Ceramic tile surface flatness detection device and detection method thereof

Abstract

The invention relates to the technical field of tile detection, in particular to a tile surface flatness detection device and method, and the device comprises a transmission module, and a trigger module, a measurement module and a data collection module which are electrically connected with one another. The transmission module is used for transmitting the measured ceramic tile and the trigger module, and the trigger module is used for synchronously triggering the data acquisition module to acquire and record the data of the corresponding surface feature points on the measured ceramic tile measured by the measurement module according to the distance between the surface feature points of the measured ceramic tile; the measurement module is used for measuring surface feature point data of the measured ceramic tile and sending the data to the data acquisition module; and the data acquisition module is used for processing and displaying the acquired surface feature point data of the detected ceramic tile and transmitting the surface feature point data to the external data processing module in real time. The defects that a common tile flatness detection device in the market is high in cost, complex in structure and the like, and manual detection is low in efficiency, low in precision and the like are overcome.

Description

Technical Field

[0001] The present invention relates to the technical field of ceramic tile detection, and in particular to a ceramic tile surface flatness detection device and a detection method thereof. Background Art

[0002] Ceramic tiles, a widely used decoration material, have occupied a pivotal position in the market with their diverse styles and excellent performance. In today's pursuit of high-quality living environment, the surface flatness of ceramic tiles is one of the core indicators to measure its quality, and its importance is self-evident. It is not only directly related to the practical performance of ceramic tiles after laying, such as walking comfort and space cleanliness, but also has a profound impact on the overall aesthetic effect and visual experience of decoration. Therefore, in the production process of ceramic tiles, strict testing of surface flatness has become an indispensable part.

[0003] Since the beginning of the 21st century, with the rapid development of science and technology, my country's ceramic tile production industry has ushered in unprecedented prosperity, and the high degree of automation of the production process has become the norm in the industry. In the field of ceramic tile surface quality inspection, advanced technologies such as visual inspection and laser displacement sensors are widely used in inspection equipment, greatly improving the accuracy and efficiency of inspection. However, these high-end equipment are often accompanied by high costs, which makes them serve more large-scale ceramic tile manufacturers, while many small and medium-sized manufacturers have to rely on traditional manual inspection methods, such as using feeler gauges for measurement, due to budget constraints. This method is not only inefficient and difficult to meet the needs of large-scale production, but also difficult to guarantee in terms of accuracy and consistency, which may affect the market competitiveness of ceramic tile products. Summary of the invention

[0004] One purpose of the present invention is to provide a device for detecting the flatness of a ceramic tile surface, so as to solve the shortcomings of the common ceramic tile flatness detection devices on the market, such as high cost and complex structure, as well as the shortcomings of slow efficiency and low precision of manual detection;

[0005] Another object of the present invention is to provide a detection method for a tile surface flatness detection device.

[0006] To achieve this object, the present invention adopts the following technical solutions:

[0007] A device for detecting the flatness of a tile surface comprises a transmission module, a trigger module, a measurement module and a data acquisition module, wherein the trigger module, the measurement module and the data acquisition module are electrically connected to each other;

[0008] The tested tile and the trigger module are placed on the transmission module, the trigger module is located on one side of the tested tile, an arched mounting bracket is installed above the transmission module, and the measuring module and the data acquisition module are installed on the arched mounting bracket;

[0009] The transmission module is used to transmit the tested tiles and the trigger module. The trigger module is used to synchronously trigger the data acquisition module according to the distance between the surface feature points of the tested tiles to collect and record the corresponding surface feature point data on the tested tiles measured by the measuring module; the measuring module is used to measure the surface feature point data of the tested tiles and send it to the data acquisition module; the data acquisition module is used to process and display the collected surface feature point data of the tested tiles, and transmit the surface feature point data to the external data processing module in real time.

[0010] Preferably, it also includes a standard gauge block, wherein the standard gauge block has a standard thickness value.

[0011] Preferably, the transmission module comprises a transmission platform and transmission mounting brackets arranged along both sides of the transmission platform;

[0012] The conveying installation bracket is provided with a conveying installation groove along its length direction, and the two ends of the arched installation bracket are detachably installed in the conveying installation grooves on both sides.

[0013] Preferably, the trigger module includes a trigger mounting seat, a light blocking ruler, a sensor mounting seat and a beam-type infrared sensor;

[0014] The trigger mounting seat is mounted on the conveying platform, the lower surface of the light-blocking ruler is mounted on the trigger mounting seat, and light-blocking sheets are detachably mounted on the light-blocking ruler at intervals, the light-blocking ruler is made of a transparent material, and the light-blocking sheet is made of a non-transparent material;

[0015] The sensor mounting seat is detachably mounted in one of the transmission mounting grooves of the transmission mounting bracket, the opposing infrared sensor is mounted on the sensor mounting seat, and the opposing infrared sensor includes a transmitter and a receiver, and an opposing space is provided between the transmitter and the receiver;

[0016] When the conveying platform drives the light-blocking ruler on the sensor mounting seat to move, the light-blocking ruler movably passes through the opposing space of the opposing infrared sensor. When the light-blocking sheet on the light-blocking ruler passes through the opposing space of the opposing infrared sensor, the opposing infrared sensor triggers a signal and synchronously triggers the data acquisition module to collect and record the surface feature point data of the measured tile measured by the measuring module.

[0017] Preferably, the measuring module includes three groups of measuring submodules, and the measuring submodules are detachably mounted on the arch mounting bracket; the measuring submodules include a measuring mounting seat, a measuring mounting rod and a digital dial indicator;

[0018] The measuring mounting seat is provided with a mounting portion, the arched mounting bracket is provided with a clamping groove, and the mounting portion is installed in the clamping groove through a fastener; the measuring mounting seat is provided with a measuring mounting through hole at one end away from the measuring mounting seat, the measuring mounting rod can be movably installed in the measuring mounting through hole, and the lower end of the measuring mounting rod is provided with the digital display dial indicator;

[0019] The measuring module further comprises a measuring ruler, and the measuring ruler is arranged on the conveying platform.

[0020] Preferably, the data acquisition module includes a storage box, an OLED display screen and a single-chip microcomputer;

[0021] The storage box is installed on the arched mounting bracket, the OLED display screen is exposed from the storage box, and the single-chip microcomputer is built in the storage box;

[0022] The single chip microcomputer includes a control processing unit, a digital display dial indicator data acquisition unit, a beam infrared sensor trigger acquisition unit, an OLED data display unit and a serial communication unit which are electrically connected to each other;

[0023] The control processing unit is used to coordinate control and process the digital display dial indicator data acquisition unit, the infrared sensor trigger acquisition unit, the OLED data display unit and the serial communication unit;

[0024] The digital display dial gauge data acquisition unit is used to acquire the surface feature point data of the tested tile acquired by the digital display dial gauge;

[0025] The opposed-beam infrared sensor trigger acquisition unit is used to acquire the trigger signal of the opposed-beam infrared sensor;

[0026] The OLED data display unit is used to display the surface feature point data collected by the state of the digital display dial indicator;

[0027] The serial communication unit is used to transmit the surface feature point data to an external data processing module in real time.

[0028] Preferably, the control processing unit includes a control processing chip U3, and the model of the control processing chip U3 is STM32F103C8T6.

[0029] Preferably, the digital dial indicator data acquisition unit comprises a digital dial indicator data acquisition chip U1, a potentiometer R1, a digital dial indicator socket port U4, a digital dial indicator socket port U5 and a digital dial indicator socket port U6;

[0030] The digital dial gauge data acquisition chip U1 is electrically connected to the control processing chip U3 through the potentiometer R1, and the digital dial gauge socket port U4, the digital dial gauge socket port U5 and the digital dial gauge socket port U6 are all electrically connected to the digital dial gauge data acquisition chip U1, and the digital dial gauge socket port U4, the digital dial gauge socket port U5 and the digital dial gauge socket port U6 are all electrically connected to the digital dial gauge;

[0031] The model of the digital display dial indicator data acquisition chip U1 is TXS0108EQPWRQ1.

[0032] A detection method of a ceramic tile surface flatness detection device, applied to a ceramic tile surface flatness detection device as described above, comprises the following steps:

[0033] S1. Calibration steps: Place the standard gauge block under the three digital dial indicators for measurement, record the three measured values ​​as the calibration values ​​of the three digital dial indicators, and input them into the data acquisition module corresponding to each digital dial indicator;

[0034] S2, preparation step: according to the thickness and size of the measured tile, record 9 surface feature points of the measured tile measuring surface, including point A, point B, point C, point D, point E, point F, point G, point H and point I, and adjust the trigger module and the measurement module according to the distance between the 9 surface feature points, where point E is the center point, point A, point C, point G and point I are corner points, and point B, point D, point F and point H are the midpoints of the four sides respectively;

[0035] S3, measurement steps: start the transmission module and start to transmit the measured tiles;

[0036] When the surface feature point on the tested tile passes through the trigger module, the trigger module sends a signal, and the data acquisition module detects the signal of the trigger module and immediately records the data of the surface feature point of the tested tile measured by the measurement module at this moment;

[0037] S4, data processing step: the data acquisition module receives the surface feature point data from the measurement module, displays it in real time through the OLED display screen, and transmits the surface feature point data to the external data processing module in real time;

[0038] S5. Result analysis and evaluation step: The data processing module processes and analyzes the collected surface feature point data, uses the calibration value in the correction step to make corrections, calculates the center curvature, warpage and edge curvature of the tested tile, and evaluates the flatness of the tile surface according to the preset tile flatness classification.

[0039] Preferably, the step S5, result analysis and evaluation: the data processing module processes and analyzes the collected surface feature point data, uses the calibration value in the correction step to make corrections, calculates the center curvature, warpage and edge curvature of the tested tile, and evaluates the flatness of the surface of the tested tile; specifically includes the following steps:

[0040] S51, taking the corner point of the standard gauge block close to point A on the measured tile as the origin O, the straight line parallel to points A, B and C as the X-axis, the straight line parallel to points A, D and G as the Y-axis, and the straight line perpendicular to the origin O as the Z-axis, to establish a rectangular coordinate system xyz;

[0041] S52, assuming that the width of the tile to be measured is M and the length is N, then the coordinates of the feature points are: point A (10, 10, HA), point B (M / 2, HB), point C (M-10, 10, HC), point D (10, N / 2, HD), point E (M / 2, N / 2, HE), point F (M-10, N / 2, HF), point G (10, N-10, HG), point H (M / 2, N-10, HH) and point I (M-10, N-10, HI);

[0042] S53. Definition of center curvature: It refers to the distance of the center point of the measured surface of the tile being measured from the plane determined by any three of the four corner points of the tile being measured, and finally expressed as a percentage of the length of the diagonal line, that is, the distances from point E to planes ACI, CIG, IGA and GAC are calculated respectively, and the maximum distance Lzmax is divided by the length of the diagonal line;

[0043] S54. The specific calculation process of the center curvature is:

[0044] Let the equation of plane ACI be:

[0045] A 1 x+B 1 y+C 1 z+D 1 =0 (1);

[0046] Then the distance from point E to plane ACI is:

[0047]

[0048] Assume the equation of plane CIG is:

[0049] A 2 x+B 2 y+C 2 z+D 2 =0 (3);

[0050] Then the distance from point E to plane CIG is:

[0051]

[0052] Let the equation of the plane IGA be:

[0053] A 3 x+B 3 y+C 3 z+D 3 =0 (5);

[0054] Then the distance from point E to plane IGA is:

[0055]

[0056] Let the equation of plane GAC be:

[0057] A 4 x+B 4 y+C 4 z+D 4 =0 (7);

[0058] Then the distance from point E to plane GAC is:

[0059]

[0060] Take L zmax =(L Z1 ,L Z2 ,L Z3 ,L Z4 );

[0061] Then the central curvature α is:

[0062]

[0063] S55. Definition of warpage: It refers to the distance of one corner point of the measured surface of the tile being measured from the plane determined by the other three corner points, and then expressed as a percentage of the length of the diagonal line, that is, the distances from point A to plane CIG, point C to plane IGA, point I to plane GAC, and point G to plane ACI are calculated, and the largest distance Lwmax is divided by the length of the diagonal line;

[0064] S56. The specific calculation process of warpage is:

[0065] Let the equation of plane ACI be:

[0066] A 1 x+B 1 y+C 1 z+D 1 =0 (10);

[0067] Then the distance from point G to plane ACI is:

[0068]

[0069] Assume the equation of plane CIG is:

[0070] A 2 x+B 2 y+C 2 z+D 2 =0 (12);

[0071] Then the distance from point A to plane CIG is:

[0072]

[0073] Let the equation of the plane IGA be:

[0074] A 3 x+B 3 y+C 3 z+D 3 =0 (14);

[0075] Then the distance from point C to plane IGA is:

[0076]

[0077] Let the equation of plane GAC be:

[0078] A 4 x+B 4 y+C 4 z+D 4 =0 (16);

[0079] Then the distance from point I to plane GAC is:

[0080]

[0081] Take L wmax =(L W1 ,L W2 ,L W3 ,L W4 );

[0082] Then the warpage β is:

[0083]

[0084] S57. Define the curvature of the edge: It refers to the distance of the midpoint of one edge of the tested tile from the plane determined by three of the four corner points, and then expressed as a percentage of the edge length, that is, calculate the distances LB1, LB2, LB3, LB4 from point B, D, F, H to plane ACI, LB5, LB6, LB7, LB8 from point B, D, F, H to plane CIG, LB9, LB10, LB11, LB12 from point B, D, F, H to plane IGA, LB13, LB14, LB15, LB16 from point B, D, F, H to plane GAC, and take the maximum value LBmax of these 16 numbers and divide it by the edge length;

[0085] S58. The specific calculation process of edge curvature is as follows:

[0086] Let the equation of plane ACI be:

[0087] A 1 x+B 1 y+C 1 z+D 1 =0 (19);

[0088] Then the distances from points B, D, F, and H to plane ACI are:

[0089]

[0090] Assume the equation of plane CIG is:

[0091] A 2 x+B 2 y+C 2 z+D 2 =0 (24);

[0092] Then the distances from points B, D, F, and H to plane CIG are:

[0093]

[0094] Let the equation of the plane IGA be:

[0095] A 3 x+B 3 y+C 3 z+D 3 =0 (29);

[0096] Then the distances from points B, D, F, and H to plane IGA are:

[0097]

[0098]

[0099] Let the equation of plane GAC be:

[0100] A 4 x+B 4 y+C 4 z+D 4 =0 (34);

[0101] Then the distances from points B, D, F, and H to plane GAC are:

[0102]

[0103] When the width M of the tile being tested is equal to the length N, LBmax is equal to max (LB1, LB2, LB3, LB4, LB5, LB6, LB7, LB8, LB9, LB10, LB11, LB12, LB13, LB14, LB15, LB16), then the curvature of the edge is

[0104] When the width M of the tile being tested is ≠ the length N, LBmax = max(LB1, LB 4, LB 5, LB8, LB9, LB12, LB13, LB16), then the edge curvature

[0105] One of the above technical solutions has the following beneficial effects: First, the transmission module is the starting point of the entire detection process, responsible for transporting the tested tile along the preset path at a constant speed. At the same time, the trigger module is also placed on the transmission module, maintaining a relatively fixed position with one side of the tested tile to ensure that the surface of the tile can be continuously monitored during the movement of the tile.

[0106] Secondly, the trigger module is used to detect the feature points on the tile surface. When a feature point on the tile surface passes through the trigger module, an electrical signal will be triggered. This electrical signal is generated synchronously based on the distance between the feature points on the tile surface, ensuring that the data acquisition module collects and records the data of the measured points on the tile surface measured by the measurement module at the right time.

[0107] Then, the data acquisition module installed on the arch mounting bracket immediately collects and records the measurement data of the measurement module after receiving the trigger signal sent by the trigger module. The measurement module performs high-precision measurements on the feature points on the tile surface. These measurement data reflect the height or depth information of the tile surface relative to a certain reference plane.

[0108] Finally, the data acquisition module processes the measurement data collected by the measurement module through the built-in circuit system and software, and then transmits it to the external data processing module in real time. The built-in algorithm of the data processing module calculates the flatness of the tile according to the national testing specifications, including the center curvature, warping and edge curvature, and grades, displays and saves the tile flatness data according to the standards set by the manufacturer.

[0109] In summary, this ceramic tile surface flatness detection device can accurately measure the tiny ups and downs of the ceramic tile surface through the precise synchronization of the trigger module, data acquisition module and measurement module, as well as the application of high-precision sensors, so as to improve the detection accuracy. Moreover, the entire detection process is automated, which minimizes human intervention and improves detection efficiency and consistency. At the same time, automated detection also reduces errors caused by human factors. Therefore, the application of this device helps ceramic tile manufacturers to establish a more stringent quality management system, promptly discover and correct problems in the production process, thereby improving product quality and market competitiveness. At the same time, through data accumulation and analysis, it can also provide strong support for product improvement and process optimization. BRIEF DESCRIPTION OF THE DRAWINGS

[0110] Figure 1 It is a structural schematic diagram of one viewing angle of the present invention;

[0111] Figure 2 It is a structural schematic diagram of another perspective of the present invention;

[0112] Figure 3 It is a structural schematic diagram of the standard gauge block in the present invention;

[0113] Figure 4 It is a measurement schematic diagram of the standard gauge block in the present invention;

[0114] Figure 5 It is a schematic diagram of nine surface feature points of the tested ceramic tile in the present invention to be tested;

[0115] Figure 6 It is a circuit diagram of the data acquisition module in the present invention;

[0116] Figure 7 It is a schematic diagram of the architecture of the data acquisition module in the present invention;

[0117] Figure 8 It is a flow chart of the data acquisition module in the present invention;

[0118] Fig. 9 It is a schematic diagram of the process of the digital display dial indicator in the present invention;

[0119] Fig.10 It is a recording schematic diagram of the digital display dial indicator in the present invention;

[0120] Fig.11 It is a schematic diagram of the interaction between the data acquisition module and the data processing module in the present invention;

[0121] Fig.12 It is a flow chart of the data processing module in the present invention;

[0122] Fig.13 It is a schematic diagram of establishing the spatial coordinate axis of the tested tile in the present invention;

[0123] Fig.14 It is a display schematic diagram of the data processing module in the present invention. DETAILED DESCRIPTION

[0124] The technical solution of the present invention is further described below with reference to the accompanying drawings and through specific implementation methods.

[0125] A device for detecting the flatness of a tile surface comprises a transmission module 1, a trigger module 2, a measurement module 3 and a data acquisition module 4, wherein the trigger module 2, the measurement module 3 and the data acquisition module 4 are electrically connected to each other;

[0126] The tested tile and the trigger module 2 are placed on the transmission module 1, and the trigger module 2 is located on one side of the tested tile. An arched mounting bracket 5 is installed above the transmission module 1, and the measuring module 3 and the data acquisition module 4 are installed on the arched mounting bracket 5;

[0127] The transmission module 1 is used to transmit the tested tiles and the trigger module 2. The trigger module 2 is used to synchronously trigger the data acquisition module 4 to collect and record the surface feature point data of the tested tiles measured by the measuring module 3 according to the distance between the surface feature points of the tested tiles; the measuring module 3 is used to measure the surface feature point data of the tested tiles and send it to the data acquisition module 4; the data acquisition module 4 is used to process and display the collected surface feature point data of the tested tiles, and transmit the surface feature point data to an external data processing module in real time.

[0128] It should be noted that according to the requirements of the national standard GB / T 3810.2-2016, there are 9 surface feature points that need to be measured on the surface of the tile, namely the center point of the tile surface, the 4 midpoints of the 4 edges of the tile surface and the 4 corner points of the tile. Among them, the distance from the midpoint of the 4 edges of the tile to the corresponding edge is 1 cm, and the distance from the 4 corner points to the corresponding two edges is 1 cm. Figure 4 AI points shown.

[0129] like Figure 1-2 As shown, the working principle of the tile surface flatness detection device is mainly based on the collaborative work of the following modules:

[0130] First, the transmission module 1 is the starting point of the entire detection process, responsible for transporting the tested tile along the preset path at a constant speed. At the same time, the trigger module 2 is also placed on the transmission module 1, maintaining a relatively fixed position with one side of the tested tile to ensure that the surface of the tested tile can be continuously monitored during its movement.

[0131] Secondly, the trigger module 2 is used to detect the feature points on the surface of the tile. When a feature point on the surface of the tile passes through the trigger module 2, an electrical signal will be triggered. This electrical signal is synchronously generated based on the distance between the feature points on the surface of the tile, ensuring that the data acquisition module 4 collects and records the data of the measured point on the surface of the tile measured by the measurement module 3 at the correct position.

[0132] Next, after receiving the trigger signal sent by the trigger module 2, the data acquisition module 4 installed on the arch mounting bracket 5 immediately collects and records the measurement data of the measurement module 3. The measurement module 3 performs high-precision measurement of the feature points on the surface of the tile. These measurement data reflect the height or depth information of the tile surface relative to a certain reference plane.

[0133] Finally, the data acquisition module 4 processes the measurement data collected by the measurement module 3 through the built-in circuit system and software, and then transmits it to the external data processing module in real time. The built-in algorithm of the data processing module calculates the flatness of the tile according to the national testing specifications, including the center curvature, warpage and edge curvature, and grades, displays and saves the tile flatness data according to the standards set by the manufacturer.

[0134] In summary, the ceramic tile surface flatness detection device can accurately measure the tiny fluctuations on the ceramic tile surface through the precise synchronization of the trigger module 2, the data acquisition module 4 and the measurement module 3, as well as the application of high-precision sensors, so as to improve the detection accuracy. Moreover, the entire detection process is automated, which minimizes human intervention and improves detection efficiency and consistency. At the same time, automated detection also reduces errors caused by human factors. Therefore, the application of this device helps ceramic tile manufacturers to establish a more stringent quality management system, promptly discover and correct problems in the production process, thereby improving product quality and market competitiveness. At the same time, through data accumulation and analysis, it can also provide strong support for product improvement and process optimization.

[0135] Further explanation, it also includes a standard gauge block 6, and the standard gauge block 6 has a standard thickness value. In an optional embodiment, as Figure 3-4 As shown, a standard gauge block 6 with a thickness of 5 mm is used as the system reference.

[0136] Before measuring the tested tile, the 5mm thick standard gauge block 6 is placed under the three digital dial gauges 33 for measurement, and the three values ​​are recorded as the calibration values ​​of the three digital dial gauges 33, and are input into the data acquisition module 4 corresponding to each digital dial gauge 33. After measuring the tested tile, the measured value of each digital dial gauge 33 is subtracted from the corresponding calibration value as the measured value for flatness calculation, that is, during measurement, the height change of the tile surface is relative to the 5mm thick standard gauge block 6.

[0137] like Figure 6 As shown in the initial position in , there is no need to make the tips of the three digital dial indicators 33 at the same height level before measurement, because it is difficult to adjust the three tips to the same height level and the initial value is 0, so a 5mm thickness gauge block with a size of 5mm×9mm×30mm and a 5mm height plane is used as the reference plane, i.e. the calibration plane. The data measured by the digital dial indicator 33 on the tile surface minus the data measured by the corresponding digital dial indicator 33 on the reference plane is the value used to calculate the flatness.

[0138] like Figure 6 As shown, the numerical calibration values ​​of the reference planes measured by the three digital dial indicators 33 are 3.5mm, 2mm, and 3mm respectively. Assuming that the thickness of the tile is 8mm, the data for a very flat surface are 6.5mm, 5mm, and 6mm, then the data actually used to calculate the flatness are 6.5-3.5=3mm, 5-2=3mm, and 6-3=3mm. This subtraction process is implemented on the host computer software. The calibration value will be entered once on the host computer software, and the data of the 9 measuring points read by the host computer will be subtracted from the corresponding calibration values. It can be seen that this is exactly the value of the tile thickness minus the 5mm thickness gauge block. Therefore, the 5mm thickness gauge block is the reference plane. In actual measurement situations, the 8mm thick tile has a varying surface flatness, so its measurement value varies by about 3mm.

[0139] Therefore, for tiles of different thicknesses, the measured values ​​are all relative to the surface of the 5mm thickness gauge block, i.e. the reference plane. For example, when measuring 9mm thickness tiles, the data used to calculate the flatness according to the above method varies around 4mm; when measuring 10mm thickness tiles, the data used to calculate the flatness according to the above method is around 5mm.

[0140] Therefore, for tiles of different thicknesses, only the range of the measurement value changes, and the calculation process of the flatness is not affected. Therefore, the present invention can realize the measurement and calculation of the surface flatness of tiles of different thicknesses.

[0141] To further illustrate, the transmission module 1 includes a transmission platform 11 and transmission mounting brackets 12 arranged along both sides of the transmission platform 11;

[0142] The conveying installation bracket 12 is provided with a conveying installation groove 13 along its length direction, and both ends of the arched installation bracket 5 are detachably installed in the conveying installation groove 13 on both sides.

[0143] like Figure 1 As shown, the conveying platform 11 serves as the main carrier for moving tiles, and its form can be selected as rotating or non-rotating according to the needs of the user. The rotating conveying platform 11 is driven by a power device such as a motor to realize automatic conveying of tiles; while the non-rotating conveying platform 11 relies on manual translation to save equipment costs. By allowing users to choose a rotating or non-rotating conveying platform 11 according to actual needs, it not only meets the needs of automated production, but also takes cost-effectiveness into account. This flexibility allows the device to be widely used in tile production lines of different scales and different needs. At the same time, the design of the conveying installation groove 13 on the conveying installation bracket 12 not only provides a stable installation foundation for the arched installation bracket 5 and other modules, but also makes the entire device compact and easy to assemble and maintain.

[0144] To further illustrate, the trigger module 2 includes a trigger mounting seat 21, a light blocking ruler 22, a sensor mounting seat 23 and a beam-type infrared sensor 24;

[0145] The trigger mounting seat 21 is mounted on the conveying platform 11, the lower surface of the light blocking ruler 22 is mounted on the trigger mounting seat 21, and a light blocking sheet 25 is detachably mounted on the light blocking ruler 22 at intervals. The light blocking ruler 22 is made of a transparent material, and the light blocking sheet 25 is made of a non-transparent material;

[0146] The sensor mounting seat 23 is detachably mounted in one of the transmission mounting grooves 13 of the transmission mounting bracket 12, and the opposing infrared sensor 24 is mounted on the sensor mounting seat 23. The opposing infrared sensor 24 includes a transmitter and a receiver, and an opposing space is provided between the transmitter and the receiver.

[0147] When the conveying platform 11 drives the light-blocking ruler 22 on the sensor mounting seat 23 to move, the light-blocking ruler 22 is movable and passes through the opposing space of the opposing infrared sensor 24. When the light-blocking plate 25 on the light-blocking ruler 22 passes through the opposing space of the opposing infrared sensor 24, the opposing infrared sensor 24 triggers a signal and synchronously triggers the data acquisition module 4 to collect and record the corresponding surface feature point data on the measured tile measured by the measuring module 3.

[0148] like Figure 2As shown, first, the trigger mounting base 21 is firmly mounted on the conveying platform 11 as a supporting base for the light-blocking scale 22. The light-blocking scale 22 is made of a transparent material to ensure unimpeded penetration of the infrared light of the through-beam infrared sensor 24, while the light-blocking sheet 25 installed thereon is made of a non-transparent material to block the infrared light and form a trigger signal. The position of the light-blocking sheet 25 on the light-blocking scale 22 is detachably mounted, so that it can be adjusted according to the actual characteristics of the tile surface.

[0149] Secondly, the sensor mounting seat 23 is installed in the transmission mounting groove 13 of the transmission mounting bracket 12, providing a stable installation environment for the through-beam infrared sensor 24. The through-beam infrared sensor 24 is composed of a transmitter and a receiver, and a through-beam space is formed between the two. When there is no obstruction, the infrared light emitted by the transmitter can be smoothly received by the receiver; when an obstruction enters the through-beam space, the light intensity received by the receiver will change, thereby triggering a signal.

[0150] As the conveying platform 11 moves, the light-blocking ruler 22 also moves. When the light-blocking sheet 25 on the light-blocking ruler 22 enters the opposing space of the opposing infrared sensor 24, it blocks the infrared light, causing the intensity of light received by the receiver to drop sharply. This change is recognized by the sensor as a trigger signal, which then synchronously triggers the data acquisition module 4 through electrical connection to collect and record the data measured by the measuring module 3 at this moment. Since the interval between the light-blocking sheets 25 on the light-blocking ruler 22 is known, the data acquisition module 4 can be synchronously triggered to collect and record the data on the tile surface measured by the measuring module 3 by calculating the time or number of light-blocking sheets 25 passing through the opposing space, thereby achieving accurate measurement of the characteristic points on the tile surface.

[0151] In summary, the trigger module 2 uses a non-contact infrared sensor 24 and a simple mechanical structure, which ensures high-precision triggering while reducing the manufacturing cost and use cost of the device. This makes the device have high promotion value and application prospects in small and medium-sized tile production enterprises.

[0152] To further illustrate, the measuring module 3 includes three groups of measuring submodules, and the measuring submodules are detachably mounted on the arched mounting bracket 5;

[0153] The measuring module 3 includes a measuring mounting seat 31, a measuring mounting rod 32 and a digital dial indicator 33;

[0154] The measuring mounting seat 31 is provided with a mounting portion 34, the arched mounting bracket 5 is provided with a clamping groove 35, and the mounting portion 34 is mounted in the clamping groove 35 by a fastener;

[0155] A measuring installation through hole is formed at one end of the measuring installation seat 31 away from the measuring installation seat 31 , and the measuring installation rod 32 can be movably installed in the measuring installation through hole. The digital display dial indicator 33 is installed at the lower end of the measuring installation rod 32 .

[0156] like Figure 1 As shown, the arched mounting bracket 5 serves as the supporting structure of the measuring module 3, and its design fully considers the stability and flexibility of the measurement. The arched mounting bracket 5 is provided with a snap-in groove 35, which is used to cooperate with the mounting portion 34 on the measuring mounting seat 31 to achieve a stable snap-in installation. This installation method not only simplifies the installation process, but also improves the stability of the measuring module 3. A measuring mounting through hole is provided at one end of the measuring mounting seat 31 away from the mounting portion 34, so that the measuring mounting rod 32 can be movably installed in the measuring mounting through hole, allowing it to be adjusted up and down or left and right within a certain range to meet the measurement requirements of different ceramic tile surfaces. In addition, a digital dial indicator 33 is installed at the lower end of the measuring mounting rod 32. As a core component for measuring the flatness of the ceramic tile surface, the digital dial indicator 33 is a high-precision measuring instrument that can display the measurement value in real time and has high measurement accuracy and stability.

[0157] In further explanation, the measuring module 3 further includes a measuring scale 36, and the measuring scale 36 is disposed on the conveying platform 11. Figure 1 As shown, the ruler is arranged along the length direction perpendicular to the conveying platform 11. The ruler can be used to measure the length of the measured tile and the distance between the surface feature points of the measured tile due to its own scale value, thus saving measurement time.

[0158] To further illustrate, the data acquisition module 4 includes a storage box 41, an OLED display screen 42 and a single-chip microcomputer 43;

[0159] The storage box 41 is installed on the arched mounting bracket 5, the OLED display screen 42 is exposed from the storage box 41, and the single chip computer 43 is built in the storage box 41;

[0160] The single chip computer 43 includes a control processing unit 431, a digital display dial indicator data acquisition unit 432, a beam infrared sensor trigger acquisition unit 433, an OLED data display unit 434 and a serial communication unit 435 which are electrically connected to each other;

[0161] The control processing unit 431 is used to coordinate control and process the digital display dial gauge data acquisition unit 432, the infrared sensor trigger acquisition unit 433, the OLED data display unit 434 and the serial communication unit 435;

[0162] The digital display dial gauge data acquisition unit 432 is used to collect the surface feature point data of the tested tile collected by the digital display dial gauge 33;

[0163] The opposed-beam infrared sensor trigger acquisition unit 433 is used to acquire the trigger signal of the opposed-beam infrared sensor 24;

[0164] The OLED data display unit 434 is used to display the surface feature point data collected by the digital display dial gauge 33;

[0165] The serial communication unit 435 is used to transmit the surface feature point data to an external data processing module in real time.

[0166] like Figure 6-8 As shown, first, the storage box 41 is installed on the arched mounting bracket 5 as a carrier of the data acquisition module 4 to provide protection for electronic components such as the single-chip microcomputer 43. The OLED display screen 42 is exposed from the storage box 41, which is convenient for users to directly view the measurement data and device status.

[0167] Secondly, the single chip microcomputer 43 is the core of the data acquisition module 4, which integrates multiple functional units, including a control processing unit 431, a digital display dial gauge data acquisition unit 432, a beam infrared sensor trigger acquisition unit 433, an OLED data display unit 434, and a serial communication unit 435. These units are interconnected through an internal bus to achieve data exchange and processing, centralized data control and processing, and intuitive display and remote transmission of data through the OLED display 42 and the serial communication unit 435. The specific circuit diagram is shown in FIG. Figure 6 As shown, the specific architecture diagram is shown in 7, and the specific process diagram is shown in 8.

[0168] 1. Optimization of data transmission of digital dial indicator:

[0169] like Figure 8 As shown, the digital display dial indicator 33 is used to efficiently complete the precise measurement of the tile surface height, and the measurement data is transmitted to the single-chip microcomputer in the form of a serial signal through a dedicated data output port. The serial signal contains two key signals, the clock signal SCL and the data signal SDA, to ensure the synchronization and accuracy of data transmission. The data signal SDA is valid at each rising edge of the clock signal SCL, and is encoded in a 24-bit binary format. The data arrangement follows the international standard of low-order first and high-order last, which is convenient for rapid analysis and processing.

[0170] 2. Optimization of position recognition of infrared sensors:

[0171] The through-beam infrared sensor 24 accurately identifies the positions of the front and rear surface feature points on the measured tile, and outputs a level signal through the shielding state of the light-blocking ruler 22. When there is no shielding, a stable high level is output. Once a light-blocking sheet 25 passes by with its position accurately corresponding to the surface feature point, a clear falling edge signal is immediately generated. This signal is used as a trigger point, and the single-chip microcomputer 43 immediately captures and marks the data measured by the dial indicator as valid data, that is, the accurate reading of the tile surface feature point. The measured data in the non-trigger state is regarded as invalid, which effectively avoids data redundancy and misreading.

[0172] 3. OLED display 42 status and data visualization optimization:

[0173] The OLED display screen 42 intuitively displays the working status and real-time measurement data of the digital dial gauge 33, enhancing the friendliness of the operation interface and information transparency. When the digital dial gauge 33 is not connected or turned on, the display screen immediately displays "OFF", clearly indicating that the device is not in working state; once the digital dial gauge 33 is normally connected and turned on, it switches to the "ON" state, indicating that the digital dial gauge 33 is ready. At the same time, the OLED display screen 42 dynamically updates the real-time measurement data of the three digital dial gauges 33, which is convenient for the staff to monitor and evaluate the measurement process in real time.

[0174] 4. Optimization of data transmission protocol between MCU 43 and host computer:

[0175] The single-chip microcomputer 43 transmits the measurement data of the three digital display dial gauges 33 to the host computer efficiently and accurately through the USART communication protocol. To ensure the reliability and integrity of data transmission, a custom data frame format is used. Each frame contains 18 hexadecimal digits, of which the first and last two bits are data check bits, which are used to verify data integrity; the third and fourth bits are data valid flag bits, which clearly distinguish valid measurement data from invalid data; bits 5-16 correspond to the measurement data of the three digital display dial gauges 33, respectively, and are arranged in order from left to right, such as Fig. 9 As shown, it is convenient for the host computer to quickly analyze and store, and finally realize the comprehensive and accurate measurement of 9 key feature points on the tile surface.

[0176] 5. Optimization of host computer data processing:

[0177] The host computer is mainly used to receive the data collected by the STM32 microcontroller. At the same time, the tile size and other related data are input on the front panel. The data processing program will calculate the flatness information of the tile based on these data, and finally display the results on the front panel of the program. It is mainly composed of the data reading part, the center curvature and warpage calculation part, the edge curvature calculation part and the data processing result display and storage part. Each part is a thread, and the threads communicate through message queues, such as Fig.11 shown.

[0178] The data reading part completes the reading of the data transmitted by the single chip microcomputer 43, extracts the data of the points to be measured on the surface of the tile from these data, and reads the parameters input on the display front panel at the same time.

[0179] like Fig.12 The figure shows the data reading flow chart. Initialization is performed at the beginning to identify whether the serial port is connected. Then, the array DATA[] for storing the data of 9 points to be measured on the tile surface is declared. Then, a loop is entered to continuously read the data transmitted by the serial port in the loop. The data is judged to be correct according to the defined data format. Incorrect data is discarded. Correct data is judged to be valid data of the points to be measured on the tile surface. If not, continue to read. If so, store it in the data DATA[]. After the data of the 9 measurement points are saved in DATA[], the array is stored in the message queue 1. At the same time, the parameters such as the tile size input by the front panel are also stored in the message queue 1 so that the flatness calculation program can read these data for calculation.

[0180] To further illustrate, the control processing unit 431 includes a control processing chip U3, and the model of the control processing chip U3 is STM32F103C8T6. As an optional embodiment, the control processing chip U3 of this embodiment adopts the STM32 series.

[0181] It should be noted that any control processing chip U3 that can realize the above-mentioned functions of processing, displaying and transmitting the data collected by the measuring module 3 falls within the protection scope of the present invention.

[0182] To further illustrate, the digital dial gauge data acquisition unit 432 includes a digital dial gauge data acquisition chip U1, a potentiometer R1, a digital dial gauge socket port U4, a digital dial gauge socket port U5, and a digital dial gauge socket port U6;

[0183] The digital dial indicator data acquisition chip U1 is electrically connected to the control processing chip U3 through the potentiometer R1, the digital dial indicator socket port U4, the digital dial indicator socket port U5 and the digital dial indicator socket port U6 are all electrically connected to the digital dial indicator data acquisition chip U1, and the digital dial indicator socket port U4, the digital dial indicator socket port U5 and the digital dial indicator socket port U6 are all electrically connected to the digital dial indicator 33.

[0184] For further explanation, the model of the digital display dial indicator data acquisition chip U1 is TXS0108EQPWRQ1.

[0185] As an optional embodiment, the digital display dial indicator data acquisition chip U1 of this embodiment adopts TXS0108EQPWRQ1.

[0186] It should be noted that any control processing chip U3 capable of processing the data collected by the digital display dial indicator 33 falls within the protection scope of the present invention.

[0187] The specific working principle of the present invention is as follows:

[0188] 1. Installation and adjustment of digital dial indicator 33:

[0189] On the arch mounting frame 5, the multi-dimensional flexible adjustment of the position of the digital dial indicator 33 is achieved through the measuring mounting seat 31 and the measuring mounting rod 32, wherein the measuring mounting seat 31 is firmly connected to the arch mounting frame 5 by means of bolts, allowing lateral fine-tuning on the arch mounting frame 5 by loosening the bolts, so as to accurately control the left and right positions of the three digital dial indicators 33. Moreover, each measuring mounting rod 32 is fixed to the measuring mounting seat 31 with a fastening bolt, further supporting the up and down adjustment function of the digital dial indicator 33. The digital dial indicator 33 is installed under the measuring mounting rod 32 by a flexible dial indicator fixing clamp, and the fixing clamp can rotate around the measuring mounting rod 32 to achieve the adjustment of the dial indicator at a slight angle forward and backward. This series of designs ensures that the digital dial indicator 33 can fully cover and accurately align with different measuring points on the surface of the measured tile, and can achieve precise adaptation regardless of left and right, up and down, or front and back positions.

[0190] 2. Installation and adjustment of the infrared sensor 24:

[0191] The sensor mounting seat 23 is installed in one of the conveying mounting grooves 13 of the conveying platform 11, and the infrared sensor 24 installed thereon can flexibly set its optimal detection point by adjusting the position of the mounting bolts. This design ensures that the infrared sensor 24 can accurately capture the key signals during the movement of the measured tile.

[0192] 3. Installation and adjustment of auxiliary tools and transmission platform:

[0193] The 2mm wide measuring scale 36 embedded in front of the conveying platform 11 not only serves as a reference for the front and rear limit of the tile, but also assists in size calibration. The two ends of the arched mounting frame 1 are tightly installed with the conveying mounting grooves 13 on both sides of the conveying platform 11 to ensure the stable sliding of the conveying platform 11 during the measurement process. The transparent light-blocking scale 22 on the conveying platform 11 cooperates with the light-blocking sheets 25 at three precise positions to effectively trigger the infrared sensor 24 to achieve automatic recognition and data collection of the measuring points.

[0194] 4. Data acquisition and processing module:

[0195] The high-performance single-chip microcomputer 43 built into the storage box 41 is directly connected to the digital display dial gauge 33 through a data line, and the measurement data of the digital display dial gauge 33 is captured in real time through the digital display dial gauge data acquisition unit 432. The single-chip microcomputer 43 also integrates the signal recognition function of the through-beam infrared sensor 24 - the through-beam infrared sensor trigger acquisition unit 433, ensuring that valid data is recorded only when the light shielding sheet 25 passes. The surface feature point data of the tested tile collected is instantly fed back on the OLED display screen 42 through the OLED data display unit 434, and the surface feature point data can be transmitted to the external data processing module in real time through the serial communication unit 435. The data processing module calculates the surface feature point data according to the national inspection specifications to obtain the tile flatness, and grades, displays and saves the tile flatness data according to the standards set by the manufacturer, wherein the tile flatness includes the center curvature, warpage and edge curvature, realizing automatic analysis and report generation.

[0196] A detection method of a ceramic tile surface flatness detection device, applied to a ceramic tile surface flatness detection device as described above, comprises the following steps:

[0197] S1, calibration step: placing the standard gauge block under three digital display dial gauges for measurement, recording the three measured values ​​as calibration values ​​of the three digital display dial gauges, and inputting them into the data acquisition module corresponding to each digital display dial gauge (33);

[0198] S2, preparation step: according to the thickness and size of the measured tile, record 9 surface feature points of the measured tile measuring surface, including point A, point B, point C, point D, point E, point F, point G, point H and point I, and adjust the trigger module and the measurement module according to the distance between the 9 surface feature points, where point E is the center point, point A, point C, point G and point I are corner points, and point B, point D, point F and point H are the midpoints of the four sides respectively;

[0199] S3, measurement steps: start the transmission module and start to transmit the measured tiles;

[0200] When the surface feature point on the tested tile passes through the trigger module, the trigger module sends a signal, and the data acquisition module 4 detects the signal of the trigger module 2 and immediately records the data of the surface feature point of the tested tile measured by the measurement module 3 at this moment;

[0201] S4, data processing step: the data acquisition module receives the surface feature point data from the measurement module, displays it in real time through the OLED display screen, and transmits the surface feature point data to the external data processing module in real time;

[0202] S5. Result analysis and evaluation step: The data processing module processes and analyzes the collected surface feature point data, uses the calibration value in the correction step to make corrections, calculates the center curvature, warpage and edge curvature of the tested tile, and evaluates the flatness of the tile surface according to the preset tile flatness classification.

[0203] In an optional embodiment, the tile flatness grading table is as follows:

[0204] Center curvature α Warpage β Edge curvatureγ Flatness grade α<0.5％ β<0.8％ γ<0.5% Level 1 0.5％<α<1％ 0.8％<β<1.5％ 0.5%<γ<1% Level 2 1％<α 1.5％<β 1%<γ Level 3

[0205] Further explanation, the step of S5, result analysis and evaluation: the data processing module processes and analyzes the collected surface feature point data, uses the calibration value in the correction step to make corrections, calculates the center curvature, warpage and edge curvature of the tested tile, and evaluates the flatness of the surface of the tested tile; specifically includes the following steps:

[0206] S51. Take the corner point of the standard gauge block close to point A on the tile to be measured as the origin O, the straight line parallel to points A, B and C as the X-axis, the straight line parallel to points A, D and G as the Y-axis, and the straight line perpendicular to the origin O as the Z-axis to establish a rectangular coordinate system xyz; Fig.13 As shown;

[0207] S52, assuming that the width of the tile to be measured is M and the length is N, then the coordinates of the feature points are: point A (10, 10, HA), point B (M / 2, HB), point C (M-10, 10, HC), point D (10, N / 2, HD), point E (M / 2, N / 2, HE), point F (M-10, N / 2, HF), point G (10, N-10, HG), point H (M / 2, N-10, HH) and point I (M-10, N-10, HI);

[0208] S53. Definition of center curvature: It refers to the distance of the center point of the measured surface of the tile being measured from the plane determined by any three of the four corner points of the tile being measured, and finally expressed as a percentage of the length of the diagonal line, that is, the distances from point E to planes ACI, CIG, IGA and GAC are calculated respectively, and the maximum distance Lzmax is divided by the length of the diagonal line;

[0209] S54. The specific calculation process of the center curvature is:

[0210] Let the equation of plane ACI be:

[0211] A 1 x+B 1 y+C 1 z+D 1 =0 (1);

[0212] Then the distance from point E to plane ACI is:

[0213]

[0214] Assume the equation of plane CIG is:

[0215] A 2 x+B 2 y+C 2 z+D 2 =0 (3);

[0216] Then the distance from point E to plane CIG is:

[0217]

[0218] Let the equation of the plane IGA be:

[0219] A 3 x+B 3 y+C 3 z+D 3 =0 (5);

[0220] Then the distance from point E to plane IGA is:

[0221]

[0222] Let the equation of plane GAC be:

[0223] A 4 x+B 4 y+C 4 z+D 4 =0 (7);

[0224] Then the distance from point E to plane GAC is:

[0225]

[0226] Take L zmax =(L Z1 ,L Z2 ,L Z3 ,L Z4 );

[0227] Then the central curvature α is:

[0228]

[0229] S55. Definition of warpage: It refers to the distance of one corner point of the measured surface of the tile being measured from the plane determined by the other three corner points, and then expressed as a percentage of the length of the diagonal line, that is, the distances from point A to plane CIG, point C to plane IGA, point I to plane GAC, and point G to plane ACI are calculated, and the largest distance Lwmax is divided by the length of the diagonal line;

[0230] S56. The specific calculation process of warpage is:

[0231] Let the equation of plane ACI be:

[0232] A 1 x+B 1 y+C 1 z+D 1 =0 (10);

[0233] Then the distance from point G to plane ACI is:

[0234]

[0235] Assume the equation of plane CIG is:

[0236] A 2 x+B 2 y+C 2 z+D 2 =0 (12);

[0237] Then the distance from point A to plane CIG is:

[0238]

[0239] Let the equation of the plane IGA be:

[0240] A 3 x+B 3 y+C 3 z+D 3 =0 (14);

[0241] Then the distance from point C to plane IGA is:

[0242]

[0243] Let the equation of plane GAC be:

[0244] A 4 x+B 4 y+C 4 z+D 4 =0 (16);

[0245] Then the distance from point I to plane GAC is:

[0246]

[0247] Take L wmax =(L W1 ,L W2 ,L W3 ,L W4 );

[0248] Then the warpage β is:

[0249]

[0250] S57. Define the curvature of the edge: It refers to the distance of the midpoint of one edge of the tested tile from the plane determined by three of the four corner points, and then expressed as a percentage of the edge length, that is, calculate the distances LB1, LB2, LB3, LB4 from point B, D, F, H to plane ACI, LB5, LB6, LB7, LB8 from point B, D, F, H to plane CIG, LB9, LB10, LB11, LB12 from point B, D, F, H to plane IGA, LB13, LB14, LB15, LB16 from point B, D, F, H to plane GAC, and take the maximum value LBmax of these 16 numbers and divide it by the edge length;

[0251] S58. The specific calculation process of edge curvature is as follows:

[0252] Let the equation of plane ACI be:

[0253] A 1 x+B 1 y+C 1 z+D 1 =0 (19);

[0254] Then the distances from points B, D, F, and H to plane ACI are:

[0255]

[0256] Assume the equation of plane CIG is:

[0257] A 2 x+B 2 y+C 2 z+D 2 =0 (24);

[0258] Then the distances from points B, D, F, and H to plane CIG are:

[0259]

[0260] Let the equation of the plane IGA be:

[0261] A 3x+B 3 y+C 3 z+D 3 =0 (29);

[0262] Then the distances from points B, D, F, and H to plane IGA are:

[0263]

[0264]

[0265] Let the equation of plane GAC be:

[0266] A 4 x+B 4 y+C 4 z+D 4 =0 (34);

[0267] Then the distances from points B, D, F, and H to plane GAC are:

[0268]

[0269] When the width M of the tile being tested is equal to the length N, LBmax is equal to max (LB1, LB2, LB3, LB4, LB5, LB6, LB7, LB8, LB9, LB10, LB11, LB12, LB13, LB14, LB15, LB16), then the curvature of the edge is

[0270] When the width M of the tile being tested is ≠ the length N, LBmax = max(LB1, LB 4, LB 5, LB8, LB9, LB12, LB13, LB16), then the edge curvature

[0271] The display interface of the host computer is as follows: Fig.14 As shown, before the whole device is running, it is necessary to input basic parameters such as serial communication parameters, tile size and 3 dial indicator calibration values. When measuring, turn on the data acquisition button to start the tile surface flatness measurement. The display interface will display the measured values ​​of the 3 dial indicators in real time. The data of the 9 points where the tile flatness should be measured will be displayed in the "Measurement Point Data" table. A measurement point curve will be drawn based on the data of the 9 measurement points to intuitively show the change in the height of the tile surface. After calculating the 3 parameters of flatness, the results will be displayed in the "Flatness Processing Result" table, and the results of the flatness grading (i.e., the level of flatness) will be displayed. Finally, the measurement data and calculation results of each tile will be displayed in the "Data Record" table, and these data will be saved in the Excel table of the computer.

[0272] The technical principle of the present invention is described above in conjunction with specific embodiments. These descriptions are only for explaining the principle of the present invention and cannot be interpreted as limiting the scope of protection of the present invention in any way. Based on the explanations herein, those skilled in the art can associate other specific embodiments of the present invention without creative work, and these equivalent variations or substitutions are all included in the scope defined by the claims of this application.

Claims

1. A device for detecting the flatness of a tile surface, characterized in that: It comprises a transmission module (1), a trigger module (2), a measurement module (3) and a data acquisition module (4), wherein the trigger module (2), the measurement module (3) and the data acquisition module (4) are electrically connected to each other; The ceramic tile to be tested and the trigger module (2) are placed on the transmission module (1), and the trigger module (2) is located on one side of the ceramic tile to be tested. An arched mounting bracket (5) is installed above the transmission module (1), and the measuring module (3) and the data acquisition module (4) are installed on the arched mounting bracket (5); The transmission module (1) is used to transmit the tested tile and the trigger module (2); the trigger module (2) is used to synchronously trigger the data acquisition module (4) according to the distance between the surface feature points of the tested tile to collect and record the corresponding surface feature point data on the tested tile measured by the measuring module (3); the measuring module (3) is used to measure the surface feature point data of the tested tile and send it to the data acquisition module (4); the data acquisition module (4) is used to process and display the collected surface feature point data of the tested tile, and transmit the surface feature point data to an external data processing module in real time.

2. A device for detecting the flatness of a tile surface according to claim 1, characterized in that: It also comprises a standard gauge block (6), wherein the standard gauge block (6) has a standard thickness value.

3. A device for detecting the flatness of a tile surface according to claim 2, characterized in that: The transmission module (1) comprises a transmission platform (11) and transmission mounting brackets (12) arranged along two sides of the transmission platform (11); The conveying installation bracket (12) is provided with a conveying installation groove (13) along its length direction, and the two ends of the arched installation bracket (5) are detachably installed in the conveying installation grooves (13) on both sides.

4. A tile surface flatness detection device according to claim 3, characterized in that: The trigger module (2) comprises a trigger mounting seat (21), a light blocking ruler (22), a sensor mounting seat (23) and a beam-type infrared sensor (24); The trigger mounting seat (21) is mounted on the conveying platform (11), the lower surface of the light blocking ruler (22) is mounted on the trigger mounting seat (21), a light blocking sheet (25) is detachably mounted on the light blocking ruler (22) at intervals, the light blocking ruler (22) is made of a transparent material, and the light blocking sheet (25) is made of a non-transparent material; The sensor mounting seat (23) is detachably mounted in one of the transmission mounting grooves (13) of the transmission mounting bracket (12); the opposing infrared sensor (24) is mounted on the sensor mounting seat (23); the opposing infrared sensor (24) comprises a transmitter and a receiver, and an opposing space is provided between the transmitter and the receiver; When the conveying platform (11) drives the light-blocking ruler (22) on the sensor mounting seat (23) to move, the light-blocking ruler (22) is movably arranged in the corresponding space of the corresponding infrared sensor (24); when the light-blocking sheet (25) on the light-blocking ruler (22) passes through the corresponding space of the corresponding infrared sensor (24), the corresponding infrared sensor (24) triggers a signal and synchronously triggers the data acquisition module (4) to collect and record the surface feature point data corresponding to the measured tile measured by the measuring module (3).

5. A device for detecting the flatness of a tile surface according to claim 4, characterized in that: The measuring module (3) comprises three groups of measuring submodules, and the measuring submodules are detachably mounted on the arched mounting bracket (5); the measuring submodules comprise a measuring mounting seat (31), a measuring mounting rod (32) and a digital dial indicator (33); The measuring mounting seat (31) is provided with a mounting portion (34), the arched mounting bracket (5) is provided with a clamping groove (35), and the mounting portion (34) is mounted on the clamping groove (35) by means of a fastener; an end of the measuring mounting seat (31) away from the measuring mounting seat (31) is provided with a measuring mounting through hole, the measuring mounting rod (32) is movably mounted on the measuring mounting through hole, and the lower end of the measuring mounting rod (32) is provided with the digital display dial indicator (33); The measuring module (3) further comprises a measuring scale (36), and the measuring scale (36) is arranged on the conveying platform (11).

6. A device for detecting the flatness of a tile surface according to claim 5, characterized in that: The data acquisition module (4) comprises a storage box (41), an OLED display screen (42) and a single-chip microcomputer (43); The storage box (41) is mounted on the arched mounting bracket (5), the OLED display screen (42) is exposed outside the storage box (41), and the single-chip microcomputer (43) is built inside the storage box (41); The single chip computer (43) comprises a control processing unit (431), a digital display dial gauge data acquisition unit (432), a beam-type infrared sensor trigger acquisition unit (433), an OLED data display unit (434) and a serial communication unit (435) which are electrically connected to each other; The control processing unit (431) is used to coordinate control and process the digital display dial gauge data acquisition unit (432), the infrared sensor trigger acquisition unit (433), the OLED data display unit (434) and the serial communication unit (435); The digital display dial gauge data acquisition unit (432) is used to acquire the surface feature point data of the tested tile acquired by the digital display dial gauge (33); The opposing infrared sensor trigger collection unit (433) is used to collect the trigger signal of the opposing infrared sensor (24); The OLED data display unit (434) is used to display the surface feature point data collected by the state of the digital display dial gauge (33); The serial communication unit (435) is used to transmit the surface feature point data to an external data processing module in real time.

7. A device for detecting the flatness of a tile surface according to claim 6, characterized in that: The control processing unit (431) comprises a control processing chip U3, and the model of the control processing chip U3 is STM32F103C8T6.

8. A device for detecting the flatness of a tile surface according to claim 7, characterized in that: The digital dial gauge data acquisition unit (432) comprises a digital dial gauge data acquisition chip U1, a potentiometer R1, a digital dial gauge socket port U4, a digital dial gauge socket port U5 and a digital dial gauge socket port U6; The digital dial gauge data acquisition chip U1 is electrically connected to the control processing chip U3 through the potentiometer R1, the digital dial gauge socket port U4, the digital dial gauge socket port U5 and the digital dial gauge socket port U6 are all electrically connected to the digital dial gauge data acquisition chip U1, and the digital dial gauge socket port U4, the digital dial gauge socket port U5 and the digital dial gauge socket port U6 are all electrically connected to the digital dial gauge (33); The model of the digital display dial indicator data acquisition chip U1 is TXS0108EQPWRQ1.

9. A detection method for a tile surface flatness detection device, characterized in that: A device for detecting the flatness of a tile surface as claimed in claim 8 comprises the following steps: S1, calibration step: placing the standard gauge block (6) under three digital display dial gauges (33) for measurement, recording the three measured values ​​as calibration values ​​of the three digital display dial gauges (33), and inputting the values ​​into the data acquisition module (4) corresponding to each digital display dial gauge (33); S2, preparation step: according to the thickness and size of the measured tile, record 9 surface feature points of the measured tile measuring surface, including point A, point B, point C, point D, point E, point F, point G, point H and point I, and adjust the trigger module (2) and the measurement module (3) according to the distances between the 9 surface feature points, wherein point E is the center point, point A, point C, point G and point I are corner points, and point B, point D, point F and point H are the midpoints of the four sides respectively; S3, measurement step: start the transmission module (1) to start transmitting the tile to be measured; When the surface feature point on the measured tile passes through the trigger module (2), the trigger module (2) sends a signal, and the data acquisition module (4) detects the signal of the trigger module (2) and immediately records the data of the surface feature point of the measured tile measured by the measuring module (3) at this moment; S4, data processing step: the data acquisition module (4) receives the surface feature point data from the measurement module (3), displays it in real time through the OLED display screen, and transmits the surface feature point data to an external data processing module in real time; S5. Result analysis and evaluation step: The data processing module processes and analyzes the collected surface feature point data, uses the calibration value in the correction step to make corrections, calculates the center curvature, warpage and edge curvature of the tested tile, and evaluates the flatness of the tile surface according to the preset tile flatness classification.

10. The detection method of a tile surface flatness detection device according to claim 9, characterized in that: The step S5, result analysis and evaluation: the data processing module processes and analyzes the collected surface feature point data, uses the calibration value in the correction step to make corrections, calculates the center curvature, warpage and edge curvature of the tested tile, and evaluates the flatness of the surface of the tested tile; specifically includes the following steps: S51, establish a rectangular coordinate system xyz by taking the corner point of the standard gauge block (6) close to point A on the tile to be measured as the origin O, the straight line parallel to points A, B and C as the X axis, the straight line parallel to points A, D and G as the Y axis, and the straight line perpendicular to the origin O as the Z axis; S52, assuming that the width of the tile to be measured is M and the length is N, then the coordinates of the feature points are: point A (10, 10, HA), point B (M / 2, HB), point C (M-10, 10, HC), point D (10, N / 2, HD), point E (M / 2, N / 2, HE), point F (M-10, N / 2, HF), point G (10, N-10, HG), point H (M / 2, N-10, HH) and point I (M-10, N-10, HI); S53. Definition of center curvature: It refers to the distance of the center point of the measured surface of the tile being measured from the plane determined by any three of the four corner points of the tile being measured, and finally expressed as a percentage of the length of the diagonal line, that is, the distances from point E to planes ACI, CIG, IGA and GAC are calculated respectively, and the maximum distance Lzmax is divided by the length of the diagonal line; S54. The specific calculation process of the center curvature is: Assume the equation of plane ACI is: A1x+B1y+C1z+D1=0 (1); Then the distance from point E to plane ACI is: Let the equation of the plane CIG be: A2x+B2y+C2z+D2=0 (3); Then the distance from point E to plane CIG is: Let the equation of the plane IGA be: A3x+B3y+C3z+D3=0 (5); Then the distance from point E to plane IGA is: Let the equation of plane GAC be: A4x+B4y+C4z+D4=0 (7); Then the distance from point E to plane GAC is: Take L zmax =(L Z1 ,L Z2 ,L Z3 ,L Z4 ); Then the central curvature α is: S55. Definition of warpage: It refers to the distance of one corner point of the measured surface of the tile being measured from the plane determined by the other three corner points, and then expressed as a percentage of the length of the diagonal line, that is, the distances from point A to plane CIG, point C to plane IGA, point I to plane GAC, and point G to plane ACI are calculated, and the largest distance Lwmax is divided by the length of the diagonal line; S56. The specific calculation process of warpage is: Assume the equation of plane ACI is: A1x+B1y+C1z+D1=0 (10); Then the distance from point G to plane ACI is: Let the equation of the plane CIG be: A2x+B2y+C2z+D2=0 (12); Then the distance from point A to plane CIG is: Let the equation of the plane IGA be: A3x+B3y+C3z+D3=0 (14); Then the distance from point C to plane IGA is: Let the equation of plane GAC be: A4x+B4y+C4z+D4=0 (16); Then the distance from point I to plane GAC is: Take L wmax =(L W1 ,L W2 ,L W3 ,L W4 ); Then the warpage β is: S57. Define the curvature of the edge: It refers to the distance of the midpoint of one edge of the tested tile from the plane determined by three of the four corner points, and then expressed as a percentage of the edge length, that is, calculate the distances LB1, LB2, LB3, LB4 from point B, D, F, H to plane ACI, LB5, LB6, LB7, LB8 from point B, D, F, H to plane CIG, LB9, LB10, LB11, LB12 from point B, D, F, H to plane IGA, LB13, LB14, LB15, LB16 from point B, D, F, H to plane GAC, and take the maximum value LBmax of these 16 numbers and divide it by the edge length; S58. The specific calculation process of edge curvature is as follows: Assume the equation of plane ACI is: A1x+B1y+C1z+D1=0 (19); Then the distances from points B, D, F, and H to plane ACI are: Let the equation of the plane CIG be: A2x+B2y+C2z+D2=0 (24); Then the distances from points B, D, F, and H to plane CIG are: Let the equation of the plane IGA be: A3x+B3y+C3z+D3=0 (29); Then the distances from points B, D, F, and H to plane IGA are: Let the equation of plane GAC be: A4x+B4y+C4z+D4=0 (34); Then the distances from points B, D, F, and H to plane GAC are: When the width M of the tile being tested is equal to the length N, LBmax is equal to max (LB1, LB2, LB3, LB4, LB5, LB6, LB7, LB8, LB9, LB10, LB11, LB12, LB13, LB14, LB15, LB16), then the curvature of the edge is When the width M of the tile being tested is ≠ the length N, LBmax = max(LB1, LB 4, LB 5, LB8, LB9, LB12, LB13, LB16), then the edge curvature

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