A Trigger-Type Probe Fault Detection Method and System

Abstract

A trigger probe fault detection method and system provided by the present application relate to the technical field of fault detection. Sensor information built in the trigger probe to be detected is obtained, and a test circuit and a test scenario are configured. The probe is connected to the test circuit through the interface of the probe, and the tightness verification of the connection structure is performed. When the verification is passed, the test circuit is controlled according to the first and second test scenarios, and the output signal of the probe is received to generate first and second test signal sequences. Fault analysis is performed by combining the first and second test signal sequences to generate a fault detection result, solving the technical problem that the existing trigger probe fault detection cannot accurately identify and prevent faults in real time, resulting in low production efficiency, and achieving the technical effects of improving the accuracy of fault detection, giving early warnings, and quickly and accurately locating faults.

Description

Technical Field

[0001] The present invention relates to the technical field of fault detection, and particularly relates to a trigger probe fault detection method and system. Background Art

[0002] In industrial applications, trigger probes, as an important sensor device, are widely used in various precision detection and control systems. These probes can provide real-time data on the production line to ensure product quality and the accuracy of the process flow. Trigger probes usually need to operate under extreme or changing environmental conditions, such as temperature fluctuations, mechanical vibrations, etc. These factors can affect the accuracy and stability of the probes. Therefore, ensuring the reliability and accuracy of the probes is crucial. Traditional trigger probe fault detection methods mostly rely on regular maintenance inspections or troubleshooting after a fault occurs. These methods usually cannot detect potential faults in real time or in advance, resulting in problems such as downtime or inaccurate data during critical production periods. In addition, existing fault detection technologies have limitations in simulating the performance detection of probes in a test environment and cannot comprehensively evaluate the stability and reliability of probes in actual applications.

[0003] In summary, existing trigger probe fault detection often has the technical problem of being unable to identify and prevent faults in real time and accurately, resulting in low production efficiency. Summary of the Invention

[0004] This application provides a trigger probe fault detection method and system for solving the technical problem that existing trigger probe fault detection cannot identify and prevent faults in real time and accurately, resulting in low production efficiency.

[0005] In view of the above problems, this application provides a trigger probe fault detection method and system.

[0006] In a first aspect, this application provides a trigger probe fault detection method, and the method includes:

[0007] Obtain the sensor information built in the trigger probe to be detected; configure a test circuit and a test scenario based on the sensor information, where the test scenario includes a first test scenario and a second test scenario, the first test scenario is a signal stable scenario, and the second test scenario is a signal fluctuation scenario; connect the trigger probe to be detected to the test circuit through the interface of the trigger probe to be detected, and perform a tightness verification of the connection structure; when the tightness verification passes, control the test circuit according to the first test scenario and the second test scenario, and receive the output signal of the trigger probe to be detected to generate a first test signal sequence and a second test signal sequence; perform fault analysis by combining the first test signal sequence and the second test signal sequence to generate a fault detection result.

[0008] In a second aspect, the present application provides a trigger probe fault detection system, which includes:

[0009] A sensor information acquisition module, configured to acquire sensor information built in the trigger probe to be detected; a test configuration module, configured to configure a test circuit and a test scenario based on the sensor information, where the test scenario includes a first test scenario and a second test scenario, the first test scenario is a signal stable scenario, and the second test scenario is a signal fluctuation scenario; a tightness verification execution module, configured to connect the trigger probe to be detected to the test circuit through an interface of the trigger probe to be detected and perform tightness verification of the connection structure; a signal sequence generation module, configured to control the test circuit according to the first test scenario and the second test scenario and receive an output signal of the trigger probe to be detected to generate a first test signal sequence and a second test signal sequence when the tightness verification is passed; a fault analysis module, configured to perform fault analysis by combining the first test signal sequence and the second test signal sequence to generate a fault detection result.

[0010] One or more technical solutions provided in the present application have at least the following technical effects or advantages:

[0011] A trigger probe fault detection method provided in the present application includes acquiring sensor information built in the trigger probe to be detected; configuring a test circuit and a test scenario based on the sensor information, where the test scenario includes a first test scenario and a second test scenario, the first test scenario is a signal stable scenario, and the second test scenario is a signal fluctuation scenario; connecting the trigger probe to be detected to the test circuit through an interface of the trigger probe to be detected and performing tightness verification of the connection structure; when the tightness verification is passed, controlling the test circuit according to the first test scenario and the second test scenario and receiving an output signal of the trigger probe to be detected to generate a first test signal sequence and a second test signal sequence; performing fault analysis by combining the first test signal sequence and the second test signal sequence to generate a fault detection result, which solves the technical problem that the existing trigger probe fault detection cannot accurately identify and prevent faults in real time, resulting in low production efficiency. By using dual test scenarios of stability and variation to ensure the reliability of the probe under different conditions, and combining signal deviation analysis to judge the functional state of the probe, the accuracy of fault detection is improved, achieving the technical effects of early warning and quickly and accurately locating faults, and significantly improving production stability. Description of the Drawings

[0012] Figure 1 It is a schematic flow chart of a trigger probe fault detection method provided in the present application.

[0013] Figure 2 This application provides a schematic structural diagram of a trigger probe fault detection system.

[0014] Explanation of reference numerals: Sensor information acquisition module 11, test configuration module 12, fastening verification execution module 13, signal sequence generation module 14, fault analysis module 15. Specific implementation manners

[0015] In order to make the objectives, technical solutions and advantages of this application more clear and understandable, the following further details this application in combination with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not used to limit this application.

[0016] In the first embodiment, as Figure 1 shown, this application provides a trigger probe fault detection method, and the method includes:

[0017] Obtain the sensor information built in the trigger probe to be detected.

[0018] Configure the test circuit and test scenarios based on the sensor information, where the test scenarios include a first test scenario and a second test scenario, the first test scenario is a signal stable scenario, and the second test scenario is a signal fluctuation scenario.

[0019] Specifically, a trigger probe is also called a trigger stylus or a touch probe, which is a precision measurement tool commonly used in industrial and scientific research fields, especially in coordinate measuring machines, numerically controlled machine tools, and other automated measurement devices. Its main function is to trigger a signal when it touches the surface of the object to be measured, so as to accurately measure the size, shape and position of the object. The basic structure of a trigger probe usually includes a probe body, a trigger mechanism, a sensor, a signal processing unit and an interface. Among them, the probe body is the main part of the probe, usually made of metal or high-strength plastic, and is used to support other components; the trigger mechanism is the core component of the probe, including one or more movable contacts (pins), and these contacts can move and trigger a measurement signal when they touch the object to be measured; the sensor is used to detect the movement of the contacts and convert physical contact into an electrical signal; the signal processing unit converts the signal of the sensor into a digital signal for computer analysis and processing; the interface is the part that connects the probe to the measuring machine to ensure the transmission of signals and the fixation of the probe. Due to its high precision and high efficiency, trigger probes are widely used in aerospace, automotive manufacturing, precision machinery and other industrial fields, and play a crucial role in improving product quality and production efficiency.

[0020] In this embodiment, first obtain the sensor information built in the trigger probe to be detected. The sensor is a key component of the probe and is used to detect and convert the change in contact force into an electrical signal. The sensor information usually includes the type of sensor, measurement range, sensitivity, output signal type, etc. These information are crucial for subsequent test configurations. After obtaining the sensor information, configure the test circuit and test scenarios based on this information. The configuration of the test circuit needs to ensure that it can adapt to the output signal type and electrical signal processing requirements of the sensor, as well as provide the necessary power supply and interface connections for the sensor. The setting of the test scenario includes two main parts, namely the first test scenario and the second test scenario. Among them, the first test scenario is the signal stability scenario, that is, in this scenario, the test environment and external conditions are maintained in a controlled and stable state to facilitate the evaluation of the performance of the probe without external disturbances. For example, parameters such as temperature, humidity, and pressure can be set to remain constant, and at the same time, the frequency and amplitude of the input signal are fixed or change at a slow rate, so as to ensure the stability of the environment and the consistency of the signal. The second test scenario is the signal fluctuation scenario, which aims to simulate various unstable factors that may be encountered in actual use. In this test scenario, some parameters of the environment or signal are set to change continuously, and the signal to be detected changes violently and at a very fast rate. For example, temperature fluctuations, vibrations, or fluctuations in the amplitude and frequency of electrical signals can be simulated to test the sensitivity and response ability of the probe to environmental changes. Through the above two test scenarios, the performance and stability of the trigger probe can be comprehensively evaluated, so as to effectively conduct fault analysis. This method not only improves the accuracy of fault detection, but also can better predict the performance of the probe in actual use by simulating the situations that may be encountered in real applications.

[0021] Connect the trigger probe to be detected to the test circuit through the interface of the trigger probe to be detected, and perform the tightness verification of the connection structure.

[0022] Optionally, connect the trigger probe to be tested to the test circuit through its interface. During this connection process, the type of the interface, such as D-SUB, USB, or other industrial standard interfaces, needs to be exactly matched with the corresponding port of the test circuit to ensure the integrity and accuracy of signal transmission. After completing the physical connection, verify the tightness of the connection structure, which is a necessary condition to ensure the stable operation of the probe during the test. The tightness verification can adopt the method of combining image vision with machine learning, or perform a vibration test to evaluate the stability of the connection. For example, in the verification method of combining image vision with machine learning, a high-resolution camera can be used to capture images of the interface connection state, and a trained machine learning model is used to analyze potential defects or incomplete contacts in the images. This method can accurately identify tiny cracks, gaps, or other factors that may affect the connection stability. On the other hand, if a vibration environment is involved, the vibration test simulates the vibration conditions during operation in a controlled environment and monitors the physical performance of the interface when affected by vibration. In this test, the vibration platform operates at a set frequency and amplitude to simulate the vibration environment that may be encountered in actual use. During the test, additional sensors can be used to monitor the tiny movement or looseness of the connection point to evaluate its reliability under actual working conditions. Through the tightness verification, it can be ensured that the connection between the trigger probe and the test circuit is both firm and reliable, thus guaranteeing the accuracy and efficiency of subsequent tests. This strict verification process is a key link in ensuring the reliability of the probe test results and is of great significance for preventing misdiagnosis and missed diagnosis of faults.

[0023] When the tightness verification is passed, control the test circuit according to the first test scenario and the second test scenario, and receive the output signal of the trigger probe to be tested to generate a first test signal sequence and a second test signal sequence.

[0024] Furthermore, control the test circuit according to the first test scenario and the second test scenario. If the output signal of the trigger probe to be tested cannot be received, issue a warning signal for the internal circuit fault of the probe.

[0025] Perform fault analysis by combining the first test signal sequence and the second test signal sequence to generate a fault detection result.

[0026] Specifically, after the fastening verification is passed, the control test circuit is executed according to the designed first test scenario and second test scenario, while monitoring and recording the output signals of the trigger probe. This process involves precisely controlling the circuit behavior to simulate the performance of the probe under different operating environments, ensuring that its performance and stability can be comprehensively evaluated. First, according to the setting of the first test scenario, that is, the signal stability scenario, the test circuit adjusts the circuit settings to maintain a stable output of the test signal. This scenario aims to verify the responsiveness and accuracy of the probe under stable conditions. For example, by setting an electrical signal with a fixed frequency and amplitude, the standard operating state of the probe without external interference can be simulated, thereby generating the first test signal sequence. Subsequently, the test circuit switches to the second test scenario, that is, the signal fluctuation scenario, and simulates the impact of environmental changes on the probe by changing the frequency, amplitude or other parameters of the signal. This scenario is used to test the stability and reliability of the probe when encountering external disturbances such as mechanical vibration and temperature fluctuations, thereby generating the second test signal sequence. During the test, if the test circuit fails to receive the output signal of the trigger probe to be detected, the system will automatically diagnose it as a possible internal circuit fault and issue a fault warning signal in a timely manner. This mechanism ensures that problems can be identified and processed before developing into more serious faults. Finally, the system will comprehensively analyze the first test signal sequence and the second test signal sequence, and evaluate the consistency and deviation of the signals by comparing the output signals under these two different conditions, thereby performing fault analysis. During the analysis process, algorithms may be used to perform in-depth mathematical processing on the signal sequences, such as calculating deviations and stability indicators, to accurately determine the performance state of the probe and the specific problems existing. The generated fault detection results will provide guidance for maintenance work to ensure that the probe can operate in the best state. Through the above steps, not only can faults be effectively discovered and diagnosed, but also by simulating a variety of working scenarios, the reliability and accuracy of the probe in practical applications can be greatly improved.

[0027] Furthermore, configuring the test circuit and test scenarios based on the sensor information includes:

[0028] Reading a predetermined detection signal type based on the sensor information, where the predetermined detection signal type includes one or more detection signal types.

[0029] Configuring the test circuit based on the predetermined detection signal type, where the test circuit includes a circuit control terminal for adjusting the signal state of the predetermined detection signal type.

[0030] Obtaining the detection accuracy information of the trigger probe to be detected.

[0031] Configuring the first test scenario and the second test scenario based on the detection accuracy information.

[0032] Exemplarily, sensor information is read from the trigger probe to be detected, including but not limited to the sensor type, output signal characteristics, etc., which are the basis for subsequent test configurations.

[0033] Next, the test circuit is configured according to the predetermined detection signal type provided by the sensor. The predetermined detection signal types include analog signals, digital signals, or composite signals with specific frequencies and amplitudes, and these signal types directly affect the complexity and functionality of the circuit design. The test circuit includes a circuit control terminal that has the function of adjusting the signal state and can enhance or weaken the signal as needed, or adjust parameters such as the frequency and waveform of the signal. For example, if the sensor information indicates that the probe outputs a low-amplitude analog signal, the circuit control terminal will be configured to be able to amplify such a signal and convert it into a format suitable for analysis. In addition, the system also needs to obtain the detection accuracy information of the trigger probe, which can evaluate the performance ability of the probe in fine measurement. The detection accuracy information includes indicators such as the resolution, error range, and response time of the probe. Based on this accuracy information, the first test scenario and the second test scenario are further configured. The first test scenario is the signal stability scenario, which aims to test the performance of the probe in an ideal interference-free state. In this scenario configuration, the test circuit will provide a constant signal source that matches the accuracy of the probe to verify whether the probe can maintain the consistency and accuracy of the output under continuous and stable input. For example, if the error range of the probe is ±0.01%, the signal source will be designed to provide a measurement signal within this accuracy range. The second test scenario is the signal fluctuation scenario, which is used to simulate the variable conditions that may be encountered in actual applications. In this scenario, the circuit control terminal will adjust the signal according to a predetermined change pattern, such as periodic fluctuations or random amplitude changes, to test the adaptability and accuracy of the probe to dynamic changes. This scenario design helps to determine the reliability and performance stability of the probe under actual working conditions. Through the above steps, the configuration of the test circuit and scenarios is not only optimized based on the technical characteristics and performance requirements of the probe, but also can comprehensively simulate various conditions that the probe may encounter in actual applications, ensuring the comprehensiveness and effectiveness of fault detection.

[0034] Furthermore, configuring the first test scenario and the second test scenario based on the detection accuracy information includes:

[0035] Determine the signal test range corresponding to the predetermined detection signal type based on the detection accuracy information.

[0036] Configure multiple groups of fixed signal characteristics within the signal test range to generate the first test scenario.

[0037] Randomly configure multiple groups of continuously changing signal characteristics within the signal test range according to a predetermined change frequency to generate the second test scenario.

[0038] Furthermore, the configuration of the test scenario is based on the detection accuracy information of the probe, and this information provides precise guidance for the design of the test signals. The detection accuracy information generally includes indicators such as the minimum change amount that the probe can identify, the maximum tolerance error, and the speed of signal response. This information is crucial for ensuring that the test scenario can effectively evaluate the performance of the probe. First, determine the signal test range corresponding to the predetermined detection signal type applicable to the probe to be detected according to the obtained detection accuracy information. The signal test range refers to the minimum and maximum thresholds of the signals that the probe can accurately process. For example, if the detection accuracy of the probe is ±0.1%, the signal test range will be set to cover the signal intensity that meets this accuracy requirement to ensure that all test signals are within the effective working range of the probe. Then, configure the first test scenario based on this signal test range. In the first test scenario, set multiple groups of fixed signal characteristics, and each group of signal characteristics is fixed at a certain specific value or pattern without any change. This setting aims to simulate a stable measurement environment to test the stability and repeatability of the probe without external interference. For example, a group of periodic signals with fixed frequency and amplitude can be set to observe whether the response of the probe to these unchanged signals remains consistent. Further, for the second test scenario, within the same signal test range, randomly configure multiple groups of continuously changing signal characteristics according to a predetermined change frequency. These signal characteristics not only include changes in frequency but may also involve random variations in other parameters such as amplitude and waveform to simulate various complex and unstable test conditions that the probe may encounter in the real world. For example, a signal sequence can be designed in which the amplitude of the signal fluctuates rapidly according to a randomly generated pattern to test the response ability and accuracy of the probe in a rapidly changing environment. Through such refined test scenario configuration, not only can the performance of the trigger probe be comprehensively evaluated under ideal and challenging conditions, but it can also help identify the problems and limitations that the probe may face in actual applications, thereby effectively guiding the further optimization and application of the probe. This method ensures the efficiency and practicality of probe fault detection and enhances the reliability and application value of the test results.

[0039] Furthermore, perform fault analysis by combining the first test signal sequence and the second test signal sequence to generate a fault detection result, including:

[0040] Analyze the signal deviation between the first test signal sequence and the signals in the first test scenario to generate a first fault analysis result.

[0041] Analyze the signal deviation between the second test signal sequence and the signals in the second test scenario to generate a second fault analysis result.

[0042] Combine the first fault analysis result and the second fault analysis result to generate the fault detection result.

[0043] Optionally, the generation of the first fault analysis result is performed, and this step focuses on deviation stability analysis. In the first test scenario, the probe receives a fixed signal feature. Therefore, the purpose of analyzing this scenario is to detect whether the deviation between the output signal and the input signal of the probe remains stable. The specific operations include calculating the deviation at each point between the output signal and the preset signal, and then analyzing the statistical distribution of these deviations, such as the mean value, standard deviation, etc. For example, if a probe shows very small or little change in signal deviation under continuous stable input, it can be considered that the probe works normally under stable conditions; if the deviation is large or the volatility is high, it may indicate that the probe has a fault or performance degradation. Next, the second test signal sequence is analyzed to generate the second fault analysis result, and this analysis focuses on the sensitivity of the probe. In the second test scenario, the input signal feature changes continuously, and the goal of the analysis is to evaluate the ability of the probe to respond to these changes. By comparing the correspondence between the output of the probe and the rapidly changing input signal, such as the response time, the ratio of the output amplitude to the input amplitude, etc., the sensitivity of the probe to signal changes can be judged. If the probe can accurately and quickly follow the changes of the input signal, it indicates that its sensitivity is good; otherwise, it may indicate insufficient sensitivity or response delay. Finally, the first and second fault analysis results are combined to generate a comprehensive fault detection result. This result does not involve the identification of specific fault types, but comprehensively evaluates whether the probe has a fault or abnormality. By comparing the analysis results in the two scenarios, if both show that the probe performs normally, it is judged that the probe has no fault; if any result shows an abnormality, such as unstable deviation or low sensitivity, the probe is judged to possibly have a fault. Through the above analysis process, important information about the operating state of the trigger probe can be provided, helping the maintenance team to discover and solve problems in a timely manner, so as to ensure the stable operation and measurement accuracy of the probe.

[0044] Furthermore, analyzing the signal deviation between the first test signal sequence and the first test scenario to generate the first fault analysis result includes:

[0045] Comparing the signal deviation between the first test signal sequence and the first test scenario to generate the first signal deviation sequence.

[0046] Performing stability analysis on multiple deviation data in the first signal deviation sequence to generate a deviation stability index.

[0047] Judging whether the deviation stability index is within a preset stable interval and whether the multiple deviation data are within a preset deviation range, and generating a first anomaly flag indicating whether the test is abnormal according to the judgment result.

[0048] Generating the first fault analysis result with the first anomaly flag.

[0049] Exemplarily, the generation of the first fault analysis result is completed through detailed data processing and analysis steps, aiming to evaluate the performance of the probe in a stable test environment. This process starts with a detailed comparison of the first test signal sequence and the signal deviation in the first test scenario to ensure the accuracy and systematicness of the analysis. First, the first test signal sequence is collected from the first test scenario, which records the output signals of the probe under stable conditions. These output signals are compared with the preset ideal signals (i.e., the signals of the first test scenario) to generate the first signal deviation sequence. The signal deviation sequence is composed of the differences between the actual output signals and the ideal signals at each measurement point, and these differences intuitively represent the accuracy and consistency of the probe output. Then, a stability analysis is performed on multiple deviation data in the first signal deviation sequence. This analysis involves calculating statistical indicators of the deviation sequence, such as the average deviation, standard deviation, etc., to generate deviation stability indicators. These indicators help evaluate the fluctuation degree of the probe output signal and the regularity of deviation from the preset signal, and are key factors in judging the performance stability of the probe.

[0050] Subsequently, further evaluation is performed based on the deviation stability indicators and the deviation data. This step includes judging whether the deviation stability indicators are within the preset stable interval and checking whether all deviation data are within the allowed deviation range. The preset stable interval and deviation range are defined in advance according to the design parameters and application requirements of the probe to ensure the reliability and accuracy of the probe in actual applications. Finally, the first anomaly flag is generated according to the above analysis and judgment results. If both the deviation stability indicators and the deviation data meet the preset conditions, the first anomaly flag indicates that no anomaly is found in the test, that is, the probe performs normally. On the contrary, if any parameter exceeds the preset range, the first anomaly flag will mark the test result as abnormal, indicating possible probe failures or performance degradation. The first fault analysis result provides important information about the operating conditions of the probe in a stable environment for the maintenance team, helps identify and prevent potential faults, and ensures the high performance and long-term stable operation of the probe. The implementation of this method helps improve production efficiency and product quality.

[0051] Furthermore, analyzing the signal deviation between the second test signal sequence and the second test scenario to generate the second fault analysis result includes:

[0052] Performing a timing alignment on the second test signal sequence and the control signal of the second test scenario to generate a double-column timing alignment signal.

[0053] Analyzing the double-column timing alignment signal to establish a probe detection delay sequence.

[0054] Analyzing the change of the probe detection delay sequence to generate a detection delay fluctuation stability indicator under continuous signal fluctuations.

[0055] Determine whether the detected delay fluctuation stability index is within a preset range, and generate a second anomaly flag.

[0056] Generate the second fault analysis result based on the second anomaly flag.

[0057] Specifically, the second fault analysis result is specifically used to evaluate the response ability and sensitivity of the probe in a dynamic test environment. This process involves detailed signal processing and timing analysis to ensure that the performance of the probe in the face of rapidly changing signals can be accurately evaluated. First, align the timing of the second test signal sequence with the control signal in the second test scenario. The purpose of timing alignment is to ensure that the response data collected from the probe strictly corresponds to the input control signal, so that the response time and accuracy of the probe can be accurately evaluated. For example, if the control signal sets the temperature to 15 degrees Celsius at the first time point and quickly jumps to 30 degrees Celsius at the second time point, the data after timing alignment will clearly show the reaction time and behavior of the probe to this change. Next, establish a probe detection delay sequence based on the signals after timing alignment. This sequence records the reaction time of the probe at each control signal change point, that is, the time difference between the issuance of the control signal and the actual reaction of the probe. In the aforementioned example of temperature change, if the probe delays for a few seconds before starting to react after the temperature jumps to 30 degrees Celsius, this delay time will be recorded in the detection delay sequence. Subsequently, perform a change analysis on the detection delay sequence to generate a detection delay fluctuation stability index under continuous signal fluctuations. This index reflects the stability and predictability of the probe's delay response in continuous dynamic tests. By calculating the average value, standard deviation, and other statistical parameters of the delay time, the performance stability of the probe in the face of rapid and continuous changes can be evaluated. Finally, determine whether the detection delay fluctuation stability index is within the preset stable range. If the delay fluctuation stability index shows that the delay time is relatively consistent and meets the expected stability requirements, the second anomaly flag will be marked as no anomaly, indicating that the probe performs well in the dynamic environment; on the contrary, if the delay fluctuation is large or exceeds the preset range, the second anomaly flag will be marked as abnormal, indicating possible performance problems or faults. Through the above steps, the second fault analysis result provides important information about the performance of the probe in the dynamic test environment for the maintenance team, helps to evaluate and optimize the response speed and stability of the probe, and ensures its reliability and efficiency in practical applications. This method is of great significance for ensuring the long-term stable operation of the probe and reducing the fault downtime.

[0058] Through the technical solutions of the above embodiments, a trigger probe fault detection method provided by the present application solves the technical problem that the existing trigger probe fault detection cannot accurately identify and prevent faults in real time, resulting in low production efficiency. By means of dual test scenarios of stability and variation, the reliability of the probe under different conditions is ensured, and the functional state of the probe is judged by combining signal deviation analysis, thereby improving the accuracy of fault detection, achieving the technical effects of early warning and quickly and accurately locating faults, and significantly improving production stability.

[0059] Embodiment 2, based on the same inventive concept as a trigger probe fault detection method in the foregoing embodiment, as Figure 2 shown, the present application provides a trigger probe fault detection system, and the system includes:

[0060] A sensor information acquisition module 11, configured to acquire sensor information built in the trigger probe to be detected.

[0061] A test configuration module 12, configured to configure a test circuit and a test scenario based on the sensor information, wherein the test scenario includes a first test scenario and a second test scenario, the first test scenario is a signal stable scenario, and the second test scenario is a signal fluctuation scenario.

[0062] A fastening verification execution module 13, configured to connect the trigger probe to be detected to the test circuit through the interface of the trigger probe to be detected, and perform fastening verification of the connection structure.

[0063] A signal sequence generation module 14, configured to, when the fastening verification is passed, control the test circuit according to the first test scenario and the second test scenario, and receive the output signal of the trigger probe to be detected, and generate a first test signal sequence and a second test signal sequence.

[0064] A fault analysis module 15, configured to perform fault analysis by combining the first test signal sequence and the second test signal sequence, and generate a fault detection result.

[0065] Furthermore, the test configuration module 12 is further configured to perform the following steps:

[0066] Read a predetermined detection signal type based on the sensor information, where the predetermined detection signal type includes one or more detection signal types.

[0067] Configure the test circuit based on the predetermined detection signal type, where the test circuit includes a circuit control terminal, and the circuit control terminal is configured to adjust the signal state of the predetermined detection signal type.

[0068] Acquire the detection accuracy information of the trigger probe to be detected.

[0069] Configure the first test scenario and the second test scenario based on the detection accuracy information.

[0070] Furthermore, the test configuration module 12 is further configured to perform the following steps:

[0071] Determine the signal test range corresponding to the predetermined detection signal type based on the detection accuracy information.

[0072] Configure multiple sets of fixed signal features within the signal test range to generate the first test scenario.

[0073] Within the signal test range, randomly configure multiple sets of continuously changing signal features according to a predetermined change frequency to generate the second test scenario.

[0074] Furthermore, the fault analysis module 15 is further configured to perform the following steps:

[0075] Analyze the signal deviation between the first test signal sequence and the first test scenario to generate a first fault analysis result.

[0076] Analyze the signal deviation between the second test signal sequence and the second test scenario to generate a second fault analysis result.

[0077] Combine the first fault analysis result and the second fault analysis result to generate the fault detection result.

[0078] Furthermore, the fault analysis module 15 is further configured to perform the following steps:

[0079] Compare the signal deviation between the first test signal sequence and the first test scenario to generate a first signal deviation sequence.

[0080] Perform a stability analysis on multiple deviation data in the first signal deviation sequence to generate a deviation stability index.

[0081] Judge whether the deviation stability index is within a preset stability interval, and whether the multiple deviation data are within a preset deviation range, and generate a first anomaly flag indicating whether the annotation test is abnormal according to the judgment result.

[0082] Generate the first fault analysis result with the first anomaly flag.

[0083] Furthermore, the fault analysis module 15 is further configured to perform the following steps:

[0084] Perform a timing alignment on the control signals of the second test signal sequence and the second test scenario to generate a double-column timing alignment signal.

[0085] Analyze the double-column time-series aligned signals to establish a probe detection delay sequence.

[0086] Analyze the changes in the probe detection delay sequence to generate a detection delay fluctuation stability index under continuous signal fluctuations.

[0087] Determine whether the detection delay fluctuation stability index is within a preset range to generate a second anomaly identifier.

[0088] Generate the second fault analysis result based on the second anomaly identifier.

[0089] Furthermore, the signal sequence generation module 14 is also used to perform the following steps:

[0090] Control the test circuit according to the first test scenario and the second test scenario. If the output signal of the trigger probe to be detected cannot be received, issue a warning signal for an internal circuit fault of the probe.

[0091] Through the foregoing detailed description of a trigger probe fault detection method in this specification, those skilled in the art can clearly know a trigger probe fault detection system in this embodiment. For the system disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple. For related parts, refer to the description in the method section.

[0092] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present application. Various modifications to these embodiments will be obvious to those skilled in the art. The general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to these embodiments shown herein, but will be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A trigger probe fault detection method, characterized in that, Including: Obtain the sensor information built in the trigger probe to be detected; Configure the test circuit and test scenarios based on the sensor information, where the test scenarios include a first test scenario and a second test scenario, the first test scenario is a signal stable scenario, and the second test scenario is a signal fluctuation scenario; Connect the trigger probe to be detected to the test circuit through the interface of the trigger probe to be detected, and perform tightness verification of the connection structure; When the tightness verification passes, control the test circuit according to the first test scenario and the second test scenario, and receive the output signal of the trigger probe to be detected to generate a first test signal sequence and a second test signal sequence; Perform fault analysis by combining the first test signal sequence and the second test signal sequence to generate a fault detection result; Configure the first test scenario and the second test scenario based on the detection accuracy information, specifically including: Determine the signal test range corresponding to the predetermined detection signal type based on the detection accuracy information; Configure multiple groups of fixed signal characteristics within the signal test range to generate the first test scenario; Randomly configure multiple groups of continuously changing signal characteristics within the signal test range according to a predetermined change frequency to generate the second test scenario; Analyze the signal deviation between the second test signal sequence and the second test scenario to generate a second fault analysis result, including: Perform timing alignment on the second test signal sequence and the control signal of the second test scenario to generate a double-column timing alignment signal; Analyze the double-column timing alignment signal to establish a probe detection delay sequence; Analyze the change analysis of the probe detection delay sequence to generate a detection delay fluctuation stability index under continuous signal fluctuations; Judge whether the detection delay fluctuation stability index is within a preset range to generate a second anomaly flag; Generate the second fault analysis result with the second anomaly flag.

2. The trigger probe fault detection method according to claim 1, wherein Configure the test circuit and test scenarios based on the sensor information, including: Read the predetermined detection signal type based on the sensor information, where the predetermined detection signal type includes one or more detection signal types; Configure the test circuit based on the predetermined detection signal type, where the test circuit includes a circuit control terminal for adjusting the signal state of the predetermined detection signal type; Obtain the detection accuracy information of the trigger probe to be detected.

3. The trigger probe fault detection method according to claim 1, characterized in that Perform fault analysis by combining the first test signal sequence and the second test signal sequence to generate a fault detection result, including: Analyze the signal deviation between the first test signal sequence and the first test scenario to generate a first fault analysis result; Analyze the signal deviation between the second test signal sequence and the second test scenario to generate a second fault analysis result; Combine the first fault analysis result and the second fault analysis result to generate the fault detection result.

4. The trigger probe fault detection method according to claim 3, characterized in that Analyze the signal deviation between the first test signal sequence and the first test scenario to generate a first fault analysis result, including: Compare the signal deviation between the first test signal sequence and the first test scenario to generate a first signal deviation sequence; Perform stability analysis on multiple deviation data in the first signal deviation sequence to generate a deviation stability index; Determine whether the deviation stability index is within a preset stability interval and whether the multiple deviation data are within a preset deviation range, and generate a first anomaly flag indicating whether the annotation test is abnormal according to the determination result; Generate the first fault analysis result with the first anomaly flag.

5. The trigger probe fault detection method according to claim 1, wherein Control the test circuit according to the first test scenario and the second test scenario. If the output signal of the trigger probe to be detected cannot be received, send a warning signal for the internal circuit failure of the probe.

6. A trigger probe fault detection system, characterized in that, For implementing a trigger probe fault detection method according to any one of claims 1-5, the system includes: A sensor information acquisition module for acquiring sensor information built in the trigger probe to be detected; A test configuration module for configuring a test circuit and test scenarios based on the sensor information, wherein the test scenarios include a first test scenario and a second test scenario, the first test scenario is a signal stability scenario, and the second test scenario is a signal fluctuation scenario; A fastening verification execution module for connecting the trigger probe to be detected to the test circuit through the interface of the trigger probe to be detected and performing fastening verification of the connection structure; A signal sequence generation module for, when the fastening verification is passed, controlling the test circuit according to the first test scenario and the second test scenario, receiving the output signal of the trigger probe to be detected, and generating a first test signal sequence and a second test signal sequence; A fault analysis module for performing fault analysis by combining the first test signal sequence and the second test signal sequence to generate a fault detection result.

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