; the third time interval is used to indicate the time taken to start the application after the system-level chip is started; the object to be tested corresponds to the target time interval; Based on the target time interval, power on and power off tests are performed on the object to be tested to obtain the target test result.

3. The method according to claim 2, characterized in that The object to be tested is one of the primary power supply, the system-level chip, and the application; the target time interval is a time interval corresponding to the object to be tested among the first time interval, the second time interval, and the third time interval; the object to be tested corresponds to the target time interval; and based on the target time interval, power-on and power-off tests are performed on the object to be tested to obtain a target test result of the domain controller, including: Sending a first power-on instruction to the domain controller, where the first power-on instruction is used to trigger the object to be tested to power on; After sending the first power-on instruction for a duration corresponding to the target time interval, obtaining a first power-on response result of the object to be tested; The expected response result corresponding to the object to be tested is compared with the first power-on response result to obtain a first test result, where the first test result is used to indicate whether the power-on of the object to be tested is normal.

4. The method according to claim 2, characterized in that: The object to be tested includes the primary power supply, the system-level chip, and multiple ones of the application; the target time interval includes: multiple time intervals corresponding to the object to be tested in the first time interval, the second time interval, and the third time interval; and based on the target time interval, performing power-on and power-off tests on the object to be tested to obtain a target test result of the domain controller includes: Sending a second power-on instruction to the domain controller, where the second power-on instruction is used to trigger each object in the objects to be tested to power on; Based on the target time interval, obtaining a second power-on response result, wherein the second power-on response includes a power-on response result of each object in the objects to be tested; The expected response result corresponding to the object to be tested is compared with the second power-on response result to obtain a second test result, where the second test result is used to indicate whether the power-on of the object to be tested is normal.

5. The method according to claim 2, characterized in that: The object to be tested includes a first object and a second object, the first object and the second object are two adjacent ones of the primary power supply, the system-level chip, and the application, the second object is a lower-level object of the first object, the target time interval includes a time interval corresponding to the first object and a time interval corresponding to the second object, and based on the target time interval, performing power-on and power-off tests on the object to be tested to obtain a target test result of the domain controller includes: Sending a third power-on instruction to the domain controller, where the third power-on instruction is used to trigger powering on the first object and the second object; Based on the target time interval, obtaining a third power-on response result of the object to be tested, where the third power-on response result is a power-on response result corresponding to the second object; The expected response result corresponding to the object to be tested is compared with the third power-on response result to obtain a third test result, and the third test result is used to indicate whether the power-on of the first object and the second object is normal.

6. The method according to claim 1, characterized in that The object to be tested is at least one of the following: the secondary power supply system, the tertiary power supply system; and the testing scheme based on the object to be tested, testing the object to be tested, comprises: Sending a fourth power-on instruction to the domain controller, wherein the fourth power-on instruction is used to trigger powering on the secondary power supply system and / or the tertiary power supply system; Acquire a fourth power-on response result of the object to be tested, wherein the fourth power-on response result includes a power-on response result of the secondary power supply system and / or the tertiary power supply system; The expected response result corresponding to the object to be tested is compared with the fourth power-on response result to obtain a fourth test result, and the fourth test result is used to indicate whether the power-on of the secondary power supply system and / or the tertiary power supply system is normal.

7. The method according to claim 1, characterized in that The object to be tested is at least one of the following: a power management integrated circuit under the primary power system, and a system base controller under the primary power system, wherein the power management integrated circuit under the primary power system and the system base controller under the primary power system both include a plurality of channels, and the testing scheme based on the object to be tested, testing the object to be tested, comprises: Sending a fifth power-on instruction to the object to be tested, wherein the fifth power-on instruction is used to trigger the power management integrated circuit under the primary power system and / or the system base controller under the primary power system to power on; Acquire a fifth power-on response result corresponding to the object to be tested, wherein the fifth power-on response result includes a power-on response result of each channel of the object to be tested; The expected response result corresponding to the object to be tested is compared with the fifth power-on response result to obtain a fifth test result, wherein the fifth test result is used to indicate whether the power management integrated circuit and / or the system base controller is powered on normally.

8. The method according to claim 1, characterized in that The testing of the object to be tested based on the test scheme of the object to be tested includes: Obtaining a target number of tests for the object to be tested, where the target number of tests is determined based on a designed usage time of the domain controller; Testing the object to be tested based on the target test number to obtain multiple test results, wherein the test results are used to indicate whether the object to be tested is powered on and off normally; Based on the number of test results indicating that the object to be tested is powered on and off normally among the multiple test results being greater than or equal to a quantity threshold, determining that the target test result is a sixth test result, the sixth test result being used to indicate that the object to be tested is powered on and off normally; Based on the number of test results indicating that the object to be tested is powered on and off normally among the multiple test results being less than a number threshold, the target test result is determined to be a seventh test result, and the seventh test result is used to indicate that the object to be tested is powered on and off abnormally.

9. A testing device, characterized in that: It includes an acquisition module, a determination module and a test module; The acquisition module is used to acquire an object to be tested of the domain controller, wherein the object to be tested includes at least one of the following: a primary power system, a secondary power system under the primary power system, a tertiary power system under the secondary power system, a power management integrated circuit under the primary power system, and a system base controller under the primary power system; The determination module is used to determine a test scheme for the object to be tested based on the object to be tested; The testing module is used to test the object to be tested based on the testing scheme of the object to be tested, and obtain a target testing result of the object to be tested, wherein the target testing result is used to indicate whether the power on and off of the object to be tested is normal.

10. A testing device, characterized in that: include: processor; a memory for storing instructions executable by the processor; The processor is configured to execute the instructions to implement the method according to any one of claims 1 to 8.

11. A computer-readable storage medium, characterized in that: When the computer-executable instructions stored in the computer-readable storage medium are executed by a processor of a test device, the test device is capable of performing the method according to any one of claims 1 to 8.

12. A computer program product, characterized in that The computer program product comprises computer instructions, which, when executed on a test device, enable the test device to perform the method according to any one of claims 1 to 8.

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