Surface profile acquisition method and device

Abstract

The present application relates to the field of surface profile acquisition, and in particular to a surface profile acquisition method and device. The device includes: a first wheel group, a second wheel group, a deviation detection device, a distance detection device, and a controller. The first wheel group and the second wheel group are used to contact the surface to be inspected respectively, the deviation detection device is used to detect the first deviation information of the first wheel group, and the second deviation information of the second wheel group, the distance detection device is used to detect the moving distance of the surface profile acquisition device, the controller is used to determine the first height change information of the inspected surface based on the first deviation information, the first acquisition interval, and the moving distance, and determine the second height change information based on the second deviation information, the second acquisition interval, and the moving distance, and fuse the first height change information and the second height change information to obtain the surface profile acquisition result, so that the flatness information and levelness information of the entire inspected surface can be conveniently obtained with higher accuracy.

Description

Technical Field

[0001] The present application relates to the field of surface profile acquisition, and in particular to a surface profile acquisition method and device. Background Art

[0002] The flatness of a plane or elevation is a key indicator for assessing building quality. In the construction industry, flatness not only significantly impacts floor installation but also the building's service life. It also plays a crucial role in other fields, including warehousing, road transportation, rail transportation, and aerospace.

[0003] When testing the flatness of a plane or elevation, a straightedge method is typically used to obtain flatness data for the surface being tested (plane or elevation). This method involves placing a straightedge against the surface being tested, inserting a wedge-shaped feeler gauge into the gap, and reading the ground flatness data based on the degree of insertion. This method is inefficient, susceptible to interference from human readings, and lacks accuracy. Furthermore, it is not conducive to obtaining continuous flatness data for the surface being tested. Summary of the Invention

[0004] In view of this, the embodiments of the present application provide a surface profile acquisition device and method to solve the problems in the prior art of flatness measurement, such as low detection efficiency, susceptibility to interference from human readings, low accuracy, and difficulty in obtaining continuous flatness related data.

[0005] A first aspect of an embodiment of the present application provides a surface profile acquisition device, the surface profile acquisition device comprising a first wheel group, a second wheel group, a first deviation detection device, a second deviation detection device, a distance detection device, and a controller;

[0006] The first wheel set and the second wheel set are used to contact the detected surface respectively, the first deviation detection device is used to detect first deviation information of the first wheel set, and the second deviation detection device is used to detect second deviation information of the second wheel set;

[0007] The distance detection device is used to detect the moving distance of the surface profile acquisition device;

[0008] The controller is used to determine a first surface contour curve of the inspected surface based on first deviation information of the first wheel group, determine a second surface contour curve of the inspected surface based on second deviation information of the second wheel group, and fuse the first surface contour curve and the second surface contour curve to obtain a surface contour acquisition result, wherein the intervals between surface contour acquisition points of the first surface contour curve and the second surface contour curve are different.

[0009] In combination with the first aspect, in a first possible implementation of the first aspect, the first wheel group includes a first wheel and a second wheel for contacting the detected surface, the first wheel group is connected by a first connecting rod, the second wheel group includes a third wheel and a fourth wheel for contacting the detected surface, the second wheel group is connected by a second connecting rod, the interval of the surface contour collection points of the first surface contour curve is the first collection interval between the first wheel and the second wheel, the interval of the surface contour collection points of the second surface contour curve is the second collection interval between the third wheel and the fourth wheel, and the first collection interval is greater than the second collection interval.

[0010] In combination with the first aspect, in a second possible implementation of the first aspect, the first wheel group includes a first wheel and a second wheel for contacting the detected surface, the first wheel and the second wheel are connected by a first connecting rod, the second wheel group includes a second wheel and a third wheel for contacting the detected surface, the second wheel and the third wheel are connected by a second connecting rod, the interval of the surface contour collection points of the first surface contour curve is the first collection interval between the first wheel and the second wheel, the interval of the surface contour collection points of the second surface contour curve is the third collection interval between the second wheel and the third wheel, and the first collection interval is greater than the third collection interval.

[0011] In combination with the first aspect, in a third possible implementation of the first aspect, the first wheel group includes a first wheel and a second wheel, the second wheel group includes a second wheel, the second deviation detection device includes a distance sensor, the first wheel and the second wheel are connected by a first connecting rod, the interval of the surface contour collection points of the first surface contour curve is the first collection interval between the first wheel and the second wheel, the interval of the surface contour collection points of the second surface contour curve is the fourth collection interval between the second wheel and the distance sensor, and the first collection interval is greater than the fourth collection interval.

[0012] In combination with the third possible implementation manner of the first aspect, in a fourth possible implementation manner of the first aspect, the distance sensor is provided on the first connecting rod;

[0013] Alternatively, the second wheel group includes a second wheel and a third wheel, the second wheel and the third wheel are connected by a second connecting rod, the second connecting rod is equipped with a second deviation detection device, the second deviation detection device includes an angle sensor and a distance sensor, the distance sensor is used to detect the distance between the distance sensor and the ground, and the angle sensor is used to detect the inclination angle of the second connecting rod.

[0014] In combination with the first aspect or the first possible implementation of the first aspect, in a fifth possible implementation of the first aspect, the surface contour acquisition device further includes a marking device, the controller is used to determine the raised positions and / or recessed positions that meet preset requirements based on the determined surface contour acquisition results, and the marking device is used to mark the raised positions and recessed positions.

[0015] In combination with the fifth possible implementation of the first aspect, in the sixth possible implementation of the first aspect, the surface contour acquisition device also includes a ground anomaly detection device, and the controller is used to control the ground anomaly detection device to perform anomaly detection on the raised position and / or recessed position after detecting the raised position and / or recessed position.

[0016] In combination with the first aspect, in a seventh possible implementation of the first aspect, the surface contour acquisition device further includes a mapping device, and the controller is used to obtain scene information of the detected surface through the mapping device, generate a scene map based on the scene information, and generate a contour map based on the surface contour acquisition result and the scene map.

[0017] A second aspect of the embodiments of the present application provides a surface profile acquisition method, the surface profile acquisition method being based on the surface profile acquisition device according to any one of the first aspects, the method comprising:

[0018] obtaining first deviation information of the first wheel group through the deviation detection device, and obtaining second deviation information of the second wheel group;

[0019] Determine a first relative height at a position corresponding to the first collection interval of the first wheel group according to the first collection interval of the first wheel group and the first deviation information, and determine a second relative height at a position corresponding to the second collection interval of the second wheel group according to the second collection interval of the second wheel group and the second deviation information;

[0020] Obtaining a first surface profile curve based on the moving distance determined by the distance detection device and the first relative height, and obtaining a second surface profile curve based on the moving distance and the second relative height;

[0021] The first surface profile curve and the second surface profile curve are fused to obtain a surface profile acquisition result.

[0022] In conjunction with the second aspect, in a first possible implementation of the second aspect, obtaining the first surface profile curve according to the moving distance determined by the distance detection device and the first relative height includes:

[0023] Determine, based on the first relative heights of the i-th position and the i+1-th position collected by the first wheel group and in combination with the first collection interval, an i-th line segment between the i-th position and the i+1-th position;

[0024] determining, based on the movement distance, when the first wheel group of the surface profile acquisition device acquires the i+1th position and the i+2th position, updating a first relative height, determining, based on the first relative height, an i+1th line segment between the i+1th position and the i+2th position, and obtaining the first surface profile curve by connecting multiple line segments determined by multiple movements;

[0025] Obtaining a second surface profile curve according to the moving distance, the second collection interval, and the second relative height, including:

[0026] determining a jth line segment between the jth position and the j+1th position according to the second relative heights of the jth position and the j+1th position collected by the second wheel group and in combination with the second collection interval;

[0027] According to the movement distance, it is determined that when the third wheel group of the surface profile acquisition device moves to collect the j+1th position and the j+2th position, the second relative height is updated, and the j+1th line segment between the j+1th position and the j+2th position is determined according to the second relative height. The second surface profile curve is obtained by connecting multiple line segments determined by multiple movements, where i and j are natural numbers.

[0028] A third aspect of the embodiments of the present application provides a surface profile acquisition device, wherein the surface profile acquisition device is based on the surface profile acquisition device according to any one of the first aspects, and the device comprises:

[0029] an information acquiring unit, configured to acquire first deviation information of the first wheel set and second deviation information of the second wheel set through the deviation detecting device;

[0030] a relative height determining unit, configured to determine a first relative height at a position corresponding to the first collection interval of the first wheel group based on the first collection interval of the first wheel group and the first deviation information, and to determine a second relative height at a position corresponding to the second collection interval of the second wheel group based on the second collection interval of the second wheel group and the second deviation information;

[0031] a curve determining unit, configured to obtain a first surface profile curve based on the moving distance determined by the distance detecting device and the first relative height, and to obtain a second surface profile curve based on the moving distance and the second relative height;

[0032] The fusion unit is used to fuse the first surface contour curve and the second surface contour curve to obtain a surface contour acquisition result.

[0033] The fourth aspect of an embodiment of the present application provides a detection device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the steps of the method described in any one of the second aspects are implemented.

[0034] A fifth aspect of an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the method described in any one of the first aspects are implemented.

[0035] Compared with the prior art, the embodiments of the present application have the following beneficial effects: the embodiments of the present application respectively contact the inspected surface through the first wheel group and the second wheel group, obtain the deviation information of the first wheel group and the second wheel group during the movement through the deviation detection device, detect the moving distance of the first wheel group and the second wheel group during the movement through the distance detection device, determine the first height change information with a longer single detection distance during the movement according to the first deviation information and the moving distance, and compared with the detection method with more times of detection, since the height change information can be detected with fewer times, its accuracy is higher, and the second height information with a shorter single detection distance during the movement is determined according to the second deviation information, the second acquisition interval and the moving distance, and since the first height change information fails to detect the local height change, the local height change information detected by the second height information is more accurate, and by fusing the first height information and the second height information, the flatness information and levelness information of the entire inspected surface with higher accuracy can be efficiently obtained. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments or descriptions of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0037] Figure 1 is a schematic diagram of a surface profile acquisition device provided in an embodiment of the present application;

[0038] Figure 2 is a schematic diagram of another surface profile acquisition device provided in an embodiment of the present application;

[0039] Figure 3 is a schematic diagram of another surface profile acquisition device provided in an embodiment of the present application;

[0040] Figure 4 is a schematic diagram of another surface profile acquisition device provided in an embodiment of the present application;

[0041] Figure 5 is a schematic diagram of another surface profile acquisition device provided in an embodiment of the present application;

[0042] Figure 6 This is a schematic diagram of another surface profile acquisition device provided in an embodiment of the present application;

[0043] Figure 7 A schematic diagram of surface contour curve fusion provided in an embodiment of the present application;

[0044] Figure 8 This is a schematic diagram of the implementation process of a surface profile acquisition method provided in an embodiment of the present application;

[0045] Figure 9 is a schematic diagram of a surface profile acquisition device provided in an embodiment of the present application;

[0046] Figure 10 This is a schematic diagram of a detection device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0047] In the following description, specific details such as specific system structures and techniques are provided for purposes of illustration rather than limitation to facilitate a thorough understanding of the embodiments of the present application. However, it will be apparent to those skilled in the art that the present application may be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to avoid obscuring the description of the present application with unnecessary detail.

[0048] In order to illustrate the technical solution described in this application, specific embodiments are provided below.

[0049] The flatness of a plane or facade is an important indicator for evaluating building quality and has important application value in the field of construction. For example:

[0050] In the field of precision manufacturing, excellent ground flatness can effectively reduce equipment tilt or shaking, improve the accuracy of detection data, enhance the stability of equipment operation, reduce equipment wear, improve production efficiency and improve product quality.

[0051] In the field of smart warehousing, ground flatness can effectively reduce the difficulty of operating robots or forklifts and improve the production efficiency and reliability of smart warehousing.

[0052] In the field of transportation, excellent ground flatness can improve the driving quality index, enhance driving safety and driving ability, increase the service life of the road surface, and reduce noise and vibration during vehicle driving.

[0053] In the field of ground rail transit, excellent ground flatness can increase the stability of the track structure, reduce wheel-rail wear, reduce resistance and vibration, reduce maintenance costs, and make rail transit riding more comfortable.

[0054] Because surface profile acquisition is crucial, accurate and reliable surface profile acquisition is required for both planes and facades. Traditional testing methods typically use a straightedge. This involves placing the straightedge against the surface being tested, inserting a wedge-shaped feeler gauge into the gap, and reading the surface flatness data based on the degree of insertion. This method is inefficient, susceptible to interference from human readings, and lacks accuracy. Furthermore, it hinders the acquisition of continuous flatness data for the surface being tested.

[0055] In order to improve the surface profile acquisition accuracy and detection convenience, the present application embodiment proposes a surface profile acquisition device, such as Figure 1 As shown, the device includes a first wheel group 101, a second wheel group 102, a deviation detection device 103 including a first deviation detection device 1031, a second deviation detection device 1032, a distance detection device 104 and a controller 105;

[0056] The first wheel set 101 and the second wheel set 102 are used to contact the detected surface respectively, the first deviation detection device is used to detect first deviation information of the first wheel set 101, and the second deviation detection device is used to detect second deviation information of the second wheel set 102;

[0057] The distance detection device 104 is used to detect the moving distance of the surface profile acquisition device;

[0058] The controller 105 is used to determine a first surface contour curve of the inspected surface based on the first deviation information of the first wheel set 101, determine a second surface contour curve of the inspected surface based on the second deviation information of the second wheel set 102, and fuse the first surface contour curve and the second surface contour curve to obtain a surface contour acquisition result, wherein the intervals between the surface contour acquisition points of the first surface contour curve and the second surface contour curve are different.

[0059] In a specific implementation, Figure 1 As shown, the first wheel set 101 includes a first wheel 1011 and a second wheel 1012 for contacting the detected surface, and the second wheel set 102 includes a third wheel 1021 and a fourth wheel 1022 for contacting the detected surface.

[0060] The interval between the first round 1011 and the second round 1012 is the first collection interval. That is, when collecting ground profile information, height information is collected according to the first collection interval between the first round 1011 and the second round 1012. The interval between the third round 1021 and the fourth round 1022 is the second collection interval. That is, when collecting ground profile information, height information is collected according to the second collection interval between the third round 1021 and the fourth round 1022. The first collection interval is greater than the second collection interval, allowing the surface profile collection device to collect surface profile curves with different precision characteristics, including surface profile curves with high long-range single-point positioning accuracy and surface profile curves with high local positioning accuracy, so as to facilitate fusion to obtain a surface profile curve with higher overall precision.

[0061] Among them, when the first wheel group 101 and the second wheel group 102 are used to contact the detected surface respectively, Figure 1 As shown, the first wheel assembly 101 and the second wheel assembly 102 can be two independently structured wheel assemblies on the surface profile acquisition device. The first wheel 1011 and the second wheel 1012 in the first wheel assembly 101 are connected by a first connecting rod, and the third wheel 1021 and the fourth wheel 1022 in the second wheel assembly 102 are connected by a second connecting rod. The first connecting rod and the second connecting rod move relatively independently, that is, the first connecting rod tilts and deflects based on the height information of the first wheel 1011 and the second wheel 1012, and the second connecting rod tilts and deflects based on the height information of the third wheel 1021 and the fourth wheel 1022. The first wheel assembly 101 can be used to support the surface profile acquisition device body, and the second wheel assembly 102 can be connected to the surface profile acquisition device body or to the first wheel assembly 101 via a movable connection, so that the distance between the second wheel assembly and the first wheel assembly is constant. The second wheel assembly 102 can collect height change information at this constant distance.

[0062] After the first wheel 1011 and the second wheel 1012 are connected by the first connecting rod, the height of the first wheel 1011 and the second wheel 1012 are different (when the detected surface is the ground or ceiling, it presents a change in height; when the detected surface is a wall, it presents a displacement relative to the vertical plane. This application uses ground detection as an example for illustration). This will cause the inclination angle of the first connecting rod connecting the first wheel 1011 and the second wheel 1012 to change. The first deviation information of the first connecting rod can be detected by the first deviation detection device in the deviation detection device 103. Similarly, after the third wheel 1021 and the fourth wheel 1022 are connected by the second connecting rod, the second deviation information of the second connecting rod can be detected by the second deviation detection device in the deviation detection device 103.

[0063] The first deviation detection device and the second deviation detection device may be angle sensors. Figure 1As shown, both the first and second deviation detection devices are angle sensors that can detect the angle θ between the first or second connecting rod and the horizontal plane, i.e., the first deviation information. Assuming that, with the first wheel 1011 as a reference, when the second wheel 1012 is higher than the first wheel 1011, the first connecting rod is tilted to the left. The angle detected by the angle sensor is the first deviation information. The sign of the first deviation information can be determined by the height of the second wheel 1012 relative to the first wheel 1011. For example, when the second wheel 1012 is higher than the first wheel 1011, i.e., the first connecting rod is tilted to the left, the first deviation information is a positive angle; when the second wheel 1012 is lower than the first wheel 1011, i.e., the first connecting rod is tilted to the right, the first deviation information is a negative angle.

[0064] The same deviation information detection method can also be applied to the second wheel assembly 102. Specifically, the second deviation detection device can detect the height of the fourth wheel 1021 relative to the third wheel 1011 to determine the sign of the second deviation angle. For example, when the fourth wheel 1022 is higher than the third wheel 1021, that is, the second connecting rod is tilted to the left, the second deviation information will be a positive angle; when the fourth wheel 1022 is lower than the third wheel 1021, that is, the second connecting rod is tilted to the right, the second deviation information will be a negative angle.

[0065] It is understood that the number of deviation detection devices used in the first wheel group 101 and the second wheel group 102 in the embodiments of the present application is not limited, and the first wheel group or the second wheel group can simultaneously use more than two deviation detection devices. The order of the first wheel 1011, the second wheel 1012, the third wheel 1021, and the fourth wheel 1022 can be the first wheel 1011, the second wheel 1012, the third wheel 1021, and the fourth wheel 1022, or the first wheel 1011, the third wheel 1021, the second wheel 1012, and the fourth wheel 1022. After determining the order of the wheels, it is necessary to determine the first collection interval of the first wheel group 101, the second collection interval of the second wheel group 102, and the distance between the wheels in the first wheel group 101 and the wheels in the second wheel group 102, so as to determine the position of the wheels in the second wheel group 102 relative to the wheels in the first wheel group 101. The wheels in the second wheel group 102 can be moved to the position where the deviation information was previously collected by the first wheel group 101, or to a position near the position where the deviation information was previously collected by the wheels in the first wheel group 101.

[0066] In possible implementations, such as Figure 2As shown, the first wheel group 101 includes a first wheel 1011 and a second wheel 1012 for contacting the detected surface, and the first wheel group 101 is connected by a first connecting rod. The second wheel group 102 includes a second wheel 1012 and a third wheel 1021 for contacting the detected surface, and the second wheel 1012 and the third wheel 1021 are connected by a second connecting rod. The interval of the surface contour collection points of the first surface contour curve is the first collection interval between the first wheel 1011 and the second wheel 1012, and the interval of the surface contour collection points of the second surface contour curve is the third collection interval between the second wheel 1012 and the third wheel 1021. The first collection interval is greater than the third collection interval.

[0067] When detecting the height relationship between the first wheel 1011 and the second wheel 1012 in the first wheel assembly 101, an angle sensor provided on the first connecting rod, i.e., a first deviation detection device, can be used to detect the tilt deviation of the first connecting rod. When detecting the height relationship between the second wheel 1012 and the third wheel 1021, an angle sensor provided on the second connecting rod, i.e., a second deviation detection device, can be used to detect the tilt deviation of the second connecting rod. After the deviation detection device (including the first deviation detection device and the second deviation detection device) detects the deviation angles (the first deviation angle and the second deviation angle, respectively), the relative height of the first wheel assembly 101 can be calculated based on the first collection interval and the first deviation angle. For example, if the first collection interval is L1 and the first deviation angle is θ1, the relative height of the first wheel assembly 101 is: L1*θ1. Correspondingly, if the second collection interval is L2 and the second deviation angle is θ2, the relative height of the second wheel assembly 102 is: L2*θ2. Among them, the line segment determined by the front wheel in the wheel group (the first wheel group and the second wheel group) relative to the rear wheel can be determined according to the moving direction, and the angle relative to the horizontal plane where the rear wheel is located can be determined. If the line segment is upward, the angle is positive, and if the line segment is downward, the angle is negative. The relative height of the front wheel relative to the rear wheel can be calculated.

[0068] The first wheel set 101 can be used to support the body of the surface profile acquisition device.

[0069] The second connecting rod can rotate around the axis of the second wheel 1012. The third wheel 1021 can rotate at different angles depending on the height and other profile information relative to the detected surface. The third wheel 1021 can be located between the first and second wheels, or outside the range between the first and second wheels.

[0070] In a possible implementation, the relative height information of the third wheel 1021 can be detected by a distance sensor. Figure 3As shown, a distance sensor 1031 can be installed on the first connecting rod at a position corresponding to the third wheel 1021 to detect the distance between the detection plane of the third wheel 1021 and the distance sensor 1031. When the third wheel 1021 is located between the first wheel 1011 and the second wheel 1012, the distance sensor 1031 is installed on the first connecting rod and located between the first wheel 1011 and the second wheel 1012. When the third wheel 1021 is located outside the range between the first wheel 1011 and the second wheel 1012, the first connecting rod can be extended to the position corresponding to the third wheel 1021, and the distance sensor 1031 can be installed at this corresponding position. The distance between the distance sensor 1031 and the second wheel 1012, or the distance between the distance sensor 1031 and the first wheel 1011, is the fourth acquisition interval.

[0071] By arranging the distance sensor 1031 on the first connecting rod, or arranging the distance sensor 1031 on the extension rod of the first connecting rod, since the deviation of the first connecting rod can be detected by the first deviation detection device, such as the angle deviation of the first connecting rod through the angle sensor 1031, according to the angle deviation, combined with the distance between the distance sensor 1031 and the second wheel 1012 or the first wheel 1011, the relative height H1 of the distance sensor 1031 relative to the second wheel 1012 or the first wheel 1011 can be calculated, wherein when the third wheel 1021 is higher than the second wheel 1012 or the first wheel 1011, the relative height is a positive value, otherwise it is a negative value.

[0072] When the distance detected by distance sensor 1031 is H2 (a positive value), the height of the third wheel relative to the second wheel or the first wheel can be calculated as H3 + H1 - H2, combined with the pre-calibrated standard distance H3 (a positive value). The standard distance refers to the distance detected by distance sensor 1031 when the third wheel 1021, the second wheel 1012, and the first wheel 1011 are on the same horizontal plane.

[0073] In a possible implementation, the distance sensor 1031 can directly detect the distance between the ground and the distance sensor. Figure 4 As shown, at the location where distance sensor 1031 is positioned, distance sensor 1031 can directly detect the distance between the ground and distance sensor 1031. In this case, the surface profile acquisition device only includes two support wheels (first wheel 1011 and second wheel 1012). Since distance sensor 1031 is positioned on the first connecting rod, or on an extension of the first connecting rod, the first deviation detection device can detect the deviation angle between the first connecting rod and the horizontal plane to determine the change in distance sensor 1031 relative to the standard position. Combined with the collected distance, the relative height of the corresponding position of distance sensor 1031 relative to second wheel 1012 or first wheel 1011 can be obtained.

[0074] In possible implementations, such as Figure 5 As shown, the first wheel assembly 101 includes a first wheel 1011 and a second wheel 1012, which are used to support the surface profile acquisition device body. The surface profile acquisition device body can be considered the first connecting rod. The second wheel assembly 102 includes a third wheel 1021 and a fourth wheel 1022. The third wheel 1021 is connected to the second wheel 1012 via the second connecting rod, and the fourth wheel 1022 is connected to the second wheel 1012 via the third connecting rod. Both the second and third connecting rods can rotate around the second wheel 1012, and the wheels of each wheel assembly are subject to gravity or elastic force and contact the surface being inspected. A distance sensor 1031 is disposed on the second connecting rod, or on an extension of the second connecting rod, corresponding to the position of the fourth wheel 1022, and is used to detect the height of the fourth wheel 1022 relative to the third wheel 1021. An angle sensor 1032 may be provided on the second link to detect changes in the angle of the second link relative to the horizontal plane. Combined with the distance between the second wheel 1021 on the second link and the distance sensor 1031, the height of the distance sensor 1031 relative to the second wheel 1012 is determined. Combined with the distance detected by the distance sensor and the standard distance detected by the distance sensor, the height of the fourth wheel relative to the second wheel is obtained. Combined with the fourth acquisition interval of the fourth wheel 1022 relative to the second wheel 1012, that is, the fourth acquisition interval of the distance sensor 1031 relative to the second wheel 1012, a line segment determined by the two positions of the second wheel 1012 to the fourth wheel 1022 is determined, and a second surface contour curve is generated through multiple line segments.

[0075] It is understandable that the distance sensor can directly detect the distance between the ground and the distance sensor. Figure 6 As shown, the third wheel 1021 is connected to the second wheel 1012 via a second connecting rod, and a distance sensor 1031 is provided on the second connecting rod. The angle sensor 1032 detects the angular deviation of the second connecting rod from the horizontal plane. Combined with the distance between the distance sensor 1031 and the second wheel 1012, the deviation of the distance sensor 1031 from the standard position can be determined. Combined with the distance detected by the distance sensor and the standard distance detected by the distance sensor, the height of the detected point at the corresponding position of the distance sensor relative to the second wheel 1012 can be determined.

[0076] In a possible implementation, of the two wheel groups included in the surface profile acquisition device, the first acquisition interval of the first wheel group can be an integer multiple of the third acquisition interval or the fourth acquisition interval, so that during the movement of the surface profile acquisition device, the relative height acquisition point of the second wheel group and the relative position acquisition point of the first wheel group can coincide as much as possible. Figure 1In the structure shown, the interval between the second wheel 1012 and the third wheel 1021 can be the same as the second collection interval, and the first collection interval is an integer multiple of the second collection interval, so that when the surface profile collection device moves, the relative height collection point of the second wheel group and the relative position collection point of the first wheel group can overlap as much as possible.

[0077] In a possible implementation, the first collection interval may also be a non-integer of the second collection interval. In this case, the collection points of the second wheel group may not overlap with the collection points of the first wheel group. In this case, the relative heights collected by the second wheel group can be interpolated to determine the height of the second wheel group at the collection point of the first wheel group. For example Figure 1 In the illustrated surface profile acquisition device, the first wheel 1011 of the first wheel assembly 101 is located at point A, the second wheel 1012 is located at point B, the third wheel 1021 is located at point C, and the fourth wheel 1022 is located at point D. The height d1 of point A relative to the reference point B is obtained using the first acquisition interval and first deviation information, while the height d2 of point C relative to point D is obtained using the second acquisition interval and second deviation information. When the surface profile acquisition device moves a first distance (the distance between the third and second wheels), the third wheel 1021 moves to point B. Since the first distance is the same as the second acquisition interval, the fourth wheel 1022 now moves to point C. The second acquisition interval and second deviation information can be used to obtain the height d3 of point B relative to point C. The device then moves N times (N is a multiple of the first acquisition interval relative to the second acquisition interval) the first distance to acquire N heights of the third wheel 1021 relative to the fourth wheel 1022. These N straight lines, which determine the relative heights, can be connected to obtain a portion of the second surface profile curve.

[0078] In this case, the first wheel group can determine the height d1 of point A relative to point B through a single relative height calculation, and obtain the height d1' of point A relative to point B through N calculations. Since the first wheel group can determine the height of point A relative to point B with a single calculation, the cumulative attenuation is less. Therefore, the accuracy of the height of point B relative to point A determined by the first wheel group is higher than that determined by the second wheel group. However, in the first surface profile curve determined by the first wheel group, the surface profile changes in the area between the acquisition points can only be determined through linear interpolation, and the profile accuracy between the acquisition points needs to be further improved. In contrast, the second wheel group includes multiple acquisition points between the acquisition points of the first wheel group, for example, N acquisition points (N is a natural number greater than 0). Therefore, the surface profile curve determined by the second wheel group is more accurate between the acquisition points of the first wheel group. The advantages of the first and second surface profile curves can be combined through fusion, resulting in a more accurate surface profile acquisition result after fusion.

[0079] For example, the first acquisition interval can be 60 cm, and the second acquisition interval can be 10 cm. The present invention is not limited thereto. A smaller second acquisition interval can result in higher accuracy in the detected local flatness. Therefore, the first height change line segment determined by the first acquisition interval is used to reflect height change information at two locations within a 60 cm interval, and the first height change sub-line segment determined by the second acquisition interval is used to reflect height change information at two locations within a 10 cm interval.

[0080] Combine Figure 1 After the surface profile acquisition device is initially acquired and relative heights are obtained, the device is moved so that the fourth wheel 1022 is moved to position B. At this point, the third wheel 1021 is moved to a position 10 centimeters in front of position B. The second deviation detection device in the deviation detection device can then determine the first height variation sub-segment. By continuing this movement, N = 6 height variation sub-segments can be acquired within the first height variation segment. For example, if the first acquisition interval from A to B is 60 centimeters and the distance from C to D is 10 centimeters, then the first height variation segment can include six height variation sub-segments. Because the second deviation detection device performs iterative calculations, the accuracy of the height of point A relative to point B determined using these six height variation sub-segments is lower than that determined using a single calculation. Therefore, the height of point A relative to point B determined using a single comparison, namely, the height determined using the first height variation segment, can be used to correct the height determined by the second deviation detection device. At the same time, the first height change line segment determined by A and B alone cannot reflect more specific height change information between A and B. Multiple height change sub-segments determined by multiple second deviation detection devices, such as Figure 7 The six height change sub-segments shown more accurately describe the flatness and levelness information of the detected surface.

[0081] In the same manner as the first height change line segment, the surface profile acquisition device can be moved to obtain Figure 7 The first number of height-varying line segments shown can be used to obtain a second number of height-varying sub-line segments during movement by the second deviation detection device. For example, if the first acquisition interval is N times the second acquisition interval, the second number can be N times the first number.

[0082] If the first acquisition interval and the second acquisition interval are not integer multiples, the height of the height-varying sub-segment in the second height-varying segment that includes the first endpoint position may be corrected based on the first endpoint position of the height-varying segment to complete the correction of the second height-varying segment. The first endpoint position is the endpoint of any one of the multiple height-varying segments acquired by the first deviation detection device.

[0083] A plurality of first deviation information can be determined by the first deviation detection device. According to the first acquisition interval, a plurality of height change line segments can be determined in combination with the plurality of first deviation information. A first surface contour curve can be obtained according to the plurality of height change line segments.

[0084] A plurality of second deviation information can be determined by the second deviation detection device. According to the second acquisition interval, a plurality of height change sub-segments can be determined in combination with the plurality of second deviation information. A second surface contour curve can be obtained according to the plurality of height change sub-segments.

[0085] When the first smoothness curve and the second smoothness curve are merged, the position in the second smoothness curve that is the same as the endpoint of the line segment in the first smoothness curve can be corrected based on the fact that the height information of the endpoint of the line segment in the first smoothness curve is more accurate, or the height of the height-changing sub-segment including the line segment endpoint can be corrected to improve the accuracy of the second smoothness curve determined by the height-changing sub-segment.

[0086] In a possible implementation, in order to ensure that the wheels can reliably contact the detected surface, an elastic mechanism can be set to ensure that the wheels, including the first wheel and the second wheel, can reliably contact the detected surface.

[0087] In a possible implementation, the surface profile acquisition device in the embodiment of the present application may further include a marking device. A marking threshold may be pre-set. After the detection result obtained by fusing the first flatness curve and the second flatness curve, the detection result may be compared with the marking threshold. The marking threshold may include a convexity threshold and a concave threshold. If the height of the detected surface is lower than the concave threshold, the marking device may mark it as a concave position. If the height of the detected surface is higher than the convexity threshold, the marking device may mark it as a convex position.

[0088] In order to improve the convenience of detection, the embodiment of the present application can also detect abnormalities in the concave and convex positions after marking. The abnormality detection device can include equipment such as a hollow detection device to determine the specific cause of the abnormality, making it easier for staff to investigate the abnormality.

[0089] In a possible implementation, after determining the surface contour acquisition result of the inspected surface, the surface contour acquisition device in the embodiment of the present application can generate a scene map based on the surface contour acquisition result of the inspected surface in combination with the scene information obtained by the mapping device, and add flatness information and levelness information to the scene map to obtain a scene map of the inspected surface including flatness information and levelness information, such as a scene map including contour line information.

[0090] Figure 8This is a flow chart of an implementation method of a surface profile acquisition method provided in an embodiment of the present application. The method is based on the above-mentioned surface profile acquisition device and includes:

[0091] In S801, first deviation information of the first wheel set is acquired through the deviation detection device, and second deviation information of the second wheel set is acquired.

[0092] The deviation detection device may include sensing devices such as an angle sensor and a distance sensor. The first and second wheels in the first wheel set are connected by a first connecting rod, and the second and third wheels in the second wheel set are connected by a second connecting rod. The angle sensor or distance sensor can be used to determine the deviation between the first and second connecting rods and a horizontal plane. This deviation can be expressed as an angle or as the distance between the second end of the first or second connecting rod and the horizontal plane determined by the first end of the first or second connecting rod.

[0093] In S802, a first relative height of a position corresponding to the first collection interval of the first wheel group is determined based on the first collection interval of the first wheel group and the first deviation information, and a second relative height of a position corresponding to the second collection interval of the second wheel group is determined based on the second collection interval of the second wheel group and the second deviation information.

[0094] According to the first collection interval of the first wheel group and the first deviation information, the first relative height of the wheels in the first wheel group is determined, and according to the second collection interval of the second wheel group and the second deviation information, the second relative height of the wheels in the second wheel group is determined.

[0095] For example, when the first deviation information or the second deviation information is the angular deviation between the connecting rod (the first connecting rod or the second connecting rod) and the horizontal plane, the scheduling deviation in the first wheel group or the second wheel group, that is, the relative height, can be determined by the first collection interval and angle.

[0096] In S803 , a first surface profile curve is obtained according to the moving distance determined by the distance detection device and the first relative height, and a second surface profile curve is obtained according to the moving distance and the second relative height.

[0097] By repeatedly measuring the first deviation information of the first wheel assembly, multiple height variation line segments can be obtained. These multiple height variation line segments can be used to generate a first surface profile curve with high positioning accuracy for the endpoints of the height variation line segments and low positioning accuracy between the endpoints. By repeatedly measuring the second deviation information of the second wheel assembly, multiple height variation sub-line segments can be generated with high relative height detail accuracy between the endpoints of the height variation line segments, but with accumulated relative errors. These multiple height variation sub-line segments are then used to determine a second flatness curve.

[0098] The method of obtaining the first surface profile curve according to the moving distance, the first collection interval, and the first relative height determined by the distance detection device may include:

[0099] At a first time T1, the first wheel of the first wheel group is at the i-th position, the second wheel is at the i+1-th position, and the relative height of the two wheels in the first wheel group is h1. Based on the relative height h1 and a first acquisition interval d1 between the first wheel and the second wheel, an i-th height change line segment between the i-th position and the i+1-th position is determined;

[0100] As the surface profile acquisition device moves, the first wheel of the surface profile acquisition device moves to the i+1th position. At this point, the second wheel moves to the i+2th position. The first deviation detection device can determine the relative height h2 between the i+1th position and the i+2th position. Based on the relative height h2 and the first acquisition interval, the i+1th height change line segment between the i+1th position and the i+2th position can be determined. Multiple height change line segments are obtained through multiple movements. By connecting the multiple height change line segments determined through the multiple movements, a first surface profile curve can be obtained.

[0101] A second surface profile curve is obtained according to the moving distance, the second collection interval, and the second relative height, including:

[0102] At a certain sampling moment, the third wheel of the second wheel group is determined to be at the jth position, and the fourth wheel is at the j+1th position. The second deviation detection device can detect the relative height h3 of the wheel at the j+1th position relative to the jth position. Combined with the second sampling interval between the third wheel and the fourth wheel, the jth height change sub-segment between the jth position and the j+1th position can be determined.

[0103] Continue to move the surface profile acquisition device so that the third wheel of the surface profile acquisition device moves to the j+1th position. At this time, the fourth wheel moves to the j+2th position. According to the second deviation detection device and the second acquisition interval, the j+1th height change sub-segment between the j+1th position and the j+2th position is determined. By connecting multiple height change sub-segments determined by multiple movements, a second surface profile curve is obtained, where i and j are natural numbers.

[0104] In S804, the first surface profile curve and the second surface profile curve are fused to obtain a surface profile acquisition result.

[0105] Since the first smoothness curve has the characteristics of high positioning accuracy of the endpoints of the height-changing line segments and low positioning accuracy between the endpoints, and the second smoothness curve has the characteristics of high relative height information accuracy between the endpoints of the height-changing line segments but accumulates relative errors, the first smoothness curve and the second smoothness curve can be fused to obtain a fused curve with higher accuracy.

[0106] This embodiment of the present application combines the advantages of the relatively high positioning accuracy of the endpoints of line segments in the second smoothness curve with the relatively high positioning accuracy of the endpoints of height-varying line segments in the first smoothness curve to produce a more accurate surface profile acquisition result. Furthermore, detection can be completed by simply pushing or automatically moving the surface profile acquisition device, effectively improving detection efficiency and convenience.

[0107] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.

[0108] Figure 9 This is a schematic diagram of a surface profile acquisition device provided in an embodiment of the present application. The surface profile acquisition device is based on the above-mentioned surface profile acquisition device, and the device includes:

[0109] An information acquisition unit 901 is configured to acquire first deviation information of the first wheel set and second deviation information of the second wheel set through the deviation detection device;

[0110] a relative height determining unit 902, configured to determine a first relative height at a position corresponding to the first collection interval of the first wheel group based on the first collection interval of the first wheel group and the first deviation information, and to determine a second relative height at a position corresponding to the second collection interval of the second wheel group based on the second collection interval of the second wheel group and the second deviation information;

[0111] a curve determining unit 903, configured to obtain a first surface profile curve according to the moving distance determined by the distance detecting device and the first relative height, and to obtain a second surface profile curve according to the moving distance and the second relative height;

[0112] The fusion unit 904 is configured to fuse the first surface contour curve and the second surface contour curve to obtain a surface contour acquisition result.

[0113] Figure 9 The surface profile acquisition device shown is Figure 8 The surface profile acquisition method shown corresponds to .

[0114] Figure 10This is a schematic diagram of a detection device provided in an embodiment of the present application. Figure 10 As shown, the detection device 10 of this embodiment includes: a processor 100, a memory 101, and a computer program 102 stored in the memory 101 and executable on the processor 100, such as a surface profile acquisition program. When the processor 100 executes the computer program 102, the steps of the surface profile acquisition method embodiments described above are implemented. Alternatively, when the processor 100 executes the computer program 102, the functions of the modules / units described in the device embodiments described above are implemented.

[0115] Exemplarily, the computer program 102 may be divided into one or more modules / units, which are stored in the memory 101 and executed by the processor 100 to implement the present application. The one or more modules / units may be a series of computer program instruction segments capable of performing specific functions, and the instruction segments are used to describe the execution process of the computer program 102 in the detection device 10.

[0116] The detection device 10 can be a computing device such as a desktop computer, a notebook, a PDA, or a cloud server. The detection device can include, but is not limited to, a processor 100 and a memory 101. Those skilled in the art will understand that Figure 10 It is only an example of a detection device 10 and does not constitute a limitation of the detection device 10. It may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, the detection device may also include input and output devices, network access devices, buses, etc.

[0117] The processor 100 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor.

[0118] Described memory 101 can be the internal storage unit of described testing equipment 10, for example the hard disk or the internal memory of testing equipment 10.Described memory 101 can also be the external storage device of described testing equipment 10, for example the plug-in hard disk that is equipped with on described testing equipment 10, smart memory card (Smart Media Card, SMC), secure digital (Secure Digital, SD) card, flash memory card (Flash Card) etc.Further, described memory 101 can also comprise the internal storage unit of described testing equipment 10 and also comprise external storage device.Described memory 101 is used for storing other programs and data required for described computer program and described testing equipment.Described memory 101 can also be used for temporarily storing the data that has been output or will be output.

[0119] Those skilled in the art can clearly understand that, for the convenience and brevity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In actual applications, the above-mentioned functions can be distributed and completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated into one processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, and will not be repeated here.

[0120] In the above embodiments, the description of each embodiment has its own focus. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant description of other embodiments.

[0121] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0122] In the embodiments provided in this application, it should be understood that the disclosed devices / terminal equipment and methods can be implemented in other ways. For example, the device / terminal equipment embodiments described above are merely illustrative. For example, the division of the modules or units is merely a logical function division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0123] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0124] In addition, the functional units in the various embodiments of the present application may be integrated into a single processing unit, or each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or software functional units.

[0125] If the integrated module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the process in the above-mentioned embodiment method, and can also be completed by hardware related to computer program instructions. The computer program can be stored in a computer-readable storage medium, and when the computer program is executed by the processor, it can implement the steps of the above-mentioned various method embodiments. Wherein, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium. It should be noted that the content contained in the computer-readable medium can be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media do not include electric carrier signals and telecommunication signals.

[0126] The above-described embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present application, and should all be included in the scope of protection of the present application.

Claims

1. A surface profile acquisition device, characterized in that: The surface profile acquisition device includes a first wheel group, a second wheel group, a first deviation detection device, a second deviation detection device, a distance detection device and a controller; The first wheel set and the second wheel set are used to contact a detected surface respectively, the first deviation detection device is used to detect first deviation information of the first wheel set, and the second deviation detection device is used to detect second deviation information of the second wheel set, the first wheel set is connected by a first connecting rod, the first deviation information is the angle between the first connecting rod and a horizontal plane, and the second wheel set is connected by a second connecting rod, the second deviation information is the angular deviation between the second connecting rod and the horizontal plane or the relative height of the wheels in the second wheel set; The distance detection device is used to detect the moving distance of the surface profile acquisition device; The controller is used to determine a first surface contour curve of the inspected surface based on first deviation information of the first wheel group, determine a second surface contour curve of the inspected surface based on second deviation information of the second wheel group, fuse the first surface contour curve and the second surface contour curve to obtain a surface contour acquisition result, and correct the second surface contour curve based on endpoints of a line segment in the first surface contour curve, wherein the intervals between surface contour acquisition points of the first surface contour curve and the second surface contour curve are different, and the intervals between surface contour acquisition points of the first surface contour curve are greater than the intervals between surface contour acquisition points of the second surface contour curve.

2. The surface profile acquisition device according to claim 1, characterized in that: The first wheel group includes a first wheel and a second wheel for contacting the detected surface, the first wheel group is connected by a first connecting rod, the second wheel group includes a third wheel and a fourth wheel for contacting the detected surface, the second wheel group is connected by a second connecting rod, the interval of the surface contour collection points of the first surface contour curve is the first collection interval between the first wheel and the second wheel, the interval of the surface contour collection points of the second surface contour curve is the second collection interval between the third wheel and the fourth wheel, and the first collection interval is greater than the second collection interval.

3. The surface profile acquisition device according to claim 1, characterized in that: The first wheel group includes a first wheel and a second wheel for contacting the detected surface, and the first wheel and the second wheel are connected by a first connecting rod. The second wheel group includes a second wheel and a third wheel for contacting the detected surface, and the second wheel and the third wheel are connected by a second connecting rod. The interval of the surface contour collection points of the first surface contour curve is the first collection interval between the first wheel and the second wheel, and the interval of the surface contour collection points of the second surface contour curve is the third collection interval between the second wheel and the third wheel, and the first collection interval is greater than the third collection interval.

4. The surface profile acquisition device according to claim 1, characterized in that: The first wheel group includes a first wheel and a second wheel, the second wheel group includes a second wheel, the second deviation detection device includes a distance sensor, the first wheel and the second wheel are connected by a first connecting rod, the interval of the surface contour collection points of the first surface contour curve is the first collection interval between the first wheel and the second wheel, the interval of the surface contour collection points of the second surface contour curve is the fourth collection interval between the second wheel and the distance sensor, the first collection interval is greater than the fourth collection interval, the second wheel group includes a second wheel and a third wheel, the second wheel and the third wheel are connected by a second connecting rod, the second connecting rod is equipped with a second deviation detection device, the second deviation detection device includes an angle sensor and a distance sensor, the distance sensor is used to detect the distance between the distance sensor and the ground, and the angle sensor is used to detect the inclination angle of the second connecting rod.

5. The surface profile acquisition device according to claim 1 or 2, characterized in that: The surface profile acquisition device further includes a marking device. The controller is used to determine the raised positions and / or recessed positions that meet preset requirements based on the determined surface profile acquisition results. The marking device is used to mark the raised positions and recessed positions.

6. The surface profile acquisition device according to claim 5, characterized in that: The surface profile acquisition device further includes a ground anomaly detection device, and the controller is configured to control the ground anomaly detection device to perform anomaly detection on the convex position and / or concave position after detecting the convex position and / or concave position.

7. The surface profile acquisition device according to claim 1, characterized in that: The surface contour acquisition device further includes a mapping device, and the controller is configured to acquire scene information of the detected surface through the mapping device, generate a scene map based on the scene information, and generate a contour map based on the surface contour acquisition result and the scene map.

8. A surface profile acquisition method, characterized in that: The surface profile acquisition method is based on the surface profile acquisition device according to any one of claims 1 to 5, and the method comprises: Acquiring first deviation information of the first wheel set and second deviation information of the second wheel set by the deviation detection device, wherein the first wheel set is connected via a first connecting rod, and the first deviation information is the angle between the first connecting rod and a horizontal plane; the second wheel set is connected via a second connecting rod, and the second deviation information is the angular deviation between the second connecting rod and the horizontal plane or the relative height of the wheels in the second wheel set; Determine a first relative height at a position corresponding to the first collection interval of the first wheel group according to the first collection interval of the first wheel group and the first deviation information, and determine a second relative height at a position corresponding to the second collection interval of the second wheel group according to the second collection interval of the second wheel group and the second deviation information; Obtaining a first surface profile curve based on the moving distance determined by the distance detection device and the first relative height, and obtaining a second surface profile curve based on the moving distance and the second relative height; The first surface profile curve and the second surface profile curve are fused to obtain a surface profile acquisition result, and the second surface profile curve is corrected according to the endpoints of the line segments in the first surface profile curve, wherein the intervals between the surface profile acquisition points of the first surface profile curve and the second surface profile curve are different, and the intervals between the surface profile acquisition points of the first surface profile curve are greater than the intervals between the surface profile acquisition points of the second surface profile curve.

9. The method according to claim 8, characterized in that Obtaining a first surface profile curve according to the moving distance determined by the distance detection device and the first relative height includes: Determine, based on the first relative heights of the i-th position and the i+1-th position collected by the first wheel group and in combination with the first collection interval, an i-th line segment between the i-th position and the i+1-th position; determining, based on the movement distance, when the first wheel group of the surface profile acquisition device acquires the i+1th position and the i+2th position, updating a first relative height, determining, based on the first relative height, an i+1th line segment between the i+1th position and the i+2th position, and obtaining the first surface profile curve by connecting multiple line segments determined by multiple movements; Obtaining a second surface profile curve according to the moving distance, the second collection interval, and the second relative height, including: determining a jth line segment between the jth position and the j+1th position according to the second relative heights of the jth position and the j+1th position collected by the second wheel group and in combination with the second collection interval; According to the movement distance, it is determined that when the third wheel group of the surface profile acquisition device moves to collect the j+1th position and the j+2th position, the second relative height is updated, and the j+1th line segment between the j+1th position and the j+2th position is determined according to the second relative height. The second surface profile curve is obtained by connecting multiple line segments determined by multiple movements, where i and j are natural numbers.

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