Method for testing dielectric property of ceramic material in high-temperature vacuum environment

Abstract

The invention relates to the technical field of dielectric property testing, in particular to a dielectric property testing method of a ceramic material in a high-temperature vacuum environment, which is realized by a testing device, the testing device comprises a supporting frame, a lower cylinder is fixed on the supporting frame, an upper cylinder cover is hinged on the supporting frame, and a placing mechanism is arranged in the lower cylinder. The placing mechanism is composed of a lower lifting mechanism and an upper lifting mechanism, and the lower lifting mechanism and the upper lifting mechanism are respectively linked with the upper cylinder cover so as to clamp and loosen the tested ceramic wafer; the testing method comprises the steps of preparation before testing, placement before testing and testing. According to the method for testing the dielectric property of the ceramic material in the high-temperature vacuum environment, the dielectric material is uniformly stressed and clamped in a linkage manner.

Description

Technical Field

[0001] The invention relates to the technical field of dielectric performance testing, and in particular to a method for testing the dielectric performance of ceramic materials in a high-temperature vacuum environment. Background Art

[0002] Dielectric properties, also known as permeability, refer to the response ability and characteristics of dielectric materials under the action of electric fields, usually expressed by dielectric constant and dielectric loss. Dielectric constant is the permittivity of dielectric materials in electric fields relative to vacuum or air; dielectric loss is the degree of energy loss of dielectric materials in electric fields.

[0003] At present, the dielectric performance test method is to fix the dielectric material on the test carrier and then transfer it to the test vacuum chamber for testing. However, the conventional test method still has the following shortcomings:

[0004] Due to the structure of the vacuum chamber, the stability of the dielectric material needs to be ensured. When the carrier is transported in the conventional way, there is a risk of dislocation of the dielectric material. Summary of the invention

[0005] In order to solve the technical problems existing in the background technology, the present invention provides a method for testing the dielectric properties of ceramic materials in a high-temperature vacuum environment, which clamps the dielectric material with uniform force through a linkage method.

[0006] The technical solution adopted by the present invention is:

[0007] A method for testing the dielectric properties of ceramic materials in a high-temperature vacuum environment is implemented by a testing device, which includes: a support frame fixedly arranged on a horizontal ground, a lower cylinder fixedly arranged on the support frame, an upper cylinder cover movably arranged on the support frame, a placement mechanism movably arranged in the lower cylinder, the placement mechanism consists of a lower lifting mechanism and an upper lifting mechanism, and the lower lifting mechanism and the upper lifting mechanism are respectively linked with the upper cylinder cover to clamp and release the ceramic sheet to be tested.

[0008] The testing method comprises:

[0009] Step 1. Preparation before testing:

[0010] The ceramic sheet is cleaned, dried, and inserted into a closed purification chamber.

[0011] Step 2: Placement before testing:

[0012] In the dust-free test room, open the upper cylinder cover on the lower cylinder, open the purification chamber, clamp the ceramic sheet in the purification chamber out with a clamp, and place it on the lower lifting mechanism, and evenly apply thermal conductive silicone grease on the upper surface of the ceramic sheet;

[0013] The upper cylinder cover sealing cover is arranged on the lower cylinder body. During this process, the lower lifting mechanism and the upper lifting mechanism are close to each other and clamp the ceramic sheet.

[0014] Step 3, test:

[0015] The sealed chamber composed of the lower cylinder and the upper cylinder cover is vacuumed to reach the vacuum degree required for testing;

[0016] The ceramic sheet is heated until it reaches the testing temperature;

[0017] Collect the dielectric properties of ceramic sheets under test vacuum and test temperature conditions.

[0018] Furthermore, a fixed base is protruded in the center of the inner bottom of the lower cylinder, and the fixed base extends downward to the outside of the lower cylinder. A sliding rod group and a lower electrical socket are provided on the fixed base. The lead of the lower electrical socket extends downward to the outside of the fixed base and is electrically connected to the central control machine. A vacuum extraction hole connected to the vacuum equipment is provided through the wall of the lower cylinder.

[0019] Furthermore, a limiting top cap is screwed on the upper end of the slide bar group, and the outer diameter of the limiting top cap is larger than the outer diameter of the slide bar of the slide bar group.

[0020] Furthermore, a mounting ear is protruding from the outer wall of the lower cylinder, and the mounting ear is used to fix the lower cylinder to the support frame.

[0021] Furthermore, the lower lifting mechanism comprises:

[0022] A lower lifting seat is arranged horizontally, a lower sliding rod is protruding from the side wall of the lower lifting seat, a lower placement groove is arranged at the upper top of the lower lifting seat, a test probe is arranged in the lower placement groove, a lower sliding hole slidably connected to the sliding rod group is protruding from the edge of the lower lifting seat, an upper electrical socket is arranged at the upper top edge of the lower lifting seat, an extended base is arranged at the lower bottom end of the lower lifting seat, a lower electrical socket strip electrically plugged into the lower electrical socket is arranged at the lower bottom edge of the extended base, and the lower electrical socket strip is electrically connected to the upper electrical socket.

[0023] Furthermore, the upper lifting mechanism comprises:

[0024] An upper lifting seat is arranged parallel to and just above the lower lifting seat, an upper sliding rod is protruding from the side wall of the upper lifting seat, an upper placement groove is provided at the lower bottom end of the upper lifting seat, a heating plate is protruding from the center of the placement groove, a temperature measuring probe is protruding from the placement groove on one side of the heating plate, an upper sliding hole slidably connected to the sliding rod group is protruding from the edge of the upper lifting seat, an upper electrical socket strip electrically plugged into the upper electrical socket is provided at the edge of the lower bottom end of the upper lifting seat, and the upper electrical socket strip is electrically connected to the heating plate and the temperature measuring probe.

[0025] Furthermore, the lower end surfaces of the heating plate and the temperature measuring probe are flush.

[0026] Furthermore, a suspension arm is hingedly provided at the upper end of the upper cylinder cover, and a swivel shaft hinged to the support frame is provided at the end of the suspension arm. A first slide group and a second slide group are downwardly extended from the upper top end inside the upper cylinder cover. The first slide group is slidably connected to the upper slide rod, and the second slide group is slidably connected to the lower slide rod.

[0027] Furthermore, a damper fixedly connected to the support frame is provided on the rotating shaft;

[0028] A guide spring is provided at the connection between the first slide group, the second slide group and the inner top of the upper cylinder cover. The first slide group and the second slide group are respectively provided with slide grooves. The upper end of the slide groove of the first slide group is higher than the upper end of the slide groove of the second slide group, and the lower end of the slide groove of the first slide group is lower than the lower end of the slide groove of the second slide group.

[0029] Further, the step 2, placement before testing, includes:

[0030] In the dust-free test room, open the upper cylinder cover on the lower cylinder, and use the damper to keep the upper cylinder cover directly above the lower cylinder and in suspension;

[0031] During the rising process of the upper cylinder cover, the first slide group and the second slide group move upward, and the lower slide rod first slides to the lower end of the slide groove of the second slide group, so that the upper lifting seat moves upward and separates from the lower lifting seat, and the upper slide rod then slides to the lower end of the slide groove of the first slide group, so that the lower lifting seat moves upward and rises to the upper opening of the lower cylinder body;

[0032] Open the purification chamber, use the clamp to clamp out the ceramic sheet in the purification chamber, and clamp it into the lower placement slot and contact it with the test probe. Apply thermal grease evenly on the upper surface of the ceramic sheet, and remove the thermal grease on the edge of the upper surface of the ceramic sheet.

[0033] The upper cylinder cover sealing cover is arranged on the lower cylinder body. During the descending process of the upper cylinder cover, the lower slide rod first slides to the upper end of the slide groove of the second slide group, so that the upper lifting seat moves downward, and the upper slide rod then slides to the upper end of the slide groove of the first slide group, so that the lower lifting seat moves downward, and finally the lower electrical socket is electrically connected with the lower electrical socket strip, the upper electrical socket is electrically connected with the upper electrical socket strip, and the heating plate and the lower placement groove are close to each other to clamp the ceramic sheet, and the temperature measuring probe is in contact with the upper end surface of the ceramic sheet.

[0034] The beneficial effects of the ceramic material dielectric property testing method in a high temperature vacuum environment of the present invention are:

[0035] 1. By rotating the screw, the translation seat can be translated to achieve position switching;

[0036] 2. Store energy through the energy storage rocker to realize closing and opening actions, and switch on and off the grid. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] In order to more clearly illustrate the specific implementation of the present invention, the drawings required in the specific implementation are briefly introduced below. The drawings in the following description are implementations of the present invention.

[0038] Figure 1 It is a general three-dimensional schematic diagram of a method for testing dielectric properties of ceramic materials in a high-temperature vacuum environment provided by an embodiment of the present invention;

[0039] Figure 2 It is a three-dimensional schematic diagram of a cutaway lower cylinder of a method for testing dielectric properties of ceramic materials in a high-temperature vacuum environment provided by an example of the present invention;

[0040] Figure 3 It is a three-dimensional schematic diagram of the lower cylinder and the placement mechanism of the dielectric property testing method of ceramic materials in a high-temperature vacuum environment provided by an example of the present invention;

[0041] Figure 4 It is a three-dimensional schematic diagram of the lower lifting mechanism of the ceramic material dielectric property testing method in a high-temperature vacuum environment provided by an example of the present invention;

[0042] Figure 5 It is a three-dimensional schematic diagram of an upper lifting mechanism of a method for testing dielectric properties of ceramic materials in a high-temperature vacuum environment provided by an example of the present invention;

[0043] Figure 6 It is a three-dimensional schematic diagram of a lower lifting mechanism and an upper cylinder cover of a method for testing dielectric properties of ceramic materials in a high-temperature vacuum environment provided by an example of the present invention.

[0044] In the figure:

[0045] 1. Support frame,

[0046] 2. Lower cylinder, 20. Fixed base, 21. Sliding rod assembly, 22. Limiting top cap, 23. Lower electrical socket, 24. Mounting ear, 25. Vacuum extraction hole,

[0047] 3. Placement mechanism, 31. Lower lifting mechanism, 32. Upper lifting mechanism,

[0048] 310, lower lifting seat, 311, lower sliding rod, 312, lower placement slot, 313, lower sliding hole, 314, upper electrical socket, 315, test probe, 316, extension base, 317, lower electrical socket,

[0049] 320, upper lifting seat, 321, upper slide bar, 322, upper placement slot, 323, upper slide hole, 324, upper electrical socket, 325, heating plate, 326, temperature probe,

[0050] 4. Upper cylinder cover, 40. Suspension arm, 41. First slideway group, 42. Second slideway group,

[0051] 5. Ceramic pieces. DETAILED DESCRIPTION

[0052] In order to more clearly and specifically explain the specific implementation purpose and implementation mode of the present invention, the technical solution of the present invention will be fully described below. The described embodiments are part of the embodiments of the present invention, but not all of them. Without making creative work, all other embodiments based on the embodiments described in the present invention belong to the protection scope of the present invention.

[0053] The dielectric properties testing device of ceramic materials in a high temperature vacuum environment of the present invention is as follows: Figure 1 As shown, including:

[0054] A support frame 1 is fixedly arranged on a horizontal ground, and a lower cylinder 2 is fixedly arranged on the support frame 1. Figure 2 , Figure 3 As shown, a fixed base 20 is protruded from the center of the inner bottom of the lower cylinder 2, and the fixed base 20 extends downward to the outside of the lower cylinder 2. A slide bar group 21 and a lower electrical socket 23 are provided on the fixed base 20. A limiting top cap 22 is screwed on the upper top of the slide bar group 21, and the outer diameter of the limiting top cap 22 is larger than the outer diameter of the slide bar of the slide bar group 21. The lead of the lower electrical socket 23 extends downward to the outside of the fixed base 20 and is electrically connected to the central control machine. A mounting ear 24 is protruded from the outer wall of the lower cylinder 2, and the mounting ear 24 is used to fix the lower cylinder 2 to the support frame 1. A vacuum extraction hole 25 connected to the vacuum equipment is penetrated through the wall of the lower cylinder 2.

[0055] The support frame 1 is provided with an upper cylinder cover 4 movably. Figure 6 As shown, the upper end of the upper cylinder cover 4 is hingedly provided with a suspension arm 40, the end of the suspension arm 40 is provided with a swivel hinged to the support frame 1, and the swivel is provided with a damper fixedly connected to the support frame 1. The upper top end in the upper cylinder cover 4 is downwardly extended to provide a first slide group 41 and a second slide group 42, the first slide group 41 is slidably connected to the upper slide bar 321, the second slide group 42 is slidably connected to the lower slide bar 311, and a guide spring is provided at the connection between the first slide group 41, the second slide group 42 and the inner top of the upper cylinder cover 4, the first slide group 41 and the second slide group 42 are respectively provided with slide grooves, the upper end of the slide groove of the first slide group 41 is higher than the upper end of the slide groove of the second slide group 42, and the lower end of the slide groove of the first slide group 41 is lower than the lower end of the slide groove of the second slide group 42.

[0056] A placing mechanism 3 is movably arranged in the lower cylinder 2. Figure 3As shown, the placing mechanism 3 is composed of a lower lifting mechanism 31 and an upper lifting mechanism 32 , and the lower lifting mechanism 31 and the upper lifting mechanism 32 are respectively linked with the upper cylinder cover 4 to clamp and release the tested ceramic sheet 5 .

[0057] The lower lifting mechanism 31 is as follows Figure 4 As shown, including:

[0058] A lower lifting seat 310 is horizontally arranged, and a lower sliding rod 311 is protrudingly provided on the side wall of the lower lifting seat 310, and a lower placement groove 312 is provided at the upper top of the lower lifting seat 310. A test probe 315 is provided in the lower placement groove 312, and the test probe 315 abuts against the lower bottom end of the ceramic plate 5. A lower sliding hole 313 is protruding at the edge of the lower lifting seat 310 and is slidably connected to the sliding rod group 21. An upper electrical socket 314 is provided at the upper top edge of the lower lifting seat 310, and an extension base 316 is provided at the lower bottom end of the lower lifting seat 310. A lower electrical socket 317 electrically plugged into the lower electrical socket 23 is provided at the lower bottom edge of the extension base 316, and the lower electrical socket 317 is electrically connected to the upper electrical socket 314.

[0059] The upper lifting mechanism 32 is as follows Figure 5 , Figure 6 As shown, including:

[0060] The upper lifting seat 320 is arranged parallel to the upper part of the lower lifting seat 310, and an upper sliding rod 321 is protruding from the side wall of the upper lifting seat 320. An upper placement groove 322 is provided at the lower bottom end of the upper lifting seat 320. A heating plate 325 is protruding from the center of the placement groove 322. A temperature measuring probe 326 is protruding from the placement groove 322 on one side of the heating plate 325. The lower end surfaces of the heating plate 325 and the temperature measuring probe 326 are flush and abut against the upper top of the ceramic sheet 5. An upper sliding hole 323 slidably connected to the sliding rod group 21 is protruding from the edge of the upper lifting seat 320. An upper electrical socket 324 electrically plugged into the upper electrical socket 314 is provided at the lower bottom edge of the upper lifting seat 320. The upper electrical socket 324 is electrically connected to the heating plate 315 and the temperature measuring probe 326.

[0061] According to the specific structure of the ceramic material dielectric property testing device in a high temperature vacuum environment in the above embodiment, the testing method thereof is further described below:

[0062] Step 1. Preparation before testing:

[0063] The ceramic sheet 5 is cleaned, dried, and inserted into a closed purification chamber.

[0064] Step 2: Placement before testing:

[0065] In a dust-free test room, the upper cylinder cover 4 on the lower cylinder 2 is opened, and the upper cylinder cover 4 is always kept directly above the lower cylinder 2 and suspended by a damper;

[0066] During the rising process of the upper cylinder cover 4, the first slide group 41 and the second slide group 42 move upward, and the lower slide rod 311 first slides to the lower end of the slide groove of the second slide group 42, so that the upper lifting seat 320 moves upward and separates from the lower lifting seat 310, and the upper slide rod 321 then slides to the lower end of the slide groove of the first slide group 41, so that the lower lifting seat 310 moves upward and rises to the upper end opening of the lower cylinder body 2;

[0067] Open the purification chamber, clamp the ceramic sheet 5 out of the purification chamber with a clamp, and place it in the lower placement groove 312 and contact with the test probe 315, evenly apply thermal grease on the upper surface of the ceramic sheet 5, and remove the thermal grease at the edge of the upper surface of the ceramic sheet 5.

[0068] The sealing cover of the upper cylinder cover 4 is arranged on the lower cylinder body 2. During the process of the upper cylinder cover 4 descending, the lower slide rod 311 first slides to the upper end of the slide groove of the second slideway group 42, so that the upper lifting seat 320 moves downward, and the upper slide rod 321 then slides to the upper end of the slide groove of the first slideway group 41, so that the lower lifting seat 310 moves downward, and finally the lower electrical socket 23 is electrically connected with the lower electrical socket 317, the upper electrical socket 314 is electrically connected with the upper electrical socket 324, and the heating plate 325 and the lower placement groove 312 are close to each other to clamp the ceramic sheet 5, and the temperature measuring probe 326 is in contact with the upper end surface of the ceramic sheet 5;

[0069] In the above process, the lower lifting mechanism 31 and the upper lifting mechanism 32 are brought close to each other and clamp the ceramic sheet 5 .

[0070] Step 3, test:

[0071] The sealed chamber composed of the lower cylinder 2 and the upper cylinder cover 4 is evacuated to a vacuum degree required for testing;

[0072] The ceramic sheet 5 is heated until it reaches the test temperature, the test temperature is: RT-1500°C;

[0073] The dielectric properties of the ceramic sheet 5 under the test vacuum and test temperature conditions are collected, and the dielectric constant under the environmental parameters is calculated.

[0074] Based on the above, the embodiment of the method for testing the dielectric properties of ceramic materials in a high-temperature vacuum environment of the present invention is used as inspiration. Through the above description, relevant personnel can make various changes and modifications without departing from the scope of the technical idea of ​​the present invention.

Claims

1. A method for testing the dielectric properties of ceramic materials in a high temperature vacuum environment is implemented by a testing device, the testing device comprising: A support frame (1) is fixedly arranged on a horizontal ground, a lower cylinder (2) is fixedly arranged on the support frame (1), and an upper cylinder cover (4) is movably arranged on the support frame (1), characterized in that: A placement mechanism (3) is movably arranged in the lower cylinder (2), and the placement mechanism (3) is composed of a lower lifting mechanism (31) and an upper lifting mechanism (32). The lower lifting mechanism (31) and the upper lifting mechanism (32) are respectively linked with the upper cylinder cover (4) to clamp and release the ceramic sheet (5) to be tested; The testing method comprises: Step 1. Preparation before testing: The ceramic sheet (5) is cleaned and dried, and inserted into a closed purification chamber; Step 2: Placement before testing: In a dust-free test room, the upper cylinder cover (4) on the lower cylinder (2) is opened, the purification chamber is opened, the ceramic sheet (5) in the purification chamber is clamped out by a clamp, and is placed on the lower lifting mechanism (31), and thermal conductive silicone grease is evenly applied on the upper surface of the ceramic sheet (5); The upper cylinder cover (4) is sealed and placed on the lower cylinder body (2). During this process, the lower lifting mechanism (31) and the upper lifting mechanism (32) are brought close to each other and clamp the ceramic sheet (5); Step 3, test: The sealed chamber formed by the lower cylinder (2) and the upper cylinder cover (4) is evacuated to a vacuum level required for testing; Heating the ceramic sheet (5) until it reaches a testing temperature; The dielectric properties of the ceramic sheet (5) are collected under the conditions of test vacuum and test temperature.

2. The method for testing dielectric properties of ceramic materials in a high temperature vacuum environment according to claim 1, characterized in that: A fixed base (20) is protruding from the center of the inner bottom of the lower cylinder (2), and the fixed base (20) extends downward to the outside of the lower cylinder (2). A sliding rod group (21) and a lower electrical socket (23) are provided on the fixed base (20). The lead of the lower electrical socket (23) extends downward to the outside of the fixed base (20) and is electrically connected to the central control machine. A vacuum extraction hole (25) connected to the vacuum equipment is provided through the wall of the lower cylinder (2).

3. The method for testing dielectric properties of ceramic materials in a high temperature vacuum environment according to claim 2, characterized in that: A limiting top cap (22) is screwed onto the upper end of the slide bar group (21), and the outer diameter of the limiting top cap (22) is greater than the outer diameter of the slide bar of the slide bar group (21).

4. The method for testing dielectric properties of ceramic materials in a high temperature vacuum environment according to claim 2, characterized in that: A mounting ear (24) is protruding from the outer wall of the lower cylinder (2), and the mounting ear (24) is used to fix the lower cylinder (2) to the support frame (1).

5. The method for testing dielectric properties of ceramic materials in a high temperature vacuum environment according to claim 2, characterized in that: The lower lifting mechanism (31) comprises: A lower lifting seat (310) is arranged horizontally, a lower sliding rod (311) is protrudingly arranged on the side wall of the lower lifting seat (310), a lower placement groove (312) is arranged at the upper top of the lower lifting seat (310), a test probe (315) is arranged in the lower placement groove (312), a lower sliding hole (313) is protrudingly arranged at the edge of the lower lifting seat (310) and is slidably connected to the sliding rod group (21), an upper electrical socket (314) is arranged at the upper top edge of the lower lifting seat (310), an extension base (316) is arranged at the lower bottom end of the lower lifting seat (310), a lower electrical socket (317) electrically plugged into the lower electrical socket (23) is arranged at the lower bottom edge of the extension base (316), and the lower electrical socket (317) is electrically connected to the upper electrical socket (314).

6. The method for testing dielectric properties of ceramic materials in a high temperature vacuum environment according to claim 5, characterized in that: The upper lifting mechanism (32) comprises: An upper lifting seat (320) is arranged parallel to and directly above the lower lifting seat (310), an upper sliding bar (321) is protruding from the side wall of the upper lifting seat (320), an upper placement groove (322) is arranged at the lower bottom end of the upper lifting seat (320), a heating plate (325) is protruding from the center of the placement groove (322), a temperature measuring probe (326) is protruding from the placement groove (322) on one side of the heating plate (325), an upper sliding hole (323) slidably connected to the sliding bar group (21) is protruding from the edge of the upper lifting seat (320), an upper electrical socket (324) electrically plugged into the upper electrical socket (314) is arranged at the lower bottom edge of the upper lifting seat (320), and the upper electrical socket (324) is electrically connected to the heating plate (315) and the temperature measuring probe (326).

7. The method for testing dielectric properties of ceramic materials in a high temperature vacuum environment according to claim 6, characterized in that: The lower end surfaces of the heating plate (325) and the temperature measuring probe (326) are flush.

8. The method for testing dielectric properties of ceramic materials in a high temperature vacuum environment according to claim 6, characterized in that: The upper end of the upper cylinder cover (4) is hingedly provided with a suspension arm (40), and the end of the suspension arm (40) is provided with a rotating shaft hinged to the support frame (1). The upper top end inside the upper cylinder cover (4) is downwardly extended with a first slide group (41) and a second slide group (42), the first slide group (41) is slidably connected to the upper slide bar (321), and the second slide group (42) is slidably connected to the lower slide bar (311).

9. The method for testing dielectric properties of ceramic materials in a high temperature vacuum environment according to claim 6, characterized in that: The rotating shaft is provided with a damper fixedly connected to the supporting frame (1); A guide spring is provided at the connection between the first slideway group (41), the second slideway group (42) and the inner top of the upper cylinder cover (4); the first slideway group (41) and the second slideway group (42) are respectively provided with a slide groove; the upper end of the slide groove of the first slideway group (41) is higher than the upper end of the slide groove of the second slideway group (42); and the lower end of the slide groove of the first slideway group (41) is lower than the lower end of the slide groove of the second slideway group (42).

10. The method for testing dielectric properties of ceramic materials in a high temperature vacuum environment according to claim 1, characterized in that: The step 2, placement before testing, comprises: In a dust-free test room, the upper cylinder cover (4) on the lower cylinder (2) is opened, and the upper cylinder cover (4) is always kept directly above the lower cylinder (2) and suspended by a damper; During the process of the upper cylinder cover (4) rising, the first slideway group (41) and the second slideway group (42) move upward, and the lower slide bar (311) first slides to the lower end of the slide groove of the second slideway group (42), so that the upper lifting seat (320) moves upward and separates from the lower lifting seat (310), and the upper slide bar (321) then slides to the lower end of the slide groove of the first slideway group (41), so that the lower lifting seat (310) moves upward and rises to the upper end opening of the lower cylinder body (2); Open the purification chamber, clamp the ceramic sheet (5) in the purification chamber by means of a clamp, and clamp it into the lower placement groove (312) so as to contact the test probe (315), evenly apply thermal grease on the upper surface of the ceramic sheet (5), and remove the thermal grease at the edge of the upper surface of the ceramic sheet (5); The sealing cover of the upper cylinder cover (4) is arranged on the lower cylinder body (2). During the process of the upper cylinder cover (4) descending, the lower slide bar (311) first slides to the upper end of the slide groove of the second slideway group (42), so that the upper lifting seat (320) moves downward, and the upper slide bar (321) then slides to the upper end of the slide groove of the first slideway group (41), so that the lower lifting seat (310) moves downward, and finally the lower electrical socket (23) is electrically connected with the lower electrical socket (317), the upper electrical socket (314) is electrically connected with the upper electrical socket (324), and the heating plate (325) and the lower placement groove (312) are close to each other to clamp the ceramic sheet (5), and the temperature measuring probe (326) is in contact with the upper end surface of the ceramic sheet (5).

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