A shape memory alloy wire training and performance testing platform

Abstract

The present application belongs to the technical field of shape memory alloy material training and performance testing, and particularly relates to a shape memory alloy wire training and performance testing platform, comprising: a training and testing mechanism, which comprises a plurality of test track groups and training track groups, the test track groups being used for performance testing of SMA wires, and the training track groups being used for thermal mechanical training of SMA wires; an SMA wire power supply mechanism, which comprises a plurality of SMA wire power supplies and relays; and a data acquisition mechanism, which comprises a data acquisition card, an infrared temperature measuring instrument, a data acquisition power supply, a current sensor, a voltage sensor, a displacement sensor and a force sensor; the shape memory alloy wire training and performance testing platform can synchronously measure a plurality of data such as current, voltage, wire length change, tension and temperature, can be built in parallel with a plurality of test track groups and training track groups, can simultaneously train and test different SMA wires, is high in working efficiency, and is convenient to operate.

Description

TECHNICAL FIELD

[0001] The present application belongs to the technical field of shape memory alloy material training and performance testing, and particularly relates to a shape memory alloy wire training and performance testing platform. BACKGROUND

[0002] Shape memory alloy (SMA) has superior shape memory effect, super-elasticity, high strength, large plasticity, good corrosion resistance, and excellent biocompatibility. As a new type of intelligent material, it has been widely used in aerospace, medical devices, automotive engineering, automatic control, instruments and meters, and robots.

[0003] Shape memory alloy can remember the shape of the low-temperature martensite phase. After a significant plastic deformation, it can automatically recover to the original shape when heated to a certain temperature. Super-elasticity refers to the phenomenon that when a shape memory alloy is subjected to stress at a higher temperature, it can recover to its original shape after the stress is released.

[0004] When using SMA shape memory effect as a driver, first, an external load is applied to the SMA to cause deformation, and then the strain recovery force is generated by heating to realize driving. SMA is subjected to external load and generates recovery strain when heated. During the cooling process, the external load induces martensitic transformation and generates pre-strain. This cycle is repeated periodically, and this periodic thermal cycle under external force is called thermal mechanical cycle. However, the memory stability of general SMA is poor. With the increase of the number of thermal mechanical cycles, the memory performance gradually stabilizes, that is, the recovery strain reaches a stable value. Therefore, before using SMA as a driver, the SMA material needs to be trained for tens or even thousands of times of thermal mechanical cycles to improve the memory stability of the SMA material.

[0005] In addition, because different alloy proportions and heat treatment conditions have a great influence on the mechanical properties of shape memory alloy during manufacturing, in order to study the mechanical property decay and high-temperature recovery performance of different shape memory alloy wires, the shape memory alloy wires also need to be subjected to cyclic heating and cooling, and the parameters such as the current, voltage, temperature, tension, and wire length change of the shape memory alloy wire need to be detected. How to test and train the performance parameters is also a key to its application in engineering. Therefore, it is a key technology to use appropriate equipment for quantitative experimental research and training.

[0006] At present, the shape memory alloy wire experimental training platform generally applies a load to the shape memory alloy wire through a weight, controls the on and off of the alloy wire, trains the shape memory effect of the alloy wire, and measures the current, voltage, length change and other data of the alloy wire by using multiple sensors during the training process. In the experiment, with the on and off of the memory alloy wire, the temperature of the memory alloy wire changes and the shape memory effect occurs, so that the length changes, and the resistance of the memory alloy wire also changes with the temperature. These data are correlated, influenced and dynamically changed during the training process, so the synchronization of each data measurement is very important.

[0007] In order to study the thermal-mechanical properties of the shape memory alloy wire, the current, voltage, length change, tension and temperature of the alloy wire need to be monitored. However, the existing shape memory alloy wire experimental training platform measures each parameter independently, which cannot guarantee the synchronization of the measured data, and thus cannot meet the requirements of the comprehensive and synchronous experimental data for the study of the thermal-mechanical properties of the shape memory alloy wire. Without the synchronous measurement of the current, voltage, length change, tension and temperature of the alloy wire, the relationship between the temperature, resistance, stress and strain of the memory alloy wire cannot be grasped, which is not conducive to the study of the characteristics of the shape memory alloy.

[0008] In addition, the existing shape memory alloy wire training and testing platform can generally only train or test one alloy wire at the same time. If multiple alloy wires need to be trained at the same time, multiple training tables are needed, which occupies more resources and is low in efficiency.

[0009] If a testing platform with high synchronization of data measurement and collection and capable of training multiple shape memory alloy wires at the same time can be provided, it will greatly facilitate the production and research of shape memory alloy wires. SUMMARY

[0010] The purpose of the present application is to provide a shape memory alloy wire training and performance testing platform with high synchronization of data measurement and collection and capable of training multiple shape memory alloy wires at the same time, to facilitate the production and research of shape memory alloy wires.

[0011] Therefore, the present application provides a shape memory alloy wire training and performance testing platform, which comprises:

[0012] The training and testing mechanism comprises a plurality of test track groups and training track groups, the test track groups are used for performance testing of SMA wires, and the training track groups are used for thermal-mechanical training of SMA wires.

[0013] The SMA wire power supply mechanism comprises a plurality of SMA wire power supplies and relays, the SMA wire power supplies are respectively connected with each SMA wire and relay, and the on and off state of each SMA wire can be controlled through the relay.

[0014] The data acquisition mechanism comprises a data acquisition card, an infrared temperature measuring instrument, a data acquisition power supply, a current sensor, a voltage sensor, a displacement sensor and a force sensor, the data acquisition power supply can supply power to other components in the data acquisition mechanism, the infrared temperature measuring instrument, the current sensor, the voltage sensor, the displacement sensor and the force sensor are connected with the data acquisition card, and the data acquisition card can synchronously acquire data detected by each detection device.

[0015] Further, the training track group and the test track group comprise:

[0016] The first guide rail is a track structure extending in a horizontal direction;

[0017] The third slider, the first slider and the fourth slider are sequentially arranged on the first guide rail, the third slider, the first slider and the fourth slider can slide along the first guide rail and can be fixed at any position on the first guide rail;

[0018] The second guide rail is arranged on the first slider, the second guide rail is parallel to the first guide rail and is also a track structure extending in a horizontal direction;

[0019] The second slider is arranged on the second guide rail and can slide along the second guide rail;

[0020] One end of the SMA wire is connected with the third slider, the other end of the SMA wire is connected with the second slider, the pulling rope is also connected with the second slider, a loading weight is arranged away from one end of the SMA wire, and the loading weight can apply a load to the SMA wire.

[0021] Further, the first slider is two, a mounting base plate is arranged on the two first sliders, the two first sliders are connected as a whole through the mounting base plate, and the second guide rail is arranged on the mounting base plate.

[0022] Further, a first hook table and a second hook table are arranged on the second slider, the first hook table and the second hook table are sequentially arranged along the length direction of the second guide rail and are fixedly connected with the second slider; wherein the first hook table is detachably connected with the end of the SMA wire, and the second hook table is detachably connected with the pulling rope.

[0023] Further, the test track group further comprises:

[0024] The fifth slider is arranged on the first guide rail, and is located between the third slider and the first slider; a displacement sensor is arranged on the fifth slider; a light barrier is arranged at the end of the SMA wire; and the displacement sensor can obtain the length of the SMA wire by detecting the position of the light barrier.

[0025] Further, the positive and negative poles of the data acquisition power supply are connected to the two ends of the SMA wire respectively; the current sensor is connected in series between the data acquisition power supply and the SMA wire, so that the measurement port of the current sensor is electrically connected to the SMA wire, current can flow through the SMA wire and be detected by the current sensor; and the voltage sensor is connected in parallel to the two ends of the SMA wire, and is used to measure the voltage between the two ends of the SMA wire.

[0026] Further, the infrared temperature measuring instrument is arranged near the SMA wire through a mechanical arm, and can measure the temperature of the SMA wire.

[0027] The displacement sensor is arranged above the SMA wire, and a light barrier movable with the end of the SMA wire is arranged at the other end of the SMA wire; and the displacement sensor can measure the length of the SMA wire through the light barrier.

[0028] The force sensor is fixedly arranged in the training and testing mechanism, and the measurement port of the force sensor is connected to one end of the SMA wire, so that the force sensor can measure the tension of the SMA wire.

[0029] Further, the SMA wire power supply mechanism further comprises:

[0030] The first mounting rack is a multilayer structure, and the SMA wire power supply is mounted on the first mounting rack.

[0031] Further, the data acquisition mechanism further comprises:

[0032] The second mounting rack is a multilayer structure, and the data acquisition card, the data acquisition power supply, the current sensor and the voltage sensor are placed in the layers of the second mounting rack after being connected according to the foregoing circuit.

[0033] Further, the shape memory alloy wire training and performance testing platform further comprises:

[0034] The testing platform comprises a movable table body and a breadboard.

[0035] The training and testing mechanism, the SMA wire power supply mechanism, the data acquisition mechanism and the breadboard are arranged on the tabletop of the movable table body.

[0036] The beneficial effects of the present application are:

[0037] The shape memory alloy wire training and performance test platform provides a test device capable of synchronously measuring current, voltage, wire length change, tension and temperature, and improves the temperature measurement method, so that the temperature measurement is more accurate and can better meet the needs of multi-point temperature measurement in scientific research. BRIEF DESCRIPTION OF DRAWINGS

[0038] Figure 1 is a perspective structural schematic diagram of the shape memory alloy wire training and performance test platform;

[0039] Figure 2 is a front view structural schematic diagram of the shape memory alloy wire training and performance test platform;

[0040] Figure 3 is a side view structural schematic diagram of the shape memory alloy wire training and performance test platform;

[0041] Figure 4 is a top view structural schematic diagram of the shape memory alloy wire training and performance test platform;

[0042] Figure 5 is a partial perspective structural schematic diagram of the shape memory alloy wire training and performance test platform;

[0043] Figure 6 is a perspective structural schematic diagram of the training track group;

[0044] Figure 7 is a perspective structural schematic diagram of the test track group under a first view angle;

[0045] Figure 8 is a perspective structural schematic diagram of the test track group under a second view angle;

[0046] Figure 9 is a principle schematic diagram of the shape memory alloy wire training and performance test platform;

[0047] The marks in the figure are:

[0048] 1, training test mechanism; 1a, test track group; 1b, training track group; 101, first guide rail; 102, first slider; 103, second slider; 104, second guide rail; 105, mounting base plate; 106, third slider; 107, fourth slider; 108, fifth slider; 109, support seat; 110, pulley; 111, optical axis; 112, first hook table; 113, second hook table; 114, light shield; 115, connecting hook; 116, SMA wire; 117, SMA wire fixing table; 118, pulling rope; 119, loading weight; 2, SMA wire power supply mechanism; 201, SMA wire power supply power supply; 202, relay; 203, first mounting frame; 3, data acquisition mechanism; 301, data acquisition card; 302, infrared temperature measuring instrument; 303, mechanical arm; 304, data acquisition power supply; 305, current sensor; 306, voltage sensor; 307, displacement sensor; 308, force sensor; 309, second mounting frame; 4, test platform; 401, movable table body; 402, breadboard. DETAILED DESCRIPTION

[0049] The technical solutions in the embodiments of the present application will be clearly described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by a person of ordinary skill in the art belong to the scope of protection of the present application.

[0050] In the description of the present application, it should be noted that the terms used herein are only for the purpose of describing the specific embodiments, and are not intended to limit the exemplary embodiments according to the present application. For the purpose of description, the sizes of the various parts shown in the drawings are not drawn in accordance with the actual proportional relationship. The technology, methods and devices known to those skilled in the relevant art can not be discussed in detail, but in appropriate cases, the technology, methods and devices should be considered as part of the authorized description. In all examples shown and discussed herein, any specific value should be interpreted as merely exemplary, and not as a limitation. Therefore, other examples of exemplary embodiments can have different values. It should be noted that similar reference numerals and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further discussed in subsequent drawings.

[0051] It should be noted that the terms "first," "second," etc., used in the specification and claims of this application are used to distinguish similar objects and not to describe a specific order or sequence. It should be understood that such use of data can be interchanged where appropriate so that embodiments of this application can be implemented in orders other than those illustrated or described herein, and the objects distinguished by "first," "second," etc., are generally of the same class and are not limited in number; for example, a first object can be one or more. Furthermore, in the specification and claims, "and / or" indicates at least one of the connected objects, and the character " / " generally indicates that the preceding and following objects are in an "or" relationship.

[0052] It should be noted that in the description of this application, the directional terms such as "front, back, up, down, left, right", "horizontal, vertical, horizontal" and "top, bottom" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description. Unless otherwise stated, these directional terms do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on the scope of protection of this application. The directional terms "inner" and "outer" refer to the inner and outer contours relative to the outline of each component itself.

[0053] It should be noted that, in this application, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element. Furthermore, it should be noted that the scope of the methods and apparatuses in the embodiments of this application is not limited to performing functions in the order shown or discussed, but may also include performing functions substantially simultaneously or in the reverse order, depending on the functions involved. For example, the described methods may be performed in a different order than described, and various steps may be added, omitted, or combined. Additionally, features described with reference to certain examples may be combined in other examples.

[0054] like Figures 1-9 As shown, a shape memory alloy wire training and performance testing platform includes:

[0055] The training and testing facility 1 includes several test track groups 1a and training track groups 1b. The test track groups 1a are used to perform performance tests on the SMA filament 116, and the training track groups 1b are used to perform thermomechanical training on the SMA filament 116.

[0056] SMA wire power supply mechanism 2 includes a plurality of SMA wire power supply 201 and relay 202. The SMA wire power supply 201 is connected to each SMA wire 116 and the relay 202 respectively. The relay 202 can control the on / off state of each SMA wire 116.

[0057] The data acquisition mechanism 3 includes a data acquisition card 301, an infrared thermometer 302, a data acquisition power supply 304, a current sensor 305, a voltage sensor 306, a displacement sensor 307, and a force sensor 308. The data acquisition power supply 304 can supply power to other components in the data acquisition mechanism 3. The infrared thermometer 302, current sensor 305, voltage sensor 306, displacement sensor 307, and force sensor 308 are connected to the data acquisition card 301. The data acquisition card 301 can synchronously acquire data detected by each detection device.

[0058] Specifically, such as Figure 9 As shown, in the shape memory alloy wire training and performance testing platform, the positive and negative terminals of the data acquisition power supply 304 are connected to the two ends of the SMA wire 116, respectively. The current sensor 305 is connected in series between the data acquisition power supply 304 and the SMA wire 116, so that the measurement port of the current sensor 305 is electrically connected to the SMA wire 116, and the current can flow through the SMA wire 116 and be detected by the current sensor 305. The voltage sensor 306 is connected in parallel across the two ends of the test SMA wire 116 to measure the voltage across the SMA wire 116.

[0059] In addition, the infrared thermometer 302 is positioned near the SMA wire 116 via a robotic arm 303 and can measure the temperature of the SMA wire 116; the displacement sensor 307 is positioned above the SMA wire 116, and a light-blocking plate 114 that can move with the end of the SMA wire 116 is provided at the other end of the SMA wire 116. The displacement sensor 307 can measure the displacement of the SMA wire 116, i.e., the wire length, through the light-blocking plate 114; the force sensor 308 is fixedly installed in the training and testing mechanism 1, and its measurement port is connected to one end of the SMA wire 116, so that the force sensor 308 can measure the tension of the SMA wire 116.

[0060] Preferably, since temperature measurement is not required for the training track group 1b, an infrared thermometer 302 can be placed only near the SMA wire 116 in the test track group 1a.

[0061] Furthermore, the SMA wire power supply mechanism 2 also includes:

[0062] The first mounting rack 203 is a multi-layer structure, and the SMA wire power supply 201 is mounted on the first mounting rack 203.

[0063] Preferably, the SMA wire power supply 201 is mounted on the first mounting rack 203 layer by layer, so that the floor area of the SMA wire power supply mechanism 2 can be saved.

[0064] As some examples of the present application, the SMA wire power supply mechanism 2 includes 2-8 SMA wire power supplies 201 and an equal number of relays 202, the relays 202 and the SMA wire power supplies 201 are connected one by one, each group of SMA wire power supplies 201 and relays 202 is connected with different SMA wires 116, and the circuit flowing through each SMA wire 116 is independently controlled.

[0065] Similarly, the data acquisition mechanism 3 also includes:

[0066] The second mounting rack 309 is a multi-layer structure, and the data acquisition card 301, the data acquisition power supply 304, the current sensor 305, and the voltage sensor 306 are placed in the layers of the second mounting rack 309 after being connected according to the foregoing circuit, so that not only the floor area can be saved, but also the working state of each component can be observed and controlled by the operator.

[0067] Further, the shape memory alloy wire training and performance testing platform also includes:

[0068] The testing platform 4 includes a movable table body 401 and a breadboard 402;

[0069] The breadboard 402 is arranged on the tabletop of the movable table body 401, and the training testing mechanism 1, the SMA wire power supply mechanism 2, and the data acquisition mechanism 3 are also arranged on the tabletop of the movable table body 401, so that the shape memory alloy wire training and performance testing platform becomes a movable whole, which is convenient to use.

[0070] Preferably, corresponding circuits are arranged in the breadboard 402, and the components in the training testing mechanism 1, the SMA wire power supply mechanism 2, and the data acquisition mechanism 3 are electrically connected in a set manner, so that the structure of the shape memory alloy wire training and performance testing platform can be simplified.

[0071] Further, the training track group 1b includes:

[0072] A guide rail and a plurality of sliders arranged on the guide rail, the sliders can slide along the guide rail and can be fixed at any position on the guide rail;

[0073] One end of the SMA wire 116 is fixed by a slider, and the other end is connected with a pulling rope 118, the pulling rope 118 is provided with a loading weight 119 away from one end of the SMA wire 116, the loading weight 119 can apply load to the SMA wire 116;

[0074] When training, the SMA wire 116 is supplied with current by the SMA wire power supply mechanism 2, and at the same time, the relevant parameters of the training process are synchronously collected by the data collection mechanism 3.

[0075] As some other embodiments of the present application, the training test mechanism 1 can also use a servo motor loading mode instead of a weight loading mode, which can realize more convenient change of the loading load size.

[0076] Specifically, the training track group 1b includes:

[0077] The first guide rail 101 is a track structure extending in the horizontal direction;

[0078] The third slider 106, the first slider 102 and the fourth slider 107 are sequentially arranged on the first guide rail 101, the third slider 106, the first slider 102 and the fourth slider 107 can slide along the first guide rail 101 and can be fixed at any position on the first guide rail 101;

[0079] The second guide rail 104 is arranged on the first slider 102, the second guide rail 104 is parallel to the first guide rail 101 and is also a track structure extending in the horizontal direction;

[0080] The second slider 103 is arranged on the second guide rail 104 and can slide along the second guide rail 104;

[0081] One end of the SMA wire 116 is connected with the third slider 106, and the other end is connected with the second slider 103, and the pulling rope 118 is also connected with the second slider 103, so that the pulling rope 118 can drive the SMA wire 116 to displace through the second slider 103.

[0082] Preferably, the first slider 102 is two, the mounting base plate 105 is arranged on the two first sliders 102, the two first sliders 102 are connected into one through the mounting base plate 105, the second guide rail 104 is arranged on the mounting base plate 105, and the second slider 103 is arranged on the second guide rail 104, the second guide rail 104 has a certain length to reserve enough space for the sliding of the second slider 103 in order to meet the use requirement, and this way of arranging two first sliders 102 can reduce the material and sliding resistance of the first slider 102; meanwhile, when the length of the second guide rail 104 needs to be adjusted, only the mounting base plate 105 and the second guide rail 104 with appropriate length need to be replaced.

[0083] Further, the SMA wire fixing table 117 is arranged on the third slider 106, and the end of the SMA wire 116 is connected with the SMA wire fixing table 117.

[0084] Further, the first hook table 112 and the second hook table 113 are arranged on the second slider 103, the first hook table 112 and the second hook table 113 are arranged on the second slider 103 in sequence along the length direction of the second guide rail 104 and are fixedly connected with the second slider 103; wherein the first hook table 112 is connected with the end of the SMA wire 116, the second hook table 113 is connected with the pulling rope 118, and the first hook table 112 and the second hook table 113 provide convenience for the connection of the SMA wire 116 and the pulling rope 118 with the second slider 103.

[0085] As some examples of the present application, the recess is arranged on the first hook table 112, the clamping block is arranged on the end of the SMA wire 116, the clamping block is clamped on the recess, and the quick connection of the SMA wire 116 with the second slider 103 is realized.

[0086] As some examples of the present application, the connecting hook 115 is arranged on the second hook table 113, the pulling rope 118 is hooked on the connecting hook 115, and the quick connection of the pulling rope 118 with the second slider 103 is realized.

[0087] Further, the fourth slider 107 comprises:

[0088] Two oppositely arranged supporting seats 109;

[0089] The optical axis 111 is arranged between the two supporting seats 109 in the horizontal direction;

[0090] The pulley 110 is arranged on the optical axis 111;

[0091] The pull rope 118 extends vertically after passing around the pulley 110, so that the shape memory alloy wire training and performance testing platform can apply a load to the SMA wire 116 using the gravity of the loading weight 119.

[0092] Furthermore, in addition to having the same structure as the training track group 1b described above, the test track group 1a also includes:

[0093] A fifth slider 108 is disposed on the first guide rail 101. The fifth slider 108 is located between the third slider 106 and the first slider 102. A displacement sensor 307 is disposed on the fifth slider 108. A light-blocking plate 114 is disposed at the end where the SMA wire 116 is connected to the traction rope 118. The light-blocking plate 114 can move with the end of the SMA wire 116. The displacement sensor 307 can obtain the length of the SMA wire 116 by detecting the position of the light-blocking plate 114.

[0094] Preferably, an obstacle avoidance structure, such as an L-shaped plate structure, is provided on the fifth slider 108. The obstacle avoidance structure allows the SMA wire 116 to pass through and can also provide an installation platform for the displacement sensor 307.

[0095] Based on existing training and performance testing methods for shape memory alloy wires, it can be determined that during the training and performance testing process, the first slider 102, the third slider 106, the fourth slider 107, and the fifth slider 108 should first slide to the set position and be fixed to the first guide rail 101, while the second slider 103 should always remain in a sliding state. The testing and training process is consistent with existing technology and will not be described in detail here.

[0096] In addition, the force sensor 308 is disposed on the first slider 102, and the end of the SMA wire 116 is connected to the force sensor 308, so that the force sensor 308 can measure the tension force on the SMA wire 116.

[0097] The working principle of the shape memory alloy wire training and performance testing platform described in this invention is as follows: Figure 9As shown, a loaded weight 119 is used as a fixed load for the SMA wire 116. The temperature and shape memory effect of the SMA wire 116 are controlled by energizing it. During this process, data is recorded using a current sensor 305, a voltage sensor 306, an infrared thermometer 302, a displacement sensor 307, and a force sensor 308. Data from each sensor is output to a data acquisition card 301, achieving synchronization of data acquisition time. This method of acquiring various data measured during the experiment using the data acquisition card 301 allows for the simultaneous acquisition of multiple types of data on the same time axis, facilitating data analysis and calculation, and also allows for flexible adjustment of the data sampling frequency.

[0098] Furthermore, existing shape memory alloy wire training and testing platforms generally use thermocouples to measure the wire temperature. Thermocouples are a contact-type temperature measurement method, requiring them to be attached to the shape memory alloy wire. When the shape memory alloy wire shifts, the thermocouple's position changes, affecting the accuracy of the temperature measurement. Simultaneously, the adhesion of the thermocouple alters the convective heat transfer conditions of the shape memory alloy wire, affecting the study of its temperature rise characteristics under natural convection heat transfer conditions. Additionally, during shape memory alloy wire experiments and training, the wire needs to be energized to control the temperature; an charged object can affect the accuracy of thermocouple measurements. The temperature measurement method of this invention uses an infrared thermometer. This non-contact temperature measurement method does not affect the normal heat transfer of the alloy wire. Moreover, the infrared thermometer can freely select multiple measurement points and has a high sampling frequency, allowing for a more convenient and accurate reflection of the temperature field of the alloy wire in the study of its thermo-mechanical properties.

[0099] Furthermore, the shape memory alloy wire training and performance testing platform described in this invention adopts a structure in which each shape memory alloy wire corresponds to one track and multiple tracks are laid in parallel, making it possible to train and test multiple shape memory alloy wires simultaneously.

[0100] Based on this, the test track group 1a and training track group 1b of the present invention have simple structures and small widths, which greatly reduces the volume of a single track and makes the space utilization efficiency of the entire training and performance testing platform high. At the same time, the present invention also optimizes the arrangement of the power supply, various sensors and data acquisition card 301, making it more convenient to adjust the power supply current and voltage, and the entire training and testing platform occupies less area and space.

[0101] In summary, the shape memory alloy wire training and performance testing platform of this invention provides a testing device capable of simultaneously measuring multiple data such as current, voltage, wire length change, tensile force, and temperature. Furthermore, it improves the temperature measurement method, enabling more accurate temperature measurement and better meeting the needs of multi-point temperature measurement in scientific research. The single shape memory alloy wire test track in this invention has a small volume, allowing for the parallel construction of multiple test track groups 1a and training track groups 1b, simultaneously training and testing different SMA wires 116. This approach is highly efficient and easy to operate.

[0102] The embodiments of this application have been described above with reference to the accompanying drawings. Unless otherwise specified, the embodiments and features in the embodiments of this application can be combined with each other. This application is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of this application without departing from the spirit and scope of the claims, and all of these forms are within the protection scope of this application.

Claims

1. A shape memory alloy wire training and performance testing platform, characterized in that, The utility model relates to a kind of training and testing device for SMA wire, including: Training test mechanism (1), it includes several test track groups (1a) and training track groups (1b), the test track groups (1a) are used to carry out performance test to SMA wire (116), the training track groups (1b) are used to carry out thermal mechanical training to SMA wire (116); SMA wire power supply mechanism (2), it includes several SMA wire power supply (201) and relay (202), the SMA wire power supply (201) is connected with each SMA wire (116) and relay (202) respectively, and the on-off state of each SMA wire (116) can be controlled by the relay (202); Data acquisition mechanism (3), it includes data acquisition card (301), infrared thermometer (302), data acquisition power supply (304), current sensor (305), voltage sensor (306), displacement sensor (307) and force sensor (308), the data acquisition power supply (304) can power other components in the data acquisition mechanism (3), the infrared thermometer (302), current sensor (305), voltage sensor (306), displacement sensor (307) and force sensor (308) are connected with the data acquisition card (301), and the data acquisition card (301) can synchronously acquire the data detected by each detection device.

2. The shape memory alloy wire training and performance testing platform of claim 1, wherein, The training track groups (1b) and test track groups (1a) include: First guide rail (101), it is track structure extending along horizontal direction; Third slider (106), first slider (102), fourth slider (107) are sequentially arranged on the first guide rail (101), the third slider (106), first slider (102), fourth slider (107) can slide along the first guide rail (101), and can be fixed at any position on the first guide rail (101); And, second guide rail (104), it is arranged on the first slider (102), and the second guide rail (104) is parallel with the first guide rail (101), and also is track structure extending along horizontal direction; Second slider (103) is arranged on the second guide rail (104), and the second slider (103) can slide along the second guide rail (104); One end of the SMA wire (116) is connected with the third slider (106), the other end is connected with the second slider (103), and the pulling rope (118) is also connected with the second slider (103), and the pulling rope (118) is provided with loading weight (119) away from one end of the SMA wire (116), and the loading weight (119) can apply load to the SMA wire (116).

3. The shape memory alloy wire training and performance testing platform of claim 2, wherein, The first slider (102) is two, mounting base plate (105) is arranged on the two first sliders (102), and the two first sliders (102) are connected as a whole by the mounting base plate (105), and the second guide rail (104) is arranged on the mounting base plate (105).

4. The shape memory alloy wire training and performance testing platform of claim 2, wherein, A first hook table (112) and a second hook table (113) are arranged on the second slider (103), the first hook table (112) and the second hook table (113) are arranged in sequence along the length direction of the second guide rail (104) and are fixedly connected with the second slider (103); wherein the first hook table (112) is detachably connected with the end of the SMA wire (116), and the second hook table (113) is detachably connected with the pulling rope (118).

5. The shape memory alloy wire training and performance testing platform of claim 2, wherein, The test track group (1a) further comprises: A fifth slider (108) is arranged on the first guide rail (101), the fifth slider (108) is located between the third slider (106) and the first slider (102), a displacement sensor (307) is arranged on the fifth slider (108), a light barrier (114) is arranged at the end of the SMA wire (116), and the displacement sensor (307) can obtain the length of the SMA wire (116) by detecting the position of the light barrier (114).

6. The shape memory alloy wire training and performance testing platform of claim 1, wherein, The positive and negative poles of the data acquisition power supply (304) are respectively connected with the two ends of the SMA wire (116), the current sensor (305) is connected in series between the data acquisition power supply (304) and the SMA wire (116), so that the measurement port of the current sensor (305) is electrically connected with the SMA wire (116), current can flow through the SMA wire (116) and be detected by the current sensor (305); the voltage sensor (306) is connected in parallel at the two ends of the SMA wire (116) for measuring the voltage at the two ends of the SMA wire (116).

7. The shape memory alloy wire training and performance testing platform according to claim 1, wherein, The infrared temperature measuring instrument (302) is arranged near the SMA wire (116) by the mechanical arm (303) and can measure the temperature of the SMA wire (116); The displacement sensor (307) is arranged above the SMA wire (116), and a light barrier (114) movable with the end of the SMA wire (116) is arranged at the other end of the SMA wire (116), and the displacement sensor (307) can measure the length of the SMA wire (116) through the light barrier (114); The force sensor (308) is fixedly arranged in the training and testing mechanism (1), the measurement port of the force sensor (308) is connected with one end of the SMA wire (116), so that the force sensor (308) can measure the tension of the SMA wire (116).

8. The shape memory alloy wire training and performance testing platform of claim 1, wherein, The SMA wire power supply mechanism (2) further comprises: The first mounting rack (203) is a multi-layer structure, and the SMA wire power supply (201) is mounted on the first mounting rack (203).

9. The shape memory alloy wire training and performance testing platform of claim 1, wherein, The data acquisition mechanism (3) further comprises: Second mounting rack (309), it is multilayer structure, the data acquisition card (301), data acquisition power supply (304), current sensor (305), voltage sensor (306) are placed in each layer of second mounting rack (309) after the foregoing circuit connection.

10. The shape memory alloy wire training and performance testing platform of claim 1, wherein, The shape memory alloy wire training and performance testing platform further comprises: The testing platform (4) comprises a movable table body (401) and a breadboard (402); The training testing mechanism (1), the SMA wire power supply mechanism (2), the data acquisition mechanism (3), and the breadboard (402) are arranged on the tabletop of the movable table body (401).

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