Probe interval adjusting device and system

Abstract

The invention relates to the technical field of battery module testing, and particularly provides a probe interval adjusting device and system. The probe interval adjusting device comprises an assembly fixing plate and a plurality of probe assemblies, wherein the assembly fixing plate extends along a first direction; the assembly fixing plate comprises a sliding part and a limiting part; the sliding part is provided with a sliding groove extending in the first direction, and the limiting part is provided with a plurality of limiting grooves with openings facing the third direction. Each probe assembly comprises a limiting containing part, a limiting part, a first sliding block and a probe fixing plate. On the basis of the probe interval adjusting device, the limiting end can be inserted into or moved out of the limiting groove only by adjusting the position of the limiting piece in the containing cavity in the third direction, and state adjustment of the limiting piece is achieved; under the condition that the limiting piece is in the unlocking state, the probe assembly can slide along the sliding groove based on the first sliding block, then the distance between the adjacent probes is changed, rapid adjustment of the positions of the probes is achieved, and the adjustment difficulty of the positions of the probes is reduced.

Description

Technical Field

[0001] The present application relates to the technical field of battery module testing, and in particular to a probe spacing adjustment device and system. Background Art

[0002] Module testing is an important process in the production of battery modules. It is mainly responsible for testing the current, voltage and insulation withstand voltage of each cell in the battery module to determine whether the cell is damaged or leaking. During the test, it is necessary to establish an electrical connection between the test equipment and the battery pole based on the probe. The position of the probe is usually fixed based on a fixed probe plate or a split adjustable fixing plate.

[0003] Among them, the fixed probe board needs to be customized. The probe position on each fixed probe board is fixed based on the position of the battery cell pole of the module to be tested. When the distance between the battery cell poles changes, the probe position needs to be adjusted by replacing the probe board. During the replacement of the probe board, each probe needs to be rewired. The workload of replacing the probe board is large, resulting in a long time and difficulty in adjusting the probe position.

[0004] The split adjustment fixing plate can utilize the cooperation of through holes and tooth holes to achieve position adjustment between adjacent probes; however, during each adjustment process, the probes need to be loosened and locked, which is cumbersome and will increase the time and difficulty of adjusting the probe positions.

[0005] Therefore, the existing probe position adjustment method has the technical defects of long adjustment time and great difficulty. Summary of the invention

[0006] In view of this, an object of the embodiments of the present application is to provide a probe spacing adjustment device and system to solve the technical problems of the existing probe position adjustment method, which has a long adjustment time and high difficulty.

[0007] In a first aspect, an embodiment of the present application provides a probe interval adjustment device, the device comprising: a component fixing plate extending along a first direction and a plurality of probe components;

[0008] The component fixing plate comprises a sliding portion and a limiting portion; the sliding portion is provided with a sliding groove extending along the first direction and opening toward the second direction, and the limiting portion is provided with a plurality of limiting grooves opening toward the third direction; the second direction and the third direction are respectively perpendicular to the first direction;

[0009] Each of the probe assemblies comprises a limiting accommodating member, a limiting member, a first sliding block and a probe fixing plate;

[0010] The position-limiting container is provided with a housing cavity with a housing opening facing the third direction, and the housing opening is arranged on a side close to the position-limiting groove; the position-limiting container is movably arranged in the housing cavity along the third direction; the first slider is fixedly connected to the position-limiting container and is slidably connected to the slide groove; the probe fixing plate is fixedly connected to the position-limiting container, and a probe hole for fixing the probe is arranged on the probe fixing plate;

[0011] Wherein, the limiting member includes a locking state and an unlocking state; when the limiting member is in the locking state, the limiting end of the limiting member close to the limiting groove is inserted into the limiting groove to achieve position locking of the probe assembly; when the limiting member is in the unlocking state, the limiting end moves out of the limiting groove to achieve position unlocking of the probe assembly.

[0012] In the above implementation process, the probe spacing adjustment device includes: a component fixing plate extending along a first direction and a plurality of probe components; the component fixing plate includes a sliding part and a limiting part; the sliding part is provided with a slide groove extending along the first direction and opening toward the second direction, and the limiting part is provided with a plurality of limiting grooves opening toward a third direction; each of the probe components includes a limiting accommodating member, a limiting member, a first slider and a probe fixing plate. Based on the probe spacing adjustment device, the limiting end can be inserted into or removed from the limiting groove by only adjusting the position of the limiting member in the accommodating cavity along the third direction, so as to adjust the state of the limiting member; when the limiting member is in an unlocked state, the probe component can slide along the slide groove based on the first slider to adjust the position of the probe component, thereby changing the distance between adjacent probes, realizing rapid adjustment of the probe position, and reducing the difficulty of adjusting the probe position. The technical problems of the long adjustment time and high difficulty of the existing probe position adjustment method are solved.

[0013] Optionally, in the embodiment of the present application, a shift hole communicating with the accommodating cavity is formed on a side of the position-limiting accommodating member away from the sliding groove, and the position-limiting member includes a shift block protruding from the shift hole out of the position-limiting accommodating member.

[0014] In the above implementation process, since the limiting member includes a toggle block protruding from the toggle hole out of the limiting accommodation member, the position of the probe assembly can be adjusted by moving the toggle block, further reducing the difficulty of adjusting the probe position.

[0015] Optionally, in an embodiment of the present application, the probe assembly further includes: an elastic member arranged in the accommodating cavity; one end of the elastic member contacts one end of the limiting member away from the limiting groove, and the other end contacts an inner wall of the accommodating cavity of the limiting accommodating member away from the limiting groove; wherein, when the elastic member is in a normal state, the limiting end is inserted into the limiting groove.

[0016] In the above-mentioned implementation process, an elastic member is arranged in the accommodating cavity, and the elastic member is compressed by moving the toggle block so as to move the limiting end of the limiting member out of the limiting groove, thereby unlocking the position of the probe assembly; after controlling the probe assembly to slide to a specified position along the slide groove based on the first slider, the toggle block is released, and as the elastic member returns to a normal state, the limiting end is automatically inserted into the corresponding limiting groove, thereby locking the position of the probe assembly; the difficulty of adjusting the probe position is further reduced.

[0017] Optionally, in an embodiment of the present application, the device further includes: a driving member and a shift fork; the driving member is fixedly connected to the shift fork; the driving member is configured to drive the shift fork to perform a linear reciprocating motion between the limit groove and the shift block; the shift fork is configured to move away from the shift block during the linear reciprocating motion, or to push the shift block to compress the elastic member so that the limit end moves out of the limit groove.

[0018] In the above implementation process, the driving member can drive the shift fork away from the shift block, or push the shift block to compress the elastic member, so as to achieve the state switching of the probe assembly between the locked state and the unlocked state.

[0019] Optionally, in an embodiment of the present application, the shift fork comprises a first shift piece, a second shift piece and a third shift piece; the shift fork is specifically configured to push the shift block to compress the elastic member based on the first shift piece, so that the limiting end moves out of the limiting groove;

[0020] The device also includes: a first driving mechanism, a first slide rail and a second slider; the track direction of the first slide rail is parallel to the first direction; the first slide rail and the second slider are slidably connected; the first driving mechanism is configured to drive the second slider to slide along the track direction of the first slide rail; the second slider is fixedly connected to the driving member; the second slider is configured to drive the driving member to move along the first direction; the shift fork is further configured to push the shift block to move along the first direction based on the second paddle or the third paddle after the first paddle pushes the shift block to compress the elastic member so that the limiting end moves out of the limiting groove.

[0021] In the above implementation process, the second slider can be driven to slide along the track direction of the first slide rail through the first driving mechanism, so as to drive the shift fork on the driving member fixedly connected to the second slider to move along the first direction. The first paddle of the shift fork can push the shift block to compress the elastic member to unlock the position of the probe assembly, and after unlocking, the second paddle or the third paddle pushes the shift block to move along the first direction to change the position of the probe assembly. Based on the probe spacing adjustment device, the probe position can be automatically adjusted, which further reduces the difficulty of adjusting the probe position.

[0022] Optionally, in an embodiment of the present application, the device further comprises: a position detector fixedly connected to the driving member; the position detector is configured to detect position information of the toggle block.

[0023] In the above implementation process, the position information of the toggle block can be detected by the position detector, and the position information of the corresponding probe assembly can be determined according to the position information of the toggle block to realize the position detection of the probe assembly.

[0024] Optionally, in an embodiment of the present application, the limit end includes n first limit bars, and the limit groove includes at least n+1 second limit bars; wherein n is a positive integer, and the first distance between two adjacent first limit bars is equal to the second distance between two adjacent second limit bars.

[0025] In the above implementation process, since the limiting end includes multiple first limiting strips and the limiting groove includes multiple second limiting strips, the position locking of the probe assembly can be achieved through the first limiting strips and the second limiting strips at different positions, thereby improving the position adjustment accuracy of the probe assembly.

[0026] Optionally, in an embodiment of the present application, the limiting strip includes straight-up portions on both sides and a guide portion at the end; wherein the limiting strip includes the first limiting strip and the second limiting strip.

[0027] In the above implementation process, the guide part can guide the positional relationship between the first limit bar and the second limit bar, which helps to smoothly engage the first limit bar and the second limit bar to avoid jamming; the straightening part can improve the position stability of the probe assembly in the locked state.

[0028] In a second aspect, an embodiment of the present application provides a probe spacing adjustment system, the system comprising: two probe spacing adjustment devices as described in any one of the first aspects above, arranged in mirror symmetry, a second slide rail with a guide rail direction perpendicular to a component fixing plate of each of the probe spacing adjustment devices, a third slider, a fourth slider, a second drive mechanism, positive and negative screw rods, a first nut and a second nut;

[0029] One end of the two component fixing plates is fixedly connected to the first nut and the second nut respectively, and the other end of the two component fixing plates is fixedly connected to the third slider and the fourth slider respectively;

[0030] The third slider and the fourth slider are respectively slidably connected to the second slide rail, and the spacing distance between the third slider and the fourth slider is equal to the spacing distance between the first nut and the second nut;

[0031] The second driving mechanism is configured to provide rotational power for the forward and reverse screw rods; the forward and reverse screw rods are configured to drive the first nut to move forward along the forward and reverse screw rods based on the rotational power, and drive the second nut to move reversely along the forward and reverse screw rods;

[0032] The first nut and the second nut are configured to drive the two component fixing plates to move closer to or farther from each other along the guide rail direction of the second slide rail based on the rotational power.

[0033] In the above implementation process, the probe spacing adjustment system includes: two probe spacing adjustment devices as described in any of the above first aspects, which are arranged in mirror symmetry, a second slide rail whose guide rail direction is perpendicular to the component fixing plate of each of the probe spacing adjustment devices, a third slider, a fourth slider, a second drive mechanism, a forward and reverse screw rod, a first nut and a second nut. The second drive mechanism provides the rotational power of the forward and reverse screw rod, and the forward and reverse screw rod drives the first nut and the second nut to move forward / reverse along the forward and reverse screw rod based on the rotational power, thereby driving the two component fixing plates to move closer to or away from each other, and the interval between the two probe spacing adjustment devices in the guide rail direction of the second slide rail is adjusted to change the distance of the probe assembly in the guide rail direction, thereby realizing rapid adjustment of the probe position.

[0034] Optionally, in an embodiment of the present application, the ends of the other ends of the two component fixing plates are respectively fixedly connected to the third slider and the fourth slider; the system also includes: a third slide rail, a fifth slider and a sixth slider of the component fixing plate whose guide direction is perpendicular to each of the probe spacing adjustment devices; the ends of one end of the two component fixing plates are respectively fixedly connected to the fifth slider and the sixth slider; the fifth slider and the sixth slider are respectively slidably connected to the third slide rail, and the spacing distance between the fifth slider and the sixth slider is equal to the spacing distance between the first nut and the second nut.

[0035] In the above implementation process, slide rails and sliders are provided at the ends of both ends of the component fixing plate to further provide guarantee for the stable movement of the component fixing plate in the direction of the guide rails.

[0036] The beneficial effects of the present application include at least: based on the probe spacing adjustment device, the limit end can be inserted into or removed from the limit groove by adjusting the position of the limiter in the accommodating cavity along the third direction, thereby adjusting the state of the limiter; when the limiter is in the unlocked state, the probe assembly can slide along the slide groove based on the first slider, thereby changing the distance between adjacent probes, thereby realizing rapid adjustment of the probe position and reducing the difficulty of adjusting the probe position. The technical problems of the existing probe position adjustment method, which has long adjustment time and high difficulty, are solved. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments of the present application will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0038] Figure 1 A schematic diagram of the structure of a probe spacing adjustment device provided in an embodiment of the present application;

[0039] Figure 2 Schematic diagram of the limiting member provided in the embodiment of the present application in a locked state and an unlocked state respectively;

[0040] Figure 3 A schematic diagram of the structure of another probe spacing adjustment device provided in an embodiment of the present application;

[0041] Figure 4 A schematic diagram of the structure of a limit bar provided in an embodiment of the present application;

[0042] Figure 5 A schematic diagram of the structure of a probe spacing adjustment system provided in an embodiment of the present application.

[0043] Reference numerals: 01-probe spacing adjustment device; 10-assembly fixing plate; 101-sliding portion; 1010-sliding groove; 102-limiting portion; 1020-limiting groove; 20-probe assembly; 201-limiting accommodating member; 2010-accommodating cavity; 202-limiting member; 2020-limiting end; 2021-sliding block; 203-first sliding block; 204-probe fixing plate; 2040-probe hole; 205-elastic member; 3 0-driving member; 40-shift fork; 50-first driving mechanism; 60-first slide rail; 70-second slider; 80-position detector; 02-probe spacing adjustment system; 021-second slide rail; 022-third slider; 023-fourth slider; 024-second driving mechanism; 025-positive and negative screw rods; 026-first nut; 027-second nut; 028-third slide rail; 029-fifth slider; 0210-sixth slider. DETAILED DESCRIPTION

[0044] The following embodiments of the technical solution of the present application are described in detail in conjunction with the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present application, and are therefore only used as examples, and cannot be used to limit the scope of protection of the present application.

[0045] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application.

[0046] In the description of the embodiments of the present application, the technical terms "first", "second", etc. are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features. In the description of the embodiments of the present application, the meaning of "multiple" is two or more, unless otherwise clearly and specifically defined.

[0047] See also Figure 1 A schematic structural diagram of a probe spacing adjustment device 01 provided in an embodiment of the present application is shown. Figure 1 Specifically shown is a schematic diagram of a front view structure of the probe spacing adjustment device 01. The probe spacing adjustment device 01 comprises: a component fixing plate 10 extending along a first direction and a plurality of probe components 20;

[0048] The component fixing plate 10 includes a sliding portion 101 and a limiting portion 102; the sliding portion 101 is provided with a sliding groove 1010 extending along the first direction and opening toward the second direction, and the limiting portion 102 is provided with a plurality of limiting grooves 1020 opening toward the third direction; the second direction and the third direction are respectively perpendicular to the first direction;

[0049] Each probe assembly 20 includes a limiting accommodating member 201, a limiting member 202, a first slider 203 and a probe fixing plate 204;

[0050] The limiting container 201 is provided with a containing cavity 2010 with a containing opening facing the third direction, and the containing opening is arranged on a side close to the limiting groove 1020; the limiting component 202 is movably arranged in the containing cavity 2010 along the third direction; the first slider 203 is fixedly connected to the limiting container 201 and is slidably connected to the slide groove 1010; the probe fixing plate 204 is fixedly connected to the limiting container 201, and a probe hole 2040 for fixing the probe is opened on the probe fixing plate 204;

[0051] Among them, the limit member 202 includes a locked state and an unlocked state; when the limit member 202 is in the locked state, the limit end 2020 of the limit member 202 close to the limit groove 1020 is inserted into the limit groove 1020 to achieve position locking of the probe assembly 20; when the limit member 202 is in the unlocked state, the limit end 2020 moves out of the limit groove 1020 to achieve position unlocking of the probe assembly 20.

[0052] The first direction may be consistent with the arrangement direction of the cells in the battery module to be tested, and by adjusting the position of the probe assembly 20 on the assembly fixing plate 10 along the first direction, module testing of the battery modules to be tested with different cell thicknesses may be achieved. The cross-section (perpendicular to the cross-section of the first aspect) of the slide 1010 may be rectangular, T-shaped (specifically, an inverted T-shaped to better limit the moving direction of the first slider 203 to the first direction), trapezoidal, or other reasonable shapes. Figure 1 The case where the cross-sectional shape of the slide groove 1010 is an inverted T shape is specifically shown. The number of limit grooves 1020 can be 30, or 100, 150 or other reasonable values; the number of limit grooves 1020 can be adjusted based on the actual conditions such as the probe position adjustment accuracy and the number of cells included in the battery module to be tested. A plurality of limit grooves 1020 can be evenly distributed in the limit portion 102 of the component fixing plate 10, and the distribution of the plurality of limit grooves 1020 in the limit portion 102 can also be adjusted according to actual needs. The angle between the second direction and the third direction can be 30°, 60°, 90° or other reasonable values; wherein, "the angle between the second direction and the third direction is 90°" means that the second direction and the third direction are perpendicular to each other.

[0053] The shape and size of the accommodating cavity 2010 can be adjusted according to the specific shape and size of the limiting member 202. Since the limiting member 202 is movably arranged in the accommodating cavity 2010 along the third direction, and the opening direction of the limiting groove 1020 is also the third direction, when the accommodating opening of the accommodating cavity 2010 is aligned with the opening of the limiting groove 1020, the position of the probe assembly 20 on the component fixing plate 10 can be locked by moving the position of the limiting member 202 in the accommodating cavity 2010 so that the limiting end 2020 of the limiting member 202 is inserted into the limiting groove 1020; and the position of the probe assembly 20 on the component fixing plate 10 can be unlocked by moving the limiting member 202 so that the limiting end 2020 moves out of the limiting groove 1020. When the position of the probe assembly 20 on the assembly fixing plate 10 is unlocked, the first slider 203 is provided with moving power along the slide groove 1010, so that the probe assembly 20 can be driven to move along the first direction based on the movement of the first slider 203 along the slide groove 1010, thereby changing the position of the probe assembly 20 and the spacing between adjacent probe assemblies 20. By changing the spacing between adjacent probe assemblies 20, the distance between two adjacent probe holes 2040 for fixing probes can be changed, thereby achieving the adjustment of the spacing between adjacent probes.

[0054] Among them, the module test of the square shell battery module or the blade battery module can be realized based on the probe spacing adjustment device 01. Taking the blade battery module as an example, when the spacing distance between adjacent probe assemblies 20 (i.e., the spacing between adjacent probes) is adjusted based on the probe spacing adjustment device 01, the battery cell pole test on one side of the blade battery module can be realized through the probe fixed on the probe hole 2040; after adjusting the direction of the blade battery module, the battery cell pole test on the other side of the blade battery module can be realized through the probe fixed on the probe hole 2040.

[0055] It can be seen that the probe spacing adjustment device 01 provided in the embodiment of the present application includes: a component fixing plate 10 extending along a first direction and a plurality of probe components 20; the component fixing plate 10 includes a sliding part 101 and a limiting part 102; the sliding part 101 is provided with a sliding groove 1010 extending along the first direction and opening toward the second direction, and the limiting part 102 is provided with a plurality of limiting grooves 1020 opening toward the third direction; each of the probe components 20 includes a limiting accommodating member 201, a limiting member 202, a first slider 203 and a probe fixing plate 204. Based on the probe spacing adjustment device 01, it is only necessary to adjust the position of the limiter 202 in the accommodating cavity 2010 along the third direction, so that the limiter end 2020 can be inserted into or removed from the limiter groove 1020 to adjust the state of the limiter 202; when the limiter 202 is in the unlocked state, the probe assembly 20 can slide along the slide groove 1010 based on the first slider 203 to adjust the position of the probe assembly 20, thereby changing the distance between adjacent probes, achieving rapid adjustment of the probe position, and reducing the difficulty of adjusting the probe position. The technical problems of the existing probe position adjustment method, which has a long adjustment time and is difficult, are solved.

[0056] Please refer to Figure 2 , Figure 2 Schematic diagram of the limiting member 202 provided in the embodiment of the present application in a locked state and an unlocked state respectively; and Figure 2 The probe orientation shown is similar to Figure 1 The probes are shown facing in the opposite direction. Figure 2 The left side specifically shows a schematic diagram of the position-limiting member 202 in a locked state, and the right side specifically shows a schematic diagram of the position-limiting member 202 in an unlocked state. In some optional embodiments, a toggle hole communicating with the accommodation cavity 2010 is provided on a side of the position-limiting accommodation member 201 away from the slide slot 1010, and the position-limiting member 202 includes a toggle block 2021 protruding from the toggle hole out of the position-limiting accommodation member 201.

[0057] Among them, when the toggle block 2021 is at the end of the toggle hole close to the limit slot 1020, it is necessary to ensure that the limit end 2020 can be inserted into the limit slot 1020 to achieve the position locking of the probe assembly 20; and when the toggle block 2021 is at the end of the toggle hole away from the limit slot 1020, it is necessary to ensure that the limit end 2020 can be moved out of the limit slot 1020 to achieve the position unlocking of the probe assembly 20.

[0058] In some optional embodiments, the probe assembly 20 also includes: an elastic member 205 disposed in the accommodating cavity 2010; one end of the elastic member 205 contacts one end of the limiting member 202 away from the limiting groove 1020, and the other end contacts the inner wall of the accommodating cavity of the limiting accommodating member 201 away from the limiting groove 1020; wherein, when the elastic member 205 is in a normal state, the limiting end 2020 is inserted into the limiting groove 1020.

[0059] Among them, the elastic member 205 can be implemented by a spring, such as a cylindrical coil spring or a rubber spring. The elastic member 205 is in a normal state, which means that the elastic member is neither subjected to a compressive external force nor subjected to a tensile external force. After the elastic member 205 is compressed by moving the toggle block 2021 to move the limiting end 2020 of the limiting member 202 out of the limiting groove 1020 to unlock the position of the probe assembly 20, the probe assembly 20 can be first controlled to slide along the slide groove 1010 to a specified locking position based on the first slider 203, and the toggle block 2021 is released at the specified locking position. Based on the restoring elastic force of the elastic member 205, the limiting end 2020 can be automatically inserted into the limiting groove 1020 to lock the position of the probe assembly 20. The difficulty of adjusting the probe position can be further reduced.

[0060] In some optional embodiments, the probe spacing adjustment device 01 also includes: a driving member 30 and a fork 40; the driving member 30 is fixedly connected to the fork 40; the driving member 30 is configured to drive the fork 40 to perform a linear reciprocating motion between the limit groove 1020 and the toggle block 2021; the fork 40 is configured to move away from the toggle block 2021 during the linear reciprocating motion, or push the toggle block 2021 to compress the elastic member 205, so that the limit end 2020 moves out of the limit groove 1020.

[0061] The driving member 30 may be implemented by a cylinder or a hydraulic cylinder, etc. The driving member 30 can drive the shift fork 40 away from the shift block 2021, or push the shift block 2021 to compress the elastic member 205, so as to switch the probe assembly 20 between the locked state and the unlocked state.

[0062] Please refer to Figure 3 , Figure 3 This is a schematic diagram of the structure of another probe spacing adjustment device 01 provided in an embodiment of the present application. It should be noted that: Figure 3 Specifically shown is a left-side structural schematic diagram of the probe spacing adjustment device 01 .

[0063] In some optional embodiments, the shift fork 40 includes a first shift piece, a second shift piece, and a third shift piece; the shift fork 40 is specifically configured to push the shift block 2021 to compress the elastic member 205 based on the first shift piece, so that the limiting end 2020 moves out of the limiting groove 1020;

[0064] The probe spacing adjustment device 01 further includes: a first driving mechanism 50, a first slide rail 60 and a second slider 70; the track direction of the first slide rail 60 is parallel to the first direction; the first slide rail 60 and the second slider 70 are slidably connected; the first driving mechanism 50 is configured to drive the second slider 70 to slide along the track direction of the first slide rail 60; the second slider 70 is fixedly connected to the driving member 30; the second slider 70 is configured to drive the driving member 30 to move along the first direction;

[0065] The shift fork 40 is further configured to push the shift block 2021 to move along the first direction based on the second shift piece or the third shift piece after the first shift piece pushes the shift block 2021 to compress the elastic member 205 so that the limiting end 2020 moves out of the limiting groove 1020 .

[0066] Among them, the first paddle, the second paddle and the third paddle can be implemented by rectangular paddles or arc-shaped paddles. The implementation methods of the first paddle, the second paddle and the third paddle can be the same or different. The first paddle, the second paddle and the third paddle can be all implemented by rectangular paddles; or the first paddle is implemented by a rectangular paddle, and the second paddle and the third paddle are implemented by arc-shaped paddles. Specifically, taking the first paddle, the second paddle and the third paddle are all implemented by rectangular paddles as an example, the first paddle can be specifically arranged between the toggle block 2021 and the limit groove 1020, and the paddle surface of the first paddle is perpendicular to the third direction; the second paddle and the third paddle can be specifically perpendicular to the first paddle and arranged on the side of the first paddle away from the limit groove 1020; the second paddle or the third paddle can be at a certain interval with the first paddle, or can be in contact with the first paddle. The first driving mechanism 50 can be implemented by a motor, a cylinder or a hydraulic cylinder. The first slide rail 60 can be implemented by a screw-nut matching structure or a linear slide rail. When the first slide rail 60 is implemented by a screw-nut matching structure, the track direction of the first slide rail 60 refers to the moving direction of the nut along the screw. The first driving mechanism 50 can drive the second slider 70 to slide along the track direction of the first slide rail 60, so as to drive the fork 40 on the driving member 30 fixedly connected to the second slider 70 to move along the first direction. The first paddle of the fork 40 can push the toggle block 2021 to compress the elastic member 205, so as to unlock the position of the probe assembly 20, and after unlocking, the toggle block 2021 is pushed to move along the first direction based on the second paddle or the third paddle to change the position of the probe assembly 20, thereby realizing the automatic adjustment of the probe position. It can be understood that the second paddle and the third paddle can respectively push the toggle block 2021 to move in the opposite direction of the first direction.

[0067] In some optional embodiments, the probe interval adjustment device 01 further includes: a position detector 80 fixedly connected to the driving member; the position detector 80 is configured to detect position information of the toggle block 2021 .

[0068] Among them, the position detector 80 may include an in-position detector or an anti-fool detector; it may also include a position detector and an anti-fool detector at the same time. The position detector 80 can detect the position information of the toggle block 2021, and the position information of the corresponding probe assembly 20 can be determined according to the position information of the toggle block 2021 to realize the position detection of the probe assembly 20. It can be determined according to the position detector 80 whether the fork 40 moves to the specified probe adjustment position. When the fork 40 moves to the specified probe adjustment position, the fork 40 is controlled to adjust the position of the probe assembly 20 at the specified position.

[0069] Please refer to Figure 4 , Figure 4 A schematic diagram of the structure of a limit bar provided in an embodiment of the present application. In some optional embodiments, the limit end 2020 includes n first limit bars, and the limit groove 1020 includes at least n+1 second limit bars; wherein n is a positive integer, and the first distance between two adjacent first limit bars is equal to the second distance between two adjacent second limit bars.

[0070] Wherein, n can be 1, 3, 6, 8 or other reasonable values; when n is 3, the number of second limit bars included in the limit slot 1020 can be 4, 6, 9 or other reasonable values. When the number of second limit bars included in the limit slot 1020 is greater than n+1, the n first limit bars included in the limit end 2020 can be buckled with different second limit bars of the limit slot 1020 to fix the limit end 2020 at different positions of the same limit slot 1020. Multiple limit slots 1020 can be arranged continuously or at intervals, and this application does not make specific restrictions on this. Figure 4 Specifically, the limiting end 2020 includes four first limiting strips, and a plurality of limiting grooves 1020 are continuously arranged, and the dotted frame represents one limiting groove 1020. Since the limiting end 2020 includes a plurality of first limiting strips, and the limiting groove 1020 includes a plurality of second limiting strips, the position locking of the probe assembly 20 can be achieved through the first limiting strips and the second limiting strips at different positions, thereby improving the position adjustment accuracy of the probe assembly 20.

[0071] In some optional embodiments, the limiting strip includes straight-up portions on both sides and a guiding portion at the end; wherein the limiting strip includes a first limiting strip and a second limiting strip.

[0072] The limiting strip may include a plurality of limiting edges, the straight-lift portion may include a limiting edge with an angle greater than 80° with the "surface of the limiting portion 102 close to the limiting member 202", and the guide portion may include a limiting edge with an angle less than or equal to 50° with the "surface of the limiting portion 102 close to the limiting member 202". The guide portion may guide the positional relationship between the first limiting strip and the second limiting strip, which helps the first limiting strip and the second limiting strip to be smoothly engaged and avoid jamming; the straight-lift portion may improve the positional stability of the probe assembly 20 in the locked state.

[0073] In some optional embodiments, the lifting portion may specifically include a limiting edge with an angle greater than 85° to the "surface of the limiting portion 102 close to the limiting member 202", and the guiding portion may specifically include a limiting edge with an angle less than or equal to 45° to the "surface of the limiting portion 102 close to the limiting member 202".

[0074] Please refer to Figure 5 , Figure 5 This is a schematic diagram of the structure of a probe spacing adjustment system 02 provided in an embodiment of the present application. It should be noted that: Figure 5 Specifically shown is a schematic diagram of the top view of the structure of the probe spacing adjustment system 02. The probe spacing adjustment system 02 comprises: two probe spacing adjustment devices 01 as described in any one of the first aspects above, arranged in mirror symmetry, a second slide rail 021 whose guide rail direction is perpendicular to the component fixing plate of each probe spacing adjustment device 01, a third slider 022, a fourth slider 023, a second driving mechanism 024, a forward and reverse screw rod 025, a first screw nut 026 and a second screw nut 027;

[0075] One end of the two component fixing plates is fixedly connected to the first nut 026 and the second nut 027 respectively, and the other end of the two component fixing plates is fixedly connected to the third slider 022 and the fourth slider 023 respectively;

[0076] The third slider 022 and the fourth slider 023 are respectively slidably connected to the second slide rail 021 , and the spacing distance between the third slider 022 and the fourth slider 023 is equal to the spacing distance between the first nut 026 and the second nut 027 ;

[0077] The second driving mechanism 024 is configured to provide a rotational force to the forward and reverse screw rod 025; the forward and reverse screw rod 025 is configured to drive the first nut 026 to move forward along the forward and reverse screw rod 025 based on the rotational force, and drive the second nut 027 to move backward along the forward and reverse screw rod 025;

[0078] The first nut 026 and the second nut 027 are configured to drive the two component fixing plates to move closer to or farther from each other along the guide rail direction of the second slide rail 021 based on the rotational power.

[0079] The second driving mechanism 024 can be realized by a motor, a cylinder or a hydraulic cylinder, etc. The second driving mechanism 024 provides the rotational power of the forward and reverse screw rod 025, and the forward and reverse screw rod 025 drives the first screw nut 026 and the second screw nut 027 to move forward / reverse along the forward and reverse screw rod 025 based on the rotational power, thereby driving the two component fixing plates to move closer to or away from each other, and by adjusting the interval between the two probe spacing adjustment devices 01 in the guide rail direction of the second slide rail 021, the distance between the probe components in the guide rail direction is changed, so as to realize the rapid adjustment of the probe position.

[0080] Among them, when the battery module to be tested is realized by a square shell battery module, the module test of two square shell battery modules can be simultaneously realized based on the probe spacing adjustment system 02; when the battery module to be tested is realized by a blade battery module, the battery cell pole test on both sides of the blade battery module can be simultaneously realized based on the probe spacing adjustment system 02.

[0081] In some optional embodiments, the ends of the other ends of the two component fixing plates are respectively fixedly connected to the third slider 022 and the fourth slider 023; the probe spacing adjustment system 02 also includes: a third slide rail 028, a fifth slider 029 and a sixth slider 0210 of the component fixing plate whose guide direction is perpendicular to each probe spacing adjustment device 01; the ends of one end of the two component fixing plates are respectively fixedly connected to the fifth slider 029 and the sixth slider 0210; the fifth slider 029 and the sixth slider 0210 are respectively slidably connected to the third slide rail 028, and the spacing distance between the fifth slider 029 and the sixth slider 0210 is equal to the spacing distance between the first nut 026 and the second nut 027.

[0082] The third slide rail 028 and the second slide rail 021 can be symmetrically arranged at both ends of the two component fixing plates. By arranging the slide rail and the slider assembly at both ends of the component fixing plates, the stable movement of the component fixing plates in the guide rail direction can be further guaranteed.

[0083] It should be understood that the probe spacing adjustment system 02 corresponds to the above-mentioned embodiment of the probe spacing adjustment device 01. The specific functions of the probe spacing adjustment system 02 can be found in the above description. To avoid repetition, the detailed description is appropriately omitted here.

[0084] In the several embodiments provided in the embodiments of the present application, it should be understood that the disclosed device / system and method can also be implemented in other ways, and the device embodiments described above are only exemplary. The functional modules in the various embodiments of the embodiments of the present application can be integrated together to form an independent part, or each module can exist separately, or two or more modules can be integrated to form an independent part.

[0085] The above description is only an optional implementation manner of the embodiments of the present application, but the protection scope of the embodiments of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or replacements within the technical scope disclosed in the embodiments of the present application, which should be covered within the protection scope of the embodiments of the present application.

Claims

1. A probe spacing adjustment device, characterized in that: The device comprises: a component fixing plate extending along a first direction and a plurality of probe components; The component fixing plate includes a sliding portion and a limiting portion; the sliding portion is provided with a sliding groove extending along the first direction and opening toward the second direction, and the limiting portion is provided with a plurality of limiting grooves opening toward the third direction; the second direction and the third direction are respectively perpendicular to the first direction; Each of the probe assemblies comprises a limiting accommodating member, a limiting member, a first sliding block and a probe fixing plate; The position-limiting container is provided with a housing cavity with a housing opening facing the third direction, and the housing opening is arranged on a side close to the position-limiting groove; the position-limiting container is movably arranged in the housing cavity along the third direction; the first slider is fixedly connected to the position-limiting container and is slidably connected to the slide groove; the probe fixing plate is fixedly connected to the position-limiting container, and a probe hole for fixing the probe is arranged on the probe fixing plate; Wherein, the limiting member includes a locking state and an unlocking state; when the limiting member is in the locking state, the limiting end of the limiting member close to the limiting groove is inserted into the limiting groove to achieve position locking of the probe assembly; when the limiting member is in the unlocking state, the limiting end moves out of the limiting groove to achieve position unlocking of the probe assembly.

2. The device according to claim 1, characterized in that A shifting hole communicating with the accommodating cavity is formed on a side of the position-limiting accommodating member away from the sliding groove, and the position-limiting member comprises a shifting block protruding from the shifting hole out of the position-limiting accommodating member.

3. The device according to claim 2, characterized in that The probe assembly further includes: an elastic member disposed in the accommodating cavity; one end of the elastic member contacts an end of the limiting member away from the limiting groove, and the other end contacts an inner wall of the accommodating cavity of the limiting accommodating member away from the limiting groove; Wherein, when the elastic member is in a normal state, the limiting end is inserted into the limiting groove.

4. The device according to claim 3, characterized in that The device further comprises: a driving member and a shift fork; the driving member is fixedly connected to the shift fork; The driving member is configured to drive the shift fork to perform linear reciprocating motion between the limiting groove and the shifting block; The shift fork is configured to move away from the shift block during the linear reciprocating motion, or to push the shift block to compress the elastic member so that the limiting end moves out of the limiting groove.

5. The device according to claim 4, characterized in that The shift fork comprises a first shift piece, a second shift piece and a third shift piece; the shift fork is specifically configured to push the shift block to compress the elastic member based on the first shift piece, so that the limiting end moves out of the limiting groove; The device further comprises: a first driving mechanism, a first slide rail and a second slide block; the track direction of the first slide rail is parallel to the first direction; The first slide rail is slidably connected to the second slide block; the first driving mechanism is configured to drive the second slide block to slide along the track direction of the first slide rail; The second slider is fixedly connected to the driving member; the second slider is configured to drive the driving member to move along the first direction; The shift fork is further configured to push the shift block to move along the first direction based on the second shift piece or the third shift piece after the first shift piece pushes the shift block to compress the elastic member so that the limiting end moves out of the limiting groove.

6. The device according to claim 4, characterized in that The device further comprises: a position detector fixedly connected to the driving member; the position detector is configured to detect position information of the toggle block.

7. The device according to any one of claims 1 to 6, characterized in that: The limiting end includes n first limiting strips, and the limiting groove includes at least n+1 second limiting strips; Wherein, n is a positive integer, and the first distance between two adjacent first limiting strips is equal to the second distance between two adjacent second limiting strips.

8. The device according to claim 7, characterized in that The limiting strip includes straight-up parts on both sides and a guiding part at the end; wherein the limiting strip includes the first limiting strip and the second limiting strip.

9. A probe spacing adjustment system, characterized in that: The system comprises: two probe spacing adjustment devices as claimed in any one of claims 1 to 8, arranged in mirror-symmetrical manner, a second slide rail whose guide direction is perpendicular to the component fixing plate of each of the probe spacing adjustment devices, a third slider, a fourth slider, a second driving mechanism, positive and negative screw rods, a first screw nut and a second screw nut; One end of the two component fixing plates is fixedly connected to the first nut and the second nut respectively, and the other end of the two component fixing plates is fixedly connected to the third slider and the fourth slider respectively; The third slider and the fourth slider are respectively slidably connected to the second slide rail, and the spacing distance between the third slider and the fourth slider is equal to the spacing distance between the first nut and the second nut; The second driving mechanism is configured to provide rotational power for the forward and reverse screw rods; the forward and reverse screw rods are configured to drive the first nut to move forward along the forward and reverse screw rods based on the rotational power, and drive the second nut to move reversely along the forward and reverse screw rods; The first nut and the second nut are configured to drive the two component fixing plates to move closer to or farther from each other along the guide rail direction of the second slide rail based on the rotational power.

10. The system according to claim 9, characterized in that The ends of the other ends of the two component fixing plates are fixedly connected to the third slider and the fourth slider respectively; The system further comprises: a third slide rail, a fifth slide block and a sixth slide block having a guide rail direction perpendicular to the component fixing plate of each of the probe spacing adjustment devices; The ends of one end of the two component fixing plates are fixedly connected to the fifth slider and the sixth slider respectively; The fifth slider and the sixth slider are respectively slidably connected to the third slide rail, and a spacing distance between the fifth slider and the sixth slider is equal to a spacing distance between the first nut and the second nut.

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