A universal power supply aging vehicle

Abstract

The present invention relates to the technical field of aging test, and discloses a universal aging vehicle, including: a single-chip microcomputer sampling system and a host computer, wherein the single-chip microcomputer sampling system is configured with a single-chip microcomputer, a plurality of multi-channel analog switch chips, and a control module. The plurality of multi-channel analog switch chips collect input signals and send output signals to the single-chip microcomputer, and the single-chip microcomputer receives and analyzes the output signals. If the circuit is abnormal, a signal is generated and sent to the host computer for recording. The control module is used to control the opening and closing state of the aging device according to the switch control signal. The detection and recording of circuit abnormalities of the aging device are realized.

Description

Technical Field

[0001] The invention relates to the technical field of aging testing, and in particular to a universal power supply aging vehicle. Background Art

[0002] With the widespread application of electronic products, the quality and reliability of power supply products are becoming more and more important. As a key link in the research and development and production of power supply products, power supply aging test can detect its stability and reliability, discover potential faults, and improve the quality of power supply products by applying rated AC voltage to power supply products and testing them with load and detecting performance indicators.

[0003] In the existing power supply aging process, the following technical problems often occur:

[0004] First, it is impossible to quickly detect and record abnormalities in the circuits of aging equipment to improve the processing efficiency of general aging vehicles and the traceability of abnormal situations;

[0005] Second, the existing technology in power aging testing lacks optimization in load resistance selection, in-depth analysis of abnormal situations, and a lack of problem feedback mechanism;

[0006] Third, the existing alarm thresholds are usually set uniformly and cannot be adjusted for different aged power supplies, which may result in false alarms or missed alarms. Summary of the invention

[0007] The summary of the invention is used to introduce concepts in a brief form, which will be described in detail in the detailed implementation section below. The summary of the invention is not intended to identify the key features or essential features of the technical solution claimed for protection, nor is it intended to limit the scope of the technical solution claimed for protection.

[0008] The present invention proposes a universal power supply aging vehicle to solve one or more of the technical problems mentioned in the above background technology part.

[0009] The present invention provides a universal power supply aging vehicle, comprising:

[0010] The single-chip microcomputer sampling system is configured with a single-chip microcomputer, multiple multi-channel analog switch chips, a control module, and a latch group. The single-chip microcomputer communicates with the host computer through a serial port. Each of the multiple multi-channel analog switch chips corresponds to multiple input signals. The input signals are voltage signals, current signals, and temperature data of the aged power supply in the aged power supply group.

[0011] The single-chip microcomputer is used to receive the circuit analysis signal sent by the control panel, determine the target multi-channel analog switch chip from the multiple multi-channel analog switch chips according to the circuit analysis signal, and generate a data acquisition instruction, and send the data acquisition instruction to the target multi-channel analog switch chip, so that the target multi-channel analog switch chip selects the corresponding input signal from the multiple input signals as the output signal and transmits it to the single-chip microcomputer;

[0012] The single-chip microcomputer is used to receive the output signal sent by the target multi-channel analog switch chip, and analyze the output signal to obtain the analysis result corresponding to the output signal. If the analysis result corresponding to the output signal is that the circuit is abnormal, a circuit abnormality signal is generated; according to the circuit abnormality signal, an abnormal parameter record is generated; the abnormal parameter record is sent to the host computer so that the host computer performs corresponding operations according to the abnormal parameter record; and a switch control signal is sent to the control module;

[0013] The control module is configured with a decoding unit and a preset number of dual-channel signal inversion units. The decoding unit is used to perform encoding conversion on the switch control signal to obtain a target number of level signals, and transmit the target number of level signals to a preset number of dual-channel signal inversion units; the dual-channel signal inversion unit is used to perform reverse processing on the level signal sent by the decoding unit to obtain a reverse level signal corresponding to each level signal; the dual-channel signal inversion unit is also used to send each reverse level signal to a corresponding latch group; so that the latch group controls the opening and closing state of the switch of the aging device according to the reverse level signal;

[0014] The host computer is used to receive the abnormal parameter records sent by the single-chip microcomputer and store the abnormal parameter records sent by the single-chip microcomputer.

[0015] Optionally, also include:

[0016] The abnormal record analysis device is used to obtain multiple abnormal parameter records of each aged power supply within the test cycle from the upper computer, and the abnormal parameter records include the abnormal time point corresponding to the aged power supply, the load resistance corresponding to the aged power supply, and the type information corresponding to the aged power supply; according to the abnormal time point corresponding to the aged power supply, each abnormal parameter record in the multiple abnormal parameter records of each aged power supply is sorted to obtain the abnormal parameter record sequence corresponding to each aged power supply; according to the test cycle, each abnormal parameter record sequence is divided to obtain multiple abnormal parameter record subsequences corresponding to each aged power supply; wherein each abnormal parameter record subsequence corresponds to a time interval; according to the multiple abnormal parameter record subsequences corresponding to each aged power supply, the matching coefficient of each load resistor with the same type of aged power supply is determined; according to the matching coefficient of each load resistor with the same type of aged power supply from large to small, each load resistor is sorted to obtain a load resistor sequence; the load resistor with the largest matching coefficient in the load resistor sequence is selected as the standard load resistor corresponding to the same type of aged power supply.

[0017] Optionally, the matching coefficient of each load resistor to the same type of aged power supply is determined by the following steps:

[0018] According to the resistance value of the load resistor and the type information corresponding to the aged power supply, a plurality of abnormal parameter record subsequences corresponding to each aged power supply are divided to obtain a plurality of abnormal parameter record subsequence sets; wherein each abnormal parameter record subsequence set corresponds to a load resistor and a type information;

[0019] For each abnormal parameter record subsequence set, determine the number of abnormal parameter records in each time interval, query the number of abnormal parameter records in each time interval in a preset abnormality score table, and obtain the abnormality score corresponding to each time interval; assign a corresponding weighted weight to the abnormality score corresponding to each time interval;

[0020] The weighted weights corresponding to the abnormal scores corresponding to each time interval are weighted summed to obtain the matching coefficient between each load resistor and the same type of aged power supply.

[0021] Optionally, the abnormal record analysis device is further used to divide each aged power supply according to the batch information corresponding to the aged power supply to obtain a plurality of aged power supply groups; wherein each aged power supply group corresponds to one batch information;

[0022] For multiple aged power supply groups, clustering the aged power supplies in each aged power supply group according to the number of abnormal parameter records corresponding to each aged power supply and a preset fixed number, to obtain a fixed number of clustering clusters corresponding to each aged power supply group;

[0023] The number of abnormal parameter records corresponding to each aged power supply in each cluster is summed to obtain the total number of abnormal parameter records corresponding to each cluster; the cluster corresponding to the maximum total number of abnormal parameter records is determined as the target cluster;

[0024] Generate an abnormal scatter plot according to multiple abnormal parameter records corresponding to each aged power supply in the target cluster and the abnormal time point corresponding to each abnormal parameter record;

[0025] Generate a batch exception report based on the abnormal scatter plot; and send the batch exception report to the host computer so that the host computer stores the batch exception report.

[0026] Optionally, batch exception reporting is determined by the following steps:

[0027] According to the test cycle, the time axis corresponding to the abnormal scatter plot is divided to generate multiple abnormal scatter intervals; the number of abnormal parameter records corresponding to each abnormal scatter interval is determined;

[0028] The sum of the number of abnormal parameter records corresponding to each abnormal scatter point interval is averaged to obtain the average value of the abnormal parameter records; the number of abnormal parameter records corresponding to each abnormal scatter point interval is compared with the average value of the abnormal parameter records. If there is an abnormal scatter point interval in which the number of abnormal parameter records is greater than the average value of the abnormal parameter records, the abnormal scatter point interval in which the number of abnormal parameter records is greater than the average value of the abnormal parameter records is determined as the target abnormal scatter point interval;

[0029] According to the abnormal parameter records corresponding to the target abnormal scatter point interval, the number of occurrences of the aged power supply corresponding to each type of information is determined; according to the number of occurrences of the aged power supply corresponding to each type of information, a batch abnormality report is generated.

[0030] The present invention has the following beneficial effects: 1. By setting a plurality of multi-channel analog switch chips, according to the data acquisition instructions sent by the single-chip microcomputer, the corresponding input signal is selected from the multi-channel input signals as the output signal, and sent to the single-chip microcomputer. The single-chip microcomputer analyzes the output signal after receiving it, and generates a circuit abnormality signal if the output signal is determined to be a circuit abnormality. And an abnormal parameter record is generated according to the circuit abnormality signal and sent to the host computer. The host computer stores the abnormal parameter record. The control module is used to control the opening and closing state of the aging equipment according to the switch control signal. Through the coordinated work of multiple analog switch chips with the single-chip microcomputer, the control module and the host computer, the circuit abnormality is detected and processed in time, and the recording function provides a favorable basis for subsequent problem tracing, thereby improving the efficiency of the universal aging vehicle in handling abnormal situations and the traceability of abnormal problems;

[0031] 2. By dividing and analyzing the sequence of abnormal parameter records of the aged power supply, the matching coefficient between the load resistor and the same type of aged power supply is determined to select the standard load resistor, thus achieving the optimal selection of the load resistor; the aged power supply is clustered according to the batch information and an abnormal scatter plot is generated, the time axis is divided to determine the target abnormal scatter interval, and the number of occurrences of different types of aged power supplies is determined according to the abnormal parameter records in the target abnormal scatter interval. Information is fed back to the upper computer by generating batch abnormality reports, which effectively solves the problem of insufficient in-depth analysis of abnormal situations and lack of problem feedback mechanism;

[0032] 3. By obtaining the rated voltage range and absolute maximum rated value of the aged power supply corresponding to different types of information, calculating the rated difference and querying it in the tolerance score table to obtain the tolerance score, matching the tolerance score with the preset score interval, and determining the alarm threshold adjustment plan, for the aged power supply corresponding to each type of information in the first score interval, querying the critical value in the critical value table to determine the maximum alarm threshold and the alarm range threshold to generate an alarm plan, for the aged power supply corresponding to each type of information in the second score interval, directly using the maximum rated value as the alarm threshold to generate an alarm plan, thereby solving the problem of false alarm or missed alarm caused by uniformly setting the alarm threshold, and realizing the setting of alarm thresholds for aged power supplies corresponding to different types of information. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] The above and other features, advantages and aspects of the embodiments of the present invention will become more apparent with reference to the following detailed description in conjunction with the accompanying drawings. Throughout the accompanying drawings, the same or similar reference numerals represent the same or similar elements. It should be understood that the drawings are schematic and that components and elements are not necessarily drawn to scale.

[0034] Figure 1 Schematic diagram of the exemplary structure of the universal aging vehicle of the present invention. DETAILED DESCRIPTION

[0035] The present invention will be described in more detail below with reference to the accompanying drawings. Although certain embodiments of the present invention are shown in the accompanying drawings, it should be understood that the present invention can be implemented in various forms and should not be construed as being limited to the embodiments set forth herein. On the contrary, these embodiments are provided to provide a more thorough and complete understanding of the present invention. It should be understood that the drawings and embodiments of the present invention are only for exemplary purposes and are not intended to limit the scope of protection of the present invention.

[0036] It should also be noted that, for ease of description, only the parts related to the invention are shown in the drawings. In the absence of conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other.

[0037] It should be noted that the concepts such as "first" and "second" mentioned in the present invention are only used to distinguish different devices, modules or units, and are not used to limit the order or interdependence of the functions performed by these devices, modules or units.

[0038] It should be noted that the modifications of "one" and "plurality" mentioned in the present invention are illustrative rather than restrictive, and those skilled in the art should understand that, unless otherwise clearly indicated in the context, it should be understood as "one or more".

[0039] The names of the messages or information exchanged between multiple devices of the present invention are only for illustrative purposes, and are not used to limit the scope of these messages or information.

[0040] The present invention will be described in detail below with reference to the accompanying drawings and in conjunction with embodiments.

[0041] like Figure 1 As shown, it is an exemplary structural diagram of the universal aging car of the present invention. Among them, the universal aging car includes: a single-chip sampling system 100, and the single-chip sampling system 100 is configured with a single-chip 101, a plurality of multi-channel analog switch chips 102, a control module 103, and a latch group 104. The single-chip 101 communicates with the host computer through a serial port, and each of the multiple multi-channel analog switch chips 102 corresponds to a multi-channel input signal. The input signal is the voltage signal, current signal, and temperature data of the aged power supply in the aged power supply group. In practice, each single-chip sampling system 100 needs to be responsible for collecting 32 output currents and 32 output voltages, a total of 64 analog signals. In practice, the single-chip 101 in the single-chip sampling system 100 can be an STM32F03C8T6 single-chip 101. Since the STM32F03C8T6 microcontroller has only 16 ADC input channels, it cannot meet the needs of collecting 64 analog signals. Therefore, the CD4067BPW chip can be selected as a multi-channel analog switch chip. The multi-channel analog switch chip is set to four as needed. Among them, each multi-channel analog switch chip is connected to a pin of the STM32F03C8T6 microcontroller. Therefore, each multi-channel analog switch chip corresponds to 16 input signals.

[0042] The single-chip microcomputer 101 is used to receive the circuit analysis signal sent by the control panel, determine the target multi-channel analog switch chip from the multiple multi-channel analog switch chips 102 according to the circuit analysis signal, and generate a data acquisition instruction, and send the data acquisition instruction to the target multi-channel analog switch chip, so that the target multi-channel analog switch chip selects the corresponding input signal from the multiple input signals as the output signal and transmits it to the single-chip microcomputer 101. In practice, the single-chip microcomputer 101 can be connected to the control panel through various communication methods, so that the single-chip microcomputer 101 can receive the circuit analysis signal sent by the control panel. In practice, the single-chip microcomputer 101 can determine the target multi-channel analog switch chip from the multiple multi-channel analog switch chips 102 by analyzing the circuit analysis signal. And generate a corresponding data acquisition instruction. The data acquisition instruction is sent to the target multi-channel analog switch chip, so that the target multi-channel analog switch chip selects the corresponding input signal from the multiple input signals as the output signal and transmits it to the single-chip microcomputer 101.

[0043] The single-chip computer 101 is used to receive the output signal sent by the target multi-channel analog switch chip, and analyze the output signal to obtain the analysis result corresponding to the output signal. In practice, the voltage signal, current signal, and temperature data of the aged power supply can be compared with the corresponding threshold value; if any of the voltage signal, current signal, and temperature data of the aged power supply is greater than the corresponding threshold value, the analysis result corresponding to the output signal is a circuit abnormality. If the analysis result corresponding to the output signal is a circuit abnormality, a circuit abnormality signal is generated; according to the circuit abnormality signal, an abnormal parameter record is generated. As an example, the abnormal parameter record includes but is not limited to the abnormal time point corresponding to the aged power supply, etc. In practice, the time point when the circuit abnormality signal is generated can be used as the abnormal time point corresponding to the aged power supply. The abnormal parameter record is sent to the host computer so that the host computer performs corresponding operations according to the abnormal parameter record. In practice, the single-chip computer 101 can send the abnormal parameter record to the host computer through the serial port connected to the host computer. And send a switch control signal to the control module 103 so that the control module 103 controls the opening and closing of the switch of the aging device according to the switch control signal.

[0044] The control module 103 is configured with a decoding unit and a preset number of dual-channel signal inversion units. The decoding unit is used to encode the switch control signal to obtain a target number of level signals, and transmit the target number of level signals to a preset number of dual-channel signal inversion units; the dual-channel signal inversion unit is used to reversely process the level signal sent by the decoding unit to obtain a reverse level signal corresponding to each level signal; the dual-channel signal inversion unit is also used to send each reverse level signal to the corresponding latch group 104; so that the latch group 104 controls the opening and closing state of the switch of the aging device according to the reverse level signal. In practice, a 3-8 decoder can be selected as the decoding unit in the control module 103. Among them, the 3-8 decoder includes three input lines and eight output lines. The three input lines are A0, A1 and A2. The eight output lines are Y0#, Y1#, Y2#, Y3#, Y4#, Y5#, Y6# and Y7#. The switch control signal is converted into binary code through the three input lines in the decoding unit to obtain eight level signals. Since the 3-8 decoder has eight output lines, the target number is eight. In addition, the 3-8 decoder also has three enable signal lines, which are E1#, E2#, and E3. When E1# and E2# are low and E3 is high, the 3-8 decoder will decode the input values ​​of A0, A1, and A2 and activate the corresponding output. The three main input signal lines (A0, A1, and A2) are connected to the three pins of the single-chip microcomputer 101 respectively, and E3 of the three enable signal lines is directly connected to the power supply, and E1# and E2# are grounded. Thus, the enabling condition of the 3-8 decoder is always satisfied. Among them, the enabling condition of the 3-8 decoder is that E1# and E2# are low and E3 is high. In practice, 4 identical dual-channel inverters can be selected as the dual-channel signal inversion unit in the control module 103. It can be seen that the preset number of dual-channel signal inversion units in the control module 103 has a total of eight input terminals, and the eight output lines in the 3-8 decoder are used as the output terminals of the 3-8 decoder. Among them, each of the eight input terminals of the dual-channel signal inversion unit corresponds to an output terminal of the 3-8 decoder. The dual-channel signal inversion unit is used to reversely process the level signal sent by the decoding unit to obtain a reverse level signal corresponding to each level signal. In practice, the dual-channel signal inversion unit converts the high-level signal output by the 3-8 decoder into a low-level signal, and the output low-level signal is converted into a high-level signal. Among them, the 8 output terminals of the 4 dual-channel inverters are respectively connected to the 8 latch groups. Each of the 8 output terminals of the 4 dual-channel inverters corresponds to a latch group 104. The dual-channel signal inversion unit is also used to send each reverse level signal to the corresponding latch group; so that the latch group 104 controls the opening and closing state of the switch of the aging device according to the reverse level signal. The dual-channel inverter sends the reverse level signal to the corresponding latch group 104 through the output terminal.As an example, the eight level signals output by the 3-8 decoder to the dual-channel signal inversion unit are 7 high-level signals and 1 low-level signal. After being processed by the dual-channel signal inversion unit, 7 low-level and 1 high-level outputs are obtained. When the reverse level signal corresponding to the latch group is a high-level signal, the two latches in the latch group are in the enabled state. The latch group in the enabled state controls the opening and closing state of the switch of the aging device.

[0045] The host computer is used to receive the abnormal parameter record sent by the single-chip computer 101 and store the abnormal parameter record sent by the single-chip computer 101.

[0046] In these embodiments, by setting a plurality of multi-channel analog switch chips, according to the data acquisition instruction sent by the single-chip microcomputer, the corresponding input signal is selected from the multi-channel input signals as the output signal, and sent to the single-chip microcomputer. After receiving the output signal, the single-chip microcomputer analyzes it, and if the output signal is determined to be a circuit abnormality, a circuit abnormality signal is generated. And an abnormal parameter record is generated according to the circuit abnormality signal and sent to the host computer. The host computer stores the abnormal parameter record. The control module is used to control the opening and closing state of the aging device according to the switch control signal. Through the collaborative work of multiple analog switch chips with the single-chip microcomputer, the control module and the host computer, the circuit abnormality is detected and processed in time, and the recording function provides a favorable basis for subsequent problem tracing, thereby improving the efficiency of the general aging vehicle in handling abnormal situations and the traceability of abnormal problems.

[0047] In some embodiments, in order to further solve the second technical problem described in the background technology section, namely, "the existing technology has the problem of lack of optimization in the selection of load resistors, lack of in-depth analysis of abnormal situations, and lack of problem feedback mechanism in power aging testing", the present invention also includes:

[0048] Optionally, also include:

[0049] The abnormal record analysis device is used to obtain multiple abnormal parameter records of each aged power supply within the test cycle from the upper computer, and the abnormal parameter records include the abnormal time point corresponding to the aged power supply, the load resistance corresponding to the aged power supply, and the type information corresponding to the aged power supply; according to the abnormal time point corresponding to the aged power supply, each abnormal parameter record in the multiple abnormal parameter records of each aged power supply is sorted to obtain the abnormal parameter record sequence corresponding to each aged power supply; according to the test cycle, each abnormal parameter record sequence is divided to obtain multiple abnormal parameter record subsequences corresponding to each aged power supply; wherein each abnormal parameter record subsequence corresponds to a time interval; according to the multiple abnormal parameter record subsequences corresponding to each aged power supply, the matching coefficient of each load resistor with the same type of aged power supply is determined; according to the matching coefficient of each load resistor with the same type of aged power supply from large to small, each load resistor is sorted to obtain a load resistor sequence; the load resistor with the largest matching coefficient in the load resistor sequence is selected as the standard load resistor corresponding to the same type of aged power supply.

[0050] In some embodiments, the abnormal record analysis device can be various electronic computers (such as desktop computers). The abnormal record analysis device is configured with a central processing unit, a communication module, etc. as needed. The abnormal record analysis device can be connected to the host computer through the communication module so that the abnormal record analysis device obtains multiple abnormal parameter records of each aged power supply in the test cycle from the host computer. In practice, the test cycle can be ten days. Among them, the aged power supply can be the aged power supply A. As an example, the abnormal record analysis device can obtain all abnormal parameter records of the aged power supply A in a complete test cycle (ten days) from the host computer. Thus, multiple abnormal parameter records corresponding to the aged power supply A are obtained. Among them, the abnormal parameter record includes the abnormal time point corresponding to the aged power supply, the load resistance corresponding to the aged power supply, and the type information corresponding to the aged power supply. Since each abnormal parameter record corresponds to an abnormal time point, each abnormal parameter record in the multiple abnormal parameter records of each aged power supply can be sorted according to the order of the abnormal time point from first to last, and the abnormal parameter record sequence corresponding to each aged power supply is obtained. According to the test cycle, each abnormal parameter record sequence is divided to obtain multiple abnormal parameter record subsequences corresponding to each aged power supply. In practice, the test cycle is ten days, and the test cycle (10 days) can be divided into ten time intervals, that is, each time interval corresponds to one day in the test cycle (10 days). According to the ten time intervals corresponding to the cycle (10 days), each abnormal parameter record sequence is divided to obtain multiple abnormal parameter record subsequences corresponding to each aged power supply. Among them, each abnormal parameter record subsequence corresponds to a time interval. According to the multiple abnormal parameter record subsequences corresponding to each aged power supply, the matching coefficient of each load resistor and the same type of aged power supply is determined.

[0051] Optionally, the matching coefficient of each load resistor to the same type of aged power supply is determined by the following steps:

[0052] Step 1: According to the resistance value of the load resistor and the type information corresponding to the aged power supply, multiple abnormal parameter record subsequences corresponding to each aged power supply are divided to obtain multiple abnormal parameter record subsequence sets; wherein each abnormal parameter record subsequence set corresponds to a load resistor and a type information.

[0053] In some embodiments, as an example, the resistance value of the load resistor may be 5 ohms and 10 ohms. The type information corresponding to the aged power supply may be P type and M type. In practice, multiple abnormal parameter record subsequences corresponding to the aged power supply whose resistance value of the load resistor is 5 ohms and whose type information corresponding to the aged power supply is P type may be combined to obtain an abnormal parameter record subsequence set Z. Among them, the resistance value of the load resistor corresponding to the abnormal parameter record subsequence set is 5 ohms, and the type information corresponding to the abnormal parameter record subsequence set is P type.

[0054] Step 2: For each abnormal parameter record subsequence set, determine the number of abnormal parameter records corresponding to each time interval, query the number of abnormal parameter records corresponding to each time interval in the preset abnormality score table, and obtain the abnormality score corresponding to each time interval; assign a corresponding weighted weight to the abnormality score corresponding to each time interval.

[0055] In some embodiments, it can be seen from the above that each abnormal parameter record subsequence corresponds to a time interval. As an example, the number of abnormal parameter records in a time interval in the abnormal parameter record subsequence set Z is determined to obtain the number of abnormal parameter records corresponding to each time interval. As an example, the time interval can be a time interval F and a time interval M. The number of abnormal parameter records corresponding to the time interval (F) can be 30, and the number of abnormal parameter records corresponding to the time interval (M) can be 20. The number of abnormal parameter records corresponding to the time interval (M) (20) and the number of abnormal parameter records corresponding to the time interval (F) (30) are queried in the preset abnormal score table respectively, and the abnormal score corresponding to the time interval (F) can be 60 points and the abnormal score corresponding to the time interval (M) can be 40 points. The corresponding weighted weight is assigned to the abnormal score corresponding to each time interval. In practice, for each time interval corresponding to a test cycle, the time intervals corresponding to the test cycle can be sorted in the order of the time intervals from first to last to obtain a time interval sequence. The maximum weight is assigned to the abnormal score corresponding to the first time interval in the time interval sequence, and the weights are decreased in order so that the abnormal score corresponding to each time interval is assigned a different weighted weight. The weighted weights corresponding to the abnormal scores corresponding to each time interval are weighted summed to obtain the matching coefficient of each load resistor and the same type of aged power supply.

[0056] Step three, sorting the load resistors according to the order of matching coefficients between each load resistor and the same type of aged power supply from large to small to obtain a load resistor sequence; selecting the load resistor with the largest matching coefficient in the load resistor sequence as the standard load resistor corresponding to the same type of aged power supply.

[0057] In some embodiments, as an example, the matching coefficient between the P-type aged power supply and the load resistor with a resistance value (5 ohms) can be 50. The matching coefficient between the P-type aged power supply and the load resistor with a resistance value (10 ohms) can be 40. According to the order of matching coefficient from large to small, the load resistors are sorted to obtain a load resistor sequence. As an example, the load resistor with the largest matching coefficient in the load resistor sequence is selected as the standard load resistor corresponding to the same type of aged power supply.

[0058] Optionally, the abnormal record analysis device is further used to divide each aged power supply according to batch information corresponding to the aged power supplies to obtain multiple aged power supply groups; wherein each aged power supply group corresponds to a batch information; for the multiple aged power supply groups, cluster the aged power supplies in each aged power supply group according to the number of abnormal parameter records corresponding to each aged power supply and a preset fixed number to obtain a fixed number of cluster clusters corresponding to each aged power supply group; sum the number of abnormal parameter records corresponding to each aged power supply in each cluster cluster to obtain the total number of abnormal parameter records corresponding to each cluster cluster; determine the cluster cluster corresponding to the maximum total number of abnormal parameter records as the target cluster cluster; generate an abnormal scatter plot according to the multiple abnormal parameter records corresponding to each aged power supply in the target cluster cluster and the abnormal time point corresponding to each abnormal parameter record; generate a batch abnormality report according to the abnormal scatter plot; and send the batch abnormality report to the host computer so that the host computer stores the batch abnormality report.

[0059] In some embodiments, the abnormal record analysis device is further used to combine the aged power supplies with the same batch information according to the batch information corresponding to the aged power supplies to obtain multiple aged power supply groups. Each aged power supply group corresponds to a batch information. For multiple aged power supply groups, as an example, the preset fixed number can be 2. Cluster the aged power supplies in each aged power supply group to obtain two cluster clusters corresponding to each aged power supply group. Among them, clustering can be performed according to the number of abnormal parameter records corresponding to each aged power supply. The number of abnormal parameter records corresponding to each aged power supply in each cluster cluster is summed to obtain the total number of abnormal parameter records corresponding to each cluster cluster; the cluster cluster corresponding to the maximum total number of abnormal parameter records is determined as the target cluster cluster. As an example, the X-axis of the abnormal scatter plot can be the time axis. The Y-axis of the abnormal scatter plot can be the load resistance corresponding to the aged power supply. Thus, a blank abnormal scatter plot is generated. According to the abnormal time point and load resistance corresponding to each abnormal parameter record. Multiple abnormal parameter records corresponding to each aged power supply in the target cluster cluster are input into the blank abnormal scatter plot to obtain an abnormal scatter plot.

[0060] Optionally, batch exception reporting is determined by the following steps:

[0061] Step 1: divide the time axis corresponding to the abnormal scatter plot according to the test cycle to generate multiple abnormal scatter intervals; determine the number of abnormal parameter records corresponding to each abnormal scatter interval.

[0062] In some embodiments, as an example, it can be seen from the above that the test period is ten days. The test period (10 days) can be divided into 10 time periods. Each time period is matched with the time axis corresponding to the abnormal scatter plot to generate ten abnormal scatter intervals. Among them, each abnormal scatter interval corresponds to a time period. The number of scatter points in the abnormal scatter interval is determined as the number of abnormal parameter records corresponding to each abnormal scatter interval.

[0063] Step 2: Average the sum of the numbers of abnormal parameter records corresponding to each abnormal scatter point interval to obtain the average value of the abnormal parameter records; compare the number of abnormal parameter records corresponding to each abnormal scatter point interval with the average value of the abnormal parameter records. If there is an abnormal scatter point interval in which the number of abnormal parameter records is greater than the average value of the abnormal parameter records, the abnormal scatter point interval in which the number of abnormal parameter records is greater than the average value of the abnormal parameter records is determined as the target abnormal scatter point interval.

[0064] In some embodiments, the sum of the number of abnormal parameter records corresponding to each abnormal scatter point interval is averaged to obtain an average value of the abnormal parameter records. As an example, the average value of the abnormal parameter records may be 5. The number of abnormal parameter records corresponding to each abnormal scatter point interval is compared with the average value of the abnormal parameter records. If there is an abnormal scatter point interval in which the number of abnormal parameter records is greater than the average value of the abnormal parameter records (5), the abnormal scatter point interval is determined as the target abnormal scatter point interval.

[0065] Step three: determine the number of occurrences of the aged power supply corresponding to each type of information according to the abnormal parameter records corresponding to the target abnormal scatter point interval; and generate a batch abnormality report according to the number of occurrences of the aged power supply corresponding to each type of information.

[0066] In some embodiments, the abnormal parameter record corresponding to the target abnormal scatter point interval contains type information corresponding to the aged power supply. The number of occurrences of the aged power supply corresponding to each type of information in the target abnormal scatter point interval is counted. As an example, the type information can be H type, J type, and K type, and the number of occurrences of H type aged power supplies, the number of occurrences of J type aged power supplies, and the number of occurrences of K type aged power supplies in the target abnormal scatter point interval are counted respectively. According to the number of occurrences of the aged power supplies corresponding to each type of information obtained by statistics, a batch abnormality report is generated. The batch abnormality report includes the type information and the number of occurrences corresponding to the type information.

[0067] In these embodiments, by dividing and analyzing the sequence of abnormal parameter records of the aged power supplies, the matching coefficient between the load resistor and the same type of aged power supplies is determined to select the standard load resistor, thereby achieving optimal selection of the load resistor; the aged power supplies are clustered according to the batch information and an abnormal scatter plot is generated, the time axis is divided to determine the target abnormal scatter interval, the number of occurrences of different types of aged power supplies is determined according to the abnormal parameter records in the target abnormal scatter interval, and information is fed back to the upper computer by generating a batch abnormality report, which effectively solves the problems of insufficient in-depth analysis of abnormal situations and lack of a problem feedback mechanism.

[0068] In some embodiments, in order to further solve the third technical problem described in the background technology section, that is, "the existing alarm threshold is usually set uniformly, cannot be adjusted for different aged power supplies, and may cause false alarms or missed alarms", the present invention also includes:

[0069] The alarm scheme generating device is used to obtain the rated voltage range of the aged power supply and the absolute maximum rated value of the aged power supply corresponding to each type information. As an example, the type information may be power supply type A and power supply type B. Among them, the rated voltage range of the aged power supply corresponding to power supply type A may be 20-30V. The rated voltage range of the aged power supply corresponding to power supply type B may be 30-35V. The absolute maximum rated value of the aged power supply corresponding to power supply type A may be 35V. The rated voltage range of the aged power supply corresponding to power supply type B may be 36V.

[0070] According to the rated voltage range of the aged power supply corresponding to each type of information, the maximum rated value of the aged power supply is determined; the maximum rated value of the aged power supply is subtracted from the corresponding absolute maximum rated value to obtain the rated difference corresponding to the aged power supply. As an example, the rated voltage range of the aged power supply corresponding to power type A is (20-30V), and the maximum rated value in the rated voltage range (20-30V) is determined as the maximum rated value (30V) of the aged power supply corresponding to power type A. The maximum rated value (30V) of the aged power supply corresponding to power type A is subtracted from the absolute maximum rated value (35V) of the aged power supply corresponding to power type A to obtain the rated difference (5V) of the aged power supply corresponding to power type A.

[0071] The rated difference corresponding to the aged power supply is queried in the preset tolerance score table to obtain the tolerance score of the aged power supply corresponding to each type of information. As an example, the rated difference (5V) of the aged power supply corresponding to power supply type A is queried in the preset tolerance score table, and the tolerance score of the aged power supply corresponding to power supply type A is 70 points. The tolerance score table includes the rated difference and the tolerance score corresponding to the rated difference. The tolerance score corresponding to the rated difference is used as the tolerance score of the aged power supply corresponding to the type information. The tolerance score can indicate the allowable deviation degree of the aged power supply to the abnormal voltage. The higher the tolerance score, the greater the allowable deviation degree of the aged power supply to the abnormal voltage.

[0072] The tolerance score of the aged power supply corresponding to each type of information is matched with a plurality of preset score intervals to obtain a score interval corresponding to the aged power supply corresponding to each type of information. As an example, the plurality of score intervals may be a first score interval (51-100) and a second score interval (1-50).

[0073] According to the scoring interval of the aged power supply corresponding to each type of information, an alarm threshold adjustment scheme of the aged power supply corresponding to each type of information is determined.

[0074] The alarm threshold adjustment scheme of the aged power supply corresponding to each type of information can be determined by the following steps:

[0075] For each aged power supply corresponding to each type of information in the first scoring interval, the tolerance score of the aged power supply corresponding to each type of information is queried in a preset critical value table to obtain the critical value of the aged power supply corresponding to each type of information; the critical value of the aged power supply corresponding to each type of information is subtracted from the corresponding absolute maximum rated value to obtain the maximum alarm threshold of the aged power supply corresponding to each type of information; according to the maximum rated value and the maximum alarm threshold of the aged power supply corresponding to each type of information, the alarm range threshold of the aged power supply corresponding to each type of information is determined. According to the alarm range threshold of the aged power supply corresponding to each type of information, an alarm scheme for the aged power supply corresponding to each type of information is generated.

[0076] As an example, the tolerance score (70) of the aged power supply corresponding to power type A is queried in the preset critical value table, and the critical value of the aged power supply corresponding to power type A is 2V. The absolute maximum rated value (35V) is subtracted from the critical value (2V), and the maximum alarm threshold of the aged power supply corresponding to power type A is 33V. The maximum rated value (30V) and the maximum alarm threshold (33V) of the aged power supply corresponding to power type A are combined, and the alarm range threshold of the aged power supply corresponding to power type A is 30V-33V. Therefore, the alarm scheme of the aged power supply corresponding to power type A is determined to trigger the alarm mechanism when the voltage value in the voltage signal of the aged power supply corresponding to power type A falls within the alarm range threshold (30V-33V) and lasts for more than 3 seconds.

[0077] For the aged power supply corresponding to each type of information in the second scoring interval, the maximum rated value of the aged power supply corresponding to each type of information is used as the alarm threshold, and an alarm scheme is generated according to the alarm threshold. As an example, the tolerance score of the aged power supply corresponding to power type B can be 40 points. Since the tolerance score (40) of the aged power supply corresponding to power type B falls within the second scoring interval, the maximum rated value (35V) of the aged power supply corresponding to power type B is used as the alarm threshold. According to the alarm threshold, an alarm scheme is generated. Among them, the alarm scheme of the aged power supply corresponding to power type B can be that the alarm mechanism is triggered when the voltage value in the voltage signal of the aged power supply corresponding to power type B is greater than the alarm threshold (35V).

[0078] In these embodiments, the rated voltage range and absolute maximum rated value of the aged power supply corresponding to different types of information are obtained, the rated difference is calculated and the tolerance score is obtained by querying in a tolerance score table, the tolerance score is matched with a preset score interval, and an alarm threshold adjustment scheme is determined. For the aged power supply corresponding to each type of information in the first score interval, the critical value is queried in the critical value table to determine the critical value and then the maximum alarm threshold and the alarm range threshold are determined to generate an alarm scheme. For the aged power supply corresponding to each type of information in the second score interval, the maximum rated value is directly used as the alarm threshold to generate an alarm scheme, thereby solving the problem of false alarm or missed alarm caused by uniformly setting the alarm threshold and realizing the setting of alarm thresholds for aged power supplies corresponding to different types of information.

[0079] The above descriptions are only some preferred embodiments of the present invention and the explanation of the technical principles used. Those skilled in the art should understand that the scope of the invention involved in the present invention is not limited to the technical solutions formed by the specific combination of the above technical features, but also should cover other technical solutions formed by any combination of the above technical features or their equivalent features without departing from the above inventive concept. For example, the above features are replaced with the technical features with similar functions disclosed in the present invention (but not limited to) to form a technical solution.

Claims

1. A universal power supply aging vehicle, characterized in that: include: A single-chip microcomputer sampling system, wherein the single-chip microcomputer sampling system is configured with a single-chip microcomputer, a plurality of multi-channel analog switch chips, a control module, and a latch group. The single-chip microcomputer communicates with a host computer through a serial port. Each of the plurality of multi-channel analog switch chips corresponds to a plurality of input signals, and the input signals are voltage signals, current signals, and temperature data of the aged power supply in the aged power supply group; The single-chip microcomputer is used to receive a circuit analysis signal sent by a control panel, determine a target multi-channel analog switch chip from a plurality of multi-channel analog switch chips according to the circuit analysis signal, and generate a data acquisition instruction, and send the data acquisition instruction to the target multi-channel analog switch chip, so that the target multi-channel analog switch chip selects a corresponding input signal from the multiple input signals as an output signal and transmits it to the single-chip microcomputer; The single-chip microcomputer is used to receive the output signal sent by the target multi-channel analog switch chip, and analyze the output signal to obtain the analysis result corresponding to the output signal. If the analysis result corresponding to the output signal is a circuit abnormality, a circuit abnormality signal is generated; an abnormal parameter record is generated according to the circuit abnormality signal; the abnormal parameter record is sent to the host computer so that the host computer performs corresponding operations according to the abnormal parameter record; and a switch control signal is sent to the control module; The control module is configured with a decoding unit and a preset number of dual-channel signal inversion units, the decoding unit is used to perform encoding conversion on the switch control signal to obtain a target number of level signals, and transmit the target number of level signals to a preset number of dual-channel signal inversion units; the dual-channel signal inversion unit is used to perform reverse processing on the level signal sent by the decoding unit to obtain a reverse level signal corresponding to each level signal; the dual-channel signal inversion unit is also used to send each reverse level signal to a corresponding latch group; so that the latch group controls the opening and closing state of the switch of the aging device according to the reverse level signal; The host computer is used to receive the abnormal parameter records sent by the single-chip microcomputer and store the abnormal parameter records sent by the single-chip microcomputer.

2. The universal power supply aging vehicle according to claim 1 is characterized in that: Also includes: An abnormal record analysis device, the abnormal record analysis device is used to obtain multiple abnormal parameter records of each aged power supply within a test cycle from a host computer, the abnormal parameter records include the abnormal time point corresponding to the aged power supply, the load resistance corresponding to the aged power supply, and the type information corresponding to the aged power supply; according to the abnormal time point corresponding to the aged power supply, each abnormal parameter record in the multiple abnormal parameter records of each aged power supply is sorted to obtain an abnormal parameter record sequence corresponding to each aged power supply; according to the test cycle, each abnormal parameter record sequence is divided to obtain multiple abnormal parameter record subsequences corresponding to each aged power supply; wherein each abnormal parameter record subsequence corresponds to a time interval; According to multiple abnormal parameter record subsequences corresponding to each aged power supply, the matching coefficient of each load resistor and the same type of aged power supply is determined; according to the order of the matching coefficients of each load resistor and the same type of aged power supply from large to small, the load resistors are sorted to obtain a load resistor sequence; and the load resistor with the largest matching coefficient in the load resistor sequence is selected as the standard load resistor corresponding to the same type of aged power supply.

3. The universal power supply aging vehicle according to claim 2 is characterized in that: The matching coefficient of each load resistor and the same type of aged power supply is determined by the following steps: According to the resistance value of the load resistor and the type information corresponding to the aged power supply, a plurality of abnormal parameter record subsequences corresponding to each aged power supply are divided to obtain a plurality of abnormal parameter record subsequence sets; wherein each abnormal parameter record subsequence set corresponds to a load resistor and a type information; For each abnormal parameter record subsequence set, determine the number of abnormal parameter records in each time interval, query the number of abnormal parameter records in each time interval in a preset abnormality score table, and obtain the abnormality score corresponding to each time interval; assign a corresponding weighted weight to the abnormality score corresponding to each time interval; The weighted weights corresponding to the abnormal scores corresponding to each time interval are weighted summed to obtain the matching coefficient between each load resistor and the same type of aged power supply.

4. The universal power supply aging vehicle according to claim 3 is characterized in that: The abnormal record analysis device is also used to divide each aged power supply according to the batch information corresponding to the aged power supply to obtain a plurality of aged power supply groups; wherein each aged power supply group corresponds to one batch information; For multiple aged power supply groups, clustering the aged power supplies in each aged power supply group according to the number of abnormal parameter records corresponding to each aged power supply and a preset fixed number, to obtain a fixed number of clustering clusters corresponding to each aged power supply group; The number of abnormal parameter records corresponding to each aged power supply in each cluster is summed to obtain the total number of abnormal parameter records corresponding to each cluster; the cluster corresponding to the maximum total number of abnormal parameter records is determined as the target cluster; Generate an abnormal scatter plot according to multiple abnormal parameter records corresponding to each aged power supply in the target cluster and the abnormal time point corresponding to each abnormal parameter record; Generate a batch exception report according to the abnormal scatter plot; and send the batch exception report to a host computer so that the host computer stores the batch exception report.

5. The universal power supply aging vehicle according to claim 4 is characterized in that: The batch exception report is determined by the following steps: According to the test cycle, the time axis corresponding to the abnormal scatter plot is divided to generate multiple abnormal scatter intervals; the number of abnormal parameter records corresponding to each abnormal scatter interval is determined; The sum of the number of abnormal parameter records corresponding to each abnormal scatter point interval is averaged to obtain the average value of the abnormal parameter records; the number of abnormal parameter records corresponding to each abnormal scatter point interval is compared with the average value of the abnormal parameter records. If there is an abnormal scatter point interval in which the number of abnormal parameter records is greater than the average value of the abnormal parameter records, the abnormal scatter point interval in which the number of abnormal parameter records is greater than the average value of the abnormal parameter records is determined as the target abnormal scatter point interval; Determine the number of occurrences of the aged power supply corresponding to each type of information according to the abnormal parameter records corresponding to the target abnormal scatter point interval; A batch exception report is generated according to the number of occurrences of aged power supplies corresponding to each type of information.

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