Constraint method, device and equipment for probe rod of ocean platform and readable storage medium

By calculating the probe rod parameters under the action of sea waves, providing appropriate constraint compensation stiffness, the problem of probe rod bending in offshore wind static contact detection is solved, and the stability of probe rod and the accuracy of static contact detection is improved.

CN119167537AActive Publication Date: 2024-12-20CHINA THREE GORGES CORPORATION
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Patent Information

Application Number
CN202411046837.X
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-07-31
Publication Date
2024-12-20
Estimated Expiration
2044-07-31

AI Technical Summary

Technical Problem

During the static contact detection process of offshore wind electricity, the probe rod is prone to bend in the middle section between the ocean platform and the seabed, resulting in the failure to effectively solve the stability problem.

Method used

By calculating the force, bending moment, stiffness and deflection of the wave on the probe rod, the required constraint compensation stiffness is determined, and the specific material and structural components are used to provide constraints to prevent the probe rod from bending under the action of the wave.

Benefits of technology

The stability of the probe rod is improved, ensuring that bending can be effectively avoided under wave conditions, and improving the accuracy and reliability of static touch detection tests.

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Abstract

The invention provides a probe rod restraining method, device and equipment for an ocean platform and a readable storage medium, and the method comprises the steps that the acting force of sea waves on a probe rod is obtained, and the sea wave load on the probe rod is determined based on the acting force; according to the sea wave load and the probe rod length of the probe rod, the bending moment of the probe rod is obtained through operation; determining the first rigidity of the probe rod based on the probe rod modulus and the probe rod inertia moment of the probe rod; based on the probe rod length and a preset probe rod inclination angle, calculating to obtain a first deflection; based on the length of the probe rod, the bending moment and the first deflection, second rigidity is obtained through operation; and based on the first rigidity and the second rigidity, performing operation to obtain constraint compensation rigidity, and constraining the probe rod based on the constraint compensation rigidity. The operation stability of the probe rod can be improved.
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Description

Technical Field

[0001] The embodiments of the present application relate to the field of marine engineering technology, and in particular to a probe constraint method, device, electronic device and computer-readable storage medium for an offshore platform. Background Art

[0002] At present, offshore wind power is developing rapidly, and static penetration testing is a necessary test in geological surveys for offshore wind power. When conducting static penetration testing, it is necessary to insert the probe rod used for penetration into the seabed of the ocean on an offshore platform.

[0003] However, due to the large operating water depth, the static penetration probe rod is prone to bending when the probe rod is located in the middle section between the offshore platform and the seabed. Currently, there is no solution to the problem of excessive bending of the probe rod during static penetration testing on offshore platforms. Summary of the invention

[0004] In view of the above problems, embodiments of the present application are proposed to provide a method, device, electronic device and computer-readable storage medium for restraining a probe rod of an offshore platform that overcome the above problems or at least partially solve the above problems.

[0005] In a first aspect, an embodiment of the present application discloses a probe constraint method for an offshore platform, comprising:

[0006] Acquire the force of the waves on the probe rod, and determine the wave load on the probe rod based on the force;

[0007] Calculating and obtaining the bending moment of the probe rod according to the wave load and the probe rod length of the probe rod;

[0008] Determining a first stiffness of the probe rod based on a probe rod modulus and a probe rod moment of inertia of the probe rod;

[0009] Based on the length of the probe rod and the preset probe rod inclination angle, a first deflection is calculated; the first deflection represents the maximum deformation degree of the probe rod; the preset probe rod inclination angle represents the maximum inclination angle of the probe rod;

[0010] Obtaining a second stiffness by calculation based on the probe rod length, the bending moment and the first deflection;

[0011] Based on the first stiffness and the second stiffness, a constraint compensation stiffness is calculated, and the probe rod is constrained based on the constraint compensation stiffness.

[0012] In a second aspect, an embodiment of the present application discloses a probe restraint device for an offshore platform, the device comprising:

[0013] An action load module, used for obtaining the action force of the waves on the probe rod, and determining the wave load on the probe rod based on the action force;

[0014] A bending moment module, used for calculating the bending moment of the probe rod according to the wave load and the probe rod length of the probe rod;

[0015] A first stiffness module, used for determining a first stiffness of the probe rod based on a probe rod modulus and a probe rod inertia moment of the probe rod;

[0016] A first deflection module is used to calculate and obtain a first deflection based on the length of the probe rod and a preset probe rod inclination angle; the first deflection represents the maximum deformation degree of the probe rod; the preset probe rod inclination angle represents the maximum inclination angle of the probe rod;

[0017] A second stiffness module, used for calculating and obtaining a second stiffness based on the probe rod length, the bending moment and the first deflection;

[0018] The compensation constraint module is used to calculate the constraint compensation stiffness based on the first stiffness and the second stiffness, and constrain the probe rod based on the constraint compensation stiffness.

[0019] In a third aspect, an embodiment of the present application further discloses an electronic device, comprising a processor and a memory, wherein the memory stores programs or instructions that can be run on the processor, and when the program or instructions are executed by the processor, the steps of the probe rod constraint method for an offshore platform as described in the first aspect are implemented.

[0020] In a fourth aspect, an embodiment of the present application further discloses a computer-readable storage medium, on which a program or instruction is stored. When the program or instruction is executed by a processor, the steps of the probe rod constraint method for an offshore platform as described in the first aspect are implemented.

[0021] In the embodiment of the present application, the force of the waves on the probe rod can be obtained, and the wave load on the probe rod can be determined based on the force; the bending moment of the probe rod can be calculated based on the wave load and the probe rod length of the probe rod; the first stiffness of the probe rod can be calculated based on the modulus of the probe rod and the moment of inertia of the probe rod, and the first deflection can be calculated based on the probe rod length and the preset probe rod inclination angle; the second stiffness can be calculated based on the probe rod length, the bending moment and the first deflection; based on the first stiffness and the second stiffness, the constraint compensation stiffness can be accurately calculated, and the probe rod can be constrained based on the constraint compensation stiffness. The constraint compensation stiffness required under specific wave loads can be accurately calculated for various parameters of the probe rod itself, including length, stiffness, bending moment, etc., to prevent the probe rod from bending under the action of waves, and to improve the stability of the probe rod during operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 It is a flow chart of the steps of a probe restraint method for an offshore platform provided in an embodiment of the present application;

[0023] Figure 2 It is a schematic diagram of the operation of the unconstrained probe provided in the embodiment of the present application;

[0024] Figure 3 It is a schematic diagram of the operation of the constrained probe provided in the embodiment of the present application;

[0025] Figure 4 is a flowchart of the steps of another offshore platform probe constraint method provided by an embodiment of the present application;

[0026] Figure 5 It is a block diagram of a probe restraint device for an offshore platform provided in an embodiment of the present application;

[0027] Figure 6 is a block diagram of an electronic device provided in an embodiment of the present application;

[0028] Figure 7 This is a block diagram of another electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0029] The exemplary embodiments of the present application will be described in more detail below with reference to the accompanying drawings. Although the exemplary embodiments of the present application are shown in the accompanying drawings, it should be understood that the present application can be implemented in various forms and should not be limited by the embodiments set forth herein. On the contrary, these embodiments are provided in order to enable a more thorough understanding of the present application and to fully convey the scope of the present application to those skilled in the art.

[0030] refer to Figure 1 , which shows a flow chart of the steps of a probe constraint method for an offshore platform provided in an embodiment of the present application, the method comprising:

[0031] Step 101, obtaining the force of the waves on the probe rod, and determining the wave load on the probe rod based on the force;

[0032] In the embodiment of the present application, the probe rod will enter the ocean. Since the waves in the ocean are fluctuating and flowing, the waves will exert a certain force on the probe rod. There may be one or more forces, and the wave load on the probe rod can be determined based on the forces.

[0033] Step 102, calculating and obtaining the bending moment of the probe rod according to the wave load and the probe rod length of the probe rod;

[0034] In the embodiment of the present application, according to the distribution of the wave load F, the bending moment of the free section of the probe rod is calculated along the probe rod length L, which can be calculated by the following formula:

[0035]

[0036] Where M0(L) represents the bending moment when the probe length is L, F represents the wave load, L represents the probe length, and d represents the derivative.

[0037] Step 103, determining a first stiffness of the probe rod based on the probe rod modulus and the probe rod inertia moment of the probe rod;

[0038] In the disclosed embodiment, the probe modulus and the probe moment of inertia of the probe are obtained to determine the first stiffness. Stiffness refers to the ability of a structure to resist elastic deformation when subjected to force, and is a characterization of the ease of elastic deformation of a material or structure. The elastic modulus refers to the proportional coefficient of stress and strain of a material during the elastic deformation stage. The moment of inertia is a geometric quantity used to describe the property of a cross section resisting bending. The first stiffness of the probe is determined by the probe modulus, i.e., the elastic modulus (E0) and the probe moment of inertia (I0). The elastic modulus and moment of inertia of the probe can be known parameters obtained during design and manufacturing.

[0039] Step 104, calculating and obtaining a first deflection based on the probe rod length and the preset probe rod inclination angle; the first deflection represents the maximum deformation degree of the probe rod; the preset probe rod inclination angle represents the maximum inclination angle of the probe rod;

[0040] In the embodiment of the present application, deflection refers to the linear displacement of the axis of an object in a direction perpendicular to the axis, which can represent the degree of deformation of an object, such as a probe rod, under a bending moment. The preset probe rod inclination angle refers to the corresponding maximum probe rod inclination angle when the probe rod is at the maximum bending degree. The maximum bending degree can be determined according to the requirements of the static penetration test specification. The corresponding maximum probe rod inclination angle can be 2 degrees. The probe rod inclination angle can be the angle formed by connecting the two points of the probe rod head and tail and the connecting line and the offshore platform.

[0041] Based on the probe rod length and the preset probe rod inclination angle, the first deflection is calculated and can be calculated by the following formula:

[0043] y max =2Lsin2°

[0044] Among them, y max It represents the first deflection, that is, the deflection when the maximum probe inclination angle required by the static penetration test specification is 2 degrees, and L represents the length of the probe.

[0045] Since the maximum probe rod inclination angle is 2 degrees, the corresponding calculated first deflection represents the maximum deformation degree of the probe rod.

[0046] Step 105, calculating and obtaining a second stiffness based on the probe rod length, the bending moment and the first deflection;

[0047] In the embodiment of the present application, the required stiffness of the probe rod, i.e., the second stiffness, can be calculated based on the length of the probe rod, the bending moment, and the maximum first deflection. It can be understood that the actual stiffness of the probe rod can be greater than the second stiffness, and the second stiffness just meets the requirement of the preset probe rod inclination angle and is the minimum stiffness required. The second stiffness can be expressed in the following formula:

[0048]

[0049] Among them, y max represents the first deflection of the probe rod, M0 represents the bending moment, L represents the length of the probe rod, (EI) min represents the second stiffness, and d represents the derivative.

[0050] Step 106, based on the first stiffness and the second stiffness, calculate the constraint compensation stiffness, and constrain the probe rod based on the constraint compensation stiffness.

[0051] In the embodiment of the present application, the first stiffness is the stiffness of the probe rod itself, and the second stiffness is the minimum stiffness required to meet the preset probe rod inclination requirements. The difference between the two is the constraint compensation stiffness. The constraint compensation stiffness needs to be provided by an additional constraint component. The corresponding constraint component can be manufactured using specific materials and structures so that the constraint component has the constraint compensation stiffness. The constraint component and the probe rod can be bound or fixed so that the constraint component can provide the constraint compensation stiffness.

[0052] Figure 2 is a schematic diagram of the operation of the unconstrained probe provided by an embodiment of the present disclosure; Figure 2 The invention includes an ocean platform 201, from which a probe rod 202 is inserted into the seabed, and the probe rod 202 is deformed due to the force of the waves.

[0053] Figure 3 is a schematic diagram of the operation of a constrained probe rod provided in an embodiment of the present disclosure; Figure 3 The invention includes an offshore platform 301, from which a probe rod 302 having a constraint assembly 303 is inserted into the seabed, and the probe rod 302 does not deform.

[0054] In summary, in the embodiments of the present application, the force of the waves on the probe rod can be obtained, and the wave load on the probe rod can be determined based on the force; the bending moment of the probe rod can be calculated based on the wave load and the probe rod length of the probe rod; the first stiffness of the probe rod can be calculated based on the modulus of the probe rod and the moment of inertia of the probe rod, and the first deflection can be calculated based on the length of the probe rod and the preset probe rod inclination angle; the second stiffness can be calculated based on the length of the probe rod, the bending moment and the first deflection; based on the first stiffness and the second stiffness, the constraint compensation stiffness can be accurately calculated, and the probe rod can be constrained based on the constraint compensation stiffness. The constraint compensation stiffness required under specific wave loads can be accurately calculated for various parameters of the probe rod itself, including length, stiffness, bending moment, etc., to prevent the probe rod from bending under the action of waves, and to improve the stability of the probe rod during operation.

[0055] refer to Figure 4 , which shows a flow chart of the steps of a probe constraint method for an offshore platform provided in an embodiment of the present application, the method comprising:

[0056] Step 401, obtaining the force of the waves on the probe rod, and determining the wave load on the probe rod based on the force;

[0057] Step 402, calculating and obtaining the bending moment of the probe rod according to the wave load and the probe rod length of the probe rod;

[0058] Step 403, determining a first stiffness of the probe rod based on the probe rod modulus and the probe rod inertia moment of the probe rod;

[0059] Step 404, based on the length of the probe rod and the preset probe rod inclination angle, a first deflection is calculated; the first deflection represents the maximum deformation degree of the probe rod; the preset probe rod inclination angle represents the maximum inclination angle of the probe rod;

[0060] Step 405, calculating and obtaining a second stiffness based on the probe rod length, the bending moment and the first deflection;

[0061] Step 406: Obtain constraint compensation stiffness based on the first stiffness and the second stiffness by calculation, and constrain the probe rod based on the constraint compensation stiffness.

[0062] The above steps 401-406 can refer to the above Figure 1 The contents of the embodiments will not be described in detail here.

[0063] Optionally, the step of obtaining the force of the waves on the probe includes:

[0064] The flow velocity and density of the ocean wave are obtained, and based on the flow velocity and the density, the drag force of the ocean wave is calculated.

[0065] In the disclosed embodiment, the force of the waves on the probe can be the drag force caused by the velocity of the waves, wherein the drag force refers to the force generated by the fluid resistance when an object moves in the fluid. It is related to factors such as the object's speed, shape, surface roughness, and density and viscosity of the fluid.

[0066] The drag force of the waves can be calculated by the velocity and density of the waves, and can be calculated by the following formula:

[0067]

[0068] Among them, F d is the drag force, C d is the drag coefficient, ρ is the seawater density, A is the probe surface area, U max is the seawater speed under extreme working conditions. It is understandable that the seawater speed is variable, and the highest seawater speed (i.e. the seawater speed under extreme working conditions) needs to be used for calculation so that the calculation results can meet the requirements of various seawater speeds, that is, the probe can operate stably without obvious bending under various seawater speeds.

[0069] Optionally, the step of obtaining the force of the waves on the probe includes:

[0070] The acceleration and density of the wave are obtained, and based on the acceleration and the density, the inertia force of the wave is calculated. Inertia force refers to a virtual force generated when the motion state of an object changes due to the inertia of the object. For example, when an object is accelerating or decelerating, the inertia force will be felt.

[0071] Therefore, the acceleration and density of seawater can be obtained, and the inertial force of the wave can be calculated by the following formula:

[0072]

[0073] Among them, F i Represents the inertial force, C M represents the inertia coefficient, V represents the volume of the probe per unit length, U max is the seawater velocity under extreme conditions, Indicates the seawater acceleration under extreme conditions.

[0074] It can be understood that the drag force is the actual force on an object when it moves in a fluid, while the inertial force is a virtual force used to describe the motion state of an object under the action of inertia. When determining the force of waves, these two forces can be used as the acting forces at the same time to determine the wave load.

[0075] In addition, the velocity and acceleration of the waves can be determined by investigating the recent static penetration wave measurement device data in the sea area or the wave monitoring data on the website of the local marine natural resources bureau, based on the distribution law of wave speed, wave height and wavelength. It can also be obtained through sensors placed in the waves.

[0076] Optionally, the step 406 of calculating a constraint compensation stiffness based on the first stiffness and the second stiffness, and constraining the probe rod based on the constraint compensation stiffness includes:

[0077] Sub-step 4061, determining a constraint compensation stiffness based on a difference between the first stiffness and the second stiffness;

[0078] Sub-step 4062, obtaining a target material type of the constraint component, and determining a target material modulus corresponding to the target material type according to a mapping relationship between the material type and the material modulus; the target material modulus represents the deformation resistance of the target material type;

[0079] Sub-step 4063, determining the cross-sectional area of ​​the constraint component based on the constraint compensation stiffness and the target material modulus, and constraining the probe rod based on the constraint component having the cross-sectional area.

[0080] In the embodiment of the present disclosure, the first stiffness is the stiffness of the probe rod itself, and the second stiffness is the stiffness required for the whole. The difference between the first stiffness and the second stiffness is the constraint compensation stiffness.

[0081] When the probe is constrained based on the constraint compensation stiffness, the constraint compensation stiffness can be provided by a constraint component. The constraint component can be made of different materials, and different materials have different material moduli, that is, the elastic modulus of the material. At present, most materials and their corresponding elastic moduli are known, and the mapping relationship between material type and material modulus can be pre-constructed, and then the corresponding target material modulus can be determined according to the target material type of the constraint component obtained.

[0082] Further, the cross-sectional area of ​​the constraint assembly is determined according to the constraint compensation stiffness and the target material modulus, wherein the greater the constraint compensation stiffness, the greater the cross-sectional area of ​​the constraint assembly required. In addition, since the target material modulus represents the deformation resistance of the target material type, the greater the target material modulus, the smaller the cross-sectional area of ​​the constraint assembly required.

[0083] Optionally, the step 4063 of determining the cross-sectional area of ​​the constraint component based on the constraint compensation stiffness and the target material modulus includes:

[0084] Step A1, obtaining the design structure type of the constraint component, and determining the target section formula corresponding to the design structure type according to the mapping relationship between the structure type and the section formula;

[0085] Step A2, based on the constraint compensation stiffness, the target material modulus and the target cross-sectional formula, calculate and obtain the cross-sectional area of ​​the constraint component.

[0086] In the disclosed embodiment, the rigidity corresponding to the constraint components of different design structures is different, so it is necessary to obtain the design structure type of the constraint component. Based on different structural types such as cylindrical, annular, rectangular, etc., the corresponding cross-sectional formula for calculating the cross-sectional area is also different. The mapping relationship between the structural type and the cross-sectional formula can be constructed in advance, and then the corresponding target cross-sectional formula can be determined based on the obtained design structure cross section.

[0087] Furthermore, based on the constraint compensation stiffness, the target material modulus and the target cross-sectional formula, the cross-sectional area of ​​the constraint component is calculated and obtained.

[0088] Optionally, the step A2 of calculating and obtaining the cross-sectional area of ​​the constraint component based on the constraint compensation stiffness, the target material modulus and the target cross-sectional formula includes:

[0089] Step A21, when the design structure type is annular, calculating and obtaining the component inertia moment of the constraint component based on the constraint compensation stiffness and the target material modulus;

[0090] Step A22, based on the moment of inertia of the component and the target cross-sectional formula, calculate and obtain the inner and outer diameters of the constraint component when it is annular, and determine the cross-sectional area based on the inner and outer diameters.

[0091] In the disclosed embodiment, the design structure type can be annular, that is, the center part of the cylinder is empty and the cross section is annular. Since the stiffness is determined by the target material modulus and the moment of inertia, and the moment of inertia and the cross-sectional area are related, the moment of inertia of the constrained component can be calculated based on the constraint compensation stiffness and the target material modulus. The calculation formula of the component moment of inertia of the constrained component is as follows:

[0092]

[0093] Among them, I C represents the component moment of inertia of the constrained component, (EI) min represents the second stiffness, E0I0 represents the first stiffness of the probe, E C Represents the target material modulus.

[0094] Then, based on the moment of inertia of the constrained component and the target cross-sectional formula when the design structure type is a ring, the inner and outer diameters of the ring are calculated, and then the cross-sectional area of ​​the ring design structure can be determined based on the inner and outer diameters. The target cross-sectional formula when the design structure type is a ring can be the following formula:

[0095]

[0096] Among them, I C represents the moment of inertia of the constrained component, d is the inner diameter of the ring, and D is the outer diameter of the ring. When the inner and outer diameters of the ring are known, the cross-sectional area of ​​the ring design structure can be calculated. Among them, the inner diameter d can be 1.5 times, 1.7 times, or 2 times the diameter of the probe rod, etc.

[0097] Optionally, the method further includes:

[0098] According to the length of the probe rod, the bending moment and the first stiffness, a second deflection of the probe rod is calculated; the second deflection indicates the degree of deformation of the probe rod under the bending moment;

[0099] A third deflection of the constraint component is obtained by calculation according to the component length of the constraint component, the bending moment and the constraint compensation stiffness; the third deflection represents the degree of deformation of the constraint component under the bending moment;

[0100] Determine that the sum of the second deflection and the third deflection is less than or equal to the first deflection.

[0101] In the embodiment of the present application, the first deflection of the probe rod is calculated based on the probe rod length, bending moment and the first stiffness of the probe rod; the first deflection indicates the degree of deformation of the probe rod under the bending moment. Similarly, the third deflection of the constraint assembly is calculated based on the assembly length, bending moment and constraint compensation stiffness of the constraint assembly; the third deflection indicates the degree of deformation of the constraint assembly under the bending moment. It is understandable that the probe rod length and assembly length can be the same.

[0102] The first deflection calculated based on the maximum inclination angle, i.e. the preset probe rod inclination angle, is the maximum deflection under the requirement of stable operation of the probe rod. The sum of the deflections of the probe rod and the constraint assembly needs to be less than or equal to the second deflection to ensure stable operation of the probe rod. The second deflection can be calculated by the following formula:

[0103]

[0104] Among them, y1 represents the second deflection of the probe rod, M0 represents the bending moment, L represents the length of the probe rod, E0 represents the probe rod modulus of the probe rod, I0 represents the moment of inertia of the probe rod, and d represents the derivative.

[0105] Similarly, by substituting the component length, bending moment and constraint compensation stiffness of the constraint component into the above formula, the third deflection of the constraint component can be obtained, and then it can be determined whether the sum of the second deflection and the third deflection is less than or equal to the first deflection. If it is greater than the first deflection, the constraint component needs to be adjusted.

[0106] After determining the constraint assembly with constraint compensation stiffness and the above annular cross-sectional area, the constraint structure can be installed on the probe rod by following the steps S1-S3:

[0107] Step S1, installation design: according to the constraint structure design as pipe fittings or trusses, select the installation equipment, and at the same time design the installation parameters such as installation depth, installation speed, connection method and fixing method according to the water depth of the static penetration operation.

[0108] Step S2, installation process: using the installation equipment, according to the installation design parameters, the constraint structure is installed to the designed depth, and the top is fixed to the platform;

[0109] Step S3: Installation effect inspection and verification. The inclination angle of the probe rod is required to be less than 2°, corresponding to a maximum deflection of y max , use the vertical detection device to detect whether the installation accuracy of the constraint structure meets the requirements. If the deflection of the constraint structure is y2, then the deflection of the probe rod will increase by y2 after the constraint is strengthened. The deflection of the probe rod itself is y1, and it is necessary to ensure that (y1+y2) is still less than or equal to y max .

[0110] After installation is complete, static penetration testing can be performed by following the steps H1-H3:

[0111] Step H1, static probe rod installation design; design the penetration rate of the static probe rod, and select intermittent penetration, which can be adjusted as the penetration progresses. After the static probe probe passes through the constraint structure, it can be penetrated continuously until the probe approaches the seabed surface, ensuring that friction damage and probe collision damage are reduced inside the constraint structure.

[0112] Step H2, conduct static exploration test; drill the probe rod into the seabed soil, conduct penetration operation, and conduct static exploration test.

[0113] Step H3: After the test, the equipment is dismantled. First, the drilling rod is lifted out, and after the probe enters the restraining structure, the lifting speed is reduced to prevent the restraining structure from damaging the probe rod, and finally the restraining structure is dismantled.

[0114] Through the above steps H1-H3, vertical penetration of drilling can be achieved, the penetration error can be reduced, and the accuracy of static penetration test can be improved.

[0115] In summary, in the embodiments of the present application, the force of the waves on the probe rod can be obtained, and the wave load on the probe rod can be determined based on the force; the bending moment of the probe rod can be calculated based on the wave load and the probe rod length of the probe rod; the first stiffness of the probe rod can be calculated based on the modulus of the probe rod and the moment of inertia of the probe rod, and the first deflection can be calculated based on the length of the probe rod and the preset probe rod inclination angle; the second stiffness can be calculated based on the length of the probe rod, the bending moment and the first deflection; based on the first stiffness and the second stiffness, the constraint compensation stiffness can be accurately calculated, and the probe rod can be constrained based on the constraint compensation stiffness. The constraint compensation stiffness required under specific wave loads can be accurately calculated for various parameters of the probe rod itself, including length, stiffness, bending moment, etc., to prevent the probe rod from bending under the action of waves, and to improve the stability of the probe rod during operation.

[0116] refer to Figure 5 , which shows a probe restraint device 50 for an offshore platform provided in an embodiment of the present application, comprising:

[0117] The load module 501 is used to obtain the force of the waves on the probe rod and determine the wave load on the probe rod based on the force;

[0118] A bending moment module 502, used for calculating the bending moment of the probe rod according to the wave load and the probe rod length of the probe rod;

[0119] A first stiffness module 503, configured to determine a first stiffness of the probe rod based on a probe rod modulus and a probe rod inertia moment of the probe rod;

[0120] A first deflection module 504 is used to calculate a first deflection based on the probe rod length and a preset probe rod inclination angle; the first deflection represents the maximum deformation degree of the probe rod; the preset probe rod inclination angle represents the maximum inclination angle of the probe rod;

[0121] A second stiffness module 505, configured to calculate and obtain a second stiffness based on the probe rod length, the bending moment and the first deflection;

[0122] The compensation constraint module 506 is used to calculate the constraint compensation stiffness based on the first stiffness and the second stiffness, and constrain the probe rod based on the constraint compensation stiffness.

[0123] Optional, applied load module, including:

[0124] The drag submodule is used to obtain the flow velocity and density of the ocean wave, and calculate the drag force of the ocean wave based on the flow velocity and the density.

[0125] Optional, applied load module, including:

[0126] The inertial submodule is used to obtain the acceleration and density of the waves, and calculate the inertial force of the waves based on the acceleration and the density.

[0127] Optional compensation constraint modules, including:

[0128] A stiffness difference submodule, configured to determine a constraint compensation stiffness based on a difference between the first stiffness and the second stiffness;

[0129] A material modulus submodule, used to obtain a target material type of a constraint component, and determine a target material modulus corresponding to the target material type according to a mapping relationship between the material type and the material modulus, wherein the target material modulus represents the deformation resistance of the target material type;

[0130] The cross-sectional area submodule is used to determine the cross-sectional area of ​​the constraint component based on the constraint compensation stiffness and the target material modulus, and constrain the probe rod based on the constraint component having the cross-sectional area.

[0131] Optional, cross-sectional area submodule, including:

[0132] A design structure unit, used for obtaining a design structure type of the constraint component, and determining a target section formula corresponding to the design structure type according to a mapping relationship between the structure type and the section formula;

[0133] A cross-sectional formula unit is used to calculate and obtain the cross-sectional area of ​​the constraint component based on the constraint compensation stiffness, the target material modulus and the target cross-sectional formula.

[0134] Optional, section formula unit, including:

[0135] a ring subunit, for calculating and obtaining the component inertia moment of the constraint component based on the constraint compensation stiffness and the target material modulus when the design structure type is a ring;

[0136] The inner and outer diameter subunit is used to calculate the inner and outer diameters of the constraint component when it is annular based on the component inertia moment and the target cross-sectional formula, and determine the cross-sectional area based on the inner and outer diameters.

[0137] Optionally, the device further comprises:

[0138] A second deflection module, used for calculating and obtaining a second deflection of the probe rod according to the length of the probe rod, the bending moment and the first stiffness; the second deflection indicates the degree of deformation of the probe rod under the bending moment;

[0139] A third deflection module, used for calculating and obtaining a third deflection of the constraint component according to the component length of the constraint component, the bending moment and the constraint compensation stiffness; the third deflection indicates the degree of deformation of the constraint component under the bending moment;

[0140] The deflection comparison module is used to determine whether the sum of the second deflection and the third deflection is less than or equal to the first deflection.

[0141] In summary, in the embodiments of the present application, the force of the waves on the probe rod can be obtained, and the wave load on the probe rod can be determined based on the force; the bending moment of the probe rod can be calculated based on the wave load and the probe rod length of the probe rod; the first stiffness of the probe rod can be calculated based on the modulus of the probe rod and the moment of inertia of the probe rod, and the first deflection can be calculated based on the length of the probe rod and the preset probe rod inclination angle; the second stiffness can be calculated based on the length of the probe rod, the bending moment and the first deflection; based on the first stiffness and the second stiffness, the constraint compensation stiffness can be accurately calculated, and the probe rod can be constrained based on the constraint compensation stiffness. The constraint compensation stiffness required under specific wave loads can be accurately calculated for various parameters of the probe rod itself, including length, stiffness, bending moment, etc., to prevent the probe rod from bending under the action of waves, and to improve the stability of the probe rod during operation.

[0142] Figure 6 8 is a block diagram of an electronic device 800 shown in an exemplary embodiment. For example, the electronic device 800 may be a mobile phone, a computer, a digital broadcast terminal, a messaging device, a game console, a tablet device, a medical device, a fitness device, a personal digital assistant, etc.

[0143] Reference Figure 6 , the electronic device 800 may include one or more of the following components: a processing component 802 , a memory 804 , a power component 806 , a multimedia component 808 , an audio component 810 , an input / output (I / O) interface 812 , a sensor component 814 , and a communication component 816 .

[0144] The processing component 802 generally controls the overall operation of the electronic device 800, such as operations associated with display, phone calls, data communications, camera operations, and recording operations. The processing component 802 may include one or more processors 820 to execute instructions to complete all or part of the steps of the above-mentioned method. In addition, the processing component 802 may include one or more modules to facilitate the interaction between the processing component 802 and other components. For example, the processing component 802 may include a multimedia module to facilitate the interaction between the multimedia component 808 and the processing component 802.

[0145] The memory 804 is used to store various types of data to support operations on the electronic device 800. Examples of such data include instructions for any application or method operating on the electronic device 800, contact data, phone book data, messages, pictures, multimedia, etc. The memory 804 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk.

[0146] The power supply component 806 provides power to the various components of the electronic device 800. The power supply component 806 may include a power management system, one or more power supplies, and other components associated with generating, managing, and distributing power to the electronic device 800.

[0147] The multimedia component 808 includes a screen that provides an output interface between the electronic device 800 and the user. In some embodiments, the screen may include a liquid crystal display (LCD) and a touch panel (TP). If the screen includes a touch panel, the screen may be implemented as a touch screen to receive input signals from the user. The touch panel includes one or more touch sensors to sense touch, slide, and gestures on the touch panel. The touch sensor may not only sense the boundaries of the touch or slide action, but also detect the duration and pressure associated with the touch or slide operation. In some embodiments, the multimedia component 808 includes a front camera and / or a rear camera. When the electronic device 800 is in an operating mode, such as a shooting mode or a multimedia mode, the front camera and / or the rear camera may receive external multimedia data. Each front camera and the rear camera may be a fixed optical lens system or have a focal length and optical zoom capability.

[0148] The audio component 810 is used to output and / or input audio signals. For example, the audio component 810 includes a microphone (MIC), and when the electronic device 800 is in an operating mode, such as a call mode, a recording mode, and a voice recognition mode, the microphone is used to receive an external audio signal. The received audio signal can be further stored in the memory 804 or sent via the communication component 816. In some embodiments, the audio component 810 also includes a speaker for outputting audio signals.

[0149] I / O interface 812 provides an interface between processing component 802 and peripheral interface modules, such as keyboards, click wheels, buttons, etc. These buttons may include but are not limited to: home button, volume button, start button, and lock button.

[0150] The sensor assembly 814 includes one or more sensors for providing various aspects of status assessment for the electronic device 800. For example, the sensor assembly 814 can detect the open / closed state of the electronic device 800, the relative positioning of the components, such as the display and keypad of the electronic device 800, and the sensor assembly 814 can also detect the position change of the electronic device 800 or a component of the electronic device 800, the presence or absence of contact between the user and the electronic device 800, the orientation or acceleration / deceleration of the electronic device 800, and the temperature change of the electronic device 800. The sensor assembly 814 may include a proximity sensor configured to detect the presence of a nearby object without any physical contact. The sensor assembly 814 may also include an optical sensor, such as a CMOS or CCD image sensor, for use in imaging applications. In some embodiments, the sensor assembly 814 may also include an acceleration sensor, a gyroscope sensor, a magnetic sensor, a pressure sensor, or a temperature sensor.

[0151] The communication component 816 is used to facilitate wired or wireless communication between the electronic device 800 and other devices. The electronic device 800 can access a wireless network based on a communication standard, such as WiFi, a carrier network (such as 2G, 3G, 4G or 5G), or a combination thereof. In an exemplary embodiment, the communication component 816 receives a broadcast signal or broadcast-related information from an external broadcast management system via a broadcast channel. In an exemplary embodiment, the communication component 816 also includes a near field communication (NFC) module to facilitate short-range communication. For example, the NFC module can be implemented based on radio frequency identification (RFID) technology, infrared data association (IrDA) technology, ultra-wideband (UWB) technology, Bluetooth (BT) technology and other technologies.

[0152] In an exemplary embodiment, the electronic device 800 can be implemented by one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors or other electronic components to implement the probe constraint method for an offshore platform provided in an embodiment of the present application.

[0153] In an exemplary embodiment, a non-transitory computer-readable storage medium including instructions is also provided, such as a memory 804 including instructions, and the instructions can be executed by a processor 820 of an electronic device 800 to perform the above method. For example, the non-transitory storage medium can be a ROM, a random access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, etc.

[0154] Figure 7is a block diagram of an electronic device 900 shown in an exemplary embodiment. For example, the electronic device 900 may be provided as a server. Figure 7 The electronic device 900 includes a processing component 922, which further includes one or more processors, and a memory resource represented by a memory 932 for storing instructions executable by the processing component 922, such as an application. The application stored in the memory 932 may include one or more modules, each corresponding to a set of instructions. In addition, the processing component 922 is configured to execute instructions to execute a probe constraint method for an offshore platform provided in an embodiment of the present application.

[0155] The electronic device 900 may also include a power supply component 926 configured to perform power management of the electronic device 900, a wired or wireless network interface 850 configured to connect the electronic device 900 to a network, and an input / output (I / O) interface 958. The electronic device 900 may operate based on an operating system stored in the memory 932, such as Windows Server™, Mac OS X™, Unix™, Linux™, FreeBSD™ or the like.

[0156] Those skilled in the art will readily appreciate other embodiments of the present application after considering the specification and practicing the application disclosed herein. The present application is intended to cover any variations, uses or adaptations of the present application, which follow the general principles of the present application and include common knowledge or customary techniques in the art that are not disclosed in the present application. The specification and examples are intended to be exemplary only, and the true scope and spirit of the present application are indicated by the following claims.

[0157] It should be understood that the present application is not limited to the precise structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present application is limited only by the appended claims.

Claims

1. A probe restraint method for an offshore platform, characterized in that: The method comprises: Acquire the force of the waves on the probe rod, and determine the wave load on the probe rod based on the force; Calculating and obtaining the bending moment of the probe rod according to the wave load and the probe rod length of the probe rod; Determining a first stiffness of the probe rod based on a probe rod modulus and a probe rod moment of inertia of the probe rod; Based on the length of the probe rod and the preset probe rod inclination angle, a first deflection is calculated; the first deflection represents the maximum deformation degree of the probe rod; the preset probe rod inclination angle represents the maximum inclination angle of the probe rod; Obtaining a second stiffness by calculation based on the probe rod length, the bending moment and the first deflection; Based on the first stiffness and the second stiffness, a constraint compensation stiffness is calculated, and the probe rod is constrained based on the constraint compensation stiffness.

2. The method according to claim 1, characterized in that The step of obtaining the force of the waves on the probe comprises: The flow velocity and density of the ocean wave are obtained, and based on the flow velocity and the density, the drag force of the ocean wave is calculated.

3. The method according to claim 1, characterized in that The step of obtaining the force of the waves on the probe comprises: The acceleration and density of the ocean wave are obtained, and based on the acceleration and the density, the inertial force of the ocean wave is calculated.

4. The method according to claim 1, characterized in that: The step of calculating the constraint compensation stiffness based on the first stiffness and the second stiffness, and constraining the probe rod based on the constraint compensation stiffness comprises: determining a constraint compensation stiffness based on a difference between the first stiffness and the second stiffness; Obtaining a target material type of the constraint component, and determining a target material modulus corresponding to the target material type according to a mapping relationship between the material type and the material modulus; the target material modulus represents the deformation resistance of the target material type; Based on the constraint compensation stiffness and the target material modulus, a cross-sectional area of ​​the constraint component is determined, and the probe rod is constrained based on the constraint component having the cross-sectional area.

5. The method according to claim 4, characterized in that The step of determining the cross-sectional area of ​​the constraint component based on the constraint compensation stiffness and the target material modulus comprises: Acquire the design structure type of the constraint component, and determine the target section formula corresponding to the design structure type according to the mapping relationship between the structure type and the section formula; Based on the constraint compensation stiffness, the target material modulus and the target cross-sectional formula, the cross-sectional area of ​​the constraint component is calculated and obtained.

6. The method according to claim 5, characterized in that The step of calculating and obtaining the cross-sectional area of ​​the constraint component based on the constraint compensation stiffness, the target material modulus and the target cross-sectional formula comprises: In the case where the design structure type is annular, calculating and obtaining the component inertia moment of the constraint component based on the constraint compensation stiffness and the target material modulus; Based on the moment of inertia of the component and the target cross-sectional formula, the inner and outer diameters of the constraint component when it is annular are calculated, and the cross-sectional area is determined based on the inner and outer diameters.

7. The method according to claim 6, characterized in that The method further comprises: According to the length of the probe rod, the bending moment and the first stiffness, a second deflection of the probe rod is calculated; the second deflection indicates the degree of deformation of the probe rod under the bending moment; A third deflection of the constraint component is obtained by calculation according to the component length of the constraint component, the bending moment and the constraint compensation stiffness; the third deflection represents the degree of deformation of the constraint component under the bending moment; Determine that the sum of the second deflection and the third deflection is less than or equal to the first deflection.

8. A probe restraint device for an offshore platform, characterized in that: The device comprises: An action load module, used for obtaining the action force of the waves on the probe rod, and determining the wave load on the probe rod based on the action force; A bending moment module, used for calculating the bending moment of the probe rod according to the wave load and the probe rod length of the probe rod; A first stiffness module, used for determining a first stiffness of the probe rod based on a probe rod modulus and a probe rod inertia moment of the probe rod; A first deflection module is used to calculate and obtain a first deflection based on the length of the probe rod and a preset probe rod inclination angle; the first deflection represents the maximum deformation degree of the probe rod; the preset probe rod inclination angle represents the maximum inclination angle of the probe rod; A second stiffness module, used for calculating and obtaining a second stiffness based on the probe rod length, the bending moment and the first deflection; The compensation constraint module is used to calculate the constraint compensation stiffness based on the first stiffness and the second stiffness, and constrain the probe rod based on the constraint compensation stiffness.

9. An electronic device, characterized in that: include: A processor, a communication interface, a memory and a communication bus; wherein the processor, the communication interface and the memory communicate with each other via the communication bus; Memory, used to store computer programs; The processor is used to implement the steps of the probe constraint method for an offshore platform as described in any one of claims 1 to 7 when executing the program stored in the memory.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the program is executed by a processor, the steps of the probe restraint method for an offshore platform as claimed in any one of claims 1 to 7 are implemented.

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