A DC resistance temperature drift characteristic measurement system based on data visualization

Abstract

The present invention provides a DC resistor temperature drift characteristic measurement system based on data visualization, comprising a measurement circuit, a detection system, a control system, and a visualization system. The measurement circuit is used to measure the temperature drift characteristics of the resistor to be detected, the detection system is used to detect various parameters in the measurement circuit and the control system, the control system is used to control the independent variables of the measurement circuit, and the visualization system is used to analyze and visualize the parameters of each system. The present invention introduces the error caused by the detection end during the analysis phase of the temperature drift characteristic curve, analyzes the error introduced by the temperature difference between the temperature value of the first temperature control box and the detected temperature value of the resistor to be detected, thereby improving the accuracy of the temperature drift characteristic analysis results of the resistor to be detected; at the same time, the introduction of data visualization technology can convert the analysis results into a variety of different forms of charts.

Description

Technical Field

[0001] The present invention relates to the field of circuit element testing, and in particular to a DC resistance temperature drift characteristic measurement system based on data visualization. Background Art

[0002] In an amplifier circuit, any parameter change, such as power supply voltage fluctuations, component aging, and temperature-dependent changes in semiconductor device parameters, will cause output voltage drift. In a direct-coupled amplifier circuit, the drift voltage of the previous stage is transmitted to the next stage along with the useful signal, and is amplified step by step. This makes it difficult to distinguish between the useful signal and the drift voltage at the output. Temperature-induced changes in semiconductor device parameters are the primary cause of zero-point drift, and therefore zero-point drift is also referred to as temperature drift, or simply temperature drift.

[0003] For example, the prior art disclosed in CN113625816A discloses a low temperature drift current generating circuit, which includes a negative temperature coefficient voltage unit, an operational amplifier with a positive temperature coefficient compensation voltage, a current mirror, and a resistor. The first output end of the current mirror is connected to the output end of the negative temperature coefficient voltage unit and to the first input end of the operational amplifier with a positive temperature coefficient compensation voltage. The second output end of the current mirror is connected to one end of the resistor and to the second input end of the operational amplifier with a positive temperature coefficient compensation voltage. The output end of the operational amplifier with a positive temperature coefficient compensation voltage is connected to the input end of the current mirror. The second end of the resistor serves as the output end of the current generating circuit. The current flowing through the resistor is a low temperature drift current, which is output from the output end of the current generating circuit.

[0004] Another typical prior art disclosed in CN213661576U is a temperature drift suppression circuit, which includes: a power amplifier circuit, a comparator A1, an enabling module, and a sampling and correction module. The sampling and correction module includes a sampling module and a correction module.

[0005] Next, let's look at a method for correcting temperature drift of a thermometer thermocouple disclosed in the prior art KR101704222B1, which includes: obtaining an analog voltage of a resistance thermistor in response to a constant current source, converting the obtained analog voltage into data, calculating the temperature difference between each temperature in an RT table depending on the temperature of the thermistor and a set normal temperature, and calculating a correction value by multiplying the calculated temperature difference by a set correction coefficient.

[0006] Although there are many methods for measuring the temperature drift characteristics of resistors in this field, it is often difficult to accurately obtain the temperature drift curve of the resistor, and there is little use of data visualization, and the data expression is not intuitive enough. In order to solve the common problems in this field, the present invention was made. Summary of the Invention

[0007] The purpose of the present invention is to address the current deficiencies and propose a DC resistance temperature drift characteristic measurement system based on data visualization.

[0008] In order to overcome the deficiencies of the prior art, the present invention adopts the following technical solutions:

[0009] A DC resistor temperature drift characteristic measurement system based on data visualization includes a measurement circuit, a detection system, a control system, and a visualization system. The measurement circuit is used to measure the temperature drift characteristics of the resistor to be tested. The detection system is used to detect various parameters in the measurement circuit and the control system. The control system is used to control the independent variables of the measurement circuit. The visualization system is used to analyze and visualize the parameters of each system.

[0010] The visualization system includes a recording module, a data processing module, a chart generating module, a data storage module, a display module and an interactive module; the recording module is in signal communication with the detection system and the measurement circuit, the recording module is used to record the detection data of the detection system and the measurement circuit, the recording module includes a timer, and the timer is used to record time; the data processing module is used to analyze the temperature drift characteristics of the resistor to be detected based on the detection data, and generate a temperature drift characteristic curve of the resistor to be detected; the interactive module is used to receive user instructions; the chart generating module is used to generate corresponding charts based on the user instructions and the processing results of the data processing module; the data storage module is used to store the data in the recording module, the data processing module and the chart generating module; the display module is used to display the generated chart.

[0011] Furthermore, the measurement circuit includes a power supply, a first voltmeter, a second voltmeter, an ammeter, a resistor to be detected, a thermistor and multiple wires; the power supply is used to output direct current of different sizes; the wires are used to connect various circuit elements; the power supply, the resistor to be detected, the ammeter and the thermistor are connected in series in sequence through the wires; the first voltmeter and the resistor to be detected are connected in parallel through the wires to detect the voltage across the resistor to be detected; the second voltmeter and the thermistor are connected in parallel through the wires to detect the voltage across the thermistor; the ammeter is used to detect the current of the circuit, and the thermistor is used to regulate the overall resistance of the circuit.

[0012] Furthermore, the control system includes a first temperature-controlled box and a second temperature-controlled box, the first temperature-controlled box includes a first temperature-controlled component, a first input hole and a first output hole; the first input hole and the first output hole are used to allow the wire to pass through the first temperature-controlled box, the first temperature-controlled box surrounds the resistor to be detected and is in a sealed state, and the first temperature-controlled component is used to set the internal temperature of the first temperature-controlled box; the second temperature-controlled box includes a second temperature-controlled component, a second input hole and a second output hole; the second input hole and the second output hole are used to allow the wire to pass through the second temperature-controlled box, the second temperature-controlled box surrounds the thermistor and is in a sealed state, and the second temperature-controlled component is used to set the internal temperature of the second temperature-controlled box.

[0013] Furthermore, the detection system includes a first detection component, a second detection component, a third detection component, and a fourth detection component; the detection end of the first detection component is attached to the resistor to be detected, and is used to detect the temperature of the resistor to be detected; the second detection component is installed on the inner wall of the first temperature control box, and is used to detect the temperature inside the first temperature control box; the detection end of the third detection component is attached to the thermistor, and is used to detect the temperature of the thermistor; the fourth detection component is installed on the inner wall of the second temperature control box, and is used to detect the temperature inside the second temperature control box.

[0014] Furthermore, the measuring circuit for measuring the temperature drift characteristic of the DC resistance includes the following steps:

[0015] STEP 1, adjust the resistance value of the thermistor;

[0016] STEP 2: Turn on the power supply, the first voltmeter, the second voltmeter, and the ammeter;

[0017] STEP 3: Continue to lower the temperature of the first temperature control box until the value of the first voltmeter drops to the minimum value and remains stable;

[0018] STEP 4: Continue to increase the temperature of the first temperature control box until the current meter value drops to the minimum and remains stable;

[0019] STEP 5: The recording module records the readings of the ammeter, the first voltmeter, the first detection element, and the second detection element during the process from STEP 3 to STEP 4. After recording is completed, the power supply is turned off and the measurement is completed.

[0020] Furthermore, the visualization system analyzes and visualizes the parameters of each system, including the following steps:

[0021] S1, the recording module records the readings of the ammeter, the first voltmeter, the first detection element and the second detection element and the recording time;

[0022] S2, the data processing module analyzes the temperature drift characteristics of the resistor to be detected according to the reading;

[0023] S3, the interaction module receives user instructions;

[0024] S4, the chart generation module selects a suitable chart model according to the user's instructions and displays the curves and processing results generated by the data processing module during the processing process;

[0025] S5, the data storage module saves data;

[0026] S6, the display module displays the generated chart.

[0027] Furthermore, the data processing module analyzes the temperature drift characteristics of the resistor to be detected, including the following steps:

[0028] S21, plotting a current versus time curve, a voltage versus time curve, a temperature variation curve of the resistance to be tested versus time curve, and a temperature variation curve of the first temperature control box versus time curve based on the readings of the ammeter, the first voltmeter, the first detection element, the second detection element, and the timer;

[0029] S22, combining the current versus time curve and the voltage versus time curve by R=U / I to obtain a resistance value versus time curve of the resistor to be detected, where R is the resistance value of the resistor to be detected, U is the reading of the first voltmeter, and I is the reading of the ammeter;

[0030] S23, obtaining a curve of the resistance value of the resistor to be detected varying with the detection temperature based on the curve of the resistance value of the resistor to be detected varying with time and the curve of the detection temperature of the resistor to be detected varying with time; obtaining a curve of the temperature of the resistor to be detected varying with the temperature of the first temperature control box based on the curve of the detection temperature of the resistor to be detected varying with time and the curve of the temperature of the first temperature control box varying with time;

[0031] S24, starting from the starting point to the end point of the curve of the resistance value of the resistor to be detected versus the detection temperature, extracting the detection temperature value of the resistor to be detected and its corresponding resistance value every one degree Celsius to obtain multiple detection temperature values [T1, T2…Ti…TN] and multiple resistance values [R1, R2…Ri…RN] of the resistor to be detected, where i∈[1,N], Ri corresponds to Ti, and N is the number of extractions;

[0032] Obtain the temperature value [t1, t2…ti…tN] of the first temperature control box corresponding to [T1, T2…Ti…TN] from the curve of the temperature change of the resistor to be detected as the temperature of the first temperature control box;

[0033] S25, substitute T1, R1, and t1 into T, R, and t in the following formula, respectively, to obtain B1; substitute T2, R2, and t2 into T, R, and t in the following formula, respectively, to obtain B2; and so on until substituting TN, RN, and tN into T, R, and t in the following formula, respectively, to obtain BN;

[0034]

[0035] Where R is the resistance of the resistor to be tested, R0 is the resistance of the resistor to be tested at room temperature, T0 is the preset normal temperature value, B is the temperature coefficient, T is the detection temperature value of the resistor to be tested, t is the temperature value of the first temperature control box, S 总 is the surface area of the detection end of the first detection member, S 贴 is the contact area between the detection end of the first detection element and the resistor to be detected;

[0036] S26, arranging B1, B2...Bi...BN from small to large to obtain a sequence of temperature coefficients B;

[0037] S27, eliminating the five smallest values and the five largest values in the sequence of the temperature coefficient B, and averaging the remaining values in the sequence to obtain an average temperature coefficient b.

[0038] The beneficial effects achieved by the present invention are as follows: by introducing the error caused by the detection end during the analysis phase of the temperature drift characteristic curve, the error introduced by the temperature difference between the temperature value of the first temperature control box and the detected temperature value of the resistor to be detected is analyzed, thereby improving the accuracy of the temperature drift characteristic analysis results of the resistor to be detected; at the same time, the introduction of data visualization technology can convert the analysis results into charts in a variety of different forms. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] The present invention can be further understood from the following description in conjunction with the accompanying drawings. The components in the figures are not necessarily drawn to scale, but rather the emphasis is placed on illustrating the principles of the embodiments. In different views, the same reference numerals designate the same parts.

[0040] Figure 1 It is a structural schematic diagram of the present invention.

[0041] Figure 2 This is a flow chart of the measurement circuit of the present invention for measuring the temperature drift characteristics of a DC resistor.

[0042] Figure 3 This is a flow chart of the visualization system of the present invention analyzing and visualizing the parameters of each system.

[0043] Figure 4 The present invention is a flow chart of a data processing module analyzing the temperature drift characteristics of a resistor to be detected and generating a temperature drift characteristic curve of the resistor to be detected. DETAILED DESCRIPTION

[0044] The following is an explanation of the embodiments of the present invention through specific embodiments. Those skilled in the art can understand the advantages and effects of the present invention from the contents disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments, and the details in this specification can also be modified and changed in various ways based on different viewpoints and applications without departing from the spirit of the present invention. In addition, the drawings of the present invention are only simple schematic illustrations and are not depicted in actual size. It is stated in advance. The following embodiments will further explain the relevant technical content of the present invention in detail, but the disclosed content is not intended to limit the scope of protection of the present invention.

[0045] Example 1:

[0046] according to Figure 1 、 Figure 2 、 Figure 3 and Figure 4 This embodiment provides a DC resistor temperature drift characteristic measurement system based on data visualization, comprising a measurement circuit, a detection system, a control system, and a visualization system. The measurement circuit is used to measure the temperature drift characteristics of a resistor to be detected. The detection system is used to detect various parameters in the measurement circuit and the control system. The control system is used to control the independent variables of the measurement circuit. The visualization system is used to analyze and visualize the parameters of each system.

[0047] The visualization system includes a recording module, a data processing module, a chart generating module, a data storage module, a display module and an interactive module; the recording module is in signal communication with the detection system and the measurement circuit, the recording module is used to record the detection data of the detection system and the measurement circuit, the recording module includes a timer, and the timer is used to record time; the data processing module is used to analyze the temperature drift characteristics of the resistor to be detected based on the detection data, and generate a temperature drift characteristic curve of the resistor to be detected; the interactive module is used to receive user instructions; the chart generating module is used to generate corresponding charts based on the user instructions and the processing results of the data processing module; the data storage module is used to store the data in the recording module, the data processing module and the chart generating module; the display module is used to display the generated chart.

[0048] Furthermore, the measurement circuit includes a power supply, a first voltmeter, a second voltmeter, an ammeter, a resistor to be detected, a thermistor and multiple wires; the power supply is used to output direct current of different sizes; the wires are used to connect various circuit elements; the power supply, the resistor to be detected, the ammeter and the thermistor are connected in series in sequence through the wires; the first voltmeter and the resistor to be detected are connected in parallel through the wires to detect the voltage across the resistor to be detected; the second voltmeter and the thermistor are connected in parallel through the wires to detect the voltage across the thermistor; the ammeter is used to detect the current of the circuit, and the thermistor is used to regulate the overall resistance of the circuit.

[0049] Specifically, the temperature characteristic curve of the thermistor is known.

[0050] Furthermore, the control system includes a first temperature-controlled box and a second temperature-controlled box, the first temperature-controlled box includes a first temperature-controlled component, a first input hole and a first output hole; the first input hole and the first output hole are used to allow the wire to pass through the first temperature-controlled box, the first temperature-controlled box surrounds the resistor to be detected and is in a sealed state, and the first temperature-controlled component is used to set the internal temperature of the first temperature-controlled box; the second temperature-controlled box includes a second temperature-controlled component, a second input hole and a second output hole; the second input hole and the second output hole are used to allow the wire to pass through the second temperature-controlled box, the second temperature-controlled box surrounds the thermistor and is in a sealed state, and the second temperature-controlled component is used to set the internal temperature of the second temperature-controlled box.

[0051] Furthermore, the detection system includes a first detection component, a second detection component, a third detection component, and a fourth detection component; the detection end of the first detection component is attached to the resistor to be detected, and is used to detect the temperature of the resistor to be detected; the second detection component is installed on the inner wall of the first temperature control box, and is used to detect the temperature inside the first temperature control box; the detection end of the third detection component is attached to the thermistor, and is used to detect the temperature of the thermistor; the fourth detection component is installed on the inner wall of the second temperature control box, and is used to detect the temperature inside the second temperature control box.

[0052] Furthermore, the measuring circuit for measuring the temperature drift characteristic of the DC resistance includes the following steps:

[0053] STEP 1, adjust the resistance value of the thermistor;

[0054] Specifically, when the temperature is too low, the resistance value of the resistor to be detected will be approximately equal to 0. By adjusting the resistance value of the thermistor, a short circuit in the measurement circuit can be avoided. Different temperature drift characteristic curves of the resistor to be detected can also be obtained for different thermistor resistance values.

[0055] STEP 2: Turn on the power supply, the first voltmeter, the second voltmeter, and the ammeter;

[0056] STEP 3: Continue to lower the temperature of the first temperature control box until the value of the first voltmeter drops to the minimum value and remains stable;

[0057] STEP 4: Continue to increase the temperature of the first temperature control box until the current meter value drops to the minimum and remains stable;

[0058] STEP 5: The recording module records the readings of the ammeter, the first voltmeter, the first detection element, and the second detection element during the process from STEP 3 to STEP 4. After recording is completed, the power supply is turned off and the measurement is completed.

[0059] Specifically, by changing the output of the power supply and the resistance value of the thermistor, the temperature drift characteristic of the DC resistor can be measured multiple times. By comparing the results of the multiple measurements, the measurement accuracy can be improved.

[0060] Specifically, adjusting the resistance value of the thermistor includes the following steps:

[0061] STEP 11, setting the temperature of the second temperature control box according to the temperature characteristic curve of the thermistor and the required resistance value;

[0062] STEP 12: Observe the reading of the third detection member. If the reading of the third detection member is the same as the set temperature of the second temperature control box and remains stable, the resistance value setting is complete.

[0063] Furthermore, the visualization system analyzes and visualizes the parameters of each system, including the following steps:

[0064] S1, the recording module records the readings of the ammeter, the first voltmeter, the first detection element and the second detection element and the recording time;

[0065] S2, the data processing module analyzes the temperature drift characteristics of the resistor to be detected according to the reading;

[0066] S3, the interaction module receives user instructions;

[0067] S4, the chart generation module selects a suitable chart model according to the user's instructions and displays the curves and processing results generated by the data processing module during the processing process;

[0068] S5, the data storage module saves data;

[0069] S6, the display module displays the generated chart.

[0070] Furthermore, the data processing module analyzes the temperature drift characteristics of the resistor to be detected, including the following steps:

[0071] S21, plotting a current versus time curve, a voltage versus time curve, a temperature variation curve of the resistance to be tested versus time curve, and a temperature variation curve of the first temperature control box versus time curve based on the readings of the ammeter, the first voltmeter, the first detection element, the second detection element, and the timer;

[0072] S22, combining the current versus time curve and the voltage versus time curve by R=U / I to obtain a resistance value versus time curve of the resistor to be detected, where R is the resistance value of the resistor to be detected, U is the reading of the first voltmeter, and I is the reading of the ammeter;

[0073] S23, obtaining a curve of the resistance value of the resistor to be detected varying with the detection temperature based on the curve of the resistance value of the resistor to be detected varying with time and the curve of the detection temperature of the resistor to be detected varying with time; obtaining a curve of the temperature of the resistor to be detected varying with the temperature of the first temperature control box based on the curve of the detection temperature of the resistor to be detected varying with time and the curve of the temperature of the first temperature control box varying with time;

[0074] S24, starting from the starting point to the end point of the curve of the resistance value of the resistor to be detected versus the detection temperature, extracting the detection temperature value of the resistor to be detected and its corresponding resistance value every one degree Celsius to obtain multiple detection temperature values [T1, T2…Ti…TN] and multiple resistance values [R1, R2…Ri…RN] of the resistor to be detected, where i∈[1,N], Ri corresponds to Ti, and N is the number of extractions;

[0075] Obtain the temperature value [t1, t2…ti…tN] of the first temperature control box corresponding to [T1, T2…Ti…TN] from the curve of the temperature change of the resistor to be detected as the temperature of the first temperature control box;

[0076] Specifically, the serial numbers of the temperature values and resistance values correspond to the number of times the same resistor is repeatedly tested.

[0077] S25, substitute T1, R1, and t1 into T, R, and t in the following formula, respectively, to obtain B1; substitute T2, R2, and t2 into T, R, and t in the following formula, respectively, to obtain B2; and so on until substituting TN, RN, and tN into T, R, and t in the following formula, respectively, to obtain BN;

[0078]

[0079] Where R is the resistance of the resistor to be tested, R0 is the resistance of the resistor to be tested at room temperature, T0 is the preset normal temperature value, B is the temperature coefficient, T is the detection temperature value of the resistor to be tested, t is the temperature value of the first temperature control box, S 总 is the surface area of the detection end of the first detection member, S 贴is the contact area between the detection end of the first detection element and the resistor to be detected;

[0080] Generally speaking, the preset normal temperature value is the normal ambient temperature value, for example, it can be set to 26 degrees Celsius.

[0081] Specifically, a pressure detection unit is provided inside the detection end of the first detection member, and there are multiple pressure detection units. The pressure detection unit can detect the pressure on various parts of the detection end surface of the first detection member; the pressure detection unit can detect the pressure at the contact part between the detection end of the first detection member and the resistor to be detected. By analyzing the proportion of the pressure detection units that detect pressure in all pressure detection units, it can be known that S 空 In S 总 The proportion of S 空 The value of , that is: Among them L 检 is the number of pressure detection units that detect pressure, L 总 is the total number of pressure detection units.

[0082] S26, arranging B1, B2...Bi...BN from small to large to obtain a sequence of temperature coefficients B;

[0083] S27, eliminating the five smallest values and the five largest values in the sequence of the temperature coefficient B, and averaging the remaining values in the sequence to obtain an average temperature coefficient b.

[0084] Specifically, the average temperature coefficient b can be used to characterize the temperature drift characteristics of the resistor. The larger the average temperature coefficient b is, the more drastic the change in the resistance value with temperature changes is.

[0085] It is worth noting that for a resistor, its temperature coefficient is generally constant, but in the actual measurement process, the temperature coefficient often changes when the temperature is too high or too low, and errors caused by the measurement will occur. This solution uses the average temperature coefficient to help reduce the impact of errors and extreme values, thereby improving the accuracy of the temperature characteristic curve of the resistor to be tested.

[0086] The beneficial effects of this solution are as follows: by introducing the error caused by the detection end during the analysis phase of the temperature drift characteristic curve, the error introduced by the temperature difference between the temperature value of the first temperature control box and the detected temperature value of the resistor to be detected is analyzed, thereby improving the accuracy of the temperature drift characteristic analysis results of the resistor to be detected; at the same time, the introduction of data visualization technology can convert the analysis results into a variety of different forms of charts.

[0087] Example 2:

[0088] This embodiment should be understood to include all the features of any of the aforementioned embodiments, and further improve upon them, in that the parameter adjustment method of the first temperature control box includes the following:

[0089] The first temperature control box is provided with an algorithm unit, and the algorithm unit adjusts the parameters of the first temperature control box according to the temperature value detected by the second detection component using the following formula:

[0090] Parameter adjustment amount = Kp(t)*(current error + Ki(t)*accumulated error + Kd(t)*error change rate);

[0091] Wherein, Kp(t), Ki(t), and Kd(t) are the adaptive parameters of proportion, integration, and differentiation at time t, respectively; the current error is the error between the set temperature at time t and the temperature value detected by the second detection element; the cumulative error is the cumulative value of multiple errors generated from the start of temperature adjustment of the first temperature control box to time t; the error change rate is the rate of change of multiple errors generated from the start of temperature adjustment of the first temperature control box to time t;

[0092] Specifically, the parameter adjustment amount may be the power of the heating element or the heat dissipation element in the first temperature-controlled box.

[0093] Specifically, the adjustment formula of the adaptive parameters is as follows:

[0094] Kp(t)=Kp0+ΔKp(t); Ki(t)=Ki0+ΔKi(t); Kd(t)=Kd0+ΔKd(t);

[0095] Among them, Kp0, Ki0 and Kd0 are initial parameters pre-set by those skilled in the art based on experience, and ΔKp(t), ΔKi(t) and ΔKd(t) are parameter corrections calculated based on the error index at time t;

[0096] The error index is obtained according to the following formula:

[0097]

[0098] Wherein, e(t) is the error index, y_ref(t) is the set temperature at time t, and y(t) is the temperature value detected by the second detection element at time t; e(t0) is the error index during the last parameter adjustment; ΔK(t0) is the parameter adjustment amount during the last parameter adjustment; Δt is the time interval between two adjustments, which is determined by technicians in this field according to requirements when designing the algorithm unit;

[0099] According to the error signal, the parameter correction can be calculated:

[0100] ΔKp(t)=γp*e(t); ΔKi(t)=γi*∫e(t)dt; ΔKd(t)=γd*de(t) / dt;

[0101] Among them, γp, γi and γd are initial gain parameters of adaptive parameter adjustment obtained by those skilled in the art based on experience, and are used to control the speed and amplitude of parameter correction.

[0102] The beneficial effects of this embodiment are as follows: by continuously adjusting the parameters of the first temperature control box, when the difference between the set temperature and the actual temperature is large, the difference between the set temperature and the actual temperature can be quickly shortened; when the difference between the set temperature and the actual temperature is small, the parameters are finely adjusted, thereby improving the performance and stability of the first temperature control box.

[0103] The contents disclosed above are only preferred feasible embodiments of the present invention and do not limit the scope of protection of the present invention. Therefore, all equivalent technical changes made using the contents of the present invention description and drawings are included in the scope of protection of the present invention. In addition, the elements therein can be updated as technology develops.

Claims

1. A DC resistance temperature drift characteristic measurement system based on data visualization, characterized in that: The system comprises a measurement circuit, a detection system, a control system and a visualization system. The measurement circuit is used to measure the temperature drift characteristics of the resistor to be detected. The detection system is used to detect various parameters in the measurement circuit and the control system. The control system is used to control the independent variables of the measurement circuit. The visualization system is used to analyze and visualize the parameters of each system. The visualization system includes a recording module, a data processing module, a chart generation module, a data storage module, a display module, and an interaction module; the recording module is in signal communication with the detection system and the measurement circuit, and is used to record the detection data of the detection system and the measurement circuit. The recording module includes a timer, and the timer is used to record time; the data processing module is used to analyze the temperature drift characteristics of the resistor to be detected based on the detection data and generate a temperature drift characteristic curve of the resistor to be detected; and the interaction module is used to receive user instructions; The chart generation module is used to generate corresponding charts according to user instructions and the processing results of the data processing module; the data storage module is used to store data in the recording module, the data processing module and the chart generation module; the display module is used to display the generated chart; The measurement circuit includes a power supply, a first voltmeter, a second voltmeter, an ammeter, a resistor to be detected, a thermistor, and a plurality of wires; the power supply is used to output direct current of different magnitudes; the wires are used to connect various circuit components; the power supply, the resistor to be detected, the ammeter, and the thermistor are sequentially connected in series via the wires; the first voltmeter and the resistor to be detected are connected in parallel via the wires for detecting the voltage across the resistor to be detected; the second voltmeter and the thermistor are connected in parallel via the wires for detecting the voltage across the thermistor; the ammeter is used to detect the current of the circuit, and the thermistor is used to regulate the overall resistance of the circuit; The control system includes a first temperature-controlled box and a second temperature-controlled box, wherein the first temperature-controlled box includes a first temperature-controlled component, a first input hole, and a first output hole; the first input hole and the first output hole are used to allow a wire to pass through the first temperature-controlled box, the first temperature-controlled box surrounds the resistor to be detected and is in a sealed state, and the first temperature-controlled component is used to set the internal temperature of the first temperature-controlled box; the second temperature-controlled box includes a second temperature-controlled component, a second input hole and a second output hole; the second input hole and the second output hole are used to allow a wire to pass through the second temperature-controlled box, the second temperature-controlled box surrounds the thermistor and is in a sealed state, and the second temperature-controlled component is used to set the internal temperature of the second temperature-controlled box; The detection system includes a first detection member, a second detection member, a third detection member, and a fourth detection member; the detection end of the first detection member is attached to the resistor to be detected, and is used to detect the temperature of the resistor to be detected; the second detection member is installed on the inner wall of the first temperature control box, and is used to detect the temperature inside the first temperature control box; the detection end of the third detection member is attached to the thermistor, and is used to detect the temperature of the thermistor; the fourth detection member is installed on the inner wall of the second temperature control box, and is used to detect the temperature inside the second temperature control box; The measuring circuit for measuring the temperature drift characteristic of the DC resistance comprises the following steps: STEP 1, adjust the resistance value of the thermistor; STEP 2: Turn on the power supply, the first voltmeter, the second voltmeter, and the ammeter; STEP 3: Continue to lower the temperature of the first temperature control box until the value of the first voltmeter drops to the minimum value and remains stable; STEP 4: Continue to increase the temperature of the first temperature control box until the current meter value drops to the minimum and remains stable; STEP 5: The recording module records the readings of the ammeter, the first voltmeter, the first detection element, and the second detection element during the process from STEP 3 to STEP 4. After recording is completed, the power supply is turned off, and the measurement is completed. The visualization system analyzes the parameters of each system and performs visualization processing, including the following steps: S1, the recording module records the readings of the ammeter, the first voltmeter, the first detection element and the second detection element and the recording time; S2, the data processing module analyzes the temperature drift characteristics of the resistor to be detected according to the reading; S3, the interaction module receives user instructions; S4, the chart generation module selects a suitable chart model according to the user's instructions and displays the curves and processing results generated by the data processing module during the processing process; S5, the data storage module saves data; S6, the display module displays the generated chart; The data processing module analyzes the temperature drift characteristics of the resistor to be detected, including the following steps: S21, plotting a current versus time curve, a voltage versus time curve, a temperature variation curve of the resistance to be tested versus time curve, and a temperature variation curve of the first temperature control box versus time curve based on the readings of the ammeter, the first voltmeter, the first detection element, the second detection element, and the timer; S22, combining the current versus time curve and the voltage versus time curve by R=U / I to obtain a resistance value versus time curve of the resistor to be detected, where R is the resistance value of the resistor to be detected, U is the reading of the first voltmeter, and I is the reading of the ammeter; S23, obtaining a curve of the resistance value of the resistor to be detected varying with the detection temperature based on the curve of the resistance value of the resistor to be detected varying with time and the curve of the detection temperature of the resistor to be detected varying with time; obtaining a curve of the temperature of the resistor to be detected varying with the temperature of the first temperature control box based on the curve of the detection temperature of the resistor to be detected varying with time and the curve of the temperature of the first temperature control box varying with time; S24, starting from the starting point to the end point of the curve of the resistance value of the resistor to be detected versus the detection temperature, extracting the detection temperature value of the resistor to be detected and its corresponding resistance value every one degree Celsius to obtain multiple detection temperature values [T1, T2…Ti…TN] and multiple resistance values [R1, R2…Ri…RN] of the resistor to be detected, where i∈[1,N], Ri corresponds to Ti, and N is the number of extractions; Obtain the temperature value [t1, t2…ti…tN] of the first temperature control box corresponding to [T1, T2…Ti…TN] from the curve of the temperature change of the resistor to be detected as the temperature of the first temperature control box; S25, substitute T1, R1 and t1 into T, R and t in the following formula to obtain B1, substitute T2, R2 and t2 into T, R and t in the following formula to obtain B2, and so on until TN, RN and tN are substituted into T, R and t in the following formula to obtain BN; R=R0*exp{B*[ -T0]}; Wherein, R is the resistance of the resistor to be detected, R0 is the resistance of the resistor to be detected at room temperature, T0 is the preset normal temperature value, B is the temperature coefficient, T is the detection temperature value of the resistor to be detected, and t is the temperature value of the first temperature control box. is the surface area of the detection end of the first detection member, is the contact area between the detection end of the first detection element and the resistor to be detected; S26, arranging B1, B2...Bi...BN from small to large to obtain a sequence of temperature coefficients B; S27, eliminating the five smallest values and the five largest values in the sequence of the temperature coefficient B, and averaging the remaining values in the sequence to obtain an average temperature coefficient b.

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