Solar cell screen printing production system and single-chip tracing method thereof

Abstract

The invention relates to a solar cell silk-screen production system and a single-chip tracing method thereof, and the method comprises the steps: reading identification information of a flower basket by process equipment located at the head end of a processing process sequence, generating virtual ID request information according to the identification information, and transmitting the virtual ID request information to a management platform; the management platform allocates silicon wafer virtual IDs according to virtual ID request information sent by the process equipment at the head end, issues the silicon wafer virtual IDs and the information of the number of layers in the flower basket to the process equipment at the head end, and binds the silicon wafer virtual IDs with the battery silicon wafers in the flower basket in a one-to-one correspondence manner; each process device transmits the silicon wafer virtual ID to the next process device according to the processing process sequence, and uploads the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID to the management platform; and the management platform receives the processing information of each battery silicon wafer reported by each process device and the corresponding silicon wafer virtual ID, and binds and stores the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID as a tracing basis of the solar battery silicon wafer, thereby realizing a single-wafer tracing effect.

Description

Technical Field

[0001] The present application relates to the technical field of photovoltaic cell production, and in particular to a solar cell silk screen production system and a single-chip traceability method thereof. Background Art

[0002] The photovoltaic industry is a key industry in the global sustainable development strategy. With the growing demand for clean and renewable energy, high-efficiency photovoltaic cells are gaining more and more attention. As a result, there is an increasing demand for precise control and management of each production link of photovoltaic cells, especially in the silk-screen process that affects the conversion efficiency of the cell.

[0003] The screen printing process refers to the process of printing metal paste on the surface of silicon wafers to form conductive electrodes through screen printing during the manufacturing process of photovoltaic cells. This process is critical to the quality and performance of the cells. Tracing the specific information of each cell in key processes such as production, testing and packaging can not only provide transparency in the production process, but also has important value in quickly locating production problems, optimizing production processes, and improving product quality. In the traditional traceability process of cell production, electronic or manual process sheets are usually used to mark single batches, and the batch of cells is manually tracked to record and count the required test results. The process sheet tracking method can usually only achieve traceability of a single batch or a single carrier, and cannot achieve single-chip traceability. Summary of the invention

[0004] Based on this, it is necessary to provide a solar cell screen printing production system and a single-chip traceability method thereof that can realize single-chip traceability in order to solve the above problems.

[0005] The first aspect of the present application provides a solar cell screen printing production system, including a management platform and a screen printing device, wherein the screen printing device includes more than two process devices connected in a processing sequence, and the management platform performs 5G / wireless communication with each of the process devices;

[0006] The process equipment at the beginning of the processing sequence reads the identification information of the flower basket, generates a virtual ID (Identity) request information according to the identification information and sends it to the management platform, and receives the silicon wafer virtual ID of the battery silicon wafer and the number of layers in the flower basket issued by the management platform, and binds the silicon wafer virtual ID to the battery silicon wafer in the flower basket one by one according to the number of layers information; each of the process equipment also passes the silicon wafer virtual ID to the next process equipment according to the processing sequence, and uploads the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID to the management platform;

[0007] The management platform is used to allocate a silicon wafer virtual ID according to the virtual ID request information sent by the process equipment at the head end, send the silicon wafer virtual ID and the number of layers in the basket to the process equipment at the head end, and receive the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID reported by each process equipment, and bind the processing information of each battery silicon wafer with the corresponding silicon wafer virtual ID for storage.

[0008] In one of the embodiments, the process equipment is also used to correct the virtual ID after detecting an abnormality in the battery silicon wafer, and report the corrected data to the management platform so that the management platform can update the stored binding information; the battery silicon wafer abnormality includes missing or damaged battery silicon wafer and mismatch between the silicon wafer virtual ID and the battery silicon wafer.

[0009] In one of the embodiments, the process equipment detects whether each battery silicon wafer is missing or damaged through a photoelectric sensor, and reports the location information and correction data of the missing or damaged battery silicon wafer to the management platform.

[0010] In one of the embodiments, the process equipment arranges the virtual IDs of each silicon wafer in the order of the positions of the battery silicon wafers in the flower basket to form a virtual code set; the process equipment detects whether the Nth battery silicon wafer in the flower basket matches the Nth silicon wafer virtual ID in the virtual code set.

[0011] In one of the embodiments, the processing information of the battery silicon wafer includes flower basket information and / or processing technology information, the flower basket information includes identification information, number of uses and the position of the battery silicon wafer in the flower basket, and the processing technology information includes process data, the time when the first battery silicon wafer and the last battery silicon wafer in the flower basket arrive at the process equipment and the corresponding silicon wafer virtual ID.

[0012] In one of the embodiments, the management platform includes an EAP (Equipment Automation Program) system and an MES (Manufacturing Execution System) system, and the EAP system performs 5G / wireless communication with each of the process equipment;

[0013] The EAP system receives the virtual ID request information reported by the process equipment at the head end, assembles the virtual ID request information and the machine information of the process equipment at the head end into JSON format data and forwards it to the MES system; the MES system returns the allocated silicon wafer virtual ID and the number of layers corresponding to the silicon wafer virtual ID of the battery silicon wafer in the flower basket to the EAP system; the EAP system sorts the silicon wafer virtual ID according to the corresponding number of layers of the battery silicon wafer, and writes them into the array variable of the internal controller of the process equipment at the head end.

[0014] In one of the embodiments, the system also includes a feeding track arranged between each of the process equipment, and a sensing unit arranged on the feeding track. The battery silicon wafers are transmitted between each of the process equipment via the feeding track. The sensing unit is used to count the number of battery silicon wafers passing through the feeding track and report it to the management platform.

[0015] In one of the embodiments, the system also includes a cache mechanism arranged on the feeding track, and the cache mechanism is used to store battery silicon wafers whose processing progress is greater than a set progress threshold, and report the battery silicon wafer cache information to the management platform when the battery silicon wafers are stored and taken out.

[0016] In one embodiment, the system further includes an AGV (Automated Guided Vehicle) vehicle, and the AGV vehicle is used to transport the basket loaded with battery silicon wafers to the process equipment at the head end.

[0017] A second aspect of the present application provides a single-chip traceability method for a solar cell screen printing production system, comprising:

[0018] The process equipment at the beginning of the processing sequence reads the identification information of the flower basket, generates virtual ID request information according to the identification information and sends it to the management platform;

[0019] The management platform allocates a silicon wafer virtual ID according to the virtual ID request information sent by the process equipment at the head end, and sends the silicon wafer virtual ID and the number of layers in the basket to the process equipment at the head end;

[0020] The process equipment at the head end receives the silicon wafer virtual ID of the battery silicon wafer and the number of layers in the flower basket issued by the management platform, and binds the silicon wafer virtual ID to the battery silicon wafer in the flower basket in a one-to-one correspondence according to the number of layers information;

[0021] Each of the process equipment also transmits the silicon wafer virtual ID to the next process equipment according to the processing sequence, and uploads the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID to the management platform;

[0022] The management platform receives the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID reported by each process equipment, and binds and stores the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID.

[0023] In the solar cell silk-screen production system and single-wafer traceability method thereof, the process equipment at the head end of the processing sequence reads the identification information of the flower basket, generates virtual ID request information according to the identification information and sends it to the management platform; the management platform allocates a silicon wafer virtual ID according to the virtual ID request information sent by the process equipment at the head end, and sends the silicon wafer virtual ID and the number of layers in the flower basket to the process equipment at the head end; the process equipment at the head end receives the silicon wafer virtual ID and the number of layers in the flower basket of the battery silicon wafer sent by the management platform, and binds the silicon wafer virtual ID to the battery silicon wafer in the flower basket one by one according to the number of layers; each process equipment also passes the silicon wafer virtual ID to the next process equipment according to the processing sequence, and uploads the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID to the management platform; the management platform receives the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID reported by each process equipment, binds the processing information of each battery silicon wafer with the corresponding silicon wafer virtual ID and stores it as the traceability basis of the solar cell silicon wafer, supports binding and recording the processing information in the processing steps where the code cannot be scanned, and achieves the effect of single-wafer traceability. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 It is a structural block diagram of a solar cell screen printing production system in one embodiment;

[0025] Figure 2 This is a schematic diagram of the structure of a flower basket in one embodiment;

[0026] Figure 3 Flow chart of a single wafer traceability method for a solar cell screen printing production system in one embodiment. DETAILED DESCRIPTION

[0027] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0028] The screen printing process has a fast production speed, a long single-chip traceability link, frequent alarms from production environment equipment, and a high chip loss rate, so the single-chip traceability of the screen printing process is difficult and has poor accuracy, and requires a lot of manpower for joint debugging. Based on this, the present application provides a solar cell screen printing production system, in which the process equipment at the head end of the processing sequence reads the identification information of the flower basket, generates a virtual ID request information based on the identification information and sends it to the management platform; the management platform allocates a silicon wafer virtual ID based on the virtual ID request information sent by the process equipment at the head end, and sends the silicon wafer virtual ID and the number of layers in the flower basket to the process equipment at the head end. The process equipment at the head end receives the silicon wafer virtual ID and the number of layers in the flower basket of the battery silicon wafer sent by the management platform, and binds the silicon wafer virtual ID to the battery silicon wafer in the flower basket one by one according to the number of layers information. Each process equipment also passes the silicon wafer virtual ID to the next process equipment according to the processing sequence, and uploads the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID to the management platform. The management platform receives the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID reported by each process equipment, and binds and stores the processing information of each battery silicon wafer with the corresponding silicon wafer virtual ID as the basis for traceability of solar cell silicon wafers. It supports binding and recording of processing information in processing procedures where code scanning is not possible, thereby achieving the effect of single-wafer traceability.

[0029] In one embodiment, Figure 1 As shown, a solar cell screen printing production system is provided, including a management platform 110 and a screen printing device 120, the screen printing device 120 includes more than two process devices connected in a processing sequence, and the management platform 110 performs 5G / wireless communication with each process device. Among them, the process device at the head end of the processing sequence reads the identification information of the flower basket, generates a virtual ID request information according to the identification information and sends it to the management platform 110, and receives the silicon wafer virtual ID of the battery silicon wafer and the number of layers in the flower basket issued by the management platform 110, and binds the silicon wafer virtual ID to the battery silicon wafer in the flower basket one by one according to the number of layers information; each process device also passes the silicon wafer virtual ID to the next process device according to the processing sequence, and uploads the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID to the management platform 110. The management platform 110 is used to allocate a silicon wafer virtual ID according to the virtual ID request information sent by the process equipment at the head end, send the silicon wafer virtual ID and the number of layers in the basket to the process equipment at the head end, and receive the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID reported by each process equipment, and bind and store the processing information of each battery silicon wafer with the corresponding silicon wafer virtual ID.

[0030] Specifically, the management platform 110 can be a terminal, a server, etc. The terminal can be, but is not limited to, various personal computers, laptops, smart phones, tablet computers, Internet of Things devices and portable wearable devices. The Internet of Things devices can be smart speakers, smart TVs, smart air conditioners, smart car-mounted devices, etc., and portable wearable devices can be smart watches, smart bracelets, head-mounted devices, etc. The server can be implemented as an independent server or a server cluster composed of multiple servers. The specific number and type of process equipment included in the screen printing equipment 120 are not unique. According to the processing sequence, the process equipment may include a feeder, a four-pass printer, a drying furnace, a sintering furnace, etc. The feeder is the process equipment located at the head of the processing sequence. The feeder, the four-pass printer, the drying furnace and the sintering furnace are connected through a network to form an Internet of Things, and the silicon wafer virtual ID is transmitted according to the processing sequence.

[0031] The raw material of solar cells is silicon wafers, which are formed into cells after processes such as silicon wafer sorting, texturing, diffusion, SE (Selective Emitter), etching, annealing, coating (back film, front film), screen printing, sintering, etc., and finally packaged and shipped out after the cells are graded. Only after sintering can a real cell be formed. Before sintering, it can be called a cell silicon wafer. Among them, etching, printing, sintering and other processes belong to the single-chip process, which directly processes the cell silicon wafer. The structure of the flower basket is as follows Figure 2 As shown, it is used to place multiple battery silicon wafers, and a radio frequency chip is set in the flower basket to store the identification information of the flower basket, such as the flower basket number. It can be that a physical code is set for each battery silicon wafer. After the loader receives the silicon wafer virtual ID, the internal controller of the loader binds the silicon wafer virtual ID with the physical code of the battery silicon wafer in the flower basket one by one according to the layer number information. In other embodiments, the internal controller of the loader can also directly bind the battery silicon wafers of different layers in the flower basket with the silicon wafer virtual ID one by one according to the layer number information. The battery silicon wafer passes through the loader, four-pass printing machine, drying furnace and sintering furnace in turn, and each process equipment performs corresponding processing operations on the battery silicon wafer, and uses sensors to collect various types of data generated during the processing (such as screen printing pressure, temperature, viscosity, etc.) to obtain the processing information of the battery silicon wafer. The internal controller of each process equipment communicates with the management platform 110, and reports the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID to the management platform 110 for binding and storage. The type of internal controller of the process equipment is not unique, and it can be a functional device such as FPGA (Field-Programmable Gate Array), MCU (Microcontroller Unit) and so on.

[0032] The system also includes an AGV cart, which is used to transport the flower basket loaded with battery silicon wafers to the process equipment at the head end. Specifically, after the AGV cart transports the flower basket loaded with battery silicon wafers to the loader, the internal controller of the loader scans the code through RFID (Radio Frequency Identification, radio frequency identification technology) to identify the identification information of the flower basket. Among them, the identification information can be a barcode or a QR code. The loader sends a virtual ID request message carrying the identification information of the flower basket to the management platform 110. Furthermore, after reading the identification information stored in the radio frequency chip in the flower basket, the loader verifies the identification information to determine whether the identification information is correct; if the identification information is correct, the virtual ID request information corresponding to the identification information is reported to the management platform 110; if the identification information is incorrect, an error prompt message is sent to the management platform 110.

[0033] Specifically, the management platform includes an EAP system and an MES system. The EAP system performs 5G / wireless communication with each process equipment. The EAP system receives the virtual ID request information reported by the process equipment at the head end, assembles the virtual ID request information and the machine information of the process equipment at the head end into JSON format data and forwards it to the MES system. The MES system returns the assigned silicon wafer virtual ID and the number of layers corresponding to the silicon wafer virtual ID in the basket to the EAP system. The EAP system sorts the silicon wafer virtual ID according to the corresponding number of layers of the battery silicon wafer and writes it into the array variable of the internal controller of the process equipment at the head end. Among them, NTP time synchronization is performed between the internal controller of each process equipment, the EAP system and the MES system. The silicon wafer virtual ID runs through the entire battery process and is the unique number of the entire traceability process of the battery silicon wafer. It is bound to the battery silicon wafer in the basket, and all information of the corresponding battery silicon wafer in the process can be queried according to the silicon wafer virtual ID.

[0034] After receiving the virtual ID request information sent by the loader, the EAP system packages the identification information of the basket and the relevant information of the host computer (such as number, type, etc.) into JSON format data and forwards it to the MES system for recording. The MES system can also verify the identification information of the basket first, obtain the number of layers in the basket according to the identification information of the basket after the inspection, assign a silicon wafer virtual ID to each layer of battery silicon wafers, and return the silicon wafer virtual ID and the number of layers in the basket to the EAP system, which is sent to the internal controller of the loader for storage by the EAP system in the form of an array variable. The subscript of the array corresponds to the number of layers of each slot in the basket. The internal controller of the loader is used to store the silicon wafer virtual ID. The RF chip in the basket only stores the identification information of the basket, and there is no need to store the silicon wafer virtual ID of the battery silicon wafer. Therefore, there is no need to erase and write repeatedly, which reduces the amount of data read and written by the RF chip in the basket and avoids network jams. In addition, it can also reduce the risk of chip failure caused by frequent erasure of information in the RF chip. Since the RF chip is cast in the flower basket, the flower basket needs to be replaced if the chip fails. Avoiding frequent erasure of information in the RF chip can also reduce maintenance costs.

[0035] Furthermore, the internal controller of the loader binds each layer of battery silicon wafers in the basket to the corresponding silicon wafer virtual ID one by one, and transmits the silicon wafer virtual ID to a screen printer through the local area network. When the first and last battery silicon wafers arrive at this device, the screen printer records the corresponding silicon wafer virtual ID and arrival time, caches 10 silicon wafer virtual ID requests to report data once, and transmits the silicon wafer virtual ID to the back-end process equipment through the local area network when the battery silicon wafer leaves the device. During the processing, each process equipment detects the processing information of each battery silicon wafer through sensors, uploads the processing information together with the corresponding silicon wafer virtual ID to the EAP system, and transfers it to the MES system through the EAP system for binding and storage.

[0036] Further, the processing information of the battery silicon wafer includes flower basket information and / or processing technology information. The flower basket information may include identification information, the number of times used and the position of the battery silicon wafer in the flower basket. The processing technology information includes process data, the time when the first battery silicon wafer and the last battery silicon wafer in the flower basket arrive at the process equipment and the corresponding silicon wafer virtual ID. During the process, each process equipment detects the process data of the current process through a sensor. The process data includes but is not limited to information such as solution concentration, process time, temperature, pressure, radio frequency power, and gas ratio. It can be understood that due to different processing procedures, the content of the process data monitored by each process equipment is also different, which can be set according to actual processing requirements, and there is no limitation on this. In this embodiment, under the premise of realizing single-chip traceability, not only can the flower basket information bound to each battery wafer be analyzed for timely cleaning or replacement of the flower basket, but also the quality of the battery silicon wafer can be analyzed according to the processing technology information bound to each battery silicon wafer, and the cause of abnormal quality of the battery silicon wafer can be accurately located. At the same time, the source analysis of the battery silicon wafer helps to better select the source of better quality.

[0037] The solar cell screen printing production system mentioned above uses the virtual ID of the silicon wafer corresponding to the physical code in the single-chip screen printing process to bind and record the processing information in the processing steps where the code cannot be scanned, and can achieve the effect of single-chip traceability in any process.

[0038] In addition, the process equipment is also used to correct the virtual ID after detecting the abnormality of the battery silicon wafer, and report the correction data to the management platform 110, so that the management platform 110 can update the stored binding information. Among them, the battery silicon wafer abnormality includes the battery silicon wafer missing, damaged, and the silicon wafer virtual ID does not match the battery silicon wafer. Each process equipment can perform abnormal detection on the battery silicon wafer, and correct the abnormal battery silicon wafer and the corresponding silicon wafer virtual ID. After the correction is completed, the silicon wafer virtual ID in the array is updated, and the relevant correction data is uploaded to the EAP system, which is forwarded by the EAP system to the MES system for recording.

[0039] In one embodiment, the process equipment arranges the virtual IDs of the silicon wafers in the order of their positions in the flower basket to form a virtual code set; the process equipment detects whether the Nth battery silicon wafer in the flower basket matches the Nth silicon wafer virtual ID in the virtual code set.

[0040] The process equipment can compare the physical code of each silicon wafer in the basket with the corresponding silicon wafer virtual ID in the virtual code set to see if they match. For example, the first silicon wafer is discharged first, and the silicon wafer virtual ID of the first silicon wafer ranks first in the virtual code set. The process equipment compares the physical code of the first silicon wafer with the first silicon wafer virtual ID in the virtual code set to see if they match. If the scanned physical code matches the first silicon wafer virtual ID in the virtual code set, it means that the process information of the current silicon wafer is accurate, and then compares the physical code of the next silicon wafer with the next silicon wafer virtual ID in the virtual code set to see if they match. If there is a mismatch between the scanned physical code and the silicon wafer virtual ID at the corresponding position in the virtual code set, the process equipment detects whether there is a virtual code in the virtual code set that matches the scanned physical code; if so, the silicon wafer virtual ID at the corresponding position in the virtual code set is exchanged with the silicon wafer virtual ID that matches the scanned physical code. For example, if the physical code of the i-th silicon wafer does not match the i-th silicon wafer virtual ID in the virtual code set, but matches the j-th silicon wafer virtual ID in the virtual code set, the positions of the i-th silicon wafer virtual ID and the j-th silicon wafer virtual ID and the bound processing information are swapped, and the process equipment reports the relevant information after the swap to the EAP system, which forwards it to the MES system for recording to ensure the correspondence between the physical code and the silicon wafer virtual ID, as well as the process information bound to the silicon wafer virtual ID.

[0041] Furthermore, the process equipment detects whether each battery silicon wafer is missing or damaged through a photoelectric sensor, and reports the location information and correction data of the missing or damaged battery silicon wafer to the management platform 110. Specifically, the process equipment detects whether each battery silicon wafer is missing or damaged through a photoelectric sensor, reports after identifying that a battery silicon wafer is missing or damaged, and reports the silicon wafer virtual ID bound to the missing or damaged battery silicon wafer to the EAP system, which is forwarded by the EAP system to the MES system for recording. In addition, if there is an unmatched silicon wafer virtual ID in the virtual code set, it can also be determined that the silicon wafer corresponding to the unmatched silicon wafer virtual ID has been broken, and the process equipment reports the broken prompt information to the EAP system, which is forwarded by the EAP system to the MES system for recording.

[0042] In one embodiment, the system further includes a feeding track disposed between each process equipment, and a sensing unit disposed on the feeding track. The battery silicon wafers are transmitted between each process equipment via the feeding track, and the sensing unit is used to count the number of battery silicon wafers passing through the feeding track and report it to the management platform. By arranging the feeding track between each process equipment, the feeding track transmits the battery silicon wafers in groups between each process equipment, and the sensing unit calculates the number of battery silicon wafers passing through the feeding track and reports it to the management platform 110. Furthermore, the system further includes a cache mechanism disposed on the feeding track, and the cache mechanism is used to store battery silicon wafers whose processing progress is greater than a set progress threshold, and report the battery silicon wafer cache information to the management platform 110 when the battery silicon wafers are stored and taken out.

[0043] The specific value of the progress threshold is not unique and can be set according to actual needs. The management platform 110 is also used to calculate the order of the grabbing positions of the unloading arm, i.e. the loading order, based on the number of times the battery silicon wafers are sent out / received as reported by the feeding track, the processing information of each battery silicon wafer, the silicon wafer virtual ID of each battery silicon wafer, and the battery silicon wafer cache information reported by the cache mechanism, so as to determine the order of unloading the battery silicon wafers, which is more convenient for single-chip traceability of the battery silicon wafers.

[0044] In one embodiment, Figure 3 As shown, a single-chip traceability method for a solar cell screen printing production system is also provided, including:

[0045] Step S110: The process equipment at the beginning of the processing sequence reads the identification information of the flower basket, generates virtual ID request information according to the identification information, and sends it to the management platform.

[0046] Step S120: the management platform allocates a silicon wafer virtual ID according to the virtual ID request information sent by the process equipment at the head end, and sends the silicon wafer virtual ID and the number of layers in the basket to the process equipment at the head end.

[0047] Step S130: The process equipment at the head end receives the silicon wafer virtual ID of the battery silicon wafer and the layer number information in the flower basket issued by the management platform, and binds the silicon wafer virtual ID to the battery silicon wafer in the flower basket one by one according to the layer number information.

[0048] Step S140: Each process equipment also transmits the silicon wafer virtual ID to the next process equipment according to the processing sequence, and uploads the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID to the management platform.

[0049] Step S150: The management platform receives the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID reported by each process equipment, and binds and stores the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID.

[0050] It can be understood that the specific embodiment of the single-chip traceability method of the solar cell silk-screen production system has been explained in detail in the above solar cell silk-screen production system, which will not be repeated here.

[0051] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0052] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.

Claims

1. A solar cell screen printing production system, characterized in that: It includes a management platform and a screen printing device, wherein the screen printing device includes more than two process devices connected in a processing sequence, and the management platform performs 5G / wireless communication with each of the process devices; The process equipment located at the head end of the processing sequence reads the identification information of the flower basket, generates virtual ID request information according to the identification information and sends it to the management platform, and receives the silicon wafer virtual ID of the battery silicon wafer and the number of layers in the flower basket issued by the management platform, and binds the silicon wafer virtual ID to the battery silicon wafer in the flower basket one by one according to the number of layers information; Each of the process equipment also transmits the silicon wafer virtual ID to the next process equipment according to the processing sequence, and uploads the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID to the management platform; The management platform is used to allocate a silicon wafer virtual ID according to the virtual ID request information sent by the process equipment at the head end, send the silicon wafer virtual ID and the number of layers in the basket to the process equipment at the head end, and receive the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID reported by each process equipment, and bind the processing information of each battery silicon wafer with the corresponding silicon wafer virtual ID for storage.

2. The system according to claim 1, characterized in that The process equipment is also used to correct the virtual ID after detecting an abnormality in the battery silicon wafer, and report the corrected data to the management platform so that the management platform can update the stored binding information; the battery silicon wafer abnormality includes missing or damaged battery silicon wafer and mismatch between the silicon wafer virtual ID and the battery silicon wafer.

3. The system according to claim 2, characterized in that The process equipment detects whether each battery silicon wafer is missing or damaged through a photoelectric sensor, and reports the location information and correction data of the missing or damaged battery silicon wafer to the management platform.

4. The system according to claim 2, characterized in that The process equipment arranges the virtual IDs of the silicon wafers in the order of the positions of the battery silicon wafers in the basket to form a virtual code set; The process equipment detects whether the Nth battery silicon wafer in the flower basket matches the Nth silicon wafer virtual ID in the virtual code set.

5. The system according to claim 1, characterized in that The processing information of the battery silicon wafer includes flower basket information and / or processing technology information, the flower basket information includes identification information, number of uses and the position of the battery silicon wafer in the flower basket, and the processing technology information includes process data, the time when the first battery silicon wafer and the last battery silicon wafer in the flower basket arrive at the process equipment and the corresponding silicon wafer virtual ID.

6. The system according to claim 1, characterized in that The management platform includes an EAP system and an MES system, and the EAP system performs 5G / wireless communication with each of the process equipment; The EAP system receives the virtual ID request information reported by the process equipment at the head end, assembles the virtual ID request information and the machine information of the process equipment at the head end into JSON format data and forwards it to the MES system; the MES system returns the allocated silicon wafer virtual ID and the number of layers corresponding to the silicon wafer virtual ID of the battery silicon wafer in the flower basket to the EAP system; the EAP system sorts the silicon wafer virtual ID according to the corresponding number of layers of the battery silicon wafer, and writes them into the array variable of the internal controller of the process equipment at the head end.

7. The system according to claim 1, characterized in that It also includes a feeding track arranged between each of the process equipment, and a sensing unit arranged on the feeding track. The battery silicon wafers are transmitted between each of the process equipment via the feeding track. The sensing unit is used to count the number of battery silicon wafers passing through the feeding track and report it to the management platform.

8. The system according to claim 7, characterized in that It also includes a cache mechanism arranged on the feeding track, which is used to store battery silicon wafers whose processing progress is greater than a set progress threshold, and report battery silicon wafer cache information to the management platform when the battery silicon wafers are stored and taken out.

9. The system according to any one of claims 1 to 8, characterized in that: It also includes an AGV cart, which is used to transport the flower basket loaded with battery silicon wafers to the process equipment at the head end.

10. A single-chip traceability method for a solar cell screen printing production system, characterized in that: include: The process equipment at the beginning of the processing sequence reads the identification information of the flower basket, generates virtual ID request information according to the identification information and sends it to the management platform; The management platform allocates a silicon wafer virtual ID according to the virtual ID request information sent by the process equipment at the head end, and sends the silicon wafer virtual ID and the number of layers in the basket to the process equipment at the head end; The process equipment at the head end receives the silicon wafer virtual ID of the battery silicon wafer and the number of layers in the flower basket issued by the management platform, and binds the silicon wafer virtual ID to the battery silicon wafer in the flower basket in a one-to-one correspondence according to the number of layers information; Each of the process equipment also transmits the silicon wafer virtual ID to the next process equipment according to the processing sequence, and uploads the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID to the management platform; The management platform receives the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID reported by each process equipment, and binds and stores the processing information of each battery silicon wafer and the corresponding silicon wafer virtual ID.

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